Radiation inspection system

Abstract

The application provides a radiation inspection system, which comprises a scanning device, the scanning device comprises a radiation device and a detection device, the radiation device and the detection device cooperate with each other to scan a subject, the radiation device is located on one side of the subject and comprises at least two radiation sources, the at least two radiation sources of the radiation device are arranged along a first direction and each comprises at least two sub-light sources arranged at intervals along a second direction, the first direction and the second direction are perpendicular to each other and intersect with the relative arrangement direction of the radiation device and the subject, and in the at least two radiation sources of the radiation device, any two adjacent radiation sources in the first direction partially overlap in the second direction. In this way, the accuracy of the inspection result of the radiation inspection system can be improved.

Description

Technical Field

[0001] This application relates to the field of radiation inspection technology, and in particular to a radiation inspection system. Background Technology

[0002] Radiation inspection systems are widely used in fields such as medical care, security inspection, and customs anti-smuggling. They typically consist of a radiation device and a detection device. The radiation emitted by the radiation device irradiates the object being inspected, and the detection device receives the radiation to generate an image, thus enabling the inspection of the object.

[0003] In practice, it has been found that the accuracy of the inspection results from radiation inspection systems needs to be improved. Summary of the Invention

[0004] One of the technical problems this application aims to solve is to improve the accuracy of the inspection results of radiation inspection systems.

[0005] To address the aforementioned technical problems, this application provides a radiation inspection system, comprising:

[0006] A scanning device includes a radiation device and a detection device, which cooperate to scan an object under inspection. The radiation device is located on one side of the object under inspection and includes at least two radiation sources. The at least two radiation sources of the radiation device are arranged along a first direction and each includes at least two sub-light sources arranged at intervals along a second direction. The first direction and the second direction are perpendicular to each other and intersect with the relative arrangement direction of the radiation device and the object under inspection. Among the at least two radiation sources of the radiation device, any two adjacent radiation sources in the first direction partially overlap in the second direction.

[0007] In some embodiments, two adjacent radiation sources in the first direction overlap in the second direction to form an overlapping region, and a sub-light source is provided in the overlapping region.

[0008] In some embodiments, a pair of sub-light sources collinear in a first direction are provided in the overlapping region.

[0009] In some embodiments, sub-light sources that are collinear in the first direction in the overlapping region do not emit beams simultaneously.

[0010] In some embodiments, the sub-light sources of the radiation device do not emit beams simultaneously.

[0011] In some embodiments, the scanning device is configured as at least one of the following:

[0012] The radiation device includes at least three radiation sources;

[0013] The radiation source includes at least three sub-sources;

[0014] The sub-light source is a pulsed light source.

[0015] In some embodiments, the radiation device is located on one side of the object under test in the vertical direction, with a first direction along the left-right direction and a second direction along the front-back direction; and / or, the radiation device is located on one side of the object under test in the left-right direction, with a first direction along the front-back direction and a second direction along the vertical direction.

[0016] In some embodiments, the detection device includes a backscatter detector, which cooperates with a radiation device to perform a backscatter scan on the object under test; and / or, the detection device includes a transmission detector, which cooperates with a radiation device to perform a transmission scan on the object under test.

[0017] In some embodiments, the radiation inspection system includes at least two scanning devices, with the radiation devices of the at least two scanning devices arranged on different sides of the object being inspected.

[0018] In some embodiments, the radiation inspection system includes at least three scanning devices.

[0019] By constructing the radiation device to include at least two distributed radiation sources arranged along a first direction, and constructing any two adjacent distributed radiation sources along the first direction to partially overlap in a second direction, the scanning range of the radiation device can be effectively expanded, and the risk of missed scans within the scanning range can be effectively reduced, thus effectively improving the accuracy of the inspection results.

[0020] Other features and advantages of this application will become clear from the following detailed description of exemplary embodiments with reference to the accompanying drawings. Attached Figure Description

[0021] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0022] Figure 1 This is a simplified structural diagram of the radiation inspection system in an embodiment of this application.

