Data processing method and device for vehicle testing, test equipment, test system and storage medium

Abstract

The present application discloses a data processing method and device, test equipment, test system and storage medium for whole vehicle testing, which are applied to the field of testing technology. The data processing method for whole vehicle testing comprises: obtaining identification information of each write operation object in a target test case of the whole vehicle, and data to be written corresponding to each write operation object; taking the combination of the identification information of each write operation object and the data to be written as a set element respectively, and constructing a data write set; if the data write process is triggered, writing the data to all the data to be written in the set, and writing the data into the hardware test environment of the whole vehicle at the same time, thereby reducing the cumulative delay of the write operation and improving the writing efficiency of the data to be written.

Description

Technical Field

[0001] The present application relates to the field of testing technology, and in particular to a data processing method and device, testing equipment, a testing system and a storage medium for whole vehicle testing. Background Art

[0002] In the process of testing multiple related functions of the device to be tested, a combined test case can be set according to the test cases corresponding to different functions. During the execution of the combined test case, the data to be written corresponding to the write operation object in each test case in the combined test case needs to be written serially to the device to be tested. However, when the number of test cases increases, the number of write operation objects also increases, and this serial writing method affects the efficiency of data writing. Summary of the invention

[0003] In view of the above problems, the present application provides a data processing method and device, test equipment, test system and storage medium for whole vehicle testing, aiming to alleviate the problem of low writing efficiency of data to be written due to serial writing of data to be written.

[0004] In the first aspect, the present application provides a data processing method for whole vehicle testing, including: obtaining identification information of each write operation object in a target test case of the whole vehicle, and the data to be written corresponding to each write operation object; taking the combination of the identification information of each write operation object and the data to be written as a set element, respectively, to construct a data write set; if the data write process is triggered, writing the data to all the data to be written in the set, and at the same time writing it into the hardware test environment of the whole vehicle, so as to change the data values ​​of each write operation object in the hardware test environment, so that the observed signal value of the signal to be observed corresponding to the write operation object in the hardware test environment changes with the change of the data written by the write operation object, and then reading the changed observation signal value to perform whole vehicle testing.

[0005] In an embodiment of the present application, the identification information of each write operation object and the combination of the data to be written are respectively used as a set element to construct a data write set. Each set element in the data write set contains the identification information of the write operation object and the corresponding data to be written. Multiple set elements are integrated together to prepare for subsequent synchronous write operations. When the data write process is triggered, the write operations are no longer executed one by one, but all the data to be written in a data write set are synchronously written to the test environment. Since all write operations are completed at the same time or approximately the same time, this synchronous writing method can reduce the cumulative delay of the write operation, improve the writing efficiency of the data to be written corresponding to a single test case, and thereby improve the writing efficiency of the combined test case.

[0006] In one embodiment, a target test case of the whole vehicle is obtained; and identification information corresponding to each write operation object and data to be written corresponding to each write operation object are extracted from the target test case.

[0007] In the embodiment of the present application, the target test case provides a unified standard and format for testing. By directly extracting the identification information corresponding to each write operation object and the data to be written corresponding to each write operation object from the target test case, the accuracy and consistency of the data can be ensured, errors that may be introduced by manual input or calculation can be avoided, and the accuracy of the constructed data write set can be improved.

[0008] In one embodiment, identification information of each write operation object is extracted from the target test case of the whole vehicle, and a write operation object database is established based on the identification information of all write operation objects; the write operation object database is loaded into the hardware test environment of the whole vehicle, and an association relationship between the test tool and the hardware test environment of the whole vehicle is established; if the data writing process is triggered, based on the association relationship, all the data to be written in the data write set are simultaneously written into the hardware test environment of the whole vehicle.

[0009] In the embodiment of the present application, a data transmission channel can be established between the test tool of the test device and the hardware test environment corresponding to the device to be tested through the association relationship between the test tool and the test environment. Based on the data transmission channel, the data to be written of each write operation object is written into the hardware test environment of the device to be tested, so that real-time writing of the data to be written can be achieved. Moreover, by establishing an association relationship between the test tool and the hardware test environment corresponding to the device to be tested, accurate synchronous writing of the data to be written can be ensured, thereby further enhancing the accuracy of the test.

[0010] In one embodiment, if the data writing process is triggered, a test script is generated according to the data writing set; the test script is executed, and based on the association relationship, all the data to be written in the data writing set are simultaneously written into the hardware test environment of the entire vehicle.

[0011] In the embodiment of the present application, by writing a test script and synchronously writing all the data to be written in the data write set into the test environment based on the association relationship, the writing process of the data to be written can be automatically executed, thereby improving the writing efficiency.

[0012] In one embodiment, feedback results from a hardware test environment are received, and the write status of each data to be written is determined based on the feedback results; based on the write status, a target write operation object where the write failed is determined; and based on the target write operation object and the data to be written corresponding to the target write operation object, the cause of the write failure is determined.

[0013] In the embodiment of the present application, by receiving the feedback results of the hardware test environment, the writing status of the data to be written can be timely understood to ensure the accuracy of the data. The target write operation object of the write failure is determined, so that the problem location is more accurate and the erroneous data caused by misjudgment or omission is reduced. In addition, by analyzing and determining the cause of the write failure, it is helpful to optimize and improve the write process and further improve the stability and reliability of the test system.

[0014] In one embodiment, if the reading process of the observation signal value is triggered, the time difference of reading the observation signal values ​​corresponding to each signal to be observed is obtained according to the observation signal value reading set; the reading time point of the observation signal value of each signal to be observed is obtained according to the start reading time point and the time difference of reading the observation signal values ​​corresponding to each signal to be observed, wherein the start reading time point of the observation signal value corresponding to each signal to be observed is the same; the observation signal value corresponding to the signal to be observed is read based on the reading time point, wherein, if the data to be written corresponding to the write operation object changes, the observation signal value of the signal to be observed corresponding to the write operation object in the test environment changes.

[0015] In the embodiment of the present application, the start reading time point of each signal to be observed is uniformly determined. Since the reading time points of all the signals to be observed are calculated based on the same time reference, even if there is a time difference in some signals to be observed, this delay can be compensated by reading in advance, so that the observation signal values ​​read by all the signals to be observed are more accurate.

[0016] In one embodiment, according to the observed signal value determination set, the expected value, observed signal value and numerical tolerance corresponding to each signal to be observed are obtained; based on the expected value, observed signal value and numerical tolerance corresponding to each signal to be observed, the test results corresponding to each signal to be observed are obtained.

[0017] In the embodiment of the present application, by automatically comparing the expected value, observed signal value and numerical tolerance corresponding to each signal to be observed, the test result corresponding to each signal to be observed is obtained, which can intuitively reflect whether the observed signal value of the signal to be observed meets the expectation, achieve the automated testing effect of each signal to be observed, and improve the accuracy and objectivity of the test results.

[0018] In a second aspect, the present application provides a data processing device for vehicle testing, comprising:

[0019] The use case processing module is used to obtain the identification information of each write operation object in the target test case of the whole vehicle, and the data to be written corresponding to each write operation object; the combination of the identification information of each write operation object and the data to be written is used as a set element to construct a data write set;

[0020] The synchronous writing module is used to write the data to all the data to be written in the collection and to the hardware test environment of the whole vehicle at the same time if the data writing process is triggered.

[0021] In a third aspect, the present application provides a testing device, including: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program is configured to implement the steps of the data processing method for the whole vehicle test as described above.

[0022] In a fourth aspect, the present application provides a testing system, including the above-mentioned testing equipment, and a connection is established between the testing tools carried on the testing equipment and the hardware testing environment of the whole vehicle.

[0023] In a fifth aspect, the present application provides a storage medium, which is a computer-readable storage medium. A computer program is stored on the storage medium. When the computer program is executed by a processor, the steps of the above-mentioned data processing method for whole vehicle testing are implemented. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present application. Moreover, the same reference numerals are used throughout the drawings to represent the same components. In the drawings:

[0025] Figure 1 A schematic diagram of the structure of a test system according to some embodiments of the present application;

[0026] Figure 2 A schematic flow chart of a data processing method for a vehicle test in an embodiment of the present application;

[0027] Figure 3 This is a flow chart of step S10 of a data processing method for a vehicle test in one embodiment of the present application;

[0028] Figure 4 This is a flow chart of a data processing method for a vehicle test in another embodiment of the present application;

[0029] Figure 5 This is a flow chart of step S31 of a data processing method for a vehicle test in another embodiment of the present application;

[0030] Figure 6 This is a flow chart of a data processing method for a vehicle test in another embodiment of the present application;

[0031] Figure 7 This is a flow chart of a data processing method for a vehicle test in another embodiment of the present application;

[0032] Figure 8 This is a functional diagram of a synchronous reading module in some embodiments of the present application;

[0033] Fig. 9 This is a flow chart of a data processing method for a vehicle test in another embodiment of the present application;

[0034] Fig.10 A schematic diagram of the module structure of a data processing device for vehicle testing in some embodiments of the present application;

[0035] Fig.11 This is a schematic diagram of the structure of the testing equipment in some embodiments of the present application. DETAILED DESCRIPTION

[0036] The following embodiments of the technical solution of the present application are described in detail in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present application, and are therefore only used as examples, and cannot be used to limit the scope of protection of the present application.

[0037] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

[0038] In the description of the embodiments of the present application, the technical terms "first", "second", etc. are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the meaning of "multiple" is more than two, unless otherwise clearly and specifically defined.

