Identification method and device of storage particles, terminal equipment and readable storage medium

Abstract

The application is suitable for the technical field of storage, and provides a storage grain identification method and device, terminal equipment and readable storage medium. The storage grain identification method comprises: in response to a special type scanning instruction, performing special type scanning on the storage grain to obtain a LUN unit packaging type of the storage grain. Through the preset scanning strategy and the special type scanning, the special LUN grain type can be accurately identified, so that more comprehensive support is provided for subsequent firmware development.

Description

TECHNICAL FIELD

[0001] The present application belongs to the technical field of storage, and particularly relates to a storage grain identification method and device, a terminal device, and a readable storage medium. BACKGROUND

[0002] In the production and manufacturing process of storage grains, special types of storage grains often need to be packaged. Since there are multiple LUN (Logical Unit) grain types for the same ID of storage grains, it is impossible to determine which LUN grain type the storage grain belongs to by looking at the grain ID and the grain externally. If the LUN grain type of the storage grain cannot be identified, it is impossible to provide support for subsequent firmware development, resulting in the inability to support special LUN grain types. In the related art, only conventional LUN grain types can be identified, and special LUN grain types of storage grains cannot be identified. SUMMARY

[0003] The embodiments of the present application provide a storage grain identification method and device, a terminal device, and a readable storage medium, which can solve the problem that the related art cannot identify the special LUN grain type of the storage grain.

[0004] In a first aspect, the embodiments of the present application provide a storage grain identification method, comprising:

[0005] In response to a special type scanning instruction, performing special type scanning on the storage grain to obtain a LUN unit packaging type of the storage grain.

[0006] In some embodiments of the first aspect, performing special type scanning on the storage grain to obtain the LUN unit packaging type of the storage grain comprises:

[0007] Obtaining multiple preset special LUN combination modes;

[0008] Iterating through all the special LUN combination modes, performing special type scanning on the storage grain to obtain all scanning results;

[0009] Analyzing all the scanning results to obtain the LUN unit packaging type of the storage grain.

[0010] In some embodiments of the first aspect, the special LUN combination mode includes: an extra pull CE model combination mode, a first LUN LUN MAP model combination mode, a second LUN LUN MAP model combination mode, a third LUN LUN MAP model combination mode, an extra pull CE + LUN LUN MAP 2 3 combination model combination mode, an extra pull CH model combination mode, a different packaging type particle mixed paste combination mode, and a same packaging type particle positive and negative mixed paste combination mode. All special LUN combination modes are traversed, special type scanning is performed on the storage particles, and all scanning results are obtained, including:

[0011] The extra pull CE model combination mode is used to perform special type scanning on the storage particles, and a first scanning result is obtained.

[0012] The first LUN LUN MAP model combination mode is used to perform special type scanning on the storage particles, and a second scanning result is obtained.

[0013] The second LUN LUN MAP model combination mode is used to perform special type scanning on the storage particles, and a third scanning result is obtained.

[0014] The third LUN LUN MAP model combination mode is used to perform special type scanning on the storage particles, and a fourth scanning result is obtained.

[0015] The extra pull CE + LUN LUN MAP 2 3 combination model combination mode is used to perform special type scanning on the storage particles, and a fifth scanning result is obtained.

[0016] The extra pull CH model combination mode is used to perform special type scanning on the storage particles, and a sixth scanning result is obtained.

[0017] The different packaging type particle mixed paste combination mode is used to perform special type scanning on the storage particles, and a seventh scanning result is obtained.

[0018] The same packaging type particle positive and negative mixed paste combination mode is used to perform special type scanning on the storage particles, and an eighth scanning result is obtained.

[0019] In some embodiments of the first aspect, all scanning results are analyzed to obtain the LUN unit packaging type of the storage particles, including:

[0020] The corresponding type features are extracted from each scanning result.

[0021] The type features are matched with the special LUN unit packaging types in the feature library to obtain the LUN unit packaging type of the storage particles.

[0022] In some embodiments of the first aspect, after performing the special type scan on the storage grain to obtain the LUN cell packaging type of the storage grain, the method further comprises:

[0023] performing a read-write-erase test on the storage grain according to the LUN cell packaging type to obtain a test result.

[0024] In some embodiments of the first aspect, in response to the special type scan instruction, performing the special type scan on the storage grain to obtain the LUN cell packaging type of the storage grain comprises:

[0025] performing a regular type scan on the storage grain in response to the scan instruction to determine whether the storage grain is a regular type storage grain;

[0026] if it is determined that the storage grain is not a regular type storage grain, generating a special type scan instruction;

[0027] performing the special type scan on the storage grain in response to the special type scan instruction to obtain the LUN cell packaging type of the storage grain.

[0028] In some embodiments of the first aspect, in response to the special type scan instruction, performing the special type scan on the storage grain to obtain the LUN cell packaging type of the storage grain comprises:

[0029] performing the special type scan on the storage grain in response to the special type scan instruction to obtain the LUN cell packaging type of the storage grain when the special type scan instruction is received.

