Frame frequency testing device and method for high-speed detector

Abstract

The invention relates to the technical field of high-speed detector frame frequency testing, in particular to a high-speed detector frame frequency testing device and method. The radiation source is used for outputting a ray beam; the frame frequency test card is arranged on the rotary table, the rotary table is located between the radiation source and the detector, and a hollow area is arranged on the frame frequency test card; the motor is connected with the frame frequency test card and is used for driving the frame frequency test card to rotate by taking the circle center of the frame frequency test card as the center; the detector is arranged at the rear end of the frame frequency test card, the detector is used for collecting a plurality of images after the ray beam passes through the frame frequency test card, and the plurality of images comprise feature regions of a high-gray value image and a low-gray value image; and judging whether the image quality of the feature regions in the plurality of images meets the requirement, and if so, determining that the frame frequency of the detector meets the requirement. According to the invention, the test work of the frame frequency of the high-speed detector can be rapidly completed with low cost, and meanwhile, an accurate detection result can be obtained.

Description

Technical Field

[0001] The present invention relates to the technical field of high-speed detector frame rate testing, and in particular to a high-speed detector frame rate testing device and method. Background Art

[0002] After the exposure is completed and the data is read out, the signal remaining inside the pixel in the detector is called the delayed signal, and the corresponding phenomenon is called the delay effect or memory effect. Since the delayed signal is mainly related to the afterglow attenuation characteristics of the scintillator, the delayed signal is also called the afterglow signal. Almost all inorganic solid-state scintillator materials have afterglow attenuation characteristics. In amorphous silicon detectors, the scintillator is CsI containing certain impurities and doped with tantalum (Tl) in the gap. Different scintillator components lead to different attenuation constants. The larger the attenuation time constant of the detector, the more likely it is for artifacts to appear in the output image. In sequence and continuous acquisition modes, the delay effect of the detector often leads to inaccurate image grayscale values ​​and the superposition of afterglow information in the next frame, which will affect the effect of high-speed acquisition of the projected image and the judgment of the detector frame rate test results. The frame rate of the detector should be measured on the basis of obtaining a valid image.

[0003] The existing methods for detecting the frame rate of an X-ray detector have high detection costs and complexity. Summary of the invention

[0004] In view of the above-mentioned shortcomings of the prior art, an object of the present invention is to provide a device and method for high-speed detector frame rate testing, which can obtain accurate detection results with low detection cost and complexity.

[0005] To achieve the above-mentioned and other related purposes, the present invention provides a high-speed detector frame rate testing device, comprising:

[0006] A ray source, used for outputting a ray beam;

[0007] A frame rate test card, which is arranged on a turntable, the turntable is located between the ray source and the detector, and a hollow area is arranged on the frame rate test card;

[0008] A motor connected to the frame rate test card, the motor being used to drive the frame rate test card to rotate around the center of the frame rate test card;

[0009] A detector is arranged at the rear end of the frame rate test card, and is used to collect multiple images after the ray beam passes through the frame rate test card, wherein the multiple images include characteristic areas of high gray value images and low gray value images; and to determine whether the image quality of the characteristic areas in the multiple images meets the requirements. If so, the frame rate of the detector meets the requirements.

[0010] In one embodiment of the present invention, the frame rate test card includes:

[0011] The metal area is arranged in a circular shape, and the motor is used to drive the frame rate test card to rotate with the center of the metal area as the center;

[0012] The hollow area is evenly distributed on the metal area with the center of the metal area as the center. The detector collects multiple images of the ray beam passing through the metal area as low gray value images, and the detector collects multiple images of the ray beam passing through the hollow area as high gray value images.

[0013] In one embodiment of the present invention, the hollow area is a linear groove structure.

[0014] In one embodiment of the present invention, the number of the hollow areas is set to be greater than or equal to 16.

[0015] In one embodiment of the present invention, a hollowed-out Arabic numeral is provided on one side of each hollowed-out area close to the center of the circle.

[0016] The present invention also provides a method for testing a high-speed detector frame rate, including the above-mentioned device for testing a high-speed detector frame rate. The method for testing a high-speed detector frame rate includes:

[0017] S1, outputting a ray beam through the ray source;

[0018] S2, the detector collects a plurality of images in which the high gray value image and the low gray value image appear alternately according to the set frame rate test requirement;

[0019] S3. Determine whether the image quality of the characteristic areas in the multiple images meets the requirements. If so, the frame rate of the detector meets the requirements.

