A method and device for detecting polarizer

Abstract

The present invention discloses a method and device for detecting polarizers, the method comprising: using a broadband dielectric spectrum to determine the dielectric properties of the polarizer, analyzing the curve of the change of the dielectric properties with frequency, and determining the distribution of the sensitive area of ​​the polarizer; applying a frequency modulated acoustic signal to the sensitive area, determining the surface potential change characteristics, and obtaining the charge distribution state of the antistatic layer or the conductive layer; maintaining the frequency modulated acoustic signal, scanning the polarizer using a dual-probe differential measurement mode, and determining the electric field distribution according to the phase relationship between the potential difference and the acoustic signal; determining the transmission characteristics of orthogonal polarization state light in the abnormal electric field area, and analyzing the intensity ratio and phase difference of the polarization component; based on the charge distribution state, electric field distribution and the transmission characteristics of polarization state light, analyzing the stray electric field distribution in the antistatic layer or the conductive layer and its influence on the optical performance of the polarizer. The technical solution of the present invention can improve the accuracy and repeatability of polarizer detection.

Description

Technical Field

[0001] The present invention relates to the technical field of polarizer detection, and in particular to a method and device for detecting a polarizer. Background Art

[0002] Polarizer is a key optical component in display panels and optical devices. Its basic structure consists of a polarizing substrate (such as a stretched oriented PVA film) and protective layers attached on both sides (such as TAC film or PET film). As display technology develops towards high resolution and wide color gamut, higher requirements are placed on the optical stability of polarizers. In order to reduce the accumulation of static charge on the surface of the polarizer and reduce problems such as electrostatic discharge damage and dust adsorption, an antistatic layer or conductive layer is usually introduced into the polarizer structure. These functional layers are attached to the surface of the protective film or the peripheral area of ​​the polarizing substrate in the form of coating or interlayer, and play an important protective role in the manufacturing and use of displays.

[0003] However, in actual application environments, the antistatic layer or the conductive layer may undergo local electrical changes due to factors such as trace moisture adsorption, ion migration, or interfacial chemical reactions, thereby forming imperceptible microscopic stray electric fields inside or on the surface of the polarizer. Current detection methods mainly focus on macroscopic indicators such as optical transmittance, polarization efficiency, or overall resistance value. These methods have difficulty in timely identifying and quantifying subtle interference caused by microscopic stray electric fields. Although these microscopic electric fields are weak in intensity, they may gradually affect the optical properties of the polarizer over time and with environmental changes, resulting in a decrease in display quality. In addition, since these stray electric fields are often related to the depth distribution characteristics of the antistatic layer or the conductive layer, traditional surface detection methods are even more difficult to fully evaluate their impact. Therefore, how to accurately identify and characterize these stray electric field interferences caused by local ion migration or trace moisture adsorption during the detection process has become a key technical issue in improving the accuracy and repeatability of polarizer detection. Summary of the invention

[0004] The main purpose of the present invention is to solve the technical problem that the existing polarizer detection method cannot accurately identify and quantify the microscopic stray electric field generated in the antistatic layer or the conductive layer due to local ion migration and moisture adsorption, resulting in insufficient detection accuracy and repeatability.

[0005] A first aspect of the present invention provides a method for detecting a polarizer, the method comprising:

[0006] The dielectric properties of the polarizer are measured using broadband dielectric spectroscopy, the curve of dielectric properties changing with frequency is analyzed, and the distribution of sensitive areas of the polarizer is determined;

[0007] Applying a frequency modulated acoustic signal to the sensitive area, measuring the surface potential change characteristics, and obtaining the charge distribution state of the antistatic layer or the conductive layer;

[0008] Maintaining the frequency modulated acoustic signal, scanning the polarizer using a dual-probe differential measurement mode, and determining the electric field distribution according to the phase relationship between the potential difference and the acoustic signal;

[0009] In the determined abnormal electric field area, the transmission characteristics of the orthogonal polarization state light are measured, and the intensity ratio and phase difference of the polarization components are analyzed;

[0010] Based on the charge distribution state, electric field distribution and transmittance characteristics of polarized light, the stray electric field distribution in the antistatic layer or the conductive layer and its influence on the optical performance of the polarizer are analyzed.

[0011] Optionally, the method of measuring the dielectric properties of the polarizer by using a broadband dielectric spectrum, analyzing the curve of the dielectric properties changing with frequency, and determining the distribution of the sensitive area of ​​the polarizer includes:

[0012] The polarizer is divided into grids and the dielectric constant and dielectric loss of each partition are measured in the frequency range of 1 Hz to 10 MHz;

[0013] Calculating the dielectric property difference between adjacent partitions according to the dielectric constant and dielectric loss to obtain the spatial distribution of the dielectric property of the polarizer;

[0014] The spatial distribution of the dielectric properties is measured under the conditions of relative humidity of 25% to 35% and relative humidity of 55% to 65% respectively to obtain humidity response data of the dielectric properties;

[0015] Performing a continuous frequency scan in the range of 1 Hz to 10 MHz for the partitions whose dielectric loss difference exceeds a preset threshold, and determining a frequency response curve of the dielectric loss;

[0016] The sensitive area distribution of the polarizer is determined according to the dielectric property spatial distribution, humidity response data and frequency response curve.

[0017] Optionally, calculating the dielectric property difference between adjacent partitions according to the dielectric constant and dielectric loss to obtain the dielectric property spatial distribution of the polarizer includes:

[0018] The dielectric constant and dielectric loss of each partition of the polarizer are measured by orthogonal scanning to obtain dielectric characteristic data in the horizontal and vertical directions;

[0019] Performing anisotropy analysis on the dielectric property data in the horizontal direction and the vertical direction to determine the orientation distribution state of the antistatic layer or the conductive layer;

[0020] Perform timed repeated measurements in the interface transition region of the antistatic layer or the conductive layer to obtain the time evolution data of the dielectric properties;

[0021] Compensating the time evolution data of the dielectric properties according to the orientation distribution state to obtain the interface charge accumulation state;

[0022] The dielectric property difference of each partition is calculated based on the interface charge accumulation state to obtain the dielectric property spatial distribution of the polarizer.

[0023] Optionally, performing repeated measurements at regular intervals in the interface transition region of the antistatic layer or the conductive layer to obtain time evolution data of dielectric properties includes:

[0024] Applying an alternating electric field pretreatment to the interface transition region of the antistatic layer or the conductive layer to measure the initial dielectric properties of the interface transition region;

[0025] Determine the dielectric properties of the interface transition region at preset time intervals to obtain data on changes in the dielectric properties over time;

[0026] Calculating the dielectric property change rate of the interface transition region according to the dielectric property change data over time;

[0027] Performing a time series analysis on the dielectric property change rate to obtain a characteristic time constant of an interface transition region;

[0028] The data of the change of the dielectric property with time is processed in sections according to the characteristic time constant to obtain the time evolution data of the dielectric property in the interface transition area.

[0029] Optionally, applying a frequency modulated acoustic signal to a sensitive area, measuring the surface potential change characteristics, and obtaining the charge distribution state of the antistatic layer or the conductive layer includes:

[0030] Apply amplitude modulated acoustic signals to the sensitive area to measure the transient response characteristics of the surface potential;

[0031] Performing time-frequency analysis on the transient response characteristics to obtain a characteristic frequency spectrum of the potential change;

[0032] adjusting the modulation frequency of the acoustic signal according to the characteristic frequency spectrum, and measuring the steady-state potential distribution at different modulation frequencies;

[0033] Performing stress-potential correlation analysis on the steady-state potential distribution to obtain a charge-stress coupling coefficient;

[0034] The steady-state potential distribution is corrected according to the charge-stress coupling coefficient to obtain the charge distribution state of the antistatic layer or the conductive layer.

