Data reading circuit, display driver chip, display driving method and display device

By introducing a clock signal processing circuit into the display driver chip to generate a second clock signal at multiple sampling time points, the problem that the display driver chip cannot match the specification parameters of various Flash chips is solved, and adaptive data collection and compatibility improvement for different models of Flash chips are achieved.

CN119832855BActive Publication Date: 2025-09-16BOE TECHNOLOGY GROUP CO LTD +1
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Patent Information

Application Number
CN202510168537.7
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-02-14
Publication Date
2025-09-16
Estimated Expiration
2045-02-14

AI Technical Summary

Technical Problem

Display driver chips cannot simultaneously match Flash chips with multiple specifications and parameters, resulting in the need to configure different sampling time points, increasing the complexity of code management and limiting the compatibility of Flash chip models.

Method used

By introducing a clock signal processing circuit into the display driver chip, a second clock signal with multiple interval-distributed sampling signals is generated, allowing data collection at multiple sampling time points, adapting to the data preparation time of different models of Flash chips, and avoiding the single configuration of the sampling time point.

Benefits of technology

It realizes adaptive data collection for different types of Flash chips, covers a wider range of data preparation time, reduces the configuration requirements for display driver chips, and improves compatibility.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present disclosure provides a data reading circuit, a display driver chip, a display driving method, and a display device. The data reading circuit includes a clock circuit, a clock signal processing circuit, and a sampling circuit. The clock circuit is configured to generate a first clock signal. The clock signal processing circuit is configured to process the first clock signal to obtain a second clock signal, wherein the second clock signal has multiple sampling signals distributed at intervals within a clock cycle of the first clock signal. The sampling circuit includes an input terminal and a control terminal, and the control terminal is used to receive the second clock signal. When the output terminal of the clock circuit is connected to the clock signal input terminal of a target memory and the data output terminal of the target memory is connected to the input terminal of the sampling circuit, the target memory periodically outputs data from the data output terminal under the control of the first clock signal, and the sampling circuit sequentially samples the data output from the data output terminal using each sampling signal until correct sampled data is obtained.
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Description

Technical Field

[0001] The present disclosure relates to the field of display technology, and more specifically, to a data reading circuit, a display driver chip, a display driving method, and a display device. Background Art

[0002] In the field of organic light-emitting diode (OLED) display technology, in order to optimize the display effect, it is usually necessary to store compensation data in the Flash chip of the display module. After the display module is turned on, the display driver integrated circuit (DDIC) can read the compensation data from the Flash chip and use it to compensate the display image.

[0003] However, there are many Flash chip manufacturers on the market, and the Flash chips produced by different manufacturers have different specifications and parameters, and the display driver chip cannot match Flash chips with different specifications and parameters at the same time. Summary of the Invention

[0004] The present disclosure aims to provide a data reading circuit, a display driver chip, a display driving method and a display device to solve the technical problem in the related art that the display driver chip cannot simultaneously match Flash chips with multiple specifications and parameters.

[0005] To achieve the above objectives, the present disclosure adopts the following technical solutions:

[0006] A first aspect of the present disclosure provides a data reading circuit, the data reading circuit comprising a clock circuit, a clock signal processing circuit, and a sampling circuit;

[0007] The clock circuit is configured to generate a first clock signal;

[0008] The input end of the clock signal processing circuit is connected to the output end of the clock circuit, and the clock signal processing circuit is configured to process the first clock signal to obtain a second clock signal, wherein the second clock signal has a plurality of sampling signals distributed at intervals within a clock cycle of the first clock signal, and the sampling signals are at a first level or a second level;

[0009] The sampling circuit includes an input end and a control end. The control end is connected to the output end of the clock signal processing circuit and is used to receive the second clock signal. When the output end of the clock circuit is connected to the clock signal input end of the target memory and the data output end of the target memory is connected to the input end of the sampling circuit, the target memory periodically outputs data from the data output end under the control of the first clock signal. The sampling circuit sequentially uses each sampling signal of the multiple spaced sampling signals to sample the data output from the data output end until correct sampled data is obtained.

[0010] Optionally, the clock signal processing circuit includes:

[0011] a frequency multiplication circuit, wherein an input end of the frequency multiplication circuit is connected to an output end of the clock circuit, and the frequency multiplication circuit is configured to perform frequency multiplication processing on the first clock signal to obtain a third clock signal;

[0012] A logic gate comprising two input terminals and an output terminal, one of the two input terminals being connected to the output terminal of the clock circuit, the other input terminal being connected to the output terminal of the frequency multiplication circuit, and the output terminal being connected to the control terminal of the sampling circuit, the logic gate being configured to perform a logical operation on the first clock signal and the third clock signal to obtain the second clock signal.

