A method for calibrating the spectral response of an x-ray time resolved recording system

Abstract

The application discloses an X-ray time-resolved recording system spectrum response calibration method, S1: a pulsed laser is used to bombard the end face of a filament target, and an X-ray light source is generated through laser ablation; S2: different types of crystal spectrometers are arranged in an axisymmetric manner in space along the axis of the filament target, and the crystal spectrometers at least include a static crystal spectrometer, a stripe crystal spectrometer and a gated crystal spectrometer, wherein the recording medium response characteristics of the static crystal spectrometer are known or have been accurately calibrated, and the stripe crystal spectrometer and the gated crystal spectrometer are time-resolved crystal spectrometers with recording device response characteristics to be calibrated; S3: the spectrum response of the recording medium used by each crystal spectrometer is calibrated offline on a synchrotron radiation or a laboratory X-ray light source platform, and a calibration curve is obtained; and S4: the measured spectrum data of each crystal spectrometer and the offline calibration data of components such as crystals, filters, IPs, films or CCDs are known quantities.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of high-energy-density physical X-ray diagnostic technology, and particularly relates to a spectral response calibration method for an X-ray time-resolved recording system. BACKGROUND

[0002] In the experimental research in the fields of inertial confinement fusion, high-energy-density physics and laboratory astrophysics, in order to accurately measure the relevant physical state and its evolution and development, a ps or 10 ps level time-resolved ultrafast X-ray signal recording system is needed, which is currently mainly realized by means of X-ray framing camera and streak camera. Since the framing camera and the streak camera involve complex photoelectric conversion, transmission and amplification processes in the dynamic working mode, the response characteristics thereof are highly sensitive to the gain voltage, and it is difficult to calibrate the spectral response of the whole machine offline. The current calibration work is limited to the calibration of the photoelectric conversion efficiency of the cathode material, and the calibration of the processes such as electrical signal amplification and electro-optical conversion is still basically in a blank state, which greatly restricts the precision of related spectroscopy diagnosis.

[0003] In particular, the plasma parameter diagnosis related to X-ray spectroscopy requires that the semi-quantitative and quantitative measurement and recording of X-ray spectrum / spectra must be realized, and the current main measurement equipment is various types of crystal spectrometers. The X-ray recording equipment of the traditional crystal spectrometer is film, IP plate, CCD camera and the like, although these recording equipment can be calibrated by means of offline X-ray source, but lacks the function of ultrafast time resolution. In order to realize the time-resolved measurement, it is also necessary to use recording equipment such as X-ray streak camera and framing camera involving complex photoelectric processes, and the spectral response calibration of this kind of recording equipment is an important basis for realizing the time-resolved accurate diagnosis of plasma temperature, density and other parameters.

[0004] However, both the streak camera and the framing camera involve complex signal transmission processes such as photoelectric conversion, photoelectron signal amplification, and electro-optical conversion, and it is difficult to calibrate the response characteristics offline. Taking the streak camera device as an example, its structure is complex, and many factors affect the energy spectrum response under working conditions, such as the photoelectric conversion process of the cathode material, the electrical signal amplification process of the image intensifier, and the electro-optical conversion process of the fluorescent screen under pulsed dynamic working voltage. Offline calibration of the energy spectrum response of these processes is either technically difficult, such as the electrical signal amplification process of the image intensifier, or cannot accurately reflect the actual response characteristics under actual working conditions, such as the photoelectric conversion process on the cathode and the electro-optical conversion process of the fluorescent screen under pulsed dynamic working voltage, making it difficult to calibrate the X-ray energy spectrum response. In addition, the energy spectrum response of some components is complex, such as the cathode energy spectrum response of the streak camera. Taking the CsI cathode as an example, it is directly related to the photoelectric conversion process of the cathode material. This effect can be studied by using an offline X-ray source to study the response of the material and give calibration data. However, once the cathode is coupled to the fixed device, it is also affected by factors such as the angle, thickness, CH substrate thickness, Au layer thickness, and deliquescence under working conditions of the cathode material, making it difficult to calibrate the cathode component offline under working conditions and coupled to the device.

[0005] Similarly, the framing camera device is also complex, and the MCP gain composed of Au cathodes is also related to the gating pulse voltage, making it difficult to calibrate the X-ray energy spectrum response offline. Factors such as the angle of light incidence, the thickness of the Au layer, the depth of the coating, the MCP aperture, and the thickness of the MCP also affect the energy spectrum curve of the Au cathode MCP, making it difficult to calibrate the cathode component offline under working conditions and coupled to the device.

