Pinhole inspection device

Abstract

The present invention relates to a pinhole inspection apparatus, comprising: a transfer unit that transfers a tray on which an inspection object is loaded along a preset transfer path; and an inspection unit provided at a preset inspection position of the transfer path and performing pinhole inspection on the inspection object loaded on the tray, the inspection unit including: a darkroom having an imaging space formed therein so as to be separated from the outside; a lifter that lifts and lowers the tray that has reached the inspection position so that the tray enters the imaging space or is drawn out from the imaging space; an illumination unit configured to irradiate inspection light to the inspection object entering the imaging space along with the tray; a camera shooting the inspection object entering the shooting space to generate a shooting image related to the inspection object; and a visual processing unit that analyzes the captured image and performs pinhole inspection on the inspection object.

Description

Technical Field

[0001] The invention relates to a pinhole inspection device. Background Art

[0002] Recently, as the world implements carbon reduction policies to combat climate change, the era of internal combustion engine vehicles is rapidly changing to the era of electric vehicles. As the downstream industry changes, the market for electric vehicle batteries will grow, and as a result, the demand for copper thin films as secondary battery electrode materials will increase significantly.

[0003] On the other hand, when preparing copper foil film, pinholes, which are tiny holes that penetrate the copper foil film, frequently occur during the preparation process of the copper foil film. In the past, workers used their naked eyes to manually identify pinhole defects to determine the defects of the copper foil film caused by the pinhole defects. For this existing pinhole inspection method, each worker has a different inspection standard, and due to repeated operations, the workers often feel dizzy and their recognition ability decreases. In this regard, according to the existing pinhole inspection method, the detection rate of pinholes and the reliability of the pinhole inspection results are reduced, so there is a problem that it is difficult to determine the defects of the copper foil film caused by pinhole defects. Summary of the invention

[0004] The present invention is used to solve the problems of the prior art. The purpose of the present invention is to provide an improved pinhole inspection device that can automatically inspect pinholes in a copper foil film.

[0005] A pinhole inspection device according to a preferred embodiment of the present invention for solving the above-mentioned problem comprises: a transfer unit for transferring a tray loaded with an inspection object along a preset transfer path; and an inspection unit for being arranged at a preset inspection position on the transfer path for performing a pinhole inspection on the inspection object loaded on the tray, the inspection unit comprising: a darkroom for forming a shooting space inside the tray in a manner separated from the outside; a lift for lifting the tray that has reached the inspection position so as to enter into the shooting space or be led out from the shooting space; lighting for irradiating inspection light to the inspection object that has entered into the shooting space along with the tray; a camera for photographing the inspection object that has entered into the shooting space to generate a photographed image related to the inspection object; and a visual processing unit for analyzing the photographed image to perform a pinhole inspection on the inspection object.

[0006] The present invention relates to a pinhole inspection device, which performs pinhole inspection on the inspection object by detecting and analyzing the bright spot generated by the inspection light passing through the pinhole of the inspection object by photographing the inspection object irradiated with the inspection light in the dark environment of a dark room. According to the present invention, the noise caused by the surface reflection of the inspection object can be suppressed, the recognition of pinhole defects and other surface defects can be improved, the complexity of the photographed image of the inspection object can be reduced, the recognition of the pinhole can be improved by the diffusion effect of the inspection light generated when the inspection light passes through the pinhole, and the transmittance of the inspection light through the inspection object can be adjusted by adjusting the brightness of the inspection light, thereby improving the accuracy of the pinhole inspection. BRIEF DESCRIPTION OF THE DRAWINGS

[0007] Figure 1 It is a block diagram showing a control system of a pinhole inspection device according to a preferred embodiment of the present invention.

[0008] Figure 2 To show Figure 1 A front view of the simplified structure of the pinhole inspection device shown.

[0009] Figure 3 To show Figure 2 A top view of the schematic structure of the transfer device shown.

[0010] Figure 4 A top view showing the simplified structure of the tray is shown below. Figure 5 This is a cross-sectional view showing the schematic structure of a tray.

[0011] Figure 6 and Figure 7 A diagram for explaining the connection between a pallet and a shuttle.

[0012] Figures 8 to 16 It is a diagram for explaining a method of implementing a loading process of inspection objects and a temporary storage process of trays.

[0013] Fig.17 and Fig.18 A diagram for explaining a method of transferring a tray temporarily stored in a first storage unit to an inspection unit.

[0014] Fig.19 It is a block diagram for explaining the control system of the inspection unit.

[0015] Fig. 20 and Fig.21 It is a diagram for explaining a method of causing a tray that has reached an inspection position to enter an imaging space of a darkroom.

[0016] Fig. 22 This is a diagram for explaining a method of performing a pinhole inspection on an inspection object loaded on a tray in an imaging space of a darkroom.

[0017] Fig.23 and Fig.24 A diagram for explaining a method of photographing an inspection object.

[0018] Fig.25 A diagram for explaining a method of performing a pinhole inspection using a captured image of an inspection object.

[0019] Fig.26 and Fig. 27 A diagram showing a state in which a tray directly passes through the second storage unit when the pinhole inspection is performed according to the forward inspection method.

[0020] Figures 28 to 30 It is a diagram for explaining a method of storing a plurality of trays from which inspection objects have been unloaded in the second loading / unloading unit.

