Hot plug test fixture

Abstract

The application belongs to the technical field of electrical switch detection, and discloses a hot plug test tool, which comprises a machine table, a guide mechanism, a lifting table, a first positioning mechanism, a second positioning mechanism and a detection module. The guide mechanism is arranged on the machine table. The lifting table is connected to the guide mechanism and is lifted along the guide mechanism. The first positioning mechanism is arranged on the machine table, and a test plug is positioned on the first positioning mechanism. The second positioning mechanism is connected to the lifting table, and a switch to be tested is positioned on the second positioning mechanism. The distance and the relative angle between the first positioning mechanism and the second positioning mechanism are adjustable. The switch to be tested and the test plug can be plugged or separated. The detection module is arranged on the second positioning mechanism and is electrically connected to the test plug. The detection module can detect the voltage, the current, the resistance of the switch to be tested and the pulling force and the pressure that the switch to be tested is subjected to during plugging and unplugging. The hot plug test tool can improve the positioning accuracy of the test interface and the switch to be tested, avoid mechanical damage during plugging and unplugging, and improve the precision of the test result.

Description

Technical Field

[0001] This invention relates to the field of electrical switch testing technology, and in particular to a hot-swap testing fixture. Background Technology

[0002] With the rapid development of power electronics technology, low-voltage intelligent switches, as key components in electrical systems, are crucial for the safe operation of the entire system due to their stability and reliability. In practical applications of intelligent switches, hot-swapping is a common maintenance or replacement method. The resulting changes in electrical parameters and mechanical stress pose significant challenges to the switch's durability, safety, and overall performance.

[0003] Traditional hot-swap testing devices have the following limitations: First, the positioning accuracy of existing hot-swap testing devices for the test interface and the switch under test needs improvement. They cannot accurately capture the minute changes in electrical parameters and complex mechanical stress distributions during hot-swap operations. This lack of accuracy may lead to biased test results, failing to accurately reflect the true performance of the test switch. Furthermore, insufficient positioning accuracy of both the test interface and the test switch can cause mechanical damage during insertion and removal.

[0004] Therefore, there is an urgent need for a hot-swap testing fixture to solve the above problems. Summary of the Invention

[0005] The purpose of this invention is to provide a hot-swap testing fixture that can improve the positioning accuracy of the test interface and the switch under test, avoid mechanical damage to both during insertion and removal, and improve the accuracy of the test results, thereby enhancing the authenticity of the performance of the test switch reflected by the test results.

[0006] To achieve this objective, the present invention adopts the following technical solution:

[0007] Hot-swap test fixture, including:

[0008] A machine base and a guiding mechanism, wherein the guiding mechanism is disposed on the machine base;

[0009] A lifting platform, connected to the guide mechanism, is capable of moving up and down along the guide mechanism;

[0010] A first positioning mechanism is provided on the machine base, and the test connector can be positioned at the first positioning mechanism;

[0011] The second positioning mechanism is connected to the lifting platform. The switch under test can be positioned in the second positioning mechanism. The distance and relative angle between the first positioning mechanism and the second positioning mechanism are adjustable. The switch under test and the test connector can be plugged in or separated.

[0012] A detection module is mounted on the second positioning mechanism and electrically connected to the test connector. The detection module can detect the voltage, current and resistance of the switch under test, as well as the tension and pressure experienced by the switch under test during insertion and removal.

[0013] As a preferred embodiment of the hot-swap testing fixture provided by the present invention, the hot-swap testing fixture further includes a top seat and a telescopic drive mechanism, wherein the top seat is spaced above the machine base, and the guide mechanism is disposed between the top seat and the machine base;

[0014] The telescopic drive mechanism is located on the top seat and connected to the lifting platform, and can drive the lifting platform to move along the guide mechanism.

[0015] As a preferred embodiment of the hot-swap testing fixture provided by the present invention, the hot-swap testing fixture further includes an angle adjustment mechanism. The angle adjustment mechanism includes a first receiving seat and a first rotation drive device. The first receiving seat is fixedly connected to the side of the machine platform facing the second positioning mechanism. The first rotation drive device is disposed within the first receiving seat and partially extends out of the first receiving seat, connected to the first positioning mechanism. The first rotation drive device can drive the first positioning mechanism to rotate, thereby adjusting the relative angle between the switch under test and the test connector; and / or,

[0016] The angle adjustment mechanism includes a second receiving seat and a second rotation drive device. The second receiving seat is fixed to the side of the lifting platform facing the first positioning mechanism. The second rotation drive device is disposed inside the second receiving seat and partially extends out of the second receiving seat, and is connected to the second positioning mechanism. The second rotation drive device can drive the second positioning mechanism to rotate, so as to adjust the relative angle between the switch under test and the test connector.

