Nondestructive testing method, device and equipment and readable storage medium

Abstract

The invention discloses a nondestructive testing method, device and equipment and a readable storage medium, and relates to the technical field of nondestructive testing and three-dimensional image reconstruction. The nondestructive testing method comprises the following steps: determining the surface height of a to-be-detected area according to image information of a to-be-detected object in the to-be-detected area; according to the surface height of the to-be-detected area, reconstructing two-dimensional horizontal slice images of the to-be-detected area at at least two different height positions; fitting a real slice image of the to-be-detected area according to the two-dimensional horizontal slice image; and performing nondestructive testing on the to-be-detected area of the to-be-detected object based on the real slice image. According to the nondestructive testing method, the problem that the nondestructive testing accuracy is insufficient when the object to be detected inclines in the prior art is solved.

Description

Technical Field

[0001] The present invention relates to the technical field of nondestructive testing and three-dimensional image reconstruction, and in particular to a nondestructive testing method, device, equipment and readable storage medium. Background Art

[0002] Modern industrial nondestructive testing has been widely used in many engineering fields, especially in the fields of electronics and semiconductors. In large-scale industrial production processes, many defects are hidden below the surface of objects and cannot be directly observed by the naked eye or conventional means. In order to obtain information about the internal structure of an object, X-ray transmission technology is usually used to allow the rays to penetrate the object to form a visual internal image.

[0003] As the complexity of the internal structure of industrial products continues to increase and their size gradually becomes smaller, traditional two-dimensional X-ray transmission imaging has gradually exposed its limitations, making it difficult to clearly distinguish the different structures inside an object. To solve this problem, three-dimensional tomography technology has been developed. This technology collects several two-dimensional X-ray off-axis images at different angles and reconstructs them in three dimensions based on these off-axis images, thereby achieving a three-dimensional presentation of the target's internal structure.

[0004] However, existing three-dimensional tomography technology has high requirements for the physical position of the object to be tested. When acquiring two-dimensional images, it is usually assumed that the surface of the object to be tested remains absolutely horizontal. If the surface of the object is tilted or distorted due to improper placement, the inconsistency of the height around the surface will cause the horizontal slice image of the tomography at a specific height after reconstruction to fail to reflect the actual slice condition of the object, which will significantly reduce the accuracy and reliability of non-destructive testing. Summary of the invention

[0005] The object of the present invention is to provide a nondestructive testing method, device, equipment and readable storage medium, by fitting a two-dimensional horizontal slice image, to obtain a real slice image of the object to be detected in the area to be detected, so that even if the object to be detected is tilted and distorted, the real slice image can still accurately reflect the slice condition of the actual object, thereby increasing the accuracy of nondestructive testing.

[0006] In order to achieve the above object, the present invention provides the following technical solutions:

[0007] In a first aspect, the present invention provides a nondestructive testing method, the method comprising:

[0008] Determine the surface height of the area to be detected based on the image information of the object to be detected in the area to be detected;

[0009] Reconstructing two-dimensional horizontal slice images of the area to be detected at at least two different height positions according to the surface height of the area to be detected;

[0010] According to the two-dimensional horizontal slice image, a real slice image of the area to be detected is fitted;

[0011] Based on the real slice image, non-destructive testing is performed on the area to be inspected of the object to be inspected.

[0012] In some embodiments, determining the surface height of the area to be detected based on image information of the object to be detected in the area to be detected includes:

[0013] According to the requirements of non-destructive testing, the area to be tested is cut out from the object to be tested;

[0014] The image information of the area to be detected is obtained, and the surface height of the area to be detected is determined according to the image information of the area to be detected.

[0015] In some embodiments, determining the surface height of the area to be detected based on the image information of the area to be detected includes:

[0016] Obtaining the measurement point position and measurement parameters of each measurement point in the image information of the detection area;

[0017] According to the measurement point position and measurement parameters, the height value of each measurement point position is calculated;

[0018] According to the height values ​​of each measuring point, the surface height of the object to be detected is fitted.

[0019] In some embodiments, reconstructing two-dimensional horizontal slice images of the area to be detected at at least two different height positions according to the surface height of the area to be detected includes:

[0020] According to the surface height of the area to be inspected, two-dimensional off-axis images of the area to be inspected at different angles are collected;

[0021] All two-dimensional off-axis images are subjected to initial layer imaging processing to obtain two-dimensional horizontal slice images of the object to be detected at at least two different height positions.