[0039] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0040] In the description of the embodiments of the present application, the term "and / or" is only a description of the association relationship of the associated objects, indicating that there may be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0041] At present, in the modern product development process, detailed testing of the equipment to be tested is a key link to ensure product quality, stability and safety. With the continuous advancement of technology and the increasing richness of product functions, the testing process has also experienced a significant development from simple to complex, from manual to automated.

[0042] Initially, testing work mainly relied on manual execution, and testers verified the various functions of the equipment through manual operations. This testing method is not only inefficient, but also prone to human errors, and it is difficult to ensure the consistency and comprehensiveness of the test. In order to meet this challenge, the industry began to introduce automated testing technology, which greatly improved the efficiency and accuracy of testing by writing test cases and using automated testing tools to execute tests.

[0043] In the early development stage of automated testing technology, test cases were usually executed in a fixed order, and the write operation objects and their corresponding data to be written in each test case were written one by one into the device to be tested. Although this serial execution method is simple and intuitive, its limitations are becoming increasingly prominent as product functions continue to increase and the number of test cases increases dramatically. Especially when facing complex large-scale systems, problems such as long test time and excessive resource consumption caused by the serial execution method become particularly prominent.

[0044] In order to improve test efficiency, the industry has begun to explore parallel execution methods for test cases, attempting to shorten the overall test cycle by executing multiple test cases simultaneously. However, due to the coupling relationship between different functions in the device to be tested and the possible mutual influence between test cases, the parallel execution method has encountered many difficulties in practical applications. For example, in the testing of highly integrated electronic control units such as automotive ECUs (Electronic Control Units), the parallel execution method has not been widely used.

[0045] Based on the above considerations, in order to alleviate the problem of low writing efficiency of the data to be written of the write operation objects in the test case, the present application designs a data processing method for whole vehicle testing, which specifically includes: obtaining the identification information of each write operation object in the target test case of the whole vehicle, and the data to be written corresponding to each write operation object; taking the combination of the identification information of each write operation object and the data to be written as a set element respectively, to construct a data write set; if the data write process is triggered, write the data to all the data to be written in the set, and write it into the hardware test environment of the whole vehicle at the same time, so as to change the data values ​​of each write operation object in the hardware test environment, so that the observed signal value of the signal to be observed corresponding to the write operation object in the hardware test environment changes with the change of the data written by the write operation object, and then read the changed observation signal value to perform whole vehicle testing.

[0046] Different from the traditional serial writing method of data to be written, the present application takes the identification information of each write operation object and the combination of the data to be written as a set element respectively to construct a data write set. Each set element in this data write set contains the identification information of the write operation object and the corresponding data to be written. Multiple set elements are integrated together to prepare for subsequent synchronous write operations. When the data write process is triggered, the write operations are no longer executed one by one, but all the data to be written in a data write set are synchronously written to the test environment. Since all write operations are completed at the same time or approximately the same time, this synchronous writing method can reduce the cumulative delay of the write operation, improve the writing efficiency of the data to be written corresponding to a single test case, and thereby improve the writing efficiency of the combined test case.

[0047] In this way, not only can the writing efficiency of the data to be written in the write operation object in the test case be improved, but the overall execution time of the combined test case can also be shortened, thereby further improving the test efficiency. This is especially important for complex test cases containing a large number of write operations, which can significantly reduce the test cycle and reduce the test cost while ensuring the accuracy and reliability of the test results. For combined test cases, the overall efficiency of the combined test cases is also improved.

[0048] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0049] The data processing method for vehicle testing provided in the embodiment of the present application can be applied to Figure 1 In the application environment shown.

[0050] The testing tool carried on the testing device 102 is connected to the hardware testing environment corresponding to the device to be tested 104 .

[0051] The test device 102 may be a computing service device with data processing, network communication and program running functions for vehicle testing, such as a tablet computer, a personal computer, a mobile phone, etc., or an electronic device capable of realizing the above data reading function, etc. The specific content of the test device 102 can be referred to in the subsequent content, and will not be described in detail here. The above test tool is running in the test device 102, and through the test tool, the test tool provides a software testing environment.

[0052] The device to be tested 104 may be a complete vehicle, such as a new energy vehicle, a fuel vehicle, etc. Specifically, the power system, battery pack, etc. in the complete vehicle may be tested. It may also be other devices that need to be tested, such as electronic and communication equipment such as mobile phones, tablet computers, personal computers, etc., industrial automation and mechanical equipment such as industrial robots, CNC machine tools, etc., automobile and transportation equipment such as engines, brake systems, vehicle-mounted electronic equipment, etc., medical equipment such as ultrasonic diagnostic equipment, etc., aerospace equipment such as navigation systems, flight control systems, etc., household appliances, security equipment, environmental monitoring equipment, etc. In the actual test process, the hardware test environment of the device to be tested 104 may be simulated to reduce the test cost.

[0053] Taking vehicle testing as an example, there are the following test scenarios:

[0054] First, perform HIL (Hardware-in-the-Loop Testing) testing on the entire vehicle. HIL testing is a testing method widely used in the field of automotive electronic control systems. In HIL testing, a software testing environment, i.e., a testing tool, is installed or run in the test equipment. The device to be tested provides a hardware testing environment, including actual hardware such as ECU (Electronic Control Unit), sensors, actuators, etc. The software testing environment and the hardware testing environment are combined for testing, which can reduce the testing cost of the actual vehicle testing. In actual use, the hardware testing environment can send instructions to the test equipment. After receiving the instructions, the test equipment sends test cases to the test tool. The test tool converts the test cases into test scripts, and executes the test scripts to write the data to be written into the hardware testing environment.

[0055] Second, the battery pack or power system level test can also be performed on the whole vehicle. In electric vehicles or hybrid vehicles, the battery pack is one of the core components of the whole vehicle, and its performance and safety are directly related to the vehicle's range, power performance and safety. Therefore, it is very important to test the battery pack. This test may include battery pack capacity testing, charge and discharge performance testing, safety testing, etc., to ensure that the battery pack can meet the performance and safety requirements of the whole vehicle.

[0056] Third, it is also possible to perform functional testing on each software module in the vehicle to implement testing at the software unit level. In vehicle development, a large amount of software programming and algorithm design will be involved. The performance and stability of these software modules are directly related to the intelligence level and driving experience of the vehicle. Therefore, it is very important to test the software modules. This test may include interface testing, functional testing, performance testing, etc. of the module, so that the software module can correctly implement its function and have sufficient stability and reliability.

[0057] It should be noted that vehicle testing is a complex and systematic process, which covers multiple levels and aspects from hardware to software, from systems to components. Tests at different levels have different goals and focuses, but they are all for the performance, safety and reliability of the vehicle. In actual testing, it is necessary to select the appropriate test level and method based on the specific needs and test objectives of the vehicle. At the same time, tests at different levels and tests of different functions at the same level are also interrelated and dependent, which requires comprehensive consideration and coordination.

[0058] In some embodiments of the present application, Figure 2 As shown, a data processing method for vehicle testing is provided, and the method is applied to Figure 1 Taking the test device 102 in the example as an example, the following steps are included:

[0059] Step S10, obtaining identification information of each write operation object in the target test case of the whole vehicle, and the to-be-written data corresponding to each write operation object.

[0060] The target test case can be a table of write actions including multiple write operation objects with different functions, or it can be a text, or it can be a flow chart, state diagram, etc. This application does not limit the form of expression of the target test case. Among them, the target test case may contain multiple fields, such as identification information, write operation objects, the execution order of each write operation, data to be written, and the relationship between the write operation object and the data to be written, such as equals. The target test case can be sent from the test equipment to the test tool, or it can be integrated and developed in the test tool to obtain the target test case, or it can be a historical test case that is historically edited and stored.

[0061] The target test case may include one write operation or multiple write operations. For example, Table 1 shows a target test case, which includes multiple write operations.

[0062] Table 1

[0063]

[0064] When there is a write operation in the target test case, the write operation object corresponding to the write operation is obtained, the identification information of the write operation object and the data to be written corresponding to the write operation object are determined, and the set element of the data write set is constructed according to the identification information and the data to be written corresponding to the identification information to obtain the data write set, that is, this data write set includes a write operation object.

[0065] When there are multiple write operations in the target test case, each write operation can construct a set element of the data write set in the above manner to obtain a data write set, that is, this data write set includes multiple write operation objects.

[0066] The write operation refers to the process of transferring the data to be written corresponding to the write operation object from the software test environment of the test device, that is, the test tool, to the hardware test environment of the device to be tested, and storing it in the hardware test environment.

[0067] The write operation object refers to the object that is operated or processed in the hardware test environment of the device to be tested. It can be a variable or an analog quantity. For example, the write operation object can be resistance, voltage, current, etc. Different functions correspond to different write operation objects. For example, taking the battery cell temperature test function of the whole vehicle as an example, when the temperature of the battery cell needs to be changed, the write operation object can be the resistance of the battery cell or the voltage of the battery cell. By changing the resistance value of the resistance of the battery cell or the voltage value of the voltage, the battery cell temperature can be changed.

[0068] The identification information refers to the unique identification of the write operation object, which can be the object name of the write operation object, or the number of the write operation object or other information that can indicate the uniqueness of the write operation object. Through the identification information, the position of the write operation object in the hardware test environment can be located, so as to facilitate the subsequent writing of the data to be written by the write operation object to the corresponding position. For example, if there are four write operation objects, the identification information of the four write operation objects can be represented by operation object A, operation object B, operation object C and operation object D respectively.