[0030] In a second aspect, an embodiment of the present application provides a storage grain identification device, comprising:

[0031] a scan module configured to perform a special type scan on the storage grain in response to a special type scan instruction to obtain a LUN cell packaging type of the storage grain.

[0032] In a third aspect, an embodiment of the present application provides a terminal device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor implements the steps of the above-mentioned storage grain identification method when executing the computer program.

[0033] In a fourth aspect, an embodiment of the present application provides a computer readable storage medium, and the computer readable storage medium stores a computer program, and the computer program is executed by a processor to implement the steps of the above-mentioned storage grain identification method.

[0034] In a fifth aspect, an embodiment of the present application provides a computer program product, and when the computer program product is executed on a terminal device, the terminal device executes the above-mentioned storage grain identification method.

[0035] The beneficial effects of this application embodiment compared to the prior art are as follows: This application embodiment performs a special type scan on the storage chip in response to a special type scan command to obtain the LUN cell package type of the storage chip. Through a preset scan strategy and special type scan, this application embodiment can accurately identify special LUN chip types, thereby providing more comprehensive support for subsequent firmware development. Attached Figure Description

[0036] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0037] Figure 1 This is a schematic diagram illustrating the implementation process of a method for identifying storage particles provided in an embodiment of this application;

[0038] Figure 2 This is a schematic diagram of the structure of a storage particle identification device provided in an embodiment of this application;

[0039] Figure 3 This is a schematic diagram of the structure of the terminal device provided in the embodiments of this application. Detailed Implementation

[0040] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are protected by this application.

[0041] It should be noted that the terms "comprising," "including," and "having," and any variations thereof, in the specification, claims, and accompanying drawings of this application, are intended to cover non-exclusive inclusion. For example, a process, method, terminal, product, or device that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or devices. Terms such as "first" and "second" in the claims, specification, and accompanying drawings of this application, as well as relational terms, are used merely to distinguish one entity / operation / object from another entity / operation / object, and do not necessarily require or imply any such immediate relationship or order between these entities / operations / objects.

[0042] Reference to“an embodiment” herein means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase“in one embodiment” in various places in the specification are not necessarily referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. As will be understood by those skilled in the art, an embodiment described herein can be incorporated into other embodiments.

[0043] In the production process of storage particles, it is often necessary to package special types of storage particles. Since there are multiple LUN (Logical Unit) particle types for storage particles of the same ID, it cannot be determined from the particle ID and the appearance of the particle alone whether the storage particle belongs to which LUN particle type. If the LUN particle type of the storage particle cannot be identified, support cannot be provided for subsequent firmware development, resulting in the inability to support special LUN particle types. In the related art, only conventional LUN particle types can usually be identified, and special LUN particle types of storage particles cannot be identified.

[0044] Therefore, embodiments of the present application can accurately identify special LUN particle types by presetting a scanning strategy and special type scanning, thereby providing more comprehensive support for subsequent firmware development.

[0045] In order to illustrate the technical solutions of the present application, specific embodiments will be described below.

[0046] Figure 1 An implementation flowchart of a storage particle identification method provided by an embodiment of the present application is shown, which can be applied to a terminal device. The terminal device can be a mobile phone, a tablet computer, a notebook computer, an ultra-mobile personal computer (UMPC), a netbook, etc.

[0047] Therefore, specifically, the above-mentioned storage particle identification method can include the following step S101.

[0048] Step S101, in response to a special type scanning instruction, performing special type scanning on the storage particle to obtain the LUN unit packaging type of the storage particle.

[0049] The special type scanning instruction is an instruction issued by the terminal device or the user, used to trigger the special type scanning process on the storage particle.

[0050] The storage particle is a physical unit for storing data, usually packaged inside a storage device (such as a solid state drive SSD, a memory stick, etc.). The storage particle can be a NAND flash memory, a DRAM, etc.

[0051] The LUN unit packaging type refers to a packaging manner of the LUN unit of the storage grain.

[0052] In the embodiments of the present application, first, the terminal device can receive a special type scanning instruction issued by an external system or a user through an interface. The interface can be a hardware interface (such as USB, Ethernet, etc.) or a software interface (such as API, command line interface, etc.). Then, the terminal device can parse the received scanning instruction to determine the required parameters (such as scanning speed, scanning depth, scanning mode, etc.) for scanning. At the same time, the hardware and software environment required for scanning are prepared, such as connecting the storage grain, loading the necessary driver and algorithm library, etc. Then, the hardware interface of the storage device or the test device is used to communicate with the storage grain, and specific scanning commands or test sequences are sent. These commands or sequences can include queries to the internal structure of the storage grain, read or write operations to specific registers, etc. According to the corresponding driver and algorithm, the response data of the storage grain can also be parsed, and the LUN unit packaging type of the storage grain can be determined according to the data. Specifically, it can be achieved by analyzing the electrical characteristics, timing characteristics or data format of the storage grain. Finally, the terminal device can determine the LUN unit packaging type of the storage grain based on the scanning result and the preset algorithm or rule. Then, the result is returned to the external system or the user in a standard format. The returned result can be a code, a string or other identifiers, etc., to represent the specific packaging type of the storage grain.

