Test system and test method for vehicle-mounted chip

Abstract

The application discloses a kind of test system and test method of vehicle-mounted chip, belong to chip test technical field, the test system of vehicle-mounted chip includes: chip slot module, main control module, load module and power supply module, chip slot module is inserted for vehicle-mounted chip;Main control module is connected with chip slot module, is configured as sending test signal to vehicle-mounted chip, so that vehicle-mounted chip sends control signal according to test signal;Load module is connected with chip slot module, is configured as receiving control signal and sending first feedback signal to vehicle-mounted chip, vehicle-mounted chip sends second feedback signal to main control module according to first feedback signal, and main control module outputs test result according to second feedback signal;Power supply module is connected with chip slot module, main control module and load module, is configured as power supply to chip slot module, main control module and load module, it is favorable to shorten test cycle, improve test efficiency, ensure safety in practical application.

Description

Technical Field

[0001] This invention relates to the field of chip testing technology, and in particular to a testing system and method for automotive chips. Background Technology

[0002] With the rapid development of the domestic chip industry, the replacement applications of domestic chips in vehicles are gradually increasing. However, the rapid development of the industry has led to inconsistent quality of domestic chips. The functional indicators of domestic chips are difficult to meet the nominal requirements. In actual use, some performance indicators of domestic chips deviate, and some functions malfunction, posing a high safety risk.

[0003] In related technologies, the testing of automotive chips is usually done manually, which has the drawbacks of long testing cycles and low testing efficiency. Summary of the Invention

[0004] This invention aims to at least solve one of the technical problems existing in the prior art. To this end, this invention proposes a testing system for automotive chips, which helps to shorten the testing cycle, improve testing efficiency, and ensure safety in practical applications.

[0005] The present invention also proposes a testing method.

[0006] A testing system for an automotive chip according to a first aspect of the present invention includes: a chip slot module for inserting an automotive chip; a main control module connected to the chip slot module and configured to send a test signal to the automotive chip, causing the automotive chip to send a control signal according to the test signal; a load module connected to the chip slot module and configured to receive the control signal and send a first feedback signal to the automotive chip, wherein the automotive chip sends a second feedback signal to the main control module according to the first feedback signal, and the main control module outputs a test result according to the second feedback signal; and a power supply module connected to the chip slot module, the main control module, and the load module and configured to supply power to the chip slot module, the main control module, and the load module.

[0007] The vehicle-mounted chip testing system according to embodiments of the present invention has at least the following beneficial effects: the power supply module is used to supply power to the chip slot module, the main control module, and the load module. The chip slot module allows the vehicle-mounted chip under test to be plugged in, while the main control module and the load module are both connected to the chip slot module to realize the interaction between the main control module, the load module, and the vehicle-mounted chip. The main control module is configured to send test signals to the vehicle-mounted chip, causing the vehicle-mounted chip to send control signals according to the test signals. The load module receives the control signals and sends a first feedback signal to the vehicle-mounted chip. The vehicle-mounted chip sends a second feedback signal to the main control module according to the first feedback signal. The load module can simulate the application scenario of the vehicle-mounted chip in a vehicle to improve the accuracy and authenticity of the test. The main control module outputs the test results according to the second feedback signal to test whether the various functional indicators of the vehicle-mounted chip are normal and to realize the automatic testing of the vehicle-mounted chip. This helps to shorten the testing cycle of the vehicle-mounted chip, improve the testing efficiency, and ensure the safety of the vehicle-mounted chip in actual application scenarios.

[0008] According to some embodiments of the present invention, the testing system for automotive chips further includes an indicator module, which is connected to the main control module and configured to send a pass signal or a fail signal to the user based on the test results.

[0009] Specifically, to facilitate users' intuitive understanding of the test results of the automotive chip, the automotive chip testing system also includes an indicator module. The indicator module is connected to the main control module and is configured to send a pass or fail signal to the user based on the test results. In other words, the test results can be intuitively fed back to the user through the indicator module, eliminating the need for the user to constantly monitor the test results of the automotive chip, which helps designers complete the testing of the automotive chip.

[0010] According to a second aspect of the present invention, a test method is applied to a test system for an automotive chip as shown in the first aspect; the test method includes:

[0011] Insert the vehicle-mounted chip into the chip slot module;

[0012] The main control module sends test signals to the vehicle chip and controls the vehicle chip to send control signals according to the test signals;

[0013] The control load module sends a first feedback signal to the vehicle chip according to the control signal, and controls the vehicle chip to send a second feedback signal to the main control module according to the first feedback signal;

[0014] The main control module outputs the test results based on the second feedback signal.

