Display panel and display device
By gradually increasing the impedance per unit length from the middle to both ends in the test bus of the OLED display, the Mura problem caused by the test signal voltage drop is solved, and a more uniform lighting effect is achieved, and the yield of the display is improved.
Patent Information
- Application Number
- CN202411253303.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-06
- Publication Date
- 2024-12-13
AI Technical Summary
When the OLED display is turned on, the voltage drop of the test signal causes poor charging effect of pixels in the middle, resulting in uneven brightness Mura phenomenon, which reduces the yield of the screen.
A display panel was designed to gradually increase the unit length impedance from the middle to both ends in the test bus, ensuring that the test signal voltage received by each test module is consistent, avoiding the Mura problem caused by signal differences, and improving the lighting quality. Rate.
Through uniform test signal transmission, the lighting effect of the display screen is improved, ensuring that the test signal voltage received by each test module of the screen is consistent, avoiding the Mura phenomenon, and improving the yield of the screen.
Smart Images
Figure CN119132206A_ABST
Abstract
Description
Technical Field
[0001] The present application belongs to the field of display technology, and in particular, relates to a display panel and a display device. Background Art
[0002] Organic Light Emitting Diode (OLED) and flat panel display devices based on technologies such as Light Emitting Diode (LED) have been widely used in various consumer electronic products such as mobile phones, televisions, laptops, desktop computers, etc. due to their advantages such as high image quality, power saving, thin body and wide application range, becoming the mainstream in display devices.
[0003] However, the display performance of current OLED display products needs to be improved. Summary of the invention
[0004] The embodiments of the present application provide a display panel and a display device, which can ensure that the test signal voltages received by each test module of the screen are as consistent as possible, avoiding the Mura problem when the screen is lit due to the difference in test signals received by the test modules in the middle of the screen, and improving the screen lighting yield.
[0005] In a first aspect, an embodiment of the present application provides a display panel, including a display area and a non-display area, wherein the non-display area includes a test circuit; the test circuit includes:
[0006] A test module, the output end of which is electrically connected to the sub-pixel in the display area, and is used to transmit a test signal to the corresponding sub-pixel;
[0007] A test bus, the test bus is electrically connected to the test module and the test signal terminal, and is used to transmit the signal of the test signal terminal to the test module, the test bus includes at least one of a scan bus and a data bus;
[0008] The impedance per unit length of the test bus increases from the middle of the test bus to both ends of the test bus.
[0009] In a possible embodiment of the first aspect,
[0010] The first unit area of the test bus decreases from the middle to both ends of the test bus, wherein the test bus extends along a first direction, and the first unit area is the area corresponding to a unit length of the test bus in the first direction.
[0011] In a possible embodiment of the first aspect,
[0012] The width of the test bus remains constant from the middle of the test bus to both ends of the test bus, and the test bus includes a plurality of openings.
[0013] In a possible embodiment of the first aspect,
[0014] The areas of the openings are the same, and the spacing between adjacent openings in the first direction tends to decrease from the middle of the test bus to the two ends of the test bus;
[0015] In a possible embodiment of the first aspect, the openings have the same shape;
[0016] In a possible embodiment of the first aspect, each opening is rectangular in shape.
[0017] In a possible embodiment of the first aspect,
[0018] From the middle of the test bus to the two ends of the test bus, the second unit area of the opening increases, and the second unit area is the area of the opening corresponding to the unit length in the first direction;
[0019] In a possible embodiment of the first aspect, intervals between adjacent openings in the first direction are equal.
[0020] In a possible embodiment of the first aspect,
[0021] From the middle of the test bus to the two ends of the test bus, the width of the test bus tends to decrease;
[0022] In a possible embodiment of the first aspect, in a second direction intersecting the first direction, a first edge of the test bus faces the test module, a second edge of the test bus is opposite to the first edge, and a distance between the first edge and the test module decreases from the middle of the test bus to both ends of the test bus.
[0023] In a possible embodiment of the first aspect,
[0024] From the middle of the test bus to both ends of the test bus, the width of the test bus decreases in a step-like manner;
[0025] In a possible embodiment of the first aspect, the width differences of the sections formed into a stepped reduction in the second direction are equal;
[0026] In a possible embodiment of the first aspect, the lengths of the segments in the first direction are equal.
