A structural detection method for nanocrystalline products

Abstract

The present application relates to a structure detection process for nanocrystalline products, the process comprising: step 1, initializing a developer sheet; step 2, placing the nanocrystalline product on a support table, covering the initialized developer sheet on the nanocrystalline product and gently pressing it, ensuring that there are no bubbles or gaps between the two; step 3, turning on a light source to enhance the contrast of the developed image; step 4, observing the developed image of the developer sheet; step 5, judging whether the nanocrystalline product has structural defects. The present application has the effect of improving the accuracy of the structure detection of nanocrystalline products.

Description

Technical Field

[0001] The present application relates to the technical field of structure detection, and in particular to a structure detection method for nanocrystalline products. Background Art

[0002] With the rapid development of nanotechnology, nanocrystalline products have been widely used in electronics, optics and other fields due to their unique physical and chemical properties. However, various structural defects are prone to occur during the production and processing of these products, which directly affect product quality and performance. Although traditional detection methods have met basic needs to a certain extent, they still have many limitations when dealing with products with complex structures, especially under the requirements of high precision and high efficiency, the existing detection methods are particularly insufficient.

[0003] Currently, the commonly used methods for testing nanocrystalline products are visual inspection and thickness measurement. Visual inspection uses the naked eye to observe the appearance of the product to determine whether there are obvious defects, but this method is greatly affected by human factors and it is difficult to accurately identify the situation where it is blocked by packaging materials. Thickness measurement inspection measures the thickness change of the product to infer whether the internal structure is intact, but since nanocrystalline products are usually wrapped in a matte black film, the thickness measurement results are inaccurate and the operation is cumbersome.

[0004] Existing structural detection methods for nanocrystalline products generally have problems of low detection efficiency and poor accuracy. Summary of the invention

[0005] In order to improve the accuracy of structure detection of nanocrystalline products, the present application provides a structure detection method for nanocrystalline products.

[0006] The above-mentioned invention objective of the present application is achieved through the following technical solutions:

[0007] Step 1, initialize the video display;

[0008] Step 2: Place the nanocrystal product on the support table, cover the initialized developer film on the nanocrystal product and press gently to ensure there are no bubbles or gaps between the two.

[0009] Step 3, turning on the light source to enhance the contrast of the developed image;

[0010] Step 4, observing the developed image of the developing film;

[0011] Step 5: Determine whether the nanocrystalline product has structural defects.

[0012] By adopting the above technical solution, the detection of the nanocrystalline product structure wrapped by the matte black film is realized, avoiding the defect that the traditional detection method cannot visually detect the nanocrystalline product structure wrapped by the matte black film, improving the detection speed and accuracy, and being particularly suitable for the quality control link of large-scale production. In addition, by using low-cost developing films and simple equipment configuration, the detection cost is greatly reduced, allowing enterprises to more flexibly respond to the needs of different production scales.

[0013] In a preferred example, the present application can be further configured as follows: a fixing device is provided on the support table for fixing the developer sheet and placing the nanocrystalline product to be tested flatly.

[0014] By adopting the above technical solution, the fixing device set on the support table can ensure that the developer sheet and the flat nanocrystalline product remain stable during the detection process, preventing detection errors caused by movement or sliding. The design of the fixing device not only improves the accuracy and reliability of the detection, but also simplifies the operation process, making the detection process more convenient and efficient.

[0015] In a preferred example, the present application can be further configured as follows:

[0016] Display videos, including:

[0017] The developer sheet is divided into three layers, the outer layers on both sides are transparent protective layers, and the middle layer is a functional layer containing magnetic particles;

[0018] The functional layer is composed of a number of closely arranged functional units, each functional unit is exactly the same in shape and size, and the number of magnetic particles in each functional unit is the same.

[0019] By adopting the above technical solution, the three-layer structure design of the developer sheet not only effectively protects the magnetic particles in the functional layer from the influence of the external environment, but also ensures the clarity and stability of the image. The existence of the transparent protective layer allows the operator to directly observe the image of the nanocrystalline product without any interference. At the same time, this structural design also extends the service life of the developer sheet and reduces the cost of frequent replacement.

[0020] In a preferred example, the present application can be further configured as follows: the magnetic particles in the functional layer are distributed on the same side of the corresponding functional units in the initialization state, and no image is displayed on the display film.

