Load test circuit and device

Abstract

The invention relates to a pull load test circuit and device. The load test circuit comprises a controller, a plurality of first power connectors and a plurality of load test modules. The plurality of first power supply connectors are used for being connected with a plurality of power supply rails to be subjected to loading test; the controller is used for controlling a main switch arranged between each first power supply connector and the main test module in the load test module corresponding to each first power supply connector to be closed after each first power supply connector is connected with each power supply rail; the main test module in the plurality of tension test modules is used for carrying out tension test on the power rail connected with the first power connector corresponding to the corresponding tension test module under the condition that the main switch is closed, so as to obtain tension test data, and sending the tension test data to the controller; and the controller is also used for determining the loading test result of the power rail according to the loading test data. By adopting the load test circuit provided by the invention, the load test efficiency can be improved.

Description

Technical Field

[0001] The present application relates to the field of circuit technology, and in particular to a load test circuit and device. Background Art

[0002] Load test refers to applying a certain current load to the power rail of the board equipped with the chip to simulate the power consumption of the chip during actual operation, so as to test whether the power rail can meet the power demand of the chip. In other words, it simulates the power consumption of the chip and verifies the power supply capacity of the power rail.

[0003] In the prior art, a programmable load is mostly used to perform a load test on the power rail of a board equipped with a chip to detect the power supply capacity of the voltage rail.

[0004] However, this method of using a programmable load to perform a load test on a power rail can only perform a load test on one power rail at a time, resulting in low efficiency of the load test. Summary of the invention

[0005] Based on this, it is necessary to provide a load test circuit and device that can improve the efficiency of the load test in order to solve the above technical problems.

[0006] In a first aspect, the present application provides a load test circuit, including a controller, a plurality of first power connectors and a plurality of load test modules, each of the load test modules including a main test module, each of the first power connectors corresponds to each of the load test modules one by one, and a main switch is provided between each of the first power connectors and the main test module in the load test modules corresponding to each of the first power connectors, and the controller is connected to each of the first power connectors and each of the load test modules;

[0007] The plurality of first power connectors are used to connect to a plurality of power rails to be subjected to a pull-load test;

[0008] The controller is used to control the main switch provided between each first power connector and a main test module in the load test module corresponding to each first power connector to be closed after each first power connector is connected to each power rail;

[0009] A main test module among the multiple load test modules is used to perform a load test on a power rail connected to a first power connector corresponding to the load test module when the main switch is closed, so as to obtain load test data, and send the load test data to the controller;

[0010] The controller is also used to determine the load test result of the power rail according to the load test data.

[0011] In one of the embodiments, each of the load test modules also includes at least one spare test module, and a spare switch is arranged between the main test module in each of the load test modules and the at least one spare test module; the controller is also used to determine a target spare test module from the at least one spare test module according to the load test requirement when the main test module of any load test module in each of the load test modules does not meet the load test requirement of the power rail connected to the first power connector corresponding to the load test module, and control the target spare switch between the main test module of the load test module and the target spare test module to be closed; the target spare test module is used to, together with the main test module of the load test module, perform a load test on the power rail connected to the first power connector corresponding to the load test module when the target spare switch is closed.

[0012] In one of the embodiments, a first switch is provided between a main test module in any of the load test modules and at least one spare test module of an adjacent load test module adjacent to the load test module; the controller is further used for controlling the first switch between the main test module in the load test module and the idle spare test module to be closed when, when any of the load test modules in each of the load test modules performs a load test on a power rail connected to a first power connector corresponding to the load test module and the load test requirement of the power rail is not met and there is an idle spare test module in an idle state in an adjacent load test module of the load test module; the idle spare test module is used for, when the first switch is closed, jointly with the load test module to perform a load test on the power rail connected to the first power connector corresponding to the load test module.

[0013] In one embodiment, the main test module includes a driver chip, a comparator, a sampling resistor and a transistor, the driver chip is connected to a first input pin of the comparator and the sampling resistor, the sampling resistor is connected to a second input pin of the comparator, a first end of the transistor is connected to an output pin of the comparator, a second end of the transistor is connected to the power rail through the main switch, and a third end of the transistor is connected to the sampling resistor; the driver chip is used to determine a reference voltage according to a test current indicated by a load test, and send the reference voltage to the comparator; the sampling resistor is used to obtain a first operating voltage of the power rail, and send the first operating voltage to the comparator; the comparator is used to determine a driving voltage according to the reference voltage and the first operating voltage, and send the driving voltage to the transistor; the transistor is used to adjust the output current of the power rail under the drive of the driving voltage; the sampling resistor is also used to obtain an adjusted second operating voltage of the power rail, and send the second operating voltage to the driver chip; the driver chip is also used to determine the load test data of the power rail according to the second operating voltage.