[0022] In some embodiments, fitting a real slice image of the area to be detected according to the two-dimensional horizontal slice image includes:

[0023] Obtaining an initial height value of an initial slice image in a two-dimensional horizontal slice image;

[0024] According to the initial height value, each two-dimensional horizontal slice image is fitted to obtain the real slice image of the area to be detected.

[0025] In some embodiments, the measurement points are distributed in a dispersed manner in the area to be detected.

[0026] In a second aspect, the present invention further provides a nondestructive testing device, the device comprising:

[0027] A height determination module, used to determine the surface height of the area to be detected based on the image information of the object to be detected in the area to be detected;

[0028] An image reconstruction module, used to reconstruct two-dimensional horizontal slice images of the area to be detected at at least two different height positions according to the surface height of the area to be detected;

[0029] An image fitting module is used to fit a real slice image of the area to be detected based on the two-dimensional horizontal slice image;

[0030] The nondestructive testing module is used to perform nondestructive testing on the area to be tested of the object to be tested based on the real slice image.

[0031] In a third aspect, the present invention further provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the nondestructive testing method provided in the first aspect when executing the computer program.

[0032] In a fourth aspect, the present invention further provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the nondestructive testing method provided in the first aspect is implemented.

[0033] In a fifth aspect, the present invention further provides a computer program product, comprising a computer program, which, when executed by a processor, implements the nondestructive testing method provided in the first aspect.

[0034] The beneficial effects of the present invention are:

[0035] The scheme in the present application first determines the surface height of the area to be detected based on the image information of the object to be detected in the area to be detected; then, based on the surface height of the area to be detected, reconstructs a two-dimensional horizontal slice image of the area to be detected at at least two different height positions; then, based on the two-dimensional horizontal slice image, fits the real slice image of the area to be detected; finally, non-destructive testing is performed on the area to be detected of the object to be detected based on the real slice image. Compared with the method of directly using two-dimensional horizontal slice images for non-destructive testing in traditional technology, the present application significantly improves the detection accuracy by adding a fitting process. In traditional methods, when the surface of the object to be detected is tilted or bent, the collected two-dimensional horizontal slice image cannot truly reflect the actual slice condition of the object to be detected, resulting in a decrease in the accuracy of the detection result. However, the present application does not directly perform non-destructive testing based on the two-dimensional horizontal slice image, but first fits the two-dimensional horizontal slice image to the real slice image, and then performs non-destructive testing on the object to be detected based on the real slice image. Since the real slice image can more accurately reflect the real slice condition of the object to be detected, non-destructive testing based on this method can significantly improve the accuracy and reliability of non-destructive testing.

[0036] The above description is only an overview of the technical solution of the present invention. In order to more clearly understand the technical means of the present invention and implement it according to the contents of the specification, the following is a detailed description of the preferred embodiments of the present invention in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Figure 1 A schematic diagram of a flow chart of a nondestructive testing method according to an embodiment of the present invention;

[0038] Figure 2 A structural diagram of a system for determining the surface height of an area to be detected according to an embodiment of the present invention;

[0039] Figure 3 A schematic diagram of the position of a laser spot according to an embodiment of the present invention;

[0040] Figure 4 A schematic diagram of the structure of a device for acquiring a two-dimensional horizontal slice image using X-rays according to an embodiment of the present invention;

[0041] Figure 5 A schematic flow chart of another nondestructive testing method according to an embodiment of the present invention;

[0042] Figure 6 It is a structural schematic diagram of a nondestructive testing device shown in one embodiment of the present invention;

[0043] Figure 7 It is a structural schematic diagram of another nondestructive testing device shown in one embodiment of the present invention;

[0044] Figure 8 A schematic structural diagram of another nondestructive testing device according to an embodiment of the present invention;

[0045] Fig. 9 It is a structural schematic diagram of another nondestructive testing device shown in one embodiment of the present invention;

[0046] Fig.10 A schematic diagram of the structure of an electronic device provided in one embodiment of the present application. DETAILED DESCRIPTION

[0047] The technical solution of the present invention will be described clearly and completely below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0048] It should be noted that references to "one embodiment", "embodiment", "example embodiment", etc. in this specification refer to the embodiment being described which may include specific features, structures or characteristics, but not every embodiment must include these specific features, structures or characteristics. In addition, such expressions do not refer to the same embodiment. Furthermore, when describing specific features, structures or characteristics in conjunction with an embodiment, whether or not there is an explicit description, it is indicated that incorporating such features, structures or characteristics into other embodiments is within the knowledge of those skilled in the art.

