FLASH treatment system, cerenkov detector, beam flux measurement device and method thereof

Abstract

The application provides a FLASH treatment system, a Cerenkov detector, a beam flux measuring device and a method thereof. The Cerenkov detector comprises: a Cerenkov radiator, which is arranged on the path of the beam current and is irradiated by the beam current to generate Cerenkov radiation light propagating in the Cerenkov radiator; the direction of the beam current intersects with the receiving surface of the Cerenkov radiator, and the Cerenkov radiation light serves as light signals for measurement; and a light signal collection array, which is arranged on the light path of the Cerenkov radiation light and is not directly irradiated by the beam current, is used to collect the Cerenkov radiation light and output analog signals, and the analog signals are used to indicate the light intensity, light spot position and trigger time of the Cerenkov radiation light at different positions of the light signal collection array. Through the arrangement of the Cerenkov radiator and the light signal collection array, the detector remains relatively stable and is not prone to damage when measuring the beam current, and the service life of the detector is improved.

Description

[0001] This application is a divisional application of the invention patent application filed on September 22, 2023, with application number CN202311226317.2 and invention title "FLASH Treatment System, Cherenkov Detector, Beam Flow Measurement Device and Method Thereof". Technical Field

[0002] This application relates to the technical fields of beam flow measurement in medical devices and artificial intelligence, and particularly to FLASH therapeutic systems, Cherenkov detectors, beam flow measurement devices and methods thereof, electronic devices and computer-readable storage media. Background Technology

[0003] Particle therapy is a modern cancer treatment method that uses high-energy particles released by an accelerator to precisely target tumor cells, delivering energy directly into the tumor cells and killing them. Particle therapy allows for precise control of the radiation dose and range, reducing damage to healthy tissues while improving treatment effectiveness.

[0004] After several years of development, equipment performance has been greatly improved, and clinical treatment research has been greatly enriched. FLASH radiation therapy has emerged as a treatment option, demonstrating promising therapeutic effects. FLASH therapy delivers doses at dose rates tens to hundreds of times higher than those of commonly used medical equipment, delivering a large dose to the lesion in a short period of time.

[0005] Current beam flow measurement devices use silicon pixel array detectors at the detector end. The beam flow measurement is performed by directly bombarding local areas of the silicon pixels with charged particle pulses, which results in rapid local damage and short lifespan of the detector.

[0006] Based on this, this application provides a FLASH therapy system, a Cherenkov detector, a beam flow measurement device and method thereof, electronic equipment, and a computer-readable storage medium to improve related technologies. Summary of the Invention

[0007] The purpose of this application is to provide a FLASH therapy system, a Cherenkov detector, a beam current measurement device and method thereof, electronic equipment and computer-readable storage medium, which improve the detector's lifespan, enable simultaneous and unified measurement of multiple parameters and are applicable to different particle energy ranges.

[0008] The objective of this application is achieved through the following technical solution:

[0009] In a first aspect, this application provides a Cherenkov detector, the Cherenkov detector comprising:

[0010] A Cherenkov radiator is positioned in the path of a beam and is irradiated by the beam to generate Cherenkov radiation propagating within the Cherenkov radiator; the direction of the beam intersects with the receiving surface of the Cherenkov radiator, and the Cherenkov radiation serves as a measurement optical signal.

[0011] An optical signal collecting array is disposed in the optical path of the Cherenkov radiation and is not directly irradiated by the beam. It is used to collect the Cherenkov radiation and output an analog signal. The analog signal is used to indicate the light intensity, spot position and trigger time of the Cherenkov radiation at different positions of the optical signal collecting array.

[0012] In some possible implementations, the Cherenkov detector also includes:

[0013] The frame has an opaque channel for housing the optical signal collecting array so that it is not directly exposed to the beam.

[0014] In some possible implementations, the Cherenkov radiator has a docking end near the optical signal collection array. The part of the Cherenkov radiator not covered by the frame is covered with an opaque reflective coating to make it opaque, and the Cherenkov radiation light is transmitted to the optical signal collection array by specular reflection. The part of the Cherenkov radiator without the opaque reflective coating extends into the opaque channel and is covered by the frame to make it opaque.

[0015] In some possible implementations, the Cherenkov radiator includes:

[0016] At least one radiator unit, each radiator unit having a top surface and a bottom surface arranged opposite to each other, the radiator unit being used to receive the beam through the top surface and generate Cherenkov radiation;

[0017] And opaque reflective coatings respectively disposed on the bottom and top surfaces of the radiator unit, the opaque reflective coatings being used to prevent Cherenkov radiation from passing through the top and bottom surfaces.

[0018] In some possible implementations, a light shield is also included, which is disposed between the optical signal collecting array and the Cherenkov radiator to form a light-shielding space in the optical path of the Cherenkov radiation between the optical signal collecting array and the Cherenkov radiator.

[0019] In some possible implementations, the optical signal collection array includes multiple photoelectric conversion units arranged in an array, each of which is used to receive the Cherenkov radiation and output a corresponding analog signal.

[0020] In some possible implementations, the photoelectric conversion unit of the optical signal collection array is any one of the following: fiber optic bundle, photoresistor, photodiode, and phototransistor.

[0021] In some possible implementations, the optical signal collecting array and the docking end of the Cherenkov radiator are spaced apart along the optical path direction of the Cherenkov radiation.

[0022] In some possible implementations, the optical signal collecting array is positioned in at least two non-parallel optical path directions of the Cherenkov radiation.

[0023] In some possible implementations, the Cherenkov radiator is a cube, and the Cherenkov radiator is composed of multiple radiator units;

[0024] The radiator unit is a cuboid, and the side surfaces of the radiator unit and the end surfaces that do not face the light signal collection array are provided with an opaque reflective coating. Multiple radiator units are arranged closely together with their long sides to form the Cherenkov radiator.

[0025] Secondly, this application also provides a beam current measurement device for measuring the beam current output from an accelerator, the device comprising:

[0026] The Cherenkov detector according to any one of the first aspects, wherein the Cherenkov detector is used to receive the beam and output an analog signal;

[0027] A signal processing module, which is used to convert the analog signal into a digital signal and output it;

[0028] An information reconstruction module is used to measure the beam by reconstructing the physical information of the beam based on the digital signal. The physical information includes one or more combinations of the following: beam dose, beam energy, beam position, beam spot size information, and beam spot shape information.

[0029] Thirdly, this application also provides a beam current measurement method for measuring the beam current output from an accelerator using a beam current measurement device including a Cherenkov detector as described in any one of the first aspects, or a beam current measurement device as described in the second aspect, the method comprising:

[0030] The beam is received by a Cherenkov detector and an analog signal is output.

[0031] The analog signal is converted into a digital signal and output through the signal processing module;

[0032] The beam is measured by reconstructing the physical information of the beam based on the digital signal through the information reconstruction module. The physical information includes one or more combinations of the following: beam dose, beam energy, beam position, beam spot size information, and beam spot shape information.

[0033] In some possible implementations, the Cherenkov radiator includes at least one radiator unit, each radiator unit having a top surface and a bottom surface disposed opposite to each other, the radiator unit being used to receive the beam through the top surface and generate Cherenkov radiation.

[0034] The process of receiving the beam through a Cherenkov detector and outputting an analog signal includes:

[0035] The beam is received and Cherenkov radiation is generated using at least one radiator unit of the Cherenkov radiator.

[0036] By using opaque reflective coatings on the top and bottom surfaces of the radiator unit that generates Cherenkov radiation, the transmission of the Cherenkov radiation is prevented, and the Cherenkov radiation is transmitted to the optical signal collection array by specular reflection.

[0037] In some possible implementations, receiving the beam and outputting an analog signal via a Cherenkov detector further includes:

[0038] The signal collection array receives the Cherenkov radiation and outputs an analog signal, which is used to indicate the light intensity, spot position and trigger time of the light signal at different positions of the light signal collection array.

[0039] In some possible implementations, the method further includes:

[0040] The accelerator is diagnosed based on the physical information and preset beam setting parameters;

[0041] When the diagnostic results indicate that the beam setting parameters of the accelerator need to be adjusted, the beam setting parameters are input into the beam adjustment model to obtain the beam adjustment parameters of the accelerator.

[0042] The beam setting parameters are updated using the beam adjustment parameters;

[0043] The beam adjustment model is obtained by training a preset deep learning model using a training set.

[0044] Fourthly, this application also provides an electronic device comprising a memory and at least one processor, the memory for storing a computer program, and the processor for calling and running the computer program stored in the memory to cause the processor to perform the method as described in any one of the third aspects.

[0045] Fifthly, this application also provides a FLASH treatment system, characterized in that the FLASH treatment system includes an accelerator for generating a beam and the aforementioned beam flow measurement device.

[0046] Sixthly, this application also provides a computer-readable storage medium storing a computer program that, when executed by at least one processor, implements the steps of the method described in any of the third aspects or implements the functions of the electronic device described in the fourth aspect.

[0047] In a seventh aspect, this application provides a computer program product comprising a computer program that, when executed by at least one processor, implements the steps of any of the methods in the third aspect or implements the functions of any of the FLASH therapeutic systems described in the fourth aspect.

