A method and apparatus for measuring sensitivity of a streak camera system under a through-going radiation pulse, and a method for calculating maximum ADUs value

By building a measurement system within a streak camera system and calculating the sensitivity conversion coefficient using a dosimeter and an experimental radiation source, the problem of low sensitivity testing accuracy under penetrating radiation pulses was solved. This enabled efficient and accurate calculation of sensitivity and ADUs values, adapting to different radiation source conditions.

CN119045040BActive Publication Date: 2025-11-18NORTHWEST INST OF NUCLEAR TECH
View PDF 3 Cites 0 Cited by

Patent Information

Application Number
CN202411175770.X
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-08-26
Publication Date
2025-11-18
Estimated Expiration
2044-08-26

AI Technical Summary

Technical Problem

Existing streak camera systems suffer from low sensitivity testing accuracy, poor flexibility, and high workload under penetrating radiation pulses, and cannot efficiently adapt to changes in the energy spectrum and intensity of different radiation devices.

Method used

By setting up a measurement system, using dose plates and experimental radiation sources to calculate the sensitivity conversion coefficient, and combining dose monitoring values ​​and image acquisition, the sensitivity and maximum ADUs value of the stripe camera system under penetrating radiation pulses are calculated.

Benefits of technology

It enables efficient and accurate sensitivity measurement and ADUs value calculation under different radiation source conditions, reduces the workload of parameter adjustment, and improves experimental efficiency and the accuracy of sensitivity measurement.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN119045040B_ABST
    Figure CN119045040B_ABST
Patent Text Reader

Abstract

The application discloses a kind of stripe camera system sensitivity under the measurement method and device of through radiation pulse, the calculation method of maximum ADUs value, solve the problem that stripe camera system sensitivity test precision is low in prior art, flexibility is poor and workload is big, specifically includes: step 1, build measurement system;Step 2, calculate conversion coefficient;Step 3, acquisition experimental image and dose monitoring value;Step 4, calculate sensitivity;The conversion coefficient calculation method of the present application is established from experimental radiation source pulse radiation dose to actual radiation source energy fluence, realizes the ability of using the measurement result under experimental radiation source to calculate stripe camera system sensitivity under actual radiation source radiation, fills the vacancy that stripe camera system sensitivity cannot be accurately measured under the current through radiation pulse, in the case where actual radiation source does not have stripe camera system calibration condition, ensure that stripe camera system is efficiently implemented scientific research exploration experiment.
Need to check novelty before this filing date? Find Prior Art

Description

TECHNICAL FIELD

[0001] The present application relates to a method and device for measuring sensitivity, in particular to a method and device for measuring sensitivity of a streak camera system under through radiation pulse, and a method for calculating maximum ADUs (Analog-to-Digital Units; also called GrayScale; also called Counts) value. BACKGROUND

[0002] The streak camera system refers to a system composed of a scintillator 01, a mirror 02, an objective lens 03 and a streak camera 04. Figure 1 As shown in the figure, the objective lens 03 is used to image the scintillator 01 on the slit surface of the streak camera 04 through the mirror 02; the slit of the streak camera 04 is thin and long, and only the light in the slit area can enter the streak camera 04. When the streak camera system works, the radiation pulse is incident on the scintillator, the scintillator emits a scintillation light pulse, the scintillation light pulse is incident on the slit through the mirror and the objective lens to enter the streak camera; the streak camera converts the light incident on the slit into photoelectrons and accelerates them, and the photoelectrons are deflected to different spatial positions at different times due to the action of the pulse deflection voltage, i.e. the signal intensity at different times is represented by the signal intensity at different positions. The photoelectrons are converted into visible light by a fluorescent screen and recorded by a digital camera. Since the deflection speed of the electrons is very fast, the streak camera is regarded as a kind of instrument for high time resolution recording, and the fastest streak camera time resolution can reach 200 femtoseconds.

[0003] The streak camera system can measure the time behavior of the radiation pulse, and can also test the pulse response sensitivity, time resolution, spatial resolution and other characteristics of the scintillation material, and has the advantage of high intrinsic time resolution. Therefore, the streak camera system can not only complete the monitoring of the pulse radiation, but also study the scintillation characteristics of the material.

