Test system and test method

Abstract

The application discloses a test system and a test method, wherein the test system comprises a data acquisition module, a test module and a reflecting object; the test module comprises a test device and a test PCBA board electrically connected to the data acquisition module; the test device comprises a machine table and a bearing assembly and a transceiver device arranged on the machine table; the bearing assembly is used for bearing a to-be-tested galvanometer; the transceiver device is electrically connected to the test PCBA board; the data acquisition module is used for controlling the test PCBA board to drive the transceiver device; the transceiver device emits a test light beam, which is deflected by the to-be-tested galvanometer and then is shot to the reflecting object; a test echo is shot to the transceiver device after being deflected by the to-be-tested galvanometer; the transceiver device outputs a receiving signal after receiving the test echo; the data acquisition module acquires the receiving signal and outputs a test result; the test echo is a light beam returned after the test light beam is reflected by the reflecting object. The technical scheme of the application realizes the pilot evaluation on the galvanometer in the laser radar independently, and improves the accuracy of the evaluation on the galvanometer.

Description

Technical Field

[0001] This application relates to the field of lidar technology, and in particular to a testing system and a testing method applied to the testing system. Background Technology

[0002] The leader is a relatively important indicator in lidar, as it can characterize the receiving response caused by stray light inside the lidar. The receiving response caused by stray light can easily cover the waveform of the detection echo signal of the nearby target object, resulting in poor accuracy of the detection echo signal, thus affecting the lidar's short-range ranging capability.

[0003] In lidar, the structures that generate the leader include galvanometers, transceiver modules, windows, and other structural components with insufficient extinction. However, due to the fragility and high light density of the galvanometers, they are quite important in leader testing. Therefore, there is an urgent need to design a testing system that can independently evaluate the leader of the galvanometers. Summary of the Invention

[0004] This application provides a testing system and testing method that can perform preliminary evaluation of the galvanometers within a lidar independently, thereby improving the accuracy of the galvanometer evaluation.

[0005] In a first aspect, embodiments of this application provide a testing system, including a data acquisition module, a testing module, and a reflector. The testing module includes a testing device and a test PCBA board electrically connected to the data acquisition module.

[0006] The testing device includes a machine base and a support component and a transceiver device disposed on the machine base. The support component is used to support the galvanometer to be tested, and the transceiver device is electrically connected to the PCBA board to be tested.

[0007] The data acquisition module controls the test PCBA board to drive the transceiver device. The transceiver device emits a test beam, which is deflected by the mirror under test and then directed towards the reflector. The test echo is deflected by the mirror under test and then directed towards the transceiver device. The transceiver device receives the test echo and outputs a received signal. The data acquisition module acquires the received signal and outputs the test result. The test echo is the beam that returns after the test beam is reflected by the reflector.

[0008] The testing system based on this application embodiment includes a data acquisition module, a testing module, and a reflector. The testing module includes a testing device and a test PCBA board electrically connected to the data acquisition module. The data acquisition module controls the test PCBA board to drive the laser emitter to start, and emits a test beam through a transceiver module. The test beam is deflected by the galvanometer under test on a support fixture and then directed towards the reflector. The test beam is then reflected sequentially by the reflector and the galvanometer under test to return to the transceiver module, forming a test echo. The laser receiver processes the test echo to generate a test electrical signal. The test PCBA board transmits the test electrical signal to the data acquisition module, which then uses the test electrical signal to perform a preliminary evaluation of the galvanometer under test. Thus, the testing system of this application does not require preliminary evaluation of the entire lidar system. It can perform preliminary evaluation of the galvanometer independently in both early reliability testing and later customer return scenarios, improving the accuracy of the galvanometer evaluation.

[0009] In some embodiments, the carrier assembly includes a carrier fixture, the galvanometer to be tested is disposed on the carrier fixture, and at least one of the carrier fixture and the transceiver device is rotatable relative to the machine platform to adjust the angle at which the test beam is directed toward the galvanometer to be tested.

[0010] In some embodiments, the machine base further includes a mounting base for mounting the transceiver device, the mounting base being fixedly connected to the machine base, and the support fixture being rotatably disposed relative to the machine base.

[0011] In some embodiments, the table surface of the machine tool is provided with at least two spaced-apart limiting portions, and the support fixture is provided with a connecting portion that is detachably connected to the limiting portions. The connecting portion is selectively connected to at least one of the limiting portions, so that the support fixture can be fixed at the set angle position after rotating relative to the machine tool by a set angle.

[0012] In some embodiments, the support fixture includes a connecting seat, the connecting part being a first positioning post disposed on the bottom surface of the connecting seat, and the limiting part being a first positioning hole disposed on the table surface of the machine tool, wherein the first positioning post is inserted into any of the first positioning holes.