[0027] In a possible embodiment of the first aspect,
[0028] The width of the test bus decreases linearly from the middle of the test bus to the two ends of the test bus; or,
[0029] From the middle of the test bus to the two ends of the test bus, the first edge is an arc-shaped edge, and the arc-shaped edge protrudes toward the test module.
[0030] In a possible embodiment of the first aspect,
[0031] The test bus is electrically connected to the test modules via connecting wires, and the connecting wires to which the test modules are connected have the same line width.
[0032] Based on the same inventive concept, in a second aspect, an embodiment of the present application further provides a display device, and the display device includes the display panel in the first aspect or any embodiment of the first aspect.
[0033] The display panel and display device of the embodiments of the present application, wherein the display panel includes a display area and a non-display area, the non-display area includes a test circuit, the test circuit includes a test module and a test bus, wherein the output end of the test module is electrically connected to the sub-pixel in the display area, the test module can be used to transmit the test signal to the corresponding sub-pixel, the test bus is electrically connected to the test module and the test signal end, the test bus can be used to transmit the signal of the test signal end to the test module, the test bus includes at least one of a scan bus and a data bus, and the impedance per unit length of the test bus tends to increase from the middle of the test bus to the two ends of the test bus, that is, the impedance per unit length of the test bus gradually decreases from the two ends to the middle, thereby ensuring that the test signal voltages received by each test module of the screen are as consistent as possible, avoiding the Mura problem when the screen is lit due to the difference in test signals received by the test module in the middle of the screen, and improving the screen lighting yield. BRIEF DESCRIPTION OF THE DRAWINGS
[0034] Other features, objects and advantages of the present application will become more apparent by reading the following detailed description of non-limiting embodiments with reference to the accompanying drawings, in which the same or similar reference numerals represent the same or similar features and the accompanying drawings are not drawn to scale.
[0035] Figure 1 is a structural schematic diagram of a display panel provided in an embodiment of the present application;
[0036] Figure 2 is another structural schematic diagram of a display panel provided in an embodiment of the present application;
[0037] Figure 3 It is a circuit diagram of a first-type test module, a second-type test module, and a third-type test module of a display panel provided in an embodiment of the present application;
[0038] Figure 4-A It is a schematic diagram of the wiring structure of a test bus of a display panel provided in an embodiment of the present application;
[0039] Figure 4-B This is a schematic diagram of a wiring structure of another test bus of a display panel provided in an embodiment of the present application;
[0040] Figure 5-A This is a schematic diagram of a wiring structure of another test bus of a display panel provided in an embodiment of the present application;
[0041] Figure 5-B This is a schematic diagram of a wiring structure of another test bus of a display panel provided in an embodiment of the present application;
[0042] Figure 5-C This is a schematic diagram of a wiring structure of another test bus of a display panel provided in an embodiment of the present application;
[0043] Figure 6 It is a structural schematic diagram of a display device provided in an embodiment of the present application. DETAILED DESCRIPTION
[0044] The features and exemplary embodiments of various aspects of the present application will be described in detail below. In order to make the purpose, technical solutions and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only configured to explain the present application and are not configured to limit the present application. For those skilled in the art, the present application can be implemented without the need for some of these specific details. The following description of the embodiments is only to provide a better understanding of the present application by illustrating the examples of the present application.
[0045] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the statement "include..." do not exclude the presence of other identical elements in the process, method, article or device including the elements.
[0046] It should be understood that the term "and / or" used in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.
[0047] It is obvious to those skilled in the art that various modifications and changes can be made in the present application without departing from the spirit or scope of the present application. Therefore, the present application is intended to cover modifications and changes of the present application that fall within the scope of the corresponding claims (technical solutions for protection) and their equivalents. It should be noted that the implementation methods provided in the embodiments of the present application can be combined with each other without contradiction.
[0048] Before describing the technical solutions provided by the embodiments of the present application, in order to facilitate the understanding of the embodiments of the present application, the present application first specifically describes the problems existing in the related art:
[0049] Before leaving the factory, the display needs to be tested for screen yield using a screen test circuit to ensure that the display meets quality and performance requirements.
[0050] In the related art, the screen test circuit may include a test module and a test bus. When performing the screen test, the screen test circuit may transmit a test signal to the test module via the test bus, and then the test module may light up the corresponding sub-pixel via the test signal to test the display quality of the display screen.
