A spin-polarized photoexcitation multi-field coupled in-situ neutron scattering sample environment device

Abstract

The application provides a spin-optical excitation multi-field coupling in-situ neutron scattering sample environment device, which comprises a sample cabin, a sample adjusting platform, a temperature control device and an optical detection device; the temperature control device is connected with the sample adjusting platform and is used for controlling the environmental temperature of the sample table; the optical detection device comprises an optical cabin, a laser emitter, a collimating lens and a liquid crystal wave plate, generates a specified type of polarized light, and finally irradiates the sample on the sample table through a laser window; two opposite sides of the sample table are respectively provided with a neutron incident window and a neutron emission window; in the sample environment device, the temperature control device is integrated to provide a specific environmental temperature for the sample, the optical detection device provides a polarized light environment for the sample, and the neutron scattering technology is used to detect the data of the sample under different temperatures and different polarized light environments, so that the sample detection scene is enriched and the experimental environment of multiple spectrometer lines can be adapted.

Description

Technical Field

[0001] This application relates to the field of neutron scattering technology, specifically to a spin-optically excited multi-field coupled in-situ neutron scattering sample environment device. Background Technology

[0002] Neutron scattering is a technique used to study the static structure and microscopic dynamic properties of matter. The performance and structure of samples under different environments can only be verified experimentally before they can be used in specific environments, or to explore the performance and structure of samples of new research materials under specific conditions. Among related technologies, temperature control of the sample can be used to place it in a specific temperature environment, and combining this specific temperature environment with neutron scattering can expand the scope of materials science research. However, current sample detection environments generally only involve adjusting the ambient temperature of the sample, without considering the combined ambient temperature and specific polarization light environment, thus limiting the detection scenarios for samples using neutron scattering. Summary of the Invention

[0003] The main technical problem addressed in this application is that the scenarios in which neutron scattering sample environment devices can detect samples are limited, making it difficult to collect data from samples under various experimental conditions.

[0004] To address the aforementioned technical problems, one embodiment provides a neutron scattering sample environment device, including a sample chamber, a sample conditioning platform, a temperature control device, and an optical detection device;

[0005] The sample chamber is used to provide a sub-vacuum environment;

[0006] The sample adjustment platform is located inside the sample chamber; the sample adjustment platform includes a sample stage and a mounting mechanism connected to the sample stage; therefore, the top of the sample stage has a bearing surface for placing the sample, and the mounting mechanism is used to support the sample stage;

[0007] The temperature control device is connected to the sample adjustment platform; the temperature control device includes a temperature control module and a heat dissipation module. The temperature control module is in contact with the sample stage and is used to control the ambient temperature of the sample stage. The heat dissipation module is connected to the temperature control module and is used to dissipate heat from the temperature control module.

[0008] The optical detection device includes an optical chamber, a laser emitter, a collimating lens, and a liquid crystal waveplate. The optical chamber is fixedly connected to the sample chamber, and a laser window is provided at the connection between the optical chamber and the sample chamber. The laser emitter is fixedly disposed in the optical chamber. The collimating lens and the liquid crystal waveplate are arranged sequentially from away from the sample stage to close to the sample stage. The laser emitted by the laser emitter is focused by the collimating lens, then converted into a specified type of polarized light by the liquid crystal waveplate, and finally irradiates the sample on the sample stage through the laser window.

[0009] The sample stage has a neutron incident window and a neutron exit window on two opposite sides, which are used for the incident and exit of neutrons, respectively.

[0010] In one embodiment, the mounting mechanism includes a fixed base and an adjustable base; the fixed base is fixedly disposed below the adjustable base; the adjustable base is positioned above the fixed base and is fixedly connected to the sample stage; the fixed base is provided with at least three support members, each support member protruding from the top of the fixed base and providing support for the adjustable base, and at least one of the support members is an adjustable support member, the height of which the adjustable support member protrudes from the top of the fixed base can be adjusted to adjust the angle of the supported adjustable base.