[0069] The data to be written refers to the data or state held by the write operation object itself. The data to be written can be a string, a numeric value, or other types of data. The data to be written corresponding to the write operation object can be changed according to demand. For example, the data to be written corresponding to the operation object A can be A1, the data to be written corresponding to the operation object B can be B1, the data to be written corresponding to the operation object C can be C1, and the data to be written corresponding to the operation object D can be D1. In actual application, if the write operation object is a resistor, the data to be written can be the resistance value, if the write operation object is a voltage, the data to be written can be the voltage value, and if the write operation object is a current, the data to be written can be the current value.

[0070] In a feasible implementation, the test tool can receive instructions sent by the test equipment, and by parsing the instructions, obtain the identification information of each write operation object in the target test case of the whole vehicle, as well as the data to be written corresponding to each write operation object, so as to meet different testing requirements.

[0071] In another feasible implementation, the test tool can also receive instructions sent by the test equipment, parse the instructions to obtain the function to be tested, and obtain relevant data stored in the historical test process of the test function from the database, thereby obtaining the identification information of each write operation object in the target test case of the whole vehicle, as well as the data to be written corresponding to each write operation object.

[0072] Specifically, the database can be a local database, which stores historical test cases corresponding to different historical test functions. These historical test cases include multiple write operations, each write operation corresponds to identification information of a write operation object, and data to be written corresponding to the write operation object. The historical test function matching the currently received test function can be obtained from the database, and the historical test cases associated with the historical test function can be obtained. By parsing the historical test cases, the identification information corresponding to the write operation object corresponding to each write operation and the data to be written corresponding to the write operation object can be obtained. In this way, the identification information of the write operation object and the data to be written corresponding to the write operation object can be quickly obtained without re-editing, thereby reducing testing overhead.

[0073] Step S20: taking the identification information of each write operation object and the combination of the data to be written as a set element, respectively, to construct a data write set.

[0074] A set element is a basic unit constituting a set. Each write operation object corresponds to a set element. The set element corresponding to each write operation object is composed of identification information corresponding to the write operation object and data to be written.

[0075] A data write set refers to a set including multiple set elements, which is used to guide the writing of the to-be-written data corresponding to the write operation object into the hardware test environment. In different programming languages, the representation of the data write set is different. For example, it can be an array, a list, or other representations. The representation of the data write set can be set according to different programming languages. The programming language of the data write set can be recognized by the test tool, and it can be executed in the form of a test script.

[0076] In a feasible implementation, when there are multiple write operation objects, there are multiple constructed set elements, and the various set elements can be spliced ​​to obtain a data write set.

[0077] In another feasible implementation, the data write set may be obtained through programming in the test tool according to current test requirements.

[0078] In another feasible implementation, the data write set may also be a historically programmed data write set matched from a database. For example, feature extraction is performed on the current test case to determine the attribute features corresponding to each write operation object, and the attribute features corresponding to each write operation object are converted into an attribute feature vector. Based on the attribute feature vector, similar data write sets are matched from existing data write sets in the database. In this way, there is no need to repeatedly program the data write sets, thereby reducing development costs.

[0079] For example, if the data is written into a collection, it can be represented as: ["operation object A: A1", "operation object B: B1", "operation object C: C1", "operation object D: D1"].

[0080] The write operation object A, write operation object B, write operation object C, and write operation object D in the above data write set correspond to the identification information of the write operation object A, the identification information of the write operation object B, the identification information of the write operation object C, and the identification information of the write operation object D. A1, B1, C1, and D1 correspond to the data to be written of the write operation object A, the data to be written of the write operation object B, the data to be written of the write operation object C, and the data to be written of the write operation object D, respectively.

[0081] It can be seen from the above data write set that the data write set includes four set elements, namely "write operation object A: A1", "write operation object B: B1", "write operation object C: C1" and "write operation object D: D1", and each set element is composed of identification information corresponding to a write operation object and the data to be written.

[0082] Step S30, if the data writing process is triggered, write the data to all the data to be written in the set, and write it into the hardware test environment of the whole vehicle at the same time, so as to change the data value of each write operation object in the hardware test environment, so that the observation signal value of the signal to be observed corresponding to the write operation object in the hardware test environment changes with the change of the data written by the write operation object, and then read the changed observation signal value to perform the whole vehicle test.

[0083] A trigger is an event or condition that starts or activates a process or action.

[0084] The data writing process refers to a program or process responsible for writing the data to be written of the writing operation object from the test tool of the test device to the hardware test environment of the device to be tested.

[0085] A test environment refers to a virtual or simulated environment, which can be a software test environment, a hardware test environment, or a combination of a software test environment and a hardware test environment. By providing a software test environment and a hardware test environment, testing is facilitated. This application takes the test environment as a hardware test environment as an example.

[0086] All data to be written are written synchronously into the hardware test environment of the vehicle. Synchronization refers to the writing action or state that is consistent or performed simultaneously in time. Each set element in the data writing set contains the identification information of the writing operation object and the corresponding data to be written. The identification information and data to be written of multiple writing operation objects are integrated together to prepare for the subsequent synchronous writing operation. When the data writing process is triggered, the writing operation is no longer performed one by one, but all the data to be written in the data writing set are synchronously written into the test environment.

[0087] In a feasible implementation, a test tool is provided on the test device, which includes a programming interface and a write control. The write control is associated with the program corresponding to the data write set edited in the editing interface. After the program corresponding to the data write set is edited in the programming interface, the write control is triggered to enter the data writing process for the data to be written, and all the data to be written in the data write set are synchronously written into the test environment.

[0088] In another feasible implementation, in order to realize the writing of the data to be written, when triggering the data writing process, it is necessary to parse the data write set, parse the content of the data write set, obtain the identification information corresponding to each write operation object and the data to be written, and locate the address of the write operation object in the hardware test environment of the device to be tested through the identification information, so as to realize the writing of the data to be written corresponding to the write operation object to the corresponding address.

[0089] In an embodiment of the present application, the identification information of each write operation object and the combination of the data to be written are respectively used as a set element to construct a data write set. Each set element in this data write set contains the identification information of the write operation object and the corresponding data to be written. Multiple set elements are integrated together to prepare for subsequent synchronous write operations. When the data write process is triggered, the write operations are no longer executed one by one, but all the data to be written in a data write set are synchronously written to the test environment. Since all write operations are completed at the same time or approximately the same time, this synchronous writing method can reduce the cumulative delay of the write operation, improve the writing efficiency of the data to be written corresponding to a single test case, and thereby improve the writing efficiency of the combined test case.

[0090] like Figure 3As shown, in some embodiments of the present application, determining the write operation object corresponding to each write operation and the to-be-written data corresponding to the write operation object includes:

[0091] Step S11, obtaining a target test case for the entire vehicle.

[0092] In a feasible implementation manner, the target test case may be edited on the test device and then sent to a test tool running on the test device, so that the test tool acquires the target test case.

[0093] In another feasible implementation, the target test case can also be the target test case edited on the test tool. The test tool can integrate functions such as the creation of target test cases and writing of data to be written. The creation of target test cases and subsequent functions are completed through the test tool, thereby reducing data transmission overhead and improving test efficiency.

[0094] Step S12: extracting identification information corresponding to each write operation object and data to be written corresponding to each write operation object from the target test case.

[0095] The target test case can be parsed to obtain identification information corresponding to each write operation object and data to be written corresponding to each write operation object.

[0096] You need to determine the format in which the target test case is stored, such as Excel, YAML, JSON, Python script, etc. Different storage formats have different extraction methods. According to the storage format, select the appropriate tool or programming language for extraction. For example, for Excel files, you can use Excel software or Python's pandas library; for YAML or JSON files, you can use Python's PyYAML or json library; for Python scripts, you can directly read and parse the script content.

[0097] In a feasible implementation, the target test case is opened and parsed using the above-mentioned tool or programming language. According to the structure of the test case, the part containing the identification information of the write operation object and the data to be written is found. Each write operation object in the test case is traversed to extract its identification information and the data to be written. The extracted identification information and the data to be written can be stored in an easy-to-process data structure, such as a list, a dictionary or a database table, an array, to obtain a data write set.

[0098] In an embodiment of the present application, the target test case provides a unified standard and format for testing. By directly extracting the identification information corresponding to each write operation object and the data to be written corresponding to each write operation object from the target test case, the accuracy and consistency of the data can be ensured, avoiding errors that may be introduced by manual input or calculation, and improving the accuracy of the constructed data write set.

[0099] like Figure 4 As shown, in some embodiments of the present application, if the data writing process is triggered, before writing the data into all the to-be-written data in the set and into the hardware test environment of the whole vehicle, it also includes:

[0100] Step S01 : extracting identification information of each write operation object from a target test case of the whole vehicle, and establishing a write operation object database based on the identification information of all write operation objects.

[0101] The above-mentioned write operation object database includes a collection of all write operation objects in the target test case, which matches the test case version. The write operation objects in the write operation object database can be changed, such as added or deleted. Every time the write operation object in the target test case is changed, or the target test case is changed, the write operation object in the write operation object database is also changed synchronously to re-establish the association relationship with the new target test case.