[0017] As a preferred embodiment of the hot-swap testing fixture provided by the present invention, the hot-swap testing fixture further includes a control module, which is communicatively connected to the detection module. The control module is capable of recording the voltage, current and resistance of the switch under test, as well as the tension and pressure experienced by the switch under test during insertion and removal.

[0018] The second positioning mechanism is equipped with a displacement sensor, which can detect the position information of the switch under test and the test connector during the insertion and removal process;

[0019] The displacement sensor is communicatively connected to the control module, and the control module can adjust the relative distance and relative angle between the first positioning mechanism and the second positioning mechanism according to the position information.

[0020] As a preferred embodiment of the hot-swap testing fixture provided by the present invention, the first positioning mechanism includes a first support platform and a plurality of first fastening plates. The first support platform is disposed on the machine base, and the plurality of first fastening plates are disposed on the first support platform to form a first clamping space. The test connector is positioned in the first clamping space.

[0021] The second positioning mechanism includes a second support platform and multiple second fastening plates. The second support platform is connected to the lifting platform, and the multiple second fastening plates are disposed on the side of the second support platform away from the lifting platform to form a second clamping space. The switch to be tested is positioned in the second clamping space.

[0022] As a preferred embodiment of the hot-swap testing fixture provided by the present invention, the first positioning mechanism further includes a plurality of first adjustment components, each of which corresponds to and is connected to the first fastening plate and is disposed on the first support platform. The first adjustment components can adjust the position of the first fastening plate relative to the first support platform.

[0023] The second positioning mechanism further includes a plurality of second adjustment components, which are connected to the second fastening plate and disposed on the second support platform. The second adjustment components can adjust the position of the second fastening plate relative to the second support platform.

[0024] As a preferred embodiment of the hot-swap testing fixture provided by the present invention, the first support platform is provided with a first guide groove, and a portion of the first fastening plate can extend into the first guide groove and move along the first guide groove.

[0025] The second support platform has a second guide groove, and a portion of the second fastening plate can extend into the second guide groove and move along the second guide groove.

[0026] As a preferred embodiment of the hot-swap testing fixture provided by the present invention, a first elastic element and a first buffer pad are provided on the side of the first fastening plate facing the first clamping space. The first elastic element is connected to the first fastening plate, and the first buffer pad is connected to the end of the first elastic element away from the first fastening plate.

[0027] The second fastening plate is provided with a second elastic element and a second buffer pad on the side facing the second clamping space. The second elastic element is connected to the second fastening plate, and the second buffer pad is connected to the end of the second elastic element away from the second fastening plate.

[0028] As a preferred embodiment of the hot-swap testing fixture provided by the present invention, the test connector includes a power line and a data line. The distance between the end of the power line and the socket of the test connector is smaller than the distance between the end of the data line and the socket of the test connector. When the test connector is plugged into the switch under test, the connection between the power line and the switch under test is prior to the connection between the data line and the switch under test.

[0029] As a preferred embodiment of the hot-swap testing fixture provided by the present invention, the hot-swap testing fixture further includes a protective cover, which is disposed on the machine base, and the guide mechanism, the lifting platform, the first positioning mechanism and the second positioning mechanism are all disposed inside the protective cover;

[0030] The protective cover has a door that can be movably installed at its opening, and the door can open or close the opening of the protective cover.

[0031] The protective cover is equipped with a cooling fan, which is connected to the internal space and the external space of the protective cover;

[0032] A temperature sensor is installed inside the protective cover, and the temperature sensor is able to detect the temperature of the internal space of the protective cover.

[0033] A humidity sensor is installed inside the protective cover, which can detect the humidity of the internal space of the protective cover.