[0011] In one embodiment, the adjustable support includes two threaded adjustment components, which are rotatably mounted on the fixed base via threaded engagement.

[0012] In one embodiment, the support further includes a spherical support fixed to the top of the fixed base, the top of which provides support for the adjustable base.

[0013] In one embodiment, the spherical support is disposed on the edge region of the fixed base; or,

[0014] The installation mechanism further includes several elastic connectors, which are disposed at least on both sides of the fixed base and the adjustable base, and connect the fixed base and the adjustable base; the spherical support is disposed in the central area of ​​the fixed base.

[0015] In one embodiment, the temperature control module includes a semiconductor temperature control module, which is disposed between the adjustment base and the sample stage, and the temperature control working surface of the semiconductor temperature control module is in contact with the sample stage.

[0016] In one embodiment, the heat dissipation module includes a liquid cooling circulation pipe; a hollow cavity is formed inside the adjustment base, and the pipe of the liquid cooling circulation pipe is sealed and connected to the hollow cavity; the semiconductor temperature control module is fixed to the top surface of the adjustment base in contact.

[0017] In one embodiment, the optical detection device further includes a beam splitter and a corresponding laser power meter. The beam splitter is disposed between the collimating lens and the liquid crystal waveplate and is used to split the laser light passing through the collimating lens into a main laser and a secondary laser. The main laser is emitted along the original path to be converted into polarized light of a specified type by the liquid crystal waveplate. The secondary laser forms a non-zero angle with the main laser. The laser power meter is used to detect the light intensity of the secondary laser.

[0018] In one embodiment, the collimating lens, the liquid crystal waveplate, and the beam splitter are all fixedly disposed in the optical cabin by a rotating thread mechanism, and the rotating thread mechanism is at least used to adjust the distance between the collimating lens and the laser emitter.

[0019] In one embodiment, the optical detection device further includes a vacuum extraction port for connecting a vacuum pump to evacuate the optical chamber.

[0020] According to the neutron scattering sample environment device of the above embodiment, since the sample environment device integrates a temperature control device to provide a specific ambient temperature for the sample, the ambient temperature range can be between -50°C and 50°C, and the optical detection device provides a polarized light environment for the sample, the neutron scattering technology is used to detect the sample data under different temperatures and different polarized light environments, thereby enriching the sample detection scenarios and adapting to the experimental environment of multi-spectrometer line. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the composition and structure of the neutron scattering sample environment device provided in the embodiments of this application.

[0022] Figure 2 This is a schematic diagram of the composition of the sample conditioning platform provided in the embodiments of this application.

[0023] Figure 3 This is a schematic diagram of the assembly structure of the installation mechanism provided in the embodiments of this application.

[0024] Figure 4 This is a schematic diagram of the assembly structure of the installation mechanism provided in the embodiments of this application.

[0025] Figure 5 This is a schematic cross-sectional view of the adjustment base provided in an embodiment of this application.

[0026] Figure 6This is a schematic diagram of the sample stage structure provided in an embodiment of this application.

[0027] Explanation of reference numerals in the attached figures:

[0028] 1-Sample compartment;

[0029] 2-Sample adjustment platform; 21-Sample stage; 22-Mounting mechanism; 23-Fixed base; 24-Adjustable base; 25-Support component; 26-Adjustable support component; 27-Threaded adjustment component; 28-Spherical support component; 29-Hollow cavity;

[0030] 3-Temperature control device; 31-Temperature control module; 32-Heat dissipation module; 33-Liquid cooling circulation pipe;

[0031] 4-Optical inspection device; 41-Optical cabin; 42-Laser emitter; 43-Collimating lens; 44-Liquid crystal waveplate; 45-Beam splitter; 46-Vacuum extraction port; 47-Rotating thread mechanism; 48-Connecting window;

[0032] 51 - Neutron incident window; 52 - Neutron exit window. Detailed Implementation

