Test platform for AD chip

Abstract

The invention provides a test platform for an AD chip, and the platform comprises a machine control center and N test stations, and the machine control center is connected with the N test stations in series, and can carry out the serial communication. The machine control center can acquire a test instruction and test data, generate a first data packet containing the test instruction, the test data and a target identifier, and send the first data packet; and when the test station receives the first data packet, obtaining a target identifier in the first data packet, if the target identifier is equal to the identifier corresponding to the test station, testing the AD chip in the test station based on the first data packet, otherwise, sending the first data packet through the test station. The test platform can carry out aging test on a plurality of AD chips.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing, and in particular to a testing platform for AD chips. Background Art

[0002] Aging test is an important test to eliminate early fault products before they are delivered to customers. The ultimate goal of chip aging test is to predict the service life of the product and evaluate or predict the durability of the products produced by the manufacturer. With the rapid development of semiconductor technology and the increasing complexity of chips, chip testing runs through the entire design, development and production process, becoming more and more challenging. Aging tests are mainly divided into four categories: 1. High-Temperature Operating Life (HTOL), 2. High-Temperature Storage Life Test (HTSL), 3. Highly Accelerated Temperature and Humility Stress Test (HAST), 4. Chip Size Package Reliability Test (CSP).

[0003] Among them, AD chips have a wide range of usage scenarios. Therefore, how to perform aging tests on multiple AD chips has become a problem that needs to be solved urgently. Summary of the invention

[0004] The object of the present invention is to provide a test platform for AD chips.

[0005] In order to achieve one of the above-mentioned purposes of the invention, an embodiment of the present invention provides a test platform for AD chips, including: a machine control center, a test station station1, a test station station2, ..., a test station station N Each test station is provided with a unique identifier, wherein N is a natural number; the machine control center is provided with a first digital communication interface, each test station i are provided with a second digital communication interface, a third digital communication interface and an AD chip mounting seat, wherein i is a natural number, 1≤i≤N; the first digital communication interface of the machine control center can digitally communicate with the second digital communication interface in the test station station1, and the test station station j The third digital communication interface can be connected to the test station j+1The second digital communication interface in performs digital communication, j is a natural number, 1≤j≤N-1; when the machine control center receives an instruction to test the AD chip in the test station corresponding to the target identifier, it obtains the test instruction and the test data, generates a first data packet including the test instruction, the test data and the target identifier, and sends it through the first digital communication interface; the test station station i When receiving the first data packet from the second digital communication interface, obtaining the target identifier in the first data packet, if the target identifier = test station station i When the corresponding identifier is set, the test station station is set based on the test instructions and test data in the first data packet. i The AD chip in the AD chip mount is tested, otherwise, the AD chip in the AD chip mount is tested by the test station. i A first data packet is sent from the third digital communication interface.

[0006] As a further improvement of the embodiment of the present invention, the test station i When the third digital communication interface receives the second data packet, the second data packet is acquired and sent through the second digital communication interface.

[0007] As a further improvement of the embodiment of the present invention, the test station N When a first data packet is received from the second digital communication interface, a target identifier in the first data packet is obtained, and if the target identifier is ≠ the test station station N When a corresponding identifier is received, a second data packet containing an error code is sent through the second digital communication interface, where the error code is used to characterize the error type of the first data packet.

[0008] As a further improvement of the embodiment of the present invention, the "test station station i Testing the AD chip in the AD chip mounting seat in the test station i The AD chip in the AD chip mounting seat is tested and the test result is obtained; then, a second data packet containing the test result is sent through the second digital communication interface.

[0009] As a further improvement of the implementation mode of the present invention, the machine control center is provided with a first analog communication interface, each test station is provided with a second analog communication interface for analog communication, and the first analog communication interface can perform analog communication with the second analog communication interface in all test stations.

[0010] As a further improvement of the implementation mode of the present invention, the "obtaining test instructions and test data" specifically includes: obtaining test instructions, test data including digital signals, and a first analog signal corresponding to the digital signals; the machine control center is also used to: receive a second analog signal through a first analog communication interface, and when the difference between the first and second analog signals is greater than a first preset value, the AD chip in the test station corresponding to the target identifier fails the test.