[0015] The testing method according to embodiments of the present invention has at least the following beneficial effects: The testing method is applied to the testing system for automotive chips as shown in the first aspect. Both the main control module and the load module are connected to the chip slot module. Specifically, after the automotive chip under test is inserted into the chip slot module, interaction between the main control module, the load module, and the automotive chip is realized. The testing method can control the main control module to send test signals to the automotive chip according to the functional indicators to be tested, and control the automotive chip to send control signals according to the test signals. It also controls the load module to send a first feedback signal to the automotive chip according to the control signals, and controls the automotive chip to send a second feedback signal to the main control module according to the first feedback signal. The load module can simulate the application scenario of the automotive chip in a vehicle to improve the accuracy and realism of the test. The main control module outputs test results according to the second feedback signal to test whether the various functional indicators of the automotive chip are normal, and to realize automatic testing of the automotive chip. This helps to shorten the testing cycle of the automotive chip, improve testing efficiency, and ensure the safety of the automotive chip in actual application scenarios.

[0016] According to some embodiments of the present invention, the main control module sends a test signal to the vehicle-mounted chip and controls the vehicle-mounted chip to send a control signal according to the test signal, including:

[0017] The main control module sends a first signal to the vehicle chip and controls the vehicle chip to send a second signal that is the same as the first signal. The test signal includes the first signal and the control signal includes the second signal.

[0018] The control load module sends a first feedback signal to the on-board chip based on the control signal, and controls the on-board chip to send a second feedback signal to the main control module based on the first feedback signal, including:

[0019] The control load module receives the second signal and sends a third signal that is the same as the second signal, and controls the vehicle chip to send a fourth signal that is the same as the third signal to the main control module. The first feedback signal includes the third signal, and the second feedback signal includes the fourth signal.

[0020] Specifically, this test method controls the main control module to send a first signal to the vehicle-mounted chip, and controls the vehicle-mounted chip to send a second signal identical to the first signal, i.e., controls the vehicle-mounted chip to relay the first signal. The load module receives the second signal and sends a third signal identical to the second signal, i.e., controls the load module to feed back the same third signal to the vehicle-mounted chip. After receiving the third signal, the vehicle-mounted chip feeds back a fourth signal identical to the third signal to the main control module. This test method, through the relay of the same signal, facilitates testing of the vehicle-mounted chip's operating mode, network communication, electrical characteristics, and other functional indicators to determine if they are abnormal. It also enables automated testing of the vehicle-mounted chip, which helps shorten the testing cycle, improves testing efficiency, and ensures the safety of the vehicle-mounted chip in real-world applications.

[0021] According to some embodiments of the present invention, the main control module outputs test results based on a second feedback signal, including:

[0022] The main control module verifies the matching degree between the first signal and the fourth signal, and compares the matching degree with the first preset range to complete a communication test.

[0023] When the matching degree meets the first preset range, the communication test of the vehicle chip is deemed to have passed.

[0024] This test method controls the main control module to verify the matching degree between the first signal and the fourth signal, and compares the matching degree with the first preset range, that is, to determine whether the first signal and the fourth signal are consistent, so as to complete a communication test. In other words, this test method can automatically test whether the communication function of the vehicle chip is abnormal, so as to ensure the normal communication of the vehicle chip in actual application scenarios and ensure that the upper and lower level components of the vehicle chip can operate normally.

[0025] According to some embodiments of the present invention, the main control module outputs test results based on a second feedback signal, including:

[0026] The main control module measures the bit time of multiple fields in the fourth signal and compares the bit time with the second preset range.

[0027] If the bit time meets the second preset range, the bit time test of the vehicle chip is deemed to have passed.

[0028] This test method, after the vehicle chip sends the fourth signal to the main control module, can control the main control module to measure the bit time of multiple fields in the fourth signal, compare the bit time with a second preset range to complete a bit time test. When the bit time meets the second preset range, the bit time test of the vehicle chip is determined to be passed. This test method, by passing the bit time test, helps to ensure the data transmission rate of the vehicle chip when used in vehicles, can verify whether the vehicle chip can accurately generate and receive synchronization signals, helps to avoid communication failures and data loss problems, and can more accurately evaluate the performance of the vehicle chip to determine whether the performance of the vehicle chip meets the nominal requirements.

[0029] According to some embodiments of the present invention, the main control module outputs test results based on a second feedback signal, including:

[0030] The main control module measures the duty cycle of the dominant and recessive levels in the fourth signal and compares the duty cycle with the third preset range.

[0031] When the duty cycle meets the third preset range, the duty cycle test of the vehicle chip is deemed to have passed.