[0013] Optionally, when the sampling signal is at the first level, the logic gate is an AND gate.

[0014] Optionally, when the sampling signal is at the second level, the logic gate is an OR gate.

[0015] Optionally, the frequency multiplication circuit is a 3-times frequency multiplication circuit, a 4-times frequency multiplication circuit or a 5-times frequency multiplication circuit.

[0016] Optionally, the input end of the clock circuit is configured to be connected to a crystal oscillator circuit and to process a system clock signal generated by the crystal oscillator circuit to generate the first clock signal.

[0017] Optionally, the sampling circuit is further configured to perform a correctness check on the sampled data obtained by sampling using the current sampling signal within one clock cycle of the first clock signal, and if the correctness check fails, continue to sample using the next sampling signal among the multiple spaced sampling signals until the sampled data that passes the correctness check is obtained.

[0018] Optionally, the target memory is a flash memory.

[0019] A second aspect of the present disclosure provides a display driver chip, comprising the data reading circuit as described above.

[0020] A third aspect of the present disclosure provides a display driving method, which is applicable to the display driving chip described above, and includes:

[0021] Outputting a data read instruction and a first clock signal to a target memory, wherein after receiving the data read instruction, the target memory periodically performs data preparation under the control of the first clock signal and outputs the prepared compensation data through a data output terminal;

[0022] The data outputted from the data output terminal is sampled in sequence using each sampling signal in a plurality of sampling signals distributed at intervals in the second clock signal until correct sampling data is obtained.

[0023] A fourth aspect of the present disclosure provides a display device comprising a display panel, a flash memory and the display driver chip as described above, wherein the flash memory stores compensation data, and the display driver chip is configured to utilize the data reading circuit to read the compensation data from the flash memory and compensate for the image to be displayed.

[0024] The beneficial effects of the present disclosure are as follows:

[0025] The data reading circuit of the disclosed embodiment adds a clock signal processing circuit, uses the clock signal processing circuit to process the first clock signal to obtain a second clock signal, and provides the second clock signal to the sampling circuit, wherein the second clock signal has multiple sampling signals distributed at intervals within one clock cycle of the first clock signal, that is, it has multiple sampling time points, so multiple sampling can be performed. When no data can be collected at the first sampling time point, sampling will continue to be performed at the second sampling time point, and so on until accurate data is collected. It realizes adaptive data collection at appropriate sampling time points for different models of Flash chips, without having to configure different sampling time points in the display driver chip for different models of Flash chips. Moreover, since the second clock signal has multiple sampling time points, it can cover a wider range of data preparation time t CLQV , that is, under the same configuration, data can be collected from multiple models of Flash chips. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] The specific embodiments of the present disclosure will be further described in detail below with reference to the accompanying drawings.

[0027] Figure 1 For the Flash chip in the related technology CLQV Schematic diagram of the parameters;

[0028] Figure 2This is a timing diagram of the main control chip reading data from the Flash chip in the related art;

[0029] Figure 3 A schematic diagram of the structure of a data reading circuit and a target memory provided in an embodiment of the present disclosure;

[0030] Figure 4 This is a structural diagram of a data reading circuit implemented using a frequency multiplication circuit and an AND gate according to an embodiment of the present disclosure;

[0031] Figure 5 Schematic diagram of the third clock signal clk3 and the second clock signal clk2 obtained by processing the first clock signal clk1 by a 3-times frequency multiplication circuit when the first clock signal clk1 is sampled at a high level;

[0032] Figure 6 Schematic diagram of the third clock signal clk3 and the second clock signal clk2 obtained by processing the first clock signal clk1 by a 4-times frequency multiplication circuit when the first clock signal clk1 is sampled at a high level;

[0033] Figure 7 Schematic diagram of the third clock signal clk3 and the second clock signal clk2 obtained by processing the first clock signal clk1 through a 5-times frequency multiplication circuit when the sampling frequency is high level;

[0034] Figure 8 Schematic diagram of the third clock signal clk3 and the second clock signal clk2 obtained by processing the first clock signal clk1 by a 3-times frequency multiplication circuit when the sampling frequency is low level;

[0035] Figure 9 A flowchart of a display driving method provided in an embodiment of the present disclosure;

[0036] Figure 10 A schematic structural diagram of a display device provided in an embodiment of the present disclosure. DETAILED DESCRIPTION

[0037] To make the purpose, technical solutions, and advantages of the embodiments of the present disclosure more clear, the technical solutions of the embodiments of the present disclosure will be clearly and completely described below in conjunction with the accompanying drawings of the embodiments of the present disclosure. Obviously, the described embodiments are part of the embodiments of the present disclosure, not all of the embodiments. Based on the described embodiments of the present disclosure, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present disclosure.

