Miniature weak-coupling dual-polarization probe for high-power microwave test and detection equipment

Abstract

The invention provides a small-sized weak-coupling dual-polarization probe and detection equipment for high-power microwave testing, and relates to a small-sized dual-polarization weak-coupling probe for high-power microwave testing, which comprises a loudspeaker main body structure, a bottom cover, a connector and a medium protection sheet. The bottom cover is used for sealing the bottom of the horn main body structure, the connector is used for sensing and transmitting high-power microwave signals received by the horn main body, and the dielectric sheet is installed at an opening in the upper end of the horn main body and plays a role in protecting a probe and resisting interference to a certain extent. The probe realizes gain reception of weak coupling, dual polarization and the like of high-power microwaves, has a wide beam width, overcomes the defects that strict space alignment and polarization matching alignment are needed, the size is large, the economic cost is high and the like in a traditional test method, and has a good application value in the fields of high-power microwave test, national defense science and technology and the like.

Description

Technical Field

[0001] The invention relates to a high-power microwave test probe, in particular to a small weak-coupled dual-polarization probe and detection equipment used for high-power microwave testing. Background Art

[0002] High-power microwave generation, propagation and reception test technology based on electromagnetic energy is a new research field with great application value in national defense science and technology, medical treatment, food processing, material hardening and other fields. In the measurement and testing of high-power microwaves, due to the high power and high energy characteristics of high-power microwaves, direct measurement is easy to cause damage to the signal analysis instrument. At present, one of the most common high-power microwave reception methods is "reception + attenuation", which uses traditional antenna reception and attenuates the microwave energy with an attenuator, and then enters the subsequent signal analysis instrument or back-end detection circuit for measurement. This method has the problems of large size, inconvenience in carrying and high cost. In terms of the selection of field strength receivers, the commonly used high-power microwave receiving test probes have the characteristics of high gain and narrow beam width. This requires a more rigorous spatial alignment operation during the test process, and increases the requirements for the attenuation of the attenuator, which consumes high time cost and economic cost. In addition, when the polarization direction of the incoming wave is uncertain or polarization alignment cannot be achieved, the single polarization probe test method can only measure the field strength component, resulting in a large field strength measurement error. Designing a high-power microwave test probe with weak coupling effect, miniaturization, dual-polarization receiving characteristics, and large beam width has good practical value and is helpful for low-cost testing of high-power microwaves.

[0003] Therefore, there is an urgent need for a small weakly coupled dual-polarization probe and detection equipment for high-power microwave testing. Summary of the invention

[0004] The purpose of the present invention is to overcome the practical problems of the current high-power microwave test receiving technology, and propose a high-power microwave test probe with weak coupling effect, miniaturization, dual-polarization receiving characteristics, and large beam width, which solves the shortcomings of traditional high-power microwave measurement probes, such as large volume and weight, strict spatial alignment and polarization alignment during use, and large field strength measurement errors. The specific technical solution is as follows:

[0005] In a first aspect, the present invention provides a small weakly coupled dual-polarization probe for high-power microwave testing, the probe comprising: a horn main body structure, a bottom cover, a connector and a dielectric sheet;

[0006] The speaker main body structure is a rectangular waveguide structure, and the operating frequency of the speaker main body structure is in the cutoff region of the waveguide, so as to realize the weak coupling receiving effect on the receiving beam; the inner wall of the speaker main body structure is provided with a plurality of protrusion blocks, and the plurality of protrusion blocks are spliced ​​in the speaker main body structure to form a cavity with a gradually changing opening; of the two protrusion blocks arranged opposite to each other in the speaker main body structure, one is provided with a channel for passing the connector probe, and the other is provided with a groove for fixing the connector probe;

[0007] A groove structure is arranged on the top of the speaker main body structure, and the dielectric sheet is fixed in the groove structure; the bottom cover is fixed on the bottom of the speaker main body structure; and the connector is arranged on the side of the speaker main body structure.

[0008] In another embodiment of the present aspect, the protrusion block is a trapezoidal protrusion block, which is vertically arranged inside the speaker main body structure, the long bottom surface of the trapezoidal protrusion block is fixed to the inner wall of the speaker main body structure, the short bottom surface of the trapezoidal protrusion block is arranged opposite to the short bottom surface of another trapezoidal protrusion block, and the inclined surface of the trapezoidal protrusion block is arranged toward the dielectric sheet.