[0053] The beneficial effects of the embodiments of the present application compared with the prior art are: the embodiments of the present application respond to the special type scanning instruction, perform special type scanning on the storage grain, and obtain the LUN unit packaging type of the storage grain. The embodiments of the present application can accurately identify the special LUN grain type through the preset scanning strategy and special type scanning, thereby providing more comprehensive support for subsequent firmware development.

[0054] In some embodiments of the present application, the special type scanning on the storage grain to obtain the LUN unit packaging type of the storage grain can specifically include steps S401 to S403.

[0055] Step S401: Obtain a plurality of preset special LUN combination manners.

[0056] The special LUN combination manner can refer to a series of preset special scanning or test conditions for the storage grain, which can involve different voltages, currents, timing, command sequences, etc., for triggering specific responses of the storage grain, so as to identify the packaging type thereof.

[0057] In embodiments of the present application, the terminal device can obtain a plurality of special LUN combination modes from the database or configuration file of the storage device. The special LUN combination mode can be obtained through experiments, experience or technical documents, aiming to cover various packaging types of storage grains, so as to ensure that there are enough scanning conditions to trigger the potential response of the storage grain, thereby increasing the accuracy of identifying the packaging type thereof.

[0058] Step S402: traversing all special LUN combination modes, performing special type scanning on the storage grain, and obtaining all scanning results.

[0059] In embodiments of the present application, the terminal device can apply these special LUN combination modes to the storage grain one by one. The scanning process can specifically be sending a specific command sequence, adjusting the voltage and current level, monitoring the response of the storage grain, etc. By applying different scanning conditions, the specific response of the storage grain is triggered, and the response data is collected for subsequent analysis.

[0060] Step S403: analyzing all scanning results to obtain the LUN unit packaging type of the storage grain.

[0061] In embodiments of the present application, the terminal device can collect and record the scanning results under each special LUN combination mode. The scanning results can include response data, error codes, response time, etc. of the storage grain. Then, using a preset algorithm or rule, the results are analyzed to determine the packaging type of the storage grain. By analyzing the scanning results, the specific packaging type of the storage grain is identified, which provides key information for subsequent storage device manufacturing or firmware development.

[0062] Embodiments of the present application can trigger the potential response of the storage grain more comprehensively by traversing a plurality of preset special LUN combination modes, identify a plurality of storage grains of different packaging types, thereby improving the accuracy of identifying the packaging type thereof, so that storage device manufacturers and firmware developers can optimize the design for specific types of storage grains, thereby improving the read-write speed, durability and stability of the storage device.

[0063] In some specific embodiments of the present application, the above-mentioned special type scanning on the storage grain and obtaining all scanning results can further include steps S501 to S508.

[0064] The special LUN combination mode includes: an extra pull CE model combination mode, a first LUN LUN MAP model combination mode, a second LUN LUN MAP model combination mode, a third LUN LUN MAP model combination mode, an extra pull CE+LUN LUN MAP_2_3 combination model combination mode, an extra pull CH model combination mode, a different packaging type particle mixed paste combination mode, and a same packaging type particle positive and negative mixed paste combination mode.

[0065] In step S501, the extra pull CE model combination mode is used to perform special type scanning on the storage particle to obtain a first scanning result.

[0066] The extra pull CE model combination mode can be an extra operation or adjustment on the Chip Enable (CE) pin of the storage particle in the scanning process to trigger the specific response of the storage particle. This combination mode can involve different CE pin operation sequences or level states.

[0067] In the embodiments of the present application, the terminal device can first determine the pin configuration and electrical characteristics of the storage particle, and then connect to the test device to ensure that all connections are correct. Then, according to the specifications of the storage particle, the test device is configured to apply the extra pull CE model, which can be specifically implemented by adjusting the level state, timing or command sequence of the CE pin. Then, according to the “2CHx1CE_2LUN” combination mode, two channels and one CE pin are selected for scanning, and the logical unit (LUN1, etc.) to be scanned is determined. Then, the selected scanning conditions are applied to scan the storage particle, and the response of the storage particle is monitored, such as data reading, error code return, etc. Next, the response of the storage particle under the extra pull CE model combination mode is recorded, and the response data is analyzed to determine the specific behavior or characteristics of the storage particle, and a first scanning result is obtained.

[0068] In step S502, the first LUN LUN MAP model combination mode is used to perform special type scanning on the storage particle to obtain a second scanning result.

[0069] The LUN LUN MAP model combination mode can refer to testing the response of the storage particle to the LUN mapping through a specific command sequence or operation mode.

