Test system for FT3 frame format relay protection device

Abstract

A test system for an FT3 frame format relay protection device is provided with a calculation unit, an FT3 digital interface unit, an RTIO intelligent interface unit and a switch. The calculation unit calculates real-time analog quantity data and state quantity data and transmits the data; information is received, and closed-loop judgment of the test is carried out; the FT3 digital interface unit receives data of the calculation unit through an Ethernet interface, processes the data into data in an FT3 frame format, and sends an FT3 optical fiber signal to an FT3 frame format relay protection device through an optical fiber interface; an FT3 frame format supported by the FT3 digital interface unit can be defined, and a data output channel of the FT3 digital interface unit is correspondingly configured by the computing unit according to the FT3 frame format relay protection device serving as the tested device and the FT3 frame format needing to be output. According to the method, each byte in the FT3 signal frame can be defined, different FT3 frame format relay protection devices can be matched, the applicability is high, and the configuration is flexible.

Description

Technical Field

[0001] The invention relates to the technical field of power system testing, and in particular to a testing system for a FT3 frame format relay protection device. Background Art

[0002] FT3 is a transmission frame format of the link layer specified in the IEC60044-8 electronic current transformer standard. This frame format has the advantages of fixed delay and multi-point synchronous data link in high-speed data processing. At present, the FT3 frame format is widely used in DC protection devices. However, due to the different definition methods of each byte in the frame format, there are the following problems when testing the relay protection performance of the FT3 frame format relay protection device: the existing relay protection tester can only define one type of byte content in the frame format, resulting in incompatibility during testing. To address this problem, one solution is to modify the program or upgrade the tester to adapt to the different byte definitions of the FT3 frame format message. In this solution, when encountering any FT3 frame format byte definition that is different from the previous type, the tester needs to be upgraded and adapted. The bytes cannot be flexibly configured, causing difficulties for users to use and cannot be widely used. Another solution is to use multiple testers to cooperate in testing to meet the requirements for the frame format during the test. This solution requires the configuration of multiple testers, which has problems such as high cost and difficulty in promotion.

[0003] Therefore, in view of the shortcomings of the prior art, it is necessary to provide a test system for a FT3 frame format relay protection device to overcome the shortcomings of the prior art. Summary of the invention

[0004] The purpose of the present invention is to avoid the shortcomings of the prior art and provide a test system for a FT3 frame format relay protection device, which can realize the definition of each byte in the FT3 signal frame and can match relay protection devices suitable for different FT3 frame formats for simulation tests.

[0005] The purpose of the present invention is achieved through the following technical measures.

[0006] A test system for a FT3 frame format relay protection device is provided, comprising:

[0007] Calculation unit: Calculates real-time analog quantity data and state quantity data according to static simulation test cases and dynamic simulation test cases, and transmits the data to the FT3 digital interface unit, RTIO intelligent interface unit and switch; receives information from the RTIO intelligent interface unit and switch to perform closed-loop judgment of the test;

[0008] FT3 digital interface unit: It is provided with an Ethernet communication interface and an FT3 interface. It receives the calculation unit data through the Ethernet interface, processes the data into data in the FT3 frame format, and then sends the FT3 optical fiber signal to the FT3 frame format relay protection device through the optical fiber interface. The FT3 frame format supported by the FT3 digital interface unit can be defined. The data output channel of the FT3 digital interface unit is configured by the calculation unit according to the FT3 frame format relay protection device as the device under test and the FT3 frame format to be output;

[0009] RTIO intelligent interface unit: It is provided with an input circuit and an output circuit, triggers the input of the FT3 frame format relay protection device as the device under test, and receives the output signal of the FT3 frame format relay protection device;

[0010] Switch: Receive and send GOOSE signals.

[0011] Preferably, in the above-mentioned test system for the relay protection device in FT3 frame format, the calculation unit configures the FT3 frame format supported by the FT3 digital interface unit, and defines each byte in the FT3 frame format as a state quantity or an analog quantity.

