Insulating material resistivity testing device and method

Abstract

The invention provides an insulating material resistivity testing device and method, and the device comprises a shielding housing which is provided with a shielding test cavity, the shielding test cavity is internally provided with an insulating material sample, and the device also comprises a radiation module, a high temperature module, a radiation collimation device, a PC module, and a pressurization and current monitoring device. The pressurization and current monitoring device is connected with the insulating material sample; the PC module is connected with the radiation module, the high-temperature module and the pressurization and current monitoring device; the high-temperature module is also connected with the pressurization and current monitoring device; the radiation module is used for providing radiation beams for the shielding test cavity; the high-temperature module is used for providing a high-temperature environment for the shielding test cavity; the pressurization and current monitoring device is used for applying voltage to the insulating material sample and monitoring current flowing through the insulating material sample; and the PC module determines the surface resistivity or volume resistivity of the insulating material sample according to the received voltage and current. The device can test the resistivity of the insulating material under different radiation intensities and different temperature environments.

Description

Technical Field

[0001] The invention belongs to the technical field of electrical performance testing of insulating materials in extreme environments, and in particular relates to a device and method for testing the resistivity of insulating materials. Background Art

[0002] In the space environment, spacecraft materials need to face a series of harsh environmental tests. Thermal cycles, gamma-ray radiation, X-ray radiation, ultraviolet radiation, atomic oxygen, plasma environment (ions and electrons), space debris, etc. may cause material degradation, induce damage to components or structures, reduce system reliability, and even shorten the service life of spacecraft. Therefore, compared with the ground working environment, the extreme environment of space places higher requirements on the insulation performance of insulating materials. Testing and analyzing the resistivity changes of insulating materials under multiple extreme environments of radiation and high temperature is crucial to designing and optimizing insulating materials and improving the reliability of live equipment on spacecraft. In the existing technology, there is still a lack of testing devices that integrate radiation and high temperature into multiple extreme environments and can characterize the charge transport characteristics of insulating materials under multiple extreme environments. Therefore, it is of great significance to design and develop resistivity testing devices that can artificially control the type of radiation, radiation intensity and temperature conditions acting on insulating materials, and propose relevant testing methods. Summary of the invention

[0003] The purpose of the present invention is to provide an insulating material resistivity testing device and method to solve the technical problem in the prior art of lacking a testing device capable of characterizing the charge transport characteristics of insulating materials under multiple extreme environments.

[0004] In order to solve the above technical problems, the present invention adopts the following technical solutions:

[0005] A method for testing the resistivity of an insulating material comprises the following steps:

[0006] Step 1, pressing the insulating material into a circular sheet sample with a thickness of 0.1 mm to 5 mm; forming a high-voltage end gold-sprayed electrode and a ground end gold-sprayed electrode on the surface of the sample by gold-spraying treatment;

[0007] When testing the surface resistivity of insulating materials, the gold-sprayed electrode at the high voltage end and the gold-sprayed electrode at the ground end are strip electrodes of the same length, and the gold-sprayed electrode at the high voltage end and the gold-sprayed electrode at the ground end are arranged in parallel on the same side of the insulating material sample; the spacing between the gold-sprayed electrode at the high voltage end and the gold-sprayed electrode at the ground end is 20 mm to 30 mm;

[0008] When conducting a volume resistivity test on an insulating material, the gold-sprayed electrode at the high-voltage end and the gold-sprayed electrode at the ground end are circular electrodes of the same area, and the gold-sprayed electrode at the high-voltage end and the gold-sprayed electrode at the ground end are arranged on both sides of the insulating material sample in a mirror-symmetrical manner; and the area of ​​the gold-sprayed electrode at the high-voltage end is 30% to 60% of the surface area of ​​the insulating material;

[0009] Step 2: Clamp the prepared sample on the high-temperature sample holder so that the front of the sample faces the outlet of the radiation collimation device;

