A stress detection device for the detection end based on an infrared sensor

Abstract

This invention discloses a detection end stress detection device based on an infrared sensor, belonging to the technical field of infrared stress detection devices. It includes a detection device body, a detector head fixedly connected to one side of the detection device body, and mounting plates symmetrically fixedly connected to the side of the detection device body near the detector head. A frame is fixedly connected between the mounting plates and the detection device body. An obstruction removal mechanism is provided on the frame, including a vertical plate fixedly connected to the upper surface of the upper mounting plate. This mechanism can blow away floating objects and impurities from the infrared illumination path and the surface of the object to be detected. This not only eliminates propagation obstacles of infrared radiation, ensuring that radiation can smoothly reach the detector end and avoiding problems such as signal strength weakening, signal distortion, and background interference, thereby improving measurement accuracy, but also reduces the influence of external factors on the measurement, keeping the illumination path clean and unobstructed, reducing error sources, and improving measurement stability.

Description

Technical Field

[0001] This invention relates to the field of infrared stress detection device technology, specifically to a stress detection device for the detection end based on an infrared sensor. Background Technology

[0002] An infrared sensor's detection end stress detection device is a device used to detect the stress or pressure on the surface of an object. Based on infrared sensing technology, it determines the magnitude of stress or pressure by measuring the difference in infrared radiation intensity on the surface of the object. It mainly uses an infrared emitter to emit infrared radiation, which shines on the surface of the object being measured. The stress or pressure on the surface of the object will change its optical properties, thereby affecting the intensity of the reflected infrared radiation. At this time, the infrared receiver receives the reflected infrared radiation and transmits the signal to the signal processing circuit. The signal processing circuit calculates the value of stress or pressure by comparing the received infrared signal with a reference value.

[0003] During the use of the stress detection device at the detection end, floating objects or other impurities may obstruct the infrared radiation path and the surface of the object to be tested. Dust on the radiation path is often unnoticed by workers, and it is not removed in time. This not only blocks the propagation of infrared light, weakening the intensity of the infrared radiation signal received by the detection end, leading to a decrease in detection sensitivity, resulting in incorrect measurement results or ineffective detection, but also changes the propagation path of infrared radiation or scatters radiation, causing distortion of the infrared signal. This results in the signal received by the detection end not conforming to the expected waveform characteristics, thus affecting the accuracy and reliability of the measurement.

[0004] Therefore, this invention proposes a stress detection device based on an infrared sensor at the detection end to solve the above problems. Summary of the Invention

[0005] (a) Technical problems to be solved

[0006] To address the shortcomings of existing technologies, this invention provides a stress detection device for the detection end based on an infrared sensor, which can effectively solve the problems of floating objects and impurities in the illumination path and on the surface of the object to be detected in existing technologies.

[0007] (II) Technical Solution

[0008] To achieve the above objectives, the present invention can be accomplished through the following technical solutions:

[0009] An infrared sensor-based probe end stress detection device includes a detection device body. A probe head is fixedly connected to one side of the detection device body. Mounting plates are symmetrically fixedly connected to the detection device body near the probe head. A frame is fixedly connected between the mounting plates and the detection device body. An obstruction removal mechanism is provided on the frame. The obstruction removal mechanism includes a vertical plate, which is fixedly connected to the upper surface of the upper mounting plate. A rotating shaft is rotatably connected through the vertical plate. The outer surface of the rotating shaft has a threaded groove. The obstruction removal mechanism is used to remove floating objects and impurities in the path of the probe head and on the surface of the object to be detected. A pre-processing mechanism is provided on the detection device body. The pre-processing mechanism is used to automatically drive the obstruction removal mechanism to work before the probe head is turned on.

[0010] As a further embodiment of the present invention: a fixed plate is fixedly connected to the side of the rotating shaft near the frame, a sliding column is fixedly connected to the end of the fixed plate away from the rotating shaft, a lifting plate is provided on the outer sleeve of the sliding column, a sliding groove is provided on the side of the lifting plate near the sliding column, the sliding column is slidably connected in the sliding groove, and a sliding plate is symmetrically fixedly connected to the lower end face of the lifting plate, and the sliding plates are all slidably connected to the frame.

[0011] As a further aspect of the present invention: the obstruction removal mechanism further includes fan blades symmetrically arranged on the side of the frame away from the probe head, each fan blade being fixedly connected to a connecting shaft on the side near the frame, and each connecting shaft having a connecting block symmetrically rotatably connected to its outer surface, and each connecting block being fixedly connected to the side wall of the frame.

