A chip self-checking method, system, device and medium under a low-power consumption condition

Abstract

The application discloses a chip self-checking method, system, device and medium under a low-power consumption condition, the chip self-checking method under the low-power consumption condition comprises the following steps: acquiring the running power consumption of a chip in real time; when the running power consumption is lower than a preset threshold, acquiring the current running state of the chip and a chip self-checking task; obtaining each sub self-checking task based on the chip self-checking task; performing current chip self-checking processing based on the current running state and the chip self-checking task; after completing the current chip self-checking processing, acquiring a new running state and a remaining chip self-checking task, and continuing to perform chip self-checking processing based on the new running state and the remaining chip self-checking task until all sub self-checking tasks are completed. Therefore, the application can perform chip self-checking under a low-power consumption condition according to the current acquired running state and chip self-checking task when the running power consumption is lower than the preset threshold, thereby effectively reducing the power consumption of chip self-checking.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of chip self-checking, and in particular to a chip self-checking method, system, device and medium under low power consumption conditions. BACKGROUND

[0002] With the continuous upgrading of chip hardware, the chip power consumption standard is getting higher and higher, which not only reduces the service life of the chip, but also increases the power consumption of the chip, thereby continuously increasing the running cost of the chip. Therefore, low power consumption operation of the chip has always been the research goal of the technical personnel in the field. When the chip is self-checked, the functions and states of the chip are often checked comprehensively, which makes it difficult to reduce the power consumption of the chip during self-checking. Therefore, how to improve the power saving effect of the chip during self-checking is the current research goal.

[0003] The traditional chip self-checking method is to perform function self-checking on each chip function of the chip based on a self-checking running program. However, the self-checking running program can only ensure that the chip completes the self-checking task, and cannot ensure low running power consumption of the chip, thereby resulting in poor self-checking power saving effect of the chip. SUMMARY

[0004] The present application provides a chip self-checking method, system, device and medium under low power consumption conditions to solve the above technical problems and effectively reduce the power consumption of chip self-checking.

[0005] In order to solve the above technical problems, the present application provides a chip self-checking method under low power consumption conditions, comprising:

[0006] real-time acquisition of the running power consumption of the chip;

[0007] when the running power consumption is lower than the preset threshold, acquiring the current running state of the chip and the chip self-checking task;

[0008] obtaining each sub self-checking task based on the chip self-checking task;

[0009] performing current chip self-checking processing based on the current running state and the chip self-checking task;

[0010] After completing the current chip self-checking processing, acquiring a new running state and a remaining chip self-checking task, and continuing to perform chip self-checking processing based on the new running state and the remaining chip self-checking task until all sub self-checking tasks are completed.

[0011] The present application has the following advantages:

[0012] The application obtains the current running state and chip self-checking task of the chip when the running power consumption of the chip is lower than the preset threshold, performs current chip self-checking processing based on the current running state and chip self-checking task, and continues to perform chip self-checking processing based on the obtained new running state and remaining chip self-checking task after completing the current chip self-checking processing, until all sub self-checking tasks are completed. Thus, the application can perform chip self-checking according to the currently obtained running state and chip self-checking task when the running power consumption is lower than the preset threshold, can perform chip self-checking under low power consumption conditions, and can effectively reduce the power consumption of chip self-checking.

[0013] As a preferred solution, the current chip self-checking processing based on the current running state and chip self-checking task comprises:

[0014] Based on the current running state, current chip power consumption information and a current running process are obtained.

[0015] Based on the chip self-checking task, self-checking processes of each sub self-checking task are obtained to obtain each self-checking process.

[0016] Based on each self-checking process, average power consumption information corresponding to each self-checking process is queried in a historical self-checking database.

[0017] Based on the average power consumption information corresponding to each self-checking process, the current chip power consumption information and the current running process, a current self-checking process is selected in each self-checking process.

[0018] The current chip self-checking processing is performed based on the current self-checking process.

[0019] As a preferred solution, the current chip power consumption information and the current running process based on the current running state are obtained, comprising:

[0020] Based on the current running state, a current power consumption value and a current running task of the chip are obtained.

[0021] Based on the current running task, a current running process is obtained.

[0022] Based on the current running process, an average unit power consumption value of the current running process and an average running duration of the current running process are queried in a historical database.

[0023] The average unit power consumption value is adjusted based on the current power consumption value to obtain a current average unit power consumption value.

[0024] The current chip power consumption information is obtained based on the current average unit power consumption value and the average running duration.

[0025] As a preferred solution, the self-checking processes of each sub self-checking task based on the chip self-checking task are obtained, comprising:

[0026] Obtaining each self-check target based on the chip self-check task, wherein the self-check target corresponds to each sub self-check task one by one;

[0027] Querying each task flow of each sub self-check task in the self-check database based on each self-check target;

[0028] Obtaining the average task power consumption of each task flow;

[0029] For each sub self-check task, selecting the task flow with the lowest average task power consumption in the task flows corresponding to the sub self-check task as the self-check flow of the sub self-check task.