[0013] In some embodiments, the carrier assembly further includes a first clamp connected to the table surface of the machine tool, including a first clamping end that abuts against the connecting seat of the carrier fixture.

[0014] In some embodiments, the galvanometer to be tested is provided with a second positioning hole;

[0015] The support fixture also includes a fixture body and a second positioning post. The surface of the fixture body facing the transceiver device is provided with a support groove for supporting the galvanometer to be tested. The second positioning post is located on the surface of the fixture body and cooperates with the second positioning hole.

[0016] In some embodiments, the carrier assembly further includes a second clamp connected to the fixture body, including a second clamping end that can abut against the surface of the galvanometer to be tested.

[0017] In some embodiments, the testing apparatus further includes a spot-capturing device disposed on the machine platform, the spot-capturing device facing the reflector and used to capture the spot formed by the test beam on the reflector.

[0018] Secondly, embodiments of this application provide a testing method applied to the testing system described above, comprising the following steps:

[0019] The data acquisition module generates control commands;

[0020] The test PCBA board receives the control command and controls the transceiver device to emit a test beam and receive a test echo and output a received signal according to the control command. The test beam is deflected by the galvanometer under test and then directed toward the reflector. The test beam is reflected back by the reflector to form a test echo. The test echo is deflected by the galvanometer under test and then directed toward the transceiver device.

[0021] The test PCBA board receives the received signal and sends it to the data acquisition module;

[0022] The data acquisition module acquires the received signal and outputs the test results based on the received signal.

[0023] The testing method based on the embodiments of this application can perform individual testing on the galvanometer under test within the lidar to obtain the test results of the galvanometer under test, and can obtain the preliminary evaluation of the galvanometer under test through the test results, thereby eliminating the need for a preliminary evaluation of the entire lidar system. In cases such as early reliability testing and later customer returns, it can achieve a separate preliminary evaluation of the lidar galvanometer and improve the accuracy of the galvanometer evaluation. Attached Figure Description

[0024] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0025] Figure 1 This is a schematic diagram of the structure of one embodiment of the test system of this application;

[0026] Figure 2 for Figure 1 A schematic diagram of the test apparatus and the galvanometer under test in the test system shown.

[0027] Figure 3 for Figure 1 A schematic diagram of the test apparatus and the galvanometer under test of the test system shown from another perspective.

[0028] Figure 4 for Figure 2 A schematic diagram of the test apparatus of the test system shown.

[0029] Figure 5 for Figure 4 A schematic diagram of the support fixture of the test device shown;

[0030] Figure 6 for Figure 4 A schematic diagram of the structure of the test apparatus shown;

[0031] Figure 7 for Figure 2 The diagram shows the structure of the galvanometer to be tested.

[0032] Figure 8 This is a flowchart illustrating an embodiment of the testing method of this application.

[0033] Explanation of icon numbers:

[0034] 100. Testing system; 10. Data acquisition module; 30. Testing module; 31. Testing device; 311. Machine base; 3111. Platform body; 3111a. Limiting part; 3113. Adjusting plate; 3115. Adjusting structure; 3115a. Leveling bolt; 3117. Mounting base; 313. Bearing component; 3131. Bearing fixture; 3131a. Fixture body; 3131b. Connecting seat; 3131c. Connecting part ; 3131d, second positioning post; 3131e, bearing groove; 3133, first clamp; 3133a, first pressing end; 3133b, first connecting part; 3135, second clamp; 3135a, second pressing end; 3135b, second connecting part; 315, transceiver; 317, light spot capturing device; 33, test PCBA board; 50, reflector; 300, galvanometer to be tested; 310, second positioning hole.

[0035] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0036] To make the objectives, technical solutions, and advantages of this application clearer, the embodiments of this application will be described in further detail below with reference to the accompanying drawings.

[0037] Where the following description relates to the accompanying drawings, unless otherwise indicated, the same numbers in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this application as detailed in the appended claims.

[0038] In the description of this application, it should be understood that the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances. Furthermore, in the description of this application, unless otherwise stated, "multiple" refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship.

[0039] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of this application. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0040] Please see Figures 1 to 3 The first aspect of this application proposes a test system 100, which, in an embodiment of this application, includes a data acquisition module 10, a test module 30, and a reflector 50.

[0041] The test module 30 includes a test device 31 and a test PCBA board 33 electrically connected to the data acquisition module 10. The data acquisition module 10 can be composed of a PC and corresponding debugging software. That is, the data acquisition module 10 can be functionally divided into a control receiving unit and an optical modulation test unit. The control receiving unit has functions such as generating and sending control commands and receiving received signals transmitted by the test PCBA board 33, while the optical modulation test unit has functions such as processing the received signals, for example, processing the received signals to form readable data or graphics for the preliminary evaluation of the galvanometer 300 under test, so as to facilitate the output of test results after analysis.

