Alternating current and direct current simulation test system of capacitor

Abstract

The invention provides an AC / DC simulation test system of a capacitor, and belongs to the technical field of capacitor test. The system comprises a parameter configuration module configured to obtain image information of a to-be-tested capacitor and determine an initial test strategy of the to-be-tested capacitor, and a test module configured to perform multi-type tests on the to-be-tested capacitor in a first test period according to the initial test strategy to obtain test data of the first test period, the optimization module is configured to construct a target test feedback model of the to-be-tested capacitor and determine an optimization test strategy of the to-be-tested capacitor, the test module is further configured to obtain test data of a second test period according to the optimization test strategy, and the evaluation module is configured to evaluate the to-be-tested capacitor according to the test data of multiple test periods. And determining a simulation test result of the to-be-tested capacitor. The problem that an existing capacitor testing scheme cannot meet the testing requirement of a capacitor in a rail transit system is solved.

Description

Technical Field

[0001] The present application relates to the technical field of capacitor testing, and in particular to an AC / DC simulation testing system for a capacitor. Background Art

[0002] In rail transit systems, capacitors play an important role in key applications, especially in traction power supply systems, signal systems, and energy recovery systems. These capacitors need to withstand extreme working conditions, such as high voltage, high current, and drastic temperature changes, so the testing of capacitors in rail transit applications is particularly strict.

[0003] The current capacitor testing solution cannot meet the testing requirements of capacitors in rail transit systems. Summary of the invention

[0004] The embodiment of the present application provides an AC / DC simulation test system for a capacitor, and the present application adopts the following technical solutions:

[0005] In a first aspect, an AC / DC simulation test system for a capacitor is provided, wherein a parameter configuration module is configured to obtain image information of a capacitor to be tested after obtaining a capacitor test request, and determine an initial test strategy of the capacitor to be tested according to the image information of the capacitor to be tested, wherein the initial test strategy includes a plurality of test configuration parameters;

[0006] A testing module is configured to perform multiple types of tests on the capacitor to be tested in a first test cycle according to an initial test strategy to obtain test data of the first test cycle;

[0007] An optimization module is configured to construct a target test feedback model of the capacitor to be tested according to the test data of the first test cycle, and optimize the initial test strategy according to the target test feedback model to determine the optimized test strategy of the capacitor to be tested;

[0008] The test module is further configured to perform multiple types of tests on the capacitor to be tested in a second test cycle according to the optimized test strategy to obtain test data of the second test cycle;

[0009] The evaluation module is configured to determine a simulation test result of the capacitor to be tested according to the test data of a plurality of test cycles.

[0010] In a feasible implementation, the parameter configuration module includes:

[0011] A label determination submodule, used to determine the type label of the capacitor to be tested according to the image information of the capacitor to be tested;

[0012] The matching submodule is used to use the type label of the capacitor to be tested as an index to match an initial test strategy that matches the type label.

[0013] In a feasible implementation, the tag determination submodule includes:

[0014] A query unit, used to determine whether there is a first type tag matching the capacitor to be tested according to the model features in the image information, where the first type tag is used to characterize the type of capacitor for which there is a historical test record;

[0015] A first determining unit, configured to determine the first type label as a type label of the capacitor to be tested when there is a first type label matching the model feature;

[0016] The second determination unit is configured to determine a second type tag as a type tag of the capacitor to be tested when there is no first type tag matching the capacitor to be tested, wherein the second type tag is used to characterize a capacitor type for which there is no historical test record.

[0017] In a feasible implementation, the matching submodule includes:

[0018] A first matching unit, configured to determine an initial test strategy for the capacitor to be tested according to a historical test record corresponding to the first type tag when the type tag of the capacitor to be tested is a first type tag;

[0019] The second matching unit is used to determine an initial test strategy for the capacitor to be tested according to the performance parameters of the capacitor to be tested when the type label of the capacitor to be tested is a second type label.

[0020] In a feasible implementation, the test module includes:

[0021] A first test submodule is configured to perform a DC test on the capacitor to be tested according to an initial test strategy to obtain DC test data;

[0022] The second test submodule is configured to perform an AC test on the capacitor to be tested according to the initial test strategy to obtain AC test data.

[0023] In a feasible implementation, the first test submodule includes:

[0024] A DC power supply unit for applying a DC voltage to the capacitor to be tested according to an initial test strategy;

[0025] A first capacitance measuring unit, used to measure an electrical feedback parameter of the capacitor when a DC voltage is applied;

[0026] a first temperature measurement unit, for measuring a temperature feedback parameter of the capacitor when a DC voltage is applied;

[0027] The first data integration unit is used to integrate the electrical feedback parameters and the temperature feedback parameters to construct DC test data.

[0028] In a feasible implementation, the second test submodule includes:

[0029] An AC power supply unit, used for applying an AC ripple current to the capacitor to be tested according to an initial test strategy;

[0030] A second capacitance measuring unit, used for measuring an electrical feedback parameter of the capacitor when an AC ripple current is applied;

[0031] a second temperature measurement unit, for measuring a temperature feedback parameter of the capacitor when an AC ripple current is applied;

[0032] The second data integration unit is used to integrate the electrical feedback parameters and the temperature feedback parameters to construct AC test data.