[0014] In one of the embodiments, the driver chip is specifically used to determine a new output current of the power rail according to the second operating voltage, and when the difference between the new output current and the test current is greater than or equal to a preset threshold, determine a new reference voltage according to the difference, and send the new reference voltage to the comparator; the sampling resistor is also used to obtain the second operating voltage of the power rail, and send the second operating voltage to the comparator; the comparator is used to determine a new driving voltage according to the new reference voltage and the second operating voltage, and send the new driving voltage to the transistor; the transistor is used to adjust the output current of the power rail under the drive of the new driving voltage, so that the difference between the adjusted output current and the test current is less than the preset threshold.

[0015] In one of the embodiments, the driver chip is specifically used to determine the new output current of the power rail according to the second operating voltage, and when the difference between the new output current and the test current is greater than or equal to a preset threshold and the new output current is less than the test current, increase the reference voltage to obtain the new reference voltage, and send the new reference voltage to the comparator.

[0016] In one of the embodiments, the driver chip is specifically used to determine a new output current of the power rail according to the second operating voltage, and when the difference between the new output current and the test current is less than a preset threshold, obtain the voltage slope of the reference voltage, and send the voltage slope to the controller as load test data; the controller is also used to determine the load test result of the power rail according to the operational amplifier parameters of the comparator, the resistance value of the sampling resistor and the load test data.

[0017] In one embodiment, the circuit further includes an additional power connector and an additional load test module corresponding to the additional power connector, an additional switch being arranged between the additional power connector and the additional load test module; the additional power connector being used to connect to the remaining power rails when the number of power rails to be load tested is greater than the number of the first power connectors; the controller being further used to control the additional switch between the additional power connector and the additional load test module to close after the additional power connector is connected to the remaining power rails; the additional load test module being used to perform a load test on the remaining power rails when the additional switch is closed to obtain the load test results of the remaining power rails.

[0018] In a second aspect, the present application further provides a load test device, comprising the load test circuit described in any embodiment of the first aspect, a first connector, a second connector and a chip package conversion module, wherein the first connector is connected to a plurality of first power connectors and the second connector in the load test circuit, and the second connector is also connected to the chip package conversion module;

[0019] The chip package conversion module is used to place a chip power supply device and convert multiple ports to be subjected to a load test in the chip power supply device into multiple power rails;

[0020] The first connector and the second connector are used to connect the multiple power rails and the first power connector in the load test circuit;

[0021] The load test circuit is used to perform load tests on the multiple power rails simultaneously.

[0022] In one embodiment, the second connector is provided with a plurality of second power connectors, each of the second power connectors corresponds one-to-one to each of the power rails, and each of the second power connectors corresponds one-to-one to each of the first power connectors; any second power connector among the plurality of second power connectors is used to form a load channel with the corresponding first power connector through the first connector; and the load test circuit is specifically used to perform a load test on the power rail corresponding to the second power connector through the load channel.

[0023] The load test circuit and device described above include a controller, a plurality of first power connectors and a plurality of load test modules, each of which includes a main test module, each of which corresponds to the first power connectors one by one, and a main switch is provided between each of which and the main test module in the load test module corresponding to the first power connectors, and the controller is connected to each of which and the first power connectors and the load test module; the plurality of first power connectors are used to connect to a plurality of power rails to be subjected to load tests; the controller is used to control the main switch provided between each of which and the main test module in the load test module corresponding to the first power connectors to be closed after each of which is connected to the power rails; the main test module in the plurality of load test modules is used to perform a load test on the power rail connected to the first power connector corresponding to the load test module when the main switch is closed, so as to obtain load test data, and send the load test data to the controller; the controller is also used to determine the load test result of the power rail according to the load test data. The load test circuit provided in the present application is provided with a plurality of first power connectors and a plurality of load test modules, and can realize load testing on a plurality of power rails at the same time, thereby effectively improving the efficiency of the load test. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the drawings required for use in the embodiments of the present application or related technical descriptions will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0025] Figure 1 is a schematic diagram of a load test circuit in one embodiment;

[0026] Figure 2 is a schematic diagram of a load test circuit in another embodiment;

[0027] Figure 3 is a schematic diagram of a load test circuit in another embodiment;

[0028] Figure 4 is a schematic diagram of a main test module in one embodiment;

[0029] Figure 5 is a schematic diagram of a load test circuit in another embodiment;

[0030] Figure 6 A schematic diagram of a load testing device in one embodiment;

[0031] Figure 7 is a schematic diagram of a first connector in one embodiment;

[0032] Figure 8 Schematic diagram of a second connector in one embodiment. DETAILED DESCRIPTION

[0033] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0034] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present application, so the present application is not limited by the specific embodiments disclosed below.

[0035] In the description of the present application, it should be understood that if the terms "first" and "second" appear, these terms are used for descriptive purposes only and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of the present application, if the term "plurality" appears, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0036] In this application, unless otherwise clearly specified and limited, if the terms "installed", "connected", "connected", "fixed" and the like appear, these terms should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integrated connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to the specific circumstances.

