Test device

Abstract

This application discloses a testing device, belonging to the field of vehicle technology. The testing device includes a support assembly and a light-transmitting element. The support assembly is used to support a head-up display (HUD) to be tested. The support assembly has a first marked position and a second marked position. The light-transmitting element is connected to the support assembly, and the HUD to be tested is located between the support assembly and the light-transmitting element. Sunlight passing through the light-transmitting element illuminates the first marked position, and the shadow formed falls on the second marked position. The line connecting the first and second marked positions is parallel to the principal optical axis in the imaging optical path of the HUD to be tested. Using the technical solution provided in this application, the accuracy of sunlight backflow test results can be improved.

Description

Technical Field

[0001] This application relates to the field of vehicle technology, and more specifically to a testing device. Background Technology

[0002] To ensure safer and more stable driving, an increasing number of vehicles are equipped with head-up displays (HUDs). HUDs can overlay various information, such as navigation, driving, and environmental information, within the driver's field of vision, preventing the driver from looking down at information and deviating from the road, thus avoiding dangerous driving consequences. In general, light rays parallel to the principal optical axis in natural light converge through a curved mirror within the HUD, forming a light spot that falls on the center of the image generation unit—a phenomenon known as sunlight backflow. The temperature of the image generation unit can rise rapidly due to the light spot, potentially even causing it to burn out. Therefore, sunlight backflow testing is necessary during the development phase of HUDs to better understand their performance and provide a better basis for designing heat dissipation structures. In actual driving, a condition may occur where the light spot consistently falls on the center of the image generation unit. Under this condition, the image generation unit heats up the fastest. Therefore, testing the performance of the image generation unit under this condition can efficiently assess the performance of the HUD.

[0003] In related technologies, during sunlight backflow tests, the position of the light spot formed after sunlight is focused by the curved mirror inside the head-up display often deviates from the center of the image generation unit, resulting in low accuracy of the test results. Summary of the Invention

[0004] In view of this, this application provides a testing device that can improve the accuracy of solar backflow test results.

[0005] On the one hand, embodiments of this application provide a testing device, which includes a support assembly and a light-transmitting element;

[0006] The bracket assembly is used to support the head-up display to be tested;

[0007] The support assembly has a first marking position and a second marking position;

[0008] The light-transmitting element is connected to the bracket assembly, and the head-up display under test is located between the bracket assembly and the light-transmitting element. The shadow formed after sunlight shines on the first marked position falls on the second marked position, and the line connecting the first marked position and the second marked position is parallel to the principal optical axis in the imaging optical path of the head-up display under test.

[0009] Optionally, the bracket assembly includes a base and a support assembly;

[0010] The head-up display to be tested is located on the base;

[0011] One side of the support component is connected to the base, and the other side of the support component extends away from the base. The support component is connected to the light-transmitting element.

[0012] Optionally, the support assembly includes a support plate, a first support column, and a second support column;

[0013] One end of the support plate is connected to the base, and the other end of the support plate extends away from the base. The surface of the support plate facing the head-up display to be tested is provided with a first slot.

[0014] The first support column and the second support column are arranged opposite to each other. The first support column and the second support column are respectively connected to the base. The surface of the first support column facing the head-up display to be tested is provided with a second slot, and the surface of the second support column facing the head-up display to be tested is provided with a third slot.

[0015] The light-transmitting element includes a first side, a second side, and a third side connected in sequence. The first side and the third side are arranged opposite to each other. The second side is inserted into the first slot. The first side and the third side are respectively inserted into the second slot and the third slot.

[0016] Optionally, the first support column is provided with the first marked position, and the base is provided with the second marked position.

[0017] Optionally, the first support column is provided with a protrusion, and the apex of the protrusion forms the first marking position.

[0018] Optionally, the surface of the first support column facing the head-up display under test is provided with a through groove, the through groove extending in a direction perpendicular to the first support column;

[0019] The top point of any slot away from the support plate in the through slot is the first marked position, and the base is provided with a second marked position corresponding to the first marked position.

[0020] Optionally, a groove is formed at the second marking position.

[0021] Optionally, the orthographic projection of the groove onto the plane of the base is a circle, and the diameter of the circle is not less than 2 mm and not more than 6 mm.

