Method for measuring photon flux and photon flux sensor
By designing photoelectric conversion unit, signal amplification unit, analog-to-digital conversion unit, and digital-to-analog conversion unit for the photoelectric quantum flux sensor, the problem that existing sensors cannot detect pulsed light signals is solved, and efficient photoelectric quantum flux detection is achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- ZHUOZHOU JINGSHENG POWER ENG CO LTD
- Filing Date
- 2023-07-07
- Publication Date
- 2026-07-24
Smart Images
Figure CN116839729B_ABST
Abstract
Description
Technical Field
[0001] This disclosure relates to a method for measuring optical quantum flux and an optical quantum flux sensor. Background Technology
[0002] Light is crucial for plants. The most important physiological activity during photosynthesis is the production of organic matter. Providing plants with sufficient light when needed allows them to fully utilize light to produce more organic matter, thus greatly promoting plant growth and increasing yield. In practice, photonic flux sensors are used to measure the light intensity of crops in order to increase yield by adjusting light intensity.
[0003] With the development of agricultural technology, the use of LEDs for supplemental lighting of plants has become widely adopted. However, due to the complexity of controlling DC-driven light sources, their low efficiency, poor linearity, and the fact that LEDs are best suited for switching operations, pulsed dimming systems have emerged. These systems modulate DC current into different pulse widths based on the photon flux characteristics of plant growth, thereby controlling the photon flux density and providing the plants with the light they need for their current growth. However, current photon flux sensors can only measure static light signals and cannot detect dynamic light signals such as pulsed light signals.
[0004] Chinese patent publication number CNCN103148934 discloses a detection method and device based on a solar single-band quantum flux density model. It first continuously measures the total visible light intensity and the intensity of a specific wavelength band at different times on different dates within a calendar year to obtain the proportion of the specific wavelength band in the visible light. Then, based on the relationship between the detection time, geographical location, and solar altitude angle, it uses Matlab to fit the variation law of the specific wavelength band with the solar altitude angle to obtain the percentage of the specific wavelength band at different solar altitude angles. Finally, it calculates the specific single-band quantum flux density according to the formula. This scheme is suitable for continuous static light such as natural light. However, it requires the measurement of other optical parameters such as illuminance. The algorithm involves complex calculations of the light signal, which is time-consuming. The sampling frequency is low and the acquisition time is too long, therefore it cannot acquire high-speed pulse signals and cannot be applied to the detection of quantum flux of pulsed light signals. Summary of the Invention
[0005] To address at least one of the aforementioned technical problems, this disclosure provides a method for measuring optical quantum flux and an optical quantum flux sensor.
[0006] According to a first aspect of this disclosure, a photonic quantum flux sensor is provided, comprising:
[0007] The photoelectric conversion unit is used to collect the pulse light signal of the light source under test and convert it into a pulse electrical signal;
[0008] The signal amplification unit is used to amplify the pulse electrical signal from the photoelectric conversion unit into a DC voltage signal;
[0009] The analog-to-digital conversion unit is used to convert DC voltage signals into digital signals.
[0010] The control unit stores a calibration data table, which contains calibration data of photon flux density within a predetermined interval. The value of each calibration data is the standard value of the digital signal corresponding to the corresponding photon flux density. The control unit is used to sample, filter, and look up the digital signal from the analog-to-digital converter to determine the calibration data corresponding to the digital signal and provide the calibration data to the digital-to-analog converter unit.
[0011] The digital-to-analog conversion unit is used to convert calibration data from the control unit into digital signals to generate an analog signal indicating the current quantum flux density of the light source under test.
[0012] The power supply unit is used to connect to an external power source to supply power to the signal amplification unit, analog-to-digital conversion unit, control unit, and digital-to-analog conversion unit.
[0013] In some embodiments of this disclosure, the photoelectric conversion unit includes: an optical diffuser for collecting pulsed light signals from the light source under test so that they illuminate the receiving end of the photoelectric converter; and a photoelectric converter for receiving the pulsed light signals from the light source under test and performing photoelectric conversion on them to generate pulsed electrical signals.
[0014] In some embodiments of this disclosure, the optical diffuser is a cosine corrector.