[0010] Step 3, turning on the high voltage source to apply voltage to the insulating material sample, and turning on the current monitoring device to monitor the current flowing through the sample;

[0011] Step 4, start the high temperature module to heat the insulating material sample until the temperature monitoring device shows that the temperature of the insulating material sample reaches the set value;

[0012] Step 5, set the radiation intensity and radiation duration of the radiation source, turn on the power of the radiation source, and turn off the power of the radiation source after the set radiation duration is reached;

[0013] Step 6, keeping the temperature constant, and adjusting the radiation intensity of the radiation source by gradually increasing it, until the surface resistivity / volume resistivity test of the insulating material sample under the same temperature and different radiation intensities is completed;

[0014] Step 7, setting the temperature of the high temperature module in a step-by-step manner, repeating steps 4 to 6, and completing the surface resistivity / volume resistivity test of the insulating material sample under different temperatures and different radiation intensities;

[0015] Step 8: Replace the insulating material sample and repeat steps 1 to 7 until all insulating material samples are tested.

[0016] The present invention also has the following technical features:

[0017] Specifically, the insulating material includes shape memory polymers and composite materials thereof, polyimide, polytetrafluoroethylene, fluorinated ethylene propylene copolymer, polyamide, ceramic-based insulating materials, carbon-based composite materials, silicone rubber and ceramic fiber composite materials.

[0018] The present invention also protects an insulating material resistivity test device, comprising a shielding shell having a sealable shielding test cavity disposed therein, wherein an insulating material sample is disposed in the shielding test cavity, and further comprising a radiation module, a high temperature module, a radiation collimation device, a PC module, a high voltage source and a current monitoring device;

[0019] The high temperature module, the high voltage source and the current monitoring device are respectively connected to the insulating material sample;

[0020] The PC module is respectively connected to the radiation module, the high temperature module, the high voltage source and the current monitoring device;

[0021] The radiation module is used to provide a radiation beam inside the shielding test chamber;

[0022] The high temperature module is used to provide a high temperature environment inside the shielding test chamber;

[0023] The radiation collimation device is arranged in the shielding test chamber and is used to collimate the radiation beam so that the radiation beam is irradiated to the surface of the insulating material sample;

[0024] The high voltage source is used to apply voltage to the insulating material sample and send the applied voltage value to the PC module;

[0025] The current monitoring device is used to obtain the surface current / volume current value flowing through the insulating material sample, and send the obtained surface current / volume current value to the PC module;

[0026] The PC module is used to determine the surface resistivity of the insulating material sample according to the received voltage and surface current, or to determine the volume resistivity of the insulating material sample according to the received voltage and volume current.

[0027] Furthermore, the radiation module includes a radiation source arranged inside the shielding test chamber, and the radiation source is connected to a radiation source power supply and a radiation source control system arranged outside the shielding test chamber; the radiation source power supply is connected to the radiation source control system; the radiation source is used to provide a radiation beam, and the radiation source control system is used to control the switch of the radiation source power supply and regulate the radiation intensity of the radiation source, and the radiation source power supply is used to provide an operating voltage for the radiation source and the radiation source control system.

[0028] Furthermore, the high temperature module includes a high temperature sample rack arranged inside the shielding test chamber, the high temperature sample rack is provided with a temperature probe, the temperature probe is connected to a temperature monitoring device arranged outside the shielding test chamber, the high temperature sample rack is connected to a heating device arranged outside the shielding test chamber, and the heating device is connected to the temperature monitoring device.

[0029] Furthermore, the high voltage source and the current monitoring device are both arranged outside the shielded test chamber; the high voltage source and the current monitoring device are respectively connected to the electrode assembly arranged on the high temperature sample holder;

[0030] The electrode assembly comprises a first lead-out electrode and a second lead-out electrode, wherein the first lead-out electrode is connected to a gold-sprayed electrode at a high voltage end disposed on the surface of the insulating material sample, and the second lead-out electrode is connected to a gold-sprayed electrode at a ground end disposed on the surface of the insulating material sample;

[0031] The high voltage source is used to form a stable electric field on the insulating material sample, and the current monitoring device is used to obtain the surface current / body current flowing through the insulating material sample and can disconnect the high voltage source when the insulating material sample breaks down.