[0012] As a further aspect of the present invention: each of the connecting shafts is fixedly connected to a linkage plate at its upper end, and each linkage plate has a groove on the side near the frame. Each of the grooves is slidably connected to a lever, and each lever is fixedly connected to a first connecting plate at its upper end. Each of the first connecting plates is fixedly connected to a movable plate at its lower end, and each movable plate is slidably connected to the upper surface of the upper connecting block.

[0013] As a further aspect of the present invention: each of the first connecting plates is fixedly connected to a movable column on the side near the slide plate, and each of the slide plates is provided with a corrugated groove, and the movable column is slidably connected within the corrugated groove.

[0014] As a further aspect of the present invention: each of the lower ends of the slide plate is fixedly connected to a lifting block, each of the lifting blocks is vertically slidably connected to the frame, and a flexible cleaning plate is fixedly connected between the lifting blocks, the flexible cleaning plate being in contact with the probe head.

[0015] As a further aspect of the present invention: the pretreatment mechanism includes a drive shaft, which is rotatably connected to the upper end face of the detection device body. A drive source is connected to the drive shaft. A second connecting plate is fixedly connected to the upper end of the drive shaft. A push plate is rotatably connected to the upper end of the second connecting plate away from the drive shaft. A linkage column is rotatably connected to the end of the push plate away from the second connecting plate. The upper end of the linkage column is slidably connected to a threaded groove. A movable frame is fixedly connected to the lower end of the linkage column. The movable frame is slidably connected to the detection device body.

[0016] As a further embodiment of the present invention: a pressing plate is fixedly connected to the center of the lower end face of the movable frame, and a switch is fixedly connected to the upper end face of the detection device body away from the movable frame. The switch and the pressing plate are on the same horizontal line, and the switch and the probe are electrically connected.

[0017] (III) Beneficial Effects

[0018] Compared with the prior art, the present invention provides a stress detection device for the detection end based on an infrared sensor, which has the following advantages:

[0019] 1. The obstruction removal mechanism can blow away floating objects and impurities on the infrared irradiation path and the surface of the object to be detected. This not only eliminates the propagation obstacles of infrared radiation, ensuring that the radiation can reach the detection end smoothly and avoiding problems such as signal strength weakening, signal distortion and background interference, thereby improving the accuracy of measurement, but also reduces the influence of external factors on the measurement. Keeping the irradiation path clean and unobstructed can reduce the sources of error and improve the stability of measurement.

[0020] 2. Through the set lifting block, during the process of blowing away floating objects and impurities on the infrared irradiation path and the surface of the object to be detected, the flexible cleaning plate can be driven to reciprocate to wipe the surface of the probe. The material of the flexible cleaning plate is usually relatively soft and does not easily cause scratches or damage to the surface of the probe. The reciprocating wiping can not only gently remove the impurities adhering to the surface of the probe and prevent these impurities from hindering the propagation of infrared radiation, thereby further improving the accuracy and stability of the measurement, but also reduce the need for manual intervention and operation, improve work efficiency and reduce the risk of operational errors, and protect the surface quality and integrity of the probe to the greatest extent.

[0021] 3. The pre-processing mechanism can automatically pre-process floating objects and impurities on the irradiation path and the surface of the object to be detected before the probe is used. The automatic pre-processing can not only quickly and efficiently remove floating objects and impurities before the infrared probe is used, thus saving time and labor costs, but also ensure that the infrared radiation can reach the probe smoothly and avoid problems such as signal strength weakening, signal distortion and background interference. Attached Figure Description

[0022] To facilitate understanding by those skilled in the art, the present invention will be further described below with reference to the accompanying drawings.

[0023] Figure 1 This is a schematic diagram of the overall structure of the present invention;

[0024] Figure 2 For the present invention Figure 1 Enlarged structural diagram of region A in the middle;

[0025] Figure 3 For the present invention Figure 1 Another perspective structural diagram;

[0026] Figure 4 For the present invention Figure 3 Enlarged structural diagram of region B in the middle;

[0027] Figure 5 This is a schematic diagram of the connection structure between the lifting plate and the frame of the present invention;

[0028] Figure 6 This is a schematic diagram of the connection structure of the pretreatment mechanism of the present invention;

[0029] Figure 7 For the present invention Figure 6 A magnified structural diagram of region C in the middle.

