Capacitor loss measurement method and device based on frequency domain dielectric spectrum, and storage medium

Abstract

The invention relates to the technical field of artificial intelligence, and discloses a capacitor loss measurement method and device based on a frequency domain dielectric spectrum, and a storage medium. The method comprises the steps of systematically obtaining frequency domain characteristics of a capacitor to be measured through accurate measurement and equivalent circuit modeling, and calculating loss based on obtained data. The method has the advantages that a solid foundation is provided for analyzing the performance and reliability of the capacitor in practical application, the relation between a series equivalent circuit of the capacitor and frequency domain dielectric spectrum parameters is studied, corresponding numerical values of capacitor equipment under different voltage frequencies and the variation trend of the numerical values are obtained, and different from current fixed frequency measurement, the method has the advantage that the measurement accuracy is high. And the active loss characteristic of the capacitor can be better represented.

Description

Technical Field

[0001] The present invention relates to the technical field of capacitor loss measurement based on frequency domain dielectric spectroscopy, and in particular to a capacitor loss measurement method, device and storage medium based on frequency domain dielectric spectroscopy. Background Art

[0002] At present, most of the power supplies for measuring capacitors at home and abroad use a single frequency excitation method, but under actual operating conditions, there are periodic harmonic voltages and non-periodic transient voltages. The active loss of capacitors under high-frequency and high-amplitude voltages will increase, and the loss characteristics will also change. Capacitors work under complex voltage conditions, resulting in higher losses. Under extreme conditions, it also poses challenges to the insulation performance of capacitors. The active loss of capacitors is divided into: dielectric loss, including conductivity loss and polarization loss; metal loss, mainly plate loss, including resistance loss including internal fuse loss, etc., but when measuring its loss, it is impossible to measure various losses separately, and only its total active loss characteristics can be measured. Summary of the invention

[0003] Based on this, it is necessary to address the existing capacitor loss measurement problem based on frequency domain dielectric spectroscopy, and propose a capacitor loss measurement method, device and storage medium based on frequency domain dielectric spectroscopy.

[0004] A method for measuring capacitor loss based on frequency domain dielectric spectroscopy, the method comprising:

[0005] Step S1, performing voltage and current acquisition operations, applying a preset frequency steady-state voltage to the capacitor to be tested, and acquiring a target voltage and a target current of the capacitor to be tested;

[0006] Step S2, performing a parameter adjustment operation, applying a steady-state voltage of a preset frequency to the equivalent series circuit, and adjusting parameters of an equivalent resistance and an equivalent capacitance in the equivalent series circuit until the voltage and current in the equivalent series circuit are the target voltage and the target current;

[0007] Step S3, performing a marking operation to obtain parameters of the adjusted equivalent resistance and equivalent capacitance, and marking them as the actual resistance and actual capacitance of the capacitor to be tested under a preset frequency steady-state voltage;

[0008] Step S4, modifying the frequency of the applied steady-state voltage multiple times based on the frequency value set in the frequency domain dielectric spectrum, and repeating steps S1 to S3, so as to obtain the actual resistance and actual capacitance at each frequency steady-state voltage;

[0009] Step S5: Calculate the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage.

[0010] Furthermore, the step S1 of performing the voltage and current acquisition operation, applying a preset frequency steady-state voltage to the capacitor to be tested, and acquiring a target voltage and a target current of the capacitor to be tested, includes:

[0011] Step S101, connecting the capacitor to be tested, a preset voltage source and a preset current meter in sequence to form a first loop, and connecting the preset voltage meter to both ends of the preset voltage source;

[0012] Step S102, applying a preset frequency steady-state voltage to the capacitor to be tested based on the preset voltage source;

[0013] Step S103 : acquiring a target voltage and a target current of the capacitor to be tested based on the preset current meter and the preset voltage meter respectively.

[0014] Furthermore, it also includes an industrial computer, the preset voltage source is connected to and controlled by the industrial computer, and the preset ammeter and the preset voltmeter are respectively connected to the industrial computer.

[0015] Furthermore, the step S2 of performing the parameter adjustment operation, applying a steady-state voltage of a preset frequency to the equivalent series circuit, and adjusting the parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current, includes:

[0016] Step S201, calculating a complex capacitance constant and a dielectric loss tangent according to the target voltage and the target current;

[0017] Step S202: adjusting parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit based on the complex capacitance constant and the dielectric loss tangent until the voltage and the current in the equivalent series circuit reach the target voltage and the target current.

[0018] Furthermore, the equivalent series circuit includes an equivalent resistor and an equivalent capacitor connected in series.

[0019] Further, the step S5 of calculating the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage includes:

[0020] Step S501, obtaining a lossless capacitor having the same parameters as the capacitor to be tested;

[0021] Step S502, measuring the reference resistance and reference capacitance of the lossless dielectric spectrum at each frequency steady-state voltage;

[0022] Step S503: Compare the actual resistance and the reference resistance at different frequencies, and compare the actual capacitance and the reference capacitance to obtain the loss of the capacitor to be tested at different frequencies.