[0004] When the streak camera system performs the above work, it will switch between different pulse radiation devices. The particle energy in the radiation pulse is high, only a small part of the pulse energy is deposited in the scintillator, and most of the radiation energy passes through the scintillator, so it is called through radiation pulse. The intensity of the radiation pulse emitted by different pulse radiation devices is obviously different, and the energy fluence rate difference is more than 1 order of magnitude; the pulse energy spectrum is different, for example, the X / γ radiation photon energy emitted by different devices can be more than 2 times different; the pulse duration also has a large difference, and the pulse time spectrum full width at half maximum can range from 20ns to 300ns; the cost of generating a radiation is high, about 10,000 yuan per emission.

[0005] Due to the above characteristics, when the streak camera system is tested on the pulse radiation device, the sensitivity of the streak camera needs to be adjusted according to the energy spectrum and intensity of different devices to obtain a signal with a suitable signal-to-noise ratio and save the test shots. Therefore, a method for measuring the sensitivity of the streak camera system under the action of the pulse radiation and calculating the output is needed, and the method should be able to calculate the output of the streak camera system according to the change of the energy spectrum and intensity of the radiation pulse and the change of the streak camera setting.

[0006] The Chinese utility model patent with the publication number CN 209784551 U discloses a high-time-space-resolution soft X-ray radiation flow quantitative measurement system, which uses an X-ray diode for comparative measurement to realize quantitative measurement of a soft X-ray streak camera.

[0007] There are also reports on methods for calibrating the sensitivity of a soft X-ray streak camera using direct current. For example, in the document "Absolute Calibration of Static Energy Response of Soft X-ray Streak Camera", Yi Rongqing et al., High Energy Physics and Nuclear Physics, Vol. 27, No. 5, May 2003, 452-454, a direct current soft X-ray beam is used to irradiate the photocathode of the streak camera, the response of the streak camera is measured, the current output by the standard detector is used to obtain the intensity of the soft X-ray, and thus the static energy response of the soft X-ray streak camera is obtained. Similar documents include "Spectral Response Sensitivity Calibration of Transmission Au and CsI Cathode for Soft X-ray Streak Camera", Zeng Peng et al., Acta Physica Sinica, Vol. 61, No. 15, 2012, 155209(7). In the document "Absolute Sensitivity Measurement of Visible Light Streak Camera", Peng Bodong et al., Acta Optica Sinica, Vol. 35, No. 8, August 2015, 0812004(8), a method for measuring the pulse sensitivity of a streak camera when visible light is incident is proposed.

[0008] However, the above methods are not for penetrating radiation pulses, and there is no report on the sensitivity measurement method of the streak camera system and the calculation method of the maximum ADUs value, resulting in low test precision of the sensitivity of the pulse streak camera system, more test shots of the streak camera system when switching between experimental devices, and low efficiency. Some methods, such as the static sensitivity and dynamic sensitivity comparison method, cannot change the system parameters after the test is completed, and need to be tested again if the parameters are changed, which is time-consuming. SUMMARY

[0009] The present application aims to provide a method for measuring the sensitivity of a streak camera system under penetrating radiation pulses and a device therefor, and a calculation method for the maximum ADUs value, to solve the problems of low test precision, poor flexibility and large workload of the sensitivity of the streak camera system in the prior art, so that the streak camera system can play a more efficient role in the research and exploration of scientific research such as the characteristics of scintillating materials and the characteristics of pulse radiation sources.

[0010] In order to achieve the above object, the present application adopts the following technical solutions:

[0011] The method for measuring the sensitivity of a streak camera system under a penetrating radiation pulse, wherein the method comprises the following steps:

[0012] Step 1, setting up a measurement system;

[0013] Under experimental conditions, a to-be-measured streak camera system is arranged at an exit end of an experimental radiation source, and a dosimeter is arranged on an incident end surface of the to-be-measured streak camera system; the thickness of a scintillator in the to-be-measured streak camera system is l1; the dosimeter is used for measuring a dose monitoring value of a dose standard reference material;

[0014] Step 2, calculating a conversion coefficient;

[0015] The conversion coefficient k of the sensitivity of the to-be-measured streak camera system under the radiation of the experimental radiation source and an actual radiation source is calculated:

[0016]

[0017] Wherein, u = 10 -5 J / rad·g is a unit conversion coefficient; p st is the density of the dose standard reference material with the thickness of l1; c1 is the energy deposited by an average particle in the scintillator with the thickness of l1 in the pulse of the experimental radiation source; c0 is the energy deposited by an average particle in the dose standard reference material with the thickness of l1 in the pulse of the experimental radiation source;

