A contact testing method, device and system for titanium alloy buckle contacts

Abstract

The present invention relates to the technical field of electrical performance testing, and specifically to a contact testing method, device and system for titanium alloy buckle contacts. The present invention obtains the resistance stability of the contact position and the resistance stable position by analyzing the change between the contact resistance value of the contact position and the contact resistance value of its neighboring position; obtains the anti-interference ability of the contact resistance value by analyzing the change consistency of the resistance stability under different test conditions of each resistance stable position; obtains the effectiveness of the contact resistance value by analyzing the change trend of the contact resistance value of each resistance stable position; and corrects the contact resistance value of each resistance stable position according to the anti-interference ability and effectiveness of the contact resistance value to obtain the corrected contact resistance value of the contact, judge the quality of the contact and analyze the qualified situation of the titanium alloy buckle. The present invention improves the reliability of the contact resistance value, and thus can improve the accuracy of the quality judgment of the titanium alloy buckle contact.

Description

Technical Field

[0001] The present invention relates to the technical field of electrical performance testing, and in particular to a contact testing method, equipment and system for titanium alloy buckle contacts. Background Art

[0002] Titanium alloy has good physical and chemical properties, which makes it widely used in aerospace, medical and other scenarios. Titanium alloy can be used as a medical allograft due to its stability and lightness, and can also be used to make probes for equipment. When performing brain wave monitoring, it is necessary to contact the scalp with electrodes to collect brain wave signals, and then transmit the acquired brain wave signals to the device for data analysis. When collecting data, it is generally necessary to fix the electrodes or sensor equipment with titanium alloy buckles with good performance. Titanium alloy buckles need to transmit the collected data while fixing the equipment. Therefore, when using titanium alloy buckles, it is necessary to conduct contact tests on their contacts to determine their performance.

[0003] In the prior art, when conducting a contact test on a titanium alloy buckle contact, the contact is energized and the resistance, temperature and other information of the contact after energization are analyzed to determine the quality or life of the contact when in contact. However, during EEG monitoring, the titanium alloy buckle contact is subject to external forces (mechanical vibration) and electromagnetic interference, resulting in serious noise in the acquired EEG information. Therefore, during EEG monitoring, determining the quality or life of the contact when in contact by only analyzing the resistance information of the contact may result in unreliable judgment results, which in turn affects the robustness of EEG monitoring. Summary of the invention

[0004] In order to solve the above technical problems, the object of the present invention is to provide a contact testing method, equipment and system for titanium alloy buckle contacts.

[0005] According to a first aspect of an embodiment of the present invention, a contact testing method for a titanium alloy buckle contact is provided, and the technical solution adopted is specifically as follows:

[0006] Obtain the contact resistance values ​​of contacts at different contact positions and under different test conditions;

[0007] Based on the contact resistance values ​​at different contact positions, analyzing the change between the contact resistance value at each contact position and the contact resistance value at its neighboring position, obtaining the resistance stability of each contact position, and then determining the resistance stable position;

[0008] Based on the resistance stability of each resistance stable position under different test conditions, the change consistency of the resistance stability of each resistance stable position under different test conditions is analyzed to obtain the anti-interference ability of the contact resistance value of each resistance stable position;

[0009] Based on the contact resistance values ​​under different test conditions, analyzing the change trend of the contact resistance value at each resistance stable position, and obtaining the validity of the contact resistance value at each resistance stable position;

[0010] According to the anti-interference capability and the effectiveness of the contact resistance value at each resistance stable position, the contact resistance value at each resistance stable position is corrected to obtain a corrected contact resistance value of the contact point.

[0011] In some embodiments of the present invention, the test conditions include contact pressure and contact current.

[0012] In some embodiments of the present invention, based on the contact resistance values ​​at different contact positions, analyzing the change between the contact resistance value at each contact position and the contact resistance value at its neighboring position, obtaining the resistance stability of each contact position, and then determining the resistance stable position, includes:

[0013] Calculate the resistance mean and resistance variance of the contact resistance values ​​measured multiple times under the same test conditions at each contact position;

[0014] Draw a thermal diagram of all the contact positions and the resistance averages corresponding to different contact positions under the same test condition;

[0015] Determining eight neighborhood positions of each of the contact positions based on the heat map;

[0016] Analyze the difference between the resistance mean of each contact position and the resistance mean of its eight neighboring positions, and analyze the superposition between the resistance variance of each contact position and the resistance variance of its eight neighboring positions, to obtain the resistance stability of each contact position;

[0017] According to the resistance stability of the contact position, a resistance stability threshold is set to obtain a resistance stable position.