[0023] Further, after the step S5 of calculating the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage, the method further includes:

[0024] Step S601, determining whether the loss of the capacitor to be tested has reached a preset value;

[0025] Step S602: If the loss of the capacitor to be tested reaches a preset value, determine that the capacitor to be tested is an unusable capacitor.

[0026] A capacitor loss measurement device based on frequency domain dielectric spectroscopy, the device comprising:

[0027] An acquisition module, used for instructing to implement step S1, executing voltage and current acquisition operations, applying a preset frequency steady-state voltage to the capacitor to be tested, and acquiring a target voltage and a target current of the capacitor to be tested;

[0028] an adjustment module, used for instructing to implement step S2, perform a parameter adjustment operation, apply a steady-state voltage of a preset frequency to the equivalent series circuit, and adjust the parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current;

[0029] A marking module, used to instruct to implement step S3, perform a marking operation, obtain the parameters of the adjusted equivalent resistance and equivalent capacitance, and mark them as the actual resistance and actual capacitance of the capacitor to be tested under a preset frequency steady-state voltage;

[0030] A modification module, used to instruct the implementation of step S4, modify the frequency of the applied steady-state voltage multiple times based on the frequency value set in the frequency domain dielectric spectrum, and repeat steps S1 to S3, so as to obtain the actual resistance and actual capacitance under each frequency steady-state voltage;

[0031] The calculation module is used to instruct the implementation of step S5, calculating the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage.

[0032] A computer device comprises a memory and a processor, wherein the memory stores a computer program, and when the computer program is executed by the processor, the processor performs the following steps:

[0033] Step S1, performing voltage and current acquisition operations, applying a preset frequency steady-state voltage to the capacitor to be tested, and acquiring a target voltage and a target current of the capacitor to be tested;

[0034] Step S2, performing a parameter adjustment operation, applying a steady-state voltage of a preset frequency to the equivalent series circuit, and adjusting parameters of an equivalent resistance and an equivalent capacitance in the equivalent series circuit until the voltage and current in the equivalent series circuit are the target voltage and the target current;

[0035] Step S3, performing a marking operation to obtain parameters of the adjusted equivalent resistance and equivalent capacitance, and marking them as the actual resistance and actual capacitance of the capacitor to be tested under a preset frequency steady-state voltage;

[0036] Step S4, modifying the frequency of the applied steady-state voltage multiple times based on the frequency value set in the frequency domain dielectric spectrum, and repeating steps S1 to S3, so as to obtain the actual resistance and actual capacitance at each frequency steady-state voltage;

[0037] Step S5, calculating the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage. A computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the processor performs the following steps:

[0038] Step S1, performing voltage and current acquisition operations, applying a preset frequency steady-state voltage to the capacitor to be tested, and acquiring a target voltage and a target current of the capacitor to be tested;

[0039] Step S2, performing a parameter adjustment operation, applying a steady-state voltage of a preset frequency to the equivalent series circuit, and adjusting parameters of an equivalent resistance and an equivalent capacitance in the equivalent series circuit until the voltage and current in the equivalent series circuit are the target voltage and the target current;

[0040] Step S3, performing a marking operation to obtain parameters of the adjusted equivalent resistance and equivalent capacitance, and marking them as the actual resistance and actual capacitance of the capacitor to be tested under a preset frequency steady-state voltage;

[0041] Step S4, modifying the frequency of the applied steady-state voltage multiple times based on the frequency value set in the frequency domain dielectric spectrum, and repeating steps S1 to S3, so as to obtain the actual resistance and actual capacitance at each frequency steady-state voltage;

[0042] Step S5: Calculate the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage.

[0043] The beneficial effects of the present invention are as follows: through precise measurement and equivalent circuit modeling, the frequency domain characteristics of the capacitor to be tested are systematically obtained, and the loss is calculated based on the obtained data, which provides a solid foundation for analyzing the performance and reliability of the capacitor in practical applications, and studies the relationship between the capacitor series equivalent circuit and the frequency domain dielectric spectrum parameters, and obtains the corresponding values ​​of the capacitor equipment at different voltage frequencies and their changing trends, which is different from the current fixed frequency measurement, and better characterizes the active loss characteristics of the capacitor. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0045] in:

[0046] Figure 1 A diagram showing an application environment of a capacitor loss measurement method based on frequency domain dielectric spectroscopy in one embodiment;

[0047] Figure 2 A flowchart of capacitor loss measurement based on frequency domain dielectric spectroscopy in one embodiment;

[0048] Figure 3 A schematic diagram of a frequency domain dielectric response test in an embodiment;

[0049] Figure 4 An equivalent circuit diagram of capacitors connected in series in one embodiment;