[0030] As a preferred solution, the querying of the average power consumption information corresponding to each self-check flow in the historical self-check database based on each self-check flow comprises:

[0031] For each self-check flow, obtaining each historical self-check log of the self-check flow, the historical self-check power consumption of each historical self-check log and the historical self-check duration of each historical self-check log in the historical self-check database;

[0032] Calculating the average self-check duration of the self-check flow based on the historical self-check duration of each historical self-check log;

[0033] Calculating the average self-check power consumption of the self-check flow based on the historical self-check power consumption of each historical self-check log;

[0034] Taking the average self-check duration and the average self-check power consumption as the average power consumption information corresponding to the self-check flow.

[0035] As a preferred solution, the filtering of the current self-check flow in each self-check flow based on the average power consumption information corresponding to each self-check flow, the current chip power consumption information and the current running flow comprises:

[0036] Obtaining the flow content of the current running flow;

[0037] Extracting the running flow feature corresponding to the flow content;

[0038] Obtaining the self-check flow content of each self-check flow based on each self-check flow to obtain each self-check flow content;

[0039] Extracting the self-check flow feature corresponding to each self-check flow content to obtain each self-check flow feature corresponding to each self-check flow;

[0040] Calculating the similarity between each running flow feature and each self-check flow feature respectively;

[0041] In each self-check flow feature, taking the self-check flow feature with a similarity greater than a similarity threshold as a candidate feature;

[0042] In the respective self-checking processes, the self-checking process corresponding to the candidate feature is taken as a candidate self-checking process;

[0043] Based on the current power consumption information and the average power consumption information corresponding to each candidate self-checking process, a power consumption deviation value between each candidate self-checking process and the current running process is calculated;

[0044] The candidate self-checking process with the largest power consumption deviation value is selected as the current self-checking process.

[0045] As a preferred solution, after completing the current chip self-checking process, before obtaining the new running state and the remaining chip self-checking task, the method further comprises:

[0046] Recording running log information of the current running process;

[0047] Obtaining current self-checking process content of the current self-checking process;

[0048] Based on the running log information and the current self-checking process content, obtaining remaining self-checking process content of the current self-checking process;

[0049] Taking the current self-checking process containing the remaining self-checking process content as a new self-checking process;

[0050] Based on the new self-checking process, generating a new sub-self-checking task;

[0051] Updating each sub-self-checking task based on the new sub-self-checking task.

[0052] Correspondingly, in order to solve the above technical problems, the application further provides a chip self-checking system under a low power consumption condition, comprising a power consumption acquisition module, a data acquisition module and a chip self-checking module;

[0053] The power consumption acquisition module is used to acquire the running power consumption of the chip in real time.

[0054] The data acquisition module is used to acquire the current running state of the chip and the chip self-checking task when the running power consumption is lower than a preset threshold value; and obtain each sub-self-checking task based on the chip self-checking task.

[0055] The chip self-checking module is used to perform current chip self-checking processing based on the current running state and the chip self-checking task.

[0056] The chip self-checking module is further used to acquire a new running state and a remaining chip self-checking task after completing the current chip self-checking processing, and continue to perform chip self-checking processing based on the new running state and the remaining chip self-checking task until all sub-self-checking tasks are completed.

[0057] The application further provides a terminal device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the chip self-checking method under low-power consumption conditions according to any one of the preceding embodiments when executing the program.

[0058] The application further provides a storage medium having a computer program stored thereon, wherein the computer program is executable on a processor to implement the steps of the chip self-checking method under low-power consumption conditions according to any one of the preceding embodiments. BRIEF DESCRIPTION OF DRAWINGS

[0059] Figure 1 Fig. 1 is a flowchart of an embodiment of the chip self-checking method under low-power consumption conditions provided by the application;

[0060] Figure 2 Fig. 2 is a structural diagram of an embodiment of the chip self-checking system under low-power consumption conditions provided by the application;

[0061] Figure 3 Fig. 3 is an internal structural diagram of the terminal device provided by the embodiment of the application. DETAILED DESCRIPTION

[0062] The technical solutions in the embodiments of the application will be clearly and completely described below with reference to the drawings in the embodiments of the application. Obviously, the described embodiments are only part of the embodiments of the application, rather than all the embodiments of the application. Based on the embodiments in the application, all other embodiments obtained by those skilled in the art without creative work fall within the scope of the application.

