A base station testing system

Abstract

The present invention provides a base station test system, including a darkroom, wherein a detection device, a test bench, a first flip mechanism and a second flip mechanism are arranged in the darkroom, wherein the first flip mechanism and the second flip mechanism are arranged on two opposite side walls of the darkroom, wherein the detection device is fixedly arranged on the flipping surface of the first flip mechanism, and the test bench is fixedly arranged on the flipping surface of the second flip mechanism, wherein the first flip mechanism and the second flip mechanism respectively drive the detection device and the test bench to flip in two dimensions, front and back and left and right, in a plane; and the test bench is provided with a fixing device for fixing the base station to be tested and an anti-dropping device for preventing the cables of the base station to be tested from loosening and falling off. The present invention can achieve the effect of completely detecting the base station to be tested without increasing the number of probe antennas of the detection device, thereby avoiding the interference of the signal in the darkroom due to the excessive number of probe antennas, thereby reducing the detection accuracy, and at the same time reducing the energy consumption during the detection process.

Description

Technical Field

[0001] The invention belongs to the technical field of base station testing, and in particular relates to a base station testing system. Background Art

[0002] At present, 5G has entered the official commercial stage, and operators around the world are purchasing base station equipment on a large scale for the construction of 5G networks. For 5G base station antennas, the antennas are integrated with the RRU (Radio Remote Unit). On the one hand, interference factors such as electromagnetic coupling and active standing waves cannot be completely eliminated; on the other hand, the calibration and amplitude-phase weighting of active antennas are completed through a series of active devices on each RF channel, which is very different from the way passive antenna arrays perform amplitude-phase weighting through passive power division networks. Therefore, for 5G base stations that use large-scale MIMO (multiple-input, multiple-output) active antenna technology, integrated air interface testing methods can effectively reflect their performance indicators.

[0003] The existing integrated air interface test system includes a darkroom, and a detection device is arranged on the top wall of the darkroom. The detection device includes multiple probe antennas arranged in an array. The probe antennas in the array form a quiet zone covering the area where the base station to be tested is located in the space of the darkroom. The base station to be tested is scanned through the coverage of the quiet zone, and the RF parameters of each channel of the base station to be tested are collected.

[0004] However, in order to achieve the formation of an area in the darkroom space that is sufficient to cover the entire base station to be tested, a sufficient number of array antennas is required, which will lead to a large increase in the number of antennas. On the one hand, although the probe antenna is used to detect the base station to be tested, the probe antenna itself will also produce a small interference to the signal emitted by the base station to be tested. As the number of probe antennas increases, the signal interference capability generated by several probe antennas becomes stronger, which will directly affect the test accuracy and results of the base station to be tested; on the other hand, the large increase in the number of probe antennas also increases the energy consumption during detection, resulting in excessive use of energy. In addition, the increase in probe antennas will also increase the direct cost of air interface testing, and this problem needs to be solved urgently. Therefore, the present invention provides a base station test system to solve the above problems. Summary of the invention

[0005] The purpose of the present invention is to provide a base station testing system in view of the deficiencies in the prior art.

[0006] The present invention adopts the following technical solutions:

[0007] The present invention provides a base station test system, comprising a darkroom; a detection device, a test bench, a first flipping mechanism and a second flipping mechanism are arranged in the darkroom; the first flipping mechanism is arranged on the first inner wall of the darkroom, and the second flipping mechanism is arranged on the second inner wall of the darkroom, and the first inner wall and the second inner wall are opposite to each other; the detection device is fixedly arranged on the flipping surface of the first flipping mechanism, and the first flipping mechanism can drive the detection device to flip; the test bench is used to place a base station to be tested, and is fixedly arranged on the flipping surface of the second flipping mechanism, and the second flipping mechanism can drive the test bench to flip.

[0008] Furthermore, the detection device comprises a substrate, and an antenna array consisting of a plurality of probe antennas is arranged on a side of the substrate facing the test bench.

