Synchrotron radiation method and device for simultaneously detecting DC and AC components of spin current

Abstract

The present invention discloses a synchrotron radiation method and device for simultaneously detecting the DC and AC components of a spin current, and relates to the field of photoelectric detection technology. A double-layer film sample to be tested is placed on an electrical test sample platform; a high-frequency microwave signal obtained by processing a microwave clock signal through a microwave electronics part is input into the electrical test sample platform to excite the magnetic layer of the double-layer film sample to be tested to generate GHz spin precession; a synchrotron radiation X-ray pulse is incident on the double-layer film sample to be tested to detect the instantaneous signal of the spin precession of the ferromagnetic layer in the double-layer film sample to be tested and the instantaneous signal of the spin precession of the non-magnetic layer driven by the AC spin current pumped from the ferromagnetic layer; at the same time, an electrical response test system is used to measure the DC voltage signal converted by the non-magnetic layer in the magnetic double-layer sample to be tested through the inverse spin Hall effect. The synchrotron radiation method and device can simultaneously detect the DC component and the GHz AC component of the spin current.

Description

Technical Field

[0001] The present invention relates to the field of photoelectric detection technology, and in particular to a synchrotron radiation method and device for simultaneously detecting DC and AC components of a spin current. Background Art

[0002] Spintronic devices, with their compact size, high stability, low energy consumption, multifunctionality, and high integration density, have opened up new avenues for the development of information technology, becoming the trigger for the Fourth Industrial Revolution, following vacuum tubes, transistors, and integrated circuits. The recently developed spin-orbit torque random access magnetic memory (SOM) represents a significant breakthrough in spintronic devices, providing a third-generation information writing / reading method, following giant magnetoresistance (GMR), tunneling magnetoresistance (TMR), and spin-transfer torque (STMT) memory. Spin current, a key information transmission medium in SOMRAM, has gradually become a focus of attention. Spin pumping, a common method for generating spin current in ferromagnetic / non-magnetic heterojunctions, involves perturbing the ferromagnetic layer with GHz microwaves, causing the magnetic moment of the ferromagnetic layer to precess, continuously injecting a spin current into the adjacent non-magnetic layer. The resulting spin current consists of a small DC component and a larger AC component that varies at GHz. However, the conventional method of detecting spin currents is electrical measurement, that is, detecting the spin current by detecting the inverse spin Hall voltage induced by the spin current in the heavy metal layer. This method can only detect the DC component of the spin current by averaging the electrical signal, but cannot explore the properties of the GHz AC component of the spin current, thus missing information about the coherence and phase of the spin current.

[0003] The recently developed synchrotron radiation-based X-ray ferromagnetic resonance technique (referenced in publication number CN116520221A, "A Method and System for Detecting GHz Spin Precession with Time and Space Resolved") synchronizes the phases of X-ray pulses and microwave detection, enabling element- and phase-resolved ultrafast magnetic dynamics measurements and spin current transport. While this method can detect the AC component of the spin current, it cannot simultaneously obtain information about the DC component of the spin current, making the results difficult to directly compare with conventional electrical measurements. Summary of the Invention

[0004] Based on the technical problems existing in the background technology, the present invention proposes a synchrotron radiation method and device for simultaneously detecting the DC and AC components of the spin current, and realizes the simultaneous detection of the DC component and the GHz AC component of the spin current through synchrotron radiation X-ray pulses and an electrical response test system.

[0005] The synchrotron radiation method for simultaneously detecting the DC and AC components of a spin current proposed in the present invention comprises the following steps:

[0006] Step 1: Placing a double-layer film sample to be tested on an electrical test sample platform of an electrical response test system, wherein the electrical test sample platform includes a PCB board and a perforated waveguide embedded in the PCB board. The double-layer film sample to be tested is connected to an electrical interface provided on the PCB board via leads, and the electrical interface is connected to a test and control system of the electrical response test system via leads. The double-layer film sample to be tested is a double-layer film structure composed of a ferromagnetic layer and a non-magnetic layer containing different elements.