[0035] Optionally, the step of maintaining the frequency modulated acoustic signal, scanning the polarizer in a dual-probe differential measurement mode, and determining the electric field distribution according to a phase relationship between the potential difference and the acoustic signal includes:

[0036] A reference probe is set in the stable region to measure the dynamic response of the reference potential under the modulation of the acoustic signal;

[0037] Scan the polarizer in a spiral path to obtain the dynamic change data of the electric potential at each scanning point;

[0038] Calculating the potential difference dynamic characteristics of each scanning point according to the reference potential dynamic response and potential dynamic change data;

[0039] Performing phase analysis on the potential difference dynamic characteristics to obtain charge migration response distribution;

[0040] The electric field distribution of the polarizer is determined according to the charge transfer response distribution.

[0041] Optionally, the measuring the transmission characteristics of the orthogonal polarization state light in the determined abnormal electric field region and analyzing the intensity ratio and phase difference of the polarization components include:

[0042] The initial transmission characteristics of orthogonal polarization light are measured in the abnormal electric field region to obtain the baseline data when there is no external field effect;

[0043] Applying a progressive stress field in an orthogonal direction to the abnormal electric field region, and measuring the transmission characteristic change data under the stress field;

[0044] Calculating stress-induced optical anisotropy contribution based on the baseline data and the transmission characteristic change data;

[0045] Deducting the stress-induced optical anisotropy contribution from the transmission characteristic change data to obtain the electric field-induced polarization state modulation characteristics;

[0046] The intensity ratio and phase difference of the polarization components are determined according to the polarization state modulation characteristics induced by the electric field.

[0047] Optionally, analyzing the stray electric field distribution in the antistatic layer or the conductive layer and its influence on the optical properties of the polarizer based on the charge distribution state, the electric field distribution and the transmittance characteristics of the polarized light includes:

[0048] Calculating the charge-electric field coupling coefficient according to the spatial correspondence between the charge distribution state and the electric field distribution, and obtaining the abnormal electric field regional distribution data in the antistatic layer or the conductive layer;

[0049] Performing layer-wise analysis on the abnormal electric field regional distribution data to obtain the stray electric field distribution characteristics of the antistatic layer or the conductive layer at different depths;

[0050] Correcting the stray electric field distribution characteristics according to the transmission characteristics of the polarized light to obtain the intrinsic electric field distribution data of the antistatic layer or the conductive layer;

[0051] Continuously sampling and analyzing the charge distribution state to obtain charge migration characteristic data in the antistatic layer or the conductive layer;

[0052] Correcting the intrinsic electric field distribution data according to the charge migration characteristic data to obtain the time-varying distribution characteristics of the stray electric field in the antistatic layer or the conductive layer;

[0053] The transmittance characteristics of the polarized light are analyzed according to the time-varying distribution characteristics of the stray electric field to obtain transmittance attenuation data and extinction ratio change data of the polarizer.

[0054] Optionally, performing layer-wise analysis on the abnormal electric field regional distribution data to obtain stray electric field distribution characteristics of the antistatic layer or the conductive layer at different depths includes:

[0055] Discretize the abnormal electric field regional distribution data in the depth direction, calculate the electric field gradient between adjacent layers according to the processing results, and obtain the interface charge accumulation characteristics of the antistatic layer or the conductive layer;

[0056] Performing a threshold analysis on the interface charge accumulation characteristics to determine the charge trap distribution data in the antistatic layer or the conductive layer;

[0057] Calculating effective stray electric field distribution according to the charge trap distribution data to obtain orientation characteristics of the stray electric field in the antistatic layer or the conductive layer;

[0058] The interfacial stress distribution is calculated based on the orientation characteristics of the stray electric field to obtain the stray electric field distribution characteristics of the antistatic layer or the conductive layer at different depths.

[0059] A second aspect of the present invention provides a polarizer detection device, the polarizer detection device comprising:

[0060] The dielectric property measurement module is used to measure the dielectric properties of the polarizer using a broadband dielectric spectrum, analyze the curve of the dielectric properties changing with frequency, and determine the distribution of the sensitive area of ​​the polarizer;

[0061] A charge distribution measurement module, used to apply a frequency modulated acoustic signal to a sensitive area, measure the surface potential change characteristics, and obtain the charge distribution state of the antistatic layer or the conductive layer;

[0062] An electric field distribution determination module, used to maintain the frequency modulated acoustic signal, scan the polarizer using a dual-probe differential measurement mode, and determine the electric field distribution according to the phase relationship between the potential difference and the acoustic signal;

[0063] An optical property measurement module is used to measure the transmission characteristics of orthogonal polarization state light in a determined abnormal electric field area and analyze the intensity ratio and phase difference of the polarization components;

[0064] The performance impact analysis module is used to analyze the stray electric field distribution in the antistatic layer or the conductive layer and its impact on the optical performance of the polarizer based on the charge distribution state, electric field distribution and the transmission characteristics of polarized light.

[0065] The technical solution provided by the embodiment of the present application, in order to cope with the microscopic stray electric field interference that may occur in practical applications, the detection method first measures the dielectric properties of the object to be tested over a wide frequency range, and analyzes the trend of the measurement results changing with the frequency to find those areas that are most sensitive to the external environment. In this way, the subsequent tests and analyses required can be concentrated on these sensitive positions, which can not only improve the detection efficiency, but also capture weak interference as soon as it appears. At this time, due to factors such as local ion migration or water adsorption, the performance of dielectrics in different frequency bands is often differentiated, and the broadband dielectric spectrum can intuitively present this difference in the form of a change curve, thereby separating potential abnormal areas. If only the overall transmittance or polarization efficiency is detected, it is difficult to capture these early signals, and broadband dielectric measurements enable the dielectric constant and loss of each region at different frequencies to be quantified and compared with adjacent regions, thereby accurately locating hidden charge accumulation sites.

[0066] After the sensitive parts are identified, in order to gain a deeper understanding of the microscopic charge distribution therein, a modulated acoustic signal is introduced into the detection process and applied to the sensitive parts. Once the acoustic excitation is applied to the surface of the polarizer, if there is a local charge or the charge migration channel is implicit in the structure, a small disturbance of the surface potential will be caused at the corresponding position. The different manifestations of these disturbances in the time or frequency domain can reflect the storage method of the charge, the difficulty of migration, and the strength of coupling with the environment. Compared with the conventional "measuring the overall resistance value" or "observing the one-time distribution of the surface potential", the change of surface potential under acoustic modulation can more delicately feedback the state of the local charge, because the acoustic signal has different excitation effects on the charge at different modulation frequencies. By adjusting the frequency of the acoustic signal and recording the change process of the steady-state potential distribution, it is possible to distinguish whether it is a simple electrostatic accumulation or a dynamic and static composite phenomenon related to the adsorption of water or ion diffusion by deep materials. Next, if the dual-probe differential measurement method is used to scan the surface in this modulation environment, the phase correspondence between the potential difference distribution and the acoustic modulation signal can be regarded as a "visualization" of the dynamic response of the charge on the plane. The data generated by the plane scanning can distinguish which areas have obvious charge coupling and which areas are relatively stable, thereby further analyzing the distribution of stray electric fields in abnormal areas.

[0067] When this scan locates the area where the abnormal electric field appears, the transmission test of orthogonal polarized light can be used to evaluate the impact of the electric field on the optical performance. Since the stray electric field will cause slight changes in the material orientation or electro-birefringence effect locally, measuring the transmission of orthogonal polarized light can quantify the extent of this impact. If the electric field distribution is not measured, it is difficult to determine the cause of optical damage, and even hidden performance degradation cannot be discovered at the early stage. By recording the intensity ratio and phase difference of each polarization component and comparing it with the existing charge distribution and electric field distribution results, it is possible to infer layer by layer how much the stray electric field contributes to the cumulative optical loss at different depths and different positions of the polarizer, or whether there is any correlation with ion migration and water diffusion inside the material.