[0015] In some embodiments of this disclosure, the photoelectric converter is a silicon photovoltaic cell.
[0016] In some embodiments of this disclosure, the signal amplification unit includes a first-stage operational amplifier circuit and a second-stage operational amplifier circuit connected in series; the first-stage operational amplifier circuit is used to amplify the pulse electrical signal from the photoelectric conversion unit and output a DC voltage signal; the second-stage operational amplifier circuit is used to amplify the DC voltage signal from the first-stage operational amplifier circuit and output it.
[0017] In some embodiments of this disclosure, the control unit includes a memory and a processor; the memory is used to store the calibration data table, the filtering program, and the fitting program; the processor is used to read the calibration data table, the filtering program, and the fitting program from the memory, and run the filtering program and the fitting program to complete the sampling, filtering, and table lookup operations of the digital signal according to the calibration data table to determine the calibration data corresponding to the digital signal.
[0018] In some embodiments of this disclosure, the power supply unit includes: a negative voltage generator, used to convert the voltage provided by an external power supply into a negative voltage and provide the negative voltage as a reference voltage to the signal amplification unit.
[0019] In some embodiments of this disclosure, the power supply unit includes: an adjustable voltage module for adjusting the voltage of an external power supply to supply power to the signal amplification unit, analog-to-digital conversion unit, control unit, and digital-to-analog conversion unit, respectively.
[0020] In some embodiments of this disclosure, the light source to be tested is a plant LED light-emitting diode.
[0021] In some embodiments of this disclosure, the analog-to-digital conversion unit is a TLC2543A / D converter chip; and / or, the digital-to-analog conversion unit is a TLC5615D / A converter chip.
[0022] According to a second aspect of this disclosure, a method for measuring optical quantum flux is provided, comprising:
[0023] Acquire pulsed light signals from the light source under test and convert them into pulsed electrical signals;
[0024] Amplify the pulse electrical signal into a DC voltage signal;
[0025] Perform analog-to-digital conversion on DC voltage signals to generate digital signals;
[0026] The digital signal from the analog-to-digital converter is sampled, filtered, and looked up according to a pre-stored calibration data table to determine the calibration data corresponding to the digital signal. The calibration data table contains calibration data of photon flux density within a predetermined interval, and the value of each calibration data is the standard value of the digital signal corresponding to the corresponding photon flux density.
[0027] The calibration data corresponding to the digital signal is converted from digital to analog to generate an analog signal that indicates the current photonic flux density of the light source under test.
[0028] In some embodiments of this disclosure, among all the calibration data in the calibration data table, the calibration data corresponding to the digital signal is closest to the value of the filtered digital signal.
[0029] The photonic quantum flux measurement method and photonic quantum flux sensor of this disclosure can realize the photonic quantum flux detection of pulsed light signals from light sources such as LED lights by performing simple processing such as photoelectric conversion, analog-to-digital conversion, sampling, filtering and table lookup on the pulsed light signal in sequence. Since the integration operation is eliminated, the signal processing speed is improved, and the sampling frequency and acquisition time are no longer limited, resulting in high efficiency and short time consumption. Attached Figure Description
[0030] The accompanying drawings illustrate exemplary embodiments of the present disclosure and, together with the description thereof, serve to explain the principles of the present disclosure. These drawings are included to provide a further understanding of the present disclosure and are incorporated in and constitute a part of this specification.
[0031] Figure 1 This is a schematic diagram of the structure of a photonic quantum flux sensor according to some embodiments of the present disclosure.
[0032] Figure 2 This is a schematic diagram illustrating the specific implementation structure and connection of a photonic quantum flux sensor according to some embodiments of this disclosure.
[0033] Figure 3 This is an exemplary flowchart of analog-to-digital conversion according to some embodiments of the present disclosure.
[0034] Figure 4 This is an exemplary flowchart of digital signal filtering according to some embodiments of the present disclosure.
[0035] Figure 5 This is an exemplary flowchart illustrating the comparison of digital signal values according to some embodiments of this disclosure.
[0036] Figure 6 This is an exemplary flowchart of digital-to-analog conversion according to some embodiments of the present disclosure.
