Ghosting test and suppression method and system

Abstract

The invention discloses a ghosting test and suppression method and system, and the method comprises the steps: making a black-and-white grid image, making a black-and-white grid mirror image with the black-and-white grid image as a basic image, and obtaining the black-and-white grid image and the black-and-white grid mirror image; and alternately displaying the black-and-white grid image and the black-and-white grid mirror image at a refresh rate greater than a specified frequency of 200 HZ. The black-and-white grid images and the black-and-white grid mirror image images are alternately displayed at a refresh rate greater than 200HZ by adopting the black-and-white grid images and the black-and-white grid mirror image images, so that the images can be refreshed in a non-inductive manner, and the voltage of each pixel point can be more balanced; liquid crystal molecule orientation deviation or other physical property changes caused by long-time single voltage state are avoided, so that the residual of ghost shadows during testing and picture switching is effectively reduced.

Description

Technical Field

[0001] The present invention relates to the field of afterimage testing technology, and in particular to an afterimage testing and suppression method and system. Background Art

[0002] Display image retention (also known as "image persistence" or "screen burn-in") refers to the phenomenon where after the screen displays a fixed image for a long time, the outline of the previous image can still be vaguely seen when switching to new content. This phenomenon is common on OLED screens, but LCD screens may also have short-term image retention due to long-term static display. OLED pixels are self-luminous, and when high-contrast static images (such as navigation bars, icons, and black edges of videos) are displayed for a long time, some pixels may age due to excessive use, resulting in uneven brightness attenuation. LCD relies on the deflection of liquid crystal molecules to control light. Maintaining the same state for a long time may cause "fatigue" of the molecules, slowing down the recovery speed and forming short-term image retention.

[0003] In the production and quality inspection process of display screens, afterimage is an important consideration. When a display screen displays a specific pattern (such as a picture with black and white squares) for a long time and then switches to the next screen, afterimage often occurs, that is, part of the image of the previous screen remains in the subsequent screen. This not only affects the display quality of the display screen, but also reduces the user experience.

[0004] The traditional afterimage testing method only uses a single test pattern, such as lighting up the display screen with a specific black and white square interval pattern for a long time. Although this method can detect whether there is an afterimage problem on the display screen, it cannot effectively avoid or reduce the generation of afterimages during the test process. After the test, additional processing steps are often required to eliminate the afterimages generated during the test process, which increases production and testing costs and reduces production efficiency. Summary of the invention

[0005] In the prior art, during the afterimage test of a display screen, although it is possible to detect whether the display screen has an afterimage problem, it is impossible to effectively avoid or reduce the afterimages generated during the test process, and additional processing steps are required after the test to eliminate the afterimages generated during the test process, which increases production and testing costs and reduces production efficiency.

[0006] In view of the above problems, a method and system for image sticking test and suppression is proposed. By adopting black and white grid images and black and white grid mirror images and alternately displaying the black and white grid images and the black and white grid mirror images at a refresh rate greater than 200HZ, not only the image can be refreshed imperceptibly, but also the voltage of each pixel can be made more balanced, avoiding the directional displacement of liquid crystal molecules or other changes in physical properties due to being in a single voltage state for a long time, thereby effectively reducing the residual image sticking when testing and switching screens.

[0007] In a first aspect, a residual image testing and suppression method includes: Step 100, making a black and white checkered image, and making a black and white checkered mirror image based on the black and white checkered image, to obtain a black and white checkered image and a black and white checkered mirror image; Step 200: alternately display the black and white checkered image and the black and white checkered mirror image at a refresh rate greater than a specified frequency, wherein the specified frequency is 200 Hz.

[0008] In combination with the afterimage test and suppression method described in the first aspect of the present invention, in a first possible implementation manner, the afterimage test and suppression method further includes: Step 300, stop alternately displaying the black and white checkered image and the black and white checkered mirror image, and display a pure gray or gradient grayscale image; Step 400: Detect whether there is an afterimage in the black and white grid area of ​​the display screen.

[0009] In combination with the first possible implementation of the first aspect of the present invention, in a second possible implementation, step 400 includes: Step 410: Use a colorimeter to detect the color values ​​of the black grid area and the white grid area; Step 420: Compare the color value of the black grid area with the color value of the white grid area, and determine that there is an afterimage if the difference in the color values ​​is greater than a specified value.

[0010] In combination with the second possible implementation manner of the first aspect of the present invention, in a third possible implementation manner, step 100 includes: Step 110, using black and white grids to make black and white spacing rows, and using black and white grids to make black and white spacing columns; Step 120: Obtain the black and white checkered image according to the black and white alternate rows and the black and white alternate columns.