[0034] The beneficial effects of this invention are:

[0035] The hot-swap testing fixture provided by this invention includes a machine base, a guide mechanism, a lifting platform, a first positioning mechanism, a second positioning mechanism, and a testing module. The guide mechanism is disposed on the machine base; the lifting platform is connected to the guide mechanism and can move up and down along it; the first positioning mechanism is disposed on the machine base, and the test connector can be positioned within it; the second positioning mechanism is connected to the lifting platform, and the switch under test can be positioned within it. The distance and relative angle between the first and second positioning mechanisms are adjustable; the switch under test and the test connector can be inserted or separated. The first and second positioning mechanisms reliably position the test connector and the switch under test. The guide mechanism provides a guiding function for the second positioning mechanism, ensuring it can move up and down along a preset path, thereby ensuring the accuracy of the insertion and connection of the switch under test and the test connector, avoiding mechanical damage during insertion and removal, and improving the accuracy of the test results. The detection module is mounted on the second positioning mechanism and electrically connected to the test connector. This module can detect the voltage, current, and resistance of the switch under test (SUTP), as well as the tension and pressure experienced by the SUTP during insertion and removal. Through this detection module, multiple performance indicators of the SUTP can be tested, improving the efficiency of the SUTP testing and enhancing the accuracy of the test results in reflecting the switch's performance. Attached Figure Description

[0036] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments of the present invention will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the content of the embodiments of the present invention and these drawings without creative effort.

[0037] Figure 1 This is a partial structural schematic diagram of the hot-swap testing fixture provided in an embodiment of the present invention;

[0038] Figure 2 This is a front view of a portion of the structure of the hot-swap testing fixture provided in this embodiment of the invention. Figure 1 ;

[0039] Figure 3 This is a front view of a portion of the structure of the hot-swap testing fixture provided in this embodiment of the invention. Figure 2 ;

[0040] Figure 4 This is a schematic diagram of the structure of the first positioning mechanism provided in an embodiment of the present invention;

[0041] Figure 5 This is a longitudinal sectional view of the first positioning mechanism provided in an embodiment of the present invention;

[0042] Figure 6 This is a schematic diagram of the structure of the test connector provided in an embodiment of the present invention;

[0043] Figure 7 This is a schematic diagram of the overall structure of the hot-swap testing fixture provided in an embodiment of the present invention;

[0044] Figure 8 This is a front view of a portion of the structure of the hot-swap testing fixture provided in this embodiment of the invention. Figure 3 .

[0045] In the picture:

[0046] 100. Test connector; 110. Power cord; 120. Data cable;

[0047] 200. Switch under test;

[0048] 1. Machine base; 2. Guiding mechanism; 3. Lifting platform;

[0049] 4. First positioning mechanism; 41. First support platform; 411. First guide groove; 42. First fastening plate; 421. First elastic element; 422. First buffer pad; 43. First adjusting assembly; 431. First positioning plate; 432. First adjusting rod; 433. First fastening cap;

[0050] 5. Second positioning mechanism; 51. Second support platform; 52. Second fastening plate; 53. Second adjusting assembly; 531. Second positioning plate; 532. Second adjusting rod; 533. Second fastening cap;

[0051] 6. Detection module; 7. Top mount; 8. Telescopic drive mechanism;

[0052] 9. Angle adjustment mechanism; 91. First receiving seat; 92. First rotation drive device; 93. Second receiving seat; 94. Second rotation drive device;

[0053] 10. Control module; 11. Displacement sensor; 12. Protective cover; 13. Door body; 14. Cooling fan; 15. Temperature sensor; 16. Humidity sensor. Detailed Implementation

[0054] The technical solution of the present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0055] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. The components of the embodiments of the present invention described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0056] Therefore, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the invention without inventive effort are within the scope of protection of the invention.

[0057] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0058] In the description of this invention, it should be noted that the terms "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the product of this invention is in use. They are used only for the convenience of describing the invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the invention. Furthermore, the terms "first," "second," and "third," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance. In the description of this invention, unless otherwise stated, "a plurality of" means two or more.

[0059] In the description of this invention, it should also be noted that, unless otherwise explicitly specified and limited, the terms "set," "connect," and "fix" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0060] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0061] In this embodiment, the term "and / or" is merely a description of the relationship between associated objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. Additionally, in this invention, the character " / " generally indicates that the preceding and following associated objects have an "or" relationship.

[0062] Embodiments of the present invention are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and should not be construed as limiting the present invention.

[0063] Figure 1 This diagram shows a partial structural schematic of the hot-swap testing fixture provided in an embodiment of the present invention. Figure 2 This image shows a front view of a portion of the structure of the hot-swap testing fixture provided in an embodiment of the present invention. Figure 1 , Figure 3 This image shows a front view of a portion of the structure of the hot-swap testing fixture provided in an embodiment of the present invention. Figure 2 . Reference Figures 1-3 This embodiment provides a hot-swap testing fixture. The hot-swap testing fixture includes a machine base 1, a guide mechanism 2, a lifting platform 3, a first positioning mechanism 4, a second positioning mechanism 5, and a testing module 6.

