Procedure inspection system for providing a cabinet and a server in the cabinet

Abstract

A procedure detection system for providing a cabinet and a server in the cabinet, a detection device performs a server procedure detection of each server in the cabinet in a L10 stage, and then performs a cabinet procedure detection in a L11 stage, when the server procedure detection of the server in the L10 stage is failed by the detection device or the cabinet procedure detection of the cabinet in the L11 stage is failed by the detection device, the server is provided to be repaired or replaced by a backup server, the repaired server and the backup server which is not detected in the L10 stage are first detected in the L10 stage and then continue the detection process, the backup server which is detected in the L10 stage can continue the detection process, thereby achieving the technical effect of reducing the detection time of the cabinet and the server in the cabinet.

Description

Technical Field

[0001] An inspection system, particularly a process inspection system for server racks and servers within server racks. Background Technology

[0002] The current testing process for server racks and the servers within them involves separate L10-level server process testing and L11-level rack process testing. If a testing problem occurs during either L10 or L11 stage, the testing process is interrupted. The server and rack bindings must be severed to resolve the issue before the L10 and L11 tests are repeated, resulting in unnecessary testing time being wasted.

[0003] In summary, it is clear that the existing technology has long suffered from the problem that the current testing process for server racks and the servers installed within them is too time-consuming. Therefore, it is necessary to propose improved technical methods to solve this problem. Summary of the Invention

[0004] In view of the problem that existing inspection processes for server racks and servers within them are too time-consuming, this invention discloses a process inspection system for server racks and servers within them, wherein:

[0005] The first embodiment of this invention discloses a process inspection system for a server rack and servers within the rack, comprising: a server rack and an inspection device, wherein the server rack houses multiple servers; and the inspection device is connected to the server rack and performs the following inspection process:

[0006] The testing device performs L10 stage server process testing on each server in the rack. If a server fails the L10 stage server process testing, it is removed from the rack for repair. After repair, the server is reinserted into the rack, and the testing device performs L10 stage server process testing on the reinserted server. When all servers in the rack pass the L10 stage server process testing successfully, the testing device performs L11 stage rack process testing on the rack. If a server fails the L11 stage rack process testing, it is removed from the rack for repair. After repair, the server is reinserted into the rack, and the testing device first performs L10 stage server process testing on the reinserted server and detects that the server process is successful. Then, the testing device performs L11 stage rack process testing on the rack again.

[0007] The second embodiment of the present invention discloses a process inspection system for a server rack and servers within the rack, comprising: a server rack, a backup server rack, and a testing device. The server rack is equipped with multiple servers; the backup server rack is equipped with multiple backup servers; and the testing device is connected to the server rack, performing the following testing process:

[0008] The testing device performs L10 stage server process testing on each server in the rack. If a server in the rack fails the L10 stage server process testing, a backup server is selected from the backup rack to replace it. The testing device then performs L10 stage server process testing on the backup server in the rack. When all servers in the rack pass the L10 stage server process testing, the testing device performs L11 stage rack process testing on the rack. If a server fails the L11 stage rack process testing, an unreplaced backup server is selected from the backup rack to replace it. Furthermore, if the testing device first performs L10 stage server process testing on the backup server in the rack and detects that the server process is successful, the testing device then performs L11 stage rack process testing on the rack again.

[0009] The third embodiment of this invention discloses a process inspection system for a server rack and servers within the rack, comprising: a server rack, a backup server rack, and a testing device. The server rack houses multiple servers; the backup server rack houses multiple backup servers; and the testing device is connected to both the server rack and the backup server rack, and performs the following testing process:

[0010] The testing device performs L10 stage server process testing on each server in the rack; the testing device also performs L10 stage server process testing on each backup server in the backup rack; if a server in the rack fails the L10 stage server process testing, a backup server that has passed the L10 stage server process testing is selected from the backup rack to replace the failed server; when all servers in the rack pass the L10 stage server process testing, the testing device performs L11 stage rack process testing on the rack; if a server fails the L11 stage rack process testing, an unreplaced backup server from the backup rack is selected to replace the failed server; and the testing device then performs L11 stage rack process testing on the rack again.

