A method for testing radio frequency signals in an interplanetary space environment

Abstract

The application is applied to internal radio frequency signal test of spaceborne electronic product under simulated interstellar space environment. The test method adopts two kinds of probe combination of clamping type and elastic self-locking type probe, first uses the clamping type probe to carry out room temperature radio frequency signal detection positioning, and finally uses the elastic self-locking type probe to implement interstellar space environment radio frequency signal test. The stress provided by the elastic deformation of the elastic self-locking type probe probe of the elastic self-locking type probe ensures the close contact of the test point, compensates the deformation of the interstellar space environment, and realizes reliable and effective test on the radio frequency signal of the test point. The application meets the radio frequency signal detection, adapts to various measured point shapes, direct current isolation, test state elastic self-locking, probe installation position fixing, standardized SMA coaxial interface and coupling level adjustment.

Description

TECHNICAL FIELD

[0001] The application belongs to the field of radio frequency electronic products, and relates to a method for testing internal radio frequency signals of a satellite-borne electronic product under an interstellar space environment. BACKGROUND

[0002] The task originates from a satellite-borne electronic product, which requires normal operation under an interstellar space environment.

[0003] In the development of a satellite-borne electronic product, internal radio frequency signals of the product are often tested under a simulated interstellar space environment to determine a debugging position and parameter adjustment.

[0004] In the fault diagnosis analysis of a satellite-borne electronic product, internal radio frequency signals of the product are also often tested under a simulated interstellar space environment.

[0005] Usually, a test cable lead is welded on a circuit welding point to test signals, and after debugging or troubleshooting is completed, a professional electrician is required to repair the circuit.

[0006] This causes unnecessary damage to the product welding point, delays the development progress of the product, increases the development risk in some special development stages (for example, when the product is removed from a satellite for inspection), and delays the launch progress of the satellite.

[0007] The interstellar space environment specifically requires a temperature range of -25℃ to +60℃ and a vacuum degree of 1*10 -4 pa in a sealed space. SUMMARY

[0008] The application solves the technical problem of overcoming the deficiencies of the prior art and providing a method for testing radio frequency signals in an interstellar space environment, which is applied to the testing of internal radio frequency signals of a satellite-borne electronic product under a simulated interstellar space environment and solves the problem of solderless signal detection under a simulated interstellar space environment.

[0009] The technical solution of the application is a method for testing radio frequency signals in an interstellar space environment, which comprises: under a room temperature environment, using a clamping probe to perform step-by-step testing on radio frequency signals of all test points in a satellite-borne electronic product, finding out test points with abnormal radio frequency signals, determining an attenuator attenuation value of an elastic self-locking probe according to a maximum signal power value of the test points with abnormal radio frequency signals, and using the elastic self-locking probe with the attenuation value to perform radio frequency signal testing on the test points with abnormal radio frequency signals in the satellite-borne electronic product under a simulated interstellar space environment to obtain a signal spectrum.

[0010] The star-borne electronic product includes a radio frequency circuit and a shell structure, the radio frequency circuit is installed on the shell structure, the test point inside the star-borne electronic product is located on the radio frequency circuit of the star-borne electronic product, and a flange fixing point exists on the shell structure of the star-borne electronic product.

[0011] The test point of the radio frequency signal anomaly refers to a test point with a radio frequency signal power less than 60% of a design value.

[0012] The attenuator attenuation value of the elastic self-locking probe is determined, including: when the maximum signal power value of the test point of the radio frequency signal anomaly is not greater than 20 dBm, the attenuator attenuation value is 3 dB; when the maximum signal power value of the test point of the radio frequency signal anomaly is greater than 20 dBm, the attenuator attenuation value is an integer of the absolute value of the difference between the maximum signal power value of the test point of the radio frequency signal anomaly and 17 dBm.

[0013] The elastic self-locking probe includes a probe, a base, a direct-current isolator and an attenuator; one end of the probe contacts the test point inside the star-borne electronic product, and the other end is connected to one end of the base, used for extracting the radio frequency signal and outputting to the base; the other end of the base is connected to one end of the direct-current isolator, used for providing a position fixing function and outputting the radio frequency signal to the direct-current isolator; the other end of the direct-current isolator is connected to one end of the attenuator, used for direct-current isolation in radio frequency signal transmission; and the other end of the attenuator is connected to a radio frequency test cable, used for attenuating and outputting the radio frequency signal.