[0011] As a further improvement of the implementation mode of the present invention, the "obtaining test instructions and test data" specifically includes: obtaining test instructions, test data including an analog signal, and a first digital signal corresponding to the analog signal, and then sending the analog signal through a first analog communication interface; the machine control center is also used to: receive a second digital signal through the first digital communication interface, and when the difference between the first and second digital signals is greater than a second preset value, the AD chip in the test station corresponding to the target identifier fails the test.

[0012] As a further improvement of the embodiment of the present invention, the machine control center sends a third data packet including an identifier with a value of 1 through the first digital communication interface; the test station i When the second digital communication interface receives the third data packet, the test station i as the identifier in the third data packet, increase the value of the identifier in the third data packet by 1, and send the third data packet through the third digital communication interface.

[0013] As a further improvement of the embodiment of the present invention, the test station i When the third data packet fails to be sent through the third digital communication interface, the value of the identifier in the third data packet is reduced by 1, and a fourth data packet is sent through the second digital communication interface, the fourth data packet including the identifier in the third data packet; when the machine control center receives the fourth data packet from the first digital communication interface, the number of test stations that the first digital communication interface can communicate with = the value of the identifier in the fourth data packet.

[0014] As a further improvement of the implementation mode of the present invention, when the machine control center receives the instruction to configure the AD chips in all the test stations, it obtains the configuration instruction and the configuration data, generates a fifth data packet including the configuration instruction, the configuration data and the broadcast address, and sends it through the first digital communication interface; the test station station i When a fifth data packet is received from the second digital communication interface, a target identifier in the fifth data packet is obtained. If the target identifier is a broadcast address, the test station station is configured based on the configuration instructions and configuration data in the fifth data packet.i The AD chip in the AD chip mounting seat is configured, and then the AD chip is tested at the station i A fifth data packet is sent from the third digital communication interface.

[0015] Compared with the prior art, the technical effect of the present invention is that: the embodiment of the present invention provides a test platform for AD chips, including: a machine control center, N test stations, the machine control center is connected in series with the N test stations, and can perform serial communication; the machine control center can obtain test instructions and test data, generate a first data packet containing test instructions, test data and a target identifier, and send it; when the test station receives the first data packet, it obtains the target identifier in the first data packet, if the target identifier = the identifier corresponding to the test station, then the AD chip in the test station is tested based on the first data packet, otherwise, the first data packet is sent through the test station. The test platform can perform aging tests on multiple AD chips. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 Schematic diagram of the structure of a test platform for AD chips in an embodiment of the present invention;

[0017] Figure 2 It is a schematic diagram of a data packet in an embodiment of the present invention. DETAILED DESCRIPTION

[0018] The present invention will be described in detail below in conjunction with the various embodiments shown in the accompanying drawings. However, these embodiments do not limit the present invention, and any structural, methodological, or functional changes made by a person skilled in the art based on these embodiments are all within the scope of protection of the present invention.

[0019] As used herein, terms indicating spatial relative positions such as "upper," "above," "lower," and "below" are used for the purpose of convenience to describe the relationship of one unit or feature relative to another unit or feature as shown in the accompanying drawings. Terms of spatial relative position may be intended to include different orientations of the device in use or operation in addition to the orientation shown in the drawings. For example, if the device in the figure is turned over, units described as being "below" or "beneath" other units or features will be located "above" the other units or features. Thus, the exemplary term "below" can encompass both above and below orientations. The device may be oriented in other ways (rotated 90 degrees or in other orientations), and the spatially relative descriptors used herein interpreted accordingly.

[0020] Furthermore, it should be understood that although the terms first, second, etc. may be used herein to describe various elements or structures, these described objects should not be limited by these terms. These terms are only used to distinguish these described objects from each other. For example, a first data acquisition module may be referred to as a second data acquisition module, and similarly, a second data acquisition module may also be referred to as a first data acquisition module, without departing from the scope of protection of this application.

[0021] Embodiment 1 of the present invention provides a test platform for an AD chip. The full spelling of AD is: Analog Digital in English, and in Chinese it is: analog digital. The AD chip includes an ADC (Analog to Digital Converter) and a DAC (Digital to Analog Converter).

