Method and system for testing welding quality of HDMI socket

Abstract

The invention provides an HDMI socket welding quality test method and system, the test method is based on an HDMI socket welding quality test device, the test device comprises an acquisition unit, a plurality of analog switches and a constant current source generator, and the test method comprises the following steps: obtaining a plurality of pin numbers to be tested; according to each pin number, a pin test list is generated, and the pin test list comprises a connection test between two pins and a connection test between the pins and the ground; inputting the pin test list to the test device, so that the test device tests the test items in the pin test list in sequence by controlling the connection or disconnection of each analog switch to obtain each corresponding voltage signal; and comparing each voltage signal with a preset threshold value, and further evaluating the welding quality of the HDMI socket, so that automatic testing of the welding quality of the HDMI socket is realized, and the efficiency of testing the welding quality of the HDMI socket is improved.

Description

Technical Field

[0001] The present application relates to the technical field of electronic component testing, and in particular to a method and system for testing the welding quality of an HDMI socket. Background Art

[0002] An HDMI socket is an interface specifically designed to receive an HDMI plug, which allows an HDMI cable to transmit audio and video signals from a signal source (such as a TV set-top box, Blu-ray player, etc.) to a display device (such as a TV, projector, etc.). The pins of an HDMI socket have specific functions to ensure stable transmission of audio and video signals. These pins include: TMDS data channel pins: used to transmit video signals. Clock signal pins: used to synchronize transmitted data. DDC channel pins: used to transmit information such as EDID (Extended Display Identification Data) to achieve automatic configuration between devices. CEC (Consumer Electronics Control) pins: allow devices to control each other. +5V power pin: provides power to certain devices. HPD (Hot Plug Detect) pin: used to detect the connection status of the device.

[0003] HDMI sockets are usually soldered in PCB boards. In order to ensure the data transmission stability of PCB boards, it is necessary to test the soldering quality of HDMI sockets in PCB boards during the production and maintenance of PCB boards. Since there are many pins of HDMI sockets and each has different functions, manual measurement is usually adopted to use a multimeter to measure the connectivity between each pin, and then evaluate the soldering quality of HDMI sockets. This measurement method is inefficient. When a large number of PCB boards need to be tested for the soldering quality of HDMI sockets, a lot of manpower and material resources are required, and the testing process is simple repetitive labor. Therefore, an efficient automated measurement method is needed to improve the efficiency of HDMI socket soldering quality testing. Summary of the invention

[0004] In view of the above technical problems, the present application provides a method and system for testing the welding quality of an HDMI socket, so as to realize the automated testing of the welding quality of an HDMI socket and improve the efficiency of the welding quality testing of an HDMI socket.

[0005] In a first aspect, the present application provides a method for testing the welding quality of an HDMI socket. The testing method is based on a device for testing the welding quality of an HDMI socket. The testing device includes an acquisition unit, a plurality of analog switches, and a constant current source generator. One end of the analog switch is connected to a plurality of pins in the HDMI socket under test, and the other end is connected to the constant current source generator. The acquisition unit is connected to the HDMI socket under test, and each of the pins is connected to at least two different analog switches. The testing method includes:

[0006] Get the pin numbers to be tested.

[0007] Generate a pin test list according to each of the pin numbers, the pin test list including a connectivity test between two pins and a connectivity test between a pin and the ground;

[0008] Inputting the pin test list into the test device, so that the test device sequentially tests the test items in the pin test list by controlling the connection or disconnection of each analog switch to obtain corresponding voltage signals;

[0009] Each of the voltage signals is compared with a preset threshold value to evaluate the welding quality of the HDMI socket.

[0010] The embodiment of the present application provides a method for testing the welding quality of an HDMI socket. A test device is constructed by an acquisition unit, an analog switch, and a constant current source generator and connected to an HDMI socket, so that the welding quality of any pin of the HDMI socket can be quickly measured, thereby improving the efficiency of the welding quality test of the HDMI socket. Furthermore, the test device is combined with the test method provided by the present application, and the connection or disconnection of each analog switch is automatically controlled according to the generated pin test list. The loop current is generated by combining the constant current source generator and the acquisition unit is used to obtain the voltage signal of the tested HDMI socket, and then the voltage signals are compared and analyzed to evaluate the welding quality of the HDMI socket, thereby realizing automated multi-pin testing. Compared with the prior art, the embodiment of the present application does not require manual connection and measurement of the connectivity between each pin, but automatically generates corresponding test results according to the test requirements, thereby improving the efficiency of the welding quality test of the HDMI socket.

[0011] In a possible implementation, when the test item is a connectivity test between a first pin and a second pin, the test device sequentially tests the test items in the pin test list by controlling the connectivity or disconnection of each analog switch to obtain corresponding voltage signals, including:

[0012] Determine a corresponding first analog switch and a second analog switch according to respective pin numbers of the first pin and the second pin;

[0013] Sending control signals to the first analog switch and the second analog switch respectively, so that the first analog switch is connected to the first pin and the second analog switch is connected to the second pin;

[0014] Sending a constant current signal to the constant current source generator, so that the constant current source generator outputs a preset constant current, and the constant current passes through the first pin and the second pin;

[0015] The voltage signal between the first pin and the second pin is acquired by the acquisition unit.

