Self-checking method for infrared temperature measuring device

Abstract

The invention provides a self-checking method for an infrared temperature measuring device, which is applied to a heating device, the infrared temperature measuring device is arranged in the heating device, the infrared temperature measuring device comprises a circuit board, a detector and a signal transmitting assembly, and the method comprises the following steps: acquiring a target signal value transmitted by the signal transmitting assembly; the detector compares the received target signal value with a preset signal range value; and determining the working state of the detector according to the comparison result. The signal transmitting assembly is additionally arranged on the circuit board, the signal transmitting assembly transmits infrared rays or visible light with the specific wavelength, the detector receives the infrared rays or visible light with the specific wavelength transmitted by the signal transmitting assembly, and the comparison result of the signal value of the received infrared rays or visible light with the specific wavelength and the preset range value is judged. Therefore, the failure detection of the infrared temperature measuring device is realized, and the risk caused by the out-of-control application temperature of the heating appliance is avoided.

Description

Technical Field

[0001] The present application relates to the technical field of electromagnetic cookers, and in particular to a self-test method for an infrared temperature measuring device. Background Art

[0002] Existing infrared thermometers include thermopile temperature detectors and indium gallium arsenide detectors. Thermopile detectors can detect infrared rays with wavelengths greater than 3μm, and indium gallium arsenide detectors can detect infrared rays with wavelengths of 0.7μm-2.6μm, so different wavelengths correspond to different application scenarios. Thermopile detectors are commonly used in ear thermometers and household appliance temperature measurement devices; indium gallium arsenide detectors are commonly used in infrared imaging, infrared remote sensing, and fiber optic sensing. Due to the small wavelength of indium gallium arsenide detectors that can pass through glass and microcrystalline panels, they have also been used in household appliances such as induction cookers in recent years. The indium gallium arsenide detector is used to pass through the microcrystalline plate to measure the temperature of the bottom of the pot.

[0003] However, in the existing induction cooker structure, the InGaAs detector is mainly installed below the center area of ​​the wire disk to measure the temperature of the bottom of the pot through the ceramic plate. The passive receiving signal of the InGaAs detector is weak. Apart from being able to detect open and short circuits in internal devices, it cannot accurately detect temperature deviations, obstructions, and device temperature drift, resulting in safety risks for heating appliances such as induction cookers. Summary of the invention

[0004] The purpose of the embodiments of the present application is to provide a self-test method for an infrared temperature measuring device, by adding a signal transmitting component on the circuit board, the signal transmitting component sends infrared light or visible light of a specific wavelength, the detector receives the infrared light or visible light of the specific wavelength emitted by the signal transmitting component, and determines the comparison result between the signal value of the received infrared light or visible light of the specific wavelength and the preset range value, so as to determine whether the working state of the detector is normal or failed, thereby realizing failure detection of the infrared temperature measuring device and avoiding the temperature of the heating device being out of control, which may lead to the generation of risks.

[0005] The present application provides a self-test method for an infrared temperature measuring device, which is applied to a heating device. The infrared temperature measuring device is arranged in the heating device. The infrared temperature measuring device includes: a circuit board, a detector and a signal transmitting component. The method includes:

[0006] Obtaining a target signal value emitted by the signal emitting component;

[0007] The detector compares the received target signal value with a preset signal range value;

[0008] According to the comparison result, the working state of the detector is determined.

[0009] In one embodiment, the signal emitting component is a light emitter, and obtaining the target signal value emitted by the signal emitting component includes:

[0010] When a preset trigger condition is met, a target signal value emitted by the light emitter is obtained.

[0011] In one embodiment, the target signal value is a target preset wavelength signal value; the preset trigger condition is: power-on start or according to a preset time interval; when the preset trigger condition is met, obtaining the target signal value emitted by the light emitter includes:

[0012] At the beginning of power-on, or at a preset time interval, the target preset wavelength signal value emitted by the light emitter at a fixed intensity within a preset duration is obtained.

[0013] In one embodiment, the preset signal range value is a preset temperature range value, and determining the working state of the detector according to the comparison result includes:

[0014] If the temperature value corresponding to the target preset wavelength signal value is within the preset temperature range, it is determined that the working state of the detector is normal; if not, it is determined that the working state of the detector is failed.