[0042] The testing device 31 includes a transceiver 315, a spot-capturing device 317, a support component 313, and a machine base 311. The transceiver 315, the spot-capturing device 317, and the support component 313 are mounted on the machine base 311. During the test, the data acquisition module 10 controls the test PCBA board 33 to drive the transceiver 315. The transceiver 315 emits a test beam, which is deflected by the test mirror 300 and then directed towards the reflector 50. The test echo is deflected by the test mirror 300 and then directed towards the transceiver 315. The transceiver 315 receives the test echo and outputs a received signal. The data acquisition module 10 acquires the received signal and outputs the test result. The test echo is the beam that returns after the test beam is reflected by the reflector 50.

[0043] The transceiver device 315 may include a transceiver module, a laser transmitter, and a laser receiver. The test PCBA (Printed Circuit Board Assembly) 33 can be electrically connected to the data acquisition module 10, the laser transmitter, and the laser receiver, respectively, via either a ribbon cable connection or a wireless connection. It is important to emphasize that the galvanometer 300 under test in this application can be a galvanometer structure within a lidar system, such as a MEMS (Micro-Electro-Mechanical System) galvanometer. The transceiver module may include a housing and a light-emitting shaping structure, a light-receiving shaping structure, and a beam-splitting structure disposed within the housing. The light-emitting shaping structure, the light-receiving shaping structure, and the beam-splitting structure can all be optical lens structures. The beam-splitting structure is located between the light-emitting and light-receiving shaping structures. A through-hole is provided on the surface of the housing facing the galvanometer 300 under test. Specifically, under the control command of the data acquisition module 10, the laser emitter emits a light beam. This light beam passes through the light-shaping structure and the beam-splitting structure in sequence and exits through the through-hole to be defined as the test beam described above. After the test beam passes through the subsequent test mirror 300 and the reflector 50, the beam reflected back by the reflector 50 is defined as the test echo. The test echo is then incident on the beam-splitting structure through the through-hole. The beam-splitting structure deflects the test echo to the receiving light-shaping structure and the laser receiver. At this time, the laser receiver processes the test echo and outputs a received signal. That is, the test light signal of the test echo is converted into a test electrical signal by the laser receiver. The laser receiver transmits the test electrical signal to the control receiving unit of the data acquisition module 10 through the test PCBA board 33.

[0044] The spot capturing device 317 can capture the spot formed by the test beam on the reflector 50. Since the laser emitter is an infrared laser, the test beam it emits is infrared laser, meaning the type of test beam is invisible light, making it impossible for the tester to visually confirm whether the test beam has entered the reflection area of ​​the reflector 50. Therefore, the spot capturing device 317 can be an infrared camera, and by capturing the spot of the infrared laser, it can be confirmed whether the test beam has successfully entered the reflection area of ​​the reflector 50. When the laser emitter is another type of laser that can emit a visible test beam, the infrared camera can be replaced by a CCD (charge coupled device) camera. The CCD camera can photograph the reflective surface of the reflector 50, and the spot image on the reflective surface can be used to determine whether the test beam has successfully entered the reflection area of ​​the reflector 50. This is not limited here.

[0045] The structure of the test stand 311 can be a table or a frame, etc. The test stand 311 mainly serves to support the various components inside the test device 31, and it can also be used to support the reflector 50. Of course, the reflector 50 can also be installed in a location other than the test stand 311, such as an external wall or panel. The reflector 50 can be a reflective plate or an optical element with a reflective surface. There is no limitation here, as long as it can reflect the test beam incident after being deflected by the galvanometer 300 under test back to the galvanometer 300 under test along the coaxial optical path.

[0046] In one embodiment, the machine tool 311 includes a platform 3111, an adjustment plate 3113, and an adjustment structure 3115. The carrying component 313, the transceiver device 315, and the light spot capturing device 317 are all disposed on the adjustment plate 3113. The adjustment structure 3115 is connected to the platform 3111 and the adjustment plate 3113 to adjust the angle between the platform 3111 and the adjustment plate 3113. When the platform 3111 is placed on a surface in the external environment, the surface may not maintain a high degree of flatness, causing the position of the test beam incident on the reflector 50 to change. For example, if the surface is uneven, the test beam may be incident outside the reflection area of ​​the reflector 50, which will lead to a decrease in the accuracy of the test results. Therefore, in order to cope with the unevenness of the placement surface in the actual test environment, this application provides an adjustment structure 3115 to fine-tune the angle between the platform 3111 and the adjustment plate 3113. This allows the tester to adjust the height of the test mirror 300 to deflect the test beam emitted by the laser emitter onto the reflector 50, and to ensure that the test beam falls within the reflection area of ​​the reflector 50, thereby improving the accuracy of the test.