[0020] In one embodiment of the present invention, it further includes:

[0021] S0. Before testing, select the hollow area at the Arabic numeral 1, the length direction of the hollow area is parallel to the length direction of the detector, and set the motor speed.

[0022] In one embodiment of the present invention, the step S3 of determining whether the image quality of the characteristic regions in the plurality of images meets the requirements, and if so, whether the frame rate of the detector meets the requirements includes:

[0023] When it is determined that the current frame image among the plurality of images does not include the Arabic numeral shape of the previous frame image, the frame rate of the detector meets the requirement.

[0024] The present invention also provides an electronic device, comprising a processor and a memory, wherein the memory stores program instructions, and the processor executes the program instructions to implement the above-mentioned method for testing the frame rate of a high-speed detector.

[0025] As described above, the device and method for high-speed detector frame rate testing of the present invention have the following beneficial effects:

[0026] (1) The high-speed detector frame rate test device of the present invention comprises a ray source, a frame rate test card, a turntable, a motor, and a detector. The present invention can quickly complete the high-speed detector frame rate test at a relatively low cost. The present invention can ensure that the high-speed detector frame rate meets the performance requirements of the industrial CT system and can obtain accurate test results.

[0027] (2) The frame rate test method for high-speed detectors of the present invention can determine whether the generated frame image is a valid frame by judging the imaging quality of the digital area in the image. The judgment of imaging quality is mainly due to the delay effect of the detector, which often leads to the superposition of the afterglow information in the previous frame and the next frame, which will affect the effect of high-speed acquisition of the projected image. The present invention determines the strength of the delay effect by judging the number of previous frame images contained in the current frame image. The test results of the test method of the present invention can be quantified, which can avoid the black box effect of the device self-test. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 A structural diagram of a high-speed detector frame rate testing device provided in an embodiment of the present application.

[0029] Figure 2 A structural diagram of a frame rate test card for a high-speed detector frame rate test device provided in an embodiment of the present application.

[0030] Figure 3 An enlarged structural diagram of a frame rate test card for a high-speed detector frame rate test device provided in an embodiment of the present application.

[0031] Figure 4 A flowchart of a high-speed detector frame rate testing method provided in an embodiment of the present application.

[0032] Component number description

[0033] 1 Radiation source

[0034] 2 Ray beam

[0035] 3 Frame rate test chart

[0036] 4 Turntable

[0037] 5. Motor

[0038] 6 Detector

[0039] 31 Metal Area

[0040] 32 Hollow Area DETAILED DESCRIPTION

[0041] The following describes the embodiments of the present invention by specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification. The present invention can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed in various ways based on different viewpoints and applications without departing from the spirit of the present invention. It should be noted that the following embodiments and features in the embodiments can be combined with each other without conflict.

[0042] It should be noted that the illustrations provided in the following embodiments are only used to illustrate the basic concept of the present invention in a schematic manner, and thus the illustrations only show components related to the present invention rather than being drawn according to the number, shape and size of components in actual implementation. In actual implementation, the type, quantity and proportion of each component may be changed arbitrarily, and the component layout may also be more complicated.

[0043] Terms such as first or second can be used to describe various components, but these components are not limited by the above terms. The above terms are used to distinguish one component from another component, for example, without departing from the scope of the concept according to the present disclosure, a first component can be referred to as a second component, and similarly, a second component can be referred to as a first component.

[0044] In addition, "connected / coupled" means that one component is directly electrically coupled to another component or is indirectly electrically coupled through another component. The singular form may include the plural form unless explicitly stated in the sentence. In addition, "include / comprise" or "includes / comprises" used in this specification indicates that one or more components, steps, operations, and elements exist or have been added. The specific structural or functional descriptions of the examples of the implementation of the concepts disclosed in this specification are only illustrated to describe the examples of the implementation of the concepts, and the examples of the implementation of the concepts can be implemented in various forms, but these descriptions are not limited to the examples of the implementation described in this specification.

[0045] According to the concept, various modifications and changes can be applied to the examples of the embodiments, so that the examples of the embodiments will be illustrated in the drawings and described in the specification. However, the examples of the embodiments according to the concept are not limited to the specific embodiments, but include all changes, equivalents or replacements included in the spirit and technical scope of the present disclosure.