[0033] In a feasible implementation, the optimization module includes:

[0034] A first model building submodule, used to build a first test feedback model according to the corresponding relationship between the initial test strategy and the DC test data;

[0035] A second model building submodule is used to build a second test feedback model according to the corresponding relationship between the initial test strategy and the AC test data;

[0036] The third model building submodule is used to perform model fusion according to the first test feedback model and the second test feedback model to obtain a target test feedback model;

[0037] A policy optimization submodule is used to test the feedback model against the target.

[0038] In a feasible implementation, the first model building submodule includes:

[0039] A first model building unit, used to build an electrical feedback parameter model according to the corresponding relationship between the electrical feedback parameter and the initial test strategy;

[0040] A second model building unit is used to build a temperature feedback parameter model according to the corresponding relationship between the temperature feedback parameter and the initial test strategy;

[0041] The electrical feedback parameter model is used as the first optimization target, the temperature feedback parameter model is used as the second optimization target, and the first test feedback model is determined according to the optimization results of the first optimization target and the second optimization target.

[0042] In a feasible implementation, the evaluation module includes:

[0043] A first evaluation submodule, used to determine an evaluation score of the capacitor to be tested in each test cycle according to the test data of multiple test cycles, and to determine a comprehensive evaluation result of the capacitor to be tested according to the evaluation coefficient corresponding to each test cycle;

[0044] The second evaluation submodule is used to generate a test evaluation report of the capacitor to be tested according to the comprehensive evaluation result.

[0045] In summary, the AC / DC simulation test system for the capacitor has the following technical effects:

[0046] The embodiment of the present application provides an AC / DC simulation test system for capacitors. After obtaining a capacitor test request, the parameter configuration module can intelligently identify the type and specific characteristics of the capacitor to be tested by obtaining the image information of the capacitor. This method of determining the initial test strategy based on image information ensures the accuracy and pertinence of the test strategy. Multiple test configuration parameters in the initial test strategy can be set for different types of capacitors to ensure that the system can handle capacitors of different specifications and models in the rail transit system and adapt to complex test requirements.

[0047] Secondly, the test module performs multiple types of tests in the first test cycle, covering multi-dimensional performance tests of DC and AC. Especially in rail transit, high-order harmonics have a greater impact on capacitor performance. The test module can apply AC ripple current to fully evaluate the performance of the capacitor in a real working environment and ensure that it can withstand a high-order harmonic environment. By obtaining the test data of the first test cycle, the system can fully understand the performance of the capacitor under the initial test conditions, especially the data on electrical feedback parameters and temperature feedback parameters, which provides a basis for subsequent optimization.

[0048] The optimization module further constructs a target test feedback model based on the test data of the first test cycle, and optimizes the initial test strategy by analyzing the actual performance of the capacitor. This adaptive optimization mechanism can adjust the test strategy according to the individual differences of each capacitor, ensuring that the test plan is flexible and accurate, and adapting to the high reliability requirements of capacitors in rail transit systems. The optimized test strategy can further improve the effectiveness of the test, especially for the performance of capacitors under high-frequency applications.

[0049] Finally, the evaluation module comprehensively evaluates the simulation test results of the capacitor through the test data of multiple test cycles. This multi-cycle test can fully detect the performance of the capacitor under different test conditions and different stages to ensure its performance stability. Through gradual optimization and multiple tests, the system can provide more accurate capacitor performance evaluation for rail transit applications to ensure its long-term reliability and working stability. In this way, the high requirements for capacitors in the rail transit field are met, overcoming the limitations of existing test solutions in complex environments and ensuring the performance stability of capacitors under high-order harmonics and complex temperature conditions. BRIEF DESCRIPTION OF THE DRAWINGS

[0050] Figure 1 A schematic structural diagram of an AC / DC simulation test system for a capacitor provided in an embodiment of the present application. DETAILED DESCRIPTION

[0051] The technical solution in this application will be described below in conjunction with the accompanying drawings.

[0052] In order to make the purpose, technical solutions and advantages of this application more clear, the following Figure 1 It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0053] The terms "first", "second", etc. involved in the embodiments of the present application are only used to distinguish features of the same type and cannot be understood as indicating relative importance, quantity, order, etc.

[0054] The terms "exemplary" or "for example" and the like in the embodiments of the present application are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of the terms "exemplary" or "for example" is intended to present the related concepts in a specific way.

[0055] The terms "coupling" and "connection" involved in the embodiments of the present application should be understood in a broad sense. For example, they may refer to a direct physical connection, or an indirect connection achieved through electronic devices, such as a connection achieved through resistors, inductors, capacitors or other electronic devices.

[0056] The power environment in which capacitors in the rail transit field are located is extremely harsh. They are usually faced with complex working conditions such as high voltage, high current, frequent voltage fluctuations, pulse shocks, extreme temperature changes and mechanical vibrations. However, existing capacitor testing solutions are mostly based on standard industrial or consumer electronics applications and cannot fully simulate the special working conditions in rail transit. These test solutions usually lack effective evaluation of capacitor performance under large current shocks, dynamic load changes and high-frequency operation. Due to these shortcomings, existing tests cannot provide an accurate evaluation of the actual performance of capacitors in rail transit applications, which may cause unforeseen failures or performance degradation of capacitors in actual work, increasing the risk of system operation.

[0057] Reference Figure 1 The present application provides an AC / DC simulation test system for a capacitor, comprising:

[0058] The parameter configuration module 101 is configured to obtain image information of the capacitor to be tested after obtaining a capacitor test request, and determine an initial test strategy of the capacitor to be tested according to the image information of the capacitor to be tested.