[0007] Step 2: Processing the microwave clock signal from the synchrotron radiation accelerator through a microwave electronics unit with frequency multiplication / gain / phase delay functions to generate a high-frequency microwave signal. This high-frequency microwave signal is then input into an electrical test sample stage comprising a planar resonant waveguide to excite the double-layer film sample to generate GHz spin precession.

[0008] Step 3: Using a GHz high-frequency spin precession detection device that integrates GHz microwave excitation and X-ray detection, a synchrotron radiation X-ray pulse emitted by a synchrotron radiation accelerator is incident on the bilayer film sample to be tested through the perforation of the planar resonant waveguide to detect the transient signal of the spin precession of the ferromagnetic layer of the bilayer film sample to be tested near the resonance field, as well as the transient signal of the spin precession of the non-magnetic layer driven by the AC spin current pumped from the ferromagnetic layer;

[0009] Step 4: At the same time, the electrical response test system is used to measure the DC voltage signal converted from the DC component of the spin current in the non-magnetic layer of the double-layer film sample through the inverse spin Hall effect;

[0010] Step 5: Apply different electrical environments to the double-layer film sample to be tested through the electrical response test system, so as to obtain the detection results of the DC component and GHz AC component of the spin current of the double-layer film sample to be tested under different electrical environments.

[0011] Furthermore, in step five, different electrical environments are applied to the double-layer film sample to be tested by the electrical response test system, specifically:

[0012] A microwave current is directly introduced into the conductive double-layer film sample to be tested through the electrical test sample stage. The microwave magnetic field and spin torque generated by the microwave current are used to excite the double-layer film sample to produce spin-torque ferromagnetic resonance. At this time, synchrotron radiation X-ray pulses are used to detect the instantaneous signal of the spin precession of the ferromagnetic layer and non-magnetic layer of the double-layer film sample to be tested.

[0013] An electrical response test system is used to apply a bias gate voltage perpendicular to the sample to be tested. At the same time, synchrotron radiation X-ray pulses are used to detect the voltage-controlled GHz spin precession and spin pumping of the double-layer film sample to be tested.

[0014] An electrical response test system is used to apply a pulse current to the double-layer film sample to be tested to instantaneously change the temperature of the double-layer film sample to be tested, and the GHz spin precession and spin pumping of the thermally regulated double-layer film sample to be tested are detected.

[0015] Furthermore, in step 2, the microwave clock signal is processed by a microwave electronics part having frequency doubling / gain / phase delay functions to obtain a high-frequency microwave signal. The processing process is: performing phase delay, power gain and microwave frequency doubling processing on the microwave clock signal to obtain a high-frequency microwave signal.

[0016] Furthermore, the ferromagnetic layer will inject spin current into the neighboring layer during the ferromagnetic resonance process. By adjusting the synchrotron radiation X-ray energy to the energy absorption edge of the non-magnetic layer elements, the instantaneous precession signal of the non-magnetic layer driven by the GHz AC spin current torque is detected. In this process, the electrical response test system is also used to measure the DC voltage signal converted by the DC spin current component of the non-magnetic layer of the magnetic sample through the inverse spin Hall effect.

[0017] Furthermore, in step three, the instantaneous signal of the spin precession of the non-magnetic layer driven by the AC spin current pumped from the ferromagnetic layer is detected by synchrotron radiation X-ray pulses, specifically:

[0018] The spin precession of the ferromagnetic layer pumps a spin current into the adjacent non-magnetic layer, wherein the spin current contains a large GHz AC component and a small DC component, that is, the spin current includes 99% of the GHz AC component and 1% of the DC component;

[0019] By utilizing the adjustable energy of synchrotron radiation X-rays, synchrotron radiation X-ray pulses are used to simultaneously detect the spin precession of the non-magnetic layer near the resonance field of the ferromagnetic layer, that is, the instantaneous signal of the spin precession of the non-magnetic layer driven by the GHz AC component of the pump spin current.