[0009] Further, the test bench is provided with a fixing device for fixing the base station to be tested; the fixing device includes at least one group of first clamping grooves and at least one group of second clamping grooves, the first clamping grooves and the second clamping grooves are both opened on a side of the test bench facing the detection device, and the first clamping grooves and the second clamping grooves are perpendicular to each other; a first driving rod is rotatably installed inside the first clamping groove, an external thread is provided on the first driving rod, and the threaded directions of the threaded sections of the left and right parts of the first driving rod are opposite, two first clamping plates are installed on the first driving rod, the two first clamping plates are both provided with threaded holes, and are respectively rotatably connected to the two threaded sections on the first driving rod in opposite directions; a second driving rod is rotatably installed inside the second clamping groove, and the second driving rod is distributed above or below the first driving rod; an external thread is provided on the second driving rod, and the threaded directions of the threaded sections of the left and right parts of the second driving rod are opposite, the second driving rod is provided with two second clamping plates, the two second clamping plates are both provided with threaded holes, and are respectively rotatably connected to the two threaded sections on the second driving rod in opposite directions.

[0010] Furthermore, one end of the first clamping plate away from the first driving rod exceeds the mounting surface of the test bench; and one end of the second clamping plate away from the second driving rod exceeds the mounting surface of the test bench.

[0011] Furthermore, the first clamping groove and the second clamping groove are respectively provided with sliding rails, and the first clamping plate and the second clamping plate are respectively provided with sliders adapted to the sliding rails; the first clamping groove is slidably installed in the first clamping groove through the sliding rails and the sliders, and the second clamping groove is slidably installed in the second clamping groove through the sliding rails and the sliders.

[0012] Furthermore, the ends of the first driving rod and the second driving rod are respectively provided with screwing driving assemblies; the screwing driving assembly includes a mounting plate, a holding ring and a holding handle; the mounting plate is fixedly arranged at one end of the first clamping groove / the second clamping groove, and is fixedly connected to the side wall of the test bench; the holding ring is rotatably connected to the outer surface of the mounting plate; the holding handle passes through the mounting plate, one end of which is fixedly connected to the first driving rod / the second driving rod, and the other end is fixedly connected to the holding ring.

[0013] Furthermore, the test bench is provided with an anti-dropping device for preventing the cable of the base station to be tested from falling off; the anti-dropping device includes a pressing plate, a pressing plate mounting seat, a buckle plate and a buckle plate mounting seat; the pressing plate mounting seat and the buckle plate mounting seat are both fixed on the test bench; one end of the pressing plate is movably connected to the pressing plate mounting seat, one end of the buckle plate is movably connected to the buckle plate mounting seat, and a buckle groove adapted to the pressing plate is provided on the side of the buckle plate facing the test bench, and the buckle plate fixes the free end of the pressing plate through the buckle groove; a through groove for the cable to pass through is formed between the pressing plate, the buckle plate and the test bench.

[0014] Furthermore, the end of the pressing plate is rotatably connected to the pressing plate mounting seat, and the pressing plate can rotate horizontally relative to the pressing plate mounting seat; the end of the buckle plate is rotatably connected to the buckle plate mounting seat, and the buckle plate can be flipped up and down relative to the buckle plate mounting seat; and a plurality of anti-slip protrusions are provided on the surface of the pressing plate facing the test bench.

[0015] Furthermore, the first flipping mechanism includes a first flipping device and a second flipping device; the first flipping device is fixedly arranged on the first inner wall, the second flipping device is fixedly arranged on the flipping surface of the first flipping device, and the detection device is fixedly arranged on the flipping surface of the second flipping device; the flipping direction driven by the first flipping device and the flipping direction driven by the second flipping device are perpendicular to each other; the detection device flips forward and backward or left and right under the drive of the first flipping device and the second flipping device.

[0016] Furthermore, the second flipping mechanism includes a third flipping device and a fourth flipping device; the third flipping device is fixedly arranged on the second inner wall, the fourth flipping device is fixedly arranged on the flipping surface of the third flipping device, and the test bench is fixedly arranged on the flipping surface of the fourth flipping device; the flipping direction driven by the third flipping device and the flipping direction driven by the fourth flipping device are perpendicular to each other; the test bench flips forward and backward or left and right under the drive of the third flipping device and the fourth flipping device.