[0037] Figure 7 This is a schematic flowchart of a method for measuring optical quantum flux according to some embodiments of the present disclosure.
[0038] Explanation of reference numerals in the attached figures
[0039] Photoelectric conversion unit 102
[0040] 1022 Optical Diffuser / Cosine Corrector
[0041] Photovoltaic converter / silicon photovoltaic cell 1024
[0042] Signal Amplification Unit 104
[0043] First-stage operational amplifier circuit 1042
[0044] Second-stage operational amplifier circuit 1044
[0045] Analog-to-digital converter unit / TLC2543A / D converter chip 106
[0046] Control Unit / Microcontroller 108
[0047] Memory 1082
[0048] Controller 1084
[0049] Digital-to-Analog Converter Unit / TLC5615D / A Converter Chip 110
[0050] Power supply unit 112
[0051] Adjustable voltage module 1122
[0052] Negative voltage generator 1124 Detailed Implementation
[0053] The present disclosure will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are for illustrative purposes only and are not intended to limit the scope of the disclosure. Furthermore, it should be noted that, for ease of description, only the parts relevant to the present disclosure are shown in the accompanying drawings.
[0054] It should be noted that, where there is no conflict, the embodiments and features described in this disclosure can be combined with each other. The technical solutions of this disclosure will now be described in detail with reference to the accompanying drawings and embodiments.
[0055] Unless otherwise stated, the exemplary implementations / embodiments shown are to be understood as providing exemplary features of various details that provide ways in which the technical concepts of this disclosure can be implemented in practice. Therefore, unless otherwise stated, the features of various implementations / embodiments may be additionally combined, separated, interchanged and / or rearranged without departing from the technical concepts of this disclosure.
[0056] The use of crosshairs and / or shading in the accompanying drawings is generally used to clarify the boundaries between adjacent components. Thus, unless otherwise stated, the presence or absence of crosshairs or shading does not convey or indicate any preference or requirement for the specific material, material properties, dimensions, proportions, commonalities between the illustrated components, or any other characteristics, properties, etc., of the components. Furthermore, in the accompanying drawings, the dimensions and relative dimensions of components may be exaggerated for clarity and / or descriptive purposes. When exemplary embodiments can be implemented differently, a specific process sequence may be performed in a different order than that described. For example, two consecutively described processes may be performed substantially simultaneously or in the reverse order of their description. Moreover, the same reference numerals denote the same components.
[0057] When a component is referred to as being "on" or "above" another component, "connected to," or "joined to" another component, the component may be directly on, directly connected to, or directly joined to the other component, or there may be intermediate components. However, when a component is referred to as being "directly on" another component, "directly connected to," or "directly joined to" another component, there are no intermediate components. Therefore, the term "connection" can refer to a physical connection, an electrical connection, etc., and may or may not have intermediate components.
[0058] For descriptive purposes, this disclosure may use spatial relative terms such as “below,” “under,” “below,” “down,” “above,” “above,” “higher,” and “side (e.g., in a “sidewall”)” to describe the relationship between one component and another component as shown in the accompanying drawings. In addition to the orientations depicted in the drawings, the spatial relative terms are also intended to encompass different orientations of the device during use, operation, and / or manufacture. For example, if the device in the drawings is flipped, a component described as “below” or “under” another component or feature would subsequently be positioned “above” said other component or feature. Thus, the exemplary term “below” can encompass both “above” and “below” orientations. Furthermore, the device may be otherwise positioned (e.g., rotated 90 degrees or in other orientations), thus interpreting the spatial relative descriptive terms used herein accordingly.
[0059] The terminology used herein is for the purpose of describing particular embodiments and is not intended to be limiting. As used herein, unless the context clearly indicates otherwise, the singular forms “a” and “the” are intended to include the plural forms as well. Furthermore, when the terms “comprising” and / or “including” and variations thereof are used in this specification, it indicates the presence of the stated features, integrals, steps, operations, parts, components, and / or groups thereof, but does not exclude the presence or addition of one or more other features, integrals, steps, operations, parts, components, and / or groups thereof. It should also be noted that, as used herein, the terms “substantially,” “about,” and other similar terms are used as approximate terms rather than as terms of degree, thus explaining the inherent biases in measurements, calculated values, and / or provided values that would be recognized by one of ordinary skill in the art.