[0020] A synchrotron radiation device that simultaneously detects the DC and AC components of spin currents, including a synchrotron radiation accelerator, microwave electronics with frequency doubling / gain / phase delay functions, an electrical response test system, a GHz high-frequency spin precession detection device for X-ray detection, an integrated GHz microwave excitation device, and a computer;

[0021] Synchrotron radiation accelerators are used to generate synchronized microwave clock signals and synchrotron radiation X-ray pulses;

[0022] The microwave electronics part with frequency doubling / gain / phase delay functions is used to process the microwave clock signal received from the synchrotron radiation accelerator device to obtain a high-frequency microwave signal;

[0023] The electrical response test system is used to input a high-frequency microwave signal into an electrical test sample stage including a planar resonant waveguide to excite the double-layer film sample to generate GHz spin precession. The electrical response test system is used to measure the DC voltage signal converted by the non-magnetic layer in the double-layer film sample to be tested through the inverse spin Hall effect. In addition, the electrical response system is used to apply different electrical environments to the double-layer film sample to be tested.

[0024] Utilizing a GHz high-frequency spin precession detection device for X-ray detection and integrated GHz microwave excitation, the synchrotron radiation X-ray pulses received by the synchrotron radiation accelerator are incident on the bilayer film sample to be tested through the perforations of the planar resonant waveguide to detect the transient signal of the spin precession of the ferromagnetic layer of the bilayer film sample to be tested near the resonance field. In addition, by adjusting the energy of the synchrotron radiation X-ray, the transient precession signal of the non-magnetic layer driven by the GHz AC spin current torque is detected.

[0025] The computer is connected to the electrical response test system, the microwave electronics system with frequency doubling / gain / phase delay functions, and the GHz high-frequency spin precession detection device for X-ray detection. It is used to automatically control the operation of each system and collect data, thereby obtaining the detection results of the DC component and GHz AC component of the spin current.

[0026] Furthermore, the GHz AC spin current and DC spin current generated during spin pumping can be simultaneously detected, as well as spin precession and spin pumping in complex electrical environments. The electrical response test system can apply different electrical environments to the double-layer film sample to be tested, specifically:

[0027] A high-frequency microwave signal is directly transmitted to the conductive double-layer film sample to be tested through the electrical test sample stage. The microwave magnetic field generated by the microwave current and the spin torque are used to excite the double-layer film sample to produce spin-torque ferromagnetic resonance. At this time, synchrotron radiation X-ray pulses are used to detect the instantaneous signal of the spin precession of the ferromagnetic layer of the double-layer film sample to be tested near the resonance field.

[0028] An electrical response test system is used to apply a bias gate voltage perpendicular to the sample to be tested. At the same time, synchrotron radiation X-ray pulses are used to detect the voltage-controlled GHz spin precession and spin pumping of the double-layer film sample to be tested.

[0029] An electrical response test system is used to apply a pulse current to the double-layer film sample to be tested to instantaneously change the temperature of the double-layer film sample to be tested, and the GHz spin precession and spin pumping of the thermally regulated double-layer film sample to be tested are detected.

[0030] Furthermore, the microwave electronics part with frequency doubling / gain / phase delay functions is specifically used to perform phase delay, power gain and microwave frequency doubling processing on the microwave clock signal to obtain a high-frequency microwave signal.

[0031] Furthermore, the GHz high-frequency spin precession detection device for X-ray detection includes an electrical test sample stage of an electrical response test system.

[0032] The advantages of the synchrotron radiation method and apparatus for simultaneously detecting the DC and AC components of spin currents provided by the present invention are that they combine conventional X-ray ferromagnetic resonance spectroscopy with electrical testing to achieve simultaneous element-resolved and phase-resolved detection of the GHz AC and DC components of spin currents with adjustable soft X-ray energy and adjustable radiofrequency microwave field frequency. Utilizing an electrical test sample stage and synchrotron radiation apparatus, magnetic samples can be characterized using both optical and electrical methods. Experimental conditions are provided to enable detection of GHz spin precession under applied voltage or DC, AC, or pulsed current conditions, as well as spin pumping detection controlled by applied electric and magnetic fields. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] Figure 1 It is a structural schematic diagram of the present invention;

[0034] Figure 2 Schematic diagram of the generation of spin currents in a ferromagnetic metal / non-magnetic metal heterojunction using spin pumping, where the spin currents contain both direct current and GHz alternating current components.