[0015] In one embodiment, the target signal value is a target preset intensity signal value, and the preset trigger condition is: starting at power-on or at a preset time interval; when the preset trigger condition is met, obtaining the target signal value emitted by the light emitter includes:

[0016] According to the preset time interval, the target preset intensity signal value emitted by the light emitter at a fixed wavelength within the preset duration is obtained.

[0017] In one embodiment, the preset signal range value is a preset temperature range value, and determining the working state of the detector according to the comparison result includes:

[0018] If the temperature value corresponding to the target preset intensity signal value is within the preset temperature range, it is determined that the working state of the detector is normal; if not, it is determined that the working state of the detector is invalid.

[0019] In one embodiment, the detector and the signal emitting component are packaged integrally.

[0020] In one embodiment, the signal emitting component is a trigger element, and the target signal value is a target voltage signal value; and obtaining the target signal value emitted by the signal emitting component includes:

[0021] According to a preset time interval, the trigger element is controlled to open, and the target voltage signal value of the trigger element is obtained.

[0022] In one embodiment, the preset signal range value is a preset voltage signal range value; and determining the working state of the detector according to the comparison result includes:

[0023] If the target voltage signal value is within the preset voltage signal range value, it is determined that the working state of the detector is normal; if not, it is determined that the working state of the detector is failed.

[0024] In one embodiment, the detector is an InGaAs detector.

[0025] In the present application scheme, a signal transmitting component is additionally provided on the circuit board, the signal transmitting component sends infrared light or visible light of a specific wavelength, the specific wavelength infrared light or visible light emitted by the signal transmitting component is received by the detector, and the comparison result between the signal value of the received specific wavelength infrared light or visible light and the preset range value is judged to judge whether the working state of the detector is normal or failed, thereby realizing failure detection of the infrared temperature measuring device and avoiding the temperature of the heating device being out of control, which leads to the generation of risks.

[0026] In addition, by adjusting the intensity of infrared or visible light of a specific wavelength, different infrared or visible light intensities correspond to different voltage signals representing different temperatures, thereby achieving calibration of different temperatures to achieve calibration of multiple temperature points of the detector.

[0027] By adding a signal processing circuit to the detector detection circuit. The signal processing circuit is used to connect to the external main control board. The detector detects the temperature signal of the specified area of ​​the bottom of the pot. The signal processing circuit is used to obtain the temperature signal and send an electrical signal corresponding to the temperature signal to the external main control board to detect the temperature of the specified area of ​​the bottom of the pot, so as to realize the failure detection of the infrared temperature measuring device. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] In order to more clearly illustrate the technical solution of the embodiments of the present application, the drawings required for use in the embodiments of the present application are briefly introduced below.

[0029] Figure 1 A schematic diagram of a flow chart of a self-test method for an infrared temperature measuring device provided in one embodiment of the present application;

[0030] Figure 2 A schematic diagram of the structure of an infrared temperature measuring device provided in an embodiment of the present application Figure 1 ;

[0031] Figure 3 A schematic diagram of the structure of an infrared temperature measuring device provided in an embodiment of the present application Figure 2 ;

[0032] Figure 4 for Figure 3 A front view of

[0033] Figure 5 A schematic diagram of the structure of an infrared temperature measuring device provided in an embodiment of the present application Figure 3 .

[0034] Reference numerals:

[0035] 1-infrared temperature measuring device; 100-circuit board; 200-detector; 300-signal transmitting component; 400-signal processing circuit; 500-external main control board; 600-trigger element. DETAILED DESCRIPTION

[0036] The technical solutions in the embodiments of the present application will be described below in conjunction with the drawings in the embodiments of the present application.

[0037] Similar reference numerals and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings. At the same time, in the description of this application, the terms "first", "second", etc. are only used to distinguish the description and cannot be understood as indicating or implying relative importance.

[0038] Please refer to Figure 1 The present application provides a self-test method for an infrared temperature measuring device, which is applied to a heating device, and the infrared temperature measuring device 1 is arranged in the heating device.

[0039] The heating device may be an electrical component that can heat and cook food. For example, the heating device may be an induction cooker, an electric heating pot, a heating cooker, a rice cooker, a food processor, or other electrical appliances that can heat food. In this embodiment, the heating device is an induction cooker as an example.