[0022] Optionally, the first support column is provided with two first marking positions, and the base is provided with two second marking positions, with the first marking positions and the second marking positions corresponding one-to-one.

[0023] Optionally, the testing device further includes a carrier and a rotating shaft, with both ends of the rotating shaft connected to the carrier and the support assembly, respectively, and the support assembly being rotatable relative to the carrier around the rotating shaft.

[0024] The testing apparatus provided in this application includes a support assembly and a light-transmitting element. The support assembly supports the head-up display (HUD) under test and has a first marking position and a second marking position. The light-transmitting element is connected to the support assembly, and the HUD under test is located between the support assembly and the light-transmitting element, allowing sunlight to pass through the support assembly and enter the HUD under test to simulate the process of sunlight flowing back into the display. The shadow formed by the sunlight passing through the light-transmitting element and hitting the first marking position falls on the second marking position. The line connecting the first and second marking positions is parallel to the principal optical axis in the imaging optical path of the HUD under test. Since this ray of light propagating along the principal optical axis generally originates from the center of the image generation unit of the HUD and falls on the windshield, and the line connecting the first and second marking positions is parallel to the principal optical axis in the imaging optical path of the HUD under test, according to the principle of optical path reversibility, if the shadow of the first marking position falls on the second marking position, it can be ensured that the light spot formed by the sunlight after being converged by the curved mirror of the HUD under test falls on the center of the image display. In other words, the position of the support assembly can be adjusted at any time by observing whether the shadow of the first marked position falls into the second marked position, so as to more accurately simulate the sunlight backflow scenario corresponding to the head-up display under test when the temperature rises the fastest, and ensure that the light spot can always be located in the center of the image generation unit, thereby improving the accuracy of the sunlight backflow test results. Attached Figure Description

[0025] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0026] Figure 1 This is a schematic diagram of the structure of a testing device provided in an embodiment of this application;

[0027] Figure 2 This is an exploded view of a testing device provided in an embodiment of this application;

[0028] Figure 3 This is an exploded view of a testing device provided in an embodiment of this application;

[0029] Figure 4 This is a partial structural schematic diagram of a testing device provided in an embodiment of this application;

[0030] Figure 5 This is a partial structural schematic diagram of another testing device provided in an embodiment of this application;

[0031] Figure 6 This is an exploded view of a portion of the structure of a testing device provided in an embodiment of this application.

[0032] Figure label:

[0033] 100. Bracket assembly; 110. Base; 120. Support assembly; 130. Mounting base; 111. Bottom wall; 112. First mounting part; 114. Connecting plate; 115. U-shaped groove; 121. Support plate; 122. First support column; 123. Second support column; 124. First slot; 125. Second slot; 126. Protrusion; 127. Through groove; 128. Top point of the groove; 129. Third slot; 131. First side wall; 132. Second side wall;

[0034] 200, Light-transmitting component; 210, First side; 220, Second side; 230, Third side;

[0035] 300. Head-up display to be tested;

[0036] 400, First marker position;

[0037] 500, Second mark position; 510, Groove;

[0038] 600. Load-bearing components;

[0039] 700, Shaft;

[0040] 800, First Bolt;

[0041] 1000, Rotating mechanism; 1010, Lead screw; 1020, Guide block;

[0042] 1100, Adjusting column;

[0043] 1200, Level;

[0044] 1300. Image acquisition equipment.

[0045] The accompanying drawings have illustrated specific embodiments of this application, which will be described in more detail below. These drawings and descriptions are not intended to limit the scope of the concept in any way, but rather to illustrate the concept of this application to those skilled in the art through reference to specific embodiments. Detailed Implementation

[0046] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0047] Unless otherwise defined, all technical terms used in the embodiments of this application have the same meaning as commonly understood by those skilled in the art.

[0048] To make the technical solutions and advantages of this application clearer, the embodiments of this application will be described in further detail below with reference to the accompanying drawings.

