Apparatus for vibration testing of cryogenic superconducting magnet support structures
By designing an adjustment device for the support structure of a cryogenic superconducting magnet, the position of the support structure is adjusted using an adjusting screw and threaded hole. This solves the problem that vibration test data is not reliable in the existing technology, and realizes low-cost and simple-to-operate vibration state simulation, reducing testing costs and cycle time.
Patent Information
- Application Number
- CN202311453196.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-11-03
- Publication Date
- 2025-12-19
- Estimated Expiration
- 2043-11-03
AI Technical Summary
Existing technologies cannot effectively simulate the vibration state of low-temperature superconducting magnet support structures under actual working conditions, resulting in vibration test data that is not meaningful and is costly, and the influence of the load-bearing mass of the support components cannot be considered.
A device comprising an internal adjustment unit and an external fixing unit was designed. The relative position of the support structure is adjusted by adjusting the adjusting screw and threaded hole to simulate the cold shrinkage deformation of the inner Dewar and the vibration load of the support component, and the test is carried out by a vibration table.
It achieves low-cost and simple operation for restoring the vibration state of support structures, simulating the vibration state under real working conditions, and reducing testing costs and time.
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Figure CN119935462B_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of vibration test, in particular to a device for vibration test of low-temperature superconducting magnet support structure. BACKGROUND
[0002] The low-temperature superconducting magnet support structure is located between the outer Dewar and the inner Dewar (containing superconducting coils inside) of the superconducting magnet, used for connecting the outer Dewar and the inner Dewar, and is the core load-bearing component of the superconducting magnet. During the normal working process of the superconducting coil, the temperature of the inner Dewar will be reduced from room temperature to 4.2K, and the cold shrinkage deformation of the inner Dewar material will cause a large difference between the support and the original assembly state, and a large deformation will occur at the connection position of the support and the inner Dewar, which will bring a large stress to the inside of the support, thereby affecting the vibration state of the support. At the same time, the weak radial stiffness characteristics brought by the low heat leakage design of the support will cause the radial vibration of the support to be greatly affected by the load mass.
[0003] Since liquid helium is expensive, if the sample support is assembled in the superconducting magnet for vibration test, the refrigeration link will consume a large amount of liquid helium, and the sample test often needs to be iterated several times, which will greatly increase the development cost of the support, and the internal vacuumization link before the superconducting magnet is refrigerated will also consume a lot of time. If the conventional vibration test bench is used for vibration test, the vibration state in the actual working process of the support cannot be restored. Moreover, the influence of the pre-stress of the support structure caused by the deformation at the extremely low temperature on the vibration state cannot be considered, and the influence of the load mass of the support on its vibration cannot be considered, so the vibration test data of the support has no reference significance for the evaluation of the anti-vibration performance of the support in normal working state. SUMMARY
[0004] The present application provides a device for vibration test of low-temperature superconducting magnet support structure, which can solve the technical problems in the prior art.
[0005] The present application provides a device for vibration test of low-temperature superconducting magnet support structure, wherein the device comprises an internal adjusting unit and an external fixing unit, the adjusting unit comprises two adjusting structure blocks, two mirror adjusting structure blocks, a longitudinal adjusting member and a vertical adjusting member, the adjusting structure blocks and the mirror adjusting structure blocks are connected through the longitudinal adjusting member, the two adjusting structure blocks are connected through the vertical adjusting member, and the two mirror adjusting structure blocks are connected through the vertical adjusting member, the adjusting structure blocks and the mirror adjusting structure blocks are provided with support structure interfaces for setting the support structure to be tested, and the external fixing unit is fixed on the vibration table for setting the internal adjusting unit.
[0006] Preferably, the longitudinal adjusting member and the vertical adjusting member are adjusting screws, which are connected to the adjusting structure block and the mirror adjusting structure block through the threaded holes on the sides of the adjusting structure block and the mirror adjusting structure block.
[0007] Preferably, an operating member is arranged on the adjusting screw, which is used to rotate the adjusting screw in the axial direction.
[0008] Preferably, the adjusting member is a hexagonal structure.