[0021] By adopting the above technical solution, the magnetic particles are distributed in the functional layer on the same side of the corresponding functional units in the initialization state, ensuring that no image is displayed on the developer film, thereby avoiding interference signals in the non-detection state and improving the reliability and accuracy of the detection results.

[0022] In a preferred example, the present application can be further configured as follows: the magnetic particles are ferrite or other particles with high magnetic permeability.

[0023] By adopting the above technical solution, the magnetic particles in the developing film are made of ferrite or other particles with high magnetic permeability, which can quickly respond and gather into a clear image under weak magnetic field conditions, significantly improving the detection sensitivity and accuracy. Such highly sensitive magnetic particles can not only effectively detect the fine structural defects of nanocrystalline products wrapped in matte black film, but also reduce the detection time and operation difficulty, further improving the detection efficiency.

[0024] In a preferred example, the present application can be further configured as: initialization, specifically including: calibrating the magnetic particles in the developer sheet so that the magnetic particles in the functional layer are restored to a state of being distributed on the same side of the corresponding functional unit.

[0025] By adopting the above technical solution, it is ensured that the magnetic particles in the developer film are distributed on the same side of the corresponding functional units before detection, thereby eliminating the detection error caused by uneven initial state and improving the reliability and consistency of the detection results.

[0026] In a preferred example, the present application can be further configured to: determine whether the nanocrystalline product has structural defects, specifically including:

[0027] Take a qualified nanocrystal product, perform steps 1, 2, 3 and 4, and obtain a normal image;

[0028] In the case where the developed image is consistent with the normal image shape, the nanocrystalline product has no structural defects;

[0029] In the case where the developed image is inconsistent with the normal image shape, the nanocrystalline product has structural defects.

[0030] By adopting the above technical solution, it is possible to accurately determine whether a nanocrystalline product has structural defects. Specifically, by testing a qualified nanocrystalline product, its normal image is obtained as a reference standard. Then the developed image of the nanocrystalline product to be tested is compared with it. If the shapes of the two are consistent, it indicates that the nanocrystalline product has no structural defects; conversely, if the developed image is inconsistent with the normal image shape, it indicates that the nanocrystalline product has structural defects. This method based on image comparison not only improves the accuracy and reliability of detection, but also simplifies the operation process and reduces the influence of human factors.

[0031] In a preferred example, the present application may be further configured as follows: after determining whether the nanocrystalline product has structural defects, the following steps may be further included:

[0032] In the case of structural defects in nanocrystalline products, the nanocrystalline products are judged as unqualified products, and the specific location and type of defects are recorded;

[0033] In the case that the nanocrystalline product has no structural defects, the nanocrystalline product is judged to be a qualified product.

[0034] By adopting the above technical solution, it is possible to accurately determine that a nanocrystalline product is an unqualified product when structural defects are detected in the nanocrystalline product, and record the specific location and type of the defects in detail, thereby ensuring the pertinence and effectiveness of subsequent processing; at the same time, when the test results show that the nanocrystalline product has no structural defects, the nanocrystalline product is determined to be a qualified product, thereby ensuring the quality and production efficiency of the nanocrystalline product.

[0035] In summary, the present application includes at least one of the following beneficial technical effects:

[0036] 1. By using the film display method, the defect of the traditional detection method that the nanocrystalline product structure wrapped in matte black film cannot be visually detected is avoided, and the accuracy and efficiency of nanocrystalline product detection are improved;

[0037] 2. The display film can clearly display the structural image of the nanocrystalline product, avoiding the human error in traditional visual inspection and thickness measurement inspection, and ensuring the reliability of the inspection results;

[0038] 3. Compared with expensive advanced detection methods such as X-ray imaging, this application uses a developing film with magnetic materials for detection, which has high accuracy and greatly reduces the cost of nanocrystalline product structure detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Figure 1 It is a flow chart of a method for detecting nanocrystalline materials in one embodiment of the present application.

[0040] Figure 2 It is a schematic diagram of a display film in a method for detecting nanocrystalline materials in one embodiment of the present application.

[0041] Figure 3 It is a flow chart for implementing step S50 in the nanocrystalline material detection method in one embodiment of the present application.

[0042] Figure 4 This is a diagram showing the development effect of a developer film in a method for detecting nanocrystalline materials in one embodiment of the present application.

[0043] Figure 5 It is an implementation flow chart after step S50 in the nanocrystalline material detection method in one embodiment of the present application.

