Prism optical path measuring method and tool thereof

Abstract

The application discloses a prism optical path measurement method and a tool thereof. The prism optical path measurement method of the application utilizes a shadow contour line formed by a shielding mark line, such as a scale line, in a light spot to measure, compared with directly measuring a light contour, the method is easier to identify and position, thereby reducing measurement error; the scheme further utilizes an existing two-dimensional projector facility, and a method for measuring a prism optical path by using a two-dimensional projector has not appeared in an existing method, through automatic imaging and measurement functions of the two-dimensional projector, operation steps of measurement are greatly simplified, and since imaging and measurement accuracy of the two-dimensional projector itself is relatively high, accuracy of the method for measuring the prism optical path is also relatively high; the tool of the application comprises one or more scale plates, which can conveniently provide the shielding mark line.

Description

Technical Field

[0001] This invention relates to the field of photovoltaic power generation, and specifically to a prism optical path measurement method and its tooling. Background Technology

[0002] The optical path length of a prism refers to the total length of the path a light ray travels inside the prism after entering it. Due to the refraction of the prism, light rays are refracted after entering the prism's incident surface and propagate along the angle of refraction inside the prism until they exit the prism, where they are refracted again. The length of the light ray's path inside the prism is related to the speed of light propagation in the prism material, which in turn depends on the refractive index of the prism material. The optical path length is not only the geometric length of the actual path but also takes into account the refractive index of the medium. Because light of different wavelengths travels at different speeds in a medium (i.e., dispersion), the same actual path will have different values ​​when calculating the optical path length depending on the wavelength.

[0003] In practical applications, measuring the optical path length of a prism is crucial for accurately understanding its influence on light propagation, and this has wide applications in optical design, spectroscopy, and precision measurement. For example, understanding the optical path length of a prism is essential in optical instrument calibration, fiber optic communication system design, and scientific research. Accurate measurement of the prism's optical path length can help researchers and engineers design more precise optical systems, improve the performance of optical measurement equipment, or better understand the physical processes of light-matter interaction.

[0004] Existing methods for measuring the optical path of prisms typically rely on traditional optical instruments and techniques, such as laser trackers, which calculate the optical path by precisely measuring the reflection angle of the laser on the prism surface. While these devices are generally highly accurate, they are expensive and bulky. Therefore, it is necessary to design a simpler and more convenient method for measuring the optical path of a prism. Summary of the Invention

[0005] To address the aforementioned problems, this invention discloses a prism optical path measurement method and its tooling.

[0006] To achieve the above objectives, the present invention provides the following technical solution: On one hand, this application provides a method for measuring the optical path length of a prism, the method comprising the following steps:

[0007] Set up a projection light source and set up occlusion marking lines on the projection path of the projection light source;

[0008] The first light spot generated by the projection light source is imaged according to the preset first position, and the initial X-axis coordinate P1 of the shadow outline generated by the occlusion mark line in the first light spot is recorded.

[0009] Determine the incident surface of the prism, set the incident surface to correspond to the projection light source, and make the light generated by the projection light source enter the incident surface through the blocking mark line;

[0010] Determine the exit surface of the prism, image the second light spot generated by the projection light source at the second position corresponding to the exit surface, and record the X-axis coordinate P2 of the shadow outline generated by the occlusion mark line in the second light spot;

[0011] Based on the obtained X-axis coordinate P2 and the initial X-axis coordinate P1, the distance between them in the X-axis direction is calculated, and the distance value is used as the optical path of the prism.

[0012] The first position and the second position have the same height.

[0013] In the above scheme, the method further includes:

[0014] The occlusion marking line is set above the projection worktable of the two-dimensional projector;

[0015] Start the two-dimensional projector, image the first light spot generated at the first position, align the reference axis of the two-dimensional projector with the shadow outline in the first light spot image, and set the initial X-axis coordinate P1 position parameter of the two-dimensional projector to zero.

[0016] Determine the incident surface of the prism, set the incident surface to correspond to the projection light source of the two-dimensional projector, and make the light generated by the projection light source enter the incident surface through the blocking mark line.

[0017] The exit surface of the prism is determined, and the second light spot generated by the projection light source is imaged at the second position corresponding to the exit surface. The X-axis coordinate P2 of the shadow outline generated by the occlusion mark line in the second light spot is recorded by the two-dimensional projector. Based on the obtained X-axis coordinate P2 and the initial X-axis coordinate P1, the distance value between the two in the X-axis direction is calculated, and the distance value is used as the optical path of the prism.

[0018] The first position and the second position have the same height.

[0019] In the above scheme, the occlusion marking line is a reticle line located on the reticle.

[0020] In the above scheme, the occlusion marking line is set on a light-transmitting plate or film.