[0021] Description of Reference Numerals

[0022] 1: Pinhole inspection device

[0023] 10: Controller

[0024] 20: Transfer unit

[0025] 22: Tray 22a: Holding groove

[0026] 22b: Carrying slot 22c: Loading slot

[0027] 22d: Guide hole

[0028] 24: Transfer track 26: Shuttle

[0029] 26a: Shuttle body 26b: Clamp

[0030] 26c: Holding member 26d: Transfer member

[0031] 30: First loading / unloading unit

[0032] 32: First loading / unloading platform 32a: First loading / unloading slot

[0033] 34: First loading / unloading lift

[0034] 40: First storage unit

[0035] 42: First storage carrier 42a: First storage carrier tank

[0036] 44: First storage lift

[0037] 50: Inspection unit

[0038] 51: Darkroom

[0039] 51a: Shooting space 51b: Entrance and exit

[0040] 52: lift 52a: support bracket

[0041] 52b: Lifting parts

[0042] 52d: Arrangement groove 52c: Bracket

[0043] 53: Lighting 54: Camera

[0044] 55: Camera transfer machine

[0045] 60: Second storage unit

[0046] 62: Second storage carrier 62a: Second storage carrier slot

[0047] 64: Second storage lift

[0048] 70: Second loading / unloading unit

[0049] 72: Second loading / unloading platform 72a: Second loading / unloading slot

[0050] 74: Second loading / unloading lift

[0051] P: Inspection object As: Shooting area

[0052] Hp: Pinhole Li: Inspection light

[0053] I: Capture image S: Highlight

[0054] P1: First loading / unloading position P2: First storage position

[0055] P3: Inspection position P4: Second storage position

[0056] P5: Second loading / unloading position DETAILED DESCRIPTION

[0057] Figure 1 1 is a block diagram showing a control system of a pinhole inspection device according to a preferred embodiment of the present invention. Figure 2 To show Figure 1 The front view of the simplified structure of the pinhole inspection device shown in FIG. Figure 3 To show Figure 2 A top view of the schematic structure of the transfer device shown.

[0058] Reference Figures 1 to 3The pinhole inspection device 1 of the preferred embodiment of the present invention is used to implement pinhole inspection on the inspection object P, which may include a controller 10, a transfer unit 20, a first loading / unloading unit 30, a first storage unit 40, an inspection unit 50, a second storage unit 60, a second loading / unloading unit 70, etc.

[0059] Preferably, the inspection object P for which the pinhole inspection system 1 can be used to implement the pinhole inspection is a copper foil film as an electrode material of a secondary battery, but it is not limited thereto. That is, in addition to the copper foil film, the inspection object P can also be one of a variety of foil films that can cause pinhole defects.

[0060] First, the controller 10 is used to control various devices provided in the pinhole inspection system 1 .

[0061] The controller 10 may be a generally used personal computer, other devices for controlling various devices, and a detailed description thereof will be omitted.

[0062] Figure 4 A top view showing the simplified structure of the tray is shown below. Figure 5 A cross-sectional view showing a simplified structure of a tray. Figure 6 and Figure 7 A diagram for explaining the connection between a pallet and a shuttle.

[0063] Next, the transfer unit 20 is a device for transferring the inspection object P along a preset transfer path.

[0064] The structure of the transfer unit 20 is not particularly limited. Figure 2 As shown, the transfer unit 20 may include: a tray 22, which can load or unload the inspection object P; a transfer track 24, which extends along a preset transfer path; and a shuttle 26, which is movably mounted on the transfer track 24, and transfers the tray 22 and the inspection object P loaded on the tray 22 along the transfer path.

[0065] The transfer path is determined to utilize the shuttle 26 to reciprocately transfer the pallet 22 along the transfer direction, so that the pallet 22 can be selectively set in a first loading / unloading position P1, a first storage position P2, an inspection position P3, a second storage position P4, and a second loading / unloading position P5 that are determined sequentially according to a preset transfer direction.

[0066] The inspection position P3 is a position for performing a pinhole inspection on the inspection object P loaded on the tray 22 .

[0067] The first loading / unloading position P1 and the second loading / unloading position P5 are positions for loading or unloading the inspection object P onto or from the tray 22. The first loading / unloading position P1 and the second loading / unloading position P5 are respectively formed at one of the two end points of the transfer path across the inspection position P3.

[0068] The first storage position P2 and the second storage position P4 are positions for temporarily storing the tray 22 loaded with the inspection object P. The first storage position P2 is formed between the first loading / unloading position P1 and the inspection position P3, and the second storage position P4 is formed between the second loading / unloading position P5 and the inspection position P3.

[0069] According to the transfer path, the inspection object P can be subjected to pinhole inspection according to one of the forward inspection method in which the inspection object P loaded on the pallet 22 at the first loading / unloading position P1 is subjected to pinhole inspection at the inspection position P3 and then the inspection object P is unloaded at the second loading / unloading position P5, and the reverse inspection method in which the inspection object P loaded on the pallet 22 at the second loading / unloading position P5 is subjected to pinhole inspection at the inspection position P3 and then the inspection object P is unloaded at the first loading / unloading position P1. In particular, when the forward inspection method is implemented, temporary storage of the pallet 22 loaded with the inspection object P is implemented only at the first storage position P2, and the pallet 22 is not temporarily stored at the second storage position P4 but is directly passed. Also, when the reverse inspection method is implemented, temporary storage of the pallet 22 loaded with the inspection object P is implemented only at the second storage position P4, and the pallet 22 is not temporarily stored at the first storage position P2 but is directly passed.

[0070] For the convenience of explanation, the present invention will be described below based on a case where a pinhole inspection is performed on the inspection object P according to the forward inspection method.

[0071] The tray 22 is a member for transporting the inspection objects P along the transport path while arranging them in a predetermined arrangement.

[0072] The structure of the tray 22 is not particularly limited. Figure 5 and Figure 6 As shown, the tray 22 may include a holding slot 22a, a carrying slot 22b, a loading slot 22c, a guide hole 22d, and the like.

[0073] The holding groove 22 a is recessed along the circumference of the lower portion of the tray 22 so that the lower portion has a predetermined length and width.

[0074] The carrying groove 22b is recessed on the upper surface of the tray 22 so as to have the same length and width as the lower portion of the tray 22. In particular, the height of the carrying groove 22b is lower than the height of the holding groove 22a by a predetermined interval.