[0046] It should be understood that when an element is described as being "coupled" or "connected" to another element, the element may be directly coupled or directly connected to the other element, or may be coupled or connected to the other element through a third element. Conversely, it should be understood that when an element is referred to as being "directly coupled to" or "directly coupled to" another element, no other element is placed between them. Other expressions describing the relationship between components (i.e., "between" and "directly between" or "adjacent to" and "directly adjacent to") need to be interpreted in the same manner.

[0047] The terms used in this specification are only used to describe specific examples of the embodiments and are not intended to limit the present disclosure. If there is no clear opposite meaning in the context, the singular form may include the plural form. In this specification, it should be understood that the term "including" or "having" indicates the presence of the features, quantities, steps, operations, components, parts or combinations thereof described in the specification, but the possibility of the presence or addition of one or more other features, quantities, steps, operations, components, parts or combinations thereof cannot be precluded.

[0048] If there is no contrary definition, all terms (including technical terms or scientific terms) used herein have the same meaning as those generally understood by ordinary technicians in the field. If the terms defined in the commonly used dictionary are not clearly defined in this specification, they should be interpreted as having the same meaning as in the context of the relevant technology, and not interpreted as ideal or overly formal meanings.

[0049] Descriptions of well-known components and processing techniques may be omitted so as not to unnecessarily obscure the embodiments of the disclosure.

[0050] Throughout the specification, the same reference numerals refer to the same elements. Thus, even if a reference numeral is not mentioned or described with reference to one figure, it may be mentioned or described with reference to another figure. Furthermore, even if a reference numeral is not shown in one figure, it may be mentioned or described with reference to another figure.

[0051] In addition, the logic level of the signal may be different or opposite to the described logic level. For example, a signal described as having a logic "high" level may alternatively have a logic "low" level, and a signal described as having a logic "low" level may alternatively have a logic "high" level.

[0052] The following will describe the various embodiments of the present disclosure in detail with reference to the accompanying drawings. However, it will be appreciated by those skilled in the art that in the various embodiments of the present disclosure, many technical details are provided in order to enable the reader to better understand the present disclosure. However, even without these technical details and various changes and modifications based on the following embodiments, the technical solutions claimed in the present disclosure can be implemented.

[0053] See also Figures 1 to 3 , Figure 1 A structural diagram of a high-speed detector frame rate testing device provided in an embodiment of the present application. Figure 2 A structural diagram of a frame rate test card for a high-speed detector frame rate test device provided in an embodiment of the present application. Figure 3 The enlarged structural diagram of a frame rate test card for a high-speed detector frame rate test device provided in an embodiment of the present application. The present invention provides a high-speed detector frame rate test device, comprising a ray source 1, a frame rate test card 3, a turntable 4, a motor 5, and a detector 6, wherein the ray source 1 is used to output a ray beam 2; the frame rate test card 3 is arranged on the turntable 4, the turntable 4 is located between the ray source 1 and the detector 6, and a hollow area 32 is arranged on the frame rate test card 3; the motor 5 is connected to the frame rate test card 3, and the motor 5 is used to drive the frame rate test card 3 to rotate with the center of the circle of the frame rate test card 3 as the center; the detector 6 is arranged at the rear end of the frame rate test card 3, and the detector 6 is arranged at the rear end of the frame rate test card 3, and the detector 6 is used to collect multiple images after the ray beam 2 passes through the frame rate test card 3, and the multiple images include feature areas of high gray value images and low gray value images; and it is judged whether the image quality of the feature areas in the multiple images meets the requirements, and if so, the frame rate of the detector 6 meets the requirements.

[0054] Specifically, the frame rate test card 3 includes a metal area 31 and a hollow area 32. The metal area 31 is set to a circular shape, and the motor 5 is used to drive the frame rate test card 3 to rotate with the center of the metal area 31 as the center; the hollow area 32 and the center of the metal area 31 are evenly distributed on the metal area 31, and the detector 6 collects multiple images of the ray beam 2 passing through the metal area 31 as low gray value images, and the detector 6 collects multiple images of the ray beam 2 passing through the hollow area 32 as high gray value images.

[0055] In one embodiment of the present invention, the high-speed detector frame rate test device of the present invention utilizes that the intensity of X-rays will be attenuated after passing through the metal area 31 of the frame rate test card 3. After the X-rays pass through the same position, when they pass through the hollow area 32, that is, when there is no metal sheet blocking, the gray value of the collected image is higher, and when there is a metal sheet blocking, the gray value of the collected image is lower.