[0009] In another embodiment of the present aspect, there are four trapezoidal protrusion blocks, each of which is respectively arranged on an inner wall of the speaker main structure, and the trapezoidal protrusion blocks are arranged opposite to each other in pairs. The trapezoidal protrusion blocks divide the cavity of the speaker main structure to form a gradual cavity with a gradually decreasing cross-sectional area.

[0010] In another embodiment of this aspect, the probe further includes: a connector; the connector is a radio frequency connector with a long probe structure, and the connector is inserted into a channel provided in the corresponding protrusion block.

[0011] In another embodiment of the present aspect, two connectors are provided, each of the connectors is inserted into a channel provided in a corresponding protrusion block, and the two connectors are vertically arranged in skew planes to receive incoming waves in the horizontal planning direction and the vertical polarization direction respectively.

[0012] In another embodiment of the present aspect, when one of the two connectors disposed vertically in different planes is connected to a matching load, the other connector is used to achieve single-polarization reception.

[0013] In another embodiment of this aspect, the material of the dielectric sheet is polytetrafluoroethylene material.

[0014] In another embodiment of this aspect, the dielectric sheet is used to protect the internal structure of the probe and to resist interference.

[0015] In another embodiment of this aspect, a shielding ridge is provided on the top of the speaker main body structure, and the shielding ridge is used to reduce the influence on the directional pattern during the use of the probe.

[0016] In a second aspect, the present invention further provides a high-power microwave testing device, wherein the device is provided with a small weakly coupled dual-polarization probe for high-power microwave testing as described in any embodiment of the first aspect, and the device is used to measure high-power microwaves.

[0017] The beneficial effects of the present invention are as follows:

[0018] The beneficial effect achieved by the above scheme is that the present invention realizes weak coupling, dual polarization and equal gain reception of waves from two polarization directions of high-power microwaves, and has a wide beam width, which solves the shortcomings of traditional test methods that require strict spatial alignment and polarization matching alignment, as well as the large size of the required attenuator and high economic cost. The invented small dual-polarization weak coupling probe for high-power microwave testing has the characteristics of small size, light weight, easy installation and carrying, simple structure, low economic cost, etc., and has good application value in the fields of high-power microwave testing, national defense science and technology, etc. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 A cross-sectional view of a small weakly coupled dual-polarization probe for high-power microwave testing;

[0020] Figure 2 A top view of a small weakly coupled dual-polarization probe for high-power microwave testing;

[0021] Figure 3 This is the simulation result of the directivity pattern of a small dual-polarization weakly coupled probe in the C band;

[0022] Among them, 1-speaker main body structure, 2-trapezoidal raised block A, 3-trapezoidal raised block B, 4-trapezoidal raised block C, 5-trapezoidal raised block D, 6-cylindrical channel, 7-connector probe, 8-conical small groove, 9-screw hole at the bottom of the speaker body, 10-shielding ridge surface, 11-groove structure, 12-groove screw hole, 13-bottom cover, 14-dielectric sheet, 15-connector. DETAILED DESCRIPTION

[0023] In order to make the purpose, technical solutions and advantages of this specification clearer, the technical solutions of this application will be clearly and completely described below in conjunction with the specific embodiments of this application and their corresponding drawings. Obviously, the described embodiments are only part of the embodiments of this specification, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this document.

[0024] The following combination Figure 1-3 , describes in detail the technical solutions provided by each embodiment of this specification. Specific embodiment 1:

[0026] like Figure 1 As shown, the present invention discloses a small weakly coupled dual polarization probe for high-power microwave testing, comprising a speaker main body structure, a bottom cover, a connector and a dielectric protection sheet. The bottom cover is used for the bottom cover of the speaker main body structure, the connector is used for sensing and conducting the high-power microwave signal received by the speaker main body, and the dielectric sheet is installed at the upper end opening of the speaker main body to protect the probe and have a certain anti-interference effect.

[0027] The main structure of the speaker is a small rectangular waveguide structure 1, and its operating frequency is in the cutoff region of the waveguide to achieve weak coupling reception of the incoming waves. There are four trapezoidal protrusions A, B, C, and D on its inner wall, forming a gradual structure in the rectangular waveguide, that is, a cavity whose opening gradually decreases downward. A cylindrical channel 6 is opened at the lower end of the trapezoidal protrusion block A and the trapezoidal protrusion block B, which runs through the outer wall of the main structure of the speaker and the side wall of the protrusion block, and is used to insert two connector probes 7 with different polarization directions. Small cylindrical grooves 8 are respectively arranged below the trapezoidal protrusion block C and the trapezoidal protrusion block D, which are used to fix the tail end of the connector probe. The cylindrical small groove and the cylindrical channel are arranged opposite to each other, and the center of the cylinder is on the same straight line.