[0051] For example, the pins on the left side of the flexible printed circuit (FPC) are connected to one end of the test bus, and the pins on the right side of the flexible printed circuit (FPC) are connected to the other end of the test bus to provide a test signal for the test bus. Then, multiple test modules can be mounted on the test bus, thereby providing a test signal for the test module, so that the test module lights up the corresponding sub-pixel through the test signal.
[0052] When the display screen is not foldable or the display area of a single screen is small, the traditional screen test circuit can be used for testing. However, when the display screen is foldable and driven by a single IC, the display area of the single screen is too large, so the traditional screen test circuit design has the following problems:
[0053] The test signal of the test module located in the middle of the screen has a certain voltage drop compared to the test signal received by the test modules at the left and right ends of the screen due to the long wiring resistance of the test bus. This voltage drop will cause the charging effect of the pixels in the middle of the screen to be worse than that of the pixels at the left and right edges when the screen is lit. Macroscopically, it manifests as uneven display brightness from the middle of the screen to both sides, that is, the Mura phenomenon, which will affect the normal lighting effect confirmation and reduce the screen yield.
[0054] Based on this, the embodiments of the present application provide a display panel and a display device, which can ensure that the test signal voltages received by each test module of the screen are as consistent as possible, avoid the Mura problem when the screen is lit due to the difference in test signals received by the test modules in the middle of the screen, and improve the screen lighting yield.
[0055] The display panel provided in the embodiments of the present application is described in detail below with reference to the accompanying drawings.
[0056] Figure 1 It is a structural schematic diagram of a display panel provided in an embodiment of the present application.
[0057] like Figure 1 As shown, the display panel may include a display area and a non-display area, and the non-display area may include a test circuit 10. The test circuit 10 may include a test module 11 and a test bus 12.
[0058] The output end of the test module 11 is electrically connected to the sub-pixel 20 in the display area, and the test signal can be output to the corresponding sub-pixel 20 to light up the corresponding sub-pixel 20. The test module 11 can be called CT (Cell Test). The test bus 12 is electrically connected to the test module 11 and the test signal end, and can be used to transmit the test signal of the test signal end to the test module 11.
[0059] The test bus 12 may include at least one of a scan bus and a data bus. For example, the test bus 12 may include a scan bus, and the test signal at the test signal end may be a scan signal, which may be used to control the on and off of the test module 11. For another example, the test bus 12 may include a data bus, and the test signal at the test signal end may be a data signal, which may be transmitted to the sub-pixel 20 through the test module 11 to control the on and off of the sub-pixel 20.
[0060] The impedance per unit length of the test bus 12 is related to the position: the impedance per unit length of the test bus 12 tends to increase from the middle of the test bus 12 to the two ends of the test bus 12, that is, the impedance per unit length of the test bus 12 tends to decrease from one end of the test bus 12 to the middle of the test bus 12, and the impedance per unit length of the test bus 12 also tends to decrease from the other end of the test bus 12 to the middle of the test bus 12.
[0061] According to the display panel provided by the embodiment of the present application, the display panel includes a display area and a non-display area, the non-display area includes a test circuit, the test circuit includes a test module 11 and a test bus 12, wherein the output end of the test module 11 is electrically connected to the sub-pixel 20 in the display area, the test module 11 can be used to transmit the test signal to the corresponding sub-pixel 20, the test bus 12 is electrically connected to the test module 11 and the test signal end, the test bus 12 can be used to transmit the signal of the test signal end to the test module 11, the test bus 12 includes at least one of a scan bus and a data bus, and from the middle of the test bus 12 to the two ends of the test bus 12, the impedance per unit length of the test bus 12 tends to increase, that is, the impedance per unit length of the test bus 12 gradually decreases from the two ends to the middle, thereby ensuring that the test signal voltages received by each test module 11 of the screen are as consistent as possible, avoiding the Mura problem when the screen is lit due to the difference in the test signal received by the test module 11 in the middle of the screen, and improving the screen lighting yield.
[0062] Figure 2 This is a schematic diagram of the structure of another display panel provided in an embodiment of the present application.
[0063] In one example, see Figure 2 , the number of the test modules 11 is equal to the number of columns of the sub-pixels 20 .
[0064] The test module 11 can be configured as different types of test circuits to connect different test signal lines and drive sub-pixels in different columns.
[0065] The test bus 12 has two input terminals and multiple output terminals. The two input terminals of the test bus 12 are connected to different test signal terminals located at opposite sides of the display panel, and the multiple output terminals of the test bus 12 are respectively connected to different test modules 11. The test bus 12 may include a scan bus and a data bus.