[0044] Among them, 1. developer film; 11. transparent protective layer; 12. functional layer. DETAILED DESCRIPTION

[0045] The present application is further described in detail below in conjunction with the accompanying drawings.

[0046] In one embodiment, if Figure 1 As shown, the present application discloses a method for detecting nanocrystalline materials, which specifically includes the following steps:

[0047] S10: Initialize the display film 1.

[0048] Specifically, use a magnet strip to scrape the developer film 1 from bottom to top, and observe whether the image on the developer film 1 is blank. If it has completely disappeared, the developer film 1 is initialized successfully. If the image is not blank, repeat the above steps of scraping the developer film 1 with a magnet strip until the image becomes completely blank.

[0049] S20: Place the nanocrystal product on the support table, cover the initialized developer sheet 1 on the nanocrystal product and press gently to ensure that there are no bubbles or gaps between the two.

[0050] Specifically, the nanocrystal product is placed between the support table and the developer sheet 1 , and the developer sheet 1 is gently pressed to make the nanocrystal product fit closely to the developer sheet 1 , ensuring that there is no gap or bubble between the two, so as to reduce the impact on the developed image on the developer sheet 1 .

[0051] S30: Turn on the light source to enhance the contrast of the developed image.

[0052] Specifically, an external light source, such as an LED light, is turned on to enhance the contrast of the image displayed on the developer sheet 1 , making it easier to observe the developed image on the developer sheet 1 .

[0053] S40: Observe the developed image of the developing film 1.

[0054] Specifically, the developed image on the developer sheet 1 is observed and compared with the image of a normal nanocrystal product to determine whether the inspected nanocrystal product has structural defects.

[0055] S50: Determine whether the nanocrystalline product has structural defects.

[0056] Specifically, whether the structure of the nanocrystal product has defects is determined based on the comparison between the developed image on the developer sheet 1 and the normal image.

[0057] In one embodiment, the support table is provided with a fixing device for fixing the developer sheet 1 and placing the nanocrystalline product to be tested flatly.

[0058] Specifically, the support table is mainly made of silicone, which can avoid scratching the developer film 1 and the nanocrystalline product. A fixing device for fixing the developer film 1, such as a suction cup or a clip, is provided on the support table. At the same time, the support table can make the nanocrystalline product and the developer film 1 fit more closely without crushing the nanocrystalline material and the developer film 1.

[0059] In one embodiment, the display sheet 1 specifically includes:

[0060] The developer sheet 1 is divided into three layers, the outer layers on both sides are transparent protective layers 11, and the middle layer is a functional layer 12 containing magnetic particles;

[0061] The functional layer 12 is composed of a plurality of closely arranged functional units, each of which has the same shape and size, and contains the same number of magnetic particles.

[0062] Specifically, the developer sheet 1 is composed of three layers, such as Figure 2 As shown, the two outer layers are transparent protective layers 11, which are made of highly light-transmitting materials such as PET (polyethylene terephthalate) or PC (polycarbonate). The middle layer is a functional layer 12 that plays a practical role. The functional layer 12 is composed of a large number of closely arranged functional units. Each functional unit has the same shape and size and contains an equal amount of magnetic particles, so that it can be quickly developed when it comes into contact with the nanocrystalline product, and the magnetic particles can be distributed on the same side of the corresponding functional unit during initialization.

[0063] In one embodiment, the magnetic particles in the functional layer 12 are distributed on the same side of the corresponding functional units in the initialization state, and no image is displayed on the developing sheet 1 .

[0064] Specifically, after initialization, the magnetic particles in the functional layer 12 are distributed on the same side of their respective functional units. For example, when the magnet strip is swept from bottom to top during initialization, the magnetic particles are distributed on the upper side of their respective functional units. At this time, no special image is displayed on the developer sheet 1, but regularly distributed dots.

[0065] In one embodiment, the magnetic particles are ferrite or other particles with high magnetic permeability.

[0066] Specifically, the magnetic particles are ferrite or other particles with high magnetic permeability, such as Fe3O4, CoFe2O4, etc. These particles can respond and aggregate quickly under the action of a weak magnetic field to form a clear image.

[0067] In one embodiment, initialization specifically includes:

[0068] The magnetic particles in the developer sheet 1 are calibrated so that the magnetic particles in the functional layer 12 are restored to a state of being distributed on the same side of the corresponding functional units.