[0017] Beneficial effects of the present invention:

[0018] (1) Since the quiet zone generated by the detection device detects the antenna array of the base station to be tested one subarray at a time during the detection process, the detection device only needs to generate a small quiet zone that is sufficient to cover the area of ​​a single subarray of the base station to be tested. The present invention allows the quiet zone generated by the detection device to move in the darkroom by setting a first flip mechanism; by setting a second flip mechanism, the operator can adjust the facing position of the detection device and the test bench according to the specific use status, so as to achieve the effect of making the quiet zone generated by the detection device translate and scan on the test bench, and detect each subarray of the base station to be tested one by one through the movement of the quiet zone. The present invention uses the characteristics of mechanical movement and the base station detection process, and exchanges time for space to achieve complete detection of the base station to be tested without increasing the number of probe antennas of the detection device. This design will not reduce the detection accuracy due to the serious interference of the signal in the darkroom due to the excessive number of probe antennas, but can also reduce the energy consumption during the detection process, and at the same time, it can also fully detect the relevant parameters of the entire base station to be tested.

[0019] (2) The present invention provides a first flipping device and a second flipping device between the first inner wall and the detection device, fixes the second flipping device on the flipping surface of the first flipping device, and then fixes the substrate with the array antenna on the flipping surface of the second flipping device. The first flipping device and the second flipping device can drive the substrate to flip in two dimensions, front and back and left and right, in a plane.

[0020] (3) The present invention arranges a third flipping device and a fourth flipping device between the second inner wall and the test bench, fixes the fourth flipping device on the flipping surface of the third flipping device, and then fixes the test bench on which the base station to be tested is placed on the flipping surface of the fourth flipping device. The third flipping device and the fourth flipping device can drive the test bench to flip in two dimensions, front and back and left and right, in a plane.

[0021] (4) Since the test bench needs to be flipped during the test process, the base station to be tested placed on the test bench needs to be fixed before the test bench is flipped. In the present invention, a driving rod is rotatably inserted into the first clamping groove and the second clamping groove, and a clamping plate is threadedly sleeved on the driving rod. After the operator places the base station to be tested on the test bench, the driving rod is rotated to drive the clamping plate to move toward the base station to be tested until the clamping plate on each driving rod contacts the side wall of the base station to be tested. In this way, even if the base station to be tested flips in two dimensions on the test bench, the base station to be tested will be restricted by the surrounding clamping plates and will not move on the test bench surface, thereby being able to better cooperate with the movement and alignment of the detection device and the test bench.

[0022] (5) The present invention provides a plurality of clamping grooves, each of which is equipped with a driving rod and a clamping plate, so as to increase the area of ​​the contact between the side wall of the base station to be tested and the clamping plate, that is, to increase the clamping area, thereby improving the placement stability of the base station to be tested on the test bench.

[0023] (6) The present invention can increase the holding points of the driving rod by providing a holding ring and a holding handle, thereby making it easier for the operator to rotate the driving rod.

[0024] (7) Since the base station to be tested needs to be connected to the power supply line to work properly, the flipping of the test bench can easily cause the power supply line to loosen at the connection point of the base station, thereby forcing the entire test to be terminated. Therefore, the present invention sets an anti-slip device on the test bench. When the power supply line passes the edge of the test bench, the pressing plate is rotated to press the power supply line on the test bench. At this time, the power supply line on the test bench is in a relatively static state following the flipping of the test bench, which can effectively prevent the power supply line and the base station to be tested from loosening. Even if the power supply line outside the test platform is disturbed, it will be transmitted to the bottom of the pressing plate and terminated.

[0025] (8) The present invention can restrict the free end of the pressing plate more stably through the cooperation of the buckle groove and the buckle plate, and the anti-slip protrusion can improve the stability of the energy supply line on the test bench. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 It is an external view of the device of the present invention;

[0027] Figure 2 It is an internal view of the device of the present invention;

[0028] Figure 3 It is a schematic diagram of the detection device of the present invention;

[0029] Figure 4 It is a schematic diagram of the test bench of the present invention;

[0030] Figure 5 It is a schematic diagram of the fixing device of the present invention;

[0031] Figure 6 for Figure 5 A partial enlarged view of A in FIG.

[0032] The symbols in the accompanying drawings are:

[0033] 1. Darkroom; 11. First inner wall; 12. Second inner wall; 2. Test bench; 21. Anti-slip device; 22. Pressing plate; 23. Buckle plate; 24. Buckle slot; 25. Insertion slot; 26. Second flipping mechanism; 27. Fourth flipping device; 28. Third flipping device; 3. Detection device; 31. Base plate; 32. Probe antenna; 4. First flipping mechanism; 41. Fixing device; 42. First clamping slot; 43. Second clamping slot; 44. Second driving rod; 45. Second clamping plate; 46. Holding ring; 47. Holding handle; 5. First flipping device; 51. Second flipping device. DETAILED DESCRIPTION

[0034] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0035] Example 1

[0036] Reference Figure 1~2 An embodiment of the present invention provides a base station test system, including a darkroom 1, in which a detection device 3, a test bench 2, a first flip mechanism 4 and a second flip mechanism 26 are arranged.