[0032] Furthermore, the high-temperature sample rack includes a fixed plate assembly for clamping insulating material samples, and a light-facing heating tube and a back-lighting heating tube are relatively arranged on both sides of the fixed plate assembly; the fixed plate assembly includes a first fixed plate and a second fixed plate relatively arranged, and the insulating material sample is clamped between the first fixed plate and the second fixed plate.

[0033] Furthermore, heating patches are provided on the outer walls of the light-facing surface heating tube and the backlight-facing surface heating tube.

[0034] Furthermore, the radiation source includes a gamma ray source, an X-ray source, an ultraviolet lamp, an ion gun and an electron gun.

[0035] Furthermore, the temperature range provided by the high temperature module is 25° C. to 200° C., and the radiation intensity provided by the radiation module is 0W to 50W.

[0036] Compared with the prior art, the present invention has the following technical features:

[0037] (1) The device of the present invention can simultaneously apply radiation and high temperature conditions to insulating material samples, thereby realizing the performance test of insulating materials under multiple extreme environments of radiation and high temperature. The device of the present invention can select the type of radiation source according to the test needs, set the radiation intensity, radiation duration and heating temperature, so as to simulate different radiation and high temperature environments that may exist in the space environment. The device of the present invention sets the heating device and the high-voltage source outside the shielding shell, which can avoid the influence of the radiation environment in the shielding shell on related equipment and improve the reliability of the test value.

[0038] (2) The method of the present invention realizes the test of the surface resistivity / volume resistivity of insulating material samples under different temperatures and different radiation intensities by regulating the type of radiation, radiation intensity and temperature conditions acting on the insulating material. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Figure 1 This is a schematic diagram of the system structure of the insulating material resistivity test device;

[0040] Figure 2 This is a perspective view of the high temperature sample holder structure;

[0041] Figure 3 This is the front view of the high temperature sample holder;

[0042] Figure 4 This is the left view of the high temperature sample holder;

[0043] Figure 5 This is a top view of the high temperature sample holder;

[0044] Figure 6 It is a schematic diagram of the structure of the insulating material sample used for surface resistivity testing;

[0045] Figure 7 It is a schematic diagram of the structure of the insulating material sample used for volume resistivity testing;

[0046] Figure 8 The resistivity evolution curve of Example 2 at 30°C and X-ray radiation powers of 2W, 4W, 6W, and 8W respectively;

[0047] Fig. 9 The resistivity evolution curve of Example 2 at 70°C and X-ray radiation powers of 2W, 4W, 6W, and 8W respectively;

[0048] Fig.10 This is the resistivity evolution curve of Example 2 at 90°C and X-ray radiation powers of 2W, 4W, 6W, and 8W respectively.

[0049] The numbers in the figure represent:

[0050] 1-shielded test chamber, 2-radiation module, 3-high temperature module, 4-radiation collimation device, 5-pressurization and current monitoring device, 6-PC module, 7-insulating material sample;

[0051] 21-radiation source, 22-radiation source power supply, 23-radiation source control system; 31-high temperature sample holder, 32-heating device, 33-temperature monitoring device, 34-electrode assembly, 35-heating patch; 51-high voltage source, 52-current monitoring device;

[0052] 311-fixed plate assembly, 312-light-facing heating tube, 313-backlight-facing heating tube; 341-first lead-out electrode, 342-second lead-out electrode, 343-high-voltage end gold-sprayed electrode, 344-ground end gold-sprayed electrode; 3111-first fixed plate, 3112-second fixed plate. DETAILED DESCRIPTION

[0053] Specific embodiments of the present invention are given below. It should be noted that the present invention is not limited to the following specific embodiments, and all equivalent changes made on the basis of the technical solution of this application fall within the protection scope of the present invention.