[0102] Step S02, loading the write operation object database into the hardware test environment of the whole vehicle, and establishing an association relationship between the test tool and the hardware test environment of the whole vehicle.

[0103] Establishing an association relationship between the test tool and the test environment refers to: establishing a communication connection relationship between the test tool and the hardware test environment, so that the test tool can write the data to be written into the hardware test environment of the device to be tested.

[0104] Step S31, if the data writing process is triggered, based on the association relationship, all the data to be written in the data writing set are simultaneously written into the hardware test environment of the whole vehicle.

[0105] In a feasible implementation, based on the association relationship, all the data to be written in the data write set are synchronously written into the test environment, including: based on the association relationship, from the write operation object database of the test environment, matching the preset identification information corresponding to the identification information of each write operation object, obtaining the address of the data to be written associated with each preset identification information, and synchronously writing each data to be written to the corresponding address of the data to be written.

[0106] In another feasible implementation, before making the first write request for the data to be written, it is necessary to send a request for allowing access to the device to be tested. When feedback information allowing access is received from the device to be tested, it indicates that the conditions for writing the data to be written are met. At this time, the preset identification information corresponding to the identification information of each write operation object is matched from the write operation object database of the test environment, and the address of the data to be written associated with each preset identification information is obtained, and each data to be written is synchronously written to the corresponding address of the data to be written.

[0107] In an embodiment of the present application, through the association relationship between the test tool and the test environment, a data transmission channel can be established between the test tool of the test device and the hardware test environment corresponding to the device to be tested. Based on the data transmission channel, the data to be written of each write operation object is written into the hardware test environment of the device to be tested, so that real-time writing of the data to be written can be achieved. Moreover, by establishing an association relationship between the test tool and the hardware test environment corresponding to the device to be tested, accurate synchronous writing of the data to be written can be ensured, thereby further enhancing the accuracy of the test.

[0108] like Figure 5 As shown, in some embodiments of the present application, if the data writing process is triggered, based on the association relationship, all the data to be written in the data writing set are simultaneously written into the hardware test environment of the whole vehicle, including:

[0109] Step S311, if the data writing process is triggered, a test script is generated according to the data writing set.

[0110] In order to enable the test tool to recognize the content of the data write collection, it is also necessary to convert the data write collection into a test script that can be recognized by the test tool.

[0111] In a feasible implementation manner, the data written into the collection may be converted into a JSON file through a python tool to obtain a test script.

[0112] Step S312, executing the test script, based on the association relationship, writes all the data to be written in the set into the hardware test environment of the whole vehicle at the same time.

[0113] By executing the test script on the test tool, the data writing process is triggered, so that all the data to be written in the data writing set are synchronously written into the test environment.

[0114] In a feasible implementation manner, the test script is executed to trigger the data writing process, so that all the data to be written in the data writing set are synchronously written into the hardware test environment of the device to be tested.

[0115] In an embodiment of the present application, by writing a test script and synchronously writing all the data to be written in the data write set into the test environment based on the association relationship, the writing process of the data to be written can be automatically executed to improve the writing efficiency.

[0116] like Figure 6 As shown, in some embodiments of the present application, if the data writing process is triggered, after writing the data into all the data to be written in the set and into the hardware test environment of the whole vehicle, it also includes:

[0117] Step S110, receiving feedback results of the hardware test environment, and determining the writing status of each data to be written according to the feedback results.

[0118] The feedback result is fed back by the hardware test environment of the device to be tested, which includes the write status of the data to be written corresponding to all write operation objects in the current target test case.

[0119] The write status is used to reflect the status of the data to be written corresponding to the write operation object, whether it is written successfully or failed. Therefore, the write status includes two types: write success or write failure. A Boolean value such as true can be used to indicate a successful write, and false can be used to indicate a failed write, or a status code such as 0 can be used to indicate a successful write, and non-zero can be used to indicate a failed write.

[0120] In a feasible implementation, the test tool receives feedback results of the hardware test environment of the device to be tested, and the feedback results can be sent to the test tool of the test device in the form of a message. The test tool parses the message to obtain the writing status of each data to be written.

[0121] Step S120: determining a target write operation object where writing fails according to the write status.

[0122] The target write operation object refers to the write operation object corresponding to the data write failure in all write operation objects in the target test case.

[0123] Step S130, determining a write failure cause based on the target write operation object and the to-be-written data corresponding to the target write operation object.

[0124] The reasons for write failure include data not meeting the requirements, abnormal state of the target write operation object, insufficient write operation permissions, external interference, etc. If the data does not meet the requirements, you can check whether the data to be written exceeds the length limit, range limit or data type mismatch of the target write operation object. Verify whether the data to be written meets the constraints of the target write operation object, such as uniqueness constraint, non-null constraint, etc. If the state of the target write operation object is abnormal, you can check whether the target write operation object is in a writable state, such as whether the write operation object database is locked. Confirm whether the target write operation object exists, such as whether the write operation object database has been deleted, whether the file path is correct, etc. If the write operation permission is insufficient, you can check whether the user or process performing the write operation has sufficient permissions. Confirm whether the permission settings of the target write operation object allow the write operation. If external interference occurs, you can check whether there are other external factors interfering with the write operation, such as network delay or abnormal test environment. Confirm whether the write operation is interfered with by other processes or threads.

[0125] For write failures, corresponding solutions can be taken, such as taking corresponding measures to repair the write failure according to the cause of the write failure. For example, modify the data to be written to meet the attribute requirements of the target write operation object, adjust the status or permissions of the target write operation object, etc. Diagnose the test network or test environment.

[0126] In a feasible implementation, the target write operation object and the data to be written corresponding to the target write operation object can be converted into a feature vector as a combination, and a preset feature vector similar to the feature vector is obtained from a database, and a preset write failure cause associated with the preset feature vector is obtained as the write failure cause, thereby achieving the effect of automatically determining the write failure cause and improving the analysis efficiency of the write failure cause, wherein a mapping relationship between different preset feature vectors and preset write failure causes is pre-stored in the database, and the preset feature vector can be a feature vector corresponding to a preset write operation object and a preset combination of data to be written corresponding to the preset write operation object.

[0127] In another feasible implementation, in addition to storing the mapping relationship between different preset feature vectors and preset write failure causes, the above-mentioned database can also store preset solution strategies corresponding to different preset write failure causes. After matching similar preset write failure causes, the preset solution strategy associated with the preset write failure cause is obtained. By recommending the preset solution strategy, the entire testing process is made more intelligent and specific solutions can be quickly located.

[0128] In the embodiment of the present application, by receiving the feedback results of the hardware test environment, the writing status of the data to be written can be timely understood to ensure the accuracy of the data. Determining the target write operation object of the write failure makes the problem location more accurate and reduces the erroneous data caused by misjudgment or omission. In addition, by analyzing and determining the cause of the write failure, it is helpful to optimize and improve the write process and further improve the stability and reliability of the test system.

[0129] like Figure 7 As shown, in some embodiments of the present application, if the data writing process is triggered, after writing the data into all the data to be written in the set and into the hardware test environment of the whole vehicle, it also includes:

[0130] Step S210: If the reading process of the observed signal value is triggered, the time difference corresponding to the reading of the observed signal value of each signal to be observed is obtained according to the observed signal value reading set.

[0131] A trigger is an event or condition that starts or activates a process or action.

[0132] The observation signal value reading process refers to a program or process responsible for reading the observation signal value corresponding to the signal to be observed from the device to be tested.

[0133] Triggering the reading process of the observation signal value means starting the process of reading the observation signal value.

[0134] The signal to be observed refers to the signal that is expected or planned to be observed in the device to be tested. For example, the signal to be observed can be specifically divided into control instructions, sensor sampling signals, status signals, diagnostic signals, etc. Among them, the sensor sampling signal can be engine speed, intake air volume, coolant temperature, battery capacity, vehicle speed, etc.

[0135] Since there is a complex coupling relationship between the various functions of the device to be tested, it is necessary to design test cases with multiple functional combinations to test the device to be tested. Therefore, in the test scenario of the multi-functional combination, there may be multiple signals to be observed in one test case, and each signal to be observed represents a different function to meet the testing requirements under complex working conditions.

[0136] For example, there are functional modules including a temperature module, a charging module and a high-voltage module. When the temperature value corresponding to the temperature module changes, it will affect the output values ​​of the charging module and the high-voltage module. By setting a test case, the test case includes the observed signal corresponding to the temperature module, the observed signal corresponding to the charging module and the observed signal corresponding to the high-voltage module. The test case mentioned here can be the target test case mentioned above, that is, the target test case includes not only multiple signals to be observed and the attribute information of each signal to be observed, but also multiple write operation objects and the attribute information corresponding to each write operation object.

[0137] The observed signal value refers to the signal value observed from the device to be tested. Taking the device to be tested as a whole vehicle as an example, the observed signal value can be collected and monitored by the sensors of the whole vehicle. The electronic control unit of the whole vehicle can collect information from various sensors, which are responsible for monitoring the observed signal values ​​corresponding to various signals to be observed of the vehicle. For example, when the signal to be observed is the battery temperature, the observed signal value can be the temperature value of the battery temperature, and when the signal to be observed is the battery capacity, the observed signal value can be the battery capacity value.