[0033] The present application will now be described in further detail with reference to the accompanying drawings and specific embodiments. Similar elements in different embodiments are referred to by related similar element reference numerals. In the following embodiments, many details are described to facilitate a better understanding of the present application. However, those skilled in the art will readily recognize that some features may be omitted in different situations, or may be replaced by other elements, materials, or methods. In some cases, certain operations related to the present application are not shown or described in the specification. This is to avoid obscuring the core parts of the present application with excessive description. For those skilled in the art, detailed description of these related operations is not necessary; they can fully understand the related operations based on the description in the specification and general technical knowledge in the art.

[0034] Furthermore, the features, operations, or characteristics described in the specification can be combined in any suitable manner to form various embodiments. At the same time, the steps or actions in the method description can be rearranged or adjusted in a manner obvious to those skilled in the art. Therefore, the various orders in the specification and drawings are only for the clear description of a particular embodiment and do not imply a necessary order, unless otherwise stated that a particular order must be followed.

[0035] The serial numbers assigned to components in this document, such as "first" and "second," are used only to distinguish the described objects and have no sequential or technical meaning. The terms "connection" and "linkage" used in this application, unless otherwise specified, include both direct and indirect connections (linkages).

[0036] This application primarily utilizes experiments with neutrons from the spectrometer lines of the China Spallation Neutron Source (CSNS), a major scientific facility in China, to probe the internal structure of matter. The performance and structure of samples under different environments can only be verified experimentally before they can be used in specific environments, or to explore the performance and structure of samples of new research materials under specific conditions. This application mainly relies on the CSNS, a large-scale scientific facility in China. Neutrons generated by the CSNS can be used to probe the structure and properties of matter. The main focus is on studying new or specific samples at specific temperatures, with specific polarization of light, and by controlling the angle of neutron incidence. The application utilizes neutrons to probe the internal structure and properties of matter, and uses lasers to generate polarized light. Polarized light can produce magnetization parallel or antiparallel to the laser beam direction, maximizing the flexibility of the experimental method.

[0037] This application also relates to the photophysical properties of chiral inorganic nanomaterials and their wide range of applications. The chiral structures obtained through experimental research can react strongly with photons, causing a change in polarization state and producing circularly polarized light (CPL). Chirality is a geometric property of matter; its mirror image cannot coincide with itself through simple rotation and translation, i.e., it lacks Sn symmetry elements. Many chiral molecules exist in nature, such as the DNA double helix structure, L-amino acids, and D-sugars, which play important roles in living organisms. Chiral materials possess unique optical activities, such as optical rotation, circular dichroism (CD), and the emission of circularly polarized light, making them valuable for applications in light-emitting diodes and security anti-counterfeiting. Polarization is a property of light. Based on the wave vector perpendicular to the direction of light propagation, polarized light can be classified as partially polarized light, linearly polarized light (LPL), elliptically polarized light (EPL), and circularly polarized light. Circularly polarized light can also be considered a special type of elliptically polarized light. For circularly polarized light, the electric and magnetic field components of the electromagnetic wave rotate around the propagation vector at a constant rate. If the field rotates left-handed relative to the wave's propagation direction, it is called left-handed circularly polarized light (LH-CPL); otherwise, it is called right-handed circularly polarized light (RH-CPL). This application can adjust the sample temperature and the environment for applying specific polarized light. Based on the angle of neutron incident on the sample, the ambient temperature of the sample can be controlled with high precision between -50°C and 50°C. While achieving the above functions, the device has a precise internal structure and a small overall size, making it suitable for experiments on multiple spectrometer lines.

[0038] Please refer to Figure 1 and Figure 2 This application provides a neutron scattering sample environment device, which specifically includes a sample chamber 1, a sample adjustment platform 2, a temperature control device 3, and an optical detection device 4.