[0050] Figure 5 is a graph of frequency and real part of complex capacitance in one embodiment;

[0051] Figure 6 is a graph of frequency and imaginary part of complex capacitance in one embodiment;

[0052] Figure 7 is a structural block diagram of a capacitor loss measurement device based on frequency domain dielectric spectroscopy in one embodiment;

[0053] Figure 8 FIG. 4 is a structural block diagram of a computer device in one embodiment. DETAILED DESCRIPTION

[0054] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0055] Figure 1 FIG. 1 is a diagram of an application environment for capacitor loss measurement based on frequency domain dielectric spectroscopy in one embodiment. Figure 1 , the capacitor loss measurement method based on frequency domain dielectric spectroscopy is applied to a capacitor loss measurement system based on frequency domain dielectric spectroscopy. The capacitor loss measurement system based on frequency domain dielectric spectroscopy includes a terminal 110 and a server 120. The terminal 110 and the server 120 are connected via a network, and the terminal 110 can be a desktop terminal or a mobile terminal, and the mobile terminal can be at least one of a mobile phone, a tablet computer, a laptop computer, etc. The server 120 can be implemented as an independent server or a server cluster composed of multiple servers. The terminal 110 is used to obtain voltage and current, and the server 120 is used to store and analyze voltage and current.

[0056] like Figure 2 As shown, in one embodiment, a capacitor loss measurement method based on frequency domain dielectric spectroscopy is provided. The method can be applied to both a terminal and a server. This embodiment is illustrated by applying to a terminal. The capacitor loss measurement method based on frequency domain dielectric spectroscopy specifically includes the following steps:

[0057] Step S1, performing voltage and current acquisition operations, applying a preset frequency steady-state voltage to the capacitor to be tested, and acquiring a target voltage and a target current of the capacitor to be tested;

[0058] Step S2, performing a parameter adjustment operation, applying a steady-state voltage of a preset frequency to the equivalent series circuit, and adjusting parameters of an equivalent resistance and an equivalent capacitance in the equivalent series circuit until the voltage and current in the equivalent series circuit are the target voltage and the target current;

[0059] Step S3, performing a marking operation to obtain parameters of the adjusted equivalent resistance and equivalent capacitance, and marking them as the actual resistance and actual capacitance of the capacitor to be tested under a preset frequency steady-state voltage;

[0060] Step S4, modifying the frequency of the applied steady-state voltage multiple times based on the frequency value set in the frequency domain dielectric spectrum, and repeating steps S1 to S3, so as to obtain the actual resistance and actual capacitance at each frequency steady-state voltage;

[0061] Step S5: Calculate the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage.

[0062] As described in step S1 above, perform voltage and current acquisition operations, apply a preset frequency steady-state voltage to the capacitor to be tested, and obtain the target voltage and target current of the capacitor to be tested. The purpose is to obtain the target voltage and target current of the capacitor to be tested under a certain frequency steady-state condition. Specifically, a sinusoidal voltage of a specific frequency is applied to the capacitor to ensure that the frequency is fixed. Record the voltage (target voltage) across the capacitor and the current (target current) generated by it. These two values ​​directly reflect the response characteristics of the capacitor at a specific frequency.

[0063] As described in step S2 above, a parameter adjustment operation is performed to apply a steady-state voltage of a preset frequency to the equivalent series circuit, and the parameters of the equivalent resistance and equivalent capacitance in the equivalent series circuit are adjusted until the voltage and current in the equivalent series circuit are the target voltage and the target current. The purpose is to find the equivalent series circuit parameters (equivalent resistance R cs And the equivalent capacitance C s ). Specifically, an equivalent series circuit is established, including an equivalent resistor R cs and an equivalent capacitor C s . Adjustment parameters: By changing the equivalent resistance R cs and equivalent capacitance C s The value is calculated and iterated repeatedly until the voltage and current of the equivalent circuit are consistent with the target voltage and target current.

[0064] As described in step S3 above, a marking operation is performed to obtain the parameters of the adjusted equivalent resistance and equivalent capacitance, and mark them as the actual resistance and actual capacitance of the capacitor to be tested under the preset frequency steady-state voltage. cs and equivalent capacitance C s The value is taken as the actual parameter of the capacitor at this frequency. Specifically, the equivalent resistance R after the adjustment is completed is recorded. cs And the equivalent capacitance C s These parameters are labeled as the actual resistance and actual capacitance of the capacitor at the current frequency and applied voltage.

[0065] As described in step S4 above, the frequency of the applied steady-state voltage is modified multiple times based on the frequency value set in the frequency domain dielectric spectrum, and steps S1-S3 are repeated to obtain the actual resistance and actual capacitance at each frequency steady-state voltage. That is, through multi-frequency measurement, the entire frequency domain dielectric spectrum is constructed to obtain the parameter changes of the capacitor at different frequencies. Specifically, the frequency of the applied voltage is modified and steps S1-S3 are repeated. Each time the frequency is changed, a steady-state sinusoidal voltage is applied and the voltage and current are recorded. The equivalent circuit parameters are adjusted to obtain the equivalent resistance R at that frequency. cs And the equivalent capacitance C s Finally, record the equivalent resistance R at each frequency cs and equivalent capacitance C s , forming the frequency domain dielectric spectrum of the capacitor.