[0060] the term:
[0061] Photonic quantum flux density (PPFD) refers to the luminous flux density of photosynthetically active radiation. It represents the number of photons incident per unit area per unit time in the wavelength range of 400-700 nm, and the unit is usually μmol / m². 2 *s.
[0062] Figure 1 This is a schematic diagram of the structure of a photonic quantum flux sensor 100 according to one embodiment of the present disclosure. Figure 2 A schematic diagram illustrating the specific structure of the optical quantum flux sensor 100 is shown.
[0063] like Figure 1 As shown, the optical quantum flux sensor of this disclosure includes:
[0064] The photoelectric conversion unit 102 is used to collect the pulse light signal of the light source under test and convert it into a pulse electrical signal;
[0065] The signal amplification unit 104 is used to amplify the pulse electrical signal from the photoelectric conversion unit into a DC voltage signal;
[0066] The analog-to-digital conversion unit 106 is used to perform analog-to-digital conversion on the DC voltage signal to generate a digital signal.
[0067] The control unit 108 stores a calibration data table, which contains calibration data of photon flux density within a predetermined interval. The value of each calibration data is the standard value of the digital signal corresponding to the corresponding photon flux density. The control unit 108 is used to sample, filter, and look up the digital signal from the analog-to-digital converter to determine the calibration data corresponding to the digital signal and provide the calibration data to the digital-to-analog converter unit.
[0068] The digital-to-analog conversion unit 110 is used to perform digital-to-analog conversion on the calibration data from the control unit 108 to generate an analog signal indicating the current photon flux density of the light source under test;
[0069] The power supply unit 112 is used to connect an external power supply to supply power to the signal amplification unit, analog-to-digital conversion unit, control unit, and digital-to-analog conversion unit.
[0070] The light source under test in this disclosure can be, but is not limited to, any light source capable of emitting pulsed light signals. For example, the light source under test can be a plant LED or other similar light source.
[0071] The photoelectric conversion unit 102 may include an optical diffuser 1022 and a photoelectric converter 1024. The optical diffuser 1022 can be used to collect pulsed light signals from the light source under test so that they illuminate the receiving end of the photoelectric converter. The photoelectric converter 1024 can be used to receive the pulsed light signals from the light source under test and perform photoelectric conversion on them to generate pulsed electrical signals. Alternatively, the photoelectric conversion unit 102 may only include the photoelectric converter 1024, or it may employ a photoelectric conversion device that integrates a light signal collection function.
[0072] like Figure 2As shown, the optical diffuser 1022 can be, but is not limited to, a cosine corrector. A cosine corrector can be used for spectral radiation sampling, collecting light within a 180° solid angle, thereby reducing optical coupling problems caused by the limitations of the light collection sampling geometry in other sampling devices. Alternatively, the optical diffuser 1022 can also employ other devices with light signal collection capabilities; this disclosure does not limit the scope of the embodiments.
[0073] like Figure 2 As shown, the photoelectric converter 1024 can be, but is not limited to, a silicon photovoltaic cell. Specifically, a pulsed light signal is irradiated onto the receiving end of the silicon photovoltaic cell through an optical diffuser 1022, such as a cosine corrector. The silicon photovoltaic cell responds to the pulsed light signal by generating a pulsed electrical signal and sending it to the signal amplification circuit 104. Alternatively, the photoelectric converter 1024 can also employ other devices with photoelectric conversion functions; this disclosure does not limit the scope of the embodiments.
[0074] like Figure 2 As shown, the signal amplification unit 104 may include a first-stage operational amplifier circuit 1042 and a second-stage operational amplifier circuit 1044 connected in series. The first-stage operational amplifier circuit 1042 can amplify the pulse electrical signal from the photoelectric conversion unit and output a DC voltage signal, while the second-stage operational amplifier circuit 1044 can amplify the DC voltage signal from the first-stage operational amplifier circuit. Using two stages of operational amplifier circuits can reduce data errors. Alternatively, the signal amplification unit 104 may also employ a single-stage or multi-stage operational amplifier circuit; this embodiment of the present disclosure does not impose limitations on this.