[0035] Figure 3 This is a schematic diagram of the structure of the electrical test sample platform;

[0036] Figure 4 Schematic diagram of the radiation device for simultaneously detecting the DC and AC components of the spin current;

[0037] Figure 5 Schematic diagram of the electrical test system. DETAILED DESCRIPTION

[0038] The technical solutions of the present invention are described in detail below through specific embodiments. Numerous specific details are set forth in the following description to facilitate a full understanding of the present invention. However, the present invention can be implemented in many other ways than those described herein, and those skilled in the art may make similar modifications without departing from the scope of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0039] Figures 1 to 5 As shown, the synchrotron radiation method for simultaneously detecting the DC and AC components of a spin current proposed by the present invention comprises the following steps:

[0040] Step 1. Place a double-layer film sample to be tested on the electrical test sample platform of the electrical response test system. The electrical test sample platform includes a PCB board and a perforated waveguide embedded in the PCB board. The double-layer film sample to be tested is connected to the electrical interface provided on the PCB board through a lead. The electrical interface is connected to the test and control system of the electrical response test system through a lead. The double-layer film sample to be tested is a double-layer film structure composed of a ferromagnetic layer and a non-magnetic layer containing different elements.

[0041] Among them, Figure 3 and 5 As shown, the electrical response test system includes an electrical test sample station and a test and control system. The electrical interface includes a left electrode and a right electrode. The left electrode and the right electrode are respectively distributed on the positive and negative sides of the double-layer film sample to be tested and printed on the PCB board. The positive and negative electrodes of the double-layer film sample to be tested are electrically connected to the right electrode and the left electrode respectively through leads. Then the right electrode and the left electrode are respectively connected to the control system through a printed circuit provided on the PCB board (the printed circuit is only used for data transmission). The control system is connected to a computer. On the one hand, the electrical response test system is controlled by the computer, so that different electrical environments are applied to the double-layer film sample to be tested through the electrical response test system; on the other hand, the electrical response test system obtains the DC voltage signal of the double-layer film sample to be tested, thereby achieving the purpose of detecting the DC component of the spin current through electrical testing. In particular, the test and control system includes an external current and voltage source and an external current and voltage meter. The external current and voltage source are electrically connected to the right electrode and the left electrode respectively, and the external current and voltage meter are electrically connected to the right electrode and the left electrode respectively.

[0042] Step 2: Processing the microwave clock signal from the synchrotron radiation accelerator through a microwave electronics unit with frequency multiplication / gain / phase delay functions to generate a high-frequency microwave signal. This high-frequency microwave signal is then input into an electrical test sample stage comprising a planar resonant waveguide to excite the double-layer film sample to generate GHz spin precession.

[0043] The microwave electronics part with time-resolving function performs phase delay, power gain and microwave frequency multiplication processing on the microwave clock signal to obtain a high-frequency microwave signal. The specific processing process can be directly referred to the records in Publication No. CN116520221A. The high-frequency microwave signal is input into a planar resonant waveguide including an electrical test sample platform to excite the double-layer film sample to be tested to generate GHz spin precession. The excitation process of the double-layer film sample to be tested to generate GHz spin precession can also be directly referred to the records in Publication No. CN116520221A. This embodiment will not be described in detail here.