[0039] The neutron scattering sample environment device in this embodiment is mainly for adjusting the position of the experimental sample on the spectrometer line and collecting data on the changes of the sample under specific experimental conditions. The sample chamber 1 provides a sub-vacuum environment; maintaining the sample chamber 1 and the optical chamber 41 in a vacuum / sub-vacuum environment ensures that the equipment and components within the chambers remain dry, guaranteeing the quality of the detection environment and the reliability of the monitoring results. The detection environment includes polarized light projected onto the sample, an accurate and stable temperature environment, etc., and the vacuum level of the sample chamber 1 is approximately 10. -3 The vacuum level is on the order of Pa. To maintain the required vacuum level, the connection points between the sample chamber 1 and the optical detection device 4 in this embodiment are sealed with sealing rings.

[0040] The sample adjustment platform 2 is located inside the sample chamber 1. The sample adjustment platform 2 includes a sample stage 21 and a mounting mechanism 22 connected to the sample stage 21. Therefore, the top of the sample stage 21 has a bearing surface for placing samples, and the mounting mechanism 22 supports the sample stage 21. The sample adjustment platform 2 includes a sample stage 21 for holding samples and a mounting mechanism 22 connected to the sample stage 21. Generally, the top of the sample stage 21 has a bearing surface for placing samples, and this bearing surface also serves as the working area for sample testing.

[0041] Depending on the specific sample conditions, the bearing surface on the sample stage 21 can be set as a receiving chamber, and the sample is placed in the receiving chamber for detection. In order to stabilize the state of the sample, a sample clamping component can also be set on the sample stage 21 to fix the sample to the sample stage 21 and prevent the sample from falling off.

[0042] In some alternative embodiments, the sample often needs to be adjusted in orientation during the detection process to achieve sample detection at different angles; to achieve this, please refer to... Figure 3-5As shown, the mounting mechanism 22 may specifically include a fixed base 23 and an adjustable base 24. The fixed base 23 is fixedly disposed below the adjustable base 24. The adjustable base 24 is disposed above the fixed base 23 and is fixedly connected to the sample stage 21. At least three support members 25 are provided on the fixed base 23. The support members 25 protrude from the top of the fixed base 23 and provide support for the adjustable base 24. At least one of the support members 25 is an adjustable support member 26. The height of the adjustable support member 26 protruding from the top of the fixed base 23 can be adjusted to adjust the angle of the supported adjustable base 24. The function of the mounting mechanism 22 is to support the sample stage 21. Therefore, the posture of the sample stage 21 is determined by the mounting mechanism 22. In this embodiment, the mounting mechanism 22 includes a fixed base 23 and an adjustable base 24. The fixed base 23 is disposed below the adjustable base 24, and the adjustable base 24 is disposed below the sample stage 21. The fixed base 23 and the adjustable base 24 are relatively separated, and their relative positions can be adjusted, thereby affecting the posture of the sample stage 21 disposed on the adjustable base 24.

[0043] To achieve attitude adjustment of the sample stage 21, at least three support members 25 are provided on the fixed base 23. Each support member 25 protrudes from the top surface of the fixed base 23, thus supporting the adjustable base 24 located above the fixed base 23. Therefore, at least three support members 25 are provided in this embodiment because the three points determine the plane, which ensures the stability of the supported adjustable base 24. At least one of the three support members 25 is an adjustable support member 26, and the height of the adjustable support member 26 protruding from the fixed base 23 is adjustable. This means that the plane formed by each support member 25 will adjust according to the height of the adjustable support member 26 protruding from the fixed base 23, thereby causing the angle of the supported adjustable base 24 to change, and causing the sample stage 21 to adjust accordingly, so as to achieve multi-angle sample detection.