[0066] The scan bus may be electrically connected to the control end of the test module 11 and is used to control the on and off of the switch tube in the test module 11 .
[0067] The data bus may be electrically connected to the input end of the test module 11 , and is used to transmit the data signal on the data bus to the corresponding sub-pixel through the test module 11 when the switch tube in the test module 11 is turned on.
[0068] The test signal terminal can be divided into a scan signal terminal and a data signal terminal. D_SW1, D_SW2, and D_SW3 are scan signal terminals, connected to the first scan bus, the second scan bus, and the third scan bus respectively; D_R, D_B, and D_G are data signal terminals, connected to the first data bus, the second data bus, and the third data bus respectively.
[0069] Figure 3 is a circuit diagram of a first type test module, a second type test module and a third type test module of a display panel provided in an embodiment of the present application, which is equivalent to Figure 2 A partial enlarged view of .
[0070] In one example, if Figure 3 As shown, the test module 11 can be configured as a first type test module 111 , a second type test module 112 , or a third type test module 113 .
[0071] In another example, see Figure 3 The first type test module 111 may include a first switch tube T1 and a second switch tube T2.
[0072] The gate of the first switch tube T1 is electrically connected to the first scan bus, the first electrode of the first switch tube T1 is electrically connected to the first data bus, and the second electrode of the first switch tube T1 serves as the output end of the first type test module 111, which is used to respond to the scan signal of the first scan bus and transmit the data signal on the first data bus to the R sub-pixel of the corresponding column.
[0073] The gate of the second switch tube T2 is electrically connected to the second scan bus, the first electrode of the second switch tube T2 is electrically connected to the second data bus, and the second electrode of the second switch tube T2 is electrically connected to the second electrode of the first switch tube T1, and is used to respond to the scan signal of the second scan bus and transmit the data signal on the second data bus to the B sub-pixel of the corresponding column.
[0074] In another example, see Figure 3 The second type test module 112 may include a third switch tube T3.
[0075] The gate of the third switch tube T3 is electrically connected to the third scan bus, the first electrode of the third switch tube T3 is electrically connected to the third data bus, and the second electrode of the third switch tube T3 serves as the output end of the second type test module 112, which is used to respond to the scan signal of the third scan bus and transmit the data signal on the third data bus to the G sub-pixel of the corresponding column.
[0076] In another example, see Figure 2 The third type test module 113 may include a fourth switch tube T4 and a fifth switch tube T5.
[0077] The gate of the fourth switch tube T4 is electrically connected to the second scan bus, the first electrode of the fourth switch tube T4 is electrically connected to the first data bus, and the second electrode of the fourth switch tube T4 serves as the output end of the third type test module 113, which is used to respond to the scan signal of the second scan bus and transmit the data signal on the first data bus to the R sub-pixel of the corresponding column.
[0078] The gate of the fifth switch tube T5 is electrically connected to the first scan bus, the first electrode of the fifth switch tube T5 is electrically connected to the second data bus, and the second electrode of the fifth switch tube T5 is electrically connected to the second electrode of the fourth switch tube T4, and is used to respond to the scan signal of the first scan bus and transmit the data signal on the second data bus to the B sub-pixel of the corresponding column.
[0079] In the embodiment of the present application, through precise switch tube control and signal transmission, it can be ensured that each sub-pixel receives a correct and consistent test signal, thereby improving the accuracy of the test.
[0080] It should be noted that the Figure 2 The embodiment takes the delta pixel arrangement as an example, which is not intended to limit the present application. It is understandable that the impedance adjustment scheme of the test bus 12 of the present application is applicable to other pixel arrangements.
[0081] The inventors have discovered that in order to ensure that the test signal voltages received by each test module 11 of the screen are as consistent as possible, that is, in order that the impedance per unit length of the test bus 12 can tend to decrease from one end of the test bus 12 to the middle of the test bus 12, different resistivity routing materials can be selected at different positions of the test bus 12, so that the resistivity can tend to increase from the middle of the test bus 12 to both ends of the test bus 12.