[0066] As described in step S5 above, the loss of the capacitor to be tested is calculated based on the actual resistance and actual capacitance at each frequency steady-state voltage. That is, the loss of the capacitor is calculated based on the frequency domain dielectric spectrum data. Since the loss of the capacitor is generally linked to the corresponding resistance and capacitance, the loss factor (D) can be calculated by the following formula: Where ω is the angular frequency, C s is the equivalent capacitance; is the equivalent resistance. Through precise measurement and equivalent circuit modeling, the frequency domain characteristics of the capacitor to be tested are systematically obtained. Finally, the loss is calculated based on these data, providing a solid foundation for analyzing the performance and reliability of capacitors in practical applications.

[0067] In one embodiment, the step S1 of performing the voltage and current acquisition operation, applying a preset frequency steady-state voltage to the capacitor to be tested, and acquiring a target voltage and a target current of the capacitor to be tested, comprises:

[0068] Step S101, connecting the capacitor to be tested, a preset voltage source and a preset current meter in sequence to form a first loop, and connecting the preset voltage meter to both ends of the preset voltage source;

[0069] Step S102, applying a preset frequency steady-state voltage to the capacitor to be tested based on the preset voltage source;

[0070] Step S103 : acquiring a target voltage and a target current of the capacitor to be tested based on the preset current meter and the preset voltage meter respectively.

[0071] As described in step S101 above, please refer to Figure 3, connect the capacitor to be tested, a preset voltage source and a preset ammeter in sequence to form a first loop, and connect the preset voltmeter to both ends of the preset voltage source. Build a measurement circuit to ensure that the voltage across the capacitor and the current passing through the capacitor can be accurately measured. Specific operation: Connect the capacitor to be tested in series with a preset voltage source and an ammeter in sequence to form a closed loop (ie, the first loop). Make sure that the capacitor to be tested is the main test element in the loop. Voltage measurement connection: Use a preset voltmeter to connect directly to both ends of the preset voltage source. Since the voltage of the ammeter can be ignored, it can be directly regarded as measuring the voltage across the capacitor to be tested.

[0072] As described in step S102 above, a preset frequency steady-state voltage is applied to the capacitor to be tested based on the preset voltage source, and a sinusoidal steady-state voltage with a fixed frequency and amplitude is provided to the capacitor to be tested. Specifically, the output parameters of the preset voltage source are set, including: frequency and amplitude (effective value or peak value). When applying the voltage, it is necessary to ensure that the output sinusoidal voltage is stable, avoid waveform distortion or amplitude drift, make the circuit enter a steady state, and ensure that the current and voltage characteristics of the capacitor are stable and suitable for measurement.

[0073] As described in the above step S103, the target voltage and target current of the capacitor to be tested are respectively obtained based on the preset ammeter and the preset voltmeter. That is, the actual voltage at both ends of the capacitor to be tested and the current passing through it are measured respectively. Using the preset voltmeter, the voltage value at the output end of the voltage source is directly read as the target voltage of the capacitor to be tested. The current value passing through the capacitor to be tested is measured by the preset ammeter. The readings of the voltmeter and the ammeter are marked as the target voltage and the target current respectively for subsequent analysis and processing.

[0074] In one embodiment, an industrial computer is also included, the preset voltage source is connected to and controlled by the industrial computer, and the preset ammeter and the preset voltmeter are respectively connected to the industrial computer. Industrial computer and preset voltage source: Connection method: The industrial computer is connected to the preset voltage source through a communication interface (such as RS-485, USB or LAN). The output parameters of the voltage source can be controlled, including the amplitude and frequency of the applied voltage, and the applied steady-state voltage can be dynamically adjusted to meet the measurement requirements of different frequencies. Industrial computer and preset ammeter and preset voltmeter: Connection method: The readings of the ammeter and voltmeter are obtained through a standard data acquisition interface (such as MODBUS, GPIB, CAN or other protocols). The target voltage and target current data can be collected in real time, and the collected data can be recorded, stored, processed and visualized. The industrial computer can program and control the voltage source to automatically cycle and set the steady-state voltage of different frequencies, avoid manual intervention, reduce errors, and realize complex test processes, including frequency domain scanning, multi-parameter iteration, etc., obtain real-time measurement data (target voltage and target current) through the interface, filter, suppress noise, calibrate and other processing on the collected data to improve the measurement accuracy. Record the voltage and current values ​​at each frequency point. Equivalent parameters (such as equivalent resistance and equivalent capacitance) can be directly calculated and the frequency domain dielectric spectrum can be generated. A human-machine interface (HMI) can also be provided to display the measurement status and data curve in real time. Allow users to set parameters and monitor the entire test process. In addition, the industrial computer is easy to integrate into larger test or production systems, such as material testing equipment, manufacturing process control systems, etc. Through software upgrades, more functions can be expanded, such as temperature control, multi-component testing, etc.

