Driving circuit, driving method and display panel

The automated repair technology using the detection and compensation modules solves the problem of relying on manual operation for repairing broken scan lines on display panels, achieving efficient and accurate automatic repair results.

CN120048207BActive Publication Date: 2026-05-01CHONGQING HKC OPTOELECTRONICS TECH CO LTD +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
CHONGQING HKC OPTOELECTRONICS TECH CO LTD
Filing Date
2025-03-31
Publication Date
2026-05-01

AI Technical Summary

Technical Problem

In the existing technology, the repair of broken scan lines on display panels relies on manual operation, which is prone to operational errors, resulting in poor repair results and a limited number of repairs.

Method used

The detection module receives the output signal of the scan line and compares it with the preset reference signal to determine the position of the abnormal scan line. The compensation module then outputs a compensation signal for automatic repair, avoiding manual operation.

Benefits of technology

It eliminates the need for manual positioning, reduces the possibility of operational errors, improves repair efficiency and effectiveness, and overcomes the problem of limited repair capacity.

✦ Generated by Eureka AI based on patent content.

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Abstract

The embodiment of the application discloses a driving circuit, a driving method and a display panel, and belongs to the technical field of display. The driving circuit comprises: a detection module, the detection module is electrically connected with a plurality of scanning lines, and the detection module is used for determining the position of an abnormal scanning line in the plurality of scanning lines according to the output signal of the plurality of scanning lines and a preset reference signal; a compensation module, the compensation module is respectively electrically connected with the detection module and the plurality of scanning lines, and the compensation module is used for outputting a compensation signal to the row where the abnormal scanning line is located according to the opening sequence of the plurality of scanning lines and the position of the abnormal scanning line. The embodiment of the application determines the position of the abnormal scanning line in the plurality of scanning lines through the detection module, and then outputs the compensation signal to the row where the abnormal scanning line is located through the compensation module, so that the row where the scanning line is located can be normally driven, and then the technical problem that the effect is poor due to operation error when the scanning line is repaired by manual operation can be avoided.
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Description

Technical Field

[0001] This application relates to the field of display technology, and in particular to driving circuits, driving methods, and display panels. Background Technology

[0002] Currently, during the manufacturing process of display panels, broken gate lines may occur. To repair these breaks, which can occur in different locations, the current technology typically involves first locating the break using a microscope, and then using a laser to align the broken gate line with the repair line, thus establishing a repair path. However, this repair method relies heavily on manual labor, which is not only time-consuming but also prone to poor repair results if operational errors occur. Summary of the Invention

[0003] The main objective of this application is to provide a driving circuit, driving method, and display panel, aiming to solve the technical problem of how to avoid poor results due to operational errors when manually repairing scan lines.

[0004] To achieve the above objectives, embodiments of this application provide a driving circuit, the driving circuit comprising:

[0005] A detection module is electrically connected to multiple scan lines. The detection module is used to determine the position of abnormal scan lines among the multiple scan lines based on the output signals of the multiple scan lines and a preset reference signal.

[0006] The compensation module is electrically connected to the detection module and the multiple scan lines respectively. The compensation module is used to output a compensation signal to the row where the abnormal scan line is located according to the opening order of the multiple scan lines and the position of the abnormal scan line.

[0007] In one embodiment, the preset reference signal includes a preset comparison signal and a column clock signal output by a timing controller;

[0008] The detection module includes:

[0009] A comparison unit is electrically connected to the plurality of scan lines and connected to the preset comparison signal. The comparison unit is used to compare the output signals of the plurality of scan lines with the preset comparison signal to obtain a comparison result.

[0010] A logic processing unit is electrically connected to the comparison unit, the timing controller, and the compensation module. The logic processing unit is used to determine the position of the abnormal scan line among the multiple scan lines based on the comparison result and the column clock signal, and output the position of the abnormal scan line to the compensation module.

