Artwork microscopic graph acquisition method and device, electronic equipment and storage medium

Abstract

The embodiment of the invention relates to an artwork microscopic graph acquisition method and device, electronic equipment and a storage medium. The artwork microscopic graph acquisition method comprises the following steps: pre-storing a multi-level positioning graph of all target point locations of a target artwork; based on the multi-level positioning map and a preset image acquisition equipment fine adjustment rule, performing fine adjustment on the image acquisition equipment and determining a target acquisition position; and collecting a microscopic graph corresponding to the target point location of the target artwork based on the determined target collection position. Therefore, the acquisition personnel are guided to find the target acquisition point location through the image comparison algorithm, so that the learning difficulty of the acquisition personnel is reduced, and the acquisition efficiency is improved.

Description

Technical Field

[0001] The embodiments of the present invention relate to the field of technical authentication, and in particular to a method, device, electronic device and storage medium for collecting microscopic images of artworks. Background Art

[0002] In the art authentication and filing business, the most important thing is the collection of microscopic images of artworks, which is similar to the process of finding a house number in an unfamiliar city in reality. First of all, you need to know the district, street, community name, building, and unit to which the house number to be found belongs, and finally find the house number based on this information. When using handheld mobile devices to collect microscopic images of artworks, it is necessary to manually locate the collection points. Although there are guide maps and microscopic images of various magnifications to guide the collectors to find the correct collection points, the collection process of microscopic images requires high capabilities and concentration of the collectors themselves. The operation is difficult and prone to errors, which is not conducive to new users getting started quickly. Therefore, how to simply and quickly collect microscopic images of artworks has become a problem that needs to be solved urgently. Summary of the invention

[0003] In view of this, in order to solve the above-mentioned technical problems or part of the technical problems, an embodiment of the present invention provides a method, device, electronic device and storage medium for collecting microscopic images of artworks.

[0004] In a first aspect, an embodiment of the present invention provides a method for collecting a microscopic image of an artwork, comprising:

[0005] A multi-level positioning map of all target points of the target artwork is stored in advance;

[0006] Based on the multi-level positioning map and the preset fine-tuning rules of the image acquisition device, fine-tune the image acquisition device and determine the target acquisition position;

[0007] A microscopic image corresponding to a target point of the target artwork is acquired based on the determined target acquisition position.

[0008] In a possible implementation, the method further includes:

[0009] Acquire a first magnified microscopic image of a current position of the image acquisition device at a first multiple;

[0010] Based on the multi-level positioning map and the first magnified microscopic map of the first multiple of the current position of the image acquisition device, the image acquisition device is fine-tuned and the target acquisition position is determined.

[0011] In a possible implementation, the method further includes:

[0012] The multi-level positioning map includes a Part map, a guide map, a 60-fold magnified microscopic map, and a 200-fold magnified microscopic map;

[0013] Reading a pre-stored guide map of all target points of the target artwork and a second magnified microscopic map of the first magnification;

[0014] Scaling the second magnified microscopic image of the first magnification in the same proportion;

[0015] Using an image comparison algorithm, locate the first magnified microscopic image of the first magnification and the second magnified microscopic image of the first magnification on the guide image, and mark the first magnified microscopic image of the first magnification with a first wireframe and mark the second magnified microscopic image of the first magnification with a second wireframe;

[0016] The image acquisition device is fine-tuned based on the relative positions of the first wireframe and the second wireframe until the first wireframe and the second wireframe are aligned.

[0017] In a possible implementation, the method further includes:

[0018] If the first magnified microscopic image of the first magnification cannot be successfully located on the guide image, then reading a pre-stored Part image of all target points of the target artwork;

[0019] Using an image comparison algorithm, locate the first magnified microscopic image of the first magnification and the second magnified microscopic image of the first magnification on the Part image, and mark the first magnified microscopic image of the first magnification with a first wireframe and mark the second magnified microscopic image of the first magnification with a second wireframe;

[0020] The image acquisition device is fine-tuned based on the relative positions of the first wireframe and the second wireframe until the first wireframe and the second wireframe are aligned.