[0028] The bottom edge of the speaker main structure is provided with a screw hole 9, which can be connected to the bottom cover 13 by screws. The top has a shielding ridge 10 and a groove structure 11. The shielding ridge can reduce the impact of the connector, mounting fixture, RF cable, etc. on the radiation pattern during the use of the probe. The groove is provided with a screw hole 12, which can be fixed to the dielectric sheet by a metal screw.

[0029] The bottom cover 13 is a rectangular metal sheet with a plurality of screw holes on the edge of the metal sheet, which can be connected to the bottom of the speaker main structure by metal screws.

[0030] The dielectric sheet is a rectangular dielectric sheet 14, which can be placed in the groove structure on the top of the speaker main structure and fixed by metal screws.

[0031] There are two connectors 15, both of which are N-shaped RF connectors 15 with long probe structures, which receive waves in the horizontal polarization direction and the vertical polarization direction respectively. When a matching load is connected to one of the connectors, the other connector can realize single polarization reception.

[0032] Except for the dielectric sheet of the probe which is made of polytetrafluoroethylene, the rest of the probe is made of metal materials.

[0033] It should be noted here that when the dual-polarization probe measures waves from any polarization direction, accurate field strength testing can only be achieved when the gains in the two polarization directions are the same. Suppose the mutual coupling coefficient of the two polarization directions at a certain frequency point is M, and the probe aperture area in the x-polarization direction is A. x , the probe aperture area in the y polarization direction is A y , assuming that the angle between the polarization direction of the incident wave and the x-polarization direction of the probe is θ, the electromagnetic intensity of the incoming wave is E, and m is the index, then:

[0034] The signal power received in the x-polarization direction is:

[0035] P x =(1-M 2 )A x |cosθE| 2 +M 2 A y |sinθE| 2

[0036] The signal power received at port y is:

[0037] P y =(1-M 2 )A y |sinθE| 2 +M 2 A x |cosθE| 2

[0038] The total received power is:

[0039] P=P x +P y =A x |cosθE| 2 +A y |sinθE| 2

[0040] Assume A y =A x +u,

[0041] P=A x |cosθE| 2 +(A x +u)|sinθE| 2 =(A x +usin 2 θ)E 2

[0042] therefore

[0043]

[0044] Since the angle between the polarization direction of the incident wave and the x-polarization direction of the probe is unknown, sin 2 The value of θ is uncertain. Only when u=0, that is, A y =A x This requires that the two polarization directions of the dual-polarization probe have the characteristic of receiving incoming waves with equal gain.

[0045] Taking the C-band dual-polarization probe as an example, its key dimensions are Figure 2 The operating frequency and bandwidth are 4 to 6 GHz, and within this frequency band, it can achieve weak coupling reception below -20 dB for high-power microwaves in any polarization direction. The C-band antenna probe has a three-dimensional spatial size of approximately 5.3 cm × 5.2 cm × 2.3 cm, and is compact and light. Figure 3 Table 1 shows the probe’s directional diagrams in two different polarization directions at typical frequencies of 4.2 GHz and 5.5 GHz, and the probe gain and beam width results within the frequency band are given in Table 1. From the above results, it can be seen that the invented probe has a weak coupling effect, and the gains in the two polarization directions are basically the same, with a wide beam width, which can achieve low-cost and high-precision measurement of high-power microwaves.

[0046] Table 1

[0047] Specific embodiment 2:

[0049] The purpose of the present invention is to overcome the practical problems of the current high-power microwave test receiving technology, and propose a high-power microwave test probe with weak coupling effect, miniaturization, dual-polarization receiving characteristics, and large beam width, which solves the shortcomings of traditional high-power microwave measurement probes, such as large volume and weight, strict spatial alignment and polarization alignment during use, and large field strength measurement errors. The specific technical solution is as follows:

[0050] In a first aspect, the present invention provides a small weakly coupled dual-polarization probe for high-power microwave testing, the probe comprising: a horn main body structure, a bottom cover, a connector and a dielectric sheet;