[0068] The above multi-step operation realizes the penetrating analysis from the dielectric property measurement of the material surface to the deep local electric field distribution. It can not only identify weak stray electric fields, but also quantify the interference caused by these electric fields on optical performance. In this way, it is possible to completely solve the problem that electrical changes caused by local accumulation of moisture or ions are difficult to detect in time: first find the most vulnerable position, then use acoustic modulation and differential measurement to reveal the charge and electric field coupling hidden inside, and finally use polarized light transmission test to confirm the impact on display performance. It is precisely because the process of both dielectric detection and optical detection is covered, and full tracking is achieved in local subdivided areas, that these slowly accumulated but difficult to be detected by traditional detection stray electric field disturbances can be accurately identified and characterized at an early stage, thereby effectively preventing the potential degradation of display quality. BRIEF DESCRIPTION OF THE DRAWINGS

[0069] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the structures shown in these drawings without paying creative work.

[0070] Figure 1 Schematic diagram of an embodiment of a method for detecting a polarizer in an embodiment of the present invention;

[0071] Figure 2 Schematic diagram of an embodiment of a detection device for a polarizer in an embodiment of the present invention.

[0072] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0073] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0074] It should be noted that if the embodiments of the present invention involve directional indications (such as up, down, left, right, front, back...), the directional indications are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0075] In addition, the descriptions of "first", "second", etc. in the present invention are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In addition, "and / or" in the full text includes three solutions. Taking A and / or B as an example, it includes technical solution A, technical solution B, and technical solution that satisfies both A and B. In addition, the technical solutions between the various embodiments can be combined with each other, which must be based on the ability of ordinary technicians in the field to implement. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0076] An embodiment of the present application provides a method for detecting a polarizer. Figure 1 A flow chart of a method for detecting a polarizer provided in an embodiment of the present application. In this embodiment, the method includes:

[0077] See also Figure 1 , use broadband dielectric spectrum to measure the dielectric properties of polarizer, analyze the curve of dielectric properties changing with frequency, and determine the distribution of sensitive areas of polarizer;

[0078] In one embodiment of the present invention, the method of measuring the dielectric properties of the polarizer by using a broadband dielectric spectrum, analyzing the curve of the dielectric properties changing with frequency, and determining the distribution of the sensitive area of ​​the polarizer includes:

[0079] The polarizer is divided into grids and the dielectric constant and dielectric loss of each partition are measured in the frequency range of 1 Hz to 10 MHz;

[0080] Calculating the dielectric property difference between adjacent partitions according to the dielectric constant and dielectric loss to obtain the spatial distribution of the dielectric property of the polarizer;

[0081] The spatial distribution of the dielectric properties is measured under the conditions of relative humidity of 25% to 35% and relative humidity of 55% to 65% respectively to obtain humidity response data of the dielectric properties;

[0082] Performing a continuous frequency scan in the range of 1 Hz to 10 MHz for the partitions whose dielectric loss difference exceeds a preset threshold, and determining a frequency response curve of the dielectric loss;

[0083] The sensitive area distribution of the polarizer is determined according to the dielectric property spatial distribution, humidity response data and frequency response curve.

[0084] The following is a detailed description of the steps involved in the above embodiment:

[0085] In the first step, the sample to be tested needs to be divided into several grid units, and the dielectric constant and dielectric loss are measured in each unit. When dividing the grid, you can use equidistant division or refine it according to the structural characteristics of the display panel, keep the lateral and longitudinal dimensions of each unit consistent or adjust them appropriately in the functional layer interface area. The measurement equipment can use a broadband impedance analyzer or a similar broadband LCR test instrument, covering the test frequency from 1Hz to 10MHz, so that the dielectric response of each grid unit in a wide range can be recorded. Doing so can capture the microscopic electrical characteristics of each grid unit, so as to locate areas that may be affected by local ion migration or moisture adsorption during subsequent data processing.

[0086] In the second step, it is necessary to calculate the difference between adjacent units based on the measured dielectric constant and dielectric loss data to generate a distribution map of dielectric properties on the plane. Specifically, the test results of each grid unit can be entered into the data analysis software in the form of a matrix or scattered points, and the difference operation can be performed according to the coordinates of the adjacent units, and the difference distribution can be displayed in the form of contour lines or pseudo-color on the visual interface. Compared with the absolute value of a single grid unit, the difference between adjacent units can better reflect the gradient of local electrical properties in the horizontal or vertical direction, thereby highlighting areas where obvious anomalies or transitions may exist. This distribution map can intuitively display the dielectric differences in the surface layer and local functional layer of the material, providing a reference for subsequent screening of local locations where stray electric fields may exist.

[0087] In the third step, the samples to be tested are placed in an environment with a relative humidity of 25% to 35% and 55% to 65% and the same dielectric property distribution measurement is performed to obtain humidity response data. Environmental control can be achieved through a constant temperature and humidity chamber or a closed system with humidity regulation function. Maintaining the same test frequency range and grid unit division, record the dielectric constant and dielectric loss of each grid unit under different humidity conditions, and also calculate the difference between adjacent units. By comparing the two sets of difference distribution results, the significance of the local area response when the humidity changes can be obtained. If there is a large difference change near certain units or certain functional layers, it means that the relevant area is more sensitive to moisture, which provides an important basis for judging potential ion migration channels or adsorption centers.

[0088] In the fourth step, for those grid units whose dielectric loss difference has exceeded the preset threshold, further continuous frequency scanning is required to obtain a more refined dielectric loss response curve. At this time, the frequency step mode can be set on the same test instrument to focus on testing suspicious units with smaller frequency increments (such as multiple sampling points in each order of magnitude). The scanning process will output a curve of dielectric loss versus frequency, which can reflect information such as polarization relaxation, conductive loss, and other possible adsorption-desorption behaviors. At this stage, if the dielectric loss of certain sections is found to increase nonlinearly or have other abnormal forms, it can be preliminarily inferred that the polarization mechanism or interface effect inside the material has changed, laying the foundation for further analysis.

[0089] In the fifth step, it is necessary to combine the previously obtained planar distribution of dielectric properties, humidity response data, and frequency scanning results to finally confirm the sensitive areas in the polarizer where microscopic stray electric fields or local charge accumulation may exist. By jointly analyzing the previously constructed difference distribution map with the humidity response comparison map and the dielectric loss frequency response curve, it can be determined which areas have the strongest changes in dielectric properties under different humidity conditions, and which areas have abnormal peaks or slope changes in dielectric loss in specific frequency bands. In this way, it is possible to accurately locate and circle the key locations on the sample plane, providing a clear target for evaluating the impact of these sensitive areas on optical performance in subsequent stages. The final result of this process is to obtain one or more schematic diagrams that mark the range of all sensitive grid units worthy of further detection and analysis, as well as their humidity and frequency response characteristics.

[0090] In one embodiment of the present invention, the step of calculating the dielectric property difference between adjacent partitions according to the dielectric constant and the dielectric loss to obtain the spatial distribution of the dielectric property of the polarizer includes:

[0091] The dielectric constant and dielectric loss of each partition of the polarizer are measured by orthogonal scanning to obtain dielectric characteristic data in the horizontal and vertical directions;

[0092] Performing anisotropy analysis on the dielectric property data in the horizontal direction and the vertical direction to determine the orientation distribution state of the antistatic layer or the conductive layer;

[0093] Perform timed repeated measurements in the interface transition region of the antistatic layer or the conductive layer to obtain the time evolution data of the dielectric properties;

[0094] Compensating the time evolution data of the dielectric properties according to the orientation distribution state to obtain the interface charge accumulation state;

[0095] The dielectric property difference of each partition is calculated based on the interface charge accumulation state to obtain the dielectric property spatial distribution of the polarizer.

[0096] The following is a detailed description of the steps involved in the above embodiment:

[0097] In the first step, the object to be tested needs to be placed on a scanning platform that can move in the horizontal and vertical directions according to a pre-established grid, and the dielectric constant and dielectric loss data are obtained in two orthogonal directions. The measurement equipment can use a broadband impedance analyzer or similar instrument, and a fixed contact pressure is maintained between the probe and the sample. After each scan covers all the partitions in the grid, the measured values ​​in the horizontal and vertical directions are recorded separately and stored in the corresponding data matrix. This can provide two sets of independent and comparable test results, laying a quantitative basis for subsequent judgment of the electrical differences of the material in different directions. When implementing this process, a linear round trip or spiral path can also be used to ensure measurement resolution and data integrity. This step enables accurate comparison of dielectric performance in the horizontal and vertical directions, which helps to reveal whether there are differences caused by the arrangement of functional layers or molecular orientation.