[0023] Figure 2 This is a simplified structural diagram of the radiation device in the embodiments of this application.

[0024] Figure 3 This is a simplified structural diagram of the collimator in an embodiment of this application.

[0025] Explanation of reference numerals in the attached figures:

[0026] 10. Scanning device;

[0027] 1. Radiation device; 11. Radiation source; 12. Sub-source; 13. Overlapping area;

[0028] 2. Detection device; 21. Backscatter detector;

[0029] 3. Collimator; 31. Collimation port;

[0030] 4. Inspect the passageway;

[0031] 5. The object being inspected;

[0032] X, first direction; Y, second direction; H, up / down direction; W, left / right direction; L, front / back direction. Detailed Implementation

[0033] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. The following description of at least one exemplary embodiment is merely illustrative and is in no way intended to limit this application or its application or use. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.

[0034] Techniques, methods, and equipment known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and equipment should be considered part of the specification.

[0035] In the description of this application, it should be understood that the orientation or positional relationship indicated by directional terms such as "front, back, up, down, left, right", "horizontal, vertical, horizontal" and "top, bottom" is usually based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing this application and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the scope of protection of this application; the directional terms "inner" and "outer" refer to the inner and outer contours relative to the outline of each component itself.

[0036] In the description of this application, it should be understood that the use of terms such as "first" and "second" to define components is merely for the purpose of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore should not be construed as limiting the scope of protection of this application.

[0037] Furthermore, the technical features involved in the different embodiments of this application described below can be combined with each other as long as they do not conflict with each other.

[0038] In practice, it has been found that the limited scanning range of radiation devices is a significant reason for the low accuracy of inspection results. This is because the limited scanning range of radiation devices means that during the inspection of an object using a radiation inspection system, the device can only cover a portion of the object at a time, and cannot completely cover a certain dimension (such as height or width) of the object in one go. This may result in missed scans and inspections, affecting the accuracy of the inspection results. This problem is more pronounced when the object being inspected is large, which makes it difficult for radiation inspection systems to effectively meet the inspection needs of large objects.

[0039] Based on the above findings, this application improves the structure of existing radiation inspection systems and provides a corresponding radiation inspection system.

[0040] Figures 1-3 The structure of the radiation inspection system in this application is illustrated by way of example. It will be understood that... Figures 1-3 This is merely a simplified illustration, and the shapes of the components shown are not intended to be the only limitation.

[0041] See Figures 1-3 In this application, the radiation inspection system includes a scanning device 10, which comprises a radiation device 1 and a detection device 2. The radiation device 1 and the detection device 2 cooperate to scan the object under inspection 5. The radiation device 1 is located on one side of the object under inspection 5 and includes at least two radiation sources 11. The at least two radiation sources 11 of the radiation device 1 are arranged along a first direction X, and each includes at least two sub-light sources 12 arranged at intervals along a second direction Y. Among the at least two radiation sources 11 of the radiation device 1, any two adjacent radiation sources 11 in the first direction X partially overlap in the second direction Y. The first direction X and the second direction Y are perpendicular to each other and intersect (e.g., perpendicular) the relative arrangement direction of the radiation device 1 and the object under inspection 5.

[0042] In the above scheme, the radiation source 11 included in the radiation device 1 is a distributed radiation source, which does not include only one sub-light source 12, but includes at least two sub-light sources 12 arranged at intervals along the second direction Y. In this way, the problem of limited scanning range of a single sub-light source 12 can be effectively solved. Therefore, compared with the case where the radiation source 11 only includes a single sub-light source 12, the scanning range in the second direction Y can be effectively expanded, making it convenient for the radiation device 1 to cover a larger area of ​​a certain dimension (e.g., height or width) of the object under inspection 5 at one time, and reducing the risk of missed scans and missed detections caused by a small scanning range.

