Test fixture for microstrip device

Abstract

The invention discloses a test fixture for a microstrip device, and relates to the field of test fixtures, the test fixture comprises a mounting platform, the mounting platform is provided with a vertical position adjusting assembly, the vertical position adjusting assembly comprises a test platform, and the test platform has a degree of freedom of moving along the height direction of the mounting platform. A plurality of position adjusters are arranged on the mounting platform around the vertical position adjusting assembly, each position adjuster comprises an adjusting platform and a nondestructive test crimping clamp, the adjusting platform has a degree of freedom of horizontal movement close to or away from the test platform, and the mounting position of the nondestructive test crimping clamp on the adjusting platform is adjustable. Through the vertical position adjusting assembly and the position adjuster, the distance position between the nondestructive test crimping clamp and the microstrip circulator isolator on the test platform can be adjusted, so that close contact between test nodes of the microstrip circulator isolator and the nondestructive test crimping clamp is ensured, and loss caused by an overlarge test gap is avoided.

Description

Technical Field

[0001] The invention relates to the technical field of test fixtures, in particular to a test fixture for a microstrip device. Background Art

[0002] In the production process of microwave devices, performance testing is usually the final inspection link, so the performance testing device is particularly important. At present, in the performance device of microstrip ring isolators, most of them use test connectors and coaxial lines for welding, and the circular inner conductor in the coaxial line is tested by crimping contact with the gold-clad circuit node of the microstrip ring isolator. The existing testing method has the following problems: first, the crimping contact between the inner conductor and the microstrip line is easy to scratch the gold-clad layer, thereby affecting the appearance of the final product. Secondly, the existing testing method uses coaxial line connection, which is quite different from the actual product application environment, resulting in large deviations in the performance indicators of the microstrip ring isolator and cannot meet the actual use needs.

[0003] In addition, in other microstrip ring isolator performance test devices, the test connector is welded to the metal spring, and the metal spring is tested by crimping contact. This method has a short service life of the metal spring and there is a flatness error at the contact point, which also causes a large deviation in the performance indicators of the microstrip ring isolator and cannot meet actual needs. Summary of the invention

[0004] The purpose of the present invention is to overcome the deficiencies of the prior art and provide a test fixture for a microstrip device to solve the deficiencies of the prior art.

[0005] The objective of the present invention is achieved through the following technical solutions: a test fixture for a microstrip device, comprising a mounting platform, a vertical position adjustment component is arranged on the mounting platform, the vertical position adjustment component comprises a test platform, the test platform has the freedom to move along the height direction of the mounting platform, a plurality of position adjusters are arranged on the mounting platform around the vertical position adjustment component, the position adjuster comprises an adjustment platform and a non-destructive test crimping fixture, the adjustment platform has the freedom to move horizontally close to or away from the test platform, the installation position of the non-destructive test crimping fixture on the adjustment platform is adjustable, and the non-destructive test crimping fixture comprises a bottom The invention relates to a test fixture plate, a base, an upper cover, a test pressure block, a test probe and a test fixture plate, wherein the base is installed on the adjustment platform, the upper cover is connected to the base by screws, the top surface of the base extends out of the test plane, the test fixture plate is fixed on the test plane, the test probe is installed on the upper cover, the test pressure block is fixed on the test probe, the test pressure block is located above the test fixture plate, the test pressure block is made of non-metallic material, an arc-shaped contact surface is formed on the bottom of the test pressure block, a metal conductive layer is plated on the arc-shaped contact surface, and the test probe is used to drive the arc-shaped contact surface of the test pressure block to move closer to or away from the test fixture plate.

[0006] Furthermore, a test connector is provided on the base, and semicircular grooves are provided on the top surface of the base and the bottom surface of the upper cover. The two semicircular grooves form a circular groove, and a circular inner conductor is embedded in the circular groove. One end of the circular inner conductor is welded to the test tooling plate, and the other end is connected to the test connector.