[0064] Specifically, the guide mechanism 2 is mounted on the machine base 1; the lifting platform 3 is connected to the guide mechanism 2 and can move up and down along the guide mechanism 2. The first positioning mechanism 4 is mounted on the machine base 1, and the test connector 100 can be positioned on the first positioning mechanism 4. The second positioning mechanism 5 is connected to the lifting platform 3, and the switch under test 200 can be positioned on the second positioning mechanism 5. The distance and relative angle between the first positioning mechanism 4 and the second positioning mechanism 5 are adjustable; the switch under test 200 and the test connector 100 can be inserted or separated. Through the first positioning mechanism 4 and the second positioning mechanism 5, the test connector 100 and the switch under test 200 can be reliably positioned. Through the guide mechanism 2, the second positioning mechanism 5 can be guided, ensuring that it can move up and down along a preset route, thereby ensuring the accuracy of the insertion and connection of the switch under test 200 and the test connector 100, avoiding mechanical damage to both during insertion and removal, and thus improving the accuracy of the test results.

[0065] More specifically, the detection module 6 is mounted on the second positioning mechanism 5 and electrically connected to the test connector 100. The detection module 6 can detect the voltage, current, and resistance of the switch under test 200, as well as the pulling and compressing forces experienced by the switch under test 200 during insertion and removal. Through the detection module 6, multiple performance indicators of the switch under test 200 can be detected, improving the efficiency of the detection and enhancing the accuracy of the performance of the switch under test reflected in the test results.

[0066] More specifically, the hot-swap testing fixture also includes a top seat 7 and a telescopic drive mechanism 8. The top seat 7 is spaced above the machine base 1, and the guide mechanism 2 is disposed between the top seat 7 and the machine base 1. In this embodiment, the guide mechanism 2 specifically consists of four guide posts arranged in a rectangular array. The four guide posts are respectively inserted at the four apex corners of the lifting platform 3. The telescopic drive mechanism 8 is disposed on the top seat 7 and connected to the lifting platform 3, and can drive the lifting platform 3 to move along the guide mechanism 2. In this embodiment, the telescopic drive mechanism 8 can specifically be an electric push rod from the prior art.

[0067] More specifically, the hot-swap testing fixture also includes an angle adjustment mechanism 9. The angle adjustment mechanism 9 includes a first receiving seat 91 and a first rotation drive device 92. The first receiving seat 91 is fixed to the side of the machine base 1 facing the second positioning mechanism 5. The first rotation drive device 92 is disposed in the first receiving seat 91 and partially extends out of the first receiving seat 91, and is connected to the first positioning mechanism 4. The first rotation drive device 92 can drive the first positioning mechanism 4 to rotate, so as to adjust the relative angle between the switch under test 200 and the test connector 100.

[0068] Similarly, the angle adjustment mechanism 9 includes a second receiving seat 93 and a second rotation drive device 94. The second receiving seat 93 is fixed to the side of the lifting platform 3 facing the first positioning mechanism 4. The second rotation drive device 94 is disposed in the second receiving seat 93 and partially extends out of the second receiving seat 93, and is connected to the second positioning mechanism 5. The second rotation drive device 94 can drive the second positioning mechanism 5 to rotate, so as to adjust the relative angle between the switch under test 200 and the test connector 100.

[0069] In this embodiment, both the first positioning mechanism 4 and the second positioning mechanism 5 are capable of rotation. In other embodiments, only the first receiving seat 91 and the first rotation drive device 92 may be provided to realize the rotation of the first positioning mechanism 4, or only the second receiving seat 93 and the second rotation drive device 94 may be provided to realize the rotation of the second positioning mechanism 5.

[0070] Figure 4 This diagram shows a structural schematic of the first positioning mechanism provided in an embodiment of the present invention. Figure 5 A longitudinal sectional view of the first positioning mechanism provided in an embodiment of the present invention is shown. (Refer to...) Figures 2-5 The first positioning mechanism 4 includes a first support platform 41 and a plurality of first fastening plates 42. The first support platform 41 is disposed on the machine base 1, and the plurality of first fastening plates 42 are disposed on the first support platform 41 to form a first clamping space, in which the test connector 100 is positioned. In this embodiment, there are two first fastening plates 42, which are arranged relatively spaced apart to clamp the switch 200 under test. In other embodiments, there may be four first fastening plates 42 arranged in an array to form the first clamping space.