[0032] Specifically, after the onboard chip sends the fourth signal to the main control module, the test method can control the main control module to measure the duty cycle of the dominant and recessive levels in the fourth signal. The duty cycle is compared with a third preset range to complete a duty cycle test. When the duty cycle meets the third preset range, the duty cycle test of the onboard chip is deemed to have passed. This test method can verify the accuracy and stability of the onboard chip when generating signals through the duty cycle test, which helps to evaluate the performance of the onboard chip in energy management, helps to detect potential faults or problems in a timely manner, avoid serious safety accidents in actual applications, and can more accurately evaluate the performance of the onboard chip to determine whether the performance of the onboard chip meets the nominal requirements.

[0033] According to some embodiments of the present invention, the main control module outputs test results based on a second feedback signal, including:

[0034] The main control module verifies whether the message attributes of the fourth signal meet the preset standards;

[0035] If the message attributes meet the preset standards, the message attribute test of the vehicle chip is deemed to have passed.

[0036] Specifically, after the onboard chip sends the fourth signal to the main control module, the test method can control the main control module to verify whether the message attributes of the fourth signal meet the preset standards, that is, to verify whether the message attributes of the signal sent by the onboard chip meet expectations. By testing the message attributes, it is beneficial to ensure the correct transmission and parsing of information. While ensuring signal integrity, it reduces or avoids the impact of communication delays or interruptions on vehicle safety and performance. It can more accurately evaluate the performance of the onboard chip to determine whether the performance of the onboard chip meets the nominal requirements.

[0037] According to some embodiments of the present invention, the test method further includes:

[0038] Multiple communication tests were conducted on the vehicle-mounted chip;

[0039] In multiple communication tests, the throughput of multiple first signals increases until the matching degree verified by the main control module exceeds the first preset range. At this point, the current communication test of the vehicle chip is determined to be unsuccessful, and the throughput of the first signal in the current communication test is taken as the maximum bus communication bandwidth.

[0040] This testing method performs multiple communication tests on the automotive chip. In these tests, the throughput of multiple first signals increases sequentially until the matching degree verified by the main control module exceeds a first preset range. This means that the throughput of the first signal is too high, causing the current communication test of the automotive chip to fail. The throughput of the first signal in the current communication test is taken as the maximum bus communication bandwidth. This testing method, by testing the maximum bus communication bandwidth, helps to measure whether the transmission capability of the automotive chip meets the nominal requirements. It can objectively evaluate the chip's data transmission capability and ensure that the chip's maximum bus communication bandwidth matches that of other components in the vehicle during the application of the automotive chip, thereby ensuring the stability and reliability of data transmission.

[0041] According to some embodiments of the present invention, the test method further includes:

[0042] The power supply module controls the power supply to the vehicle chip to increase or decrease in increments of a first voltage.

[0043] Each time the power supply increases or decreases by the first voltage, multiple communication tests are performed on the vehicle chip. When multiple communication tests pass, the power supply module is controlled to continue to increase or decrease the power supply.

[0044] Until the communication test of the vehicle chip fails, the control power supply module stops increasing or decreasing the power supply, and uses the current power supply of the communication test as the limit voltage of the vehicle chip.

[0045] This testing method controls the power supply module to increase or decrease the power supply to the automotive chip at a first voltage level. Each time the power supply increases or decreases by the first voltage, multiple communication tests are performed on the automotive chip. The success or failure of these communication tests determines whether the automotive chip is approaching its voltage limit for stable operation. If multiple communication tests pass, the power supply module continues to increase or decrease the power supply until the communication test of the automotive chip fails. At this point, the power supply module stops increasing or decreasing the power supply, and the current power supply level from the communication test is taken as the voltage limit of the automotive chip. This helps to understand the chip's voltage tolerance limit and helps avoid exceeding the voltage tolerance range of the automotive chip in practical applications, ensuring the safety of the automotive chip in vehicle applications.

[0046] Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0047] The present invention will be further described below with reference to the accompanying drawings and embodiments, wherein:

[0048] Figure 1 This is a schematic diagram of the structure of a testing system for an automotive chip according to an embodiment of the present invention;

[0049] Figure 2 This is a flowchart of a testing method according to an embodiment of the present invention;

[0050] Figure 3 This is a flowchart illustrating the transmission of the first, second, third, and fourth signals in a test method according to an embodiment of the present invention.

[0051] Figure 4 This is a flowchart of a communication test method according to an embodiment of the present invention;

[0052] Figure 5 This is a flowchart of a bit-time test method according to an embodiment of the present invention;

[0053] Figure 6 This is a flowchart of a duty cycle test method according to an embodiment of the present invention;

[0054] Figure 7 This is a flowchart of a message attribute test method according to an embodiment of the present invention;

[0055] Figure 8 This is a flowchart illustrating the maximum bus communication bandwidth test of a test method according to an embodiment of the present invention;

[0056] Figure 9 This is a flowchart of the limit voltage test of a test method according to an embodiment of the present invention. Detailed Implementation

[0057] Embodiments of the present invention are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and should not be construed as limiting the present invention.