[0049] like Figure 1 As shown in the accompanying drawings, this application provides a testing device, which includes a support assembly 100 and a light-transmitting element 200. The support assembly 100 is used to support the head-up display 300 to be tested. The support assembly 100 has a first marking position 400 and a second marking position 500. It should be noted that when using the testing device provided in this application embodiment for testing, the head-up display 300 to be tested is in a working state, and the testing device needs to be placed in a sunny and unobstructed area to ensure that sunlight can enter the head-up display 300 to be tested. The light-transmitting element 200 shown in the accompanying drawings is only a part of the light-transmitting element 200, and the size of the light-transmitting element 200 can be adjusted according to needs. The image source of the head-up display 300 to be tested is magnified and projected and displayed on the light-transmitting element 200, so that the image changes can be observed through the light-transmitting element 200, thereby understanding the performance changes of the head-up display 300 to be tested.

[0050] The light-transmitting element 200 is connected to the support assembly 100. The head-up display 300 under test is located between the support assembly 100 and the light-transmitting element 200, so that sunlight can pass through the support assembly 100 and enter the head-up display 300 under test to simulate the process of sunlight backflow. The shadow formed after sunlight shines on the first marked position 400 falls on the second marked position 500. The line connecting the first marked position 400 and the second marked position 500 is parallel to the principal optical axis in the imaging optical path of the head-up display 300 under test. It should be noted that when the head-up display 300 under test is in operation, the light ray propagating along the principal optical axis generally originates from the center of the image generation unit of the head-up display and falls on the windshield of the vehicle. The line connecting the first mark position 400 and the second mark position is parallel to the principal optical axis in the imaging optical path of the head-up display 300 under test. Therefore, according to the principle of optical path reversibility, if the shadow of the first mark position 400 falls on the second mark position 500, it ensures that the light spot formed by the sunlight converged by the curved mirror of the head-up display 300 under test falls on the center of the image display. Sunlight can shine on the first mark position 400 through the light-transmitting element 200, or it can directly shine on the first mark position 400 without passing through the light-transmitting element 200. It should be noted that the principal optical axis is the propagation path formed by the central light ray in all optical paths capable of imaging on the windshield. In other words, testers can adjust the position of the support assembly 100 at any time by observing whether the shadow of the first mark position 400 falls on the second mark position 500, so that the shadow of the first mark position 400 always falls on the second mark position 500. This allows for a more accurate simulation of the sunlight backflow scenario corresponding to the head-up display 300 under test when the temperature rises the fastest, ensuring that the light spot is always located in the center of the image generation unit, thus improving the accuracy and efficiency of the sunlight backflow test results.

[0051] It should be noted that the testing device generally needs to be modeled before fabrication. In this embodiment, the first marker position 400 and the second marker position 500 are predetermined during the modeling process. The determination process is as follows: first, a model corresponding to the testing device with the head-up display 300 to be tested installed is established; the known main optical axis of the head-up display 300 to be tested is obtained; and the main optical axis is aligned until it intersects with the support assembly 100 at two points. Finally, when manufacturing the physical test device based on the model, the two intersection points determined in the model can be directly used as the corresponding first marker position 400 and second marker position 500 on the physical device.

[0052] The following is in conjunction with the appendix Figures 1 to 6 The details and functions of the testing apparatus provided in the embodiments of this application will be described in more specific and detailed manner.

[0053] Combination Figure 2 and Figure 3As shown, in some embodiments, the bracket assembly 100 includes a base 110 and a support assembly 120. The head-up display 300 under test is located on the base 110. It should be noted that the head-up display 300 under test can be mounted on the base 110 by snapping it into the mounting holes on the base 110, by fixing it to the base 110 with bolts or other fasteners, by adhesive, or by snapping it onto the base 110, as long as the head-up display 300 under test can be fixed to the base 110.

[0054] One side of the support assembly 120 is connected to the base 110, and the other side of the support assembly 120 extends away from the base 110. The support assembly 120 is connected to the light-transmitting element 200. This allows the light-transmitting element 200 to be stably connected to the base 110.

[0055] like Figure 2 As shown, in some embodiments, the support assembly 120 includes a support plate 121, a first support column 122, and a second support column 123. One end of the support plate 121 is connected to the base 110, and the other end of the support plate 121 extends away from the base 110. A first slot 124 is provided on the surface of the support plate 121 facing the head-up display 300 to be tested.

[0056] The first support column 122 and the second support column 123 are arranged opposite to each other. The first support column 122 and the second support column 123 are respectively connected to the base 110. The surface of the first support column 122 facing the head-up display 300 under test is provided with a second slot 125, and the surface of the second support column 123 facing the head-up display 300 under test is provided with a third slot 129.