[0006] Therefore, in practical applications, the traditional partial component energy spectrum response calibration method cannot meet the needs of spectral quantitative measurement, and the entire machine energy spectrum response calibration of complex X-ray energy spectrum measurement recording devices such as streak cameras and framing cameras containing photoelectric conversion processes is needed to solve the problems that some components in the recording device cannot be calibrated offline and the offline energy spectrum response calibration of some components cannot accurately reflect the response under actual working conditions. In addition, since some factors related to the energy spectrum response of the cathode material, such as the deliquescence factor, are also related to the use time and the working environment, there is a clear need for regular or pre-use calibration of the recording device, which also requires convenient calibration of the entire machine of the recording device. SUMMARY

[0007] In view of the above status, the present application provides an X-ray time-resolved recording system energy spectrum response calibration method, which aims to solve the technical problems that some components in the recording device cannot be calibrated offline and the offline calibration data cannot accurately reflect the energy spectrum response under actual working conditions.

[0008] To achieve the above object, the technical scheme of the present application is as follows:

[0009] A kind of X-ray time-resolved recording system spectral response calibration method, its gist is, comprising the following steps:

[0010] S1: using pulsed laser irradiation filament target end face, laser ablation generates small scale, near-axis symmetric X-ray light source;

[0011] S2: with the filament target axis, in space axisymmetric arrangement different categories of crystal spectrometer, crystal spectrometer at least includes static crystal spectrometer, stripe crystal spectrometer and gated crystal spectrometer, wherein, the recording medium response characteristic of the static crystal spectrometer is known or has been accurately calibrated, the stripe crystal spectrometer and gated crystal spectrometer are recording device response characteristic time-resolved crystal spectrometer to be calibrated;

[0012] S3: offline in the platform of synchrotron radiation or laboratory X-ray light source, the spectral response calibration of recording medium used by the crystal spectrometer is carried out, and calibration curve is obtained;

[0013] S4, the spectral response calibration data of stripe camera, framing camera are acquired, and specific calibration method and data processing are as follows:

[0014] S4.1: from the same period, the same space light source signal , the spectral signal recorded by recording device , the overall spectral response function of diagnostic system Three satisfy the relationship:

[0015] ……(1);

[0016] ……(2);

[0017] The above is the X-ray photon frequency corresponding to the energy point;T1 is the transmittance of crystal spectrometer prefilter;T2 is the transmittance of postfilter;R is the energy-dependent crystal integral reflectivity; is the crystal diffraction factor; is the geometric factor determined by the optical path geometry;Q is the response function of recording device

[0018] S4.2: static crystal spectrometer satisfies the relationship , the recording device to be calibrated corresponding crystal spectrometer satisfies the relationship Therefore, there is the relationship:

[0019] ……(3);

[0020] According to formula (1), (2) and (3), the recording system energy spectrum response function of the crystal spectrometer to be calibrated The relationship is:

[0021] …(4);

[0022] S4.3: The spectral data obtained from the experiment can provide static crystal spectrometer measurement spectrum from the same spatial position, recording the same period and the crystal spectrometer to be calibrated ;

[0023] The calibration work of the same energy point or energy section of the recording medium used by each crystal spectrometer completed by the existing offline calibration can provide the energy spectrum response functions of three types of elements, denoted as the transmittance of the pre-filter of the static crystal spectrometer , the transmittance of the post-filter , the energy-dependent crystal integral reflectivity , the crystal diffraction factor and the response function of the IP or film recording medium , denoted as the transmittance of the pre-filter of the crystal spectrometer to be calibrated , the transmittance of the post-filter , the energy-dependent crystal integral reflectivity and the crystal diffraction factor ;

[0024] The geometric factor of the static crystal spectrometer can be provided by the optical path geometry of the crystal spectrometer , the geometric factor of the crystal spectrometer to be calibrated response function curve;

[0025] After obtaining the above parameters, the recording system energy spectrum response of the crystal spectrometer to be calibrated can be solved using equation (4).

[0026] Preferably, in the step S1, a suitable filament target material is selected according to the required calibration energy point or energy section, or a mixed film is doped and plated on the end face of the filament target.

[0027] Preferably, in the step S1, the end face area of the filament target is less than or equal to the laser focal spot area.

[0028] Preferably, in the step S1, the pulsed laser is composed of one or more pulsed lasers superimposed, and the pulsed laser power density ranges from 10 14 -10 16 W / cm 2 .