[0075] In one embodiment, the step S2 of performing the parameter adjustment operation, applying a steady-state voltage of a preset frequency to the equivalent series circuit, and adjusting the parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current, includes:

[0076] Step S201, calculating a complex capacitance constant and a dielectric loss tangent according to the target voltage and the target current;

[0077] Step S202: adjusting parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit based on the complex capacitance constant and the dielectric loss tangent until the voltage and the current in the equivalent series circuit reach the target voltage and the target current.

[0078] Reference Figure 4 , as described in the above steps S201-S202, calculating the complex capacitance constant and the dielectric loss tangent according to the target voltage and the target current;

[0079]

[0080] Where: C' is the real part of the complex capacitance, which represents the part that generates capacitive current and the polarization characteristics at the microscopic level; C" is the imaginary part of the complex capacitance, which represents the part that generates resistive current and the loss characteristics at the microscopic level, j is the imaginary unit, ω is the frequency,

[0081]

[0082] Where: C' is the real part of the complex capacitance, which represents the part that generates capacitive current and the polarization characteristics at the microscopic level; C" is the imaginary part of the complex capacitance, which represents the part that generates resistive current and the loss characteristics at the microscopic level. is the target voltage, is the target current, δ is the dielectric loss angle, and tanδ is the dielectric loss tangent.

[0083] Capacitor equivalent impedance:

[0084]

[0085] The complex capacitance C* in the dielectric spectrum has the following corresponding relationship with the capacitor equivalent series circuit.

[0086]

[0087] So we can get the series equivalent resistance R cs And the equivalent capacitance C s The relationship between the real and imaginary parts of the complex capacitance is:

[0088]

[0089] Equations (6) and (7) establish the relationship between the real part and imaginary part of the complex capacitance and the equivalent resistance and equivalent capacitance. The frequency domain dielectric spectrum curve C*-f can be used to obtain the corresponding values ​​of the capacitor equipment and its change trend at different voltage frequencies.

[0090] In one embodiment, the equivalent series circuit includes an equivalent resistor and an equivalent capacitor connected in series.

[0091] In one embodiment, the step S5 of calculating the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage includes:

[0092] Step S501, obtaining a lossless capacitor having the same parameters as the capacitor to be tested;

[0093] Step S502, measuring the reference resistance and reference capacitance of the lossless dielectric spectrum at each frequency steady-state voltage;

[0094] Step S503: Compare the actual resistance and the reference resistance at different frequencies, and compare the actual capacitance and the reference capacitance to obtain the loss of the capacitor to be tested at different frequencies.

[0095] As described in step S501 above, obtain a lossless capacitor with the same parameters as the capacitor to be tested. A lossless capacitor can be introduced as a reference standard to eliminate the loss effects other than the ideal capacitor. An ideal lossless capacitor refers to a capacitor whose resistance is infinite (no leakage current) within the operating frequency range. In experiments, lossless capacitors are usually simulated by capacitors with high quality factors. Select a high-quality capacitor whose parameters such as capacitance value and rated operating voltage are consistent with those of the capacitor to be tested. Low-loss ceramic capacitors or film capacitors can be used as reference samples.

[0096] As in step S502 above, the frequency domain characteristics of the lossless capacitor are measured to obtain the reference resistance and reference capacitance as a basis for loss calculation. Measurement environment: Apply a steady-state voltage with the same preset frequency as the capacitor to be tested. Maintain the same test conditions (such as temperature, frequency range and voltage amplitude). Record the reference resistance and reference capacitance of the lossless capacitor at different frequencies. The resistance of an ideal lossless capacitor is theoretically infinite; the capacitance is a constant value that does not change with frequency.

[0097] As described in step S503 above, the loss is calculated by comparison, that is, by comparing the actual resistance and capacitance with the reference resistance and capacitance, the loss of the capacitor to be tested at each frequency is calculated. The loss at different frequencies is recorded and a frequency domain curve is drawn. The law of loss variation with frequency is analyzed to evaluate the performance of the capacitor to be tested.

[0098] In one embodiment, after the step S5 of calculating the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage, the method further includes:

[0099] Step S601, determining whether the loss of the capacitor to be tested has reached a preset value;

[0100] Step S602: If the loss of the capacitor to be tested reaches a preset value, determine that the capacitor to be tested is an unusable capacitor.