[0014] The probe includes a transition section, an elastic arc and a tip; the transition section is a straight section; the elastic arc is a part of a circular arc, and the elastic stress of the probe material is used to compensate for various deformations in the interstellar space environment; and the tip is in the shape of a hook, a ring or a needle, corresponding to three types of the test point inside the star-borne electronic product, i.e., a flat shape, a convex pin shape and a hole shape.

[0015] The base is connected to the direct-current isolator through an SMA flange coaxial connector, one end of the base is connected to the direct-current isolator through an SMA coaxial external thread interface, the other end of the base is a hollow cylindrical welding sheet for welding the probe, and the base flange is fixed on the flange fixing point of the shell structure of the star-borne electronic product through a screw.

[0016] The use of the elastic self-locking probe carries out the RF signal test of the test point of the abnormal RF signal in the internal all RF signals of the spaceborne electronic product under the simulated interstellar space environment, including:

[0017] The flange fixing point on the shell structure of the spaceborne electronic product closest to the test point of the abnormal RF signal is found.

[0018] The horizontal offset between the test point of the abnormal RF signal and the flange fixing point on the shell structure of the spaceborne electronic product closest to the test point is measured, the elastic self-locking probe flange fixing point offset is measured, and the probe elastic arc offset is calculated.

[0019] The vertical drop between the test point of the abnormal RF signal and the flange fixing point on the shell structure of the spaceborne electronic product closest to the test point is measured, the elastic self-locking probe probe transition section length is measured, and the probe elastic arc diameter is calculated.

[0020] According to the shape of the test point in the internal spaceborne electronic product, the shape of the elastic self-locking probe probe tip is selected, wherein the ring-shaped tip elastic self-locking probe is used for the convex pin-shaped test point, the needle-shaped tip elastic self-locking probe is used for the hole-shaped test point, and the bent hook-shaped tip elastic self-locking probe is used for the flat-shaped test point.

[0021] In a room temperature environment, the elastic self-locking probe attenuator, the elastic self-locking probe elastic self-locking probe isolator, the elastic self-locking probe base and the elastic self-locking probe probe are assembled into the elastic self-locking probe.

[0022] The flange fixing point on the shell structure of the spaceborne electronic product closest to the test point of the abnormal RF signal is fixed on the flange fixing point on the shell structure of the spaceborne electronic product closest to the test point of the abnormal RF signal, the elastic self-locking probe probe is contacted on the test point of the abnormal RF signal, the RF signal is measured, the connected measured RF circuit and the elastic self-locking probe are put into a test oven or a vacuum tank, the RF signal is output to a test system through an RF cable, the simulated interstellar space environment RF signal test is carried out, and a signal spectrum is obtained.

[0023] The probe elastic arc diameter H = 1.06 (B-Y1), wherein B represents the vertical drop between the flange fixing points on the shell structure, and Y1 represents the length of the elastic self-locking probe probe transition section.

[0024] The probe elastic arc offset X2 = A-X1, wherein A represents the horizontal offset between the flange fixing points, and X1 represents the elastic self-locking probe flange fixing point offset.

[0025] Compared with the prior art, the present application has the following beneficial effects:

[0026] 1) The method of the present application proposes to reasonably use the elastic deformation of the elastic self-locking probe probe material as the locking torque to resist the deformation of the interstellar space environment. Through simulation analysis and design, the probe device design scheme of the elastic self-locking probe probe is given, which takes the elastic arc design as the key technical point. Through simulation design, the specific calculation size formula and method of the elastic self-locking probe probe are given. The detection position locking and welding-free signal detection problem under the condition of simulating the interstellar space environment are realized;

[0027] 2) In view of the requirement that the test system has the function of isolating direct current in the radio frequency signal and can adjust the signal amplitude, the probe device of the present application adopts a standard elastic self-locking probe DC isolator to solve the problem of direct current signal isolation in the test method, and adopts a standard elastic self-locking probe attenuator to solve the problem of adjusting the signal amplitude in the test method. The DC isolation circuit is usually welded with a DC isolation capacitor, which is neither safe nor convenient. The elastic self-locking probe DC isolator is packaged as an SMA standard interface, which is convenient to install and replace, and has high reliability and safety;

[0028] 3) In view of the requirement of adapting to various shapes of the measured points of the radio frequency circuit, the elastic self-locking probe probe tip is designed in the form of a hook, a ring and a needle according to the different characteristics of the measured points of the measured parts, which respectively adapts to three conditions of internal flat shape test points (single flat pad), protruding pin shape test points (lead pad) and hole shape test points (via hole or empty pad) of the satellite-borne electronic products. BRIEF DESCRIPTION OF DRAWINGS

[0029] Figure 1 It is a schematic diagram of a clamping type probe structure.