[0082] In one example, the test bus 12 may be formed by splicing material segments of different resistivities, and these material segments have different electrical conductivity, which may make the impedance per unit length different, so that the impedance per unit length of the test bus 12 may increase from the middle of the test bus 12 to the two ends of the test bus 12. In the embodiment of the present application, by splicing the test bus 12 with material segments of different resistivities, the impedance of the test bus 12 may be precisely controlled, which provides greater flexibility and customizability for the design. The resistivity of the material segments may also be selected or adjusted according to specific application requirements to ensure that the test signal voltages received by the various test modules 11 of the screen are as consistent as possible.
[0083] The inventors further discovered that, in addition to selecting routing materials with different resistivities, the resistance of the test bus 12 can be changed by adjusting the routing area of the test bus 12 while maintaining the same resistivity of the selected materials. This allows the impedance per unit length of the test bus 12 to increase from the middle of the test bus 12 to both ends of the test bus 12, so as to ensure that the test signal voltages received by each test module 11 of the screen are as consistent as possible.
[0084] The following is a detailed description of a design scheme for adjusting the routing area of the test bus 12 so that the impedance per unit length of the test bus 12 increases from the middle of the test bus 12 to both ends of the test bus 12 .
[0085] In some embodiments, the first unit area of the test bus 12 decreases from the middle to the two ends of the test bus 12. The test bus 12 extends along a first direction, and the first unit area is the area corresponding to the unit length of the test bus 12 in the first direction.
[0086] The first unit area is the area corresponding to the unit length of the test bus 12 in the first direction. Figure 1 , the wiring area corresponding to the unit length of the test bus 12 in the horizontal direction is the first unit area.
[0087] For more details, please refer to Figure 1 The test bus 12 extends in the transverse direction, and the area corresponding to the unit length of the test bus 12 in the transverse direction may show a decreasing trend from the middle of the test bus 12 to the two ends of the test bus 12.
[0088] In the embodiment of the present application, the resistance of the test bus 12 can be adjusted by adjusting the routing area of the test bus 12, so that the impedance per unit length of the test bus 12 increases from the middle of the test bus 12 to both ends of the test bus 12.
[0089] The inventors further discovered that, according to the available space requirements of the display panel, different routing area adjustment strategies can be adopted to achieve an impedance per unit length of the test bus 12 that increases from the middle of the test bus 12 to both ends of the test bus 12, thereby maximizing space utilization.
[0090] Combine the following Figure 4-A and Figure 4-B The first routing area adjustment strategy for the test bus 12 is introduced in detail.
[0091] In some embodiments, Figure 4-A or Figure 4-B As shown, the width of the test bus 12 remains constant from the middle of the test bus 12 to the two ends of the test bus 12 , and the test bus 12 may include a plurality of openings.
[0092] In the embodiment of the present application, by digging holes, the impedance per unit length of the test bus 12 can be achieved while the routing width of the test bus 12 remains unchanged, and the impedance tends to increase from the middle of the test bus 12 to the two ends of the test bus 12. The consistent routing width can make the wiring more regular, reduce changes and adjustments in the manufacturing process, and is conducive to improving space utilization.
[0093] In some embodiments, you may continue to refer to Figure 4-A , the areas of the openings on the test bus 12 can be the same, and the spacing between adjacent openings in the first direction can decrease from the middle of the test bus 12 to the two ends of the test bus 12. The embodiment of the present application can keep the area of the openings unchanged and the spacings different, and the uniform opening area simplifies the design and manufacturing process.
[0094] In one embodiment, you can continue to refer to Figure 4-A The shapes of the openings on the test bus 12 can be the same. In the embodiment of the present application, the openings of the same shape can be processed using the same manufacturing tools and processes, thereby simplifying the manufacturing process and improving production efficiency.
[0095] In one embodiment, each opening may be rectangular in shape.
[0096] In yet another embodiment, the shape of each opening may be circular.
[0097] It should be noted that the shape and area of the openings on the test bus 12 can be designed according to actual needs, and this application does not limit this.
[0098] In some embodiments, see Figure 4-B , from the middle of the test bus 12 to the two ends of the test bus 12, the second unit area of the opening may increase, and the second unit area is the area corresponding to the unit length of the opening in the first direction. In the embodiment of the present application, by flexibly adjusting the area of the openings on the test bus 12, the second unit area of the openings may increase from the middle of the test bus 12 to the two ends of the test bus 12. In other words, the first unit area of the test bus 12 may decrease from the middle of the test bus 12 to the two ends of the test bus 12, thereby ensuring that the test signal voltages received by the various test modules of the screen are as consistent as possible.
