Method, device and equipment for correcting sampling value of resistance temperature sensor and medium
By acquiring multiple temperature and resistance values from a resistive temperature sensor, a variation curve is created. Typical resistance values are selected and polynomial fitting is performed, which solves the temperature deviation problem caused by different manufacturers and improves detection accuracy and application range.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- QINGDAO HAIER AIR CONDITIONING ELECTRONICS CO LTD
- Filing Date
- 2022-07-11
- Publication Date
- 2026-07-10
AI Technical Summary
Due to differences in materials and processes used in resistive temperature sensors produced by different manufacturers, there is a deviation between the detected temperature and the actual temperature. Existing correction methods cannot accurately correct multiple temperature points, and modifying the controller's underlying program affects versatility and increases costs.
By acquiring multiple temperature and resistance values from a resistive temperature sensor, a variation curve is created. A typical resistance value is selected, the actual value is obtained, and polynomial fitting is performed to obtain a calculation function for the actual temperature value, which is used to correct the sampled values.
It significantly improves the detection accuracy of resistive temperature sensors, expands the application range, and enhances the user experience.
Smart Images
Figure CN117419830B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of temperature sensor offset correction technology, and specifically provides a method, apparatus, electronic device, and computer-readable storage medium for correcting the sampled values of a resistive temperature sensor. Background Technology
[0002] With the development of technology, temperature sensors are often used to detect temperature in various situations. However, since temperature sensors are produced by different manufacturers, the materials and processes used in their production vary, which leads to discrepancies between the temperature detected by the sensor and the actual temperature.
[0003] To address the deviation issue, two common correction methods are used. One method involves adding or subtracting a fixed correction value from the temperature detected by the temperature sensor. However, since the temperature curve of the temperature sensor is not linear, and the deviation value of different temperature sensors is not fixed, this method can only accurately correct one temperature point, while deviations still exist at other temperature points. The other method involves modifying the underlying program of the controller associated with the temperature sensor. However, this method not only reduces the versatility of the controller but also requires the controller manufacturer to modify the underlying program, severely impacting project development efficiency and increasing investment costs.
[0004] Accordingly, there is a need in the art for a new scheme to correct the sampled values of resistive temperature sensors to address the above problems. Summary of the Invention
[0005] To overcome the above-mentioned defects, the present invention is proposed to provide a method, apparatus, device, and medium for correcting the sampled values of a resistive temperature sensor, which solves or at least partially solves the technical problem that the sampled values of a resistive temperature sensor deviate too much from the actual values due to differences in materials and processes.
[0006] In a first aspect, the present invention provides a method for correcting sampled values of a resistive temperature sensor. The method includes: acquiring multiple temperature sampled values of the resistive temperature sensor and a resistance value of the resistive temperature sensor corresponding to each temperature sampled value; creating a variation curve of the temperature sampled value versus the resistance value; selecting a typical resistance value within the variation curve, wherein the typical resistance value refers to the resistance value corresponding to an integer temperature sampled value; acquiring an actual temperature value corresponding to each typical resistance value; performing polynomial fitting based on the temperature sampled value corresponding to each typical resistance value and the actual temperature value corresponding to each typical resistance value to obtain a calculation function for the actual temperature value; and correcting the ambient temperature sampled value obtained by sampling the current environment through the resistive temperature sensor according to the calculation function for the actual temperature value to obtain the actual ambient temperature value of the current environment.
[0007] In one technical solution of the above-mentioned method for correcting the sampled values of a resistive temperature sensor, the step of "performing polynomial fitting based on the temperature sampled value corresponding to each typical resistance value and the actual temperature value corresponding to each typical resistance value to obtain a calculation function for the actual temperature value" specifically includes: performing polynomial fitting with the temperature sampled value corresponding to each typical resistance value as the independent variable and the actual temperature value corresponding to each typical resistance value as the dependent variable to obtain a calculation function for the actual temperature value as shown in the following formula:
[0008] T a =K0+K1×T s +K2×T s 2 +…+K n ×T s n
[0009] Where n is the fitting order, K0, K1, K2, ..., K n T represents the polynomial fitting coefficients. s For each of the typical resistance values, the corresponding temperature sample value, T a The actual temperature value corresponding to each of the typical resistance values.