[0030] Figure 2 It is a schematic diagram of an elastic self-locking probe structure.

[0031] Figure 3 It is a schematic diagram of the working of the elastic self-locking probe in a temperature cycle environment.

[0032] Figure 4 It is a schematic diagram of the size parameters of the elastic self-locking probe.

[0033] Figure 5 It is a spring steel wire elastic arc model. DETAILED DESCRIPTION

[0034] The application discloses a kind of interstellar space environment under radio frequency signal test method, it is applied to the internal radio frequency signal test of spaceborne electronic product.By the actual demand analysis of debugging test work, test method uses two kinds of probe combination of clamping type and elastic self-locking probe, first using clamping type probe to carry out room temperature radio frequency signal detection positioning, finally using elastic self-locking probe to implement interstellar space environment radio frequency signal test.Using the stress stored by the elastic deformation of elastic self-locking probe probe ensures and test point contact closely, reliable and effective test to test point radio frequency signal is realized.

[0035] As Figure 1 Indicated, the application uses clamping type probe to carry out room temperature radio frequency signal detection positioning, clamping type probe adopts pen-shaped hand-held appearance, hand-held elastic self-locking probe probe handle directly contacts test point, under room temperature condition, to spaceborne product circuit is tested positioning gradually, and confirms the amplitude and frequency of radio frequency signal and the like index, can be switched back and forth in multiple test positions, convenient to use;

[0036] As Figure 2 Indicated, using elastic self-locking probe to carry out radio frequency signal test under simulated interstellar space environment, elastic self-locking probe adopts flange elastic self-locking probe base type appearance, it is convenient to be fixed on product structure, elastic self-locking probe probe and test point elastic contact, elastic self-locking probe probe material adopts elastic material, under simulated interstellar space environment, using the stress stored by the elastic deformation of elastic self-locking probe probe ensures and test point contact closely, compensates the deformation of interstellar space environment, realizes reliable and effective test to test point radio frequency signal.

[0037] The demand of test method is analyzed:

[0038] Under simulated interstellar space environment, in-25 ℃ ~ +60 ℃ range, due to thermal expansion and contraction, the relative position between elastic self-locking probe probe and test point can change, influence contact effect, requires that test device provides deformation compensation;

[0039] The electronic product to be tested under sealed vacuum environment means that test probe can not be modified at will after installation, and needs to be connected reliably;

[0040] Electronic product test point (soldering point) is exempted from soldering, without damage, without repair, and it is suggested that pressure contact is used between test probe and test point;

[0041] Adapt to various measured point appearance, through analysis, the appearance of measured point in radio frequency circuit generally includes: flat appearance test point (single plane flat pad), convex pin appearance test point (lead pad) and hole appearance test point (via hole or empty pad) three conditions;

[0042] The test system has the functions of isolating DC in RF signals and adjusting signal amplitude, and needs to consider the design of the DC isolation circuit and the attenuation circuit.

[0043] The test method adopts a standard SMA RF interface, and the probe is designed to be assembled by using SMA coaxial standard components as much as possible.

[0044] The test signal range is DC-500MHz (quantitative) and 500MHz-1000MHz (qualitative), and the treatment of the probe needle material of the elastic self-locking probe needs to consider gold plating or silver plating to increase the RF signal characteristics.

[0045] After the above analysis, the elastic self-locking probe is designed as follows:

[0046] The elastic self-locking probe is composed of an elastic self-locking probe needle, an elastic self-locking probe base, an elastic self-locking probe DC isolator, and an elastic self-locking probe attenuator.

[0047] The material and design of the elastic self-locking probe needle are the key to solving the core requirements in the simulated interstellar space environment.