[0037] The first flip mechanism 4 is disposed on the first inner wall 11 (top inner wall) of the darkroom 1 , and the second flip mechanism 26 is disposed on the second inner wall 12 (bottom inner wall) of the darkroom 1 . The first inner wall 11 and the second inner wall 12 are opposite to each other up and down.

[0038] The detection device 3 is fixedly arranged on the flipping surface of the first flipping mechanism 4, and the first flipping mechanism 4 can drive the detection device 3 to flip forward and backward and left and right. The detection device 3 includes a substrate 31, and an antenna array composed of a plurality of probe antennas 32 is arranged on the side of the substrate 31 facing the test bench 2. Figure 3 The test bench 2 is used to place the base station to be tested, and is fixedly arranged on the flipping surface of the second flipping mechanism 26. The second flipping mechanism 26 can drive the test bench 2 to flip forward and backward and left and right.

[0039] Principle of this device:

[0040] In the present invention, the base station to be tested is detected by an antenna array composed of a plurality of probe antennas 32 .

[0041] However, the base station to be tested also has array antennas. Even if the quiet zone generated by the detection device can completely cover the base station antenna to be tested, in actual testing, the array antenna of the base station to be tested is tested one sub-array at a time. In other words, the detection device only needs to be able to generate a small quiet zone that is sufficient to cover the area of ​​a single sub-array of the base station to be tested.

[0042] Therefore, the present invention can enable the quiet zone formed by the array antenna of the detection device 3 to move in the darkroom 1 by setting the first flipping mechanism 4, and the operator can adjust the facing position of the detection device 3 and the test bench 2 according to the specific usage status by setting the second flipping mechanism 26. The ultimate goal is to achieve the effect of making the quiet zone generated by the detection device 3 translate and scan on the test bench 2 by adjusting the facing position of the detection device 3 and the test bench 2, and detect each subarray of the base station to be tested one by one through the movement of the quiet zone.

[0043] The scheme of the present invention uses the characteristics of mechanical movement and the base station detection process, and exchanges time for space, so that the base station to be tested can be completely detected without increasing the number of probe antennas 32 in the detection device 3. This design will not reduce the detection accuracy due to serious interference with the signal in the darkroom 1 due to the excessive number of probe antennas 32, but can also reduce the energy consumption in the detection process, and at the same time can completely detect the relevant parameters of the entire base station to be tested.

[0044] Example 2

[0045] Since the test bench 2 needs to be turned over during the test, the base station to be tested placed on the test bench 2 needs to be fixed before turning over the test bench 2. Based on Embodiment 1, a fixing device 41 for fixing the base station to be tested is provided on the test bench 2 in this embodiment.

[0046] Specifically, refer to Figures 4 and 5 In this embodiment, the fixing device 41 includes a group of first clamping grooves 42 and two groups of parallel distributed second clamping grooves 43. The first clamping grooves 42 and the second clamping grooves 43 are both opened on the side of the test bench 2 facing the detection device 3, and the first clamping grooves 42 and the second clamping grooves 43 are perpendicular to each other.

[0047] A first driving rod is rotatably mounted inside the first clamping groove 42. The first driving rod is provided with an external thread, and the threaded sections of the left and right parts of the first driving rod have opposite thread directions. Two first clamping plates are installed on the first driving rod. Both first clamping plates are provided with threaded holes, which are rotatably connected to the two threaded sections of the first driving rod in opposite directions. One end of the first clamping plate away from the first driving rod exceeds the mounting surface of the test bench 2. A slide rail is provided inside the first clamping groove 42, and a slider adapted to the slide rail is provided on the first clamping plate. The first clamping groove 42 is slidably mounted in the first clamping groove 42 through the slide rail and the slider.