[0044] Step 3: Using a GHz high-frequency spin precession detection device that integrates GHz microwave excitation and X-ray detection, the synchrotron radiation X-ray pulses received by the synchrotron radiation accelerator are incident on the bilayer film sample to be tested through the perforations of the planar resonant waveguide to detect the transient signal of the spin precession of the ferromagnetic layer of the bilayer film sample to be tested near the resonance field, as well as the transient signal of the spin precession of the non-magnetic layer driven by the AC spin current pumped from the ferromagnetic layer;

[0045] The process of detecting the instantaneous signal of the spin precession of the ferromagnetic layer of the double-layer film sample to be tested can be directly referred to the description in Publication No. CN116520221A, which will not be described in detail in this embodiment.

[0046] The researchers used synchrotron X-ray pulses to detect the transient signal of spin precession in the non-magnetic layer driven by the AC spin current pumped from the ferromagnetic layer. Specifically, the spin precession in the ferromagnetic layer pumps a spin current in the adjacent non-magnetic layer. This spin current consists of a large GHz AC component and a small DC component, i.e., the spin current is approximately 99% GHz AC and approximately 1% DC. Leveraging the tunable energy of synchrotron X-rays, i.e., element-resolution, they simultaneously detected the spin precession of the non-magnetic layer near the ferromagnetic layer's resonance field, i.e., the transient signal of spin precession in the non-magnetic layer driven by the GHz AC component of the pumped spin current.

[0047] Step 4: At the same time, the electrical response test system is used to measure the DC voltage signal converted from the DC component of the spin current in the non-magnetic layer of the magnetic sample through the inverse spin Hall effect;

[0048] like Figure 2 As shown, the bilayer film sample under test is composed of a ferromagnetic layer and a non-magnetic layer containing different elements. During ferromagnetic resonance, the ferromagnetic layer injects a spin current into its neighboring layer. By adjusting the synchrotron X-ray energy to the energy absorption edge of the non-magnetic layer, the instantaneous precession signal of the non-magnetic layer driven by the spin current torque is detected. During this process, an electrical response test system is used to measure the DC voltage signal converted from the DC component of the spin current in the non-magnetic layer of the magnetic sample under test via the inverse spin Hall effect. Therefore, by using microwave pumping to energize the bilayer film sample under test, synchrotron X-ray pulses and the electrical response test system can simultaneously detect both the DC and GHz AC components of the spin current.

[0049] The main difference between this embodiment and the publication number CN116520221A is that the publication number CN116520221A can only detect the GHz AC component of the spin current, while Figure 4 As shown, this embodiment, based on publication number CN116520221A, can detect the DC component and GHz AC component of the spin current by setting up an electrical response test system, wherein the detection of the GHz AC component can refer to publication number CN116520221A.

[0050] Step 5: Apply different electrical environments to the double-layer film sample to be tested through the electrical response test system, so as to obtain the detection results of the DC component and GHz AC component of the spin current of the double-layer film sample to be tested under different electrical environments.

[0051] The electrical response test system applies different electrical environments to the double-layer film sample to be tested, specifically voltage, current and other electrical environments, specifically (a1) to (a3):

[0052] (a1) Directly pass a high-frequency microwave signal through an electrical test sample stage onto the conductive double-layer film sample to be tested, and use the microwave magnetic field and spin torque generated by the microwave current to excite the double-layer film sample to undergo spin-torque ferromagnetic resonance. At this time, synchrotron radiation X-ray pulses are used to detect the instantaneous signal of the spin precession of the ferromagnetic layer of the double-layer film sample to be tested near the resonance field;

[0053] (a2) Using an electrical response test system, a bias gate voltage perpendicular to the sample plane is applied to the bilayer film sample under test. Synchrotron X-ray pulses are then used to detect the voltage-regulated GHz spin precession and spin pumping of the bilayer film sample under test.

[0054] (a3) Using an electrical response test system, a pulse current is applied to the double-layer film sample to instantaneously change the temperature of the double-layer film sample to detect the GHz spin precession and spin pumping of the thermally regulated double-layer film sample to be tested.