[0138] The observation signal value reading set includes the time difference of the corresponding reading of the observation signal value of each signal to be observed. In different programming languages, the expression form of the observation signal value reading set is different, for example, it can be an observation signal value reading array, it can also be an observation signal value reading list, or it can be other expressions. The expression form of the observation signal value reading set can be set according to different programming languages. The programming language of the observation signal value reading set can be recognized by the test tool, and it can be executed in the form of a test script. The observation signal value reading set can be obtained by programming in the test tool according to the current test requirements. The observation signal value reading set can also be a historically programmed observation signal value reading set matched from the database, for example, feature extraction is performed on the current test case, the attribute features corresponding to each signal to be observed are determined, and the attribute features corresponding to each signal to be observed are converted into attribute feature vectors, and similar observation signal value reading sets are matched from the observation signal value reading sets already in the database based on the attribute feature vectors. In this way, there is no need to repeatedly program the observation signal value reading set, thereby reducing development costs.

[0139] The time difference refers to the maximum time that the signal to be observed needs to wait to obtain its corresponding observed signal value. Since the device to be tested and the device to be tested can exchange data in the form of messages, and since the messages are sent periodically, if the observed signal value of the signal to be observed changes within a cycle, then this change will not be transmitted immediately. Instead, it must wait until the end of the current cycle and the beginning of the next cycle when a new message is sent to include this change. That is, when the observed signal value of the signal to be observed changes, it is necessary to wait for the next message cycle to observe it. Therefore, the waiting time here is the time difference, and the time difference depends on the message cycle corresponding to the signal to be observed.

[0140] Since the message periods corresponding to the signals to be observed may be the same or different, for example, if the signal to be observed is the battery temperature, the message period corresponding to the battery temperature may be sent once per second; if the signal to be observed is the battery capacity, the message period corresponding to the battery capacity may be sent once per second or once every two seconds. When the message periods of the signals to be observed are different, the time differences for reading the observed signal values ​​of the signals to be observed are also different. When the message periods of the signals to be observed are the same, the time differences for reading the observed signal values ​​of the signals to be observed are the same.

[0141] For example, the observed signal value reading set can be represented as: ["signal a: T1", "signal b: T1", "signal b: T1", "signal b: T1"].

[0142] The signals a, b, c, and d in the above observed signal value reading set correspond to the signal name of the signal a to be observed, the signal name of the signal b to be observed, the signal name of the signal c to be observed, and the signal name of the signal d to be observed, respectively. Figure 8 It can be seen that T1, T2, T3, and T4 respectively correspond to the time difference of the observed signal value of the signal to be observed a, the time difference of the observed signal value of the signal to be observed b, the time difference of the observed signal value of the signal to be observed c, and the time difference of the observed signal value of the signal to be observed d. The time difference of the observed signal value of each signal to be observed corresponding to the reading may be different, for example, Figure 8 It can be seen that the time difference corresponding to the reading of the observed signal values ​​of signals a, b, c, and d increases successively.

[0143] In a feasible implementation, a test tool is provided on the test device, and the test tool includes a programming interface and a reading control. The reading control is associated with the program corresponding to the observation signal value reading set edited in the editing interface. After the program corresponding to the observation signal value reading set is edited in the programming interface, the reading control is triggered to enter the observation signal value reading process to read the observation signal value.

[0144] In another feasible implementation, in order to realize the reading of observation signal values, when triggering the reading process of observation signal values, it is necessary to parse the observation signal value reading set to obtain the time difference corresponding to the reading of the observation signal values ​​of each signal to be observed, so as to determine the subsequent reading time point based on the time difference.

[0145] Step S220, obtaining the reading time point of the observation signal value of each signal to be observed according to the time difference between the start reading time point and the corresponding reading time of the observation signal value of each signal to be observed, wherein the start reading time point of the observation signal value corresponding to each signal to be observed is the same.

[0146] The start reading time point refers to the moment when each signal to be observed uniformly starts to read the observed signal value, and the start reading time point of the observed signal value of each signal to be observed is the same. The start reading time point here can be the triggering moment of the reading process of the observed signal value, or it can be the moment corresponding to when the reading process of the observed signal value reaches a preset duration after being triggered. For example, if the reading process of the observed signal value is triggered at time A, record the triggering time and use it as the start reading time point. Alternatively, if the reading process of the observed signal value reaches 1 minute after being triggered at time A, record A+1 minutes and use it as the start reading time point.

[0147] For example, Figure 8 As shown, "0" corresponds to the start time of reading, starting from Figure 8 It can be seen that the start time point of reading the observation signal values ​​of each signal to be observed is the same.

[0148] In a feasible implementation manner, when the reading process of the observation signal value is triggered, the start reading time points corresponding to the various observation signal values ​​may be unified.

[0149] In another feasible implementation, when the preset time length is reached after the reading process of the observation signal value is triggered, the start reading time points corresponding to each signal to be observed can be unified. This preset time length can be set according to actual conditions. By setting the preset time length, the test tool has enough time to prepare and initialize the data acquisition process, ensuring that the observation signal values ​​of each signal to be observed are read at a unified time point.

[0150] The reading time point refers to the reading moment of the observation signal value of the corresponding signal to be observed from the device to be observed. Since the starting reading time points of the observation signal values ​​of each signal to be observed are the same, if the time differences corresponding to the reading of the observation signal values ​​of each signal to be observed are different, the reading time points corresponding to each observation signal value are also different. If the time differences corresponding to the reading of the observation signal values ​​of each signal to be observed are the same, the reading time points corresponding to each observation signal value are the same. Therefore, there are two situations in which the reading time points of each observation signal value are the same or different.

[0151] For example, Figure 8 As shown, there are four signals to be observed, namely signals a, b, c, and d. "t1" corresponds to the reading time point of the signal value to be observed of signal a, "t2" corresponds to the reading time point of signal b, "t3" corresponds to the reading time point of the signal value to be observed of signal c, and "t4" corresponds to the reading time point of the signal value to be observed of signal d.

[0152] In a feasible implementation, the corresponding time difference can be added to the start reading time point to obtain the reading time point of the observation signal value. Each signal to be observed can determine its corresponding reading time point of the observation signal value based on this method.

[0153] from Figure 8 It can be seen that each observation signal value has the same start reading time point, and each signal to be observed has a synchronous reading of the observation signal value after the start reading time point. Through this synchronous reading setting, the total time required to complete the reading of the observation signal values ​​of the four signals to be observed is "T4", that is, the reading of the observation signal values ​​of the four signals to be observed is completed with "T4". Since the related art is serially read, the total time required to complete the reading of the observation signal values ​​of the four signals to be observed is "T1+T2+T3+T4". Compared with the related art, the present application improves the reading efficiency of the observation signal value.

[0154] Step S230, reading the observed signal value corresponding to the signal to be observed based on the reading time point, wherein if the data to be written corresponding to the write operation object changes, the observed signal value of the signal to be observed corresponding to the write operation object in the test environment changes.

[0155] Following the above embodiment, after determining the reading time point of the observation signal value of each signal to be observed, when the corresponding reading time point is reached, the corresponding observation signal value is read from the device to be tested.

[0156] For example, Figure 8For example, at "t1" the observed signal value of the observed signal a is read from the device under test, at "t2" the observed signal value of the observed signal b is read from the device under test, at "t3" the observed signal value of the observed signal c is read from the device under test, and at "t4" the observed signal value of the observed signal d is read from the device under test.

[0157] After the observation signal values ​​are obtained, fault analysis or fault diagnosis can be performed based on these observation signal values, or other purposes can be achieved.

[0158] If the data to be written corresponding to the write operation object changes, the observed signal value of the signal to be observed corresponding to the write operation object in the test environment changes.

[0159] In a feasible implementation, the write operation object in the device to be tested can be determined according to the test requirements, and the value of the write operation object in the hardware test environment can be changed by writing the data to be written. Subsequently, the observed signal value corresponding to the observed signal when the write operation object works with the data to be written can be collected, and then the relevant analysis can be performed based on the observed signal value. For example, taking the write operation object as a battery cell as an example, the resistance value can be written into the test environment, and the battery cell temperature is different under different resistance values, thereby achieving the purpose of changing the battery cell temperature by the resistance value. The changed battery cell temperature can be collected by a temperature sensor, and the battery cell temperature is stored. When a read request for the battery cell temperature is received, the corresponding battery cell temperature value is read to facilitate the observation of the battery cell temperature value.

[0160] In another feasible implementation manner, the data to be written corresponding to the write operation object in the device to be tested may also be adjusted again according to the analysis result.

[0161] In the embodiment of the present application, since the observation signal values ​​of each signal to be observed have the same starting reading time point, even if there are different time differences in the signals to be observed, the corresponding observation signal values ​​can be read independently and synchronously after the corresponding time difference. This can alleviate the problem of inaccurate observation signal values ​​being read late due to observation signal value reading delays of some signals to be observed during the test process, thereby making the observation signal values ​​read by all signals to be observed more accurate.

[0162] like Fig. 9 As shown, in some embodiments of the present application, after reading the observed signal value corresponding to the signal to be observed based on the reading time point, the method further includes:

[0163] Step S240, determining a set of observed signal values, and obtaining expected values, observed signal values, and numerical tolerances corresponding to each signal to be observed.

[0164] The observed signal value determination set refers to a set including the expected value and observed signal value of each signal to be observed, which is used to guide the comparison of the expected value and the observed signal value of each signal to be observed. In different programming languages, the expression form of the observed signal value determination set is different. For example, it can be an array, a list, or other expressions. The expression form of the observed signal value determination set can be set according to different programming languages. The observed signal value determination set may include identification information, observed signal value, expected value and numerical tolerance corresponding to each signal to be observed.