[0011] The system disclosed in this invention is as described above. The difference between it and the prior art is that the detection device performs L10 stage server process detection on each server in the rack, and then performs L11 stage rack process detection. When the detection device detects a server process failure in L10 stage server process detection or a rack process failure in L11 stage rack process detection, the server is provided for repair or a backup server is used to replace the server. The repaired server and the backup server that has not undergone L10 stage server process detection first undergo L10 stage server process detection before continuing the detection process. The backup server that has undergone L10 stage server process detection can continue the detection process.

[0012] Through the above-mentioned technical means, the present invention can achieve the technical effect of reducing the testing time of the server rack and the servers set in the server rack. Attached Figure Description

[0013] Figure 1 The diagram illustrates the architecture of the first embodiment of the process inspection of the server rack and the server within the rack provided by the present invention.

[0014] Figure 2A The diagram illustrates the architecture of the second embodiment of the process inspection of the server rack and the server within the rack provided by the present invention.

[0015] Figure 2B The illustration shows a server replacement diagram of a second embodiment of the process inspection of a server rack and servers within the rack provided by the present invention.

[0016] Figure 2C The illustration shows a server replacement diagram of a second embodiment of the process inspection of a server rack and servers within the rack provided by the present invention.

[0017] Figure 3A The diagram illustrates the architecture of the third embodiment of the process inspection of the server rack and the server within the rack provided by the present invention.

[0018] Figure 3B The illustration shows a server replacement diagram of the third embodiment of the process inspection of the server rack and the server inside the rack provided by the present invention.

[0019] Figure 3C The illustration shows a server replacement diagram of the third embodiment of the process inspection of the server rack and the server inside the rack provided by the present invention.

[0020] Explanation of reference numerals in the attached figures:

[0021] 100: Server rack

[0022] 101: First Server

[0023] 102: Second Server

[0024] 103: Third Server

[0025] 200: Backup cabinet

[0026] 201: First Backup Server

[0027] 202: Second backup server

[0028] 203: Third backup server

[0029] 300: Detection device Detailed Implementation

[0030] The following will describe in detail the implementation of the present invention with reference to the accompanying drawings and embodiments, so that the process of how the present invention uses technical means to solve technical problems and achieve technical effects can be fully understood and implemented accordingly.

[0031] The following description is of the process inspection system for server racks and servers within server racks according to the first embodiment of the present invention, and please refer to [the relevant documentation]. Figure 1 As shown, Figure 1 The diagram illustrates the architecture of the first embodiment of the process inspection of the server rack and the server within the rack provided by the present invention.

[0032] The first embodiment of this invention discloses a process inspection system for a server rack and servers within the rack, comprising: a server rack 100 and an inspection device 300. The server rack 100 is equipped with a first server 101, a second server 102, and a third server 103 (this is merely an example and does not limit the scope of application of the invention); and the inspection device 300 is connected to the server rack 100, and the inspection device 300 performs the following inspection process:

[0033] The testing device 300 performs L10 stage server process testing on the first server 101, the second server 102, and the third server 103 in the rack 100. The L10 stage server process testing includes server assembly testing, server preliminary testing, server firmware upgrade testing, server basic function testing, server configuration testing, server stress test testing, server post-stress test secondary basic function testing, and server system log testing. This is only an example and is not intended to limit the scope of application of the present invention.

[0034] In the first embodiment, the server process of the first server 101 in the rack 100 is detected as failing in the L10 stage by the detection device 300. The first server 101 is removed from the rack 100 for repair. After the repair is completed, the first server 101 is put back into the rack 100. The detection device 300 performs L10 stage server process detection on the put-back first server 101.

[0035] When the server process of the first server 101, the second server 102, and the third server 103 in the rack 100 is detected as successful by the detection device 300 in the L10 stage, the detection device 300 performs rack process detection in the L11 stage on the rack 100. The rack process detection in the L11 stage includes rack assembly detection, rack stress test detection, rack basic function detection after rack stress test, and rack configuration detection after rack stress test. This is only an example and is not intended to limit the application scope of the present invention.