[0075] The pulse electrical signal is amplified by the signal amplification unit 104 and converted into a DC voltage signal. Taking a series two-stage operational amplifier circuit as an example, the pulse electrical signal output by the photoelectric converter 1024 can be converted into a 0-2.5V DC voltage signal by the first-stage operational amplifier circuit, and then converted into a 0-5V DC voltage signal by the second-stage operational amplifier circuit. Thus, the signal amplification unit 104 can amplify the pulse electrical signal from the photoelectric conversion unit 102 into a 0-5V DC voltage signal.
[0076] like Figure 2 As shown, the analog-to-digital converter 106 can employ, but is not limited to, a 12-bit TLC2543 A / D converter chip, which can convert the DC voltage signal from the signal amplification unit 104 into a 12-bit digital signal that the control unit 108 can read. Alternatively, the analog-to-digital converter 106 can also employ, for example, an 8-bit TLC2543 A / D converter chip, a 16-bit TLC2543 A / D converter chip, or other A / D converter chips.
[0077] The analog-to-digital converter unit 106 can convert DC voltage signals into digital signals under the control of the control unit 108. Taking the TLC2543 A / D converter chip as an example, the control unit 108 can run an analog-to-digital conversion subroutine (e.g., the TLC2543 subroutine) to control the analog-to-digital conversion process of the analog-to-digital converter unit 106.
[0078] like Figure 2 As shown, the control unit 108 can be connected to the analog-to-digital converter unit 106 via a Serial Peripheral Interface (SPI) bus. Taking the TLC2543A / D converter chip as an example, the control unit 108 can be connected to the three control input terminals of the TLC2543A / D converter chip via three signal lines: chip select (CS), input / output clock (I / O CLOCK), and serial data input (DATA INPUT). At regular intervals, the control unit 108 can send instructions to the TLC2543A / D converter chip, allowing the TLC2543A / D converter chip to transmit data to the control unit 108. The TLC2543A / D converter chip uses a shift transfer method to send a fixed-bit digital signal (e.g., a 12-bit digital signal) to the control unit 108.
[0079] Taking the TLC2543A / D converter chip as an example, the analog-to-digital conversion process and data transmission flow of the analog-to-digital conversion unit 106 under the control of the control unit 108 are as follows: Figure 3 As shown, it can include: TLC2543A / D converter chip interface definition, delay and measurement bit address declaration, TLC2543A / D reading sub-function, MCU communication port initialization, analog-to-digital conversion start, after the output flag bit, the control unit reads the analog-to-digital conversion data, reads the measurement address bit, sends a clock signal to the TLC2543A / D converter chip, the address of the TLC2543A / D converter chip shifts to the next channel, the data shifts to the next bit for reading and writing, and after the 12-bit data conversion is completed, the TLC2543A / D converter chip is disabled.
[0080] like Figure 2As shown, the control unit 108 can be implemented as, but is not limited to, a microcontroller, which can be connected to the analog-to-digital converter 106 and the digital-to-analog converter 110 via an SPI bus or any other applicable method. The control unit 108 may include a memory 1082 and a controller 1084. The memory 1082 stores a filtering program, a fitting program, and a pre-determined calibration data table. The calibration data table contains calibration data for the photon flux density within a predetermined interval, and the values of these calibration data are the calibration values of the digital signals corresponding to the respective photon flux densities. The processor 1084 can be used to read the calibration data table, the filtering program, and the fitting program from the memory 1082, and run the filtering program and the fitting program to perform sampling, filtering, and table lookup operations on the digital signals according to the calibration data table, thereby determining the calibration data corresponding to the digital signals.
[0081] The calibration data table contains pre-determined calibration data that correspond to the photon flux density within a predetermined range. For example, the calibration data table may contain M calibration data points (M is an integer greater than 1), corresponding to 0.0–1000.0 μmol / m³. 2 The photon flux density is S, where each calibration data point represents the standard value of the digital signal corresponding to its photon flux density. For example, among the M calibration data points, the value corresponds to 800.0 μmol / m³. 2 The calibrated value of the photon flux density of S is 800.0 μmol / m. 2 The standard value of the digital signal corresponding to the photon flux density of S.