[0038] Unless otherwise defined, the technical or scientific terms used in this disclosure should have the usual meanings understood by people with ordinary skills in the field to which this disclosure belongs. The words "first", "second" and similar words used in this disclosure do not indicate any order, quantity or importance, but are only used to distinguish different components. Similarly, words such as "one", "an" or "the" do not indicate a quantity limitation, but rather indicate the existence of at least one. Words such as "include" or "comprise" mean that the elements or objects appearing before the word include the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Words such as "connect" or "connected" are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the object being described changes, the relative positional relationship may also change accordingly.

[0039] As a storage chip, the core function of Flash chip is to store data. Therefore, when reading data from Flash chip, the accuracy and reading efficiency of the data must be guaranteed, and the faster the reading speed, the better. CLQV It is a key specification parameter that describes the time interval between when the main control chip needs to read data and when the Flash chip receives the instruction and when the data is ready. The shorter this parameter is, the better the performance of the Flash chip. Figure 1 , Figure 1 Flash chip t CLQV Parameter diagram, where CS represents the chip select signal of the Flash chip, CLK represents the clock signal, t CH Indicates the positive pulse width within one clock cycle, t CL Indicates the negative pulse width within a clock cycle, MISO indicates the output signal of the Flash chip, and LSB out indicates the least significant bit output. Among them, the Flash chips produced by different manufacturers or different models of Flash chips produced by the same manufacturer have different t CLQV The parameters are usually different. For example, under the same voltage (such as 1.8V), the t CLQV The parameter is 7ns, and the t CLQV The parameter is 12.5ns, A and B represent different models of Flash chips. CLQV Different parameters will result in different data sampling locations in the main control chip.

[0040] Among them, the main control chip reads data from the Flash chip through the SPI communication mode. In the SPI communication mode, the main control chip acts as the master device and the Flash chip acts as the slave device. The master device and the slave device communicate through four lines, namely the clock line (CLK), the master output slave input line (MOSI), the master input slave output line (MISO) and the chip select line (CS). The master device sends the clock signal clk through the clock line. The clock signal clk controls the data transmission rhythm. At the rising or falling edge of the clock signal, the master device sends data to the slave device through the MOSI line, and the slave device sends data to the master device through the MISO line. The CS line is used to select a specific slave device.

[0041] When the master chip reads data from the Flash chip, it can use rising-edge sampling or falling-edge sampling. Rising-edge sampling refers to the master chip sampling the data output by the Flash chip via the data output line (such as the MISO line mentioned above) at the moment the clock signal transitions from low to high. Falling-edge sampling refers to the master chip sampling the data output by the Flash chip at the moment the clock signal transitions from high to low. When the master chip and the Flash chip communicate, they agree on a specific communication protocol and timing. In the rising-edge sampling protocol mode, the Flash chip prepares data and places it on the data line (i.e., the MISO line) at a specific phase of the clock signal. The master chip then uses its internal sampling circuit to capture the current level on the data line at the rising edge of the clock, identifying it as a valid data bit and completing the data read. Similarly, in the falling-edge sampling protocol mode, the Flash chip outputs data at the appropriate phase of the clock signal according to the protocol. When the master chip detects the falling edge of the clock, it triggers a sampling operation and reads the current level on the data line as valid data.

[0042] Please refer to Figure 2 , Figure 2 This is the timing diagram of the main control chip reading data from the Flash chip. Figure 2 Taking rising edge sampling as an example, Figure 2 In the above example, Flash clk represents the clock signal of the Flash chip, and sampling clk represents the clock signal of the sampling circuit in the main control chip. In the related art, the frequency of Flash clk and sampling clk is the same. Assuming that the frequencies of Flash clk and sampling clk are both 65MHz, the clock period of Flash clk and sampling clk is T = 1 / (65*10 6)=15.4ns. In one clock cycle, the time interval between the falling edge and the next rising edge of Flash clk is t=T / 2=7.69ns. When the main control chip needs to read data from the Flash chip, the main control chip first sends a command to the Flash chip. After receiving the command, the Flash chip prepares the data at the falling edge of the clock signal Flash clock, and the main control chip generally samples the data at the rising edge of the next clock signal. That is, the sampling time point is a fixed position, which is specifically the rising edge of the next clock signal. Figure 2 As shown, the main control chip samples data at the first arrow position t1. For Flash chip A, its data preparation time is t CLQV The data in Flash chip A is ready at time t1, and the main control chip can acquire the data at the rising edge t1. For Flash chip B, its data preparation time is t CLQV is 12.5ns, which is greater than 7.69ns. Therefore, at time t1, the data in Flash chip B is not yet fully prepared, and the main control chip cannot sample the data at the rising edge t1. Therefore, for different types of Flash chips, the main control chip needs to configure the data sampling position differently. If the display module replaces a different type of Flash chip, for example, from Flash chip A to Flash chip B, the code in the main control chip needs to be reconfigured, for example, reconfiguring the sampling time point to the second rising edge of the clock signal after the instruction is issued, that is, Figure 2 At time t2, the Flash chip B is adapted. The above reconfiguration process of the main control chip not only increases the complexity of code management in the main control chip, but also limits the Flash chip models applicable to the display module, which is not conducive to expanding the Flash chip models and chip manufacturers compatible with the main control chip.