[0007] Furthermore, the non-destructive testing crimping fixture also includes a rotating arm, a first rotating shaft is eccentrically connected to the rotating arm, the first rotating shaft is fixedly connected to the upper cover, and a second rotating shaft is fixedly connected to the test probe, and the second rotating shaft is rotatably connected to the rotating arm. Under the deflection installation of the rotating arm, the test probe can be deflected downward under gravity, and rotating bearings are arranged between the first rotating shaft and the rotating arm, and between the second rotating shaft and the rotating arm.

[0008] Furthermore, a limiting boss is fixed to the end surface of the rotating arm close to the test probe, the limiting boss contacts the top surface of the test probe, and the limiting boss is used to limit the stepless rotation of the test pressing block.

[0009] Furthermore, a lock buckle is rotatably provided on the upper cover, the rotation position of the lock buckle is located between the first rotation axis and the second rotation axis, and the lock buckle is locked on the upper cover by screws.

[0010] Furthermore, a strip groove is formed through the base, and a plurality of threaded holes are formed at equal intervals on the adjustment platform. The tail of the bolt passes through the strip groove and fits into one of the threaded holes, and the bolt presses the base onto the adjustment platform.

[0011] Furthermore, the position adjuster also includes a supporting base and a horizontal slide, the supporting base is fixed on the mounting platform, the horizontal slide is slidably mounted on the supporting base, a cylinder is mounted on the supporting base, the telescopic shaft of the cylinder is connected to the horizontal slide, and the adjustment platform is mounted on the horizontal slide.

[0012] Furthermore, the vertical position adjustment assembly also includes a base plate, a lifting platform and a screw rod, the base plate is fixed to the mounting platform, the lifting platform is arranged directly above the base plate, scissors-type lifting assemblies are arranged on both sides of the base plate, one end of the bottom of the scissors-type lifting assembly is slidably connected to the base plate, and the other end of the bottom is hinged to the base plate, one end of the top of the scissors-type lifting assembly is slidably connected to the lifting platform, and the other end of the top is hinged to the lifting platform, the test platform is fixed on the top of the lifting platform, the screw rod is rotatably arranged between the two groups of the scissors-type lifting assemblies, a screw rod slider is threadedly mounted on the screw rod, and the sliding end of the bottom of the scissors-type lifting assembly is connected to the screw rod slider through a connecting rod.

[0013] Furthermore, the metal conductive layer on the arc-shaped contact surface has a width of 0.3 mm, a length of 1.2 mm, and a thickness of 10 um.

[0014] Furthermore, the position regulators are arranged in three groups, and the three groups of the position regulators are arranged in sequence at 90 degrees in a clockwise direction, wherein two groups of the position regulators are arranged opposite to each other on the left and right.

[0015] The beneficial effects of the present invention are:

[0016] 1. Through the vertical position adjustment component and the position adjuster, the spacing position between the non-destructive test crimping fixture and the microstrip ring isolator on the test platform can be adjusted, thereby ensuring that the test node of the microstrip ring isolator is in close contact with the non-destructive test crimping fixture, avoiding the loss caused by excessive test gap.

[0017] 2. The test block uses a non-metallic material with a metal-plated layer to replace the existing spring pressure piece and other technologies, which reduces the impedance caused by the test, makes the test performance closer to the actual environmental application requirements of the microstrip ring isolator, reduces the test accuracy error, and thus improves the quality and pass rate of the finished microstrip ring isolator.

[0018] 3. The metal conductive coating on the arc-shaped contact surface is equivalent to a wire with a width of 0.3mm, a length of 1.2mm, and a thickness of 10μm between the test end and the microstrip ring isolator. Its significant effect is that the impedance is small, which is closer to the actual use environment of the microstrip ring isolator, reduces the test accuracy error, makes the test performance more matched, and improves the reliability of the product. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 A schematic diagram of a test fixture for a microstrip device according to the present invention Figure 1 ;

[0020] Figure 2 for Figure 1 Enlarged view of point A in the middle;

[0021] Figure 3 It is a structural schematic diagram of a non-destructive testing crimping fixture in a testing fixture for a microstrip device of the present invention;

[0022] Figure 4 An exploded view of a non-destructive test crimping fixture in a test fixture for a microstrip device of the present invention;

[0023] Figure 5 This is a tooling state diagram of a non-destructive test crimping fixture in a test fixture for a microstrip device of the present invention;