[0063] The chip self-checking method under low-power consumption conditions provided by the embodiments of the application is applied to the chip self-checking system under low-power consumption conditions. Unless otherwise defined, all the technical and scientific terms used in the present application have the same meanings as those commonly understood by those skilled in the art to which the present application belongs. The terms used in the specification of the present application are only for the purpose of describing the specific embodiments and are not intended to limit the present application. The terms "include" and "have" and any variations thereof in the specification of the present application and the claims and the above description of drawings are intended to cover the non-exclusive inclusion. The terms "first", "second", and the like in the specification of the present application and the claims or the above description of drawings are used to distinguish different objects, rather than to describe a specific sequence.

[0064] Reference to“an embodiment” herein means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase“in one embodiment” in various places in the specification are not necessarily all referring to the same embodiment, nor are they necessarily all referring to a common embodiment, or an embodiment that is independent of other embodiments. Those skilled in the art will recognize that features described in one embodiment can be combined with features described in other embodiments.

[0065] In order to better understand the technical scheme of the present application, the technical scheme in the embodiments of the present application will be clearly and completely described below with reference to the drawings.

[0066] With the continuous upgrading of chip hardware, the chip power consumption standard is getting higher and higher, which not only reduces the service life of the chip, but also increases the power consumption of the chip, thereby increasing the running cost of the chip. Therefore, low-power running of the chip has always been the research goal of those skilled in the art. When the chip is self-checked, the running functions and states of the chip are often comprehensively checked, thereby making it difficult to reduce the power consumption of the chip during self-checking. Therefore, how to improve the power saving effect of the chip during self-checking is the current research goal.

[0067] The traditional chip self-checking method is to perform function self-checking on each chip running function of the chip based on a self-checking running program. However, the self-checking running program can only ensure that the chip completes the self-checking task, and cannot ensure low running power consumption of the chip, thereby resulting in poor self-checking power saving effect of the chip.

[0068] Embodiment one

[0069] In order to solve the above technical problems, the present application provides a chip self-checking method, system, device and medium under low power consumption conditions, which effectively reduces the power consumption of chip self-checking.

[0070] Please refer to Figure 1 , a flowchart of an embodiment of a chip self-checking method under low power consumption conditions provided by the embodiment of the present application.

[0071] As Figure 1 shown, the chip self-checking method under low power consumption conditions includes steps 101 to 105, specifically:

[0072] Step 101: Real-time acquisition of running power consumption of the chip;

[0073] Step 102: When the running power consumption is lower than the preset threshold, acquire the current running state of the chip and the chip self-checking task;

[0074] Step 103: Obtain each sub-self-checking task based on the chip self-checking task;

[0075] Step 104: based on the current running state and the chip self-check task, current chip self-check processing is performed;

[0076] Step 105: after completing the current chip self-check processing, a new running state and a remaining chip self-check task are obtained, and the chip self-check processing is continued based on the new running state and the remaining chip self-check task until all sub self-check tasks are completed.

[0077] When the running power consumption of the chip is lower than the preset threshold, the current running state of the chip and the chip self-check task are obtained, the current chip self-check processing is performed based on the current running state and the chip self-check task, and after completing the current chip self-check processing, the chip self-check processing is continued based on the obtained new running state and the remaining chip self-check task until all sub self-check tasks are completed. Therefore, the chip self-check is performed according to the currently obtained running state and the chip self-check task when the running power consumption is lower than the preset threshold, the chip self-check can be performed under the low power consumption condition, and the power consumption of the chip self-check is effectively reduced.

[0078] The chip self-check method under the low power consumption condition provided by the embodiment of the present application can be applied to the application environment of chip self-check. The method can be applied to a terminal, a server, or a system including a terminal and a server, and is realized through the interaction of the terminal and the server. The terminal can be, but is not limited to, various personal computers, notebook computers, smart phones, tablet computers, etc.

[0079] In the embodiment, the application environment of the chip self-check method under the low power consumption condition is a chip under the low power consumption condition, wherein the low power consumption condition is a chip running mode artificially preset or a condition that causes the chip to run under low power consumption.

[0080] In the embodiment, the remaining chip self-check task is all the sub self-check tasks that have not been completed.

[0081] Further, when the running power consumption is lower than the preset threshold, the chip self-check is stopped.

[0082] Further, in step 102, the current running state of the chip is collected by a detection device arranged in the chip. The current running state of the chip is the current power load percentage of the chip.

[0083] In the embodiment, the current running state of the chip includes detecting the current power output rate of the chip, collecting the full power output rate of the chip, then calculating the ratio value between the current power output rate and the full power output rate to obtain the current power load percentage of the chip, and taking the current power load percentage as the current running state of the chip.

[0084] Further, in step 103, the chip self-check task is divided into sub self-check tasks based on the self-check targets.

[0085] Further, in step 104, the current chip self-check processing is performed based on the current running state and the chip self-check task, including:

[0086] Based on the current running state, the current chip power consumption information and the current running process are obtained.

[0087] Based on the chip self-check task, the self-check processes of the sub self-check tasks are obtained to obtain the self-check processes.