[0037] In the present application, unless otherwise clearly specified and limited, if there is a description that a first feature is "above" or "below" a second feature, etc., or similar descriptions appear, it may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediate medium. Moreover, the first feature being "above", "above" and "above" the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. The first feature being "below", "below" and "below" the second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0038] Load test refers to applying a certain current load to the power rail of the board equipped with the chip to simulate the power consumption of the chip during actual operation, so as to test whether the power rail can meet the power demand of the chip. In other words, it simulates the power consumption of the chip and verifies the power supply capacity of the power rail.

[0039] In the prior art, a programmable load is mostly used to perform a load test on the power rail of a board equipped with a chip to detect the power supply capacity of the voltage rail.

[0040] However, this method of using a programmable load to perform a load test on a power rail can only perform a load test on one power rail at a time, resulting in low efficiency of the load test.

[0041] In view of this, the present application provides a load test circuit, which can perform load tests on multiple power rails at the same time, thereby effectively improving the efficiency of the load test.

[0042] In an exemplary embodiment, Figure 1 As shown, a load test circuit 100 is provided, which includes: a controller (not shown in the figure), a plurality of first power connectors 101 and a plurality of load test modules 102, each of the load test modules including a main test module 1021, each of the first power connectors 101 corresponds to each of the load test modules 102 one by one, and a main switch 103 is arranged between each of the first power connectors 101 and the main test module 1021 in the load test module 102 corresponding to each of the first power connectors 101.

[0043] The plurality of first power connectors 101 can be used to connect to a plurality of power rails (not shown) to be subjected to a pull-load test. Specifically, the first power connector can be a pin socket power connector, a plug-in power connector, a terminal power connector, or a spring pin power connector.

[0044] Load testing refers to applying a certain current load to the power rail of the board carrying the chip to simulate the power consumption of the chip during actual operation, so as to test whether the power rail can meet the power demand of the chip, that is, to simulate the power consumption of the chip and verify the power supply capacity of the power rail.

[0045] The power rail refers to the metal trace on the board equipped with the chip that connects the power supply and electronic components such as chips and capacitors. It is the power transmission line on the PCB board, which can transmit electrical energy from the power supply to the various electronic components in the chip, providing a stable power reference and power supply for the electronic components in the chip, ensuring the normal operation of the chip.

[0046] The controller is used to control the main switch 103 provided between each first power connector 101 and the main test module 1021 in the load test module 102 corresponding to each first power connector 101 to close after each first power connector 101 is connected to each power rail. Specifically, the controller can be an FPGA (Field-Programmable Gate Array), which is an integrated circuit that can be programmed using a hardware description language. The controller can also be an MCU (Micro-Controller Unit), an ASIC (Application-Specific Integrated Circuit), or an SBC (Single-Board Computer).

[0047] The main test module 1021 among the multiple load test modules 102 is used to perform a load test on the power rail connected to the first power connector 101 corresponding to the load test module 102 when the main switch 103 is closed, so as to obtain load test data and send the load test data to the controller.

[0048] The load test data can be used to evaluate the power supply performance of the power rail under different load test conditions. Exemplarily, the load test data may include current load test data, voltage load test data, and time load test data. Specifically, the current load test data may include load current, load current slope, and current ripple; the voltage load test data may include power rail voltage, voltage drop and recovery time, and voltage ripple; and the time load test data may include stabilization time.

[0049] The load current refers to the current value drawn from the power rail during the load test. The load current slope refers to the change of the load current over time. The current ripple refers to the stability of the load current, which can be used to evaluate the stability of the output current of the power rail. The power rail voltage refers to the voltage value of the power rail during the load test. The voltage drop and recovery time refers to the fact that when the load current changes suddenly, the power rail voltage may drop momentarily and then recover to normal levels. The magnitude of the voltage drop and the time required to recover to normal voltage can be used to evaluate the transient response characteristics of the power rail. For example, when the load current increases instantly, the power rail voltage drops from 5V to 4.8V and recovers to above 4.95V within 50 microseconds, which can be used to judge the performance of the power rail in dealing with sudden current changes. The voltage ripple refers to the voltage fluctuation of the power rail. The stabilization time refers to the time required from the start of the load test to the current and voltage of the power rail reaching a stable state, which can be used to evaluate the startup performance and stability of the power rail. For example, after starting the load test, the current and voltage of the power rail stabilize within 100 milliseconds. This stabilization time can be used to determine whether the power rail can quickly enter a stable working state.

[0050] The controller is also used to determine the load test result of the power rail according to the load test data. Specifically, after receiving the load test data sent by the main test module, the controller can compare the load test data with a preset threshold and determine the load test result of the power rail according to the comparison result.