[0024] Figure 6 A schematic diagram of a test fixture for a microstrip device according to the present invention Figure 2 ;

[0025] In the figure, 1-installation platform, 2-position regulator, 3-test platform, 4-adjustment platform, 5-base, 6-upper cover, 7-test pressure block, 8-test probe, 9-test tooling plate, 10-arc contact surface, 11-circular inner conductor, 12-test connector, 13-rotating arm, 14-first rotating axis, 15-second rotating axis, 16-rotating bearing, 17-limiting boss, 18-locking buckle, 19-strip groove, 20-threaded hole, 21-support base, 22-horizontal slide, 23-cylinder, 24-bottom plate, 25-lifting platform, 26-screw, 27-scissors-type lifting assembly, 28-screw slider, 29-connecting rod. DETAILED DESCRIPTION

[0026] The technical solution of the present invention is further described in detail below in conjunction with the accompanying drawings, but the protection scope of the present invention is not limited to the following.

[0027] Embodiment 1

[0028] like Figures 1 to 6As shown, a test fixture for a microstrip device includes a mounting platform 1, a vertical position adjustment component is arranged on the mounting platform 1, the vertical position adjustment component includes a test platform 3, the test platform 3 has the freedom to move along the height direction of the mounting platform 1, a plurality of position adjusters 2 are arranged around the vertical position adjustment component on the mounting platform 1, the position adjuster 2 includes an adjustment platform 4 and a non-destructive test crimping fixture, the adjustment platform 4 has the freedom to move horizontally close to or away from the test platform 3, the installation position of the non-destructive test crimping fixture on the adjustment platform 4 is adjustable, and the non-destructive test crimping fixture includes a base 5, an upper cover 6, Test block 7, test probe 8 and test fixture plate 9, base 5 is installed on adjustment platform 4, upper cover 6 is connected to base 5 by screws, top surface of base 5 extends out of test plane, test fixture plate 9 is fixed on test plane, test probe 8 is installed on upper cover 6, test block 7 is fixed on test probe 8, test block 7 is located above test fixture plate 9, test block 7 is made of non-metallic material, arc-shaped contact surface 10 is formed at the bottom of test block 7, arc-shaped contact surface 10 is plated with metal conductive layer, test probe 8 is used to drive arc-shaped contact surface 10 of test block 7 to approach or move away from test fixture plate 9 moves, a test connector 12 is arranged on the base 5, a semicircular groove is provided on the top surface of the base 5 and the bottom surface of the upper cover 6, the two semicircular grooves form a circular groove, a circular inner conductor 11 is embedded in the circular groove, one end of the circular inner conductor 11 is welded to the test fixture plate 9, and the other end is connected to the test connector 12; firstly, the number of non-destructive test crimping fixtures is selected and the installation position thereof is adjusted according to the test node position and number of the annular isolator, and then the annular isolator is installed on the test platform 3, and the non-destructive test crimping fixture is driven to move close to the annular isolator by the movement of the adjustment platform 4, so that the test fixture The end surface of the plate 9 is flush with and in contact with the end surface of the microstrip ring isolator. The test height of the ring isolator is adjusted through the test platform 3 so that the top surface of the microstrip ring isolator and the top surface of the test fixture plate 9 are on the same plane, thereby completing the fixture clamping of the microstrip ring isolator. The test platform 3 makes test platforms of different specifications according to the actual size of the microstrip ring isolator, ensuring the versatility of the test fixture. The microstrip line on the test fixture plate 9 that matches the microstrip ring isolator enables the test fixture plate 9 to make test fixture plates 9 of different specifications according to the test node position of the ring isolator, ensuring the versatility of the test fixture.After the microstrip ring isolator tooling is completed, the test is performed through the test probe 8. The test probe 8 drives the arc contact surface 10 of the test pressure block 7 to move close to the microstrip ring isolator, so that one end of the arc contact surface 10 is crimped on the test tooling board, and the other end is crimped on the microstrip ring isolator, so that the microstrip ring isolator is connected to the test tooling board 9, and then the test tooling board 9 is connected to the test connector 12 through the circular inner conductor 11, and the test connector 12 is connected to the test circuit, so as to realize the test of the microstrip ring isolator. The test pressure block 7 uses a non-metallic material metallization layer to replace the existing spring pressure piece and other technologies, which reduces the impedance brought by the test, makes the test performance closer to the actual environment application requirements of the microstrip ring isolator, reduces the test accuracy error, and thus improves the quality and qualified rate of the finished microstrip ring isolator. ;

