Fault injection simulation processing method, device and equipment for automotive chip

Abstract

The application provides a fault injection simulation processing method, device and equipment for a vehicle chip. The method comprises the following steps: determining a target fault point on a chip; injecting a fault signal at the target fault point in a fault injection simulation process for the chip; and obtaining simulation data of each observation point on the chip in the fault injection simulation process. The simulation data and simulation reference data of fault-free simulation are compared, the target fault point on the target chip is classified, the simulation is monitored, the fault classification of the fault point is completed, a large amount of simulation time is saved in large-scale random fault injection simulation, and the development of the chip and the convergence speed of safety indicators are accelerated.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of chip design, and in particular to a fault injection simulation processing method and device for automotive chip, equipment and medium. BACKGROUND

[0002] In the past few decades, the application of semiconductor products in automobiles has been expanding, especially with the rapid development of new energy vehicles, automotive electronics has become one of the fastest growing sub-markets. According to statistics, the number of chips required for traditional fuel vehicles is between 600-700, and the number of chips for new energy vehicles has increased to more than 1600, and with the continuous landing of popular fields such as intelligent driving, the number of chips on advanced intelligent vehicles is expected to increase to more than 3000. Therefore, unlike traditional commercial chips, the industry standard requirements and development process of automotive-grade chips are also becoming more and more perfect.

[0003] Before automotive-grade chips are put into production and finally sold to users, they need to be verified first, just like commercial chips, that the chip functions are completely correct, and on this basis, automotive-grade chip engineers also need to design special mechanisms for functional safety and corresponding verification, that is, functional safety verification of automotive-grade chips.

[0004] When semiconductor developers develop chips, they use fault injection at the simulation level to evaluate safety mechanisms. Compared with traditional post-silicon fault injection or fault injection at the FPGA (field programmable gate array) level, a large amount of time is needed to simulate fault models in specific hardware, and safety evaluation is often performed after the chip is completed, which greatly increases the evaluation cost. Therefore, simulation-level fault injection has become the most popular fault injection method in the industry.

[0005] For simulation-level fault injection technology, early chip engineers used to construct incorrect test cases in test cases, manually inject faults at each fault node based on the original functional verification platform, and other ways to perform simulation-level functional safety verification.

[0006] For the functional safety verification link, how to quickly converge safety indicators and complete functional safety simulation has always been the most concerned problem in the industry. For a medium or large SOC (system on chip), the fault space, that is, the nodes that may fail in the circuit, often exceeds hundreds of thousands, and in order to completely classify all these nodes, the number of fault injection simulations required is also tens of thousands to hundreds of thousands of times. Such large-scale fault simulation requires a large amount of time in the chip development process, often consuming time in months, which greatly slows down the development speed and process of automotive-grade chips.

[0007] SUMMARY

[0008] To solve the problems in the prior art, the application provides a fault injection simulation processing method, device, equipment and medium for a vehicle chip.

[0009] The application provides a fault injection simulation processing method for a vehicle chip, comprising:

[0010] determining a target fault point on a chip, injecting a fault signal at the target fault point in a fault injection simulation process for the chip, and obtaining simulation data of each observation point on the chip in the fault injection simulation process;

[0011] comparing the simulation data with simulation reference data to obtain a comparison result, wherein the simulation reference data represents simulation data of each observation point on a target chip in a fault-free injection simulation process;

[0012] based on the comparison result, classifying the target fault point on the target chip.

[0013] According to the fault injection simulation processing method for a vehicle chip provided by the application, the method further comprises: before the fault injection simulation process for the chip, dividing a fault simulation time for the target chip into multiple time slices, and at the end of each time slice, comparing simulation data of each observation point on the chip in the fault simulation injection process with simulation reference data to obtain a comparison result.

[0014] According to the fault injection simulation processing method for a vehicle chip provided by the application, the simulation data includes signal values, and correspondingly, comparing the simulation data with simulation reference data to obtain a comparison result comprises:

[0015] comparing the signal values of each observation point with reference signal values of the corresponding observation points in the simulation reference data to determine a consistency result between the signal values and the reference signal values, and taking the consistency result as the comparison result.