[0082] The calibration data in the calibration data table has the same numerical format as the digital signal. Taking the TLC2543A / D converter chip as an example, the digital signal value is a 12-bit binary number, and the calibration data value can also be a 12-bit binary number.
[0083] Among all the calibration data in the calibration data table, the calibration data corresponding to the digital signal is closest to the value of the filtered digital signal. Specifically, the processor 1084 can be used to: first run a filtering program to sample and filter the digital signal from the analog-to-digital converter unit 106 to obtain the filtered digital signal; then run a fitting program to compare the filtered digital signal with each calibration data in the calibration data table to determine the calibration data closest to the value of the filtered digital signal; and finally send the calibration data to the digital-to-analog converter unit 110. Alternatively, the processor 1084 can also use other methods to complete the sampling, filtering, and table lookup of the digital signal. The embodiments of this disclosure do not limit the specific implementation process and method.
[0084] Figure 4 A schematic diagram illustrating an exemplary implementation of processor sampling filtering is shown. For example... Figure 4 As shown, the process of the processor sampling and filtering digital signals may include: defining variables, initializing variables and then sampling all digital signals of the light source under test within a certain period of time (for example, sampling N consecutive digital signals), adding the sampled data, stopping sampling when the number of times the sampled data is added reaches N, taking the average value of the sampled data, sending the average value (i.e., the filtered digital signal) into the fitting program, then entering the delay program, delaying for a period of time, and then entering the sampling and filtering of the next set of digital signals, etc.
[0085] Figure 5 A schematic diagram illustrating an exemplary implementation of a processor table lookup process is shown. For example... Figure 5 As shown, the lookup process may include: importing the value of the filtered digital signal; comparing the digital signal with the calibration data corresponding to each quantum flux density in the pre-determined calibration data table; first comparing the digital signal with calibration data 1; when the value X of the digital signal is greater than 0 and less than the value of calibration data 1, assigning the value X of the digital signal to the value of calibration data 1 (i.e., determining that calibration data 1 is the calibration data corresponding to the digital signal); and sending calibration data 1 to the digital-to-analog converter unit. Step 110 initiates a delay, after which the next round of digital signal lookup and comparison begins. If the value X of the digital signal is greater than the value of calibration data 1, the digital signal and calibration data 2 are compared again. If the value X of the digital signal is greater than the value of calibration data 1 but less than the value of calibration data 2, the value X of the digital signal is assigned the value of calibration data 2, calibration data 2 is sent to the digital-to-analog converter 110, and a delay is initiated. After a delay, the next round of digital signal lookup and comparison begins, and so on. The calibration data in the calibration data table are sorted by value from smallest to largest. The calibration data whose value is closest to the digital signal is determined by comparing values one by one. This method is not only simple and easy to implement, but also less prone to errors.
[0086] The digital-to-analog converter 110 may be, but is not limited to, a TLC5615D / A converter chip, which converts the calibration data sent by the control unit 108 into an analog signal and outputs it. For example, the analog signal may be, but is not limited to, a DC voltage signal of 0 to 5V, or a DC current signal of 4 to 20mA.
[0087] Figure 6 This diagram illustrates a specific implementation process of the TLC5615D / A converter chip for analog-to-digital conversion. Taking the TLC5615D / A converter chip as an example, as... Figure 6As shown, the digital-to-analog conversion process may include: First, setting the D / A conversion chip to a low level to start the digital-to-analog conversion; shifting one bit of data to the internal 16-bit register on the rising edge of the clock signal SLCK; after all data bits have been shifted, latching 10 bits of valid data into the 10-bit register; the digital-to-analog conversion is complete; CS is enabled and reset; and the analog signal or the value of the analog signal is output.