[0048] The elastic self-locking probe needle material requires good elasticity and good RF signal transmission in the simulated interstellar space environment. The selection of the elastic self-locking probe needle material includes Kovar, stainless steel wire, spring steel wire, etc. The diameter specifications of the elastic self-locking probe needle include 1.0, 0.5, 0.3, etc. The surface treatment of the elastic self-locking probe needle includes silver plating and gold plating. After a large number of actual tests and mechanical analysis, 0.3, spring steel wire, and gold plating treatment are finally selected.

[0049] The elastic self-locking probe needle is made of the aforementioned materials and is composed of an elastic self-locking probe needle transition section, an elastic self-locking probe needle elastic arc, and an elastic self-locking probe needle tip.

[0050] The elastic self-locking probe needle transition section is a straight section.

[0051] As shown in Figure 3 The elastic self-locking probe needle elastic arc is a specific implementation means for providing deformation compensation in the simulated interstellar space environment of the test method. The elastic self-locking probe needle elastic arc is a part of a circular arc. The elastic self-locking probe needle elastic arc compensates for various deformations in the thermal cycle environment using the elastic stress of the elastic self-locking probe needle material. The bending radius of the elastic self-locking probe needle elastic arc can be adjusted according to actual conditions.

[0052] The elastic self-locking probe probe tip shape is hook-shaped, ring-shaped and needle-shaped three selectable designs, which correspond to three types of flat shape type (pad), convex pin shape type (pin) and hole shape type (via hole) of the internal test points of the satellite-borne electronic product respectively.

[0053] The elastic self-locking probe base adopts a standard SMA coaxial connector, and the connector has a flange around the connector which can be fixed on the electronic product shell structure of the measured member by screws. One end of the elastic self-locking probe DC blocker is an SMA coaxial external thread interface, and one end of the elastic self-locking probe probe is a hollow cylindrical soldering piece for welding the elastic self-locking probe probe.

[0054] The elastic self-locking probe DC blocker adopts: before the self-made probe, the DC blocking circuit is usually welded at both ends of the DC blocking lead capacitor, which is neither safe nor convenient. After many investigations, the elastic self-locking probe DC blocker device is adopted in the environmental radio frequency debugging test probe to solve the problem of DC isolation in the probe. The elastic self-locking probe DC blocker is packaged as an SMA standard interface, which is convenient to install and replace, and has high reliability and safety. Domestic manufacturers have different frequency band products on the shelf, which are low in cost.

[0055] The elastic self-locking probe DC blocker is packaged as an SMA standard interface, which is convenient to install and replace, and has high reliability and safety.

[0056] At the same time, in order to realize the adjustment of the output level of the probe, a coaxial elastic self-locking probe attenuator with a standard SMA-JK coaxial interface can be randomly selected and matched on the elastic self-locking probe DC blocker.

[0057] As shown in Figure 4 , it is the actual installation of the elastic self-locking probe. The measured member includes an electronic product shell structure and a radio frequency circuit board installed therein, and the radio frequency circuit board includes various electronic components, pads and printed circuit boards. The probe base flange is fixed on the shell side wall screw hole, and the probe elastic self-locking probe probe tip tightly contacts the test point.

[0058] As shown in the figure, the relative position of the measurement base flange fixed point and the radio frequency circuit test point is measured, the horizontal offset is A, and the vertical drop is B.

[0059] Next, according to the relative position of the test point of the measured radio frequency circuit and the fixed point of the measured electronic product shell structure, the related parameters of the probe are calculated. The elastic effect of the probe elastic arc is in the vertical direction of the probe, and the elastic arc diameter H of the elastic self-locking probe probe needs to consider the budget of the elastic deformation allowance.

[0060] The related size parameters of the probe include: flange fixed point offset X1, elastic self-locking probe probe elastic arc offset X2, elastic self-locking probe probe transition section Y1 and elastic self-locking probe probe elastic arc diameter H.

[0061] Horizontal direction parameter calculation. The horizontal direction does not need to consider the elastic deformation allowance, the sum of the horizontal direction of the probe (flange fixed point offset X1, elastic self-locking probe probe elastic arc offset X2) is equal to the horizontal offset A.

[0062] That is, the formula X1+X2=A, according to the actual application, the following parameter quick reference table is given in engineering, the flange adopts standard SMA size.