[0029] Furthermore, if Figures 1 to 6 As shown, the metal conductive layer on the arc contact surface 10 is 0.3mm wide, 1.2mm long, and 10um thick. The metal conductive coating on the arc contact surface 10 is equivalent to overlapping a wire with a width of 0.3mm, a length of 1.2mm, and a thickness of 10μm between the test end and the microstrip ring isolator. Its significant effect is small impedance, which is closer to the actual use environment of the microstrip ring isolator, reduces the test accuracy error, makes the test performance more matched, and improves the reliability of the product.

[0030] Furthermore, there are three groups of position regulators 2, which are arranged in a clockwise direction at 90°, and two groups of position regulators 2 are arranged opposite to each other on the left and right. The specific arrangement is based on the test node position on the microstrip ring isolator to ensure the versatility of the test fixture.

[0031] Embodiment 2

[0032] Based on the first embodiment, Figures 1 to 4As shown, the non-destructive test crimping fixture also includes a rotating arm 13, on which a first rotating shaft 14 is eccentrically rotatably connected, the first rotating shaft 14 is fixedly connected to the upper cover 6, and a second rotating shaft 15 is fixedly connected to the test probe 8, the second rotating shaft 15 is rotatably connected to the rotating arm 13, under the deflection installation of the rotating arm 13, the test probe 8 can be deflected downward under gravity, and a rotating bearing 16 is arranged between the first rotating shaft 14 and the rotating arm 13, and between the second rotating shaft 15 and the rotating arm 13, and a locking buckle 18 is rotatably arranged on the upper cover 6, and the rotation position of the locking buckle 18 is located between the first rotating shaft 14 and the second rotating shaft 15, and the locking buckle 18 is locked on the upper cover 6 by screws, and the screws on the locking buckle 18 are loosened, and the rotating arm 13 is deflected, so that the rotating arm 1 3 deflects around the axis of the first rotating shaft 14, and the test probe 8 is eccentrically installed on the rotating arm 13 relative to the first rotating shaft 14, so that the rotating arm 13 will drive the test probe 8 to deflect, so that the test probe 8 drives the arc-shaped contact surface 10 of the test pressing block 7 to contact the test fixture plate 9 and the microstrip ring isolator, and then tighten the screw on the lock buckle 18, so that the lock buckle 18 cannot rotate and contact the rotating arm 13. Due to the eccentric setting of the rotating arm 13, the rotating arm 13 has a tendency to deflect downward, so that the arc-shaped contact surface 10 contacts the test fixture plate 9 and the microstrip ring isolator, and the reversal of the rotating arm 13 will squeeze the lock buckle 18. After the lock buckle 18 is locked, the rotating arm 13 cannot reverse, so that the arc-shaped contact surface 10 stably contacts the test fixture plate 9 and the microstrip ring isolator.

[0033] Embodiment 3

[0034] Based on the second embodiment, Figures 1 to 5 As shown, a limiting boss 17 is fixed to the end face of the rotating arm 13 close to the test probe 8, and the limiting boss 17 contacts the top surface of the test probe 8. The limiting boss 17 is used to limit the infinite rotation of the test pressing block 7. Since the test probe 8 is rotatably connected to the rotating arm 13 through the second rotating shaft 15, the test probe 8 has a deflection degree of freedom. Under the combined action of the test probe 8's own gravity and the limiting boss 17, the test probe 8 is automatically leveled and limited, so that the arc contact surface 10 can accurately contact the test fixture plate 9 and the microstrip ring isolator.

