Server product test system and server product test processing method

Abstract

The invention provides a server product test system and a server product test system, and the server product test system comprises a test frame which comprises a frame body, a plurality of support plates and a plurality of bar code display modules, the plurality of support plates are arranged along the height direction of the frame body, and each support plate is movably connected with the frame body; the plurality of bar code display modules are arranged corresponding to the plurality of supporting plates, and each bar code display module displays the test state of a product placed on the corresponding supporting plate; the MES server is used for associating the basic information of the product, and the basic information of the product comprises a product code; the DIAG server is used for associating product test information, and the DIAG server comprises a test process database and a historical test process database; and the twin server is connected with the MES server and the DIAG server, and the twin server forms a product test time prediction module according to the test process database and the historical test process database. According to the invention, the problem of inaccurate test time prediction of server products in the prior art is solved.

Description

Technical Field

[0001] The present invention relates to the field of automatic control, and in particular to a server product testing system and a server product testing processing method. Background Art

[0002] At present, server product manufacturing is facing the impact of customer customization with multiple varieties and different batches. Its product performance testing takes a long time, the testing process is not fixed, the testing environment is changeable and the testing locations are dense. This is the biggest production capacity bottleneck that needs to be solved in the entire industry.

[0003] In the existing technology, traditional prediction methods can only perform simple time average estimation based on the model, and lack the evaluation of influencing factors in more dimensions, which leads to inaccurate test time prediction for server products and causes the test server to face greater data pressure. Summary of the invention

[0004] The main purpose of the present invention is to provide a server product testing system and a server product testing processing method to solve the problem in the prior art that the test time prediction for the server product is inaccurate and thus increases the test pressure on the test server.

[0005] In order to achieve the above-mentioned purpose, according to one aspect of the present invention, a server product testing system is provided, including: a test frame, including a frame, a plurality of support plates and a plurality of barcode display modules, the plurality of support plates are arranged at intervals along the height direction of the frame, and each support plate is movably connected to the frame; a plurality of barcode display modules are arranged in a one-to-one correspondence with the plurality of support plates, and each barcode display module is used to display the test status of the product placed on the support plate corresponding thereto; an MES server, used to associate basic product information, the basic product information includes a product code; a DIAG server, used to associate product test information, the DIAG server includes a test process database and a historical test process database; a twin server, which is communicatively connected to both the MES server and the DIAG server, and the twin server forms a product test time prediction module based on the test process database and the historical test process database.

[0006] Furthermore, the twin server includes an interactive management and control module for loading and unloading, and the server product testing system also includes: an interactive device, including a terminal for reading the product code, the terminal transmits the product code to the interactive management and control module for loading and unloading, the interactive management and control module calls the test process database and the product test time prediction module corresponding to the product code according to the product code, and combines the product height to obtain the product loading range.

[0007] Further, the interaction device further includes AR glasses that are paired with the terminal, which obtains the distance between the terminal and the product shelving range to determine the product shelving position and generates a guiding path, and the AR glasses guide the user to shelve the product to the shelving position according to the guiding path.

[0008] Further, the twin server includes a retest pass rate determination module, and the server product test system further includes a power distributor and a gateway disposed on the rack body. The power distributor supplies power to the product, and the gateway is used to provide network services during the test process; wherein, when the product test fails, the retest pass rate determination module combines fault analysis to test the failure reason.

[0009] According to another aspect of the present invention, there is provided a server product test processing method, which is applicable to the above-mentioned server product test system; the server product test processing method includes a test method, and the test method includes: Step S11: Obtain the product code of the product located at the quality inspection station, and the MES server transmits the product information corresponding to the product code to the twin server to start the product test time prediction module of the twin server; Step S12: The product test time prediction module calls the test process database corresponding to the product code and the historical test process database of the historical product from the DIAG server, so as to obtain the first time complexity T s (n) of the total code running according to the test process database, screen out the preset data information in the historical products whose similarity to the product information, test process and test code of this product is greater than or equal to 95%, and obtain the second time complexity T l (n) of the preset data information; Step S13: Screen out the historical data information that satisfies 0.95T l (n) ≤ T s (n) ≤ 1.05T l (n) and has no test failure process to obtain the final predicted time T i = (2 * t 实 - t 预 / n) + IF{n < 100, O(i + 1, i), [0]}, T i is associated with the product code; wherein, i is the number of predictions and is a natural number, n is the number of historical data samples in the historical data information; O(i + 1, i) is the deviation value between the previous predicted test time and the actual test time, and the initial predicted test time is 0; when the number of product samples is less than 100, O(i + 1, i) is valid; t 实 is the total actual test time, and t 预 is the predicted test time.