[0047] This application's technical solution employs a data acquisition module 10, a testing module 30, and a reflector 50. The testing module 30 includes a testing device 31 and a test PCBA board 33 electrically connected to the data acquisition module 10. The data acquisition module 10 controls the test PCBA board 33 to drive the transceiver 315 to emit a test beam. The test beam is deflected by the galvanometer 300 under test on the support fixture 3131 and then directed towards the reflector 50. The test echo reflected back by the reflector 50 is processed by the transceiver 315 to generate and output a received signal. The test PCBA board 33 transmits the received signal to the data acquisition module 10, which then performs a preliminary evaluation of the galvanometer 300 based on the received signal to output the test results. Thus, the testing system 100 of this application does not require preliminary evaluation of the entire lidar system. In situations such as early reliability testing and later customer returns, it can perform separate preliminary evaluation of the lidar galvanometer, improving the accuracy of the galvanometer evaluation.

[0048] Please continue reading. Figures 2 to 4 In one embodiment, the carrier assembly 313 includes a carrier fixture 3131, on which the galvanometer 300 to be tested is disposed. The carrier fixture 3131 has a carrier groove 3131e, where the galvanometer 300 to be tested is positioned. Vertically, the height of the carrier groove 3131e is higher than that of the transceiver device 315; that is, during testing, the galvanometer 300 to be tested is located above the transceiver device 315.

[0049] At least one of the support fixture 3131 and the transceiver device 315 can rotate relative to the machine base 311 to adjust the angle at which the test beam is directed toward the galvanometer 300 under test.

[0050] Understandably, the transmitting unit of the final product's lidar includes a laser diode and a galvanometer. The laser beam emitted by the laser diode is scanned to different directions by the vibration of the galvanometer to realize the lidar's scanning function. Therefore, in order to simulate different states of the galvanometer 300 under scanning to obtain accurate pre-evaluation, at least one of the support fixture 3131 and the transceiver 315 can be rotated relative to the machine base 311 to adjust the angle at which the test beam emitted by the transceiver 315 is directed toward the galvanometer 300 under test.

[0051] The way in which at least one of the support fixture 3131 and the transceiver device 315 can rotate relative to the machine base 311 can be as follows: one way is that the transceiver device 315 is fixed to the machine base 311 and the support fixture 3131 rotates relative to the machine base 311; another way is that the support fixture 3131 is fixed to the machine base 311 and the transceiver device 315 rotates relative to the machine base 311; yet another way is that both the support fixture 3131 and the transceiver device 315 can rotate relative to the machine base 311. This embodiment does not limit this.

[0052] Please continue reading. Figures 2 to 4 In one embodiment, the machine base 311 further includes a mounting base 3117 for mounting the transceiver device 315. The mounting base 3117 is fixedly connected to the machine base 311, that is, the mounting base 3117 is fixedly connected to the adjusting plate 3113. The mounting base 3117 is configured to have an installation space, within which the transceiver device 315 can be mounted. The supporting fixture 3131 is rotatably mounted relative to the adjusting plate 3113.

[0053] Understandably, the laser emitter within the transceiver 315 has a transmitting FPC (Flexible Printed Circuit) board electrically connected to the test PCBA board 33, and the laser receiver also has a receiving FPC board electrically connected to the test PCBA board 33. When the transmitting and receiving FPC boards are electrically connected to the test PCBA board 33 via ribbon cables, the presence of these ribbon cables means that if the transceiver 315 rotates, the ribbon cables may loosen after prolonged use, affecting the testing process. Therefore, by providing a mounting base 3117 fixedly connected to the machine tool 311, and by using the mounting base 3117 to support and fix the transceiver 315, and by rotating the support fixture 3131, the angle of the test beam directed towards the test mirror 300 can be adjusted, ensuring the stable operation of the testing system over a long period.

[0054] Mounting base 3117 can be constructed as a wedge-shaped structure, wherein the surface on which the transceiver 315 is disposed of on mounting base 3117 is defined as the mounting surface, wherein the mounting surface can be set at an angle to the vertical direction and extend obliquely in the direction toward the bearing groove 3131e, that is, the mounting surface is the wedge-shaped surface of mounting base 3117, so that the transceiver 315 emits a test beam obliquely upward, so that the test beam can be directed toward the galvanometer 300 under test which is higher than the transceiver 315. In this way, the volume of mounting base 3117 is relatively small, which is conducive to structural simplification. Furthermore, when the transceiver 315 can emit a test beam obliquely upward, it can simulate the internal space arrangement of the lidar in the actual product. That is, in the actual product design, the position of the galvanometer of most lidars is located obliquely above its transceiver, thus simulating the actual situation of lidar more realistically and further improving the accuracy of the evaluation of the galvanometer 300 under test. On the other hand, this configuration ensures that the transceiver 315 does not interfere with the propagation of the test beam between the test mirror 300 and the reflector 50, preventing the transceiver 315 from blocking the test beam and avoiding any impact on the propagation of the test beam.