[0044] In some alternative embodiments, please refer to Figure 4 To achieve the adjustment purpose, the adjustable support 26 may include two threaded adjusting members 27, which are rotatably mounted on the fixed base 23 via threaded engagement. The threaded adjusting members 27 are connected to the fixed base 23 by a threaded connection. By rotating the threaded adjusting member 27 to adjust the position of the threaded connection, the height of the threaded adjusting member 27 protruding from the top surface of the fixed base 23 is adjusted, thereby adjusting the angle of the adjustable base 24. Specifically, the threaded adjusting member 27 may be a precision threaded pair. While meeting design requirements such as accuracy and strength, the smallest possible size can be selected to ensure that the overall structure is compact while achieving the target function.

[0045] In some alternative embodiments, under extreme conditions, all support members 25 can be adjustable support members 26; of course, support members 25 can also be relatively fixed spherical support members 28, which are fixed to the top of the fixed base 23, and the top of the spherical support member 28 provides support for the adjusting base 24. The purpose of the spherical support member 28 is that, as a rotation center, it can maintain the stability of the adjusting base 24 and the fixed base 23 in a static state, and by adjusting the threaded adjusting member 27, the angle of the adjusting base 24 based on the spherical surface of the contact between the spherical support member 28 and the adjusting base 24 can be precisely adjusted.

[0046] In some alternative embodiments, based on the relatively fixed spherical support 28 and the threaded adjustment member 27 whose height protrudes from the fixed base 23, the specific configuration structure can be as follows: the spherical support 28 is disposed in the edge region of the fixed base 23. In this structure, the spherical support 28 is located in the side edge region of the top surface of the fixed base 23, or it can be located in the apex corner region of the top surface of the fixed base 23. The corresponding threaded adjustment member 27 can be disposed away from the spherical support 28 in other edge regions of the fixed base 23. For example, one of the threaded adjustment members 27 can be disposed along the diagonal of the fixed base 23 in the apex corner region opposite to the spherical support 28.

[0047] Alternatively, the mounting mechanism 22 may include several elastic connectors, which are disposed at least on both sides of the fixed base 23 and the adjusting base 24, and connect the fixed base 23 and the adjusting base 24; a spherical support 28 is disposed in the central area of ​​the fixed base 23. The elastic connectors may be tension springs, connecting the fixed base 23 and the adjusting base 24, thus balancing the connection stability between the fixed base 23 and the adjusting base 24. The elastic connectors maintain balance along at least both sides of the fixed base 23 and the adjusting base 24, and at least four elastic connectors may be provided, respectively disposed on the four corresponding side edges of the fixed base 23 and the adjusting base 24; the spherical support 28 is disposed in the central area, serving as a rotation center to support the adjusting base 24, and the fixed base 23 and the adjusting base 24 maintain positional balance through the elastic connectors.

[0048] Please refer to Figures 2-5The temperature control device 3 is connected to the sample adjustment platform 2. The temperature control device 3 includes a temperature control module 31 and a heat dissipation module 32. The temperature control module 31 is in contact with the sample stage 21 and is used to control the ambient temperature of the sample stage 21. The heat dissipation module 32 is connected to the temperature control module 31 and is used to dissipate heat from the temperature control module 31. The function of the temperature control device 3 is to provide a specific temperature environment for the sample. Due to the influence of the distance from the source, in order to ensure the reliability of the detection environment, the temperature control module 31, which directly controls the temperature, is directly in contact with the sample stage 21. This allows the sample stage 21 to maximize the temperature control effect generated by the temperature control module 31, while ensuring the stability of the sample in a specific temperature environment. Since temperature does not change spontaneously, the temperature control module 31 generates a large amount of heat while controlling the temperature. In this embodiment, the heat dissipation module 32 is used to dissipate heat from the temperature control module 31, allowing the heat generated by the temperature control module 31 to be carried away by the heat dissipation module 32, ensuring the accuracy of the temperature control by the temperature control module 31.