[0058] In the description of this invention, it should be understood that the orientation descriptions, such as up, down, etc., are based on the orientation or positional relationship shown in the drawings and are only for the convenience of describing this invention and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this invention.

[0059] In the description of this invention, "multiple" refers to two or more. The use of "first" and "second" is for distinguishing technical features only and should not be construed as indicating or implying relative importance, or implicitly indicating the number of indicated technical features or their sequential relationship.

[0060] In the description of this invention, unless otherwise explicitly defined, terms such as "set up," "install," and "connect" should be interpreted broadly, and those skilled in the art can reasonably determine the specific meaning of the above terms in this invention in conjunction with the specific content of the technical solution.

[0061] Reference Figure 1 As shown, a test system for an automotive chip according to an embodiment of the present invention includes: a chip slot module, a main control module, a load module, and a power supply module.

[0062] Reference Figure 1 As shown, the power supply module is connected to the chip slot module, the main control module, and the load module, and is configured to supply power to these modules. The chip slot module allows for the insertion of automotive chips. Both the main control module and the load module are connected to the chip slot module to enable interaction between the main control module, the load module, and the automotive chips.

[0063] Reference Figure 1 As shown, the main control module is configured to send a test signal to the vehicle chip, causing the vehicle chip to send a control signal based on the test signal; the load module is configured to receive the control signal and send a first feedback signal to the vehicle chip, the vehicle chip sends a second feedback signal to the main control module based on the first feedback signal, and the main control module outputs the test result based on the second feedback signal.

[0064] Reference Figure 1 As shown, the load module can simulate the application scenario of automotive chips in vehicles to improve the accuracy and authenticity of the test. The main control module outputs the test results according to the second feedback signal to test whether the various functional indicators of the automotive chip are normal and realize the automatic testing of the automotive chip. This helps to shorten the test cycle of the automotive chip, improve test efficiency, and ensure the safety of the automotive chip in actual application scenarios.

[0065] Reference Figure 1 As shown, specifically, the power supply module includes a transformer and a low dropout regulator (LDO) step-down chip, thereby providing a stable power output to the main control module, chip slot module and load module, making the power supply module suitable for use in miniaturized, low-power scenarios with high requirements for power stability, namely, simulating vehicle use scenarios.

[0066] Reference Figure 1 As shown, specifically, the power supply module provides 12V, 5V, and 3.3V power supply voltages to the main control module, chip slot module, and load module, respectively, to meet the voltage requirements for normal operation of these modules. The vehicle-mounted chip can be a Local Interconnect Network (LIN) chip.

[0067] Reference Figure 1 As shown, it is understandable that, in order to facilitate users' intuitive understanding of the test results of the automotive chip, the automotive chip test system also includes an indicator module. The indicator module is connected to the main control module and is configured to send a pass signal or a fail signal to the user based on the test results. That is, the test results can be intuitively fed back to the user through the indicator module, without the user having to constantly monitor the test results of the automotive chip, which is beneficial to assisting designers in completing the test of the automotive chip.

[0068] Reference Figure 1 As shown, specifically, the indicator module can be an indicator light. When the test result of the main control module indicates that the vehicle chip has passed the test, the indicator light will light up, which sends a pass signal to the user. When the test result of the main control module indicates that the vehicle chip has failed the test, the indicator light will turn off or light up with a different color, which sends a fail signal to the user. In other words, the test result can be intuitively fed back to the user through the indicator module, without the user having to constantly monitor the test result of the vehicle chip. This is beneficial for assisting designers in completing the test of the vehicle chip.

[0069] Reference Figure 1 As shown, it can be understood that the main control module uses a microcontroller unit (MCU) as the main control unit to provide an automated test program for the automotive chip under test, so as to automatically send test signals to the automotive chip and enable the automotive chip to automatically traverse the test program.

[0070] Reference Figure 1 As shown, after the vehicle chip under test is plugged into the chip slot module, the main control module can interact with the vehicle chip through interfaces such as serial port, general purpose input / output ports (GPIO), and universal asynchronous receiver / transmitter (UART) to realize automatic testing of the vehicle chip.

[0071] Reference Figures 1 to 9 As shown, a testing method according to an embodiment of the present invention is applied to the testing system for automotive chips shown in any of the above embodiments. The testing method includes the following steps:

[0072] Step S100: Insert the vehicle chip into the chip slot module;

[0073] Step S200: Control the main control module to send a test signal to the vehicle chip, and control the vehicle chip to send a control signal according to the test signal;

[0074] In step S300, the load control module sends a first feedback signal to the vehicle chip according to the control signal, and controls the vehicle chip to send a second feedback signal to the main control module according to the first feedback signal.

[0075] In step S400, the main control module outputs the test results based on the second feedback signal.