[0009] Preferably, the bottom of the internal adjusting unit is provided with a mounting hole, which is fixed on the vibration table through the mounting hole.
[0010] Preferably, the side wall of the internal adjusting unit is provided with a mounting interface, a mounting avoiding slot and an operating avoiding slot, which are used to arrange the support structure to be tested.
[0011] Preferably, the number of the longitudinal adjusting members and the number of the vertical adjusting members are both four.
[0012] By the above technical solution, the internal adjusting unit can simulate the cold shrinkage deformation of the inner Dewar, and at the same time, simulate the vibration with load when the support member is in normal work. The influence of the support member deformation caused by the inner Dewar cold shrinkage deformation and the inner Dewar mass on the vibration state of the support member is considered, and the vibration state of the support member in actual work can be restored to the greatest extent. The device has the advantages of low cost and simple operation. BRIEF DESCRIPTION OF DRAWINGS
[0013] The accompanying drawings, which are included to provide a further understanding of the embodiments and are incorporated in and constitute a part of this specification, illustrate embodiments of the present application and together with the description serve to explain the principles of the present application. It is readily apparent to one skilled in the art that the following figures are only some embodiments of the present application, and other figures can be obtained according to these figures without creative labor.
[0014] Figure 1 Fig. 1 shows a schematic diagram of an internal adjusting unit of a device for vibration test of a low-temperature superconducting magnet support structure according to an embodiment of the present application;
[0015] Figure 2 Fig. 2 shows a schematic diagram of an external fixing unit of a device for vibration test of a low-temperature superconducting magnet support structure according to an embodiment of the present application;
[0016] Figure 3 Fig. 3 shows a schematic diagram of the connection between the internal adjusting unit and the support structure to be tested according to an embodiment of the present application;
[0017] Figure 4The assembly diagram of the device for vibration test of a low-temperature superconducting magnet support structure and the support structure to be tested according to an embodiment of the application is shown. DETAILED DESCRIPTION
[0018] It should be noted that the embodiments and features of the embodiments in the present application can be combined with each other without conflict. The technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings of the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. The description of the at least one exemplary embodiment is actually only illustrative, but not as any limitation on the present application and its application or use. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative labor fall within the scope of the present application.
[0019] It should be noted that the terms used herein are only intended to describe specific embodiments, and are not intended to limit the exemplary embodiments according to the present application. As used herein, the singular form is intended to include the plural form, unless the context clearly indicates otherwise, and it should also be understood that when the terms "comprise" and / or "include" are used in the specification, there is a presence of the features, steps, operations, devices, components and / or combinations thereof.
[0020] Unless specifically stated otherwise, the relative arrangements of the components and steps illustrated in these embodiments and the numerical expressions and values set forth herein are not limiting of the scope of the application. It should be understood that the various parts of the drawings are not necessarily drawn to scale, and that, for the purpose of convenience and clarity, not all components can be shown in a given figure. Techniques, methods, and apparatus known to those of ordinary skill in the art can not be discussed in detail, but are to be considered as part of the specification, where appropriate. In all examples shown and discussed herein, any specific values are to be interpreted as examples only and are not to be construed as limiting. Other examples of the exemplary embodiments can have different values. It is noted that like numbers and letters on the figures identify like parts throughout the disclosure, and that, when a part is not further discussed, it is not necessary to discuss it further in the subsequent figures.
[0021] As Figures 1-4As shown, the embodiment of the present application provides a device for vibration test of a low-temperature superconducting magnet support structure, wherein the device comprises an internal adjustment unit and an external fixing unit, the adjustment unit comprises two adjustment structure blocks 1, two mirror adjustment structure blocks 2, a longitudinal adjustment piece 3 and a vertical adjustment piece 4, the adjustment structure blocks 1 and the mirror adjustment structure blocks 2 are connected through the longitudinal adjustment piece 3, the two adjustment structure blocks 1 are connected through the vertical adjustment piece 4, the two mirror adjustment structure blocks 2 are connected through the vertical adjustment piece 4, the adjustment structure blocks 1 and the mirror adjustment structure blocks 2 are provided with a support structure interface 5 for setting a to-be-tested support structure 10 (a low-temperature superconducting magnet to-be-tested support structure), and the external fixing unit is fixed on a vibration table for setting the internal adjustment unit.