[0165] The expected value refers to the expected signal value of the signal to be observed. The expected value corresponding to each signal to be observed can be determined according to experiments and set in advance.

[0166] The numerical tolerance refers to the permissible error value or error range of the observed signal value. It can be determined and preset through experiments, and the numerical tolerances corresponding to different signals to be observed can be the same or different.

[0167] For example, the observed signal value judgment set can be expressed as: [["a1", "s1", "actual value of signal a"], ["b1", "s2", "actual value of signal b"], ["c1", "s3", "actual value of signal c"]]. Among them, a1 is the expected value of signal a, s1 is the numerical tolerance of signal a, and the actual value of signal a is the observed signal value of signal a; b1 is the expected value of signal b, s2 is the numerical tolerance of signal b, and the actual value of signal b is the observed signal value of signal b; c1 is the expected value of signal c, s3 is the numerical tolerance of signal c, and the actual value of signal c is the observed signal value of signal c.

[0168] In a feasible implementation, after reading the observed signal value of the signal to be observed based on the reading time point, the set can be directly determined according to the observed signal value to obtain the expected value, observed signal value and numerical tolerance corresponding to each signal to be observed.

[0169] In another feasible implementation, after reading the observation signal value of the signal to be observed based on the reading time point, if the judgment process of the observation signal value is triggered, the time difference corresponding to the reading of the observation signal value of each signal to be observed is obtained according to the reading set of the observation signal value.

[0170] The judgment process of the observed signal value refers to the program or process responsible for judging the observed signal value of each signal value to be observed. Triggering the judgment process of the observed signal value means starting to compare the observed signal value of each signal value to be observed with the expected value. The purpose of the comparison is to determine whether the observed signal value read is consistent with the expected value. Through this operation, the purpose of fault diagnosis of the corresponding test function can be achieved, and the corresponding function can also be corrected and updated.

[0171] A test tool is provided on the test device, which includes a programming interface and a judgment control. The judgment control is associated with the program corresponding to the observation signal value judgment set edited in the editing interface. After the program corresponding to the observation signal value judgment set is edited in the programming interface, the judgment control is triggered to enter the observation signal value judgment process and perform subsequent observation signal value judgments.

[0172] In order to realize the judgment of the observed signal value, when triggering the judgment process of the observed signal value, it is necessary to parse the observed signal value judgment set to obtain the expected value, observed signal value and numerical tolerance corresponding to each signal to be observed, so as to judge the observed signal value.

[0173] In another feasible implementation, the observation signal value reading set and the observation signal value determination set are embodied by two independent test scripts. After the test script of the observation signal value reading set is executed, the observation signal values ​​of all the signals to be observed are displayed on the display interface of the test tool. Then, the tester can trigger the execution of the test script of the observation signal value determination set, trigger the judgment process of the observation signal value, implement the judgment of the observation signal value, and display the test results of all the observation signal values ​​on the display interface. Alternatively, a test script can be jointly constructed by the observation signal value reading set and the observation signal value determination set. After the test script of the observation signal value reading set is executed, the process of the observation signal value determination set is automatically triggered, and the test script is executed to implement the judgment of the observation signal value. Finally, the observation signal values ​​of all the signals to be observed and the test results of all the observation signal values ​​are displayed on the display interface of the test tool. The above two implementations can meet the testing requirements in different scenarios.

[0174] Step S250, based on the expected value, observed signal value and numerical tolerance corresponding to each signal to be observed, obtain the test result corresponding to each signal to be observed.

[0175] The test result is the test result of the expected value and the observed signal value corresponding to a single signal to be observed. The test result may include pass or fail, and may also include the difference between the expected value and the observed signal value.

[0176] For example, in the observed signal value judgment set, ["a1", "s1", "actual value of signal a"] is compared with ["b1", "s2", "actual value of signal b"] to obtain the test results corresponding to signal a and signal b.

[0177] In the embodiment of the present application, by automatically comparing each signal to be observed based on the corresponding expected value, observed signal value and numerical tolerance, the test results corresponding to each signal to be observed are obtained. This can intuitively reflect whether the observed signal value of the signal to be observed meets the expectation, achieve the automated testing effect of each signal to be observed, and improve the accuracy and objectivity of the test results.

[0178] In some embodiments of the present application, based on the comparison of the expected value, the observed signal value and the numerical tolerance corresponding to the signal to be observed, the test results corresponding to each signal to be observed are obtained, including:

[0179] Step S251, obtaining the expected value fluctuation range corresponding to the signal to be observed according to the expected value and the numerical tolerance of the signal to be observed.

[0180] The expected value fluctuation interval refers to the range within which the expected value can fluctuate. Setting the expected value fluctuation interval can reduce the impact of numerical errors on test results. The expected value fluctuation interval can be a closed interval or an open interval. One endpoint value of the expected value fluctuation interval can be determined based on the sum of the expected value and the numerical tolerance of the signal to be observed, and the other endpoint value can be determined based on the difference between the expected value and the numerical tolerance of the signal to be observed. When the expected values ​​and numerical tolerances of the signals to be observed are different, the expected value fluctuation intervals corresponding to the signals to be observed are also different.

[0181] For example, suppose the expected value corresponding to signal a is represented by a1, and the numerical tolerance is s1. Then, the expected value fluctuation range corresponding to signal a can be represented by [a1-s1, a1+s1], or (a1-s1, a1+s1] or [a1-s1, a1+s1]. Suppose the expected value corresponding to signal b is represented by b1, and the numerical tolerance is s2. Then, the expected value fluctuation range corresponding to signal b can be represented by [b1-s2, b1+s2], or (b1-s2, b1+s2] or [b1-s2, b1+s2]. Suppose the expected value corresponding to signal c is represented by c1, and the numerical tolerance is s3. Then, the expected value fluctuation range corresponding to signal c can be represented by [c1-s3, c1+s3], or (c1-s3, c1+s3] or [c1-s3, c1+s3).

[0182] Step S252: if the observed signal value of the signal to be observed belongs to the expected value fluctuation range, the test result of the signal to be observed is determined to be passed.

[0183] Step S253: if the observed signal value of the signal to be observed does not belong to the expected value fluctuation range, the test result of the signal to be observed is determined to be failed.

[0184] For example, taking the expected value fluctuation interval of signal a as [a1-s1, a1+s1], assuming that the observed signal value of signal a is located at [a1-s1, a1+s1], the test result of signal a is determined to be passed, otherwise, the test result of signal a is failed. Taking the expected value fluctuation interval of signal b as [b1-s2, b1+s2], assuming that the observed signal value of signal b is located at [b1-s2, b1+s2], the test result of signal b is determined to be passed, otherwise, the test result of signal b is failed. Taking the expected value fluctuation interval of signal c as [c1-s3, c1+s3], assuming that the observed signal value of signal c is located at [c1-s3, c1+s3], the test result of signal c is determined to be passed, otherwise, the test result of signal c is failed.

[0185] In the embodiment of the present application, the introduction of numerical tolerance allows the observed signal value to fluctuate within a certain range around the expected value, thereby reducing misjudgments caused by slight deviations.

[0186] The data processing method for vehicle testing of the present application can be applied to the test scenario of any functional module of the vehicle. In order to make a clearer description of the data processing method for vehicle testing provided by the present application, the following takes the test of the thermal management functional module of the vehicle as an example, including the following steps:

[0187] (1) Obtain the target test cases of the thermal management function module of the whole vehicle. The target test cases of the thermal management function module of the whole vehicle can be shown in Table 2:

[0188] Table 2

[0189]

[0190] The identification information of each write operation object and the combination of the data to be written are respectively used as a set element to construct a data write set.

[0191] For example, the generated data write set can be expressed as: ["keyOn wakeup: 1", "battery operating mode: 3", "vehicle user mode: 3", "all battery cell temperatures: 39].

[0192] (3) If the data writing process is triggered, the data is written to all the data to be written in the collection and written into the hardware test environment of the entire vehicle.

[0193] (4) Receive feedback from the hardware test environment, and determine the write status of each data to be written based on the feedback. For example, the write status of each of the above operation objects is shown in Table 3:

[0194] Table 3

[0195]

[0196] In an embodiment of the present application, in the thermal management function module, the identification information of each operation object and the data to be written corresponding to the identification information are taken as a set element to construct a data write set. Each set element in the data write set contains the identification information of the write operation object and the corresponding data to be written. Multiple set elements are integrated together to prepare for subsequent synchronous write operations. When the data write process is triggered, the write operations are no longer executed one by one, but all the data to be written in a data write set are synchronously written to the test environment. Since all write operations are completed at the same time or approximately the same time, this synchronous writing method can reduce the cumulative delay of the write operation, improve the writing efficiency of the data to be written corresponding to a single test case, thereby improving the writing efficiency of the combined test case, and thereby improving the testing efficiency of the thermal management function module of the entire vehicle.

[0197] Furthermore, after completing the above-mentioned writing operation, the data reading is started. When the value of the operation object changes, the observed signal value of the signal to be observed changes, which specifically includes:

[0198] (5) Obtain the target test cases of the thermal management function module of the whole vehicle. The target test cases of the thermal management function module of the whole vehicle can be shown in Table 4:

[0199] Table 4

[0200]

[0201] According to the time difference and identification information corresponding to each signal to be observed, an observation signal value reading set is constructed.