[0056] Specifically, the hollow area 32 is a linear groove structure.

[0057] Specifically, the number of the hollow areas 32 is set to be greater than or equal to 16.

[0058] Specifically, a hollowed-out Arabic numeral is provided on one side of each hollowed-out area 32 close to the center of the circle.

[0059] In one embodiment of the present invention, the frame rate test card 3 is used to test the sampling frame rate of the detector 6. The frame rate test card 3 is a high-density, easy-to-process metal sheet.

[0060] In one embodiment of the present invention, the number of the linear slot structures is greater than or equal to 16, and may be but is not limited to 18, 20, 22, etc., and the linear slot structures are evenly distributed.

[0061] In one embodiment of the present invention, the frame rate test card 3 is connected to the output shaft position of the motor 5 .

[0062] To sum up, the high-speed detector frame rate testing device of the present invention includes a radiation source, a frame rate test card, a turntable, a motor, and a detector. The present invention can quickly complete the high-speed detector frame rate testing work at a low cost. The present invention can ensure that it meets the performance requirements of the industrial CT system and at the same time, can obtain accurate detection results.

[0063] See also Figure 4 , Figure 4 A flowchart of a high-speed detector frame rate test method provided in an embodiment of the present application. The present invention also provides a high-speed detector frame rate test method, including the above-mentioned high-speed detector frame rate test device, the high-speed detector frame rate test method includes:

[0064] Step S1 , outputting a ray beam 2 through the ray source 1 .

[0065] Step S2: the detector 6 collects a plurality of images in which the high gray value images and the low gray value images appear alternately according to the set frame rate test requirement.

[0066] S3. Determine whether the image quality of the characteristic areas in the multiple images meets the requirements. If so, the frame rate of the detector 6 meets the requirements.

[0067] Specifically, it also includes: S0. Before the test, a hollow area 32 at the Arabic numeral 1 is selected, the length direction of the hollow area 32 is parallel to the length direction of the detector 6, and the rotation speed of the motor 5 is set.

[0068] Specifically, the detector 6 in step S2 may collect the plurality of images in which the high gray value image and the low gray value image appear alternately according to the set frame rate test requirement, including:

[0069] S21, the detector 6 meets the sampling rate requirement of 300 Hz, and the rotation speed of the motor 5 is 562.5 rpm.

[0070] S22, the detector 6 collects 300 images in which the high gray value images and the low gray value images appear alternately within 1 second.

[0071] Specifically, in step S3, determining whether the image quality of the characteristic area in the plurality of images meets the requirements, if so, whether the frame rate of the detector 6 meets the requirements includes:

[0072] When it is determined that the current frame image among the plurality of images does not include the Arabic numeral shape of the previous frame image, the frame rate of the detector 6 meets the requirement.

[0073] In one embodiment of the present invention, if it is verified that the detector 6 meets the sampling rate requirement of 300 Hz, that is, the detector 6 can collect 300 high gray value images and low gray value images that alternate within 1 second, of which 150 images include high gray value images and 150 images include low gray value images. When the motor speed is 300 / 32=9.375r / s=562.5rpm, 300 high gray value images and low gray value images that alternate can be generated.

[0074] In one embodiment of the present invention, the preparation work before testing of a high-speed detector frame rate testing method of the present invention includes:

[0075] First, the radiation source 1, the detector 6 and the frame rate test card 3 are arranged.

[0076] Before the test, the hollow area 32 at the Arabic numeral 1 is selected, the length direction of the hollow area 32 is parallel to the length direction of the detector 6, and the speed of the motor 5 is set.

[0077] A test process for a high-speed detector frame rate test method of the present invention includes:

[0078] After the relative positions of the ray source 1, the detector 6 and the frame rate test card 3 are fixed, the area imaged by the hollow area 32 at the Arabic numeral 1 of the frame rate test card 3 on the detector 5 is marked as R, and the test is ready to start.

[0079] After the ray source 1 outputs the ray beam 2, the ray beam 2 can form an image on the detector 6 after penetrating the frame rate test card 3. The formed image is a black and white image, wherein the image corresponding to the hollow area 32 has a high grayscale value and is white, and the image corresponding to the remaining positions has a low grayscale value and is gray.

