PCB-based half-brick module test tool
By designing a PCB-based half-brick module test fixture that integrates filter circuits and test points, the problem of large workload and safety hazards caused by manual soldering and wiring in existing technologies is solved, and the automation and efficiency of half-brick module testing are realized.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- BEIJING MECHANICAL EQUIP INST
- Filing Date
- 2022-07-21
- Publication Date
- 2026-05-19
AI Technical Summary
The current testing process for semi-brick modules involves manual welding and wiring, which results in a large workload, is tedious, and poses safety hazards.
Design a PCB-based half-brick module test fixture that integrates an input filter circuit, a half-brick module interface board, and an output filter circuit. Set multiple test points and connect the half-brick module pins through spring sockets. Use capacitors and resistors for filtering, and combine a single-pole double-throw switch and a sampling resistor for testing to achieve automated testing.
This approach achieves simplicity, efficiency, and reliability in the half-brick module testing process, reduces safety risks associated with manual operation, and improves the comprehensiveness and efficiency of testing.
Smart Images
Figure CN117471351B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of switching power supply technology, and in particular to a PCB-based half-brick module testing fixture. Background Technology
[0002] In recent years, with the rapid development of electronic technology, power supply technology has made great strides, and power modules have gradually become the development direction of power supply technology. The emergence and development of power modules have greatly facilitated the design of power supply systems. Their structured characteristics make power supply design simpler, development cycles shorter, and development efficiency higher, making them the preferred solution for power supply system design. Power modules, with their advantages of high efficiency, reliability, and ease of maintenance, are widely used in computers, communications, aerospace, industrial control, power grids, and other fields. With the large-scale use of power modules in various industries, their research and development and production scale has also increased significantly. Many domestic and foreign manufacturers have also invested a large amount of resources in the production of power modules.
[0003] From research and development to production, testing is an indispensable part of the process, and its efficiency often directly impacts overall research and development efficiency. A scientific and efficient testing process is crucial for shortening product development and production cycles and improving product quality.
[0004] Existing semi-brick modules not only need to be tested for input / output characteristics, but also for power integrity and signal integrity. Therefore, the direct testing method of manual soldering and wiring is not only labor-intensive and cumbersome, but also has many safety issues.
[0005] In view of this, the present invention proposes a PCB-based test fixture for half-brick modules, which makes the testing process of half-brick module power supplies simple, efficient, comprehensive and reliable. Summary of the Invention
[0006] Based on the above analysis, the present invention aims to provide a PCB-based semi-brick module testing fixture to solve the problems of large workload, cumbersome process, and safety hazards caused by manual soldering and wiring in the existing testing fixtures.
[0007] On one hand, embodiments of the present invention provide a PCB-based half-brick module test fixture, the test fixture including an input filter circuit, a half-brick module interface board, and an output filter circuit connected in sequence, the half-brick module interface board being used to connect the half-brick module under test; all components of the half-brick module test fixture are integrated on a PCB board, and multiple test points are set on the PCB board; the multiple test points are set between the input filter circuit and the half-brick module interface board, and between the half-brick module interface board and the output filter circuit;
[0008] The input filtering circuit filters the DC power supply and sends it to the half-brick module through the half-brick module interface board; the output signal of the half-brick module is sent to the output filtering circuit through the half-brick module interface board for filtering and output.
[0009] Furthermore, the half-brick module interface board is provided with an interface that matches the pins of the half-brick module under test, and each interface is provided with a spring socket that matches the corresponding pin of the half-brick module; when the half-brick module is tested, each pin of the half-brick module is inserted into the spring socket of the corresponding interface of the interface board.
[0010] Furthermore, the input filtering circuit includes an input high-frequency filtering circuit and an input low-frequency filtering circuit. The input power supply is filtered by the input high-frequency filtering circuit and the input low-frequency filtering circuit in sequence, and then sent to the half-brick module through the half-brick module interface board.
[0011] The input high-frequency filter circuit includes three capacitors C1, C2, and C3 connected in parallel. One end of capacitors C1 and C2 is connected to one end of short-circuit blocks DL4 and DL5, respectively, and the other end of both is connected to the negative terminal of the DC power supply. The other end of short-circuit blocks DL4 and DL5 is connected to the positive terminal of the DC power supply. The two ends of capacitor C3 are connected to the positive and negative terminals of the DC power supply, respectively.