[0070] In the embodiments of the present application, the terminal device can first confirm that the electrical connection and pin configuration of the storage grain are correct, and then connect the test device to ensure that all connections are stable and reliable. Then, according to the specification of the storage grain, the test device can be configured to apply the first LUNLUNMAP model, which can be implemented by setting a specific command sequence, adjusting the pin level, or configuring the logical unit mapping strategy. Then, according to the requirements of the "LUNLUNMAP_1_3 model", appropriate scan conditions can be selected, which can include determining the logical units (LUN0, LUN1, etc.) and corresponding channels (CH0, CH1, etc.) to be scanned. Next, the selected scan conditions are applied to scan the storage grain, and the response of the storage grain is controlled, such as data reading, error code return, etc. Next, the response of the storage grain under the first LUNLUNMAP model combination mode is recorded, and the response data is analyzed to determine the specific behavior or characteristics of the storage grain, such as data consistency, response time, etc., to obtain the second scan result.

[0071] Step S503, using the second LUNLUNMAP model combination mode to perform special type scanning on the storage grain to obtain the third scan result.

[0072] In the embodiments of the present application, the terminal device can first confirm that the electrical connection and pin configuration of the storage grain are correct, and then connect the test device to ensure that all connections are stable and reliable. Then, according to the specification of the storage grain, the test device can be configured to apply the second LUNLUNMAP model, which can be implemented by setting a specific command sequence, adjusting the pin level, or configuring the logical unit mapping strategy. Then, according to the requirements of the "LUNLUNMAP_2_3 model", appropriate scan conditions can be selected, which can include determining the logical units (LUN0, LUN1, etc.) and corresponding channels (CH0, CH1, etc.) to be scanned. Next, the selected scan conditions are applied to scan the storage grain, and the response of the storage grain is controlled, such as data reading, error code return, etc. Next, the response of the storage grain under the second LUNLUNMAP model combination mode is recorded, and the response data is analyzed to determine the specific behavior or characteristics of the storage grain, such as data consistency, response time, etc., to obtain the third scan result.

[0073] Step S504, using the third LUNLUNMAP model combination mode to perform special type scanning on the storage grain to obtain the fourth scan result.

[0074] In the embodiments of the present application, the terminal device can first confirm that the electrical connection and pin configuration of the storage grain are correct, and then connect the test device to ensure that all connections are stable and reliable. Then, according to the specification of the storage grain, the test device can be configured to apply the third LUNLUNMAP model, which can be specifically implemented by setting a specific command sequence, adjusting the pin level, or configuring the logical unit mapping strategy. Then, according to the requirements of the "LUNLUNMAP_1_2_3 model", appropriate scan conditions can be selected, which can specifically include determining the logical units (LUN0, LUN1, etc.) and the corresponding channels (CH0, CH1, etc.) to be scanned. Next, the selected scan conditions are applied to scan the storage grain, and the response of the storage grain is controlled, such as data reading, error code return, etc. Next, the response of the storage grain under the third LUNLUNMAP model combination mode is recorded, and the response data is analyzed to determine the specific behavior or characteristics of the storage grain, such as data consistency, response time, etc., to obtain the fourth scan result.

[0075] In step S505, the storage grain is scanned in a special type using the "extra pull CE+LUNLUNMAP_2_3" combination model combination mode to obtain a fifth scan result.

[0076] The "extra pull CE+LUNLUNMAP_2_3" combination model combination mode is a scanning mode that combines the extra pull CE model with the second and third LUNLUNMAP models, aiming to trigger specific responses of the storage grain by combining the two test conditions.

[0077] In the embodiments of the present application, the terminal device can first confirm that the electrical connection and pin configuration of the storage grain are correct, and then connect the test device to ensure that all connections are stable and reliable. Then, according to the specification of the storage grain, the test device can be configured to apply the third LUNLUNMAP model, which can be specifically implemented by setting a specific command sequence, adjusting the pin level, or configuring the logical unit mapping strategy. Then, according to the requirements of the "LUNLUNMAP_1_2_3 model", appropriate scan conditions can be selected, which can specifically include determining the logical units (LUN0, LUN1, etc.) and the corresponding channels (CH0, CH1, etc.) to be scanned. Next, the selected scan conditions are applied to scan the storage grain, and the response of the storage grain is controlled, such as data reading, error code return, etc. Next, the response of the storage grain under the third LUNLUNMAP model combination mode is recorded, and the response data is analyzed to determine the specific behavior or characteristics of the storage grain, such as data consistency, response time, etc., to obtain the fourth scan result.

[0078] Step S506, the storage grain is scanned in the extra pull CH model combination mode to obtain a sixth scan result.

[0079] The extra pull CH model combination mode is similar to the extra pull CE model. The extra pull CH here can refer to additional operations or adjustments on a channel (CH) pin of the storage grain to trigger a specific response.