[0063] Table 1-1 probe parameter quick reference table

[0064]

[0065] Note: unit mm

[0066] Vertical direction parameter calculation. The sum of the vertical direction of the probe (elastic self-locking probe probe transition section Y1 and elastic self-locking probe probe elastic arc diameter H) is equal to the vertical drop B. Among them, the elastic self-locking probe probe elastic arc diameter H considers the elastic deformation, and the budget of the elastic deformation allowance needs to be considered.

[0067] The modeling budget for H is as follows:

[0068] In this scheme, 0.3mm spring steel wire is used, and the applicable diameters are H=2mm, 5mm, 10mm, 15mm. The length of the spring steel wire of different diameter arc segments after the diameter is shortened after being subjected to contact stress needs to be determined.

[0069] The shape model of the spring steel wire is as shown in Figure 5

[0070] The grade / specification of the spring steel wire is: 65Mn GB4357-89 / diameter 0.3mm

[0071] The stress range of the spring steel wire: assuming that the spring steel wire is in the ideal elastic deformation stage during the compression process, the boundary conditions are to ensure that the contact surface has sufficient pressure, the spring steel wire is in good contact with the welding point (minimum stress, according to experience, 15KPa, 0.001N), the welding point cannot be damaged (maximum stress, the yield limit of the welding point is 48MPa, taking a safety factor of 1.5, which is 32MPa, 2.26N), the spring steel wire cannot fail (maximum stress, the yield limit of the welding point is 785MPa, taking a safety factor of 1.5, which is 523MPa), and the welding point failure and spring steel wire failure take the smaller value.

[0072] A spring wire model is established, the maximum stress and the minimum stress are applied, and the diameter change of the spring steel wire of different diameter elastic arcs can be calculated. The elastic deformation allowance in the range selected in engineering is as shown in the following table:

[0073] Table 1-2 Diameter change corresponding to different elastic arc diameters ​

[0074]

[0075] According to the calculation result, reasonable engineering selection value is selected to pre-compress the elastic arc, and effective contact of the elastic self-locking probe and the test point is realized.

[0076] The elastic deformation residual range of H is obtained through simulation budget, and in engineering, the elastic deformation coefficient can be taken as 1.06 by directly checking the table.

[0077] The formula in the vertical direction is H = 1.06 (B-Y1), and according to the actual application, the following parameter quick reference table is given in engineering, and the flange adopts standard SMA size.

[0078] Table 1-3 Probe Parameter Quick Reference Table

[0079]

[0080] Note: unit mm

[0081] According to the above table 1-1 and table 1-3, the related size parameters of the elastic self-locking probe can be determined.

[0082] Design of clamping probe

[0083] The clamping probe includes: SMA coaxial elastic self-locking probe attenuator, SMA coaxial elastic self-locking probe direct current isolator, elastic self-locking probe probe (made of SMA coaxial semi-rigid cable), grounding clamp (with connecting line).

[0084] The clamping type is used in the condition of manual point-by-point test at room temperature, and can be tested back and forth at multiple points, which is more convenient. The clamping probe and the elastic self-locking probe are used together at room temperature, which has the characteristics of convenient and fast use.

[0085] The SMA coaxial elastic self-locking probe attenuator and the elastic self-locking probe direct current isolator in the clamping probe are the same as the elastic self-locking probe.

[0086] Manufacture of elastic self-locking probe in clamping probe: SMA coaxial semi-rigid cable is used as the main body of the probe elastic self-locking probe (handheld part), which provides structural support and electrical signal transmission function, at the same time, the cable head is stripped of the outer skin, and the inner conductor is exposed and tin-plated as the elastic self-locking probe part of the probe.

[0087] Grounding clamp (with line) in clamping probe: the installation wire is welded on the probe body, and the welding alligator clip is led out as grounding.

[0088] The specific test implementation method is as follows:

[0089] First, in the room temperature environment, the handheld clamping probe tests the radio frequency signals of all test points in the satellite-borne electronic product step by step, finds out the test points with abnormal radio frequency signals, and the test points with abnormal radio frequency signals refer to the test points with radio frequency signal power less than 60% of the design value. The attenuation value of the attenuator of the elastic self-locking probe is determined according to the maximum signal power value of the test points with abnormal radio frequency signals.

[0090] The attenuation value determination method of the attenuator of the elastic self-locking probe is as follows: when the maximum signal power value of the test points with abnormal radio frequency signals is not greater than 20dBm, the attenuation value of the attenuator is 3dB; when the maximum signal power value of the test points with abnormal radio frequency signals is greater than 20dBm, the attenuation value of the attenuator is the integer of the absolute value of the difference between the maximum signal power value of the test points with abnormal radio frequency signals and 17dBm.