[0075] The loading slot 22c is recessed in the bottom surface of the carrying slot 22b so as to be connected to the carrying slot 22b when the length and width are the same as the length and width of the inspection object P or are larger than the length and width of the inspection object P by a preset ratio.

[0076] The guide hole 22d is formed through the lower surface of the tray 22 so as to communicate with the loading slot 22c while having a length and a width smaller than the length and the width of the inspection object P by a predetermined ratio.

[0077] Such a pallet 22 can be gripped by the shuttle 26 by hanging a clamp 26b of the shuttle 26 described later on the gripping groove 22a. The specific method of gripping the shuttle 26 by the clamp 26b will be described later.

[0078] Furthermore, the pallets 22 can be transported in multiple layers by inserting the lower portion of one pallet 22 into the transport grooves 22b of other pallets 22. However, the height of the holding groove 22a is greater than the height of the transport groove 22b, and when a plurality of pallets 22 are transported, the holding groove 22a is exposed to the outside by a gap corresponding to the height difference between the holding groove 22a and the transport groove 22b.

[0079] Furthermore, the tray 22 can be loaded into or unloaded from the loading slot 22c in a state where the end of the lower surface of the inspection object P is hung on the bottom surface of the loading slot 22c. In particular, when the inspection object P is loaded into the loading slot 22c, the lower surface of the inspection object P can be exposed to the lower side of the tray 22 through the guide hole 22d, and the upper surface of the inspection object P can be exposed to the upper side of the tray 22 through the loading slot 22c and the carrying slot 22b.

[0080] like Figure 3 As shown, the transfer rail 24 is extended along the transfer direction in a manner longer than the distance between the first loading / unloading position P1 and the second loading / unloading position P5 of the transfer path by a preset ratio. In addition, the transfer rail 24 is provided in a pair in a manner spaced apart from each other by a preset distance in a vertical direction perpendicular to the transfer direction compared to the width of the upper portion of the tray 22 as the area having the largest width in the entire area of ​​the tray 22.

[0081] like Figure 7 As shown, the shuttle 26 may include: a shuttle body 26a, which is movably mounted on the transfer track 24; a driving component (not shown), which reciprocates the shuttle body 26a along the transfer path under the guidance of the transfer track 24; and a clamp 26b, which is combined with the shuttle body 26a so that the pallet 22 can be gripped or released.

[0082] And, when a pair of transfer rails 24 are provided, one shuttle 26 is provided for each transfer rail 24, that is, a total of a pair of shuttles 26 are provided. In this case, the pair of shuttles 26 are formed symmetrically with the tray 22 interposed therebetween.

[0083] The structure of the clamp 26b is not particularly limited. For example, the clamp 26b may include: a holding member 26c on which the ceiling surface of the holding groove 22a of the tray 22 can be hung; and a moving member 26d for reciprocating the holding member 26c in the vertical direction so that the holding member 26c can approach the tray 22 or be separated from it.

[0084] like Figure 7 As shown, the clamp 26b is provided with a holding member 26c by using a transfer member 26d so that the ceiling surface of the holding groove 22a of the pallet 22 is hung on the holding member 26c, thereby being able to hold the pallet 22 in a manner of transferring the pallet 22 along with the shuttle 26. In particular, when a plurality of pallets 22 are transported in multiple layers, the plurality of pallets 22 are arranged in a manner such that the pallet 22 at the top of the plurality of pallets 22 is located at a height that can be held by the clamp 26b, and after the top pallet 22 is held by the clamp 26b, the remaining pallets 22 are separated from the top pallet 22, thereby being able to separate the top pallet 22 from the remaining pallets 22. For the convenience of explanation, hereinafter, the setting height of the pallet 22 at which the pallet 22 can be held by the clamp 26b is referred to as the pallet transfer height.

[0085] Figures 8 to 16 1 is a diagram for explaining a method of implementing a loading process of an inspection object and a temporary storage process of a tray. Fig.17 and Fig.18 A diagram for explaining a method of transferring a tray temporarily stored in a first storage unit to an inspection unit.

[0086] Next, the first loading / unloading unit 30 loads or unloads the inspection object P to or from the tray 22 .

[0087] The first loading / unloading unit 30 is disposed at the first loading / unloading position P1 so as to be able to perform a loading or unloading process on the inspection object P.

[0088] The structure of the first loading / unloading unit 30 is not particularly limited. Figure 2 As shown, the first loading / unloading unit 30 may include: a first loading / unloading carrier 32 that can carry the pallet 22; and a first loading / unloading elevator 34 that can lift and lower the first loading / unloading carrier 32 and the pallet 22 carried by the first loading / unloading carrier 32.

[0089] The first loading / unloading carrier 32 may have a first loading / unloading carrier groove 32a that is recessed on the upper surface in a manner having the same length and width as the upper portion of the pallet 22. In particular, the first loading / unloading carrier groove 32a has the same height as the carrier groove 22b of the pallet 22 so that the pallet 22 carried in the first loading / unloading carrier groove 32a can be gripped by the clamp 26b of the shuttle 26. According to such a first loading / unloading carrier groove 32a, the pallet 22 can be inserted into the first loading / unloading carrier groove 32a in a manner such that the lower surface of the pallet 22 is placed on the bottom surface of the first loading / unloading carrier groove 32a, thereby allowing the pallet 22 to be carried in the first loading / unloading carrier groove 32a in a preset arrangement state.

[0090] Furthermore, the pallet 22 carried on the first loading / unloading carrying slot 32a can carry at least one pallet 22 in multiple layers. Thus, the first loading / unloading carrying stage 32 can support multiple pallets 22 carried in multiple layers.

[0091] The structure of the first loading / unloading elevator 34 is not particularly limited. For example, the first loading / unloading elevator 34 may be composed of a cylinder device.

[0092] Furthermore, the first loading / unloading elevator 34 can move the pallet 22 carried on the first loading / unloading carrier 32 up and down between a storage height spaced a preset distance downward from the pallet transfer height and the pallet transfer height.