[0049] In addition, the technical features involved in the different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0050] Figure 1 FIG. 1 is a flow chart of a nondestructive testing method according to an embodiment of the present invention. Figure 1 As shown, the non-destructive testing method includes:

[0051] S101, determining the surface height of the area to be detected according to image information of the object to be detected in the area to be detected.

[0052] Among them, the object to be inspected is an object that needs to be non-destructively tested, and the area to be inspected is a partial area on the object to be inspected. Since the object to be inspected may be bent, and the area to be inspected is a smaller area, even if the object to be inspected is bent, the area to be inspected will be relatively flat; the image information includes information such as the image of the area to be inspected, the camera angle, and the camera height.

[0053] Specifically, an image of the area to be detected captured by a camera, as well as the height and angle of the camera are obtained, and the surface height of the area to be detected is calculated based on the information.

[0054] Optionally, when calculating the surface height of the area to be inspected, it is also necessary to cut out the area to be inspected from the object to be inspected according to the requirements of non-destructive testing; obtain image information of the area to be inspected, and determine the surface height of the area to be inspected based on the image information of the area to be inspected.

[0055] Specifically, the nondestructive testing requirements of the operation and maintenance personnel are obtained, such as the location of the area to be inspected and the size of the area to be inspected, and according to the nondestructive testing requirements, the camera is controlled to collect image information of the area to be inspected, and then the surface height of the area to be inspected is determined according to the image information of the area to be inspected.

[0056] Optionally, the method for determining the surface height of the area to be detected may also be to obtain the measurement point position and measurement parameters of each measurement point in the image information of the detection area; calculate the height value of each measurement point position based on the measurement point position and the measurement parameters; and fit the surface height of the object to be detected based on the height value of each measurement point position.

[0057] Among them, each measuring point is distributed in a dispersed manner in the area to be detected.

[0058] Specifically, a plurality of measurement points separated from each other can be set in the area to be detected, and the height value of each measurement point can be determined according to the position of each measurement point in the area to be detected and the angle of the camera. Finally, the surface height of the object to be detected can be fitted according to a preset formula based on the height value of each measurement point.

[0059] For example, Figure 2 As shown, a system structure diagram for determining the surface height of the area to be detected is provided. In order to obtain the height value of each measuring point position, the height value of each measuring point position can be determined by a fully automatic laser height measurement system based on a single laser generator and a side-view optical camera. The point light source laser generator is installed at a specific height, and its point laser is emitted from top to bottom perpendicular to the area to be detected. The side-view optical camera that forms an angle of θ with the area to be detected is installed on the right side of the laser generator. In addition, the system is also equipped with a standard overhead downward optical camera (not shown in the above figure). In the initial calibration stage, it is first necessary to adjust the position and pixel size of the right side-view optical camera so that the image offset of the right camera and the overhead camera when collecting the image of the standard horizontal plane object is close to 0. Then, it is necessary to adjust the emission angle, position, etc. of the single laser generator so that when the laser generator irradiates the standard horizontal plane (the Z-axis height of this standard plane is 0 and it remains absolutely horizontal in the XY plane), the light spot generated by the laser is located in the center of the image generated by the right camera.

[0060] In the actual process, due to various factors (the placement height offset of the object to be detected, the distortion of the object to be detected, etc.), the Z-axis height of the plane of the object to be detected at different positions cannot be all 0, but some are high and some are low. In this way, the light spot irradiated by the laser generator at different positions will be offset on the X-axis in the image of the right optical camera. If the actual position is too low, the light spot will appear to the right of the center of the image. If the actual position is too high, the light spot will appear to the left of the center of the image. Figure 3 As shown, according to the offset d of the spot position and the angle θ between the laser and the area to be detected, the actual height z of the laser irradiation position can be calculated, and the formula is: z = f (d, θ). The height offset, distortion, etc. of the object to be detected may vary greatly in the actual process, but in a very small area to be detected, the surface of the object to be detected should be relatively flat, and a plane fitting formula can be used to calculate the height of each point in the area, so 3-4 laser height measurement points (i.e., measurement points) can be set, and each measurement point is distributed in a dispersed manner in the area to be detected. For example, the measurement points are relatively evenly distributed around the area to be detected, and the distance between them cannot be too close; the measurement points cannot be too close to the center of the area to be detected; the measurement points cannot be arranged in a straight line or near a straight line. Calculate the height of each laser height measurement point, and then for each detection area that needs to be reconstructed in three dimensions, calculate the height fitting formula of the plane in the area to be detected based on the position information of these laser height measurement points: Height (x, y) = a*x+b*y+c.