[0036] If the third server 103 in rack 100 fails the rack process test at stage L11 by the testing device 300, the third server 103 is removed from rack 100 for maintenance. After maintenance, the third server 103 is put back into rack 100. The testing device 300 first performs the server process test at stage L10 on the put-back third server 103 and detects that the server process is successful. Then, the testing device 300 performs the rack process test at stage L11 on rack 100 again.

[0037] The following description describes the process inspection system for a server rack and servers within the rack, as disclosed in the second embodiment of this invention. Please refer to [link / reference]. Figure 2A As shown, Figure 2A The diagram illustrates the architecture of the second embodiment of the process inspection of the server rack and the server within the rack provided by the present invention.

[0038] The second embodiment of this invention discloses a process inspection system for a server rack and servers within the rack, comprising: a server rack 100, a backup server rack 200, and a detection device 300. The server rack 100 is equipped with a first server 101, a second server 102, and a third server 103 (this is merely illustrative and does not limit the scope of application of the invention); the backup server rack 200 is equipped with a first backup server 201, a second backup server 202, and a third backup server 203 (this is also merely illustrative and does not limit the scope of application of the invention); and the detection device 300 is connected to the server rack 100 and performs the following detection process:

[0039] The testing device 300 performs L10 stage server process testing on the first server 101, the second server 102, and the third server 103 in the rack 100. The L10 stage server process testing includes server assembly testing, server preliminary testing, server firmware upgrade testing, server basic function testing, server configuration testing, server stress test testing, server post-stress test secondary basic function testing, and server system log testing. This is only an example and is not intended to limit the scope of application of the present invention.

[0040] In the second embodiment, if the server process of the first server 101 in rack 100 fails during the L10 stage server process detection by the detection device 300, a second backup server 202 is selected from the backup rack 200 to replace the first server 101. The detection device 300 then performs the L10 stage server process detection on the second backup server 202 in rack 100. For a schematic diagram of the replacement between the first server 101 and the second backup server 202, please refer to [reference needed]. Figure 2B As shown, Figure 2B The illustration shows a server replacement diagram of a second embodiment of the process inspection of a server rack and servers within the rack provided by the present invention.

[0041] When the server process of the second backup server 202, the second server 102, and the third server 103 in the rack 100 is detected as successful by the detection device 300 in the L10 stage, the detection device 300 performs the rack process inspection in the L11 stage on the rack 100. The rack process inspection in the L11 stage includes rack assembly inspection, rack stress test inspection, rack basic function inspection after rack stress test, and rack configuration inspection after rack stress test. This is only an example and is not intended to limit the application scope of the present invention.

[0042] When the rack process inspection device 300 detects a failure in rack 100 during stage L11, the third server 103 in rack 100 is replaced by an unreplaced third backup server 203 selected from the backup rack 200. Please refer to the diagram illustrating the replacement between the third server 103 and the third backup server 203. Figure 2C As shown, Figure 2C The illustration shows a server replacement diagram of a second embodiment of the process inspection of a server rack and servers within the rack provided by the present invention.

[0043] When the detection device 300 first performs the L10 stage server process detection on the third backup server 203 in the rack 100 and detects that the server process is successful, the detection device 300 then performs the L11 stage rack process detection on the rack 100 again.

[0044] The following description describes the process inspection system for a server rack and servers within the rack, as disclosed in the third embodiment of this invention. Please refer to [link / reference needed]. Figure 3A As shown, Figure 3A The diagram illustrates the architecture of the third embodiment of the process inspection of the server rack and the server within the rack provided by the present invention.