[0054] The terms "upper", "lower", "front", "back", "top", "bottom" and the like used in the present invention to indicate the orientation or positional relationship are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operate in a specific orientation. "Inside" and "outside" refer to the inside and outside of the corresponding component contours, and the above terms cannot be understood as limiting the present invention. In addition, the terms "first", "second" and other ordinal numbers are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features.

[0055] In the present invention, unless otherwise stated, the terms "install", "connect", "connect", "fix" and the like should be understood in a broad sense, for example, it can be a fixed connection, or a detachable connection or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For those skilled in the art, the specific meanings of the above terms in the present invention can be understood according to the specific circumstances.

[0056] Unless otherwise specified, the components in the present invention are all commercially available.

[0057] Example 1

[0058] Following the above technical solution, Figures 1 to 7 As shown, this embodiment discloses an insulating material resistivity test device, including a shielding shell with a shielding test cavity 1 disposed therein, the shielding shell can be sealed, and an insulating material sample 7 is disposed in the shielding test cavity 1. Preferably, the shielding shell wall includes a stainless steel layer, a dielectric layer and a lead layer disposed in sequence from the outside to the inside, which can prevent internal radiation leakage. The shielding test cavity is used to provide space for radiation and high temperature testing, and can prevent radiation from affecting personnel, equipment and test circuits outside the test area; the test device also includes a radiation module 2, a high temperature module 3, a radiation collimation device 4, a PC module 6, a high voltage source 8 and a current monitoring device 5;

[0059] The high temperature module 3, the high voltage source 8 and the current monitoring device 5 are respectively connected to the insulating material sample 7;

[0060] The PC module 6 is respectively connected to the radiation module 2, the high temperature module 3, the high voltage source 8 and the current monitoring device 5;

[0061] The radiation module 2 is used to provide a radiation beam inside the shielding test chamber 1;

[0062] The high temperature module 3 is used to provide a high temperature environment inside the shielding test chamber 1;

[0063] The radiation collimation device 4 is arranged in the shielding test chamber 1, and is used to collimate the radiation beam so that the radiation beam is irradiated to the surface of the insulating material sample 7;

[0064] The high voltage source 8 is used to apply voltage to the insulating material sample 7 and send the applied voltage value to the PC module 6;

[0065] The current monitoring device 5 is used to obtain the surface current value / volume current value flowing through the insulating material sample 7, and send the obtained surface current value / volume current value to the PC module 6;

[0066] The PC module 6 is used to determine the surface resistivity of the insulating material sample 7 according to the received voltage value and surface current value, or to determine the volume resistivity of the insulating material sample 7 according to the received voltage value and volume current value.

[0067] In this embodiment, the high voltage source 8 can apply a direct current electric field of 1 kV / mm on both sides of the insulating material sample 7 .

[0068] As a preferred scheme of this embodiment, the radiation module 2 includes a radiation source 21 arranged inside the shielding test chamber 1, and the radiation source 21 is respectively connected to a radiation source power supply 22 and a radiation source control system 23 arranged outside the shielding test chamber 1; the radiation source power supply 22 is connected to the radiation source control system 23; the radiation source 21 is used to provide a radiation beam, and the radiation source control system 23 is used to control the switch of the radiation source power supply 22 and adjust the radiation intensity of the radiation source 21, and the radiation source power supply 22 is used to provide working voltage for the radiation source 21 and the radiation source control system 23.

[0069] As a preferred solution of this embodiment, the high temperature module 3 includes a high temperature sample rack 31 arranged inside the shielding test chamber 1, and a temperature probe is arranged on the high temperature sample rack 31. The temperature probe is connected to a temperature monitoring device 33 arranged outside the shielding test chamber 1 through a shielding interface. The high temperature sample rack 31 is connected to a heating device 32 arranged outside the shielding test chamber 1 through a shielding interface, and the heating device 32 is connected to the temperature monitoring device 33.