[0016] According to the fault injection simulation processing method for a vehicle chip provided by the application, based on the comparison result, classifying the target fault point on the target chip comprises:

[0017] creating a list containing the states of all fault points, and setting the initial state of each fault point in the list as fault unclassified;

[0018] if the consistency result is signal inconsistency, updating the state of the corresponding target fault point in the list from fault unclassified to the matched classification type;

[0019] If the consistency result is signal consistent, the state of the corresponding target fault point in the list is kept as fault unclassified.

[0020] According to the fault injection simulation processing method for the automotive-grade chip, after the target fault point on the target chip is classified, the method further comprises:

[0021] When the time slice determined to end is not the last time slice, and the state of the target fault point on the target chip is updated from fault unclassified to detected fault, the fault injection simulation process of the chip is ended, and the target fault point is recorded for skipping the fault classification process of the target fault point in the fault injection simulation process again;

[0022] After the fault injection simulation process is determined to end, if there is a target fault point whose state is kept as fault unclassified, and the fault injection simulation times of the target fault point do not reach the preset times, the fault classification process of the target fault point of the target chip is executed again.

[0023] According to the fault injection simulation processing method for the automotive-grade chip, the method further comprises:

[0024] A timer is set, if the fault injection simulation time exceeds the configured maximum time, it is determined that the chip appears fault and causes deadlock or system failure, and then the fault injection simulation process is forcibly ended, and the state of the corresponding target fault point in the list is updated as exiting due to timeout.

[0025] According to the fault injection simulation processing method for the automotive-grade chip, the method further comprises:

[0026] An XML configuration file is read and parsed to obtain defined fault points and observation points;

[0027] Based on the extracted fault points and observation points, a verilog module is generated in the form of a function dumpvars into the verilog system, and the verilog module comprises a module name and a port, and each observation point defines a corresponding signal.

[0028] The Verilog module is called for fault-free injection simulation to obtain simulation data of each observation point on the target chip in the fault-free injection simulation process.

[0029] The application further provides a fault injection simulation processing device for the automotive-grade chip, comprising:

[0030] The simulation module is configured to determine a target fault point on the chip, inject a fault signal at the target fault point in a fault injection simulation process for the chip, and obtain simulation data of each observation point on the chip in the fault injection simulation process.

[0031] The comparison module is configured to compare the simulation data with simulation reference data to obtain a comparison result, wherein the simulation reference data represents simulation data of each observation point on the target chip in a fault-free injection simulation process.

[0032] The classification module is configured to classify the target fault point on the target chip based on the comparison result.

[0033] The present application also provides an electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements any of the above-mentioned fault injection simulation processing methods for a chip for vehicle regulations when executing the program.

[0034] The present application also provides a non-transitory computer-readable storage medium having a computer program stored thereon, wherein the computer program is executable by a processor to implement any of the above-mentioned fault injection simulation processing methods for a chip for vehicle regulations.

[0035] The present application also provides a computer program product comprising a computer program, wherein the computer program is executable by a processor to implement any of the above-mentioned fault injection simulation processing methods for a chip for vehicle regulations.

[0036] The present application provides a fault injection simulation processing method, device, equipment and medium for a chip for vehicle regulations, which determines a target fault point on the chip, injects a fault signal at the target fault point in a fault injection simulation process for the chip, obtains simulation data of each observation point on the chip in the fault injection simulation process, compares the simulation data with simulation reference data of a fault-free injection simulation process, classifies the target fault point on the target chip, realizes monitoring while simulating, classifies the fault point, saves a large amount of simulation time in large-scale random fault injection simulation, and accelerates the development of the chip and the convergence speed of safety indicators. BRIEF DESCRIPTION OF DRAWINGS

[0037] In order to more clearly illustrate the technical solutions in the present application or prior art, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings in the following description are some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained without creative labor.