[0080] In the embodiments of the present application, the terminal device can first confirm that the electrical connection and pin configuration of the storage grain are correct, and then connect the test device to ensure that all connections are stable and reliable. Then, according to the specification of the storage grain, the test device can be configured to apply the extra pull CH model. Specifically, this can be achieved by setting a specific command sequence, adjusting the pin level, or configuring the logic unit mapping strategy. Then, according to the requirements of the extra pull CH model, appropriate scan conditions can be selected, which can specifically include determining the logic units (LUN0, LUN1, etc.) and corresponding channels (CH0, CH1, etc.) to be scanned. Next, the selected scan conditions are applied to scan the storage grain, and the response of the storage grain is controlled, such as data reading, error code return, etc. Next, the response of the storage grain under the extra pull CH model combination mode is recorded, and the response data is analyzed to determine the specific behavior or characteristics of the storage grain, such as data consistency, response time, etc., to obtain the sixth scan result.

[0081] Step S507, the storage grain is scanned in the extra pull CH model combination mode to obtain a sixth scan result.

[0082] The different packaging type grain mixed paste combination mode corresponds to mixing storage grains of different packaging types together for testing to observe whether their responses to specific scan conditions are different.

[0083] In the embodiments of the present application, the terminal device can first confirm that the electrical connection and pin configuration of the storage grain are correct, and then connect the test device to ensure that all connections are stable and reliable. Then the test device can be configured according to the specification of the storage grain to apply different mixed packaging type grain models. Specifically, this can be achieved by setting a specific command sequence, adjusting the pin level, or configuring the logic unit mapping strategy. Then, according to the requirements of the different mixed packaging type grain models, appropriate scan conditions can be selected, which can specifically include determining the logic units (LUN0, LUN1, etc.) and corresponding channels (CH0, CH1, etc.) to be scanned. Next, the selected scan conditions are applied to scan the storage grain, and the response of the storage grain is controlled, such as data reading, error code return, etc. Next, the response of the storage grain under different mixed packaging type grain combination modes is recorded, and the response data is analyzed to determine the specific behavior or characteristics of the storage grain, such as data consistency, response time, etc., to obtain the seventh scan result.

[0084] Step S508, performing a special type scan on the storage grain using the same packaging type grain forward-reverse mixed packaging combination mode to obtain an eighth scan result.

[0085] Among them, the same packaging type grain forward-reverse mixed packaging combination mode is to mix storage grains of the same packaging type but in opposite directions together for testing to evaluate the influence of direction on the scan result.

[0086] In the embodiments of the present application, the terminal device can first confirm that the electrical connection and pin configuration of the storage grain are correct, and then connect the test device to ensure that all connections are stable and reliable. Then the test device can be configured according to the specification of the storage grain to apply different mixed packaging type grain models. Specifically, this can be achieved by setting a specific command sequence, adjusting the pin level, or configuring the logic unit mapping strategy. Then, according to the requirements of the different mixed packaging type grain models, appropriate scan conditions can be selected, which can specifically include determining the logic units (LUN0, LUN1, etc.) and corresponding channels (CH0, CH1, etc.) to be scanned. Next, the selected scan conditions are applied to scan the storage grain, and the response of the storage grain is controlled, such as data reading, error code return, etc. Next, the response of the storage grain under different mixed packaging type grain combination modes is recorded, and the response data is analyzed to determine the specific behavior or characteristics of the storage grain, such as data consistency, response time, etc., to obtain the seventh scan result.

[0087] The embodiments of the present application trigger the potential responses of the storage grains through different combination manners, and collect the response data for subsequent analysis. Each combination manner can test the behavior of the storage grains under different conditions, thereby increasing the accuracy of identifying the packaging type thereof, and being able to more comprehensively test the response of the storage grains, thereby more accurately identifying the packaging type thereof. By understanding the packaging type and response characteristics of the storage grains, it is helpful for the storage device manufacturer to optimize the design thereof, and improve the performance and stability of the storage device.

[0088] In some embodiments of the present application, the analysis of all scan results to obtain the LUN unit packaging type of the storage grains can specifically include steps S601 and S602.

[0089] Step S601 extracts the corresponding type features from each scan result.

[0090] The type features are key information or data that can reflect the packaging type of the storage grains or LUN units extracted from the scan results. These features can be numerical values, strings, binary codes, etc.

[0091] In the embodiments of the present application, the terminal device can use a specific algorithm or tool to process the scan results and extract the key information or data therefrom. By extracting the features, the subsequent matching process with the feature library can be simplified, and the identification efficiency can be improved.

[0092] Step S602 matches the type features with the special LUN unit packaging types in the feature library to obtain the LUN unit packaging type of the storage grains.

[0093] The feature library is a pre-established database containing various LUN unit packaging types and their corresponding type features. This database can be used to match the type features in the scan results to identify the LUN unit packaging type of the storage grains.

[0094] In the embodiments of the present application, the terminal device can compare the extracted type features with the features of each special LUN unit packaging type in the feature library one by one, and use a certain matching algorithm (such as similarity calculation, distance measurement, etc.) to determine the most matched LUN unit packaging type. Through matching, the LUN unit packaging type of the storage grains can be identified.