[0059] In this embodiment, after the user sends a test request and it is received by the AC / DC simulation test system, it is first necessary to determine the type of capacitor to be tested. The AC / DC simulation test system can be provided with an image acquisition device to obtain the image information of the capacitor to be tested, and determine its specific type according to the image information of the capacitor to be tested. Finally, different initial test strategies can be assigned to the capacitor according to the specific type of the capacitor to be tested. The initial test strategy includes multiple test configuration parameters to guide the specific test process of the capacitor to be tested. For example, the content of the capacitor test can be several aspects: first, the capacitance test is used to determine the energy storage capacity of the capacitor to ensure that it provides a stable capacitance value within the specified voltage range; second, the measurement of the equivalent series resistance, which reflects the inherent loss of the capacitor, especially the energy loss in high-frequency applications; leakage current testing is also key, by measuring the leakage current of the capacitor at a specific voltage to evaluate its insulation performance and reliability; in addition, the loss factor and dielectric loss of the capacitor will also be tested to evaluate its power loss in the alternating electric field. In order to ensure its performance in harsh environments, the withstand voltage test is used to verify whether the capacitor can work for a long time under rated voltage or even overvoltage conditions without breakdown or failure. Environmental simulation tests such as high temperature and high humidity tests and temperature cycle tests are also required to evaluate the stability and life performance of capacitors in extreme temperature and humidity environments. Through these tests, we can fully understand the electrical performance, thermal stability and service life of the capacitor, thereby ensuring its reliability in different application scenarios. It should be noted that when testing, multiple capacitors can be tested at the same time, and the test process of each capacitor to be tested is completely independent.

[0060] In a feasible implementation, the parameter configuration module includes:

[0061] The label determination submodule is used to determine the type label of the capacitor to be tested according to the image information of the capacitor to be tested.

[0062] In this embodiment, the system obtains the image information of the capacitor to be tested through the image acquisition device, and the label determination submodule will analyze the collected image to identify the appearance characteristics of the capacitor, such as size, shape, packaging form, and model number marked on the surface of the capacitor. Then, based on these features, the system compares it with the pre-stored capacitor type library to determine the specific type of the capacitor and the corresponding type label. The type label can accurately indicate the model, rated voltage, capacity and other key information of the capacitor, thereby providing basic support for subsequent testing processes. Through the label determination submodule, the test system can automatically identify the capacitor type and assign a suitable initial test strategy to it without manual input, thereby improving the efficiency and accuracy of the test.

[0063] In a feasible implementation, the tag determination submodule includes:

[0064] A query unit, used to determine whether there is a first type label matching the capacitor to be tested according to the model features in the image information;

[0065] A first determining unit, configured to determine the first type label as a type label of the capacitor to be tested when there is a first type label matching the model feature;

[0066] The second determining unit is configured to determine the second type tag as the type tag of the capacitor to be tested when there is no first type tag matching the capacitor to be tested.

[0067] In this embodiment, the label determination submodule includes the following functional units: the query unit is used to determine whether there is a first type label that matches the capacitor to be tested according to the model feature in the image information. The first type label refers to the type of capacitor that has a historical test record in the system. By analyzing and comparing the model features, the query unit can quickly identify whether the same model of capacitor has been tested. The first determination unit, when the query unit finds that there is a first type label that matches the model feature of the capacitor to be tested, the first determination unit will directly determine the first type label as the type label of the capacitor to be tested. The type label can effectively characterize the key characteristics of the capacitor, such as model, rated voltage, capacity and working environment. In this way, the system can call the historical test strategy according to the type label, quickly generate the test process, and reduce the time for repeated configuration. The second determination unit, when the query unit fails to find the first type label that matches the model feature of the capacitor to be tested, the system divides the capacitor into a new second type through the second determination unit. The second type label is used to mark the capacitor as a new type of capacitor that has no historical record in the system. At this time, the system needs to assign a new test strategy to the capacitor to ensure that it can still perform a comprehensive performance test without historical test data.

[0068] The matching submodule is used to use the type label of the capacitor to be tested as an index to match an initial test strategy that matches the type label.

[0069] In this embodiment, after determining the corresponding type label for each capacitor to be tested, the type label can be used as a retrieval basis to quickly find the initial test strategy that matches the label from a preset database. Therefore, using the type label for retrieval can ensure that the selected test strategy is highly consistent with the actual application scenario of the capacitor. The initial test strategy includes a series of test configuration parameters, including but not limited to test voltage, current range, frequency, temperature conditions, load characteristics, etc., which can provide detailed guidance for the subsequent test process. The workload of manual configuration is greatly reduced and the efficiency of the test is improved.

[0070] In a feasible implementation, the matching submodule includes:

[0071] A first matching unit, configured to determine an initial test strategy for the capacitor to be tested according to a historical test record corresponding to the first type tag when the type tag of the capacitor to be tested is a first type tag;

[0072] The second matching unit is used to determine an initial test strategy for the capacitor to be tested according to the performance parameters of the capacitor to be tested when the type label of the capacitor to be tested is a second type label.