[0088] Based on the self-check processes, the average power consumption information corresponding to each self-check process is queried in the historical self-check database.

[0089] Based on the average power consumption information corresponding to each self-check process, the current chip power consumption information and the current running process, the current self-check process is filtered in each self-check process.

[0090] The current chip self-check processing is performed based on the current self-check process.

[0091] In this embodiment, each sub self-check task corresponds to a self-check target, that is, the chip self-check task includes sub self-check tasks corresponding to multiple self-check targets. Based on the chip self-check task, the self-check processes of the sub self-check tasks are obtained to obtain the self-check processes, specifically, the task execution processes of the sub self-check tasks are queried in the historical self-check database to obtain the self-check processes of the sub self-check tasks, and the self-check processes are obtained to obtain the self-check processes.

[0092] In this embodiment, each self-check process includes a normal running process of the chip and a detection process of the chip. The self-check process of the sub self-check task obtained by the application is the normal running process of the chip. The normal running process is the running process of the chip when running each chip program, which is the same as the running process of the conventional chip.

[0093] In this embodiment, the current chip power consumption information is the target output power value of the chip obtained by multiplying the average unit power consumption value (i.e. the current power output rate of the chip) of the chip per unit time by the average running time of the current running process in which the chip is located. The target output power value is the output power of the total process of the chip when running the current running process.

[0094] Further, the current chip power consumption information and the current running process are obtained based on the current running state, including:

[0095] Based on the current running state, the current power consumption value and the current running task of the chip are obtained.

[0096] Based on the current running task, a current running process is acquired;

[0097] Based on the current running process, an average unit power consumption value of the current running process and an average running duration of the current running process are queried in a history database;

[0098] Based on the current power consumption value, the average unit power consumption value is adjusted to obtain a current average unit power consumption value;

[0099] Based on the current average unit power consumption value and the average running duration, current chip power consumption information is obtained.

[0100] In the embodiment, the current power consumption value is an instantaneous power consumption value corresponding to a current running state acquired by the chip. Wherein, since the average unit power consumption value represents an average chip instantaneous power consumption value at each moment, the instantaneous power consumption value acquired at this moment is a current actual chip instantaneous power consumption value.

[0101] In the embodiment, based on the current power consumption value, the average unit power consumption value is adjusted to obtain the current average unit power consumption value, specifically, an average value between the current actual chip instantaneous power consumption value and the average unit power consumption value is calculated to obtain the current average unit power consumption value.

[0102] In the embodiment, based on the current average unit power consumption value and the average running duration, the current chip power consumption information is obtained, specifically, the average running duration is multiplied by the current average unit power consumption value to obtain the current chip power consumption information.

[0103] The current actual chip instantaneous power consumption value actually acquired is used to adjust the current average unit power consumption value of the chip to obtain the current chip power consumption information of the chip, and the accuracy of the identified current chip power consumption information of the chip is improved.

[0104] Further, based on the chip self-check task, self-check processes of each sub self-check task are acquired, including:

[0105] Based on the chip self-check task, each self-check target is obtained; the each self-check target corresponds to each sub self-check task one by one;

[0106] Based on each self-check target, each task process of each sub self-check task is queried in a self-check database respectively;

[0107] An average task power consumption of each task process is acquired;

[0108] For each sub self-check task, in each task process corresponding to the sub self-check task, a task process with the lowest average task power consumption is selected as a self-check process of the sub self-check task.

[0109] In the embodiment, each self-checking target corresponds to a chip running program, and each chip running program corresponds to one or more chip running flows.

[0110] In the embodiment, each task flow is one or more chip running flows corresponding to a chip running program.

[0111] The application selects a task flow with the lowest task power consumption as a self-checking flow of a sub self-checking task, thereby reducing the task power consumption of the self-checking flow corresponding to each sub self-checking task and improving the task power consumption saving degree of each sub self-checking task.

[0112] Further, the average power consumption information corresponding to each self-checking flow is queried in the historical self-checking database based on each self-checking flow, and the average power consumption information corresponding to each self-checking flow includes:

[0113] For each self-checking flow, each historical self-checking log of the self-checking flow, historical self-checking power consumption of each historical self-checking log, and historical self-checking duration of each historical self-checking log are obtained in the historical self-checking database.

[0114] Based on the historical self-checking duration of each historical self-checking log, the average self-checking duration of the self-checking flow is calculated.

[0115] Based on the historical self-checking power consumption of each historical self-checking log, the average self-checking power consumption of the self-checking flow is calculated.

[0116] The average self-checking duration and the average self-checking power consumption are taken as the average power consumption information corresponding to the self-checking flow.

[0117] In the embodiment, the historical self-checking database includes a corresponding relationship between power consumption information of a chip performing self-checking each time when the sub self-checking task is executed and the sub self-checking task. Based on the above corresponding relationship, the average power consumption information corresponding to each self-checking flow is calculated.