[0070] The heating device 32 is used to heat the high temperature sample holder 31 to achieve heating of the insulating material sample 7 , and the temperature probe is used to monitor the temperature of the insulating material sample 7 and send the monitored temperature value to the temperature monitoring device 33 .

[0071] As a preferred solution of this embodiment, the high voltage source 8 and the current monitoring device 5 are both arranged outside the shielding test chamber 1; the high voltage source 8 and the current monitoring device 5 are respectively connected to the electrode assembly 34 arranged on the high temperature sample holder 31.

[0072] The electrode assembly 34 includes a first lead electrode 341 and a second lead electrode 342 . The first lead electrode 341 is connected to a high-voltage gold-sprayed electrode 343 disposed on the surface of the insulating material sample 7 . The second lead electrode 342 is connected to a ground gold-sprayed electrode 344 disposed on the surface of the insulating material sample 7 .

[0073] The high voltage source 8 applies a stable DC voltage to the insulating material sample 7 through the electrode assembly 34, thereby forming a stable electric field on one or both sides of the insulating material sample 7. The current monitoring device 5 is used to monitor the surface current / body current flowing through the insulating material sample 7, and can disconnect the high voltage source 8 when the insulating material sample 7 breaks down.

[0074] As a preferred solution of this embodiment, the high temperature sample rack 31 includes a fixed plate assembly 311 for clamping the insulating material sample 7, and a light-facing heating tube 312 and a back-lighting heating tube 313 relatively arranged on both sides of the fixed plate assembly 311; the fixed plate assembly 311 includes a first fixed plate 3111 and a second fixed plate 3112 relatively arranged, and the insulating material sample is clamped between the first fixed plate 3111 and the second fixed plate 3112.

[0075] As a preferred solution of this embodiment, heating patches 35 are provided on the outer walls of the light-facing surface heating tube 312 and the backlight-facing surface heating tube 313 .

[0076] As a preferred solution of this embodiment, the radiation source 21 includes a gamma-ray source, an X-ray source, an ultraviolet lamp, an ion gun and an electron gun.

[0077] As a preferred solution of this embodiment, the temperature range provided by the high temperature module 3 is 25° C. to 200° C., and the radiation intensity provided by the radiation module 2 is 0W to 50W.

[0078] The testing device provided in this embodiment is capable of applying radiation and high temperature conditions to the insulating material sample 7 at the same time, so as to realize the performance test of the insulating material under multiple extreme environments of radiation and high temperature. The device of the present invention can select the type of radiation source according to the test needs, set the radiation intensity, radiation duration and heating temperature, so as to simulate different radiation and high temperature environments that may exist in the space environment.

[0079] Example 2

[0080] This embodiment discloses a method for testing the resistivity of an insulating material, wherein a sheet sample prepared from an E51 epoxy material using diethylenetriamine as a curing agent is subjected to a volume resistivity test. The method is implemented by the insulating material resistivity testing device provided in Embodiment 1, and comprises the following steps:

[0081] Step 1. Prepare a circular sheet epoxy material sample with a thickness of 0.18 mm and a diameter of 50 mm, and perform gold spraying on the upper and lower surfaces of the sample to form a circular high-voltage end gold-sprayed electrode 343 and a ground end gold-sprayed electrode 344 with the same area and mirror-symmetrical arrangement. In order to ensure that the radiation received by the test area is more uniform and stable and the test results are more accurate, the area of ​​the circular electrode can be set to 30% to 60% of the surface area of ​​the insulating material. In this embodiment, the area of ​​the circular high-voltage end gold-sprayed electrode is 36% of the area of ​​the insulating sample.