[0069] Specifically, use a magnet bar to scrape the developer film 1 from bottom to top. The magnetic particles will follow the magnet bar to move to each one. Observe whether the image on the developer film 1 is blank. If it has completely disappeared, the developer film 1 is initialized successfully. If the image is not blank, repeat the step of scraping the developer film 1 with the magnet bar until the image becomes completely blank.

[0070] In one embodiment, if Figure 3 As shown, in S50, it is determined whether the nanocrystalline product has structural defects, which specifically includes:

[0071] S51: Take a qualified nanocrystal product, and execute step 1, step 2, step 3 and step 4 to obtain a normal image.

[0072] Specifically, a piece of qualified nanocrystalline product is taken, and the preceding steps 1, 2, 3 and 4 are performed, that is, the development operation using the developer sheet 1 is performed. Figure 4 As shown, what appears on the developer sheet 1 is a normal image of a qualified product.

[0073] S52: When the developed image is consistent with the normal image shape, the nanocrystalline product has no structural defects.

[0074] Specifically, the development image displayed in the test is compared with the normal effect determined in advance, and the two are consistent, indicating that there are no defects in the structure of the nanocrystalline product.

[0075] S53: When the developed image is inconsistent with the normal image shape, the nanocrystalline product has structural defects.

[0076] Specifically, the development image displayed in the test is compared with the normal effect determined in advance. If the two are inconsistent, it means that the nanocrystalline product has structural defects.

[0077] In one embodiment, if Figure 5 As shown, after S50, that is, after determining whether the nanocrystalline product has structural defects, the following steps are also included:

[0078] S60: In the case where the nanocrystalline product has structural defects, the nanocrystalline product is determined to be an unqualified product, and the specific location and type of the defect are recorded.

[0079] Specifically, if the nanocrystalline product has structural defects, it means that the nanocrystalline product cannot be put on the market and is judged as an unqualified product. The specific location and type of the defects are recorded to facilitate subsequent analysis and summary of the causes of the defects.

[0080] S70: When the nanocrystalline product has no structural defects, the nanocrystalline product is determined to be a qualified product.

[0081] Specifically, if the nanocrystal product has no structural defects, it means that the nanocrystal product can be put on the market and judged as a qualified product. Subsequent packaging and other operations can be carried out, and then the structural testing of the next nanocrystal product can be continued.

[0082] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0083] The above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application.

Claims

1. A method for detecting the structure of a nanocrystalline product, characterized in that: The following steps are involved: Step 1, initializing the display film (1); The developer sheet (1) is divided into three layers, the outer layers on both sides are transparent protective layers (11), and the middle layer is a functional layer (12) containing magnetic particles, the magnetic particles are ferrite or other particles with high magnetic permeability, the functional layer (12) is composed of a number of closely arranged functional units, each functional unit has the same shape and size, and the number of magnetic particles in each functional unit is the same, the magnetic particles in the functional layer (12) are distributed on the same side of the corresponding functional unit in the initialized state, and no image is displayed on the developer sheet (1); The initialization specifically includes: calibrating the magnetic particles in the developer sheet (1) so that the magnetic particles in the functional layer (12) are restored to a state where they are distributed on the same side of the corresponding functional unit; Step 2, placing the nanocrystal product on a support table, wherein the support table is provided with a fixing device for fixing the developer sheet (1) and placing the nanocrystal product to be tested flatly, and covering the initialized developer sheet (1) on the nanocrystal product and gently pressing to ensure that there are no bubbles or gaps between the two; Step 3, turning on the light source to enhance the contrast of the developed image; Step 4, observing the developed image on the developing sheet (1); Step 5, determining whether the nanocrystalline product has structural defects; The step five comprises: taking the qualified nanocrystalline product, performing the steps one, two, three and four, and obtaining a normal image; In the case where the developed image is consistent with the normal image in shape, the nanocrystalline product has no structural defects; In the case where the developed image is inconsistent with the normal image shape, the nanocrystalline product has structural defects.

2. The method for detecting the structure of a nanocrystalline product according to claim 1, characterized in that: After determining whether the nanocrystalline product has structural defects, the method further includes: if the nanocrystalline product has structural defects, determining the nanocrystalline product as an unqualified product, and recording the specific location and type of the structural defects; if the nanocrystalline product does not have structural defects, determining the nanocrystalline product as a qualified product.

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