[0051] In some exemplary embodiments, when a load test is required on multiple power rails, a plurality of first power connectors in the load test circuit can be first connected to the multiple power rails respectively. After the multiple first power connectors and the multiple power rails are connected, the controller can control the main switch set between the multiple first power connectors and the main test modules in the load test modules corresponding to the multiple first power connectors to close.

[0052] Furthermore, after multiple main switches are closed, a main test module among the multiple load test modules can perform a load test on the power rails connected to the multiple first power connectors corresponding to the multiple load test modules, and obtain load test data of the load test, and send the load test data to the controller. After receiving the load test data, the controller can determine the load test results of each power rail according to the load test data.

[0053] The load test circuit includes a controller, a plurality of first power connectors and a plurality of load test modules, each of which includes a main test module, each of which corresponds to the first power connectors one by one, and a main switch is provided between each of which and the main test module in the load test module corresponding to the first power connectors, and the controller is connected to each of which and the first power connectors and the load test module; the plurality of first power connectors are used to connect to a plurality of power rails to be subjected to load tests; the controller is used to control the main switch provided between each of which and the main test module in the load test module corresponding to the first power connectors to be closed after each of which is connected to the power rails; the main test module in the plurality of load test modules is used to perform a load test on the power rail connected to the first power connector corresponding to the load test module when the main switch is closed, so as to obtain load test data, and send the load test data to the controller; the controller is also used to determine the load test result of the power rail according to the load test data. The load test circuit provided in the present application is provided with a plurality of first power connectors and a plurality of load test modules, and can realize load testing on a plurality of power rails at the same time, thereby effectively improving the efficiency of the load test.

[0054] In an exemplary embodiment, Figure 2 As shown, each of the load test modules 102 further includes at least one backup test module 1022 , and a backup switch 104 is provided between the main test module 1021 in each of the load test modules 102 and the at least one backup test module 1022 .

[0055] The controller is also used to determine a target standby test module from the at least one standby test module 1022 according to the load test requirement, and control the closing of a target standby switch between the main test module 1021 of the load test module 102 and the target standby test module when the main test module 1021 of any load test module 102 in each of the load test modules 102 does not meet the load test requirement of the power rail connected to the first power connector 101 corresponding to the load test module 102. The target standby test module is used to, when the target standby switch is closed, jointly perform a load test on the power rail connected to the first power connector 101 corresponding to the load test module 102 with the main test module 1021 of the load test module 102.

[0056] Exemplarily, the structures of the standby test module and the main test module may be the same or different, but both the standby test module and the main test module may perform a load test on the power rail.

[0057] In some exemplary embodiments, during the process of a main test module in a load test module performing a load test on a power rail corresponding to the load test module, if it is determined that the load test requirement of the power rail cannot be met, a first request can be sent to a controller. After the controller receives the first request, a target standby test module can be determined from the standby test modules in the load test module according to the load test requirement, and a target standby switch between the main test module of the load test module and the target standby test module can be controlled to be closed.

[0058] The controller can also first determine the load test requirements of each power rail, and determine whether the main test module in the load test module corresponding to each power rail can meet the load test requirements according to the load test requirements; if not, determine the target standby test module from the standby test modules in the load test module according to the load test requirements, and control the target standby switch between the main test module of the load test module and the target standby test module to be closed.

[0059] Furthermore, after the target standby switch between the main test module of the load test module and the target standby test module is closed, the target standby test module can jointly perform a load test on the power rail connected to the first power connector corresponding to the load test module with the main test module of the load test module.

[0060] In an optional embodiment of the present application, in addition to the situation where the above-mentioned main test module cannot meet the test requirements of the power rail, there is also a situation where the main test module is abnormal. In this case, a spare test module can also be used to perform a load test on the power rail.

[0061] It should be noted that the main test module and the backup test module in the load test module are in a parallel relationship.

[0062] In the load test circuit, each of the load test modules also includes at least one spare test module, and a spare switch is provided between the main test module and the at least one spare test module in each of the load test modules; the controller is also used to determine a target spare test module from the at least one spare test module according to the load test requirement, and control the target spare switch between the main test module of the load test module and the target spare test module to be closed when the main test module of any load test module in each of the load test modules does not meet the load test requirement of the power rail connected to the first power connector corresponding to the load test module, and the target spare test module is used to perform a load test on the power rail connected to the first power connector corresponding to the load test module together with the main test module of the load test module when the target spare switch is closed. The load test circuit can perform a load test on power rails with different load test requirements, and according to the actual requirements of the power rail, select to use the main test module to perform a load test on the power rail, or select to use the main test module and the spare test module to perform a load test on the power rail together, which effectively improves the efficiency of the load test.

[0063] In an exemplary embodiment, Figure 3 As shown, a first switch 302 is provided between the main test module 1021 in any of the load test modules 102 and at least one spare test module 1022 of the adjacent load test module 301 adjacent to the load test module 102 .