[0045] The third embodiment of this invention discloses a process inspection system for a server rack and servers within the rack, comprising: a server rack 100, a backup server rack 200, and a detection device 300. The server rack 100 is equipped with a first server 101, a second server 102, and a third server 103 (this is merely illustrative and does not limit the scope of application of the invention). The backup server rack 200 is equipped with a first backup server 201, a second backup server 202, and a third backup server 203 (this is also merely illustrative and does not limit the scope of application of the invention). The detection device 300 is connected to both the server rack 100 and the backup server rack 200, and performs the following detection process:

[0046] The testing device 300 performs L10 stage server process testing on the first server 101, the second server 102, and the third server 103 in the server rack 100. The testing device 300 also performs L10 stage server process testing on the first backup server 201, the second backup server 202, and the third backup server 203 in the backup server rack 200. The L10 stage server process testing includes server assembly testing, server preliminary testing, server firmware upgrade testing, server basic function testing, server configuration testing, server stress test testing, server post-stress test secondary basic function testing, and server system log testing. This is only an example and is not intended to limit the scope of application of the present invention.

[0047] In the third embodiment, if the server process of the first server 101 in the rack 100 fails during the L10 stage server process detection by the detection device 300, a second backup server 202, which has been detected as having succeeded during the L10 stage server process detection by the detection device 300, is selected from the backup rack 200 to replace the first server 101. Since the second backup server 202 has already been detected as having succeeded during the server process detection by the detection device 300, it is not necessary to perform the L10 stage server process detection on the second backup server 202 again when it replaces the first server 101. For a schematic diagram of the mutual replacement between the first server 101 and the second backup server 202, please refer to [reference needed]. Figure 3B As shown, Figure 3B The illustration shows a server replacement diagram of the third embodiment of the process inspection of the server rack and the server inside the rack provided by the present invention.

[0048] When the server process of the second backup server 202, the second server 102, and the third server 103 in the rack 100 is detected as successful by the detection device 300 in the L10 stage, the detection device 300 performs the rack process inspection in the L11 stage on the rack 100. The rack process inspection in the L11 stage includes rack assembly inspection, rack stress test inspection, rack basic function inspection after rack stress test, and rack configuration inspection after rack stress test. This is only an example and is not intended to limit the application scope of the present invention.

[0049] In rack 100, the third server 103 fails the rack process inspection at stage L11. The inspection device 300 then selects an unreplaced third backup server 203 from the backup rack 200 to replace the third server 103. Since the third backup server 203 has already been detected as having successfully completed its server process by the inspection device 300, it is not necessary to perform the L10 stage server process inspection on the third backup server 203 again when replacing the third server 103. Please refer to the diagram illustrating the replacement between the third server 103 and the third backup server 203. Figure 3C As shown, Figure 3C The illustration shows a server replacement diagram of the third embodiment of the process inspection of the server rack and the server inside the rack provided by the present invention. The inspection device 300 re-performs the L11 stage rack process inspection on the server rack 100.

[0050] In summary, the difference between this invention and the prior art lies in the fact that the detection device performs L10 stage server process detection on each server in the rack, and then performs L11 stage rack process detection. When a server in the rack is detected as having failed the server process during L10 stage server process detection, or when the rack is detected as having failed the rack process during L11 stage rack process detection, the server is provided for repair or a backup server is used to replace the server. The repaired server and the backup server that has not undergone L10 stage server process detection first undergo L10 stage server process detection before continuing the detection process. The backup server that has undergone L10 stage server process detection can continue the detection process.

[0051] This technology can solve the problem that the existing testing process for server racks and servers installed in server racks is too time-consuming, thereby achieving the technical effect of reducing the testing time of server racks and servers installed in server racks.

[0052] While the embodiments disclosed in this invention are as described above, the content is not intended to directly limit the scope of patent protection of this invention. Anyone skilled in the art to which this invention pertains may make minor modifications in form and detail without departing from the spirit and scope disclosed herein. The scope of patent protection of this invention shall still be determined by the scope defined in the appended claims.