[0076] Reference Figure 1 and Figure 2 As shown, in step S100, both the main control module and the load module are connected to the chip slot module. Specifically, after the vehicle chip is plugged into the chip slot module, the interaction between the main control module, the load module and the vehicle chip is realized.

[0077] Reference Figure 1 and Figure 2 As shown, in step S200, the test method can control the main control module to send test signals to the vehicle chip according to the functional indicators to be tested, and control the vehicle chip to send control signals according to the test signals.

[0078] Reference Figure 1 and Figure 2 As shown, in step S300, the control load module sends a first feedback signal to the vehicle chip according to the control signal, and the control vehicle chip sends a second feedback signal to the main control module according to the first feedback signal. The load module can simulate the application scenario of the vehicle chip in the vehicle to improve the accuracy and authenticity of the test.

[0079] Reference Figure 1 and Figure 2 As shown, in step S400, the test method controls the main control module to output test results according to the second feedback signal, so as to test whether the various functional indicators of the vehicle chip are normal and realize the automatic testing of the vehicle chip. This helps to shorten the test cycle of the vehicle chip, improve test efficiency, and ensure the safety of the vehicle chip in actual application scenarios.

[0080] Reference Figure 1 and Figure 3 As shown, it can be understood that in step S200 of this test method, the main control module sends a test signal to the on-board chip, and the on-board chip sends a control signal according to the test signal, including the following steps:

[0081] Step S210: Control the main control module to send a first signal to the vehicle chip, and control the vehicle chip to send a second signal that is the same as the first signal. The test signal includes the first signal, and the control signal includes the second signal.

[0082] Reference Figure 1 and Figure 3As shown, this test method controls the main control module to send a first signal to the vehicle chip, and controls the vehicle chip to send a second signal that is the same as the first signal, that is, controls the vehicle chip to transmit the first signal.

[0083] Reference Figure 1 and Figure 3 As shown, in step S300 of this test method, the control load module sends a first feedback signal to the vehicle chip according to the control signal, and controls the vehicle chip to send a second feedback signal to the main control module according to the first feedback signal, including the following steps:

[0084] Step S310: Control the load module to receive the second signal and send a third signal that is the same as the second signal, and control the vehicle chip to send a fourth signal that is the same as the third signal to the main control module. The first feedback signal includes the third signal, and the second feedback signal includes the fourth signal.

[0085] Reference Figure 1 and Figure 3 As shown, this test method controls the load module to receive a second signal and send a third signal identical to the second signal. That is, it controls the load module to feed back the same third signal to the vehicle chip. After receiving the third signal, the vehicle chip relays the same fourth signal to the main control module. In other words, the test method uses the relay of the same signal to test whether the functional indicators such as the working mode, network communication, and electrical characteristics of the vehicle chip are normal, and to realize the automatic testing of the vehicle chip. This helps to shorten the testing cycle of the vehicle chip, improve testing efficiency, and ensure the safety of the vehicle chip in real-world applications.

[0086] Reference Figure 1 and Figure 2 As shown, it can be understood that in step S200 of this test method, the main control module sends a test signal to the on-board chip, and the on-board chip sends a control signal according to the test signal, including the following steps:

[0087] Step S220: The main control module pulls down the sleep / wake-up pin of the vehicle chip under test through the GPIO port, so that the vehicle chip enters sleep mode;

[0088] Step S230: After a first preset time, the main control module reads the pin status of the vehicle chip and determines whether the vehicle chip has entered sleep mode normally.

[0089] Reference Figure 1 and Figure 2 As shown, the hibernation function allows the automotive chip to reduce power consumption and enter a low-power state when it does not need to perform operations, which helps to save energy, especially in scenarios where the vehicle is powered by a battery, and can significantly extend the life of the vehicle battery.

[0090] Reference Figure 1and Figure 2 As shown, this test method can verify the power management capabilities of the automotive chip in different working modes (such as standby mode, sleep mode, etc.) through the sleep function test, and ensure that the automotive chip can correctly enter and maintain a low power consumption state.

[0091] Reference Figure 1 and Figure 2 As shown, it can be understood that in step S200 of this test method, the main control module sends a test signal to the on-board chip, and the on-board chip sends a control signal according to the test signal, including the following steps:

[0092] Step S240: The main control module sends a wake-up message to the vehicle chip via the UART port;

[0093] In step S250, after a second preset time, the main control module pulls up the sleep / wake-up pin of the vehicle chip and reads the pin status of the vehicle chip to determine whether the vehicle chip has entered the preset standard mode normally.

[0094] Reference Figure 1 and Figure 2 As shown, this test method also performs a wake-up function test on the automotive chip. The wake-up function test verifies the ability of the automotive chip to quickly recover from a low-power state (such as sleep mode) to a normal working state, which directly affects the device's response speed and user experience. A fast and reliable wake-up function can allow users to experience a smoother operation during use.