[0012] The input low-frequency filter circuit includes four capacitors C4-C7 connected in parallel. The positive terminal of capacitor C4 is connected to the positive terminal of the DC power supply, and the negative terminal is connected to the negative terminal of the DC power supply. The positive terminals of capacitors C5-C7 are respectively connected to one end of short-circuit blocks DL6-DL8. The other ends of short-circuit blocks DL6-DL8 are all connected to the positive terminal of the DC power supply, and the negative terminals of capacitors C5-C7 are all connected to the negative terminal of the DC power supply.
[0013] Furthermore, the output filtering circuit includes an output high-frequency filtering circuit and an output low-frequency filtering circuit. The output signal of the half-brick module is filtered by the output high-frequency filtering circuit and the output low-frequency filtering circuit in sequence after passing through the half-brick module interface board before being output.
[0014] The output high-frequency filter circuit includes three capacitors C8-C10 connected in parallel. One end of capacitors C8 and C9 is connected to one end of short-circuit blocks DL9 and DL10, respectively, and the other end of each capacitor is connected to the VOUT- interface of the half-brick module interface board. The other ends of short-circuit blocks DL9 and DL10 are connected to the VOUT+ interface of the half-brick module interface board. The two ends of capacitor C10 are connected to the VOUT- interface and VOUT+ interface of the half-brick module interface board, respectively.
[0015] The output low-frequency filter circuit includes four capacitors C11-C14 connected in parallel. The positive terminal of capacitor C11 is connected to the VOUT+ interface of the half-brick module interface board, and the negative terminal is connected to the VOUT- interface of the half-brick module interface board. The positive terminals of capacitors C12-C14 are respectively connected to one end of short-circuit blocks DL11-DL13. The other ends of short-circuit blocks DL11-DL13 are all connected to the VOUT+ interface of the half-brick module interface board. The negative terminals of capacitors C12-C14 are all connected to the VOUT- interface of the half-brick module interface board.
[0016] Furthermore, the test fixture also includes a single-pole double-throw switch. The stationary end of the single-pole double-throw switch is connected to the ON / OFF interface of the half-brick module interface board, and one side of the moving end is connected to the VIN- interface of the half-brick module interface board, while the other end is left floating, which is used to control the power on and off of the half-brick module.
[0017] The test fixture also includes an input sampling resistor Rsi and an output sampling resistor Rso. One end of the input sampling resistor Rsi is connected to the positive terminal of the DC power supply, and the other end is connected to the VIN+ interface of the half-brick module interface board. One end of the output sampling resistor Rso is connected to the VOUT+ interface of the half-brick module interface board, and the other end is connected to the other end of the short-circuit blocks DL9 and DL10.
[0018] The test points include test points TP1-TP9. Test points TP1 and TP2 are located at both ends of the input sampling resistor Rsi and are used to test the input current of the half-brick module. TP3 and TP5 are located at the VIN+ and VIN- interfaces of the half-brick module interface board, respectively, and are used to test the input voltage of the half-brick module. TP4 is located at the ON / OFF interface of the half-brick module interface board and is used to test the power-off signal of the half-brick module.
[0019] TP6 and TP9 are located at the two ends of the output sampling resistor Rso, respectively, and are used to test the output current of the half-brick module. TP7 and TP8 are located at the VOUT- and VPUT+ interfaces of the half-brick module interface board, respectively, and are used to test the output voltage of the half-brick module.
[0020] Furthermore, the test fixture also includes a current sharing pin for the half-brick, wherein pins 1ISHARE- and 3ISHARE- are shorted by a concealed wire on the PCB board and connected to the ISHARE- interface of the half-brick module interface board, and pins 2ISHARE+ and 4ISHARE+ are shorted by a concealed wire on the PCB board and connected to the ISHARE+ interface of the half-brick module interface board.
[0021] Furthermore, the test fixture also includes a synchronous starter, whose pin 1 ON / OFF is connected to the ON / OFF interface of the half-brick module interface board, and pin 2 VIN- is connected to the VIN- interface of the half-brick module interface board.
[0022] The test fixture also includes an output voltage adjustment port, whose pins TRIM- and TRIM+ are connected to the TRIM- and TRIM+ interfaces of the half-brick module interface board, respectively.
[0023] Furthermore, the test fixture also includes an adjustable resistor Rup, with one fixed end of the adjustable resistor Rup connected to a short-circuit block DL2, and the other fixed end left floating. The adjustable end is connected to one end of a resistor R1, and the other end of the resistor R1 is connected to the short-circuit block DL1. The other end of the short-circuit block DL1 is connected to the SENSE+ interface of the half-brick module interface board and the other end of the output sampling resistor Rso. The other end of the short-circuit block DL2 is connected to the TRIM+ interface of the half-brick module interface board.