[0118] In the embodiment, the historical self-checking power consumption is the total running power consumption required for the chip to run the self-checking flow stored in the historical self-checking log; and the historical self-checking duration is the total duration required for the chip to run the self-checking flow.

[0119] The application calculates the average self-checking power consumption and the average self-checking duration, thereby ensuring the comprehensiveness of the analysis of the power consumption information of each self-checking flow.

[0120] Further, the current self-checking flow is screened in each self-checking flow based on the average power consumption information corresponding to each self-checking flow, current chip power consumption information, and a current running flow.

[0121] The flow content of the current running flow is obtained.

[0122] extract a running process feature corresponding to the process content;

[0123] Based on the respective self-check process, the self-check process content of the respective self-check process is obtained to obtain the respective self-check process content;

[0124] Extract the self-check process feature corresponding to the respective self-check process content to obtain the respective self-check process feature corresponding to the respective self-check process;

[0125] Calculate the similarity between each running process feature and each self-check process feature respectively;

[0126] In the respective self-check process feature, the self-check process feature with a similarity greater than a similarity threshold value is taken as a candidate feature;

[0127] In the respective self-check process, the self-check process corresponding to the candidate feature is taken as a candidate self-check process;

[0128] Based on the current power consumption information and the average power consumption information corresponding to each candidate self-check process, the power consumption deviation value between each candidate self-check process and the current running process is calculated;

[0129] The candidate self-check process with the largest power consumption deviation value is screened as the current self-check process.

[0130] In the present embodiment, one of the implementation manners of extracting the running process feature corresponding to the process content and extracting the self-check process feature corresponding to the respective self-check process content is: performing text processing on each process content or self-check process content to obtain the text content of each process content or self-check process content, and then respectively extracting the text feature of each text content based on the neural network of the natural language processing technology to obtain the running process feature or the self-check process feature of each process content or self-check process content.

[0131] In the present embodiment, the similarity between each running process feature and each self-check process feature can be calculated respectively by, but not limited to, the cosine similarity algorithm.

[0132] In the present embodiment, the similarity threshold value is a preset value, which can be set according to the actual situation.

[0133] In the embodiment, based on the current power consumption information and the average power consumption information corresponding to each candidate self-checking process, a power consumption deviation value between each candidate self-checking process and the current running process is calculated, specifically: a deviation value between the average unit power consumption value of each candidate self-checking process and the power consumption value of the current running process is calculated to obtain a first power consumption deviation value; a time length deviation value between the average time length of each candidate self-checking process and the average running time length of the current running process is calculated to obtain a second deviation value; wherein the deviation value includes positive and negative deviation values, and the positive deviation value represents that the running time length of the current running process is shorter than the running time length of the current self-checking process, or the power consumption value of the current running process is lower than the power consumption value of the current self-checking process; the first deviation value and the second deviation value are taken as the power consumption deviation value.

[0134] In the embodiment, the candidate self-checking process with the largest power consumption deviation value is selected, that is, the candidate self-checking process with a running time length much longer than the current running process and a power consumption value much greater than the current running process is selected, and the candidate self-checking process can replace the current running process, so that the self-checking process with high power consumption and long time can be removed, thereby greatly reducing the power consumption value of the self-checking process.

[0135] After the selection of the candidate self-checking process by the similarity of the process content, the candidate self-checking process with a running time length much longer than the current running process and a power consumption value much greater than the current running process is selected, thereby greatly reducing the power consumption value of the self-checking process and improving the power saving degree of the self-checking task.

[0136] Further, after completing the current chip self-checking process, before obtaining the new running state and the remaining chip self-checking task, the method further comprises:

[0137] recording running log information of the current running process;

[0138] obtaining current self-checking process content of the current self-checking process;

[0139] based on the running log information and the current self-checking process content, obtaining remaining self-checking process content of the current self-checking process;

[0140] taking the current self-checking process containing the remaining self-checking process content as a new self-checking process;

[0141] generating a new sub-self-checking task based on the new self-checking process;

[0142] updating each sub-self-checking task based on the new sub-self-checking task.

[0143] In the embodiment, after the new sub-self-checking task is generated based on the new self-checking process, the method further comprises: replacing the self-checking task corresponding to the current self-checking process with the new sub-self-checking task.

[0144] In the embodiment, a small amount of power consumption is consumed in the part of recording the running log information corresponding to the current running procedure and evaluating the log.

[0145] In the embodiment, the remaining self-check procedure content is the procedure content not included in the current running procedure. For example, when the current running procedure is (A, B, C, D) and the self-check procedure content is (A, B, C, D, E, F), the remaining self-check procedure is (E, F). However, when the self-check procedure content is equal to or less than the current running procedure, the self-check procedure does not have the remaining self-check procedure content. The present application determines whether the remaining self-check procedure content exists based on the above rule.