[0057] The light-transmitting element 200 includes a first side 210, a second side 220, and a third side 230 connected in sequence. The first side 210 and the third side 230 are arranged opposite to each other. The second side 220 is inserted into a first slot 124, and the first side 210 and the third side 230 are inserted into a second slot 125 and a third slot 129, respectively. This allows the light-transmitting element 200 to be stably connected to the support assembly 120.

[0058] Combination Figure 2As shown, in some embodiments, the height between the second slot 125 and the base 110 is equal to the height between the third slot 129 and the base 110. The height between the first slot 124 and the base 110 is lower than the height between the second slot 125 and the base 110. With this configuration, when each side of the light-transmitting element 200 is inserted into its corresponding slot, the light-transmitting element 200 can be tilted, thus more realistically simulating the scene of sunlight passing through a vehicle's windshield in a real-world scenario. In some embodiments, the material and tilt angle of the light-transmitting element 200 are the same as those of the target vehicle's windshield. This more realistically simulates the scene of sunlight backflow, improving the accuracy of the test results.

[0059] Combination Figure 1 and Figure 2 As shown, in some embodiments, a first mark position 400 is provided on the first support column 122, and a second mark position 500 is provided on the base 110. This makes it easier for testers to observe the propagation of light illuminating the first mark position 400.

[0060] In some embodiments, the first support column 122 is provided with two first marking positions 400, and the base 110 is provided with two second marking positions 500, with the first marking positions 400 and the second marking positions 500 corresponding one-to-one. With this configuration, the adjustment of the support assembly 100 will only stop when the two first marking positions 400 fall on their corresponding second marking positions 500, so that the head-up display 300 under test is maintained at its current angle. This allows for more accurate adjustment of the angle of the head-up display 300 under test, thereby improving the accuracy of the test results.

[0061] like Figure 4 As shown, in some embodiments, the first support column 122 is provided with a protrusion 126, and the vertex of the protrusion 126 forms a first mark position 400. It should be noted that, according to the principle of light and shadow formation, by setting the protrusion 126, when sunlight shines on the vertex of the protrusion 126, the shadow of the vertex can fall more clearly on the base 110, making it easier for testers to distinguish and judge the position of the shadow of the vertex, the first support column 122, and the shadow position of any point on the protrusion 126, thereby improving the efficiency and accuracy of observing the shadow position of the first mark position 400, ensuring that the light spot can always be located in the center of the image generation unit, and thus improving the accuracy of the test results.

[0062] like Figure 5As shown, in some embodiments, the surface of the first support column 122 facing the head-up display 300 under test is provided with a through groove 127, which extends in a direction perpendicular to the first support column 122. Any top point 128 of the through groove 127 away from the support plate 121 is designated as a first marker position 400, and a second marker position 500 corresponding to the first marker position 400 is provided on the base 110. It should be noted that, based on the principle of light and shadow formation, by using any top point 128 of the through groove 127 away from the support plate 121 as the first marker position 400, when sunlight shines on this top point 128, the shadow of the top point 128 can fall more clearly on the base 110. This makes it easier for testers to distinguish and judge the position of the shadow of the top point 128, the first support column 122, and the shadow positions of other points on the through groove 127, thereby improving the efficiency and accuracy of observing the shadow position of the first marker position 400, ensuring that the light spot is always located in the center of the image generation unit, and thus improving the accuracy of the test results.

[0063] like Figure 5 As shown, in some embodiments, the second marker position 500 is formed with a groove 510. It can be understood that when the shadow of the first marker position 400 falls into the groove 510, it is considered that the light spot falls on the center of the image generation unit. The setting of the groove 510 makes it easier for the tester to observe the position of the shadow of the first marker position 400.

[0064] like Figure 5 As shown, in some embodiments, the orthographic projection of the groove 510 onto the plane of the base 110 is a circle, with a diameter of not less than 2 mm and not more than 6 mm. This setting ensures that the shadow of the first mark position 400 can accurately fall on the second mark position 500, and also reduces the observation error caused by an excessively large diameter of the groove 510. This allows the tester to more accurately adjust the support assembly 100, that is, adjust the position and angle of the head-up display 300 under test.