[0099] In one embodiment, you can continue to refer to Figure 4-B , from the middle of the test bus 12 to the two ends of the test bus 12, the second unit area of the openings may increase, and the spacing between adjacent openings on the test bus 12 in the first direction is equal. For example, from the middle of the test bus 12 to the two ends of the test bus 12, the second unit area of the openings may increase, and the spacing between adjacent openings in the lateral direction is equal. In the embodiment of the present application, by adjusting the opening area and keeping the spacing between the openings unchanged, it can be ensured that the test bus 12 is more stable when subjected to various stresses.
[0100] Combine the following Figure 5-A , Figure 5-B and Figure 5-C The second routing area adjustment strategy for the test bus 12 is introduced in detail.
[0101] In some embodiments, see Figure 5-A , Figure 5-B or Figure 5-C , the width of the test bus 12 may decrease from the middle of the test bus 12 to the two ends of the test bus 12 .
[0102] In the embodiment of the present application, the area per unit length of the test bus 12 in the first direction can be adjusted by adjusting the width of the test bus 12, so as to realize an impedance per unit length of the test bus 12 which increases from the middle of the test bus 12 to both ends of the test bus 12, thereby ensuring that the test signal voltages received by each test module 11 of the screen are as consistent as possible.
[0103] It should be noted that the second routing area adjustment strategy is to adjust the routing area by changing the routing width, so no holes need to be drilled. Alternatively, in the case of some special space requirements, the area per unit length of the test bus 12 can be adjusted by combining drilling and adjusting the line width.
[0104] In one embodiment, you can continue to refer to Figure 5-A , Figure 5-B or Figure 5-C In the second direction intersecting the first direction, the first edge of the test bus 12 faces the test module 11, and the second edge of the test bus 12 is opposite to the first edge. From the middle of the test bus 12 to the two ends of the test bus 12, the distance between the first edge and the test module 11 may tend to decrease.
[0105] Specifically, if Figure 5-A , Figure 5-B or Figure 5-C As shown, in the longitudinal direction, the upper edge of the test bus 12 faces the test module 11, and the lower edge of the test bus 12 is opposite to the upper edge. From the middle of the test bus 12 to the two ends of the test bus 12, the distance between the upper edge and the test module 11 tends to decrease.
[0106] In the embodiment of the present application, the width of the test bus 12 can be adjusted by flexibly adjusting the spacing between the upper edge of the test bus 12 and the test module 11, so that the area per unit length of the test bus 12 in the first direction can be different, and the width of the test bus 12 can decrease from the middle of the test bus 12 to the two ends of the test bus 12, so as to achieve the impedance per unit length of the test bus 12, and increase from the middle of the test bus 12 to the two ends of the test bus 12, thereby ensuring that the test signal voltages received by each test module 11 of the screen are as consistent as possible.
[0107] In some embodiments, see Figure 5-A, the width of the test bus 12 can be reduced in a step-like manner from the middle of the test bus 12 to the two ends of the test bus 12. In the embodiment of the present application, a step-shaped routing design of the test bus 12 is performed, and the impedance per unit length of the test bus 12 can be flexibly adjusted by adjusting the level difference between the steps, so that the width of the test bus 12 decreases from the middle of the test bus 12 to the two ends of the test bus 12, thereby ensuring that the test signal voltages received by each test module 11 of the screen from the test bus 12 are as consistent as possible.
[0108] In one embodiment, you can continue to refer to Figure 5-A , the width difference of each section in the second direction is equal to that of the stepped reduction. In other words, the level difference of each step in the longitudinal direction is equal. In the embodiment of the present application, the level difference of each step is equal, which can achieve a uniform transition of the impedance of the test bus 12.
[0109] In one embodiment, the lengths of the various sections forming the step-like reduction in the first direction are equal. In other words, the lengths of each step forming the step-like shape in the lateral direction are equal. In the embodiment of the present application, the lengths of each step in the lateral direction are equal, which can simplify the design and manufacturing process while making the impedance of the test bus 12 transition uniformly.
[0110] In some embodiments, see Figure 5-B , the width of the test bus 12 decreases linearly from the middle of the test bus 12 to the two ends of the test bus 12. In other words, the upper edge of the test bus 12 is a straight line. In the embodiment of the present application, the width of the test bus 12 changes in a straight line, which can achieve a smooth transition of impedance.