Claims

1. A process inspection system for providing a server rack and servers within the rack, comprising: The server rack contains multiple servers; and The detection device establishes a connection with the cabinet and performs the following detection process: The testing device performs L10 stage server process testing on each server in the rack. When the server in the rack is detected by the detection device as having failed the server process during the L10 stage of the server process inspection, the server is removed from the rack for repair. After the repair is completed, the server is re-racked in the rack, and the testing device performs L10 stage server process testing on the re-racked server. When all servers in the rack are detected as having successfully completed the server process in the L10 stage by the detection device, the detection device performs the L11 stage rack process detection on the rack. When a server in the rack is detected as having failed the rack process during the L11 stage rack process inspection by the detection device, the server is removed from the rack for repair. as well as After the maintenance is completed, the server is re-installed in the rack. The testing device first performs L10 stage server process testing on the re-installed server. If the server process is found to be successful, the testing device then performs L11 stage rack process testing on the rack.

2. The process detection system for providing a cabinet and a server in the cabinet according to claim 1, wherein The L10 stage of server process inspection includes server assembly inspection, server preliminary inspection, server firmware upgrade inspection, server basic function inspection, server configuration inspection, server stress test inspection, server post-stress test secondary basic function inspection, and server system log inspection.

3. The process detection system for providing a cabinet and a server in the cabinet according to claim 1, wherein, The L11 stage of rack process inspection includes rack assembly inspection, rack stress test inspection, rack basic function inspection after stress test, and rack configuration inspection after stress test.

4. A process inspection system for providing a server rack and servers within the rack, comprising: The server rack contains multiple servers; The backup server rack is equipped with multiple backup servers; and The detection device establishes a connection with the cabinet and performs the following detection process: The testing device performs L10 stage server process testing on each server in the rack. When the server in the rack fails the server process detection at stage L10, a backup server is selected from the backup rack to replace the server. The testing device performs L10 stage server process testing on the backup server in the cabinet. When all servers in the rack are detected as having successfully completed the server process in the L10 stage by the detection device, the detection device performs the L11 stage rack process detection on the rack. When a server in the rack is detected as having failed the rack process during L11 stage by the detection device, a backup server that has not been replaced is selected from the backup rack to replace the server; and The detection device first performs L10 stage server process detection on the backup server in the rack and detects that the server process is successful. Then, the detection device performs L11 stage rack process detection on the rack again.

5. The process detection system for providing a cabinet and a server in the cabinet according to claim 4, wherein, The L10 stage of server process inspection includes server assembly inspection, server preliminary inspection, server firmware upgrade inspection, server basic function inspection, server configuration inspection, server stress test inspection, server post-stress test secondary basic function inspection, and server system log inspection.

6. The process inspection system for providing a server rack and servers within the rack according to claim 4, wherein, The L11 stage of rack process inspection includes rack assembly inspection, rack stress test inspection, rack basic function inspection after stress test, and rack configuration inspection after stress test.

7. A process inspection system for providing a server rack and servers within the rack, comprising: The server rack contains multiple servers; The backup server rack is equipped with multiple backup servers; and The detection device establishes connections with both the cabinet and the backup cabinet, and performs the following detection process: The testing device performs L10 stage server process testing on each server in the rack. The testing device performs L10 stage server process testing on each backup server in the backup rack. When the server in the rack fails the server process detection at stage L10, a backup server that has been detected as having succeeded in the server process detection at stage L10 is selected from the backup rack to replace the server. When all servers in the rack are detected as having successfully completed the server process in the L10 stage by the detection device, the detection device performs the L11 stage rack process detection on the rack. When a server in the rack is detected as having failed the rack process during L11 stage by the detection device, a backup server that has not been replaced is selected from the backup rack to replace the server; and The testing device re-performs the L11 stage cabinet process test on the cabinet.

8. The process inspection system for providing a server rack and servers within the rack according to claim 7, wherein, The L10 stage of server process inspection includes server assembly inspection, server preliminary inspection, server firmware upgrade inspection, server basic function inspection, server configuration inspection, server stress test inspection, server post-stress test secondary basic function inspection, and server system log inspection.

9. The process inspection system for providing a server rack and servers within the rack according to claim 7, wherein, The L11 stage of rack process inspection includes rack assembly inspection, rack stress test inspection, rack basic function inspection after stress test, and rack configuration inspection after stress test.

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