[0016] In an embodiment of the present application, when it is necessary to test the connectivity between two pins, since each analog switch in the test device is connected to a number of pins and each pin is connected to at least two analog switches, any first pin and second pin can correspond to different analog switches, which is the structural basis for the subsequent construction of the current loop. After determining the first analog switch and the second analog switch corresponding to the first pin and the second pin, the first analog switch is controlled to be connected to the first pin, and the second analog switch is controlled to be connected to the second pin, and then the connection structure of the analog switch and the constant current source generator is used to construct a current loop including the first pin and the second pin. Finally, since the acquisition unit is always connected to the HDMI socket under test, after the current loop is constructed, the voltage signal between the first pin and the second pin can be automatically read to realize the automatic test of the connectivity between the specified two pins, and then all the connectivity test items between the two pins in the pin test list can be automatically tested in this way.

[0017] In a possible implementation, when the test item is a connectivity test between the first pin and the ground, the test device sequentially tests the test items in the pin test list by controlling the connectivity or disconnection of each analog switch to obtain corresponding voltage signals, including:

[0018] Determine a corresponding first analog switch according to the first pin;

[0019] Sending a control signal to the first analog switch to connect the first analog switch to the first pin;

[0020] Sending a constant current signal to the constant current source generator, so that the constant current source generator outputs a preset constant current, and the constant current flows to the ground through the first pin;

[0021] The voltage signal between the first pin and the ground is acquired by the acquisition unit.

[0022] In an embodiment of the present application, when it is necessary to test the connectivity between the first pin and the ground, similar to the process of testing two pins, it is only necessary to control the first analog switch corresponding to the first pin so that the first analog switch is connected to the first pin, thereby constructing a current loop including the first pin and the ground. Finally, through the automatic reading of the acquisition unit, the automatic test of the connectivity between the specified pin and the ground is realized. In this way, all the connectivity test items between the pins and the ground in the pin test list can be automatically tested.

[0023] Furthermore, the constant current source generator generates a current at the microampere level, and the voltage signal is obtained through the acquisition unit, including:

[0024] Acquiring an initial voltage signal through the acquisition unit;

[0025] The voltage signal is input to an operational amplifier in the acquisition unit, so that the operational amplifier amplifies the initial voltage signal by a preset multiple, thereby obtaining the voltage signal.

[0026] The embodiment of the present application provides a method for obtaining a voltage signal. Considering the circuit safety during the automated test and the problem that the pins in the tested HDMI socket cannot withstand large currents, the constant current source generator in the embodiment of the present application is used to generate a current at the microampere level to protect the HDMI socket and the entire test circuit. Therefore, after the acquisition unit obtains the initial voltage signal, it is necessary to amplify the initial voltage signal by a preset multiple through an operational amplifier to ensure the accuracy of the welding quality assessment.

[0027] Furthermore, the step of comparing each of the voltage signals with a preset threshold value to evaluate the welding quality of the HDMI socket includes:

[0028] Calculating the resistance value corresponding to each of the voltage signals according to the preset current value of the constant current source generator;

[0029] Each of the resistance values ​​is compared with a preset threshold value. If the difference between a certain resistance value and the corresponding preset threshold value exceeds a preset range, it is determined that the welding quality of the HDMI socket is unqualified, and an alarm message is generated. The alarm message includes the pin number that causes the welding quality of the HDMI socket to be unqualified.

[0030] The embodiment of the present application provides an automatic early warning method. After obtaining the voltage signal, the voltage signal is further converted into a resistance value, and the resistance value can more intuitively reflect the connectivity between two points in the circuit. Then the obtained resistance value is compared and analyzed with the preset threshold value and the preset range to determine whether the welding quality of the HDMI socket is qualified. If it is unqualified, the corresponding pin number is automatically recorded and an alarm message is generated, which is convenient for maintenance personnel to quickly locate the defective position and perform repairs, thereby improving the efficiency of the HDMI socket welding quality test.

[0031] In a second aspect, correspondingly, an embodiment of the present application provides a test system for the welding quality of an HDMI socket, the test system being based on a test device for the welding quality of an HDMI socket, the test device comprising an acquisition unit, a plurality of analog switches and a constant current source generator, wherein one end of the analog switch is connected to a plurality of pins in the HDMI socket under test, and the other end is connected to the constant current source generator, each of the pins is connected to at least two different analog switches, the acquisition unit is connected to the HDMI socket under test, and the test system comprises an acquisition module, a test list generation module, a test module and an evaluation module;

[0032] Wherein, the acquisition module is used to obtain a number of pin numbers to be tested;

[0033] The test list generating module is used to generate a pin test list according to each of the pin numbers, wherein the pin test list includes a connectivity test between two pins and a connectivity test between a pin and the ground;

[0034] The test module is used to input the pin test list into the test device, so that the test device sequentially tests the test items in the pin test list by controlling the connection or disconnection of each analog switch to obtain corresponding voltage signals;

[0035] The evaluation module is used to compare each of the voltage signals with a preset threshold value, thereby evaluating the welding quality of the HDMI socket.