[0010] Further, the server product test processing method further includes a product shelving method, and the product shelving method includes: Step S21: Scan the product code through the terminal to call the product information corresponding to the product in the MES server, transmit the product information to the twin server to start the warehousing and outbound interaction control module of the twin server, and obtain the final predicted time T obtained in Step S13 according to the product code. i ; Step S22: Obtain the product height according to the product information, and combine with the warehousing and outbound interaction control module to call the test process database corresponding to the product code in the DIAG server according to the product code to obtain the preliminary selected shelving position; Step S23: Determine whether there is a product being tested at the preliminary selected shelving position. If there is a product being tested at the preliminary selected shelving position, obtain the variance of the remaining test time of the shelved product and the predicted time of this product, and select the test rack position with the smallest variance as the final shelving position.

[0011] Further, the product shelving method further includes Step S24 after Step S23 and Step S25 after Step S24: Step S24: Determine the coordinate value of the final shelving position and the coordinate value of the position where the terminal is located, and plan the warehousing path of the product. The AR glasses guide the terminal to move to the final shelving position according to the warehousing path, and the terminal scans the barcode display module at the final shelving position; Step S25: Start the test and control the barcode display module to display a yellow light. The DIAG server reads the test IP and test status, and transmits the test IP and test status to the twin server for binding with the product code.

[0012] Further, in Step S25, if the product test fails, call the retest pass rate determination module of the twin server. The determination method of the retest pass rate determination module includes: Step S31: Determine whether the product is damaged. If the product is damaged, control the barcode display module to display a red light; Step S32: If the product is not damaged, determine whether the power distributor has had a power outage, whether the gateway has had a network disconnection, or network fluctuations; if there has been a power outage and / or network disconnection or network fluctuations, retest and control the barcode display module to display a blue light; Step S33: If there has been no power outage, no network disconnection, or network fluctuations, obtain the number of test times of the product. If the number of test times is less than 100 times, retest and control the barcode display module to display a blue light; if the number of test times is greater than or equal to 100 times, screen out the retest pass data in the historical products whose similarity to the product information, test process, and test code of this product is greater than or equal to 95% according to the product code. If the retest pass data is greater than or equal to 90%, retest and control the barcode display module to display a blue light; if the retest pass data is less than 90%, control the barcode display module to display a red light.

[0013] Furthermore, the server product testing processing method further includes a product delisting method, and the product delisting method includes: Step S41: Obtain the product testing status. If the product has completed testing, start the up-and-down listing interaction control module of the twin server; Step S42: The up-and-down listing interaction control module plans the delisting path of the product according to the final listing position of the product; Step S43; The AR glasses drive the user to move to the final listing position according to the delisting path to perform the delisting action on the product.

[0014] Furthermore, the interaction device of the server product testing system further includes a processor. The terminal is communicatively connected to the AR glasses through the processor. The product delisting method further includes Step S40 located between Step S42 and Step S43: Obtain the number β of terminals to allocate delisting tasks according to the number of terminals. After receiving the delisting task, each terminal sends a delisting signal to the processor, and after receiving the delisting signal, the processor sends the delisting path to the AR glasses.

[0015] Furthermore, in Step S40, when the ratio of the number β of terminals to the number γx of areas to be delisted is greater than or equal to 2, each terminal is reminded once every 0.5h. If the terminal fails to process more than a times, it is determined that the terminal operation is missed; 3 ≤ a ≤ 5; when the ratio of the number β of terminals to the number γx of areas to be delisted is less than 2, each terminal is reminded once every 0.75h. If the terminal fails to process more than b times, it is determined that the terminal operation is missed; 4 ≤ b ≤ 6.