[0012] Preferably, in the above-mentioned test system for the relay protection device in FT3 frame format, the calculation unit configures the FT3 frame format supported by the FT3 digital interface unit in real time.

[0013] Preferably, the test system for the FT3 frame format relay protection device is pre-set with multiple FT3 frame format templates supported by the FT3 digital interface unit, and the bytes in each FT3 frame format template are pre-defined with state quantity and analog quantity;

[0014] When a corresponding performance test is performed on the FT3 frame format relay protection device, the calculation unit retrieves the corresponding FT3 frame format template and configures the data output channel of the FT3 digital interface unit according to the retrieved FT3 frame format template.

[0015] Preferably, in the above-mentioned test system for the relay protection device in FT3 frame format, the calculation unit configures the baud rate and optical polarity parameters of the FT3 signal of the FT3 digital interface unit.

[0016] Preferably, the above-mentioned test system for FT3 frame format relay protection device configures the output channel of the FT3 digital interface unit through a configuration page, and configures the baud rate and optical polarity parameters of the FT3 signal through the configuration page.

[0017] Preferably, the above-mentioned test system for FT3 frame format relay protection devices performs static simulation test cases and dynamic simulation case configurations through a configuration page, specifically including setting a fixed output, setting a variable output, setting a delay time, and setting a closed-loop judgment condition.

[0018] Preferably, in the above-mentioned test system for relay protection devices in FT3 frame format, the computing unit is provided with 8-way Ethernet communication interfaces.

[0019] Preferably, in the above-mentioned test system for FT3 frame format relay protection devices, the FT3 digital interface unit is provided with 4 Ethernet communication interfaces and 12 FT3 interfaces; the RTIO intelligent interface unit is provided with 32 open input loops and 32 open output loops.

[0020] Preferably, the above-mentioned test system for the FT3 frame format relay protection device is tested by the following steps:

[0021] Step 1: Send the configured test cases to the computing unit through the host computer;

[0022] Step 2: The calculation unit performs real-time calculations based on the device under test and the test case, defines the FT3 frame format and configures the data output channel of the FT3 digital interface unit, and outputs the output value at each moment to the FT3 digital interface unit through the Ethernet interface;

[0023] Step 3: The FT3 digital interface unit processes the data and sends it to the FT3 frame format relay protection device as the device under test through the FT3 interface;

[0024] Step 4: The FT3 frame format relay protection device as the device under test receives the signal and can form the corresponding protection characteristics. The conventional tripping is sent to the RTIO intelligent interface unit, and after being processed by the RTIO intelligent interface unit, it is transmitted to the calculation unit to form a closed-loop test. The digital tripping is sent to the calculation unit via the switch to form a closed-loop test.

[0025] The present invention is used for a test system of an FT3 frame format relay protection device, and is provided with: a calculation unit: calculating real-time analog quantity data and state quantity data according to static simulation test cases and dynamic simulation test cases, and transmitting the data to an FT3 digital interface unit, an RTIO intelligent interface unit and a switch; receiving information from the RTIO intelligent interface unit and the switch, and performing closed-loop judgment of the test; an FT3 digital interface unit: provided with an Ethernet communication interface and an FT3 interface, receiving calculation unit data through the Ethernet interface, processing the data into data in the FT3 frame format, and then sending an FT3 optical fiber signal to an FT3 frame format relay protection device through an optical fiber interface; the FT3 frame format supported by the FT3 digital interface unit can be defined, and a data output channel of the FT3 digital interface unit is configured by the calculation unit according to a FT3 frame format relay protection device as a device under test and a FT3 frame format to be output; an RTIO intelligent interface unit: provided with an open-in loop and an open-out loop, triggering the open-in of the FT3 frame format relay protection device as the device under test, and receiving an open-out signal of the FT3 frame format relay protection device; and a switch: receiving and sending a GOOSE signal. The test system for the FT3 frame format relay protection device of the present invention can define each byte in the FT3 signal frame. By defining each byte in the FT3 signal frame during use, different FT3 frame format relay protection devices can be matched, and static simulation tests can be performed on various types of FT3 frame format relay protection devices. The applicability of the test system is improved, and it has the characteristics of strong applicability and flexible configuration. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] The present invention is further described with reference to the accompanying drawings, but the contents in the accompanying drawings do not constitute any limitation to the present invention.