[0018] In some embodiments of the present invention, based on the resistance stability of each resistance stable position, the change consistency of the resistance stability of each resistance stable position under different test conditions is analyzed to obtain the anti-interference ability of the contact resistance value of each resistance stable position, including:

[0019] Based on the resistance stability of each resistance stable position and different contact pressures, the change consistency of the resistance stability corresponding to different contact pressures at each resistance stable position is analyzed to obtain the anti-interference ability of the contact resistance value at each resistance stable position.

[0020] In some embodiments of the present invention, based on the contact resistance values ​​under different test conditions, analyzing the change trend of the contact resistance value at each resistance stable position to obtain the validity of the contact resistance value at each resistance stable position includes:

[0021] Construct a two-dimensional coordinate space using the different contact pressures at each resistor stable position and the corresponding contact resistance, wherein the abscissa of the two-dimensional coordinate space is the contact pressure and the ordinate is the contact resistance value;

[0022] Performing regression fitting on the data points in the two-dimensional coordinate space to obtain a regression line;

[0023] Based on the regression line, the variation trend of the contact resistance value at each resistance stable position is analyzed to obtain the validity of the contact resistance value at each resistance stable position.

[0024] In some embodiments of the present invention, based on the regression line, analyzing the change trend of the contact resistance value at each resistance stable position to obtain the validity of the contact resistance value at each resistance stable position includes:

[0025] Based on the regression line, obtaining the slope and loss function of the regression line;

[0026] According to the slope and the loss function, the variation trend of the contact resistance value at each resistance stable position is analyzed to obtain the validity of the contact resistance value at each resistance stable position.

[0027] In some embodiments of the present invention, the method further comprises:

[0028] According to the corrected contact resistance value, the quality of the contact point is judged and the qualification of the titanium alloy buckle is analyzed.

[0029] In some embodiments of the present invention, judging the quality of the contact and analyzing the qualification of the titanium alloy buckle according to the corrected contact resistance value includes:

[0030] Performing linear normalization processing on the corrected contact resistance value to obtain a normalized corrected contact resistance value, and using the normalized corrected contact resistance value as a quality measurement value of the contact;

[0031] Set the threshold value of the corrected contact resistance value;

[0032] Comparing the normalized corrected contact resistance value with the corrected contact resistance value threshold;

[0033] If the normalized corrected contact resistance value is less than the corrected contact resistance value threshold, the titanium alloy buckle is judged to be a qualified product.

[0034] According to a second aspect of an embodiment of the present invention, a contact testing device for titanium alloy buckle contacts is provided, the device comprising: a memory and a processor, wherein:

[0035] The memory is used to store program codes;

[0036] The processor is used to read the program code stored in the memory and execute a contact testing method for titanium alloy buckle contacts provided in the first aspect of an embodiment of the present invention.

[0037] According to a third aspect of an embodiment of the present invention, a contact testing system for titanium alloy buckle contacts is provided, the system comprising:

[0038] A contact resistance value acquisition module is used to obtain the contact resistance values ​​of contacts at different contact positions and under different test conditions;

[0039] A resistance stable position acquisition module is used to analyze the change between the contact resistance value of each contact position and the contact resistance value of its neighboring position based on the contact resistance values ​​of different contact positions, obtain the resistance stability of each contact position, and then determine the resistance stable position;

[0040] The anti-interference capability analysis module of the contact resistance value is used to analyze the change consistency of the resistance stability of each resistance stable position under different test conditions based on the resistance stability of each resistance stable position, and obtain the anti-interference capability of the contact resistance value of each resistance stable position;

[0041] A contact resistance value validity analysis module, used to analyze the change trend of the contact resistance value at each resistance stable position based on the contact resistance value under different test conditions, and obtain the validity of the contact resistance value at each resistance stable position;

[0042] The corrected contact resistance value acquisition module is used to correct the contact resistance value of each resistance stable position according to the anti-interference ability and the effectiveness of the contact resistance value of each resistance stable position to obtain the corrected contact resistance value of the contact point.