[0029] Preferably, in the step S2, each crystal spectrometer is located on a horizontal plane parallel to the end face of the filament target.

[0030] Preferably, each of the crystal spectrometers is equal to the angle between the filament target end face, and the angle is not more than 45°.

[0031] Preferably, in the step S2, the recording medium comprises an IP plate, a film or a CCD camera.

[0032] Preferably, in the step S2, the streak crystal spectrometer is composed of a streak camera and a crystal spectrometer; and the gated crystal spectrometer is composed of a framing camera and a crystal spectrometer.

[0033] The present application has the following beneficial effects:

[0034] 1. The X-ray time-resolved recording system spectrum response calibration method provided by the present application can measure spectral data by each crystal spectrometer, and can obtain the spectrum response calibration data of the recording device (streak camera, framing camera) to be calibrated by calculating the offline calibration data of the components such as crystals, filters, IPs, films or CCDs, thereby solving the technical problem that some components in the X-ray recording device are difficult to calibrate offline in the prior art.

[0035] 2. The X-ray time-resolved recording system spectrum response calibration method provided by the present application can accurately reflect the spectrum response of the recording device under actual working conditions by calculating and solving the offline calibration data.

[0036] 3. The X-ray time-resolved recording system spectrum response calibration method provided by the present application can simultaneously calibrate multiple recording devices.

[0037] 4. The traditional method only calibrates some elements or element materials of the recording system offline, and the material preparation and element process itself have different technical maturity, which greatly affects the X-ray spectrum response, and the calibration data is difficult to be applied to the whole machine, and the factors such as the assembly angle of the element in the whole machine and the voltage of the electronic system cannot be considered in the calibration, and the calibration method provided by the present application can consider such problems. BRIEF DESCRIPTION OF DRAWINGS

[0038] Figure 1 The calibration system experiment design and diagnosis arrangement diagram of the present application;

[0039] Figure 2 The diagnosis design schematic diagram of the calibration method of the present application applied to the Shenguang III laser;

[0040] Figure 3 The Ti spectrum image measured by the static, streak and gated crystal spectrometers;

[0041] Figure 4 (a) is the spectrum distribution of the static crystal spectrometer figure; Figure 4(b) Spectral distribution of the stripe crystal spectrometer from the same time period. ;

[0042] Figure 5 (a) Spectral distribution of the striped crystal spectrometer at 1080 ps ; Figure 5 (b) Spectral distribution of gated crystal spectrometers from the same time period. ;

[0043] Figure 6 This is a flowchart of the overall energy spectrum relative response data processing for striped and framing cameras. Detailed Implementation

[0044] The present invention will be further described below with reference to the embodiments and accompanying drawings.

[0045] A method for calibrating the energy spectral response of an X-ray time-resolved recording system, please refer to the attached document. Figure 1 As shown, the calibration method includes the following steps:

[0046] S1: One or more lasers 3 emit pulsed laser light to irradiate the filamentous target 1 (a high-Z material with a filamentous structure). The laser ablates the target material to generate a small-sized, paraxially symmetric X-ray source. This process can be carried out by selecting materials according to the required calibration energy point and energy range. Alternatively, a mixed coating can be applied to the end face of the filamentous material to increase the calibration energy point or energy range.

[0047] S2: Multiple crystal spectrometers of different types are placed in an axisymmetric orientation with the filamentous target 1 as the axis to measure X-ray spectral images generated by laser bombardment of the target material in the same time period and space. One of the crystal spectrometers is a static crystal spectrometer 5 with known or precisely calibrated response characteristics of the recording medium (IP plate 5a, film, or CCD), and the rest are time-resolved crystal spectrometers with response characteristics to be calibrated. In this embodiment, the time-resolved crystal spectrometers with response characteristics to be calibrated are a stripe crystal spectrometer 2 and a gated crystal spectrometer 4. The stripe crystal spectrometer 2 consists of a stripe camera 4a and a crystal spectrometer; the gated crystal spectrometer 4 consists of a framing camera 4a and a crystal spectrometer.

[0048] S3: Offline calibration of the energy spectrum response of diffraction crystals, filters, IP plates, films, or CCDs used in the above-mentioned crystal spectrometers on a synchrotron radiation or laboratory X-ray source platform to obtain calibration curves.