[0202] For example, the generated observation signal value reading set can be expressed as: ["Battery working status: 10", "Battery thermal management request: 100", "Battery thermal management scenario: 100", "Requested water inlet target water temperature: 100", "Requested water flow: 100", "DC charging status: 20"].

[0203] (6) Extract the expected value and numerical tolerance corresponding to each signal to be observed from the target test case. Construct an observation signal value judgment set based on the identification information, expected value, numerical tolerance and the observed signal value read by each signal to be observed.

[0204] For example, the generated observed signal value decision set can be expressed as: [["3","0","3.0"], ["2","0","2.0"], ["1","0","1.0"], ["107.5","0.5","107.5"], ["255.5","0.5","255.5"], ["2","0","2.0"]].

[0205] (7) If the reading process of the observed signal value is triggered, the time difference of reading the observed signal value of each signal to be observed is obtained according to the reading set of the observed signal value. The reading time point of the observed signal value of each signal to be observed is obtained according to the start reading time point and the time difference of reading the observed signal value of each signal to be observed, wherein the start reading time point of the observed signal value corresponding to each signal to be observed is the same. The observed signal value of the signal to be observed is read based on the reading time point.

[0206] For example, assuming that the start reading time point is 0, the reading time point of the observation signal value corresponding to the battery working status is the 10th second, the reading time point of the observation signal value corresponding to the battery thermal management request is the 100th second, the reading time point of the observation signal value corresponding to the battery thermal management scenario is the 100th second, the reading time point of the observation signal value corresponding to the requested inlet target water temperature is the 100th second, the reading time point of the observation signal value corresponding to the requested water flow rate is the 100th second, and the reading time point of the observation signal value corresponding to the DC charging status is the 20th second.

[0207] (8) According to the observed signal value judgment set, the expected value, observed signal value and numerical tolerance corresponding to each signal to be observed are obtained. Based on the expected value, observed signal value and numerical tolerance corresponding to each signal to be observed, the test results corresponding to each signal to be observed are obtained. At this point, the test of each signal to be observed in the thermal management function module of the whole vehicle is completed.

[0208] Among them, the test results corresponding to each signal to be observed can be shown in Table 5:

[0209] Table 5

[0210]

[0211] In the embodiment of the present application, in the thermal management function module, the observation signal values ​​of each signal to be observed have the same start reading time point. Even if there are different time differences between the signals to be observed, the corresponding observation signal values ​​can be read independently and synchronously after the corresponding time differences. This reading method can improve the reading efficiency of the observation signal values, thereby improving the test efficiency of the thermal management function module of the whole vehicle. It can also alleviate the problem of inaccurate observation signal values ​​being read out late for some of the signals to be observed during the test, making the observation signal values ​​read by all the signals to be observed more accurate.

[0212] It should be understood that, although the steps in the flowcharts involved in the above embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear description in this article, the execution of these steps is not strictly limited in order, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0213] Based on the same invention purpose, corresponding to the data processing method of the vehicle test provided in the above embodiment, Fig.10 This is a structural block diagram of a data processing device for whole vehicle testing provided in an embodiment of the present application. For ease of explanation, only the parts related to the embodiment of the present application are shown.

[0214] Reference Fig.10 , provides a data processing device for vehicle testing, the data processing device for vehicle testing comprising Fig.10 The synchronous writing device shown comprises:

[0215] The use case processing module 202 is used to obtain the identification information of each write operation object in the target test case of the whole vehicle, and the data to be written corresponding to each write operation object; the combination of the identification information of each write operation object and the data to be written is respectively used as a set element to construct a data write set.

[0216] In some embodiments of the present application, the data processing device for the whole vehicle test also includes a use case acquisition module 201, which is also used to extract the identification information of each write operation object from the target test case of the whole vehicle, and establish a write operation object database based on the identification information of all write operation objects; load the write operation object database into the hardware test environment of the whole vehicle, and establish an association relationship between the test tool and the hardware test environment of the whole vehicle.

[0217] The data processing device for the whole vehicle test also includes a synchronous writing module 203. The synchronous writing module 203 is used to write all the to-be-written data in the data writing set into the hardware testing environment of the whole vehicle at the same time based on the association relationship if the data writing process is triggered, so as to change the data values ​​of each write operation object in the hardware testing environment, so that the observation signal value of the to-be-observed signal corresponding to the write operation object in the hardware testing environment changes with the change of the data written by the write operation object, and then read the changed observation signal value to perform the whole vehicle test.

[0218] In some embodiments of the present application, the synchronous writing module 203 is also used to generate a test script based on the data writing set if the data writing process is triggered; execute the test script, and based on the association relationship, write all the data to be written in the data writing set into the hardware testing environment of the entire vehicle at the same time.

[0219] In some embodiments of the present application, the data processing device for the whole vehicle test also includes a status feedback module 204, which is used to receive feedback results from the hardware test environment, and determine the write status of each data to be written based on the feedback results; determine the target write operation object where the write failed based on the write status; and determine the cause of the write failure based on the target write operation object and the data to be written corresponding to the target write operation object.

[0220] In some embodiments of the present application, the use case processing module 202 is also used to, if the reading process of the observation signal value is triggered, obtain the time difference of reading the observation signal values ​​corresponding to each signal to be observed according to the observation signal value reading set; obtain the reading time point of the observation signal value of each signal to be observed according to the start reading time point and the time difference of reading the observation signal value of each signal to be observed, wherein the start reading time point of the observation signal value corresponding to each signal to be observed is the same; and read the observation signal value corresponding to the signal to be observed based on the reading time point.

[0221] In some embodiments of the present application, the data processing device for the whole vehicle test also includes a result judgment module, which is used to obtain the expected value, observation signal value and numerical tolerance corresponding to each signal to be observed according to the observation signal value judgment set; based on the expected value, observation signal value and numerical tolerance corresponding to each signal to be observed, the test result corresponding to each signal to be observed is obtained.

[0222] The data processing device for the whole vehicle test provided by the present application adopts the data processing method for the whole vehicle test in the above-mentioned embodiment, which can alleviate the problem of low writing efficiency of the data to be written due to serial writing of the data to be written. Compared with the prior art, the beneficial effects of the data processing device for the whole vehicle test provided by the present application are the same as the beneficial effects of the data processing method for the whole vehicle test provided by the above-mentioned embodiment, and the other technical features in the data processing device for the whole vehicle test are the same as the features disclosed in the above-mentioned embodiment method, which will not be described in detail here.

[0223] Based on the same invention purpose, the present application provides a testing device, which includes: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the above-mentioned data processing method for the whole vehicle test.

[0224] Reference below Fig.11 , which shows a schematic diagram of the structure of a test device suitable for implementing the embodiment of the present application. The test device in the embodiment of the present application may include but is not limited to mobile terminals such as mobile phones, laptop computers, digital broadcast receivers, PDAs (Personal Digital Assistants), PADs (Portable Application Descriptions: tablet computers), PMPs (Portable Media Players: portable multimedia players), vehicle-mounted terminals (such as vehicle-mounted navigation terminals), etc., and fixed terminals such as digital TVs, desktop computers, etc. Fig.11 The test device shown is merely an example and should not bring any limitation to the functions and scope of use of the embodiments of the present application.

[0225] like Fig.11 As shown, the test equipment may include a processing device 1001 (e.g., a central processing unit, a graphics processor, etc.), which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM: Read Only Memory) 1002 or a program loaded from a storage device 1003 to a random access memory (RAM: Random Access Memory) 1004. In RAM1004, various programs and data required for the operation of the test equipment are also stored. The processing device 1001, ROM1002, and RAM1004 are connected to each other through a bus 1005. An input / output (I / O) interface 1006 is also connected to the bus. Generally, the following systems can be connected to the I / O interface 1006: an input device 1007 including, for example, a touch screen, a touch pad, a keyboard, a mouse, an image sensor, a microphone, an accelerometer, a gyroscope, etc.; an output device 1008 including, for example, a liquid crystal display (LCD: Liquid Crystal Display), a speaker, a vibrator, etc.; a storage device 1003 including, for example, a magnetic tape, a hard disk, etc.; and a communication device 1009. The communication device 1009 can allow the test device to communicate with other devices wirelessly or wired to exchange data. Although the figure shows a test device with various systems, it should be understood that it is not required to implement or have all the systems shown. More or fewer systems can be implemented or have alternatively.

[0226] In particular, according to the embodiments disclosed in the present application, the process described above with reference to the flowchart can be implemented as a computer software program. For example, the embodiments disclosed in the present application include a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program includes a program code for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network through a communication device, or installed from a storage device 1003, or installed from a ROM 1002. When the computer program is executed by the processing device 1001, the above-mentioned functions defined in the method of the embodiment disclosed in the present application are executed.

[0227] The test equipment provided by the present application adopts the data processing method for the whole vehicle test in the above embodiment, which can alleviate the problem of low writing efficiency of the data to be written due to serial writing of the data to be written. Compared with the prior art, the beneficial effects of the test equipment provided by the present application are the same as the beneficial effects of the data processing method for the whole vehicle test provided by the above embodiment, and the other technical features in the test equipment are the same as the features disclosed in the method of the previous embodiment, which will not be repeated here.