[0024] Furthermore, the test fixture also includes a downward adjustment resistor Rdw, one fixed end of which is connected between the short-circuit block DL2 and the upward adjustment resistor Rup, and the other fixed end is suspended. The adjustable end is connected to one end of the resistor R2, and the other end of the resistor R2 is connected to the short-circuit block DL3. The other end of the short-circuit block DL3 is connected to the VOUT- and SENSE- interfaces of the half-brick module interface board.
[0025] Furthermore, the test fixture also includes safety capacitors CY1-CY8 for suppressing common-mode interference. One end of safety capacitors CY1 and CY2 is connected to both sides of resistor Rsi, and one end of safety capacitors CY5 and CY6 is connected to both sides of Rso. The other ends of safety capacitors CY1, CY2, CY5, and CY6 are all grounded. Safety capacitors CY3 and CY4 are connected in parallel, with one end of CY3 and CY4 connected to the negative terminal of the DC power supply and the other end grounded. Safety capacitors CY7 and CY8 are connected in parallel, with one end of CY7 and CY8 connected to the VOUT- interface of the half-brick module interface board and the other end grounded.
[0026] Compared with the prior art, the present invention can achieve at least one of the following beneficial effects:
[0027] 1. By setting test points TP1-TP9, the testing process for the half-brick module becomes simple, efficient, comprehensive, and reliable, solving the problems of large workload, cumbersome process, and safety hazards caused by manual welding and wiring in the existing test fixtures.
[0028] 2. By connecting multiple test fixtures in parallel through the half-brick current sharing pin and synchronous starter, and realizing the parallel connection between half-brick modules, the power processed by a single half-brick module is reduced, thereby improving the system's unreliability.
[0029] In this invention, the above-described technical solutions can be combined with each other to achieve more preferred combinations. Other features and advantages of this invention will be set forth in the following description, and some advantages may become apparent from the description or be learned by practicing the invention. The objects and other advantages of this invention can be realized and obtained from what is particularly pointed out in the description and drawings. Attached Figure Description
[0030] The accompanying drawings are for illustrative purposes only and are not intended to limit the invention. Throughout the drawings, the same reference numerals denote the same parts.
[0031] Figure 1 For the test fixture schematic diagram
[0032] Figure 2 For testing tooling PCB board
[0033] Figure 3 A schematic diagram of a test environment built using a PCB-based half-brick module test fixture. Detailed Implementation
[0034] Preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings, which form part of this application and are used together with the embodiments of the present invention to illustrate the principles of the present invention, but are not intended to limit the scope of the present invention.
[0035] A specific embodiment of the present invention discloses a PCB-based half-brick module testing fixture, such as... Figure 1 and Figure 2 As shown. The test fixture includes an input filter circuit, a half-brick module interface board, and an output filter circuit connected in sequence. The half-brick module interface board is used to connect the half-brick module under test. All components of the half-brick module test fixture are integrated on a PCB board, and multiple test points are set on the PCB board. The multiple test points are set between the input filter circuit and the half-brick module interface board, and between the half-brick module interface board and the output filter circuit.
[0036] The input filtering circuit filters the DC power supply and sends it to the half-brick module through the half-brick module interface board; the output signal of the half-brick module is sent to the output filtering circuit through the half-brick module interface board for filtering and output.
[0037] Specifically, such as Figure 3 As shown, the test fixture has a heat sink attached to its back, and a fan is installed on the side wall of the heat sink and an air duct is provided. When the test fixture is working, the heat generated is dissipated through the heat sink and the fan from the air duct.
[0038] Furthermore, the half-brick module interface board is provided with an interface that matches the pins of the half-brick module under test, and each interface is provided with a spring socket that matches the corresponding pin of the half-brick module; when the half-brick module is tested, each pin of the half-brick module is inserted into the spring socket of the corresponding interface of the interface board.
[0039] Specifically, to ensure a reliable connection between the PCB board and the power supply of the half-brick module under test, a spring socket matching the power supply pins of the half-brick module is selected as the connection method for the half-brick.