[0073] In this embodiment, when the type label of the capacitor to be tested is determined to be a first type label, the first matching unit automatically generates an initial test strategy for the capacitor according to the historical test record corresponding to the type label. The historical test record contains the test configuration, test results and related performance of the previous capacitor of the same type. Therefore, based on the historical test record, the test strategy applicable to the capacitor can be quickly determined, eliminating the step of reconfiguration, and ensuring the efficiency and accuracy of the test strategy. When the type label of the capacitor to be tested is determined to be a second type label, since there is no historical test record related to this type of capacitor in the system, the second matching unit generates an adapted initial test strategy based on the actual performance parameters of the capacitor (such as rated voltage, capacitance, operating frequency, environmental requirements, etc.). This strategy generation method ensures that even in the face of a new type of capacitor, the system can formulate a reasonable test configuration based on its basic performance indicators, ensure that the performance of the capacitor can be fully evaluated, and provide accurate guidance for subsequent performance tests. This method can flexibly respond to different situations with or without historical test records, ensuring the system's comprehensive testing capabilities for new and old capacitors.

[0074] The testing module 102 is configured to perform multiple types of tests on the capacitor to be tested in a first test cycle according to an initial test strategy to obtain test data of the first test cycle.

[0075] In this embodiment, the testing module 102 is configured to perform multiple types of tests on the capacitor to be tested in the first testing cycle according to the initial testing strategy, so as to obtain test data of the capacitor to be tested in the first testing cycle.

[0076] In a feasible implementation, the test module includes:

[0077] The first test submodule is configured to perform a DC test on the capacitor to be tested according to an initial test strategy to obtain DC test data.

[0078] The second test submodule is configured to perform an AC test on the capacitor to be tested according to the initial test strategy to obtain AC test data.

[0079] In this embodiment, in the DC test, the system applies a constant DC voltage to the capacitor, measures its capacitance, leakage current and withstand voltage performance, and evaluates its energy storage capacity, insulation characteristics and stability under DC working conditions. The DC test can detect the leakage current, withstand voltage and long-term DC performance of the capacitor to ensure its reliability in the DC circuit. In the AC test, the system applies an alternating voltage or alternating current to the capacitor to test the changes in its equivalent series resistance, loss factor and capacitance under AC conditions. The AC test can simulate the behavior of the capacitor in a high-frequency signal environment and evaluate its dynamic response under an alternating electric field, especially the loss, thermal effect and stability in high-frequency applications. Through the combined test of DC and AC, the system can comprehensively analyze the performance of the capacitor under different power environments, thereby obtaining comprehensive test data for the first test cycle. This test method can cover a variety of working conditions that the capacitor may encounter in actual use, ensuring its reliability and stability in complex application scenarios.

[0080] In a feasible implementation, the first test submodule includes:

[0081] A DC power supply unit for applying a DC voltage to the capacitor to be tested according to an initial test strategy;

[0082] A first capacitance measuring unit, used to measure an electrical feedback parameter of the capacitor when a DC voltage is applied;

[0083] a first temperature measurement unit, for measuring a temperature feedback parameter of the capacitor when a DC voltage is applied;

[0084] The first data integration unit is used to integrate the electrical feedback parameters and the temperature feedback parameters to construct DC test data.

[0085] In this embodiment, in a feasible embodiment, the first test submodule includes the following components: a DC power supply unit, which is used to apply a DC voltage to the capacitor to be tested according to the initial test strategy. This unit can accurately control the voltage value to ensure that the capacitor operates under the specified DC working conditions to evaluate its DC performance. The first capacitance measurement unit is used to measure the electrical feedback parameters of the capacitor while applying the DC voltage. These electrical feedback parameters include capacitance, leakage current, equivalent series resistance, etc., which can help the system understand the basic electrical characteristics and performance of the capacitor under DC voltage. The first temperature measurement unit is used to monitor the temperature feedback parameters of the capacitor in real time during the application of the DC voltage. This unit can evaluate the thermal effect generated by the capacitor during operation to ensure that it can still work stably when the temperature rises. The first data integration unit is responsible for integrating the electrical feedback parameters and the temperature feedback parameters to construct complete DC test data. Through the comprehensive analysis of electrical performance and thermal performance, the system can more comprehensively evaluate the operating state of the capacitor in a DC environment to ensure its reliability and stability in practical applications.

[0086] Electrical feedback parameters directly reflect the core electrical performance of the capacitor. Common electrical parameters include capacitance, equivalent series resistance, leakage current, etc. Measuring these parameters helps to understand the energy storage capacity, loss, insulation performance, etc. of the capacitor under specific working conditions. For example, changes in capacitance can indicate the health of the capacitor and reveal its energy loss in a high-frequency environment, while leakage current reflects its insulation performance. These electrical feedback parameters can help determine whether the capacitor meets the design specifications and whether it can work properly in actual applications.

[0087] During operation, capacitors generate heat due to the flow of current. Excessive temperature may cause the performance of the capacitor to deteriorate or even fail. Therefore, it is very important to monitor the temperature feedback parameters. The increase in temperature may affect the electrical characteristics of the capacitor, especially the leakage current. These parameters will fluctuate with temperature changes, affecting the stability of the capacitor. By measuring the temperature feedback parameters, the thermal stability of the capacitor and its working performance at different temperatures can be evaluated to ensure that it can still maintain reliability under high temperature or extreme conditions.

[0088] In a feasible implementation, the second test submodule includes:

[0089] An AC power supply unit, used for applying an AC ripple current to the capacitor to be tested according to an initial test strategy;

[0090] A second capacitance measuring unit, used for measuring an electrical feedback parameter of the capacitor when an AC ripple current is applied;

[0091] a second temperature measurement unit, for measuring a temperature feedback parameter of the capacitor when an AC ripple current is applied;

[0092] The second data integration unit is used to integrate the electrical feedback parameters and the temperature feedback parameters to construct AC test data.