[0095] Reference Figure 1 and Figure 2 As shown, this test method can also verify the power management and signal processing capabilities of the vehicle chip during the wake-up process through the wake-up function test, including verifying whether the vehicle chip can correctly receive the wake-up signal, adjust the power supply, and restore the previous working state, so as to ensure that the chip will not have problems such as power fluctuations and signal interference during the wake-up process.

[0096] It should be noted that the first and second preset times can be adjusted according to actual needs. For example, the first and second preset times can be set to 5s, 6s, 7s, etc.

[0097] Reference Figure 1 and Figure 4 As shown, it can be understood that in step S400 of this test method, the main control module outputs the test result according to the second feedback signal, including the following steps:

[0098] Step S410: Control the main control module to verify the matching degree between the first signal and the fourth signal, and compare the matching degree with the first preset range to complete a communication test;

[0099] Step S420: When the matching degree meets the first preset range, the communication test of the vehicle chip is determined to be passed.

[0100] Reference Figure 1 and Figure 4 As shown, the test method controls the main control module to verify the matching degree between the first signal and the fourth signal, and compares the matching degree with the first preset range, that is, to determine whether the first signal and the fourth signal are consistent, so as to complete a communication test.

[0101] When the matching degree meets the first preset range, that is, when the matching degree falls within the range of the first preset range, the communication test of the vehicle chip is considered to have passed. When the matching degree exceeds the range of the first preset range, the communication test of the vehicle chip is considered to have failed.

[0102] This testing method can automatically test the communication function of automotive chips to ensure that the automotive chips can communicate normally in practical applications.

[0103] Reference Figure 1 and Figure 5 As shown, it can be understood that in step S400 of this test method, the main control module outputs the test result according to the second feedback signal, including the following steps:

[0104] Step S430: Control the main control module to measure the bit time of multiple fields in the fourth signal and compare the bit time with the second preset range;

[0105] In step S440, if the bit time meets the second preset range, the bit time test of the vehicle chip is determined to be passed.

[0106] Reference Figure 1 and Figure 5 As shown, after the vehicle chip sends the fourth signal to the main control module, the test method can control the main control module to measure the bit time of multiple fields in the fourth signal, and compare the bit time with the second preset range to complete a bit time test.

[0107] If the bit time meets the second preset range, that is, if the bit time falls within the range of the first preset range, the bit time test of the automotive chip is determined to be passed. If the bit time exceeds the second preset range, the test method determines that the bit time test of the automotive chip is failed.

[0108] This testing method, through bit-time testing, helps ensure the data transmission rate of automotive chips in vehicle applications. It can verify whether automotive chips can accurately generate and receive synchronization signals, which helps avoid communication failures and data loss. It can also more accurately evaluate the performance of automotive chips to determine whether their performance meets the nominal requirements.

[0109] Reference Figure 1 and Figure 5As shown, specifically, this test method can control the main control module to test the bit time of multiple fields in the fourth signal. The multiple bit times include, but are not limited to: synchronization field, identifier field, data field, and checksum field.

[0110] Reference Figure 1 and Figure 6 As shown, it can be understood that in step S400 of this test method, the main control module outputs the test result according to the second feedback signal, including the following steps:

[0111] Step S450: Control the main control module to measure the duty cycle of the dominant level and the recessive level in the fourth signal, and compare the duty cycle with the third preset range;

[0112] Step S460: When the duty cycle meets the third preset range, the duty cycle test of the vehicle chip is determined to be passed.

[0113] Reference Figure 1 and Figure 6 As shown, specifically, after the vehicle chip sends the fourth signal to the main control module, the test method can control the main control module to measure the duty cycle of the dominant and recessive levels in the fourth signal, and compare the duty cycle with the third preset range to complete a duty cycle test.

[0114] When the duty cycle meets the third preset range, that is, when the duty cycle falls within the range of the third preset range, the duty cycle test of the vehicle chip is deemed to have passed. When the duty cycle exceeds the third preset range, the test method determines that the duty cycle test of the vehicle chip has failed.

[0115] This test method verifies the accuracy and stability of automotive chips when generating signals through duty cycle testing. It helps to evaluate the performance of automotive chips in energy management, helps to detect potential faults or problems in a timely manner, avoids serious safety accidents in practical applications, and can more accurately evaluate the performance of automotive chips to determine whether the performance of automotive chips meets the nominal requirements.

[0116] It should be noted that the first, second, and third preset ranges can be adjusted according to the actual application scenario, the type and specifications of the automotive chip, etc., which will not be elaborated here.