[0048] This application provides a FLASH therapy system, a Cherenkov detector, a beam current measurement device and method thereof, an electronic device, and a computer-readable storage medium. The advantages of this application are as follows:

[0049] On the one hand, the optical signal collection array in the Cherenkov detector does not need to interact directly with the beam; instead, it measures by receiving the generated optical signal. Therefore, unlike optical signal collection arrays directly bombarded by high-energy particles, it is not susceptible to severe energy deposition and damage. This allows the detector as a whole to remain relatively stable during beam measurement, less prone to damage and performance degradation. On the other hand, the physical spacing characteristics created by the introduction of the Cherenkov radiator allow the Cherenkov detector to continuously perform beam measurements for extended periods without degradation or failure due to interaction with the beam. This supports long-term or continuous experiments or measurements, resulting in accurate data and results. Furthermore, in beam measurement, accurately measuring the energy and properties of charged particle pulses is crucial. The benefits of continuous use ensure the stability and consistency of the Cherenkov radiation light (the generated analog signal), providing reliable and accurate measurement results to help physicians and researchers make correct judgments. Finally, this technology can simultaneously measure the energy (range), dose (current intensity or charge), beam shape, and position of the same beam (or pulse) without requiring different detectors. Specifically, Cherenkov radiation is generated when charged particles travel at speeds exceeding the speed of light in a medium, with its wavelength primarily concentrated in the ultraviolet band. The emission angle (radiation angle) of Cherenkov radiation is closely related to the velocity of the incident particle. For a given particle type, the particle's velocity (energy) is calculated using the emission angle in conjunction with the refractive index of the medium, and the emission angle can be deduced from the positional distribution of the light spot on the optical signal collection array. The formation time of the light spot on the detector is related to the incident position of the particle; by recording the formation time of different parts of the light spot and comparing their order, the incident position of the particle can be determined. The intensity of Cherenkov radiation is related to the deposited energy of the incident particle; by measuring the intensity of the optical signal, the energy deposited by the charged particle pulse in the medium can be obtained, thus providing dose information. Furthermore, the excitation time of Cherenkov radiation is on the picosecond level, meaning that Cherenkov radiation is generated within a picosecond time after a high-speed charged particle hits the radiator, which is negligible compared to the excitation time of any other optical response mechanism. The propagation time of light inside the radiator and the response time of semiconductor detectors (such as silicon pixel detectors) are on the order of 10 nanoseconds. Therefore, without considering electronic and back-end storage delays, the sampling frequency of Cherenkov detectors can reach hundreds of megahertz, a significant improvement compared to the response times of currently used gas ionization chamber and scintillator detectors. Such a high sampling frequency is necessary in the development of FLASH therapy methods, especially for FLASH pathways that increase current intensity by increasing pulse frequency. It has a wide range of applications and can be used in different particle energy ranges.

[0050] In summary, by setting up the Cherenkov radiator and optical signal collection array, and by restricting the beam direction, the physical separation effect is achieved, which makes the Cherenkov detector relatively stable when measuring the beam and less prone to damage and performance degradation. It has the advantages of continuous use, enabling experiments or measurements to obtain accurate data or results, more accurate measurement results, and multi-parameter measurement. Attached Figure Description

[0051] This application will be further described below with reference to the accompanying drawings and specific embodiments.

[0052] Figure 1 This is a structural block diagram of a Cherenkov detector provided in an embodiment of this application.

[0053] Figure 2 This is a schematic diagram of the structure of a Cherenkov detector provided in an embodiment of this application.

[0054] Figure 3 yes Figure 2 A cross-sectional view of a Cherenkov detector is provided.

[0055] Figure 4 This is a schematic diagram illustrating the principle of the beam directly acting on the beam detector.

[0056] Figure 5 This is a schematic diagram illustrating the principle of beam indirect action on the signal collection array.

[0057] Figure 6 This is an optical path diagram of incident particles entering a radiator from a beam provided in an embodiment of this application.

[0058] Figure 7 This is a structural block diagram of a beam flow measurement device provided in an embodiment of this application.

[0059] Figure 8 This is a schematic flowchart of a beam flow measurement method provided in an embodiment of this application.

[0060] Figure 9 This is a structural block diagram of an electronic device provided in an embodiment of this application.

[0061] Figure 10 This is a block diagram of a FLASH treatment system provided in an embodiment of this application.

[0062] Figure 11 This is a schematic diagram of the structure of a computer program product provided in an embodiment of this application. Detailed Implementation

[0063] The technical solutions of this application will be described below with reference to the accompanying drawings and specific embodiments. It should be noted that, without conflict, the various embodiments or technical features described below can be arbitrarily combined to form new embodiments. The terms expressing position and direction described in the embodiments of this application are all illustrated with the accompanying drawings, but changes can be made as needed, and all changes are included within the protection scope of this invention.

[0064] In this application, the terms "exemplary" or "for example" are used to indicate that something is an example, illustration, or description. Any implementation or design scheme described as "exemplary" or "for example" in this application should not be construed as being better or more advantageous than other implementations or design schemes. Specifically, the use of terms such as "exemplary" or "for example" is intended to present the relevant concepts in a specific manner.

[0065] The descriptions of "first," "second," etc., appearing in the embodiments of this application are for illustrative purposes and to distinguish the objects being described. They have no order and do not indicate any special limitation on the quantity in the embodiments of this application, nor do they constitute any limitation on the embodiments of this application.

[0066] The technical field and related terms of the embodiments of this application are briefly described below.

[0067] Artificial Intelligence (AI) is the theory, methods, technology, and application systems that use digital computers or machines controlled by digital computers to simulate, extend, and expand human intelligence, perceive the environment, acquire knowledge, and use that knowledge to achieve optimal results. In other words, AI is a comprehensive technology within computer science that attempts to understand the essence of intelligence and produce a new kind of intelligent machine that can react in a way similar to human intelligence. AI studies the design principles and implementation methods of various intelligent machines, enabling them to possess perception, reasoning, and decision-making capabilities. AI technology is a comprehensive discipline involving a wide range of fields, encompassing both hardware and software technologies. Fundamental AI technologies generally include sensors, dedicated AI chips, cloud computing, distributed storage, big data processing, operating / interactive systems, and mechatronics. AI software technologies mainly include computer vision, speech processing, natural language processing, as well as machine learning / deep learning, autonomous driving, and intelligent transportation.

[0068] Machine Learning (ML) is a multidisciplinary field involving probability theory, statistics, approximation theory, convex analysis, and algorithm complexity theory. A computer program can learn experience E given a certain type of task T and a performance metric P. If its performance on task T can be measured by P, it improves with experience E. Machine learning specifically studies how computers can simulate or implement human learning behavior to acquire new knowledge or skills and reorganize existing knowledge structures to continuously improve their performance. Machine learning is the core of artificial intelligence and the fundamental way to endow computers with intelligence; its applications span all areas of artificial intelligence.

[0069] Deep learning is a special type of machine learning that learns to use nested hierarchical structures of concepts to represent and achieve tremendous functionality and flexibility. Each concept is defined as being associated with a simpler one, while more abstract representations are computed in a less abstract manner. Machine learning and deep learning typically include techniques such as artificial neural networks, belief networks, reinforcement learning, transfer learning, inductive learning, and learning by demonstration.

[0070] An accelerator is a device that enables charged particles or atomic nuclei to achieve high speeds and high energies. The basic principle of an accelerator is to use an electric or magnetic field to apply force to charged particles or atomic nuclei, causing them to accelerate. The main components of an accelerator include a particle source, accelerating structure, focusing system, deflection system, and detection system. Accelerators can be used in nuclear experiments, radiomedicine, radiochemistry, the manufacture of radioactive isotopes, and non-destructive testing. There are many types of accelerators, including cyclotrons, linear accelerators, electrostatic accelerators, particle accelerators, and voltage multipliers. An accelerator is a device that artificially accelerates charged particles to higher energies. Using such devices, electrons, protons, deuterons, alpha particles, and other heavy ions of various energies can be produced. By utilizing the interaction of these directly accelerated charged particles with matter, various charged and uncharged secondary particles can also be produced, such as gamma particles, neutrons, and various mesons, hyperons, and antiparticles. The beam output from an accelerator refers to a beam (i.e., a pulse of charged particles) that is released with a specific energy, velocity, and spatial distribution after being accelerated and adjusted within the accelerator. This application uses a proton beam as an example, a type of particle radiotherapy that utilizes the Bragg peak (the depth at which most of the proton beam is deposited) to achieve precise tumor localization and dose sculpting, reducing radiation damage to normal tissues. The beam detector for the proton beam can be a dosimeter based on a scintillator or plastic scintillator, which measures the energy, flux, and dose rate of the proton beam. Alternatively, the beam detector can be an imaging system based on a metal-oxide-semiconductor field-effect transistor (MOSFET) or a silicon photomultiplier tube (SiPM), which can use the secondary electrons or gamma rays emitted by the proton beam to create two-dimensional or three-dimensional images; this application does not limit its application to these systems. The beam mentioned in this application is a high-speed beam, which includes a collection of charged particles moving at high energy and high velocity within the accelerator.

[0071] FLASH therapy is a radiotherapy technique used for cancer treatment. Unlike traditional radiotherapy, FLASH therapy uses FLASH radiation to directly irradiate tumor tissue with a very high dose of radiation (such as electrons or X-rays) in an extremely short time (typically a few milliseconds to hundreds of milliseconds). Because of the rapid flashing of the emitted radiation, contrasting with the slow-dose radiation delivery of traditional methods, it is called FLASH therapy. Because the radiation is released so quickly that normal cells do not have time to accumulate excessive damage, FLASH radiation can significantly reduce damage to healthy tissue. At the same time, because FLASH radiation delivers a high dose at an extremely high speed, it can potentially significantly shorten the treatment time, thereby reducing the burden on patients. The beam output from the accelerator mentioned in this application is a high-speed beam used for FLASH therapy.