[0043] Moreover, in the above scheme, the at least two radiation sources 11 arranged along the first direction X of the radiation device 1 do not completely overlap or completely offset in the second direction Y, but partially overlap in the second direction Y, so that any two adjacent radiation sources 11 in the first direction X are staggered (i.e. partially offset and partially overlapped) in the second direction Y. In this way, the scanning range can be effectively expanded, the risk of missed scans can be reduced, the imaging quality can be improved, and the accuracy of the examination results can be improved.

[0044] When two adjacent radiation sources 11 in the first direction X (hereinafter referred to as two adjacent radiation sources 11) are not separated in the second direction Y and completely overlap, it means that the coverage length of each radiation source 11 in the second direction Y is the same. In this case, the radiation device 1 can only rely on the sub-light source 12 in a single radiation source 11 to expand the scanning range in the second direction Y, and the expansion of the scanning range in the second direction Y is limited.

[0045] When two adjacent radiation sources 11 do not completely overlap in the second direction Y, but are staggered, the downstream radiation source 11 always increases the coverage length in the second direction Y by more than the upstream adjacent radiation source 11 along the direction from one side of the second direction Y to the other. In this case, the radiation device 1 can not only expand the scanning range in the second direction Y by relying on the sub-light source 12 in the single radiation source 11, but also expand the scanning range in the second direction Y by relying on the increased coverage length in the second direction Y of each included radiation source 11 relative to the upstream adjacent radiation source 11. Therefore, the scanning range of the scanning device 1 in the second direction Y can be expanded more effectively, so that the overall scanning range of the scanning device 1 is further increased.

[0046] Furthermore, when two adjacent radiation sources 11 are completely offset in the second direction Y, the distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y is relatively large. Since there are no sub-light sources 12 within the corresponding distance range, the relatively large distance means that the part of the object 5 located in the area between the two cannot be scanned, that is, the risk of missed scanning is high. This may lead to incomplete images, affect the imaging quality, and affect the accuracy of the inspection results. One reason why the distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 is relatively large in the second direction Y when two adjacent radiation sources 11 are completely offset in the second direction Y is that, on the one hand, the two radiation sources 11 that are completely offset in the second direction Y may not be directly connected end to end, but there may be a gap. The corresponding gap will lead to a larger distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y, increasing the risk of missed scans. On the other hand, the two sub-light sources 12 located at both ends of the second direction Y of the radiation source 11 are relatively large in the second direction Y. There is also a certain distance between the two ends of the second direction Y of the radiation source 11, and the corresponding distance is usually larger than the distance between two adjacent sub-light sources 12 of the same radiation source 11. This will also result in a large distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y, which increases the risk of missed scans. Moreover, this means that even if there is no gap between two adjacent radiation sources 11 that are completely staggered in the second direction Y, but are directly connected end to end, there is still a problem that the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 are far apart in the second direction Y, which increases the risk of missed scans.

[0047] By making two adjacent radiation sources 11 not completely offset in the second direction Y, but interleaved, the scanning range can be expanded by utilizing the partial offset of the radiation sources 11 in the second direction Y, and the distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y can be reduced by utilizing the partial overlap of the radiation sources 11 in the second direction Y. This effectively reduces the risk of missed scans, improves imaging quality, and enhances the accuracy of examination results. When two adjacent radiation sources 11 partially overlap in the second direction Y, it can not only solve the problem of high missed scan risk caused by the gap between the ends of two adjacent radiation sources 11 and the large distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y, but also solve the problem of high missed scan risk caused by the large gap between the end sub-light source 12 of the radiation source 11 and the large distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y. Therefore, it can effectively reduce the distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y, effectively reducing the missed scan risk.

[0048] As can be seen, the above solution, by constructing the radiation device 1 to include at least two distributed radiation sources 11 arranged along the first direction X, and by constructing any two adjacent distributed radiation sources 11 of the radiation device 1 along the first direction X to partially overlap in the second direction Y, can not only effectively expand the scanning range of the radiation device 1 and reduce the risk of missed scans and inspections caused by a small scanning range, but also effectively reduce the risk of missed scans within the scanning range of the radiation device 1. In this way, the accuracy of the inspection results can be improved more effectively, better meeting the inspection needs of the inspected object 5, especially large inspected objects, and improving the inspection accuracy of the inspected object 5, especially large inspected objects.