[0011] In one embodiment, the multiple scan lines are driven by multiple differential clock signals generated by a level converter based on the column clock signal, and the detection module includes multiple comparison units, the number of which is the same as the number of differential clock signals.

[0012] In one embodiment, the logic processing unit includes:

[0013] An OR gate, which is electrically connected to a plurality of the comparison units, is used to output a control signal based on the plurality of comparison results;

[0014] The processor is electrically connected to the OR gate, the timing controller, and the compensation module. The processor is used to compare the control signal with the column clock signal to determine the driving timing, determine the position of the abnormal scan line among the multiple scan lines according to the driving timing, and output the position of the abnormal scan line to the compensation module.

[0015] In one embodiment, the compensation module includes:

[0016] A compensation line, which is electrically connected to the detection module, is used to transmit the compensation signal;

[0017] A switching unit is electrically connected to the compensation line, the detection module, and the multiple scan lines respectively. The switching unit is used to control the on / off state of the compensation line according to the opening sequence of the multiple scan lines and the position of the abnormal scan line, so that the compensation signal is output to the row where the abnormal scan line is located.

[0018] Furthermore, to achieve the above objectives, embodiments of this application also provide a driving method, which is applied to the driving circuit described above, comprising:

[0019] The position of the abnormal scan line among the multiple scan lines is determined based on the output signal of the multiple scan lines and the preset reference signal;

[0020] Based on the activation order of the multiple scan lines and the position of the abnormal scan line, a compensation signal is output to the row where the abnormal scan line is located.

[0021] In one embodiment, the preset reference signal includes a preset comparison signal and a column clock signal output by a timing controller;

[0022] The step of determining the position of the abnormal scan line among the multiple scan lines based on the output signals of the multiple scan lines and the preset reference signal includes:

[0023] The comparison result is obtained by comparing the output signals of the multiple scan lines with the preset comparison signal;

[0024] The location of the abnormal scan line among the multiple scan lines is determined based on the comparison results and the column clock signal.

[0025] In one embodiment, the step of determining the position of the abnormal scan line among the plurality of scan lines based on the comparison result and the column clock signal includes:

[0026] Output control signals based on the multiple comparison results;

[0027] The control signal is compared with the column clock signal to determine the drive timing;

[0028] The location of the abnormal scan line among the multiple scan lines is determined based on the driving timing.

[0029] In one embodiment, the driving circuit includes a compensation line;

[0030] The step of outputting a compensation signal to the row containing the abnormal scan line according to the opening order of the multiple scan lines and the position of the abnormal scan line includes:

[0031] The on / off state of the compensation line is controlled according to the opening sequence of the multiple scan lines and the position of the abnormal scan line, so that the compensation signal is output to the row where the abnormal scan line is located.

[0032] In addition, to achieve the above objectives, this application embodiment also provides a display panel, the display panel including: a plurality of scan lines extending along a first direction and a plurality of data lines extending along a second direction, the plurality of scan lines and the plurality of data lines being insulated from each other and intersecting to define a plurality of sub-pixel regions, the display panel further including: a driving circuit as described above, the driving circuit being electrically connected to the plurality of scan lines.

[0033] This application proposes a driving circuit, driving method, and display panel. The driving circuit includes: a detection module electrically connected to multiple scan lines, used to determine the position of an abnormal scan line among the multiple scan lines based on the output signals of the multiple scan lines and a preset reference signal; and a compensation module electrically connected to the detection module and the multiple scan lines, used to output a compensation signal to the row containing the abnormal scan line based on the activation sequence of the multiple scan lines and the position of the abnormal scan line. This application's embodiment uses the detection module to receive the output signals from each scan line and compares them with the preset reference signal to determine the position of the abnormal scan line. The compensation module then outputs a compensation signal to the row containing the abnormal scan line, enabling the row to be driven normally. This avoids the technical problem of poor results due to operational errors when manually repairing scan lines. Attached Figure Description