[0018] c1' is the energy deposited by an average particle in the scintillator under the actual radiation source; is the average energy of particles in the output pulse of the actual radiation source;

[0019] Step 3, collecting an experimental image and a dose monitoring value;

[0020] The experimental radiation source and the to-be-measured streak camera system are started, and an experimental image output by the to-be-measured streak camera system under the radiation of the experimental radiation source is collected; and a dose monitoring value D collected by the dosimeter is obtained;

[0021] Step 4, calculating the sensitivity;

[0022] The sensitivity S of the to-be-measured streak camera system under the radiation of the actual radiation source is calculated:

[0023]

[0024] Wherein, A is the area of a local or whole working area on the scintillator; N is the total number of pixels in a signal area in the experimental image, the signal area corresponding to the local or whole working area; s iis the net signal value of the i-th pixel in the signal region in the experimental image.

[0025] Further, in step 2, the energy c1 deposited by an average particle in a pulse of the experimental radiation source in the scintillator with thickness l1 is calculated by the following formula:

[0026]

[0027] wherein E γmax is the maximum energy of the pulse particle of the experimental radiation source; f(E) is the normalized pulse spectrum of the experimental radiation source; η Scin (E) is the absorption spectrum of the scintillator in the stripe camera system to be measured.

[0028] Further, in step 2, the energy c0 deposited by an average particle in a pulse of the experimental radiation source in the dosimetric reference material with thickness l1 is calculated by the following formula:

[0029]

[0030] wherein η st (E) is the absorption spectrum of the dosimetric reference material.

[0031] Further, in step 2, the energy c'1 deposited by an average particle in a pulse of the experimental radiation source in the scintillator with thickness l1 is calculated by the following formula:

[0032]

[0033] wherein E' γmax is the maximum energy of the pulse particle of the experimental radiation source; f'(E) is the normalized pulse spectrum of the pulse particle of the experimental radiation source.

[0034] Further, in step 2, the average energy of the particles in a pulse output by the experimental radiation source is calculated by the following formula:

[0035]

[0036] Further, in step 1:

[0037] The dosimetric reference material is a silicon material or air.

[0038] Further, in step 1:

[0039] The particle is an X / γ-ray photon or an electron.

[0040] A method for calculating the maximum ADUs value of a stripe camera system under a penetrating radiation pulse, which is characterized by comprising the following steps:

[0041] Step 1, based on the above method for measuring the sensitivity of the streak camera system under a through radiation pulse, obtain the sensitivity S of the streak camera system under a through radiation pulse;

[0042] Step 2, obtain the energy fluence rate F of the actual radiation source b

[0043] Step 3, calculate the maximum ADUs value C' of the actual image output by the streak camera system under the radiation of the actual radiation source:

[0044] C'=F b '·s pixel ·S·Δt

[0045] Wherein, s pixel is the area of each pixel in the actual image corresponding to the scintillator of the streak camera system to be tested, and Δt is the exposure time of a single pixel in the actual image of the streak camera system to be tested.

[0046] A method for calculating the maximum ADUs value of a streak camera system under a through radiation pulse, characterized in that:

[0047] Step 1, based on the above method for measuring the sensitivity of the streak camera system under a through radiation pulse, obtain the sensitivity S of the streak camera system under a through radiation pulse;

[0048] Step 2, set the dosimeter at the exit end of the actual radiation source, and obtain the dose monitoring value D' collected by the dosimeter;

[0049] Calculate the energy fluence rate F of the actual radiation source b

[0050]

[0051] Wherein, t' is the time half-width of the output pulse of the actual radiation source; E' γmax is the maximum energy of the pulse particles of the actual radiation source, f'(E) is the normalized pulse energy spectrum of the actual radiation source, η st (E) is the absorption spectrum of the dose standard reference material;

[0052] Step 3, calculate the maximum ADUs value C' of the actual image output by the streak camera system under the radiation of the actual radiation source:

[0053] C'=F b '·s pixel ·S·Δt

[0054] s pixel ​​is the area of each pixel in the actual image corresponding to the scintillator of the to-be-tested streak camera system, and Δt is the exposure time of a single pixel in the actual image of the to-be-tested streak camera system.

[0055] A device for measuring the sensitivity of a streak camera system under a penetrating radiation pulse, for implementing the above-mentioned method for measuring the sensitivity of a streak camera system under a penetrating radiation pulse, and is characterized in that: comprising an experimental radiation source and a dosimeter for measuring the dose monitoring value of a dose standard reference material;

[0056] The experimental radiation source is used to emit a penetrating radiation pulse to the to-be-tested streak camera system.