[0016] Applying the technical solution of the present invention, the server product testing system includes a test rack, an MES server, a DIAG server, and a twin server. The test rack includes a rack body, a plurality of support plates, and a plurality of bar code display modules. The plurality of support plates are arranged at intervals along the height direction of the rack body, and each support plate is movably connected to the rack body; the plurality of bar code display modules are arranged in one-to-one correspondence with the plurality of support plates, and each bar code display module is used to display the testing status of the product placed on the support plate corresponding to it. The MES server is used to associate product basic information, and the product basic information includes a product code. The DIAG server is used to associate product testing information, and the DIAG server includes a test process database and a historical test process database. The twin server is communicatively connected to both the MES server and the DIAG server. The twin server forms a product testing time prediction module according to the test process database and the historical test process database. In this way, by connecting product basic information, testing process and status information, testing environment monitoring information, etc., a twin server is constructed and a product testing time prediction module is provided to improve operation efficiency in an intelligent drive and human-computer interaction manner, and solve the problem in the prior art that the testing time prediction of server products is inaccurate, increasing the testing pressure on the testing server. Description of the Drawings

[0017] The accompanying drawings forming a part of this application are used to provide a further understanding of the present invention. The schematic embodiments and descriptions thereof of the present invention are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0018] Figure 1 A three-dimensional structural schematic diagram of a test rack of a server product test system provided according to an embodiment of the present invention is shown;

[0019] Figure 2 A three-dimensional structural schematic diagram of an interaction device of a server product test system provided according to an embodiment of the present invention is shown;

[0020] Figure 3 A test time prediction flowchart of a server product test processing method provided according to an embodiment of the present invention is shown;

[0021] Figure 4 A product shelving flowchart of a server product test processing method provided according to an embodiment of the present invention is shown;

[0022] Figure 5 A product retest pass rate determination flowchart of a server product test processing method provided according to an embodiment of the present invention is shown;

[0023] Figure 6 A product removal flowchart of a server product test processing method provided according to an embodiment of the present invention is shown.

[0024] Among them, the above-mentioned drawings include the following reference numerals:

[0025] 10, test rack; 11, rack body; 12, support plate; 13, bar code display module; 14, cable rack;

[0026] 20, power distributor;

[0027] 30, interaction device; 31, terminal; 32, AR glasses; 33, processor. Detailed implementation manners

[0028] It should be noted that, without conflict, the embodiments in this application and the features in the embodiments may be combined with each other. The present invention will be described in detail below with reference to the drawings and in conjunction with the embodiments.

[0029] It should be pointed out that unless otherwise specified, all technical and scientific terms used in this application have the same meaning as commonly understood by those of ordinary skill in the technical field to which this application belongs.

[0030] In the present invention, unless otherwise specified, the orientation terms such as "upper" and "lower" generally refer to the directions shown in the drawings, or to the vertical, perpendicular or gravitational directions; similarly, for the convenience of understanding and description, "left" and "right" generally refer to the left and right shown in the drawings; "inner" and "outer" refer to the inner and outer of the contour of each component itself, but the above orientation terms are not used to limit the present invention.

[0031] In order to solve the problems of low heat dissipation efficiency of electronic devices and inability to adapt to packaging integration in narrow spaces in the prior art, the present application provides a server product test system and a server product test processing method.

[0032] As Figure 1 and Figure 2 As shown, the server product test system includes a test rack, an MES server, a DIAG server, and a twin server. The test rack 10 includes a rack body 11, a plurality of support plates 12, and a plurality of barcode display modules 13. The plurality of support plates 12 are arranged at intervals along the height direction of the rack body 11, and each support plate 12 is movably connected to the rack body 11; the plurality of barcode display modules 13 are arranged in one-to-one correspondence with the plurality of support plates 12, and each barcode display module 13 is used to display the test status of the product placed on the support plate 12 corresponding to it. The MES server is used to associate product basic information, and the product basic information includes a product code. The DIAG server is used to associate product test information, and the DIAG server includes a test process database and a historical test process database. The twin server is communicatively connected to both the MES server and the DIAG server, and the twin server forms a product test time prediction module according to the test process database and the historical test process database.