[0043] Compared with the prior art, the contact testing method, device and system of titanium alloy buckle contacts provided by the present invention have the following beneficial effects:

[0044] The present invention provides sufficient data for subsequent analysis by setting up experiments to monitor the contact resistance values ​​of contacts at different contact positions and under different test conditions. First, by analyzing the resistance stability of the contact resistance value in the area where each contact position is located, the resistance stable position is determined, that is, through the analysis of the resistance stability, the contact position with stable resistance is preliminarily screened out, and then the analysis is carried out on the basis of the resistance stable position, which reduces the amount of data analyzed and can improve the analysis efficiency and accuracy. Then, by analyzing the consistency of the change of the resistance stability of each resistance stable position with the change of contact pressure, the anti-interference ability of the contact resistance value of each resistance stable position is obtained; and by analyzing the change trend of the contact resistance value of each resistance stable position with the change of contact pressure, the effectiveness of the contact resistance value of each resistance stable position is obtained; finally, according to the anti-interference ability and the effectiveness of the contact resistance value of each resistance stable position, the contact resistance value of each resistance stable position is corrected to obtain the corrected contact resistance value of the contact; by analyzing the interference of contact pressure on the contact resistance value of the resistance stable position, and analyzing the influence of contact pressure on the effectiveness of contact resistance value, the contact resistance value is corrected, and the contact resistance value after correction comprehensively considers the influence of external factors, improves the reliability of the contact resistance value, and provides a basis for the accuracy of subsequent quality judgment of titanium alloy buckle contacts. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0046] Figure 1 A basic flow chart of a contact testing method for titanium alloy buckle contacts provided by one embodiment of the present invention;

[0047] Figure 2 A schematic diagram of a basic flow chart of a method for obtaining a stable position of a resistor provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0048] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the following is a detailed description of the contact testing method, device and system of a titanium alloy buckle contact proposed by the present invention, its specific implementation method, structure, characteristics and effects in combination with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures or characteristics in one or more embodiments may be combined in any suitable form.

[0049] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those generally understood by those skilled in the art to which the present invention belongs. Terms such as "comprises", "comprising" or any other variant thereof are intended to cover non-exclusive inclusion, so that a circuit structure, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such article or device. In the absence of further restrictions, an element defined by the statement "comprising a ..." does not exclude the presence of other identical elements in the article or device including the element.

[0050] The specific scheme of the contact testing method of the titanium alloy buckle contact provided by the present invention is described in detail below with reference to the accompanying drawings.

[0051] See also Figure 1 , which shows the basic process of a contact testing method for a titanium alloy buckle contact provided by an embodiment of the present invention.

[0052] like Figure 1 As shown, a contact testing method for titanium alloy buckle contacts provided by one embodiment of the present invention specifically includes:

[0053] S100: Obtain contact resistance values ​​of contacts at different contact positions and under different test conditions.

[0054] The contact is an important component for transmitting signals, and the contact resistance is an important indicator for measuring the performance of the contact. Therefore, in this embodiment, the contact resistance value of the contact is first obtained.

[0055] The contact resistance values ​​of the contacts are collected by setting up different laboratory environments. First, clean the contact surface to ensure that there is no oil, oxide layer or other contaminants, and ensure that the test equipment has been calibrated and is in good working condition. Then, install the contacts on the test fixture, use a micro-ohmmeter precision resistance measuring instrument to measure the contact resistance value of the contacts, and record the contact resistance value of each contact.

[0056] Since the application scenario of titanium alloy buckles is to monitor brain waves, the current generated by brain waves is very small. When the resistance of the contacts is too large, it will cause problems in the transmission of information. In addition, the user is not in a static state during brain wave monitoring, so the contact situation of the contacts is also relatively complicated. Therefore, when testing the contact resistance of titanium alloy buckles, the resistance cannot be judged only by the switch current. The contact situation of the contacts must also be considered, and the electromagnetic interference resistance of the contacts must also be considered.

[0057] According to the above logical analysis, contacts have different testing requirements in different application scenarios. When transmitting brain wave signals, the current signal of the brain wave is relatively weak. When obtaining the contact resistance data of the contact, the resistance information can be detected by setting currents of different sizes through the ohmmeter; at the same time, considering that the device needs to be carried to the head during brain wave monitoring, and the monitoring device will move with the user, when analyzing the data transmission of the contact, it is necessary to consider the impact of different external forces on the contact resistance; in addition, its usage scenario is not a laboratory scenario, so there may be certain electromagnetic interference, and the corresponding electromagnetic interference resistance of the obtained contacts needs to be considered. According to the analysis of the usage scenario, different environments are set for testing the obtained contacts. For example, when imitating the physical movement of the head-mounted device, the physical movement can be simulated by changing the contact pressure of the contacts.