[0055] The support fixture 3131 can be rotatably configured relative to the machine base 311, and can be infinitely adjustable or have a gear adjustment. When stepless adjustment is used, a drive structure can also be provided, such as a hollow rotary platform fixedly connected to the machine base 311. The hollow rotary platform has a rotary table that rotates relative to the machine base 311 and a motor that drives the rotary platform to rotate. The bearing fixture 3131 is connected to the rotary table, and the motor drives the rotary table to drive the bearing fixture 3131 to rotate. In other forms, the bearing fixture 3131 can be directly driven to rotate. For example, a motor and a transmission assembly are provided on the machine base 311. The drive end of the motor is connected to the bearing fixture 3131 through the transmission assembly and drives the bearing fixture 3131 to rotate. The outer wall of the bearing fixture 3131 can be provided with a gear ring, or the bearing fixture 3131 can be equipped with a gear, synchronous pulley, sprocket, or other structure. The transmission assembly can be in the form of a rack, synchronous belt, chain, etc. The motor drives the bearing fixture 3131 to rotate steplessly through gear transmission, belt transmission, sprocket transmission, etc.

[0056] For the rotary connection form of the bearing fixture 3131 relative to the machine tool 311 that allows for position adjustment, please refer to [link / reference]. Figures 5 to 6 The machine tool 311 has at least two spaced limiting parts 3111a on its adjusting plate 3113, and the bearing fixture 3131 has a connecting part 3131c that is detachably connected to the limiting parts 3111a. The connecting part 3131c is selectively connected to at least one limiting part 3111a so that the bearing fixture 3131 can be fixed at the set angle position after rotating relative to the machine tool 311 by a set angle.

[0057] In this embodiment, the laser beam emitted by the laser diode of the lidar can scan in different directions under the vibration of the galvanometer. This scanning range has a maximum angle and a minimum angle. Therefore, by providing at least two limiting parts 3111a, the test beam can be fixed at at least the maximum and minimum angles when incident on the galvanometer 300 under test. This achieves a pre-test simulating the maximum and minimum angles within the lidar's scanning range. Compared to testing the galvanometer 300 under test using only one incident angle, this embodiment allows for pre-test evaluation of the galvanometer 300 under test using at least two incident angles, resulting in a more comprehensive and accurate pre-test evaluation. The number of limiting parts 3111a can also be three, four, or five, etc., and is not specifically limited here. The number of limiting parts 3111a can be selected according to the actual pre-test evaluation requirements.

[0058] The connecting part 3131c can be configured as a first positioning post, and the limiting part 3111a can be configured as a first positioning hole that cooperates with the first positioning post. In this way, the first positioning post can be selectively inserted into any of the first positioning holes to realize the angle adjustment (i.e., gear adjustment) of the support fixture 3131 during its rotation on the adjusting plate 3113. Of course, the connecting part 3131c can also be configured as a buckle, and the limiting part 3111a can be configured as a slot that cooperates with the buckle. The buckle can be selectively engaged with any of the slots, which can also realize the rotation of the support fixture 3131 on the adjusting plate 3113.

[0059] Please continue reading. Figures 4 to 6 The support fixture 3131 includes a fixture body 3131a and a connecting seat 3131b connected together. The fixture body 3131a has a plate-like structure and forms the aforementioned support groove 3131e for supporting the galvanometer 300 to be tested. The connecting seat 3131b can be disc-shaped and can be integrally cast from metal material with the fixture body 3131a, or manufactured from plastic through injection molding. Of course, the connecting seat 3131b and the fixture body 3131a can also be separate structures and can be fixed together by threaded connection or pin insertion. When the fixture body 3131a adopts a two-part structure of fixture body 3131a and connecting seat 3131b, it has the advantages of small size and less material usage. Of course, the support fixture 3131 can also be integrally columnar or frame-shaped, etc., without limitation. The connecting part 3131c is a first positioning post provided on the bottom surface of the connecting seat 3131b, and the limiting part 3111a is a first positioning hole provided on the table surface of the machine tool 311. The first positioning post is inserted into any of the first positioning holes.