[0035] Embodiment 4

[0036] Based on the fourth embodiment, Figure 1 and Figure 2As shown, a strip groove 19 is formed through the base 5, and a plurality of threaded holes 20 are formed at equal intervals on the adjusting platform 4. The tail of the bolt 20 passes through the strip groove 19 and fits into one of the threaded holes 20. The bolt 20 presses the base 5 onto the adjusting platform 4. By loosening the bolt 20, the base 5 can be slid to fine-tune the position of the non-destructive test crimping fixture. The bolt 20 can be removed and installed in other threaded holes 20. The position of the non-destructive test crimping fixture can be adjusted over a wide range, so that the installation position of the non-destructive test crimping fixture can be adjusted according to the test node position on the microstrip ring isolator, thereby ensuring the versatility of the test fixture.

[0037] Embodiment 5

[0038] Based on the fourth embodiment, Figure 1 As shown, the position regulator 2 also includes a support base 21 and a horizontal slide 22. The support base 21 is fixed on the mounting platform 1, and the horizontal slide 22 is slidably mounted on the support base 21. A cylinder 23 is mounted on the support base 21, and the telescopic shaft of the cylinder 23 is connected to the horizontal slide 22. The adjustment platform 4 is mounted on the horizontal slide 22. The horizontal slide 22 is driven to move by the telescopic movement of the cylinder 23, and the horizontal slide 22 drives the adjustment platform 4 to move, which can drive the non-destructive test crimping fixture to move close to the microstrip ring isolator for tooling testing.

[0039] Embodiment 6

[0040] Based on Example 5, Figures 1 to 6 As shown, the vertical position adjustment assembly also includes a base plate 24, a lifting platform 25 and a screw rod 26. The base plate 24 is fixed on the installation platform 1, and the lifting platform 25 is arranged directly above the base plate 24. Scissor-type lifting assemblies 27 are arranged on both sides of the base plate 24. One end of the bottom of the scissor-type lifting assembly 27 is slidably connected to the base plate 24, and the other end of the bottom is hinged to the base plate 24. One end of the top of the scissor-type lifting assembly 27 is slidably connected to the lifting platform 25, and the other end of the top is hinged to the lifting platform 25. The test platform 3 is fixed on the top of the lifting platform 25. The two sets of scissor-type lifting assemblies 27 are rotated between each other. A screw rod 26 is provided, and a screw slider 28 is threadedly mounted on the screw rod 26. The sliding end at the bottom of the scissor-type lifting component 27 is connected to the screw slider 28 through a connecting rod 29. The screw rod 26 is rotated to make the screw slider 28 on the screw rod 26 move linearly along the axial direction of the screw rod 26. The screw slider 28 drives the sliding end at the bottom of the scissor-type lifting component 27 to move through the connecting rod 29, so that the scissor-type lifting component 27 is extended or contracted, so that the scissor-type lifting component 27 drives the lifting platform 25 to move up and down, and then drives the test platform 3 to move up and down to adjust the installation height of the microstrip ring isolator.

Claims

1. A test fixture for a microstrip device, comprising a mounting platform (1), characterized in that: The mounting platform (1) is provided with a vertical position adjustment component, the vertical position adjustment component comprising a test platform (3), the test platform (3) having the freedom to move along the height direction of the mounting platform (1), the mounting platform (1) having a plurality of position adjusters (2) arranged around the vertical position adjustment component, the position adjusters (2) comprising an adjustment platform (4) and a non-destructive test crimping fixture, the adjustment platform (4) having the freedom to move horizontally close to or away from the test platform (3), the installation position of the non-destructive test crimping fixture on the adjustment platform (4) being adjustable, the non-destructive test crimping fixture comprising a base (5), an upper cover (6), a test pressing block (7), a test probe (8) and a test fixture plate (9), the base (5) ) is installed on the adjustment platform (4), the upper cover (6) is connected to the base (5) by screws, the top surface of the base (5) extends out of the test plane, the test fixture plate (9) is fixed on the test plane, the test probe (8) is installed on the upper cover (6), the test pressure block (7) is fixed on the test probe (8), the test pressure block (7) is located above the test fixture plate (9), the test pressure block (7) is made of non-metallic material, an arc-shaped contact surface (10) is formed at the bottom of the test pressure block (7), a metal conductive layer is plated on the arc-shaped contact surface (10), and the test probe (8) is used to drive the arc-shaped contact surface (10) of the test pressure block (7) to move closer to or away from the test fixture plate (9).