[0040] Exemplarily, the induction cooker has: an induction cooker base, a ceramic plate or panel for placing pots, a heating coil for heating the pots, and an infrared temperature measuring device 1 for detecting temperature. The ceramic plate or panel is installed on the induction cooker base, the infrared temperature measuring device 1 is arranged in the induction cooker base, the heating coil is arranged above the infrared temperature measuring device 1, and the infrared temperature measuring device 1 corresponds to the position of the temperature measuring perspective area through the heating coil, wherein the temperature measuring perspective area refers to the area on the ceramic plate or panel for placing pots of the induction cooker for the infrared temperature measuring device 1 signal to penetrate, and the temperature measuring perspective area is set to facilitate the infrared temperature measuring device 1 to realize the temperature measuring function. The heating coil generates a high-frequency magnetic field, and eddy currents caused by electromagnetic induction flow through the induction cooker, and the Joule heat generated by the eddy currents is used to heat the pots to be cooked.

[0041] In addition, a control panel can be set on the induction cooker, and function buttons can be set on the control panel. The function buttons may include power, reservation, timing, soup, hot pot, stir-fry, etc., so as to meet the user's various operational needs. The operation panel is also provided with a display screen for displaying the temperature value set by the user, etc.

[0042] Furthermore, the infrared temperature measuring device 1 comprises: a circuit board 100, a detector 200 and a signal transmitting component 300. The detector 200 and the signal transmitting component 300 are arranged on the circuit board 100. And both are arranged on the circuit board 100 away from the center of the heating coil of the heating device. The signal transmitting component 300 can be arranged on one side of the detector 200.

[0043] Optionally, the detector 200 is, for example, an InGaAs infrared detector capable of detecting infrared rays with a wavelength of 0.7 μm-2.6 μm, that is, the spectral response wavelength range of the detector 200 is 0.7 μm-2.6 μm. InGaAs infrared detectors are used in infrared imaging, infrared remote sensing, and light sensing applications. The wavelength of the InGaAs detector is small enough to pass through the ceramic plate or panel on which the cookware is placed, and the bottom temperature of the cookware can be detected through the ceramic plate or panel.

[0044] Optionally, an InGaAs infrared detector can be installed below the center area of ​​the heating coil to measure the bottom temperature of the pot through a ceramic plate or panel to achieve rapid temperature measurement.

[0045] The infrared temperature measuring device self-test method of the present application includes: Step S110-Step S130:

[0046] Step S110: Acquire the target signal value emitted by the signal emitting component 300.

[0047] The signal emitting component 300 can emit infrared or visible light with a wavelength of 0.7 μm-2.6 μm. For example, the signal emitting component 300 can be an incandescent lamp. The target signal value is the infrared signal or visible light signal emitted by the signal emitting component 300, and the wavelength value of the infrared signal or visible light signal represents the signal value.

[0048] Step S120: The detector 200 compares the received target signal value with a preset signal range value.

[0049] The signal transmitting component 300 transmits an infrared signal or a visible light signal, and the detector 200 is used to receive the infrared signal or the visible light signal transmitted by the signal transmitting component 300, and compare the wavelength value of the infrared signal or the visible light signal with a preset signal range value.

[0050] Step S130: Determine the working state of the detector 200 according to the comparison result.

[0051] When the wavelength value of the infrared signal or visible light signal received by the detector 200 is compared with the preset signal range value, if the comparison result is within the set range, the detector 200 is judged to be normal, otherwise it is invalid. In this way, it is judged whether the working state of the detector 200 is normal or invalid.

[0052] In one embodiment, please refer to Figure 2 The signal transmitting component 300 is a light transmitter. Step S110 specifically includes: when a preset trigger condition is met, obtaining a target signal value emitted by the light transmitter.

[0053] Optionally, the target signal value is a target preset wavelength signal value. Exemplarily, the target preset wavelength signal value may be infrared light with a wavelength range of 0.7 μm-2.6 μm, and the infrared light with a wavelength of 0.7 μm-2.6 μm is emitted by a light emitter.

[0054] The preset trigger condition is: power-on or preset time interval. The power-on refers to the moment when the infrared temperature measuring device starts to be powered on. The preset time interval can be set to T0, that is, after the infrared temperature measuring device starts to be powered on, the light transmitter emits infrared light with a wavelength range of 0.7μm-2.6μm at every T0 time interval.