[0082] Step 2: Mount the epoxy material sample on the high temperature sample holder 31, place the high temperature sample holder 31 clamped with the epoxy material sample in the shielding test chamber 1, make the front of the epoxy material sample face the outlet of the radiation collimation device 4, and close the door of the shielding test chamber;

[0083] Step 3, turning on the high voltage source, setting the voltage value of the high voltage source 8 to 180V, and turning on the current monitoring device 5 to monitor and record the current flowing through the epoxy material sample;

[0084] Step 4, setting the temperature value of the high temperature module 3 to 30° C., starting the high temperature module 3 to heat the epoxy material sample until the temperature monitoring device 33 shows that the temperature of the epoxy material sample reaches 30° C. and stabilizes at this temperature;

[0085] Step 5, set the power of the X-ray source to 2W, the radiation duration to 100s, turn on the radiation source power supply 22, and turn off the radiation source power supply 22 after the radiation reaches the set radiation duration. During the radiation process, the current change can be observed on the PC module 6;

[0086] Step 6: Keep the current temperature unchanged, and adjust the power of the X-ray source to 4W, 6W, and 8W in a step-by-step manner, and the radiation duration corresponding to each radiation intensity (radiation power) is 100s, so as to complete the resistivity test of the epoxy material sample at the same temperature and different radiation intensities;

[0087] Step 7, adjust the temperature of the high temperature module to 70°C, repeat steps 3 to 5, and complete the resistivity test of the insulating material sample at 70°C and different radiation intensities;

[0088] Adjust the temperature of the high temperature module to 90°C, repeat steps 4 to 6, and complete the resistivity test of the insulating material samples at 90°C and different radiation intensities;

[0089] Step 8: Replace the insulating material sample and repeat steps 1 to 7 until all insulating material samples are tested.

[0090] The bulk resistivity of an insulating material is determined by the following formula:

[0091]

[0092] in,

[0093] ρ is the volume resistivity of the insulating material, in Ω·m;

[0094] U is the voltage applied by the pressure and current monitoring device, in V;

[0095] I 2 is the volume current flowing through the insulating material, in A;

[0096] S is the area of ​​the gold-sprayed electrode at the high-voltage end, in m 2 ;

[0097] t is the thickness of the insulating material sample, in m.

[0098] In this embodiment, the following diagram is finally drawn based on the calculation results: Figure 8 , Fig. 9 , Fig.10 The resistivity evolution curve of epoxy insulation material under different temperatures and different X-ray radiation intensities is shown.

[0099] Example 3

[0100] In this embodiment, the test device disclosed in Example 1 and the method disclosed in Example 2 are used to test the surface resistivity of the insulating material. The test steps are basically the same, with the only difference being that in step 1 of this embodiment, after preparing a circular sheet-like epoxy material sample with a thickness of 0.18 mm and a diameter of 50 mm, a strip-shaped high-voltage gold-sprayed electrode and a ground-end gold-sprayed electrode with the same length are arranged on one side of the surface of the sheet-like epoxy material sample. In order to ensure that the radiation received by the test area is more uniform and stable and the test results are more accurate, the spacing between the high-voltage gold-sprayed electrode and the ground-end gold-sprayed electrode can be set to 20 to 30 mm. In the embodiment, the spacing between the high-voltage gold-sprayed electrode and the ground-end gold-sprayed electrode is 20 mm.

[0101] The surface resistivity of an insulating material is determined by the following formula:

[0102]

[0103] in,

[0104] ρ S is the surface resistivity of the insulating material in Ω:

[0105] U is the voltage applied by the pressure and current monitoring device, in V;

[0106] I 1 is the surface current flowing through the insulating material, in A;

[0107] L is the length of the gold-sprayed electrode at the high-voltage end, in meters;

[0108] d is the distance between the gold-sprayed electrode at the high voltage end and the gold-sprayed electrode at the ground end, in meters.