[0064] The controller is also used to control the first switch 302 between the main test module 1021 in the load test module 102 and the idle standby test module 303 to be closed when any load test module 102 in each load test module 102 performs a load test on the power rail connected to the first power connector 101 corresponding to the load test module 102 and the load test requirement of the power rail is not met, and there is an idle standby test module 303 in an idle state in the adjacent load test module 301 of the load test module 102; the idle standby test module 303 is used to, together with the load test module 102, perform a load test on the power rail connected to the first power connector 101 corresponding to the load test module 102 when the first switch 302 is closed.

[0065] In some exemplary embodiments, during the process in which the main test module and all the spare test modules in the load test module jointly perform a load test on the power rail corresponding to the load test module, if the load test requirement of the power rail still cannot be met, a second request can be sent to the controller. After the controller receives the second request, it can first determine whether there is an idle spare test module in an idle state in the adjacent load test modules adjacent to the load test module. If so, the first switch between the main test module in the load test module and the idle spare test module can be controlled to be closed.

[0066] The controller may also first determine the load test requirements of each power rail, and determine whether the main test module in the load test module corresponding to each power rail can meet the load test requirements according to the load test requirements; if not, determine whether all the spare test modules and the main test module in the load test module can meet the load test requirements according to the load test requirements; if still not, determine whether there is an idle spare test module in the adjacent load test modules adjacent to the load test module; if so, the first switch between the main test module in the load test module and the idle spare test module can be controlled to be closed.

[0067] Further, after the first switch between the main test module in the load test module and the idle standby test module is closed, the idle standby test module can perform a load test on the power rail together with the main test module and the standby test module in the load test module.

[0068] In an exemplary embodiment, Figure 4 As shown, the main test module includes a driving chip 401, a comparator 402, a sampling resistor 403 and a transistor 404. The driving chip 401 is connected to a first input pin of the comparator 402 and the sampling resistor 403. The sampling resistor 403 is connected to a second input pin of the comparator 402. A first end of the transistor 404 is connected to an output pin of the comparator 402. A second end of the transistor 404 is connected to a power rail (not shown in the figure) through the main switch (not shown in the figure). A third end of the transistor 404 is connected to the sampling resistor 403.

[0069] The driver chip is used to determine a reference voltage according to a test current indicated by a load test, and send the reference voltage to the comparator. The driver chip may specifically be a programmable driver chip. The test current indicated by the load test may be a current determined according to a load test requirement.

[0070] The sampling resistor is used to obtain a first operating voltage of the power rail and send the first operating voltage to the comparator.

[0071] The comparator is used to determine the driving voltage according to the reference voltage and the first operating voltage, and send the driving voltage to the transistor. The first input pin can be a positive feedback point of the comparator, and the second input pin can be a negative feedback point of the comparator.

[0072] The transistor is used to adjust the output current of the power rail under the drive of the driving voltage. The transistor can be a MOS tube (Metal-Oxide-Semiconductor Field-Effect Transistor). The first end is a gate, the second end is a drain, and the third end is a source.

[0073] The sampling resistor is also used to obtain the adjusted second operating voltage of the power rail and send the second operating voltage to the driver chip; the driver chip is also used to determine the load test data of the power rail according to the second operating voltage.

[0074] In some exemplary embodiments, the driver chip can first determine the load test according to the load test requirements, and determine the reference voltage according to the test current indicated by the load test, and send the reference voltage to the comparator. The resistor can be used to obtain the operating voltage of the power rail at the current moment, that is, the first operating voltage. Specifically, the first operating voltage is also the voltage across the sampling resistor, which can be used to reflect the actual load current. According to Ohm's law, when current passes through the sampling resistor, a voltage drop will be generated across the resistor. Therefore, the operating voltage of the power rail can be indirectly obtained based on the voltage across the sampling resistor, and the first operating voltage can be sent to the comparator.

[0075] Furthermore, after receiving the reference voltage and the first operating voltage, the comparator can determine the driving voltage according to the reference voltage and the first operating voltage. Specifically, when the reference voltage is higher than the first operating voltage, it indicates that the actual load current is less than the test current; when the reference voltage is lower than the first operating voltage, it indicates that the actual load current is greater than the test current. The comparator determines the driving voltage according to the comparison result. If the reference voltage is higher than the first operating voltage, the comparator can output a higher driving voltage. If the reference voltage is lower than the first operating voltage, the comparator can output a lower driving voltage and send the driving voltage to the transistor.

[0076] After receiving the driving voltage, the transistor can change the degree of conduction under the driving of the driving voltage. Specifically, if the driving voltage is a higher driving voltage, the degree of conduction of the transistor increases, allowing more current to flow from the power rail to the load test module, thereby increasing the load current; if the driving voltage is a lower driving voltage, the degree of conduction of the transistor decreases, allowing less current to flow from the power rail to the load test module, thereby reducing the load current.