[0072] See Figure 4 , Figure 4 This is a schematic diagram illustrating the principle of a beam directly acting on a beam detector. Related technologies involve directly applying the beam output from an accelerator to a beam detector to obtain a signal for measuring the accelerator's output beam. When high-speed pulses of charged particles (charged particles in the beam) strike the surface of the beam detector, a significant amount of energy is transferred to the detector, potentially damaging its sensitive components. This energy transfer may cause the atoms and molecules in the beam detector material to break down or ionize, thus affecting its lifespan or causing permanent damage. Furthermore... Figure 4 The beam detector in the device cannot measure the beam energy simultaneously, and other beam measurement devices need to be replaced to complete the measurement together, which is lacking in the simultaneity and consistency of the measurement.

[0073] Based on this, this application provides a FLASH treatment system, a Cherenkov detector, a beam flow measurement device, a beam flow measurement method, an electronic device, and a computer-readable storage medium to improve the aforementioned related technologies.

[0074] See Figure 5 , Figure 5 This is a schematic diagram illustrating the principle of a beam indirectly acting on a signal collection array. The solid lines with directions indicate the beam, and the dashed lines with directions indicate Cherenkov radiation. Cherenkov radiation (i.e., the optical signal mentioned below) is light generated when charged particles interact with matter. Its energy is typically lower than that of the beam, and its energy interaction mechanism differs from that of the aforementioned related technologies. The generation of Cherenkov radiation is a very rapid process and does not cause the high-energy damage seen when high-speed charged particles directly strike the detector surface. Furthermore, the energy distribution of Cherenkov radiation is relatively uniform, preventing the concentrated release of large amounts of energy at a specific point and thus avoiding severe localized damage. Figure 5 This is merely an illustration of the principle; in practical applications, the signal collection array can be positioned on multiple sides of the Cherenkov radiator. In this application, the surface facing the beam of the Cherenkov radiator is designated as the front side, the surface opposite the front side as the back side, and the surface between the front and back sides as the side surface. Furthermore, the Cherenkov detector provided in this application can be used to simultaneously measure beam energy without requiring replacement of other beam energy measurement devices to complete the measurement, thus offering better simultaneity and consistency in the measurement.

[0075] The solutions provided in this application relate to technologies such as beam flow measurement in medical devices and artificial intelligence. The technical solutions of this application and how they solve the aforementioned technical problems will be described in detail below with reference to the accompanying drawings and specific embodiments. It should be noted that the various embodiments or technical features described below can be arbitrarily combined to form new embodiments. The order of description of the embodiments is not intended to limit the preferred order of embodiments, and the same or similar concepts or processes may not be repeated in some embodiments. Obviously, the described embodiments are only some, not all, of the embodiments of this application.

[0076] Detector implementation example.

[0077] See Figure 1 and Figure 2 , Figure 1 This is a structural block diagram of a Cherenkov detector provided in an embodiment of this application. Figure 2 This is a schematic diagram of the structure of a Cherenkov detector provided in an embodiment of this application.

[0078] This application provides a Cherenkov detector, which includes:

[0079] A Cherenkov radiator is positioned in the path of a beam and is irradiated by the beam to generate Cherenkov radiation propagating within the Cherenkov radiator; the direction of the beam intersects with the receiving surface of the Cherenkov radiator, and the Cherenkov radiation serves as a measurement optical signal.

[0080] The frame has an opaque channel for housing the optical signal collection array;

[0081] An optical signal collection array is housed within a frame and is not directly irradiated by the beam. The optical signal collection array is disposed in the optical path of the Cherenkov radiation and is used to collect the Cherenkov radiation and output an analog signal. The analog signal is used to indicate the light intensity, spot position and trigger time of the Cherenkov radiation at different positions of the optical signal collection array.

[0082] The Cherenkov radiator is provided with a docking end near the optical signal collection array. The part of the Cherenkov radiator not covered by the frame is provided with an opaque reflective coating to make it opaque. The part of the Cherenkov radiator without the opaque reflective coating extends into the opaque channel and is covered by the frame to make it opaque.

[0083] When the beam passes through the Cherenkov detector, the charged particles in the beam lose energy and produce Cherenkov radiation. The Cherenkov detector uses this generated Cherenkov radiation as an optical signal. The intensity and distribution of the optical signal can be used to infer information such as the energy and trajectory of the charged particles in the beam, thereby enabling the measurement of the beam output from the accelerator.

[0084] Compared to related technologies that directly apply a high-speed beam to a beam detector to obtain a signal for measuring the beam output from an accelerator, the impact of high-speed charged particles on the beam detector surface transfers a significant amount of energy to the detector, potentially damaging its sensitive components. This energy transfer can cause the atoms and molecules in the beam detector material to break down or ionize, affecting its lifespan or causing permanent damage. In this embodiment, a simulated signal is generated using Cherenkov radiation. Cherenkov radiation typically has lower energy and its energy interaction mechanism differs from that of related technologies. The generation of Cherenkov radiation is a very rapid process and does not cause the high-energy damage seen in the direct impact of high-speed charged particles on the detector surface.

[0085] The advantages of doing this are:

[0086] The physical separation effect, specifically, means that the optical signal collection array in the Cherenkov detector does not need to interact directly with the beam, but instead performs measurements by receiving the generated optical signals. Therefore, unlike optical signal collection arrays that are directly bombarded by high-energy particles, it is not prone to severe energy deposition and damage. This allows the detector as a whole to remain relatively stable when measuring the beam, and is less likely to be damaged or have its performance degraded.

[0087] The effect of continuous use is that, due to the physical spacing characteristics created by the introduction of the Cherenkov radiator, the Cherenkov detector can continuously perform beam measurements for a long time without degradation or failure of the beam detector due to interaction with the beam. This can support long-term or continuous experiments or measurements, thereby obtaining accurate data or results.

[0088] More accurate measurements are crucial in beam flux measurements, where accurately measuring the energy and properties of charged particle pulses is paramount. The benefits of continued use ensure the stability and consistency of the Cherenkov radiation (the generated analog signal), providing reliable and accurate measurements that help physicians and researchers make informed decisions.

[0089] Simultaneous acquisition of multiple measurements allows for the simultaneous measurement of the energy (range), dose (current intensity or charge), beam shape, and position of the same beam (or pulse) without the need to use different detectors. Specifically, Cherenkov radiation is generated by charged particles moving at speeds exceeding the speed of light in a medium, with its wavelength primarily concentrated in the ultraviolet band. The emission angle (radiation angle) of Cherenkov radiation is closely related to the velocity of the incident particles. For a given particle type, the particle velocity (energy) is calculated using the emission angle in conjunction with the refractive index of the medium, and the emission angle can be deduced from the positional distribution of the light spot on the optical signal collection array. The formation time of the light spot on the detector is related to the incident position of the particle; by recording the formation time of different parts of the light spot and comparing their order, the incident position of the particle can be determined. The intensity of Cherenkov radiation is related to the deposited energy of the incident particles; by measuring the intensity of the optical signal, the energy deposited by the charged particle pulse in the medium can be obtained, thus providing dose information.

[0090] With its high-speed response, Cherenkov radiation is excited in picoseconds, meaning that Cherenkov radiation is generated within picoseconds after a high-speed charged particle strikes the radiator. This excitation time is negligible compared to any other optical response mechanism. The propagation time of light inside the radiator and the response time of semiconductor detectors (such as silicon pixel detectors) are on the order of 10 nanoseconds. Therefore, without considering electronic and back-end storage delays, the sampling frequency of the Cherenkov detector can reach hundreds of megahertz, a significant improvement over the response times of currently used gas ionization chamber and scintillator detectors. Such a high sampling frequency is necessary in the development of FLASH therapy, especially for FLASH pathways that increase current intensity by increasing pulse frequency. It also has a wide range of applications, suitable for different particle energy ranges.

[0091] In summary, the Cherenkov detector provided in this embodiment, through the arrangement of the Cherenkov radiator and the optical signal collection array, as well as the restriction of the beam direction, achieves the effect of physical spacing, making the Cherenkov detector relatively stable when measuring the beam and less prone to damage and performance degradation. It has the advantages of continuous use, enabling experiments or measurements to obtain accurate data or results, more accurate measurement results, and multi-parameter measurement.

[0092] Among them, the opaque channel is opaque, which not only prevents light from the outside of the frame from entering the inside of the frame, but also prevents light from the inside of the frame from passing through to the outside and affecting the external environment.

[0093] In some embodiments, the Cherenkov radiator may include:

[0094] At least one radiator unit, each radiator unit having a top surface and a bottom surface arranged opposite to each other, the radiator unit being used to receive the beam through the top surface and generate Cherenkov radiation;

[0095] And the opaque reflective coatings respectively disposed on the bottom and top surfaces of the radiator unit, the opaque reflective coatings being used to prevent Cherenkov radiation from passing through the top and bottom surfaces, so that the Cherenkov radiation is transmitted to the optical signal collection array by mirror reflection.

[0096] In essence, a Cherenkov detector is designed based on the generation and transmission of Cherenkov radiation by a Cherenkov radiator, and the control of the transmission direction of the Cherenkov radiation using an opaque reflective coating. A Cherenkov radiator comprises one or more radiator units, each with a top and bottom surface positioned opposite each other, forming a sandwich-like structure consisting of two outer materials sandwiching an inner material. When multiple radiator units are arranged together, the bottom surface of one radiator unit can serve as the top surface of another adjacent radiator unit.

[0097] See Figure 6 Charged particles from the beam enter the Cherenkov radiator from the top surface. During this process, the particles lose energy and excite atoms to produce Cherenkov radiation. The propagation direction of the Cherenkov radiation is controlled by opaque reflective coatings placed on the top and bottom surfaces of the Cherenkov radiator. The Cherenkov radiation is transmitted to the optical signal collection array by specular reflection.