[0048] A second driving rod 44 is rotatably mounted inside the second clamping groove 43. The second driving rod 44 is arranged above the first driving rod and does not hinder the rotation of the first driving rod. The second driving rod 44 is provided with an external thread, and the threaded sections of the left and right parts of the second driving rod 44 have opposite thread directions. The second driving rod 44 is provided with two second clamping plates 45. Both second clamping plates 45 are provided with threaded holes, which are rotatably connected to the two threaded sections of the second driving rod 44 in opposite directions. One end of the second clamping plate 45 away from the second driving rod 44 exceeds the mounting surface of the test bench 2. A slide rail is provided inside the second clamping groove 43, and a slider adapted to the slide rail is provided on the second clamping plate 45. The second clamping groove 43 is slidably mounted in the second clamping groove 43 through the slide rail and the slider.

[0049] In addition, screw drive components are respectively provided at the ends of the first drive rod and the second drive rod 44. The screw drive components include a mounting plate, a holding ring 46 and a holding handle 47. The mounting plate is fixedly arranged at one end of the first clamping groove 42 / second clamping groove 43 and fixedly connected to the side wall of the test bench 2, the holding ring 46 is rotatably connected to the outer surface of the mounting plate, and the holding handle 47 passes through the mounting plate, one end of which is fixedly connected to the first drive rod / second drive rod 44, and the other end is fixedly connected to the holding ring 46.

[0050] When in use, the holding ring 46 is rotated, and the holding ring 46 drives the holding handle 47 to rotate, thereby driving the first driving rod / the second driving rod 44 to rotate.

[0051] When the first driving rod rotates, the two first clamping plates are driven to slide in opposite directions inside the first clamping groove 42, so that the two first clamping plates move toward or away from each other, thereby reducing or increasing the distance between the two first clamping plates, thereby clamping and releasing the base station to be tested.

[0052] When the second driving rod 44 rotates, it drives the two second clamping plates 45 to slide in opposite directions inside the second clamping groove 43, so that the two second clamping plates 45 move toward or away from each other, thereby reducing or increasing the distance between the two second clamping plates 45, thereby clamping and releasing the base station to be tested.

[0053] This embodiment is provided with a fixing device 41 , which can stably clamp and fix the base station to be tested on the test bench 2 through the cooperation of two mutually perpendicular clamping components, thereby preventing the base station to be tested from falling off due to the overturning of the test bench 2 .

[0054] Example 3

[0055] Since the base station to be tested needs to be connected to the power supply line to work properly, the flipping of the test bench 2 can easily cause the power supply line to loosen at the connection point of the base station, causing the entire test to be forced to terminate. Based on Example 2, this embodiment sets an anti-drop device 21 on the test bench 2 to prevent the cable of the base station to be tested from falling off.

[0056] Specifically, refer to Figures 5 and 6 , Figure 6 yes Figure 5 An enlarged view of area A (i.e., the anti-slip device). In this embodiment, the anti-slip device 21 includes a pressing plate 22, a pressing plate mounting seat, a buckle plate 23, and a buckle plate mounting seat.

[0057] Among them, the pressing plate mounting seat and the gusset plate mounting seat are both fixed on the test bench 2, one end of the pressing plate 22 is movably connected to the pressing plate mounting seat, and the pressing plate 22 can rotate horizontally relative to the pressing plate mounting seat. One end of the gusset plate 23 is movably connected to the gusset plate mounting seat, and the gusset plate 23 can be flipped up and down relative to the gusset plate mounting seat, and a gusset groove 24 adapted to the pressing plate 22 is provided on the side of the gusset plate 23 facing the test bench 2, and the gusset plate 23 can fix the free end of the pressing plate 22 through the gusset groove 24. A through groove 25 for the cable to pass through is formed between the pressing plate 22 and the gusset plate 23 and the test bench 2, and a plurality of anti-slip protrusions are provided on the surface of the side of the pressing plate 22 facing the test bench 2.

[0058] When in use, flip the gusset plate 23 upwards, rotate the pressing plate 22 horizontally to one side, place the cable of the base station to be tested between the pressing plate mounting seat and the gusset plate mounting seat, rotate the pressing plate 22 horizontally back to its original position, at this time the pressing plate 22 is distributed above the cable, flip the gusset plate 23 downwards and make the buckle groove 24 buckle with the pressing plate 22, at this time the pressing plate 22 has a certain squeezing force on the cable of the base station to be tested, thereby fixing the cable of the base station to be tested, and at the same time the anti-skid protrusions on the lower surface of the pressing plate 22 can further prevent the cable from loosening when the test bench 2 is flipped. When it needs to be removed, flip the gusset plate 23 upwards again and rotate the pressing plate 22 to separate the cable from the test bench 2.

