Capacitance correction method and device of key, vehicle and storage medium
By identifying and correcting the capacitance reference value of the abnormal key in the touch capacitor key, the key response problem caused by reference assignment error is solved, and the normal response of the key is achieved.
Patent Information
- Application Number
- CN202411457820.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-18
- Publication Date
- 2025-02-07
AI Technical Summary
In special scenarios where the capacitor button is touched, errors may occur in reference assignment, resulting in the button being unable to respond normally.
By obtaining the capacitance reference value and initial values of multiple keys, determining the capacitance reference relationship and fluctuation relationship, identifying the abnormal key, and correcting the capacitance reference value of the abnormal key, it conforms to the capacitance reference relationship.
It effectively avoids misjudgment of key capacitors and ensures that the keys can respond normally.
Smart Images
Figure CN119401996A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of touch button technology, and in particular to a method, device, vehicle and storage medium for calibrating the capacitance of a button. Background Art
[0002] At present, the capacitance reference calibration scheme of touch capacitive buttons (button capacitive buttons) on the market is mainly based on a gradual calibration scheme such as ambient temperature. However, in some special scenarios (such as button capacitive buttons being powered on and awakened in the touch state), when the reference value of the touch capacitive buttons is assigned, the initialization value of the touch buttons may be affected by the operation, resulting in errors, and ultimately the initial pressing state cannot be recognized, resulting in misjudgment, causing the touch capacitive buttons to fail to respond normally. Summary of the invention
[0003] In view of the above problems, the present application provides a method, device, vehicle and storage medium for calibrating the capacitance of a key, which can almost avoid the problem of misjudgment of the key capacitance and the failure of the key to respond normally.
[0004] According to one aspect of an embodiment of the present application, a method for correcting the capacitance of a key is provided, the method comprising: obtaining a capacitance reference value corresponding to each of a plurality of keys and a capacitance initial value corresponding to the capacitance reference value; the capacitance reference value is a capacitance value of the key after being touched, and the capacitance initial value is a capacitance value of the key when not touched; determining a capacitance reference relationship based on a ratio of a plurality of the capacitance initial values; determining a capacitance fluctuation relationship based on a ratio of a plurality of the capacitance reference values; if the capacitance fluctuation relationship corresponding to the plurality of keys does not satisfy the capacitance reference relationship, then classifying some of the plurality of keys as abnormal keys and another portion of the keys as normal keys based on the capacitance reference relationship; and correcting the capacitance reference value of the abnormal key until the capacitance fluctuation relationship satisfies the capacitance reference relationship.
[0005] In an optional manner, the method for correcting the capacitance reference value of the abnormal key until the capacitance fluctuation relationship satisfies the capacitance reference relationship includes: if there are multiple normal keys, obtaining the capacitance reference values corresponding to each of the multiple normal keys; determining a target capacitance reference value from the capacitance reference values corresponding to the multiple normal keys, and correcting the capacitance reference value of the abnormal key based on the target capacitance reference value until the capacitance fluctuation relationship satisfies the capacitance reference relationship.
[0006] In an optional manner, the method for determining the target capacitance reference value from the capacitance reference values corresponding to the multiple normal keys includes: determining the capacitance reference values corresponding to the multiple normal keys as the target capacitance reference value in sequence until the capacitance fluctuation relationship satisfies the capacitance reference relationship.
[0007] In an optional manner, the method for determining a target capacitance reference value from capacitance reference values corresponding to a plurality of normal keys includes: determining an average value corresponding to each capacitance reference value from capacitance reference values corresponding to a plurality of normal keys; and determining a target capacitance reference value based on the average value corresponding to each capacitance reference value.
[0008] In an optional manner, the method for correcting the capacitance reference value of the abnormal key until the capacitance fluctuation relationship satisfies the capacitance reference relationship includes: determining multiple capacitance fluctuation ranges based on multiple capacitance initial values; calculating the capacitance initial median values corresponding to each of the multiple capacitance fluctuation ranges; and correcting the capacitance reference value of the abnormal key based on the ratio of each capacitance initial median value until the capacitance fluctuation relationship satisfies the capacitance reference relationship.
[0009] In an optional manner, the method for determining a capacitance reference relationship based on a ratio of a plurality of capacitance initial values comprises: determining a plurality of fluctuation ranges based on a plurality of capacitance initial values; and determining the capacitance reference relationship based on a ratio relationship of a plurality of fluctuation ranges.
[0010] In an optional manner, if the capacitance fluctuation relationship does not satisfy the capacitance reference relationship, then based on the capacitance reference relationship, some of the multiple keys are classified as abnormal keys, and another part of the keys are classified as normal keys, the method comprises: determining the capacitance reference value corresponding to a part of the multiple keys as a first ratio sub-relationship, and determining the capacitance reference value corresponding to another part of the multiple keys as a second ratio sub-relationship; if either the first ratio sub-relationship and the second ratio sub-relationship satisfy the capacitance reference relationship, then obtaining the number of keys corresponding to the first ratio sub-relationship and obtaining the number of keys corresponding to the second ratio sub-relationship; determining the abnormal keys and normal keys among the multiple keys based on the size relationship between the number of keys corresponding to the first ratio sub-relationship and the number of keys corresponding to the second ratio sub-relationship.