[0228] It should be understood that the various parts disclosed in this application can be implemented by hardware, software, firmware or a combination thereof. In the description of the above embodiments, specific features, structures, materials or characteristics can be combined in any one or more embodiments or examples in a suitable manner.

[0229] The above are only specific implementations of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

[0230] Based on the same invention purpose, refer to Figure 1 The embodiment of the present application provides a test system, which includes a test device 102, and a connection relationship is established between the test tool on the test device 102 and the hardware test environment of the device to be tested 104. The hardware test environment between the test tool on the test device 102 and the device to be tested 104 can be connected through a wired network or a wireless network, and the specific connection method can be selected according to actual needs. The device to be tested 104 can be a complete vehicle.

[0231] The test system provided by the present application can alleviate the problem of low writing efficiency of the data to be written due to serial writing of the data to be written. Compared with the prior art, the beneficial effects of the test system provided by the present application are the same as the beneficial effects of the data processing method for the whole vehicle test provided by the above embodiment, which will not be elaborated here.

[0232] Based on the same invention purpose, the present application provides a computer-readable storage medium having computer-readable program instructions (ie, computer program) stored thereon, and the computer-readable program instructions are used to execute the data processing method for the whole vehicle test in the above-mentioned embodiment.

[0233] The computer-readable storage medium provided in the present application may be, for example, a USB flash drive, but is not limited to electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, systems or devices, or any combination of the above. More specific examples of computer-readable storage media may include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM: Random Access Memory), a read-only memory (ROM: Read Only Memory), an erasable programmable read-only memory (EPROM: Erasable Programmable Read Only Memory or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM: CD-Read Only Memory), an optical storage device, a magnetic storage device, or any suitable combination of the above. In this embodiment, the computer-readable storage medium may be any tangible medium containing or storing a program, which may be used by or in combination with an instruction execution system, system or device. The program code contained on the computer-readable storage medium may be transmitted using any appropriate medium, including but not limited to: wires, optical cables, RF (Radio Frequency: Radio Frequency), etc., or any suitable combination of the above.

[0234] The computer-readable storage medium may be included in the test device, or may exist independently without being assembled into the test device.

[0235] The computer-readable storage medium carries one or more programs. When the one or more programs are executed by the device to be tested, the device to be tested can alleviate the problem of low writing efficiency of the data to be written due to serial writing of the data to be written.

[0236] Computer program code for performing the operations of the present application may be written in one or more programming languages ​​or a combination thereof, including object-oriented programming languages ​​such as Java, Smalltalk, C++, Python, and conventional procedural programming languages ​​such as "C" or similar programming languages. The program code may be executed entirely on the user's computer, partially on the user's computer, as a separate software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer via any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computer (e.g., via the Internet using an Internet service provider).

[0237] The flow chart and block diagram in the accompanying drawings illustrate the possible architecture, function and operation of the system, method and computer program product according to various embodiments of the present application. In this regard, each square box in the flow chart or block diagram can represent a module, a program segment or a part of a code, and the module, the program segment or a part of the code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the square box can also occur in a sequence different from that marked in the accompanying drawings. For example, two square boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each square box in the block diagram and / or flow chart, and the combination of the square boxes in the block diagram and / or flow chart can be implemented with a dedicated hardware-based system that performs a specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0238] The modules involved in the embodiments described in this application may be implemented by software or hardware, wherein the name of the module does not constitute a limitation on the unit itself in some cases.

[0239] The readable storage medium provided in the present application is a computer-readable storage medium, which stores computer-readable program instructions (i.e., computer programs) for executing the above-mentioned data processing method for vehicle testing, and can alleviate the problem of low writing efficiency of data to be written due to serial writing of data to be written. Compared with the prior art, the beneficial effects of the computer-readable storage medium provided in the present application are the same as the beneficial effects of the data processing method for vehicle testing provided in the above-mentioned embodiment, and will not be elaborated here.

[0240] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them; although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application, and they should all be included in the scope of the claims and specification of the present application. In particular, as long as there is no structural conflict, the various technical features mentioned in the various embodiments can be combined in any way. The present application is not limited to the specific embodiments disclosed herein, but includes all technical solutions that fall within the scope of the claims.

Claims

1. A data processing method for vehicle testing, characterized in that: The data processing method for the whole vehicle test comprises: Obtain identification information of each write operation object in the target test case of the whole vehicle, and the data to be written corresponding to each write operation object; Taking the combination of the identification information of each write operation object and the data to be written as a set element, respectively, to construct a data write set; If the data writing process is triggered, all the data to be written in the data writing set are synchronously written into the hardware testing environment of the whole vehicle to change the data value of each of the write operation objects in the hardware testing environment, so that the observed signal value of the signal to be observed corresponding to the write operation object in the hardware testing environment changes with the change of the data written by the write operation object, and the changed observed signal value is read to perform the whole vehicle test. The synchronization refers to the writing action or state that is kept consistent or performed simultaneously in time.

2. The data processing method for vehicle testing according to claim 1, characterized in that: The obtaining of identification information of each write operation object in the target test case of the whole vehicle, and the to-be-written data corresponding to each write operation object includes: Obtaining a target test case for the whole vehicle; From the target test case, identification information corresponding to each of the write operation objects and data to be written corresponding to each of the write operation objects are extracted.

3. The data processing method for vehicle testing according to claim 2, characterized in that: If the data writing process is triggered, before writing the data into all the to-be-written data in the set and synchronously writing them into the hardware test environment of the whole vehicle, the data processing method for the whole vehicle test further includes: Extracting identification information of each of the write operation objects from the target test case of the whole vehicle, and establishing a write operation object database based on the identification information of all the write operation objects; Loading the write operation object database into the hardware test environment of the whole vehicle, and establishing an association relationship between the test tool and the hardware test environment of the whole vehicle; If the data writing process is triggered, writing the data into all the to-be-written data in the set and synchronously writing the data into the hardware test environment of the whole vehicle includes: If the data writing process is triggered, based on the association relationship, all the data to be written in the data writing set are synchronously written into the hardware testing environment of the whole vehicle.

4. The data processing method for vehicle testing according to claim 3, characterized in that: If the data writing process is triggered, based on the association relationship, all the to-be-written data in the data writing set are synchronously written into the hardware test environment of the vehicle, including: If the data writing process is triggered, a test script is generated according to the data writing set; The test script is executed, and based on the association relationship, all the to-be-written data in the data writing set are synchronously written into the hardware test environment of the whole vehicle.

5. The data processing method for vehicle testing according to any one of claims 1 to 4, characterized in that: If the data writing process is triggered, the data is written into all the to-be-written data in the set, and synchronously written into the hardware test environment of the whole vehicle, and the data processing method for the whole vehicle test further includes: receiving feedback results of the hardware test environment, and determining the writing status of each of the data to be written according to the feedback results; Determine, according to the write status, a target write operation object where the write fails; A write failure cause is determined based on the target write operation object and the to-be-written data corresponding to the target write operation object.

6. The data processing method for vehicle testing according to any one of claims 1 to 4, characterized in that: If the data writing process is triggered, the data is written into all the to-be-written data in the set, and synchronously written into the hardware test environment of the whole vehicle, and the data processing method for the whole vehicle test further includes: If the reading process of the observation signal value is triggered, the time difference corresponding to the reading of the observation signal value of each signal to be observed is obtained according to the reading set of the observation signal value; Obtaining the reading time points of the observation signal values ​​of the signals to be observed according to the time difference between the start reading time point and the corresponding reading time of the observation signal values ​​of the signals to be observed, wherein the start reading time points of the observation signal values ​​corresponding to the signals to be observed are the same; The observed signal value of the signal to be observed is read based on the reading time point.

7. The data processing method for vehicle testing according to claim 6, characterized in that: After reading the observed signal value of the signal to be observed based on the reading time point, the data processing method for the whole vehicle test further includes: According to the observed signal value determination set, the expected value, the observed signal value and the numerical tolerance corresponding to each of the signals to be observed are obtained; Based on the expected value, the observed signal value and the numerical tolerance corresponding to each of the signals to be observed, the test results corresponding to each of the signals to be observed are obtained.

8. A data processing device for vehicle testing, characterized in that: The data processing device for the whole vehicle test comprises: A case processing module is used to obtain the identification information of each write operation object in the target test case of the whole vehicle, and the data to be written corresponding to each of the write operation objects; the combination of the identification information of each write operation object and the data to be written is used as a set element to construct a data write set; A synchronous writing module is used to write the data to all the data to be written in the set if the data writing process is triggered, and synchronously write the data into the hardware test environment of the whole vehicle to change the data value of each of the write operation objects in the hardware test environment, so that the observation signal value of the signal to be observed corresponding to the write operation object in the hardware test environment changes with the change of the data written by the write operation object, and then read the changed observation signal value to perform whole vehicle testing. The synchronization refers to writing actions or states that are kept consistent or performed simultaneously in time.

9. A testing device, characterized in that: The test equipment comprises: a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the computer program is configured to implement the steps of the data processing method for the whole vehicle test as claimed in any one of claims 1 to 7.

10. A testing system, characterized in that: The test system includes the test device as claimed in claim 9, and a connection is established between the test tool carried on the test device and the hardware test environment of the whole vehicle.

11. A storage medium, characterized in that: The storage medium is a computer-readable storage medium, and a computer program is stored on the storage medium. When the computer program is executed by a processor, the steps of the data processing method for the whole vehicle test as described in any one of claims 1 to 7 are implemented.

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