[0117] Reference Figure 1 and Figure 7 As shown, it can be understood that in step S400 of this test method, the main control module outputs the test result according to the second feedback signal, including the following steps:

[0118] Step S470: Control the main control module to verify whether the message attributes of the fourth signal meet the preset standard;

[0119] Step S480: When the message attributes meet the preset standards, the message attribute test of the vehicle chip is deemed to have passed.

[0120] Reference Figure 1 and Figure 7 As shown, specifically, after the vehicle chip sends the fourth signal to the main control module, the test method can control the main control module to verify whether the message attributes of the fourth signal meet the preset standard, that is, to verify whether the message attributes of the signal sent by the vehicle chip meet the expectations. By testing the message attributes, it is beneficial to ensure the correct transmission and parsing of information. While ensuring signal integrity, it reduces or avoids the impact of communication delays or interruptions on vehicle safety and performance. It can more accurately evaluate the performance of the vehicle chip to determine whether the performance of the vehicle chip meets the nominal requirements.

[0121] Reference Figure 1 and Figure 8 As shown, it is understandable that this testing method also includes the following steps:

[0122] Step S500: Perform multiple communication tests on the vehicle-mounted chip;

[0123] In step S600, during multiple communication tests, the throughput of multiple first signals increases until the matching degree verified by the main control module exceeds the first preset range. Then, it is determined that the current communication test of the vehicle chip fails, and the throughput of the first signal in the current communication test is taken as the maximum bus communication bandwidth.

[0124] Reference Figure 1 and Figure 8 As shown, the test method performs multiple communication tests on the vehicle chip. In the multiple communication tests, the throughput of multiple first signals increases sequentially until the matching degree verified by the main control module exceeds the first preset range. That is, the throughput of the first signal is too large, causing the current communication test of the vehicle chip to fail. The throughput of the first signal in the current communication test is taken as the maximum bus communication bandwidth.

[0125] The testing method, by testing the maximum bus communication bandwidth, is beneficial for measuring whether the transmission capability of the automotive chip meets the nominal requirements. It can objectively evaluate the chip's data transmission capability and ensure that the chip's maximum bus communication bandwidth matches that of other components in the vehicle during the application of automotive chips, thereby ensuring the stability and reliability of data transmission.

[0126] Reference Figure 1 and Figure 9 As shown, it is understandable that this testing method also includes the following steps:

[0127] Step S700: Control the power supply module to increase or decrease the power supply to the vehicle chip in increments of the first voltage.

[0128] Step S800: When the power supply increases or decreases by the first voltage, perform multiple communication tests on the vehicle chip. When multiple communication tests pass, control the power supply module to continue to increase or decrease the power supply.

[0129] Step S900 continues until the communication test of the vehicle chip fails, then the power supply module is controlled to stop increasing or decreasing the power supply, and the current power supply of the communication test is used as the limit voltage of the vehicle chip.

[0130] Reference Figure 1 and Figure 9 As shown, this testing method controls the power supply module to increase or decrease the power supply to the vehicle chip at a first voltage level. Each time the power supply increases or decreases by the first voltage, multiple communication tests are performed on the vehicle chip. The success or failure of these tests determines whether the vehicle chip is approaching its voltage limit for stable operation. If multiple communication tests pass, the power supply module continues to increase or decrease the power supply until the communication test fails. At this point, the power supply module stops increasing or decreasing the power supply, and the current power supply level from the communication test is used as the voltage limit of the vehicle chip. This helps to understand the chip's voltage tolerance limit and prevents exceeding the voltage tolerance range of the vehicle chip in practical applications, ensuring the safety of the vehicle chip in vehicle use.

[0131] Reference Figure 1 and Figure 9 As shown below, this test method is illustrated using 0.01V as the first voltage and four sets of limit voltage test groups as an example:

[0132] ① The main control module controls the power supply module to gradually increase the 12V power supply voltage of the vehicle chip under test in 0.01V increments, and simultaneously performs communication tests on the vehicle chip. For every 0.01V increase, the vehicle chip is tested 3 times. If all 3 communication tests are successful, the power supply voltage is increased until the communication test fails.

[0133] ② The main control module controls the power supply module to gradually reduce the 12V power supply voltage of the vehicle chip under test in 0.01V increments, and simultaneously performs communication tests on the vehicle chip. For every 0.01V reduction, the vehicle chip is tested 3 times. If all 3 communication tests are successful, the power supply voltage is reduced further until the communication test fails.

[0134] ③ The main control module controls the power supply module to gradually increase the 5V power supply voltage of the vehicle chip under test in 0.01V increments, and simultaneously performs communication tests on the vehicle chip. For every 0.01V increase, the vehicle chip is tested 3 times. If all 3 communication tests are successful, the power supply voltage is increased until the communication test fails.