[0059] Example 4

[0060] The main structure of this embodiment is the same as that of Embodiment 3, except that: this embodiment describes the first turning mechanism 4 and the second turning mechanism 26 .

[0061] Specifically, refer to Figures 2~4In this embodiment, the first flipping mechanism 4 includes a first flipping device 5 and a second flipping device 51. The first flipping device 5 is fixedly arranged on the first inner wall 11, the second flipping device 51 is fixedly arranged on the flipping surface of the first flipping device 5, and the detection device 3 is fixedly arranged on the flipping surface of the second flipping device 51. The flipping direction driven by the first flipping device 5 is perpendicular to the flipping direction driven by the second flipping device 51. The detection device 3 can be flipped forward and backward or left and right under the drive of the first flipping device 5 and the second flipping device 51.

[0062] In this embodiment, the second flipping mechanism 26 includes a third flipping device 28 and a fourth flipping device 27. The third flipping device 28 is fixedly arranged on the second inner wall 12, the fourth flipping device 27 is fixedly arranged on the flipping surface of the third flipping device 28, and the test bench 2 is fixedly arranged on the flipping surface of the fourth flipping device 27. The flipping direction driven by the third flipping device 28 and the flipping direction driven by the fourth flipping device 27 are perpendicular to each other. The test bench 2 can be flipped forward and backward or left and right under the drive of the third flipping device 28 and the fourth flipping device 27.

[0063] It should be noted that, in this embodiment, the first flip device 5, the second flip device 51, the third flip device 28 and the fourth flip device 27 are all conventional structures in the art, and those skilled in the art can select a suitable flip device according to actual needs. The structures of the first flip device 5, the second flip device 51, the third flip device 28 and the fourth flip device 27 are not the technical points of the present invention, and therefore, the present invention does not limit their specific structures.

[0064] The above are only preferred implementations of the present invention. The protection scope of the present invention is not limited to the above embodiments. All technical solutions under the concept of the present invention belong to the protection scope of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications without departing from the principle of the present invention should be regarded as the protection scope of the present invention.

Claims

1. A base station testing system, characterized in that: including a darkroom (1); The darkroom (1) is provided with a detection device (3), a test bench (2), a first flipping mechanism (4) and a second flipping mechanism (26); The first turning mechanism (4) is arranged on a first inner wall (11) of the darkroom (1), and the second turning mechanism (26) is arranged on a second inner wall (12) of the darkroom (1), the first inner wall (11) and the second inner wall (12) being located opposite to each other; The detection device (3) is fixedly arranged on the flipping surface of the first flipping mechanism (4), and the first flipping mechanism (4) can drive the detection device (3) to flip forward and backward and left and right; the test bench (2) is used to place the base station to be tested, and is fixedly arranged on the flipping surface of the second flipping mechanism (26), and the second flipping mechanism (26) can drive the test bench (2) to flip forward and backward and left and right; the first flipping mechanism (4) can make the quiet zone formed by the array antenna of the detection device (3) move in the darkroom (1), and the second flipping mechanism (26) can adjust the facing position of the detection device (3) and the test bench (2), so that the quiet zone generated by the detection device (3) is translated and scanned on the test bench (2), and each subarray of the base station to be tested is detected one by one through the movement of the quiet zone.

2. The base station test system according to claim 1, characterized in that: The detection device (3) comprises a substrate (31), and an antenna array consisting of a plurality of probe antennas (32) is provided on a side of the substrate (31) facing the test bench (2).

3. The base station test system according to claim 1, characterized in that: The test bench (2) is provided with a fixing device (41) for fixing the base station to be tested; The fixing device (41) comprises at least one group of first clamping grooves (42) and at least one group of second clamping grooves (43), wherein the first clamping grooves (42) and the second clamping grooves (43) are both provided on a side of the test bench (2) facing the detection device (3), and the first clamping grooves (42) and the second clamping grooves (43) are perpendicular to each other; A first driving rod is rotatably mounted inside the first clamping groove (42), the first driving rod is provided with an external thread, and the threaded sections of the left and right parts of the first driving rod have opposite thread directions, and two first clamping plates are mounted on the first driving rod, and the two first clamping plates are both provided with threaded holes, which are rotatably connected to the two threaded sections of the first driving rod in opposite directions respectively; A second driving rod (44) is rotatably mounted inside the second clamping groove (43), and the second driving rod (44) is arranged above or below the first driving rod; the second driving rod (44) is provided with an external thread, and the threaded sections of the left and right parts of the second driving rod (44) have opposite thread directions; the second driving rod (44) is provided with two second clamping plates (45), and the two second clamping plates (45) are both provided with threaded holes, which are rotatably connected to the two threaded sections of the second driving rod (44) in opposite directions.