[0049] In this context, the overlapping portion of any two adjacent radiation sources 11 in the first direction X in the second direction Y can be referred to as the overlapping region 13. The overlapping region 13 may or may not contain a sub-light source 12. Compared to the case where there is no sub-light source 12 in the overlapping region 13, the presence of a sub-light source 12 in the overlapping region 13 means that the area of ​​the overlapping region 13 is larger, the overlap range between the two adjacent radiation sources 11 is larger, and the blank area without a sub-light source 12 is smaller. Therefore, it is more conducive to reducing the risk of missed scans, which is beneficial to further improving imaging quality and increasing the accuracy of inspection results.

[0050] As an example of a sub-light source 12 within the overlapping region 13, see Figure 2 In some embodiments, the overlapping region 13 contains a pair of sub-light sources 12 that are collinear in the first direction X. In this case, the overlapping region 13 not only contains sub-light sources 12, but also has one and only one pair of sub-light sources 12 that are collinear in the first direction X. This pair of sub-light sources 12 consists of the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11, which are aligned in the second direction Y with a distance of 0. Since there is no blank area without sub-light sources 12 between the two adjacent radiation sources 11, the risk of missed scans can be reduced more effectively, the imaging quality can be improved, and the accuracy of the inspection results can be increased. Furthermore, since there is only one pair of sub-light sources 12 that are collinear in the first direction X in the overlapping region 13, it means that the other sub-light sources 12 of the two adjacent radiation sources 11 are not aligned in the first direction Y, but are staggered. Thus, compared with the case where there are at least two pairs of sub-light sources 12 that are collinear in the first direction X in the overlapping region 13, the coverage length of the radiation device 1 in the second direction Y is longer and the scanning range is larger. As can be seen, the overlapping area 13 is provided with a pair of sub-light sources 12 that are collinear in the first direction X, which can effectively expand the scanning range of the radiation device 1 in the first direction Y and further reduce the risk of missed scans. Therefore, it is more conducive to improving the accuracy of the inspection results.

[0051] When a pair of sub-light sources 12 collinear in the first direction X are provided in the overlapping area 13, the corresponding collinear sub-light sources 12 can be configured to emit beams at different times. That is, among the two sub-light sources 12 collinear in the first direction X, one sub-light source 12 emits a beam while the other sub-light source 12 does not emit a beam. The two emit beams in a time-sharing (or staggered) manner. In this way, mutual interference between the collinear sub-light sources 12 can be reliably prevented, which helps to reduce the difficulty of control and achieve a smoother inspection process.

[0052] In some embodiments, the sub-light sources 12 of the radiation device 1 do not emit beams simultaneously. This can reliably prevent mutual interference between the sub-light sources 12 of the radiation device 1, further reduce the difficulty of control, and improve the smoothness of the inspection process.

[0053] As an example of the sub-light source 12 in the aforementioned embodiments, the sub-light source 12 is a pulsed light source. Since a pulsed light source is a non-continuous beam emission light source, it is more convenient to control the non-simultaneous beam emission between different sub-light sources 12 when the sub-light source 12 is a pulsed light source.

[0054] In the foregoing embodiments, the number of radiation sources 11 and sub-light sources 12 in the radiation device 1 is not limited and can be two, three or more. When the radiation device 1 includes at least three radiation sources 11 and / or the radiation sources 11 include at least three sub-light sources 12, it is more advantageous to expand the scanning range, improve the inspection accuracy, and also make the radiation inspection system more suitable for large objects to be inspected.

[0055] In the foregoing embodiments, the radiation device 1 of the scanning device 10 can be located on any side of the object under inspection 5, for example, on any side in the vertical direction H or the horizontal direction W.