[0011] According to another aspect of an embodiment of the present application, a capacitance correction device for a key is provided, the device comprising: an acquisition module, used to acquire capacitance reference values corresponding to each of a plurality of keys and capacitance initial values corresponding to the capacitance reference values; the capacitance reference value is the capacitance value of the key after being touched, and the capacitance initial value is the capacitance value of the key when not touched; a first determination module, used to determine a capacitance reference relationship based on a ratio of a plurality of the capacitance initial values; a second determination module, used to determine a capacitance fluctuation relationship based on a ratio of a plurality of the capacitance reference values; a division module, used to divide some of the plurality of keys into abnormal keys and another portion of the keys into normal keys based on the capacitance reference relationship if the capacitance fluctuation relationship corresponding to the plurality of keys does not satisfy the capacitance reference relationship; a correction module, used to correct the capacitance reference value of the abnormal key until the capacitance fluctuation relationship satisfies the capacitance reference relationship.
[0012] According to another aspect of the embodiment of the present application, a vehicle is provided, comprising: a controller; and a memory for storing one or more programs, wherein when the one or more programs are executed by the controller, the controller implements the above-mentioned key capacitance correction method.
[0013] According to another aspect of the embodiments of the present application, a computer-readable storage medium is provided, in which a computer program is stored. The computer program includes at least one executable instruction. When the executable instruction is run on a key capacitance correction device / vehicle, the key capacitance correction device / vehicle executes the key capacitance correction method as described above.
[0014] In the present application, since the capacitance correction method of a key performs a benchmark assignment on the key: first, when multiple keys are not touched, the corresponding initial capacitance values are collected, and a capacitance benchmark relationship is established through multiple initial capacitance values, which is then used as a reference relationship for benchmark assignment of touch capacitance keys. Then, when multiple keys are benchmarked, a capacitance fluctuation relationship is established through the capacitance reference values corresponding to each of the multiple keys collected. Finally, by comparing the capacitance fluctuation relationship with the capacitance benchmark relationship, it can be identified whether the capacitance fluctuation of some keys does not conform to the capacitance benchmark relationship when each key is benchmarked. If so, the keys that do not conform to the capacitance benchmark relationship are determined as abnormal keys, otherwise they are determined as normal keys, and then the capacitance reference value of the abnormal keys is corrected through the capacitance benchmark relationship, so that the capacitance reference value of the abnormal keys after correction is used as the capacitance benchmark value of the abnormal keys. Therefore, the capacitance correction method of the keys of the present application can almost avoid the problem of misjudgment of key capacitance, which causes the keys to fail to respond normally.
[0015] The above description is only an overview of the technical solution of the embodiment of the present application. In order to more clearly understand the technical means of the embodiment of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the embodiment of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] The accompanying drawings are only used to illustrate the embodiments and are not to be considered as limiting the present application. In addition, the same reference symbols are used to represent the same components throughout the accompanying drawings. In the accompanying drawings:
[0017] Figure 1 A schematic block diagram of the process of steps S210 - S250 of a method for calibrating capacitance of a key provided in an embodiment of the present application is shown.
[0018] Figure 2 A schematic block diagram of the process of steps S221 - S222 of a method for calibrating capacitance of a key provided in an embodiment of the present application is shown.
[0019] Figure 3 A schematic block diagram of the process of steps S241 - S243 of a method for correcting capacitance of a key provided in an embodiment of the present application is shown.
[0020] Figure 4 A schematic block diagram of the process of steps S251 - S253 of a key capacitance calibration method provided in an embodiment of the present application is shown.
[0021] Figure 5 A schematic block diagram of the process of steps S251 ′-S253 ′ of a key capacitance calibration method provided in an embodiment of the present application is shown.
[0022] Figure 6 A schematic structural diagram of a capacitance correction device for a key provided in an embodiment of the present application is shown.
[0023] Figure 7 A schematic structural diagram of an embodiment of a computing device of a vehicle provided by the present application is shown. DETAILED DESCRIPTION
[0024] Here, exemplary embodiments will be described in detail, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The implementations described in the following exemplary embodiments do not represent all implementations consistent with the present application. Instead, they are only examples of devices and methods consistent with some aspects of the present application as detailed in the attached claims.
[0025] The block diagrams shown in the accompanying drawings are merely functional entities and do not necessarily correspond to physically independent entities. That is, these functional entities may be implemented in software form, or in one or more hardware modules or integrated circuits, or in different networks and / or processor devices and / or microcontroller devices.
[0026] The flowcharts shown in the accompanying drawings are only exemplary and do not necessarily include all the contents and operations / steps, nor must they be executed in the order described. For example, some operations / steps can be decomposed, and some operations / steps can be combined or partially combined, so the actual execution order may change according to actual conditions.
[0027] The term "multiple" as used in this application refers to two or more than two. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone. The character " / " generally indicates that the related objects are in an "or" relationship.
[0028] First of all, it should be explained that touch capacitive buttons use the capacitance effect to measure the capacitance change of the pressed object to achieve response. It usually consists of two parts: a capacitor chip and a touch panel. One end of the touch panel is grounded, and the other end is connected to the capacitor chip. The capacitor chip detects the capacitance change through the contact between the touch panel and the pressed object, thereby achieving button response.
[0029] Furthermore, the touch capacitance key reference assignment refers to setting an initial capacitance value as a reference standard in the touch capacitance key system so that the system can accurately detect the occurrence of a touch event. This initial capacitance value is called the reference value, which is measured once after the system is powered on and used as a basis for comparison in subsequent detection processes.
[0030] Secondly, it should be noted that the capacitance reference calibration scheme for touch capacitive buttons on the market is mainly based on a gradual calibration scheme such as ambient temperature. However, in some special scenarios (such as during the touch chip wake-up initialization process), when the reference value of the touch capacitive button is assigned, it may be affected by the operation, so that the initialization assignment of the touch button may have errors, which ultimately leads to the inability to identify the initial pressing state, and then misjudgment, resulting in the touch capacitive button failing to respond normally.