[0033] Applying the technical solution of this embodiment, by integrating product basic information, test process and status information, test environment monitoring information, etc., constructing a twin server and providing a product test time prediction module, it realizes improving the operation efficiency in an intelligent drive and human-computer interaction manner, and solves the problem of inaccurate prediction of the test time of server products in the prior art, which increases the test pressure on the test server.

[0034] As Figure 1 As shown, the test rack 10 further includes a cable rack 14 provided on the rack body 11, and the cable rack 14 is used for storing and organizing cables.

[0035] In this embodiment, the server product test system not only realizes accurate prediction of the test time, but also greatly improves the flexibility and efficiency of the test by real-time monitoring the position and status of the products on the test rack 10, can quickly respond to production requirements, dynamically adjust the test resource allocation, ensure that the test time of each product is optimized, and at the same time reduce human errors and improve the overall test quality.

[0036] like Figure 2 As shown, the twin server includes an on-shelf interactive control module, and the server product testing system also includes an interactive device 30. The interactive device 30 includes a terminal 31 for reading the product code. The terminal 31 transmits the product code to the on-shelf interactive control module. The on-shelf interactive control module calls the test process database and the product test time prediction module corresponding to the product code according to the product code, and combines the product height to obtain the product shelf range. In this way, the above-mentioned precise calculation of the shelf range can effectively avoid the failure of the shelf due to the mismatch of product size, improve the flexibility and efficiency of the production line, so that the test frame 10 can be suitable for processing the testing of server products of various sizes.

[0037] In this embodiment, the above-mentioned setting of the interactive device 30 enables the system to automatically identify and calculate the optimal shelf range according to the product code, effectively avoiding shelf failure caused by product size mismatch, and significantly reducing the downtime of the production line. At the same time, the above-mentioned setting can improve the utilization rate of the test rack 10, reduce the burden on operators, and ensure the continuity and efficiency of the test process.

[0038] like Figure 2 As shown, the interactive device 30 also includes AR glasses 32 that are matched with the terminal 31. The distance between the terminal 31 and the product shelf range is obtained to determine the product shelf position and generate a guide path. The AR glasses 32 guide the user to put the product on the shelf to the shelf position according to the guide path. In this way, the above-mentioned setting of the AR glasses 32 not only simplifies the shelf process and reduces the difficulty of operation, but also can display product information and test status in real time, improve the work efficiency and experience of operators, and is suitable for test environments that require frequent product shelf and delisting operations.

[0039] In this embodiment, AR glasses 32 as part of the interactive device 30, its dynamic guidance function greatly simplifies the operation process of product placement and removal, and reduces the learning cost and work pressure of operators. By displaying product information and test status in real time, operators can understand the work progress more intuitively, improve work efficiency, reduce error rate, and ensure the smooth progress of the test process.

[0040] In this embodiment, the twin server includes a retest pass rate determination module, and the server product testing system also includes a power distributor 20 and a gateway arranged on the frame 11, the power distributor 20 supplies power to the product, and the gateway is used to provide network services during the test process; wherein, when the product test fails, the retest pass rate determination module combines the fault analysis to determine the cause of the test failure. In this way, the above-mentioned setting of the retest pass rate determination module enables the system to quickly locate the cause of the test failure, reduce invalid retests, and improve the stability and reliability of the test.

[0041] In this embodiment, the implementation of the retest pass rate determination module enables the test system to intelligently analyze the reasons for test failures. Through fault analysis, it can quickly determine whether it is a hardware fault, a power problem, a network interruption, or a software error, thereby providing targeted retest suggestions and avoiding unnecessary resource waste.

[0042] As Figures 3 to 6 shown, the present application also provides a method for testing and processing server products, which is applicable to the above-mentioned server product test system; the method for testing and processing server products includes a test method, and the test method includes:

[0043] Step S11: Obtain the product code of the product located at the quality inspection station, and the MES server transmits the product information corresponding to the product code to the twin server to start the product test time prediction module of the twin server;

[0044] Step S12: The product test time prediction module calls the test process database corresponding to the product code and the historical test process database of historical products from the DIAG server to obtain the first time complexity T s (n) of the total code running according to the test process database, screen out the preset data information with a similarity greater than or equal to 95% to the product information, test process, and test code of the product in the historical products, and obtain the second time complexity T I (n);