[0051] The speaker main body structure is a rectangular waveguide structure, and the operating frequency of the speaker main body structure is in the cutoff region of the waveguide, so as to realize the weak coupling receiving effect on the receiving beam; the inner wall of the speaker main body structure is provided with a plurality of protrusion blocks, and the plurality of protrusion blocks are spliced ​​in the speaker main body structure to form a cavity with a gradually changing opening; of the two protrusion blocks arranged opposite to each other in the speaker main body structure, one is provided with a channel for passing the connector probe, and the other is provided with a groove for fixing the connector probe;

[0052] A groove structure is arranged on the top of the speaker main body structure, and the dielectric sheet is fixed in the groove structure; the bottom cover is fixed on the bottom of the speaker main body structure; and the connector is arranged on the side of the speaker main body structure.

[0053] In another embodiment of the present aspect, the protrusion block is a trapezoidal protrusion block, which is vertically arranged inside the speaker main body structure, the long bottom surface of the trapezoidal protrusion block is fixed to the inner wall of the speaker main body structure, the short bottom surface of the trapezoidal protrusion block is arranged opposite to the short bottom surface of another trapezoidal protrusion block, and the inclined surface of the trapezoidal protrusion block is arranged toward the dielectric sheet.

[0054] In another embodiment of the present aspect, there are four trapezoidal protrusion blocks, each of which is respectively arranged on an inner wall of the speaker main structure, and the trapezoidal protrusion blocks are arranged opposite to each other in pairs. The trapezoidal protrusion blocks divide the cavity of the speaker main structure to form a gradual cavity with a gradually decreasing cross-sectional area.

[0055] In another embodiment of this aspect, the probe further includes: a connector; the connector is a radio frequency connector with a long probe structure, and the connector is inserted into a channel provided in the corresponding protrusion block.

[0056] In another embodiment of the present aspect, two connectors are provided, each of the connectors is inserted into a channel provided in a corresponding protrusion block, and the two connectors are vertically arranged in skew planes to receive incoming waves in the horizontal planning direction and the vertical polarization direction respectively.

[0057] In another embodiment of the present aspect, when one of the two connectors disposed vertically in different planes is connected to a matching load, the other connector is used to achieve single-polarization reception.

[0058] In another embodiment of this aspect, the material of the dielectric sheet is polytetrafluoroethylene material.

[0059] In another embodiment of this aspect, the dielectric sheet is used to protect the internal structure of the probe and to resist interference.

[0060] In another embodiment of this aspect, a shielding ridge is provided on the top of the speaker main body structure, and the shielding ridge is used to reduce the influence on the directional pattern during the use of the probe.

[0061] In another embodiment of the present aspect, the speaker main body structure is a small rectangular waveguide structure, and its operating frequency is in the cutoff region of the waveguide to achieve weak coupling reception of the incoming waves. There are four trapezoidal raised blocks A, B, C, and D on its inner wall, forming a gradient structure in the rectangular waveguide. A cylindrical channel is opened at the lower end of the A and B trapezoidal raised blocks, which runs through the outer wall of the speaker main body structure and the side wall of the raised block, and is used to insert two connector probes with different polarization directions. There is a small cylindrical groove under the C and D raised blocks for fixing the tail end of the connector probe. The small cylindrical groove and the cylindrical channel are arranged opposite to each other, and the center of the cylinder is on the same straight line. The bottom edge of the speaker main body structure is provided with a screw hole, and the top has a shielding ridge and a groove structure, and a screw hole is provided on the groove.

[0062] In another embodiment of the present aspect, the bottom cover is a rectangular metal sheet with a plurality of screw through holes on the edge of the metal sheet, which can be connected to the bottom of the speaker main structure by metal screws.

[0063] In another embodiment of this aspect, the dielectric sheet is a rectangular dielectric sheet, which can be placed in the groove structure on the top of the speaker body structure and fixed by metal screws.

[0064] There are two connectors, which respectively receive the incoming waves in the horizontal polarization direction and the vertical polarization direction. The connector is an N-shaped head or SMA head radio frequency connector with a long probe structure.

[0065] The bottom cover is used to seal the bottom of the speaker main structure, the connector is used to sense and conduct the high-power microwave signal received by the speaker main body, and the dielectric sheet is installed at the upper opening of the speaker main body to protect the probe and have a certain anti-interference effect. The probe realizes weak coupling, dual polarization and other gain reception of high-power microwaves, and has a wide beam width, which solves the shortcomings of traditional test methods that require strict spatial alignment and polarization matching alignment, as well as large size and high economic cost. It has good application value in the fields of high-power microwave testing, national defense science and technology, etc.