[0071] Similarly, the second positioning mechanism 5 includes a second support platform 51 and a plurality of second fastening plates 52. The second support platform 51 is connected to the lifting platform 3, and the plurality of second fastening plates 52 are disposed on the side of the second support platform 51 opposite to the lifting platform 3, forming a second clamping space, in which the switch under test 200 is positioned. In this embodiment, there are specifically two second fastening plates 52, which are arranged relatively spaced apart to clamp the test connector 100. In other embodiments, there may be four second fastening plates 52 arranged in an array to form a second clamping space.

[0072] Specifically, the first positioning mechanism 4 further includes a plurality of first adjustment components 43. Each first adjustment component 43 corresponds to and is connected to the first fastening plate 42, and is disposed on the first support platform 41. The first adjustment components 43 can adjust the position of the first fastening plate 42 relative to the first support platform 41. Through the above configuration, the first positioning mechanism 4 can be adapted to the positioning of various sizes of switches 200 under test.

[0073] Similarly, the second positioning mechanism 5 also includes a plurality of second adjustment components 53, each corresponding to and connected to the second fastening plate 52 and disposed on the second support platform 51. Each second adjustment component 53 can adjust the position of the second fastening plate 52 relative to the second support platform 51. Through the above configuration, the second positioning mechanism 5 can be adapted to the positioning of test connectors 100 of various sizes.

[0074] More specifically, the first support platform 41 is provided with a first guide groove 411, and a portion of the first fastening plate 42 can extend into the first guide groove 411 and move along the first guide groove 411. This arrangement ensures the reliability of the connection between the first fastening plate 42 and the first support platform 41, guides the movement of the first fastening plate 42, and guarantees the accuracy of adjusting the size of the first clamping space and the position of the first fastening plate 42.

[0075] Similarly, the second support platform 51 is provided with a second guide groove, and a portion of the second fastening plate 52 can extend into the second guide groove and move along the second guide groove. Through the above arrangement, the reliability of the connection between the second fastening plate 52 and the second support platform 51 can be guaranteed, and the accuracy of the adjustment of the second clamping space size and the position adjustment of the second fastening plate 52 can be guaranteed.

[0076] More specifically, the first adjustment assembly 43 includes a first positioning plate 431, a first adjusting rod 432, and a first fastening cap 433. The first positioning plate 431 is fixed and vertically mounted on the first support platform 41 and has a first threaded hole. A portion of the first adjusting rod 432 is a first screw section, which is screwed through the first threaded hole. The head end of the first adjusting rod 432 abuts against the side of the first fastening plate 42 facing the first positioning plate 431, and a first smooth section is formed near the head end of the first adjusting rod 432. The first smooth section is rotatably connected to the first fastening plate 42 via a bearing or the like. The first adjusting rod 432 can rotate and move relative to the first positioning plate 431, thereby adjusting the position of the first fastening plate 42. The first fastening cap 433 is detachably screwed onto the side of the first positioning plate 431 that extends away from the first fastening plate 42 and can be tightened to fix the first adjusting rod 432.

[0077] Similarly, the second adjustment assembly 53 includes a second positioning plate 531, a second adjustment rod 532, and a second fastening cap 533. The second positioning plate 531 is fixed and vertically mounted on the second support platform 51 and has a second threaded hole. A portion of the second adjustment rod 532 is a second screw section, which is screwed through the second threaded hole. The head end of the second adjustment rod 532 abuts against the side of the second fastening plate 52 facing the second positioning plate 531, and a second smooth section is formed near the head end of the second adjustment rod 532. The second smooth section is rotatably connected to the second fastening plate 52 via a bearing or the like. The second adjustment rod 532 can rotate and move relative to the second positioning plate 531, thereby adjusting the position of the second fastening plate 52. The second fastening cap 533 is detachably screwed onto the side of the second positioning plate 531 that extends away from the second fastening plate 52 and can be tightened to fix the second adjustment rod 532.

[0078] Reference Figure 5 The first fastening plate 42 has a first elastic element 421 and a first buffer pad 422 disposed on the side facing the first clamping space. The first elastic element 421 is connected to the first fastening plate 42, and the first buffer pad 422 is connected to the end of the first elastic element 421 away from the first fastening plate 42. The first elastic element 421 integrates a damper, which can adjust the vibration frequency and amplitude of the first elastic element 421, allowing it to vibrate smoothly and gradually decay under external force, avoiding excessive vibration and impact. This is crucial for ensuring the stability and accuracy of measurement data. The first elastic element 421 and the first buffer pad 422 act as a buffer, absorbing the impact force and vibration energy generated by the insertion and removal operation, preventing this energy from being directly transmitted to the switch under test 200, thus protecting the switch under test 200 from damage. Simultaneously, the softness and elasticity of the first buffer pad 422 ensure a tight fit with the surface of the switch under test 200, preventing electrical leakage or mechanical damage during testing.