[0022] like Figure 1 As shown, including:

[0023] Machine control center, test station station1, test station station2, ..., test station station N Each test station is provided with a unique identifier, wherein N is a natural number; the machine control center is provided with a first digital communication interface, each test station i A second digital communication interface, a third digital communication interface and an AD chip mounting seat are provided, wherein i is a natural number, 1≤i≤N; here, the AD chip mounting seat can be a hardware interface, and the AD chip can be installed and fixed on the AD chip mounting seat. In addition, the test station is electrically connected to each pin of the AD chip, so that commands and data can be sent to the AD chip, and the output data of the AD chip can be read. The type of the AD chip mounting seat can be SPI (Serial Peripheral Interface), IIC (Inter-Integrated Circuit, integrated circuit bus), LVDS (Low-Voltage Differential Signaling, low voltage differential signal) and JESD204, etc.

[0024] The first digital communication interface of the machine control center can communicate digitally with the second digital communication interface in the test station station1. j The third digital communication interface can be connected to the test station j+1The second digital communication interface in performs digital communication, j is a natural number, 1≤j≤N-1; here, the machine control center can perform two-way digital communication with the test station station1, and the test station station j Can be used with test station j+1 For two-way digital communication.

[0025] When the machine control center receives an instruction to test the AD chip in the test station corresponding to the target identifier, it obtains the test instruction and the test data, generates a first data packet including the test instruction, the test data and the target identifier, and sends it through the first digital communication interface; the test station station i When receiving the first data packet from the second digital communication interface, obtaining the target identifier in the first data packet, if the target identifier = test station station i When the corresponding identifier is set, the test station station is set based on the test instructions and test data in the first data packet. i The AD chip in the AD chip mount is tested, otherwise, the AD chip in the AD chip mount is tested by the test station. i A first data packet is sent from the third digital communication interface.

[0026] Here, an input device (for example, a keyboard, etc.) can be provided in the machine control center, and through the keyboard device, input can be made to the machine control center regarding which AD chip to test (i.e., the target identifier), what the test instructions are (for example, reading registers, writing registers, performing AD conversion, DA conversion, etc.), and test data. Then, the machine control center will receive an instruction to test the AD chip in the test station corresponding to the target identifier, and then, the first data packet can be output through the second digital communication structure, so that the test station corresponding to the target identifier can perform the corresponding test.

[0027] In this embodiment, the test station i When the third digital communication interface receives the second data packet, the second data packet is acquired and sent through the second digital communication interface. Here, when performing the test, the test station may need to send the test results back to the machine control center, etc., that is, when the test station station j When data needs to be sent to the machine control center, it can be sent through the test station j-1 ,..., test station station2, test station station1 forwards and sends the data to the machine control center.

[0028] In this embodiment, the test station NWhen a first data packet is received from the second digital communication interface, a target identifier in the first data packet is obtained, and if the target identifier is ≠ the test station station N If the test station station N The first data packet is received, but the target identifier ≠ test station N The corresponding identifier is not the data packet sent to itself, because the test station N If there is no subsequent test station, the first data packet has an error

[0029] In this embodiment, the "test station i Testing the AD chip in the AD chip mounting seat in the test station i The AD chip in the AD chip mounting seat is tested and the test result is obtained; then, a second data packet containing the test result is sent through the second digital communication interface. Here, the test result can be the state value of the AD chip, etc.

[0030] In this test platform, the machine control center and N test stations communicate serially, and the mode can be understood as follows: the machine control center is the active party, the test station is the passive party, the communication is initiated by the active party, and the passive party responds.

[0031] Machine control center to test station i When sending or receiving commands, they must be received and forwarded by the previous i-1 test stations before they can reach the test station. i , and then returns. The command is sent 4*(i-1) times in total. Let the time for each command to be sent be t i , then the total sending time is 4*(i-1)t i , plus the processing time after receiving the command, the waiting time of the machine control center is greater than 4*(i-1)t i ;t i It is also related to the communication rate and the number of command bits. Suppose the communication rate is B and the number of command bits is c, then ti=c / B; the waiting time for the machine to send a command is related to the number of command bits, the communication rate and the number of test stations.