[0093] Next, the first storage unit 40 is used to temporarily store the tray 22 loaded with the inspection object P.

[0094] The first storage unit 40 is provided at the first storage position P2 so as to be able to perform a process of temporarily storing the tray 22 loaded with the inspection object P in a state of waiting for inspection.

[0095] The structure of the first storage unit 40 is not particularly limited. Figure 2 As shown, the first storage unit 40 may include: a first storage carrier 42 for carrying the pallet 22; and a first storage elevator 44 for lifting and lowering the first storage carrier 42 and the pallet 22 carried on the first storage carrier 42.

[0096] The first storage carrier 42 may have a first storage carrier groove 42a that is recessed on the upper surface in a manner that has the same length and width as the lower portion of the pallet 22. In particular, the first storage carrier groove 42a has the same height as the carrier groove 22b of the pallet 22 so that the pallet 22 carried in the first storage carrier groove 42a can be gripped by the clamp 26b of the shuttle 26. According to such a first storage carrier groove 42a, the pallet 22 can be inserted into the first storage carrier groove 42a in a manner that the lower surface of the pallet 22 is placed on the bottom surface of the first storage carrier groove 42a, thereby allowing the pallet 22 to be carried in the first storage carrier groove 42a in a preset arrangement state.

[0097] Furthermore, the pallet 22 carried in the first storage carrying slot 42a can carry at least one pallet 22 in multiple layers. Thus, the first storage carrying platform 42 can support multiple pallets 22 carried in multiple layers.

[0098] The structure of the first storage elevator 44 is not particularly limited. For example, the first storage elevator 44 may be composed of a cylinder device.

[0099] Furthermore, the first storage elevator 44 can move the pallet 22 carried on the first storage carrier 42 up and down between a storage height spaced a preset distance downward from the pallet transfer height and the pallet transfer height.

[0100] Hereinafter, a method of implementing the inspection object P loading process and the tray 22 temporary storage process will be described with reference to the drawings.

[0101] First, if Figure 8 As shown, when the inspection object P is loaded onto the pallet 22 at the first loading / unloading position P1, the first loading / unloading elevator 34 can lift the first loading / unloading carrier 32 and the multiple pallets 22 set on the first loading / unloading carrier 32, so that the pallet 22 on the top layer among the multiple pallets 22 pre-carried in multiple layers on the first loading / unloading carrier is set at the pallet transfer height.

[0102] Next, when the uppermost pallet 22 is placed at the pallet transfer height, the shuttle 26 waiting at the first loading / unloading position P1 grips the uppermost pallet 22 with the clamp 26 b.

[0103] Afterwards, the staff manually loads the inspection object P into the loading slot 22 c of the uppermost tray 22 , or uses an automated device to automatically load the inspection object P into the loading slot 22 c of the uppermost tray 22 .

[0104] Then, if Fig. 9As shown, when the topmost pallet 22 is held by the clamp 26b of the shuttle 26, the first loading / unloading elevator 34 lowers the first loading / unloading platform 32 and the remaining multiple pallets 22 carried on the first loading / unloading platform 32, so that the topmost pallet 22 can be separated from the remaining pallets 22 and transferred to the shuttle 26.

[0105] Afterwards, if Fig.10 As shown, the shuttle 26 moves the pallet 22 received from the first loading / unloading position P1 from the first loading / unloading position P1 to the first storage position P2. Fig.11 As shown, the first storage elevator 44 waiting at the first storage position P2 raises and lowers the first storage transport platform 42 in such a manner that the pallet 22 gripped by the clamp 26b of the shuttle 26 is supported by the first storage transport platform 42, and the clamp 26b of the shuttle 26 releases its grip on the pallet 22 and transports it on the first storage transport platform 42.

[0106] Then, if Fig.12 As shown, the first storage elevator 44 lowers the first storage platform 42 and the pallet 22 carried on the first storage platform 42 and temporarily stores them in the first storage position in such a manner that the pallet 22 carried on the first storage platform 42 is set at the storage height, and the shuttle 26 moves to the first loading / unloading position P1.

[0107] like Figures 13 to 16 As shown, the inspection object P loading process and the temporary storage process of the pallet 22 are repeatedly performed, and the plurality of pallets 22 carried in multiple layers on the first loading / unloading transport platform 32 at the first loading / unloading position P1 are temporarily stored in the first storage unit 40 arranged at the first storage position P2 by being carried in multiple layers on the first storage transport platform 42 in a state of being loaded with the inspection objects P.

[0108] On the other hand, as described above, the plurality of trays 22 temporarily stored in the first storage unit 40 provided for the plurality of trays 22 are sequentially transferred from the first storage position P2 to the inspection position P3 by the shuttle 26 according to the pinhole inspection state of the inspection object P implemented in the inspection unit 50 provided at the inspection position P3. Fig.17 and Fig.18 As shown, multiple pallets 22 carried in multiple layers on the first storage transport platform 42 are lifted and lowered between the storage height and the pallet transfer height by the first storage elevator 44 and are transferred one by one to the shuttle 26 waiting at the first storage position P2 in the order opposite to the order of transportation on the first storage transport platform 42. The shuttle 26 can move the pallet 22 transferred from the first storage transport platform 42 from the first storage position P2 to the inspection position P3 and transfer it to the inspection unit 50.

[0109] Fig.19 FIG. 1 is a block diagram for explaining a control system of an inspection unit. Fig. 20 and Fig.21 2 is a diagram for explaining a method of causing a tray that has reached an inspection position to enter an imaging space in a darkroom. Fig. 22 This is a diagram for explaining a method of performing a pinhole inspection on an inspection object loaded on a tray in an imaging space of a darkroom.

[0110] Fig.23 and Fig.24 2 is a diagram for explaining a method of photographing an inspection object. Fig.25 A diagram for explaining a method of performing a pinhole inspection using a captured image of an inspection object.