[0079] Similarly, the second fastening plate 52 is provided with a second elastic element and a second buffer pad on the side facing the second clamping space. The second elastic element is connected to the second fastening plate 52, and the second buffer pad is connected to the end of the second elastic element away from the second fastening plate 52. The function and effect of the second elastic element and the second buffer pad are the same as those of the first elastic element 421 and the first buffer pad 422, and will not be described in detail here.

[0080] Reference Figures 1-2 and Figure 7The hot-swap test fixture also includes a control module 10, which is communicatively connected to the detection module 6. The control module 10 can record the voltage, current and resistance of the switch under test 200, as well as the tension and pressure experienced by the switch under test 200 during insertion and removal.

[0081] Specifically, the control module 10 integrates data recording and analysis functions, providing strong data support for the quality control, performance optimization, and fault diagnosis of the switch under test 200, further promoting the intelligence and precision of the test. Furthermore, the control module 10 integrates a display screen, which can display data signals from the detection module 6 and control the actuators such as the telescopic drive mechanism 8, the first rotation drive device 92, and the second rotation drive device 94 according to preset programs or operator instructions, displaying the results on the control module 10's display screen. This allows operators to easily monitor changes in various parameters during the test, ensuring the accuracy and reliability of the test.

[0082] More specifically, the second positioning mechanism 5 is equipped with a displacement sensor 11, which can detect the position information of the switch under test 200 and the test connector 100 during the insertion and removal process. The displacement sensor 11 is communicatively connected to the control module 10, which can adjust the relative distance and relative angle between the first positioning mechanism 4 and the second positioning mechanism 5 according to the position information.

[0083] More specifically, the detection module 6 integrates a tension / compression sensor, a voltage sensor, a current sensor, and a resistance sensor.

[0084] This tension and compression sensor is used to measure the tension and compression forces experienced by the switch under test 200 during insertion and removal. The magnitude and direction of these forces are crucial for evaluating the durability of the switch under test 200, revealing whether it can maintain stable performance over long-term use. Simultaneously, these data also reflect the smoothness of the insertion and removal operation, as well as the mechanical stress that may occur during the process, providing key information for optimized design.

[0085] This voltage sensor can monitor the voltage changes between the test connector 100 and the switch under test 200 in real time. The voltage sensor can promptly detect voltage fluctuations or abnormalities, providing an important early warning mechanism for preventing equipment damage and accidents. Continuous monitoring of voltage changes ensures the safety of the testing process and the reliability of the data.

[0086] This current sensor measures the magnitude and direction of the current passing through the test connector 100. The magnitude and changes in current directly reflect the operating status and load conditions of the electrical equipment. The data provided by the current sensor is of great significance for evaluating the performance of the switch under test 200 under different load conditions, and also provides strong support for subsequent equipment optimization and fault diagnosis.

[0087] This resistance sensor focuses on measuring the resistance value of the test connector 100 and its connection parts. Changes in resistance value are an important indicator for evaluating the contact quality and electrical connection status of the switch under test 200. By monitoring changes in resistance value, it is possible to promptly detect whether the contact of the switch under test 200 is good, whether there are problems such as oxidation or corrosion, and thus conduct a comprehensive assessment of the electrical connection quality of the switch under test 200.

[0088] In other words, the aforementioned detection module 6 provides real-time and accurate monitoring capabilities, helping to ensure that the switch under test 200 maintains stable performance in complex and changing electrical environments. The simultaneous operation of tension / compression sensors, voltage sensors, current sensors, and resistance sensors ensures comprehensiveness and accuracy of the test.

[0089] Figure 6 This diagram illustrates the structure of the test connector provided in an embodiment of the present invention. Figure 6 The test connector 100 includes a power cord 110 and a data cord 120. The distance between the end of the power cord 110 and the socket of the test connector 100 is less than the distance between the end of the data cord 120 and the socket of the test connector 100. When the test connector 100 is connected to the switch under test 200, the connection of the power cord 110 to the switch under test 200 takes precedence over the connection of the data cord 120 to the switch under test 200.