[0021] On the other hand, this application also provides a prism optical path measurement fixture, the measuring fixture including a reticle with reticle lines, wherein the incident surface of the prism is placed on the reticle during measurement.

[0022] In the above solution, the tooling also includes a base, on which a light-transmitting hole is provided for alignment and cooperation with the reticle, and the reticle lines of the reticle are located at the light-transmitting hole.

[0023] In the above scheme, the tooling further includes a positioning component, which is used to limit the prism so that the incident surface of the prism is located on the reticle.

[0024] In the above scheme, the positioning component includes a positioning slot, which is used to align and cooperate with the prism. During measurement, the prism is inserted into the positioning slot.

[0025] In the above scheme, the positioning component includes a pressure plate rotatably mounted on the base, and an adjusting stud is rotatably mounted on the pressure plate. The lower end of the adjusting stud is used to abut against the prism to fix the prism.

[0026] In the above scheme, one or more reticles are provided on the base.

[0027] Compared with the prior art, the present invention has the following advantages: The prism optical path measurement method of this application uses the shadow outline formed by the shading marking line, such as the reticle, in the light spot for measurement. Compared with directly measuring the light outline, this method is easier to identify and locate, thereby reducing measurement errors. The solution also proposes to utilize existing two-dimensional projector facilities. There is no existing method for measuring the prism optical path using a two-dimensional projector. Through the automatic imaging and measurement function of the two-dimensional projector, the measurement operation steps are greatly simplified. Moreover, since the imaging measurement accuracy of the two-dimensional projector itself is relatively high, the accuracy of measuring the prism optical path using this method is also relatively high. The tooling of this application includes one or more reticles, which can conveniently provide the shading marking line. Attached Figure Description

[0028] Figure 1 This is a schematic diagram of the projection light source position in Embodiment 1 of this application;

[0029] Figure 2 This is a schematic diagram of the light spot imaging in an embodiment of this application;

[0030] Figure 3 A schematic diagram of a measuring fixture in one form is shown in the embodiments of this application;

[0031] Figure 4 This is a schematic diagram of another form of measuring fixture in the embodiments of this application. Detailed Implementation

[0032] The present invention will be further illustrated below with reference to specific embodiments. It should be understood that the following specific embodiments are for illustrative purposes only and are not intended to limit the scope of the invention. It should be noted that the terms "front," "rear," "left," "right," "up," and "down" used in the following description refer to directions in the accompanying drawings, and the terms "inner" and "outer" refer to directions toward or away from the geometric center of a specific component, respectively.

[0033] Example 1: See Figure 1-2 On the one hand, this application provides a method for measuring the optical path of a prism, which includes the following steps:

[0034] S101: Set a projection light source and set an obstruction mark line on the projection path of the projection light source;

[0035] The projection light source is used to generate a light beam, which passes through a blocking mark line and partially blocks the light to form a corresponding shadow outline. In one possible implementation, the blocking mark line is a reticle line located on a reticle. In another possible implementation, the blocking mark line is disposed on a light-transmitting plate or film. During measurement, the projection light source is disposed below the reticle, light-transmitting plate, or film so that the light beam it generates passes through the reticle, light-transmitting plate, or film from below.

[0036] S102: Image the first light spot generated by the projection light source according to the preset first position, and record the initial X-axis coordinate P1 of the shadow outline generated by the occlusion mark line in the first light spot;

[0037] In one possible implementation, the first position is a preset imaging position in the projection imaging device, and in specific processing, the X-axis position of the shadow outline can be used as the zero point coordinate.

[0038] S103: Determine the incident surface of the prism, set the incident surface to correspond to the projection light source, and make the light generated by the projection light source pass through the blocking mark line and enter the incident surface;

[0039] In this step, the measurer determines the corresponding incident surface according to the type of prism, and then places the prism incident surface on the blocking mark line so that the light generated by the projection light source passes through the blocking mark line and enters the incident surface.

[0040] S104: Determine the exit surface of the prism, image the second light spot generated by the projection light source at the second position corresponding to the exit surface, and record the X-axis coordinate P2 of the shadow outline generated by the occlusion mark line in the second light spot.

[0041] For details, please refer to Figure 1 The placement of the projection light source 1 and prism 2 is determined, and the light spot image at the exit surface is captured at position 3 during imaging.

[0042] S105: Based on the obtained X-axis coordinate P2 and the initial X-axis coordinate P1, calculate the distance between them in the X-axis direction, and use the distance value as the optical path of the prism;

[0043] Light rays entering through the prism's incident surface exit through its exit surface. Since it is difficult to determine the specific outline position of the light rays by directly measuring them, the shadow outline is formed in the first and second spot imaging by using the set blocking marking lines, and the reverse marking is used to make the measurement easier.