[0031] Based on this, the embodiments of the present application respectively propose a key capacitance correction method, a key capacitance correction device 300, a vehicle, a computer readable storage medium and a computer program product to solve the above problems. These embodiments will be described in detail below.
[0032] See also Figure 1 , Figure 1 A schematic flow chart of steps S210-S250 of a method for correcting the capacitance of a key provided by an embodiment of the present application is shown. The method includes steps S210 to S250, which are described in detail as follows:
[0033] S210: Obtain capacitance reference values corresponding to each of the plurality of keys and initial capacitance values corresponding to the capacitance reference values; the capacitance reference value is the capacitance value of the key after being touched, and the initial capacitance value is the capacitance value of the key when not being touched.
[0034] It should be understood that when obtaining the capacitance reference values corresponding to each of the multiple keys and the capacitance initial values corresponding to the capacitance reference values, the keys are of the same type, that is, the capacitance chips and touch panels of the keys are the same.
[0035] In an exemplary embodiment of the present application, obtaining the capacitance reference values corresponding to each of the plurality of keys refers to: during the initialization process of waking up the capacitor chip, the capacitance values taken when performing reference assignment on each key.
[0036] For example, after the capacitor chip is awakened and initialized, the key is touched and pressed, and then the capacitance value of the key in the touch and press state is collected, and this capacitance value is the capacitance reference value.
[0037] It should be understood that the capacitance reference value is used as a reference standard for accurately detecting the occurrence of a touch event.
[0038] In an exemplary embodiment of the present application, obtaining the initial capacitance value corresponding to the capacitance reference value corresponding to each of the plurality of keys means: collecting the initial capacitance value of the key, that is, the ambient capacitance value of the key, in a static non-touch operation state.
[0039] It should be understood that the capacitance of the key when it is not touched is composed of the stray capacitance Cs between TPAD and PCB. When the finger is not touching, only these stray capacitances exist, and their values are relatively fixed. Specifically, in the touch key system, when it is not touched, there is only one capacitance, namely the stray capacitance Cs between TPAD and PCB. This capacitance value is relatively stable under certain conditions.
[0040] Optionally, 50 sets of buttons are selected as samples for functional testing, and a batch of samples with good functions and stable performance are screened out as the sample range. Then, under a certain environment and static non-touch operation conditions, the initial capacitance value of each button of each set of samples is collected.
[0041] S220: Determine a capacitance reference relationship based on a ratio of a plurality of capacitance initial values.
[0042] In an exemplary embodiment of the present application, see Figure 2 , Figure 2 The method for determining the capacitance reference relationship based on multiple capacitance initial values includes steps S221 to S222, which are described in detail as follows:
[0043] S221: Determine multiple fluctuation ranges based on multiple initial capacitance values.
[0044] In an exemplary embodiment of the present application, the method of determining multiple fluctuation ranges based on multiple initial capacitance values includes: firstly grouping multiple keys, and then determining the fluctuation range of the initial capacitance value of each group of keys.
[0045] For example, a plurality of keys are divided into nine groups, namely A1, A2, A3, A4, A5, A6, A7, A8 and A9. Each of the nine groups of keys includes a plurality of keys, and the fluctuation ranges of the initial capacitance values of the nine groups of keys are CA1-CA1', CA2-CA2', CA3-CA3', CA4-CA4', CA5-CA5', CA6-CA6', CA7-CA7', CA8-CA8' and CA9-CA9'. CA1 is the minimum initial capacitance value in the fluctuation range CA1-CA1', CA1' is the maximum initial capacitance value in the fluctuation range CA1-CA1', CA2-CA2', CA3-CA3', CA4-CA4', CA5-CA5', CA6-CA6', CA7-CA7', CA8-CA8' and CA9-CA9 and so on, which will not be elaborated here.
[0046] S222: Determine a capacitance reference relationship based on a ratio relationship of multiple fluctuation ranges.
[0047] In an exemplary embodiment of the present application, a capacitance reference relationship determined based on a ratio relationship of multiple fluctuation ranges can be expressed as: (CA1-CA1': CA2-CA2': CA3-CA3': CA4-CA4': CA5-CA5': CA6-CA6': CA7-CA7': CA8-CA8': CA9-CA9').
[0048] It should be understood that when the touch force applied to multiple keys is almost the same, there will be a certain proportional relationship between the capacitance of the keys when they are static and untouched and the capacitance of the keys after they are touched; at the same time, when the keys are of the same type and the keys are assigned normal reference values, the ratio relationship of the multiple capacitance reference values corresponding to the multiple keys will hardly change compared to the ratio relationship of the initial capacitance values of the multiple keys when they are static and untouched. Therefore, after determining the capacitance reference relationship through the ratio relationship of multiple fluctuation ranges, it is possible to identify the initial pressing state of each key by judging whether the capacitance reference relationship contains the ratio relationship of multiple capacitance reference values, so as to distinguish whether some of the multiple keys are touched and pressed during the initialization process of the capacitor chip wake-up, and finally determine the abnormal key.
[0049] S230: Determine a capacitance fluctuation relationship based on a ratio of a plurality of capacitance reference values.
[0050] For example, if the capacitance reference values of 9 buttons need to be determined to be consistent with the capacitance fluctuation relationship, then it is only necessary to establish a ratio relationship based on the capacitance reference values of the 9 buttons.
[0051] Optionally, the capacitance reference values of the 9 keys are CB1, CB2, CB3, CB4, CB5, CB6, CB7, CB8 and CB9 respectively, then the capacitance fluctuation relationship of the 9 keys is: (CB1: CB2: CB3: CB4: CB5: CB6: CB7: CB8: CB9).