[0090] With the above settings, during the insertion and removal of the test connector 100 and the switch under test 200, the power cable 110 establishes a connection with the switch under test 200 before the data cable 120. This design ensures that the system can quickly reach a stable state when powered on, preparing for the upcoming data transmission. Only after the power cable 110 is stably connected to the switch under test 200 will the data cable 120 contact the switch under test 200 to begin data measurement. This sequence ensures that the device is in a stable powered state before data transmission, thereby improving the accuracy and reliability of the test. When the test is completed and the switch under test 200 needs to be removed, the operation sequence is reversed. The data cable 120 will first disconnect from the switch under test 200, stopping data transmission, and then the power cable 110 will disconnect from the switch under test 200, ensuring that the hardware device has stopped data transmission before the power is disconnected. This operation sequence avoids potential hardware damage caused by data transmission at the moment of power failure.

[0091] Figure 7 This diagram shows the overall structure of the hot-swap testing fixture provided in an embodiment of the present invention. Figure 8 This image shows a front view of a portion of the structure of the hot-swap testing fixture provided in an embodiment of the present invention. Figure 3 . Reference Figure 7 and Figure 8 The hot-swap testing fixture also includes a protective cover 12. The protective cover 12 is mounted on the machine base 1, and the guide mechanism 2, the lifting platform 3, the first positioning mechanism 4, and the second positioning mechanism 5 are all housed within the protective cover 12. The protective cover 12 effectively isolates the testing area from the external environment.

[0092] Preferably, in this embodiment, the protective cover 12 is made of a transparent material, allowing operators to monitor the test situation in real time.

[0093] Specifically, a door 13 is movably provided at the opening of the protective cover 12, and the door 13 can open or close the opening of the protective cover 12. In this embodiment, the door 13 can be closed and opened by pushing and pulling.

[0094] More specifically, the protective cover 12 is equipped with a cooling fan 14, which connects the internal space and the external space of the protective cover 12. The switch under test 200 and the test connector 100 may generate a certain amount of heat due to the passage of current. The cooling fan 14 can effectively accelerate the airflow inside the protective cover 12, remove the heat in time, reduce the internal temperature, and ensure that the equipment operates in a suitable working environment.

[0095] More specifically, a temperature sensor 15 is installed inside the protective cover 12, which can detect the temperature of the internal space of the protective cover 12. A humidity sensor 16 is also installed inside the protective cover 12, which can detect the humidity of the internal space of the protective cover 12. Both the temperature sensor 15 and the humidity sensor 16 are communicatively connected to the control module 10, and can transmit temperature and humidity signals within the test area to the control module 10. This enables real-time monitoring and precise control of the test environment, providing a strong guarantee for the accuracy of test results and the long-term stable operation of the equipment.

[0096] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the implementation of the present invention. Those skilled in the art will be able to make various obvious changes, readjustments, and substitutions without departing from the scope of protection of the present invention. It is neither necessary nor possible to exhaustively describe all embodiments here. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the scope of protection of the claims of the present invention.

Claims

1. A hot-swap test fixture, characterized in that, include: A machine base (1) and a guide mechanism (2), wherein the guide mechanism (2) is disposed on the machine base (1); The lifting platform (3) is connected to the guide mechanism (2) and can move up and down along the guide mechanism (2); The first positioning mechanism (4) is set on the machine base (1), and the test connector (100) can be positioned on the first positioning mechanism (4). The second positioning mechanism (5) is connected to the lifting platform (3). The switch to be tested (200) can be positioned in the second positioning mechanism (5). The distance and relative angle between the first positioning mechanism (4) and the second positioning mechanism (5) are adjustable. The switch to be tested (200) and the test connector (100) can be plugged in or separated. The detection module (6) is disposed on the second positioning mechanism (5) and electrically connected to the test connector (100). The detection module (6) can detect the voltage, current and resistance of the switch under test (200), as well as the tension and pressure of the switch under test (200) during insertion and removal. The hot-swap test fixture also includes a control module (10), which is communicatively connected to the detection module (6). The control module (10) can record the voltage, current and resistance of the switch under test (200), as well as the tension and pressure experienced by the switch under test (200) during insertion and removal. The second positioning mechanism (5) is provided with a displacement sensor (11), which can detect the position information of the switch under test (200) and the test connector (100) during the insertion and removal process; The displacement sensor (11) is communicatively connected to the control module (10), and the control module (10) can adjust the relative distance and relative angle between the first positioning mechanism (4) and the second positioning mechanism (5) according to the position information; The test connector (100) includes a power cord (110) and a data cord (120). The distance between the end of the power cord (110) and the socket of the test connector (100) is smaller than the distance between the end of the data cord (120) and the socket of the test connector (100). When the test connector (100) is connected to the switch under test (200), the connection between the power cord (110) and the switch under test (200) is prior to the connection between the data cord (120) and the switch under test (200).