[0044] The first position and the second position are at the same height, preferably the first position and the second position are the same position. The optical path of the prism is calculated by the distance difference between the shadow contour lines formed in the first spot imaging and the second spot imaging.

[0045] Taking the testing of prism optical path using a two-dimensional projector that measures the distance to the edge of an object's contour through imaging as an example, the testing method includes the following steps. The working principle of the two-dimensional projector is to magnify the image of a small workpiece on a projection screen using an optical convex lens, forming a larger image. A measuring projector is a device that uses this principle to accurately measure and observe workpieces. The "two-dimensional" in a two-dimensional projector refers to the X and Y coordinates in a Cartesian coordinate system, and in a horizontal structure, it refers to the X and Z axis coordinates.

[0046] S201: Set the occlusion marking line above the projection worktable of the two-dimensional projector;

[0047] The projection stage of a 2D projector has a projection light source, which usually produces a green beam, such as the IM8000 2D projector.

[0048] For example, a reticle with crosshairs is placed on a projection worktable. The light beam generated by the projection light source in the projection worktable passes through the reticle and forms a light spot at the imaging end of the two-dimensional projector. In this light spot, the light rays blocked by the crosshairs in the reticle form a shadow outline.

[0049] S202: Start the two-dimensional projector, image the first light spot generated at the first position, align the reference axis of the two-dimensional projector with the shadow outline in the first light spot image, and set the initial X-axis coordinate P1 position parameter of the two-dimensional projector to zero.

[0050] That is, by adjusting and aligning the reference axis in the two-dimensional projector display device with the shadow outline in the first light spot image, the X-axis position of the shadow outline is taken as the zero point coordinate of the two-dimensional projector; by setting the X-axis coordinate to zero in the initial step of measurement, the uniformity of the measurement reference can be ensured, thereby making the subsequent measurement results more reliable.

[0051] S203: Determine the incident surface of the prism, set the incident surface to correspond to the projection light source of the two-dimensional projector, and make the light generated by the projection light source enter the incident surface through the blocking mark line.

[0052] In this step, the incident surface of the prism is placed on the reticle, and the light generated by the projection light source enters the prism through the incident surface after passing through the reticle.

[0053] S204: Determine the exit surface of the prism, image the second light spot generated by the projection light source at the second position corresponding to the exit surface, record the X-axis coordinate P2 of the shadow outline corresponding to the occlusion mark line in the second light spot using the two-dimensional projector, calculate the distance value in the X-axis direction between the obtained X-axis coordinate P2 and the initial X-axis coordinate P1, and use the distance value as the optical path of the prism; for example... Figure 2 In the light spot image, the distance L between the two shadow contour lines is the prism optical path measured in this study;

[0054] The two-dimensional projector can automatically measure the X-axis coordinate P2 of the shadow outline in the second light spot image based on its position. Since the X-axis coordinate P1 is the zero point coordinate in step S202, the value of the X-axis coordinate P2 is the prism optical path.

[0055] Wherein, the height of the first position and the second position are the same; in existing two-dimensional projectors, the first position and the second position can both adopt the device preset shooting position. Since the initial X-axis coordinate is set to zero and the height of the first position and the second position are kept consistent, or the same position is used, it is convenient to compare and calculate the distance difference between the first light spot and the second light spot, and simplify the optical path measurement process.

[0056] There is no existing method for measuring the optical path of a prism using a 2D projector. In this embodiment, the automatic imaging and measurement functions of the 2D projector greatly simplify the measurement process. Furthermore, since the imaging and measurement accuracy of the 2D projector itself is relatively high, the accuracy of measuring the optical path of the prism using this method is also relatively high. Using occlusion markers, such as the shadow outline formed by the reticle in the light spot, for measurement is easier to identify and locate than directly measuring the light outline, thus reducing measurement errors. The solution proposes utilizing existing 2D projector facilities, which means that high-precision measurements can be performed using existing resources without the need for additional dedicated measurement equipment.

[0057] Example 2: See Figure 3-4 To facilitate the setting of occlusion marking lines and the placement of prisms during measurement, this application also provides a prism optical path measurement fixture. The measuring fixture includes a reticle 100 with reticle lines. During measurement, the incident surface of the prism is placed on the reticle 100. During measurement, the incident surface of the prism to be measured is placed on the reticle 100, and the projection light source is placed below the reticle 100. At this time, the reticle lines on the reticle 100 can serve as occlusion marking lines.

[0058] In one possible implementation, the fixture further includes a base 200, which has a light-transmitting hole for aligning with the reticle 100, and the reticle lines of the reticle 100 are located at the light-transmitting hole. The reticle 100 can be glued and fixed to the base 200 around its perimeter, or it can be detachably connected by screws. During measurement, the prism is placed on the base 200, and the incident surface of the prism is aligned with the incident surface on the base 200, so that the light generated by the projection light source passes through the light-transmitting hole and the reticle 100 in sequence to reach the incident surface of the prism.