[0111] Next, the inspection unit 50 is used to perform a pinhole inspection on the inspection object.

[0112] The inspection unit 50 is installed at the inspection position P3 so as to be able to perform a pinhole inspection on the inspection object P loaded on the tray 22 .

[0113] After irradiating the inspection light Li for the pinhole inspection to the inspection object P, the inspection unit 50 analyzes a captured image I of the inspection object P capturing a state in which the inspection light Li penetrates the inspection object P to perform a pinhole inspection on the inspection object P.

[0114] For example, Fig.18 and Fig.19 As shown, the inspection unit 50 may include a darkroom 51, a lift 52, lighting 53, a camera 54, a visual processor 55, and the like.

[0115] The darkroom 51 can provide a space for performing pinhole inspection in a dark environment without any light source other than the inspection light Li provided by the lighting 53 described later. Fig.18 As shown, the darkroom 51 may include: a shooting space 51a, which is formed inside in a manner separated from the outside to prevent light from entering from the outside; and an entrance 51b, which can allow the inspection object P or various devices required for pinhole inspection to enter the shooting space 51a or be led out from the shooting space 51a. And, preferably, the entrance 51b is formed through the bottom of the darkroom 51 in a manner connected to the shooting space 51a.

[0116] In this darkroom 51, the entrance 51b is provided at a predetermined interval from the tray 22 that has arrived at the inspection position P3. For example, when the entrance 51b is formed at the bottom of the darkroom 51, the darkroom 51 is provided so that the entrance 51b is spaced upward from the tray 22 that has arrived at the inspection position P3 by a predetermined reference distance.

[0117] The lift 52 allows the pallet 22 that has arrived at the inspection position P3 along with the shuttle 26 and the inspection object P loaded on the pallet 22 to enter the imaging space 51a of the darkroom 51 through the entrance 51b of the darkroom 51 or to be led out from the imaging space 51a.

[0118] To this end, the elevator 52 may include: a supporting bracket 52a, which is fixedly provided with at least one bracket 52c, used to support the pallet 22 that arrives at the inspection position P3 along with the shuttle 26; and a lifting component 52b, which reciprocates along the height direction to move the supporting bracket 52a and the pallet 22 supported by the bracket 52c of the supporting bracket 52a.

[0119] Furthermore, the bracket 52c can support the tray 22 in a manner that the tray 22 can be lifted and lowered along the bracket 52c. In particular, preferably, the bracket 52c is arranged not to face the guide hole 22d of the tray 22, and prevents collision with the shuttle 26 during the lifting process.

[0120] Such a bracket 52c may have an arrangement groove 52d, which can be used to place the tray 22 at the upper end of the bracket 52c so that the tray 22 can be supported in a preset arrangement state. The height of the arrangement groove 52d is the same as the height of the carrying groove 22b of the tray 22 so that the tray 22 supported by the arrangement groove 52d can be gripped by the clamp 26b of the shuttle 26. According to such an arrangement groove 52d, the tray 22 can be inserted into the arrangement groove 52d in such a manner that the lower surface of the tray 22 is inserted into the bottom of the arrangement groove 52d, thereby, the bracket 52c can support the tray 22 in a state of being placed in the arrangement groove 52d in a preset arrangement state.

[0121] Furthermore, the lifting member 52b may be formed by one of various devices that lift the support bracket 52a in the height direction. For example, the lifting member 52b may be formed by a cylinder device.

[0122] like Fig. 20 As shown, for the lifter 52, when the pallet 22 reaches the inspection position P3 through the shuttle 26, it is gripped by the clamp 26b of the shuttle 26, and the support bracket 52a is lifted and lowered by the lifting member 52b, so that the pallet 22 set at the pallet transfer height is supported by the bracket 52c. Thus, the clamp 26b of the shuttle 26 releases the grip of the pallet 22 and transfers it to the bracket 52c.

[0123] And, if Fig.21 As shown, when the tray 22 is transferred to the bracket 52c, the elevator 52 uses the lifting component 52b to lift the tray 22, so that the tray 22 enters the shooting space 51a of the darkroom 52 through the entrance 51b to a preset reference depth.

[0124] When the pinhole inspection of the inspection object P loaded on the tray 22 is completed in the imaging space 51a of the darkroom 51, the lift 52 lowers the tray 22 to the tray transfer height by using the lifting member 52b, so that the tray 51b is led out of the imaging space 51a of the darkroom 51 through the entrance 51b. Therefore, the clamp 26b of the shuttle 26 waiting at the inspection position P3 holds the tray 22 again, and the lift 52 lowers the support bracket 52a in such a manner that the bracket 52c is separated from the tray 22, thereby transferring the tray 22 to the shuttle 26 again.

[0125] When the inspection object P arrives at the inspection position P3 along with the tray 22, the lighting 53 may irradiate the inspection light Li for pinhole inspection to the lower surface of the inspection object P exposed through the guide hole 22d of the tray 22. Fig.18 As shown, the lighting 53 may be fixedly mounted on the support bracket 52a so as to face the lower surface of the inspection object P as the tray 22 reaches the inspection position P3 through the guide hole 22d. Fig. 20 and Fig.21 As shown, the lighting 53 can be raised and lowered together with the tray 22 by the lifting member 52b while being spaced downward from the inspection object P by a distance corresponding to the height of the bracket 52c. In this regard, preferably, the bracket 52c has a height such that the inspection light Li emitted from the lighting 53 is uniformly irradiated to the entire area of ​​the lower surface of the inspection object P.

[0126] like Fig. 22 As shown, when the tray 22 enters the shooting space 51a of the darkroom 51 through the entrance 51b to a preset reference depth, the lighting 53 can release the inspection light Li toward the lower surface of the inspection object P to irradiate the inspection light Li to the lower surface of the inspection object P.