[0098] In the second step, the two sets of data in the orthogonal directions need to be compared point by point and mathematically analyzed to evaluate the anisotropy strength. The processing method includes differential operation or vector analysis of the dielectric constant and dielectric loss in the horizontal and vertical directions. If the difference value exceeds the set threshold, it indicates that the corresponding partition has a more significant orientation effect. Through this process, the orientation information of the conductive layer or antistatic layer can be extracted from the two-dimensional plane mapping, and the distribution tendency of these layered structures in the material can be evaluated. If the analysis results show that the dielectric properties of certain partitions are greatly different in the horizontal and vertical directions, it is determined that the functional layer arrangement or ion channel distribution of the partition is obviously separated from other areas.

[0099] In the third step, it is necessary to perform periodic repeated measurements in the interface transition region determined by the previous analysis, and collect records of the dielectric response changes in these regions over time. At this time, the same broadband impedance analyzer as mentioned above is selected to ensure the consistency of the measurement results, and scans are performed multiple times within the specified time interval. By arranging the data from multiple rounds of measurements on the time axis, a set of curves about the evolution of dielectric constant and dielectric loss over time can be obtained. If certain areas show a continuous increase or decrease trend or instantaneous fluctuation phenomenon at different times, it means that there is a charge accumulation or diffusion process at these interfaces, causing changes in dielectric properties. This step helps to identify areas where static characteristics are combined with dynamic characteristics, making subsequent data processing more accurate.

[0100] In the fourth step, it is necessary to compensate the above time evolution data accordingly in combination with the orientation distribution results obtained previously. The compensation method includes introducing the difference coefficients in the horizontal and vertical directions or other parameters characterizing the orientation into the correction formula to reduce or eliminate the impact caused by the uneven distribution of the layered structure. The curve obtained after correction can more objectively reflect the interface charge accumulation speed and degree. By comparing the data before and after compensation of each partition, it can be determined which interface transition areas have more obvious charge accumulation and in which time period the most significant changes occur. This process ensures that dynamic measurement is combined with orientation analysis, and then obtains results that can represent the true charge state inside the material.

[0101] In the fifth step, it is necessary to perform differential calculations on the dielectric properties of different partitions based on the corrected interface charge accumulation data to obtain an overall spatial distribution map. In this operation, the final dielectric constant or dielectric loss value of each partition is compared with its adjacent area, and the size and distribution trend of the difference are presented in a visual manner. If some areas still show high differences after correction, it means that there is obvious charge migration or local polarization state changes here. The spatial distribution map generated in this way not only integrates the anisotropic factors in orthogonal scanning, but also incorporates the dynamic change information in long-term measurements, providing an accurate quantitative mapping of the position and intensity of the stray electric field in the material.

[0102] In one embodiment of the present invention, the step of performing repeated measurements at regular intervals in the interface transition region of the antistatic layer or the conductive layer to obtain the time evolution data of the dielectric properties includes:

[0103] Applying an alternating electric field pretreatment to the interface transition region of the antistatic layer or the conductive layer to measure the initial dielectric properties of the interface transition region;

[0104] Determine the dielectric properties of the interface transition region at preset time intervals to obtain data on changes in the dielectric properties over time;

[0105] Calculating the dielectric property change rate of the interface transition region according to the dielectric property change data over time;

[0106] Performing a time series analysis on the dielectric property change rate to obtain a characteristic time constant of an interface transition region;

[0107] The data of the change of the dielectric property with time is processed in sections according to the characteristic time constant to obtain the time evolution data of the dielectric property in the interface transition area.

[0108] The following is a detailed description of the steps involved in the above embodiment:

[0109] In the first step, an alternating electric field with a preset amplitude and frequency range needs to be applied to the interface transition region so that the region exhibits a measurable polarization or conductive effect under a specific external field excitation. When implemented, a function generator and a broadband impedance analyzer can be used to connect the test fixture, apply an alternating signal to the material surface and immediately record the data of the dielectric constant and dielectric loss. This process can establish a reference point coupled to the external field in the initial state, thereby identifying the initial electrical performance of the interface transition region.

[0110] In the second step, the measurement operation needs to be repeated on the same interface transition area according to the established time plan to obtain the trajectory of the evolution of electrical parameters over time. Each round of measurement can maintain the same wiring method and instrument settings as the first step to ensure consistent measurement conditions. The selected time interval can be appropriately adjusted according to material properties and environmental factors, so that the changes in dielectric parameters in the area can be captured at different time periods, which helps to distinguish whether there are slower or faster charge dynamic processes.

[0111] In the third step, after obtaining multiple sets of time series data, the difference between each set of data needs to be quantified to reflect the speed of change of dielectric properties. The measured data can be processed by difference or ratio first, and then the results are matched with time stamps. If some stages show significant slope changes or the amplitude of changes is significantly higher than other stages, the electrical characteristics of the area can be considered to be undergoing more drastic or abnormal evolution.

[0112] In the fourth step, it is necessary to perform mathematical analysis on the aforementioned change rate sequence to extract the typical response duration of the region in the time domain. Methods such as autocorrelation, Fourier transform or wavelet transform can be used to retrieve regularity and ultimately determine the value of the characteristic time constant. This can indicate the evolution cycle or rhythm of the interface transition region from the initial state to a more stable state under given external field and environmental conditions. This quantitative time scale can help analyze whether potential processes such as ion diffusion and interface polarization occur inside the material.

[0113] In the fifth step, the obtained characteristic time constant needs to be introduced into the existing time series data for segmentation or compensatory processing, so as to extract more accurate dielectric performance in different time periods. If the evolution within a certain time interval has the same dynamic characteristics, it can be regarded as the same stage, and these intervals can be statistically analyzed or modeled separately. The segmented results obtained in this way can reflect the development law of the material's electrical properties over time, and provide a more targeted reference for the subsequent in-depth analysis of the interface charge accumulation state and stray electric field distribution.

[0114] Please continue reading Figure 1 , applying a frequency modulated acoustic signal to the sensitive area, measuring the surface potential change characteristics, and obtaining the charge distribution state of the antistatic layer or the conductive layer;

[0115] In one embodiment of the present invention, applying a frequency modulated acoustic signal to the sensitive area, measuring the surface potential change characteristics, and obtaining the charge distribution state of the antistatic layer or the conductive layer includes:

[0116] Apply amplitude modulated acoustic signals to the sensitive area to measure the transient response characteristics of the surface potential;

[0117] Performing time-frequency analysis on the transient response characteristics to obtain a characteristic frequency spectrum of the potential change;

[0118] adjusting the modulation frequency of the acoustic signal according to the characteristic frequency spectrum, and measuring the steady-state potential distribution at different modulation frequencies;

[0119] Performing stress-potential correlation analysis on the steady-state potential distribution to obtain a charge-stress coupling coefficient;

[0120] The steady-state potential distribution is corrected according to the charge-stress coupling coefficient to obtain the charge distribution state of the antistatic layer or the conductive layer.

[0121] The following is a detailed description of the steps involved in the above embodiment:

[0122] In the first step, a controllable vibration source needs to be arranged in the determined sensitive area to generate an acoustic signal with adjustable amplitude, and a surface potential sensor or an equivalent measuring device is placed in the area to capture the transient potential waveform formed after being excited. A signal generator can be used to connect a piezoelectric transducer or an electromagnetic vibrator to generate acoustic vibrations, and then a high input impedance potential recorder is used for real-time acquisition. By applying amplitude modulated acoustic excitation in a limited area and continuously recording the curve of the potential change over time, transient response data with high time resolution can be obtained. This process helps to observe the initial potential fluctuations formed under the action of acoustic stress coupling, and provides a data basis for the subsequent extraction of frequency domain and stress coupling information.