[0010] In one technical solution of the above-mentioned method for correcting the sampled values of a resistive temperature sensor, the step of "obtaining the actual temperature value corresponding to each typical resistance value" specifically includes: obtaining the actual temperature value corresponding to each typical resistance value according to a pre-set temperature characteristic table.
[0011] In one technical solution of the above-mentioned method for correcting the sampled value of a resistive temperature sensor, the step of "selecting a typical resistance value within the change curve" specifically includes: dividing the change curve into multiple straight line segments; determining the resistance values corresponding to the two endpoints of each straight line segment; and selecting the typical resistance value within the resistance interval formed by the two resistance values corresponding to each straight line segment.
[0012] In one technical solution of the above-mentioned method for correcting the sampled value of a resistive temperature sensor, the step of "creating a curve showing the change between the temperature sampled value and the resistance value" specifically includes: performing curve fitting on the temperature sampled value and the resistance value to obtain a curve showing the change between the temperature sampled value and the resistance value.
[0013] In one technical solution of the above-mentioned method for correcting the sampled value of a resistive temperature sensor, the step of "performing curve fitting between the temperature sampled value and the resistance value to obtain the change curve between the temperature sampled value and the resistance value" specifically includes: performing curve fitting between the temperature sampled value and the resistance value using spline curve fitting, Bezier curve fitting, or fifth-order polynomial curve fitting methods to obtain the change curve between the temperature sampled value and the resistance value.
[0014] In one technical solution of the above-mentioned method for correcting the sampled values of a resistive temperature sensor, the fitting order ranges from 3 to 6.
[0015] In a second aspect, the present invention provides a device for correcting the sampled values of a resistive temperature sensor. The device includes: a first acquisition module configured to acquire multiple temperature sampled values of the resistive temperature sensor and a resistance value of the resistive temperature sensor corresponding to each temperature sampled value; a creation module configured to create a curve showing the change between the temperature sampled values and the resistance values; a selection module configured to select a typical resistance value within the curve, wherein the typical resistance value refers to the resistance value corresponding to an integer temperature sampled value; a second acquisition module configured to acquire the actual temperature value corresponding to each typical resistance value; a polynomial fitting module configured to perform polynomial fitting based on the temperature sampled value corresponding to each typical resistance value and the actual temperature value corresponding to each typical resistance value to obtain a calculation function for the actual temperature value; and an ambient temperature sampled value correction module configured to correct the ambient temperature sampled values obtained by sampling the current environment through the resistive temperature sensor according to the calculation function for the actual temperature value to obtain the actual ambient temperature value of the current environment.
[0016] In a third aspect, an electronic device is provided, comprising a processor and a storage device, the storage device being adapted to store a plurality of program codes, the program codes being adapted to be loaded and executed by the processor to perform the method for correcting the sampled values of a resistive temperature sensor as described in any of the above-described technical solutions.
[0017] In a fourth aspect, a computer-readable storage medium is provided, wherein a plurality of program codes are stored therein, the program codes being adapted to be loaded and run by a processor to perform the method for correcting the sampled values of a resistive temperature sensor as described in any of the above-described technical solutions.
[0018] The above-described technical solutions of the present invention have at least one or more of the following beneficial effects:
[0019] In implementing the technical solution of this invention, by acquiring multiple temperature sampling values from a resistive temperature sensor and the resistance value of the resistive temperature sensor corresponding to each temperature sampling value, a change curve between the temperature sampling value and the resistance value is created. This allows for accurate understanding of the changes in the temperature sampling value and the resistance value, which is beneficial for the resistive temperature sensor to correct the sampling value based on the change curve. By selecting a typical resistance value within the change curve and obtaining the actual temperature value corresponding to each typical resistance value, and then performing polynomial fitting based on the temperature sampling value and the actual temperature value corresponding to each typical resistance value, a calculation function for the actual temperature value is obtained. Finally, the ambient temperature sampling value obtained by sampling the current environment through the resistive temperature sensor is corrected based on the calculation function for the actual temperature value, resulting in the actual ambient temperature value of the current environment. This calculation function effectively reduces the deviation between the temperature sampling value and the actual temperature value, significantly improving the detection accuracy of the resistive temperature sensor, broadening the application range of the temperature sensor, and improving the user experience. Attached Figure Description
[0020] The disclosure of this invention will become more readily understood with reference to the accompanying drawings. It will be readily understood by those skilled in the art that these drawings are for illustrative purposes only and are not intended to limit the scope of protection of this invention. Furthermore, similar numbers in the drawings are used to denote similar components, wherein:
[0021] Figure 1 This is a schematic flowchart of the main steps of a method for correcting the sampled value of a resistive temperature sensor according to an embodiment of the present invention;
[0022] Figure 2 This is a schematic flowchart of the main steps of a method for correcting the sampled values of a resistive temperature sensor according to another embodiment of the present invention;
[0023] Figure 3 This is a schematic diagram of the main structure of a device for correcting the sampled value of a resistive temperature sensor according to an embodiment of the present invention.