[0043] In order to solve the above technical problems, the present disclosure provides a data reading circuit, a display driver chip, a display driving method and a display device. Figure 3 , Figure 3 This is a schematic diagram of the structure of an embodiment of a data reading circuit provided in an embodiment of the present disclosure. This data reading circuit is integrated into a display driver chip and is used to allow the display driver chip to read data from a Flash memory. The display driver chip is equivalent to the main control chip described above. It is understood that the data reading circuit can also be integrated into other main control chips for reading data from a Flash memory, and the embodiments of the present disclosure do not limit the specific type of the main control chip.

[0044] like Figure 3As shown, the data reading circuit includes a clock circuit 10, a clock signal processing circuit 20, and a sampling circuit 30. The clock circuit 10 is configured to generate a first clock signal clk1. The input terminal of the clock signal processing circuit 20 is connected to the output terminal of the clock circuit 10. The clock signal processing circuit 20 is configured to process the first clock signal clk1 to obtain a second clock signal clk2. The second clock signal clk2 has a plurality of sampling signals distributed at intervals within a clock cycle T1 of the first clock signal clk1. The sampling signals are at a first level or a second level. The sampling circuit 30 includes an input terminal and a control terminal. The control terminal is connected to the output terminal of the clock signal processing circuit 20 and is used to receive the second clock signal clk2. When the output end of the clock circuit 10 is connected to the clock signal input end CLK of the target memory, and the data output end MISO of the target memory is connected to the input end of the sampling circuit 30, the target memory periodically outputs data from the data output end MISO under the control of the first clock signal clk1, and the sampling circuit 30 sequentially samples the data output from the data output end MISO using each sampling signal of the multiple spaced sampling signals until correct sampled data is obtained.

[0045] Optionally, in the embodiment of the present disclosure, the target memory is a flash memory, i.e., a Flash memory. In other embodiments, the target memory may also be other types of memories using the SPI communication mode. Assuming that the clock cycle of the first clock signal clk1 is recorded as T1, the target memory periodically outputs data from the data output terminal MISO under the control of the first clock signal clk1. This can be understood as the target memory performing an operation of preparing the data and placing it on the data line (i.e., the data output terminal MISO) once per clock cycle T1 after receiving the data read instruction.

[0046] In the embodiment of the present disclosure, when the data reading circuit is used to read data from the target memory, the first clock signal clk1 generated by the clock circuit 10, in addition to being used to generate the second clock signal clk2, also needs to be connected to the clock signal input terminal CLK of the target memory to serve as the clock signal for transmitting data to the target memory, that is, the first clock signal clk1 output from the output terminal of the clock circuit 10 is input to the target memory through the clock line of the target memory.

[0047] In the related art, the first clock signal clk1 not only provides a clock signal for the target memory, but also is provided to the sampling circuit 30 as a control signal of the sampling circuit 30 to control the sampling circuit 30 to sample the data of the output terminal MISO of the target memory. CLQVThe sampling time point of the sampling circuit 30 does not match the sampling time point of the sampling circuit 30. For example, at the sampling time point of the sampling circuit 30, the data in the target memory is not yet fully prepared, which will cause the sampling circuit to fail to sample the data. In the embodiment of the present disclosure, the second clock signal clk2 is used to sample the data, which can be compatible with a wider range of data preparation time t CLQV .

[0048] Specifically, compared to the first clock signal clk1, the second clock signal clk2 has multiple sampling signals distributed at intervals within a clock cycle T1. Each sampling signal corresponds to a sampling time point, and each sampling time point forms a longer sampling time width. As long as the data in the target memory is ready before the last sampling time point in the sampling time width, the sampling circuit 30 can sample the data. When sampling using the first clock signal clk1, the data in the target memory must be ready before the first sampling time point. Otherwise, sampling cannot be completed and the sampling circuit's sampling time points must be reconfigured. Therefore, by configuring multiple sampling time points, the target memory can have a wider range of data preparation time t CLQV .