[0055] When a preset trigger condition is met, a target signal value emitted by the light transmitter is obtained, including: at the beginning of power-on, or at a preset time interval, obtaining a target preset wavelength signal value emitted by the light transmitter at a fixed intensity within a preset duration.

[0056] The preset duration is defined as T1, and the fixed intensity is L1. In this embodiment, the fixed intensity of the infrared light emitted by the light emitter is L1, and the duration of the infrared light signal emission is T1. Therefore, the target preset wavelength signal value represents an infrared signal with a fixed intensity of L1, a signal emission duration of T1, and a specific wavelength of 1.4 μm, and the target preset wavelength signal value is finally received by the detector 200.

[0057] Further, the preset signal range value is a preset temperature range value. In the present application, the preset temperature range value may be any temperature value within a range of ±5°C that the cookware can reach after being heated. Step S130 specifically includes: if the temperature value corresponding to the target preset wavelength signal value is within the preset temperature range value, determining that the working state of the detector 200 is normal; if not, determining that the working state of the detector 200 is invalid.

[0058] As mentioned above, the light emitter emits an infrared signal with a specific wavelength of 1.4 μm and an intensity of L1 during the duration T1, and the preset signal range temperature value theoretically corresponding to the light emitter is 180±5°C. Therefore, when the detector 200 compares the temperature value corresponding to the received target preset wavelength signal value with the wavelength signal value corresponding to 180°C, if the temperature value corresponding to the target preset wavelength signal value received by the detector 200 is within the range of 180±5°C, it is judged that the detector 200 can accurately measure the temperature of the bottom of the pot through the ceramic plate of the induction cooker, indicating that the working state of the detector 200 is normal; if the temperature value corresponding to the target preset wavelength signal value received by the detector 200 is outside the range of 180±5°C, it is judged that the detector 200 cannot completely accurately measure the temperature of the bottom of the pot through the ceramic plate of the induction cooker, indicating that the working state of the detector 200 is invalid.

[0059] Optionally, the target signal value is a target preset intensity signal value. As mentioned above, the target preset intensity may be an infrared signal intensity of a preset intensity L1, and the infrared of the preset intensity L1 is emitted by the light emitter.

[0060] The preset trigger condition is: power-on or preset time interval. As mentioned above, power-on refers to the moment when the infrared temperature measuring device starts to be powered on. The preset time interval can be set to T0, that is, after the infrared temperature measuring device starts to be powered on, the light transmitter emits an infrared signal of preset intensity L1 every T0 time interval.

[0061] When a preset trigger condition is met, a target signal value emitted by the light transmitter is obtained, including: obtaining a target preset intensity signal value emitted by the light transmitter at a fixed wavelength within a preset duration at a preset time interval.

[0062] In this embodiment, under the condition of a fixed wavelength value, the intensity of the infrared signal emitted by the light transmitter is adjusted, and different intensities correspond to different temperatures, thereby achieving self-testing at different temperature points.

[0063] Further, the preset signal range value is a preset temperature range value, and step S130 specifically includes: if the temperature value corresponding to the target preset intensity signal value is within the preset temperature range value, determining that the working state of the detector 200 is normal; if not, determining that the working state of the detector is failed.

[0064] As mentioned above, the light emitter emits an infrared signal with a fixed intensity of L1 during the duration T1, and the preset signal range temperature value theoretically corresponding to the light emitter is 180±5°C. Therefore, when the detector 200 compares the temperature value corresponding to the received target preset intensity signal value with the wavelength signal value corresponding to 180°C, if the temperature value corresponding to the target preset light signal value received by the detector 200 is within the range of 180±5°C, it is judged that the detector 200 can accurately measure the temperature of the bottom of the pot through the ceramic plate of the induction cooker, indicating that the working state of the detector 200 is normal; if the temperature value corresponding to the target preset intensity signal value received by the detector 200 is outside the range of 180±5°C, it is judged that the detector 200 cannot accurately measure the temperature, indicating that the working state of the detector 200 is invalid.

[0065] For further information, please refer to Figure 3 , Figure 4 The detector 200 and the signal emitting component 300 are integrally packaged. The pins of the detector 200 are independently controlled, the pins are electrically connected to the external circuit board, and the detector 200 and the signal emitting component 300 are integrally packaged. Optionally, the detector 200 and the signal emitting component 300 are encapsulated by epoxy resin.