[0056] See Figure 1 When the radiation device 1 is located on one side of the object under inspection 5 in the vertical direction H, the radiation device 1 performs a top-view or bottom-view scan on the object under inspection 5. The relative arrangement direction of the radiation device 1 and the object under inspection 5 is the vertical direction H. In this case, the first direction X can be tilted along the front-back direction L or relative to the front-back direction L, and the second direction Y can be tilted along the left-right direction W or relative to the left-right direction W. This allows each radiation source 11 of the radiation device 1 to be arranged along the front-back direction L or in a direction tilted relative to the front-back direction L. Each sub-light source 12 in each radiation source 11 is arranged along the left-right direction W and in a direction tilted relative to the left-right direction W. Furthermore, each radiation source 11 partially overlaps with the other in the left-right direction W and in a direction tilted relative to the left-right direction W, allowing for a larger range of scanning in the left-right direction W. This facilitates the corresponding scanning device 10 to quickly and accurately complete the top-view or bottom-view scan of the object under inspection 5. Specifically, when the first direction X and the second direction Y are along the front-back direction L and the left-right direction W respectively, the scanning direction of the radiation device 1 is perpendicular to the relative movement direction of the object under inspection and the radiation inspection system (i.e., the front-back direction L); while when the first direction X and the second direction Y are tilted relative to the front-back direction L and the left-right direction W respectively, the scanning direction of the radiation device 1 forms an angle with the relative movement direction of the object under inspection 5 and the radiation inspection system, and is relatively tilted. The corresponding tilt angle can be adjusted to adapt to the relative movement speed of the object under inspection 5 and the inspection system in the front-back direction L.

[0057] Additionally, see Figure 1When the radiation device 1 is located on one side of the object under inspection 5 in the left-right direction W, the radiation device 1 performs a side-view scan of the object under inspection 5. The relative arrangement direction of the radiation device 1 and the object under inspection 5 is the left-right direction W. In this case, the first direction X can be tilted along the front-back direction L or relative to the front-back direction L, and the second direction Y can be tilted along the up-down direction H or relative to the up-down direction H, so that each radiation source 1 of the radiation device 1 is arranged tilted along the front-back direction L or relative to the front-back direction L, and each sub-light source 12 in each radiation source 11 is arranged tilted along the up-down direction H or relative to the up-down direction H, and each radiation source 11 partially overlaps with each other in the up-down direction H or in the direction tilted relative to the up-down direction H, so as to perform a larger range of scanning in the up-down direction H, which makes it convenient for the corresponding scanning device 10 to quickly and accurately complete the side-view scan of the object under inspection 5. Specifically, when the first direction X and the second direction Y are along the front-back direction L and the up-down direction H respectively, the scanning direction of the radiation device 1 is perpendicular to the relative movement direction of the object under inspection and the radiation inspection system (i.e., the front-back direction L); while when the first direction X and the second direction Y are tilted relative to the front-back direction L and the up-down direction H respectively, the scanning direction of the radiation device 1 forms an angle with the relative movement direction of the object under inspection 5 and the radiation inspection system, and is relatively tilted. The corresponding tilt angle can be adjusted to adapt to the relative movement speed of the object under inspection 5 and the inspection system in the front-back direction L.

[0058] In the foregoing embodiments, the scanning device 10 can perform either backscatter scanning or transmission scanning on the object 5. Specifically, when the scanning device 10 performs backscatter scanning on the object 5, the detection device 2 includes a backscatter detector 21, which works in conjunction with the radiation device 1 to perform backscatter scanning on the object 5. When the scanning device 10 performs backscatter scanning on the object 5, the detection device 2 includes a transmission detector (not shown), which works in conjunction with the radiation device 1 to perform transmission scanning on the object 5. Of course, in some embodiments, the detection device 2 may include both a backscatter detector 21 and a transmission detector, so that the scanning device 10 performs both backscatter and transmission scanning on the object 5, further improving the accuracy of the inspection.