[0038] Figure 1A flowchart of a fault injection simulation processing method for a chip for vehicle regulations provided by the application is shown.

[0039] Figure 2 A structural diagram of a fault injection simulation processing device for a chip for vehicle regulations provided by the application is shown.

[0040] Figure 3 A structural diagram of an electronic device provided by the application is shown. DETAILED DESCRIPTION

[0041] To make the objectives, technical solutions and advantages of the application clearer, the technical solutions in the application will be described clearly and completely below with reference to the drawings in the application. Obviously, the described embodiments are some of the embodiments of the application, rather than all the embodiments. Based on the embodiments in the application, all other embodiments obtained by those skilled in the art without creative efforts belong to the protection scope of the application.

[0042] The fault injection simulation processing method, device, equipment and medium for a chip for vehicle regulations provided by the application will be described below. Figures 1-3

[0043] Figure 1 A flowchart of a fault injection simulation processing method for a chip for vehicle regulations provided by the application is shown. Referring to FIG. 1, the method comprises the following steps. Figure 1

[0044] Step 11, determining a target fault point on the chip. In the fault injection simulation process for the chip, a fault signal is injected at the target fault point, and simulation data of each observation point on the chip in the fault injection simulation process is obtained.

[0045] Step 12, comparing the simulation data with simulation reference data to obtain a comparison result, wherein the simulation reference data represents simulation data of each observation point on the target chip in a fault-free injection simulation process.

[0046] Step 13, classifying the target fault point on the target chip based on the comparison result.

[0047] For the above steps 11-13, it needs to be explained that in the application, before mass production, the chip needs to be verified for safety functions to exclude faults. The chip may find many faults, and different faults occur at different fault points in the structure of the chip. Therefore, for different faults, fault injection simulation needs to be performed. The fault injection simulation of the application needs to inject a fault signal at a certain fault point, and then collect the signal generated at the observation point on the chip for monitoring the fault event. The collected signal is used as the simulation data in the fault injection simulation process.​​

[0048] In the present application, the collected simulation data and simulation reference data are compared to obtain a comparison result, wherein the simulation reference data represent simulation data of each observation point on the target chip in the fault-free injection simulation process. The present application uses the callback mechanism provided by the VPI interface to perform real-time synchronous comparison between the simulation data monitored in real time during the entire fault injection simulation time and the simulation data of the fault-free injection simulation, realizes monitoring during simulation, determines whether the fault point is faulty, completes fault classification of the fault point, and saves a large amount of simulation time in large-scale random fault injection simulation, thereby accelerating the development of the chip and the convergence speed of the safety index.

[0049] In a further method of the above method, mainly before the fault injection simulation process for the chip, the fault injection simulation time for the target chip is divided into multiple time slices, and at the end of each time slice, the simulation data of each observation point on the chip in the fault injection simulation process and the simulation reference data are compared to obtain a comparison result.

[0050] It should be noted that in order to terminate the simulation process in time after the fault point is monitored to be faulty during the fault injection simulation process, and quickly enter the fault injection simulation process of the next fault point, the fault injection simulation time for the target chip is divided into multiple time slices, and at the end of each time slice, the simulation data and the simulation reference data are compared in time to obtain a comparison result.

[0051] Based on the setting requirements of the user, when it is determined that the end time slice is not the last time slice, and the state of the target fault point on the target chip is updated from fault unclassified to the classification type of the matched fault, the fault injection simulation process of the chip is ended in time, and the target fault point is recorded for skipping the fault classification process of the target fault point in the next fault injection simulation process.

[0052] For the fault injection simulation process with a set time slice, synchronous comparison is still needed in the simulation data comparison process. The present application uses the callback mechanism provided by the VPI interface to perform real-time synchronous comparison between the simulation data monitored in real time during the entire fault injection simulation time and the simulation data of the fault-free injection simulation, realizes monitoring during simulation, and determines whether the fault point is faulty in time once the comparison result does not meet the preset condition, and completes fault classification of the fault point.