[0011] In combination with the third possible implementation manner of the first aspect of the present invention, in a fourth possible implementation manner, step 100 further includes: Step 130, obtaining the symmetry axis and center point of the black and white checkered image; Step 140: flip the black and white checkered image along the symmetry axis, or rotate it 90 degrees around the center point to obtain the black and white checkered mirror image.

[0012] In combination with the fourth possible implementation manner of the first aspect of the present invention, in a fifth possible implementation manner, step 200 includes: Step 210: refresh and display the black and white checkered image at a frequency greater than 100 Hz, and refresh and display the black and white checkered mirror image at a frequency greater than 100 Hz.

[0013] The second party, a residual image testing and suppression system, comprising: Test host; Display screen to be tested; The test host is in communication connection with the display screen to be tested; The test host is used to transmit the black and white checkered image and the black and white checkered mirror image to the display screen to be tested, and alternately display the black and white checkered image and the black and white checkered mirror image at a refresh rate greater than a specified frequency, wherein the specified frequency is 200HZ.

[0014] In conjunction with the afterimage testing and suppression system described in the second aspect of the present invention, in a first possible implementation manner, the afterimage testing and suppression system further includes: Colorimeter; The colorimeter is electrically connected to the test host and is used to detect whether there is an afterimage in the black and white grid area of ​​the display screen.

[0015] In combination with the first possible implementation manner of the second aspect of the present invention, in a second possible implementation manner, the colorimeter is used to detect the color values ​​of the black grid area and the white grid area, compare the color value of the black grid area with the color value of the white grid area, and determine the presence of afterimage if the difference between the color values ​​is greater than a specified value.

[0016] In combination with the second possible implementation manner of the second aspect of the present invention, in a third possible implementation manner, the test host refreshes and displays the black and white checkered image at a frequency greater than 100 Hz, and refreshes and displays the black and white checkered mirror image at a frequency greater than 100 Hz.

[0017] The implementation of the afterimage testing and suppression method and system described in the present invention, by using black and white grid images and black and white grid mirror images and alternately displaying the black and white grid images and the black and white grid mirror images at a refresh rate greater than 200 Hz, can not only refresh the image imperceptibly, but also make the voltage of each pixel more balanced, avoiding the directional shift of liquid crystal molecules or other physical property changes caused by being in a single voltage state for a long time, thereby effectively reducing the residual afterimage when testing and switching screens. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0019] Figure 1 It is a schematic diagram of a black and white checkered image in this application; Figure 2It is a schematic diagram of a black and white square mirror image in this application; Figure 3 It is a flowchart of a specific embodiment of a method for image sticking test and suppression; Figure 4 yes Figure 3 A schematic flow chart of a specific embodiment of step 100; Figure 5 yes Figure 4 A schematic flow chart of a specific embodiment after step 120; Figure 6 is a flowchart of another specific embodiment of an afterimage testing and suppression method; Figure 7 yes Figure 6 A schematic flow chart of a specific embodiment of step 400; Figure 8 It is a schematic diagram of the module structure of an afterimage testing and suppression system. DETAILED DESCRIPTION

[0020] The following will be combined with the accompanying drawings in the invention to clearly and completely describe the technical solutions in the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments in the present invention, other embodiments obtained by ordinary technicians in this field without creative work are all within the scope of protection of the present invention.

[0021] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.

[0022] It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it can be directly on the other element or indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element.

[0023] It should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0024] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of this application, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0025] In the prior art, during the afterimage test of a display screen, although it is possible to detect whether the display screen has an afterimage problem, it is impossible to effectively avoid or reduce the afterimages generated during the test process, and additional processing steps are required after the test to eliminate the afterimages generated during the test process, which increases production and testing costs and reduces production efficiency.

[0026] In view of the above problems, a method and system for image sticking test and suppression are proposed.

[0027] In the first aspect, a residual image testing and suppression method, such as Figure 3 , Figure 3 The present invention is a flowchart of a specific embodiment of a method for image sticking test and suppression; the flowchart includes: Step 100: Create a black and white checkered image, and create a black and white checkered mirror image based on the black and white checkered image to obtain a black and white checkered image and a black and white checkered mirror image.

[0028] In a preferred embodiment, if Figure 4 , Figure 4 yes Figure 3 A flowchart of a specific embodiment of step 100 is shown in FIG. 1 ; step 100 comprises: step 110, making black and white spaced rows with black and white grids, and making black and white spaced columns with black and white grids; step 120, obtaining a black and white checkered image according to the black and white spaced rows and the black and white spaced columns.