[0088] In some implementations, such as Figure 2 As shown, the power supply unit 112 may include an adjustable voltage module 1122. The adjustable voltage module is connected to an external power supply and is used to adjust the voltage of the external power supply to supply power to the signal amplification unit 104, the analog-to-digital conversion unit 106, the control unit 108, and the digital-to-analog conversion unit 110, respectively. In specific applications, the adjustable voltage module can be implemented by a power chip, which can convert the external voltage input to the optical quantum flux sensor into the voltage required by each unit.
[0089] In some implementations, such as Figure 2 As shown, the power supply unit 112 may further include a negative voltage generator 1124, used to convert the voltage provided by the external power supply into a negative voltage and provide the negative voltage as a reference voltage for the signal amplification unit 104. Taking a two-stage operational amplifier circuit as an example, the negative voltage generator 1124 converts the voltage of the input optical quantum flux sensor into a negative voltage and provides reference voltages for the first-stage operational amplifier circuit and the second-stage operational amplifier circuit, respectively.
[0090] The following is based on Figure 2 Taking the specific structure of the light quantum flux sensor in this disclosure as an example and using LED light-emitting diodes for plants, the processing procedure of the sensor in this embodiment is explained in detail. Figure 2As shown, the light emitted by the LED light-emitting diode for plants is collected by a cosine corrector and then shines on a silicon photodiode. The silicon photodiode collects the pulse light signal from the LED light-emitting diode for plants and converts it into a pulse electrical signal, which is then sent to the first-stage operational amplifier circuit. After being amplified by the first-stage operational amplifier circuit, it enters the second-stage operational amplifier circuit to amplify it to the level required by the 12-bit TLC2543A / D converter chip and is then sent to the TLC2543A / D converter chip. After analog-to-digital conversion by the TLC2543A / D converter chip, a digital signal is obtained. The digital signal enters the microcontroller through the SPI bus. The processor in the microcontroller reads the filtering program and fitting program in the memory, performs sampling, filtering, table lookup, and other processing on the digital signal according to the pre-stored calibration data table, and determines the calibration data corresponding to the digital signal. The calibration data corresponding to the digital signal is then sent to the TLC5615D / A converter chip through the SPI bus. The TLC5615D / A converter chip converts the digital signal into an analog signal and outputs it. External devices, such as lighting control equipment, can directly adjust parameters such as the light intensity of the LED light-emitting tubes used in plants based on the analog signal, so that the LED light-emitting tubes can provide the plants with the required light, thereby achieving the purpose of increasing yield.
[0091] Figure 7 A schematic flowchart of a photonic quantum flux measurement method according to an embodiment of this disclosure is shown. This photonic quantum flux measurement method is implemented using the aforementioned photonic quantum flux sensor. Figure 7 As shown, the method for measuring optical quantum flux may include the following steps S702 to S708:
[0092] Step S702: Acquire the pulsed light signal from the light source under test and convert it into a pulsed electrical signal;
[0093] Step S704: Amplify the pulse electrical signal into a DC voltage signal;
[0094] Step S706: Perform analog-to-digital conversion on the DC voltage signal to generate a digital signal;
[0095] Step S708: The digital signal from the analog-to-digital converter is sampled, filtered, and looked up according to the pre-stored calibration data table to determine the calibration data corresponding to the digital signal. The calibration data table contains calibration data of photon flux density within a predetermined interval, and the value of each calibration data is the standard value of the digital signal corresponding to the corresponding photon flux density.
[0096] Step S710: Perform digital-to-analog conversion on the calibration data corresponding to the digital signal to generate an analog signal that indicates the current photonic quantum flux density of the light source under test.
[0097] Among all the calibration data in the calibration data table, the calibration data corresponding to the digital signal is closest to the value of the filtered digital signal. Specifically, step S708 may include: first, allowing the filtering program to sample and filter the digital signal from the analog-to-digital converter to obtain the filtered digital signal; and then, running the fitting program and reading the calibration data table to compare the values of the filtered digital signal with the calibration data in the calibration data table, thereby determining the calibration data whose value is closest to the filtered digital signal.
[0098] Further details regarding the method for measuring optical quantum flux can be found in the previous description of the optical quantum flux sensor, and will not be repeated here.