[0027] Figure 1 The present invention discloses a topological diagram of a test system for a relay protection device in an FT3 frame format.

[0028] Figure 2 It is a schematic diagram of the output channel of the FT3 digital interface unit provided in Example 5 of the present invention.

[0029] Figure 3 It is a schematic diagram of a test case set in Example 5 of the present invention.

[0030] Figure 4 It is a schematic diagram of the fixed value test (gradual change) in Example 5 of the present invention.

[0031] Figure 5 This is a result diagram of the fixed value test (gradual change) performed in Example 5 of the present invention.

[0032] Figure 6 It is a schematic diagram of a fixed value test (sudden application of excitation) performed in Example 5 of the present invention.

[0033] Figure 7 This is a graph showing the result of a constant value test (sudden application of excitation) performed in Example 5 of the present invention. DETAILED DESCRIPTION

[0034] The present invention will be further described with reference to the following examples.

[0035] Example 1.

[0036] A test system for a relay protection device in FT3 frame format according to this embodiment is as follows: Figure 1 As shown, a computing unit, an FT3 digital interface unit, an RTIO intelligent interface unit and a switch are provided.

[0037] The calculation unit calculates the real-time analog quantity data and state quantity data according to the static simulation test cases and dynamic simulation test cases, and transmits the data to the FT3 digital interface unit, RTIO intelligent interface unit and switch; receives the information from the RTIO intelligent interface unit and the switch to perform closed-loop judgment of the test.

[0038] FT3 digital interface unit: It is provided with an Ethernet communication interface and an FT3 interface, receives the calculation unit data through the Ethernet interface, processes the data into data in the FT3 frame format, and then sends the FT3 optical fiber signal to the FT3 frame format relay protection device through the optical fiber interface. In this embodiment, the FT3 frame format supported by the FT3 digital interface unit can be defined, and the data output channel of the FT3 digital interface unit is configured by the calculation unit according to the FT3 frame format relay protection device as the device under test and the FT3 frame format to be output. In this embodiment, each byte in the FT3 frame format can be customized, that is, it can be defined as a state quantity or an analog quantity. The specific implementation method is that the calculation unit modifies the byte in real time according to the defined situation.

[0039] RTIO intelligent interface unit: It is provided with an input circuit and an output circuit, triggers the input of the FT3 frame format relay protection device as the device under test, and receives the output signal of the FT3 frame format relay protection device.

[0040] Switch: Receive and send GOOSE signals.

[0041] In the test system for the FT3 frame format relay protection device of this embodiment, the calculation unit configures the FT3 frame format supported by the FT3 digital interface unit, and defines each byte in the FT3 frame format as a state quantity or an analog quantity. 本实施例The frame format can be customized, and the configuration is more flexible. Each byte and each word can be customized to output data. By defining each byte in the FT3 signal frame during use, different FT3 frame format relay protection devices can be matched, and static simulation tests can be performed on various types of FT3 frame format relay protection devices. The applicability of the test system is improved, and it has the characteristics of strong applicability and flexible configuration.

[0042] Preferably, the calculation unit can simultaneously configure the FT3 frame format supported by the FT3 digital interface unit and configure the data output channel of the FT3 digital interface unit. The FT3 digital interface unit inputs the data in the FT3 frame format to the FT3 frame format relay protection device as the device under test through the corresponding configured output channel.

[0043] The test system for FT3 frame format relay protection devices is tested through the following steps:

[0044] Step 1: Send the configured test cases to the computing unit through the host computer;

[0045] Step 2: The calculation unit performs real-time calculations based on the device under test and the test case, defines the FT3 frame format and configures the data output channel of the FT3 digital interface unit, and outputs the output value at each moment to the FT3 digital interface unit through the Ethernet interface;

[0046] Step 3: The FT3 digital interface unit processes the data and sends it to the FT3 frame format relay protection device as the device under test through the FT3 interface;

[0047] Step 4: The FT3 frame format relay protection device as the device under test receives the signal and can form the corresponding protection characteristics. The conventional tripping is sent to the RTIO intelligent interface unit, and after being processed by the RTIO intelligent interface unit, it is transmitted to the calculation unit to form a closed-loop test. The digital tripping is sent to the calculation unit via the switch to form a closed-loop test.