[0080] After the ray beam 2 is emitted, the region R is white with a high gray value. The ray source 1 continuously emits beams to generate X-rays. When the frame rate test card 3 rotates, the detector 6 continuously collects images to form a series of images. In each image, the region R will show a white-gray alternating transformation pattern.

[0081] If the detector 6 collects N (N=300) images within 1s, and the area R in the N (N=300) images is alternating between gray and white, of which N / 2 (150) images have high grayscale values ​​and are white, and N / 2 (150) images have low grayscale values ​​and are gray, and the image quality meets the requirements, then the sampling frame rate of the detector 6 is considered to be N.

[0082] The frame rate testing method for high-speed detectors of the present invention can determine whether the generated frame image is a valid frame by judging the imaging quality of the digital area in the image. The judgment of imaging quality is mainly due to the delay effect of the detector, which often leads to the superposition of the afterglow information in the previous frame and the next frame, which will affect the effect of high-speed acquisition of the projected image. The present invention determines the strength of the delay effect by judging the number of previous frame images contained in the current frame image. The test results of the test method of the present invention can be quantified, which can avoid the black box effect of the device self-test.

[0083] The above embodiments are merely illustrative of the principles and effects of the present invention, and are not intended to limit the present invention. Anyone familiar with the art may modify or alter the above embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or alterations made by a person of ordinary skill in the art without departing from the spirit and technical concept disclosed by the present invention shall still be covered by the claims of the present invention.

Claims

1. A high-speed detector frame rate test device, characterized in that: include: A ray source (1) for outputting a ray beam (2); A frame rate test card (3) is arranged on a turntable (4), wherein the turntable (4) is located between the ray source (1) and the detector (6), and a hollow area (32) is arranged on the frame rate test card (3); A motor (5) connected to the frame rate test card (3), the motor (5) being used to drive the frame rate test card (3) to rotate with the center of the circle of the frame rate test card (3) as the center; A detector (6) is arranged at the rear end of the frame rate test card (3), and the detector (6) is used to collect a plurality of images after the ray beam (2) passes through the frame rate test card (3), wherein the plurality of images include characteristic areas of high gray value images and low gray value images; And determine whether the image quality of the characteristic areas in the multiple images meets the requirements. If so, the frame rate of the detector (6) meets the requirements.

2. The high-speed detector frame rate testing device according to claim 1, characterized in that: The frame rate test card (3) comprises: The metal area (31) is arranged in a circular shape, and the motor (5) is used to drive the frame rate test card (3) to rotate with the center of the metal area (31) as the center; The hollow area (32) is evenly distributed on the metal area (31) with the center of the circle of the metal area (31) as the center, and the detector (6) collects multiple images of the ray beam (2) passing through the metal area (31) as low gray value images, and the detector (6) collects multiple images of the ray beam (2) passing through the hollow area (32) as high gray value images.

3. The high-speed detector frame rate test device according to claim 2, characterized in that: The hollow area (32) is a linear groove structure.

4. The high-speed detector frame rate test device according to claim 2, characterized in that: The number of the hollow areas (32) is set to be greater than or equal to 16.

5. The high-speed detector frame rate test device according to claim 2, characterized in that: A side of each hollow area (32) close to the center of the circle is provided with hollow Arabic numerals.

6. A method for testing the frame rate of a high-speed detector, characterized in that: The high-speed detector frame rate testing device comprises any one of claims 1 to 5, wherein the high-speed detector frame rate testing method comprises: S1, outputting a ray beam (2) through the ray source (1); S2, the detector (6) collects a plurality of images in which the high gray value image and the low gray value image appear alternately according to the set frame rate test requirement; S3, judging whether the image quality of the characteristic areas in the plurality of images meets the requirements, and if so, the frame rate of the detector (6) meets the requirements.

7. The method for testing the frame rate of a high-speed detector according to claim 6, characterized in that: Also includes: S0. Before testing, select the hollow area (32) at the Arabic numeral 1, the length direction of the hollow area (32) is parallel to the length direction of the detector (6), and set the rotation speed of the motor (5).

8. The method for testing the frame rate of a high-speed detector according to claim 6, characterized in that: In step S3, judging whether the image quality of the characteristic areas in the plurality of images meets the requirements, and if so, the frame rate of the detector (6) meets the requirements includes: When it is determined that the current frame image among the plurality of images does not include the Arabic numeral shape of the previous frame image, the frame rate of the detector (6) meets the requirement.

Images