[0099] In the description of this specification, the references to terms such as "one embodiment / mode," "some embodiments / modes," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment / mode or example is included in at least one embodiment / mode or example of this disclosure. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment / mode or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments / modes or examples. Furthermore, without contradiction, those skilled in the art can combine and integrate the different embodiments / modes or examples described in this specification, as well as the features of different embodiments / modes or examples.
[0100] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this disclosure, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0101] Those skilled in the art should understand that the above embodiments are merely for illustrating the present disclosure and are not intended to limit the scope of the disclosure. Those skilled in the art can make other changes or modifications based on the above disclosure, and these changes or modifications still fall within the scope of the present disclosure.
Claims
1. A photoelectric quantum flux sensor, characterized in that, include: The photoelectric conversion unit is used to collect the pulse light signal of the light source under test and convert it into a pulse electrical signal; The signal amplification unit is used to amplify the pulse electrical signal from the photoelectric conversion unit into a DC voltage signal; The analog-to-digital conversion unit is used to convert DC voltage signals into digital signals. The control unit stores a calibration data table, which contains calibration data of photon flux density within a predetermined interval. The value of each calibration data is the standard value of the digital signal corresponding to the corresponding photon flux density. The control unit is used to sample, filter, and look up the digital signal from the analog-to-digital converter to determine the calibration data corresponding to the digital signal and provide the calibration data to the digital-to-analog converter unit. The digital-to-analog conversion unit is used to convert calibration data from the control unit into digital signals to generate an analog signal indicating the current quantum flux density of the light source under test. The power supply unit is used to connect an external power source to supply power to the signal amplification unit, analog-to-digital conversion unit, control unit, and digital-to-analog conversion unit. The control unit includes a memory and a processor; The memory is used to store the calibration data table, filtering program, and fitting program; The processor is used to read the calibration data table, filtering program and fitting program in the memory, and run the filtering program and fitting program to complete the sampling, filtering and table lookup operations of the digital signal according to the calibration data table to determine the calibration data corresponding to the digital signal. Among all the calibration data in the calibration data table, the calibration data corresponding to the digital signal is closest to the value of the filtered digital signal. The signal amplification unit includes a first-stage operational amplifier circuit and a second-stage operational amplifier circuit connected in series. The first-stage operational amplifier circuit is used to amplify the pulse electrical signal from the photoelectric conversion unit and output a DC voltage signal; The second-stage operational amplifier circuit is used to amplify the DC voltage signal from the first-stage operational amplifier circuit and then output it. The power supply unit includes a negative voltage generator, used to convert the voltage provided by the external power supply into a negative voltage and provide the negative voltage as a reference voltage to the signal amplification unit.
2. The optical quantum flux sensor according to claim 1, characterized in that, The photoelectric conversion unit includes: An optical diffuser is used to collect pulsed light signals from the light source under test so that they can illuminate the receiving end of the photoelectric converter. A photoelectric converter is used to receive pulsed light signals from the light source under test and convert them into pulsed electrical signals.
3. The optical quantum flux sensor according to claim 2, characterized in that, The optical diffuser is a cosine corrector.
4. The optical quantum flux sensor according to claim 2, characterized in that, The photoelectric converter is a silicon photovoltaic cell.
5. The optical quantum flux sensor according to claim 1, characterized in that, The power supply unit includes an adjustable voltage module for adjusting the voltage of the external power supply to supply power to the signal amplification unit, analog-to-digital conversion unit, control unit, and digital-to-analog conversion unit, respectively.
6. A method for measuring the optical quantum flux based on the optical quantum flux sensor according to any one of claims 1 to 5, characterized in that, include: Acquire pulsed light signals from the light source under test and convert them into pulsed electrical signals; Amplify the pulse electrical signal into a DC voltage signal; Perform analog-to-digital conversion on DC voltage signals to generate digital signals; The digital signal from the analog-to-digital converter is sampled, filtered, and looked up according to a pre-stored calibration data table to determine the calibration data corresponding to the digital signal. The calibration data table contains calibration data of photon flux density within a predetermined interval, and the value of each calibration data is the standard value of the digital signal corresponding to the corresponding photon flux density. The calibration data corresponding to the digital signal is converted from digital to analog to generate an analog signal that indicates the current photonic flux density of the light source under test.