[0077] Furthermore, the sampling resistor can also obtain the adjusted operating voltage of the power rail, that is, the second operating voltage, and send the second operating voltage to the driver chip. The driver chip can also determine the load test data of the power rail according to the second operating voltage.

[0078] In an exemplary embodiment, the driver chip is specifically used to determine a new output current of the power rail according to the second operating voltage, and when the difference between the new output current and the test current is greater than or equal to a preset threshold, determine a new reference voltage according to the difference, and send the new reference voltage to the comparator; the sampling resistor is also used to obtain the second operating voltage of the power rail, and send the second operating voltage to the comparator; the comparator is used to determine a new driving voltage according to the new reference voltage and the second operating voltage, and send the new driving voltage to the transistor; the transistor is used to adjust the output current of the power rail under the drive of the new driving voltage, so that the difference between the adjusted output current and the test current is less than the preset threshold.

[0079] The preset threshold is a threshold preset by a technician according to actual needs. By comparing the difference with the preset threshold, it can be determined whether the new output current is close to the test current.

[0080] In some exemplary embodiments, the driver chip can determine the new output current of the power rail according to the second operating voltage, and determine the new reference voltage according to the difference between the new output current and the test current when the difference is greater than or equal to the preset threshold. Specifically, the reference voltage can be increased to obtain a new reference voltage. And the new reference voltage is sent to the comparator. The sampling resistor can obtain the second operating voltage of the power rail and send the second operating voltage to the comparator. When the comparator receives the second operating voltage and the new reference voltage, it can determine the new driving voltage according to the new reference voltage and the second operating voltage, and send the new driving voltage to the transistor. Driven by the driving voltage, the transistor changes the degree of conduction, thereby adjusting the output current of the power rail so that the difference between the adjusted output current and the test current is less than the preset threshold.

[0081] It should be noted that the above process is a repeated process until the difference between the output current after the power rail is adjusted and the test current is less than the preset threshold value after the conduction degree of the transistor is adjusted a certain time.

[0082] In an exemplary embodiment, the driver chip is specifically used to determine the new output current of the power rail according to the second operating voltage, and when the difference between the new output current and the test current is greater than or equal to a preset threshold and the new output current is less than the test current, increase the reference voltage to obtain the new reference voltage, and send the new reference voltage to the comparator.

[0083] In some exemplary embodiments, after the driver chip determines the new output current of the power rail based on the second operating voltage, if it is determined that the difference between the new output current and the test current is greater than or equal to a preset threshold, and the new output current is less than the test current, the reference voltage is increased to obtain the new reference voltage, and the new reference voltage is sent to the comparator.

[0084] If it is determined that the difference between the new output current and the test current is greater than or equal to a preset threshold, and the new output current is greater than the test current, the reference voltage is reduced and the new reference voltage is sent to the comparator.

[0085] In an exemplary embodiment, the driver chip is specifically used to determine a new output current of the power rail according to the second operating voltage, and when the difference between the new output current and the test current is less than a preset threshold, obtain the voltage slope of the reference voltage, and send the voltage slope to the controller as load test data; the controller is also used to determine the load test result of the power rail according to the operational amplifier parameters of the comparator, the resistance value of the sampling resistor and the load test data.

[0086] In some exemplary embodiments, the driver chip can determine a new output current of the power rail based on the second operating voltage, and when the difference between the new output current and the test current is less than a preset threshold, obtain the voltage slope of the reference voltage, and send the voltage slope to the controller as load test data.

[0087] Furthermore, after the controller receives the voltage slope, the load test result of the power rail can be determined according to the operational amplifier parameters of the comparator, the resistance value of the sampling resistor and the voltage slope.

[0088] Specifically, the load test result can be determined according to a load current slope determination formula, which can be: , where R1 is the resistance value of the sampling resistor, dVref / dt is the voltage slope, dVr1 / dt is the voltage slope of the sampling resistor, and G is the operational amplifier parameter of the comparator.

[0089] In an exemplary embodiment, Figure 5 As shown, the circuit further includes an additional power connector 105 and an additional load test module 106 corresponding to the additional power connector 105 , and an additional switch 107 is provided between the additional power connector 105 and the additional load test module 106 .

[0090] The additional power connector is used to connect to the remaining power rails when the number of power rails to be subjected to the pull-load test is greater than the number of the first power connectors.

[0091] The controller is also used to control the additional switch between the additional power connector and the additional load test module to close after the additional power connector is connected to the remaining power rail.

[0092] The additional load test module is used to perform a load test on the remaining power rail when the additional switch is closed, so as to obtain a load test result of the remaining power rail.

[0093] Exemplarily, the additional power connector and the first power connector may have the same or different structures, but both can be used to connect to the power rail. The additional load test module and the load test module may have the same or different structures, and both can be used to perform load tests on the power rail.