[0048] The present invention is used for a test system of a FT3 frame format relay protection device, and can define each byte in an FT3 signal frame. Different FT3 frame format relay protection devices can be matched by defining each byte in the FT3 signal frame during use, and static simulation tests can be performed on various types of FT3 frame format relay protection devices. The applicability of the test system is improved, and the system has the characteristics of strong applicability and flexible configuration.

[0049] It should be noted that the FT3 digital interface unit provided in the system of the present invention may also be provided as a FT3 / HDLC digital interface unit or a digital interface unit with a transmission format as required.

[0050] Example 2.

[0051] A test system for a FT3 frame format relay protection device, the other features of which are the same as those of Example 1, except that it also has the following features.

[0052] The test system for FT3 frame format relay protection device is pre-set with multiple FT3 frame format templates supported by FT3 digital interface units, and the bytes in each FT3 frame format template are pre-defined with state quantity and analog quantity;

[0053] When a corresponding performance test is performed on the FT3 frame format relay protection device, the calculation unit retrieves the corresponding FT3 frame format template and configures the data output channel of the FT3 digital interface unit according to the retrieved FT3 frame format template.

[0054] In this embodiment, the calculation unit also configures the baud rate and optical polarity parameters of the FT3 signal of the FT3 digital interface unit to be suitable for testing relay protection devices of different models of FT3 frame formats.

[0055] In this embodiment, by setting multiple FT3 frame format templates, the relay protection device can directly use the FT3 frame format corresponding to the template according to the specific FT3 frame format, and the calculation unit configures the output channel of the FT3 digital interface unit accordingly, which is more flexible to use and more adaptable.

[0056] Example 3.

[0057] A test system for a FT3 frame format relay protection device, the other features of which are the same as those of Example 2, except that it also has the following features.

[0058] The test system for the FT3 frame format relay protection device of this embodiment configures the output channel of the FT3 digital interface unit through the configuration page, and configures the interface parameters through the configuration page. Static simulation test cases and dynamic simulation test cases are configured through the configuration page, specifically including setting a fixed output, setting a variable output, setting a delay time, and setting a closed-loop judgment condition.

[0059] The functions in Table 1 can be completed through the configuration page.

[0060] Table 1

[0061] Configuration Page Function Output channel configuration interface Configuring channel mapping can drive the output of related channels, and each data block can be customized. Interface parameter configuration interface Match interface parameters of different devices. Test case configuration interface Complete test cases such as transitions, state sequences, etc.

[0062] Output channel interface configuration: Write the supported FT3 frame formats into the template by enumeration, so that this type of frame format is used when sending. Each byte in the frame format can be customized, which can be defined as a state quantity or an analog quantity. The specific implementation method is that the calculation unit modifies the byte in real time according to the definition.

[0063] Interface parameter configuration interface: mainly modifies the baud rate and optical polarity parameters of the FT3 signal to adapt to the test of relay protection devices with different FT3 frame formats.

[0064] The test case configuration interface is shown in Table 2.

[0065] Table 2

[0066] Options Function SetValue Set a fixed output (including parameters: phase, code value, frequency). IncValue Set the output amount of the change (including parameters: phase change rate, code value change rate, frequency change rate). Delay Delay time setting. Breakif Closed-loop judgment conditions.

[0067] Through the above commands, the output can be changed and controlled, and the closed-loop test can be completed.

[0068] This test system for FT3 frame format relay protection device sets the FT3 frame format template through the configuration interface, modifies the baud rate and optical polarity parameters of the FT3 signal to parameters that match the FT3 frame format relay protection device to be tested, and configures relevant test cases through the configuration interface.