[0109] The preferred embodiments of the present invention are described in detail above in conjunction with the accompanying drawings. However, the present invention is not limited to the specific details in the above embodiments. Within the technical concept of the present invention, a variety of simple modifications can be made to the technical solution of the present invention, and these simple modifications all belong to the protection scope of the present invention.

[0110] In addition, various embodiments of the present invention may be arbitrarily combined, and as long as they do not violate the concept of the present invention, they should also be regarded as the contents disclosed by the present invention.

[0111] It should be noted that, unless otherwise specified, all components involved in this embodiment are components that can be purchased in the prior art.

Claims

1. A method for testing the resistivity of an insulating material, characterized in that: The following steps are involved: Step 1, pressing the insulating material into a circular sheet sample with a thickness of 0.1 mm to 5 mm; forming a high-voltage end gold-sprayed electrode and a ground end gold-sprayed electrode on the surface of the sample by gold-spraying treatment; When testing the surface resistivity of insulating materials, the gold-sprayed electrode at the high voltage end and the gold-sprayed electrode at the ground end are strip electrodes of the same length, and the gold-sprayed electrode at the high voltage end and the gold-sprayed electrode at the ground end are arranged in parallel on the same side of the insulating material sample; the spacing between the gold-sprayed electrode at the high voltage end and the gold-sprayed electrode at the ground end is 20 mm to 30 mm; When the volume resistivity test is performed on the insulating material, the gold-sprayed electrode at the high voltage end and the gold-sprayed electrode at the ground end are circular electrodes of the same area, and the gold-sprayed electrode at the high voltage end and the gold-sprayed electrode at the ground end are arranged on both sides of the insulating material sample in a mirror-symmetrical manner; the area of ​​the gold-sprayed electrode at the high voltage end is 30% to 60% of the surface area of ​​the insulating material; Step 2: Clamp the prepared sample on the high-temperature sample holder so that the front of the sample faces the outlet of the radiation collimation device; Step 3, turning on the high voltage source to apply voltage to the insulating material sample, and turning on the current monitoring device to monitor the current flowing through the sample; Step 4, start the high temperature module to heat the insulating material sample until the temperature monitoring device shows that the temperature of the insulating material sample reaches the set value; Step 5, set the radiation intensity and radiation duration of the radiation source, turn on the power of the radiation source, and turn off the power of the radiation source after the set radiation duration is reached; Step 6, keeping the temperature constant, and adjusting the radiation intensity of the radiation source by gradually increasing it, until the surface resistivity / volume resistivity test of the insulating material sample under the same temperature and different radiation intensities is completed; Step 7, setting the temperature of the high temperature module in a step-by-step manner, repeating steps 4 to 6, and completing the surface resistivity / volume resistivity test of the insulating material sample under different temperatures and different radiation intensities; Step 8: Replace the insulating material sample and repeat steps 1 to 7 until all insulating material samples are tested.

2. The method for testing the resistivity of an insulating material according to claim 1, wherein: The insulating materials include shape memory polymers and composite materials thereof, polyimide, polytetrafluoroethylene, fluorinated ethylene propylene copolymer, polyamide, ceramic-based insulating materials, carbon-based composite materials, silicone rubber and ceramic fiber composite materials.

3. An insulating material resistivity testing device, characterized in that: Used to implement the insulating material resistivity test method as described in any one of claims 1 to 2, comprising a shielding shell with a shielding test chamber (1) arranged therein, wherein an insulating material sample (7) is arranged in the shielding test chamber (1), and further comprising a radiation module (2), a high temperature module (3), a radiation collimation device (4), a PC module (6), a high voltage source (8) and a current monitoring device (5); The high temperature module (3), the high voltage source (8) and the current monitoring device (5) are respectively connected to the insulating material sample (7); The PC module (6) is respectively connected to the radiation module (2), the high temperature module (3), the high voltage source (8) and the current monitoring device (5); The radiation module (2) is used to provide a radiation beam inside the shielding test chamber (1); The high temperature module (3) is used to provide a high temperature environment inside the shielding test chamber (1); The radiation collimating device (4) is arranged in the shielding test chamber (1) and is used to collimate the radiation beam so that the radiation beam is irradiated onto the surface of the insulating material sample (7); The high voltage source (8) is used to apply voltage to the insulating material sample (7) and send the applied voltage value to the PC module (6); The current monitoring device (5) is used to obtain the surface current / volume current value flowing through the insulating material sample (7), and send the obtained surface current / volume current value to the PC module (6); The PC module (6) is used to determine the surface resistivity of the insulating material sample (7) according to the received voltage and surface current, or to determine the volume resistivity of the insulating material sample (7) according to the received voltage and volume current.