[0101] As described in the above steps S601-S602, the judgment of the capacitor to be tested is realized, wherein the preset value can be derived from any one of the manufacturer's technical specifications, the reliability requirements in the application, and the critical value determined by the experiment. If the measured loss value exceeds the preset threshold, it means that the performance of the capacitor to be tested is unqualified. If the loss value exceeds the preset threshold value, the capacitor is judged to be unusable (i.e., the performance does not meet the requirements). The reasons for unavailability may be: excessive dielectric loss, resulting in energy waste or overheating; excessive leakage current, reducing the reliability of the capacitor; the capacitance value deviates from the design range, affecting the circuit function.

[0102] Reference Figure 5-Figure 6 In a specific detection process, the corresponding relationship between each frequency and the corresponding equivalent resistance (i.e., the real part of the complex capacitance) and equivalent capacitance (i.e., the imaginary part of the complex capacitance) can be obtained, and the frequency domain characteristics of the capacitor to be tested can be systematically obtained. Finally, the loss is calculated based on these data, which provides a solid foundation for analyzing the performance and reliability of capacitors in practical applications.

[0103] Reference Figure 7 The present invention also provides a capacitor loss measurement device based on frequency domain dielectric spectroscopy, the device comprising:

[0104] An acquisition module 10 is used to instruct the implementation of step S1, perform voltage and current acquisition operations, apply a preset frequency steady-state voltage to the capacitor to be tested, and obtain a target voltage and a target current of the capacitor to be tested;

[0105] an adjustment module 20, for instructing to implement step S2, perform a parameter adjustment operation, apply a steady-state voltage of a preset frequency to the equivalent series circuit, and adjust the parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current;

[0106] The marking module 30 is used to instruct the implementation of step S3, perform the marking operation, obtain the parameters of the adjusted equivalent resistance and equivalent capacitance, and mark them as the actual resistance and actual capacitance of the capacitor to be tested under the preset frequency steady-state voltage;

[0107] The modification module 40 is used to instruct the implementation of step S4, to modify the frequency of the applied steady-state voltage multiple times based on the frequency value set in the frequency domain dielectric spectrum, and to repeat steps S1 to S3, so as to obtain the actual resistance and actual capacitance at each frequency steady-state voltage;

[0108] The calculation module 50 is used to instruct the implementation of step S5, calculating the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage.

[0109] In one embodiment, the acquisition module 10 includes:

[0110] A connection submodule, used to instruct the implementation of step S101, connecting the capacitor to be tested, the preset voltage source and the preset current meter in sequence to form a first loop, and connecting the preset voltage meter to both ends of the preset voltage source;

[0111] An applying submodule, used for instructing to implement step S102, applying a preset frequency steady-state voltage to the capacitor to be tested based on the preset voltage source;

[0112] The acquisition submodule is used to instruct the implementation of step S103, and to respectively acquire the target voltage and the target current of the capacitor to be tested based on the preset ammeter and the preset voltmeter.

[0113] In one embodiment, an industrial computer is further included, the preset voltage source is connected to and controlled by the industrial computer, and the preset ammeter and the preset voltmeter are respectively connected to the industrial computer.

[0114] In one embodiment, the adjustment module 20 includes:

[0115] A calculation submodule, used for instructing to implement step S201, calculating a complex capacitance constant and a dielectric loss tangent according to the target voltage and the target current;

[0116] The adjustment submodule is used to instruct the implementation of step S202, adjusting the parameters of the equivalent resistance and equivalent capacitance in the equivalent series circuit based on the complex capacitance constant and the dielectric loss tangent until the voltage and current in the equivalent series circuit are the target voltage and the target current.

[0117] In one embodiment, the equivalent series circuit includes an equivalent resistor and an equivalent capacitor connected in series.

[0118] In one embodiment, the computing module 50 includes:

[0119] A lossless capacitor acquisition submodule, used for instructing to implement step S501, acquiring a lossless capacitor having the same parameters as the capacitor to be tested;

[0120] A measurement submodule, used for instructing to implement step S502, measuring the reference resistance and reference capacitance of the lossless dielectric at each frequency steady-state voltage in the frequency domain dielectric spectrum;

[0121] The comparison submodule is used to instruct the implementation of step S503, comparing the actual resistance and the reference resistance at different frequencies, and comparing the actual capacitance and the reference capacitance, so as to obtain the loss of the capacitor to be tested at different frequencies.

[0122] In one embodiment, the capacitor loss measurement device based on frequency domain dielectric spectroscopy further includes:

[0123] A loss judgment module, used to instruct the implementation of step S601, to judge whether the loss of the capacitor to be tested has reached a preset value;

[0124] The determination module is used to instruct to implement step S602, and if the loss of the capacitor to be tested reaches a preset value, determine that the capacitor to be tested is an unusable capacitor.