[0034] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only a part of the embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0035] Figure 1 This is a schematic diagram of a driving circuit provided in an embodiment of this application;

[0036] Figure 2 This is a schematic diagram illustrating an application scenario of a driving circuit provided in an embodiment of this application;

[0037] Figure 3 A schematic diagram of the signal output waveform related to the scan line in a driving circuit provided in an embodiment of this application;

[0038] Figure 4 A schematic diagram of the waveform of the differential clock signal output by a level converter involved in a driving circuit provided in an embodiment of this application in a practical application;

[0039] Figure 5 This is a schematic diagram of the structure of a detection module in a driving circuit provided in an embodiment of this application;

[0040] Figure 6 A schematic diagram of the comparison principle involved in the detection module of a driving circuit provided in an embodiment of this application;

[0041] Figure 7 This application provides a schematic diagram of the structure of a logic processing unit in a driving circuit according to an embodiment of the present application.

[0042] Figure 8 A schematic diagram of a counting waveform involved in a logic processing unit in a driving circuit provided in an embodiment of this application;

[0043] Figure 9 This is a schematic diagram of the structure of a compensation module in a driving circuit provided in an embodiment of this application;

[0044] Figure 10 This is a flowchart illustrating a driving method provided in an embodiment of this application.

[0045] Explanation of icon numbers:

[0046] 10. Detection module; 20. Compensation module; 11. Comparison unit; 12. Logic processing unit; 121. OR gate; 122. Processor; 21. Compensation line; 22. Switching unit. Detailed Implementation

[0047] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of this application. However, those skilled in the art will understand that the embodiments of this application can also be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods are omitted so as not to obscure the description of the embodiments of this application with unnecessary detail.

[0048] TFT-LCD (Thin Film Transistor Liquid Crystal Display), as a flat panel display device, is increasingly used in high-performance display fields due to its small size, low power consumption, no radiation, and relatively low manufacturing cost. When a TFT-LCD displays, each row of gate lines on the display panel is scanned line by line to activate the pixel units connected to that row of gate lines. Data lines output data signals to the activated pixel units to charge them. Pixel units with different charges have different liquid crystal deflection angles, thus allowing the display of different grayscale levels. To further reduce the production cost of LCD products, the circuit used for scanning the gate lines often adopts a GOA (Gate Driver on Array) design. This design integrates the TFT gate switching circuit onto the array substrate of the display panel to form a scanning drive for the display panel. This gate switching circuit integrated on the array substrate using GOA technology is also called a GOA unit or shift register unit. Display devices using GOA units eliminate the need for bonding the driving circuit, thus reducing product costs in terms of both materials and manufacturing processes.

[0049] Taking LCD or OLED (Organic Light-Emitting Diode) displays as examples, their pixel architecture typically involves horizontal scanning and vertical charging via source lines. The horizontal GOA (a simple line-by-line shifting circuit, mounted on the glass with minimal cost increase during production) scanning is bidirectional, while the vertical scanning is driven by a source driver chip. The source driver receives display data from the front end, performs complex data processing, then performs DAC (digital-to-analog conversion) to generate grayscale voltages that drive the display within the plane. Source driver chips are relatively expensive but convenient for transmitting display data, so they are generally driven from one side only. In contrast, GOA units are less expensive, so they are typically driven from a dual-side configuration.

[0050] Because gate traces are generally designed as dual-drive in the horizontal direction, meaning the scan lines on both sides are connected, current manufacturing processes can result in broken or dark gate lines. This leaves only one side of the gate line open. For small-sized, low-resolution panels, the broken line may not be noticeable. However, for products with related technologies, such as TVs with high resolution (e.g., 5K, 8K, etc.) and high refresh rates (100, 120, 144, 165, 240Hz, etc.), the charging time is shorter. For large-sized TVs such as 50, 55, 58, 65, 75, and even 94, 100, and 107 inches, the transfer from one scan line to another can cause insufficient charging of the sub-pixels on the side of the broken line. This means that the target grayscale voltage level cannot be reached during the charging time, resulting in a noticeable difference in the display boundary. However, these products are expensive, and while the repair value is high, the location of the broken wire is unknown to repair personnel. Therefore, it may appear in any area of ​​the panel, making repair difficult. For different locations, a universal circuit design needs to be found for repair.

