Resistance testing device and method for synthetic block for cultivating diamond

Abstract

The invention relates to the field of resistance testing of synthetic blocks for diamonds, in particular to a resistance testing device and method for synthetic blocks for cultivating diamonds, which comprises a base and a turnover resistance testing table, a mounting box is arranged at the right end of the base, a control chip and a resistance sensor are arranged in the mounting box, and a touch display screen is arranged on the surface of the mounting box. A right bearing platform is arranged on the left side of the mounting box, a left bearing platform is arranged at the left end of the base, a sunken groove is formed between the right bearing platform and the left bearing platform, the left end of the overturning resistance testing platform is hinged to the left bearing platform, and the right end of the overturning resistance testing platform is arranged on the right bearing platform in a lap joint mode. The invention provides a novel resistance testing device and method for a synthetic block for diamond cultivation, and effectively overcomes the defect of low testing efficiency in resistance testing of the synthetic block in the prior art.

Description

Technical Field

[0001] The invention relates to the field of resistance testing of synthetic blocks for diamonds, and in particular to a resistance testing device and method for synthetic blocks for cultured diamonds. Background Art

[0002] In the synthesis process of cultured diamonds, synthesis power is a crucial process parameter that directly affects the synthesis quality of diamonds. This parameter is mainly determined by the resistance of the synthetic block, and in actual operation, it will also refer to the synthesis of the previous diamond to make corresponding adjustments. However, due to the errors in the component manufacturing process, the resistance of the synthetic block will fluctuate to a certain extent. When the fluctuation is small, the synthesis power can be slightly adjusted based on the empirical value. However, if the resistance fluctuates greatly, the adjustment of the synthesis power is no longer a simple linear relationship, but becomes complicated and difficult to accurately predict, which makes it difficult to determine the optimal synthesis power, which in turn affects the synthesis quality of diamonds and causes fluctuations.

[0003] In order to improve the synthetic quality of diamonds, the staff will first conduct a resistance test on each synthetic block before the synthetic block is put on the machine. Based on the continuous accumulation and analysis of data between resistance, power and synthetic quality, the staff will continuously correct the synthesis parameters to achieve more precise control and further improve the synthesis effect. In the Chinese invention patent document with application number 202310455930.5, a synthetic block resistance testing device for cultured diamonds is disclosed, in which multiple loading mechanisms are driven downward by a cylinder to simultaneously detect the resistance values ​​of multiple synthetic blocks. However, the technical solution recorded in the patent document has obvious and obvious defects: first, the device has high requirements for the placement of synthetic blocks, and the placement process is cumbersome, which affects the test efficiency; because the placement is not convenient enough, the number of test stations set up is also difficult to increase, so the amount of synthetic block resistance data obtained is also small, and the help for improving the synthesis effect is also limited.

[0004] Therefore, there is an urgent need for a new type of synthetic block resistance testing device and method for cultured diamonds to provide an effective solution to the defects of the existing technology. Summary of the invention

[0005] The object of the present invention is to provide a synthetic block resistance testing device for cultured diamonds to solve the problems raised in the above background technology.

[0006] To achieve the above object, the present invention provides the following technical solutions: A synthetic block resistance testing device for cultured diamonds comprises a base and a flip resistance testing platform, wherein the right end of the base is a mounting box, a control chip and a resistance sensor are arranged in the mounting box, a touch screen is arranged on the surface of the mounting box, the left side of the mounting box is a right support platform, the left end of the base is a left support platform, an inner recessed groove is arranged between the right support platform and the left support platform, the left end of the flip resistance testing platform is hinged on the left support platform, the right end of the flip resistance testing platform is placed on the right support platform, a pair of electric telescopic rods are arranged between the inner recessed groove and the flip resistance testing platform; a plurality of mounting grooves are densely and regularly distributed on the upper part of the flip resistance testing platform, and the flip resistance testing platform is made of insulating material. The test bench is made of a left electrode plate fixedly mounted on the left side wall of the mounting groove, a right electrode plate slidably mounted in the mounting groove, a synthetic block placement opening is provided between the left electrode plate and the right electrode plate, an insulating plate is fixedly mounted on the right side wall of the right electrode plate, a spring seat is provided on the right side of the insulating plate, a spring is connected between the spring seat and the insulating plate, the spring seats in the same row are fixed on a connecting rod, an avoidance groove for avoiding the connecting rod is provided on the flipping resistance test bench, the front and rear ends of all the connecting rods are fixedly mounted on the side pull rod, the left end of the side pull rod is fixedly connected to the cross bar, an electric push rod is fixedly mounted on the left side wall of the flipping resistance test bench, and the end of the telescopic rod of the electric push rod is connected to the cross bar.