[0045] Step S13: Screen out the historical data information that satisfies 0.95T l (n) ≤ T s (n) ≤ 1.05T l (n) and has no test failure process to obtain the final predicted time T i = (2 * t 实 - t 预 / n) + IF{n < 100, O(i + 1, i), [0]}, T i is associated with the product code; where i is the number of predictions and is a natural number, n is the number of historical data samples in the historical data information; O(i + 1, i) is the deviation value between the previous predicted test time and the actual test time, and the initial predicted test time is 0; when the number of product samples is less than 100, O(i + 1, i) is valid; t 实 is the total actual test time, t 预 is the predicted test time.

[0046] Specifically, this method can accurately predict the test time, optimize the test resource allocation, and is applicable to high-density test environments that require refined management of test time, such as batch testing of data center servers.

[0047] In this embodiment, the server product testing processing method further includes a product shelving method, and the product shelving method includes:

[0048] Step S21: Scan the product code through the terminal to call the product information corresponding to the product in the MES server, transmit the product information to the twin server to start the warehousing and out - warehousing interaction control module of the twin server, and obtain the final predicted time T obtained in step S13 according to the product code. i ;

[0049] Step S22: Obtain the product height according to the product information, and combine with the warehousing and out - warehousing interaction control module to call the test process database corresponding to the product code in the DIAG server according to the product code to obtain the preliminary selected shelving position.

[0050] Step S23: Determine whether there is a product being tested at the preliminary selected shelving position. If there is a product being tested at the preliminary selected shelving position, obtain the variance of the remaining test time of the shelved product and the predicted time of this product, and select the test rack position with the smallest variance as the final shelving position.

[0051] Specifically, by implementing the above - mentioned testing method, precise management of the test time can be achieved, thereby optimizing resource allocation, significantly improving the test efficiency, reducing the test waiting time, and enhancing the utilization rate of test resources.

[0052] In this embodiment, the product shelving method further includes step S24 after step S23 and step S25 after step S24:

[0053] Step S24: Determine the coordinate values of the final shelving position and the coordinate values of the position where the terminal is located, and plan the product shelving path. The AR glasses guide the terminal to move to the final shelving position according to the shelving path, and the terminal scans the barcode display module at the final shelving position.

[0054] Step S25: Start the test and control the barcode display module to display a yellow light. The DIAG server reads the test IP and test status, and transmits the test IP and test status to the twin server for binding with the product code.

[0055] Specifically, through the guidance of the AR glasses and the status display of the barcode display module, the operator can grasp the progress and status of the product test in real time, effectively reducing human operation errors and improving the accuracy and efficiency of the test. At the same time, by monitoring the test status in real time, test anomalies can be detected and processed in a timely manner to ensure the smooth progress of the test work.

[0056] In this embodiment, in step S25, if the product test fails, the retest pass rate determination module of the twin server is called, and the determination method of the retest pass rate determination module includes:

[0057] Step S31: determine whether the product is damaged. If the product is damaged, control the barcode display module to display a red light;

[0058] Step S32: If the product is not damaged, determine whether the power distributor has experienced a power outage, whether the gateway has experienced a network disconnection or network fluctuation; if a power outage and / or network disconnection or network fluctuation has occurred, retest and control the barcode display module to display a blue light;

[0059] Step S33: If there has been no power outage, network disconnection or network fluctuation, the number of product tests is obtained. If the number of tests is less than 100 times, the product is retested and the barcode display module is controlled to display a blue light. If the number of tests is greater than or equal to 100 times, the historical products are screened according to the product code, and the retest passing data whose product information, test process and test code are more than or equal to 95% similar to the product are selected. If the retest passing data is greater than or equal to 90%, the product is retested and the barcode display module is controlled to display a blue light. If the retest passing data is less than 90%, the barcode display module is controlled to display a red light.

[0060] Specifically, the determination method based on the retest pass rate can intelligently identify the cause of test failure, distinguish hardware failures from software problems, avoid invalid retests, and significantly improve test efficiency. In server product testing scenarios that require rapid response to test failures, this method can ensure the rational use of test resources, reduce test delays, and improve the flexibility and adaptability of the production line.