[0030] In the diagram: 1. Detection device body; 2. Probe head; 3. Mounting plate; 4. Frame;

[0031] 5. Obstruction Removal Mechanism; 501. Vertical Plate; 502. Rotating Shaft; 503. Threaded Groove; 504. Lifting Plate; 505. Fan Blade; 506. Connecting Block; 507. Connecting Shaft; 508. Linkage Plate; 509. Groove; 510. Lever; 511. First Connecting Plate; 512. Slide Plate; 513. Corrugated Groove; 514. Moving Column; 515. Fixed Plate; 516. Sliding Column; 517. Sliding Channel; 518. Lifting Block; 519. Flexible Cleaning Plate; 520. Moving Plate;

[0032] 6. Pre-processing mechanism; 601. Second connecting plate; 602. Push plate; 603. Moving frame; 604. Drive shaft; 605. Pressing plate; 606. Linkage column; 7. Switch. Detailed Implementation

[0033] The technical solution of the present invention will be clearly and completely described below with reference to the embodiments. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0034] This embodiment provides a stress detection device for the detection end based on an infrared sensor, such as... Figure 1 - Figure 7 As shown, the device includes a detection device body 1, a probe 2 fixedly connected to one side of the detection device body 1, and mounting plates 3 symmetrically fixedly connected to the side of the detection device body 1 near the probe 2. A frame 4 is fixedly connected between the mounting plates 3 and the detection device body 1. An obstruction removal mechanism 5 is provided on the frame 4. The obstruction removal mechanism 5 includes a vertical plate 501, which is fixedly connected to the upper end face of the upper mounting plate 3. A rotating shaft 502 is rotatably connected through the vertical plate 501. A threaded groove 503 is opened on the outer surface of the rotating shaft 502. The obstruction removal mechanism 5 is used to remove floating objects and impurities from the irradiation path of the probe 2 and the surface of the object to be detected.

[0035] In this embodiment, as Figure 3 and Figure 4 As shown, a fixed plate 515 is fixedly connected to the side of the rotating shaft 502 near the frame 4. A sliding column 516 is fixedly connected to the end of the fixed plate 515 away from the rotating shaft 502. A lifting plate 504 is fitted over the sliding column 516. A sliding groove 517 is opened on the side of the lifting plate 504 near the sliding column 516. The sliding column 516 is slidably connected in the sliding groove 517. A sliding plate 512 is symmetrically fixedly connected to the lower end of the lifting plate 504. The sliding plates 512 are slidably connected to the frame 4. When the rotating shaft 502 rotates, the fixed plate 515 can drive the sliding column 516 to slide back and forth in the sliding groove 517 opened on the lifting plate 504, thereby causing the sliding plates 512 symmetrically connected to the lower end of the lifting plate 504 to move up and down on the frame 4.

[0036] In this embodiment, as Figure 1 and Figure 2 As shown, the obstruction removal mechanism 5 also includes fan blades 505 symmetrically arranged on the side of the frame 4 away from the probe head 2. Each fan blade 505 is fixedly connected to a connecting shaft 507 on the side near the frame 4. Each connecting shaft 507 is symmetrically rotatably connected to a connecting block 506 on its outer surface. Each connecting block 506 is fixedly connected to the side wall of the frame 4. When the connecting shaft 507 reciprocates between the connecting blocks 506, it can drive the fan blades 505 to reciprocate synchronously, thereby forming an airflow to blow away floating objects and impurities on the irradiation path and the surface of the object to be detected.

[0037] In this embodiment, as Figure 2As shown, a linkage plate 508 is fixedly connected to the upper end of the connecting shaft 507. A groove 509 is opened on the side of the linkage plate 508 near the frame 4. A lever 510 is slidably connected in the groove 509. A first connecting plate 511 is fixedly connected to the upper end of the lever 510. A moving plate 520 is fixedly connected to the lower end of the first connecting plate 511. The moving plate 520 is slidably connected to the upper end face of the upper connecting block 506. When the first connecting plate 511 moves back and forth through the sliding connection between the moving plate 520 and the connecting block 506, it can drive the lever 510 to move back and forth in the groove 509 opened on the linkage plate 508, thereby causing the connecting shaft 507 connected to the lower end of the lever 510 to rotate back and forth synchronously.