[0059] Example 3: See Figure 4 To facilitate the fixation of the prism placed on the base 200 and make it more stable during measurement, the tooling also includes a positioning component. The positioning component is used to limit the prism so that the incident surface of the prism is located on the reticle 100. Specifically, in one possible embodiment, the positioning component includes a positioning slot 300 disposed on the base 200. The positioning slot 300 is used to align and cooperate with the prism. During measurement, the prism is engaged in the positioning slot 300.

[0060] Example 4: See Figure 4 The positioning component includes a pressure plate 400 rotatably mounted on the base 200, and an adjusting stud 500 rotatably mounted on the pressure plate 400. The lower end of the adjusting stud 500 is used to abut against the prism to fix the prism.

[0061] Example 5: In order to accommodate prisms of different shapes and structures, a plastic ring, such as a ring of clay, can be separately set on the base 200 corresponding to the perimeter of the reticle 100. During positioning, the perimeter of the prism can be directly pressed down into the clay to accommodate the support of complex prisms, without having to design special positioning furniture for each type of prism, thus improving versatility.

[0062] The technical means disclosed in this invention are not limited to those disclosed in the above embodiments, but also include technical solutions composed of any combination of the above technical features. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principles of this invention, and these improvements and modifications are also considered within the scope of protection of this invention.

Claims

1. A method for measuring the optical path length of a prism, characterized in that: Includes the following steps: Set up a projection light source and set up occlusion marking lines on the projection path of the projection light source; The first light spot generated by the projection light source is imaged according to the preset first position, and the initial X-axis coordinate P1 of the shadow outline generated by the occlusion mark line in the first light spot is recorded. Determine the incident surface of the prism, set the incident surface to correspond to the projection light source, and make the light generated by the projection light source enter the incident surface through the blocking mark line; Determine the exit surface of the prism, image the second light spot generated by the projection light source at the second position corresponding to the exit surface, and record the X-axis coordinate P2 of the shadow outline generated by the occlusion mark line in the second light spot; Based on the obtained X-axis coordinate P2 and the initial X-axis coordinate P1, the distance between them in the X-axis direction is calculated, and the distance value is used as the optical path of the prism. The first position and the second position have the same height.

2. The prism optical path measurement method according to claim 1, characterized in that: The method further includes: The occlusion marking line is set above the projection worktable of the two-dimensional projector; Start the two-dimensional projector, image the first light spot generated at the first position, align the reference axis of the two-dimensional projector with the shadow outline in the first light spot image, and set the initial X-axis coordinate P1 position parameter of the two-dimensional projector to zero. Determine the incident surface of the prism, set the incident surface to correspond to the projection light source of the two-dimensional projector, and make the light generated by the projection light source enter the incident surface through the blocking mark line. The exit surface of the prism is determined, and the second light spot generated by the projection light source is imaged at the second position corresponding to the exit surface. The X-axis coordinate P2 of the shadow outline generated by the occlusion mark line in the second light spot is recorded by the two-dimensional projector. Based on the obtained X-axis coordinate P2 and the initial X-axis coordinate P1, the distance value between the two in the X-axis direction is calculated, and the distance value is used as the optical path of the prism. The first position and the second position have the same height.

3. The prism optical path measurement method according to claim 2, characterized in that: The occlusion marking line is a reticle line located on the reticle.

4. The prism optical path measurement method according to claim 1, characterized in that: The shading marking line is set on a light-transmitting plate or film.

5. The prism optical path measurement method according to claim 3, characterized in that: The reticle is a component of the measuring fixture, and during measurement, the incident surface of the prism is placed on the reticle.

6. The prism optical path measurement method according to claim 5, characterized in that: The measuring fixture also includes a base, on which a light-transmitting hole is provided for alignment and cooperation with the reticle, and the reticle lines are located at the light-transmitting hole.

7. The prism optical path measurement method according to claim 6, characterized in that: The measuring fixture also includes a positioning component for limiting the prism so that the incident surface of the prism is located on the reticle.

8. The prism optical path measurement method according to claim 7, characterized in that: The positioning component includes a positioning slot, which is used to align and cooperate with the prism. During measurement, the prism is engaged in the positioning slot.

9. The prism optical path measurement method according to claim 7, characterized in that: The positioning component includes a pressure plate rotatably mounted on the base, and an adjusting stud rotatably mounted on the pressure plate. The lower end of the adjusting stud is used to abut against the prism to fix the prism.

10. A prism optical path measurement method according to claim 6, characterized in that: The base is provided with one or more reticles.

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