[0024] List of reference numerals :
[0025] 11: First acquisition module; 12: Creation module; 13: Selection module; 14: Second acquisition module; 15: Polynomial fitting module; 16: Ambient temperature sampling value correction module. Detailed Implementation
[0026] Some embodiments of the present invention will now be described with reference to the accompanying drawings. Those skilled in the art should understand that these embodiments are merely illustrative of the technical principles of the present invention and are not intended to limit the scope of protection of the present invention.
[0027] In the description of this invention, "module" and "processor" can include hardware, software, or a combination of both. A module may include hardware circuitry, various suitable sensors, communication ports, and memory, and may also include software components, such as program code, or a combination of software and hardware. A processor may be a central processing unit, a microprocessor, a digital signal processor, or any other suitable processor. The processor has data and / or signal processing capabilities. The processor may be implemented in software, in hardware, or a combination of both. Non-transitory computer-readable storage media include any suitable medium capable of storing program code, such as magnetic disks, hard disks, optical disks, flash memory, read-only memory, random access memory, etc.
[0028] See appendix Figure 1 , Figure 1 This is a schematic flowchart illustrating the main steps of a method for correcting the sampled values of a resistive temperature sensor according to an embodiment of the present invention. Figure 1 As shown, the correction method for the sampled value of the resistive temperature sensor in this embodiment of the invention mainly includes the following steps S101-S106.
[0029] Step S101: Obtain multiple temperature sampling values from the resistive temperature sensor and the resistance value of the resistive temperature sensor corresponding to each temperature sampling value.
[0030] In this embodiment, the resistive temperature sensor is a temperature sensor made using a material whose resistance changes with temperature. It is mostly used in industrial applications below 600°C.
[0031] Step S102: Create a curve showing the change between temperature sampling value and resistance value.
[0032] In one implementation, the temperature sample value and the resistance value can be curve-fitted to obtain the change curve of the temperature sample value and the resistance value.
[0033] It should be noted that curve fitting refers to a data processing method that uses a curve to approximate the functional relationship between the coordinates of discrete points on a plane. In other words, it solves for a fitting curve so that the coordinates of the image points are distributed in the vicinity of this curve. The fitting curve reflects the overall distribution of the image point coordinates, and at the same time, the functional model of the fitting curve deviates from the known height information dataset in the whole.
[0034] Step S103: Select a typical resistance value within the variation curve.
[0035] In this embodiment, the typical resistance value refers to the resistance value corresponding to an integer temperature sampling value.
[0036] In one implementation, the resistance value corresponding to an integer temperature sampling value within the change curve can be obtained through the change curve, and this resistance value can be used as a typical resistance value.
[0037] Step S104: Obtain the actual temperature value corresponding to each typical resistance value.
[0038] In one embodiment, a correspondence table between typical resistance values and actual temperature values, i.e., a temperature characteristic table, can be pre-set. Then, the corresponding actual temperature value can be obtained according to each typical resistance value through the temperature characteristic table. This embodiment of the invention does not specifically limit this.
[0039] Step S105: Perform polynomial fitting based on the temperature sample value corresponding to each typical resistance value and the actual temperature value corresponding to each typical resistance value to obtain the calculation function of the actual temperature value.
[0040] In this embodiment, polynomial fitting refers to using a polynomial function, adjusting the parameters of the function, so that the function graph approximates the data curve, can represent the trend of the data curve, and thus can use this polynomial to replace the original data sequence.