[0053] In the present application, the classification type of the fault injection simulation can include: DD—detecting and diagnosing to a fault, DU—detecting but failing to diagnose, UD—failing to detect but successfully diagnosing, and UU—failing to detect and diagnose to a fault.

[0054] To realize the function of real-time synchronization comparison, that is, to monitor whether the fault influence is transmitted to the observation point in real time, it is necessary to realize the synchronization intervention in the external function during the fault injection simulation process. In order to keep synchronization, the callback function feature is used in the algorithm. The callback function mechanism of VPI mainly includes the following kinds:

[0055]

[0056] Based on the flexible callback mechanism, the corresponding callback function is written and registered, the simulation data of the observation point saved in the previous fault injection simulation process is obtained in VPI, the handle is registered, the cbValueChange callback constant is set, the event calling is ensured when the signal of the observation point changes each time, the signal value change event is recorded in the event queue, and the change of the signal of the observation point in each time slice is recorded.

[0057] It should be further explained that when it is determined that the fault injection simulation process is ended, if the state of the target fault point continues to remain in the fault unclassified, and the fault injection simulation times of the target fault point do not reach the preset times, the fault classification process of the target fault point of the target chip is executed again. That is to say, it cannot be simply considered that the fault point is not prone to failure after the fault injection simulation process is successful. It is also necessary to simulate multiple times to determine whether the fault point that may fail belongs to a relatively safe position.

[0058] Further explanation and description can be made as follows. A timer can be set. If the fault injection simulation time exceeds the configured maximum time, it is determined that the chip appears fault and causes deadlock or system failure, at this time, the fault injection simulation process is forcibly ended, and the state of the corresponding target fault point in the list is updated to be quit due to timeout. That is to say, when the fault injection simulation process fails to stop at the end, it can be determined that the chip has a whole problem, the fault injection simulation process needs to be forcibly ended, and a special type of state classification of the fault point is divided, that is, quit due to timeout.

[0059] In the further method of the above method, the processing process of comparing the simulation data with the simulation reference data to obtain the comparison result is explained and described as follows.

[0060] The signal value of each observation point is compared with the reference signal value of the corresponding observation point in the simulation reference data to determine the consistency result between the signal value and the reference signal value; and the consistency result is taken as the comparison result.

[0061] It should be noted that the simulation information collected by the observation point can be displayed in the form of a waveform, and then the signal values represented on the waveform in the two simulation processes are compared to determine whether there is consistency. The waveform here can be displayed in the form of a potential signal, such as a high level of 1 and a low level of 0. Then, the consistency is determined, and the value of the fault injection signal is 1. When the value of the signal after fault injection is 0, it indicates inconsistency.

[0062] Further, based on the comparison result, the target fault point on the target chip is classified, including:

[0063] A list containing the state of all fault points is created, and the initial state of each fault point in the list is set to fault unclassified;

[0064] If the consistency result is that the signal is inconsistent, the state of the corresponding target fault point in the list is updated from fault unclassified to the matched classification type;

[0065] If the consistency result is that the signal is consistent, the state of the corresponding target fault point in the list remains fault unclassified.

[0066] In the further method of the above method, the acquisition of the simulation data in the fault-free injection simulation process also needs to be explained and described as follows:

[0067] Read and parse the XML configuration file to obtain the defined fault points and observation points;

[0068] Based on the extracted fault points and observation points, a verilog module is generated in the form of a function dumpvars in the verilog system, and the verilog module includes the name and port of the module, and the corresponding signal defined by each observation point;

[0069] Call the Verilog module for fault-free injection simulation to obtain the simulation data of each observation point on the target chip in the fault-free injection simulation process.

[0070] In this way, the user-specified observation point is converted into the form of the Verilog system function dumpvars and packaged into a module, which can be automatically attached to the simulation process to obtain the fault-free simulation waveform.

[0071] The present application supports batch random fault injection simulation. When fault injection simulation is performed on a large number of fault points, a hierarchical structure is used to store the fault classification report of each fault point, a script is provided to automatically analyze the result.xml result under each path based on the hierarchy, and the results are merged to calculate the diagnostic coverage rate index of the final fault injection simulation.