[0146] In the embodiment, the task target of the new sub-self-check task is the same as that of the self-check task corresponding to the new sub-self-check task, but the self-check procedure of the new sub-self-check task is the remaining self-check procedure.

[0147] In the embodiment, the remaining chip self-check task includes the self-check task corresponding to the screened current self-check procedure. Since the current self-check procedure and the current running procedure can not be completely corresponding, i.e., there is a part of self-check procedure not executed, the present application generates a new self-check task for the not executed self-check procedure and replaces the self-check task of the current self-check procedure. In the screening process, the new self-check task needs to match the current task procedure including the completed self-check procedure corresponding to the not executed self-check procedure to be matched. For example, the self-check procedure corresponding to the new self-check task includes (D, E, F), the original self-check procedure corresponding to the self-check procedure is (A, B, C, D, E, F), after the current self-check procedure is screened in the first screening, the self-check procedure is completed only (A, B, C, D) when the current running procedure is executed, in the second screening, the current running procedure of the self-check procedure at least includes the procedure corresponding to (A, B, C, D, E, F), i.e., the current running procedure can be (A, B, C, D, E, F, …), but cannot be (A, C, D, E, F, …), (B, C, D, E, F, …), (C, D, E, F, …), (D, E, F, …) corresponding to the procedure type. The ellipsis can correspond to a specific procedure or can have no specific procedure, i.e., the current running procedure is completely corresponding to the original procedure. However, in the actual execution process, only the running information of the current running procedure in the running (D, E, F) part needs to be recorded, so that the running information of the part is executed by the detection procedure of the self-check task.

[0148] The present application re-generates the sub-self-check task by identifying the completion degree of the self-check procedure, so that each self-check procedure can be completed and the power consumption of each self-check procedure is reduced to the minimum value.

[0149] In the embodiment, another implementation of the chip self-checking method under the low-power consumption condition is as follows:

[0150] obtaining the current running state of the chip and a chip self-checking task, and obtaining current chip power consumption information based on the current running state;

[0151] based on the chip self-checking task, obtaining a self-checking flow of each sub self-checking task to obtain each self-checking flow;

[0152] based on each self-checking flow, obtaining average power consumption information corresponding to each self-checking flow to obtain the average power consumption information corresponding to each self-checking flow;

[0153] based on the average power consumption information corresponding to each self-checking flow, the current chip power consumption information and the current running flow, in each self-checking flow, screening a current self-checking flow for chip self-checking processing, and after completing the chip self-checking processing of the current self-checking flow, re-obtaining a new running state of the chip;

[0154] obtaining all uncompleted sub self-checking tasks;

[0155] replacing the new running state with the current running state, and replacing all uncompleted sub self-checking tasks with the chip self-checking task of the chip, returning to execute the step of obtaining the current chip power consumption information based on the current running state until all sub self-checking tasks are completed.

[0156] It should be understood that although each step in the flowchart involved in each embodiment as described above is displayed in sequence according to the arrow, these steps are not necessarily executed in sequence according to the arrow. Unless otherwise stated herein, the execution of these steps is not strictly limited in sequence, and these steps can be executed in other sequences. Moreover, at least part of the steps in the flowchart involved in each embodiment as described above can include multiple steps or multiple stages, which are not necessarily executed at the same time, but can be executed at different times, and the execution sequence of these steps or stages is not necessarily sequential, but can be executed in rotation or alternation with at least part of other steps or steps or stages in other steps.

[0157] Correspondingly, in order to solve the above technical problems, the present application also provides a chip self-checking system under a low-power consumption condition. Please refer to Figure 3 The structure diagram of an embodiment of a chip self-checking system under a low-power consumption condition provided by the present application.

[0158] The chip self-checking system 20 under the low-power consumption condition comprises a power consumption obtaining module 201, a data obtaining module 202 and a chip self-checking module 203.

[0159] The power consumption acquisition module 201 is configured to acquire the running power consumption of the chip in real time.

[0160] The data acquisition module 202 is configured to acquire the current running state of the chip and the chip self-check task when the running power consumption is lower than the preset threshold value, and obtain each sub self-check task based on the chip self-check task.

[0161] The chip self-check module 203 is configured to perform the current chip self-check processing based on the current running state and the chip self-check task.

[0162] The chip self-check module 203 is further configured to acquire a new running state and a remaining chip self-check task after completing the current chip self-check processing, and continue to perform the chip self-check processing based on the new running state and the remaining chip self-check task until all sub self-check tasks are completed.

[0163] The above-mentioned modules in the chip self-check system under the low power consumption condition can be realized by software, hardware and combinations thereof in whole or in part. The above-mentioned modules can be embedded in or independent of the processor in the computer device in hardware form, or can be stored in the memory in the computer device in software form, so as to be called and executed by the processor to perform the operations corresponding to the above-mentioned modules.