[0021] In a possible implementation, the method further includes:

[0022] If the first magnified microscopic image of the first magnification cannot be successfully located on the Part image, then reading a pre-stored complete work image of the target artwork;

[0023] Using an image comparison algorithm, locate the first magnified microscopic image of the first multiple and the second magnified microscopic image of the first multiple on the complete work image, and mark the first magnified microscopic image of the first multiple with a first wireframe and mark the second magnified microscopic image of the first multiple with a second wireframe;

[0024] The image acquisition device is fine-tuned based on the relative positions of the first wireframe and the second wireframe until the first wireframe and the second wireframe are aligned.

[0025] In a possible implementation, the method further includes:

[0026] Acquire a third magnified microscopic image of a second multiple of the current position of the image acquisition device;

[0027] Reading a pre-stored second magnified microscopic image of all target points of the target artwork at a first magnification and a fourth magnified microscopic image at a second magnification;

[0028] Using an image comparison algorithm, locate the third magnified microscopic image of the second magnification and the fourth magnified microscopic image of the second magnification in the second magnification microscopic image of the first magnification, and mark the third magnified microscopic image of the second magnification with a first wireframe and mark the fourth magnified microscopic image of the second magnification with a second wireframe;

[0029] Fine-tuning the image acquisition device based on the relative positions of the first wireframe and the second wireframe until the first wireframe and the second wireframe are aligned;

[0030] The inner area of ​​the wireframe after the first wireframe and the second wireframe are aligned is determined as the target acquisition position.

[0031] In a possible implementation, the method further includes:

[0032] Before using the image comparison algorithm to locate the image, the first magnified microscopic image of the first multiple, the second magnified microscopic image of the first multiple, the third magnified microscopic image of the second multiple and the fourth magnified microscopic image of the second multiple are scaled in proportion.

[0033] In a second aspect, an embodiment of the present invention provides a device for collecting microscopic images of artworks, comprising:

[0034] A storage module, used for pre-storing a multi-level positioning map of all target points of a target artwork;

[0035] A fine-tuning module, used to fine-tune the image acquisition device and determine the target acquisition position based on the multi-level positioning map and a preset fine-tuning rule for the image acquisition device;

[0036] The acquisition module is used to acquire a microscopic image corresponding to a target point of the target artwork based on the determined target acquisition position.

[0037] In a third aspect, an embodiment of the present invention provides an electronic device, comprising: a processor and a memory, wherein the processor is used to execute a program for collecting microscopic images of artworks stored in the memory to implement the method for collecting microscopic images of artworks described in the first aspect above.

[0038] In a fourth aspect, an embodiment of the present invention provides a storage medium, comprising: the storage medium stores one or more programs, and the one or more programs can be executed by one or more processors to implement the method for collecting microscopic images of artworks described in the first aspect above.

[0039] The scheme for collecting microscopic images of artworks provided by the embodiment of the present invention is to pre-store a multi-level positioning map of all target points of the target artwork; fine-tune the image acquisition device and determine the target acquisition position based on the multi-level positioning map and the preset fine-tuning rules of the image acquisition device; and collect the microscopic image corresponding to the target point of the target artwork based on the determined target acquisition position. Compared with the existing acquisition method that requires manual positioning of the acquisition point, has high requirements on the ability and concentration of the acquisition personnel, is difficult to operate and prone to errors, this scheme guides the acquisition personnel to find the target acquisition point through the image comparison algorithm, thereby reducing the learning difficulty of the acquisition personnel and improving the acquisition efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] Figure 1 A schematic diagram of a flow chart of a method for collecting microscopic images of artworks provided by an embodiment of the present invention;

[0041] Figure 2 A guide diagram provided for an embodiment of the present invention;

[0042] Figure 3 A 60-fold magnified microscopic image provided by an embodiment of the present invention;

[0043] Figure 4 A 200-fold magnified microscopic image provided by an embodiment of the present invention;

[0044] Figure 5 A semi-transparent floating display image provided by an embodiment of the present invention;

[0045] Figure 6 A schematic diagram of the structure of a device for collecting microscopic images of artworks provided by an embodiment of the present invention;

[0046] Figure 7 A schematic diagram of the structure of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0047] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0048] To facilitate understanding of the embodiments of the present invention, specific embodiments will be further explained below in conjunction with the accompanying drawings. The embodiments do not constitute a limitation on the embodiments of the present invention.