[0098] The advantages of this approach are as follows: Charged particles enter the Cherenkov radiator from the top surface. As the particles pass through the Cherenkov radiator, they lose energy and excite atoms to produce Cherenkov radiation. The resulting photons form Cherenkov radiation light. The propagation direction of the Cherenkov radiation light is controlled by opaque reflective coatings placed on the top and bottom surfaces of the Cherenkov radiator. The Cherenkov radiation light is transmitted to the optical signal collection array via specular reflection. This process changes the direction of light propagation, facilitating collection from the sides of the radiator. Simultaneously, the opaque reflective coatings also prevent external light from entering the radiator unit through the bottom and / or top surfaces, thus avoiding interference with the optical signal collection array. By incorporating an opaque reflective coating, Cherenkov radiation is transmitted to the optical signal collection array via specular reflection. When a Cherenkov detector comprises multiple Cherenkov radiators, a shared opaque reflective coating can be placed on adjacent surfaces (bottom and top). Simultaneously, the beam can pass through the opaque reflective coating, allowing each layer of Cherenkov radiators to generate an optical signal, which is then transmitted to the optical signal collection array via specular reflection, thus improving signal detection sensitivity. When a Cherenkov detector comprises multiple stacked Cherenkov radiators (with adjacent surfaces isolated by an opaque reflective coating), the detector can collect optical signals from different layers of Cherenkov radiators. By analyzing the optical signals from different layers, better spatial resolution can be achieved to more accurately determine the incident position of charged particles, thereby providing more accurate beam trajectory information. The above structure can be configured by stacking different numbers of Cherenkov radiators as needed to adjust the detector's sensitivity and resolution. Because each optical signal is transmitted to the optical signal collection array via specular reflection, analysts can more easily build models and algorithms to interpret the optical signals and extract information about the beam, without having to consider the complexities of optical signals coming from different directions, thus simplifying the analysis. Restricting the Cherenkov radiation to be transmitted to the optical signal collection array via specular reflection ensures that the transmission path of the optical signals is controllable and consistent. This allows for more accurate calculation of parameters such as beam energy, position, and trajectory during subsequent analysis and interpretation of the optical signals.

[0099] The beam can pass through the opaque reflective coating, enabling each Cherenkov radiator to generate a light signal, which is then transmitted to the light signal collection array via specular reflection.

[0100] In practical applications, the Cherenkov radiator has a picosecond-level emission response time, which is fast and has a short dead time, enabling high-frequency single-pulse measurement.

[0101] In some embodiments, for each radiator unit:

[0102] The thickness of the opaque reflective coating ranges from 0.3 μm to 6 μm; and / or,

[0103] The composition of the opaque reflective coating includes an opaque metal; and / or,

[0104] The thickness of the radiator unit ranges from 0.2 cm to 8 cm; and / or,

[0105] The radiator unit is made of optical lead glass or optical acrylic glass.

[0106] The advantages of this approach are: the optical glass (lead glass or plexiglass) serving as the radiator unit has a sufficient refractive index to generate Cherenkov radiation; the uniform refractive index of the optical glass improves the uniformity of the response, thereby enhancing measurement accuracy; and the low and controllable dispersion of the optical glass effectively reduces the risk of resolution reduction due to dispersion. The components of the opaque reflective coating include opaque metals such as aluminum, gold, and silver, enabling specular reflection of light without allowing it to pass through.

[0107] See Figure 2 and Figure 3 , Figure 3 yes Figure 2 A cross-sectional view of a Cherenkov detector is provided.

[0108] In some embodiments, the optical signal collection array includes a plurality of photoelectric conversion units arranged in an array, each of which is used to receive the Cherenkov radiation and output a corresponding analog signal.

[0109] The advantage of doing this is that by arranging multiple photoelectric conversion units into an array, optical signals at different locations on the Cherenkov radiator can be captured and recorded simultaneously, which allows for high-resolution measurements in space, thereby improving the accuracy of beam measurements.

[0110] Therefore, the signal collection array can be considered a high-resolution detector, composed of multiple tiny detection units (e.g., pixels), each capable of independently sensing radiated light and generating a corresponding electrical signal. This array can be used to capture, record, and analyze signals from particles or light, thereby achieving high-resolution detection and measurement. Cherenkov radiation generated by a Cherenkov radiator, after being confined by an opaque reflective coating, enters the optical path of the signal collection array. At the signal collection array, the Cherenkov radiation is received and converted into an analog signal. The signal collection array can be considered to consist of many tiny pixel detectors, such as photomultiplier tubes. Each pixel detector is responsible for receiving and measuring the light intensity, spot position, and trigger time difference of the light signal at its location. When the Cherenkov radiation enters the signal collection array and is received, it generates an analog signal containing information about the light signal acquired by each pixel detector. This information may include the light signal intensity, spot position, and the trigger time difference of the light signal arriving at different pixel detectors.

[0111] Compared to related technologies, the beam dose measurement equipment used (such as ionization chambers, silicon pixel detectors, and films) lacks types that can simultaneously measure beam dose and beam energy. This means that during beam debugging and verification, it is often necessary to measure attributes such as energy (range) and dose separately, increasing measurement time and creating a logical flaw in simultaneously verifying various attributes. The Cherenkov detector provided in this embodiment, because its signal collection array can measure the characteristics of the optical signal at different locations, can simultaneously obtain information on the light intensity, spot position, and time of the optical signal for multi-parameter measurement, making beam measurement more comprehensive and accurate.

[0112] Furthermore, the signal collection array configuration enables simultaneous measurement of both the intensity and spot position of the optical signal at different spatial locations (i.e., providing high spatial resolution), thereby accurately determining the incident position of the optical signal on the Cherenkov detector. By measuring the trigger time difference of the optical signal between different pixel detectors, information about the time of arrival of the optical signal at different locations can be obtained, thus revealing the temporal correlation of events such as particle incidence. The signal collection array can measure these characteristics of the optical signal in real time, providing real-time beam flow measurement data, which in turn allows for real-time monitoring and control of beam performance.

[0113] In summary, detailed measurements and analyses of optical signals can be performed in both spatial and temporal dimensions, thereby enabling more accurate beam flow measurement.

[0114] In some embodiments, the photoelectric conversion unit in the optical signal collection array is any one of the following: fiber optic bundle, photoresistor, photodiode, and phototransistor.

[0115] The advantages of this approach are as follows: Taking a light signal collection array composed of multiple photodiode units as an example, each photodiode unit is responsible for receiving light signals at its location and converting light energy into electrical charge. Each photodiode unit generates a certain amount of charge after receiving the light signal, and this charge can be read out and converted into a corresponding analog signal. This analog signal carries information about the intensity and location of the light signal. Therefore, the photodiode unit has high sensitivity and can effectively convert light signals into electrical charge, thereby improving the detector's performance. Since the photodiode unit is a tiny light detection unit, it can provide high spatial resolution to accurately determine the spot position of the light signal, thus enabling precise measurement of parameters such as the particle incident position. Each photodiode unit can independently measure the intensity and location of the light signal, thereby achieving multi-parameter measurement. The combination of multiple photodiode units can simultaneously provide more comprehensive information about the distribution and intensity of the light signal.

[0116] As an example, the optical signal collection array includes multiple silicon pixel photodiode units arranged in an array to receive the optical signal and output a corresponding analog signal.

[0117] A silicon pixel photodiode (SPD) is a photodetector unit made of silicon semiconductor material. It combines the electronic characteristics of silicon semiconductors with the features of optoelectronics, enabling it to convert light signals into electrical signals, which can then be read and processed. In this embodiment, its working principle is as follows:

[0118] Light absorption occurs when a light signal shines on the sensitive area of ​​a silicon pixel photodiode. The photon energy is absorbed, causing electrons in the silicon to be excited to the conduction band, generating electron-hole pairs.

[0119] When charge carriers separate, the resulting electron-hole pairs are separated by an electric field. Electrons align with one polarity, while holes align with the opposite polarity. This separation process generates electric charge.

[0120] Charge collection concentrates the generated charge onto the electrodes inside the pixel photodiode.

[0121] Signal readout: By reading the charge on the electrodes, information such as the intensity and location of the light signal can be obtained.

[0122] In this embodiment, silicon pixel photodiode units are arranged into a pixel array, and each pixel unit in the array is an independent photodetector that can measure light signals at a specific location, making it suitable for acquiring high-resolution signals.

[0123] Therefore, the signal collection array consists of multiple silicon pixel photodiode units. Each silicon pixel photodiode unit is responsible for receiving light signals at its location and converting light energy into electrical charge. Each silicon pixel photodiode unit generates a certain amount of charge after receiving light signals. These charges can be read out and converted into corresponding analog signals, which carry information about the intensity and location of the light signals.

[0124] The advantages of this approach are: silicon pixel photodiode units possess high sensitivity, effectively converting light signals into electrical charges, thereby improving detector performance. Because silicon pixel photodiode units are tiny light-detecting units, they can provide high spatial resolution to accurately determine the spot position of the light signal, thus enabling precise measurements of parameters such as particle incident position. Each silicon pixel photodiode unit can independently measure the intensity and position of the light signal, enabling multi-parameter measurements. Combining multiple silicon pixel photodiode units can simultaneously provide more comprehensive information about the distribution and intensity of the light signal.