[0058] In order to judge the anti-electromagnetic interference capability of the contact, the embodiment of the present invention first places all the contacts in an environment without electromagnetic interference and an environment with electromagnetic interference in turn under the condition of controlling variables, repeatedly measures the contact resistance value of the contact, obtains two sets of contact resistance value data without electromagnetic interference and with electromagnetic interference, calculates the difference rate of the two sets of data, and judges the anti-electromagnetic interference capability of the contact by setting a difference rate threshold. Specifically, the difference rate is the ratio of the absolute value of the difference between the contact resistance value without electromagnetic interference and the contact resistance value with electromagnetic interference to the contact resistance value without electromagnetic interference; the difference rate threshold can be set to 0.1. When the difference rate is less than 0.1, the anti-electromagnetic interference capability of the contact is judged to be qualified, the contact is retained, and subsequent experiments are continued; when the difference rate is greater than or equal to 0.1, the anti-electromagnetic interference capability of the contact is judged to be unqualified. Subsequent experiments and analyses are all based on contacts with qualified anti-electromagnetic interference capabilities.

[0059] After obtaining the contacts with qualified anti-electromagnetic interference capability through the above experiments and analysis, the embodiment of the present invention sets different test conditions in the laboratory scene and measures the contact resistance value at different contact positions of the contacts, wherein the test conditions include contact pressure and contact current. Specifically, the contact resistance value collection experiment is carried out by controlling variables, and the controlled variables include contact pressure, contact current, and contact position. It should be noted that the experiment does not need to be carried out in a specific environment, but only in real outside air.

[0060] The same contact pressure and the same contact current are set for the experiment. By changing the contact position on the contact point, multiple tests are performed on each contact position of the contact point to obtain a contact resistance value sequence of multiple tests. In this embodiment, the number of repeated measurements is set to 10 times.

[0061] The contact pressure and contact current are changed, and the contact resistance value test of different contact positions is repeated. During the test, the contact pressure and contact current are all changed from small to large. At the same time, only one parameter is changed at a time, that is, the control variable method is adopted. In this embodiment, the contact pressure change sequence is (0.01N, 0.03N, 0.05N, 0.07N, 0.09N, 0.11N), and the contact current change sequence is (2mA, 4mA, 6mA, 8mA, 10mA, 12mA).

[0062] Through the above experimental settings, a set of contact resistance values ​​is obtained for each contact position. So far, the collection of contact resistance values ​​of contacts at different contact positions and under different test conditions has been completed.

[0063] S200: Based on the contact resistance values ​​at different contact positions, analyze the change between the contact resistance value at each contact position and the contact resistance value at its neighboring position, obtain the resistance stability of each contact position, and then determine the resistance stable position.

[0064] Under normal circumstances, the contact resistance values ​​at different contact positions are relatively stable, but because the contact product may be interfered by mass or electromagnetic information, the contact resistance value of the contact product may be unstable, affecting the subsequent brain wave transmission. Therefore, based on the contact resistance values ​​at different contact positions, this embodiment analyzes the change between the contact resistance value of each contact position and the contact resistance value of its neighboring position, obtains the resistance stability of each contact position, and then determines the resistance stable position.

[0065] See also Figure 2 , which shows the basic process of a method for obtaining a stable position of a resistor provided by an embodiment of the present invention.

[0066] like Figure 2 As shown, based on the contact resistance values ​​at different contact positions, the change between the contact resistance value at each contact position and the contact resistance value at its neighboring position is analyzed to obtain the resistance stability of each contact position, and then the resistance stable position is determined, including:

[0067] S201: Calculate the resistance mean and resistance variance of the contact resistance values ​​measured multiple times under the same test conditions at each contact position.

[0068] First, the resistance mean and resistance variance of the contact resistance values ​​measured multiple times under the same test conditions at each contact position are calculated.

[0069] The resistance variance of each contact position can reflect the stability of the contact resistance value measurement result of the contact position to a certain extent. The larger the variance, the more unstable the measurement result of the corresponding contact position. However, there are many reasons for the instability of the contact resistance value. For example, the surface quality of the product at the current contact position is poor, resulting in an unstable contact resistance value, or the current measurement is subject to electromagnetic interference, resulting in fluctuations in the contact resistance value. Therefore, the product quality information cannot be directly determined by the resistance variance obtained above.

[0070] S202: Draw a thermal diagram of all contact positions and the resistance averages corresponding to different contact positions under the same test conditions.

[0071] Draw a heat map of all contact positions and the average resistance values ​​corresponding to different contact positions under the same test conditions. The position of the pixel in the heat map is the spatial position of the contact position on the contact point, and the gray value of the pixel is the average resistance value corresponding to the contact position.

[0072] S203: Determine eight-neighborhood positions of each contact position based on the heat map.

[0073] Determine the eight-neighborhood locations of each contact location in the heat map.

[0074] S204: Analyze the difference between the resistance mean of each contact position and the resistance mean of its eight neighboring positions, and analyze the superposition between the resistance variance of each contact position and the resistance variance of its eight neighboring positions, to obtain the resistance stability of each contact position.