[0049] Compared with the related art, the embodiment of the present disclosure adds a clock signal processing circuit 20, uses the clock signal processing circuit 20 to process the first clock signal clk1 to obtain the second clock signal clk2, and provides the second clock signal clk2 to the sampling circuit 30, that is, uses the second clock signal clk2 to control the sampling circuit 30 to perform sampling. Since the second clock signal clk2 has multiple sampling signals distributed at intervals within a clock cycle T1 of the first clock signal clk1, that is, it has multiple sampling time points, it can be sampled multiple times. When no data is collected at the first sampling time point, it will continue to use the second sampling time point for sampling. When no data is collected at the second sampling time point, it will continue to use the third sampling time point for sampling, and so on until accurate data is collected. It realizes the adaptive collection of data at the appropriate sampling time point for different models of Flash chips, without the need to configure the sampling time points in the display driver chip differently for different models of Flash chips. In addition, since the second clock signal clk2 has multiple sampling time points, it can cover a wider range of data preparation time t CLQV , which means that data can be collected from multiple models of Flash chips.

[0050] In one possible implementation, Figure 4As shown, the clock signal processing circuit 20 includes a frequency multiplication circuit 210 and a logic gate 220. The input end of the frequency multiplication circuit 210 is connected to the output end of the clock circuit 10, and the frequency multiplication circuit 210 is configured to perform frequency multiplication processing on the first clock signal clk1 to obtain a third clock signal clk3; the logic gate 220 includes two input ends and an output end, one of the two input ends is connected to the output end of the clock circuit 10, and the other input end is connected to the output end of the frequency multiplication circuit 210, and the output end is connected to the control end of the sampling circuit 30. The logic gate 220 is configured to perform a logical operation on the first clock signal clk1 and the third clock signal clk3 to obtain the second clock signal clk2.

[0051] The frequency multiplier circuit 210 is used to increase the frequency of the first clock signal clk1 to an integer multiple of its original value. Assuming that the frequency of the first clock signal clk1 is denoted as f1, the clock period is denoted as T1, and the frequency of the third clock signal clk3 is denoted as f3, then f3 = n*f1, where n represents the multiple of the frequency multiplier circuit 210. After processing by the frequency multiplier circuit 210, the frequency of the first clock signal clk1 can be significantly increased. It can also be understood that the frequency multiplier circuit 210 is used to process a low-frequency signal to obtain a high-frequency signal.

[0052] Optionally, the frequency multiplication circuit 210 is a 3-times frequency multiplication circuit, a 4-times frequency multiplication circuit, or a 5-times frequency multiplication circuit, that is, the multiple of the frequency multiplication circuit 210 is 3, 4, or 5. For example, when the frequency multiplication circuit 210 is a 3-times frequency multiplication circuit, n=3, and f3=3*f1. Similarly, when the frequency multiplication circuit 210 is a 4-times frequency multiplication circuit, n=4, and f3=4*f1.

[0053] The logic gate 220 is used to perform a logic operation on the first clock signal clk1 and the third clock signal clk3 to obtain the second clock signal clk2. The second clock signal clk2 needs to meet the following requirements: within one clock cycle T1, it needs to have multiple sampling signals.

[0054] For sampling circuit 30, its control signal is typically low or high. That is, sampling circuit 30 typically performs sampling when the control terminal receives a low or high level. Because the second clock signal clk2 serves as the control signal for sampling circuit 30 in the disclosed embodiment, one of the first and second levels is high, and the other is low. For example, the first level is high and the second level is low; or the first level is low and the second level is high. The disclosed embodiment is described using the example of a first level being high and the second level being low.

[0055] The second clock signal clk2 has multiple sampling signals in one clock cycle T1, which can realize the process of the target memory outputting data once. The sampling circuit 30 has multiple sampling points for the output of the target memory, that is, multiple sampling can be performed at different time points. Figures 5 to 7 , Figure 5 Schematic diagram of a third clock signal clk3 and a second clock signal clk2 obtained by processing the first clock signal clk1 by a 3-times frequency multiplication circuit. Figure 6 Schematic diagram of a third clock signal clk3 and a second clock signal clk2 obtained by processing the first clock signal clk1 by a quadruple frequency multiplication circuit. Figure 7 Schematic diagram of the third clock signal clk3 and the second clock signal clk2 obtained by processing the first clock signal clk1 by a 5-times frequency multiplication circuit. Figures 5 to 7 It can be seen that when the frequency multiplication circuit 210 is a 3-times frequency multiplication circuit or a 4-times frequency multiplication circuit, within one clock cycle T1, the sampling circuit 30 has two sampling points, which are respectively recorded as sampling point 1 and sampling point 2. When the frequency multiplication circuit 210 is a 5-times frequency multiplication circuit, within one clock cycle T1, the sampling circuit 30 has three sampling points, which are respectively recorded as sampling point 1, sampling point 2, and sampling point 3. As the multiplication factor of the frequency multiplication circuit 210 increases, the number of sampling points of the second clock signal clk2 obtained in one clock cycle T1 will also increase. In this case, the data preparation time t CLQV The wider the range, the more Flash memory models can be applied.