[0029] In a preferred embodiment, if Figure 5 , Figure 5 yes Figure 4 A schematic flow chart of a specific embodiment after step 120 in the figure; step 100 also includes: step 130, obtaining the symmetry axis and center point of the black and white checkered image; step 140, flipping the black and white checkered image along the symmetry axis, or rotating it 90 degrees around the center point, to obtain a black and white checkered mirror image, such as Figure 1 and Figure 2 , Figure 1 is a schematic diagram of a black and white checkered image in this application, Figure 2 It is a schematic diagram of the black and white square mirror image in this application;.

[0030] In the implementation mode of the present application, a test pattern is first produced, and a picture with black and white square intervals is used as a basic test pattern, and a mirror image of the test pattern is generated at the same time. The mirror image is generated by symmetrically flipping the black and white pixels of the basic test pattern based on the central symmetry axis of the image, ensuring that the mirror image and the original test pattern are in a mirror symmetric relationship in pixel distribution.

[0031] Step 200: alternately displaying a black and white checkered image and a black and white checkered mirror image at a refresh rate greater than a specified frequency, wherein the specified frequency is 200 Hz.

[0032] Preferably, step 200 includes: step 210, refreshing and displaying the black and white checkered image at a frequency greater than 100 Hz, and refreshing and displaying the black and white checkered mirror image at a frequency greater than 100 Hz.

[0033] When performing the afterimage test, the black and white checkered image is quickly refreshed at a refresh rate greater than 100HZ, which is unrecognizable to the human eye, and the afterimage test screen is displayed on the display. The visual persistence characteristics of the human eye are used to make it impossible for the human eye to detect the rapidly switching test pattern and mirror pattern. At the same time, the black and white checkered mirror image is refreshed on the display at a frequency greater than 100HZ through the test host, and the frequency of the alternating changes between the two is greater than 200HZ, so the human eye will not be able to detect the refresh changes.

[0034] Due to the symmetry of the pixel distribution between the black and white checkered image and the black and white checkered mirror image, each pixel on the display screen will not always remain in a specific voltage state during the rapid alternating display process. When the pixel in the test pattern is in a high voltage (corresponding to the white square) display state, the pixel at the corresponding position in the black and white checkered mirror image is in a low voltage (corresponding to the black square) display state, and vice versa. This alternating change allows the voltage of the pixel to be dynamically balanced during the test process, avoiding the directional shift of the liquid crystal molecules or other changes in physical properties caused by being in a single voltage state for a long time, thereby effectively reducing the residual afterimage when switching the screen.

[0035] In this embodiment, the afterimage test is combined with the afterimage elimination, and the afterimage is effectively suppressed while the test is being performed, thus avoiding the additional step of processing the afterimage after the test in the traditional test method, and greatly improving the production efficiency.

[0036] By maintaining a dynamic balance of pixel voltage during the test process, potential damage to the display screen caused by the test process is reduced, which helps to improve the overall quality and stability of the display screen and extend the service life of the display screen. The afterimage test in this embodiment reduces the additional afterimage elimination process, reduces manpower, material and time costs, and improves the economic benefits of the production enterprise. By using black and white grid images and black and white grid mirror images and alternating black and white square images and black and white square mirror images at a refresh rate greater than 200HZ, not only can the image be refreshed imperceptibly, but also the voltage of each pixel can be made more balanced, avoiding the directional displacement of liquid crystal molecules or other physical property changes caused by being in a single voltage state for a long time, thereby effectively reducing the residual afterimage when testing and switching screens.

[0037] In a preferred embodiment, if Figure 6 , Figure 6 The present invention is a flowchart of another specific embodiment of the afterimage test and suppression method; the afterimage test and suppression method further includes: step 300, stopping the alternating display of the black and white checkered image and the black and white checkered mirror image, and displaying a pure gray or gradient grayscale image; step 400, detecting whether there is afterimage in the black and white checkered area of ​​the display screen. In a preferred embodiment, if Figure 7 , Figure 7 yes Figure 6 A flow chart of a specific embodiment of step 400 in the embodiment; step 400 includes: step 410, using a colorimeter to detect the color values ​​of the black grid area and the white grid area; step 420, comparing the color value of the black grid area with the color value of the white grid area, and judging that there is a residual image when the difference in color value is greater than a specified value. When the difference in color value is greater than 3, it means that the chromaticity difference between the two is large, and it is judged that there is a residual image.