[0061] In this embodiment, the server product test processing method further includes a product delisting method, and the product delisting method includes:

[0062] Step S41: Get the product test status. If the product has completed the test, start the interactive management and control module of the twin server;

[0063] Step S42: The on-shelf and off-shelf interactive control module plans the product's off-shelf path according to the final on-shelf location of the product;

[0064] Step S43: The AR glasses drive the user to move to the final shelf position according to the unloading path to remove the product.

[0065] Specifically, the automated process of the product removal method not only greatly reduces the physical burden on operators, but also ensures the timeliness and accuracy of product removal through precise path planning and the guidance of AR glasses, improving the turnover speed of tested products. In high-efficiency testing centers, such as the production line of server products that quickly respond to market demands, this method can effectively shorten the time from product testing to warehousing, accelerate product circulation, and enhance the market competitiveness of enterprises. At the same time, through automated removal, human errors are reduced, and the operational efficiency of the testing center and customer satisfaction are improved.

[0066] In this embodiment, the interaction device 30 further includes a processor 33. The terminal is communicatively connected to the AR glasses through the processor 33. The product removal method further includes step S40 located between step S42 and step S43:

[0067] Obtain the number β of terminals to allocate removal tasks according to the number of terminals. After each terminal receives the removal task, it sends a removal signal to the processor, and the processor sends a removal path to the AR glasses after receiving the removal signal.

[0068] Specifically, the intelligent allocation of removal tasks by the processor can dynamically adjust task allocation according to the number of terminals and the workload, ensuring the balanced operation of each terminal, improving the removal efficiency and the operational capacity of the testing center. Furthermore, it can effectively manage the removal process of tested products, avoid the problem of accumulation of tested products in a certain area, ensure the continuity and high efficiency of the testing work, reduce the waiting time of operators, and improve the overall testing efficiency and customer service level.

[0069] In this embodiment, in step S40,

[0070] When the ratio of the number β of terminals to the number γx of areas to be removed and processed is greater than or equal to 2, each terminal is reminded once every 0.5 h. If the terminal fails to process more than a times, it is determined that the terminal operation is missed; 3 ≤ a ≤ 5;

[0071] When the ratio of the number β of terminals to the number γx of areas to be removed and processed is less than 2, each terminal is reminded once every 0.75 h. If the terminal fails to process more than b times, it is determined that the terminal operation is missed; 4 ≤ b ≤ 6.

[0072] Specifically, through the setting of periodic reminders and the number of missed operations, the dynamic reminder mechanism effectively monitors the working status of the operation terminal, ensures the timely removal of tested products from the shelves, and avoids test delays caused by operation omissions. In the test environment of server products that requires real-time monitoring of the working status of the operation terminal, this method can keep track of the test progress in real time, quickly respond to changes in test requirements, and improve the operation efficiency and response speed of the test center. Through precise reminders and job management, it reduces ineffective waiting and increases the turnover rate of tested products, providing strong technical support for the efficient production and maintenance of server products.

[0073] In this embodiment, the server product test system and processing method, through the combination of digital twin technology and AR glasses, achieve intelligent, automated, and refined management of the test process, effectively improving the test efficiency and accuracy, reducing the test cost, and providing strong technical support for the rapid and accurate testing of large-scale server products. In practical applications, the flexibility and efficiency of this system and method have been fully verified. It not only performs excellently in the automated testing of server production lines, improving production efficiency and product quality, but also in the equipment maintenance testing of data centers. Through intelligent analysis and rapid response, it shortens the maintenance cycle, ensures data security and business continuity. In the quality control testing of server products, precise time prediction and process optimization improve the test coverage and effectiveness, ensuring the high performance and stability of the products. In addition, through the dynamic reminder mechanism and real-time monitoring of the terminal operation status, it further improves the operation efficiency of the test center and is applicable to all scenarios that require high-efficiency and high-precision server product testing.