[0057] The dosimeter is arranged on the incident end surface of the to-be-tested streak camera system.

[0058] The present application has the following beneficial effects:

[0059] 1、The present application establishes a calculation method for the conversion coefficient from the pulse radiation dose of the experimental radiation source to the energy fluence of the actual radiation source, realizes the ability to calculate the sensitivity of the streak camera system under the radiation of the actual radiation source using the measurement results under the experimental radiation source, fills the gap that the sensitivity of the streak camera system under the penetrating radiation pulse cannot be accurately measured at present, and guarantees the efficient implementation of scientific research and exploration experiments of the streak camera system under the following conditions: the actual radiation source does not have the calibration conditions of the streak camera system, or the actual radiation source has a long repetition period, the experiment is difficult to implement, the machine time is tight, and the experimental cost is high.

[0060] 2、The present application calculates the ratio of the total signal output of the streak camera system to the total incident energy in the working area of the scintillator as the sensitivity of the streak camera system, which is independent of the radiation energy spectrum, the pulse duration and the streak camera exposure time. Therefore, in the case that there is a large difference between the experimental radiation source and the actual radiation source or the streak camera exposure time is changed, the maximum ADUs value of the streak camera system under the actual radiation source can be accurately calculated. Secondly, the physical quantities involved in the calculation, such as the dose monitoring value, the sum of the net ADUs value of the output image, the average energy of the pulse particles and the absorption spectrum, are all integral quantities, and the sensitivity measurement does not require a quantitative pulse radiation detector, thereby reducing the measurement difficulty, removing the spatial difference caused by the use of a quantitative pulse detector, and guaranteeing the accuracy of the ADUs value.

[0061] 3. The stripe camera system provided by the application, the method for calculating the maximum ADUs value under the penetrating radiation pulse, after adjusting the stripe camera scanning range and the slit width, the sensitivity does not need to be measured again under the new setting, only the new exposure time is obtained by using the relationship between the scanning range and the exposure time and the relationship between the slit width and the exposure time, so that the maximum ADUs value of the stripe camera system under the new setting can be obtained conveniently, the adjustment range of the stripe camera system is larger, and the workload caused by the parameter adjustment of the stripe camera system is greatly reduced. BRIEF DESCRIPTION OF DRAWINGS

[0062] Figure 1 is a structural schematic diagram of a stripe camera system;

[0063] In the figure, 01 is a scintillator, 02 is a mirror, 03 is an objective lens, and 04 is a stripe camera.

[0064] Figure 2 is a structural schematic diagram of an embodiment of a measuring device for the sensitivity of a stripe camera system under a penetrating radiation pulse of the stripe camera system according to the application;

[0065] Figure 3 is an experimental image (a) of a stripe camera system under a penetrating radiation pulse emitted by an experimental radiation source in an embodiment of the application and a signal curve diagram (b) thereof;

[0066] Figure 4 is a pulse energy spectrum distribution diagram of an experimental radiation source in an embodiment of the application;

[0067] Figure 5 is an absorption spectrum of a scintillator in a stripe camera system to be measured in an embodiment of the application;

[0068] Figure 6 is an absorption spectrum of a silicon material in an embodiment of the application;

[0069] Figure 7 is a pulse energy spectrum distribution diagram of an actual radiation source in an embodiment of the application;

[0070] Figure 8 is a curve diagram of the dose monitoring value of an actual radiation source varying with the distance between a dosimeter and the exit end face of the actual radiation source in an embodiment of the application;

[0071] Figure 9 is an experimental image (c) of a stripe camera system under a penetrating radiation pulse emitted by an actual radiation source in an embodiment of the application and a signal curve diagram (d) thereof.

[0072] REFERENCE NUMERALS:

[0073] 1 is a scintillator, 2 is a mirror, 3 is an objective lens, 4 is a stripe camera, 5 is a dosimeter, and 6 is an experimental radiation source. DETAILED DESCRIPTION

[0074] The technical solution of the present invention will be clearly and completely described below with reference to the accompanying drawings and embodiments. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0075] This embodiment provides a device for measuring the sensitivity of a streak camera system under a penetrating radiation pulse, such as... Figure 2 As shown, the measuring device includes an experimental radiation source 6 and a dosimeter 5 for measuring the dose monitoring value of the dose standard reference material; the experimental radiation source 6 is used to emit penetrating radiation pulses to the stripe camera system under test; the dosimeter 5 is placed on the incident end face of the stripe camera system under test.