[0041] In one implementation, a polynomial fitting can be performed using the temperature sample value corresponding to each typical resistance value as the independent variable and the actual temperature value corresponding to each typical resistance value as the dependent variable to obtain the calculation function for the actual temperature value, as shown in the following formula:
[0042] T a =K0+K1×T s +K2×T s 2 +…+K n ×T s n
[0043] Where n is the fitting order, K0, K1, K2, ..., K n T represents the polynomial fitting coefficients. s The temperature sample value corresponding to each typical resistance value, T a The actual temperature value corresponding to each typical resistance value.
[0044] Furthermore, the polynomial fitting coefficients K0, K1, K2, ..., K can be calculated using the temperature sample value corresponding to each typical resistance value and the actual temperature value corresponding to each typical resistance value. n The value of .
[0045] Furthermore, the fitting order n is a pre-selected value. The fitting order n can be a value obtained by those skilled in the art based on experimental data, or it can be a value obtained by those skilled in the art after adjusting the pre-set value according to actual needs. This embodiment of the invention does not limit this. In addition, the fitting order n can be any value in the range of 3 to 6. Preferably, the fitting order n in this embodiment of the invention is 5.
[0046] Step S106: Correct the ambient temperature sampling value obtained by sampling the current environment through the resistive temperature sensor according to the actual temperature value calculation function to obtain the actual ambient temperature value of the current environment.
[0047] In one embodiment, the ambient temperature sample value obtained by sampling the current environment through a resistive temperature sensor can be substituted into the above-mentioned actual temperature value calculation function to obtain the actual value of the current ambient temperature.
[0048] Based on steps S101-S106 above, by acquiring multiple temperature sampling values from the resistive temperature sensor and the corresponding resistance value of the resistive temperature sensor for each temperature sampling value, a curve showing the change between the temperature sampling value and the resistance value is created. This allows for accurate understanding of the changes in the temperature sampling value and the resistance value, which is beneficial for the resistive temperature sensor to correct the sampling value based on this curve. By selecting typical resistance values within the curve and acquiring the actual temperature value corresponding to each typical resistance value, a polynomial fitting is performed on the temperature sampling value and the actual temperature value corresponding to each typical resistance value to obtain a calculation function for the actual temperature value. Finally, the ambient temperature sampling value obtained by the resistive temperature sensor from sampling the current environment is corrected based on the calculation function for the actual temperature value to obtain the actual ambient temperature value. This calculation function effectively reduces the deviation between the temperature sampling value and the actual temperature value, significantly improving the sampling accuracy of the resistive temperature sensor, broadening the application range of the temperature sensor, and improving the user experience.
[0049] See appendix Figure 2 , Figure 2 This is a schematic flowchart illustrating the main steps of a method for correcting the sampled values of a resistive temperature sensor according to another embodiment of the present invention. Figure 2 As shown, the correction method for the sampled value of the resistive temperature sensor in this embodiment of the invention mainly includes the following steps S201-S207.
[0050] Step S201: Obtain multiple temperature sampling values from the resistive temperature sensor and the resistance value of the resistive temperature sensor corresponding to each temperature sampling value.
[0051] In this embodiment, the method for obtaining multiple temperature sampling values of the resistive temperature sensor and the resistance value of the resistive temperature sensor corresponding to each temperature sampling value is the same as the method in step S101 above, and will not be repeated here.
[0052] Step S202: Perform curve fitting on the temperature sampling value and the resistance value to obtain the change curve of temperature and resistance value.
[0053] In this embodiment, curve fitting refers to a data processing method that uses a curve to approximate the functional relationship between coordinates represented by a set of discrete points on a plane. That is, a fitting curve is obtained so that the coordinates of the image points are distributed in the vicinity of this curve. The fitting curve reflects the overall distribution of the coordinates of the image points, and at the same time, the functional model of the fitting curve has the smallest overall deviation from the known height information dataset.
[0054] In one embodiment, based on the temperature sample value and the resistance value, a spline curve fitting, Bezier curve fitting, or fifth-order polynomial curve fitting method is used to perform curve fitting on the temperature sample value and the resistance value to obtain the temperature and resistance value change curve.
[0055] It should be noted that the specific fitting methods and operating principles of spline curve fitting, Bézier curve fitting, or fifth-order polynomial curve fitting are conventional technical means in this field, and the embodiments of the present invention will not describe them in detail.
[0056] Step S203: Divide the changing curve into multiple straight line segments.