[0075] In a heat map corresponding to a test condition, the change between the mean resistance of each contact position and the mean resistance of its eight neighboring positions is analyzed, and the superposition between the resistance variance of each contact position and the resistance variance of its eight neighboring positions is analyzed to obtain the resistance stability of each contact position. The calculation formula for constructing resistance stability is:

[0076]

[0077] In the formula, Indicates Resistance stability at each contact position; Indicates The number of data points in the eight-neighborhood location of a contact location; Indicates The resistance variance of each contact position; Indicates The resistance variance of eight neighboring locations; Indicates The average resistance of each contact position; Indicates The average resistance of eight neighboring locations; Indicated by natural constant An exponential function with base .

[0078] Indicates The resistance variance of the first contact position is The sum of the resistance variances of the eight neighboring positions indicates the superposition of the resistance variance of the contact position and the resistance variance of its eight neighboring positions. The resistance variance of the contact position can reflect the stability of the measurement result of the contact resistance value of the contact position to a certain extent. However, there are many reasons that lead to the instability of the contact resistance value. Therefore, by analyzing the The superposition of the resistance variance of the contact position and the resistance variance of its eight neighboring positions, that is, by analyzing the The stability of the contact resistance value measurement results in the area where the first contact position is located can further reflect the The stability of the contact resistance measurement results at each contact position, The larger the value, the The contact resistance values ​​of the first contact position and its eight neighboring positions are more unstable, indicating that The more unstable the contact resistance value measurement result is, the more unstable the contact resistance value is. Indicates The average resistance of the contact position is The difference between the mean resistance values ​​of the eight neighboring positions indicates the difference between the resistance variance of the contact position and the resistance variance of its eight neighboring positions. The larger the value, the The greater the difference between the mean resistance of the first contact position and its eight neighboring positions, the The more unstable the contact resistance value measurement result is, the more unstable the contact resistance value is. right Weighted, and through The function is normalized to obtain the resistance stability The larger the value, the more uniform the contact resistance value obtained and the more effective the value.

[0079] It should be noted that the resistance stability of each contact position is obtained under the same test conditions, so different resistance stabilities correspond to different contact currents and different contact pressure conditions. In this embodiment, all contact currents and all contact pressures are traversed to obtain the corresponding resistance stability. In order to improve the accuracy of the resistance stability results, this embodiment can also calculate the mean of the corresponding resistance stability under different contact current conditions at each contact position, so the resistance stability of each contact position in the subsequent steps can be calculated and analyzed using the resistance stability mean calculated under different contact current conditions.

[0080] S205: According to the resistance stability of the contact position, a resistance stability threshold is set to obtain a resistance stable position.

[0081] Resistance stability according to contact position , set the resistance stability threshold to 0.8, then When it is greater than 0.8, the corresponding contact position is a resistance stable position, otherwise it is not a resistance stable position.

[0082] S300: Based on the resistance stability of each resistance stable position, analyzing the consistency of the resistance stability changes under different test conditions at each resistance stable position, and obtaining the anti-interference capability of the contact resistance value at each resistance stable position.

[0083] Step S200 is just to preliminarily screen the contact positions with stable resistance by analyzing the resistance stability of the area where each contact position is located. In the actual use scenario of titanium alloy buckles, the contact pressure between the buckles is not in a stable state due to the movement of the person being measured during the measurement process, so the resistance stability of the resistance stable position under different contact pressures can be analyzed to obtain the anti-interference ability of the contact resistance value.

[0084] This embodiment is based on the resistance stability of each resistance stable position, analyzes the change consistency of the resistance stability under different test conditions of each resistance stable position, and obtains the anti-interference ability of the contact resistance value of each resistance stable position. Further, based on the resistance stability of each resistance stable position, analyzes the change consistency of the resistance stability corresponding to different contact pressures of each resistance stable position, and obtains the anti-interference ability of the contact resistance value of each resistance stable position. The calculation formula of the anti-interference ability of the contact resistance value is:

[0085]

[0086] In the formula, Indicates The anti-interference ability of the contact resistance value at a stable resistance position; Indicates the number of different contact pressures; Indicates The resistor stabilizes the position Resistance stability of each contact pressure; Indicates The average value of resistance stability is obtained under all contact pressure conditions at each resistance stable position; Expressed as a natural constant An exponential function with base .