[0040] The 11 interfaces in the PCB diagram are used to connect the half-brick under test. The 11 interfaces are defined as the 11 pins of schematic M1, namely VIN+, ON / OFF, ISHARE+, ISHARE-, VOUT-, SENSE-, TRIM-, TRIM+, SENSE+, and VOUT+. Among them, the VOUT+ and VOUT- interfaces use spring sockets with a diameter of 2mm, while the other interfaces use spring sockets with a diameter of 1mm.
[0041] Furthermore, the input filtering circuit includes an input high-frequency filtering circuit and an input low-frequency filtering circuit. The input power supply is filtered by the input high-frequency filtering circuit and the input low-frequency filtering circuit in sequence, and then sent to the half-brick module through the half-brick module interface board.
[0042] The input high-frequency filter circuit includes three capacitors C1, C2, and C3 connected in parallel. One end of capacitors C1 and C2 is connected to one end of short-circuit blocks DL4 and DL5, respectively, and the other end of both is connected to the negative terminal of the DC power supply. The other end of short-circuit blocks DL4 and DL5 is connected to the positive terminal of the DC power supply. The two ends of capacitor C3 are connected to the positive and negative terminals of the DC power supply, respectively.
[0043] The input low-frequency filter circuit includes four capacitors C4-C7 connected in parallel. The positive terminal of capacitor C4 is connected to the positive terminal of the DC power supply, and the negative terminal is connected to the negative terminal of the DC power supply. The positive terminals of capacitors C5-C7 are respectively connected to one end of short-circuit blocks DL6-DL8. The other ends of short-circuit blocks DL6-DL8 are all connected to the positive terminal of the DC power supply, and the negative terminals of capacitors C5-C7 are all connected to the negative terminal of the DC power supply.
[0044] Specifically, capacitors C1, C2, and C3 in the input high-frequency filter circuit are high-frequency monolithic capacitors, which have three functions:
[0045] (1) Energy storage and exchange: electrical energy is generated and released through the charging and discharging process of the capacitor;
[0046] (2) Frequency discrimination filtering: Filtering out high-frequency noise on the input DC power supply voltage;
[0047] (3) Suppressing surge voltage: It can remove short-term surge pulse signals and absorb excess energy generated by voltage fluctuations in the circuit.
[0048] The capacitors C4-C7 in the input low-frequency filter circuit are aluminum electrolytic capacitors, which have two functions:
[0049] (1) Energy storage and exchange: storing energy and releasing the required current under specific conditions;
[0050] (2) Frequency discrimination filtering: Filter out low-frequency signals on the input voltage and suppress surge voltage.
[0051] In high-frequency and low-frequency filter circuits, appropriate capacitors can be connected by shorting the shorting block with a shorting element, depending on the actual situation.
[0052] For example, when the short-circuit block DL4 is shorted using a shorter circuit breaker, capacitor C1 is connected; otherwise, it is not connected.
[0053] Furthermore, the output filtering circuit includes an output high-frequency filtering circuit and an output low-frequency filtering circuit. The output signal of the half-brick module is filtered by the output high-frequency filtering circuit and the output low-frequency filtering circuit in sequence after passing through the half-brick module interface board before being output.
[0054] The output high-frequency filter circuit includes three capacitors C8-C10 connected in parallel. One end of capacitors C8 and C9 is connected to one end of short-circuit blocks DL9 and DL10, respectively, and the other end of each capacitor is connected to the VOUT- interface of the half-brick module interface board. The other ends of short-circuit blocks DL9 and DL10 are connected to the VOUT+ interface of the half-brick module interface board. The two ends of capacitor C10 are connected to the VOUT- interface and VOUT+ interface of the half-brick module interface board, respectively.
[0055] The output low-frequency filter circuit includes four capacitors C11-C14 connected in parallel. The positive terminal of capacitor C11 is connected to the VOUT+ interface of the half-brick module interface board, and the negative terminal is connected to the VOUT- interface of the half-brick module interface board. The positive terminals of capacitors C12-C14 are respectively connected to one end of short-circuit blocks DL11-DL13. The other ends of short-circuit blocks DL11-DL13 are all connected to the VOUT+ interface of the half-brick module interface board. The negative terminals of capacitors C12-C14 are all connected to the VOUT- interface of the half-brick module interface board.