[0125] In some specific applications, see Figure 3 The signal collection array can be integrated with the Cherenkov radiator and protected by the same housing to reduce size. In other specific applications, the signal collection array can also be set separately from the Cherenkov radiator. Furthermore, since the beam flow measurement device provided in this embodiment is primarily an optical system, only the pixel detector requires power and no high-voltage power supply is needed.

[0126] In addition, analog signals are used to indicate the light intensity, spot position, and trigger time difference of the optical signal at different locations in the signal collection array.

[0127] Specifically:

[0128] Analog signals can be used to indicate the magnitude of light intensity. Light intensity refers to the strength of the light signal received from a signal collection array. Cherenkov radiation is generated during Cherenkov radiation detection, and the intensity of Cherenkov radiation can be used to infer properties such as the energy of charged particles. Light intensity can be measured on optical sensors such as photodiode arrays and is correlated with the energy of the incident charged particles (in the beam).

[0129] Each pixel in the signal collection array senses the arrival of light and generates an electrical signal. When the light signal strikes a pixel, electron-hole pairs are generated, causing an electric current to flow, which measures the light intensity. Cherenkov radiation is generated on a Cherenkov radiator and is caused by the interaction of charged particle pulses with matter. When a charged particle pulse hits the radiator and generates Cherenkov radiation, the radiation propagates along a specific path and strikes the corresponding pixel. By measuring the intensity of the light signal on the signal collection array, and since each pixel has its position pre-recorded in the array, the location of the Cherenkov radiation on the array surface can be determined by analyzing which pixels are illuminated and the intensity of the light received—that is, the location of the Cherenkov radiation spot can be inferred. Based on the spot location information, the incident position and possible direction of the beam on the surface of the Cherenkov detector can be determined.

[0130] When a charged particle pulse passes through multiple detection units, the arrival time of the signal in each detection unit will have slight differences. By comparing the arrival times of the signals between different channels, information such as the propagation direction, velocity, and energy of the charged particle pulse in the beam can be inferred.

[0131] In some embodiments, the optical signal collecting array and the docking end of the Cherenkov radiator are spaced apart along the optical path direction of the Cherenkov radiation.

[0132] Reference Figure 6 It is known that the advantage of doing this is that setting the optical signal collection array in the direction of the Cherenkov radiation can maximize the capture of Cherenkov radiation while reducing the cost of the optical signal collection array.

[0133] In some embodiments, the optical signal collecting array is arranged in at least two non-parallel optical path directions of the Cherenkov radiation.

[0134] The advantage of doing this is that by setting up optical signal collection arrays in different non-parallel optical path directions, optical signals from different angles or directions can be captured, providing more information than from a single direction, which helps to analyze the properties of Cherenkov radiation more accurately.

[0135] This can be understood as placing a signal collecting array near two adjacent sides of a Cherenkov radiator to capture Cherenkov radiation signals from different sides (which can be understood as at least two non-parallel sides). This is equivalent to establishing a coordinate system that allows the location of the incident light signal in multi-dimensional space. By measuring the time difference of the light signals from different sides, the position coordinates of the incident light signal can be reconstructed.

[0136] In summary, it can achieve multi-dimensional and precise positioning, while facilitating the establishment of a coordinate system and measurement, providing more information and higher accuracy results for beam flow measurement.

[0137] In some embodiments, the distance between the optical signal collecting array and the side of the adjacent Cherenkov radiator ranges from 1 cm to 10 cm.

[0138] Maintaining an appropriate distance between the signal collecting array and the Cherenkov radiator ensures that the Cherenkov radiation can be captured by the detector. If the distance is too great, the light signal intensity may weaken, affecting the accuracy of the data. If the distance is too small, the resolution of the acquired light signal will be affected.

[0139] In some embodiments, a light shield is provided between the signal collecting array and the Cherenkov radiator to prevent external light from interfering with the transmission of the optical signal between the signal collecting array and the Cherenkov radiator, thereby improving the accuracy of the optical signal collecting array. The light shield is, for example, opaque tape or film.

[0140] In some embodiments, the Cherenkov radiator is a cube. The cube shape of the Cherenkov radiator ensures that it has similar properties in all directions, without introducing bias or inhomogeneity. Due to the cube geometry and the arrangement of the signal collection array, the properties of the Cherenkov radiation light signals obtained from all directions are similar, ensuring the uniformity and consistency of the acquired data.

[0141] The radiator unit is a cuboid, and the side surfaces of the radiator unit and the end surfaces that do not face the light signal collection array are provided with an opaque reflective coating. Multiple radiator units are arranged closely together with their long sides to form the Cherenkov radiator.

[0142] The radiator unit is a thin strip (cubic prism). The sides of the radiator unit and the end face not facing the light signal collection array are coated with an opaque reflective layer. Multiple radiator units are arranged closely together with their long sides adjacent to form the Cherenkov radiator. For example, a square-planar Cherenkov radiator can be formed by two cubes spliced ​​together from strips, orthogonally arranged along the strip directions to form upper and lower layers. The physical position of the radiator is used for beam spot location, reducing the complexity of the reconstruction algorithm and minimizing the introduction of correlation errors.

[0143] See Figure 2 and Figure 3In a specific application scenario, this application embodiment also provides a Cherenkov detector, including a heat dissipation device (e.g., a fan), a housing, a light signal collecting array, and a Cherenkov radiator. The Cherenkov radiator has a docking end near the light signal collecting array, and the housing is at least partially composed of an opaque material to form a constant-temperature, opaque channel. Constant temperature refers to maintaining a constant temperature, that is, under certain conditions, keeping the temperature from changing or fluctuating significantly. This can be achieved by using a temperature-controlled device to control the temperature and maintain it within a set range, thus ensuring stable temperature conditions.

[0144] See also Figure 6 When the incident particles of the beam enter the radiator (i.e., the Cherenkov radiator) in the direction of the straight arrow, Cherenkov radiation is generated. Due to the setting of the reflective layer (i.e., the opaque reflective coating), the Cherenkov radiation propagates in the direction of the dashed arrow.

[0145] Device embodiment.

[0146] See Figure 7 , Figure 7 This is a structural block diagram of a beam flow measurement device provided in an embodiment of this application.

[0147] This application embodiment also provides a beam current measurement device for measuring the beam current output from an accelerator, the device comprising:

[0148] The detector embodiment protects any Cherenkov detector, which is used to receive the beam and output an analog signal;

[0149] A signal processing module, which is used to convert the analog signal into a digital signal and output it;

[0150] An information reconstruction module is used to measure the beam by reconstructing the physical information of the beam based on the digital signal. The physical information includes one or more combinations of the following: beam dose, beam energy, beam position, beam spot size information, and beam spot shape information.

[0151] The specific embodiments of the Cherenkov detector are consistent with the embodiments described in the above-mentioned detector embodiments in terms of the technical effects achieved, and some details will not be repeated here.

[0152] By setting up signal processing and information reconstruction modules, the analog signals obtained from the Cherenkov detector and signal collection array are further processed and analyzed to obtain physical information about the beam.

[0153] The signal processing module can use technologies such as analog-to-digital converters (ADCs) to convert analog signals into digital signals, and this application does not limit its implementation. Digital signal processing algorithms can then be applied to process the signal. The information processing module can also perform digital filtering and noise reduction processing; that is, digital signals can be processed through digital filtering and noise reduction algorithms to reduce noise and interference in analog signals, thereby improving signal quality and reliability.

[0154] The information reconstruction module can reconstruct the physical information of the beam using the digital signal obtained from the signal processing module according to a pre-set algorithm. This physical information includes beam dose, beam energy, beam position, beam spot size information, and beam spot shape information. The reconstruction algorithm compares the characteristics of the signal with known physical relationships to infer the relevant parameters of the beam. This embodiment does not limit the reconstruction algorithm, but examples include:

[0155] The Fourier transform can convert digital signals from the time domain to the frequency domain, thereby allowing analysis of the signal's spectral characteristics. Specifically, in beam flow measurement, information such as particle velocity and energy can be inferred by analyzing the spectrum of Cherenkov radiation light signals.

[0156] Statistical algorithms, such as least squares and maximum likelihood estimation, can be used to fit beam parameters, such as position, intensity, and ray angle, from multiple signals.

[0157] Machine learning, such as neural networks and support vector machines, can be used to analyze the complex relationships between signals and physical parameters. By training the model, highly accurate parameter reconstruction can be achieved.

[0158] The advantages of this approach are as follows: By using a signal processing module for digital signal processing, noise in analog signals can be reduced, improving the signal-to-noise ratio and thus enhancing measurement accuracy. Compared to analog signals, digital signals are easier to compress and store, saving storage space and improving data management efficiency. Digital signals can be processed more quickly than analog signals, resulting in lower latency and better performance in real-time beam measurements. Compared to analog signals, digital signals can be processed using computers and other equipment, applying various algorithms and techniques such as filtering, Fourier transform, and pattern recognition to achieve more complex signal analysis and processing. Digital signals can be transmitted to remote locations more stably and accurately, and can withstand interference and distortion during transmission, while analog signals may suffer signal loss and distortion.

[0159] In summary, digital signal processing and information reconstruction can yield more accurate and multi-parameter beam physics information, which will help advance experimental research by technicians.

[0160] The beam is measured by reconstructing the physical information of the beam from the digital signal. The physical information includes one or more combinations of the following: beam dose, beam energy, beam position, beam spot size information, and beam spot shape information.

[0161] Beam dose refers to the radiation dose deposited by charged particles (such as protons or carbon ion beams) within a specific volume. Radiation dose is the amount of radiation energy absorbed per unit mass of tissue, usually expressed in gray (Gy). Beam dose represents the energy released by a charged particle pulse within the target tissue, which is crucial for the effectiveness and impact of treatment. Calculating and controlling beam dose is a key part of ensuring the accuracy and safety of treatment. By measuring information such as light intensity, the dose delivered by the charged particle pulse, i.e., the degree to which the particle's energy is deposited into the material, can be estimated.