[0125] The beneficial effects of the present invention are as follows: through precise measurement and equivalent circuit modeling, the frequency domain characteristics of the capacitor to be tested are systematically obtained, and the loss is calculated based on the obtained data, which provides a solid foundation for analyzing the performance and reliability of the capacitor in practical applications, and studies the relationship between the capacitor series equivalent circuit and the frequency domain dielectric spectrum parameters, and obtains the corresponding values ​​of the capacitor equipment at different voltage frequencies and their changing trends, which is different from the current fixed frequency measurement, and better characterizes the active loss characteristics of the capacitor.

[0126] Figure 8 FIG. 1 shows an internal structure diagram of a computer device in an embodiment. The computer device may be a terminal or a server. Figure 8 As shown, the computer device includes a processor, a memory and a network interface connected via a system bus. The memory includes a non-volatile storage medium and an internal memory. The non-volatile storage medium of the computer device stores an operating system and may also store a computer program. When the computer program is executed by the processor, the processor may implement the capacitor loss measurement method. The internal memory may also store a computer program. When the computer program is executed by the processor, the processor may implement the capacitor loss measurement method. Those skilled in the art will understand that Figure 8 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0127] In one embodiment, a computer device is provided, comprising a memory and a processor, wherein the memory stores a computer program, and when the computer program is executed by the processor, the processor performs the following steps:

[0128] Step S1, performing voltage and current acquisition operations, applying a preset frequency steady-state voltage to the capacitor to be tested, and acquiring a target voltage and a target current of the capacitor to be tested;

[0129] Step S2, performing a parameter adjustment operation, applying a steady-state voltage of a preset frequency to the equivalent series circuit, and adjusting parameters of an equivalent resistance and an equivalent capacitance in the equivalent series circuit until the voltage and current in the equivalent series circuit are the target voltage and the target current;

[0130] Step S3, performing a marking operation to obtain parameters of the adjusted equivalent resistance and equivalent capacitance, and marking them as the actual resistance and actual capacitance of the capacitor to be tested under a preset frequency steady-state voltage;

[0131] Step S4, modifying the frequency of the applied steady-state voltage multiple times based on the frequency value set in the frequency domain dielectric spectrum, and repeating steps S1 to S3, so as to obtain the actual resistance and actual capacitance at each frequency steady-state voltage;

[0132] Step S5: Calculate the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage.

[0133] By studying the relationship between the series equivalent circuit of capacitors and the frequency domain dielectric spectrum parameters, the corresponding values ​​of capacitor equipment and their changing trends at different voltage frequencies are obtained. This is different from the current fixed frequency measurement and can better characterize the active loss characteristics of capacitors.

[0134] In one embodiment, a computer-readable storage medium is provided, storing a computer program, wherein when the computer program is executed by a processor, the processor performs the following steps:

[0135] Step S1, performing a voltage and current acquisition operation, applying a preset frequency steady-state voltage to the capacitor to be tested, and acquiring a target voltage and a target current of the capacitor to be tested;

[0136] Step S2, performing a parameter adjustment operation, applying a steady-state voltage of a preset frequency to the equivalent series circuit, and adjusting parameters of an equivalent resistance and an equivalent capacitance in the equivalent series circuit until the voltage and current in the equivalent series circuit are the target voltage and the target current;

[0137] Step S3, performing a marking operation to obtain parameters of the adjusted equivalent resistance and equivalent capacitance, and marking them as the actual resistance and actual capacitance of the capacitor to be tested under a preset frequency steady-state voltage;

[0138] Step S4, modifying the frequency of the applied steady-state voltage multiple times based on the frequency value set in the frequency domain dielectric spectrum, and repeating steps S1 to S3, so as to obtain the actual resistance and actual capacitance at each frequency steady-state voltage;

[0139] Step S5: Calculate the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage.

[0140] By studying the relationship between the series equivalent circuit of capacitors and the frequency domain dielectric spectrum parameters, the corresponding values ​​of capacitor equipment and their changing trends at different voltage frequencies are obtained. This is different from the current fixed frequency measurement and can better characterize the active loss characteristics of capacitors.

[0141] Those of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be implemented by instructing related hardware through a computer program, and the program can be stored in a non-volatile computer-readable storage medium. When the program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this application may include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), RAMbus direct RAM (RDRAM), direct RAMbus dynamic RAM (DRDRAM), and RAMbus dynamic RAM (RDRAM), etc.

[0142] The technical features of the above embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0143] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A capacitor loss measurement method based on frequency domain dielectric spectroscopy, characterized in that: The method comprises: Step S1, performing voltage and current acquisition operations, applying a preset frequency steady-state voltage to the capacitor to be tested, and acquiring a target voltage and a target current of the capacitor to be tested; Step S2, performing a parameter adjustment operation, applying a steady-state voltage of a preset frequency to the equivalent series circuit, and adjusting parameters of an equivalent resistance and an equivalent capacitance in the equivalent series circuit until the voltage and current in the equivalent series circuit are the target voltage and the target current; Step S3, performing a marking operation to obtain parameters of the adjusted equivalent resistance and equivalent capacitance, and marking them as the actual resistance and actual capacitance of the capacitor to be tested under a preset frequency steady-state voltage; Step S4, modifying the frequency of the applied steady-state voltage multiple times based on the frequency value set in the frequency domain dielectric spectrum, and repeating steps S1 to S3, so as to obtain the actual resistance and actual capacitance at each frequency steady-state voltage; Step S5: Calculate the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage.