[0049] Figure 1 A schematic diagram of a method for collecting microscopic images of artworks provided by an embodiment of the present invention is shown in FIG. Figure 1 As shown, the method specifically includes:

[0050] S11, pre-storing a multi-level positioning map of all target points of the target artwork.

[0051] The collection of microscopic images of artworks ultimately requires obtaining images of specific points of the complete artwork image taken with a 200x microscope magnification lens. Specific points can be set according to the following rules: business requirements require the collection of seals, inscriptions, and coloring of the work; or, based on the experience of the collector, points with relatively obvious features, not easy to wear, and distributed as much as possible in different positions of the work will be selected.

[0052] To this end, the system of the embodiment of the present invention adds a four-level image positioning system to this specific point:

[0053] The first level, Part map, divides the target artwork image into several logical blocks, and uses a camera to obtain the Part map of each logical block. And mark the target points to be collected on the Part map.

[0054] The second level is the guide map. In the Part map, use colored arrow-shaped paper to indicate the target point, and use a camera to take a picture of the guide map. Figure 2 shown.

[0055] The third level is the first magnified microscopic image of the first multiple (60 times). Within the scope of the guide map, use the acquisition equipment to take a 60-fold magnified microscopic image of the target point. Figure 3 shown.

[0056] The fourth level, the third magnified microscopic image of the second multiple (200 times), within the range of the 60 times magnified microscopic image, use the acquisition equipment to shoot the 200 times magnified microscopic image of the target point. Figure 4 shown.

[0057] A multi-level positioning map of all target points of the target artwork is stored in advance.

[0058] S12. Based on the multi-level positioning map and preset image acquisition device fine-tuning rules, fine-tune the image acquisition device and determine the target acquisition position.

[0059] Before collecting the image of the specific point of the complete target artwork image captured by the 200x microscope magnification lens, first collect the 60x microscopic image of the target artwork. Place the device within the guidance map range, and the device reads the guidance map a of each target point in turn, and displays it semi-transparently on the screen of the acquisition device, such as Figure 5 As shown. A first magnified microscopic image of the current position of the image acquisition device at a first magnification is obtained, and the first magnification is 60 times. Based on the above-mentioned pre-stored multi-level positioning map and the first magnified microscopic image of the current position of the image acquisition device, the image acquisition device is fine-tuned and the target acquisition position is determined.

[0060] Specifically, the device reads the second magnified microscopic image b of the first multiple collected when the target artwork was filed, scales it to 1 / 30 of the original size, ensures that the sizes of the two are consistent, and uses image comparison algorithms, such as feature point matching or template matching, to perform image matching and locate image b on image a. For example, feature points of images a and b are extracted to generate feature descriptions of the two. The feature matching algorithm is then used to match the feature descriptor of image b with the feature descriptor in image a. Based on the matching results, the position of image b in image a is determined. For example, a RANSAC algorithm can be used to eliminate erroneous matching points and improve positioning accuracy. After determining the position of image b in image a, the position of image b can be marked with a red wireframe on the semi-transparent floating display image, such as Figure 5 shown.

[0061] It should be noted that feature point extraction refers to finding key points in the image that are different from the surrounding pixels by processing the image. These key points can be corner points, edges or texture points, etc. Feature descriptors are vectors used to describe the local features of these feature points. The feature matching algorithm can find the correspondence between two feature descriptors based on the similarity between them. Based on the matching results, we can determine the position of image b in image a. If there are mismatched points in the matching results, we can use the Random Access Array Computation (RANSAC) algorithm to exclude these mismatched points, thereby improving the accuracy of positioning. The RANSAC algorithm is an iterative algorithm that estimates model parameters by randomly selecting a set of point pairs and evaluates the accuracy of the model by calculating its fitting error with other points.