2. A test fixture for a microstrip device according to claim 1, characterized in that: A test connector (12) is provided on the base (5), and a semicircular groove is provided on the top surface of the base (5) and the bottom surface of the upper cover (6), and the two semicircular grooves form a circular groove, in which a circular inner conductor (11) is embedded, and one end of the circular inner conductor (11) is welded to the test fixture plate (9), and the other end is connected to the test connector (12).

3. A test fixture for a microstrip device according to claim 2, characterized in that: The non-destructive testing crimping fixture further comprises a rotating arm (13), a first rotating shaft (14) being eccentrically rotatably connected to the rotating arm (13), the first rotating shaft (14) being fixedly connected to the upper cover (6), a second rotating shaft (15) being fixedly connected to the test probe (8), the second rotating shaft (15) being rotatably connected to the rotating arm (13), and the test probe (8) being able to deflect downward under gravity when the rotating arm (13) is deflected. Rotating bearings (16) are provided between the first rotating shaft (14) and the rotating arm (13), and between the second rotating shaft (15) and the rotating arm (13).

4. A test fixture for a microstrip device according to claim 3, characterized in that: A limiting boss (17) is fixed to the end surface of the rotating arm (13) close to the test probe (8), the limiting boss (17) contacts the top surface of the test probe (8), and the limiting boss (17) is used to limit the stepless rotation of the test pressing block (7).

5. A test fixture for a microstrip device according to claim 3, characterized in that: A lock buckle (18) is rotatably provided on the upper cover (6); the rotation position of the lock buckle (18) is located between the first rotation axis (14) and the second rotation axis (15); and the lock buckle (18) is fastened to the upper cover (6) by means of screws.

6. A test fixture for a microstrip device according to claim 1, characterized in that: The base (5) is provided with a strip groove (19), and the adjustment platform (4) is provided with a plurality of threaded holes (20) at equal intervals. The tail of the bolt (20) passes through the strip groove (19) and fits into one of the threaded holes (20), and the bolt (20) presses the base (5) onto the adjustment platform (4).

7. A test fixture for a microstrip device according to claim 1, characterized in that: The position regulator (2) also includes a support base (21) and a horizontal slide (22), wherein the support base (21) is fixed on the mounting platform (1), and the horizontal slide (22) is slidably mounted on the support base (21), a cylinder (23) is mounted on the support base (21), a telescopic shaft of the cylinder (23) is connected to the horizontal slide (22), and the adjustment platform (4) is mounted on the horizontal slide (22).

8. A test fixture for a microstrip device according to claim 1, characterized in that: The vertical position adjustment assembly also includes a base plate (24), a lifting platform (25) and a screw rod (26). The base plate (24) is fixed on the mounting platform (1). The lifting platform (25) is arranged directly above the base plate (24). Scissor-type lifting assemblies (27) are arranged on both sides of the base plate (24). One end of the bottom of the scissor-type lifting assembly (27) is slidably connected to the base plate (24), and the other end of the bottom is hinged to the base plate (24). One end of the top of the scissor-type lifting assembly (27) is slidably connected to the lifting platform (25), and the other end of the top is hinged to the lifting platform (25). The test platform (3) is fixed on the top of the lifting platform (25). The screw rod (26) is rotatably arranged between the two groups of the scissor-type lifting assemblies (27). A screw rod slider (28) is threadedly sleeved on the screw rod (26). The sliding end of the bottom of the scissor-type lifting assembly (27) is connected to the screw rod slider (28) through a connecting rod (29).

9. A test fixture for a microstrip device according to claim 1, characterized in that: The metal conductive layer on the arc-shaped contact surface (10) has a width of 0.3 mm, a length of 1.2 mm and a thickness of 10 um.

10. A test fixture for a microstrip device according to claim 1, characterized in that: The position regulators (2) are arranged in three groups, and the three groups of the position regulators (2) are arranged in sequence at 90 degrees in a clockwise direction, wherein two groups of the position regulators (2) are arranged opposite to each other on the left and right.

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