[0055] In the above, the electrical response test system is used to apply different electrical environments to the double-layer film sample to be tested. By setting or modifying the response parameters on the computer and acting on the electrical response test system, the corresponding electrical environment is applied to the double-layer film sample to be tested. The electrical environment application process is carried out by applying instructions by modifying the parameters. For example, in (a2), the vertical sample bias gate voltage is applied to the double-layer film sample to be tested. The required vertical sample bias gate voltage can be set on the computer, and then a command data packet is formed and sent to the electrical response test system, which directly acts on the double-layer film sample to be tested, changing the electrical environment of the double-layer film sample to be tested, thereby obtaining detection results under different conditions. Since the method is an existing commonly used instruction application method, this embodiment will not be described in detail here.

[0056] The advantages of this embodiment over publication number CN116520221A are:

[0057] (1) Combining conventional X-ray ferromagnetic resonance spectroscopic testing with electrical testing, we can achieve simultaneous detection of the element-resolved and phase-resolved DC component of the spin current and the GHz AC component with adjustable soft X-ray energy and adjustable radio-frequency microwave field frequency.

[0058] (2) Using an electrical test sample stage and a synchrotron radiation device, magnetic samples can be characterized using both optical and electrical methods.

[0059] (3) Provide experimental conditions to realize the detection of GHz spin precession under external voltage or external DC, AC, or pulsed current conditions, as well as the detection of GHz spin precession and spin pumping under external electric and magnetic field control.

[0060] As an example, based on the Hefei Light Source's "Soft X-ray Magnetic Circular Dichroism" beamline, this paper describes a specific implementation method using the simultaneous temporal and spatially resolved detection of 1.02 GHz spin precession and testing of a spin-pumped DC voltage signal. The sample chosen was a ferromagnetic / non-magnetic bilayer film with an in-plane easy magnetization axis and a ferromagnetic resonance field of 100 Oe at 1.02 GHz. The testing and debugging system employed a high-sensitivity voltmeter.

[0061] 1. Place the double-layer membrane sample to be tested as Figure 2 The electrodes were placed and wired as shown, and a magnetic field of 100 Oe was applied.

[0062] 2. The microwave clock signal received from the synchrotron radiation accelerator device is processed by the microwave electronics part with frequency doubling / gain / phase delay functions to obtain a high-frequency microwave signal of 1.02GHz, 20dBm power, and 0° phase shift. The high-frequency microwave signal is connected to the perforated waveguide to make the sample undergo ferromagnetic resonance.

[0063] 3. Adjust the tilt angle of the double-layer film sample to be tested and select appropriate circularly polarized X-ray (synchrotron radiation X-ray pulse) for incidence.

[0064] 4. A microwave electronics unit with frequency doubling / gain / phase delay functions is used to adjust the phase delay of the phase modulator. A GHz high-frequency spin precession detection device with X-ray detection is used to measure the signal collected by the phase-locked amplifier. The "pump-probe" technique described in Publication No. CN116520221A (A Time- and Space-Resolved GHz Spin Precession Detection Method and System) is used to achieve time-resolved GHz spin precession measurement. A high-sensitivity voltmeter from the electrical response test system is used to test the DC spin pump voltage signal of the double-layer film sample to be tested on the electrical test sample stage. By varying the external magnetic field, the changes in the spin precession phase and the DC / AC signal amplitude of the double-layer film sample to be tested are simultaneously measured. This achieves simultaneous time-resolved detection of 1 GHz spin precession and testing of the spin pump DC voltage signal.

[0065] The above description is only a preferred specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any technician familiar with the technical field, within the technical scope disclosed by the present invention, who makes equivalent replacements or changes based on the technical solution and inventive concept of the present invention, should be covered by the scope of protection of the present invention.