4. The insulating material resistivity testing device according to claim 3, characterized in that: The radiation module (2) comprises a radiation source (21) arranged inside the shielding test chamber (1), the radiation source (21) being connected to a radiation source power supply (22) and a radiation source control system (23) arranged outside the shielding test chamber (1); the radiation source power supply (22) being connected to the radiation source control system (23); the radiation source (21) being used to provide a radiation beam, the radiation source control system (23) being used to control the switch of the radiation source power supply (22) and to regulate the radiation intensity of the radiation source (21), and the radiation source power supply (22) being used to provide an operating voltage for the radiation source (21) and the radiation source control system (23).

5. The insulating material resistivity testing device according to claim 3, characterized in that: The high temperature module (3) comprises a high temperature sample rack (31) arranged inside the shielding test chamber (1); a temperature probe is arranged on the high temperature sample rack (31); the temperature probe is connected to a temperature monitoring device (33) arranged outside the shielding test chamber (1); the high temperature sample rack (31) is connected to a heating device (32) arranged outside the shielding test chamber (1); and the heating device (32) is connected to the temperature monitoring device (33).

6. The insulating material resistivity testing device according to claim 3, characterized in that: The high voltage source (8) and the current monitoring device (5) are both arranged outside the shielding test chamber (1); the high voltage source (8) and the current monitoring device (5) are respectively connected to an electrode assembly (34) arranged on a high temperature sample holder (31); The electrode assembly (34) comprises a first lead-out electrode (341) and a second lead-out electrode (342), wherein the first lead-out electrode (341) is connected to a high-voltage end gold-sprayed electrode (343) disposed on the surface of the insulating material sample (7), and the second lead-out electrode (342) is connected to a ground end gold-sprayed electrode (344) disposed on the surface of the insulating material sample (7); The high voltage source (8) is used to form a stable electric field on the insulating material sample (7), and the current monitoring device (5) is used to obtain the surface current / body current flowing through the insulating material sample (7), and can disconnect the high voltage source (8) when the insulating material sample (7) breaks down.

7. The insulating material resistivity testing device according to claim 3, characterized in that: The high-temperature sample rack (31) comprises a fixed plate assembly (311) for clamping an insulating material sample (7), and a light-facing heating cylinder (312) and a backlight-facing heating cylinder (313) arranged on both sides of the fixed plate assembly (311) in opposite directions; the fixed plate assembly (311) comprises a first fixed plate (3111) and a second fixed plate (3112) arranged in opposite directions, and the insulating material sample is clamped between the first fixed plate (3111) and the second fixed plate (3112).

8. The insulating material resistivity testing device according to claim 7, characterized in that: Heating patches (35) are provided on the outer walls of the light-facing surface heating cylinder (312) and the backlight-facing surface heating cylinder (313).

9. The insulating material resistivity testing device according to claim 3, characterized in that: The radiation source (21) includes a gamma ray source, an X-ray source, an ultraviolet lamp, an ion gun and an electron gun.

10. The insulating material resistivity testing device according to claim 3, characterized in that: The temperature range provided by the high temperature module (3) is 25°C to 200°C, and the radiation intensity provided by the radiation module (2) is 0W to 50W.

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