[0038] Second, an afterimage testing and suppression system 500, such as Figure 8 , Figure 8 The module structure diagram of the afterimage test and suppression system includes a test host 510 and a display screen 520 to be tested; the test host 510 is connected to the display screen 520 for communication; the test host 510 is used to transmit a black and white checkered image and a black and white checkered mirror image to the display screen 520 to be tested, and alternately display the black and white checkered image and the black and white checkered mirror image at a refresh rate greater than a specified frequency, wherein the specified frequency is 200HZ.

[0039] Furthermore, the afterimage testing and suppression system also includes a colorimeter 530 ; the colorimeter 530 is electrically connected to the test host 510 to detect whether there is afterimage in the black and white grid area of ​​the display screen 520 to be tested.

[0040] Furthermore, the colorimeter 530 is used to detect the color values ​​of the black grid area and the white grid area, compare the color value of the black grid area with the color value of the white grid area, and determine the presence of residual image when the difference in color value is greater than a specified value.

[0041] Furthermore, the test host 510 refreshes and displays the black and white checkered image at a frequency greater than 100 Hz, and refreshes and displays the black and white checkered mirror image at a frequency greater than 100 Hz.

[0042] A method and system for testing and suppressing afterimages of the present invention is implemented. By adopting black and white checkered images and black and white checkered mirror images and displaying the black and white checkered images and the black and white checkered mirror images alternately at a refresh rate greater than 200 Hz, not only can the image be refreshed imperceptibly, but also the voltage of each pixel point can be made more balanced, avoiding the directional shift of liquid crystal molecules or other changes in physical properties due to being in a single voltage state for a long time, thereby effectively reducing the residual afterimages when testing and switching screens.

[0043] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A method for testing and suppressing residual images, characterized in that: include: Step 100, making a black and white checkered image, and making a black and white checkered mirror image based on the black and white checkered image, to obtain a black and white checkered image and a black and white checkered mirror image; Step 200: alternately display the black and white checkered image and the black and white checkered mirror image at a refresh rate greater than a specified frequency, wherein the specified frequency is 200 Hz.

2. The afterimage testing and suppression method according to claim 1, characterized in that: The afterimage testing and suppression method also includes: Step 300, stop alternately displaying the black and white checkered image and the black and white checkered mirror image, and display a pure gray or gradient grayscale image; Step 400: Detect whether there is an afterimage in the black and white grid area of ​​the display screen.

3. The afterimage testing and suppression method according to claim 2, characterized in that: The step 400 includes: Step 410: Use a colorimeter to detect the color values ​​of the black grid area and the white grid area; Step 420: Compare the color value of the black grid area with the color value of the white grid area, and determine that there is an afterimage if the difference in the color values ​​is greater than a specified value.

4. The afterimage testing and suppression method according to claim 3, characterized in that: The step 100 comprises: Step 110, using black and white grids to make black and white spacing rows, and using black and white grids to make black and white spacing columns; Step 120: Obtain the black and white checkered image according to the black and white alternate rows and the black and white alternate columns.

5. The afterimage testing and suppression method according to claim 4, characterized in that: The step 100 further includes: Step 130, obtaining the symmetry axis and center point of the black and white checkered image; Step 140: flip the black and white checkered image along the symmetry axis, or rotate it 90 degrees around the center point to obtain the black and white checkered mirror image.

6. The afterimage testing and suppression method according to claim 5, characterized in that: The step 200 comprises: Step 210: refresh and display the black and white checkered image at a frequency greater than 100 Hz, and refresh and display the black and white checkered mirror image at a frequency greater than 100 Hz.

7. An afterimage testing and suppression system, using the afterimage testing and suppression method according to any one of claims 1 to 6, characterized in that: include: Test host; Display screen to be tested; The test host is in communication connection with the display screen to be tested; The test host is used to transmit the black and white checkered image and the black and white checkered mirror image to the display screen to be tested, and alternately display the black and white checkered image and the black and white checkered mirror image at a refresh rate greater than a specified frequency, wherein the specified frequency is 200HZ.

8. The afterimage testing and suppression system according to claim 7, characterized in that: The afterimage testing and suppression system further comprises: Colorimeter; The colorimeter is electrically connected to the test host and is used to detect whether there is an afterimage in the black and white grid area of ​​the display screen.

9. The afterimage testing and suppression system according to claim 8, characterized in that: The colorimeter is used to detect the color values ​​of the black grid area and the white grid area, compare the color value of the black grid area with the color value of the white grid area, and determine the presence of residual image when the difference between the color values ​​is greater than a specified value.

10. The afterimage testing and suppression system according to claim 9, characterized in that: The test host refreshes and displays the black and white checkered image at a frequency greater than 100 Hz, and refreshes and displays the black and white checkered mirror image at a frequency greater than 100 Hz.

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