[0062] Furthermore, obtain the first magnified microscopic image c of the current location of the acquisition device (double-click the screen to take a photo). Scale image c to 1 / 30 of its original size, and use the image comparison algorithm to locate image c on image a. If the location of image c is successfully located on image a, it means that the acquisition device has been placed within the shooting range of the guidance image of the target point. Mark image c with a blue frame on the semi-transparent floating display image, as shown in the figure below. Figure 5 shown.

[0063] The collector can fine-tune the position of the image acquisition device according to the relative position of the blue wireframe and the red wireframe. After each fine-tuning of the device position, double-click the screen to capture the first magnified microscopic image c of the current position, and then scale image c to 1 / 30 of the original size. Use the image comparison algorithm to locate image c on image a and observe whether the relative position relationship between the blue wireframe and the red wireframe has improved. If the relative position relationship has improved, it means that the fine-tuning of the image acquisition device is effective; if not, it is necessary to continue to fine-tune the device position. Until the relative positions of the red wireframe and the blue wireframe tend to align, the accurate target acquisition position is found.

[0064] If position c in Figure a cannot be located, it means that the image acquisition device is not within the shooting range of the guidance map of the target point. The device system automatically calls up Part map d of the target acquisition point and loads it into the semi-transparent floating display image, replacing the guidance map a (both the Part map and the guidance map are non-magnified images, and the shooting range of the Part map is larger than that of the guidance map).

[0065] Continue to obtain the first magnified microscopic image c of the current location of the acquisition device, scale image c to 1 / 30 of its original size, and use the image comparison algorithm to locate image c on image d. Mark image c with a blue frame on the semi-transparent floating display image. Through the above steps, even if the location of image c cannot be located on image a, the target can still be located and marked in the floating display image based on Part image d and the microscopic image c of the acquisition device's location.

[0066] If the position of Figure C can be located in Part Figure D, the target position and the current position wireframe will be displayed. The position of the image acquisition device can be fine-tuned according to the relative position of the blue wireframe and the red wireframe. After each fine-tuning of the device position, double-click the screen to shoot the first magnified microscopic Figure C of the first multiple of the current position, and then scale Figure C to 1 / 30 of the original size. Use the image comparison algorithm to locate Figure C on Part Figure D, and observe whether the relative position relationship between the blue wireframe and the red wireframe has improved. If the relative position relationship has improved, it means that the fine-tuning of the image acquisition device is effective; if not, it is necessary to continue to fine-tune the device position. Until the relative positions of the red wireframe and the blue wireframe tend to align, the accurate target acquisition position is found.

[0067] It should be noted that by locating the position of Figure c in Part Figure d and displaying the target position and the current position wireframe, the relative position relationship between the target position and the current position can be accurately determined, which is convenient for subsequent fine-tuning. According to the relative position relationship between the blue wireframe and the red wireframe, the position of the image acquisition device can be fine-tuned. After each fine-tuning, by double-clicking the screen to shoot the first magnified microscopic Figure c of the first multiple of the current position, the relative position relationship can be observed more clearly, so as to make more precise fine-tuning. Using the image comparison algorithm, locate Figure c on Part Figure d and observe whether the relative position relationship between the blue wireframe and the red wireframe has improved. If the relative position relationship has improved, it means that the fine-tuning of the image acquisition device is effective; if not, it is necessary to continue to fine-tune the device position. In this way, the fine-tuning effect can be automatically judged, avoiding errors in subjective judgment. Finally, the device position is continuously fine-tuned until the relative positions of the red wireframe and the blue wireframe tend to be aligned, and the accurate target acquisition position can be found. In this way, the accuracy of the target position can be ensured and the acquisition effect can be improved.