[0056] Specifically, capacitors C8, C9, and C10 in the output high-frequency filter circuit are high-frequency monolithic capacitors, while capacitors C11-C14 in the output low-frequency filter circuit are aluminum electrolytic capacitors. These two types of capacitors work together primarily to filter out noise from the power output of the half-brick module and improve its anti-interference capability. When the load in the downstream stage suddenly increases, it will inevitably lower the output voltage of the half-brick. However, since the voltage across the capacitor will not drop rapidly and it can store some energy, it will release some of the previously stored energy to ensure that the output voltage of the half-brick is not too low. When the load suddenly decreases, it will inevitably raise the output voltage. Since the voltage across the capacitor will not rise rapidly and the electrolytic capacitor has a large capacitance, it can absorb this fluctuation, ensuring that the output voltage of the half-brick is not too high and guaranteeing the stability of the half-brick's output voltage.
[0057] Furthermore, the test fixture also includes a single-pole double-throw switch. The stationary end of the single-pole double-throw switch is connected to the ON / OFF interface of the half-brick module interface board, and one side of the moving end is connected to the VIN- interface of the half-brick module interface board, while the other end is left floating, which is used to control the power on and off of the half-brick module.
[0058] The test fixture also includes an input sampling resistor Rsi and an output sampling resistor Rso. One end of the input sampling resistor Rsi is connected to the positive terminal of the DC power supply, and the other end is connected to the VIN+ interface of the half-brick module interface board. One end of the output sampling resistor Rso is connected to the VOUT+ interface of the half-brick module interface board, and the other end is connected to the other end of the short-circuit blocks DL9 and DL10.
[0059] The test points include test points TP1-TP9. Test points TP1 and TP2 are located at both ends of the input sampling resistor Rsi and are used to test the input current of the half-brick module. TP3 and TP5 are located at the VIN+ and VIN- interfaces of the half-brick module interface board, respectively, and are used to test the input voltage of the half-brick module. TP4 is located at the ON / OFF interface of the half-brick module interface board and is used to test the power-off signal of the half-brick module.
[0060] TP6 and TP9 are located at the two ends of the output sampling resistor Rso, respectively, and are used to test the output current of the half-brick module. TP7 and TP8 are located at the VOUT- and VPUT+ interfaces of the half-brick module interface board, respectively, and are used to test the output voltage of the half-brick module.
[0061] Specifically, when the single-pole double-throw switch is connected to the VIN- interface of the half-brick module interface board, the half-brick module is in the powered-on state, and voltage can be measured at test points TP7 and TP8 on the output terminal of the half-brick module. When the single-pole double-throw switch is in the floating state, the half-brick module is in the powered-off state, and there is no voltage at test points TP7 and TP8 on the output terminal. The prerequisite for the single-pole double-throw switch to control the power on / off of the half-brick module is the connection of a DC power supply voltage, that is, the input voltage can be measured between test points TP3 and TP5.
[0062] Specifically, the voltage across the input sampling resistor Rsi is measured at test points TP1 and TP2, and the input current of the half-brick module is calculated using the formula I = U / R. The input voltage of the half-brick module is measured at test points TP3 and TP5. The power-on / off signal of the half-brick module is measured at test points TP4 and TP5 according to negative logic. When there is a voltage signal at TP4 and TP5, the half-brick module is in the power-off state; when there is no voltage signal at TP4 and TP5, the half-brick module is in the power-on state. The voltage across the output sampling resistor Rso is measured at test points TP6 and TP9, and the output current of the half-brick module is calculated using the formula I = U / R. The output voltage of the half-brick module is measured at test points TP7 and TP8.
[0063] All tests at the above test points were performed using a multimeter, mainly targeting the input and output characteristics of the half-brick module. When an oscilloscope is connected to the test point, the signal integrity and power integrity of the half-brick module can be measured. That is, the waveform on the oscilloscope should be smooth and free from overshoot, backtracking, ringing, oscillation, and other phenomena.
[0064] If the output sampling resistor Rso is removed and replaced with a 100mΩ high-power resistor to simulate the impedance of a long-distance transmission line, the remote compensation function can be tested.
[0065] Furthermore, the test fixture also includes a current sharing pin for the half-brick, wherein pins 1ISHARE- and 3ISHARE- are shorted by a concealed wire on the PCB board and connected to the ISHARE- interface of the half-brick module interface board, and pins 2ISHARE+ and 4ISHARE+ are shorted by a concealed wire on the PCB board and connected to the ISHARE+ interface of the half-brick module interface board.
[0066] Furthermore, the test fixture also includes a synchronous starter, whose pin 1 ON / OFF is connected to the ON / OFF interface of the half-brick module interface board, and pin 2 VIN- is connected to the VIN- interface of the half-brick module interface board.