[0052] It should be understood that there is no limit to the number of keys corresponding to the capacitance fluctuation relationship, but generally speaking, it should be less than or equal to the number of fluctuation ranges for establishing the capacitance reference relationship, so as to facilitate comparison between the two.
[0053] S240: If the capacitance fluctuation relationship corresponding to the plurality of keys does not satisfy the capacitance reference relationship, then based on the capacitance reference relationship, some of the plurality of keys are classified as abnormal keys, and another portion of the keys are classified as normal keys.
[0054] In an exemplary embodiment of the present application, the method for determining whether the capacitance fluctuation relationship corresponding to multiple keys satisfies the capacitance reference relationship includes: judging whether the capacitance reference relationship formula contains the capacitance fluctuation relationship formula, and if so, determining that the capacitance fluctuation relationship corresponding to multiple keys satisfies the capacitance reference relationship; otherwise, it does not satisfy the capacitance fluctuation relationship.
[0055] For example, if the capacitance reference values in (CB1: CB2: CB3: CB4: CB5: CB6: CB7: CB8: CB9) are all within the fluctuation ranges in (CA1-CA1': CA2-CA2': CA3-CA3': CA4-CA4': CA5-CA5': CA6-CA6': CA7-CA7': CA8-CA8': CA9-CA9'), it is determined that the capacitance fluctuation relationship corresponding to multiple keys satisfies the capacitance reference relationship; otherwise it does not satisfy the fluctuation relationship.
[0056] In other embodiments, the method for determining whether the capacitance fluctuation relationship corresponding to multiple keys satisfies the capacitance reference relationship also includes: determining a fluctuation reference range based on the capacitance reference relationship formula, then determining a fluctuation value based on the capacitance fluctuation relationship, and finally determining whether the fluctuation value is within the fluctuation reference range.
[0057] For example, the fluctuation threshold range A-A' is first obtained by calculating the ratio of the endpoint values of each fluctuation range in CA1-CA1', CA2-CA2', CA3-CA3', CA4-CA4', CA5-CA5', CA6-CA6', CA7-CA7', CA8-CA8' and CA9-CA9'. The specific calculation method is as follows: (CA1: CA2: CA3: CA4: CA5: CA6: CA7: CA8: CA9) = the minimum value A of the fluctuation threshold range; (CA1': CA2': CA3': CA4': CA5': CA6': CA7': CA8': CA9') = the maximum value A' of the fluctuation threshold range. Then calculate the ratio of CB1, CB2, CB3, CB4, CB5, CB6, CB7, CB8 and CB9, specifically, the calculation method is as follows: CB1: CB2: CB3: CB4: CB5: CB6: CB7: CB8: CB9 = capacitance reference threshold B. If B is located at A-A', it is determined that the capacitance fluctuation relationship corresponding to the multiple keys satisfies the capacitance reference relationship; otherwise, it does not satisfy it.
[0058] It should be understood that during the capacitor chip wake-up initialization process, that is, when the capacitor chip has not completed the wake-up initialization, if the capacitance reference value of the key is collected to assign a reference value to the key, then at this time, the collected capacitance reference value includes the pressing state before the capacitor chip wake-up initialization is completed, which will cause the capacitance reference value of the key to fluctuate greatly, and ultimately cause the overall capacitance fluctuation relationship of multiple keys to not meet the capacitance reference relationship.
[0059] For further information, see Figure 3 , Figure 3A schematic flow diagram of steps S241-S243 of a method for correcting capacitance of a key provided by an embodiment of the present application is shown. If the capacitance fluctuation relationship does not satisfy the capacitance reference relationship, a method for classifying some of the keys as abnormal keys and another part of the keys as normal keys based on the capacitance reference relationship includes steps S241 to S243, which are described in detail as follows:
[0060] S241: determining capacitance reference values corresponding to a part of the multiple keys as a first ratio sub-relationship, and determining capacitance reference values corresponding to another part of the multiple keys as a second ratio sub-relationship.
[0061] It should be understood that the more keys there are, the more capacitance reference values there are, and the more complex the capacitance fluctuation relationship established. Therefore, multiple keys can be grouped to reduce the complexity of the capacitance fluctuation relationship, and then abnormal keys can be checked one by one.
[0062] For example, if the plurality of keys is still 9 keys, and the capacitance reference values of the keys are CB1, CB2, CB3, CB4, CB5, CB6, CB7, CB8 and CB9 respectively, then the first ratio sub-relationship corresponding to a part of the plurality of keys may be: "CB1: CB2: CB3: CB4: CB5"; and the second ratio sub-relationship corresponding to another part of the keys may be: "CB6: CB7: CB8: CB9".
[0063] S242: If any one of the first ratio sub-relationship and the second ratio sub-relationship satisfies the capacitance reference relationship, then obtaining the number of keys corresponding to the first ratio sub-relationship and obtaining the number of keys corresponding to the second ratio sub-relationship.
[0064] For example, if the capacitance reference values of CB1, CB2, CB3, CB4, and CB5 are all within the five fluctuation ranges of CA1-CA1', CA2-CA2', CA3-CA3', CA4-CA4', CA5-CA5', CA6-CA6', CA7-CA7': CA8-CA8', and CA9-CA9', then it is determined that the first ratio sub-relationship satisfies the capacitance reference relationship; accordingly, if the capacitance reference values of CB6, CB7, CB8, and CB9 are all within the four fluctuation ranges of CA1-CA1', CA2-CA2', CA3-CA3', CA4-CA4', CA5-CA5', CA6-CA6', CA7-CA7': CA8-CA8', and CA9-CA9', then it is determined that the second ratio sub-relationship also satisfies the capacitance reference relationship. At this time, it is necessary to obtain the number of keys corresponding to the first ratio sub-relationship and the number of keys corresponding to the second ratio sub-relationship for comparison.