Claims

1. A synchrotron radiation method for simultaneously detecting the DC and AC components of a spin current, characterized in that: The steps include: Step 1: Placing a double-layer film sample to be tested on an electrical test sample platform of an electrical response test system, wherein the electrical test sample platform includes a PCB board and a perforated waveguide embedded in the PCB board. The double-layer film sample to be tested is connected to an electrical interface provided on the PCB board via leads, and the electrical interface is connected to a test and control system of the electrical response test system via leads. The double-layer film sample to be tested is a double-layer film structure composed of a ferromagnetic layer and a non-magnetic layer containing different elements. Step 2: Processing the microwave clock signal from the synchrotron radiation accelerator through a microwave electronics unit with frequency multiplication, gain, and phase delay functions to generate a high-frequency microwave signal. This high-frequency microwave signal is then input into an electrical test sample stage comprising a planar resonant waveguide to excite the double-layer film sample to generate GHz spin precession. Step 3: Using a GHz high-frequency spin precession detection device that integrates GHz microwave excitation and X-ray detection, a synchrotron radiation X-ray pulse emitted by a synchrotron radiation accelerator is incident on the bilayer film sample to be tested through the perforation of the planar resonant waveguide to detect the transient signal of the spin precession of the ferromagnetic layer of the bilayer film sample to be tested near the resonance field, as well as the transient signal of the spin precession of the non-magnetic layer driven by the AC spin current pumped from the ferromagnetic layer; Step 4: At the same time, an electrical response test system is used to measure the DC voltage signal converted from the DC component of the spin current in the non-magnetic layer of the double-layer film sample to be tested through the inverse spin Hall effect; Step 5: Apply different electrical environments to the double-layer film sample to be tested through the electrical response test system, so as to obtain the detection results of the DC component and GHz AC component of the spin current of the double-layer film sample to be tested under different electrical environments.

2. The synchrotron radiation method for simultaneously detecting the DC and AC components of a spin current according to claim 1, characterized in that: In step 5, different electrical environments are applied to the double-layer film sample to be tested through the electrical response test system, specifically: A microwave current is directly introduced into the conductive double-layer film sample to be tested through the electrical test sample stage. The microwave magnetic field and spin torque generated by the microwave current are used to excite the double-layer film sample to produce spin-torque ferromagnetic resonance. At this time, synchrotron radiation X-ray pulses are used to detect the instantaneous signal of the spin precession of the ferromagnetic layer and non-magnetic layer of the double-layer film sample to be tested. An electrical response test system is used to apply a bias gate voltage perpendicular to the sample to be tested. At the same time, synchrotron radiation X-ray pulses are used to detect the voltage-controlled GHz spin precession and spin pumping of the bilayer film sample to be tested. An electrical response test system is used to apply a pulse current to the double-layer film sample to be tested to instantaneously change the temperature of the double-layer film sample to be tested, and the GHz spin precession and spin pumping of the thermally regulated double-layer film sample to be tested are detected.

3. The synchrotron radiation method for simultaneously detecting the DC and AC components of a spin current according to claim 1, characterized in that: In step 2, the microwave clock signal is processed by a microwave electronics part having frequency multiplication, gain, and phase delay functions to obtain a high-frequency microwave signal. The processing process is: performing phase delay, power gain, and microwave frequency multiplication on the microwave clock signal to obtain a high-frequency microwave signal.

4. The synchrotron radiation method for simultaneously detecting the DC and AC components of a spin current according to claim 1, characterized in that: During the ferromagnetic resonance process, the ferromagnetic layer will inject a spin current into the neighboring layer. By adjusting the synchrotron radiation X-ray energy to the energy absorption edge of the non-magnetic layer elements, the instantaneous precession signal of the non-magnetic layer driven by the GHz AC spin current torque is detected. In this process, the electrical response test system is also used to measure the DC voltage signal converted by the non-magnetic layer of the double-layer film sample to be tested through the inverse spin Hall effect.

5. The synchrotron radiation method for simultaneously detecting the DC and AC components of a spin current according to claim 4, characterized in that: In step 3, the instantaneous signal of the spin precession of the non-magnetic layer driven by the AC spin current pumped from the ferromagnetic layer is detected by synchrotron radiation X-ray pulses. Specifically: The spin precession of the ferromagnetic layer pumps a spin current into the adjacent non-magnetic layer, wherein the spin current contains 99% GHz AC component and 1% DC component; By utilizing the adjustable energy of synchrotron radiation X-rays, synchrotron radiation X-ray pulses are used to simultaneously detect the spin precession of the non-magnetic layer near the resonance field of the ferromagnetic layer, that is, the instantaneous signal of the spin precession of the non-magnetic layer driven by the GHz AC component of the pump spin current.