[0068] If the location is still not found in Part Picture d, it means that the acquisition device is not within the shooting range of the Part Picture of the target point. The device system automatically retrieves the complete artwork Picture e and loads it into the semi-transparent floating display picture, replacing Part Picture d. (The shooting range of the complete artwork picture is larger than that of the Part picture). Continue to obtain the first magnified microscopic picture c of the first multiple of the current location of the acquisition device, scale Picture c to 1 / 30 of the original size, and use the image comparison algorithm to locate Picture c on Picture e. Mark Picture c with a blue wireframe on the semi-transparent floating display picture.

[0069] If you can locate the position of Figure C in the complete work Figure E, the target position and the current position wireframe will be displayed. You can fine-tune the position of the image acquisition device according to the relative position of the blue wireframe and the red wireframe. After fine-tuning the device position each time, double-click the screen to shoot the first magnified microscopic Figure C of the first multiple of the current position, and then scale Figure C to 1 / 30 of the original size. Use the image comparison algorithm to locate Figure C on Figure A and observe whether the relative position relationship between the blue wireframe and the red wireframe has improved. If the relative position relationship has improved, it means that the fine-tuning of the image acquisition device is effective; if not, you need to continue to fine-tune the device position. Until the relative positions of the red wireframe and the blue wireframe tend to align, the accurate target acquisition position is found.

[0070] S13. Collect a microscopic image corresponding to a target point of the target artwork based on the determined target collection position.

[0071] After finding the accurate target collection position, a 200-times magnified microscopic image corresponding to the target point of the target artwork is collected according to the target collection position.

[0072] Specifically, the second magnified microscopic image f of the first magnification acquired when the target artwork is filed is read, and the 60-fold microscopic image C of the current position of the image acquisition device in the semi-transparent floating display image is replaced.

[0073] Read the fourth magnified microscopic image g of the second multiple collected when the target artwork was filed, where the second multiple is 200 times, and scale it proportionally to 1 / 3 of the original size. Use the image comparison algorithm to locate image g on image f, and mark the position of image g with a red frame on the semi-transparent floating display image (because images f and g were both collected when filing, both are different magnification images of the same point, so they can definitely be located).

[0074] Further, obtain the third magnified microscopic image h of the second multiple of the current position of the image acquisition device (double-click the screen to take a photo). Scale image h to 1 / 3 of its original size, and use the image comparison algorithm to locate image h on image f. Mark image h with a blue wireframe on the semi-transparent floating display. The acquisition personnel can fine-tune the acquisition device position according to the relative position of the blue wireframe and the red wireframe to find the accurate target acquisition position. After each fine-tuning of the device position, double-click the screen to shoot the third magnified microscopic image h of the second multiple of the current position, and then scale image h to 1 / 30 of its original size, use the image comparison algorithm to locate image h on image f, and observe whether the relative position relationship between the blue wireframe and the red wireframe has improved. If the relative position relationship has improved, it means that the fine-tuning of the image acquisition device is effective; if not, it is necessary to continue to fine-tune the device position. Until the relative positions of the red wireframe and the blue wireframe tend to align, double-click the screen to shoot, and collect the 200-fold magnified microscopic image corresponding to the target point of the target artwork.

[0075] Among them, the image comparison algorithm is used to locate figure h on figure f, and observe whether the relative position relationship between the blue wireframe and the red wireframe has improved. If the relative position relationship has improved, it means that the fine-tuning of the image acquisition device is effective; if it has not improved, it is necessary to continue to fine-tune the device position. In this way, the fine-tuning effect can be automatically judged, avoiding the error of subjective judgment. Continue to fine-tune the device position until the relative positions of the red wireframe and the blue wireframe tend to be aligned, and then double-click the screen to shoot, and you can collect a 200-fold magnified microscopic image corresponding to the target point of the target artwork. In this way, the accurate target acquisition position can be found and more detailed acquisition can be performed. In this way, the accuracy and efficiency of the image acquisition device can be improved, errors and human intervention can be reduced, and the acquisition quality and detail capture of the target artwork can be ensured through precise positioning, real-time fine-tuning, automatic judgment and final accurate target acquisition position.