[0060] In actual use, the tester selectively inserts the first positioning pin on the bottom surface of the connector 3131b into any of the first positioning holes. This allows the support fixture 3131 to be connected to the adjustment plate 3113 while simultaneously rotating relative to the adjustment plate 3113 to adjust the angle, thus switching the angle at which the test beam is incident on the galvanometer 300 under test. Furthermore, by inserting the first positioning pin into the first positioning hole, the positioning accuracy of the connector 3131b on the machine tool 311 is improved, ensuring the accuracy of the relative position between the transceiver device 315 and the galvanometer 300 under test. Optionally, the connection structure between the first positioning pin and the connector 3131b can be an integral structure or a separate structure. When it is an integral structure, it can be manufactured through integral stamping, improving the connection strength and facilitating workshop processing.

[0061] The above content specifically describes the advantages of the testing system of this application in terms of higher testing accuracy during the testing process, from the perspective of adjusting the angle of the test beam directed towards the galvanometer 300 under test. Based on this, in order for the spot capturing device 317 to capture the spot of the laser beam under the adjusted angle of the test beam directed towards the galvanometer 300 under test, the spot capturing device 317 may include a mounting frame and an imaging component mounted on the mounting frame. The imaging component can rotate around a first direction and a second direction parallel to the reflecting surface of the reflector 50, respectively, to achieve comprehensive adjustment of the imaging end of the imaging component in the first and second directions.

[0062] Please continue reading. Figures 3 to 5 In one embodiment, the support assembly 313 further includes a first clamp 3133, which is connected to the table surface of the machine tool 311. The first clamp 3133 may include a first operating part, a first connecting part 3133b, and a first pressing end 3133a. The first connecting part 3133b is connected to the table surface of the machine tool 311, the first pressing end 3133a is connected to the end of the first operating part, and the first operating end is rotatably connected to the first connecting part 3133b at its center along its own extending direction.

[0063] The first clamping end 3133a of this application can abut against the connecting seat 3131b of the bearing fixture 3131. In actual use, the tester controls the rotation of the first operating end and the first connecting part 3133b to drive the first clamping end 3133a closer to or further away from the connecting seat 3131b, so as to press or release the connecting seat 3131b. In this way, after the bearing fixture 3131 has rotated relative to the machine base 311, the bearing fixture 3131 can be guaranteed not to shift in position under the abutment of the first clamping end 3133a, thereby ensuring the positional accuracy of the galvanometer 300 under test during the test, and facilitating the operation of the first fixture 3133 by the tester.

[0064] The first pressing end 3133a may include a first threaded post and a first pressing member. One end of the first threaded post is threaded through the end of the first connecting part 3133b and the end is connected to the first pressing member so that the first pressing member can abut against the connecting seat 3131b. The contact method between the first pressing part and the surface of the connecting seat 3131b can be surface contact, which can further improve the stability of fixing the connecting seat 3131b.

[0065] In addition, please refer to the following for the number of first fixtures. Figures 2 to 5 The number of first fixtures 3133 can be one or more. When there are multiple first fixtures 3133, they can be arranged at intervals along the circumference of the base. This can further prevent the bearing fixture 3131 from shifting position after rotation, thereby further improving the position accuracy of the galvanometer 300 under test during the test.

[0066] Please continue reading. Figure 4 , Figure 5 as well as Figure 7 In one embodiment, the galvanometer under test 300 is provided with a second positioning hole 310. The galvanometer under test 300 includes a housing and a galvanometer body installed inside the housing. The second positioning hole 310 can be formed on the surface of the housing. The galvanometer body may include a mirror body and a drive motor that is driven to the mirror body. The drive motor and the mirror body are located inside the housing. The drive motor drives the mirror body to swing. That is, the galvanometer body has the functions of a traditional galvanometer for deflecting, modulating, opening and closing, and phase controlling the laser beam in the lidar.

[0067] The second positioning post 3131d of this application is provided on the surface of the fixture body 3131a and cooperates with the second positioning hole 310.

[0068] When the galvanometer 300 to be tested is positioned in the bearing groove 3131e, the second positioning post 3131d can be inserted through its own second positioning hole 310. The cooperation between the two achieves the positioning effect, ensuring the accuracy of the position of the galvanometer 300 to be tested in the bearing groove 3131e, improving the accuracy of the incident position of the test beam on the mirror body, and further improving the accuracy of the test results.

[0069] Regarding the number of first fixtures, the number of second positioning holes 310 can be one or more, which is not limited here. As an example, when there are two second positioning holes 310, there are second positioning holes 310 on each diagonal of the outer casing. Correspondingly, there are also two second positioning posts 3131d. The two second positioning posts 3131d pass through the two second positioning holes 310, and the second positioning posts 3131d correspond one-to-one with the second positioning holes 310, which makes the positioning effect better and further ensures the accuracy of the position of the galvanometer 300 under test when placed in the bearing groove 3131e.