[0066] In this embodiment, the detector 200 and the signal emitting component 300 are packaged in one piece, which can reduce the module size and simplify the structure, while avoiding the influence of the detector 200 filter on the signal emitting component 300.

[0067] For further information, please refer to Figure 5 , the signal transmitting component 300 is a trigger element 600, and the target signal value is a target voltage signal value. Step S110 specifically includes: according to a preset time interval, controlling the trigger element 600 to open, and obtaining the target voltage signal value of the trigger element 600.

[0068] At the beginning of power-on, or at a preset time interval, the trigger switch is controlled to open. Exemplarily, the preset time interval can be set to T0, that is, after the infrared temperature measuring device starts to be powered on, the trigger switch is controlled to open or close at a certain frequency every T0 time interval. The trigger switch here includes but is not limited to: relays, optocoupler switches, transistors, etc. Since the signal of the detector 200 is weak and easily affected by dark current and component leakage, therefore, in this embodiment, the trigger switch is selected to open and close without generating current to affect the signal reception of the detector 200.

[0069] like Figure 5As shown, the trigger element 600 is connected to the signal processing circuit 400. By adding the signal processing circuit 400 to the detection circuit of the detector 200, the signal processing circuit 400 is used to connect with the external main control board 500 (i.e., a single chip microcomputer, referred to as MCU). The detector 200 detects the temperature signal of the specified area of ​​the bottom of the pot, and the signal processing circuit 400 is used to obtain the temperature signal and send an electrical signal corresponding to the temperature signal to the external main control board 500 to detect the temperature of the specified area of ​​the bottom of the pot. Among them, the specified area is the temperature measurement perspective area on the ceramic plate or panel of the induction cooker on which the pot is placed as mentioned above.

[0070] Optionally, the preset signal range value is a preset voltage signal range value. Step S130 specifically includes: if the target voltage signal value is within the preset voltage signal range value, determining that the working state of the detector is normal; if not, determining that the working state of the detector is invalid.

[0071] In this embodiment, the target voltage signal value is the electric signal value corresponding to the temperature signal sent by the signal processing circuit 400 to the external main control board 500. After the signal processing circuit 400 sends the electric signal corresponding to the temperature signal to the external main control board 500, the target voltage signal value is compared and judged with the preset voltage signal range value. If the electric signal value corresponding to the temperature signal sent by the signal processing circuit 400 to the external main control board 500 is within the preset voltage signal range value, it indicates that the working state of the detector 200 is normal; if the electric signal value corresponding to the temperature signal sent by the signal processing circuit 400 to the external main control board 500 is outside the preset voltage signal range value, it indicates that the detector 200 cannot accurately measure the temperature, indicating that the working state of the detector 200 is invalid. By changing the target voltage signal value at the receiving end of the detector 200, the comparison result with the preset voltage signal range value is judged, so as to judge whether the electric signal output by the signal processing circuit 400 is normal, and finally the detector 200 can accurately measure the temperature of the bottom of the pot.

[0072] In this embodiment, the components of the infrared temperature measuring device 1 are simple and universal, and the cost is low, but the requirements for the signal processing circuit 400 are higher.

[0073] In summary, the present application adds a signal transmitting component 300 to the circuit board 100, and the signal transmitting component 300 sends infrared light or visible light of a specific wavelength. The detector 200 receives the infrared light or visible light of the specific wavelength emitted by the signal transmitting component 300, and determines the comparison result between the signal value of the received infrared light or visible light of the specific wavelength and the preset range value, so as to determine whether the working state of the detector 200 is normal or failed, thereby realizing failure detection of the infrared temperature measuring device 1 and avoiding the temperature of the heating device being out of control, which may lead to the generation of risks.

[0074] In addition, by adjusting the intensity of infrared or visible light of a specific wavelength, different infrared or visible light intensities correspond to different voltage signals representing different temperatures, thereby achieving calibration of different temperatures, so as to achieve calibration of multiple temperature points of the detector 200 .