[0135] ④ The main control module controls the power supply module to gradually reduce the 5V power supply voltage of the vehicle chip under test in 0.01V increments, and simultaneously performs communication tests on the vehicle chip. For every 0.01V reduction, the vehicle chip is tested 3 times. If all 3 communication tests are successful, the power supply voltage is reduced further until the communication test fails.

[0136] Understandably, to facilitate users' intuitive understanding of the automotive chip's test results, the automotive chip testing system also includes an indicator module. This indicator module is connected to the main control module and is configured to send pass or fail signals to the user based on the test results. In other words, the indicator module provides intuitive feedback to the user, eliminating the need for constant monitoring of the automotive chip's test results, thus assisting designers in completing the testing of the automotive chip. Specifically, the indicator module is an indicator light.

[0137] This testing method also includes the following steps:

[0138] When the communication test, bit time test, duty cycle test, and message attribute test of the vehicle chip pass, the control indicator light will light up to send a qualified signal to the user.

[0139] If any of the following tests of the vehicle chip—communication test, bit time test, duty cycle test, and message attribute test—fail, the control indicator light will remain off to send a failure signal to the user.

[0140] This testing method can intuitively feed the test results back to the user through the indicator module, eliminating the need for the user to constantly monitor the test results of the automotive chip, which helps designers complete the testing of the automotive chip.

[0141] Those skilled in the art will understand that embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0142] This invention is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0143] The embodiments of the present invention have been described in detail above with reference to the accompanying drawings. However, the present invention is not limited to the above embodiments. Within the scope of knowledge possessed by those skilled in the art, various changes can be made without departing from the spirit of the present invention.

Claims

1. A test method for a test system for automotive chips, characterized in that, The testing system for the vehicle-mounted chip includes: Chip slot module for connecting automotive chips; The main control module, connected to the chip slot module, is configured to send a test signal to the vehicle chip, so that the vehicle chip sends a control signal according to the test signal; The load module, connected to the chip slot module, is configured to receive the control signal and send a first feedback signal to the vehicle chip, the vehicle chip sends a second feedback signal to the main control module according to the first feedback signal, and the main control module outputs the test result according to the second feedback signal. A power supply module, connected to the chip slot module, the main control module and the load module, is configured to supply power to the chip slot module, the main control module and the load module; The test method includes: The vehicle-mounted chip is inserted into the chip slot module; The main control module is controlled to send the test signal to the vehicle chip, and the vehicle chip is controlled to send the control signal according to the test signal. The load module is controlled to send the first feedback signal to the vehicle chip according to the control signal, and the vehicle chip is controlled to send the second feedback signal to the main control module according to the first feedback signal; The main control module outputs the test results based on the second feedback signal; The process of controlling the main control module to send the test signal to the vehicle-mounted chip and controlling the vehicle-mounted chip to send the control signal according to the test signal includes: The main control module is controlled to send a first signal to the vehicle chip, and the vehicle chip is controlled to send a second signal that is the same as the first signal. The test signal includes the first signal, and the control signal includes the second signal. The control of the load module to send the first feedback signal to the vehicle chip according to the control signal, and the control of the vehicle chip to send the second feedback signal to the main control module according to the first feedback signal, includes: The load module is controlled to receive the second signal and send a third signal identical to the second signal, and the vehicle chip is controlled to send a fourth signal identical to the third signal to the main control module. The first feedback signal includes the third signal, and the second feedback signal includes the fourth signal. The control module outputs test results based on the second feedback signal, including: The main control module is controlled to verify the matching degree between the first signal and the fourth signal, and the matching degree is compared with a first preset range to complete a communication test. When the matching degree meets the first preset range, the communication test of the vehicle chip is deemed to have passed.

2. The testing method of the vehicle-mounted chip testing system according to claim 1, characterized in that: The testing system for the vehicle-mounted chip also includes an indicator module, which is connected to the main control module and configured to send a pass signal or a fail signal to the user based on the test results.

3. The test method of the test system for the vehicle-mounted chip according to claim 1, characterized in that: The testing method also includes: The vehicle-mounted chip underwent multiple communication tests. In multiple communication tests, the throughput of multiple first signals increases until the matching degree verified by the main control module exceeds the first preset range. At this point, it is determined that the current communication test of the vehicle chip fails, and the throughput of the first signal in the current communication test is taken as the maximum bus communication bandwidth.

4. The test method of the test system for the vehicle-mounted chip according to claim 1, characterized in that: The testing method also includes: The power supply module is controlled to increase or decrease the power supply to the vehicle chip in increments of a first voltage. As the power supply increases or decreases the first voltage, the vehicle chip undergoes multiple communication tests. When all the communication tests pass, the power supply module is controlled to continue increasing or decreasing the power supply. Until the communication test of the vehicle chip fails, the power supply module is controlled to stop increasing or decreasing the power supply, and the current power supply of the communication test is used as the limit voltage of the vehicle chip.

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