[0076] It should be explained why we need to locate and collect the 60x magnified microscopic image first and then locate and collect the 200x magnified microscopic image: Due to the high magnification of the mobile device, a slight displacement can easily cause a large offset in the screen display, affecting the comparison results. Therefore, during the verification and collection process, we will try our best to accurately mark the position of the 60x magnified microscopic image collected during the filing on the guide map, fine-tune the position of the mobile device on the work, compare the offset, and find and shoot the 60x magnified microscopic image at the current position.

[0077] The method for collecting microscopic images of artworks provided in the embodiment of the present invention is to pre-store a multi-level positioning map of all target points of the target artwork; fine-tune the image acquisition device and determine the target acquisition position based on the multi-level positioning map and the preset fine-tuning rules of the image acquisition device; and collect the microscopic image corresponding to the target point of the target artwork based on the determined target acquisition position. Compared with the existing acquisition method that requires manual positioning of the acquisition point, has high requirements on the ability and concentration of the acquisition personnel, is difficult to operate and prone to errors, this method guides the acquisition personnel to find the target acquisition point through the image comparison algorithm, thereby reducing the learning difficulty of the acquisition personnel and improving the acquisition efficiency.

[0078] Figure 6 A schematic diagram of the structure of a device for collecting microscopic images of artworks provided in an embodiment of the present invention, the device comprising:

[0079] The storage module 701 is used to pre-store a multi-level positioning map of all target points of a target artwork.

[0080] The fine-tuning module 702 is used to fine-tune the image acquisition device and determine the target acquisition position based on the multi-level positioning map and the preset fine-tuning rules of the image acquisition device.

[0081] The acquisition module 703 is used to acquire the microscopic image corresponding to the target point of the target artwork based on the determined target acquisition position. In one possible implementation, the device further includes: a processing module, including:

[0082] An acquisition submodule, used for acquiring a first magnified microscopic image of a current position of the image acquisition device at a first multiple;

[0083] The processing submodule is used to fine-tune the image acquisition device and determine the target acquisition position based on the multi-level positioning map and the first magnified microscopic map of the first multiple of the current position of the image acquisition device.

[0084] In a possible implementation, the multi-level positioning map includes a Part map, a guide map, a 60-fold magnified microscopic map, and a 200-fold magnified microscopic map;

[0085] The processing submodule is used to read the pre-stored guide map of all target points of the target artwork and the second magnified microscopic image of the first multiple; scale the second magnified microscopic image of the first multiple in equal proportion; use an image comparison algorithm to locate the first magnified microscopic image of the first multiple and the second magnified microscopic image of the first multiple on the guide map, and mark the first magnified microscopic image of the first multiple with a first wireframe and the second magnified microscopic image of the first multiple with a second wireframe; and fine-tune the image acquisition device based on the relative positions of the first wireframe and the second wireframe until the first wireframe and the second wireframe are aligned.

[0086] In a possible embodiment, the device also includes: a first comparison module, which is used to read a pre-stored Part map of all target points of the target artwork if the first magnified microscopic image of the first magnification cannot be successfully located on the guide map; use an image comparison algorithm to locate the first magnified microscopic image of the first magnification and the second magnified microscopic image of the first magnification on the Part map, and mark the first magnified microscopic image of the first magnification with a first wireframe and the second magnified microscopic image of the first magnification with a second wireframe; and fine-tune the image acquisition device based on the relative positions of the first wireframe and the second wireframe until the first wireframe and the second wireframe are aligned.

[0087] In a possible embodiment, the device also includes: a second comparison module, which is used to read a pre-stored complete work image of the target artwork if the first magnified microscopic image of the first magnification cannot be successfully located on the Part image; use an image comparison algorithm to locate the first magnified microscopic image of the first magnification and the second magnified microscopic image of the first magnification on the complete work image, and mark the first magnified microscopic image of the first magnification with a first wireframe and the second magnified microscopic image of the first magnification with a second wireframe; and fine-tune the image acquisition device based on the relative positions of the first wireframe and the second wireframe until the first wireframe and the second wireframe are aligned.