[0049] In some optional embodiments, to achieve the purpose of controlling the ambient temperature of the sample, the temperature control module 31 may specifically include a semiconductor temperature control module, wherein the semiconductor temperature control module is disposed between the adjustment base 24 and the sample stage 21, and the temperature control working surface of the semiconductor temperature control module is in contact with the sample stage 21. The semiconductor temperature control module reaches the target temperature quickly during operation, rapidly bringing the sample to the required specific temperature environment. Specifically, the semiconductor temperature control module can control the ambient temperature of the sample between -50℃ and 50℃, providing accurate and stable temperature control. The semiconductor temperature control module is disposed between the adjustment base 24 and the sample stage 21, with the part of the semiconductor temperature control module in contact with the sample stage 21 being the temperature control working surface, and the part of the semiconductor temperature control module in contact with the adjustment base 24 being the heating surface. Therefore, the heat emitted by the semiconductor temperature control module during operation is dissipated outward through the adjustment base 24.

[0050] In some alternative embodiments, please refer to Figure 5To achieve rapid heat dissipation, the heat dissipation module 32 specifically includes a liquid cooling circulation pipe 33; a hollow cavity 29 is formed inside the adjusting base 24, and the pipes of the liquid cooling circulation pipe 33 are sealed and connected to the hollow cavity 29; the semiconductor temperature control module is fixed to the top surface of the adjusting base 24 in contact. Since the adjusting base 24 receives the heat dissipated by the semiconductor temperature control module during operation, the liquid cooling circulation pipe 33 is connected to the adjusting base 24. The liquid cooling circulation pipe 33 injects low-temperature liquid into the hollow cavity 29 of the adjusting base 24, allowing the liquid to absorb heat and form a high-temperature liquid or be vaporized into gas due to high temperature, and then the high-temperature liquid / gas is discharged from the liquid cooling circulation pipe 33; wherein, the liquid cooling circulation pipe 33 for injecting low-temperature liquid and the liquid cooling circulation pipe 33 for discharging high-temperature liquid / gas are interconnected through the hollow cavity 29. The liquid cooling circulation pipe 33 dissipates heat through liquid cooling, and the two liquid cooling circulation pipes 33 adopt a V-shaped cross design to facilitate processing and reduce size, while still meeting the heat dissipation requirements.

[0051] Please refer to Figure 1 The optical detection device 4 specifically includes an optical chamber 41, a laser emitter 42, a collimating lens 43, and a liquid crystal waveplate 44. The optical chamber 41 is fixedly connected to the sample chamber 1, and a laser window is provided at the connection between the optical chamber 41 and the sample chamber 1. The laser emitter 42 is fixedly installed in the optical chamber 41. The collimating lens 43 and the liquid crystal waveplate 44 are arranged sequentially from away from the sample stage 21 to closer to it. The laser emitted by the laser emitter 42 is focused by the collimating lens 43, then converted into polarized light of a specified type by the liquid crystal waveplate 44, and finally irradiates the sample on the sample stage 21 through the laser window. The laser emitter 42 and the collimating lens are integrated, and the collimating lens and the liquid crystal waveplate 44 are integrated. The laser emitted by the laser emitter 42 is focused by the collimating lens 43, and then converted into polarized light of a specified direction by the liquid crystal waveplate 44, irradiating the sample and providing the required polarized light environment for the sample. The control principle of the liquid crystal waveplate 44 is that by controlling the voltage of the liquid crystal waveplate 44, the phase delay of the laser can be controlled accordingly, thereby enabling the laser to convert between left-polarized light and right-polarized light.

[0052] The optical detection device 4 is connected to the sample chamber 1. A connecting window 48 is provided at the connection between the optical detection device 4 and the sample chamber 1. The connecting window 48 allows polarized light to pass through the connecting window 48 and be projected onto the sample chamber 1, providing the sample with the required polarized light environment.