[0049] S4 obtains energy spectrum response calibration data from complex recording systems such as streak cameras and framing cameras. The specific calibration method, principle, and data processing method are as follows:

[0050] S4.1: Light source signals from the same time period and space Spectral signals recorded by the recording device , the overall spectral response function of the diagnostic system The three satisfy the relation:

[0051] …(1);

[0052] wherein, is the X-ray photon frequency corresponding to the energy point;

[0053] The spectral response function of the crystal spectrometer The spectral response function of the crystal spectrometer is composed of the pre-filter transmittance T1, the post-filter transmittance T2, the energy-dependent crystal integral reflectivity R, the crystal diffraction factor , the geometric factor determined by the optical path geometry and the response function Q of the recording device, which are relatively independent of each other, and satisfy the relation:

[0054] …(2);

[0055] S4.2: The static crystal spectrometer satisfies the relation The recording device to be calibrated corresponding to the crystal spectrometer satisfies the relation Therefore, there is the relation:

[0056] …(3);

[0057] Then, according to the relations (1), (2) and (3), the spectral response function of the recording system of the crystal spectrometer to be calibrated satisfies the following relation (4):

[0058] …(4);

[0059] S4.3: The spectral data obtained from the experiment can provide the measured spectrum of the static crystal spectrometer from the same spatial position and the same period of recording and the measured spectrum of the crystal spectrometer to be calibrated The calibration work of the same energy point or energy segment of the crystals, filters and IP or film recording media used by the static crystal spectrometer and the crystal spectrometer to be calibrated, which is completed by the existing offline calibration technology, can provide the spectral response functions of the three types of elements, denoted as the pre-filter transmittance , the post-filter transmittance , the energy-dependent crystal integral reflectivity , the crystal diffraction factor and the response function of the IP or film recording medium , denoted as the pre-filter transmittance , the post-filter transmittance Energy-dependent crystal volume integral reflectivity and crystal diffraction factor The geometry factor of the static crystal spectrometer can be provided by the optical path geometry of the crystal spectrometer The geometry factor of the crystal spectrometer to be calibrated Response function curve.

[0060] After the above data is obtained, the recording system energy spectrum response of the crystal spectrometer to be calibrated That is, the relationship (4) is solved.

[0061] In the embodiment, the "filament target 1" design adopted in the experimental calibration system has a filament end surface area ≤ laser focal spot area, so as to ensure that the laser intensity in the action area is uniform, and the other end surface of the filament is coated with a CH type low-Z material.

[0062] In the embodiment, the diagnosis direction of each type of crystal spectrometer equipment in step S2 is located in a horizontal plane parallel to the end surface of the filament target (i.e., perpendicular to the filament target 1), the angle between each type of crystal spectrometer equipment and the end surface of the filament target is consistent, and satisfies ≤45°.

[0063] The X-ray time-resolved recording system energy spectrum response calibration method provided in the embodiment fills the following technical gaps: 1. There is a lack of offline calibration method and experimental calibration system for the spectral response of the streak camera, framing camera and other time-resolved recording systems. 2. The streak camera, framing camera and other time-resolved recording systems containing photoelectric conversion (Au or CsI cathode), electro-optical conversion (fluorescent screen) and energy spectrum response multi-layer materials are difficult to calibrate the energy spectrum of all elements of the system offline. Therefore, compared with the traditional calibration method, the advantages of the method are: the traditional method only calibrates part of the elements or element materials of the recording system offline, and the material preparation and element process itself has a difference in technical maturity, which has a greater impact on the X-ray energy spectrum response, and the calibration data is difficult to generalize to the whole machine. The assembly angle of the element in the whole machine, the voltage of the electronic system and other factors cannot be considered in the calibration, and the calibration method provided in the embodiment can consider such problems uniformly.

[0064] The following provides a specific experimental verification case based on the above method, and the experimental verification result proves the feasibility of the calibration method.

[0065] The experimental verification is based on the Shenguang III laser, and the diagnosis design arrangement is as follows Figure 1 and Figure 2The experiment employed two sets of lasers (3) emitting two laser beams, each with an energy of 800 J / 1 ns square wave and a focal spot diameter of 300 μm. These beams acted on a vertically placed Ti filament target (1). The Ti filament target (1) had a 200 μm x 200 μm square end face. When the laser ablated the Ti filament end face, it expanded downwards, generating a downward-ejected high-temperature Ti plasma that emitted X-ray spectra. The X-ray spectra were isotropically distributed on the same horizontal plane. In a single-shot experiment, at a position 25° east of south of the horizontal equatorial plane, a static crystal spectrometer (5) with IP plate (5a) was used to acquire time-integrated and spatially resolved X-ray spectra; at a position 25° west of south of the horizontal equatorial plane, a crystal spectrometer with a streak camera (2a) was used to acquire time-resolved and spatially integrated X-ray spectra; and at a position 25° west of north of the horizontal equatorial plane, a crystal spectrometer with a framing camera (4a) was used to acquire simultaneous time- and spatially resolved X-ray spectra. The spectral results are attached. Figure 3 As shown.