[0007] Furthermore, a baffle extending horizontally to the right is fixedly connected to the top of the insulating plate. When the insulating plate is not moved, the baffle blocks the right half of the installation groove to prevent the synthetic block from falling into the area outside the synthetic block placement opening.

[0008] Furthermore, a material guide hopper is provided on the top of the flip resistance test bench, and a plurality of material distribution hoppers are distributed on the material guide hopper, the material distribution hoppers correspond one-to-one to the synthetic block placement openings, the lower port of the material distribution hopper has the same shape and size as the synthetic block placement opening, and a discharge slope is provided on the left side of the material guide hopper.

[0009] A method for testing resistance of synthetic blocks for cultured diamonds, comprising the following steps: Step 1: First, start the device through the touch screen, adjust the electric telescopic rod to the appropriate position, keep the flip resistance test bench horizontal and stable, then open the flip resistance test bench, put the synthetic block to be tested into the synthetic block placement opening of each installation slot, and clamp the synthetic block with the left and right electrode plates of each installation slot, ready for resistance testing. Step 2: Test the resistance of the synthetic block. Select Start Test on the touch screen. The control chip will start the resistance sensor for testing. At this time, the electric push rod drives the connecting rod to move through the cross bar and the side pull rod, and then pushes the spring seat and the right electrode plate to move to the left, so that the left electrode plate and the right electrode plate are in close contact with the synthetic block. The spring plays a role in buffering and maintaining stable contact pressure. The resistance sensor measures the resistance value of the synthetic block through the left electrode plate and the right electrode plate, and transmits the data to the control chip for processing and display; Step 3: Check the test results and reset the device. After the test is completed, the control chip will display the resistance value on the touch screen. The staff can check and record the resistance value of each synthetic block. Then, select the reset operation through the touch screen. The electric push rod will drive the right electrode plate to reset. At the same time, the electric telescopic rod can adjust the angle of the flip resistance test bench to facilitate the staff to take out the synthetic block after the test. After taking out the synthetic block, turn off the device and clean the installation slot to prepare for the next test.

[0010] Compared with the prior art, the present invention has the following beneficial effects: The present invention realizes the rapid placement and removal of synthetic blocks by setting up a flip resistor test table and a guide hopper, thereby significantly improving the test efficiency; a plurality of installation slots are densely and regularly distributed on the upper portion of the flip resistor test table, so that a plurality of synthetic blocks can be tested simultaneously, thereby increasing the number of test stations, thereby obtaining more synthetic block resistance data, and facilitating a more accurate analysis of the relationship between resistance, power and synthetic quality; based on the rich test data, the staff can adjust the synthetic parameters more accurately, thereby improving the synthetic quality of diamonds and reducing quality fluctuations.

[0011] The present invention simplifies the operation process through a touch display screen. The design of an electric telescopic rod and a flip resistor test table ensures stable testing and facilitates the placement of synthetic blocks. The electric push rod and spring combination ensures that the electrode plate is in close contact with the synthetic block, thereby improving the test accuracy. The resistance sensor transmits data to the control chip in real time, thereby achieving rapid processing and display and improving the test efficiency. The test is automatically reset after the test is completed, thereby facilitating continuous testing. The overall design optimizes the test process, improves the test accuracy and efficiency, and provides reliable data support for diamond synthesis. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 It is a schematic diagram of the structure of a synthetic block resistance testing device for cultured diamonds with a guide hopper; Figure 2 It is a schematic diagram of the structure of a synthetic block resistance testing device for cultured diamonds without a guide hopper; Figure 3 is a schematic diagram of the structure of the base; Figure 4 It is a structural schematic diagram of the flip resistor test bench; Figure 5 It is a structural schematic diagram of the right electrode plate driving component; Figure 6 It is a partial structural schematic diagram of the right electrode plate driving component; Figure 7 This is the framework diagram of the flip resistor test bench; Figure 8 It is a structural schematic diagram of the guide hopper.