[0094] In some exemplary embodiments, when the number of power rails to be simultaneously subjected to a load test is greater than the number of the first power connectors, the additional power connectors may be connected to the remaining power rails exceeding the number of the first power connectors.

[0095] Further, after the additional power connector is connected to the remaining power rail, the controller may control the additional switch between the additional power connector and the additional load test module to close. After the additional switch between the additional power connector and the additional load test module is closed, the additional load test module may perform a load test on the remaining power rail to obtain a load test result of the remaining power rail.

[0096] It should be noted that due to the simultaneous use of multiple power rails, additional power connectors occupy a large area and it is impossible to place one for each power rail. Therefore, in actual use, the loading circuits of adjacent connectors can be flexibly configured according to actual usage, and additional power connectors can be placed at intervals.

[0097] In an exemplary embodiment, Figure 6As shown, a load test device 200 is provided, which includes the load test circuit 100 of any of the above embodiments, a first connector 501, a second connector 502 and a chip packaging conversion module 503, the first connector 501 is connected to multiple first power connectors in the load test circuit 100 and the second connector 502, and the second connector 502 is also connected to the chip packaging conversion module 503.

[0098] The load test circuit is used to perform load tests on the multiple power rails simultaneously. The chip package conversion module is used to place a chip power supply device and convert multiple ports to be loaded in the chip power supply device into multiple power rails. Exemplarily, due to different chip package sizes and pin definitions, different packages can be converted into a unified device interface through the chip package conversion module, and the chip package conversion module can be composed of a PCB (Printed Circuit Board).

[0099] Optionally, the first connector and the second connector are used to connect the multiple power rails and the first power connector in the load test circuit.

[0100] In an exemplary embodiment, the first connector may be Figure 7 As shown, the first connector 501 is provided with a plurality of first power connectors 5011, each of the first power connectors 5011 corresponds to each of the load circuits (not shown in the figure), and each of the first power connectors 5011 corresponds to each of the second power connectors. Any first power connector 5011 among the plurality of first power connectors 5011 is used to form a load channel with the corresponding second power connector through the second connector.

[0101] In an optional embodiment, the first connector is further provided with a first grounding connector 5012. The first grounding connector can be used to connect to the ground plane of the PCB.

[0102] Exemplarily, the plurality of first power connectors 5011 are Figure 7 The first grounding connector is the thin copper column in Figure 7 Thick copper column in the.

[0103] In an exemplary embodiment, the second connector may be Figure 8 As shown, the second connector 502 is provided with a plurality of second power connectors 5021, each of the second power connectors 5021 corresponds one-to-one to each of the power rails (not shown in the figure), and each of the second power connectors 5021 corresponds one-to-one to each of the first power connectors;

[0104] Any second power connector 5021 among the plurality of second power connectors 5021 is used to form a load channel with the corresponding first power connector through the first connector. The load test circuit is specifically used to perform a load test on the power rail corresponding to the second power connector through the load channel.

[0105] In an optional embodiment, the second connector is further provided with a second grounding connector 5022. The first grounding connector can be connected to the ground plane of the PCB through the second grounding connector.

[0106] Exemplarily, the plurality of second power connectors 5021 are Figure 8 The second grounding connector 5022 is a fine recessed structure in the Figure 8 The coarse concave structure in the

[0107] In some exemplary embodiments, the first connector presents a convex structure and the second connector presents a concave structure, and the convex and concave structures of the two correspond to each other to facilitate connection, and the thick copper column and the thick concave structure are both located in the center of the first connector and the second connector, which can improve the stability of the connection to a certain extent.

[0108] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0109] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A load test circuit, characterized in that: The load test circuit includes a controller, a plurality of first power connectors and a plurality of load test modules, each of the load test modules includes a main test module, each of the first power connectors corresponds to each of the load test modules one by one, and a main switch is provided between each of the first power connectors and the main test module in the load test modules corresponding to each of the first power connectors, and the controller is connected to each of the first power connectors and each of the load test modules; The plurality of first power connectors are used to connect to a plurality of power rails to be subjected to a pull-load test; The controller is used for controlling the main switch provided between each first power connector and a main test module in the load test module corresponding to each first power connector to be closed after each first power connector is connected to each power rail; A main test module among the multiple load test modules is used to perform a load test on a power rail connected to a first power connector corresponding to the load test module when the main switch is closed, so as to obtain load test data, and send the load test data to the controller; The controller is further used to determine the load test result of the power rail according to the load test data.

2. The circuit according to claim 1, characterized in that Each of the load test modules further comprises at least one spare test module, and a spare switch is provided between the main test module in each of the load test modules and the at least one spare test module; The controller is further configured to, when a main test module of any load test module among the load test modules does not meet a load test requirement of a power rail connected to a first power connector corresponding to the load test module, determine a target standby test module from the at least one standby test module according to the load test requirement, and control a target standby switch between the main test module of the load test module and the target standby test module to be closed; The target standby test module is used to perform a load test on the power rail connected to the first power connector corresponding to the load test module together with the main test module of the load test module when the target standby switch is closed.