[0088] In one possible embodiment, the device also includes: a third comparison module, which is used to obtain a third magnified microscopic image of the second multiple of the current position of the image acquisition device; read the second magnified microscopic image of the first multiple and the fourth magnified microscopic image of the second multiple of all target points of the target artwork that are pre-stored; use an image comparison algorithm to locate the third magnified microscopic image of the second multiple and the fourth magnified microscopic image of the second multiple in the second magnified microscopic image of the first multiple, and mark the third magnified microscopic image of the second multiple with a first wireframe and the fourth magnified microscopic image of the second multiple with a second wireframe; fine-tune the image acquisition device based on the relative positions of the first wireframe and the second wireframe until the first wireframe and the second wireframe are aligned; and determine the inner area of ​​the wireframe after the first wireframe and the second wireframe are aligned as the target acquisition position.

[0089] In one possible embodiment, the device also includes: a scaling processing module, which is used to proportionally scale the first magnified microscopic image of the first magnification, the second magnified microscopic image of the first magnification, the third magnified microscopic image of the second magnification, and the fourth magnified microscopic image of the second magnification before using the image comparison algorithm to locate the image.

[0090] Figure 7 An electronic device according to an embodiment of the present invention is shown. Figure 7 As shown, the electronic device may include a processor 801 and a memory 802, wherein the processor 801 and the memory 802 may be connected via a bus or other means. Figure 7 The example of connecting through bus is taken in the following.

[0091] The processor 801 may be a central processing unit (CPU). The processor 801 may also be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or a combination of the above chips.

[0092] The memory 802 is a non-transitory computer-readable storage medium that can be used to store non-transitory software programs, non-transitory computer executable programs and modules, such as program instructions / modules corresponding to the method provided in the embodiment of the present invention. The processor 801 executes various functional applications and data processing of the processor by running the non-transitory software programs, instructions and modules stored in the memory 802, that is, implements the method in the above method embodiment.

[0093] The memory 802 may include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application required by at least one function; the data storage area may store data created by the processor 801, etc. In addition, the memory 802 may include a high-speed random access memory, and may also include a non-volatile memory, such as at least one disk storage device, a flash memory device, or other non-volatile solid-state storage device. In some embodiments, the memory 802 may optionally include a memory remotely arranged relative to the processor 801, and these remote memories may be connected to the processor 801 via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0094] One or more modules are stored in the memory 802 , and when executed by the processor 801 , the method in the above method embodiment is executed.

[0095] The specific details of the above electronic device can be understood by referring to the corresponding descriptions and effects in the above method embodiments, and will not be repeated here.

[0096] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiments can be implemented by instructing the relevant hardware through a computer program, and the program can be stored in a computer-readable storage medium. When the program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, the storage medium can be a disk, an optical disk, a read-only memory (ROM), a random access memory (RAM), a flash memory, a hard disk drive (HDD) or a solid-state drive (SSD), etc.; the storage medium can also include a combination of the above-mentioned types of memory.

[0097] Although the embodiments of the present invention have been described in conjunction with the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present invention, and such modifications and variations are all within the scope defined by the appended claims.

Claims

1. A method for collecting microscopic images of artworks, characterized in that: include: A multi-level positioning map of all target points of the target artwork is stored in advance; Based on the multi-level positioning map and the preset fine-tuning rules of the image acquisition device, fine-tune the image acquisition device and determine the target acquisition position; A microscopic image corresponding to a target point of the target artwork is acquired based on the determined target acquisition position.

2. The method according to claim 1, characterized in that: The step of fine-tuning the image acquisition device and determining the target acquisition position based on the multi-level positioning map and the preset image acquisition device fine-tuning rule includes: Acquire a first magnified microscopic image of a current position of the image acquisition device at a first multiple; Based on the multi-level positioning map and the first magnified microscopic map of the first multiple of the current position of the image acquisition device, the image acquisition device is fine-tuned and the target acquisition position is determined.