[0091] Then, the elastic self-locking probe is used to test the radio frequency signals of the test points with abnormal radio frequency signals in the satellite-borne electronic product under the simulated interstellar space environment, including the following steps:

[0092] Step one, find the flange fixing point on the shell structure of the satellite-borne electronic product closest to the test point with abnormal radio frequency signals;

[0093] Step two, measure the horizontal offset A between the test point with abnormal radio frequency signals and the flange fixing point on the shell structure of the satellite-borne electronic product closest to the test point, measure the flange fixing point offset X1 of the elastic self-locking probe, and calculate the probe elastic arc offset X2=A-X1;

[0094] Step three, measure the vertical drop B between the test point with abnormal radio frequency signals and the flange fixing point on the shell structure of the satellite-borne electronic product closest to the test point, measure the length Y1 of the probe transition section of the elastic self-locking probe, and calculate the probe elastic arc diameter H=1.06(B-Y1);

[0095] Step four, according to the shape of the test point in the satellite-borne electronic product, select the shape of the probe tip of the elastic self-locking probe, wherein the convex pin shape test point adopts a ring-shaped tip elastic self-locking probe, the hole-shaped test point adopts a needle-shaped tip elastic self-locking probe, and the flat-shaped test point adopts a hook-shaped tip elastic self-locking probe;

[0096] Step five, in the room temperature environment, assemble the elastic self-locking probe attenuator, the elastic self-locking probe direct current eliminator, the elastic self-locking probe base and the elastic self-locking probe probe into the elastic self-locking probe;

[0097] Step six, fix the flange of the elastic self-locking probe base on the flange fixing point of the closest shell structure of the spaceborne electronic product at the test point of the abnormal radio frequency signal, contact the probe of the elastic self-locking probe on the test point of the abnormal radio frequency signal, put the connected radio frequency circuit of the measured member and the elastic self-locking probe into the test oven or vacuum tank, output the test signal to the test system by the radio frequency cable, and perform the radio frequency signal test in the simulated interstellar space environment.

[0098] The radio frequency signal test method is applied in a production line, and is stable in performance in the simulated interstellar space environment condition (temperature cycle, thermal vacuum) test.

[0099] The content not described in detail in the specification of the present application is the known technology of the person skilled in the art.