[0095] The embodiments of the present application can quickly and accurately identify the LUN unit packaging type of the storage grains by extracting the type features and matching with the feature library, without the need for tedious manual analysis, and reduce the possibility of misidentification. Since the feature library can contain the features of multiple LUN unit packaging types, the embodiments of the present application can be suitable for different types of storage grains.

[0096] In some embodiments of the present application, after the special type scanning of the storage grain is performed to obtain the LUN unit packaging type of the storage grain, the above method can further include the following steps:

[0097] Performing erase-read-write test on the storage grain according to the LUN unit packaging type to obtain a test result.

[0098] In embodiments of the present application, the terminal device can select appropriate test strategies and parameters according to the LUN unit packaging type information, and use professional test equipment or software to perform erase, write and read operations on the storage grain. During the test process, the response time, error rate, read-write speed and other key indicators of the storage grain are recorded, so as to verify whether the LUN unit is normally accessed.

[0099] In some specific embodiments of the present application, the above test process can adopt a cross test mode, so as to verify whether the LUN unit has overlap or not.

[0100] In some embodiments of the present application, the above special type scanning of the storage grain in response to the special type scanning instruction to obtain the LUN unit packaging type of the storage grain can specifically include steps S701 to S703.

[0101] Step S701, performing a regular type scanning on the storage grain in response to a scanning instruction, and determining whether the storage grain is a regular type storage grain.

[0102] In embodiments of the present application, when receiving the scanning instruction, the terminal device can first start a regular type scanning program. Specifically, the regular type scanning program can check the basic attributes of the storage grain such as manufacturer information, capacity, health status, etc., and can also perform grain parameter analysis to obtain LUN number, LUN address and other information. Then, according to the scanning result, the terminal device can determine whether the storage grain is a regular type storage grain, so as to quickly identify whether the storage grain is a regular type, and provide a basis for subsequent operations. If the storage grain is a regular type, the LUN unit packaging type of the storage grain can be directly identified.

[0103] Step S702, if it is determined that the storage grain is not a regular type storage grain, a special type scanning instruction is generated.

[0104] In embodiments of the present application, if the regular type scanning result shows that the storage grain is not a regular type, the terminal device can generate a special type scanning instruction. The special type scanning instruction instructs the terminal device to perform more in-depth and professional scanning on the storage grain to obtain its LUN unit packaging type and other specific information.

[0105] In response to the special type scanning instruction, the special type scanning is performed on the storage grain to obtain the LUN unit packaging type of the storage grain.

[0106] In the embodiments of the present application, after receiving the special type scanning instruction, the terminal device can start the corresponding special type scanning program, use specific algorithms and parameters to perform scanning according to the characteristics of the storage grain, and collect and identify the LUN unit packaging type and other key information of the storage grain during the scanning process.

[0107] The embodiments of the present application can avoid unnecessary complex scanning of the regular type storage grain by first performing the regular type scanning and then generating the special type scanning instruction as needed, thereby improving the scanning efficiency. Various different types of storage grains, including irregular types, can also be processed, thereby enhancing the compatibility of the system.

[0108] In identifying the LUN unit packaging type of the storage grain, in addition to the terminal device being configured to first perform the regular scanning and then perform the special type scanning, the user can also directly send a scanning instruction to the terminal device to directly perform the special type scanning on the storage grain. Based on this, in some other specific embodiments of the present application, the above-mentioned special type scanning on the storage grain in response to the special type scanning instruction to obtain the LUN unit packaging type of the storage grain can specifically include the following steps:

[0109] When the special type scanning instruction is received, the special type scanning is performed on the storage grain in response to the special type scanning instruction to obtain the LUN unit packaging type of the storage grain.

[0110] In the embodiments of the present application, the terminal device can continuously listen to instructions from the upper layer management software or the user interface. When a command marked as "special type scanning" is received, the terminal device can enter the special type scanning process, configure the scanning device or algorithm according to the parameters and settings in the special type scanning instruction, and perform a special type scanning operation on the target storage grain, record and analyze the response of the storage grain, and extract the LUN unit packaging type and other key information.

[0111] The embodiments of the present application can more accurately identify the LUN unit packaging type of the storage grain by performing the special type scanning, thereby avoiding misjudgment or omission.

[0112] Figure 2 A structure diagram of a storage grain identification device provided by an embodiment of the present application is shown. The above-mentioned storage grain identification device 2 can be configured on a terminal device. Specifically, the above-mentioned storage grain identification device 2 can include:

[0113] The scanning module 201 is configured to perform special type scanning on the storage grain in response to a special type scanning instruction, to obtain a LUN unit packaging type of the storage grain.

[0114] Compared with the prior art, the embodiment of the present application has the beneficial effects that: the embodiment of the present application performs special type scanning on the storage grain in response to a special type scanning instruction, to obtain a LUN unit packaging type of the storage grain. The embodiment of the present application can accurately identify the special LUN grain type through the preset scanning strategy and the special type scanning, thereby providing more comprehensive support for subsequent firmware development.