4. The base station test system according to claim 3, characterized in that: One end of the first clamping plate away from the first driving rod extends beyond the mounting surface of the test bench (2); One end of the second clamping plate (45) away from the second driving rod (44) protrudes beyond the mounting surface of the test bench (2).

5. The base station test system according to claim 3, characterized in that: The first clamping groove (42) and the second clamping groove (43) are respectively provided with slide rails, and the first clamping plate and the second clamping plate (45) are respectively provided with slide blocks adapted to the slide rails; The first clamping groove (42) is slidably installed in the first clamping groove (42) through a slide rail and a slider, and the second clamping groove (43) is slidably installed in the second clamping groove (43) through a slide rail and a slider.

6. The base station test system according to claim 3, characterized in that: The ends of the first driving rod and the second driving rod (44) are respectively provided with a screwing driving assembly; The screw drive assembly comprises a mounting plate, a holding ring (46) and a holding handle (47); The mounting plate is fixedly arranged at one end of the first clamping groove (42) / the second clamping groove (43) and is fixedly connected to the side wall of the test bench (2); the holding ring (46) is rotatably connected to the outer surface of the mounting plate; The holding handle (47) passes through the mounting plate, one end of which is fixedly connected to the first driving rod / the second driving rod (44), and the other end of which is fixedly connected to the holding ring (46).

7. The base station test system according to claim 1, characterized in that: The test bench (2) is provided with an anti-dropping device (21) for preventing the cable of the base station to be tested from falling off; The anti-drop device (21) comprises a pressing plate (22), a pressing plate mounting seat, a gusset plate (23) and a gusset plate mounting seat; The pressing plate mounting seat and the gusset plate mounting seat are both fixed on the test bench (2); one end of the pressing plate (22) is movably connected to the pressing plate mounting seat, and one end of the gusset plate (23) is movably connected to the gusset plate mounting seat; a gusset plate (23) is provided with a gusset groove (24) adapted to the pressing plate (22) on a side facing the test bench (2); the gusset plate (23) fixes the free end of the pressing plate (22) via the gusset groove (24); A threading groove (25) for the cable to pass through is formed between the pressing plate (22), the buckle plate (23) and the test bench (2).

8. The base station test system according to claim 7, characterized in that: The end of the pressing plate (22) is rotatably connected to the pressing plate mounting seat, and the pressing plate (22) can rotate horizontally relative to the pressing plate mounting seat; the end of the gusset plate (23) is rotatably connected to the gusset plate mounting seat, and the gusset plate (23) can flip up and down relative to the gusset plate mounting seat; A plurality of anti-slip protrusions are provided on a surface of the pressing plate (22) facing the test bench (2).

9. The base station test system according to claim 1, characterized in that: The first turning mechanism (4) comprises a first turning device (5) and a second turning device (51); The first flipping device (5) is fixedly arranged on the first inner wall (11), the second flipping device (51) is fixedly arranged on the flipping surface of the first flipping device (5), and the detection device (3) is fixedly arranged on the flipping surface of the second flipping device (51); the flipping direction driven by the first flipping device (5) and the flipping direction driven by the second flipping device (51) are perpendicular to each other; the detection device (3) flips forward and backward or left and right under the drive of the first flipping device (5) and the second flipping device (51).

10. The base station test system according to claim 1, characterized in that: The second turning mechanism (26) comprises a third turning device (28) and a fourth turning device (27); The third flipping device (28) is fixedly arranged on the second inner wall (12), the fourth flipping device (27) is fixedly arranged on the flipping surface of the third flipping device (28), and the test bench (2) is fixedly arranged on the flipping surface of the fourth flipping device (27); the flipping direction driven by the third flipping device (28) and the flipping direction driven by the fourth flipping device (27) are perpendicular to each other; the test bench (2) is flipped forward and backward or left and right under the drive of the third flipping device (28) and the fourth flipping device (27).

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