[0036] In a possible implementation, when the test item is a connectivity test between a first pin and a second pin, the test device sequentially tests the test items in the pin test list by controlling the connectivity or disconnection of each analog switch to obtain corresponding voltage signals, including:

[0037] Determine a corresponding first analog switch and a second analog switch according to respective pin numbers of the first pin and the second pin;

[0038] Sending control signals to the first analog switch and the second analog switch respectively, so that the first analog switch is connected to the first pin and the second analog switch is connected to the second pin;

[0039] Sending a constant current signal to the constant current source generator, so that the constant current source generator outputs a preset constant current, and the constant current passes through the first pin and the second pin;

[0040] The voltage signal between the first pin and the second pin is acquired by the acquisition unit.

[0041] In a possible implementation, when the test item is a connectivity test between the first pin and the ground, the test device sequentially tests the test items in the pin test list by controlling the connectivity or disconnection of each analog switch to obtain corresponding voltage signals, including:

[0042] Determine a corresponding first analog switch according to the first pin;

[0043] Sending a control signal to the first analog switch to connect the first analog switch to the first pin;

[0044] Sending a constant current signal to the constant current source generator, so that the constant current source generator outputs a preset constant current, and the constant current flows to the ground through the first pin;

[0045] The voltage signal between the first pin and the ground is acquired by the acquisition unit.

[0046] Furthermore, the constant current source generator generates a current at the microampere level, and the voltage signal is obtained through the acquisition unit, including:

[0047] Acquiring an initial voltage signal through the acquisition unit;

[0048] The voltage signal is input to an operational amplifier in the acquisition unit, so that the operational amplifier amplifies the initial voltage signal by a preset multiple, thereby obtaining the voltage signal.

[0049] Furthermore, the evaluation module compares each of the voltage signals with a preset threshold value to evaluate the welding quality of the HDMI socket, including:

[0050] Calculating the resistance value corresponding to each of the voltage signals according to the preset current value of the constant current source generator;

[0051] Each of the resistance values ​​is compared with a preset threshold value. If the difference between a certain resistance value and the corresponding preset threshold value exceeds a preset range, it is determined that the welding quality of the HDMI socket is unqualified, and an alarm message is generated. The alarm message includes the pin number that causes the welding quality of the HDMI socket to be unqualified. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] Figure 1 : A flow chart of a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0053] Figure 2 : A structural schematic diagram of a test device in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0054] Figure 3 : A schematic diagram of the testing principle of a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0055] Figure 4 : It is a structural diagram of an HDMI socket.

[0056] Figure 5 : A schematic diagram of the connection structure between the analog switch U1 and the HDMI socket in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0057] Figure 6 : A schematic diagram of the connection structure between the analog switch U3 and the HDMI socket in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0058] Figure 7 : A schematic diagram of the connection structure between the analog switch U5 and the HDMI socket in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0059] Figure 8 : A schematic diagram of the connection structure between the analog switch U2 and the HDMI socket in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0060] Fig. 9 : A schematic diagram of the connection structure between the analog switch U4 and the HDMI socket in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0061] Fig.10 : A schematic diagram of the connection structure between the analog switch U6 and the HDMI socket in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0062] Fig.11 : A structural schematic diagram of a constant current source generator in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0063] Fig.12 : A structural schematic diagram of a collection unit in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0064] Fig.13 : A schematic diagram of the structure of a control unit in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0065] Fig.14 : A structural schematic diagram of a startup configuration unit in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0066] Fig.15 : A structural schematic diagram of an indicator light driving circuit in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0067] Fig.16 : A structural schematic diagram of starting a test control unit in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0068] Fig.17 : A structural schematic diagram of a program download unit in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0069] Fig.18 : A structural schematic diagram of the external power adapter input end in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0070] Fig.19 : A structural schematic diagram of a DCDC circuit in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0071] Fig. 20 : A schematic diagram of the internal structure of a transmission protocol conversion unit in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0072] Fig.21 : A schematic diagram of the type-c interface structure of the transmission protocol conversion unit in a method for testing the welding quality of an HDMI socket provided in an embodiment of the present application.

[0073] Fig. 22 : A structural schematic diagram of a HDMI socket welding quality testing system provided in an embodiment of the present application. DETAILED DESCRIPTION

[0074] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0075] It should be noted that the step numbers in the text are only for the convenience of explanation of the specific embodiments and do not serve to limit the order in which the steps are executed. In the description of this application, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features.

[0076] Embodiment 1:

[0077] like Figure 1 As shown, embodiment 1 provides a method for testing the welding quality of an HDMI socket. The testing method is based on a device for testing the welding quality of an HDMI socket. The testing device includes a collection unit, a plurality of analog switches, and a constant current source generator. One end of the analog switch is connected to a plurality of pins in the tested HDMI socket, and the other end is connected to the constant current source generator. The collection unit is connected to the tested HDMI socket, and each of the pins is connected to at least two different analog switches. The testing method includes steps S1 to S4:

[0078] Step S1, obtaining the numbers of several pins to be tested;

[0079] Step S2, generating a pin test list according to each of the pin numbers, wherein the pin test list includes a connectivity test between two pins and a connectivity test between a pin and the ground;

[0080] Step S3, inputting the pin test list into the test device, so that the test device sequentially tests the test items in the pin test list by controlling the connection or disconnection of each analog switch to obtain corresponding voltage signals;

[0081] Step S4: Compare each of the voltage signals with a preset threshold value to thereby evaluate the welding quality of the HDMI socket.