[0087] Indicates The resistor stabilizes the position The resistance stability of the first contact pressure is related to the The absolute value of the difference between the mean values ​​of the resistance stability obtained under all contact pressure conditions at the resistance stability position indicates the The resistor stabilizes the position The change of resistance stability corresponding to each contact pressure is consistent. All contact pressures are traversed and the sum is obtained. , The smaller the value, the The change of resistance stability under different contact pressure conditions at the resistance stable position is small, which indicates that The changes in resistance stability under different contact pressure conditions at the resistance stable position are consistent, indicating that The greater the contact resistance value at a stable resistance position, the greater the ability to resist contact pressure interference.

[0088] S400: Based on the contact resistance values ​​under different test conditions, analyzing the change trend of the contact resistance value at each resistance stable position, and obtaining the validity of the contact resistance value at each resistance stable position.

[0089] Based on the contact resistance values ​​under different test conditions, the changing trend of the contact resistance value at each stable resistor position is analyzed to obtain the validity of the contact resistance value at each stable resistor position, further including: constructing a two-dimensional coordinate space with different contact pressures and corresponding contact resistances at each stable resistor position, wherein the horizontal coordinate of the two-dimensional coordinate space is the contact pressure and the vertical coordinate is the contact resistance value, and the contact resistance value here is the corresponding resistance mean value; performing regression fitting on the data points (contact pressure\contact resistance value data points) in the two-dimensional coordinate space to obtain a regression line; based on the regression line, analyzing the changing trend of the contact resistance value at each stable resistor position to obtain the validity of the contact resistance value at each stable resistor position. Furthermore, based on the regression line, analyzing the changing trend of the contact resistance value at each stable resistor position to obtain the validity of the contact resistance value at each stable resistor position includes: based on the regression line, obtaining the slope and loss function of the regression line; according to the slope and loss function, analyzing the changing trend of the contact resistance value at each stable resistor position to obtain the validity of the contact resistance value at each stable resistor position.

[0090] The calculation formula for the effectiveness of constructing the contact resistance value is:

[0091]

[0092] In the formula, Indicates Validity of the contact resistance value at each resistance stabilization position; Indicates The slope of the regression line corresponding to the stable position of the resistor; Indicates The loss function of the regression line corresponding to the stable position of the resistor; Expressed as a natural constant An exponential function with base .

[0093] Represented by the loss function The absolute value of the slope of the regression line is weighted to represent the changing trend of the contact resistance value at the resistance stable position with the change of contact pressure. The larger the value, the greater the changing trend of the contact resistance value with the change of contact pressure. Therefore, the smaller the effectiveness of the contact resistance value at the corresponding resistance stable position, the worse the quality of the buckle.

[0094] S500: According to the anti-interference capability and effectiveness of the contact resistance value at each resistor stable position, the contact resistance value at each resistor stable position is corrected to obtain a corrected contact resistance value of the contact point.

[0095] Step S300 and step S400 respectively obtain the anti-interference ability and effectiveness of the contact resistance value of each resistance stable position. Further, the contact resistance value is corrected by the anti-interference ability and effectiveness of the contact resistance value, and all resistance stable positions are traversed, and the correction results are summed to obtain the corrected contact resistance value of the contact. The calculation formula for the corrected contact resistance value is:

[0096]

[0097] In the formula, Indicates the corrected contact resistance value of the contact; Indicates the number of stable resistance positions on the contact; No. Validity of the contact resistance value at each resistance stabilization position; Indicates The anti-interference ability of the contact resistance value at a stable resistance position; Indicates The average resistance of the resistors at stable positions.

[0098] Validity of contact resistance values ​​at resistance stabilization positions The larger the value, the greater the contribution of the contact resistance value at the resistance stable position to the contact resistance value of the entire contact, and the greater the corresponding weight; the anti-interference ability of the contact resistance value at the resistance stable position The larger the value, the greater the contribution of the contact resistance value at the resistance stable position to the contact resistance value of the entire contact, and the larger the corresponding weight; finally, the contact resistance value at the corresponding resistance stable position is weighted by the effectiveness and anti-interference ability of the contact resistance values ​​at all resistance stable positions to obtain the corrected contact resistance value of the contact.

[0099] S600: Determine the quality of the contacts and analyze the qualification of the titanium alloy buckles based on the corrected contact resistance value.