[0066] In a second aspect, the present invention further provides a high-power microwave testing device, wherein the device is provided with a small weakly coupled dual-polarization probe for high-power microwave testing as described in any embodiment of the first aspect, and the device is used to measure high-power microwaves.

[0067] Example embodiments have been disclosed herein, and although specific terms are employed, they are used and should be interpreted only in a general illustrative sense and not for limiting purposes. In some embodiments, it will be apparent to those skilled in the art that, unless otherwise expressly noted, features, characteristics, and / or elements described in conjunction with a particular embodiment may be used alone or in combination with features, characteristics, and / or elements described in conjunction with other embodiments. Therefore, it will be understood by those skilled in the art that various changes in form and detail may be made without departing from the scope of the invention as set forth in the appended claims.

Claims

1. A small weakly coupled dual-polarization probe for high-power microwave testing, characterized in that: The probe comprises: a speaker main body structure, a bottom cover, a connector and a dielectric sheet; The speaker main body structure is a rectangular waveguide structure, and the operating frequency of the speaker main body structure is in the cutoff region of the waveguide, so as to realize the weak coupling receiving effect on the receiving beam; the inner wall of the speaker main body structure is provided with a plurality of protrusion blocks, and the plurality of protrusion blocks are spliced ​​in the speaker main body structure to form a cavity with a gradually changing opening; of the two protrusion blocks arranged opposite to each other in the speaker main body structure, one is provided with a channel for passing the connector probe, and the other is provided with a groove for fixing the connector probe; A groove structure is arranged on the top of the speaker main body structure, and the dielectric sheet is fixed in the groove structure; the bottom cover is fixed on the bottom of the speaker main body structure; and the connector is arranged on the side of the speaker main body structure.

2. A small weakly coupled dual-polarization probe for high-power microwave testing as claimed in claim 1, characterized in that: The protrusion block is a trapezoidal protrusion block, which is vertically arranged inside the speaker main structure, the long bottom surface of the trapezoidal protrusion block is fixed to the inner wall of the speaker main structure, the short bottom surface of the trapezoidal protrusion block is arranged opposite to the short bottom surface of another trapezoidal protrusion block, and the inclined surface of the trapezoidal protrusion block is arranged toward the dielectric sheet.

3. A small weakly coupled dual-polarization probe for high-power microwave testing as claimed in claim 2, characterized in that: There are four trapezoidal protrusion blocks, each of which is arranged on an inner wall of the speaker main structure. The trapezoidal protrusion blocks are arranged opposite to each other in pairs, and the trapezoidal protrusion blocks separate the cavity of the speaker main structure to form a gradual cavity with a gradually decreasing cross-sectional area.

4. A small weakly coupled dual-polarization probe for high-power microwave testing as claimed in claim 1, characterized in that: The probe further comprises: a connector; the connector is a radio frequency connector with a long probe structure, and the connector is inserted into a channel arranged in the corresponding protrusion block.

5. A small weakly coupled dual-polarization probe for high-power microwave testing as claimed in claim 4, characterized in that: There are two connectors, each of which is inserted into a channel set in a corresponding protruding block, and the two connectors are vertically arranged in different planes to receive incoming waves in the horizontal planning direction and the vertical polarization direction respectively.

6. A small weakly coupled dual-polarization probe for high-power microwave testing as claimed in claim 5, characterized in that: When one of the two connectors that are vertically arranged in different planes is connected to a matching load, the other connector can be used to achieve single-polarization reception.

7. A small weakly coupled dual polarization probe for high power microwave testing as claimed in claim 1, characterized in that: The material of the dielectric sheet is polytetrafluoroethylene.

8. A small weakly coupled dual-polarization probe for high-power microwave testing as claimed in claim 7, characterized in that: The dielectric sheet is used to protect the internal structure of the probe and to resist interference.

9. A small weakly coupled dual polarization probe for high power microwave testing as claimed in claim 1, characterized in that: A shielding ridge is arranged on the top of the speaker main body structure, and the shielding ridge is used to reduce the influence on the directional pattern during the use of the probe.

10. A high power microwave test equipment, characterized in that: The device is provided with a small weakly coupled dual-polarization probe for high-power microwave testing as described in any one of claims 1 to 9, and the device is used to measure high-power microwaves.

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