[0082] The embodiment of the present application provides a method for testing the welding quality of an HDMI socket. A test device is constructed by an acquisition unit, an analog switch, and a constant current source generator and connected to an HDMI socket, so that the welding quality of any pin of the HDMI socket can be quickly measured, thereby improving the efficiency of the welding quality test of the HDMI socket. Furthermore, the test device is combined with the test method provided by the present application, and the connection or disconnection of each analog switch is automatically controlled according to the generated pin test list. The loop current is generated by combining the constant current source generator and the acquisition unit is used to obtain the voltage signal of the tested HDMI socket, and then the voltage signals are compared and analyzed to evaluate the welding quality of the HDMI socket, thereby realizing automated multi-pin testing. Compared with the prior art, the embodiment of the present application does not require manual connection and measurement of the connectivity between each pin, but automatically generates corresponding test results according to the test requirements, thereby improving the efficiency of the welding quality test of the HDMI socket.

[0083] In a preferred embodiment, a structural schematic diagram of a device for testing the welding quality of an HDMI socket is shown as follows: Figure 2 As shown, it consists of a host computer, a control unit, an acquisition unit, a switch, a constant current source, a power supply and a test object. The "host computer" is responsible for displaying the measurement results and setting the measurement value tolerance index. The "control unit" is responsible for switching the connection relationship between each pin under test and the constant current source. The "constant current source" is responsible for providing precise zero temperature drift and stable current signals. The "switch" corresponds to the synchronous or asynchronous connection of the nineteen pins of the HDMI socket. The "acquisition unit" is responsible for shaping and amplifying the collected voltage signal and converting it into a digital signal that can be recognized by the computer. The "power supply" is responsible for the power supply of the entire system. The measurement principle of the test device is as follows Figure 3 As shown in Ohm's law, there is a resistance value between every two pins. When a constant current is added to this resistance, a voltage will be generated on the resistance. By measuring this voltage, the resistance between the two pins can be determined, and thus it can be determined whether the socket is welded open or short-circuited, thereby solving invisible problems in product production.

[0084] The structural diagram of the HDMI socket is as follows Figure 4 As shown, the position number is J1, which is connected to the PCB under test through an HDMI cable. The 19 pins on the socket are respectively connected to various analog switches. The MCU (microcontroller unit) controls the corresponding analog switches to be turned on through the program to realize the path of the corresponding pins.

[0085] The structure of each analog switch and its corresponding relationship with each pin of the HDMI socket are as follows: Figure 5-Figure 10As shown, the embodiment of the present application uses 6 analog switch ICs connected to each pin, and the corresponding bit numbers of each analog switch IC are U1, U2, U3, U4, U5 and U6, and each HDMI pin is connected to two analog switch input channels. Among them, the input channel pins X0-X7 of U1 are respectively connected to the 1-8 pins of the HDMI socket J1, the input channel pins X0-X7 of U3 are respectively connected to the 9-16 pins of the HDMI socket J1, the input channel pins X0-X2 of U5 are respectively connected to the 17-19 pins of the HDMI socket J1, the input channel pins X0-X7 of U2 are respectively connected to the 1-8 pins of the HDMI socket J1, the input channel pins X0-X7 of U4 are respectively connected to the 9-16 pins of the HDMI socket J1, and the input channel pins X0-X2 of U6 are respectively connected to the 17-19 pins of the HDMI socket J1, and the common pin X of each IC is respectively connected to the current output end of the constant current source part as the starting point of the signal excitation. The control pin EN, A, B, and C are connected to the corresponding pins of the MCU respectively, and the conduction of each analog channel is switched through program control. Figure 5-Figure 10 The resistor device in the circuit is used to protect the analog switch and prevent the device from being burned out by sudden large signals. Figure 5-Figure 10 The capacitor devices in the circuit have a filtering function and their position numbers are C1, C2, C3, C4, C5 and C6 respectively, which ensure that the power supply of each analog switch IC is stable and clean.

[0086] The structural diagram of the constant current source generator is as follows: Fig.11 As shown, it is used to generate the excitation signal required for the test. Among them, U7 is a three-terminal adjustable constant current source device. By adjusting the resistance value of R78, the output current of the entire constant current source can be adjusted. The resistor R75 and the diode D2 play the role of temperature zero drift. In the embodiment of the present application, a 10uA constant current source is used. It can be calculated that: R78 = 13.4KΩ, R75 = 134KΩ, and D2 uses 1N547.