[0162] Beam energy refers to the kinetic energy of particles in a charged particle pulse. For radiotherapy, energy is a crucial property transferred to tissue as the charged particle pulse passes through it. The energy of the charged particle pulse determines its penetration ability and therapeutic effect. It can be considered that high-energy particles can penetrate deep tissues to reach deep tumors, while low-energy particles are more suitable for treating superficial tumors. Obtaining the beam spot position can be used to infer the light emission angle, thereby further obtaining information about the beam energy. When Cherenkov radiation propagates through a Cherenkov detector, it forms a beam spot on a pixel detector array. The position of the beam spot can be detected and recorded by the pixel detector array. Using the beam spot position and the position of the radiator end face, the angle of refraction of the radiation light from the radiator into the air can be calculated. Introducing the refractive indices of air and the radiator, and according to the law of refraction, the emission angle of the Cherenkov radiation excited by the incident particle can be obtained, thus yielding the particle velocity and thus the energy information.

[0163] The beam position can be determined by the trigger time difference of the array units, which determines the incident position of the charged particle pulse. The basic process is to compare the trigger times of the units in the optical signal collection array, find the earliest triggered unit, and combine the information of the horizontal and vertical adjacent arrays to determine the two-dimensional coordinates of the beam incident position, i.e., the beam incident position.

[0164] The beam spot size (or size) refers to the lateral or cross-sectional dimensions of a charged particle beam, describing its spatial distribution in the transverse direction. Based on the beam dose and beam position, beam spot size and shape information can be obtained to determine the size and shape of the beam. Specifically, by measuring the dose at different locations, the lateral distribution of the beam can be determined. As the dose changes with position, the beam spot size can be inferred. Typically, high-dose regions represent the center of the beam, while low-dose regions represent its edges. Simultaneously, beam position measurements provide information on the beam's position in both the longitudinal and transverse directions. By comparing beam positions at different locations, the degree of beam eccentricity can be determined, thereby extracting the beam spot shape. For example, beam spot size information could be 1.1 mm, 1.3 mm, or 4 mm. Beam spot shape information indicates whether the beam spot shape is circular, elliptical, or irregular.

[0165] In a specific application scenario, this application embodiment also provides a beam current measurement device for measuring the beam current output by an accelerator, the device comprising:

[0166] A Cherenkov detector, which is used to receive the beam and output an analog signal;

[0167] A signal processing module, which is used to convert the analog signal into a digital signal and output it;

[0168] An information reconstruction module is used to measure the beam by reconstructing the physical information of the beam based on the digital signal. The physical information includes one or more combinations of the following: beam dose, beam energy, beam position, beam spot size information, and beam spot shape information.

[0169] The Cherenkov detector includes:

[0170] A Cherenkov radiator is positioned in the path of a beam to receive the beam and generate Cherenkov radiation propagating within it; the direction of the beam intersects the receiving surface of the Cherenkov radiator, and the Cherenkov radiation serves as a measurement optical signal; the Cherenkov radiator is a cube.

[0171] An optical signal collecting array is disposed in the optical path of the Cherenkov radiation light, used to collect the Cherenkov radiation light and output an analog signal. The analog signal is used to indicate the light intensity, spot position, and trigger time of the Cherenkov radiation light at different positions on the optical signal collecting array. The distance between the optical signal collecting array and the Cherenkov radiator ranges from 1 cm to 10 cm; the optical signal collecting array is arranged opposite to at least two adjacent sides of the Cherenkov radiator.

[0172] A light shield is disposed between the optical signal collecting array and the Cherenkov radiator to form a light-shielding space in the optical path of the Cherenkov radiation between the optical signal collecting array and the Cherenkov radiator.

[0173] The Cherenkov radiator includes:

[0174] At least one radiator unit, each radiator unit having a top surface and a bottom surface arranged opposite to each other, the radiator unit being used to receive the beam through the top surface and generate Cherenkov radiation;

[0175] And opaque reflective coatings respectively disposed on the bottom and top surfaces of the radiator unit, the opaque reflective coatings being used to prevent Cherenkov radiation from passing through the top and bottom surfaces, and to transmit the Cherenkov radiation to the optical signal collection array by means of specular reflection.

[0176] For each radiator unit:

[0177] The thickness of the opaque reflective coating ranges from 0.3 μm to 6 μm; and / or,

[0178] The composition of the opaque reflective coating includes an opaque metal; and / or,

[0179] The thickness of the radiator unit ranges from 0.2 cm to 8 cm; and / or,

[0180] The radiator unit is made of optical lead glass or optical acrylic glass.

[0181] The optical signal collection array includes multiple photoelectric conversion units arranged in an array, each of which is used to receive the Cherenkov radiation and output corresponding analog signals.

[0182] The multiple photoelectric conversion units include at least one of the following: fiber optic bundle, photoresistor, photodiode, and phototransistor.

[0183] The above-mentioned beam flow measurement device has the following beneficial effects:

[0184] First, the signal collection array is not directly exposed to charged particles, resulting in a long service life.

[0185] The lifespan of a Cherenkov detector largely depends on the environment in which it is used and the level of radiation it is exposed to. In applications where it is not directly exposed to high-energy charged particles, the signal collection array of a Cherenkov detector can have a longer lifespan. Cherenkov radiators convert pulses of charged particles from a beam into optical signals (such as ultraviolet light), making them more suitable for detection by optical signal collection arrays.

[0186] Therefore, indirect detection using Cherenkov radiation can provide a certain degree of isolation and protection, reducing the risk of damage to the signal collection array from charged particle pulses.

[0187] Second, the main body of the beam flow measurement device is an optical system, which reduces the need for high-voltage power supply.

[0188] High-voltage power supply is frequently used in related technologies to create an electric field within the detector. This helps orient and guide particles to the sensitive area inside the detector, improving its sensitivity and enabling it to more effectively capture particle signals. Creating a sufficiently large potential difference between electrons and the charges generated at their corresponding ionization sites prevents repeated electron collisions, thus ensuring signal accuracy and distinguishability. This technical solution, however, only requires high-voltage power supply for the optical signal collection array, fundamentally solving this problem.

[0189] 3. The Cherenkov radiator can be disassembled and replaced independently.

[0190] As a core component of the Cherenkov detector, the Cherenkov radiator is susceptible to damage, aging, or other problems during use. Designing the Cherenkov radiator to be independently disassembled and replaced facilitates repair and maintenance by personnel, eliminating the need for extensive disassembly of the entire Cherenkov detector.

[0191] Furthermore, because the refractive index of a Cherenkov radiator is related to the particle type and beam energy, and its dispersion and transparency are associated with the detector's accuracy and performance tuning, different types of particles may require different Cherenkov radiator materials or structures. With detachable and replaceable Cherenkov radiators, performance can be optimized or adapted to different application conditions as needed, without having to redesign the entire Cherenkov detector.

[0192] Method implementation examples.

[0193] See Figure 8 , Figure 8 This is a schematic flowchart of a beam flow measurement method provided in an embodiment of this application.

[0194] This application provides a beam current measurement method for measuring the beam current output from an accelerator using the beam current measurement device described in any of the above claims. The method includes:

[0195] S101, the beam is received by a Cherenkov detector and an analog signal is output; wherein, the Cherenkov detector is positioned in the direction of the beam, and the direction of the beam intersects with the direction of the optical signal;

[0196] S102, the analog signal is converted into a digital signal and output through the signal processing module;

[0197] S103, the beam is measured by reconstructing the physical information of the beam based on the digital signal through the information reconstruction module; the physical information includes one or more combinations of the following: beam dose, beam energy, beam position, beam spot size information and beam spot shape information.

[0198] This method aims to measure the beam output from an accelerator in real time using a beam flow measurement device that includes a Cherenkov detector. Its specific embodiments and the achieved technical effects are consistent with those described in the detector and device embodiments above, and some details will not be repeated here.

[0199] When the beam passes through a Cherenkov detector, the charged particles within it lose energy and produce Cherenkov radiation. This Cherenkov radiation generates an optical signal, and the intensity and distribution of this signal can be used to infer information such as the beam's energy and trajectory. Compared to directly applying a high-speed beam to the detector, this method utilizes the optical signal generated by Cherenkov radiation for measurement. The generation of this optical signal is a rapid process and does not cause the high-energy damage that occurs when high-speed charged particles (i.e., the beam) directly strike the detector surface. Therefore, the method provided in this embodiment enables real-time measurement of the accelerator output beam to monitor its performance and characteristics.

[0200] In some embodiments, the Cherenkov radiator includes at least one radiator unit, each radiator unit having a top surface and a bottom surface disposed opposite to each other, the radiator unit being used to receive the beam through the top surface and generate Cherenkov radiation.

[0201] The process of receiving the beam through a Cherenkov detector and outputting an analog signal includes:

[0202] The beam is received and Cherenkov radiation is generated using at least one radiator unit of the Cherenkov radiator.

[0203] By using opaque reflective coatings on the top and bottom surfaces of the radiator unit that generates Cherenkov radiation, the transmission of the Cherenkov radiation is prevented, and the Cherenkov radiation is transmitted to the optical signal collection array by specular reflection.

[0204] In some embodiments, the step of receiving the beam and outputting an analog signal via a Cherenkov detector further includes:

[0205] The signal collection array receives the Cherenkov radiation and outputs an analog signal, which is used to indicate the light intensity, spot position and trigger time of the light signal at different positions of the light signal collection array.