3. The method according to claim 2, characterized in that The multi-level positioning map includes a Part map, a guide map, a first magnified microscopic map of a first multiple, and a third magnified microscopic map of a second multiple; The method of fine-tuning the image acquisition device and determining the target acquisition position based on the multi-level positioning map and the first magnified microscopic map of the first multiple of the current position of the image acquisition device comprises: Reading a pre-stored guide map of all target points of the target artwork and a second magnified microscopic map of the first magnification; Scaling the second magnified microscopic image of the first magnification in the same proportion; Using an image comparison algorithm, locate the first magnified microscopic image of the first magnification and the second magnified microscopic image of the first magnification on the guide image, and mark the first magnified microscopic image of the first magnification with a first wireframe and mark the second magnified microscopic image of the first magnification with a second wireframe; The image acquisition device is fine-tuned based on the relative positions of the first wireframe and the second wireframe until the first wireframe and the second wireframe are aligned.

4. The method according to claim 3, characterized in that The method further comprises: If the first magnified microscopic image of the first magnification cannot be successfully located on the guide image, then reading a pre-stored Part image of all target points of the target artwork; Using an image comparison algorithm, locate the first magnified microscopic image of the first magnification and the second magnified microscopic image of the first magnification on the Part image, and mark the first magnified microscopic image of the first magnification with a first wireframe and mark the second magnified microscopic image of the first magnification with a second wireframe; The image acquisition device is fine-tuned based on the relative positions of the first wireframe and the second wireframe until the first wireframe and the second wireframe are aligned.

5. The method according to claim 4, characterized in that The method further comprises: If the first magnified microscopic image of the first magnification cannot be successfully located on the Part image, then reading a pre-stored complete work image of the target artwork; Using an image comparison algorithm, locate the first magnified microscopic image of the first multiple and the second magnified microscopic image of the first multiple on the complete work image, and mark the first magnified microscopic image of the first multiple with a first wireframe and mark the second magnified microscopic image of the first multiple with a second wireframe; The image acquisition device is fine-tuned based on the relative positions of the first wireframe and the second wireframe until the first wireframe and the second wireframe are aligned.

6. The method according to claim 5, characterized in that The method further comprises: Acquire a third magnified microscopic image of a second multiple of the current position of the image acquisition device; Reading a pre-stored second magnified microscopic image of all target points of the target artwork at a first magnification and a fourth magnified microscopic image at a second magnification; Using an image comparison algorithm, locate the third magnified microscopic image of the second magnification and the fourth magnified microscopic image of the second magnification in the second magnification microscopic image of the first magnification, and mark the third magnified microscopic image of the second magnification with a first wireframe and mark the fourth magnified microscopic image of the second magnification with a second wireframe; Fine-tuning the image acquisition device based on the relative positions of the first wireframe and the second wireframe until the first wireframe and the second wireframe are aligned; The inner area of ​​the wireframe after the first wireframe and the second wireframe are aligned is determined as the target acquisition position.

7. The method according to claim 6, characterized in that The method further comprises: Before using the image comparison algorithm to locate the image, the first magnified microscopic image of the first multiple, the second magnified microscopic image of the first multiple, the third magnified microscopic image of the second multiple and the fourth magnified microscopic image of the second multiple are scaled in proportion.

8. A device for collecting microscopic images of artworks, characterized in that: include: A storage module, used for pre-storing a multi-level positioning map of all target points of a target artwork; A fine-tuning module, used to fine-tune the image acquisition device and determine the target acquisition position based on the multi-level positioning map and a preset fine-tuning rule for the image acquisition device; The acquisition module is used to acquire a microscopic image corresponding to a target point of the target artwork based on the determined target acquisition position.

9. An electronic device, characterized in that: include: A processor and a memory, wherein the processor is used to execute a program for collecting microscopic images of artworks stored in the memory to implement the method for collecting microscopic images of artworks described in any one of claims 1 to 7.

10. A storage medium, characterized in that: The storage medium stores one or more programs, and the one or more programs can be executed by one or more processors to implement the method for collecting microscopic images of artworks as described in any one of claims 1 to 7.

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