2. The hot-swap testing fixture according to claim 1, characterized in that, The hot-swap test fixture also includes a top seat (7) and a telescopic drive mechanism (8). The top seat (7) is spaced above the machine base (1), and the guide mechanism (2) is located between the top seat (7) and the machine base (1). The telescopic drive mechanism (8) is located on the top seat (7) and connected to the lifting platform (3), and can drive the lifting platform (3) to move along the guide mechanism (2).

3. The hot-swap testing fixture according to claim 1, characterized in that, The hot-swap testing fixture also includes an angle adjustment mechanism (9), which includes a first receiving seat (91) and a first rotation drive device (92). The first receiving seat (91) is fixed to the side of the machine base (1) facing the second positioning mechanism (5). The first rotation drive device (92) is disposed inside the first receiving seat (91) and partially extends out of the first receiving seat (91), and is connected to the first positioning mechanism (4). The first rotation drive device (92) can drive the first positioning mechanism (4) to rotate to adjust the relative angle between the switch under test (200) and the test connector (100); and / or, The angle adjustment mechanism (9) includes a second receiving seat (93) and a second rotation drive device (94). The second receiving seat (93) is fixed to the side of the lifting platform (3) facing the first positioning mechanism (4). The second rotation drive device (94) is disposed inside the second receiving seat (93) and partially extends out of the second receiving seat (93), and is connected to the second positioning mechanism (5). The second rotation drive device (94) can drive the second positioning mechanism (5) to rotate in order to adjust the relative angle between the switch under test (200) and the test connector (100).

4. The hot-swap testing fixture according to claim 1, characterized in that, The first positioning mechanism (4) includes a first bearing platform (41) and a plurality of first fastening plates (42). The first bearing platform (41) is disposed on the machine base (1), and the plurality of first fastening plates (42) are disposed on the first bearing platform (41) to form a first clamping space. The test connector (100) is positioned in the first clamping space. The second positioning mechanism (5) includes a second bearing platform (51) and a plurality of second fastening plates (52). The second bearing platform (51) is connected to the lifting platform (3). The plurality of second fastening plates (52) are disposed on the side of the second bearing platform (51) away from the lifting platform (3) to form a second clamping space. The switch to be tested (200) is positioned in the second clamping space.

5. The hot-swap testing fixture according to claim 4, characterized in that, The first positioning mechanism (4) further includes a plurality of first adjustment components (43), each of which corresponds to and is connected to the first fastening plate (42) and is disposed on the first support platform (41). The first adjustment components (43) can adjust the position of the first fastening plate (42) relative to the first support platform (41). The second positioning mechanism (5) further includes a plurality of second adjustment components (53), which are connected to the second fastening plate (52) and are disposed on the second support platform (51). The second adjustment components (53) can adjust the position of the second fastening plate (52) relative to the second support platform (51).

6. The hot-swap test fixture according to claim 4, characterized in that, The first support platform (41) is provided with a first guide groove (411), and a part of the first fastening plate (42) can extend into the first guide groove (411) and can move along the first guide groove (411); The second support platform (51) is provided with a second guide groove, and a part of the second fastening plate (52) can extend into the second guide groove and move along the second guide groove.

7. The hot-swap test fixture according to claim 4, characterized in that, The first fastening plate (42) is provided with a first elastic element (421) and a first buffer pad (422) on the side facing the first clamping space. The first elastic element (421) is connected to the first fastening plate (42), and the first buffer pad (422) is connected to the end of the first elastic element (421) away from the first fastening plate (42). The second fastening plate (52) is provided with a second elastic element and a second buffer pad on the side facing the second clamping space. The second elastic element is connected to the second fastening plate (52), and the second buffer pad is connected to the end of the second elastic element away from the second fastening plate (52).

8. The hot-swap test fixture according to any one of claims 1-7, characterized in that, The hot-swap test fixture also includes a protective cover (12), which is disposed on the machine base (1). The guide mechanism (2), the lifting platform (3), the first positioning mechanism (4) and the second positioning mechanism (5) are all disposed inside the protective cover (12). A door (13) is movably provided at the opening of the protective cover (12), and the door (13) can open or close the opening of the protective cover (12). The protective cover (12) is equipped with a heat dissipation fan (14), which is connected to the internal space and the external space of the protective cover (12); A temperature sensor (15) is provided inside the protective cover (12), and the temperature sensor (15) can detect the temperature of the internal space of the protective cover (12); A humidity sensor (16) is installed inside the protective cover (12), and the humidity sensor (16) can detect the humidity of the internal space of the protective cover (12).

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