[0123] In the second step, the collected transient response records need to be converted from the time domain to the frequency domain, and the spectrum analysis is performed in multiple time windows. Methods such as short-time Fourier transform or wavelet transform can be used to decompose the original waveform in two dimensions of time and frequency, so as to extract the main frequency components and their energy distribution corresponding to different moments. If a prominent amplitude peak or abnormal bandwidth appears in a specific interval, it can be determined that there is a specific coupling mode between the acoustic excitation and the material charge. This step can reveal the different modes of response of the potential to acoustic stimulation in a quantitative form and provide a reference for adjusting the key frequency range of the acoustic signal.

[0124] In the third step, the modulation parameters of the acoustic signal need to be reset according to the main frequency components that have been extracted, so as to determine the steady-state potential distribution at several representative frequency points. At this time, the frequency can be set to the high-energy peak or suspicious band found in the previous analysis, and the amplitude modulation or frequency modulation depth of the acoustic signal can be adjusted so that the measured area gradually reaches a quasi-steady state under different excitation conditions. After each steady state, the potential value of the material surface or the functional layer surface is recorded by an equivalent surface potential detection device, and the results are saved in a gridded manner. This step can extend the transient behavior to the steady-state distribution, laying a quantitative basis for the subsequent stress-potential correlation analysis.

[0125] In the fourth step, it is necessary to conduct a comprehensive analysis of the steady-state potential distribution data obtained in connection with the mechanical stress variables, so as to infer the deformation and charge migration effects induced by acoustic vibration inside the material. At this stage, the stress amplitude generated during vibration coupling can be recorded by force sensors or strain gauges, and then compared with the corresponding potential distribution, so as to solve the charge-stress coupling coefficient in the mathematical model. If the stress change corresponding to certain areas is linearly or quasi-linearly related to the surface potential change, the corresponding quantitative coefficient can be obtained to represent the response intensity of the charge under acoustic stress. This step can distinguish the degree of mutual coupling between the external field mechanical vibration and the electrical characteristics of the material, and provide key parameters for correcting the potential distribution.

[0126] In the fifth step, the steady-state potential distribution needs to be corrected according to the aforementioned coupling coefficient to eliminate the interference of the mechanical stress-induced effect on the potential signal, and finally obtain the actual charge distribution state inside the antistatic layer or the conductive layer. The specific method includes introducing the coupling coefficient to perform differential or weight correction on the potential data of each grid point, so that the obtained results are more in line with the electrical intrinsic characteristics of the material when there is no mechanical stress interference. If some grid points still show a higher potential value, it can be judged that there is a more concentrated charge accumulation or migration channel in this area. This step can remove the measurement deviation caused by stress coupling, so that the actual charge situation inside the material can be clearly displayed, and provide accurate data support for subsequent stray electric field evaluation.

[0127] Please continue reading Figure 1 , maintaining the frequency modulated acoustic signal, scanning the polarizer using a dual-probe differential measurement mode, and determining the electric field distribution according to the phase relationship between the potential difference and the acoustic signal;

[0128] In one embodiment of the present invention, the frequency modulated acoustic signal is maintained, a dual-probe differential measurement mode is used to scan the polarizer, and the electric field distribution is determined according to the phase relationship between the potential difference and the acoustic signal, including:

[0129] A reference probe is set in the stable region to measure the dynamic response of the reference potential under the modulation of the acoustic signal;

[0130] Scan the polarizer in a spiral path to obtain the dynamic change data of the electric potential at each scanning point;

[0131] Calculating the potential difference dynamic characteristics of each scanning point according to the reference potential dynamic response and potential dynamic change data;

[0132] Performing phase analysis on the potential difference dynamic characteristics to obtain charge migration response distribution;

[0133] The electric field distribution of the polarizer is determined according to the charge transfer response distribution.

[0134] The following is a detailed description of the steps involved in the above embodiment:

[0135] In the first step, a less disturbed area on the material surface is selected and the probe for detection is fixed there to record the reference potential signal generated under acoustic excitation. This area should be as far away as possible from the transition area of ​​the functional layer or other places where strong fluctuations may exist to make the signal more stable. During measurement, the probe can be connected through a potentiometer with high input impedance and the acoustic driver can be kept working at a given intensity. The resulting reference waveform can reflect the overall response trend of the material under acoustic stimulation and provide a baseline for subsequent comparisons.

[0136] In the second step, the moving mechanism needs to be set to a spiral movement mode to cover the entire grid area of ​​the material. Every time a predetermined scanning point is reached, the same type of probe and the same acoustic excitation parameters as mentioned above are used to synchronously record the time-varying information of the potential at that point. The spiral route can continuously acquire surface potential data without missing the edge and center areas, and store the potential curve associated with time at each coordinate. This process generates a set of dynamic potential data with space and time markers, which lays a reliable data support for the overall distribution analysis.

[0137] In the third step, the baseline waveform obtained by the reference probe and the dynamic potential record of each scanning point need to be input into the data processing module for differential or superposition analysis. By comparing the numerical differences between the reference signal and the signal of each scanning point at each moment, the discrete characteristics of the material in response to acoustic excitation at different positions can be identified. The calculation results are presented in numerical or visual form, showing the deviation in potential between each scanning point and the stable position, which helps to find potential changes caused by abnormal charge accumulation or structural differences in local areas.

[0138] In the fourth step, the above differential results need to be evaluated in terms of phase. Each differential curve can be operated in the time or frequency domain by means of fast Fourier transform or wavelet transform, and the phase difference between each scanning point and the baseline signal can be extracted. If some coordinates show significant phase advance or phase lag, it means that there is active charge migration there, or there is a functional layer that is strongly coupled with acoustic vibration. The phase distribution obtained by analysis can be used to determine which areas are more sensitive to external excitation, thereby forming a charge migration distribution map on the surface or inside of the material.

[0139] In the fifth step, it is necessary to combine the phase distribution data and spatial coordinate information to further deduce the electric field state formed inside the material. If some adjacent coordinates show a continuous gradient or a rapid transition in the phase difference value, it indicates that the field strength in the area has a significant change with the spatial distribution. Mapping these values ​​into visual results of the magnitude and direction of the electric field can intuitively reveal the potential electrostatic accumulation location, ion migration channel, and local areas that may cause polarization interference in the antistatic layer or conductive layer.

[0140] Please continue reading Figure 1 , in the determined abnormal electric field region, the transmission characteristics of the orthogonal polarization state light are measured, and the intensity ratio and phase difference of the polarization components are analyzed;

[0141] In one embodiment of the present invention, the step of measuring the transmission characteristics of the orthogonal polarization state light and analyzing the intensity ratio and phase difference of the polarization components in the determined abnormal electric field region includes:

[0142] The initial transmission characteristics of orthogonal polarization light are measured in the abnormal electric field region to obtain the baseline data when there is no external field effect;

[0143] Applying a progressive stress field in an orthogonal direction to the abnormal electric field region, and measuring the transmission characteristic change data under the stress field;

[0144] Calculating stress-induced optical anisotropy contribution based on the baseline data and the transmission characteristic change data;

[0145] Deducting the stress-induced optical anisotropy contribution from the transmission characteristic change data to obtain the electric field-induced polarization state modulation characteristics;

[0146] The intensity ratio and phase difference of the polarization components are determined according to the polarization state modulation characteristics induced by the electric field.

[0147] The following is a detailed description of the steps involved in the above embodiment:

[0148] In the first step, an optical detection system needs to be built at the location where the abnormal electric field is identified. It usually includes orthogonal polarizers and analyzers, and then cooperates with light sources and light detectors to record the intensity and phase information of the transmitted light. First, observe the area in an environment without external mechanical action, and use the collected transmitted light data as a basic reference. In this process, the supporting software can be used to record the changes of light intensity with wavelength or angle point by point or continuously to ensure that the accurate starting state is obtained without any external field interference.