[0087] The structural diagram of the acquisition unit and the control unit in the embodiment of the present application is as follows Fig.12 and Fig.13 As shown, the corresponding functions are realized through programming. Fig.12 The middle is the signal collection unit. When the analog switch is turned on, the current generated by the constant current source flows through the corresponding HDMI pin, and the corresponding pin generates a voltage signal. Fig.12 The signal processing unit in the signal amplifies the signal accordingly to match Fig.13 The input requirements of the AD converter. Fig.13Its AD converter is 12-bit electrostatic, with a conversion rate of 2MSPS, and has a high-precision reference voltage inside, with a comprehensive error of 2LSB. In this acquisition system, the constant current source will generate a voltage on the object after passing through it. This voltage model is Fig.12 The resistor R97 enters the positive terminal of the operational amplifier U9, and the negative terminal of U9 is fed back to the output terminal of the operational amplifier through a resistor R82, forming a negative feedback circuit. By configuring the ratio of R82 and R77, the amplification factor of this operational amplifier circuit can be adjusted. In the embodiment of the present application, the amplification ratio used is 2 times.

[0088] exist Fig.12 In the circuit, C12 is used for power filtering to improve the power supply stability of U9. Fig.13 In the example, pin 6 of U10 is connected to Fig.12 The output pin 1 of U9 is used to self-calibrate the AD acquisition circuit every time it is powered on and initialized to ensure the accuracy of the acquisition; pin 22 is connected to the test button. Every time the test button is triggered, U10 will receive a test command and start to execute a predetermined collection rule; resistors R87 and R89 are 100 ohm resistors, which are used to protect the serial port pins of U10 to prevent high voltage shock caused by external plug-in and unplug cables; resistors R85 and R86 are 100 ohm resistors, which are used to protect the burning pins of U10 to prevent high voltage shock caused by external plug-in and unplug cables. High voltage shock; C14, C15, C21, and C22 are mainly power supply filter capacitors to ensure that the U10 chip reduces power supply noise interference; R95 resistor is pulled up to 3.3V and connected to pin 22 of U10. This pin is the input pin, which is used to determine whether there is a test button pressed. When the button is not pressed, because of the pull-up resistor, U10 detects that the input is high level. When the button is pressed, the pin is connected to the ground through the button pin. U10 detects that the input pin is low level and calls the test program through the interrupt function.

[0089] In a possible implementation, in step S3, when the test item is a connectivity test between a first pin and a second pin, the test device sequentially tests the test items in the pin test list by controlling the connectivity or disconnection of each analog switch to obtain corresponding voltage signals, including:

[0090] Determine a corresponding first analog switch and a second analog switch according to respective pin numbers of the first pin and the second pin;

[0091] Sending control signals to the first analog switch and the second analog switch respectively, so that the first analog switch is connected to the first pin and the second analog switch is connected to the second pin;

[0092] Sending a constant current signal to the constant current source generator, so that the constant current source generator outputs a preset constant current, and the constant current passes through the first pin and the second pin;

[0093] The voltage signal between the first pin and the second pin is acquired by the acquisition unit.

[0094] In an embodiment of the present application, when it is necessary to test the connectivity between two pins, since each analog switch in the test device is connected to a number of pins and each pin is connected to at least two analog switches, any first pin and second pin can correspond to different analog switches, which is the structural basis for the subsequent construction of the current loop. After determining the first analog switch and the second analog switch corresponding to the first pin and the second pin, the first analog switch is controlled to be connected to the first pin, and the second analog switch is controlled to be connected to the second pin, and then the connection structure of the analog switch and the constant current source generator is used to construct a current loop including the first pin and the second pin. Finally, since the acquisition unit is always connected to the HDMI socket under test, after the current loop is constructed, the voltage signal between the first pin and the second pin can be automatically read to realize the automatic test of the connectivity between the specified two pins, and then all the connectivity test items between the two pins in the pin test list can be automatically tested in this way.

[0095] In a possible implementation, in step S3, when the test item is a connectivity test between the first pin and the ground, the test device sequentially tests the test items in the pin test list by controlling the connectivity or disconnection of each analog switch to obtain corresponding voltage signals, including:

[0096] Determine a corresponding first analog switch according to the first pin;

[0097] Sending a control signal to the first analog switch to connect the first analog switch to the first pin;

[0098] Sending a constant current signal to the constant current source generator, so that the constant current source generator outputs a preset constant current, and the constant current flows to the ground through the first pin;

[0099] The voltage signal between the first pin and the ground is acquired by the acquisition unit.

[0100] In an embodiment of the present application, when it is necessary to test the connectivity between the first pin and the ground, similar to the process of testing two pins, it is only necessary to control the first analog switch corresponding to the first pin so that the first analog switch is connected to the first pin, thereby constructing a current loop including the first pin and the ground. Finally, through the automatic reading of the acquisition unit, the automatic test of the connectivity between the specified pin and the ground is realized. In this way, all the connectivity test items between the pins and the ground in the pin test list can be automatically tested.

[0101] In a preferred embodiment, taking the connectivity between pin 1 and pin 2 of the HDMI socket as an example, firstly use Fig.13 The three pins 15, 14, and 13 of U10 output low level, 20 outputs high level, 19 and 18 output low level, pins 7 and 10 output low level, and pins 8, 9, 11, and 12 output high level, so that the analog switch U1 selects the first channel and U2 selects the second channel. The corresponding constant current source signal passes through pins 1 and 2 of the HDMI socket. At this time, AD conversion is started, and the measured voltage is the voltage value between pins 1 and 2 of the HDMI socket. Similarly, U10 can collect the voltage value between any pins by controlling each pin to output different level values, and then controlling each analog switch to switch to different channels. Specifically, the corresponding relationship between the level value of each pin of U10 and each test item in the embodiment of the present application is shown in the following table:

[0102]

[0103]

[0104]

[0105] Based on the above settings, when the test device obtains the pin test list, the voltage between two adjacent pins and the voltage between each pin and the ground can be automatically collected in sequence according to the pin test list.