2. The capacitor loss measurement method based on frequency domain dielectric spectroscopy according to claim 1 is characterized in that: The step S1 of performing voltage and current acquisition operations, applying a preset frequency steady-state voltage to the capacitor to be tested, and acquiring a target voltage and a target current of the capacitor to be tested, comprises: Step S101, connecting the capacitor to be tested, a preset voltage source and a preset current meter in sequence to form a first loop, and connecting the preset voltage meter to both ends of the preset voltage source; Step S102, applying a preset frequency steady-state voltage to the capacitor to be tested based on the preset voltage source; Step S103 : acquiring a target voltage and a target current of the capacitor to be tested based on the preset current meter and the preset voltage meter respectively.

3. The capacitor loss measurement method based on frequency domain dielectric spectroscopy according to claim 2 is characterized in that: It also includes an industrial computer, the preset voltage source is connected to and controlled by the industrial computer, and the preset ammeter and the preset voltmeter are respectively connected to the industrial computer.

4. The capacitor loss measurement method based on frequency domain dielectric spectroscopy according to claim 1, characterized in that: The step S2 of performing the parameter adjustment operation, applying a steady-state voltage of a preset frequency to the equivalent series circuit, and adjusting the parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current, includes: Step S201, calculating a complex capacitance constant and a dielectric loss tangent according to the target voltage and the target current; Step S202: adjusting parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit based on the complex capacitance constant and the dielectric loss tangent until the voltage and the current in the equivalent series circuit reach the target voltage and the target current.

5. The capacitor loss measurement method based on frequency domain dielectric spectroscopy according to claim 1, characterized in that: The equivalent series circuit includes an equivalent resistor and an equivalent capacitor connected in series.

6. The capacitor loss measurement method based on frequency domain dielectric spectroscopy according to claim 1, characterized in that: The step S5 of calculating the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage includes: Step S501, obtaining a lossless capacitor having the same parameters as the capacitor to be tested; Step S502, measuring the reference resistance and reference capacitance of the lossless dielectric spectrum at each frequency steady-state voltage; Step S503: Compare the actual resistance and the reference resistance at different frequencies, and compare the actual capacitance and the reference capacitance to obtain the loss of the capacitor to be tested at different frequencies.

7. The capacitor loss measurement method based on frequency domain dielectric spectroscopy according to claim 1, characterized in that: After the step S5 of calculating the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage, the method further includes: Step S601, determining whether the loss of the capacitor to be tested has reached a preset value; Step S602: If the loss of the capacitor to be tested reaches a preset value, determine that the capacitor to be tested is an unusable capacitor.

8. A capacitor loss measurement device based on frequency domain dielectric spectroscopy A capacitor loss measurement device based on frequency domain dielectric spectroscopy, characterized in that: The device comprises: An acquisition module, used for instructing to implement step S1, executing voltage and current acquisition operations, applying a preset frequency steady-state voltage to the capacitor to be tested, and acquiring a target voltage and a target current of the capacitor to be tested; an adjustment module, used for instructing to implement step S2, perform a parameter adjustment operation, apply a steady-state voltage of a preset frequency to the equivalent series circuit, and adjust the parameters of the equivalent resistance and the equivalent capacitance in the equivalent series circuit until the voltage and the current in the equivalent series circuit are the target voltage and the target current; A marking module, used to instruct to implement step S3, perform a marking operation, obtain the parameters of the adjusted equivalent resistance and equivalent capacitance, and mark them as the actual resistance and actual capacitance of the capacitor to be tested under a preset frequency steady-state voltage; A modification module, used to instruct the implementation of step S4, to modify the frequency of the applied steady-state voltage multiple times based on the frequency value set in the frequency domain dielectric spectrum, and to repeat steps S1 to S3, so as to obtain the actual resistance and actual capacitance at each frequency steady-state voltage; The calculation module is used to instruct the implementation of step S5, calculating the loss of the capacitor to be tested based on the actual resistance and actual capacitance at each frequency steady-state voltage.

9. A computer-readable storage medium, characterized in that: A computer program is stored, and when the computer program is executed by a processor, the processor executes the steps of the capacitor loss measurement method based on frequency domain dielectric spectroscopy according to any one of claims 1 to 7.

10. A computer device, characterized in that: The device includes a memory and a processor, wherein the memory stores a computer program, and when the computer program is executed by the processor, the processor executes the steps of the capacitor loss measurement method based on frequency domain dielectric spectroscopy according to any one of claims 1 to 7.

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