3. The circuit according to claim 2, characterized in that A first switch is provided between a main test module in any of the load test modules and at least one spare test module of an adjacent load test module adjacent to the load test module; The controller is further configured to control a first switch between a main test module in the load test module and the idle standby test module to be closed when, when any load test module among the load test modules performs a load test on a power rail connected to a first power connector corresponding to the load test module, a load test requirement of the power rail is not met and there is an idle standby test module in an idle state in an adjacent load test module of the load test module; The idle standby test module is used to perform a load test on a power rail connected to a first power connector corresponding to the load test module together with the load test module when the first switch is closed.

4. The circuit according to any one of claims 1 to 3, characterized in that: The main test module includes a driving chip, a comparator, a sampling resistor and a transistor, the driving chip is connected to a first input pin of the comparator and the sampling resistor, the sampling resistor is connected to a second input pin of the comparator, a first end of the transistor is connected to an output pin of the comparator, a second end of the transistor is connected to the power rail through the main switch, and a third end of the transistor is connected to the sampling resistor; The driving chip is used to determine a reference voltage according to a test current indicated by a load test, and send the reference voltage to the comparator; The sampling resistor is used to obtain a first operating voltage of the power rail and send the first operating voltage to the comparator; The comparator is used to determine a driving voltage according to the reference voltage and the first operating voltage, and send the driving voltage to the transistor; The transistor is used to adjust the output current of the power rail under the drive of the drive voltage; The sampling resistor is further used to obtain the adjusted second operating voltage of the power rail and send the second operating voltage to the driving chip; The driver chip is further used to determine the load test data of the power rail according to the second operating voltage.

5. The circuit according to claim 4, characterized in that The driver chip is specifically configured to determine a new output current of the power rail according to the second operating voltage, determine a new reference voltage according to the difference between the new output current and the test current when the difference is greater than or equal to a preset threshold, and send the new reference voltage to the comparator; The sampling resistor is further used to obtain a second operating voltage of the power rail and send the second operating voltage to the comparator; The comparator is used to determine a new driving voltage according to the new reference voltage and the second operating voltage, and send the new driving voltage to the transistor; The transistor is used to adjust the output current of the power rail under the drive of the new driving voltage so that the difference between the adjusted output current and the test current is smaller than the preset threshold.

6. The circuit according to claim 5, characterized in that The driver chip is specifically used to determine a new output current of the power rail according to the second operating voltage, and when the difference between the new output current and the test current is greater than or equal to a preset threshold and the new output current is less than the test current, increase the reference voltage to obtain the new reference voltage, and send the new reference voltage to the comparator.

7. The circuit according to claim 4, characterized in that The driver chip is specifically configured to determine a new output current of the power rail according to the second operating voltage, obtain a voltage slope of the reference voltage when a difference between the new output current and the test current is less than a preset threshold, and send the voltage slope as load test data to the controller; The controller is further used to determine the load test result of the power rail according to the operational amplifier parameters of the comparator, the resistance value of the sampling resistor and the load test data.

8. The circuit according to claim 1, characterized in that The circuit further comprises an additional power connector and an additional load test module corresponding to the additional power connector, and an additional switch is provided between the additional power connector and the additional load test module; The additional power connector is used to connect to the remaining power rails when the number of power rails to be subjected to the pull-load test is greater than the number of the first power connectors; The controller is further configured to control the additional switch between the additional power connector and the additional load test module to close after the additional power connector is connected to the remaining power rails; The additional load test module is used to perform a load test on the remaining power rails when the additional switch is closed, so as to obtain the load test results of the remaining power rails.

9. A tension test device, characterized in that: The load test device comprises the load test circuit according to any one of claims 1 to 8, a first connector, a second connector and a chip package conversion module, wherein the first connector is connected to a plurality of first power connectors and the second connector in the load test circuit, and the second connector is also connected to the chip package conversion module; The chip package conversion module is used to place a chip power supply device and convert multiple ports to be subjected to a load test in the chip power supply device into multiple power rails; The first connector and the second connector are used to connect the multiple power rails and the first power connector in the load test circuit; The load test circuit is used to perform load tests on the multiple power rails simultaneously.

10. The device according to claim 9, characterized in that A plurality of second power connectors are arranged in the second connector, each of the second power connectors corresponds to each of the power rails one by one, and each of the second power connectors corresponds to each of the first power connectors one by one; Any second power connector among the plurality of second power connectors is used to form a loading channel with the corresponding first power connector through the first connector; The load test circuit is specifically used to perform a load test on the power rail corresponding to the second power connector through the load channel.

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