[0106] Further, in step S3, the constant current source generator generates a current at the microampere level, and the voltage signal is obtained by the acquisition unit, including:

[0107] Acquiring an initial voltage signal through the acquisition unit;

[0108] The voltage signal is input to an operational amplifier in the acquisition unit, so that the operational amplifier amplifies the initial voltage signal by a preset multiple, thereby obtaining the voltage signal.

[0109] The embodiment of the present application provides a method for obtaining a voltage signal. Considering the circuit safety during the automated test and the problem that the pins in the tested HDMI socket cannot withstand large currents, the constant current source generator in the embodiment of the present application is used to generate a current at the microampere level to protect the HDMI socket and the entire test circuit. Therefore, after the acquisition unit obtains the initial voltage signal, it is necessary to amplify the initial voltage signal by a preset multiple through an operational amplifier to ensure the accuracy of the welding quality assessment.

[0110] Furthermore, in step S4, each of the voltage signals is compared with a preset threshold value to evaluate the welding quality of the HDMI socket, including:

[0111] Calculating the resistance value corresponding to each of the voltage signals according to the preset current value of the constant current source generator;

[0112] Each of the resistance values ​​is compared with a preset threshold value. If the difference between a certain resistance value and the corresponding preset threshold value exceeds a preset range, it is determined that the welding quality of the HDMI socket is unqualified, and an alarm message is generated. The alarm message includes the pin number that causes the welding quality of the HDMI socket to be unqualified.

[0113] In a preferred embodiment, according to Ohm's law, each collected voltage signal is converted into a resistance value and compared with a preset standard value. If it exceeds the tolerance range, it is judged as unqualified and an alarm signal is generated to prompt the operator that the object being tested is unqualified and there is a welding problem.

[0114] The embodiment of the present application provides an automatic early warning method. After obtaining the voltage signal, the voltage signal is further converted into a resistance value, and the resistance value can more intuitively reflect the connectivity between two points in the circuit. Then the obtained resistance value is compared and analyzed with the preset threshold value and the preset range to determine whether the welding quality of the HDMI socket is qualified. If it is unqualified, the corresponding pin number is automatically recorded and an alarm message is generated, which is convenient for maintenance personnel to quickly locate the defective position and perform repairs, thereby improving the efficiency of the HDMI socket welding quality test.

[0115] In a preferred embodiment, the test device provided in the embodiment of the present application further includes a startup configuration unit, an indicator light driving circuit, a startup test control unit, a program download unit, an external power adapter input terminal, a DCDC circuit and a transmission protocol conversion unit;

[0116] Wherein, the structure of the startup configuration unit is as follows Fig.14 As shown, it is deployed in the MCU to determine the startup order of the program. The structure of the indicator light driving circuit is as follows Fig.15 As shown, the circuit status is reflected by the indicator light. The structure of the start-up test control unit is as follows Fig.16 As shown, it is used to trigger the test. The structure of the program download unit is as follows Fig.17 As shown, it is used to download the external program to the MCU. The structure of the input end of the external power adapter is as follows Fig.18 As shown, it is used to input 12V voltage. The structure of the DCDC circuit is as follows Fig.19 As shown, it is used to step down the 12V voltage to a 3.3V power supply suitable for MCU and other circuits. Fig. 20 is a schematic diagram of the internal structure of the transmission protocol conversion unit, Fig.21 This is a schematic diagram of the type C interface structure of the transmission protocol conversion unit. The transmission protocol conversion unit is used to convert the USB protocol to the RS232 protocol, which is convenient for docking with a host computer without an RS232 hardware interface. In actual application, the type C interface of the data cable is connected to the MCU, and the USB interface at the other end of the data cable is connected to the host computer. The test data in the MCU is transmitted to the host computer through the data cable, and the host computer can also send setting parameters to the MCU.

[0117] Embodiment 2:

[0118] like Fig. 22 As shown, embodiment 2 provides a test system for HDMI socket welding quality, the test system is based on a test device for HDMI socket welding quality, the test device includes a collection unit, a plurality of analog switches and a constant current source generator, wherein one end of the analog switch is connected to a plurality of pins in the tested HDMI socket, and the other end is connected to the constant current source generator, each of the pins is connected to at least two different analog switches, the collection unit is connected to the tested HDMI socket, and the test system includes an acquisition module 10, a test list generation module 20, a test module 30 and an evaluation module 40;

[0119] Wherein, the acquisition module 10 is used to obtain a number of pin numbers to be tested;

[0120] The test list generating module 20 is used to generate a pin test list according to each of the pin numbers, wherein the pin test list includes a connectivity test between two pins and a connectivity test between a pin and the ground;

[0121] The test module 30 is used to input the pin test list into the test device, so that the test device sequentially tests the test items in the pin test list by controlling the connection or disconnection of each analog switch to obtain corresponding voltage signals;

[0122] The evaluation module 40 is used to compare each of the voltage signals with a preset threshold value, thereby evaluating the welding quality of the HDMI socket.