[0057] Step S204: Determine the resistance values corresponding to the two endpoints of each straight line segment, and select typical resistance values within the resistance range formed by the two resistance values corresponding to each straight line segment.
[0058] In this embodiment, the typical resistance value refers to the resistance value corresponding to an integer temperature sampling value.
[0059] Step S205: Obtain the actual temperature value corresponding to each typical resistance value according to the pre-set temperature characteristic table.
[0060] Step S206: Using the temperature sample value corresponding to each typical resistance value as the independent variable and the actual temperature value corresponding to each typical resistance value as the dependent variable, perform polynomial fitting to obtain the calculation function of the actual temperature value.
[0061] In this embodiment, the calculation function for the actual temperature value is the same as the calculation function for the actual temperature value in step S105 above, and will not be repeated here.
[0062] Step S207: Correct the ambient temperature sample value obtained by sampling the current environment through the resistive temperature sensor according to the actual temperature value calculation function to obtain the actual ambient temperature value of the current environment.
[0063] In this embodiment, the ambient temperature sample value obtained by sampling the current environment through the resistive temperature sensor is corrected according to the calculation function of the actual temperature value. The correction method of the actual ambient temperature value is the same as the step in step S106 above, and will not be repeated here.
[0064] Based on steps S201-S207 above, by acquiring multiple temperature sampling values from the resistive temperature sensor and the corresponding resistance value of the resistive temperature sensor for each temperature sampling value, a curve fitting is performed on the temperature sampling values and resistance values to obtain a temperature-resistance change curve. This allows for accurate understanding of the changes in temperature sampling values and resistance values, which is beneficial for the resistive temperature sensor to correct the sampling values based on this change curve. The change curve is divided into multiple straight line segments, and the resistance values corresponding to the two endpoints of each straight line segment are determined. Typical resistance values are selected within the resistance range formed by the two resistance values corresponding to each straight line segment, and the resistance values are obtained according to a pre-set temperature characteristic table. The actual temperature value is obtained by performing a polynomial fitting with the temperature sample value corresponding to each typical resistance value as the independent variable and the actual temperature value corresponding to each typical resistance value as the dependent variable. This yields a calculation function for the actual temperature value. Finally, the ambient temperature sample value obtained by the resistive temperature sensor is corrected based on this calculation function to obtain the actual ambient temperature value. This calculation function effectively reduces the deviation between the temperature sample value and the actual temperature value, significantly improving the detection accuracy of the resistive temperature sensor, broadening its application range, and enhancing the user experience.
[0065] It should be noted that although the steps in the above embodiments are described in a specific order, those skilled in the art will understand that in order to achieve the effects of the present invention, different steps do not necessarily have to be executed in such an order. They can be executed simultaneously (in parallel) or in other orders, and these variations are all within the scope of protection of the present invention.
[0066] Furthermore, the present invention also provides a device for correcting the sampled values of a resistive temperature sensor.
[0067] See appendix Figure 3 , Figure 3 This is a main structural block diagram of a correction device for the sampled value of a resistive temperature sensor according to an embodiment of the present invention. Figure 3 As shown, the device for correcting the sampled values of a resistive temperature sensor in this embodiment of the invention mainly includes a first acquisition module 11, a creation module 12, a selection module 13, a second acquisition module 14, a polynomial fitting module 15, and an ambient temperature sampled value correction module 16. In some embodiments, one or more of the first acquisition module 11, creation module 12, selection module 13, second acquisition module 14, polynomial fitting module 15, and ambient temperature sampled value correction module 16 can be combined into a single module. In some embodiments, the first acquisition module 11 can be configured to acquire multiple temperature sampled values of the resistive temperature sensor and the resistance value of the resistive temperature sensor corresponding to each temperature sampled value. The creation module 12 can be configured to create a curve showing the change between the temperature sampled value and the resistance value. The selection module 13 can be configured to select a typical resistance value within the curve, where the typical resistance value refers to the resistance value corresponding to an integer temperature sampled value. The second acquisition module 14 can be configured to acquire the actual temperature value corresponding to each typical resistance value. The polynomial fitting module 15 can be configured to perform polynomial fitting based on the temperature sampled value corresponding to each typical resistance value and the actual temperature value corresponding to each typical resistance value to obtain a calculation function for the actual temperature value. The ambient temperature sampling value correction module 16 can be configured to correct the ambient temperature sampling value obtained by sampling the current environment through a resistive temperature sensor according to a calculation function of the actual temperature value, so as to obtain the actual ambient temperature value of the current environment. In one embodiment, a description of the specific implementation function can be found in steps S101 to S106.