[0038] In this embodiment, as Figure 2 As shown, each of the first connecting plates 511 is fixedly connected to a movable column 514 on the side near the slide plate 512. Each slide plate 512 is provided with a corrugated groove 513. The movable column 514 is slidably connected in the corrugated groove 513. During the up-and-down movement of the lifting plate 504, the movable column 514 can slide along the path of the corrugated groove 513, thereby driving the first connecting plate 511 to move back and forth horizontally in a small amplitude.

[0039] In this embodiment, as Figure 5 As shown, each of the slide plates 512 has a lifting block 518 fixedly connected to its lower end. The lifting blocks 518 are vertically slidably connected to the frame 4. A flexible cleaning plate 519 is fixedly connected between the lifting blocks 518. The flexible cleaning plate 519 is in contact with the probe head 2. When the slide plate 512 slides up and down on the frame 4, the lifting blocks 518 can drive the flexible cleaning plate to synchronously and repeatedly rub the surface of the probe head 2.

[0040] In existing technologies, floating objects or other impurities obstruct the infrared radiation path and the surface of the object to be detected. This not only blocks the propagation of infrared light, weakening the intensity of the infrared radiation signal received by the detector and reducing detection sensitivity, leading to erroneous measurement results or ineffective detection, but also alters the propagation path of infrared radiation or scatters radiation, causing distortion of the infrared signal. This results in the signal received by the detector not conforming to the expected waveform characteristics, thus affecting the accuracy and reliability of the measurement. Compared with existing technologies, this method can remove floating objects and impurities from the infrared radiation path and the surface of the object to be detected. This not only eliminates propagation obstacles to infrared radiation, ensuring that the radiation can reach the detector smoothly and avoiding problems such as signal weakening, signal distortion, and background interference, thereby improving measurement accuracy, but also reduces the influence of external factors on the measurement. Keeping the illumination path clean and unobstructed reduces sources of error and improves measurement stability.

[0041] Secondly, through the lifting block 518, during the process of blowing away floating objects and impurities on the infrared irradiation path and the surface of the object to be detected, the flexible cleaning plate 519 can be driven to reciprocate and wipe the surface of the probe head 2. The material of the flexible cleaning plate 519 is usually relatively soft and does not easily cause scratches or damage to the surface of the probe head 2. The reciprocating wiping can not only gently remove the impurities adhering to the surface of the probe head 2 and prevent these impurities from hindering the propagation of infrared radiation, thereby further improving the accuracy and stability of the measurement, but also reduce the need for manual intervention and operation, improve work efficiency and reduce the risk of operational errors, and protect the surface quality and integrity of the probe head 2 to the greatest extent.

[0042] At other levels, this embodiment also provides a pre-processing mechanism 6 for automatically driving the obstruction removal mechanism 5 to operate before the probe head 2 is opened, such as... Figure 1 , Figure 5 - Figure 7 As shown, the pretreatment mechanism 6 includes a drive shaft 604, which is rotatably connected to the upper end face of the detection device body 1. A drive source is connected to the drive shaft 604. A second connecting plate 601 is fixedly connected to the upper end of the drive shaft 604. A push plate 602 is rotatably connected to the upper end of the second connecting plate 601 away from the drive shaft 604. A linkage column 606 is rotatably connected to the push plate 602 away from the second connecting plate 601. The upper end of the linkage column 606 is slidably connected to the threaded groove 503. A movable frame 603 is fixedly connected to the lower end of the linkage column 606. The movable frame 603 is slidably connected to the detection device body 1.

[0043] In this embodiment, as Figure 5 - Figure 7 As shown, a pressing plate 605 is fixedly connected to the center of the lower end face of the movable frame 603. A switch 7 is fixedly connected to the upper end face of the detection device body 1 on the side away from the movable frame 603. The switch 7 and the pressing plate 605 are on the same horizontal line. The switch 7 and the probe head 2 are electrically connected. When the movable frame 603 slides on the upper end face of the detection device body 1 to directly above the switch 7, the pressing plate 605 connected to the lower end of the movable frame 603 will press the switch 7, thereby automatically opening the probe head 2 to work and emitting infrared rays. When the movable frame 603 and the switch 7 are separated, the switch 7 will automatically rebound and close the probe head 2.

[0044] Compared with existing technologies, this technology can automatically pre-process floating objects and impurities on the illumination path and the surface of the object to be detected before using the detector head 2. Automatic pre-processing can not only quickly and efficiently remove floating objects and impurities before using the infrared detector head 2, thus saving time and labor costs, but also ensure that infrared radiation can reach the detector head 2 smoothly and avoid problems such as signal strength weakening, signal distortion and background interference.