[0072] The application provides a fault injection simulation processing method for a vehicle regulation chip.

[0073] The fault injection simulation processing device for a vehicle regulation chip provided by the application is described below, and the fault injection simulation processing device for a vehicle regulation chip described below can be correspondingly referred to the fault injection simulation processing method for a vehicle regulation chip described above.

[0074] Figure 2 A structure schematic diagram of a fault injection simulation processing device for a vehicle regulation chip provided by the application is shown, referring to Figure 2 The device comprises a simulation module 21, a comparison module 22 and a classification module 23, wherein:

[0075] The simulation module 21 is used for determining a target fault point on a chip, injecting a fault signal at the target fault point in a fault injection simulation process for the chip, and obtaining simulation data of each observation point on the chip in the fault injection simulation process.

[0076] The comparison module 22 is used for comparing the simulation data with simulation reference data to obtain a comparison result, wherein the simulation reference data represents simulation data of each observation point on the target chip in a fault-free injection simulation process.

[0077] The classification module 23 is used for classifying the target fault point on the target chip based on the comparison result.

[0078] In further devices of the above device, the simulation module is further used for:

[0079] Before the fault simulation process for the chip, the fault injection simulation time for the target chip is divided into a plurality of time slices, and at the end of each time slice, the simulation data of each observation point on the chip in the fault injection simulation process and the simulation reference data are compared to obtain a comparison result.

[0080] In further devices of the above device, the simulation data comprises a signal value, and the comparison module is specifically used for:

[0081] The signal value of each observation point is compared with the reference signal value of the corresponding observation point in the simulation reference data to determine a consistency result between the signal value and the reference signal value; and the consistency result is taken as the comparison result.

[0082] In further devices of the above devices, the classification module is specifically configured to:

[0083] create a list containing states of all fault points, and set an initial state of each fault point in the list as unclassified fault;

[0084] if the consistency result is inconsistent signals, update the state of the corresponding target fault point in the list from unclassified fault to the matched classification type;

[0085] if the consistency result is consistent signals, keep the state of the corresponding target fault point in the list as unclassified fault.

[0086] In further devices of the above devices, the classification module is further configured to:

[0087] after the fault classification of the target fault point on the target chip is completed, when the time slice determined to end is not the last time slice, and the state of the target fault point on the target chip is updated from unclassified fault to detected fault, end the fault injection simulation process of the chip, and record the target fault point, which is used to skip the fault classification process of the target fault point in the next fault injection simulation process;

[0088] after the fault injection simulation process is determined to end, if the state of the target fault point remains unclassified fault, and the fault injection simulation times of the target fault point do not reach a preset number, execute the fault classification process of the target fault point of the target chip again.

[0089] In further devices of the above devices, the classification module is further configured to:

[0090] set a timer, if the fault injection simulation time exceeds a configured maximum time, determine that the chip has a fault leading to deadlock or system failure, and forcibly end the fault injection simulation process, so that the state of the corresponding target fault point in the list is updated to quit due to timeout.

[0091] In further devices of the above devices, the device further includes a configuration module configured to:

[0092] read and parse an XML configuration file to obtain defined fault points and observation points;

[0093] Based on the extracted fault points and observation points, they are generated in the Verilog system and packaged into Verilog modules in the form of the function dumpvars. The Verilog modules include the module name and port, and the corresponding signals defined for each observation point.

[0094] The Verilog module is called to perform faultless injection simulation and obtain simulation data of each observation point on the target chip during the faultless injection simulation process.

[0095] This invention provides a fault injection simulation processing device for automotive-grade chips. By identifying the target fault point on the chip, a fault signal is injected into the target fault point during the fault injection simulation process. Simulation data of each observation point on the chip during the fault injection simulation process is acquired, and the simulation data is compared with the simulation reference data of the fault-free injection simulation process to complete the fault classification of the target fault point on the target chip. This enables simultaneous simulation and monitoring, and completes the fault classification of the fault point. In large-scale random fault injection simulation, it can save a lot of simulation time and accelerate the chip development and the convergence speed of safety indicators.