[0032] The following is a specific example to describe the interface design method.

[0033] Assume that the number of bits of a command is 43 bits, the communication rate is 115200, and the number of test stations is 200. The transmission time of a single command is 43 / 115200, that is, 0.373ms. The response time of the last test station command is at least 0.297s. Considering the time surplus, the waiting time of the test station is set to 0.7s, and the waiting time of the machine control center is set to 1s.

[0034] In this embodiment, the machine control center is provided with a first analog communication interface, each test station is provided with a second analog communication interface for analog communication, and the first analog communication interface can perform analog communication with the second analog communication interfaces in all test stations. Here, analog signals can be sent to all test stations or received from test stations through the first analog communication interface.

[0035] In this embodiment, the "obtaining test instructions and test data" specifically includes: obtaining test instructions, test data including digital signals, and a first analog signal corresponding to the digital signal; the machine control center is also used to: receive a second analog signal through a first analog communication interface, and when the difference between the first and second analog signals is greater than a first preset value, the AD chip in the test station corresponding to the target identifier fails the test. Here, it is described how to test the conversion of digital signals to analog signals for AD chips.

[0036] In this embodiment, the "obtaining test instructions and test data" specifically includes: obtaining test instructions, test data including analog signals, and a first digital signal corresponding to the analog signals, and then sending the analog signals through a first analog communication interface; the machine control center is also used to: receive a second digital signal through the first digital communication interface, and when the difference between the first and second digital signals is greater than a second preset value, the AD chip in the test station corresponding to the target identifier fails the test. Here, it is described how to test the conversion of analog signals to digital signals for AD chips.

[0037] In this embodiment, the machine control center sends a third data packet including an identifier with a value of 1 through the first digital communication interface; the test station i When the second digital communication interface receives the third data packet, the test station i The identifier of the test station is set as the identifier in the third data packet, the value of the identifier in the third data packet is increased by 1, and the third data packet is sent through the third digital communication interface. Here, the identifier of each test station can be set through the third data packet.

[0038] In this embodiment, the test station iWhen sending the third data packet through the third digital communication interface fails, reducing the value of the identifier in the third data packet by 1, and sending a fourth data packet through the second digital communication interface, the fourth data packet including the identifier in the third data packet;

[0039] When the machine control center receives the fourth data packet from the first digital communication interface, the number of test stations that the first digital communication interface can communicate with is equal to the value of the identifier in the fourth data packet. i When the third data packet fails to be sent through the third digital communication interface, it indicates that the test station i There are no more test stations. At this time, a fourth data packet can be sent to the machine control center, so that the machine control center can obtain the number of test stations.

[0040] In this embodiment, when the machine control center receives the instruction to configure the AD chips in all the test stations, it obtains the configuration instruction and configuration data, generates a fifth data packet including the configuration instruction, configuration data and broadcast address, and sends it through the first digital communication interface;

[0041] Test station i When a fifth data packet is received from the second digital communication interface, a target identifier in the fifth data packet is obtained. If the target identifier is a broadcast address, the test station station is configured based on the configuration instructions and configuration data in the fifth data packet. i The AD chip in the AD chip mounting seat is configured, and then the AD chip is tested at the station i A fifth data packet is sent from the third digital communication interface. Here, in an actual test platform, the length of the identifier is determined, for example, the length of the identifier is 8 bits of binary, all 0 or all 1 for broadcast communication, that is, if the target identifier is an 8-bit binary number of all 0 or all 1, the target identifier matches all test stations.

[0042] For a 43-bit command, the first, second, third, fourth and fifth data packets may be configured as follows: 2-bit start code + 8-bit test station identifier + 1-bit command code + 32-bit data.

[0043] The start code is 2 bits, fixed to 00, to mark the beginning of a communication. Two consecutive 0s can effectively prevent pulse interference in the circuit.

[0044] The test station identifier is 8 bits, which are used to identify the test station in the link, so as to control a single test station. All 0 or all 1 indicates broadcast communication. It can be seen that the number of test stations on a link cannot exceed 254. All 0 is used for the public configuration of the test station and does not require a response. All 1 is used for the special configuration of the test station, which requires the corresponding test station to respond within the specified time. The remaining codes correspond to a single corresponding test station.