[0100] As for the quality of the titanium alloy buckle, the more stable and smaller the contact resistance value obtained by the contact, the better the quality of data transmission of the corresponding titanium alloy buckle. Therefore, this embodiment judges the quality of the contact and analyzes the qualification of the titanium alloy buckle according to the corrected contact resistance value. Further, it includes: linearly normalizing the corrected contact resistance value to obtain a normalized corrected contact resistance value, and using the normalized corrected contact resistance value as a quality measurement value of the contact; setting a corrected contact resistance value threshold, which can be set to 0.4; comparing the normalized corrected contact resistance value with the corrected contact resistance value threshold; if the normalized corrected contact resistance value is less than the corrected contact resistance value threshold, that is, , then the titanium alloy buckle is judged to be a qualified product and can be applied to brain wave transmission; if the normalized corrected contact resistance value is not less than the corrected contact resistance value threshold, that is , then the titanium alloy buckle is judged as an unqualified product and cannot be used in brain wave transmission.

[0101] Based on the same inventive concept as the above method, the present embodiment also provides a contact testing device for titanium alloy buckle contacts, the device including a memory and a processor, wherein: the memory is used to store program codes; the processor is used to read the program codes stored in the memory, and execute to obtain the contact resistance values ​​of the contacts at different contact positions and under different test conditions; based on the contact resistance values ​​at different contact positions, the change between the contact resistance value of each contact position and the contact resistance value of its neighboring position is analyzed to obtain the resistance stability of each contact position, and then the resistance stable position is determined; based on the resistance stability of each resistance stable position under different test conditions, the change consistency of the resistance stability of each resistance stable position under different test conditions is analyzed to obtain the anti-interference ability of the contact resistance value of each resistance stable position; based on the contact resistance values ​​under different test conditions, the change trend of the contact resistance value of each resistance stable position is analyzed to obtain the effectiveness of the contact resistance value of each resistance stable position; according to the anti-interference ability and effectiveness of the contact resistance value of each resistance stable position, the contact resistance value of each resistance stable position is corrected to obtain the corrected contact resistance value of the contact.

[0102] Based on the same inventive concept as the above method, this embodiment also provides a contact test system for titanium alloy buckle contacts, the system includes a contact resistance value acquisition module, a resistance stable position acquisition module, a contact resistance value anti-interference ability analysis module, a contact resistance value effectiveness analysis module and a corrected contact resistance value acquisition module. Among them:

[0103] A contact resistance value acquisition module is used to obtain the contact resistance values ​​of contacts at different contact positions and under different test conditions;

[0104] The resistance stable position acquisition module is used to analyze the change between the contact resistance value of each contact position and the contact resistance value of its neighboring position based on the contact resistance values ​​of different contact positions, obtain the resistance stability of each contact position, and then determine the resistance stable position;

[0105] The anti-interference capability analysis module of the contact resistance value is used to analyze the change consistency of the resistance stability under different test conditions of each resistance stable position based on the resistance stability under different test conditions of each resistance stable position, and obtain the anti-interference capability of the contact resistance value of each resistance stable position;

[0106] The validity analysis module of the contact resistance value is used to analyze the change trend of the contact resistance value at each resistance stable position based on the contact resistance value under different test conditions, and obtain the validity of the contact resistance value at each resistance stable position;

[0107] The corrected contact resistance value acquisition module is used to correct the contact resistance value of each resistor stable position according to the anti-interference ability and effectiveness of the contact resistance value of each resistor stable position to obtain the corrected contact resistance value of the contact point.

[0108] It should be noted that the sequence of the above embodiments of the present invention is only for description and does not represent the advantages and disadvantages of the embodiments. The processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0109] The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referenced to each other, and each embodiment focuses on the differences from other embodiments.

Claims

1. A contact testing method for titanium alloy buckle contacts, characterized in that: The method comprises: Obtain the contact resistance values ​​of contacts at different contact positions and under different test conditions; Based on the contact resistance values ​​at different contact positions, analyzing the change between the contact resistance value at each contact position and the contact resistance value at its neighboring position, obtaining the resistance stability of each contact position, and then determining the resistance stable position; Based on the resistance stability of each resistance stable position under different test conditions, the change consistency of the resistance stability of each resistance stable position under different test conditions is analyzed to obtain the anti-interference ability of the contact resistance value of each resistance stable position; Based on the contact resistance values ​​under different test conditions, analyzing the change trend of the contact resistance value at each resistance stable position, and obtaining the validity of the contact resistance value at each resistance stable position; According to the anti-interference capability and the effectiveness of the contact resistance value at each resistance stable position, the contact resistance value at each resistance stable position is corrected to obtain a corrected contact resistance value of the contact point.

2. The contact testing method of titanium alloy buckle contacts according to claim 1, characterized in that: The test conditions include contact pressure and contact current.