[0022] Among the adjustment structure blocks 1 and the mirror adjustment structure blocks 2, the two adjustment structure blocks 1 and the two mirror adjustment structure blocks 2 are adjusted in relative positions through corresponding adjustment pieces.
[0023] Through the above technical solution, the internal adjustment unit can simulate the cold shrinkage deformation of the inner Dewar, and at the same time simulate the vibration load of the support piece in normal working state, so that the influence of the support piece deformation caused by the inner Dewar cold shrinkage deformation and the inner Dewar mass on the vibration state of the support piece is considered, and the vibration state of the support piece in actual working state can be restored to the greatest extent. The device has the advantages of low cost and simple operation.
[0024] For example, the sum of the masses of the four adjustment structure blocks is equal to the mass of the inner Dewar in the full-liquid state of the low-temperature superconducting magnet.
[0025] According to an embodiment of the present application, the longitudinal adjustment piece 3 and the vertical adjustment piece 4 are adjustment screws, and the adjustment screws are connected to the adjustment structure blocks 1 and the mirror adjustment structure blocks 2 through the threaded holes on the sides of the adjustment structure blocks 1 and the mirror adjustment structure blocks 2.
[0026] That is, each adjustment screw is connected to the corresponding adjustment structure block through the threaded hole on the side of the adjustment piece block.
[0027] According to an embodiment of the present application, an operating piece is arranged on the adjustment screw for rotating the adjustment screw in the axial direction.
[0028] According to an embodiment of the present application, the adjustment piece is a hexagonal structure piece.
[0029] That is, the relative positions among the four structure blocks can be adjusted by rotating the screw in the axial direction through the hexagonal structure on each adjustment screw (for example, at the middle part).
[0030] According to an embodiment of the present application, the bottom of the internal adjusting unit is provided with a mounting hole 9, which is fixed on the vibration table through the mounting hole.
[0031] That is, the internal adjusting unit can be provided with a mounting hole at the bottom, which is used for connecting the device for vibration test with the table surface of the vibration table.
[0032] According to an embodiment of the present application, the sidewall of the internal adjusting unit is provided with a mounting interface 6 for setting the support structure to be tested, a mounting avoiding groove 7 and an operation avoiding groove 8.
[0033] The mounting interface is used for mounting and fixing the support structure to be tested, the mounting avoiding groove is used for mounting avoidance after the internal adjusting unit and the support structure to be tested are connected, and the operation avoiding groove is used for operation avoidance when the support structure to be tested is deformed.
[0034] According to an embodiment of the present application, the number of the longitudinal adjusting members 3 and the number of the vertical adjusting members 4 are both four.
[0035] For example, two longitudinal adjusting members 3 are arranged between the adjusting structure block 1 and the mirror adjusting structure block 2, two vertical adjusting members 4 are arranged between the two adjusting structure blocks 1, and two vertical adjusting members 4 are arranged between the two mirror adjusting structure blocks 2.
[0036] The operation process of the device for vibration test of the support structure of a low-temperature superconducting magnet according to the present application is described below in combination with examples.
[0037] 1) The external fixing unit is mounted on the vibration table through the bottom mounting hole;
[0038] 2) The four support structures to be tested are respectively mounted in the corresponding interfaces of the internal adjusting structure blocks, the longitudinal and vertical adjusting screws are adjusted, and each structure block is located at the initial position. That is, in the mounting state, the support structure to be tested and the external fixing unit of the tool (the device for vibration test) are in consistent position, as shown in Figure 3 .
[0039] 3) The internal adjusting unit and the support structure to be tested connected are put into the external fixing unit from top to bottom as a whole, and the support structure to be tested and the external fixing unit are connected and fixed through the corresponding interfaces, as shown in Figure 4 .
[0040] 4) Through the operation avoiding groove of the sidewall of the external fixing unit, the eight adjusting screws are rotated until the deformation of the support structure and the deformation of the inner Dewar are consistent in size, and then the support structure to be tested can be tested for vibration, and the vibration state of the support member in actual work can be restored to the greatest extent.