[0123] In a possible implementation, when the test item is a connectivity test between a first pin and a second pin, the test device sequentially tests the test items in the pin test list by controlling the connectivity or disconnection of each analog switch to obtain corresponding voltage signals, including:

[0124] Determine a corresponding first analog switch and a second analog switch according to respective pin numbers of the first pin and the second pin;

[0125] Sending control signals to the first analog switch and the second analog switch respectively, so that the first analog switch is connected to the first pin and the second analog switch is connected to the second pin;

[0126] Sending a constant current signal to the constant current source generator, so that the constant current source generator outputs a preset constant current, and the constant current passes through the first pin and the second pin;

[0127] The voltage signal between the first pin and the second pin is acquired by the acquisition unit.

[0128] In a possible implementation, when the test item is a connectivity test between the first pin and the ground, the test device sequentially tests the test items in the pin test list by controlling the connectivity or disconnection of each analog switch to obtain corresponding voltage signals, including:

[0129] Determine a corresponding first analog switch according to the first pin;

[0130] Sending a control signal to the first analog switch to connect the first analog switch to the first pin;

[0131] Sending a constant current signal to the constant current source generator, so that the constant current source generator outputs a preset constant current, and the constant current flows to the ground through the first pin;

[0132] The voltage signal between the first pin and the ground is acquired by the acquisition unit.

[0133] Furthermore, the constant current source generator generates a current at the microampere level, and the voltage signal is obtained through the acquisition unit, including:

[0134] Acquiring an initial voltage signal through the acquisition unit;

[0135] The voltage signal is input to an operational amplifier in the acquisition unit, so that the operational amplifier amplifies the initial voltage signal by a preset multiple, thereby obtaining the voltage signal.

[0136] Furthermore, the evaluation module 40 compares each of the voltage signals with a preset threshold value to evaluate the welding quality of the HDMI socket, including:

[0137] Calculating the resistance value corresponding to each of the voltage signals according to the preset current value of the constant current source generator;

[0138] Each of the resistance values ​​is compared with a preset threshold value. If the difference between a certain resistance value and the corresponding preset threshold value exceeds a preset range, it is determined that the welding quality of the HDMI socket is unqualified, and an alarm message is generated. The alarm message includes the pin number that causes the welding quality of the HDMI socket to be unqualified.

[0139] The embodiment of the present application provides a test system for the welding quality of an HDMI socket. The test device is constructed by an acquisition unit, an analog switch and a constant current source generator and connected to the HDMI socket, so that the welding quality of any pin of the HDMI socket can be quickly measured, thereby improving the efficiency of the welding quality test of the HDMI socket. Furthermore, the test device is combined with the test method provided by the present application, and the connection or disconnection of each analog switch is automatically controlled according to the generated pin test list. The loop current is generated by combining the constant current source generator and the voltage signal of the tested HDMI socket is obtained using the acquisition unit, and then each voltage signal is compared and analyzed to evaluate the welding quality of the HDMI socket, thereby realizing automated multi-pin testing. Compared with the prior art, the embodiment of the present application does not require manual connection and measurement of the connectivity between each pin, but automatically generates corresponding test results according to the test requirements, thereby improving the efficiency of the welding quality test of the HDMI socket.

[0140] The more detailed working principle and step flow of this embodiment can refer to, but are not limited to, the relevant records of Embodiment 1.

[0141] The specific embodiments described above further describe the purpose, technical solutions and beneficial effects of the present application in detail. It should be understood that the above description is only a specific embodiment of the present application and is not intended to limit the scope of protection of the present application. It is particularly pointed out that for those skilled in the art, any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of protection of the present application.

Claims

1. A method for testing the welding quality of an HDMI socket, characterized in that: The test method is based on a test device for the welding quality of an HDMI socket, the test device comprising a collection unit, a plurality of analog switches and a constant current source generator, wherein one end of the analog switch is connected to a plurality of pins in the tested HDMI socket, and the other end is connected to the constant current source generator, the collection unit is connected to the tested HDMI socket, and each of the pins is connected to at least two different analog switches, the test method comprises: Get the pin numbers to be tested. Generate a pin test list according to each of the pin numbers, the pin test list including a connectivity test between two pins and a connectivity test between a pin and the ground; Inputting the pin test list into the test device, so that the test device sequentially tests the test items in the pin test list by controlling the connection or disconnection of each analog switch to obtain corresponding voltage signals; Each of the voltage signals is compared with a preset threshold value to evaluate the welding quality of the HDMI socket.

2. A method for testing the welding quality of an HDMI socket as claimed in claim 1, characterized in that: When the test item is a connectivity test between the first pin and the second pin, the test device sequentially tests the test items in the pin test list by controlling the connectivity or disconnection of each analog switch to obtain corresponding voltage signals, including: Determine a corresponding first analog switch and a second analog switch according to respective pin numbers of the first pin and the second pin; Sending control signals to the first analog switch and the second analog switch respectively, so that the first analog switch is connected to the first pin and the second analog switch is connected to the second pin; Sending a constant current signal to the constant current source generator, so that the constant current source generator outputs a preset constant current, and the constant current passes through the first pin and the second pin; The voltage signal between the first pin and the second pin is acquired by the acquisition unit.