[0076] The method for measuring the sensitivity of the stripe camera system under test using the above-mentioned measuring device specifically includes the following steps:

[0077] Step 1: Set up the measurement system;

[0078] Under experimental conditions, the stripe camera system under test was placed at the emission end of the experimental radiation source, and a dosimeter was placed on the incident surface of the stripe camera system. The thickness of the scintillator in the stripe camera system was l1. The dosimeter was used for measuring the metrological values ​​of the dose standard reference material. Specifically, in this embodiment, the experimental radiation source emitted an X-ray pulse, and the particles in the pulse were X / γ-ray photons; in other embodiments, they could also be electrons. The stripe camera system under test consisted of a scintillator 1, a reflector 2, an objective lens 3, and a stripe camera 4. A dosimeter 5 was placed on the incident surface of the scintillator 1. The scintillator 1 was a BC408 plastic scintillator with a C nucleus to H nucleus ratio of 1:1.104 and a density of 1.032 g / cm³. 3 Thickness l1 = 1 cm, absorption spectrum as follows Figure 5 As shown. The reflector 2 is made of aluminized glass, with a reflectivity of over 95% in the scintillation spectrum of BC408. The objective lens 3 has an effective object plane diameter of 12 cm, an effective image plane diameter of 2.5 cm, and an image-side magnification of 0.21. The slit width of the streak camera 4 is 0.02 cm, and the slit length is 2.5 cm. Based on the aforementioned objective-side magnification of 0.21, the calculated slit width in the scintillator region is 0.095 cm, and the length is 12 cm. The area of ​​this region, i.e., the scintillator working area A = 1.14 cm². 2 .

[0079] In the image output by the stripe camera system used in this embodiment, the slit length direction occupies 1200 pixels. Therefore, one pixel corresponds to a length of 0.01 cm on the scintillator, and one pixel corresponds to an area s. pixel= 0.0001 cm 2 The scanning range of the stripe camera is divided into two ranges of 500 ns and 2200 ns, and the stripe camera system outputs 1000 pixels in the scanning direction on the image, and the half width of the slit is 5 pixels, which corresponds to an exposure time of 500 / 1000*5=2.5 ns for the 500 ns range and an exposure time of 2200 / 1000*5=11 ns for the 2200 ns range.

[0080] Step 2, calculate the conversion coefficient;

[0081] The actual radiation source emits X-ray pulses, and the particles in the pulses are X-ray photons; the sensitivity conversion coefficient k of the stripe camera system to be measured under the radiation of the experimental radiation source and the actual radiation source is calculated:

[0082]

[0083] wherein the unit conversion coefficient u=10 -5 J / rad·g, the dose standard reference material is silicon material, and the density p st =2.33 g / cm 3 , and the thickness of the scintillator l1=1 cm.

[0084] The energy c1 deposited by an average particle in the pulse of the experimental radiation source in the scintillator with a thickness of l1 is calculated by the following formula:

[0085]

[0086] The energy c0 deposited by an average particle in the pulse of the experimental radiation source in the dose standard reference material with a thickness of l1 is calculated by the following formula:

[0087]

[0088] The energy c'1 deposited by an average particle in the pulse of the experimental radiation source in the scintillator with a thickness of l1 is calculated by the following formula:

[0089]

[0090] The average energy of the particles in the pulse output by the actual radiation source is calculated by the following formula:

[0091]

[0092] wherein the unit conversion coefficient u=10 -5 J / rad·g, the dose standard reference material can be selected as silicon material or air, and in this embodiment, the dose standard reference material is silicon material, and the density p st =2.33 g / cm 3 , the thickness of the scintillator l1=1 cm, and the maximum particle energy Eγmax =1.5MeV, the pulse energy spectrum of the experimental radiation source is as follows Figure 4 As shown, the absorption spectrum of the scintillator is as follows: Figure 5 As shown, the absorption spectrum of a 1 cm thick silicon material (dose standard reference material) is as follows: Figure 6 As shown, the pulse energy spectrum of the actual radiation source is as follows: Figure 7 As shown. Substituting the parameters into the conversion coefficient calculation formula, the conversion coefficient k is calculated to be 2.6057e+09MeV / cm. 2 / rad.