[0096] Figure 3 An example is a schematic diagram of the physical structure of an electronic device, such as... Figure 3 As shown, the electronic device may include a processor 31, a communication interface 32, a memory 33, and a communication bus 34. The processor 31, communication interface 32, and memory 33 communicate with each other via the communication bus 34. The processor 31 can call logic instructions in the memory 33 to execute a fault injection simulation processing method for automotive-grade chips. This method includes: determining a target fault point on the chip; injecting a fault signal into the target fault point during a fault injection simulation process; acquiring simulation data at each observation point on the chip during the fault injection simulation process; comparing the simulation data with simulation reference data to obtain a comparison result, where the simulation reference data represents the simulation data at each observation point on the target chip during a fault-free injection simulation process; and classifying the target fault point on the target chip based on the comparison result.

[0097] In addition, the logic instructions in the memory 33 described above can be implemented in the form of a software function unit and sold or used as an independent product, and can be stored in a computer readable storage medium. Based on such understanding, the technical solutions of the present application essentially or the part that contributes to the prior art or part of the technical solutions can be embodied in the form of a software product. The computer software product is stored in a storage medium, and includes a plurality of instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the method described in various embodiments of the present application. The aforementioned storage medium includes: a U disk, a mobile hard disk, a read-only memory (ROM, Read-Only Memory), a random access memory (RAM, Random Access Memory), a magnetic disk or an optical disk, and various media that can store program codes.

[0098] In another aspect, the present application also provides a computer program product, which comprises a computer program, the computer program can be stored on a non-transitory computer readable storage medium, and the computer program is executed by a processor, so that the computer can execute the fault injection simulation processing method for a chip for vehicle regulation provided by the above-mentioned methods. The method comprises: determining a target fault point on the chip, injecting a fault signal at the target fault point in a fault injection simulation process for the chip, and obtaining simulation data of each observation point on the chip in the fault injection simulation process. The simulation data and simulation reference data are compared to obtain a comparison result, wherein the simulation reference data represents the simulation data of each observation point on the target chip in a fault-free injection simulation process. Based on the comparison result, the target fault point on the target chip is classified according to the fault.

[0099] In another aspect, the present application also provides a non-transitory computer readable storage medium, which stores a computer program, and the computer program is executed by a processor to implement the fault injection simulation processing method for a chip for vehicle regulation provided by the above-mentioned methods. The method comprises: determining a target fault point on the chip, injecting a fault signal at the target fault point in a fault injection simulation process for the chip, and obtaining simulation data of each observation point on the chip in the fault injection simulation process. The simulation data and simulation reference data are compared to obtain a comparison result, wherein the simulation reference data represents the simulation data of each observation point on the target chip in a fault-free injection simulation process. Based on the comparison result, the target fault point on the target chip is classified according to the fault.

[0100] The device embodiments described above are merely illustrative, wherein the units described as separate components can or can not be physically separate, and the components displayed as units can or can not be physical units, i.e., can be located in one place, or can be distributed to multiple network units. Part or all of the modules can be selected to achieve the purposes of the embodiments according to actual needs. Those skilled in the art can understand and implement without creative labor.

[0101] Through the description of the above embodiments, those skilled in the art can clearly understand that the embodiments can be realized by means of software and the necessary general hardware platform, and of course can also be realized by hardware. Based on such understanding, the above technical solutions can be embodied in the form of a software product, which can be stored in a computer readable storage medium, such as a ROM / RAM, a magnetic disk, an optical disk, etc., and includes a number of instructions to make a computer device (which can be a personal computer, a server, or a network device, etc.) execute the methods described in each embodiment or some parts of the embodiments.