[0069] During the test, the host computer sends the configured test cases to the computing unit; the computing unit selects the corresponding FT3 frame format template in real time according to the device under test and the test cases and configures the data output channel of the FT3 digital interface unit, and outputs the output value at each moment to the FT3 digital interface unit through the Ethernet interface; then proceeds to step 3.

[0070] Step 3: The FT3 digital interface unit sends the FT3 frame format to the relay protection device as the device under test through the FT3 interface.

[0071] Step 4: The FT3 frame format relay protection device as the device under test receives the signal and can form the corresponding protection characteristics. The conventional tripping is sent to the RTIO intelligent interface unit, and after being processed by the RTIO intelligent interface unit, it is transmitted to the calculation unit to form a closed-loop test. The digital tripping is sent to the calculation unit via the switch to form a closed-loop test.

[0072] The present invention is used for a test system of a FT3 frame format relay protection device. The output channel configuration, interface parameter configuration, static simulation test case configuration, and dynamic simulation case configuration of the FT3 digital interface unit are performed through a configuration page. The configuration is convenient and the use is more flexible. The FT3 frame format can be set according to the model of the specific FT3 frame format relay protection device to be tested.

[0073] Example 4.

[0074] A test system for a FT3 frame format relay protection device, the other features of which are the same as any one of embodiments 1 to 3, except that the test system also has the following features: in the test system for a FT3 frame format relay protection device of this embodiment, the computing unit is provided with 8 Ethernet communication interfaces. The FT3 digital interface unit is provided with 4 Ethernet communication interfaces and 12 FT3 interfaces; the RTIO intelligent interface unit is provided with 32 open input loops and 32 open output loops.

[0075] Example 5.

[0076] A test system for a FT3 frame format relay protection device of the present invention is described with reference to an example. The test system of this example performs a static simulation test on a FT3 frame format relay protection device of the device to be tested, and the channel definition of the FT3 frame format relay protection device to be tested is shown in Table 3.

[0077] Table 3

[0078]

[0079] The output channels of the FT3 digital interface unit are set according to the frame format of the device under test. Figure 2 As shown. Set the baud rate of the FT3 signal to 5.0MHZ. For example, Figure 3 shown.

[0080] The system of the present invention is used to perform a fixed value test (gradual change) on the FT3 frame format relay protection device to be tested, such as Figure 4 shown.

[0081] 1) Set magHsrm 1, set all initial values ​​to 0;

[0082] 2) Set DO, set the output 1 to 1;

[0083] 3) Delay 5s;

[0084] 4) Set the amplitude of Ia to rise slowly, with the initial value of 0.95A, the amplitude step of 0.001A, the time of 0.1s, and the final value of 1.05A;

[0085] 5) When input 1 is activated, stop output.

[0086] The test results are as follows Figure 5 As shown, the test results prove that the method of the present invention can be effectively applied to the fixed value test (gradual change) of the device under test.

[0087] Then, the system of the present invention is used to perform a fixed value test (suddenly apply an excitation amount) on the FT3 frame format relay protection device to be tested. Figure 6 shown.

[0088] 1) Set magHsrm 1, set all initial values ​​to 0;

[0089] 2) Set DO, set the output 1 to 1;

[0090] 3) Delay 2s;

[0091] 4) Set magHsrm 1, set the Ia value to 1.2A;

[0092] 5) When input 1 is activated, stop output.

[0093] The test results are as follows Figure 7 As shown, the test results prove that the method of the present invention can be effectively applied to the constant value test of the sudden application of excitation amount to the device under test.

[0094] The experimental results verify that the test system for the FT3 frame format relay protection device of the present invention can define each byte in the FT3 signal frame. By defining each byte in the FT3 signal frame, different FT3 frame format relay protection devices can be matched, and static simulation tests can be performed on various types of FT3 frame format relay protection devices. The applicability of the test system is improved, and it has the characteristics of strong applicability and flexible configuration.

[0095] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present invention rather than to limit the scope of protection of the present invention. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solution of the present invention can be modified or replaced by equivalents without departing from the essence and scope of the technical solution of the present invention.