[0164] The present application also provides a terminal device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the chip self-check method under the low power consumption condition according to any one of the above-mentioned embodiments when executing the program.

[0165] In one embodiment, the internal structure of the terminal device can be as shown in Figure 3 The terminal device comprises a processor, a memory, a communication interface, a display unit and an input device connected by a system bus. The processor of the terminal device is configured to provide calculation and control capabilities. The memory of the terminal device comprises a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operating system and the computer program in the non-volatile storage medium to run. The communication interface of the terminal device is configured to perform wired or wireless communication with external terminals. The wireless mode can be achieved by WIFI, mobile cellular network, NFC (near field communication) or other technologies. The computer program is executed by the processor to implement a chip self-check method under low power consumption condition. The display unit of the terminal device can be a liquid crystal display screen or an electronic ink display screen. The input system of the terminal device can be a touch layer overlaid on the display screen, or a key, trackball or touchpad arranged on the shell of the terminal device. It can also be an external keyboard, touchpad or mouse, etc.

[0166] Those skilled in the art can understand that,Figure 3 The structure shown in the figure is only a block diagram of part of the structure related to the scheme of the present application, and does not constitute a limitation on the terminal device to which the scheme of the present application is applied; specifically, the terminal device can include more or fewer components than those shown in the figure, or combine certain components, or have a different component arrangement.

[0167] The application further provides a storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps of the chip self-checking method under the low-power consumption condition according to any one of the preceding embodiments.

[0168] The application further provides a computer program product comprising a computer program, wherein the computer program, when executed by a processor, implements the steps of the chip self-checking method under the low-power consumption condition according to any one of the preceding embodiments.

[0169] It should be noted that the user information (including but not limited to user equipment information, user personal information, etc.) and data (including but not limited to data for analysis, stored data, displayed data, etc.) involved in the present application are all information and data authorized by the user or authorized by all parties.

[0170] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a non-volatile computer readable storage medium, and when executed, can include the processes of the above-mentioned embodiment methods. Any reference to memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical storage, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration but not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc. The database involved in the embodiments provided in the present application can include at least one of a relational database and a non-relational database. The non-relational database can include a distributed database based on a blockchain, etc., without being limited thereto. The processor involved in the embodiments provided in the present application can be a general-purpose processor, a central processing unit, a graphics processing unit, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., without being limited thereto.

[0171] Compared with the prior art, the embodiments of the present application have the following beneficial effects:

[0172] Compared with the self-checking operation program in the prior art, only the chip can complete the self-checking task, and the low running power consumption of the chip cannot be ensured, thereby leading to poor self-checking power consumption saving effect of the chip. The current chip power consumption information of the current running state is obtained, so that the current self-checking process is screened in each self-checking process, and the self-checking process is fused with the current running process corresponding to the current running state. Since the current self-checking process is not necessarily completely the same as the current running process, each current remaining running process is used to replace the original self-checking process to perform chip self-checking, thereby realizing the technical scheme of self-checking while running. Since the chip self-checking is performed only when the running power consumption is lower than the preset threshold in the present application, the chip runs in a low power consumption condition, and the power consumption of the chip running process is in a low power consumption environment, thereby avoiding the high power consumption self-checking of the prior art. In the process of recording the running data of the low power consumption running process, the tasks and processes are divided, and each sub self-checking task is completed, thereby realizing the low power consumption self-checking effect of the chip. Not only the additional workload of the chip is reduced, and the chip power consumption is avoided, but also the power consumption value of the self-checking task is greatly reduced under the condition that the self-checking task can be completed, thereby comprehensively improving the self-checking power consumption saving effect of the chip.

[0173] The technical features of the above embodiments can be combined arbitrarily. To make the description concise, all possible combinations of the technical features in the above embodiments are not described, however, as long as the combinations of the technical features do not exist contradictory, they should be considered as the scope of the present application.

[0174] The above specific embodiments further illustrate the purpose, technical scheme and beneficial effects of the present application. It should be understood that the above description is only for specific embodiments of the present application, and is not used to limit the protection scope of the present application. It is particularly pointed out that any modification, equivalent replacement, improvement, etc. made by those skilled in the art within the spirit and principle of the present application should be included in the protection scope of the present application.

Claims

1. A chip self-test method under low power consumption conditions, characterized in that, include: Real-time acquisition of chip operating power consumption; When the operating power consumption is lower than a preset threshold, obtain the current operating status of the chip and the chip self-test task; Each sub-self-test task is obtained based on the chip self-test task; Perform the current chip self-test based on the current operating status and chip self-test task; After completing the current chip self-test, the new operating status and remaining chip self-test tasks are obtained, and the chip self-test process continues based on the new operating status and remaining chip self-test tasks until all sub-self-test tasks are completed.