[0056] It is understandable that the larger the multiple of the frequency multiplication circuit 210 is, the greater the sampling signal of the second clock signal clk2 in the clock cycle T1 (for example Figures 5 to 7 The more high levels 1) shown in FIG, that is, the more sampling points there are, the t of the applicable target memory is. CLQV The larger the parameter range, the larger the multiple, the higher the power consumption of the frequency multiplication circuit 210 and the sampling circuit 30. Therefore, the multiple of the frequency multiplication circuit 210 needs to be determined according to actual needs, such as the applicable t CLQV The parameter value range, power consumption requirements, etc. are set after comprehensive consideration.

[0057] Optionally, when the sampling signal is at the first level, that is, a high level, the logic gate 220 is an AND gate. Figures 4 to 7 As shown, when the logic gate 220 is an AND gate, the second clock signal clk2 will have multiple high levels in one clock cycle T1. Since the sampling circuit 30 is a high level sampling, the sampling circuit 30 will have multiple sampling points.

[0058] Optionally, when the sampling signal is at the second level, that is, the low level, the logic gate 220 is an OR gate. Figure 8 , Figure 8 Schematic diagram of the second clock signal clk2 and the third clock signal clk3 when the logic gate 220 is an OR gate and the frequency multiplication circuit 210 is a 3-time frequency multiplication circuit. Figure 8 It can be seen that at this time, the second clock signal clk2 has two low-level 0s in one clock cycle T1. Since the sampling circuit 30 is a low-level sampling, the sampling circuit 30 will have two sampling points. Similarly, for low-level sampling, as the multiplier of the frequency multiplication circuit 210 increases, the number of sampling points of the second clock signal clk2 obtained in one clock cycle T1 will also increase. At this time, the data preparation time t CLQV The wider the range, the more Flash memory models can be applied.

[0059] In a possible implementation, the input end of the clock circuit 10 is configured to be connected to a crystal oscillator circuit and to process the system clock signal clk0 generated by the crystal oscillator circuit to generate the first clock signal clk1 .

[0060] The display driver chip typically includes a crystal oscillator circuit, which generally includes a crystal oscillator and two capacitors. The crystal oscillator circuit generates the system clock signal clk0 required by the display driver chip. The frequency of the system clock signal clk0 is generally within a relatively low frequency range, for example, between 1.2 MHz and 12 MHz. Because the frequency of the clock signal required for reading and writing data to the Flash memory is different from the frequency of the system clock signal clk0, a clock circuit 10 is also provided within the display driver chip. The clock circuit 10 processes the system clock signal clk0 to obtain the clock signal required by the Flash memory. That is, the first clock signal clk1 can also be understood as Flash clk.

[0061] Optionally, the frequency of the first clock signal clk1 is 30 MHz, 65 MHz, etc. It is understandable that the frequency of the first clock signal clk1 is within the frequency range of clock signals supported by the Flash memory, and the embodiment of the disclosure does not limit the specific frequency of the first clock signal clk1.

[0062] In one possible implementation, the sampling circuit is further configured to perform a correctness check on the sampled data obtained by sampling using the current sampling signal within a clock cycle T1 of the first clock signal clk1, and if the correctness check fails, continue to perform sampling using the next sampling signal among the multiple spaced sampling signals until the sampled data that passes the correctness check is obtained.

[0063] In the embodiment of the present disclosure, at each sampling time point (i.e., the current sampling signal), the sampling circuit 30 needs to identify the sampled data after performing the sampling action. If the identification result is that the sampled data is empty, it means that no data has been sampled, and sampling is continued at the next sampling time point. If the identification result is that the sampled data is not empty, it means that data has been sampled, and the sampled data needs to be further corrected. If the correctness check passes, it means that the correct data has been sampled, and the data reading action within the current clock cycle T1 is completed, waiting for the next data reading. If the correctness check fails, it means that the sampled data is incorrect, and sampling is continued at the next sampling point, and the obtained sampled data is continued to be identified, and so on until the correctness check passes.