[0066] Then, based on the calibration method proposed above, for Figure 3 (a) The spatially resolved spectrum recorded by the IP medium was spatially integrated to obtain the temporal and spatial integrated X-ray spectral line distribution of the IP plate over 5 years, as shown in [reference]. Figure 4 (a), corresponding to ,right Figure 3 (b) The spectra recorded by the streak camera were time-integrated to obtain the X-ray spectral line distribution from the same time period and spatial region, see [reference needed]. Figure 4 (b) is The energy spectrum response correction of the crystal spectrometer structure is affected by the transmittance T1 of the pre-filter, T2 of the post-filter, the crystal response R, and the crystal rocking angle. Relationship between solid geometry cone angle and recording plane The energy spectrum response function of the recording medium is determined by I. These data can be obtained through direct calibration, denoted as Therefore, according to relation (2), the relative energy spectrum response correction function corresponding to the He-H characteristic spectral points of Ti obtained by the stripe crystal spectrometer is obtained. Based on the known response correction curve data of the crystal, filter, and geometric relationship of the crystal spectrometer front end, the energy spectrum response correction value of the streak camera can be given. See Table 1 below.

[0067] Table 1: Correction table for the relative response coefficients of the streak camera in the He-H line spectrum of Ti relative to the 4749 eV energy point.

[0068]

[0069] Special note: If the overall energy spectrum response correction of the streak camera is considered... According to the experimental results , the temperature value of the diagnostic characterization is 2.40 keV; if the overall spectral response correction of the streak camera is not considered , according to the experimental results , the temperature value of the diagnostic characterization is 2.15 keV; this corresponds to a diagnostic technique, and introduces an error of about 16%, so it can be seen that the calibration correction method proposed in the present application can significantly improve the accuracy of plasma parameter diagnosis, and has important significance for the development of plasma parameter diagnosis and X-ray spectroscopy in the field of high-energy density physics.

[0070] At the same time, according to the calibration method proposed above Figure 3 , the spatial integral processing of the spectrum at is carried out to obtain the spatial integral X-ray spectrum line distribution of the framing camera , see Figure 5 (a), which corresponds to . In Figure 3 (b), the spatial integral X-ray spectrum line distribution of the streak camera recorded at the same is selected, see Figure 5 (b), which corresponds to . The overall response correction function of the streak crystal spectrometer has been obtained according to the crystal spectrometer data, so according to the relationship (3), the relative energy spectrum response correction function corresponding to the Ti He-like and H-like characteristic spectrum line energy points of the gated crystal spectrometer is obtained , and according to the known response correction curve data of the front-end crystal, filter and geometric relationship of the crystal spectrometer, the energy spectrum response correction value of the framing camera can be given , see Table 2 below.

[0071] Table 2: Relative response coefficient correction table of the framing camera in the Ti He-H line spectrum segment relative to the 4749 eV energy point

[0072]

[0073] It is particularly noted that if the overall spectral response correction of the framing camera is considered , according to the experimental results , the temperature value of the diagnostic characterization is 2.55 keV; if the overall spectral response correction of the framing camera is not considered , according to the experimental results , the temperature value of the diagnostic characterization is 2.20 keV; this corresponds to a diagnostic technique, and introduces an error of about 16%, so it can be seen that the calibration correction method proposed in the present application has important significance for the development of plasma parameter diagnosis and X-ray spectroscopy in the field of high-energy density physics.

[0074] The specific data processing flow chart of the relative response of the whole machine of the streak camera and the framing camera is shown in the attached Figure 6 .

[0075] Finally, it should be noted that the above description is merely preferred embodiments of the present application, and those of ordinary skill in the art can make various similar expressions under the inspiration of the present application without departing from the purpose and scope of the present application. Such changes fall within the scope of the present application.