[0061] Among them, x, y are the coordinates of any point on the XY plane, Height(x, y) is the height value of the point, and coefficients a, b, c are fitting coefficients in the fitting formula. Each area to be inspected has its own unique coefficients a, b, c. Through this formula, the height value of any point on the plane of the object to be inspected can be accurately fitted based on the known measurement points, thereby meeting the accuracy requirements of non-destructive testing.

[0062] S102, reconstructing two-dimensional horizontal slice images of the area to be detected at at least two different height positions according to the surface height of the area to be detected.

[0063] Specifically, between the 0-height plane and the surface height, multiple 2D horizontal slice images at different height positions are reconstructed using X-rays, where the 0-height plane is a set reference plane, which can be Figure 2 The stage plane in .

[0064] Optionally, according to the surface height of the area to be detected, two-dimensional off-axis images of the area to be detected at different angles are collected; initial layer imaging processing is performed on all two-dimensional off-axis images to obtain two-dimensional horizontal slice images of the object to be detected at at least two different height positions.

[0065] For example, Figure 4 As shown, the X-ray flat-panel detector moves in the upper XY plane, the area to be detected moves in the lower XY plane, and the X-ray source moves up and down in the Z-axis direction perpendicular to the upper and lower XY planes. Among them, the upper and lower XY planes are parallel to each other, and the upper XY plane is above the lower XY plane. In a three-dimensional reconstructed off-axis image acquisition, the position of the X-ray source remains unchanged, and the flat-panel detector and the area to be detected move coaxially and synchronously in their respective horizontal planes. During the acquisition process, the emission center of the X-ray source, the receiving center of the flat-panel detector, and the center of the area to be detected are always kept in a straight line when moving, thereby completing the acquisition of two-dimensional off-axis images at different angles. After the acquisition is completed, the two-dimensional off-axis images acquired at different angles are synthesized into two-dimensional horizontal slice images of different heights using a tomographic imaging algorithm. Specifically, the tomographic imaging algorithm is based on the acquired two-dimensional off-axis images, and through the imaging algorithm, all two-dimensional off-axis images are reconstructed into two-dimensional horizontal slice images to ensure the accuracy and resolution of three-dimensional reconstruction.

[0066] S103, fitting a real slice image of the area to be detected according to the two-dimensional horizontal slice image.

[0067] Optionally, an initial height value of an initial slice image in the two-dimensional horizontal slice image may be obtained; and each two-dimensional horizontal slice image may be fitted according to the initial height value to obtain a real slice image of the area to be detected.

[0068] Specifically, if the two-dimensional horizontal slice image is not fitted, only theoretical horizontal slices can be obtained. Once the height of the plane of the area to be detected changes, tilts or flips, the theoretical horizontal slice will deviate from the actual position. By applying the height compensation fitting formula, a slice image that actually reflects the actual tilt situation can be generated. Therefore, according to the initial height value of the initial slice image in the two-dimensional horizontal slice image, the height compensation fitting formula is used to fit each two-dimensional horizontal slice image, and the real slice image of the area to be detected can be obtained.

[0069] S104: Perform nondestructive testing on the area to be inspected of the object to be inspected based on the real slice image.

[0070] Specifically, a normal slice image of the area to be detected in a normal state can be obtained, and feature comparison can be performed on the real slice image and the normal slice image to obtain the similarity between the real slice image and the normal slice image. If the similarity between the real slice image and the normal slice image is lower than a preset threshold, it is determined that there is a fault in the area to be detected.

[0071] In the above embodiment, the surface height of the area to be detected is first determined according to the image information of the object to be detected in the area to be detected; then, according to the surface height of the area to be detected, a two-dimensional horizontal slice image of the area to be detected at at least two different height positions is reconstructed; then, according to the two-dimensional horizontal slice image, a real slice image of the area to be detected is fitted; finally, based on the real slice image, non-destructive testing is performed on the area to be detected of the object to be detected. In the traditional technology, this is equivalent to directly performing non-destructive testing according to the two-dimensional horizontal slice image in the present application. When the object is tilted or bent, the two-dimensional horizontal slice image cannot reflect the real slice condition of the object to be detected. However, the present application does not directly perform non-destructive testing according to the two-dimensional horizontal slice image, but first fits the two-dimensional horizontal slice image to the real slice image, and then performs non-destructive testing on the object to be detected according to the real slice image. The real slice image can more accurately reflect the real slice condition of the object to be detected. Therefore, non-destructive testing based on this method significantly improves the accuracy of non-destructive testing.