[0070] Please continue reading. Figures 3 to 4 In one embodiment, the support component 313 further includes a second clamp 3135, which is connected to the fixture body 3131a. The second clamp 3135 includes a second operating part, a second connecting part 3135b, and a second pressing end 3135a. The second connecting part 3135b is connected to the fixture body 3131a, and the second pressing end 3135a is connected to the end of the second operating part. The second operating end is rotatably connected to the second connecting part 3135b at its center along its own extension direction.

[0071] The second clamping end 3135a of this application can abut against the surface of the galvanometer 300 to be tested. In actual use, the tester controls the rotation of the second operating end and the second connecting part 3135b to drive the second clamping end 3135a closer to or further away from the shell surface of the outer casing, so as to press or release the galvanometer 300 to be tested. In this way, the stability of the galvanometer 300 to be tested when placed in the bearing groove 3131e is improved.

[0072] The second pressing end 3135a includes a second threaded post and a second pressing member. One end of the second threaded post is threaded through the end of the second connecting part 3135b and connected to the second pressing member. The pressing member can press against the shell surface of the outer shell. The contact between the first pressing part and the shell surface of the outer shell can be a surface contact, which can improve the stability of pressing against the outer shell.

[0073] Please continue reading. Figure 4In one embodiment, the adjusting structure 3115 includes multiple leveling bolts 3115a. The adjusting plate 3113 has first connecting holes at its diagonals. The platform surface of the platform 3111 has multiple second connecting holes. The multiple leveling bolts 3115a are sequentially inserted into the multiple first connecting holes and the multiple second connecting holes, with each leveling bolt 3115a corresponding to one first connecting hole and one second connecting hole. The second connecting holes are threaded holes and have internal threads that mate with the external threads of the leveling bolts 3115a. The multiple leveling bolts 3115a, and the insertion depth of each leveling bolt 3115a into the second connecting hole, allow for fine-tuning of the angle between the platform 3111 and the adjusting plate 3113, facilitating operation and simplifying the structure.

[0074] As an example, the adjusting plate 3113 has two diagonals arranged vertically, each diagonal having two opposite angles, that is, a first connecting hole is provided for each opposite angle. Therefore, the number of leveling bolts 3115a is four, and correspondingly, the number of first connecting holes and second connecting holes is also four. Thus, by adjusting the insertion depth of the four leveling bolts 3115a in the corresponding four second connecting holes, the included angle can be finely adjusted.

[0075] In addition, the adjustment structure 3115 can be adjusted not only by using multiple leveling bolts 3115a, but also by using a motor and transmission components to drive the adjustment plate 3113 to swing, thereby adjusting the angle between the platform 3111 and the adjustment plate 3113. For example, the adjustment plate can be equipped with gears, synchronous pulleys, sprockets, etc., and the transmission components can be racks, synchronous belts, chains, etc. The motor drives the adjustment plate to swing through gear transmission, belt transmission, sprocket transmission, etc., thereby achieving automatic adjustment of the angle between the platform 3111 and the adjustment plate 3113.

[0076] Please see Figure 8 This application also proposes a testing method for the above-mentioned testing system, comprising the following steps:

[0077] Step S10: The data acquisition module generates control commands;

[0078] Step S20: Test the PCBA board to receive control commands, and control the transceiver device to transmit test beams and receive test echoes according to the control commands and output the received signal. The test beam is deflected by the galvanometer under test and then directed toward the reflector. The test beam is reflected back by the reflector to form a test echo. The test echo is deflected by the galvanometer under test and then directed toward the transceiver device.

[0079] Step S30: Test the PCBA board's reception of signals and their transmission to the data acquisition module;

[0080] Step S40: The data acquisition module acquires the received signal and outputs the test results based on the received signal.

[0081] In this embodiment, in step S10, the data acquisition module generates and issues control commands, which are commands to emit test beams and to receive test echoes and output received signals.

[0082] In step S20, the test PCBA board receives a control command from the data acquisition module and controls the transceiver to emit a test beam according to the control command. The transceiver also receives the echoed test echo and outputs a received signal. Specifically, the transceiver receives the echoed test echo and converts the optical signal of the test echo into an electrical signal, which is the output received signal.

[0083] In step S40, the data acquisition module can acquire the received signal emitted from the test PCBA board. The data acquisition module processes the received signal to output the test result. The specific processing process is as follows: The data acquisition module first acquires the received response of the ambient light near the transceiver and uses it as the base response. Then, it subtracts the received signal from the base response to obtain the probe echo. Before obtaining the probe echo, the transceiver receives the stray light near the galvanometer under test and converts the optical signal of the stray light into an electrical signal. The electrical signal is then subtracted from the base response to obtain the leader echo. At this time, the ratio of the probe echo to the leader echo is used as the signal leader ratio. The signal leader ratio is compared with a preset threshold in the data acquisition module. If the signal leader ratio is greater than the preset threshold, the leader evaluation of the galvanometer under test is that the galvanometer has less stray light and its optical performance is qualified. If the signal leader ratio is less than the preset threshold, the leader evaluation of the galvanometer under test is that the galvanometer has more stray light and its optical performance is poor.