[0206] In some embodiments, the method further includes:

[0207] The accelerator is diagnosed based on the physical information and preset beam setting parameters;

[0208] When the diagnostic results indicate that the beam setting parameters of the accelerator need to be adjusted, the beam setting parameters are input into the beam adjustment model to obtain the beam adjustment parameters of the accelerator.

[0209] The beam setting parameters are updated using the beam adjustment parameters;

[0210] The beam adjustment model is obtained by training a preset deep learning model using a training set.

[0211] Based on the physical information obtained from the information reconstruction module, the accelerator's performance can be measured. This physical information may include parameters reflecting the beam state emitted by the accelerator, such as beam dose, energy, position, and angle. By comparing these measurements with pre-set beam configuration parameters, the results can indicate whether the current beam configuration parameters need adjustment for better performance. Beam configuration parameters can be considered to involve settings such as beam energy, intensity, and focusing. Based on calculations using a beam adjustment model, beam adjustment parameters can be obtained, which are used to optimize beam performance. These parameters, for example, involve adjustments to magnetic field strength, focuser settings, and accelerating voltage. In practical applications, the obtained beam adjustment parameters can be input into the accelerator's control system to automatically update and adjust the accelerator's beam configuration parameters.

[0212] The advantage of this approach is that the accelerator's beam performance can be automatically optimized through real-time measurement and adjustment, thereby improving beam accuracy and reliability. By monitoring in real time and making adjustments as needed, the accelerator can maintain optimal performance throughout operation.

[0213] Beam setup parameters refer to adjustable parameters that affect beam propagation within the accelerator. Adjusting these parameters can influence the beam's characteristics, trajectory, energy, and intensity. In practical applications, beam setup parameters can be optimized based on specific experiments, applications, or objectives to ensure the beam achieves the expected performance metrics during acceleration.

[0214] As an example, beam setup parameters for a particle accelerator might include:

[0215] Accelerating voltage and frequency are parameters used in accelerators to provide energy to particles. By adjusting the accelerating voltage and frequency, the energy of the particles can be changed, thereby affecting the speed and trajectory of the beam released by the accelerator. Generally, the unit of accelerating voltage is volt (V), and the unit of accelerating frequency is hertz (Hz). Different types of accelerators may use different accelerating voltages and frequencies. For example, linear accelerators typically use high voltages (hundreds of kilovolts to hundreds of megavolts) and high frequencies (hundreds of megahertz to thousands of megahertz), while cyclotron accelerators typically use low voltages (thousands of volts to hundreds of thousands of volts) and low frequencies (tens of hertz to thousands of hertz).

[0216] Magnetic field settings: Adjusting the strength and direction of the magnetic field can affect the focal point, focusing effect, and transmission efficiency of the beam emitted by the accelerator. Generally, the unit of magnetic field is Tesla (T), and the range of the magnetic field depends on the type, energy, and radius of motion of the particles. For example, for a proton beam, the magnetic field range can be from a few millitalas to tens of Teslas, while for an electron beam, the range can be from a few microteslas to a few Teslas.

[0217] Injection parameters: Adjusting injection parameters can affect the initial characteristics of the beam emitted by the accelerator, and is crucial for maintaining the stability and consistency of the charged particle pulse stream. Generally, injection parameters include injection location, injection angle, injection time, and injection phase. These parameters need to be matched with the accelerator's structure and operating mode to achieve effective and safe injection.

[0218] Focuser settings: By adjusting the parameters of the focuser, beam compression, focusing, and transmission can be achieved. Generally, focuser settings include the type, position, number, intensity, and polarity of the focuser. These parameters need to be optimized according to the lateral and longitudinal distribution of the beam to achieve the best focusing effect.

[0219] Cooling parameters: The cooling system helps control the temperature and stability of the beam emitted by the high-energy accelerator. In other words, adjusting the cooling parameters optimizes the beam's thermodynamic properties. Generally, cooling parameters include the cooling medium, cooling method, cooling temperature, and cooling time. These parameters need to be adjusted based on the beam's energy loss and thermal stability to achieve optimal cooling performance.

[0220] By adjusting the above beam settings parameters, the performance of the accelerator can be optimized to meet specific experimental, application, or research objectives.

[0221] This application does not limit the type of deep learning model used in its embodiments; various types of deep learning models can be used to train the beam adjustment model. Examples include:

[0222] Convolutional Neural Network (CNN): A convolutional neural network is used to train a beam adjustment model. It can take multiple sample beam information (such as energy, position, angle, etc.) as input, and then extract features through multiple convolutional layers and pooling layers, and finally output a prediction related to the beam adjustment parameters.

[0223] Recurrent Neural Networks (RNNs): RNNs can be used to enable beam adjustment parameters to take into account changes over time. RNNs are suitable for sequential data and can capture time-dependent information. By inputting beam information from a series of time steps into an RNN, the beam characteristics can be learned to change over time, thereby predicting the parameters that need adjustment.

[0224] Generative Adversarial Networks (GANs) are used to generate data that conforms to specific beam characteristics, thereby assisting in the training of beam adjustment models. The generator network can generate beam data under different beam parameters, and the discriminator network can evaluate the authenticity of the generated data. Through the game-like process of generation and discrimination, the beam adjustment model can be optimized.

[0225] Ensemble models: Multiple deep learning models of different types can be integrated to achieve better performance and prediction accuracy.

[0226] The beam adjustment model in this application embodiment can select an appropriate deep learning model type according to specific circumstances to achieve beam parameter prediction and adjustment. Different types of deep learning models can play a role in different application scenarios, and selecting the appropriate model type will help to obtain more accurate beam adjustment predictions.

[0227] As an example, the method for beam flow measurement includes the following steps:

[0228] The device receives pulses of charged particles through a Cherenkov radiator and generates optical signals.

[0229] The system receives optical signals through a signal collection array and outputs analog signals.

[0230] The analog-to-digital converter receives analog signals and outputs digital signals.

[0231] The physical information reconstruction module receives digital signals and reconstructs physical information.

[0232] Example of an electronic device.

[0233] This application also provides an electronic device, the specific embodiments of which are consistent with the embodiments and technical effects achieved in the above method embodiments, and some contents will not be repeated.

[0234] An electronic device is used to measure the beam current output by an accelerator using the beam current measurement device described in any of the preceding claims. The electronic device includes a memory and at least one processor. The memory stores a computer program, and the at least one processor is configured to implement the steps in the method embodiments when executing the computer program.

[0235] See Figure 9 , Figure 9 This is a structural block diagram of an electronic device provided in an embodiment of this application.

[0236] Electronic device 10 may include, for example, at least one memory 11, at least one processor 12, and a bus 13 connecting different platform systems.

[0237] Memory 11 may include a computer-readable medium in the form of volatile memory, such as random access memory (RAM) 111 and / or cache memory 112, and may further include read-only memory (ROM) 113. Memory 11 also stores a computer program that can be executed by processor 12, causing processor 12 to perform the steps of any of the methods described above. Memory 11 may also include a utility 114 having at least one program module 115, such program module 115 including, but not limited to, an operating system, one or more application programs, other program modules, and program data; each or some combination of these examples may include an implementation of a network environment.

[0238] Accordingly, processor 12 can execute the aforementioned computer program and can execute utility 114. Processor 12 may employ one or more application-specific integrated circuits (ASICs), DSPs, programmable logic devices (PLDs), complex programmable logic devices (CPLDs), field-programmable gate arrays (FPGAs), or other electronic components.

[0239] Bus 13 can represent one or more types of bus structures, including a memory bus or memory controller, peripheral bus, graphics acceleration port, processor, or a local bus using any bus structure with multiple bus structures.

[0240] Electronic device 10 can also communicate with one or more external devices, such as keyboards, pointing devices, Bluetooth devices, etc., and with one or more devices capable of interacting with it, and / or with any device that enables it to communicate with one or more other computing devices (e.g., routers, modems, etc.). This communication can be performed through input / output interface 14. Furthermore, electronic device 10 can communicate with one or more networks (e.g., local area networks (LANs), wide area networks (WANs), and / or public networks, such as the Internet) via network adapter 15. Network adapter 15 can communicate with other modules of electronic device 10 via bus 13. It should be understood that, although not shown in the figures, in practical applications, other hardware and / or software modules can be used in conjunction with electronic device 10, including but not limited to: microcode, device drivers, redundant processors, external disk drive arrays, RAID systems, tape drives, and data backup storage platforms.

[0241] Example of a computer-readable storage medium.

[0242] This application also provides a computer-readable storage medium, the specific embodiments of which are consistent with the embodiments and technical effects achieved in the above method embodiments, and some contents will not be repeated.

[0243] The computer-readable storage medium stores a computer program that, when executed by at least one processor, implements the steps of any of the above methods or the functions of any of the above electronic devices.

[0244] A computer-readable medium can be a computer-readable signal medium or a computer-readable storage medium. In embodiments of this application, a computer-readable storage medium can be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, apparatus, or device. A computer-readable storage medium can be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples of computer-readable storage media (a non-exhaustive list) include: an electrical connection having one or more wires, a portable disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0245] Computer-readable storage media may include data signals propagated in baseband or as part of a carrier wave, carrying readable program code. Such propagated data signals may take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. The computer-readable storage medium may also be any computer-readable medium capable of sending, propagating, or transmitting a program for use by or in connection with an instruction execution system, apparatus, or device. The program code contained on the computer-readable storage medium may be transmitted using any suitable medium, including but not limited to wireless, wired, optical fiber, RF, or any suitable combination thereof. Program code for performing operations of the present invention may be written in any combination of one or more programming languages, including Java, C++, Python, C#, JavaScript, PHP, Ruby, Swift, Go, Kotlin, etc. The program code may be executed entirely on a user computing device, partially on a user device, as a standalone software package, partially on a user device and partially on a remote computing device, or entirely on a remote computing device or server. In cases involving remote computing devices, the remote computing devices can be connected to user equipment via any type of network, including local area networks (LANs) or wide area networks (WANs), or they can be connected to external computing devices (e.g., via the Internet using an Internet service provider).