2. The chip self-test method under low power consumption conditions as described in claim 1, characterized in that, The process of performing the current chip self-test based on the current operating status and chip self-test task includes: Based on the current operating state, obtain the current chip power consumption information and the current operating process; Based on the chip self-test task, the self-test process of each sub-self-test task is obtained to obtain the self-test process of each sub-self-test task. Based on each self-test process, query the average power consumption information corresponding to each self-test process in the historical self-test database. Based on the average power consumption information, current chip power consumption information, and current running process corresponding to each self-test process, the current self-test process is selected in each self-test process; Perform the current chip self-test based on the current self-test process.

3. The chip self-test method under low power consumption conditions as described in claim 2, characterized in that, The step of obtaining the current chip power consumption information and the current operating process based on the current operating state includes: Based on the current operating state, obtain the chip's current power consumption value and current running task; Based on the currently running task, obtain the current running process; Based on the current operating process, query the historical database for the average unit power consumption value and the average running time of the current operating process; The average unit power consumption value is adjusted based on the current power consumption value to obtain the current average unit power consumption value; Based on the current average unit power consumption value and the average runtime, the current chip power consumption information is obtained.

4. The chip self-test method under low power consumption conditions as described in claim 2, characterized in that, The self-test process for obtaining each sub-self-test task based on the chip self-test task includes: Each self-test target is obtained based on the chip self-test task; each self-test target corresponds one-to-one with each sub-self-test task. Based on their respective inspection objectives, each sub-self-inspection task's workflow is queried in the self-inspection database. Obtain the average power consumption of each task process; For each sub-self-test task, among the various task flows corresponding to the sub-self-test task, the task flow with the lowest average task power consumption is selected as the self-test flow of the sub-self-test task.

5. The chip self-test method under low power consumption conditions as described in claim 4, characterized in that, The step of querying the average power consumption information corresponding to each self-test process in the historical self-test database based on the self-test process includes: For each self-test process, retrieve the historical self-test logs, historical self-test power consumption, and historical self-test duration of each self-test log from the historical self-test database. Based on the historical self-inspection duration of each historical self-inspection log, the average self-inspection duration of the self-inspection process is calculated. Based on the historical self-test power consumption of each historical self-test log, the average self-test power consumption of the self-test process is calculated. The average self-test duration and average self-test power consumption are used as the average power consumption information corresponding to the self-test process.

6. The chip self-test method under low power consumption conditions as described in claim 2, characterized in that, The process of filtering the current self-test process based on the average power consumption information, current chip power consumption information, and current running process corresponding to each self-test process includes: Get the process content of the currently running process; Extract the operational process features corresponding to the process content; Based on their respective inspection processes, the self-inspection process content of each inspection process is obtained to obtain the content of each inspection process. Extract the self-inspection process features corresponding to the content of each self-inspection process to obtain the self-inspection process features corresponding to each self-inspection process; Calculate the similarity between each operational process feature and each self-inspection process feature; In each self-inspection process feature, the self-inspection process features with a similarity greater than the similarity threshold are selected as candidate features; In each self-inspection process, the self-inspection process corresponding to the candidate feature is used as the candidate self-inspection process; Based on the current power consumption information and the average power consumption information corresponding to each candidate self-test process, calculate the power consumption deviation value between each candidate self-test process and the current running process. The candidate self-test process with the largest power consumption deviation is selected as the current self-test process.

7. The chip self-test method under low power consumption conditions as described in claim 6, characterized in that, After completing the current chip self-test and before obtaining the new operating status and remaining chip self-test tasks, the process also includes: Record the running log information of the current process; Get the content of the current self-test process; Based on the operation log information and the current self-check process content, obtain the remaining self-check process content of the current self-check process; The current self-check process, which includes the remaining self-check process content, will be used as the new self-check process. Based on the new self-check process, new sub-self-check tasks are generated; Update each sub-self-check task based on the new sub-self-check task.

8. A chip self-test system under low power consumption conditions, characterized in that, include: Power consumption acquisition module, data acquisition module, and chip self-test module; The power consumption acquisition module is used to acquire the chip's operating power consumption in real time. The data acquisition module is used to acquire the current operating status of the chip and the chip self-test task when the operating power consumption is lower than a preset threshold; and to obtain each sub-self-test task based on the chip self-test task. The chip self-test module is used to perform the current chip self-test process based on the current operating status and chip self-test task; The chip self-test module is also used to obtain the new operating status and remaining chip self-test tasks after completing the current chip self-test process, and continue to perform chip self-test processing based on the new operating status and remaining chip self-test tasks until all sub-self-test tasks are completed.

9. A terminal device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the steps of the chip self-test method under low power conditions as described in any one of claims 1 to 7.

10. A storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the steps of the chip self-test method under low power conditions as described in any one of claims 1 to 7.

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