[0072] In order to more comprehensively demonstrate the present solution, this embodiment provides an optional method of nondestructive testing, such as Figure 5 As shown:

[0073] S201, according to the requirements of non-destructive testing, cutting out a region to be tested from the object to be tested.

[0074] S202, obtaining image information of the area to be detected.

[0075] S203, obtaining the measurement point position and measurement parameters of each measurement point in the detection area image information.

[0076] Among them, each measuring point is distributed in a dispersed manner in the area to be detected.

[0077] S204, calculating the height value of each measuring point position according to the measuring point position and the measuring parameters.

[0078] S205, fitting the surface height of the object to be detected according to the height values ​​of the positions of the measuring points.

[0079] S206 , collecting two-dimensional off-axis images of the area to be detected at different angles according to the surface height of the area to be detected.

[0080] Specifically, the flat-panel detector and the object to be detected on the test platform can be controlled to move coaxially and synchronously in their respective planes to collect a two-dimensional off-axis image of the area to be detected in the object to be detected.

[0081] S207, performing initial layer imaging processing on all two-dimensional off-axis images to obtain two-dimensional horizontal slice images of the object to be detected at at least two different height positions.

[0082] S208, obtaining an initial height value of an initial slice image in the two-dimensional horizontal slice image.

[0083] S209, fitting each two-dimensional horizontal slice image according to the initial height value to obtain a real slice image of the area to be detected.

[0084] S210: Perform nondestructive testing on the area to be inspected of the object to be inspected based on the real slice image.

[0085] The specific process of the above S201-S210 can refer to the description of the above method embodiment, and its implementation principle and technical effect are similar, which will not be repeated here.

[0086] Based on the same inventive concept, the embodiment of the present application also provides a nondestructive testing device for implementing the nondestructive testing method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more nondestructive testing device embodiments provided below can refer to the limitations of the nondestructive testing method above, and will not be repeated here.

[0087] In one embodiment, Figure 6 As shown, a non-destructive testing device is provided, the device comprising:

[0088] A height determination module 30, for determining the surface height of the area to be detected based on the image information of the object to be detected in the area to be detected;

[0089] An image reconstruction module 31 is used to reconstruct a two-dimensional horizontal slice image of the area to be detected at at least two different height positions according to the surface height of the area to be detected;

[0090] An image fitting module 32 is used to fit a real slice image of the area to be detected based on the two-dimensional horizontal slice image;

[0091] The non-destructive testing module 33 is used to perform non-destructive testing on the area to be tested of the object to be tested based on the real slice image.

[0092] In another embodiment, Figure 7 As shown above Figure 6 The height determination module 30 in the embodiment comprises:

[0093] The region interception unit 300 is used to intercept the region to be inspected from the object to be inspected according to the requirements of non-destructive testing;

[0094] The height determination unit 301 is used to obtain image information of the area to be detected, and determine the surface height of the area to be detected according to the image information of the area to be detected.

[0095] In another embodiment, the above Figure 7 The height determination unit 301 in is specifically used for:

[0096] The measuring point position and measuring parameters of each measuring point in the image information of the detection area are obtained; the height value of each measuring point position is calculated according to the measuring point position and the measuring parameters; and the surface height of the object to be detected is fitted according to the height value of each measuring point position.

[0097] Among them, each measuring point is distributed in a dispersed manner in the area to be detected.

[0098] In another embodiment, Figure 8 As shown above Figure 6 The image reconstruction module 31 in the embodiment comprises:

[0099] An image acquisition unit 310 is used to acquire two-dimensional off-axis images of the area to be detected at different angles according to the surface height of the area to be detected;

[0100] The imaging processing unit 311 is used to perform initial layer imaging processing on all two-dimensional off-axis images to obtain two-dimensional horizontal slice images of the object to be detected at at least two different height positions.

[0101] In another embodiment, Fig. 9 As shown above Figure 6 The image fitting module 32 comprises:

[0102] A height acquisition unit 320 is used to acquire an initial height value of an initial slice image in a two-dimensional horizontal slice image;

[0103] The image fitting unit 321 is used to fit each two-dimensional horizontal slice image according to the initial height value to obtain a real slice image of the area to be detected.