[0102] Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: it can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacement for part of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A fault injection simulation processing method for automotive-grade chips, characterized in that, include: Identify the target fault point on the chip, inject a fault signal into the target fault point during the fault injection simulation process for the chip, and obtain the simulation data of each observation point on the chip during the fault injection simulation process. The simulation data and simulation reference data are compared to obtain the comparison results, wherein the simulation reference data represents the simulation data of each observation point on the target chip during the fault-free injection simulation process; Based on the comparison results, the target fault points on the target chip are classified into fault categories. The method further includes: before the fault injection simulation process for the chip, dividing the fault simulation time for the target chip into multiple time slices; at the end of each time slice, comparing the simulation data and simulation reference data of each observation point on the chip during the fault injection simulation process to obtain the comparison results; based on the VPI callback mechanism, writing and registering the corresponding callback function, obtaining the handle of the simulation data of the observation points saved in the previous fault-free injection simulation process in VPI and registering it, setting it using the cbValueChange callback constant, and performing an event call each time the signal of the observation point changes, recording the event of the signal value change in the event queue, and recording the changes of the observation point signal in each time slice; After classifying the target fault points on the target chip, the method further includes: When it is determined that the end time slice is not the last time slice, and the status of the target fault point on the target chip is updated from unclassified fault to detected fault, the fault injection simulation process of the chip is ended, and the target fault point is recorded for use in skipping the fault classification process of the target fault point in the next fault injection simulation process. If, after the fault injection simulation process is completed, the state of the target fault point remains unclassified and the number of fault injection simulations for the target fault point has not reached the preset number, then the fault classification process for the target fault point of the target chip will be executed again.

2. The fault injection simulation processing method for automotive-grade chips according to claim 1, characterized in that, The simulation data includes signal values. Accordingly, the simulation data and simulation reference data are compared to obtain comparison results, including: The signal values ​​at each observation point are compared with the reference signal values ​​at the corresponding observation points in the simulation reference data to determine the consistency result between the signal values ​​and the reference signal values; the consistency result is used as the comparison result.

3. The fault injection simulation processing method for automotive-grade chips according to claim 2, characterized in that, Based on the comparison results, the target fault points on the target chip are classified into fault categories, including: Create a list containing the states of all fault points, with the initial state of each fault point in the list set to "Fault Uncategorized". If the consistency result is that the signals are inconsistent, then the status of the corresponding target fault point in the list is updated from unclassified fault to the matched classification type. If the consistency result is signal consistency, then the state of the corresponding target fault point in the list remains unclassified as fault.

4. The fault injection simulation processing method for automotive-grade chips according to claim 3, characterized in that, The method further includes: Set a timer. If the fault injection simulation time exceeds the configured maximum time, and it is determined that the chip has failed, resulting in deadlock or system failure, then forcibly terminate the fault injection simulation process, and update the status of the corresponding target fault point in the list to exit due to timeout.

5. The fault injection simulation processing method for automotive-grade chips according to claim 1, characterized in that, The method further includes: Read and parse the XML configuration file to obtain the defined fault points and observation points; Based on the extracted fault points and observation points, they are generated in the Verilog system and packaged into Verilog modules in the form of the function dumpvars. The Verilog modules include the module name and port, and the corresponding signals defined for each observation point. The Verilog module is called to perform faultless injection simulation and obtain simulation data of each observation point on the target chip during the faultless injection simulation process.

6. A fault injection simulation processing apparatus for automotive-grade chips based on the fault injection simulation processing method for automotive-grade chips according to any one of claims 1-5, characterized in that, include: The simulation module is used to determine the target fault point on the chip, inject a fault signal into the target fault point during the fault injection simulation process for the chip, and obtain simulation data of each observation point on the chip during the fault injection simulation process. The comparison module is used to compare the simulation data and the simulation reference data to obtain the comparison result, wherein the simulation reference data represents the simulation data of each observation point on the target chip during the fault-free injection simulation process; The classification module is used to classify the target fault points on the target chip based on the comparison results.

7. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the fault injection simulation processing method for automotive-grade chips as described in any one of claims 1-5.

8. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the fault injection simulation processing method for automotive-grade chips as described in any one of claims 1-5.

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