[0064] For example, Figure 7 Taking the high-level sampling shown as an example, when the sampling circuit 30 performs sampling at the first high level, that is, the first rising edge (sampling point 1), the sampled data is identified. If the identification result is that no data is sampled or the data is incorrect, sampling is continued at the second high level, that is, the second rising edge (sampling point 2), and the sampled data is identified, and so on until the correct data is collected.

[0065] Optionally, the correctness check in the embodiment of the present disclosure may be any method such as checksum check, error correction code (ECC) check, end-to-end data protection (E2E Protection), multiple read verification, etc.

[0066] Exemplarily, a sampling multiple read verification method verifies the correctness of sampled data. This multiple read verification method involves the main control chip reading the same data from Flash multiple times and comparing the results of each read. If the results are consistent across multiple reads, the data is likely correct; if the results are inconsistent, there may be a problem with the data. For example, for some critical data, three reads may be performed. If the results are the same across the three reads, the data is considered correct; if there are any differences, further analysis and processing can be performed.

[0067] It should be understood that the sampling circuit in the embodiments of this disclosure is the data acquisition circuit within the display driver chip in the related art, and the embodiments of this disclosure do not improve upon its specific circuitry. Similarly, the frequency multiplication circuit and logic gates in the embodiments of this disclosure can be implemented using existing frequency multiplication circuits and logic gate circuits in the related art, and the embodiments of this disclosure do not improve upon their specific circuitry. The embodiments of this disclosure primarily utilize the clock signal processing circuit implemented by the frequency multiplication circuit and logic gates to improve the data reading circuit, thereby increasing the range of Flash memory models that the data reading circuit can accommodate.

[0068] Based on the same inventive concept, a second aspect of the present disclosure provides a display driver chip, comprising the data reading circuit as described above.

[0069] The display driver chip in the embodiment of the present disclosure is a display driver integrated circuit (DDIC). Various compensation algorithms are integrated in the display driver chip. The display driver chip uses a data reading circuit to read compensation data from a Flash memory, and the compensation algorithm uses the compensation data to compensate the display image.

[0070] Optionally, the compensation algorithm includes but is not limited to a voltage drop compensation algorithm, a crosstalk compensation algorithm, a color balance compensation algorithm, an aging compensation algorithm, a brightness unevenness compensation algorithm, etc., and the compensation data may include the compensation data required when the display panel performs various compensation algorithms.

[0071] It can be understood that in addition to the data reading circuit as described above, the display driver chip can also include a signal processing unit, which is used to receive image data of the content to be displayed, configure the data reading circuit, use the compensation data read by the data reading circuit to compensate the content to be displayed, and control the display panel to display, etc.

[0072] Based on the same inventive concept, the third aspect of the present disclosure provides a display driving method, which is applicable to the display driving chip as described above, such as Figure 9 As shown, the display driving method includes the following steps:

[0073] Step S101, outputting a data read instruction and a first clock signal to a target memory. After receiving the data read instruction, the target memory periodically prepares data under the control of the first clock signal and outputs the prepared compensation data through a data output terminal.

[0074] Step S102 : sequentially sampling the data outputted from the data output terminal using each sampling signal of a plurality of sampling signals distributed at intervals in the second clock signal until correct sampling data is obtained.

[0075] In step S102, sampling is performed in sequence using each sampling signal until correct sampling data is obtained. This can be understood as: sampling is performed at the first sampling time point, and whether the sampling data is accurate is determined. If accurate data is obtained, the sampling is terminated, that is, the data reading operation is completed. If no data is sampled or the sampled data is inaccurate, sampling is continued at the second sampling time point. When no data is sampled or the data is inaccurate at the second sampling time point, sampling is continued at the third sampling time point, and so on until accurate data is collected.

[0076] For example, Figure 7 Taking the high-level sampling shown as an example, when the sampling circuit 30 performs sampling at the first high level, that is, the first rising edge (sampling point 1), the sampled data is identified. If the identification result is that no data is sampled or the data is incorrect, sampling is continued at the second high level, that is, the second rising edge (sampling point 2), and the sampled data is identified, and so on until the correct data is collected.

[0077] Based on the same inventive concept, the fourth aspect of the present disclosure provides a display device, including a display panel, a flash memory and the display driver chip as described above, wherein the flash memory stores compensation data, and the display driver chip is configured to use the data reading circuit to read the compensation data from the flash memory and compensate the display image.

[0078] Please refer to Figure 10 , Figure 10 A schematic diagram of the structure of a display device provided in an embodiment of the present disclosure is shown in FIG. Figure 10 As shown, the display device includes a display panel 400 , a flash memory 500 , and a display driver chip 600 . The display driver chip 600 is the display driver chip described in the above embodiment, and has a built-in data reading circuit.