3. The contact testing method of titanium alloy buckle contacts according to claim 2, characterized in that: Based on the contact resistance values ​​at different contact positions, analyzing the change between the contact resistance value at each contact position and the contact resistance value at its neighboring position, obtaining the resistance stability of each contact position, and then determining the resistance stable position, including: Calculate the resistance mean and resistance variance of the contact resistance values ​​measured multiple times under the same test conditions at each contact position; Draw a thermal diagram of all the contact positions and the resistance averages corresponding to different contact positions under the same test condition; Determining eight neighborhood positions of each of the contact positions based on the heat map; Analyze the difference between the resistance mean of each contact position and the resistance mean of its eight neighboring positions, and analyze the superposition between the resistance variance of each contact position and the resistance variance of its eight neighboring positions, to obtain the resistance stability of each contact position; According to the resistance stability of the contact position, a resistance stability threshold is set to obtain a resistance stable position.

4. The contact testing method of titanium alloy buckle contacts according to claim 3, characterized in that: Based on the resistance stability of each resistance stable position under different test conditions, the change consistency of the resistance stability of each resistance stable position under different test conditions is analyzed to obtain the anti-interference ability of the contact resistance value of each resistance stable position, including: Based on the resistance stability of each resistance stable position and different contact pressures, the change consistency of the resistance stability corresponding to different contact pressures at each resistance stable position is analyzed to obtain the anti-interference ability of the contact resistance value at each resistance stable position.

5. The contact testing method of titanium alloy buckle contacts according to claim 2, characterized in that: Based on the contact resistance values ​​under different test conditions, the change trend of the contact resistance value at each resistance stable position is analyzed to obtain the validity of the contact resistance value at each resistance stable position, including: Construct a two-dimensional coordinate space using the different contact pressures at each resistor stable position and the corresponding contact resistance, wherein the abscissa of the two-dimensional coordinate space is the contact pressure and the ordinate is the contact resistance value; Performing regression fitting on the data points in the two-dimensional coordinate space to obtain a regression line; Based on the regression line, the variation trend of the contact resistance value at each resistance stable position is analyzed to obtain the validity of the contact resistance value at each resistance stable position.

6. The contact testing method of titanium alloy buckle contacts according to claim 5, characterized in that: Based on the regression line, the change trend of the contact resistance value at each resistance stable position is analyzed to obtain the validity of the contact resistance value at each resistance stable position, including: Based on the regression line, obtaining the slope and loss function of the regression line; According to the slope and the loss function, the variation trend of the contact resistance value at each resistance stable position is analyzed to obtain the validity of the contact resistance value at each resistance stable position.

7. The contact testing method of titanium alloy buckle contacts according to claim 1, characterized in that: The method further comprises: According to the corrected contact resistance value, the quality of the contact point is judged and the qualification of the titanium alloy buckle is analyzed.

8. The contact testing method of titanium alloy buckle contacts according to claim 7, characterized in that: According to the corrected contact resistance value, the quality of the contact is judged and the qualification of the titanium alloy buckle is analyzed, including: Performing linear normalization processing on the corrected contact resistance value to obtain a normalized corrected contact resistance value, and using the normalized corrected contact resistance value as a quality measurement value of the contact; Set the threshold value of the corrected contact resistance value; Comparing the normalized corrected contact resistance value with the corrected contact resistance value threshold; If the normalized corrected contact resistance value is less than the corrected contact resistance value threshold, the titanium alloy buckle is judged to be a qualified product.

9. A contact testing device for titanium alloy buckle contacts, characterized in that: The device comprises a memory and a processor, wherein: The memory is used to store program codes; The processor is configured to read the program code stored in the memory and execute the method according to any one of claims 1 to 8.

10. A contact testing system for titanium alloy buckle contacts, characterized in that: The system comprises: A contact resistance value acquisition module is used to obtain the contact resistance values ​​of contacts at different contact positions and under different test conditions; A resistance stable position acquisition module is used to analyze the change between the contact resistance value of each contact position and the contact resistance value of its neighboring position based on the contact resistance values ​​of different contact positions, obtain the resistance stability of each contact position, and then determine the resistance stable position; The anti-interference capability analysis module of the contact resistance value is used to analyze the change consistency of the resistance stability under different test conditions of each resistance stable position based on the resistance stability under different test conditions of each resistance stable position, and obtain the anti-interference capability of the contact resistance value of each resistance stable position; A contact resistance value validity analysis module, used to analyze the change trend of the contact resistance value at each resistance stable position based on the contact resistance value under different test conditions, and obtain the validity of the contact resistance value at each resistance stable position; The corrected contact resistance value acquisition module is used to correct the contact resistance value of each resistance stable position according to the anti-interference ability and the effectiveness of the contact resistance value of each resistance stable position to obtain the corrected contact resistance value of the contact point.

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