[0149] In the second step, it is necessary to apply gradually increasing stress in the same area to produce different degrees of mechanical deformation inside the material, and keep the optical detection going during this process. The stress can be applied by a pressure head load device or a tension control platform, but it is necessary to ensure that the loading direction is orthogonal to the sample plane. After each change in stress amplitude, the transmission intensity and polarization information of the light passing through the area must be repeatedly detected, so that subsequent calculations can clearly distinguish the optical adjustment process of the material under stress conditions.

[0150] In the third step, it is necessary to differentiate or compare this series of optical signals generated by stress adjustment with the basic reference data in the first paragraph to obtain the anisotropy coefficient caused by external mechanical deformation in the area. If it is found that the change in optical signals corresponding to certain stress levels is prominent, it can be determined that the area is more sensitive to external stress. The stress-induced contribution obtained in this way can characterize the optical refractive index or phase shift caused by the deformation of the material layer structure or molecular orientation under stress.

[0151] In the fourth step, the stress-induced contribution needs to be deducted from the comparison results of the second paragraph and the first paragraph to exclude the optical changes caused by mechanical stress, and then highlight the polarization state modulation phenomenon caused by the internal electric field. When performing this operation, the measured data at each wavelength or incident angle can be fitted point by point or as a whole with the stress contribution, and then the pure electric field effect can be separated. This will enable subsequent calculations to more realistically reflect the impact of the internal stray electric field of the material on the optical properties.

[0152] In the fifth step, it is necessary to analyze the intensity ratio and phase difference between the mutually perpendicular polarization components in the transmitted light based on the above-mentioned subtraction results, so as to understand the additional birefringence or optical rotation effect brought by the electric field. If this process needs to be quantified, the channel intensity or phase information of the transmitted light in the two orthogonal polarization directions can be obtained through the detector, and then the ratio and phase difference of each channel can be calculated. After this step is completed, an accurate judgment can be made on what kind of polarization modulation is produced by the electric field distribution in the material, and the performance characteristics of the polarizer in an abnormal electric field environment can be further inferred.

[0153] Please continue reading Figure 1 Based on the charge distribution state, electric field distribution and transmittance characteristics of polarized light, the stray electric field distribution in the antistatic layer or the conductive layer and its influence on the optical properties of the polarizer are analyzed.

[0154] In one embodiment of the present invention, the analyzing the stray electric field distribution in the antistatic layer or the conductive layer and its influence on the optical properties of the polarizer based on the charge distribution state, the electric field distribution and the transmittance characteristics of the polarized light includes:

[0155] Calculating the charge-electric field coupling coefficient according to the spatial correspondence between the charge distribution state and the electric field distribution, and obtaining the abnormal electric field regional distribution data in the antistatic layer or the conductive layer;

[0156] Performing layer-wise analysis on the abnormal electric field regional distribution data to obtain the stray electric field distribution characteristics of the antistatic layer or the conductive layer at different depths;

[0157] Correcting the stray electric field distribution characteristics according to the transmission characteristics of the polarized light to obtain the intrinsic electric field distribution data of the antistatic layer or the conductive layer;

[0158] Continuously sampling and analyzing the charge distribution state to obtain charge migration characteristic data in the antistatic layer or the conductive layer;

[0159] Correcting the intrinsic electric field distribution data according to the charge migration characteristic data to obtain the time-varying distribution characteristics of the stray electric field in the antistatic layer or the conductive layer;

[0160] The transmittance characteristics of the polarized light are analyzed according to the time-varying distribution characteristics of the stray electric field to obtain transmittance attenuation data and extinction ratio change data of the polarizer.

[0161] The following is a detailed description of the steps involved in the above embodiment:

[0162] In the first step, the previously acquired charge distribution map and electric field distribution map need to be called and matched one-to-one in the spatial coordinates. The charge density of each grid cell can be numerically associated with the field strength or potential difference value at the corresponding position, and linear or nonlinear fitting parameters can be extracted using data visualization or matrix operation tools to form numerical coefficients representing the degree of local coupling. If certain areas show a high coupling coefficient, it means that the interaction between the local charge and the electric field is stronger, thereby generating three-dimensional distribution information that is considered to be an abnormal electric field area.

[0163] In the second step, the aforementioned abnormal distribution data needs to be analyzed longitudinally to determine whether there is a gradient change in coupling strength with layer thickness at different row depths. At this time, the entire material can be divided into several planes or sections using a layered profile test device or multi-angle optical detection means to collect more detailed data, and a layered diagram can be superimposed on a visualization platform. By comparing the differences in coupling coefficients within each section, the distribution characteristics of stray electric fields in the depth direction at different functional layer interfaces or specific areas can be identified.

[0164] In the third step, it is necessary to refer to the measured polarization transmission characteristics and eliminate the effects caused by material anisotropy or other edge effects from the stray electric field distribution. The optical transmission measurement can be compared with the previous electric field gradient data to build a correction model to eliminate the numerical deviations that are not related to the light propagation path, so as to obtain a more realistic intrinsic electric field distribution result. If there are abnormal increases or decreases in certain polarization directions, the calculation parameters can be adjusted appropriately to make the corrected spatial distribution more consistent with the actual conditions inside the material.

[0165] In the fourth step, the aforementioned charge distribution needs to be repeatedly measured at a certain time sequence to obtain the trajectory of the charge change over time at each depth position, and these trajectories are recorded as charge migration characteristic information. The instrument can use the same type of potential probe or dielectric test device to perform multiple rounds of collection at a pre-set time interval. By comparing the data of adjacent time periods, it is possible to identify whether there is a phenomenon of slow movement or sudden accumulation, thereby reflecting the migration law of different charges in the functional layer or interface of the material.

[0166] In the fifth step, it is necessary to use the obtained charge migration characteristic data and the corrected intrinsic electric field distribution for comprehensive calculation to form a stray electric field map that can reflect the changes in the time dimension. At this time, the transient electric field strength or direction of each grid unit can be updated separately. If the field strength step is caused by the high charge accumulation rate in some areas, significant time-varying characteristics may appear in the final result. This mapping will provide an intuitive basis for identifying progressive aging or intermittent failures.

[0167] In the sixth step, it is necessary to analyze the attenuation of light transmittance and extinction ratio over time again based on the time-varying information of the stray electric field and the polarization state light detection system. The polarization transmission data at different time points can be compared with the electric field distribution diagram at the corresponding moment, and the evolution of key optical parameters can be refined by interpolation or fitting. If the field intensity in certain areas suddenly increases within a specific time period, the transmittance or extinction ratio at the corresponding position will change by a corresponding amount, thereby intuitively reflecting the impact of the electric field disturbance on the final optical performance of the polarizer.

[0168] In one embodiment of the present invention, the layer-wise analysis of the abnormal electric field regional distribution data to obtain the stray electric field distribution characteristics of the antistatic layer or the conductive layer at different depths includes:

[0169] Discretize the abnormal electric field regional distribution data in the depth direction, calculate the electric field gradient between adjacent layers according to the processing results, and obtain the interface charge accumulation characteristics of the antistatic layer or the conductive layer;

[0170] Performing a threshold analysis on the interface charge accumulation characteristics to determine the charge trap distribution data in the antistatic layer or the conductive layer;

[0171] Calculating effective stray electric field distribution according to the charge trap distribution data to obtain orientation characteristics of the stray electric field in the antistatic layer or the conductive layer;

[0172] The interfacial stress distribution is calculated based on the orientation characteristics of the stray electric field to obtain the stray electric field distribution characteristics of the antistatic layer or the conductive layer at different depths.

[0173] The following is a detailed description of the steps involved in the above embodiment:

[0174] In the first step, it is necessary to perform layer-wise subdivision of the material based on the identified electric field distribution data, and record the electric field information of each discrete layer in a layered matrix. A detection platform with multi-angle or adjustable incident depth function can be used to observe the material layer by layer, or the overall thickness range can be subdivided into several uniform or non-uniform sections in combination with previous scanning results. By numerically processing the potential difference or field strength value of each section, the gradient size between adjacent layers can be calculated, and the charge accumulation pattern at the junction of the functional layers can be inferred. The gradient value obtained in this way can be presented as a curve or pseudo-color image in a specific visualization software, providing clear quantitative results for understanding whether there is a significant interface charge change inside the material.