[0093] In this embodiment, the second test submodule includes the following components: an AC power supply unit, which is used to apply an AC ripple current to the capacitor to be tested according to the initial test strategy. It is capable of accurately controlling the frequency and amplitude of the alternating current to simulate the high-frequency ripple or AC power supply conditions faced by the capacitor in actual applications. By applying this AC ripple current, the dynamic performance and response characteristics of the capacitor in a high-frequency working environment can be evaluated. A second capacitance measurement unit is used to measure the electrical feedback parameters of the capacitor when applying the AC ripple current. These electrical feedback parameters include changes in equivalent series resistance, loss factor, and capacitance under AC conditions. A second temperature measurement unit is used to measure the temperature feedback parameters of the capacitor when applying the AC ripple current. The capacitor will generate more heat due to current fluctuations under high-frequency AC, so temperature monitoring can help evaluate its thermal stability under such high-voltage and high-frequency conditions. By measuring the temperature feedback parameters, the system can understand the thermal management capabilities of the capacitor and judge its safety in a high-temperature environment. The second data integration unit is responsible for integrating the electrical feedback parameters and the temperature feedback parameters to construct complete AC test data. By integrating this data, the system can fully analyze the performance of the capacitor under alternating current conditions, especially its working state under different frequency and load conditions.

[0094] In the field of rail transit, due to the operation of complex power systems and high-power equipment, a large number of high-order harmonics are often generated. These high-order harmonics are current or voltage components with higher frequencies, which are superimposed on the basic waveform of the main power supply to form an irregular waveform. This high-order harmonic has a greater impact on electronic components such as capacitors, so AC ripple current is required during AC testing. AC ripple current can simulate the characteristics of this high-order harmonic in the rail transit environment. By applying this alternating current, the performance of the capacitor in the actual working environment can be tested. Especially under high frequency or high-order harmonic conditions, the equivalent series resistance and loss factor of the capacitor will change, which will affect its energy conversion efficiency and thermal stability in the power system. By applying AC ripple current, the complex power environment in which the capacitor is located can be more realistically simulated, thereby evaluating its response to high-order harmonics, power loss and reliability in high-frequency environments. Testing using AC ripple current can effectively identify the performance degradation problems that may occur in capacitors at high-order harmonic frequencies, ensure that the capacitor can work stably and for a long time in the rail transit system, and reduce the risk of overheating, excessive loss or capacitor failure caused by harmonics. This testing method helps to improve the overall performance and reliability of power equipment in rail transit systems.

[0095] The optimization module 103 is configured to construct a target test feedback model of the capacitor to be tested according to the test data of the first test cycle, and optimize the initial test strategy according to the target test feedback model to determine the optimized test strategy of the capacitor to be tested.

[0096] In this embodiment, even for capacitors of the same model, under the same test conditions, the test data generated in the first test cycle will be different due to slight differences in the properties of the capacitors themselves. Therefore, the initial test strategy cannot always be used as the only guide for subsequent tests. This is because although the initial test strategy can provide a basic test framework for capacitors, it is set based on the general characteristics of the capacitor type and cannot accurately reflect the specific performance differences of each capacitor.

[0097] To ensure the accuracy and personalization of the test, the system needs to dynamically adjust and optimize the subsequent test strategy based on the specific test data of each capacitor in the first test cycle. By analyzing the electrical feedback parameters and temperature feedback parameters of the capacitor in the first test cycle, the system can identify the performance of each capacitor, possible anomalies, and deviations from the expected standard. This analysis can help the system customize an optimized test strategy for each capacitor that suits its actual performance.

[0098] The optimized test strategy will be more targeted and can be adjusted according to the specific characteristics of the capacitor, such as test voltage, frequency, load conditions, etc. This strategy optimization process ensures that subsequent tests can more accurately evaluate the true performance of each capacitor, improve the reliability and consistency of test results, and also help to discover potential performance problems and ensure the long-term stability of capacitors in complex application scenarios.

[0099] In a feasible implementation, the optimization module includes:

[0100] A first model building submodule, used to build a first test feedback model according to the corresponding relationship between the initial test strategy and the DC test data;

[0101] A second model building submodule is used to build a second test feedback model according to the corresponding relationship between the initial test strategy and the AC test data;

[0102] The third model building submodule is used to perform model fusion according to the first test feedback model and the second test feedback model to obtain a target test feedback model;

[0103] A policy optimization submodule is used to test the feedback model against the target.

[0104] In this embodiment, the first model construction submodule is used to construct a first test feedback model according to the corresponding relationship between the initial test strategy and the DC test data. This model forms a systematic understanding of the performance of the capacitor under DC test by analyzing the electrical feedback parameters and temperature feedback parameters collected during the initial test strategy and DC test. The model can reveal the response characteristics and performance of the capacitor under DC working conditions. The second model construction submodule is used to construct a second test feedback model according to the corresponding relationship between the initial test strategy and the AC test data. Similar to the DC test, the second model construction submodule will form a performance model of the capacitor under AC conditions based on the data of the AC test. This model can help understand the dynamic characteristics of the capacitor in an alternating current environment, especially its response to high-frequency signals. The third model construction submodule is used to perform model fusion based on the first test feedback model and the second test feedback model to obtain the final target test feedback model. By combining the performance of the capacitor in DC and AC tests, the third model can comprehensively evaluate the overall performance of the capacitor in complex application scenarios. This model fusion can generate a more comprehensive test feedback, covering the performance of the capacitor in a variety of power environments, making the evaluation more accurate and reliable. The strategy optimization submodule is used to optimize the test strategy of the capacitor based on the target test feedback model. By analyzing the data in the target test feedback model, the strategy optimization submodule can identify the personalized needs and performance differences of the capacitor, and adjust and optimize the subsequent test strategy accordingly. The optimized test strategy is more suitable for the actual working conditions of each capacitor, ensuring its performance stability and reliability in different application scenarios.