Claims

1. A test system for a relay protection device in FT3 frame format, characterized in that: The settings are: Calculation unit: Calculates real-time analog data and state data according to static simulation test cases and dynamic simulation test cases, and transmits the data to the FT3 digital interface unit, RTIO intelligent interface unit and switch; receives information from the RTIO intelligent interface unit and switch to perform closed-loop judgment of the test; FT3 digital interface unit: It is provided with an Ethernet communication interface and an FT3 interface. It receives the calculation unit data through the Ethernet interface, processes the data into data in the FT3 frame format, and then sends the FT3 optical fiber signal to the FT3 frame format relay protection device through the optical fiber interface. The FT3 frame format supported by the FT3 digital interface unit can be defined. The data output channel of the FT3 digital interface unit is configured by the calculation unit according to the FT3 frame format relay protection device as the device under test and the FT3 frame format to be output; RTIO intelligent interface unit: It is provided with an input circuit and an output circuit, triggers the input of the FT3 frame format relay protection device as the device under test, and receives the output signal of the FT3 frame format relay protection device; Switch: Receive and send GOOSE signals.

2. The test system for FT3 frame format relay protection device according to claim 1, characterized in that: The calculation unit configures the FT3 frame format supported by the FT3 digital interface unit, and defines each byte in the FT3 frame format as a state quantity or an analog quantity.

3. The test system for FT3 frame format relay protection device according to claim 2, characterized in that: The calculation unit configures the FT3 frame format supported by the FT3 digital interface unit in real time.

4. The test system for FT3 frame format relay protection device according to any one of claims 1 to 3, characterized in that: Multiple FT3 frame format templates supported by FT3 digital interface units are pre-set, and the bytes in each FT3 frame format template are pre-defined with state quantity and analog quantity; When a corresponding performance test is performed on the FT3 frame format relay protection device, the calculation unit retrieves the corresponding FT3 frame format template and configures the data output channel of the FT3 digital interface unit according to the retrieved FT3 frame format template.

5. The test system for FT3 frame format relay protection device according to claim 4, characterized in that: The calculation unit configures the baud rate and optical polarity parameters of the FT3 signal of the FT3 digital interface unit.

6. The test system for FT3 frame format relay protection device according to claim 5, characterized in that: The output channel configuration of the FT3 digital interface unit is performed through the configuration page, and the baud rate and optical polarity parameters of the FT3 signal are configured through the configuration page.

7. The test system for FT3 frame format relay protection device according to claim 6, characterized in that: Static simulation test cases and dynamic simulation test cases are configured through the configuration page, including setting fixed output, setting variable output, setting delay time and setting closed-loop judgment conditions.

8. The test system for FT3 frame format relay protection device according to claim 7, characterized in that: The computing unit is provided with 8 Ethernet communication interfaces.

9. The test system for FT3 frame format relay protection device according to claim 7, characterized in that: The FT3 digital interface unit is provided with 4 Ethernet communication interfaces and 12 FT3 interfaces; the RTIO intelligent interface unit is provided with 32 open input loops and 32 open output loops.

10. The test system for FT3 frame format relay protection device according to claim 7, characterized in that: Test it by following these steps: Step 1: Send the configured test cases to the computing unit through the host computer; Step 2: The calculation unit performs real-time calculations based on the device under test and the test case, defines the FT3 frame format and configures the data output channel of the FT3 digital interface unit, and outputs the output value at each moment to the FT3 digital interface unit through the Ethernet interface; Step 3: The FT3 digital interface unit processes the data and sends it to the FT3 frame format relay protection device as the device under test through the FT3 interface; Step 4: The FT3 frame format relay protection device as the device under test receives the signal and can form the corresponding protection characteristics. The conventional tripping is sent to the RTIO intelligent interface unit, and after being processed by the RTIO intelligent interface unit, it is transmitted to the calculation unit to form a closed-loop test. The digital tripping is sent to the calculation unit via the switch to form a closed-loop test.

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