[0067] The test fixture also includes an output voltage adjustment port, whose pins TRIM- and TRIM+ are connected to the TRIM- and TRIM+ interfaces of the half-brick module interface board, respectively.
[0068] Furthermore, the test fixture also includes an adjustable resistor Rup, with one fixed end of the adjustable resistor Rup connected to a short-circuit block DL2, and the other fixed end left floating. The adjustable end is connected to one end of a resistor R1, and the other end of the resistor R1 is connected to the short-circuit block DL1. The other end of the short-circuit block DL1 is connected to the SENSE+ interface of the half-brick module interface board and the other end of the output sampling resistor Rso. The other end of the short-circuit block DL2 is connected to the TRIM+ interface of the half-brick module interface board.
[0069] Specifically, the specified output voltage adjustment range is 29.3-36V. When the voltage needs to be adjusted, both shorting blocks DL1 and DL2 are shorted using the shorting mechanism. The output voltage of the half-brick module is then adjusted to the required voltage by adjusting the adjustment resistor. The voltage adjustment formula is as follows:
[0070] Vo = (Rup + 1) / (Rup - 9.2) * 28V
[0071] The resistance of resistor R1 is set to 27kΩ, and the resistance of the upper resistor Rup is adjusted to 200kΩ. As the resistance of the upper resistor Rup decreases from 200kΩ to 18kΩ, the output voltage of the half-brick module changes from 29.3V to 36V. When the resistance of the upper resistor decreases to 6kΩ, the output voltage is 40V, triggering overvoltage protection. Resistor R1 is used to prevent damage to the output circuit caused by an excessively high output voltage if the resistance of the upper resistor Rup is accidentally adjusted to 0 during an overvoltage protection fault. When the resistance of resistor R1 is 27kΩ, the maximum voltage is 44V.
[0072] Furthermore, the test fixture also includes a downward adjustment resistor Rdw, one fixed end of which is connected between the short-circuit block DL2 and the upward adjustment resistor Rup, and the other fixed end is suspended. The adjustable end is connected to one end of the resistor R2, and the other end of the resistor R2 is connected to the short-circuit block DL3. The other end of the short-circuit block DL3 is connected to the VOUT- and SENSE- interfaces of the half-brick module interface board.
[0073] Specifically, the specified output voltage reduction range is 26.7-18V. When the voltage needs to be increased, both shorting blocks DL3 and DL2 are shorted using the shorting mechanism. The output voltage of the half-brick module is then adjusted to the required voltage by adjusting the reduction resistor. The voltage reduction formula is as follows:
[0074] Vo=(Rdw+1) / (Rdw+2)*28V
[0075] The resistance of resistor R2 is set to 330Ω, and the resistance of resistor Rdw is reduced by 20kΩ. During the process of reducing the resistance of Rdw from 20kΩ to 470Ω, the output voltage of the half-brick module changes from 26.7V to 18V. Resistor R2 is used to prevent the output voltage from being too low.
[0076] Furthermore, the test fixture also includes safety capacitors CY1-CY8 for suppressing common-mode interference. One end of safety capacitors CY1 and CY2 is connected to both sides of resistor Rsi, and one end of safety capacitors CY5 and CY6 is connected to both sides of Rso. The other ends of safety capacitors CY1, CY2, CY5, and CY6 are all grounded. Safety capacitors CY3 and CY4 are connected in parallel, with one end of CY3 and CY4 connected to the negative terminal of the DC power supply and the other end grounded. Safety capacitors CY7 and CY8 are connected in parallel, with one end of CY7 and CY8 connected to the VOUT- interface of the half-brick module interface board and the other end grounded.
[0077] Specifically, safety capacitors CY1-CY8 are used to suppress common-mode interference and will not cause electric shock or endanger personal safety if the capacitors fail.
[0078] Specifically, the test fixtures in this application can be used in parallel, with a maximum of 8 test fixture boards connected in parallel, that is, 8 half-brick modules connected in parallel.
[0079] When connected in parallel, pins 3ISHARE- and 4ISHARE+ of the current sharing pin of the previous test fixture are connected to pins 1ISHARE- and 2ISHARE+ of the current sharing pin of the next test fixture. Pins 1ON / OFF and 2VIN- of the synchronous starter of the previous test fixture are connected to pins 1ON / OFF and 2VIN- of the synchronous starter of the next test fixture. The output sampling resistor is replaced with a diode to prevent a voltage difference between the output voltage of the previous half-brick module and the output voltage of the next half-brick module, which would cause backflow. At this time, except for the first test fixture, the single-pole double-throw switches of the other test fixtures are all closed, and all parallel test fixtures are controlled by the switch of the first test fixture.