[0045] The overall working process and principles involved in the above embodiments are as follows:

[0046] When the staff uses the detection device body 1 to detect the surface stress of an object, by turning on the drive source, the drive shaft 604 is driven to rotate. During the rotation of the drive shaft 604, the second connecting plate 601 can be driven to move synchronously around the drive shaft 604, pushing the push plate 602 from one side of the drive shaft 604 to the other side. Through the linkage column 606 that is rotatably connected through the push plate 602, the moving frame 603 is driven to slide in the direction of the switch 7 on the upper end of the detection device body 1. When the moving frame 603 moves, it can drive the linkage column 606 to move horizontally synchronously, so that the upper end of the linkage column 606 slides in the threaded groove 503 opened on the outer surface of the rotating shaft 502, applying moving pressure to the threaded groove 503, changing the state of the threaded groove 503, thereby driving the rotating shaft 502 to rotate synchronously on the vertical plate 501.

[0047] During the rotation of the rotating shaft 502, the fixed plate 515 can move synchronously around the rotating shaft 502, and the sliding column 516 connected to the fixed plate 515 can be driven to slide back and forth in the groove 517 opened on the lifting plate 504. This drives the sliding plate 512 connected to the lower end of the lifting plate 504 to move up and down on the frame 4. As the sliding plate 512 moves up and down, the moving column 514 can be driven to move along the path of the corrugated groove 513 opened on the sliding plate 512. Through the sliding connection between the moving plate 520 and the connecting block 506 connected to the lower end face of the first connecting plate 511, the first connecting plate 511 can be driven to move back and forth horizontally in a small amplitude. After the first connecting plate 511 moves horizontally in a small amplitude, it can... The lever 510 connected to the lower end of the linkage plate 508 slides back and forth in the groove 509 on the linkage plate 508, causing the connecting shaft 507 connected to the lower end of the linkage plate 508 to rotate back and forth on the connecting block 506. This causes the fan blade 505 connected to the outer surface of the connecting shaft 507 to swing back and forth, forming an airflow that blows away floating objects and impurities from the illumination path of the detector head 2 and the surface of the object to be detected. This not only eliminates the propagation obstacles of infrared radiation and ensures that the radiation can reach the detection end smoothly, avoiding problems such as signal strength weakening, signal distortion and background interference, thereby improving the accuracy of measurement, but also reduces the influence of external factors on the measurement, keeps the illumination path clean and unobstructed, reduces the sources of error, and improves the stability of measurement.

[0048] As the slide plate 512 moves up and down reciprocally within the frame 4, it drives the lifting block 518 connected to the lower end of the slide plate 512 to move back and forth synchronously within the frame 4. This drives the flexible cleaning plate 519 connected between the lifting blocks 518 to repeatedly wipe the outer surface of the probe head 2. The flexible cleaning plate 519 is usually made of a soft material that is not easy to scratch or damage the surface of the probe head 2. The repeated wiping can not only gently remove the impurities adhering to the surface of the probe head 2 and prevent these impurities from hindering the propagation of infrared radiation, thereby further improving the accuracy and stability of the measurement, but also reduce the need for manual intervention and operation, improve work efficiency and reduce the risk of operational errors, and protect the surface quality and integrity of the probe head 2 to the greatest extent.

[0049] As the moving frame 603 moves along the surface of the detection device body 1 toward the switch 7, the rotating shaft 502 is rotated via the sliding connection of the linkage column 606 and the threaded groove 503, thereby driving the fan blade 505 and the flexible cleaning plate 519 to work. During this process, the distance between the moving frame 603 and the switch 7 gradually shortens. When the moving frame 603 moves directly above the switch 7, the rotating shaft 502 can no longer rotate. At this time, the pressing plate 605 connected to the lower end of the moving frame 603 will press the switch 7, opening the detector head 2 to work and emitting infrared rays. This allows for automatic pre-processing of floating objects and impurities on the irradiation path and the surface of the object to be detected before the detector head 2 is used. Automatic pre-processing not only quickly and efficiently removes floating objects and impurities before using the infrared detector head 2, saving time and labor costs, but also ensures that the infrared radiation can reach the detector head 2 smoothly and avoids problems such as signal strength weakening, signal distortion, and background interference.