[0045] The command code is 1 bit, and with 32 bits of data, it can read and write the test station register. When it is 0, it is used to read data, and when it is 1, it is used to write data.

[0046] The 32-bit data can be used to store test instructions, test data, error codes, test results and identifiers, etc.

[0047] like Figure 2 As shown, for the write register command, the command with the identifier 0x00 is mainly used for the common configuration of the test station, such as setting the waiting time; the command with the identifier 0xff is mainly used for the numbering configuration of the test station, wherein the lower 8 bits of data are the starting number, which is generally 1. After the test station station1 receives the command, it stores the numbering data in the corresponding register, then adds 1 to the data, and sends it to the downstream test station (i.e., the test station connected to the third digital communication interface). Similarly, after the downstream test station receives the command, it stores the numbering data in the corresponding register, then adds 1 to the data, and sends it to the downstream test station. This cycle continues. When the last test station is waiting for the response from the downstream test station, a timeout occurs (i.e., sending data Failure), it thinks it is the last test station, then puts its own test station number into the data and sends it to the uplink test station, and the uplink test station directly forwards it to the uplink test station until it is sent to the machine control center. After receiving the command, the machine control center can know the number of test stations in the link and their corresponding numbers by analyzing the lower 8 bits of data, so that it can send and receive commands point-to-point; for commands of identifiers of other test stations, they are mainly for single test stations, such as DAC devices. Since the analog interfaces are connected together, in order to isolate the outputs between test stations, the command can be used to control the output enable of a single test station, so that only one test station has outputs at the same time, which is convenient for the machine to analyze and compare analog data.

[0048] The register read command is mainly for a single test station and is used to read the working data of the test station to determine whether the test station is working normally.

[0049] Taking the ADC device as an example, the control process of the machine control center is as follows:

[0050] Step 1: First send a command with a write register identifier of 0x00, which is mainly used to test the public configuration of the station;

[0051] Step 2: Send a command with a write register identifier of 0xff, which is mainly used to test the identifier configuration of the workstation;

[0052] Step 3: Set the identifier to 1 and set the analog interface level;

[0053] Step 4: Send a command to read converted data to the test station of the identifier, and read the data after AD conversion at the test station;

[0054] Step 5: Process and display the data;

[0055] Step 6: Test the station identifier loop count, modify the analog interface level, and then go to step 4.

[0056] Taking the DAC device as an example, the control process of the machine control center is as follows:

[0057] Step 1: First send a command with a write register identifier of 0x00, which is mainly used to test the public configuration of the station;

[0058] Step 2: Send a command with a write register identifier of 0xff, which is mainly used to test the identifier configuration of the workstation;

[0059] Step 3: Set the simulation data to be converted and set the identifier of the test station to 1

[0060] Step 4: Send a data conversion command to the test station of the identifier, and turn on the test station output enable;

[0061] Step 5: Process and display the analog interface;

[0062] Step 6: Send a command to the test station to turn off the output enable, and turn off the output enable;

[0063] Step 7: Test the station's identifier loop count, modify the simulation data, and go to step 4.

[0064] Taking general digital devices as an example, the control process of the machine control center is as follows:

[0065] Step 1: First send a command with a write register identifier of 0x00, which is mainly used to test the public configuration of the station;

[0066] Step 2: Send a command with a write register identifier of 0xff, which is mainly used to test the identifier configuration of the workstation;

[0067] Step 3: Set the test station identifier to 1;

[0068] Step 4: Send a read register command to the test station of the identifier to read the working status data of the test station;

[0069] Step 5: Process and display the test station data;

[0070] Step 6: Test the station identifier loop count and go to step 4.

[0071] It should be understood that although this specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each implementation mode may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

[0072] The series of detailed descriptions listed above are only specific descriptions of feasible implementation methods of the present invention. They are not intended to limit the scope of protection of the present invention. Any equivalent implementation methods or changes that do not deviate from the technical spirit of the present invention should be included in the scope of protection of the present invention.