[0105] By establishing a correspondence between the initial test strategy and the DC test data, a first test feedback model that reflects the performance of the capacitor under DC conditions is constructed. This allows for an in-depth analysis of the specific performance of the capacitor in the DC test, especially the mutual influence of the electrical feedback and temperature feedback data. Focusing on the relationship between the initial test strategy and the AC test data, a second test feedback model is formed by modeling the high-frequency performance and loss characteristics of the capacitor in the AC test. In this way, the complex characteristics of the AC test can also be fully analyzed. By fusing the first and second test feedback models to generate a comprehensive target test feedback model, this fusion process can effectively combine the different performance of the capacitor under DC and AC conditions to generate a more comprehensive and accurate performance evaluation model. Through this fusion model, the possible complex behaviors and interactions of capacitors in actual applications can be better captured.

[0106] In a feasible implementation, the first model building submodule includes:

[0107] A first model building unit, used to build an electrical feedback parameter model according to the corresponding relationship between the electrical feedback parameter and the initial test strategy;

[0108] A second model building unit is used to build a temperature feedback parameter model according to the corresponding relationship between the temperature feedback parameter and the initial test strategy;

[0109] The electrical feedback parameter model is used as the first optimization target, the temperature feedback parameter model is used as the second optimization target, and the first test feedback model is determined according to the optimization results of the first optimization target and the second optimization target.

[0110] In this embodiment, the first model building unit is used to build an electrical feedback parameter model according to the corresponding relationship between the electrical feedback parameter and the initial test strategy. This model can capture the core electrical performance of the capacitor under DC conditions and help the system evaluate the electrical characteristics of the capacitor. The second model building unit builds a temperature feedback parameter model according to the corresponding relationship between the temperature feedback parameter and the initial test strategy. This model is mainly used to reflect the thermal effect and temperature change of the capacitor during the DC test on its performance, and evaluate the thermal stability and working reliability of the capacitor under different temperature conditions. During the optimization process, the system first uses the electrical feedback parameter model as the first optimization target to ensure that the electrical performance of the capacitor meets the expected standards. Then, the system uses the temperature feedback parameter model as the second optimization target to ensure that the thermal performance of the capacitor meets the test requirements. Finally, according to the optimization results of the first optimization target and the second optimization target, the system combines the comprehensive evaluation of electrical performance and thermal performance to determine the complete first test feedback model. This test feedback model can more comprehensively reflect the actual performance of the capacitor in the DC test, ensure the precise optimization of the subsequent test strategy, and improve the accuracy and reliability of the test.

[0111] It should be noted that the process of constructing an electrical feedback parameter model based on the correspondence between the electrical feedback parameters and the initial test strategy includes corresponding analysis of the electrical feedback parameters and the various conditions in the initial test strategy. By counting and analyzing the performance of each electrical parameter under different test conditions, the system can find out the relationship between the parameters. For example, the changing trend of capacitance under different DC voltages, or the changing law of equivalent series resistance under different leakage current ranges. By establishing a mathematical model of electrical feedback parameters, the mapping relationship between electrical parameters and test conditions is described.

[0112] It should be noted that the architecture of the second model building submodule is the same as that of the first model building submodule, so this application will not go into details.

[0113] The test module is further configured to perform multiple types of tests on the capacitor to be tested in the second test cycle according to the optimized test strategy to obtain test data of the second test cycle.

[0114] In this embodiment, in the second test cycle, multiple types of tests are performed on the capacitor to be tested to obtain test data for the second test cycle. In the second test cycle, the test module no longer relies solely on the initial test strategy, but performs further testing based on the test data and feedback results of the first test cycle through an optimized test strategy. The optimization strategy fully considers the individual differences of the capacitors and the electrical and temperature feedback parameters exhibited in the first cycle, so that the test conditions can be set more accurately, so that the test results are more in line with the actual performance of the capacitor.

[0115] In multi-type tests, the test module will perform DC tests and AC tests at the same time to more comprehensively evaluate the performance of the capacitor. By applying optimized DC voltage and AC ripple current, the test module can measure the electrical feedback parameters and temperature feedback parameters of the capacitor under these conditions again. These test data are not only used to verify the results of the first test cycle, but also to further adjust and improve the model to improve the accuracy and pertinence of the test.

[0116] The test data of the second test cycle will be used to evaluate the performance of the capacitor under the optimized test strategy, so as to determine whether it meets the expected application requirements. Through this multi-cycle and multi-type test method, the stability and reliability of the capacitor under different working conditions can be ensured, providing stronger protection for its long-term use in practical applications.

[0117] The evaluation module 104 is configured to determine a simulation test result of the capacitor to be tested according to the test data of a plurality of test cycles.

[0118] In this embodiment, determining the simulation test result of the capacitor to be tested based on the test data of multiple test cycles is a comprehensive evaluation process, which aims to fully understand the performance of the capacitor under different conditions.