[0079] Exemplarily, the display device may be any product or component with a display function, such as a mobile phone, a tablet computer, a television, a monitor, a laptop computer, a digital photo frame, a navigator, etc., and this embodiment does not limit this.

[0080] The display panel in the embodiments of the present disclosure may be an organic light-emitting diode (OLED) display panel. It is understood that the display panel may be of other types according to actual needs. For example, the display panel may be a quantum dot light-emitting diode (QLED) display panel or a micro light-emitting diode (MicroLED) display panel.

[0081] Obviously, the above embodiments of the present disclosure are merely examples for clearly illustrating the present disclosure, and are not intended to limit the implementation methods of the present disclosure. For those skilled in the art, other different forms of changes or modifications can be made based on the above description. It is impossible to enumerate all the implementation methods here. Any obvious changes or modifications derived from the technical solution of the present disclosure are still within the scope of protection of the present disclosure.

Claims

1. A data reading circuit, characterized in that: The data reading circuit includes a clock circuit, a clock signal processing circuit and a sampling circuit; The clock circuit is configured to generate a first clock signal; The input end of the clock signal processing circuit is connected to the output end of the clock circuit, and the clock signal processing circuit is configured to process the first clock signal to obtain a second clock signal, wherein the second clock signal has a plurality of sampling signals distributed at intervals within a clock cycle of the first clock signal, and the sampling signals are at a first level or a second level; The sampling circuit includes an input end and a control end. The control end is connected to the output end of the clock signal processing circuit and is used to receive the second clock signal. When the output end of the clock circuit is connected to the clock signal input end of the target memory and the data output end of the target memory is connected to the input end of the sampling circuit, the target memory periodically outputs data from the data output end under the control of the first clock signal. The sampling circuit sequentially uses each sampling signal of the multiple spaced sampling signals to sample the data output from the data output end until correct sampled data is obtained.

2. The data reading circuit according to claim 1, wherein: The clock signal processing circuit includes: a frequency multiplying circuit, the input end of the frequency multiplying circuit being connected to the output end of the clock circuit, the frequency multiplying circuit being configured to perform frequency multiplication on the first clock signal to obtain a third clock signal; and A logic gate comprising two input terminals and an output terminal, one of the two input terminals being connected to the output terminal of the clock circuit, the other input terminal being connected to the output terminal of the frequency multiplication circuit, and the output terminal being connected to the control terminal of the sampling circuit, the logic gate being configured to perform a logical operation on the first clock signal and the third clock signal to obtain the second clock signal.

3. The data reading circuit according to claim 2, wherein: When the sampling signal is at the first level, the logic gate is an AND gate.

4. The data reading circuit according to claim 2, wherein: When the sampling signal is at the second level, the logic gate is an OR gate.

5. The data reading circuit according to any one of claims 2 to 4, characterized in that: The frequency multiplication circuit is a 3-times frequency multiplication circuit, a 4-times frequency multiplication circuit or a 5-times frequency multiplication circuit.

6. The data reading circuit according to claim 1, wherein: The input end of the clock circuit is configured to be connected to a crystal oscillator circuit and to process a system clock signal generated by the crystal oscillator circuit to generate the first clock signal.

7. The data reading circuit according to claim 1, wherein: The sampling circuit is further configured to perform a correctness check on the sampled data obtained by sampling using the current sampling signal within one clock cycle of the first clock signal, and if the correctness check fails, continue to perform sampling using the next sampling signal among the multiple spaced sampling signals until sampling data that passes the correctness check is obtained.

8. The data reading circuit according to claim 1, wherein: The target memory is a flash memory.

9. A display driver chip, characterized in that: The data reading circuit comprises the data reading circuit according to any one of claims 1 to 8.

10. A display driving method, characterized in that: The display driving method is applicable to the display driving chip according to claim 9, and the display driving method includes: Outputting a data read instruction and a first clock signal to a target memory, wherein after receiving the data read instruction, the target memory periodically performs data preparation under the control of the first clock signal and outputs the prepared compensation data through a data output terminal; The data outputted from the data output terminal is sampled in sequence using each sampling signal in a plurality of sampling signals distributed at intervals in the second clock signal until correct sampling data is obtained.

11. A display device, characterized in that: The display driver chip comprises a display panel, a flash memory and the display driver chip as claimed in claim 9, wherein the flash memory stores compensation data, and the display driver chip is configured to use the data reading circuit to read the compensation data from the flash memory and compensate the image to be displayed.

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