[0080] Compared with existing technologies, this embodiment provides a PCB-based half-brick module test fixture. By setting test points TP1-TP9, the testing process of the half-brick module becomes simple, efficient, comprehensive, and reliable. It solves the problems of large workload, cumbersome process, and safety hazards caused by manual soldering and wiring in existing test fixtures. By connecting multiple test fixtures in parallel through half-brick current sharing pins and synchronous starters, and realizing parallel connection between half-brick modules, the power processed by a single half-brick module is reduced, improving system unreliability.
[0081] Those skilled in the art will understand that all or part of the processes of the methods described in the above embodiments can be implemented by a computer program instructing related hardware, and the program can be stored in a computer-readable storage medium. The computer-readable storage medium may be a disk, optical disk, read-only memory, or random access memory, etc.
[0082] The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any changes or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in the present invention should be included within the scope of protection of the present invention.
Claims
1. A PCB-based semi-brick module testing fixture, characterized in that: The test fixture includes an input filter circuit, a half-brick module interface board, and an output filter circuit connected in sequence. The half-brick module interface board is used to connect the half-brick module under test. All components of the half-brick module test fixture are integrated on a PCB board, and multiple test points are set on the PCB board. The multiple test points are set between the input filter circuit and the half-brick module interface board, and between the half-brick module interface board and the output filter circuit. The input filtering circuit filters the DC power supply and sends it to the half-brick module through the half-brick module interface board; the output signal of the half-brick module is sent to the output filtering circuit through the half-brick module interface board for filtering and output. The half-brick module interface board is provided with an interface that matches the pins of the half-brick module under test. Each interface is provided with a spring socket that matches the corresponding pin of the half-brick module. When the half-brick module is tested, each pin of the half-brick module is inserted into the spring socket of the corresponding interface of the interface board. The test fixture also includes a single-pole double-throw switch. The stationary end of the single-pole double-throw switch is connected to the ON / OFF interface of the half-brick module interface board, and one side of the moving end is connected to the VIN- interface of the half-brick module interface board, while the other end is left floating. It is used to control the power on and off of the half-brick module. The test fixture also includes an input sampling resistor Rsi and an output sampling resistor Rso. One end of the input sampling resistor Rsi is connected to the positive terminal of the DC power supply, and the other end is connected to the VIN+ interface of the half-brick module interface board. One end of the output sampling resistor Rso is connected to the VOUT+ interface of the half-brick module interface board, and the other end is connected to the other end of the short-circuit blocks DL9 and DL10. The test points include test points TP1-TP9. Test points TP1 and TP2 are located at both ends of the input sampling resistor Rsi and are used to test the input current of the half-brick module. TP3 and TP5 are located at the VIN+ and VIN- interfaces of the half-brick module interface board, respectively, and are used to test the input voltage of the half-brick module. TP4 is located at the ON / OFF interface of the half-brick module interface board and is used to test the power-off signal of the half-brick module. TP6 and TP9 are located at the two ends of the output sampling resistor Rso, respectively, and are used to test the output current of the half-brick module. TP7 and TP8 are located at the VOUT- and VPUT+ interfaces of the half-brick module interface board, respectively, and are used to test the output voltage of the half-brick module.
2. The PCB-based semi-brick module testing fixture according to claim 1, characterized in that: The input filtering circuit includes an input high-frequency filtering circuit and an input low-frequency filtering circuit. The DC power supply is sequentially filtered by the input high-frequency filtering circuit and the input low-frequency filtering circuit before being sent to the half-brick module through the half-brick module interface board. The input high-frequency filter circuit includes three capacitors C1, C2, and C3 connected in parallel. One end of capacitors C1 and C2 is connected to one end of short-circuit blocks DL4 and DL5, respectively, and the other end of both is connected to the negative terminal of the DC power supply. The other end of short-circuit blocks DL4 and DL5 is connected to the positive terminal of the DC power supply. The two ends of capacitor C3 are connected to the positive and negative terminals of the DC power supply, respectively. The input low-frequency filter circuit includes four capacitors C4-C7 connected in parallel. The positive terminal of capacitor C4 is connected to the positive terminal of the DC power supply, and the negative terminal is connected to the negative terminal of the DC power supply. The positive terminals of capacitors C5-C7 are respectively connected to one end of short-circuit blocks DL6-DL8. The other ends of short-circuit blocks DL6-DL8 are all connected to the positive terminal of the DC power supply, and the negative terminals of capacitors C5-C7 are all connected to the negative terminal of the DC power supply.