[0119] In a feasible implementation, the evaluation module includes:

[0120] A first evaluation submodule, used to determine an evaluation score of the capacitor to be tested in each test cycle according to the test data of multiple test cycles, and to determine a comprehensive evaluation result of the capacitor to be tested according to the evaluation coefficient corresponding to each test cycle;

[0121] The second evaluation submodule is used to generate a test evaluation report of the capacitor to be tested according to the comprehensive evaluation result.

[0122] In this embodiment, the first evaluation submodule is used to determine the evaluation score of the capacitor to be tested in each test cycle according to the test data of multiple test cycles. Specifically, the first evaluation submodule analyzes the data of each test cycle, especially the electrical feedback parameters and temperature feedback parameters, and gives the evaluation score of each test cycle through the set indicators and weights. These evaluation scores reflect the performance of the capacitor under different test conditions, covering the key performance indicators in DC and AC tests. In addition, the first evaluation submodule also determines the comprehensive evaluation result of the capacitor according to the evaluation coefficient corresponding to each test cycle. The evaluation coefficient is set based on the weight of different test cycles, reflecting the importance of different test stages to the final evaluation. For example, some test cycles may focus more on the high-frequency performance of the capacitor, while others are more concerned about the impact of temperature on its performance. By combining the evaluation coefficients of these different cycles, the first evaluation submodule can generate a comprehensive evaluation result, which more comprehensively reflects the overall performance of the capacitor.

[0123] The second evaluation submodule generates a test evaluation report for the capacitor to be tested based on the comprehensive evaluation results. The report includes the specific performance of the capacitor in each test cycle, detailed records of key performance parameters, abnormalities or non-compliance with standards during the test, and gives the final test conclusion of the capacitor based on the comprehensive evaluation results. This test evaluation report can provide a reliable basis for subsequent quality control, production optimization and application decisions, and ensure the long-term stability and reliability of the capacitor in complex application scenarios. After completing the test of a type of capacitor, the corresponding historical test record can be generated based on its test evaluation report.

[0124] The embodiment of the present application provides an AC / DC simulation test system for capacitors. After obtaining a capacitor test request, the parameter configuration module can intelligently identify the type and specific characteristics of the capacitor to be tested by obtaining the image information of the capacitor. This method of determining the initial test strategy based on image information ensures the accuracy and pertinence of the test strategy. Multiple test configuration parameters in the initial test strategy can be set for different types of capacitors to ensure that the system can handle capacitors of different specifications and models in the rail transit system and adapt to complex test requirements.

[0125] Secondly, the test module performs multiple types of tests in the first test cycle, covering multi-dimensional performance tests of DC and AC. Especially in rail transit, high-order harmonics have a greater impact on capacitor performance. The test module can apply AC ripple current to fully evaluate the performance of the capacitor in a real working environment and ensure that it can withstand a high-order harmonic environment. By obtaining the test data of the first test cycle, the system can fully understand the performance of the capacitor under the initial test conditions, especially the data on electrical feedback parameters and temperature feedback parameters, which provides a basis for subsequent optimization.

[0126] The optimization module further constructs a target test feedback model based on the test data of the first test cycle, and optimizes the initial test strategy by analyzing the actual performance of the capacitor. This adaptive optimization mechanism can adjust the test strategy according to the individual differences of each capacitor, ensuring that the test plan is flexible and accurate, and adapting to the high reliability requirements of capacitors in rail transit systems. The optimized test strategy can further improve the effectiveness of the test, especially for the performance of capacitors under high-frequency applications.

[0127] Finally, the evaluation module comprehensively evaluates the simulation test results of the capacitor through the test data of multiple test cycles. This multi-cycle test can fully detect the performance of the capacitor under different test conditions and different stages to ensure its performance stability. Through gradual optimization and multiple tests, the system can provide more accurate capacitor performance evaluation for rail transit applications to ensure its long-term reliability and working stability. In this way, the high requirements for capacitors in the rail transit field are met, overcoming the limitations of existing test solutions in complex environments and ensuring the performance stability of capacitors under high-order harmonics and complex temperature conditions.

[0128] The above embodiments can be implemented in whole or in part by software, hardware (such as circuits), firmware or any other combination. When implemented using software, the above embodiments can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions or computer programs. When a computer instruction or computer program is loaded or executed on a computer, a process or function according to an embodiment of the present application is generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable system. The computer program or instruction can be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer program or instruction can be transmitted from one website site, computer, server or data center to another website site, computer, server or data center by wired (such as infrared, wireless, microwave, etc.). The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center containing one or more available media sets. The available medium can be a magnetic medium (for example, a floppy disk, a hard disk, a tape), an optical medium (for example, a DVD), or a semiconductor medium. The semiconductor medium can be a solid-state hard disk.

[0129] It should be understood that the term "and / or" in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. A and B can be singular or plural. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship, but it may also indicate an "and / or" relationship. Please refer to the context for specific understanding.

[0130] In this application, "at least one" means one or more, and "more" means two or more. "At least one of the following" or similar expressions refers to any combination of these items, including any combination of single or plural items. For example, at least one of a, b, or c can be represented by: a, b, c, ab, ac, bc, or abc, where a, b, c can be single or multiple.

[0131] It should be understood that in the various embodiments of the present application, the size of the serial numbers of the above-mentioned processes does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0132] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0133] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described systems, systems and units can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0134] In the several embodiments provided in the present application, it should be understood that the disclosed systems, systems and methods can be implemented in other ways. For example, the system embodiments described above are only schematic. For example, the division of units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, and the indirect coupling or communication connection of the system or unit can be electrical, mechanical or other forms.