[0175] In the second step, the aforementioned interface accumulation information needs to be compared with the pre-set judgment value to identify whether there are areas of concentrated charge storage or blocking in each depth layer of the material. Here, the gradient value can be compared with the potential threshold, or the parameters of each discrete layer can be clustered in a statistically based way to identify layers where the characteristic quantity is above or below a certain threshold. If the value of a certain depth layer is significantly larger than that of other sections, it can be marked as an area with active charge storage or stronger ion trapping ability. In this way, the distribution of charge traps at different depths can be clarified, and the location in the functional layer where charge retention is most likely to occur can be determined.

[0176] In the third step, after completing the above trap analysis, it is necessary to use the acquired trap distribution information to correct the local electric field calculation model of the material to obtain a stray electric field state that is more in line with the actual situation. If the charge trap distribution is more concentrated in certain interface layers, the local field strength at the corresponding position will often be offset. Through data interpolation or correction algorithms, combined with the orientation information of each trap area, a more accurate electric field distribution in three-dimensional coordinates or cross-sectional views can be output, and the arrangement or tendency in the horizontal or vertical direction can be identified. In this way, we can gain an in-depth understanding of the changing laws of the dominant direction of the electric field under the multi-layer structure in the material, and provide an accurate visual reference for determining potential failure modes in the functional layer.

[0177] In the fourth step, it is necessary to infer the stress distribution generated between interfaces based on the electric field orientation information obtained in the previous step and the knowledge of the mechanical properties of the material. This process can use finite element simulation or simplified numerical methods to couple the electric field vector with parameters such as the elastic coefficient or Young's modulus of the material to obtain the stress values ​​generated by the interaction between the electric field and the functional layer at different depths. If the electric field orientation and intensity are significantly higher in a certain depth layer, local stress concentration is more likely to occur at that location. By superimposing these stress and electric field distribution maps, the local high stress areas between the layers inside the material can be intuitively displayed in a three-dimensional coordinate system, which helps to assess potential risks during long-term use and provide a basis for improving design solutions or preparation processes.

[0178] The above describes the detection method of the polarizer in the embodiment of the present invention. The following describes the detection device of the polarizer in the embodiment of the present invention. Figure 2 , an embodiment of the detection device of the polarizer in the embodiment of the present invention includes:

[0179] The dielectric property measurement module 101 is used to measure the dielectric property of the polarizer by using a broadband dielectric spectrum, analyze the curve of the dielectric property changing with the frequency, and determine the distribution of the sensitive area of ​​the polarizer;

[0180] A charge distribution measurement module 102 is used to apply a frequency modulated acoustic signal to a sensitive area to measure the surface potential change characteristics and obtain the charge distribution state of the antistatic layer or the conductive layer;

[0181] The electric field distribution determination module 103 is used to maintain the frequency modulated acoustic signal, scan the polarizer using a dual-probe differential measurement mode, and determine the electric field distribution according to the phase relationship between the potential difference and the acoustic signal;

[0182] The optical characteristic measurement module 104 is used to measure the transmission characteristics of the orthogonal polarization state light in the determined abnormal electric field area and analyze the intensity ratio and phase difference of the polarization components;

[0183] The performance impact analysis module 105 is used to analyze the stray electric field distribution in the antistatic layer or the conductive layer and its impact on the optical performance of the polarizer based on the charge distribution state, the electric field distribution and the transmission characteristics of the polarized light.

[0184] The above description is only a preferred embodiment of the present invention, and does not limit the patent scope of the present invention. All equivalent structural changes made by using the contents of the present invention specification and drawings under the inventive concept of the present invention, or directly / indirectly applied in other related technical fields are included in the patent protection scope of the present invention.

Claims

1. A method for detecting a polarizer, characterized in that: The polarizer includes an antistatic layer or a conductive layer, and the detection method of the polarizer includes: The dielectric properties of the polarizer are measured by broadband dielectric spectroscopy, the curve of the change of dielectric properties with frequency is analyzed, and the distribution of sensitive areas of the polarizer is determined; the dielectric properties of the polarizer are measured by broadband dielectric spectroscopy, the curve of the change of dielectric properties with frequency is analyzed, and the distribution of sensitive areas of the polarizer is determined, including: gridding the polarizer, and measuring the dielectric constant and dielectric loss of each partition in the frequency range of 1 Hz to 10 MHz; calculating the difference in dielectric properties of adjacent partitions according to the dielectric constant and dielectric loss, and obtaining the spatial distribution of dielectric properties of the polarizer; measuring the spatial distribution of dielectric properties under relative humidity of 25% to 35% and relative humidity of 55% to 65%, respectively, and obtaining humidity response data of dielectric properties; performing continuous frequency scanning in the range of 1 Hz to 10 MHz for the partitions whose dielectric loss difference exceeds a preset threshold, and measuring the frequency response curve of dielectric loss; determining the distribution of sensitive areas of the polarizer according to the spatial distribution of dielectric properties, humidity response data and frequency response curve; Applying a frequency modulated acoustic signal to the sensitive area, measuring the surface potential change characteristics, and obtaining the charge distribution state of the antistatic layer or the conductive layer; Maintain the frequency modulated acoustic signal, scan the polarizer using a dual-probe differential measurement mode, and determine the electric field distribution according to the phase relationship between the potential difference and the acoustic signal; Maintain the frequency modulated acoustic signal, scan the polarizer using a dual-probe differential measurement mode, and determine the electric field distribution according to the phase relationship between the potential difference and the acoustic signal, including: setting a reference probe in a stable area to measure the reference potential dynamic response under acoustic signal modulation; scanning the polarizer in a spiral path to obtain potential dynamic change data at each scanning point; calculating the potential difference dynamic characteristics of each scanning point based on the reference potential dynamic response and the potential dynamic change data; performing phase analysis on the potential difference dynamic characteristics to obtain charge migration response distribution; and determining the electric field distribution of the polarizer based on the charge migration response distribution; In the determined abnormal electric field area, the transmission characteristics of the orthogonal polarization state light are measured, and the intensity ratio and phase difference of the polarization components are analyzed; Based on the charge distribution state, electric field distribution and the transmission characteristics of orthogonal polarized light, the stray electric field distribution in the antistatic layer or the conductive layer and its influence on the optical properties of the polarizer are analyzed; based on the charge distribution state, electric field distribution and the transmission characteristics of orthogonal polarized light, the stray electric field distribution in the antistatic layer or the conductive layer and its influence on the optical properties of the polarizer are analyzed, including: according to the spatial correspondence between the charge distribution state and the electric field distribution, the charge-electric field coupling coefficient is calculated to obtain the abnormal electric field area distribution data in the antistatic layer or the conductive layer; the abnormal electric field area distribution data is analyzed layer by layer to obtain the abnormal electric field area distribution data in the antistatic layer or the conductive layer. The stray electric field distribution characteristics of the conductive layer at different depths; according to the transmission characteristics of the orthogonal polarization state light, the stray electric field distribution characteristics are corrected to obtain the intrinsic electric field distribution data of the antistatic layer or the conductive layer; the charge distribution state is continuously sampled and analyzed to obtain the charge migration characteristic data in the antistatic layer or the conductive layer; according to the charge migration characteristic data, the intrinsic electric field distribution data is corrected to obtain the time-varying distribution characteristics of the stray electric field in the antistatic layer or the conductive layer; according to the time-varying distribution characteristics of the stray electric field, the transmission characteristics of the orthogonal polarization state light are analyzed to obtain the transmittance attenuation data and the extinction ratio change data of the polarizer.