[0041] From the above embodiments, the device for low-temperature superconducting magnet support structure vibration test has at least the following advantages:
[0042] (1) The mechanical device realizes the vibration state simulation of the low-temperature superconducting magnet support structure in a vacuum and low-temperature state, greatly reducing the test cost and cycle of the support structure sample to be tested.
[0043] (2) In addition to simulating the normal working vibration state of the support structure, the mechanical device can realize vibration testing under different deformation amounts of the support structure, and realize more comprehensive acquisition of the vibration characteristics of the support structure.
[0044] In the description of the present application, it should be understood that the orientation words such as "front, rear, upper, lower, left, right", "transverse, vertical, perpendicular, horizontal" and "top, bottom" and the like indicate the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, without making the opposite statement, these orientation words do not indicate and imply that the indicated device or element must have a specific orientation or be constructed and operated in a specific orientation, therefore it cannot be understood as a limitation on the scope of protection of the present application; the orientation words "inner, outer" refer to the inner and outer of the contour of each component itself.
[0045] For the convenience of description, spatial relative terms such as "on", "above", "upper surface", "upper" and the like can be used herein to describe the spatial positional relationship of one device or feature with other devices or features as shown in the drawings. It should be understood that the spatial relative terms are intended to include different orientations in use or operation in addition to the orientation of the device described in the drawings. For example, if the device in the drawing is inverted, the device described as "above" or "on" other devices or structures will be positioned "below" or "under" other devices or structures. Therefore, the exemplary term "above" can include both "above" and "below" orientations. The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein are interpreted accordingly.
[0046] In addition, it should be noted that the use of the words "first", "second" and the like to define parts only facilitates the differentiation of the corresponding parts, and the above words have no special meaning unless otherwise stated, therefore it cannot be understood as a limitation on the scope of protection of the present application.
[0047] The above merely provides the preferred embodiments of the present application, and is not used to limit the present application. For those skilled in the art, the present application can have various modifications and changes. Any modifications, equivalent replacements, improvements, etc. made within the principles and technical scope of the present application shall fall into the scope of the present application.
Claims
1. An apparatus for vibration testing of a low temperature superconducting magnet support structure, characterized by, The device comprises an internal adjusting unit and an external fixing unit, the internal adjusting unit comprises two adjusting structure blocks (1), two mirror adjusting structure blocks (2), a longitudinal adjusting part (3) and a vertical adjusting part (4), the adjusting structure blocks (1) and the mirror adjusting structure blocks (2) are connected through the longitudinal adjusting part (3), the two adjusting structure blocks (1) are connected through the vertical adjusting part (4), the two mirror adjusting structure blocks (2) are connected through the vertical adjusting part (4), the adjusting structure blocks (1) and the mirror adjusting structure blocks (2) are provided with support structure interfaces (5) for setting the support structure to be tested, and the external fixing unit is fixed on a vibration table for setting the internal adjusting unit.
2. The apparatus of claim 1, wherein, The longitudinal adjusting part (3) and the vertical adjusting part (4) are adjusting screws, the adjusting screws are connected with the adjusting structure blocks (1) and the mirror adjusting structure blocks (2) through the threaded holes on the sides of the adjusting structure blocks (1) and the mirror adjusting structure blocks (2).
3. The apparatus of claim 2, wherein, An operating part is arranged on the adjusting screw for rotating the adjusting screw along the axial direction.
4. The apparatus of claim 3, wherein, The operating part is a hexagonal structure.
5. The apparatus of claim 4, wherein, An installation hole is arranged at the bottom of the external fixing unit for fixing on the vibration table.
6. The apparatus of claim 5, wherein, An installation interface (6) for setting the support structure to be tested, an installation avoiding slot (7) and an operating avoiding slot (8) are arranged on the side wall of the external fixing unit.
7. The apparatus of any one of claims 1-6, wherein, The number of the longitudinal adjusting parts (3) and the number of the vertical adjusting parts (4) are both four.
Citation Information
Patent Citations
Dynamic superconducting magnet thermal load test system with background magnetic field
CN113495238A
Stretching device with temperature gradient environment
CN217605529U