[0074] From the above description, it can be seen that the above embodiments of the present invention achieve the following technical effects:

[0075] The server product testing system includes a testing rack, an MES server, a DIAG server, and a twin server. The testing rack includes a rack body, a plurality of support plates, and a plurality of bar code display modules. The plurality of support plates are spaced apart along the height direction of the rack body, and each support plate is movably connected to the rack body; the plurality of bar code display modules are provided in one-to-one correspondence with the plurality of support plates, and each bar code display module is used to display the testing status of the product placed on the support plate corresponding to it. The MES server is used to associate the basic product information, and the basic product information includes the product code. The DIAG server is used to associate the product testing information, and the DIAG server includes a testing process database and a historical testing process database. The twin server is communicatively connected to both the MES server and the DIAG server, and the twin server forms a product testing time prediction module based on the testing process database and the historical testing process database. In this way, by integrating the basic product information, testing process and status information, testing environment monitoring information, etc., constructing a twin server and providing a product testing time prediction module, the operation efficiency is improved in an intelligent-driven and human-computer interaction manner, and the problem in the prior art that the testing time prediction of server products is inaccurate and increases the testing pressure on the testing server is solved.

[0076] Obviously, the above-described embodiments are only a part of the embodiments of the present invention, rather than all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0077] It should be noted that the terms used herein are only for describing specific embodiments, rather than intending to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0078] It should be noted that the terms "first", "second", etc. in the specification, claims and drawings of the present application are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged under appropriate circumstances so that the embodiments of the present application described herein can be implemented in an order different from those illustrated or described herein.

[0079] The above are only the preferred embodiments of the present invention, and are not used to limit the present invention. For those skilled in the art, the present invention can have various changes and modifications. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A server product testing system, characterized in that: include: A test rack, comprising a rack body, a plurality of support plates and a plurality of barcode display modules, wherein the plurality of support plates are arranged at intervals along the height direction of the rack body, and each of the support plates is movably connected to the rack body; the plurality of barcode display modules are arranged one-to-one correspondingly to the plurality of support plates, and each of the barcode display modules is used to display the test status of a product placed on the support plate corresponding thereto; The MES server is used to associate basic product information, wherein the basic product information includes a product code; DIAG server, used to associate product test information, the DIAG server includes a test process database and a historical test process database; A twin server is communicatively connected to the MES server and the DIAG server, and the twin server forms a product test time prediction module based on the test process database and the historical test process database.

2. The server product testing system according to claim 1, characterized in that: The twin server includes an on-shelf and off-shelf interactive management and control module, and the server product testing system also includes: The interactive device includes a terminal for reading the product code, which transmits the product code to the on-shelf and off-shelf interactive control module. The on-shelf and off-shelf interactive control module calls the test process database and the product test time prediction module corresponding to the product code according to the product code, and combines the product height to obtain the product on-shelf range.

3. The server product testing system according to claim 2, characterized in that: The interactive device also includes AR glasses that are matched with the terminal, which obtain the distance between the terminal and the product shelving range to determine the product shelving position and generate a guide path. The AR glasses guide the user to put the product on the shelf to the shelving position according to the guide path.

4. The server product testing system according to claim 1, characterized in that: The twin server includes a retest pass rate determination module, and the server product testing system also includes a power distributor and a gateway arranged on the frame, the power distributor supplies power to the product, and the gateway is used to provide network services during the test process; wherein, when the product test fails, the retest pass rate determination module combines the fault analysis to analyze the cause of the test failure.

5. A server product testing processing method, characterized in that: A server product testing system applicable to any one of claims 1 to 4; the server product testing processing method comprises a testing method, the testing method comprising: Step S11: obtaining the product code of the product located at the quality inspection station, and the MES server transmits the product information corresponding to the product code to the twin server to start the product test time prediction module of the twin server; Step S12: The product test time prediction module calls the test process database corresponding to the product code and the historical test process database of historical products from the DIAG server to obtain the first time complexity T of the total code running according to the test process database. s (n), screening out preset data information in historical products whose similarity with the product information, test process and test code of the product is greater than or equal to 95%, and obtaining the second time complexity T of the preset data information l (n); Step S13: Screen out the products that meet 0.95T l (n)≤T s (n)≤1.05T l (n) and there is no historical data information of the test failure process to obtain the final prediction time T i =(2*t 实 -t 预 / n)+IF{n<100,O(i+1,i),[0]},T i Associated with the product code; where i is the number of predictions and is a natural number, and n is the number of historical data samples in the historical data information; O(i+1, i) is the deviation between the last predicted test time and the actual test time, and the initial predicted test time is 0; when the number of product samples is less than 100, O(i+1, i) is valid; t 实 is the total actual test time, t 预 To predict the test time.