[0053] In some optional embodiments, to confirm the intensity of the laser light and ensure that polarized light of a specified intensity illuminates the sample, the optical detection device 4 may further include a beam splitter 45 and a corresponding laser power meter. The beam splitter 45 is positioned between the collimating lens 43 and the liquid crystal waveplate 44, and is used to split the laser light passing through the collimating lens 43 into a main laser and a secondary laser. The main laser is emitted along its original path to the liquid crystal waveplate 44, where it is converted into polarized light of a specified type. The secondary laser forms a non-zero angle with the main laser. The laser power meter is used to detect the intensity of the secondary laser. The laser light is split according to a specified ratio by the beam splitter 45, and the resulting laser light includes the main laser and the secondary laser. The main laser continues to be emitted along its original path to the liquid crystal waveplate 44, where it is converted into polarized light of a specified type. The intensity of the secondary laser is detected by the laser power meter, and then the intensity of the main laser is determined by the splitting ratio of the beam splitter 45. If the intensity of the main laser is found to be insufficient, the intensity of the generated laser can be changed by adjusting the laser emitter 42.

[0054] In some alternative embodiments, to maintain a vacuum state in the optical cavity, the optical detection device 4 may further include a vacuum extraction port 46, which is used to connect a vacuum pump to evacuate the optical chamber 41. When the optical detection device 4 and the sample chamber 1 are connected, the sample chamber 1 can be evacuated simultaneously when the optical chamber 41 is evacuated.

[0055] In some alternative embodiments, for ease of installation and adjustment, the collimating lens 43, liquid crystal waveplate 44, and beam splitter 45 can all be fixedly mounted within the optical chamber 41 via a rotating threaded mechanism 47. The rotating threaded mechanism 47 is at least used to adjust the distance between the collimating lens 43 and the laser emitter 42. The position of the collimating lens 43 may need adjustment. By fixing the collimating lens 43 within the optical chamber 41 via the rotating threaded mechanism 47 and adjusting the position of the threaded connection, the distance between the collimating lens 43 and the laser emitter 42 can be adjusted simultaneously. The laser generated inside the optical cavity primarily provides a polarized light environment for the sample. By adjusting the laser output power to provide different polarized light environments, the structure and performance of the sample under corresponding polarized light environments can be studied more thoroughly, facilitating the study of samples under specific polarized light and / or specific temperatures.

[0056] Please refer to Figure 6The sample stage 21 has two opposite sides with neutron incident windows 51 and neutron exit windows 52, respectively, for neutron incident and exit. The neutron incident windows 51 and neutron exit windows can be made of thin aluminum shells to form the window channels through which neutrons act on the sample, ensuring the uniformity of the shell. Alternatively, sapphire-sealed glass can also meet the neutron incident requirements. The neutron incident windows 51 and neutron exit windows 52 can be machined into through holes, sealed at the windows, and then the sapphire glass is installed. In this alternative solution, the sapphire glass windows are more conducive to observing the sample stage 21 and its internal structure, and facilitate future maintenance.

[0057] This application provides a neutron scattering sample environment device. Since the sample environment device integrates a temperature control device 3 to provide a specific ambient temperature for the sample and an optical detection device 4 to provide a polarized light environment for the sample, it uses neutron scattering technology to detect data of the sample under different temperatures and different polarized light environments, thereby enriching the sample detection scenarios and adapting to the experimental environment of multi-spectrometer lines.

[0058] Under the premise of achieving the above functions, the neutron scattering sample environment device in this application embodiment has a precise internal structure and a small overall size, making it adaptable to experimental environments on multiple spectrometer lines. This application embodiment will utilize a time-of-flight polarized neutron reflection spectrometer, capable of resolving the in-situ neutron scattering sample environment of photoexcited multi-field coupling under spin-induced heterojunction magnetization. This application embodiment can realize an in-situ coupled sample environment system under various complex environmental conditions such as spin optical fields (including temperature field, vacuum environment, atmosphere / pressure environment), and magnetic fields; and preferentially studies the heterojunction structure of perovskite and magnetic metal thin films; relying on polarized reflection theory to screen samples, and conduct methodological research on novel magnetic phenomena generated when the heterojunction magnetic interfaces of this type of photomagnetic thin film heterojunction material are coupled under spin-induced conditions. This provides new ideas and research methods for exploring the interaction between magnetic order and spin orbitals in such materials.