Claims

1. A method for testing radio frequency signals in an interplanetary space environment, the method comprising: The application relates to a method for testing a radio frequency signal of a satellite-borne electronic product. The method comprises the following steps: under a room temperature environment, using a clamping probe to test radio frequency signals of all test points in the satellite-borne electronic product step by step, finding out abnormal test points of the radio frequency signals, determining an attenuator attenuation value of an elastic self-locking probe according to a maximum signal power value of the abnormal test points of the radio frequency signals, using the elastic self-locking probe with the attenuation value to test the abnormal test points of the radio frequency signals in the satellite-borne electronic product under a simulated interstellar space environment, and obtaining a signal spectrum. The method for testing the radio frequency signal of the satellite-borne electronic product under the simulated interstellar space environment comprises the following steps: finding out a flange fixing point on a shell structure of the satellite-borne electronic product which is closest to the abnormal test points of the radio frequency signals; measuring a horizontal offset between the abnormal test points of the radio frequency signals and the flange fixing point on the shell structure of the satellite-borne electronic product which is closest to the abnormal test points, measuring an elastic arc offset of a flange fixing point of the elastic self-locking probe, and calculating a probe elastic arc diameter; measuring a vertical drop between the abnormal test points of the radio frequency signals and the flange fixing point on the shell structure of the satellite-borne electronic product which is closest to the abnormal test points, measuring a length of a transition section of a probe of the elastic self-locking probe, and calculating the probe elastic arc diameter; selecting a shape of a probe end of the elastic self-locking probe according to an appearance of a test point in the satellite-borne electronic product, wherein a circle-shaped end elastic self-locking probe is used for a convex pin appearance test point, a needle-shaped end elastic self-locking probe is used for a hole-shaped appearance test point, and a hook-shaped end elastic self-locking probe is used for a flat appearance test point; assembling an attenuator, a direct-current eliminator, a base and a probe of the elastic self-locking probe into the elastic self-locking probe under a room temperature environment; fixing the base flange of the elastic self-locking probe on the flange fixing point on the shell structure of the satellite-borne electronic product which is closest to the abnormal test points of the radio frequency signals, and contacting the probe of the elastic self-locking probe on the abnormal test points of the radio frequency signals; measuring a radio frequency signal, putting the connected measured radio frequency circuit and the elastic self-locking probe into a test oven or a vacuum tank, outputting the radio frequency signal to a test system through a radio frequency cable, and testing the radio frequency signal under the simulated interstellar space environment to obtain a signal spectrum. The satellite-borne electronic product comprises a radio frequency circuit and a shell structure, the radio frequency circuit is installed on the shell structure, a test point in the satellite-borne electronic product is located on the radio frequency circuit of the satellite-borne electronic product, and a flange fixing point exists on the shell structure of the satellite-borne electronic product. The abnormal test points of the radio frequency signal refer to test points with radio frequency signal power less than 60% of a design value. The method for determining the attenuator attenuation value of the elastic self-locking probe comprises the following steps: when the maximum signal power value of the abnormal test points of the radio frequency signal is not greater than 20 dBm, the attenuator attenuation value is 3 dB; and when the maximum signal power value of the abnormal test points of the radio frequency signal is greater than 20 dBm, the attenuator attenuation value is an integral value of an absolute value of a difference between the maximum signal power value of the abnormal test points of the radio frequency signal and 17 dBm. ​ ​ ​ 2. The method of claim 1, wherein, ​ 3. The method of claim 1, wherein, ​ 4. The method of claim 1, wherein, ​ 5. The method of claim 1, wherein, The elastic self-locking probe comprises an elastic self-locking probe probe, an elastic self-locking probe base, an elastic self-locking probe direct-current isolator and an elastic self-locking probe attenuator; one end of the elastic self-locking probe probe contacts an internal test point of a satellite-borne electronic product, and the other end is connected to one end of the elastic self-locking probe base, for extracting a radio frequency signal and outputting the radio frequency signal to the elastic self-locking probe base; the other end of the elastic self-locking probe base is connected to one end of the elastic self-locking probe direct-current isolator, for providing a position fixing function for the elastic self-locking probe and outputting the radio frequency signal to the elastic self-locking probe direct-current isolator; the other end of the elastic self-locking probe direct-current isolator is connected to one end of the elastic self-locking probe attenuator, for a direct-current isolation function in radio frequency signal transmission; and the other end of the elastic self-locking probe attenuator is connected to a radio frequency test cable, for attenuating and outputting the radio frequency signal.

6. The method of claim 5, wherein, The elastic self-locking probe probe comprises an elastic self-locking probe probe transition section, an elastic self-locking probe probe elastic arc and an elastic self-locking probe probe tip; the elastic self-locking probe probe transition section is a straight section; the elastic self-locking probe probe elastic arc is a partial arc, and the elastic stress of the elastic self-locking probe probe material is used to compensate for various deformations in the interstellar space environment; and the elastic self-locking probe probe tip is in the shape of a hook, a ring or a needle, corresponding to three types of flat external shape, convex pin external shape and hole-shaped external shape of the internal test point of the satellite-borne electronic product.

7. The method of claim 5, wherein, The elastic self-locking probe base is connected to the elastic self-locking probe direct-current isolator at one end by means of an SMA flange coaxial connector, and is connected to the elastic self-locking probe probe at the other end by means of a hollow cylindrical welding sheet; and the flange of the elastic self-locking probe base is fixed on a flange fixing point of a shell structure of the satellite-borne electronic product by means of a screw.

8. The method of claim 1, wherein, The diameter H of the probe elastic arc is equal to 1.06(B-Y1), wherein B represents the vertical drop between the test point of the radio frequency signal anomaly and the flange fixing point on the shell structure of the satellite-borne electronic product closest to the test point, and Y1 represents the length of the elastic self-locking probe transition section.

9. The method of claim 1, wherein, The offset X2 of the probe elastic arc is equal to A-X1, wherein A represents the horizontal offset between the test point of the radio frequency signal anomaly and the flange fixing point on the shell structure of the satellite-borne electronic product closest to the test point, and X1 represents the offset of the elastic self-locking probe flange fixing point.

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