[0115] In some embodiments of the present application, the scanning module 201 described above can also be configured to:

[0116] obtain a plurality of preset special LUN combination modes;

[0117] perform special type scanning on the storage grain by traversing all the special LUN combination modes, to obtain all scanning results;

[0118] analyze all the scanning results, to obtain a LUN unit packaging type of the storage grain.

[0119] In some embodiments of the present application, the special LUN combination mode includes: an extra pull CE model combination mode, a first LUN LUN MAP model combination mode, a second LUN LUN MAP model combination mode, a third LUN LUN MAP model combination mode, an extra pull CE + LUN LUN MAP_2_3 combination model combination mode, an extra pull CH model combination mode, a different packaging type grain mixed pasting combination mode, and a same packaging type grain positive and negative mixed pasting combination mode. The scanning module 201 described above can also be configured to:

[0120] perform special type scanning on the storage grain by using the extra pull CE model combination mode, to obtain a first scanning result;

[0121] perform special type scanning on the storage grain by using the first LUN LUN MAP model combination mode, to obtain a second scanning result;

[0122] perform special type scanning on the storage grain by using the second LUN LUN MAP model combination mode, to obtain a third scanning result;

[0123] perform special type scanning on the storage grain by using the third LUN LUN MAP model combination mode, to obtain a fourth scanning result;

[0124] perform special type scanning on the storage grain by using the extra pull CE + LUN LUN MAP_2_3 combination model combination mode, to obtain a fifth scanning result;

[0125] The storage grain is scanned by using an additional pull CH model combination mode to obtain a sixth scanning result;

[0126] The storage grain is scanned by using a different packaging type grain mixed paste combination mode to obtain a seventh scanning result;

[0127] The storage grain is scanned by using a same packaging type grain positive and negative mixed paste combination mode to obtain an eighth scanning result.

[0128] In some embodiments of the present application, the scanning module 201 described above can also be used to:

[0129] Extract the corresponding type features from each scanning result;

[0130] Match the type features with the special LUN unit packaging types in the feature library to obtain the LUN unit packaging type of the storage grain.

[0131] In some embodiments of the present application, the storage grain identification device 2 described above further comprises a test module, configured to:

[0132] Perform erase-read-test on the storage grain according to the LUN unit packaging type to obtain a test result.

[0133] In some embodiments of the present application, the scanning module 201 described above can also be used to:

[0134] In response to the scanning instruction, the storage grain is scanned for a regular type to determine whether the storage grain is a regular type storage grain;

[0135] If it is determined that the storage grain is not a regular type storage grain, a special type scanning instruction is generated;

[0136] In response to the special type scanning instruction, the storage grain is scanned for a special type to obtain the LUN unit packaging type of the storage grain.

[0137] In some embodiments of the present application, the scanning module 201 described above can also be used to:

[0138] When receiving the special type scanning instruction, in response to the special type scanning instruction, the storage grain is scanned for a special type to obtain the LUN unit packaging type of the storage grain.

[0139] As Figure 3As shown in FIG. 3, a schematic diagram of a terminal device provided by an embodiment of the present application is shown. The terminal device 3 can include a processor 301, a memory 302, and a computer program 303 stored in the memory 302 and executable on the processor 301, such as a storage particle identification program. The processor 301 implements the steps in each of the above storage particle identification method embodiments when executing the computer program 303, such as Figure 1 The step S101 shown above is described in detail.

[0140] It should be noted that for the convenience and brevity of description, the structure of the terminal device can also refer to the specific description of the structure in the method embodiments, which will not be described here.

[0141] The embodiments of the present application further provide a computer readable storage medium, which stores a computer program. The computer program is executed by a processor to implement the steps in the above storage particle identification method.

[0142] The embodiments of the present application provide a computer program product. When the computer program product is run on a mobile terminal, the mobile terminal can implement the steps in the above storage particle identification method.

[0143] The above embodiments are only used to illustrate the technical solutions of the present application, rather than limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that they can modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacements to some technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application.