[0013] In the figure: 1. base; 2. touch screen; 3. right support platform; 4. left support platform; 5. recessed groove; 6. electric telescopic rod; 7. flip resistance test bench; 8. installation groove; 9. avoidance groove; 10. left electrode plate; 11. right electrode plate; 12. synthetic block placement opening; 13. baffle; 14. insulating plate; 15. spring; 16. spring seat; 17. connecting rod; 18. side pull rod; 19. cross bar; 20. electric push rod; 21. guide hopper; 22. distribution hopper. DETAILED DESCRIPTION

[0014] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0015] Example 1: Please refer to Figures 1 to 8 A synthetic block resistance testing device for cultured diamonds comprises a base 1 and a flip resistance testing platform 7. The right end of the base 1 is a mounting box, in which a control chip and a resistance sensor are arranged. A touch screen 2 is arranged on the surface of the mounting box. The left side of the mounting box is a right support 3. The left end of the base 1 is a left support 4. An inner recessed groove 5 is formed between the right support 3 and the left support 4. The left end of the flip resistance testing platform 7 is hinged on the left support 4. The right end of the flip resistance testing platform 7 is placed on the right support 3. A pair of electric telescopic rods 6 are installed between the inner recessed groove 5 and the flip resistance testing platform 7. A plurality of mounting grooves 8 are densely and regularly distributed on the upper part of the flip resistance testing platform 7. The flip resistance testing platform 7 is made of insulating material. A left electric The electrode plate 10 has a right electrode plate 11 slidably installed in the mounting groove 8, a synthetic block placement opening 12 is provided between the left electrode plate 10 and the right electrode plate 11, an insulating plate 14 is fixedly installed on the right side wall of the right electrode plate 11, a spring seat 16 is provided on the right side of the insulating plate 14, a spring 15 is connected between the spring seat 16 and the insulating plate 14, the spring seats 16 in the same row are fixed to a connecting rod 17, an avoidance groove 9 for avoiding the connecting rod 17 is provided on the flip resistance test bench 7, the front and rear ends of all the connecting rods 17 are fixedly installed on the side pull rod 18, the left end of the side pull rod 18 is fixedly connected to the cross bar 19, an electric push rod 20 is fixedly installed on the left side wall of the flip resistance test bench 7, and the end of the telescopic rod of the electric push rod 20 is connected to the cross bar 19.

[0016] Furthermore, a baffle 13 extending horizontally to the right is fixedly connected to the top of the insulating plate 14 . When the insulating plate 14 is not moved, the baffle 13 blocks the right half of the installation groove 8 to prevent the synthetic block from falling into the area outside the synthetic block placement opening 12 .

[0017] Furthermore, a material guide hopper 21 is provided on the top of the flip resistor test bench 7, and a plurality of sub-hoppers 22 are distributed on the material guide hopper 21. The sub-hoppers 22 correspond one-to-one to the synthetic block placement opening 12. The lower end of the sub-hopper 22 has the same shape and size as the synthetic block placement opening 12, and a discharge slope is provided on the left side of the material guide hopper 21.

[0018] Working principle of this embodiment: In this embodiment, the entire test system is supported by the base 1, and the flip resistance test table 7 is hinged on the left support 4, which can be flexibly flipped to facilitate the placement and removal of the synthetic block. The control chip in the installation box is responsible for controlling the entire test process, and the resistance sensor is used to accurately measure the resistance value of the synthetic block.