6. A synchrotron radiation device for simultaneously detecting the DC and AC components of a spin current, characterized in that: It includes a synchrotron radiation accelerator, microwave electronics with frequency doubling, gain, and phase delay functions, an electrical response test system, a GHz high-frequency spin precession detection device for X-ray detection, an integrated GHz microwave excitation device, and a computer. Synchrotron radiation accelerators are used to generate synchronized microwave clock signals and synchrotron radiation X-ray pulses; The microwave electronics part with frequency multiplication, gain and phase delay functions is used to process the microwave clock signal received from the synchrotron radiation accelerator device to obtain a high-frequency microwave signal; The electrical response test system is used to input a high-frequency microwave signal into an electrical test sample stage including a planar resonant waveguide to excite the double-layer film sample to generate GHz spin precession. The electrical response test system is used to measure the DC voltage signal converted by the non-magnetic layer in the double-layer film sample to be tested through the inverse spin Hall effect. In addition, the electrical response system is used to apply different electrical environments to the double-layer film sample to be tested. Utilizing a GHz high-frequency spin precession detection device for X-ray detection and integrated GHz microwave excitation, the synchrotron radiation X-ray pulses received by the synchrotron radiation accelerator are incident on the bilayer film sample to be tested through the perforations of the planar resonant waveguide to detect the transient signal of the spin precession of the ferromagnetic layer of the bilayer film sample to be tested near the resonance field. In addition, by adjusting the energy of the synchrotron radiation X-ray, the transient precession signal of the non-magnetic layer driven by the GHz AC spin current torque is detected. The computer is connected to the electrical response test system, the microwave electronics system with frequency doubling, gain, and phase delay functions, and the GHz high-frequency spin precession detection device for X-ray detection. It is used to automatically control the operation of each system and collect data, thereby obtaining the detection results of the DC component and GHz AC component of the spin current.

7. The synchrotron radiation device for simultaneously detecting the DC and AC components of a spin current according to claim 6, characterized in that: It can simultaneously detect GHz AC spin currents and DC spin currents generated during spin pumping, as well as spin precession and spin pumping in complex electrical environments. The electrical response test system can impose different electrical environments on the double-layer film sample to be tested, specifically: A high-frequency microwave signal is directly transmitted to the conductive double-layer film sample to be tested through the electrical test sample stage. The microwave magnetic field generated by the microwave current and the spin torque are used to excite the double-layer film sample to produce spin-torque ferromagnetic resonance. At this time, synchrotron radiation X-ray pulses are used to detect the instantaneous signal of the spin precession of the ferromagnetic layer of the double-layer film sample to be tested near the resonance field. An electrical response test system is used to apply a bias gate voltage perpendicular to the sample to be tested. At the same time, synchrotron radiation X-ray pulses are used to detect the voltage-controlled GHz spin precession and spin pumping of the bilayer film sample to be tested. An electrical response test system is used to apply a pulse current to the double-layer film sample to be tested to instantaneously change the temperature of the double-layer film sample to be tested, and the GHz spin precession and spin pumping of the thermally regulated double-layer film sample to be tested are detected.

8. The synchrotron radiation device for simultaneously detecting the DC and AC components of a spin current according to claim 6, characterized in that: The microwave electronics part with frequency doubling, gain and phase delay functions is specifically used to perform phase delay, power gain and microwave frequency doubling processing on the microwave clock signal to obtain a high-frequency microwave signal.

9. The synchrotron radiation device for simultaneously detecting the DC and AC components of a spin current according to claim 6, characterized in that: The GHz high-frequency spin precession detection device for X-ray detection includes an electrical test sample stage of an electrical response test system.

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