6. The server product testing processing method according to claim 5, characterized in that: The server product test processing method further includes a product shelf method, and the product shelf method includes: Step S21: Scan the product code through the terminal to call the product information corresponding to the product in the MES server, transmit the product information to the twin server, start the interactive management and control module of the twin server, and obtain the final prediction time T obtained in step S13 according to the product code. i ; Step S22: Acquire the product height according to the product information, and call the test process database corresponding to the product code in the DIAG server according to the product code in combination with the shelf-loading and unloading interactive control module to obtain the preliminary shelf position; Step S23: Determine whether there is a product being tested at the preliminary shelf position. If there is a product being tested at the preliminary shelf position, obtain the fluctuation variance between the remaining test time of the shelf product and the predicted time of the product, and select the test rack position with the smallest fluctuation variance as the final shelf position.

7. The server product testing processing method according to claim 6, characterized in that: The product listing method further includes step S24 after step S23 and step S25 after step S24: Step S24: determining the coordinate values ​​of the final shelf position and the coordinate values ​​of the terminal's position, and planning a shelf path for the product; the AR glasses guide the terminal to move to the final shelf position according to the shelf path; and the terminal scans the barcode display module at the final shelf position; Step S25: Start the test and control the barcode display module to display a yellow light. The DIAG server reads the test IP and test status, and transmits the test IP and test status to the twin server to bind with the product code.

8. The server product testing processing method according to claim 7, characterized in that: In step S25, if the product test fails, the retest pass rate determination module of the twin server is called, and the determination method of the retest pass rate determination module includes: Step S31: determining whether the product is damaged, and if the product is damaged, controlling the barcode display module to display a red light; Step S32: If the product is not damaged, determine whether the power distributor has experienced a power outage, whether the gateway has experienced a network disconnection or network fluctuation; if a power outage and / or network disconnection or network fluctuation has occurred, retest and control the barcode display module to display a blue light; Step S33: If there has been no power outage, network disconnection or network fluctuation, the number of product tests is obtained. If the number of tests is less than 100 times, the product is retested and the barcode display module is controlled to display a blue light. If the number of tests is greater than or equal to 100 times, the historical products are screened according to the product code, and the retest pass data whose product information, test process and test code are more than or equal to 95% similar to the product information, test process and test code of the product are selected. If the retest pass data is greater than or equal to 90%, the product is retested and the barcode display module is controlled to display a blue light. If the retest pass data is less than 90%, the barcode display module is controlled to display a red light.

9. The server product testing processing method according to claim 5, characterized in that: The server product test processing method further includes a product delisting method, and the product delisting method includes: Step S41: Obtain the product test status. If the product has completed the test, start the on-shelf and off-shelf interactive management and control module of the twin server; Step S42: the interactive management and control module plans the product's delisting path according to the final listing location of the product; Step S43: The AR glasses drive the user to move to the final shelf position according to the off-shelf path to take the product off the shelf.

10. The server product testing processing method according to claim 9, characterized in that: The interactive device of the server product testing system further includes a processor, and the terminal is connected to the AR glasses through the processor. The product delisting method further includes step S40 between step S42 and step S43: The number of terminals β is obtained to allocate delisting tasks according to the number of the terminals. After receiving the delisting task, each terminal sends a delisting signal to the processor, and after receiving the delisting signal, the processor sends a delisting path to the AR glasses.

11. The server product testing processing method according to claim 10, characterized in that: In the step S40, When the ratio of the number of terminals β to the number of areas that need to be removed from shelves γx is greater than or equal to 2, each terminal is reminded once every 0.5 hours. If the terminal fails to process for more than a times, it is judged that the terminal operation is missed; 3≤a≤5; When the ratio of the number of terminals β to the number of areas that need to be removed from the shelves γx is less than 2, each terminal is reminded once every 0.75 hours. If the terminal is not processed for more than b times, it is judged that the terminal operation is missed; 4≤b≤6.

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