[0019] During the test, the flip resistance test bench 7 is first flipped to an open state, and the composite blocks are introduced into the corresponding composite block placement openings 12 one by one by using the guide hopper 21 and the distribution hopper 22. The composite blocks are clamped by the left electrode plate 10 and the right electrode plate 11, wherein the right electrode plate 11 can be fine-tuned by the combination of the spring 15 and the spring seat 16 to adapt to composite blocks of different sizes and ensure good electrical contact.

[0020] Then, the resistance test bench 7 is flipped back to its original position, and the electric telescopic rod 6 helps to stabilize its position. The electric push rod 20 pushes the connecting rod 17 through the cross bar 19 and the side pull rod 18, thereby driving the right electrode plate 11 to move to the left, and closely contacting the left electrode plate 10 to form a test circuit. The control chip starts the resistance sensor to measure, and displays the result on the touch screen 2.

[0021] This embodiment realizes the rapid placement and removal of synthetic blocks by setting the flip resistance test table 7 and the guide hopper 21, which significantly improves the test efficiency; a plurality of installation slots 8 are densely and regularly distributed on the upper part of the flip resistance test table 7, and a plurality of synthetic blocks can be tested at the same time, thereby increasing the number of test stations, thereby obtaining more synthetic block resistance data, and facilitating a more accurate analysis of the relationship between resistance, power and synthetic quality; based on the rich test data, the staff can adjust the synthetic parameters more accurately, thereby improving the synthetic quality of diamonds and reducing quality fluctuations.

[0022] Example 2: Please refer to Figures 1 to 8 , a method for testing resistance of synthetic blocks for cultured diamonds, comprising the following steps: Step 1: First, start the device through the touch screen 2, adjust the electric telescopic rod 6 to a proper position, keep the flip resistance test bench 7 horizontal and stable, then open the flip resistance test bench 7, put the synthetic block to be tested into the synthetic block placement opening 12 of each installation slot 8, and clamp the synthetic block with the left electrode plate 10 and the right electrode plate 11 of each installation slot 8, and prepare for the resistance test. Step 2: Test the resistance of the synthetic block. Select Start Test on the touch screen 2. The control chip will start the resistance sensor for testing. At this time, the electric push rod 20 drives the connecting rod 17 to move through the cross bar 19 and the side pull rod 18, and then pushes the spring seat 16 and the right electrode plate 11 to move to the left, so that the left electrode plate 10 and the right electrode plate 11 are in close contact with the synthetic block. The spring 15 plays a role in buffering and maintaining stable contact pressure. The resistance sensor measures the resistance value of the synthetic block through the left electrode plate 10 and the right electrode plate 11, and transmits the data to the control chip for processing and display; Step 3: Check the test results and reset the device. After the test is completed, the control chip displays the resistance value on the touch screen 2. The staff can check and record the resistance value of each synthetic block. Then, the reset operation is selected through the touch screen 2. The electric push rod 20 will drive the right electrode plate 11 to reset. At the same time, the electric telescopic rod 6 can adjust the angle of the flip resistance test bench 7 to facilitate the staff to take out the synthetic block after the test. After taking out the synthetic block, turn off the device and clean the installation slot 8 to prepare for the next test.

[0023] This embodiment simplifies the operation process through the touch screen display. The electric telescopic rod and the flip resistance test table design ensure stable testing and easy placement of the synthesis block. The electric push rod and spring combination ensure close contact between the electrode plate and the synthesis block, thereby improving the test accuracy. The resistance sensor transmits data to the control chip in real time to achieve rapid processing and display, thereby improving the test efficiency. After the test is completed, it automatically resets to facilitate continuous testing. The overall design optimizes the test process, improves the test accuracy and efficiency, and provides reliable data support for diamond synthesis.