[0246] Example of FLASH therapy system.

[0247] This application also provides a FLASH therapy system, which includes an accelerator for generating a beam and a beam flow measurement device as described in the device embodiment. The specific embodiments and achieved technical effects are consistent with those described in the above embodiments, and some details will not be repeated.

[0248] For ease of understanding, see [link to relevant documentation]. Figure 10 , Figure 10 This is a block diagram of a FLASH treatment system provided in an embodiment of this application.

[0249] In one specific application, a beam is generated using a particle accelerator, passes through a real-time dose monitoring device, a carbide absorber and a collimator, and then sequentially passes through a shielding device, a position adjustment device, a beam flow measurement device (i.e., the beam flow measurement device of this application) and a Faraday cup.

[0250] The particle accelerator can be an equipotential cyclotron or a synchrotron. The real-time dose monitoring device, such as a real-time dose ionization chamber, can monitor and test the beam dose online and provide rapid feedback. A carbide absorber is used to adjust the energy range extracted by the accelerator based on tumor information of the target (e.g., a patient). A collimator is used to calibrate the beam generated by the absorber after large-angle Coulomb scattering. Shielding facilities include a shielded chamber, and position adjustment devices, such as the treatment bed for the target, are used for position adjustment. A Faraday cup measures the beam size after passing through the patient or laboratory animal and collects and blocks excess beam.

[0251] Example of a computer program product.

[0252] This application also provides a computer program product, the specific embodiments of which are consistent with the embodiments and technical effects achieved in the above method embodiments, and some contents will not be repeated.

[0253] The computer program product includes a computer program that, when executed by at least one processor, implements the steps of any of the above methods or the functions of any of the above electronic devices.

[0254] See Figure 11 , Figure 11 This is a schematic diagram of the structure of a computer program product provided in an embodiment of this application.

[0255] The computer program product is used to implement the steps of any of the above methods or to implement the functions of any of the above electronic devices. The computer program product may employ a portable compact disc read-only memory (CD-ROM) and include program code, and may run on a terminal device, such as a personal computer. However, the computer program product of the present invention is not limited thereto, and the computer program product may employ any combination of one or more computer-readable media.

[0256] It should be noted that in the above embodiments of this application, "at least one" refers to one or more, and "more than one" refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone, where A and B can be singular or plural. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship. "At least one of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one of a, b, or c can represent: a, b, c, a and b, a and c, b and c, or a and b and c, where a, b, and c can be single or multiple. It is worth noting that "at least one" can also be interpreted as "one or more". Furthermore, the terms “comprising” and “having”, and any variations thereof, are intended to cover non-exclusive inclusion, such that a process, method, system, product, or apparatus that includes a series of steps or units is not necessarily limited to those steps or units that are explicitly listed, but may include other steps or units that are not explicitly listed or that are inherent to such process, method, product, or apparatus.

[0257] This application describes the invention from the perspectives of purpose, performance, progress, and novelty, and it meets the functional enhancement and use requirements emphasized by the Patent Law. The above description and drawings are merely preferred embodiments of this application and are not intended to limit this application. Therefore, all structures, devices, features, etc., that are similar to or identical to those of this application, i.e., all equivalent substitutions or modifications made in accordance with the scope of this patent application, shall fall within the scope of protection of this patent application.

Claims

1. A Cherenkov detector, characterized in that, The Cherenkov detector includes: A Cherenkov radiator is positioned in the path of a beam and is irradiated by the beam to generate Cherenkov radiation propagating within the Cherenkov radiator; the direction of the beam intersects with the receiving surface of the Cherenkov radiator, and the Cherenkov radiation serves as a measurement optical signal. An optical signal collection array is disposed in the optical path of the Cherenkov radiation light and is not directly irradiated by the beam. It is used to collect the Cherenkov radiation light and output an analog signal. The analog signal is used to indicate the light intensity, spot position and trigger time of the Cherenkov radiation light at different positions of the optical signal collection array. The optical signal collecting array is disposed in at least two non-parallel optical path directions of the Cherenkov radiation; and the optical signal collecting array and the docking end of the Cherenkov radiator are spaced apart along the optical path direction of the Cherenkov radiation.

2. The Cherenkov detector according to claim 1, characterized in that, Also includes: The frame has an opaque channel for housing the optical signal collecting array so that it is not directly irradiated by the beam.

3. The Cherenkov detector according to claim 2, characterized in that, The Cherenkov radiator has a docking end near the optical signal collection array. The part of the Cherenkov radiator not covered by the frame is covered with an opaque reflective coating to make it opaque, and the Cherenkov radiation light is transmitted to the optical signal collection array by mirror reflection. The part of the Cherenkov radiator without the opaque reflective coating extends into the opaque channel and is covered by the frame to make it opaque.

4. The Cherenkov detector according to claim 1, characterized in that, The Cherenkov radiator includes: At least one radiator unit, each radiator unit having a top surface and a bottom surface arranged opposite to each other, the radiator unit being used to receive the beam through the top surface and generate Cherenkov radiation; And opaque reflective coatings respectively disposed on the bottom and top surfaces of the radiator unit, the opaque reflective coatings being used to prevent Cherenkov radiation from passing through the top and bottom surfaces.

5. The Cherenkov detector according to claim 1, characterized in that, It also includes a light shield, which is disposed between the optical signal collecting array and the Cherenkov radiator to form a light-shielding space in the optical path of the Cherenkov radiation between the optical signal collecting array and the Cherenkov radiator.

6. The Cherenkov detector according to claim 1, characterized in that, The optical signal collection array includes multiple photoelectric conversion units arranged in an array, each of which is used to receive the Cherenkov radiation and output corresponding analog signals.

7. The Cherenkov detector according to claim 6, characterized in that, The photoelectric conversion unit of the optical signal collection array can be any one of the following: fiber optic bundle, photoresistor, photodiode, and phototransistor.

8. The Cherenkov detector according to claim 1, characterized in that, The Cherenkov radiator is a cube, and the Cherenkov radiator is composed of multiple radiator units; The radiator unit is a cuboid, and the side surfaces of the radiator unit and the end surfaces that do not face the light signal collection array are provided with an opaque reflective coating. Multiple radiator units are arranged closely together with their long sides to form the Cherenkov radiator.

9. A beam flow measurement device, characterized in that, The apparatus for measuring the beam output from an accelerator includes: The Cherenkov detector according to any one of claims 1-8, wherein the Cherenkov detector is used to receive the beam and output an analog signal; A signal processing module, which is used to convert the analog signal into a digital signal and output it; An information reconstruction module is used to measure the beam by reconstructing the physical information of the beam based on the digital signal. The physical information includes one or more combinations of the following: beam dose, beam energy, beam position, beam spot size information, and beam spot shape information.

10. A beam current measurement method, characterized in that, The method for measuring the beam current output from an accelerator using the beam current measuring device of claim 9 includes: The beam is received by a Cherenkov detector and an analog signal is output. The analog signal is converted into a digital signal and output through the signal processing module; The beam is measured by reconstructing the physical information of the beam based on the digital signal through the information reconstruction module. The physical information includes one or more combinations of the following: beam dose, beam energy, beam position, beam spot size information, and beam spot shape information.

11. The beam flow measurement method according to claim 10, characterized in that, The Cherenkov radiator includes at least one radiator unit, each radiator unit having a top surface and a bottom surface arranged opposite to each other, the radiator unit being used to receive the beam through the top surface and generate Cherenkov radiation. The process of receiving the beam through a Cherenkov detector and outputting an analog signal includes: The beam is received and Cherenkov radiation is generated using at least one radiator unit of the Cherenkov radiator. By using opaque reflective coatings on the top and bottom surfaces of the radiator unit that generates Cherenkov radiation, the transmission of the Cherenkov radiation is prevented, and the Cherenkov radiation is transmitted to the optical signal collection array by specular reflection.

12. The beam flow measurement method according to claim 11, characterized in that, The method of receiving the beam and outputting an analog signal via a Cherenkov detector also includes: The signal collection array receives the Cherenkov radiation and outputs an analog signal, which is used to indicate the light intensity, spot position and trigger time of the light signal at different positions of the light signal collection array.

13. The beam flow measurement method according to claim 12, characterized in that, The method further includes: The accelerator is diagnosed based on the physical information and preset beam setting parameters; When the diagnostic results indicate that the beam setting parameters of the accelerator need to be adjusted, the beam setting parameters are input into the beam adjustment model to obtain the beam adjustment parameters of the accelerator. The beam setting parameters are updated using the beam adjustment parameters; The beam adjustment model is obtained by training a preset deep learning model using a training set.

14. An electronic device, characterized in that, The electronic device includes a memory and at least one processor, the memory for storing a computer program, and the processor for calling and running the computer program stored in the memory to cause the electronic device to perform the method as described in any one of claims 10-13.

15. A FLASH therapy system, characterized in that, The FLASH treatment system includes an accelerator for generating a beam and a beam flow measurement device as described in claim 9.

16. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by at least one processor, implements the steps of the method according to any one of claims 10-13.

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