[0084] The technical solution of this application can perform individual testing on the galvanometer under test in the lidar through the testing method of the testing system, so as to obtain the test result of the galvanometer under test and obtain the preliminary evaluation of the galvanometer under test through the test result. Therefore, it is not necessary to perform a preliminary evaluation of the entire lidar system. In the early stage of reliability testing and the later stage of customer return, it can realize the individual preliminary evaluation of the lidar galvanometer and improve the accuracy of the evaluation of the galvanometer.

[0085] In the accompanying drawings of this embodiment, the same or similar reference numerals correspond to the same or similar components. In the description of this application, it should be understood that if terms such as "upper," "lower," "left," and "right" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, they are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, the terms used to describe positional relationships in the accompanying drawings are only for illustrative purposes and should not be construed as limiting this patent. For those skilled in the art, the specific meaning of the above terms can be understood according to the specific circumstances.

[0086] The above are merely preferred embodiments of this application and are not intended to limit this application. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A testing system, characterized in that, It includes a data acquisition module, a test module, and a reflector. The test module includes a test device and a test PCBA board electrically connected to the data acquisition module. The testing device includes a machine base and a support component and a transceiver device disposed on the machine base. The support component is used to support the galvanometer to be tested, and the transceiver device is electrically connected to the PCBA board to be tested. The data acquisition module is used to control the test PCBA board to drive the transceiver device. The transceiver device emits a test beam, which is deflected by the mirror under test and then directed toward the reflector. The test echo is deflected by the mirror under test and then directed toward the transceiver device. The transceiver device receives the test echo and outputs a received signal. The data acquisition module acquires the received signal and outputs the test result to obtain the pre-evaluation of the mirror under test. The test echo is the beam that returns after the test beam is reflected by the reflector.

2. The testing system as described in claim 1, characterized in that, The carrier assembly includes a carrier fixture, and the galvanometer to be tested is disposed on the carrier fixture. At least one of the carrier fixture and the transceiver device can rotate relative to the machine platform to adjust the angle at which the test beam is directed toward the galvanometer to be tested.

3. The testing system as described in claim 2, characterized in that, The machine base also includes a mounting base for mounting the transceiver device, the mounting base being fixedly connected to the machine base, and the supporting fixture being rotatably mounted relative to the machine base.

4. The testing system as described in claim 2, characterized in that, The table surface of the machine tool is provided with at least two spaced-apart limiting parts, and the support fixture is provided with a connecting part that is detachably connected to the limiting parts. The connecting part is selectively connected to at least one of the limiting parts so that the support fixture can be fixed at the set angle position after rotating relative to the machine tool by a set angle.

5. The testing system as described in claim 4, characterized in that, The support fixture includes a connecting seat, the connecting part is a first positioning post disposed on the bottom surface of the connecting seat, and the limiting part is a first positioning hole disposed on the table surface of the machine tool, wherein the first positioning post is inserted into any of the first positioning holes.

6. The testing system as described in claim 2, characterized in that, The support assembly further includes a first clamp connected to the table surface of the machine tool, and includes a first clamping end that can abut against the connecting seat of the support fixture.

7. The testing system according to any one of claims 2 to 6, characterized in that, The galvanometer to be tested is provided with a second positioning hole; The support fixture also includes a fixture body and a second positioning post. The surface of the fixture body facing the transceiver device is provided with a support groove for supporting the galvanometer to be tested. The second positioning post is located on the surface of the fixture body and cooperates with the second positioning hole.

8. The testing system as described in claim 7, characterized in that, The support assembly further includes a second clamp connected to the fixture body, which includes a second clamping end that can abut against the surface of the galvanometer to be tested.

9. The testing system according to any one of claims 1 to 6, characterized in that, The testing apparatus also includes a spot capturing device disposed on the machine platform, the spot capturing device facing the reflector and used to capture the spot formed by the test beam on the reflector.

10. A test method applied to the test system as described in any one of claims 1 to 9, characterized in that, Includes the following steps: The data acquisition module generates control commands; The test PCBA board receives the control command and controls the transceiver device to emit a test beam and receive a test echo and output a received signal according to the control command. The test beam is deflected by the galvanometer under test and then directed toward the reflector. The test beam is reflected back by the reflector to form a test echo. The test echo is deflected by the galvanometer under test and then directed toward the transceiver device. The test PCBA board receives the received signal and sends it to the data acquisition module; The data acquisition module acquires the received signal and outputs the test results based on the received signal.

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