Claims

1. A method of identifying a storage particle, characterized by, The method comprises the following steps: In response to a special type scanning instruction, performing special type scanning on the storage grain to obtain a LUN unit packaging type of the storage grain; The special type scanning on the storage grain to obtain the LUN unit packaging type of the storage grain comprises: Obtaining a plurality of preset special LUN combination modes; Iterating through all the special LUN combination modes, performing special type scanning on the storage grain to obtain all scanning results; Analyzing all the scanning results to obtain the LUN unit packaging type of the storage grain; The special LUN combination modes comprise an extra pull CE model combination mode, a first LUN LUN MAP model combination mode, a second LUN LUN MAP model combination mode, a third LUN LUN MAP model combination mode, an extra pull CE + LUN LUN MAP_2_3 combination model combination mode, an extra pull CH model combination mode, a different packaging type grain mixed pasting combination mode, and a same packaging type grain positive and negative mixed pasting combination mode, and the iterating through all the special LUN combination modes, performing special type scanning on the storage grain to obtain all scanning results comprises: Performing special type scanning on the storage grain by using the extra pull CE model combination mode to obtain a first scanning result; Performing special type scanning on the storage grain by using the first LUN LUN MAP model combination mode to obtain a second scanning result; Performing special type scanning on the storage grain by using the second LUN LUN MAP model combination mode to obtain a third scanning result; Performing special type scanning on the storage grain by using the third LUN LUN MAP model combination mode to obtain a fourth scanning result; Performing special type scanning on the storage grain by using the extra pull CE + LUN LUN MAP_2_3 combination model combination mode to obtain a fifth scanning result; Performing special type scanning on the storage grain by using the extra pull CH model combination mode to obtain a sixth scanning result; Performing special type scanning on the storage grain by using the different packaging type grain mixed pasting combination mode to obtain a seventh scanning result; Performing special type scanning on the storage grain by using the same packaging type grain positive and negative mixed pasting combination mode to obtain an eighth scanning result.

2. The method of identifying a storage grain according to claim 1, wherein, The analyzing all the scanning results to obtain the LUN unit packaging type of the storage grain comprises: Extracting a corresponding type feature from each scanning result; Matching the type feature with a special LUN unit packaging type in a feature library to obtain the LUN unit packaging type of the storage grain.

3. The method of claim 1, wherein the storage granule is identified by: After the special type scanning on the storage grain to obtain the LUN unit packaging type of the storage grain, the method further comprises: Performing erasing, writing and reading tests on the storage grain according to the LUN unit packaging type to obtain a test result.

4. The method of claim 1, wherein The special type scanning on the storage grain to obtain the LUN unit packaging type of the storage grain comprises: In response to the scanning instruction, a regular type scanning is performed on the storage grain to determine whether the storage grain is a regular type storage grain; If it is determined that the storage grain is not a regular type storage grain, the special type scanning instruction is generated; In response to the special type scanning instruction, a special type scanning is performed on the storage grain to obtain the LUN unit packaging type of the storage grain.

5. The method of claim 1, wherein the step of identifying the storage grain is performed by a method comprising: determining a location of the storage grain in the image; and determining a size of the storage grain in the image. The special type scanning on the storage grain to obtain the LUN unit packaging type of the storage grain includes: When the special type scanning instruction is received, in response to the special type scanning instruction, a special type scanning is performed on the storage grain to obtain the LUN unit packaging type of the storage grain.

6. An identification device for storing particles, characterized in that It includes: The scanning module is configured to, in response to the special type scanning instruction, perform a special type scanning on the storage grain to obtain the LUN unit packaging type of the storage grain. The special type scanning on the storage grain to obtain the LUN unit packaging type of the storage grain includes: A plurality of preset special LUN combination modes are obtained; All the special LUN combination modes are traversed, and a special type scanning is performed on the storage grain to obtain all scanning results; All the scanning results are analyzed to obtain the LUN unit packaging type of the storage grain; The special LUN combination modes include an extra CE model combination mode, a first LUN LUN MAP model combination mode, a second LUN LUN MAP model combination mode, a third LUN LUN MAP model combination mode, an extra CE + LUN LUN MAP_2_3 combination model combination mode, an extra CH model combination mode, a different packaging type grain mixed pasting combination mode, and a same packaging type grain positive and negative mixed pasting combination mode. The traversing of all the special LUN combination modes and the special type scanning on the storage grain to obtain all the scanning results include: The extra CE model combination mode is used to perform a special type scanning on the storage grain to obtain a first scanning result; The first LUN LUN MAP model combination mode is used to perform a special type scanning on the storage grain to obtain a second scanning result; The second LUN LUN MAP model combination mode is used to perform a special type scanning on the storage grain to obtain a third scanning result; The third LUN LUN MAP model combination mode is used to perform a special type scanning on the storage grain to obtain a fourth scanning result; The extra CE + LUN LUN MAP_2_3 combination model combination mode is used to perform a special type scanning on the storage grain to obtain a fifth scanning result; The extra CH model combination mode is used to perform a special type scanning on the storage grain to obtain a sixth scanning result; The different packaging type grain mixed pasting combination mode is used to perform a special type scanning on the storage grain to obtain a seventh scanning result; The same packaging type grain positive and negative mixed pasting combination mode is used to perform a special type scanning on the storage grain to obtain an eighth scanning result.

7. A terminal device, characterized by comprising: A computer program product comprising a memory, a processor, and a computer program stored in the memory and loadable into the processor, the processor implementing the steps of the method for identifying a storage particle according to any one of claims 1 to 5 when running the computer program.

8. A computer-readable storage medium storing a computer program, the computer-readable storage medium comprising: The computer program product, when run by the processor, implements the steps of the method for identifying a storage particle according to any one of claims 1 to 5.

Images