2. The method for detecting a polarizer according to claim 1, characterized in that: The step of calculating the dielectric property difference between adjacent partitions according to the dielectric constant and the dielectric loss to obtain the dielectric property spatial distribution of the polarizer includes: The dielectric constant and dielectric loss of each partition of the polarizer are measured by orthogonal scanning to obtain dielectric characteristic data in the horizontal and vertical directions; Performing anisotropy analysis on the dielectric property data in the horizontal direction and the vertical direction to determine the orientation distribution state of the antistatic layer or the conductive layer; Perform timed repeated measurements in the interface transition region of the antistatic layer or the conductive layer to obtain the time evolution data of the dielectric properties; Compensating the time evolution data of the dielectric properties according to the orientation distribution state to obtain the interface charge accumulation state; The dielectric property difference of each partition is calculated based on the interface charge accumulation state to obtain the dielectric property spatial distribution of the polarizer.

3. The method for detecting a polarizer according to claim 2, characterized in that: The method of performing repeated measurements at regular intervals in the interface transition region of the antistatic layer or the conductive layer to obtain the time evolution data of the dielectric properties includes: Applying an alternating electric field pretreatment to the interface transition region of the antistatic layer or the conductive layer to measure the initial dielectric properties of the interface transition region; Determine the dielectric properties of the interface transition region at preset time intervals to obtain data on changes in the dielectric properties over time; Calculating the dielectric property change rate of the interface transition region according to the dielectric property change data over time; Performing a time series analysis on the dielectric property change rate to obtain a characteristic time constant of an interface transition region; The data of the change of the dielectric property with time is processed in sections according to the characteristic time constant to obtain the time evolution data of the dielectric property in the interface transition area.

4. The method for detecting a polarizer according to claim 1, characterized in that: The step of applying a frequency modulated acoustic signal to the sensitive area, measuring the surface potential change characteristics, and obtaining the charge distribution state of the antistatic layer or the conductive layer includes: Apply amplitude modulated acoustic signals to the sensitive area to measure the transient response characteristics of the surface potential; Performing time-frequency analysis on the transient response characteristics to obtain a characteristic frequency spectrum of the potential change; adjusting the modulation frequency of the acoustic signal according to the characteristic frequency spectrum, and measuring the steady-state potential distribution at different modulation frequencies; Performing stress-potential correlation analysis on the steady-state potential distribution to obtain a charge-stress coupling coefficient; The steady-state potential distribution is corrected according to the charge-stress coupling coefficient to obtain the charge distribution state of the antistatic layer or the conductive layer.

5. The method for detecting a polarizer according to claim 1, characterized in that: The method of measuring the transmission characteristics of the orthogonal polarization state light in the determined abnormal electric field region and analyzing the intensity ratio and phase difference of the polarization components includes: The initial transmission characteristics of orthogonal polarization light are measured in the abnormal electric field region to obtain the baseline data when there is no external field effect; Applying a progressive stress field in an orthogonal direction to the abnormal electric field region, and measuring the transmission characteristic change data under the stress field; Calculating stress-induced optical anisotropy contribution based on the baseline data and the transmission characteristic change data; Deducting the stress-induced optical anisotropy contribution from the transmission characteristic change data to obtain the electric field-induced polarization state modulation characteristics; The intensity ratio and phase difference of the polarization components are determined according to the polarization state modulation characteristics induced by the electric field.

6. The method for detecting a polarizer according to claim 1, characterized in that: The layer-wise analysis of the abnormal electric field regional distribution data to obtain the stray electric field distribution characteristics of the antistatic layer or the conductive layer at different depths includes: Discretize the abnormal electric field regional distribution data in the depth direction, calculate the electric field gradient between adjacent layers according to the processing results, and obtain the interface charge accumulation characteristics of the antistatic layer or the conductive layer; Performing a threshold analysis on the interface charge accumulation characteristics to determine the charge trap distribution data in the antistatic layer or the conductive layer; Calculating effective stray electric field distribution according to the charge trap distribution data to obtain orientation characteristics of the stray electric field in the antistatic layer or the conductive layer; The interfacial stress distribution is calculated based on the orientation characteristics of the stray electric field to obtain the stray electric field distribution characteristics of the antistatic layer or the conductive layer at different depths.

7. A polarizer detection device, characterized in that: The polarizer detection device adopts the polarizer detection method according to any one of claims 1 to 6, and the polarizer detection device comprises: A dielectric property measurement module, used to use a broadband dielectric spectrum to measure the dielectric properties of a polarizer, analyze the curve of the dielectric properties changing with frequency, and determine the distribution of sensitive areas of the polarizer; the use of a broadband dielectric spectrum to measure the dielectric properties of a polarizer, analyze the curve of the dielectric properties changing with frequency, and determine the distribution of sensitive areas of the polarizer, including: gridding the polarizer, and measuring the dielectric constant and dielectric loss of each partition in the frequency range of 1 Hz to 10 MHz; calculating the dielectric property difference of adjacent partitions according to the dielectric constant and dielectric loss, and obtaining the spatial distribution of the dielectric properties of the polarizer; measuring the spatial distribution of the dielectric properties under relative humidity of 25% to 35% and relative humidity of 55% to 65%, respectively, and obtaining humidity response data of the dielectric properties; performing a continuous frequency scan in the range of 1 Hz to 10 MHz for the partitions whose dielectric loss difference exceeds a preset threshold, and measuring the frequency response curve of the dielectric loss; determining the distribution of sensitive areas of the polarizer according to the dielectric property spatial distribution, humidity response data, and frequency response curve; A charge distribution measurement module, used to apply a frequency modulated acoustic signal to a sensitive area, measure the surface potential change characteristics, and obtain the charge distribution state of the antistatic layer or the conductive layer; An electric field distribution determination module, used to maintain the frequency modulated acoustic signal, scan the polarizer using a dual-probe differential measurement mode, and determine the electric field distribution according to the phase relationship between the potential difference and the acoustic signal; the frequency modulated acoustic signal is maintained, the polarizer is scanned using a dual-probe differential measurement mode, and the electric field distribution is determined according to the phase relationship between the potential difference and the acoustic signal, including: setting a reference probe in a stable area to measure the reference potential dynamic response under acoustic signal modulation; scanning the polarizer in a spiral path to obtain potential dynamic change data at each scanning point; calculating the potential difference dynamic characteristics of each scanning point according to the reference potential dynamic response and the potential dynamic change data; performing phase analysis on the potential difference dynamic characteristics to obtain charge migration response distribution; and determining the electric field distribution of the polarizer according to the charge migration response distribution; An optical property measurement module is used to measure the transmission characteristics of orthogonal polarization state light in a determined abnormal electric field area and analyze the intensity ratio and phase difference of the polarization components; A performance impact analysis module, for analyzing the stray electric field distribution in the antistatic layer or the conductive layer and its influence on the optical performance of the polarizer based on the charge distribution state, the electric field distribution and the transmission characteristics of the orthogonal polarization state light; the analysis of the stray electric field distribution in the antistatic layer or the conductive layer and its influence on the optical performance of the polarizer based on the charge distribution state, the electric field distribution and the transmission characteristics of the orthogonal polarization state light, including: calculating the charge-electric field coupling coefficient according to the spatial correspondence between the charge distribution state and the electric field distribution, and obtaining the abnormal electric field area distribution data in the antistatic layer or the conductive layer; performing layer-wise analysis on the abnormal electric field area distribution data to obtain the The stray electric field distribution characteristics of the antistatic layer or the conductive layer at different depths; according to the transmission characteristics of the orthogonal polarized light, the stray electric field distribution characteristics are corrected to obtain the intrinsic electric field distribution data of the antistatic layer or the conductive layer; the charge distribution state is continuously sampled and analyzed to obtain the charge migration characteristic data in the antistatic layer or the conductive layer; according to the charge migration characteristic data, the intrinsic electric field distribution data is corrected to obtain the time-varying distribution characteristics of the stray electric field in the antistatic layer or the conductive layer; according to the time-varying distribution characteristics of the stray electric field, the transmission characteristics of the orthogonal polarized light are analyzed to obtain the transmittance attenuation data and the extinction ratio change data of the polarizer.

Images