[0111] In some embodiments, see Figure 5-C , from the middle of the test bus 12 to the two ends of the test bus 12, the first edge is an arc-shaped edge, and the arc-shaped edge is convex toward the test module 11. Alternatively, based on specific space requirements, the arc-shaped edge can also be recessed toward the test module 11. In the embodiment of the present application, a smooth transition of the impedance per unit length of the test bus 12 can be achieved, and at the same time, the impedance of different unit lengths of the test bus 12 can be flexibly adjusted.
[0112] In some embodiments, see Figure 1 to Figure 5-C , the test bus 12 can be electrically connected to the test module 11 through a connecting wire, and the line width of the connecting wire connected to each test module 11 can be equal. In the embodiment of the present application, in view of the large number of test modules 11, the number of connecting wires between the test module 11 and the test bus 12 is large. In order to simplify the process and reduce the complexity of operation, the line width of the connecting wire between the test bus 12 and the test module 11 can be kept unchanged, and only the impedance of the test bus 12 is adjusted, so that the process is more convenient and efficient.
[0113] See also Figure 6 , Figure 6 It is a schematic diagram of a display device provided in the present application. The display device may include a display panel. The display device may be at least one of a wearable device, a camera, a mobile phone, a tablet computer, a display screen, a television, and a vehicle-mounted display terminal.
[0114] The display device includes the display panel, so the display device has all the beneficial effects of the above-mentioned display panel.
[0115] It should be understood that in the embodiment of the present application, "B corresponding to A" means that B is associated with A, and B can be determined according to A. However, it should also be understood that determining B according to A does not mean determining B only according to A, and B can also be determined according to A and / or other information.
[0116] The above are only specific implementations of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed in the present application, and these modifications or replacements should be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be based on the protection scope of the claims.
Claims
1. A display panel, characterized in that: It includes a display area and a non-display area, the non-display area includes a test circuit; the test circuit includes: A test module, the output end of which is electrically connected to the sub-pixel in the display area, and is used to transmit a test signal to the corresponding sub-pixel; A test bus, the test bus being electrically connected to the test module and the test signal terminal, and being used to transmit the signal of the test signal terminal to the test module, the test bus comprising at least one of a scan bus and a data bus; The impedance per unit length of the test bus increases from the middle of the test bus to both ends of the test bus.
2. The display panel according to claim 1, characterized in that: The first unit area of the test bus decreases from the middle of the test bus to both ends of the test bus, wherein the test bus extends along a first direction, and the first unit area is the area corresponding to a unit length of the test bus in the first direction.
3. The display panel according to claim 2, characterized in that: The width of the test bus remains constant from the middle of the test bus to both ends of the test bus, and the test bus includes a plurality of openings.
4. The display panel according to claim 3, characterized in that: The areas of the openings are the same, and the spacing between adjacent openings in the first direction tends to decrease from the middle of the test bus to the two ends of the test bus; Preferably, the shapes of the openings are the same; Preferably, each of the openings is rectangular in shape.
5. The display panel according to claim 3, characterized in that: From the middle of the test bus to the two ends of the test bus, the second unit area of the opening increases, and the second unit area is the area of the opening corresponding to the unit length in the first direction; Preferably, the spacings between adjacent openings in the first direction are equal.
6. The display panel according to claim 2, characterized in that: The width of the test bus decreases from the middle of the test bus to the two ends of the test bus; Preferably, in a second direction intersecting the first direction, the first edge of the test bus faces the test module, the second edge of the test bus is opposite to the first edge, and the distance between the first edge and the test module tends to decrease from the middle of the test bus to both ends of the test bus.
7. The display panel according to claim 6, characterized in that: The width of the test bus decreases in a step-like manner from the middle of the test bus to the two ends of the test bus; Preferably, the width differences of the sections forming the step-shaped reduction in the second direction are equal; Preferably, the lengths of the sections in the first direction are equal.
8. The display panel according to claim 6, characterized in that: The width of the test bus decreases linearly from the middle of the test bus to the two ends of the test bus; or, From the middle of the test bus to both ends of the test bus, the first edge is an arc-shaped edge, and the arc-shaped edge protrudes toward the test module.
9. The display panel according to any one of claims 1 to 8, characterized in that: The test bus is electrically connected to the test modules via connecting wires, and the connecting wires connected to the respective test modules have the same line width.
10. A display device, characterized in that: The display device comprises the display panel according to any one of claims 1 to 9.