[0068] The above-mentioned correction device for the sampled value of the resistive temperature sensor is used to perform... Figure 1The embodiments of the resistive temperature sensor sampling value correction method shown are similar in technical principle, the technical problems solved and the technical effects produced. Those skilled in the art can clearly understand that, for the sake of convenience and brevity, the specific working process and related descriptions of the resistive temperature sensor sampling value correction device can be found in the embodiments of the resistive temperature sensor sampling value correction method, which will not be repeated here.
[0069] Those skilled in the art will understand that all or part of the processes in the method of the above embodiment of the present invention can also be implemented by a computer program instructing related hardware. The computer program can be stored in a computer-readable storage medium, and when executed by a processor, it can implement the steps of the various method embodiments described above. The computer program includes computer program code, which can be in the form of source code, object code, executable file, or some intermediate form. The computer-readable storage medium can include any entity or device capable of carrying the computer program code, a medium, a USB flash drive, a portable hard drive, a magnetic disk, an optical disk, a computer memory, a read-only memory, a random access memory, an electrical carrier signal, a telecommunication signal, and a software distribution medium, etc. It should be noted that the content included in the computer-readable storage medium can be appropriately added or removed according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, the computer-readable storage medium does not include electrical carrier signals and telecommunication signals.
[0070] Furthermore, the present invention also provides an electronic device. In one embodiment of the electronic device according to the present invention, the electronic device includes a processor and a storage device. The storage device can be configured to store a program for performing a correction method for the resistive temperature sensor sample values of the above-described method embodiments. The processor can be configured to execute the program in the storage device, which includes, but is not limited to, a program for performing a correction method for the resistive temperature sensor sample values of the above-described method embodiments. For ease of explanation, only the parts related to the embodiments of the present invention are shown. For specific technical details not disclosed, please refer to the method section of the embodiments of the present invention.
[0071] Furthermore, the present invention also provides a computer-readable storage medium. In one embodiment of the computer-readable storage medium according to the present invention, the computer-readable storage medium can be configured to store a program for performing a correction method for the sampled values of a resistive temperature sensor according to the above-described method embodiments. This program can be loaded and run by a processor to implement the correction method for the sampled values of the resistive temperature sensor described above. For ease of explanation, only the parts related to the embodiments of the present invention are shown; for specific technical details not disclosed, please refer to the method section of the embodiments of the present invention. The computer-readable storage medium can be a storage device comprising various electronic devices. Optionally, in the embodiments of the present invention, the computer-readable storage medium is a non-transitory computer-readable storage medium.
[0072] Furthermore, it should be understood that since the various modules are only provided to illustrate the functional units of the device of the present invention, the physical devices corresponding to these modules may be the processor itself, or a part of the processor's software, hardware, or a combination of software and hardware. Therefore, the number of modules shown in the figures is merely illustrative.
[0073] Those skilled in the art will understand that the various modules in the device can be adaptively split or combined. Such splitting or combining of specific modules will not cause the technical solution to deviate from the principles of the present invention; therefore, the technical solutions after splitting or combining will fall within the protection scope of the present invention.
[0074] The technical solution of the present invention has been described above with reference to the preferred embodiments shown in the accompanying drawings. However, it will be readily understood by those skilled in the art that the scope of protection of the present invention is obviously not limited to these specific embodiments. Without departing from the principles of the present invention, those skilled in the art can make equivalent changes or substitutions to the relevant technical features, and the technical solutions after such changes or substitutions will all fall within the scope of protection of the present invention.
Claims
1. A method for correcting the sampled values of a resistive temperature sensor, characterized in that, The method includes: Acquire multiple temperature sampling values of the resistive temperature sensor and the resistance value of the resistive temperature sensor corresponding to each temperature sampling value; Create a curve showing the change between the temperature sampling value and the resistance value; A typical resistance value is selected within the variation curve, wherein the typical resistance value refers to the resistance value corresponding to an integer temperature sampling value; Obtain the actual temperature value corresponding to each of the typical resistance values; A polynomial fitting is performed based on the temperature sample value corresponding to each typical resistance value and the actual temperature value corresponding to each typical resistance value to obtain the calculation function of the actual temperature value; The ambient temperature sample value obtained by sampling the current environment through the resistive temperature sensor is corrected according to the calculation function of the actual temperature value to obtain the actual ambient temperature value of the current environment.