3. The PCB-based semi-brick module testing fixture according to claim 2, characterized in that: The output filtering circuit includes an output high-frequency filtering circuit and an output low-frequency filtering circuit. The output signal of the half-brick module is filtered by the high-frequency filtering circuit and the low-frequency filtering circuit after passing through the half-brick module interface board before being output. The output high-frequency filter circuit includes three capacitors C8-C10 connected in parallel. One end of capacitors C8 and C9 is connected to one end of short-circuit blocks DL9 and DL10, respectively, and the other end of each capacitor is connected to the VOUT- interface of the half-brick module interface board. The other ends of short-circuit blocks DL9 and DL10 are connected to the VOUT+ interface of the half-brick module interface board. The two ends of capacitor C10 are connected to the VOUT- interface and VOUT+ interface of the half-brick module interface board, respectively. The output low-frequency filter circuit includes four capacitors C11-C14 connected in parallel. The positive terminal of capacitor C11 is connected to the VOUT+ interface of the half-brick module interface board, and the negative terminal is connected to the VOUT- interface of the half-brick module interface board. The positive terminals of capacitors C12-C14 are respectively connected to one end of short-circuit blocks DL11-DL13. The other ends of short-circuit blocks DL11-DL13 are all connected to the VOUT+ interface of the half-brick module interface board. The negative terminals of capacitors C12-C14 are all connected to the VOUT- interface of the half-brick module interface board.
4. The PCB-based semi-brick module testing fixture according to claim 1, characterized in that: The test fixture also includes a current sharing pin for the half-brick, with pins 1 ISHARE- and 3 ISHARE- shorted by a concealed wire on the PCB and connected to the ISHARE- interface of the half-brick module interface board, and pins 2 ISHARE+ and 4 ISHARE+ shorted by a concealed wire on the PCB and connected to the ISHARE+ interface of the half-brick module interface board.
5. The PCB-based semi-brick module testing fixture according to claim 4, characterized in that: The test fixture also includes a synchronous starter, whose pin 1 ON / OFF is connected to the ON / OFF interface of the half-brick module interface board, and pin 2 VIN- is connected to the VIN- interface of the half-brick module interface board. The test fixture also includes an output voltage adjustment port, whose pins TRIM- and TRIM+ are connected to the TRIM- and TRIM+ interfaces of the half-brick module interface board, respectively.
6. The PCB-based semi-brick module testing fixture according to claim 5, characterized in that: The test fixture also includes an adjustable resistor Rup. One fixed end of the adjustable resistor Rup is connected to a short-circuit block DL2, and the other fixed end is left floating. The adjustable end is connected to one end of a resistor R1, and the other end of the resistor R1 is connected to the short-circuit block DL1. The other end of the short-circuit block DL1 is connected to the SENSE+ interface of the half-brick module interface board and the other end of the output sampling resistor Rso. The other end of the short-circuit block DL2 is connected to the TRIM+ interface of the half-brick module interface board.
7. A PCB-based semi-brick module testing fixture according to claim 6, characterized in that: The test fixture also includes a down-adjustment resistor R. dw The fixed end of the downward adjustment resistor Rdw is connected between the short-circuit block DL2 and the upward adjustment resistor Rup, and the other fixed end is suspended. The adjustable end is connected to one end of the resistor R2, and the other end of the resistor R2 is connected to the short-circuit block DL3. The other end of the short-circuit block DL3 is connected to the VOUT- interface and SENSE- interface of the half-brick module interface board.
8. A PCB-based semi-brick module testing fixture according to claim 7, characterized in that: The test fixture also includes safety capacitors CY1-CY8 for suppressing common-mode interference. One end of safety capacitors CY1 and CY2 is connected to both sides of resistor Rsi, and one end of safety capacitors CY5 and CY6 is connected to both sides of Rso. The other ends of safety capacitors CY1, CY2, CY5, and CY6 are all grounded. Safety capacitors CY3 and CY4 are connected in parallel, with one end of CY3 and CY4 connected to the negative terminal of the DC power supply and the other end grounded. Safety capacitors CY7 and CY8 are connected in parallel, with one end of CY7 and CY8 connected to the VOUT- interface of the half-brick module interface board and the other end grounded.