[0127] Preferably, the inspection light Li is one of white light, red light, blue light, and green light in the commonly used visible light range. However, the present invention is not limited thereto, and the inspection light Li may also be light in the ultraviolet (UV) range or infrared (IR) range that is not in the visible light range.

[0128] The illumination 53 may irradiate the inspection light Li having a preset reference illuminance range toward the inspection object P. For example, the reference illuminance range may be 100000 Lux to 600000 Lux.

[0129] The camera 54 is disposed in the photographing space 51a of the darkroom 51 so that when the inspection object P and the lighting 53 enter the darkroom 51 to a preset reference depth through the lift 52, the camera 54 can photograph the other side of the inspection object P opposite to the side of the inspection object P irradiated by the inspection light Li released from the lighting 53. Fig. 22As shown, when the lighting 53 is set in a manner that can irradiate the inspection light Li to the lower surface of the inspection object P exposed to the outside through the guide hole 22d, the camera 54 is set in the shooting space 51a of the darkroom 51 in a manner that can shoot the upper surface of the inspection object P exposed to the outside through the loading slot 22c and the transport slot 22b.

[0130] There is no particular limitation on the type of camera that can be used as the camera 54. For example, the camera 54 may be an area camera.

[0131] Typically, the camera 54 has a preset shooting area. When the area of ​​the inspection object P for pinhole inspection is larger than the shooting area of ​​the camera 54 , a plurality of shooting regions As having an area corresponding to the shooting area may be formed on the upper surface of the inspection object P.

[0132] like Fig.23 As shown, the camera 54 has a preset shooting area, and a plurality of shooting areas As corresponding to the shooting area can be formed on the upper surface of the inspection object P. In this case, Fig. 22 As shown, the inspection unit 50 may also include a camera conveyor 56 for conveying the camera 54 in at least one of the length direction (X direction) and the width direction (Y direction) of the inspection object P, so that the camera 54 can move along a preset path and sequentially photograph multiple shooting areas As.

[0133] The camera conveyor 56 can convey the camera 54 along a preset path, based on which the camera 54 is conveyed by the camera conveyor 56 and photographs multiple photographing areas As of the inspection object P in a preset order to generate a photographed image I related to the upper surface of the inspection object P.

[0134] On the other hand, Fig.24 As shown, on the camera conveyor 56, a plurality of cameras 54 are arranged in a manner that they can be moved individually. In this case, the camera conveyor 56 can convey the plurality of cameras 54 together, so that the plurality of cameras 54 can respectively shoot different shooting areas As. In this case, preferably, on the camera conveyor 56, the plurality of cameras 54 can be arranged on the same line along the X direction or the Y direction. In particular, considering the possibility that the plurality of cameras 54 may interfere with each other, the plurality of cameras 54 are arranged behind the camera conveyor 56 at a distance that is an integer multiple of more than twice the set interval of the shooting area As, so that the plurality of cameras 54 move in a zigzag shape and shoot the plurality of shooting areas As. For example, as Fig.24As shown, after the camera transfer machine 56 transfers a plurality of cameras 54 to one direction (for example, +X direction) of the X direction and the Y direction and photographs a photographing area As set along the one direction, the camera transfer machine 56 transfers the cameras 54 to the other direction (-Y direction) of the X direction and the Y direction at a distance that is an integer multiple of the set interval of the plurality of photographing areas As, and then the camera transfer machine 56 transfers the plurality of cameras 54 to the one direction (for example, -X direction) and photographs another photographing area As set along the one direction.

[0135] The vision processor 55 may analyze a state in which the inspection light Li transmits the inspection object P based on the captured image I of the inspection object P transmitted from the camera 54 to perform a pinhole inspection on the inspection object P.

[0136] As described above, the illumination 53 can irradiate the inspection light Li to the lower surface of the inspection object P, and the camera 54 can photograph the upper surface of the inspection object P opposite to the lower surface. Fig.25 As shown, in the captured image I of the inspection object P, as the inspection light Li is transmitted through multiple pinholes Hp formed in the inspection object P, a bright spot S formed in the pinhole area where one of the multiple pinholes Hp is located can be displayed, and the visual processing unit 55 can analyze the multiple two points S displayed in the captured image I to implement pinhole inspection to collect information related to the pinhole Hp, such as whether the pinhole Hp occurs, the position of the pinhole Hp (X coordinate, Y coordinate), and the size of the pinhole Hp (width, height, area).

[0137] Fig.26 and Fig. 27 This is a diagram showing a state where the tray directly passes through the second storage unit when the pinhole inspection is performed according to the forward inspection method. Figures 28 to 30 It is a diagram for explaining a method of storing a plurality of trays from which inspection objects have been unloaded in the second loading / unloading unit.

[0138] Next, the second storage unit 60 temporarily stores the tray 22 on which the inspection object P is loaded.

[0139] The second storage unit 60 is provided at the second storage position P4 so as to be able to implement a process of temporarily storing the tray 22 loaded with the inspection object P in a state of waiting for inspection.

[0140] The structure of the second storage unit 60 is not particularly limited. Fig.26 As shown, the second storage unit 60 may include: a second storage carrier 62 capable of carrying the pallet 22 ; and a second storage elevator 64 capable of lifting and lowering the second storage carrier 62 and the pallet 22 carried on the second storage carrier 62 .

[0141] The second storage transport platform 62 may include a second storage transport groove 62a that is recessed on the upper surface in a manner having the same lateral width and longitudinal width as the lower portion of the pallet 22. In particular, the second storage transport groove 62a has the same height as the transport groove 22b of the pallet 22 so that the pallet 22 carried in the second storage transport groove 62a can be gripped by the clamp 26b of the shuttle 26. According to such a second storage transport groove 62a, the pallet 22 can be inserted into the second storage transport groove 62a in a manner such that the lower surface of the pallet 22 is placed on the bottom surface of the second storage transport groove 62a, thereby allowing the pallet 22 to be carried in the second storage transport groove 62a in a preset arrangement state.