2. The method for correcting the sampled values of a resistive temperature sensor according to claim 1, characterized in that, The step of "performing polynomial fitting based on the temperature sample value corresponding to each typical resistance value and the actual temperature value corresponding to each typical resistance value to obtain the calculation function for the actual temperature value" specifically includes: Using the temperature sample value corresponding to each typical resistance value as the independent variable and the actual temperature value corresponding to each typical resistance value as the dependent variable, a polynomial fitting is performed to obtain the calculation function for the actual temperature value as shown in the following formula: T a =K0+K1×T s +K2×T s 2 +…+K n ×T s n Where n is the fitting order, K0, K1, K2, ..., K n T represents the polynomial fitting coefficients. s For each of the typical resistance values, the corresponding temperature sample value, T a The actual temperature value corresponding to each of the typical resistance values.
3. The method for correcting the sampled values of a resistive temperature sensor according to claim 1, characterized in that, The step of "obtaining the actual temperature value corresponding to each typical resistance value" specifically includes: Obtain the actual temperature value corresponding to each typical resistance value according to the pre-set temperature characteristic table.
4. The method for correcting the sampled values of a resistive temperature sensor according to claim 1, characterized in that, The step of "selecting a typical resistance value within the variation curve" specifically includes: Divide the changing curve into multiple straight line segments; Determine the resistance values corresponding to the two endpoints of each straight line segment, and select the typical resistance value within the resistance range formed by the two resistance values corresponding to each straight line segment.
5. The method for correcting the sampled values of a resistive temperature sensor according to claim 1, characterized in that, The steps of "creating the curve of the change between the temperature sampling value and the resistance value" specifically include: Curve fitting is performed on the temperature sample value and the resistance value to obtain the change curve of the temperature sample value and the resistance value.
6. The method for correcting the sampled values of a resistive temperature sensor according to claim 5, characterized in that, The step of "performing curve fitting between the temperature sample value and the resistance value to obtain the change curve of the temperature sample value and the resistance value" specifically includes: Based on the temperature sample value and the resistance value, a spline curve fitting, Bezier curve fitting, or fifth-order polynomial curve fitting method is used to fit the temperature sample value and the resistance value to obtain the change curve of the temperature sample value and the resistance value.
7. The method for correcting the sampled values of a resistive temperature sensor according to claim 2, characterized in that, The fitting order ranges from 3 to 6.
8. A device for correcting the sampled values of a resistive temperature sensor, characterized in that, The device includes: The first acquisition module is configured to acquire multiple temperature sampling values of the resistive temperature sensor and the resistance value of the resistive temperature sensor corresponding to each temperature sampling value. A module is created, which is configured to create a curve showing the change between the temperature sample value and the resistance value; A selection module is configured to select a typical resistance value within the change curve, wherein the typical resistance value refers to the resistance value corresponding to an integer temperature sampling value; The second acquisition module is configured to acquire the actual temperature value corresponding to each of the typical resistance values; A polynomial fitting module is configured to perform polynomial fitting based on the temperature sample value corresponding to each typical resistance value and the actual temperature value corresponding to each typical resistance value to obtain a calculation function for the actual temperature value. An ambient temperature sampling value correction module is configured to correct the ambient temperature sampling value obtained by sampling the current environment through the resistive temperature sensor according to the calculation function of the actual temperature value, so as to obtain the actual ambient temperature value of the current environment.
9. An electronic device comprising a processor and a storage device, said storage device being adapted to store a plurality of program codes, characterized in that, The program code is adapted to be loaded and run by the processor to perform a method for correcting the sampled values of the resistive temperature sensor as described in any one of claims 1 to 7.
10. A computer-readable storage medium storing a plurality of program codes, characterized in that, The program code is adapted to be loaded and run by a processor to perform a method for correcting the sampled values of the resistive temperature sensor as described in any one of claims 1 to 7.