[0093] Step 3: Acquire experimental images and dose monitoring values;

[0094] Start the experimental radiation source 6 and the stripe camera system under test, and acquire experimental images output by the stripe camera system under the radiation of the experimental radiation source 6. The experimental images are as follows: Figure 3 As shown in (a), the signal curve is as follows Figure 3 As shown in (b); and the dose monitoring value D = 1 rad collected by the dose strip was obtained.

[0095] Step 4: Calculate sensitivity;

[0096] Calculate the sensitivity S of the stripe camera system under test in the presence of an actual radiation source:

[0097]

[0098] In this experiment, the total number of pixels in the signal region is N = 1.2 × 10⁻⁶. 5 D = 1 rad, A = 24 mm 2 The calculated sensitivity of the stripe camera system under the actual radiation source is S = 0.018 ADUs / MeV.

[0099] The maximum ADUs of the streak camera system are calculated based on the above method for measuring the sensitivity of the streak camera system under through-pulse radiation:

[0100] At a real radiation source, the dose monitoring value varies with the distance between the dosimeter and the exit face of the actual radiation source as follows: Figure 8 As shown, the streak camera system is planned to be positioned 3.0 meters from the actual radiation source's emitting end face during the experiment, with a dose monitoring value D' = 1.5 rad. According to the formula:

[0101]

[0102] Calculate the maximum energy fluence F at this location on the actual radiation source. b ', c'0 = 0.010 MeV, t' = 30 ns, F is calculated. b= 1.3e+08MeV / cm 2 / ns; E γ ' max f'(E) represents the maximum energy of the pulsed particles from the actual radiation source, and f'(E) represents the normalized pulsed energy spectrum of the actual radiation source.

[0103] Another method is to directly obtain the energy fluence F of the actual radiation source. b '.

[0104] During the experiment, the area s on the scintillator corresponding to each pixel was... pixel It is 0.01mm 2 The stripe camera has a scan distance of 2200 ns and an exposure time Δt of 11 ns.

[0105] Calculate the maximum ADUs value C' of the actual image output by the stripe camera system under actual radiation from the actual radiation source, and substitute the above value into C' = F'. b ·s pixel ·S·Δt, yielding C'=1232ADUs. The output image of the streak camera system under actual radiation source conditions is as follows: Figure 9 As shown in (c), the signal is as follows Figure 9 As shown in (d), the maximum value is 1200 ADUs, and the calculation method accurately predicted the actual output value.

[0106] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any changes or substitutions within the technical scope disclosed in the present invention should be covered within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A method for measuring the sensitivity of a streak camera system under a penetrating radiation pulse, characterized in that, Includes the following steps: Step 1: Set up the measurement system; Under experimental conditions, the stripe camera system under test is set at the emission end of the experimental radiation source, and a dose sheet is set on the incident end surface of the stripe camera system under test; the thickness of the scintillator in the stripe camera system under test is l1; the dose sheet is used to measure the dose monitoring value of the dose standard reference material. Step 2: Calculate the conversion factor; Calculate the sensitivity conversion coefficient k of the streak camera system under test under experimental and actual radiation source conditions: Where u = 10 -5 J / rad·g is the unit conversion factor; ρ st c1 is the density of the dose standard reference material with a thickness of l1; c1 is the energy deposited by an average particle in the experimental radiation source pulse in the scintillator with a thickness of l1; c0 is the energy deposited by an average particle in the dose standard reference material with a thickness of l1 in the experimental radiation source pulse; c1' is the energy deposited by the scintillator by an average particle under actual radiation source conditions. It is the average energy of particles in the output pulse of the actual radiation source; Step 3: Acquire experimental images and dose monitoring values; The experimental radiation source and the stripe camera system under test are activated, and experimental images output by the stripe camera system under test are acquired under the radiation of the experimental radiation source; and the dose monitoring value D collected by the dose plate is obtained. Step 4: Calculate sensitivity; Calculate the sensitivity S of the stripe camera system under actual radiation source: Where A is the area of ​​the local or total working region on the scintillator; N is the total number of pixels in the signal region of the experimental image, and the signal region corresponds to the local or total working region; s i It is the net signal value of the i-th pixel in the signal region of the experimental image.