Claims

1. A synthetic block resistance testing device for cultured diamonds, comprising a base (1) and a flip resistance testing table (7), characterized in that: The right end of the base (1) is a mounting box, in which a control chip and a resistance sensor are arranged, and a touch screen (2) is arranged on the surface of the mounting box. The left side of the mounting box is a right support (3), and the left end of the base (1) is a left support (4). An inner recessed groove (5) is provided between the right support (3) and the left support (4). The left end of the flip resistance test bench (7) is hinged on the left support (4), and the right end of the flip resistance test bench (7) is placed on the right support (3). A pair of electric telescopic rods (6) are provided between the inner recessed groove (5) and the flip resistance test bench (7); The upper part of the flip resistance test bench (7) is densely and regularly distributed with a plurality of mounting grooves (8). The flip resistance test bench (7) is made of insulating material. A left electrode plate (10) is fixedly mounted on the left side wall of the mounting groove (8). A right electrode plate (11) is slidably mounted in the mounting groove (8). A synthetic block placement opening (12) is provided between the left electrode plate (10) and the right electrode plate (11). An insulating plate (14) is fixedly mounted on the right side wall of the right electrode plate (11). A spring seat (16) is provided on the right side of the insulating plate (14). The spring seat (16) is slidably mounted on the left side wall of the mounting groove (8). Springs (15) are connected between the insulating plates (14), spring seats (16) in the same row are fixed to a connecting rod (17), an avoidance groove (9) for avoiding the connecting rod (17) is provided on the flip resistance test bench (7), the front and rear ends of all the connecting rods (17) are fixedly mounted on the side pull rod (18), the left end of the side pull rod (18) is fixedly connected to the cross bar (19), an electric push rod (20) is fixedly mounted on the left side wall of the flip resistance test bench (7), and the end of the telescopic rod of the electric push rod (20) is connected to the cross bar (19).

2. The synthetic block resistance testing device for cultured diamond according to claim 1, characterized in that: A baffle (13) extending horizontally to the right is fixedly connected to the top of the insulating plate (14); when the insulating plate (14) is not moved, the baffle (13) blocks the right half of the installation groove (8) to prevent the synthetic block from falling into an area outside the synthetic block placement opening (12).

3. The method for testing resistance of synthetic blocks for cultured diamonds according to claim 1, characterized in that: A guide hopper (21) is provided on the top of the flip resistance test bench (7), and a plurality of sub-hoppers (22) are distributed on the guide hopper (21). The sub-hoppers (22) correspond to the synthetic block placement openings (12) one by one, and the lower ports of the sub-hoppers (22) are the same in shape and size as the synthetic block placement openings (12). A discharge slope is provided on the left side of the guide hopper (21).

4. A method for testing resistance of synthetic blocks for cultured diamonds, applicable to the device for testing resistance of synthetic blocks for cultured diamonds as claimed in any one of claims 1 to 3, characterized in that: The steps include: Step 1: First, the device is started by the touch screen (2), and the electric telescopic rod (6) is adjusted to a suitable position to keep the flip resistance test bench (7) horizontal and stable. Then, the flip resistance test bench (7) is opened, and the synthetic blocks to be tested are respectively placed in the synthetic block placement openings (12) of each installation slot (8). The left electrode plate (10) and the right electrode plate (11) of each installation slot (8) clamp the synthetic block, and prepare for resistance testing. Step 2: Test the resistance of the composite block. Select Start Test on the touch screen (2). The control chip will start the resistance sensor for testing. At this time, the electric push rod (20) drives the connecting rod (17) to move through the cross bar (19) and the side pull rod (18), thereby pushing the spring seat (16) and the right electrode plate (11) to move to the left, so that the left electrode plate (10) and the right electrode plate (11) are in close contact with the composite block. The spring (15) plays a role in buffering and maintaining stable contact pressure. The resistance sensor measures the resistance value of the composite block through the left electrode plate (10) and the right electrode plate (11), and transmits the data to the control chip for processing and display. Step 3: Check the test results and reset the device. After the test is completed, the control chip displays the resistance value on the touch screen (2). The staff can check and record the resistance value of each synthetic block. Then, the staff selects the reset operation through the touch screen (2). The electric push rod (20) will drive the right electrode plate (11) to reset. At the same time, the electric telescopic rod (6) can adjust the angle of the flip resistance test table (7) to facilitate the staff to take out the synthetic block after the test. After taking out the synthetic block, the device is turned off and the installation slot (8) is cleaned to prepare for the next test.

Images