3. A method for testing welding quality of an HDMI socket as claimed in claim 1, characterized in that: When the test item is a connectivity test between the first pin and the ground, the test device sequentially tests the test items in the pin test list by controlling the connectivity or disconnection of each analog switch to obtain corresponding voltage signals, including: Determine a corresponding first analog switch according to the first pin; Sending a control signal to the first analog switch to connect the first analog switch to the first pin; Sending a constant current signal to the constant current source generator, so that the constant current source generator outputs a preset constant current, and the constant current flows to the ground through the first pin; The voltage signal between the first pin and the ground is acquired by the acquisition unit.

4. A method for testing the welding quality of an HDMI socket as claimed in claim 2 or 3, characterized in that: The constant current source generator generates a current at the microampere level, and the voltage signal is acquired by the acquisition unit, including: Acquiring an initial voltage signal through the acquisition unit; The voltage signal is input to an operational amplifier in the acquisition unit, so that the operational amplifier amplifies the initial voltage signal by a preset multiple, thereby obtaining the voltage signal.

5. A method for testing the welding quality of an HDMI socket as described in any one of claims 1 to 3, characterized in that: The step of comparing each of the voltage signals with a preset threshold value, and then evaluating the welding quality of the HDMI socket, includes: Calculating the resistance value corresponding to each of the voltage signals according to the preset current value of the constant current source generator; Each of the resistance values ​​is compared with a preset threshold value. If the difference between a certain resistance value and the corresponding preset threshold value exceeds a preset range, it is determined that the welding quality of the HDMI socket is unqualified, and an alarm message is generated. The alarm message includes the pin number that causes the welding quality of the HDMI socket to be unqualified.

6. A HDMI socket welding quality testing system, characterized in that: The test system is based on a test device for the welding quality of an HDMI socket, the test device comprising an acquisition unit, a plurality of analog switches and a constant current source generator, wherein one end of the analog switch is connected to a plurality of pins in the HDMI socket under test, and the other end is connected to the constant current source generator, each of the pins is connected to at least two different analog switches, the acquisition unit is connected to the HDMI socket under test, and the test system comprises an acquisition module, a test list generation module, a test module and an evaluation module; Wherein, the acquisition module is used to obtain a number of pin numbers to be tested; The test list generating module is used to generate a pin test list according to each of the pin numbers, wherein the pin test list includes a connectivity test between two pins and a connectivity test between a pin and the ground; The test module is used to input the pin test list into the test device, so that the test device sequentially tests the test items in the pin test list by controlling the connection or disconnection of each analog switch to obtain corresponding voltage signals; The evaluation module is used to compare each of the voltage signals with a preset threshold value, thereby evaluating the welding quality of the HDMI socket.

7. A HDMI socket welding quality testing system as claimed in claim 6, characterized in that: When the test item is a connectivity test between the first pin and the second pin, the test device sequentially tests the test items in the pin test list by controlling the connectivity or disconnection of each analog switch to obtain corresponding voltage signals, including: Determine a corresponding first analog switch and a second analog switch according to respective pin numbers of the first pin and the second pin; Sending control signals to the first analog switch and the second analog switch respectively, so that the first analog switch is connected to the first pin and the second analog switch is connected to the second pin; Sending a constant current signal to the constant current source generator, so that the constant current source generator outputs a preset constant current, and the constant current passes through the first pin and the second pin; The voltage signal between the first pin and the second pin is acquired by the acquisition unit.

8. A HDMI socket welding quality testing system as claimed in claim 6, characterized in that: When the test item is a connectivity test between the first pin and the ground, the test device sequentially tests the test items in the pin test list by controlling the connectivity or disconnection of each analog switch to obtain corresponding voltage signals, including: Determine a corresponding first analog switch according to the first pin; Sending a control signal to the first analog switch to connect the first analog switch to the first pin; Sending a constant current signal to the constant current source generator, so that the constant current source generator outputs a preset constant current, and the constant current flows to the ground through the first pin; The voltage signal between the first pin and the ground is acquired by the acquisition unit.

9. A HDMI socket welding quality testing system as claimed in claim 7 or 8, characterized in that: The constant current source generator generates a current at the microampere level, and the voltage signal is acquired by the acquisition unit, including: Acquiring an initial voltage signal through the acquisition unit; The voltage signal is input to an operational amplifier in the acquisition unit, so that the operational amplifier amplifies the initial voltage signal by a preset multiple, thereby obtaining the voltage signal.

10. A HDMI socket welding quality testing system as described in any one of claims 6 to 8, characterized in that: The evaluation module compares each of the voltage signals with a preset threshold value, thereby evaluating the welding quality of the HDMI socket, including: Calculating the resistance value corresponding to each of the voltage signals according to the preset current value of the constant current source generator; Each of the resistance values ​​is compared with a preset threshold value. If the difference between a certain resistance value and the corresponding preset threshold value exceeds a preset range, it is determined that the welding quality of the HDMI socket is unqualified, and an alarm message is generated. The alarm message includes the pin number that causes the welding quality of the HDMI socket to be unqualified.

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