[0065] like Figure 6As shown, in some embodiments, the bracket assembly 100 further includes a mounting base 130. The mounting base 130 includes opposing first sidewalls 131 and second sidewalls 132. The base 110 includes a bottom wall 111, a first mounting portion 112, and a second mounting portion (not shown). One end of the first mounting portion 112 and one end of the second mounting portion are respectively connected to the bottom wall 111 and extend in a direction away from the bottom wall 111. The first mounting portion 112 is connected to a portion of a first bolt 800, and the other portion of the first bolt 800 is rotatably connected to the first sidewall 131, for example, the other portion of the first bolt 800 is rotatably engaged in a groove formed in the first sidewall 131. The second mounting portion is connected to a portion of a second bolt (not shown), and the other portion of the second bolt is rotatably connected to the first sidewall 131. The first bolt 800 and the second bolt are coaxial. Thus, the base 110 can rotate relative to the mounting base 130 about the axial direction of the first bolt 800. It should be noted that the connection method between the second mounting part, the second bolt, and the second sidewall is the same as the connection method between the first mounting part 112, the first bolt 800, and the first sidewall 132.

[0066] like Figure 3 As shown, in some embodiments, the mounting base 130 is provided with a rotating mechanism 1000, which is rotatably connected to the base 110. When the rotating mechanism 1000 rotates, it drives the base 110 to rotate around the axial direction of the first bolt 800. It is understood that when the base 110 rotates relative to the mounting base 130, the head-up display 300 mounted on the base 110 also rotates synchronously with the base 110, thereby allowing for more flexible adjustment of the angle of the head-up display 300. It should be noted that the rotating mechanism 1000 can be a lead screw mechanism, which generally includes a lead screw 1010 and a guide block 1020. The guide block 1020 can be rotatably connected to the base 110. For example, the guide block 1020 can be movably engaged into the U-shaped groove 115 of the connecting plate 114 connected to the bottom of the base 110 via bolts. Understandably, when the lead screw 1010 rotates to drive the guide block 1020 to move along the axial direction of the lead screw 1010, the guide block 1020 can drive the connecting plate 114 to rotate, which in turn drives the base 110 to rotate around the axial direction of the first bolt 800, thereby enabling flexible adjustment of the angle of the head-up display 300 to be tested, thus improving testing efficiency.

[0067] like Figure 3As shown, in some embodiments, the testing device further includes a support member 600 and a rotating shaft 700. The two ends of the rotating shaft 700 are connected to the support member 600 and the support assembly 100, respectively. The support assembly 100 can rotate relative to the support member 600 around the rotating shaft 700. It is understood that by rotating the support assembly 100 around the rotating shaft 700, the head-up display 300 connected to the support assembly 100 can be driven to rotate synchronously, thereby allowing for more flexible adjustment of the angle of the head-up display 300 and improving the testing efficiency of the solar backflow test.

[0068] like Figure 3 As shown, in some embodiments, the testing device further includes at least two adjusting columns 1100. The adjusting columns 1100 are telescopic, with one end connected to the side of the support member 600 opposite to the base 110, and the other end adapted to be placed on the ground or on other platforms of the testing device. It should be noted that by adjusting the height of the end of each adjusting column 1100 near the base 110 relative to the ground or the platforms used to prevent tilting, the support member 600 can be adjusted to a horizontal state, thereby ensuring that the mounting base 130 is horizontal, preventing tilting, and improving the stability of the testing device during testing.

[0069] like Figure 3 As shown, in some embodiments, a level 1200 is mounted on the mounting base 130. It is understood that when adjusting the adjusting column 1100, the state of the level 1200 can be observed to determine whether the mounting base 130 is currently in a horizontal state, thereby making it easier to adjust the horizontal height of the mounting base 130.

[0070] like Figure 3 As shown, in some embodiments, there are two head-up displays 300 to be tested, which are mounted side-by-side on the base 110. The two head-up displays 300 rotate synchronously with the base 110, and their placement angles are the same, thus meeting the testing requirements of a control test and enabling the testing device to meet different testing needs, thereby improving its practicality. Generally, the internal heat dissipation components or optical elements of the two head-up displays 300 are slightly different. It should be noted that when using the testing device provided in this application embodiment, sunlight is focused by the curved mirrors of the head-up displays 300 to form light spots, which then fall at the center of the image generation unit of the corresponding head-up display. It is understood that by comparing the test results of the two head-up displays 300, the structure of the head-up displays 300 can be further improved to enhance their performance.