2. The method for measuring the sensitivity of the streak camera system under a penetrating radiation pulse according to claim 1, characterized in that, In step 2, the energy c1 deposited by an average particle in the experimental radiation source pulse in a scintillator with a thickness of l1 is calculated using the following formula: Among them, E γmax f(E) represents the maximum energy of the pulsed particles from the experimental radiation source; f(E) represents the normalized pulsed energy spectrum of the experimental radiation source; η Scin (E) is the absorption spectrum of the scintillator in the streak camera system under test.

3. The method for measuring the sensitivity of the streak camera system under a penetrating radiation pulse according to claim 1, characterized in that, In step 2, the energy c0 deposited by an average particle in the experimental radiation source pulse in a dose standard reference material with a thickness of l1 is calculated using the following formula: Where, η st (E) is the absorption spectrum of the dose standard reference material.

4. The method for measuring the sensitivity of the streak camera system under different penetrating radiation pulses according to claim 1, characterized in that, In step 2, the average energy c1' deposited per particle by the scintillator under actual radiation source is calculated using the following formula: Among them, E γ ' max f'(E) represents the maximum energy of the pulsed particle from the actual radiation source; f'(E) represents the normalized pulse energy spectrum of the pulsed particle from the actual radiation source.

5. The method for measuring the sensitivity of the streak camera system under a penetrating radiation pulse according to claim 1, characterized in that, In step 2, the average particle energy of the output pulse from the actual radiation source is... Calculated using the following formula:

6. The method for measuring the sensitivity of a streak camera system under a penetrating radiation pulse according to any one of claims 1-5, characterized in that, In step 1: The particles are X / γ-ray photons or electrons.

7. The method for measuring the sensitivity of the streak camera system under a penetrating radiation pulse according to claim 6, characterized in that, In step 1: The dosage standard reference material is silicon or air.

8. A method for calculating the maximum ADUs value of a streak camera system under a penetrating radiation pulse, characterized in that, Includes the following steps: Step 1: Based on the method for measuring the sensitivity of the streak camera system under a penetrating radiation pulse according to any one of claims 1-7, obtain the sensitivity S of the streak camera system under a penetrating radiation pulse; Step 2: Obtain the energy fluence F of the actual radiation source. b '; Step 3: Calculate the maximum ADUs value C' of the actual image output by the stripe camera system under actual radiation source: C'=F b '·s pixel ·S·Δt s pixel Δt is the area of ​​each pixel of the stripe camera system under test on the scintillator in the actual image, and Δt is the exposure time of a single pixel of the stripe camera system under test in the actual image.

9. A method for calculating the maximum ADUs value of a streak camera system under a penetrating radiation pulse, characterized in that: Step 1: Based on the method for measuring the sensitivity of the streak camera system under a penetrating radiation pulse according to any one of claims 1-7, obtain the sensitivity S of the streak camera system under a penetrating radiation pulse; Step 2: Place the dosimeter at the emitting end of the actual radiation source and obtain the dose monitoring value D' collected by the dosimeter; Calculate the energy fluence rate F of an actual radiation source b ': Where t' is the half-width of the actual radiation source output pulse; ' E γmax Let f'(E) be the maximum energy of the pulsed particles from the actual radiation source, f'(E) be the normalized pulse energy spectrum of the actual radiation source, and η be the maximum energy of the pulsed particles from the actual radiation source. st (E) is the absorption spectrum of the dose standard reference material; Step 3: Calculate the maximum ADUs value C' of the actual image output by the stripe camera system under actual radiation source: C'=F b '·s pixel ·S·Δt Among them, s pixel Δt is the area of ​​each pixel of the stripe camera system under test on the scintillator in the actual image, and Δt is the exposure time of a single pixel of the stripe camera system under test in the actual image.

10. A measuring device for the sensitivity of a streak camera system under a penetrating radiation pulse, used to implement the method for measuring the sensitivity of the streak camera system under a penetrating radiation pulse as described in any one of claims 1-7, characterized in that: This includes experimental radiation sources and dosimeters used for measuring dose monitoring values ​​of dose standard reference materials; The experimental radiation source is used to emit penetrating radiation pulses to the stripe camera system under test. The dose strip is placed on the incident end face of the stripe camera system under test.

Citation Information

Patent Citations

  • High-temporal-spatial-resolution soft X-ray radiation flow quantitative measurement system

    CN209784551U

  • Device and method for measuring neutron dose equivalent

    CN104898157A

  • Proton sensitivity calibration device and method for optical imaging energy spectrum measurement system

    CN114509802A