[0104] The present application also provides an electronic device, in some implementations, referring to Fig.10 As shown, the electronic device 700 includes an input unit 710, a memory 720, a processor 730, and an output unit 740. The memory 720 stores program instructions that can be run on the processor 730, and the processor 730 calls the program instructions to execute the nondestructive testing method and / or technical solution based on the above-mentioned embodiment. The electronic device 700 can be a mobile terminal device such as a mobile phone, a computer, etc.

[0105] In addition, the embodiment of the present application further provides a computer-readable storage medium for storing a computer program for executing a nondestructive testing method. For example, a computer program instruction, when executed by a computer, can call or provide a method and / or technical solution according to the present application through the operation of the computer. The program instruction for calling the method of the present application may be stored in a fixed or removable storage medium, and / or transmitted through a data stream in a broadcast or other signal-bearing medium and / or stored in a storage medium that runs according to the program instruction.

[0106] Obviously, those skilled in the art should understand that the above modules or steps of the present application can be implemented by a general computing device, they can be concentrated on a single computing device, or distributed on a network composed of multiple computing devices, and optionally, they can be implemented by a program code executable by a computing device, so that they can be stored in a storage device and executed by the computing device, or they can be made into individual integrated circuit modules, or multiple modules or steps therein can be made into a single integrated circuit module for implementation. In this way, the present application is not limited to any specific combination of hardware and software.

[0107] The technical features of the above embodiments may be arbitrarily integrated. To make the description concise, not all possible integrations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the integration of these technical features, they should be considered to be within the scope of this specification.

[0108] The above embodiments only express several implementation methods of the present invention, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for those of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present invention, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention shall be subject to the attached claims.

Claims

1. A nondestructive testing method, characterized in that: The method comprises: Determining the surface height of the area to be detected based on the image information of the object to be detected in the area to be detected; Reconstructing two-dimensional horizontal slice images of the area to be detected at at least two different height positions according to the surface height of the area to be detected; Fitting a real slice image of the area to be detected according to the two-dimensional horizontal slice image; A non-destructive test is performed on the area to be tested of the object to be tested based on the real slice image.

2. The nondestructive testing method according to claim 1, characterized in that: Determining the surface height of the area to be detected based on image information of the object to be detected in the area to be detected, including: According to the requirements of non-destructive testing, cutting out the area to be tested from the object to be tested; Image information of the area to be detected is acquired, and the surface height of the area to be detected is determined according to the image information of the area to be detected.

3. The nondestructive testing method according to claim 2, characterized in that: Determining the surface height of the area to be detected according to the image information of the area to be detected includes: Acquire the measurement point position and measurement parameters of each measurement point in the image information of the detection area; Calculate the height value of each measuring point according to the measuring point position and the measuring parameters; The surface height of the object to be detected is fitted according to the height values ​​of the positions of the measuring points.

4. The nondestructive testing method according to claim 1, characterized in that: Reconstructing two-dimensional horizontal slice images of the area to be detected at at least two different height positions according to the surface height of the area to be detected, including: According to the surface height of the area to be detected, collecting two-dimensional off-axis images of the area to be detected at different angles; All two-dimensional off-axis images are subjected to initial layer imaging processing to obtain two-dimensional horizontal slice images of the object to be detected at at least two different height positions.

5. The nondestructive testing method according to claim 1, characterized in that: Fitting a real slice image of the area to be detected according to the two-dimensional horizontal slice image includes: Acquire an initial height value of an initial slice image in the two-dimensional horizontal slice image; According to the initial height value, each of the two-dimensional horizontal slice images is fitted to obtain a real slice image of the area to be detected.

6. The nondestructive testing method according to claim 3, characterized in that: The various measuring points are distributed in the area to be detected.

7. A nondestructive testing device, characterized in that: The device comprises: A height determination module, used to determine the surface height of the area to be detected based on the image information of the object to be detected in the area to be detected; An image reconstruction module, used for reconstructing two-dimensional horizontal slice images of the area to be detected at at least two different height positions according to the surface height of the area to be detected; An image fitting module, used for fitting a real slice image of the area to be detected according to the two-dimensional horizontal slice image; The nondestructive testing module is used to perform nondestructive testing on the area to be tested of the object to be tested based on the real slice image.

8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the nondestructive testing method according to any one of claims 1 to 6 is implemented.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the nondestructive testing method according to any one of claims 1 to 6 is implemented.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the nondestructive testing method according to any one of claims 1 to 6 is implemented.

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