[0065] S243: Determine abnormal keys and normal keys among the multiple keys based on the magnitude relationship between the number of keys corresponding to the first ratio sub-relationship and the number of keys corresponding to the second ratio sub-relationship.
[0066] For example, from the above, it can be seen that the corresponding number of keys in the first ratio sub-relationship is 5, and the corresponding number of keys in the second ratio sub-relationship is 4. Therefore, it can be determined that the corresponding keys in the first ratio sub-relationship are normal keys, and the corresponding keys in the second ratio sub-relationship are abnormal keys, so as to define normal keys and abnormal keys in accordance with the principle of minority obeys majority.
[0067] In addition, if any one of the first ratio sub-relationship and the second ratio sub-relationship does not satisfy the capacitance reference relationship, the key corresponding to the first ratio sub-relationship or the second ratio sub-relationship that does not satisfy the capacitance reference relationship is determined as an abnormal key, otherwise it is determined as a normal key.
[0068] S250: Correcting the capacitance reference value of the abnormal key until the capacitance fluctuation relationship satisfies the capacitance reference relationship.
[0069] In an exemplary embodiment of the present application, see Figure 4 , Figure 4 A schematic flow diagram of steps S251-S253 of a method for correcting the capacitance of a key provided by an embodiment of the present application is shown. The method for correcting the capacitance reference value of an abnormal key to a capacitance fluctuation relationship that satisfies the capacitance reference relationship includes: correcting the capacitance reference value of the abnormal key by the capacitance reference value of a normal key. Specifically, steps S251 to S253 are described in detail as follows:
[0070] S251: If there are multiple normal buttons, obtain capacitance reference values corresponding to each of the multiple normal buttons.
[0071] S252: Determine a target capacitance reference value from capacitance reference values corresponding to a plurality of normal keys.
[0072] S253: Correcting the capacitance reference value of the abnormal key based on the target capacitance reference value until the capacitance fluctuation relationship satisfies the capacitance reference relationship.
[0073] It should be understood that, since some of the multiple keys have been determined to be normal keys, the capacitance reference value of the abnormal key can be directly corrected according to the capacitance reference value of the normal key, which can improve the correction efficiency.
[0074] For example, the method for determining the target capacitance reference value from the capacitance reference values corresponding to multiple normal buttons includes: sequentially determining the capacitance reference values corresponding to the multiple normal buttons as the target capacitance reference value until the capacitance fluctuation relationship satisfies the capacitance reference relationship.
[0075] Optionally, the target capacitance reference value is determined in sequence based on the frequencies of occurrence of the capacitance reference values corresponding to the multiple normal keys. Specifically, the capacitance reference value with the highest occurrence frequency is first determined as the target capacitance reference value, and if the capacitance fluctuation relationship still does not satisfy the capacitance reference relationship after the capacitance reference value of the abnormal key is corrected based on the target capacitance reference value, then the capacitance reference value with a lower occurrence frequency is selected as the target capacitance reference value, and so on, until the capacitance fluctuation relationship satisfies the capacitance reference relationship.
[0076] It should be understood that in some special cases, after the capacitance reference value of the abnormal key is corrected by the capacitance reference value of the normal key, the capacitance fluctuation relationship may still not satisfy the capacitance reference relationship. Therefore, the capacitance reference value of the abnormal key may be corrected in sequence by the capacitance reference values of multiple normal keys, thereby ensuring that the capacitance fluctuation relationship after correction can satisfy the capacitance reference relationship.
[0077] For example, a method for determining a target capacitance reference value from capacitance reference values corresponding to multiple normal buttons includes: determining an average value corresponding to each capacitance reference value from capacitance reference values corresponding to multiple normal buttons; determining a target capacitance reference value based on the average value corresponding to each capacitance reference value, thereby increasing the probability that the capacitance fluctuation relationship can satisfy the capacitance reference relationship by only correcting the capacitance reference value of the abnormal button once.
[0078] In an exemplary embodiment of the present application, see Figure 5 , Figure 5 A schematic flow chart of steps S251'-S253' of a method for correcting the capacitance of a key provided by an embodiment of the present application is shown. Affected by changes in ambient temperature, etc., the method for correcting the capacitance reference value of an abnormal key to a capacitance fluctuation relationship that satisfies the capacitance reference relationship also includes: directly correcting the capacitance reference value of the abnormal key through the capacitance reference relationship. Specifically, steps S251' to S253' are described in detail as follows:
[0079] S251 ′: Determine multiple capacitance fluctuation ranges based on multiple capacitance initial values.
[0080] For example, the capacitance fluctuation range may be: CA1-CA1', CA2-CA2', CA3-CA3', CA4-CA4', CA5-CA5', CA6-CA6', CA7-CA7', CA8-CA8' and CA9-CA9'
[0081] S252': Calculate the initial median values of capacitance corresponding to each of the plurality of capacitance fluctuation ranges.
[0082] For example, the calculation method of the initial median capacitance C1 of the capacitance fluctuation range CA1-CA1' is: (CA1+CA1') / 2; the calculation method of the initial median capacitance C2 of the capacitance fluctuation range CA2-CA2' is: (CA2+CA2') / 2, and so on, the multiple initial median capacitances corresponding to each capacitance fluctuation range are C1, C2, C3, C4, C5, C6, C7, C8 and C9.