[0059] Furthermore, in the foregoing embodiments, the number of scanning devices 10 in the radiation inspection system is not limited; it can be one, two, three, or more. See also... Figure 1 When the radiation inspection system includes at least two scanning devices 10, the radiation devices 1 of these at least two scanning devices 10 can be arranged on different sides of the object under inspection 5. In this way, the object under inspection 5 can be scanned from at least two perspectives, resulting in a more comprehensive inspection and further improving the accuracy of the inspection.

[0060] Next, combine Figures 1-3 The embodiments shown further illustrate this application.

[0061] like Figure 1 As shown, in this embodiment, the radiation inspection system includes three scanning devices 10, which are respectively arranged at the top, left and right sides of the inspection channel 4 to perform top-view, left-view and right-view detection on the object 5 (e.g., a vehicle) located in the inspection channel 4.

[0062] Depend on Figure 1 As can be seen, in this embodiment, each scanning device 10 includes a radiation device 1, a detection device 2 and a collimator 3, and the detection device 2 and the radiation device 1 are located on the same side of the inspection channel 4, and each includes two backscatter detectors 21 arranged on opposite sides of the radiation device 1, so as to cooperate with the radiation device 1 and the collimator 3 to perform backscatter scanning on the object under inspection 5.

[0063] During operation, the rays emitted by the radiation device 1 are collimated by the collimator 3 and then reflected onto the object 5 located in the inspection channel 4. The reflected rays are received by two backscatter detectors 21 and converted into electrical signals that can be recorded to generate a backscatter image.

[0064] Figure 2 The structure of the radiation device 1 in this embodiment is further illustrated. For example... Figure 2 As shown, in this embodiment, each scanning device 10's radiation device 1 includes two radiation sources 11, which are arranged side by side along the first direction X, and each includes multiple (four in the figure) sub-light sources 12 arranged at intervals along the second direction Y. The two radiation sources 11 of the same radiation device 1 are arranged alternately in the second direction Y to form an overlapping region 13. In the overlapping region 13, there is one and only one pair of sub-light sources 12 that are collinear in the first direction X.

[0065] Specifically, such as Figure 1 and Figure 2 As shown, in this embodiment, the radiation device 1 located at the top of the inspection channel 4 has two radiation sources 11 arranged side-by-side along the front-back direction L. Each source is a radiation tube that includes multiple (four in the figure) sub-light sources 12 spaced apart along the left-right direction W. The two radiation sources 11 are staggered in the left-right direction W, forming an overlapping region 13. In the overlapping region 13, there is one and only one pair of sub-light sources 12 that are collinear in the front-back direction L. In this way, the radiation device 1 located at the top of the inspection channel 4 can perform a large-scale scan in the left-right direction W with a low risk of missed scans, enabling a more accurate and efficient top-view backscatter scanning process.

[0066] The radiation device 1 located on the left or right side of the inspection channel 4 has two radiation sources 11 arranged side by side along the front-back direction L. Each source is a radiation tube containing multiple (four in the figure) sub-light sources 12 spaced apart along the vertical direction H. The two radiation sources 11 are staggered in the vertical direction H, forming an overlapping area 13. Within the overlapping area 13, there is one and only one pair of sub-light sources 12 that are collinear in the front-back direction L. In this way, the radiation device 1 located on the left or right side of the inspection channel 4 can perform a larger scanning range in the vertical direction H with a lower risk of missed scans, enabling a more accurate and efficient side-view backscatter scanning process.

[0067] In this embodiment, each sub-light source 12 is a pulsed light source, and each sub-light source 12 emits beams at different times, but emits beams in a time-division (or staggered) manner. Specifically, in this embodiment, each sub-light source 12 emits beams in sequence according to a preset order. In this way, there will be no interference between different viewing angles, or between different sub-light sources 12 at the same viewing angle, so that the scanning inspection of the object under inspection 5 can be successfully realized.