[0142] Furthermore, the pallet 22 carried in the second storage carrying slot 62a can carry at least one pallet 22 in multiple layers. Thus, the second storage carrying platform 62 can support multiple pallets 22 carried in multiple layers.

[0143] The structure of the second storage elevator 64 is not particularly limited. For example, the second storage elevator 64 may be composed of a cylinder device.

[0144] Furthermore, the second storage elevator 64 can move the pallet 22 carried on the second storage carrier 62 up and down between a storage height spaced a predetermined distance below the transfer height and the transfer height.

[0145] And, if Figure 26 to Figure 28 As shown, when the pinhole inspection of the inspection object P is implemented according to the forward inspection method, the plurality of trays 22 loaded with the inspection object P at the first loading / unloading position P1 are temporarily stored at the first storage position P2, and the trays 22 that have completed the pinhole inspection of the inspection object P at the inspection position P3 are not temporarily stored at the second storage position P4, but are directly transferred to the second loading / unloading position P5 after passing through the second storage position P4. On the contrary, when the pinhole inspection of the inspection object P is implemented according to the reverse inspection method, the plurality of trays 22 loaded with the inspection object P at the second loading / unloading position P5 are temporarily stored at the second storage position P4, and the trays 22 that have completed the pinhole inspection of the inspection object P at the inspection position P3 are not temporarily stored at the first storage position P2, but are directly transferred to the first loading / unloading position P1 after passing through the first storage position P2.

[0146] Next, the second loading / unloading unit 70 loads or unloads the inspection object P onto or from the tray 22 .

[0147] The second loading / unloading unit 70 is installed at the second loading / unloading position P5 so as to be able to perform a loading or unloading process on the inspection object P.

[0148] The structure of the second loading / unloading unit 70 is not particularly limited. Fig.26 As shown, the second loading / unloading unit 70 may include: a second loading / unloading carrier 72, which can carry the pallet 22; and a second loading / unloading elevator 74, which can lift and lower the second loading / unloading carrier 72 and the pallet 22 carried on the second loading / unloading carrier 72.

[0149] The second loading / unloading carrier 72 may include a second loading / unloading carrying groove 72a which is recessed on the upper surface in a manner having the same length and width as the lower portion of the pallet 22. In particular, the second loading / unloading carrier 72 has the same height as the carrying groove 22b of the pallet 22 so that the pallet 22 carried on the second loading / unloading carrier 72 can be gripped by the clamp 26b of the shuttle 26. According to such a second loading / unloading carrying groove 72a, the pallet 22 can be inserted into the second loading / unloading carrying groove 72a in a manner such that the lower surface of the pallet 22 is placed on the bottom surface of the second loading / unloading carrying groove 72a, thereby the pallet 22 can be carried in the second loading / unloading carrying groove 72a in a preset arrangement state. In addition, the pallet 22 carried in the second loading / unloading carrying groove 72a can carry at least one pallet 22 in multiple layers. Thus, the second loading / unloading carrier 72 can support multiple pallets 22 carried in multiple layers.

[0150] The structure of the second loading / unloading elevator 74 is not particularly limited. For example, the second loading / unloading elevator 74 may be composed of a cylinder device.

[0151] Furthermore, the second loading / unloading elevator 74 can move the pallet 22 carried on the second loading / unloading carrier 72 up and down between a storage height spaced a preset distance below the transfer height and the transfer height.

[0152] Hereinafter, a method of performing a process of unloading the inspection object P at the second loading / unloading position P5 when the pinhole inspection of the inspection object P is performed according to the forward inspection method will be described with reference to the drawings.

[0153] First, if Fig.28 As shown, the shuttle 26 transfers the pallet 22 on which the pinhole inspection of the inspection object P is completed at the inspection position P3 to the second loading / unloading position P5.

[0154] Next, the second loading / unloading elevator 74 waiting at the second loading / unloading position P5 raises and lowers the second loading / unloading stage 72 so that the pallet 22 gripped by the clamp 26 b of the shuttle 26 is supported by the second loading / unloading stage 72 .

[0155] Thereafter, the worker manually unloads the inspection object P from the loading slot 22 c of the tray 22 or automatically unloads the inspection object P from the loading slot 22 c of the tray 22 using an automated device.

[0156] Then, if Fig.29 As shown, the clamp 26b of the shuttle 26 releases its grip on the pallet 22 to transport it to the second loading / unloading platform 72, and the second loading / unloading elevator 74 lowers the second loading / unloading platform 72 and the pallet 22 carried on the second loading / unloading platform 72 and stores the pallet 22 at the second loading / unloading position P5, so that the pallet 22 carried on the second loading / unloading platform 72 is set at the storage height.

[0157] Afterwards, if Fig.29 As shown, the shuttle 26 moves to the first storage position P2, the first storage unit 40 transfers the topmost pallet 22 among the multiple temporarily stored pallets 22 to the shuttle 26, the shuttle 26 moves the pallet 22 newly received from the first storage unit 40 to the inspection position P3, and the inspection unit 50 performs a pinhole inspection on the inspection object P loaded on the pallet 22 newly received from the shuttle 26.

[0158] On the other hand, when the unloading process of the inspection object P is repeatedly performed, the multiple pallets 22 in which the loading slots 22c are in an empty state are stored in a multi-layer transport state on the second loading / unloading platform 72 of the second loading / unloading unit 70. As described above, the multiple pallets 22 stored on the second loading / unloading platform 72 can be used when performing pinhole inspection on the inspection object P by the reverse inspection method.