[0083] S253': Correcting the capacitance reference value of the abnormal key based on the ratio of the initial median values of each capacitance until the capacitance fluctuation relationship satisfies the capacitance reference relationship.
[0084] In an exemplary embodiment of the present application, the method of correcting the capacitance reference value of an abnormal key based on the ratio of the initial median values of each capacitance until the capacitance fluctuation relationship satisfies the capacitance reference relationship includes: first determining the median value of the initial capacitance ratio of multiple initial capacitance median values, and then determining the capacitance fluctuation ratio based on the capacitance fluctuation relationship; adjusting the capacitance reference value of the abnormal key based on the size relationship between the capacitance fluctuation ratio and the median value of the initial capacitance ratio, until the capacitance fluctuation ratio is equal to the median value of the initial capacitance ratio, or until the capacitance fluctuation ratio is within a preset fluctuation range of the median value of the initial capacitance ratio, then determining that the capacitance fluctuation relationship satisfies the capacitance reference relationship.
[0085] For example, the initial capacitance ratio C 中 =C1:C2:C3:C4:C5:C6:C7:C8:C9. Capacitance fluctuation ratio B 中 =CB1:CB2:CB3:CB4:CB5:CB6:CB7:CB8:CB9. Among them, CB6, CB7, CB8 and CB9 are the capacitance reference values corresponding to the abnormal key. Then, the capacitance reference value of the abnormal key can be corrected according to the capacitance reference value corresponding to the normal key and the median of the initial capacitance ratio until C 中 =B 中 ; or C 中 =B 中 + preset fluctuation range. It is determined that the capacitance fluctuation relationship satisfies the capacitance reference relationship.
[0086] In another exemplary embodiment of the present application, the method of correcting the capacitance reference value of the abnormal key based on the ratio of the initial median values of each capacitance to a capacitance fluctuation relationship that satisfies the capacitance reference relationship also includes: first determining a proportional median relationship formed by multiple initial median values of capacitance, and then determining a capacitance fluctuation ratio relationship based on the capacitance fluctuation relationship; adjusting the capacitance reference value of the abnormal key based on the relationship between the proportional median relationship and the capacitance fluctuation ratio relationship until the proportional median relationship includes the capacitance fluctuation ratio relationship.
[0087] For example, the ratio median relationship can be expressed as: "C1: C2: C3: C4: C5: C6: C7: C8: C9". The capacitance fluctuation ratio relationship can be expressed as: "CB1: CB2: CB3: CB4: CB5: CB6: CB7: CB8: CB9". If CB1, CB2, CB3, CB4, CB5, CB6, CB7, CB8 and CB9 are less than or equal to: C1, C2, C3, C4, C5, C6, C7, C8 and C9, it is determined that the capacitance fluctuation relationship satisfies the capacitance reference relationship. Otherwise, it is determined that the capacitance fluctuation relationship does not satisfy the capacitance reference relationship.
[0088] In summary, since the capacitance correction method of a key performs benchmark assignment on the key: first, the corresponding initial capacitance values of the multiple keys are collected when the keys are not touched, and a capacitance benchmark relationship is established through the multiple capacitance initial values, which is then used as a reference relationship for benchmark assignment of touch capacitance keys. Then, when benchmark assignment is performed on multiple keys, a capacitance fluctuation relationship is established through the capacitance reference values corresponding to the multiple keys collected. Finally, by comparing the capacitance fluctuation relationship with the capacitance benchmark relationship, it can be identified whether the capacitance fluctuations of some keys do not conform to the capacitance benchmark relationship when the benchmark assignment is performed on each key. If so, the keys that do not conform to the capacitance benchmark relationship are determined as abnormal keys, otherwise they are determined as normal keys, and then the capacitance reference values of the abnormal keys are corrected through the capacitance benchmark relationship, so that the capacitance reference values of the abnormal keys after correction are used as the capacitance benchmark values of the abnormal keys. Therefore, the capacitance correction method of the keys of the present application can almost avoid the problem of misjudgment of key capacitance, which causes the keys to fail to respond normally.
[0089] Figure 6 FIG. 3 is a schematic diagram showing the structure of a key capacitance correction device 300 provided in an embodiment of the present application. Figure 6 As shown, in this embodiment, a key capacitance calibration device 300 is also provided, which is used to execute the key capacitance calibration method in the above embodiment.
[0090] Furthermore, the key capacitance correction device 300 includes an acquisition module 310, which is used to obtain the capacitance reference value corresponding to each of the multiple keys and the capacitance initial value corresponding to the capacitance reference value; the capacitance reference value is the capacitance value of the key after being touched, and the capacitance initial value is the capacitance value of the key when not being touched.
[0091] Furthermore, the key capacitance correction device 300 further includes a first determination module 320, and the first determination module 320 is used to determine a capacitance reference relationship based on a ratio of a plurality of capacitance initial values.
[0092] Furthermore, the key capacitance correction device 300 further includes a second determination module 330, and the second determination module 330 is used to determine the capacitance fluctuation relationship based on the ratio of multiple capacitance reference values.
[0093] Furthermore, the key capacitance correction device 300 also includes a division module 340, which is used to divide some of the multiple keys into abnormal keys and another part of the keys into normal keys based on the capacitance reference relationship if the capacitance fluctuation relationship corresponding to the multiple keys does not satisfy the capacitance reference relationship.
[0094] Furthermore, the key capacitance correction device 300 also includes a correction module 350, and the correction module 350 is used to correct the capacitance reference value of the abnormal key to make the capacitance fluctuation relationship satisfy the capacitance reference relationship.