[0050] The preferred embodiments of the present invention disclosed above are merely illustrative of the invention. These preferred embodiments do not exhaustively describe all details, nor do they limit the invention to the specific implementations described. Clearly, many modifications and variations can be made based on the content of this specification. This specification selects and specifically describes these embodiments to better explain the principles and practical applications of the invention, thereby enabling those skilled in the art to better understand and utilize the invention. The invention is limited only by the claims and their full scope and equivalents.

Claims

1. A detection end stress detection device based on an infrared sensor, comprising a detection device body (1), wherein a detection head (2) is fixedly connected to one side of the detection device body (1), characterized in that, The detection device body (1) is symmetrically fixedly connected to the mounting plate (3) on the side close to the probe head (2), and the mounting plate (3) is fixedly connected to the frame (4) away from the detection device body (1). The frame (4) is provided with an obstruction removal mechanism (5), which includes a vertical plate (501). The vertical plate (501) is fixedly connected to the upper end face of the upper mounting plate (3). A rotating shaft (502) is rotatably connected through the vertical plate (501). A threaded groove (503) is opened on the outer surface of the rotating shaft (502). The obstruction removal mechanism (5) is used to remove floating objects and impurities from the irradiation path of the probe (2) and the surface of the object to be detected. The detection device body (1) is provided with a pre-processing mechanism (6), which is used to automatically drive the obstruction removal mechanism (5) to work before the probe head (2) is opened; A fixing plate (515) is fixedly connected to the side of the rotating shaft (502) near the frame (4). A sliding column (516) is fixedly connected to the end of the fixing plate (515) away from the rotating shaft (502). A lifting plate (504) is provided on the outer sleeve of the sliding column (516). A sliding groove (517) is provided on the side of the lifting plate (504) near the sliding column (516). The sliding column (516) is slidably connected in the sliding groove (517). A sliding plate (512) is symmetrically fixedly connected to the lower end of the lifting plate (504). The sliding plates (512) are all slidably connected to the frame (4). The obstruction removal mechanism (5) also includes fan blades (505) symmetrically arranged on the side of the frame (4) away from the probe head (2). Each fan blade (505) is fixedly connected to a connecting shaft (507) on the side of the frame (4). Each connecting shaft (507) is symmetrically rotatably connected to a connecting block (506) on its outer surface. Each connecting block (506) is fixedly connected to the side wall of the frame (4). Each of the slide plates (512) is fixedly connected to a lifting block (518) at its lower end. The lifting blocks (518) are vertically slidably connected to the frame (4). A flexible cleaning plate (519) is fixedly connected between the lifting blocks (518). The flexible cleaning plate (519) and the probe (2) are in contact.

2. The infrared sensor-based stress detection device according to claim 1, characterized in that, Each of the connecting shafts (507) has a fixed connecting plate (508) at its upper end. Each of the connecting plates (508) has a groove (509) on the side near the frame (4). Each of the grooves (509) has a lever (510) slidably connected in the groove (509). Each of the levers (510) has a fixed connecting plate (511) at its upper end. Each of the first connecting plates (511) has a fixed connecting plate (520) at its lower end. Each of the moving plates (520) is slidably connected to the upper surface of the upper connecting block (506).

3. The infrared sensor-based stress detection device according to claim 2, characterized in that, The first connecting plate (511) is fixedly connected to a movable column (514) on the side near the slide plate (512). The slide plate (512) is provided with a corrugated groove (513), and the movable column (514) is slidably connected in the corrugated groove (513).

4. The infrared sensor-based stress detection device according to claim 1, characterized in that, The pretreatment mechanism (6) includes a drive shaft (604), which is rotatably connected to the upper end face of the detection device body (1). A drive source is connected to the drive shaft (604). A second connecting plate (601) is fixedly connected to the upper end of the drive shaft (604). A push plate (602) is rotatably connected to the side of the upper end of the second connecting plate (601) away from the drive shaft (604). A linkage column (606) is rotatably connected to the end of the push plate (602) away from the second connecting plate (601). The upper end of the linkage column (606) is slidably connected to the threaded groove (503). A movable frame (603) is fixedly connected to the lower end of the linkage column (606). The movable frame (603) is slidably connected to the detection device body (1).

5. The infrared sensor-based stress detection device according to claim 4, characterized in that, A pressing plate (605) is fixedly connected to the center of the lower end face of the movable frame (603). A switch (7) is fixedly connected to the upper end face of the detection device body (1) away from the movable frame (603). The switch (7) and the pressing plate (605) are on the same horizontal line. The switch (7) and the probe (2) are electrically connected.

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