[0135] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0136] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0137] If the function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, server, or network device, etc.) to perform all or part of the steps of the various embodiments of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM), random access memory (RAM), disk or optical disk, and other media that can store program codes.

[0138] The above are only specific implementations of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A capacitor AC / DC simulation test system, characterized in that: The system comprises: a parameter configuration module, configured to obtain image information of the capacitor to be tested after obtaining a capacitor test request, and determine an initial test strategy of the capacitor to be tested according to the image information of the capacitor to be tested, wherein the initial test strategy includes a plurality of test configuration parameters; A testing module configured to perform multiple types of tests on the capacitor to be tested in a first test cycle according to the initial test strategy to obtain test data of the first test cycle; an optimization module, configured to construct a target test feedback model of the capacitor to be tested according to the test data of the first test cycle, and optimize the initial test strategy according to the target test feedback model to determine an optimized test strategy for the capacitor to be tested; The testing module is further configured to perform multiple types of tests on the capacitor to be tested in a second testing cycle according to the optimized testing strategy to obtain test data of the second testing cycle; The evaluation module is configured to determine a simulation test result of the capacitor to be tested according to test data of a plurality of test cycles.

2. The AC / DC simulation test system for capacitors according to claim 1, characterized in that: The parameter configuration module includes: A label determination submodule, used to determine the type label of the capacitor to be tested according to the image information of the capacitor to be tested; The matching submodule is used to use the type label of the capacitor to be tested as an index to match an initial test strategy that matches the type label.

3. The AC / DC simulation test system for capacitors according to claim 2, characterized in that: The label determination submodule includes: A query unit, configured to determine whether there is a first type tag matching the capacitor to be tested according to the model feature in the image information, wherein the first type tag is used to characterize the type of capacitor for which there is a historical test record; A first determining unit, configured to, if there is a first type label matching the model feature, determine the first type label as the type label of the capacitor to be tested; The second determining unit is configured to determine a second type tag as the type tag of the capacitor to be tested if there is no first type tag matching the capacitor to be tested, wherein the second type tag is used to represent a capacitor type for which there is no historical test record.

4. The AC / DC simulation test system for capacitors according to claim 2, characterized in that: The matching submodule includes: A first matching unit, configured to determine an initial test strategy for the capacitor to be tested according to a historical test record corresponding to the first type tag when the type tag of the capacitor to be tested is a first type tag; The second matching unit is configured to determine an initial test strategy for the capacitor to be tested according to the performance parameters of the capacitor to be tested when the type label of the capacitor to be tested is a second type label.

5. The capacitor AC / DC simulation test system according to claim 1, characterized in that: The test module includes: A first testing submodule is configured to perform a DC test on the capacitor to be tested according to the initial testing strategy to obtain DC test data; The second testing submodule is configured to perform an AC test on the capacitor to be tested according to the initial testing strategy to obtain AC test data.

6. The AC / DC simulation test system for capacitors according to claim 5, characterized in that: The first test submodule includes: a DC power supply unit, configured to apply a DC voltage to the capacitor to be tested according to the initial test strategy; A first capacitance measuring unit, used to measure an electrical feedback parameter of the capacitor when a DC voltage is applied; a first temperature measurement unit, for measuring a temperature feedback parameter of the capacitor when a DC voltage is applied; The first data integration unit is used to integrate the electrical feedback parameter and the temperature feedback parameter to construct the DC test data.

7. The capacitor AC / DC simulation test system according to claim 5, characterized in that: The second test submodule includes: an AC power supply unit, configured to apply an AC ripple current to the capacitor to be tested according to the initial test strategy; A second capacitance measuring unit, used for measuring an electrical feedback parameter of the capacitor when an AC ripple current is applied; a second temperature measurement unit, for measuring a temperature feedback parameter of the capacitor when an AC ripple current is applied; The second data integration unit is used to integrate the electrical feedback parameter and the temperature feedback parameter to construct the AC test data.

8. The capacitor AC / DC simulation test system according to claim 1, characterized in that: The optimization module includes: A first model building submodule, used for building a first test feedback model according to the corresponding relationship between the initial test strategy and the DC test data; A second model building submodule, used to build a second test feedback model according to the corresponding relationship between the initial test strategy and the AC test data; A third model building submodule is used to perform model fusion according to the first test feedback model and the second test feedback model to obtain the target test feedback model; The strategy optimization submodule is used to test the feedback model according to the target.

9. The capacitor AC / DC simulation test system according to claim 8, characterized in that: The first model building submodule includes: A first model building unit, configured to build an electrical feedback parameter model according to a correspondence between the electrical feedback parameter and the initial test strategy; A second model building unit, used for building a temperature feedback parameter model according to the corresponding relationship between the temperature feedback parameter and the initial test strategy; The electrical property feedback parameter model is used as a first optimization target, the temperature feedback parameter model is used as a second optimization target, and the first test feedback model is determined according to the optimization results of the first optimization target and the second optimization target.

10. The capacitor AC / DC simulation test system according to claim 1, characterized in that: The evaluation module includes: A first evaluation submodule, configured to determine an evaluation score of the capacitor to be tested in each test cycle according to test data of multiple test cycles, and determine a comprehensive evaluation result of the capacitor to be tested according to an evaluation coefficient corresponding to each test cycle; The second evaluation submodule is used to generate a test evaluation report of the capacitor to be tested according to the comprehensive evaluation result.

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