[0071] like Figure 3 As shown, in some embodiments, the testing apparatus further includes an image acquisition device 1300, which corresponds one-to-one with the head-up display 300 under test. The image acquisition device 1300 is mounted on the base 110. The image acquisition device 1300 is used to project the image of the head-up display 300 under test onto the light-transmitting element 200. Generally, the image acquisition device 1300 is connected to a computing device, allowing the tester to observe the image changes of the head-up display under test throughout the testing process on the computing device. This provides a more accurate understanding of the impact of sunlight backflow on the head-up display 300 under test and enables more precise improvements.

[0072] Other embodiments of this application will readily occur to those skilled in the art upon consideration of the specification and practice of the application disclosed herein. This application is intended to cover any variations, uses, or adaptations of this application that follow the general principles of this application and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only.

[0073] It should be understood that this application is not limited to the precise structure described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this application is limited only by the appended claims.

Claims

1. A testing device, characterized in that, The testing device includes a support assembly (100) and a light-transmitting element (200). The bracket assembly (100) is used to support the head-up display (300) under test; the bracket assembly (100) includes a base (110) and a support assembly (120); the head-up display (300) under test is located on the base (110); one side of the support assembly (120) is connected to the base (110), and the other side of the support assembly (120) extends away from the base (110); the support assembly (120) is connected to the light-transmitting element (200); the support assembly (120) includes a support plate (121), a first support column (122), and a second support column (123); one end of the support plate (121) is connected to the base (110), and the other end of the support plate (121) extends away from the base (110); the surface of the support plate (121) facing the head-up display (300) under test is provided with a first slot (12). 4); The first support column (122) and the second support column (123) are arranged opposite to each other. The first support column (122) and the second support column (123) are respectively connected to the base (110). The surface of the first support column (122) facing the head-up display (300) to be tested is provided with a second slot (125), and the surface of the second support column (123) facing the head-up display (300) to be tested is provided with a third slot (129); The light-transmitting element (200) includes a first side (210), a second side (220) and a third side (230) connected in sequence. The first side (210) and the third side (230) are arranged opposite to each other. The second side (220) is inserted into the first slot (124), and the first side (210) and the third side (230) are inserted into the second slot (125) and the third slot (129) respectively; The support assembly (100) has a first marking position (400) and a second marking position (500); The light-transmitting element (200) is connected to the bracket assembly (100), and the head-up display (300) under test is located between the bracket assembly (100) and the light-transmitting element (200). The shadow formed after sunlight shines on the first marked position (400) falls on the second marked position (500). The line connecting the first marked position (400) and the second marked position (500) is parallel to the principal optical axis in the imaging optical path of the head-up display (300) under test.

2. The testing apparatus according to claim 1, characterized in that, The first support column (122) is provided with the first mark position (400), and the base (110) is provided with the second mark position (500).

3. The testing apparatus according to claim 2, characterized in that, The first support column (122) is provided with a protrusion (126), the apex of which forms the first marking position (400).

4. The testing apparatus according to claim 2, characterized in that, The surface of the first support column (122) facing the head-up display (300) under test is provided with a through groove (127), which extends in a direction perpendicular to the first support column (122); The top point (128) of any slot of the through slot (127) away from the support plate (121) is the first marking position (400), and the base (110) is provided with a second marking position (500) corresponding to the first marking position (400).

5. The testing apparatus according to claim 1, characterized in that, The second marking position (500) has a groove (510).

6. The testing apparatus according to claim 5, characterized in that, The orthographic projection of the groove (510) onto the plane of the base (110) is a circle, and the diameter of the circle is not less than 2 mm and not more than 6 mm.

7. The testing apparatus according to claim 1, characterized in that, The first support column (122) is provided with two first marking positions (400), and the base (110) is provided with two second marking positions (500). The first marking positions (400) and the second marking positions (500) correspond one-to-one.

8. The testing apparatus according to claim 1, characterized in that, The testing device further includes a support member (600) and a rotating shaft (700). The two ends of the rotating shaft (700) are connected to the support member (600) and the support assembly (100) respectively. The support assembly (100) can rotate relative to the support member (600) around the rotating shaft (700).

Images