[0095] It should be noted that the key capacitance correction device 300 provided in the above embodiment and the key capacitance correction method provided in the above embodiment belong to the same concept, and the specific manner in which each module and unit performs the operation has been described in detail in the method embodiment and will not be repeated here.
[0096] Figure 7 A schematic diagram of the structure of an embodiment of a computing device of a vehicle of the present application is shown, which shows a schematic diagram of the structure of a computer system of a computing device of a vehicle suitable for implementing an embodiment of the present application. The specific embodiment of the present application does not limit the specific implementation of the computing device of the vehicle.
[0097] See also Figure 7 As shown, the vehicle includes a computing device, which includes: a controller; a memory for storing one or more programs, and when the one or more programs are executed by the controller, the above-mentioned key capacitance correction method is executed.
[0098] Please continue reading Figure 7 As shown, the computer system of the computing device 500 includes a central processing unit (CPU) 501, which can perform various appropriate actions and processes according to the program stored in the read-only memory (ROM) 502 or the program loaded from the storage part 508 to the random access memory (RAM) 503, such as executing the method in the above embodiment. In the RAM 503, various programs and data required for system operation are also stored. The CPU 501, ROM 502 and RAM 503 are connected to each other through a bus 504. The input / output (I / O) interface 505 is also connected to the bus 504.
[0099] The following components are connected to the I / O interface 505: an input section 506 including a keyboard, a mouse, etc.; an output section 507 including a cathode ray tube (CRT), a liquid crystal display (LCD), etc., and a speaker, etc.; a storage section 508 including a hard disk, etc.; and a communication section 509 including a network interface card such as a LAN (Local Area Network) card, a modem, etc. The communication section 509 performs communication processing via a network such as the Internet. A drive 510 is also connected to the I / O interface 505 as needed. A removable medium 511, such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, etc., is installed on the drive 510 as needed so that a computer program read therefrom is installed into the storage section 508 as needed.
[0100] In particular, according to an embodiment of the present application, the process described above with reference to the flowchart can be implemented as a computer software program. For example, an embodiment of the present application includes a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program includes a computer program for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network through a communication section 509, and / or installed from a removable medium 511. When the computer program is executed by a central processing unit (CPU) 501, various functions defined in the system of the present application are executed.
[0101] Another aspect of the present application further provides a computer-readable storage medium having a computer program stored thereon, which implements the above key capacitance calibration method when executed by a processor. The computer-readable storage medium may be included in the computing device described in the above embodiment, or may exist independently without being assembled into the electronic device.
[0102] Another aspect of the present application further provides a computer program product or a computer program, which includes at least one executable instruction, and when the executable instruction is run on the key capacitance correction device 300 / vehicle, the key capacitance correction device 300 / vehicle executes the key capacitance correction method as described above.
[0103] It should be noted that the computer-readable medium shown in the embodiment of the present application can be a computer-readable signal medium or a computer-readable storage medium or any combination of the above two. The computer-readable storage medium can be, for example, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or device, or any combination of the above. More specific examples of computer-readable storage media can include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM), a flash memory, an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above. In the present application, a computer-readable storage medium can be any tangible medium containing or storing a program, which can be used by an instruction execution system, device or device or used in combination with it. In the present application, a computer-readable signal medium can include a data signal propagated in a baseband or as a part of a carrier wave, wherein a computer-readable computer program is carried. Such propagated data signals may take a variety of forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination of the above. Computer-readable signal media may also be any computer-readable medium other than computer-readable storage media, which may send, propagate, or transmit programs for use by or in conjunction with an instruction execution system, apparatus, or device. The computer program contained on the computer-readable medium may be transmitted using any appropriate medium, including but not limited to: wireless, wired, etc., or any suitable combination of the above.
[0104] The flowcharts and block diagrams in the accompanying drawings illustrate the possible implementation architecture, functions and operations of the apparatus, methods and computer program products according to various embodiments of the present application. Among them, each box in the flowchart or block diagram can represent a module, a program segment, or a part of the code, and the above-mentioned module, program segment, or a part of the code contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in a different order than the order marked in the accompanying drawings. For example, two boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram or flowchart, and the combination of boxes in the block diagram or flowchart, can be implemented with a dedicated hardware-based system that performs a specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.
[0105] The units involved in the embodiments described in this application may be implemented by software or hardware, and the units described may also be set in a processor. The names of these units do not, in some cases, constitute limitations on the units themselves.
[0106] According to one aspect of an embodiment of the present application, a computer system is also provided, including a central processing unit (CPU), which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM) or a program loaded from a storage portion into a random access memory (RAM), such as executing the method in the above embodiment. In RAM, various programs and data required for system operation are also stored. CPU, ROM and RAM are connected to each other via a bus. An input / output (I / O) interface is also connected to the bus.
[0107] The following components are connected to the I / O interface: an input part including a keyboard, a mouse, etc.; an output part including a cathode ray tube (CRT), a liquid crystal display (LCD), etc., and a speaker; a storage part including a hard disk, etc.; and a communication part including a network interface card such as a LAN (Local Area Network) card, a modem, etc. The communication part performs communication processing via a network such as the Internet. A drive is also connected to the I / O interface as needed. Removable media, such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, etc., are installed on the drive as needed so that the computer program read therefrom is installed into the storage part as needed.
[0108] The serial numbers of the above-mentioned embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.
[0109] In the present application, the same or similar terminology concepts, technical solutions and / or application scenario descriptions are generally described in detail only the first time they appear. When they appear again later, they are generally not repeated for the sake of brevity. When understanding the technical solutions and other contents of the present application, for the same or similar terminology concepts, technical solutions and / or application scenario descriptions that are not described in detail later, reference can be made to the previous related detailed descriptions.