Claims

1. A test platform for AD chips, characterized in that: include: Machine control center, test station station1, test station station2, ..., test station station N , each test station is provided with a unique identifier, where N is a natural number; The machine control center is provided with a first digital communication interface, each test station i are provided with a second digital communication interface, a third digital communication interface and an AD chip mounting seat, wherein i is a natural number, 1≤i≤N; the first digital communication interface of the machine control center can digitally communicate with the second digital communication interface in the test station station1, and the test station station j The third digital communication interface can be connected to the test station j+1 The second digital communication interface in performs digital communication, j is a natural number, 1≤j≤N-1; When receiving an instruction to test the AD chip in the test station corresponding to the target identifier, the machine control center obtains the test instruction and the test data, generates a first data packet including the test instruction, the test data and the target identifier, and sends the data packet through the first digital communication interface; Test station i When receiving the first data packet from the second digital communication interface, obtaining the target identifier in the first data packet, if the target identifier = test station station i When the corresponding identifier is set, the test station station is set based on the test instructions and test data in the first data packet. i The AD chip in the AD chip mount is tested, otherwise, the AD chip in the AD chip mount is tested by the test station. i A first data packet is sent from the third digital communication interface.

2. The test platform according to claim 1, characterized in that: The test station i When the third digital communication interface receives the second data packet, the second data packet is acquired and sent through the second digital communication interface.

3. The test platform according to claim 1, characterized in that: Test station N When a first data packet is received from the second digital communication interface, a target identifier in the first data packet is obtained, and if the target identifier is ≠ the test station station N When a corresponding identifier is received, a second data packet containing an error code is sent through the second digital communication interface, where the error code is used to characterize the error type of the first data packet.

4. The test platform according to claim 2, characterized in that: The "test station station i The AD chip in the AD chip mount is tested” specifically includes: For test station i The AD chip in the AD chip mounting seat is tested and the test result is obtained; then, a second data packet containing the test result is sent through the second digital communication interface.

5. The test platform according to claim 3, characterized in that: The machine control center is provided with a first analog communication interface, and each test station is provided with a second analog communication interface for analog communication. The first analog communication interface can perform analog communication with the second analog communication interfaces in all test stations.

6. The test platform according to claim 5, characterized in that: The "obtaining test instructions and test data" specifically includes: obtaining a test instruction, test data including a digital signal, and a first analog signal corresponding to the digital signal; The machine control center is also used to: receive a second analog signal through the first analog communication interface, and when the difference between the first and second analog signals is greater than a first preset value, the AD chip in the test station corresponding to the target identifier fails the test.

7. The test platform according to claim 5, characterized in that: The "obtaining test instructions and test data" specifically includes: obtaining a test instruction, test data including an analog signal, and a first digital signal corresponding to the analog signal, and then sending the analog signal through a first analog communication interface; The machine control center is also used to: receive a second digital signal through the first digital communication interface, and when the difference between the first and second digital signals is greater than a second preset value, the AD chip in the test station corresponding to the target identifier fails the test.

8. The test platform according to claim 1, characterized in that: The machine control center sends a third data packet including an identifier with a value of 1 through the first digital communication interface; The test station i When the second digital communication interface receives the third data packet, the test station i as the identifier in the third data packet, increase the value of the identifier in the third data packet by 1, and send the third data packet through the third digital communication interface.

9. The test platform according to claim 1, characterized in that: The test station i When sending the third data packet through the third digital communication interface fails, reducing the value of the identifier in the third data packet by 1, and sending a fourth data packet through the second digital communication interface, the fourth data packet including the identifier in the third data packet; When the machine control center receives the fourth data packet from the first digital communication interface, the number of test stations that the first digital communication interface can communicate with = the value of the identifier in the fourth data packet.

10. The test platform according to claim 1, characterized in that: When receiving the instruction to configure the AD chips in all the test stations, the machine control center obtains the configuration instruction and configuration data, generates a fifth data packet including the configuration instruction, configuration data and broadcast address, and sends it through the first digital communication interface; Test station i When a fifth data packet is received from the second digital communication interface, a target identifier in the fifth data packet is obtained. If the target identifier is a broadcast address, the test station station is configured based on the configuration instructions and configuration data in the fifth data packet. i The AD chip in the AD chip mounting seat is configured, and then the AD chip is tested at the station i A fifth data packet is sent from the third digital communication interface.

Images