[0159] As described above, the pinhole inspection device 1 uses the captured image I of the inspection object P generated by capturing the inspection object P irradiated with the inspection light Li in the dark environment of the darkroom 51, and detects and analyzes the bright spot S generated by the inspection light Li passing through the pinhole Hp of the inspection object P, so as to perform pinhole inspection on the inspection object P. According to such a pinhole inspection device 1, it is possible to suppress noise caused by surface reflection of the inspection object P, improve the ability to distinguish between pinhole defects and other surface defects, reduce the complexity of the captured image I of the inspection object P, improve the ability to distinguish the pinhole Hp by the diffusion effect of the inspection light Li generated when the inspection light Li passes through the pinhole Hp, and adjust the transmittance of the inspection light Li through the inspection object P by adjusting the brightness of the inspection light Li, thereby improving the accuracy of the pinhole inspection.

Claims

1. A pinhole inspection device, characterized in that: The pinhole inspection device comprises: a transfer unit that transfers the tray loaded with the inspection object along a preset transfer path; and The inspection unit is disposed at a preset inspection position of the transfer path and performs a pinhole inspection on the inspection object loaded on the tray. The inspection unit comprises: A darkroom having a shooting space formed inside in a manner separated from the outside; An elevator, which lifts the tray that has reached the inspection position so that the tray enters the shooting space or is led out of the shooting space; lighting, irradiating inspection light to the inspection object entering the shooting space along with the tray; a camera, for photographing the inspection object entering the photographing space to generate a photographed image related to the inspection object; and The visual processing unit analyzes the captured image to perform a pinhole inspection on the inspection object.

2. The pinhole inspection device according to claim 1, characterized in that: The illumination is capable of irradiating the inspection light onto one side of the inspection object, The camera can photograph another side of the inspection object opposite to the one side.

3. The pinhole inspection device according to claim 2, characterized in that: The darkroom is separated upward from the tray that has reached the inspection position and has an entrance and an exit, and the tray is guided to enter or exit the imaging space. The illumination is capable of irradiating the inspection light onto the lower surface of the inspection object, The camera can photograph the upper surface of the inspection object.

4. The pinhole inspection device according to claim 1, characterized in that: The visual processing unit analyzes a bright spot that appears when the inspection light passes through the inspection object, so as to implement the pinhole inspection.

5. The pinhole inspection device according to claim 1, characterized in that: The inspection unit further includes a camera transporter for transporting the camera so as to photograph a plurality of photographing areas set at preset intervals on the inspection object in a preset order.

6. The pinhole inspection device according to claim 1, characterized in that: The elevator comprises: a support bracket capable of supporting the tray and fixedly provided with the lighting; and The lifting component lifts and lowers the support bracket to allow the tray and the lighting to enter the shooting space or be led out of the shooting space.

7. The pinhole inspection device according to claim 1, characterized in that: The transfer unit includes a clamp capable of holding the pallet and a shuttle for transferring the pallet along the transfer path. When the pallet reaches the inspection position, the lifter receives the pallet released from the grip of the clamp while supporting the pallet.

8. The pinhole inspection device according to claim 7, characterized in that: At both end points of the transfer path, a first loading / unloading position and a second loading / unloading position are formed across the inspection position. The pinhole inspection device also includes: a first loading / unloading unit disposed at the first loading / unloading position so as to be able to load the inspection object onto the tray or unload it from the tray; and A second loading / unloading unit is provided at the second loading / unloading position so as to be able to load the inspection object onto the tray or unload it from the tray.

9. The pinhole inspection device according to claim 8, characterized in that: The shuttle moves the pallet loaded with the inspection object from one of the first loading / unloading position and the second loading / unloading position to the inspection position, and moves the pallet on which the pinhole inspection of the inspection object is completed at the inspection position to the other of the first loading / unloading position and the second loading / unloading position.

10. The pinhole inspection device according to claim 9, characterized in that: The first loading / unloading unit comprises: a first loading / unloading platform capable of carrying the pallets in multiple layers; and a first loading / unloading lifter that raises and lowers the first loading / unloading platform so as to reciprocate the pallet carried on the first loading / unloading platform between a preset pallet transfer height and a pallet storage height; The second loading / unloading unit comprises: a second loading / unloading platform capable of carrying the pallets in multiple layers; and The second loading / unloading elevator raises and lowers the second loading / unloading platform so as to reciprocate the pallet carried on the second loading / unloading platform between a preset pallet transfer height and the pallet storage height.

11. The pinhole inspection device according to claim 10, characterized in that: The pallet transfer height is determined as a setting height of the pallet at which the pallet can be gripped by the clamp. The pallet storage height is determined as a height spaced apart from the pallet transfer height by a preset interval.

12. The pinhole inspection device according to claim 9, characterized in that: a first storage position is formed between the first loading / unloading position and the inspection position, and a second storage position is formed between the inspection position and the second loading / unloading position, The pinhole inspection device also includes: a first storage unit disposed at the first storage position so as to be able to temporarily store the tray loaded with the inspection object; and The second storage unit is provided at the second storage position so as to temporarily store the tray loaded with the inspection object.

13. The pinhole inspection device according to claim 12, characterized in that: the first storage unit temporarily stores the tray that has arrived at the first storage position in a state where the inspection object is loaded at the first loading / unloading position, The second storage unit temporarily stores the tray that has arrived at the second storage position in a state where the inspection object is loaded at the second loading / unloading position.

14. The pinhole inspection device according to claim 13, characterized in that: The first storage unit comprises: A first storage carrier capable of carrying the pallets in multiple layers; and The first storage lifter raises and lowers the first storage carrier so as to reciprocate the pallet carried on the first storage carrier between a preset pallet transfer height and a pallet storage height. The second storage unit comprises: A second storage carrier capable of carrying the pallets in multiple layers; and The second storage lifter raises and lowers the second storage carrier so as to reciprocate the pallet carried on the second storage carrier between a preset pallet transfer height and a pallet storage height.

15. The pinhole inspection device according to claim 14, characterized in that: The pallet transfer height is determined as a setting height of the pallet at which the pallet can be gripped by the clamp. The pallet storage height is determined as a height spaced apart from the pallet transfer height by a preset interval.

Images