[0059] The above examples illustrate this application only to aid understanding and are not intended to limit its scope. Those skilled in the art to which this application pertains can make various simple deductions, modifications, or substitutions based on the ideas presented.

Claims

1. A spin-optical excitation multi-field coupled in-situ neutron scattering sample environment apparatus, characterized in that, The sample chamber, the sample adjusting platform, the temperature control device and the optical detection device are included. The sample chamber is used to provide a sub-vacuum environment. The sample adjusting platform is arranged in the sample chamber. The temperature control device is connected with the sample adjusting platform. The temperature control device includes a temperature control module and a heat dissipation module. The optical detection device includes an optical chamber, a laser emitter, a collimating lens and a liquid crystal wave plate.

2. A spin-optical excitation multi-field coupled in-situ neutron scattering sample environment apparatus as claimed in claim 1, wherein, The sample table has two opposite sides, each of which is provided with a neutron incident window and a neutron emission window for the incident and emission of neutrons, respectively.

3. A spin-optical excitation multi-field coupled in situ neutron scattering sample environment apparatus as in claim 2, wherein, The mounting mechanism includes a fixed base and an adjusting base.

4. A spin-optical excitation multi-field coupled in situ neutron scattering sample environment apparatus as in claim 3, wherein, The fixed base is fixedly arranged below the adjusting base.

5. A spin-optical excitation multi-field coupled in situ neutron scattering sample environment apparatus as in claim 4, wherein, The adjusting base is arranged above the fixed base and is fixedly connected with the sample table. The fixed base is provided with at least three supporting members.

6. A spin-optical excitation multi-field coupled in situ neutron scattering sample environment apparatus as in claim 2, wherein, The height of the adjustable supporting member protruding from the top of the fixed base can be adjusted to adjust the angle of the adjusting base supported thereby. The adjustable supporting member includes a threaded adjusting member. The supporting member also includes a spherical supporting member. The spherical supporting member is arranged at the edge region of the fixed base. The mounting mechanism also includes a plurality of elastic connecting members. The temperature control module includes a semiconductor temperature control module. The temperature control working surface of the semiconductor temperature control module is in contact with the sample table.

7. A spin-optical excitation multi-field coupled in situ neutron scattering sample environment apparatus as in claim 6, wherein, The heat dissipation module comprises a liquid cooling circulation pipe; a hollow chamber is formed in the adjusting base, and a pipeline of the liquid cooling circulation pipe is in sealed communication with the hollow chamber; and the semiconductor temperature control module is fixed in contact with a top surface of the adjusting base.

8. A spin-optical excitation multi-field coupled in situ neutron scattering sample environment apparatus according to any one of claims 1 to 7, wherein, The optical detection device further comprises a beam splitter and a corresponding laser power meter, the beam splitter is arranged between the collimating lens and the liquid crystal wave plate, and is used to divide the laser passing through the collimating lens into a main laser and a secondary laser, the main laser is emitted along the original path to the liquid crystal wave plate to form a specified type of polarized light, and the secondary laser forms a non-zero angle with the main laser; and the laser power meter is used to detect the light intensity of the secondary laser.

9. A spin-optical excitation multi-field coupled in situ neutron scattering sample environment apparatus as in claim 8, wherein, The collimating lens, the liquid crystal wave plate and the beam splitter are fixedly arranged in the optical cabin through a rotating screw mechanism, and the rotating screw mechanism is used to at least adjust the distance between the collimating lens and the laser emitter.

10. A spin-optical excitation multi-field coupled in situ neutron scattering sample environment apparatus according to any one of claims 1 to 7, wherein, The optical detection device further comprises a vacuum air exhaust hole, and the vacuum air exhaust hole is used to connect a vacuum pump to vacuumize the optical cabin.

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