[0068] Figure 3 The structure of the collimator 3 in this embodiment is further illustrated. For example... Figure 3 As shown, in this embodiment, the collimator 3 is provided with a collimation port 31 for collimating the rays emitted from the radiation device 1. Specifically, by Figure 3 As can be seen, in this embodiment, the collimation aperture 31 is circular, and the collimation aperture 31 on the collimator 3 corresponds one-to-one with the sub-light source 12 of the corresponding radiation device 1. In this way, the collimator 3 can collimate the rays emitted by each sub-light source 12 of the radiation device 1 into a pencil beam. Of course, as a variation, the collimation aperture 31 can also be elongated or other shapes, and at least two sub-light sources 12 can share one collimation aperture 31.

[0069] As can be seen, the radiation inspection system of this embodiment can perform multi-view imaging, and the scanning range of each view is large, with a low risk of missed scans. It can achieve an efficient and accurate scanning inspection process, and is therefore particularly suitable for inspecting large objects.

[0070] The above description is merely an exemplary embodiment of this application and is not intended to limit this application. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A radiation inspection system, characterized in that, include: The scanning device (10) includes a radiation device (1), a detection device (2), and a collimator (3). The radiation device (1) and the detection device (2) cooperate to scan the object under inspection (5). The radiation device (1) is located on one side of the object under inspection (5) and includes at least two radiation sources (11). The at least two radiation sources (11) of the radiation device (1) are arranged along a first direction (X) and each includes at least two sub-light sources (12) arranged at intervals along a second direction (Y). The first direction (X) and the second direction (Y) are perpendicular to each other and intersect with the relative arrangement direction of the radiation device (1) and the object under inspection (5). The collimator (3) collimates the rays emitted by each sub-light source (12) of the radiation device (1) into a pencil beam. Among the at least two radiation sources (11) of the radiation device (1), any two adjacent radiation sources (11) in the first direction (X) partially overlap in the second direction (Y).

2. The radiation inspection system according to claim 1, characterized in that, The overlapping portion of any two adjacent radiation sources (11) in the first direction (X) in the second direction (Y) forms an overlapping region (13), and the sub-light source (12) is provided in the overlapping region (13).

3. The radiation inspection system according to claim 2, characterized in that, The overlapping region (13) is provided with a pair of sub-light sources (12) that are collinear in the first direction (X).

4. The radiation inspection system according to claim 3, characterized in that, In the overlapping region (13), the sub-light sources (12) that are collinear in the first direction (X) do not emit beams simultaneously.

5. The radiation inspection system according to claim 1, characterized in that, Each of the sub-light sources (12) of the radiation device (1) emits a beam at different times.

6. The radiation inspection system according to claim 1, characterized in that, The scanning device (10) is configured to be at least one of the following: The radiation device (1) includes at least three radiation sources (11); The radiation source (11) includes at least three of the sub-light sources (12); The sub-light source (12) is a pulsed light source.

7. The radiation inspection system according to claim 1, characterized in that, The radiation device (1) is located on one side of the object under inspection (5) in the vertical direction (H), the first direction (X) is inclined along the front-back direction (L) or relative to the front-back direction (L), and the second direction (Y) is inclined along the left-right direction (W) or relative to the left-right direction (W); and / or, the radiation device (1) is located on one side of the object under inspection (5) in the left-right direction (W), the first direction (X) is inclined along the front-back direction (L) or relative to the front-back direction (L), and the second direction (Y) is inclined along the vertical direction (H) or relative to the vertical direction (H).

8. The radiation inspection system according to claim 1, characterized in that, The detection device (2) includes a backscatter detector (21), which cooperates with the radiation device (1) to perform backscatter scanning on the object under inspection (5); and / or, the detection device (2) includes a transmission detector, which cooperates with the radiation device (1) to perform transmission scanning on the object under inspection (5).

9. The radiation inspection system according to any one of claims 1-8, characterized in that, The radiation inspection system includes at least two of the scanning devices (10), and the radiation devices (1) of the at least two scanning devices (10) are arranged on different sides of the object under inspection (5).

10. The radiation inspection system according to claim 9, characterized in that, The radiation inspection system includes at least three of the aforementioned scanning devices (10).

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