[0110] In the present application, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.
[0111] The various technical features of the technical solution of the present application can be arbitrarily combined. In order to make the description concise, not all possible combinations of the various technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of the present application.
[0112] The above content is only a preferred exemplary embodiment of the present application and is not intended to limit the implementation scheme of the present application. A person skilled in the art can easily make corresponding changes or modifications based on the main concept and spirit of the present application. Therefore, the scope of protection of the present application shall be based on the scope of protection required by the claims.
Claims
1. A method for correcting the capacitance of a key, characterized in that: The method comprises: Acquire capacitance reference values corresponding to each of the plurality of keys and capacitance initial values corresponding to the capacitance reference values; the capacitance reference value is the capacitance value of the key after being touched, and the capacitance initial value is the capacitance value of the key when not being touched; determining a capacitance reference relationship based on a ratio of a plurality of the initial capacitance values; determining a capacitance fluctuation relationship based on a ratio of a plurality of the capacitance reference values; If the capacitance fluctuation relationship corresponding to the plurality of keys does not satisfy the capacitance reference relationship, classifying some of the plurality of keys as abnormal keys and another portion of the keys as normal keys based on the capacitance reference relationship; The capacitance reference value of the abnormal key is corrected until the capacitance fluctuation relationship satisfies the capacitance reference relationship.
2. The method according to claim 1, characterized in that The method of correcting the capacitance reference value of the abnormal key until the capacitance fluctuation relationship satisfies the capacitance reference relationship includes: If there are multiple normal buttons, obtaining capacitance reference values corresponding to each of the multiple normal buttons; A target capacitance reference value is determined from capacitance reference values corresponding to the plurality of normal keys, and the capacitance reference value of the abnormal key is corrected based on the target capacitance reference value until the capacitance fluctuation relationship satisfies the capacitance reference relationship.
3. The method according to claim 2, characterized in that The method of determining a target capacitance reference value from capacitance reference values corresponding to a plurality of normal keys comprises: The capacitance reference values corresponding to the plurality of normal keys are sequentially determined as the target capacitance reference values until the capacitance fluctuation relationship satisfies the capacitance reference relationship.
4. The method according to claim 2, characterized in that The method of determining a target capacitance reference value from capacitance reference values corresponding to a plurality of normal keys comprises: Determine an average value corresponding to each of the capacitance reference values from the capacitance reference values corresponding to the plurality of normal keys; A target capacitance reference value is determined based on an average value corresponding to each of the capacitance reference values.
5. The method according to claim 1, characterized in that The method of correcting the capacitance reference value of the abnormal key until the capacitance fluctuation relationship satisfies the capacitance reference relationship includes: determining a plurality of capacitance fluctuation ranges based on a plurality of the capacitance initial values; Calculating initial median values of capacitance corresponding to each of the plurality of capacitance fluctuation ranges; The capacitance reference value of the abnormal key is corrected based on the ratio of the initial median values of each capacitance until the capacitance fluctuation relationship satisfies the capacitance reference relationship.
6. The method according to claim 1, characterized in that The method for determining the capacitance reference relationship based on the ratio of the plurality of capacitance initial values comprises: determining a plurality of fluctuation ranges based on a plurality of the initial capacitance values; The capacitance reference relationship is determined based on a ratio relationship of a plurality of the fluctuation ranges.
7. The method according to claim 6, characterized in that The method of classifying some of the keys as abnormal keys and another part of the keys as normal keys based on the capacitance reference relationship if the capacitance fluctuation relationship does not satisfy the capacitance reference relationship comprises: Determine the capacitance reference values corresponding to a part of the plurality of keys as a first ratio sub-relationship, and determine the capacitance reference values corresponding to another part of the plurality of keys as a second ratio sub-relationship; If either the first ratio sub-relationship and the second ratio sub-relationship satisfy the capacitance reference relationship, then obtaining the number of keys corresponding to the first ratio sub-relationship and obtaining the number of keys corresponding to the second ratio sub-relationship; Abnormal keys and normal keys among the multiple keys are determined based on the magnitude relationship between the number of keys corresponding to the first ratio sub-relationship and the number of keys corresponding to the second ratio sub-relationship.
8. A capacitance correction device for a key, characterized in that: The device comprises: An acquisition module, used to acquire capacitance reference values corresponding to each of the plurality of keys and capacitance initial values corresponding to the capacitance reference values; the capacitance reference value is the capacitance value of the key after being touched, and the capacitance initial value is the capacitance value of the key when not being touched; A first determining module, configured to determine a capacitance reference relationship based on a ratio of a plurality of capacitance initial values; A second determining module, configured to determine a capacitance fluctuation relationship based on a ratio of a plurality of capacitance reference values; a classification module, configured to classify some of the plurality of keys as abnormal keys and another portion of the keys as normal keys based on the capacitance reference relationship if the capacitance fluctuation relationship corresponding to the plurality of keys does not satisfy the capacitance reference relationship; The correction module is used to correct the capacitance reference value of the abnormal key until the capacitance fluctuation relationship satisfies the capacitance reference relationship.
9. A vehicle, characterized in that: include: Controller; A memory for storing one or more programs, which, when executed by the controller, enables the controller to implement the key capacitance correction method described in any one of claims 1 to 7.
10. A computer-readable storage medium, characterized in that: The storage medium stores a computer program, which includes at least one executable instruction. When the executable instruction is run on the key capacitance correction device / vehicle, the key capacitance correction device / vehicle executes the key capacitance correction method as described in any one of claims 1 to 7.