[0075] By adding a signal processing circuit 400 to the detection circuit of the detector 200. The signal processing circuit 400 is used to connect with the external main control board 500, the detector 200 detects the temperature signal of the specified area of ​​the bottom of the pot, and the signal processing circuit 400 is used to obtain the temperature signal and send an electrical signal corresponding to the temperature signal to the external main control board 500 to perform temperature detection on the specified area of ​​the bottom of the pot, so as to realize the failure detection of the infrared temperature measuring device 1.

[0076] In several embodiments provided in the present application, the disclosed devices and methods may also be implemented in other ways. The device embodiments described above are merely schematic, for example, the flowcharts and block diagrams in the accompanying drawings show the possible architecture, functions and operations of the devices, methods and computer program products according to the multiple embodiments of the present application. In this regard, each box in the flowchart or block diagram may represent a module, a program segment or a part of a code, and a module, a program segment or a part of a code contains one or more executable instructions for implementing a specified logical function. In some alternative implementations, the functions marked in the box may also occur in an order different from that marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they may sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram and / or the flowchart, and the combination of boxes in the block diagram and / or the flowchart, can be implemented with a dedicated hardware-based system that performs a specified function or action, or can be implemented with a combination of dedicated hardware and computer instructions.

[0077] In addition, the functional modules in the various embodiments of the present application may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.

[0078] If the function is implemented in the form of a software function module and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods of each embodiment of the present application.

Claims

1. A self-test method for an infrared temperature measuring device, applied to a heating device, wherein the infrared temperature measuring device is arranged in the heating device, characterized in that: The infrared temperature measuring device comprises: a circuit board, a detector and a signal transmitting component, and the method comprises: Obtaining a target signal value emitted by the signal emitting component; The detector compares the received target signal value with a preset signal range value; According to the comparison result, the working state of the detector is determined.

2. The self-test method of the infrared temperature measuring device according to claim 1, characterized in that: The signal emitting component is a light emitter, and obtaining the target signal value emitted by the signal emitting component includes: When a preset trigger condition is met, a target signal value emitted by the light emitter is obtained.

3. The self-test method of the infrared temperature measuring device according to claim 2, characterized in that: The target signal value is a target preset wavelength signal value; The preset trigger condition is: starting from power on or at a preset time interval; When a preset trigger condition is met, obtaining a target signal value emitted by the light emitter includes: At the beginning of power-on, or at a preset time interval, the target preset wavelength signal value emitted by the light emitter at a fixed intensity within a preset duration is obtained.

4. The infrared temperature measuring device self-test method according to claim 2 or 3, characterized in that: The preset signal range value is a preset temperature range value, and determining the working state of the detector according to the comparison result includes: If the temperature value corresponding to the target preset wavelength signal value is within the preset temperature range, it is determined that the working state of the detector is normal; if not, it is determined that the working state of the detector is failed.

5. The infrared temperature measuring device self-test method according to claim 2, characterized in that: The target signal value is a target preset strength signal value, and the preset trigger condition is: starting from power on or at a preset time interval; When a preset trigger condition is met, obtaining a target signal value emitted by the light emitter includes: According to the preset time interval, the target preset intensity signal value emitted by the light emitter at a fixed wavelength within the preset duration is obtained.

6. The self-test method of the infrared temperature measuring device according to claim 5, characterized in that: The preset signal range value is a preset temperature range value, and determining the working state of the detector according to the comparison result includes: If the temperature value corresponding to the target preset intensity signal value is within the preset temperature range, it is determined that the working state of the detector is normal; if not, it is determined that the working state of the detector is invalid.

7. The infrared temperature measuring device self-test method according to claim 5 or 6, characterized in that: The detector and the signal transmitting component are packaged integrally.

8. The self-test method of infrared temperature measuring device according to claim 1, characterized in that: The signal emitting component is a trigger element, and the target signal value is a target voltage signal value; and obtaining the target signal value emitted by the signal emitting component includes: According to a preset time interval, the trigger element is controlled to open, and the target voltage signal value of the trigger element is obtained.

9. The infrared temperature measuring device self-test method according to claim 8, characterized in that: The preset signal range value is a preset voltage signal range value; Determining the working state of the detector according to the comparison result includes: If the target voltage signal value is within the preset voltage signal range, it is determined that the working state of the detector is normal; If not, it is determined that the working state of the detector is failure.

10. The self-test method of infrared temperature measuring device according to claim 1, characterized in that: The detector is an InGaAs detector.

Images