Claims

1. A method for calibrating the energy spectrum response of an X-ray time-resolved recording system, characterized in that, Includes the following steps: S1: Using pulsed laser to bombard the end face of a filamentous target, laser ablation generates a small-scale, paraxially symmetric X-ray source. S2: Different types of crystal spectrometers are arranged symmetrically in space with respect to the axis of the filamentous target. The crystal spectrometers include at least a static crystal spectrometer, a stripe crystal spectrometer, and a gated crystal spectrometer. The recording medium response characteristics of the static crystal spectrometer are known or have been precisely calibrated. The stripe crystal spectrometer and the gated crystal spectrometer are time-resolved crystal spectrometers whose recording device response characteristics are to be calibrated. S3: Offline calibration of the energy spectrum response of the recording medium used by each crystal spectrometer on a synchrotron radiation or laboratory X-ray source platform to obtain calibration curves; S4. Obtain the energy spectrum response calibration data of the streak camera and the framing camera. The specific calibration method and data processing are as follows: S4.1: Light source signals from the same time period and space Spectral signals recorded by the recording device The overall energy spectrum response function of the diagnostic system The three parties satisfy the following relationship: ……(1)； ……(2)； above T1 represents the X-ray photon frequency corresponding to the energy point; T2 represents the transmittance of the pre-filter of the crystal spectrometer; T3 represents the transmittance of the post-filter; and R represents the energy-dependent integrated reflectance efficiency of the crystal. It is the crystal diffraction factor; The geometric factor is determined by the optical path geometry; Q is the response function of the recording device. Together, they form a geometric factor. S4.2: Static crystal spectrometer satisfies the following relation The crystal spectrometer corresponding to the recording device to be calibrated satisfies the following relationship. Therefore, the following relation exists: ……(3)； According to formulas (1), (2) and (3), the energy spectrum response function of the recording system of the crystal spectrometer to be calibrated is... The relation is: ……(4)； S4.3: Spectral data obtained from experiments can provide static crystal spectrometer measurements from the same spatial location and recorded over the same time period. Spectroscopy measured with the crystal spectrometer to be calibrated ; The calibration of the recording media used in various crystal spectrometers, completed through existing offline calibration, for the same energy point or energy range, can provide the energy spectral response functions of three types of components, and record the transmittance of the pre-filter of the static crystal spectrometer. Post-filter transmittance Energy-related crystal integral reflection efficiency Crystal diffraction factor Response function of IP or film recording media Record the transmittance of the pre-filter of the crystal spectrometer to be calibrated. Post-filter transmittance Energy-related crystal integral reflection efficiency and crystal diffraction factor ; The geometric factor of a static crystal spectrometer can be obtained from the optical path geometry of the crystal spectrometer. Geometric factors of the crystal spectrometer to be calibrated Response function curve; After obtaining the above parameters, the energy spectrum response of the recording system of the crystal spectrometer to be calibrated is... The solution can be obtained using relation (4).

2. The method for calibrating the energy spectrum response of an X-ray time-resolved recording system according to claim 1, characterized in that: In step S1, a suitable filamentous target material is selected according to the required calibration energy point and energy range, or a mixed coating is applied to the end face of the filamentous target.

3. The method for calibrating the energy spectrum response of an X-ray time-resolved recording system according to claim 1, characterized in that: In step S1, the end face area of ​​the filament target is less than or equal to the laser focal spot area to generate a small-scale, paraxially symmetric light source.

4. The method for calibrating the energy spectrum response of an X-ray time-resolved recording system according to claim 1, characterized in that: In step S1, the pulsed laser is composed of one or more superimposed pulsed laser beams, and the power density of the pulsed laser ranges from 10. 14 -10 16 W / cm 2 .

5. The method for calibrating the energy spectrum response of an X-ray time-resolved recording system according to claim 1, characterized in that: In step S2, each crystal spectrometer is located on a horizontal plane parallel to the end face of the filamentous target.

6. The method for calibrating the energy spectrum response of an X-ray time-resolved recording system according to claim 5, characterized in that: Each of the crystal spectrometers has an equal angle with the end face of the filamentous target, and this angle does not exceed 45°.

7. The method for calibrating the energy spectrum response of an X-ray time-resolved recording system according to claim 1, characterized in that: In step S2, the recording medium includes a diffraction crystal, a filter, an IP plate, film, or a CCD camera.

8. The method for calibrating the energy spectrum response of an X-ray time-resolved recording system according to claim 1, characterized in that: In step S2, the striped crystal spectrometer consists of a striped camera and a crystal spectrometer; the gated crystal spectrometer consists of a framing camera and a crystal spectrometer.

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