[0051] The common approach in related technologies is to first use a microscope to locate the specific broken scan line on the panel, then use a laser to laser-connect the broken scan line to the repair line, thus establishing a repair path. Finally, the gate drive signal is collected from the other end (the side without abnormal dual-drive), passed through an operational amplifier (OP), and then sent back. However, this approach has many drawbacks. For example, each panel requires manual inspection to determine which scan line is broken before laser treatment, and poor connections may occur during the laser treatment process, resulting in unsatisfactory repair results. Furthermore, this approach requires an OP with a large withstand voltage differential, making selection difficult. There is also a delay issue when collecting and sending back the gate drive signal, and if both gate drives on both sides of the dual-drive are disconnected, repair is impossible. Additionally, for broken line repair, each repaired G-line requires a repair line to be pulled back. Because the glass has limited traces, only one or two scan lines can be repaired at most, limiting the number of broken lines that can be repaired.

[0052] Based on this, embodiments of this application provide a driving circuit, driving method, and display panel. By receiving output signals from each scan line through a detection module and comparing them with a preset reference signal, the location of abnormal scan lines among multiple scan lines can be determined, eliminating the need for manual searching with a microscope, saving time and reducing the possibility of operational errors. By outputting a compensation signal to the row containing the abnormal scan line through a compensation module, the row containing the scan line can be driven normally without the need for laser treatment, avoiding the problem of poor repair results that may occur due to manual repair, and overcoming the problem of limited repair lines for broken lines.

[0053] The driving circuit, driving method, and display panel provided in the embodiments of this application are specifically described through the following embodiments. First, the driving circuit in the embodiments of this application is described.

[0054] This application provides a driving circuit, referring to... Figure 1 , Figure 1 This is a schematic diagram of a driving circuit provided in an embodiment of this application. In this embodiment, the driving circuit includes:

[0055] The detection module 10 is electrically connected to multiple scan lines. The detection module 10 is used to determine the position of abnormal scan lines among the multiple scan lines based on the output signals of the multiple scan lines and a preset reference signal.

[0056] The compensation module 20 is electrically connected to the detection module 10 and multiple scan lines. The compensation module 20 is used to output a compensation signal to the row where the abnormal scan line is located according to the opening sequence of the multiple scan lines and the position of the abnormal scan line.

[0057] In this embodiment, the driving circuit is used to automatically detect and repair G-line breakage or G-line darkening problems in the display panel. The display panel may include multiple GOA circuits, each of which can correspond to the output signal G(n) of a scan line. G(n) represents the output turn-on signal of this row of gates. If the TFT cell in the GOA circuit is abnormal or the wiring is broken, resulting in no output of G(n), the output of this row will be abnormal, causing G-line darkening or G-line breakage.

[0058] Based on the detection module 10, this embodiment can automatically find abnormal G(n) without manual operation of the microscope for positioning, determine the abnormal position according to the preset algorithm, and then provide the abnormal position to the compensation module 20. The compensation module 20 outputs a compensation signal to the row where the abnormal scan line is located to achieve the effect of automatic repair, and the number of scan lines that can be compensated is unlimited.

[0059] As an example, refer to Figure 2 This embodiment addresses the issue of dark or weak G lines, which can be combined with... Figure 2To understand this, Gn can represent the location of the broken line. Since GOA units are generally dual-drive designs, on the nth row of the scan line, there are two Gn signals, Gn_L and Gn_R, on both sides of the glass, connected by the scan line. If one side's Gn signal, such as Gn_L, is missing (there are many reasons for this, such as TFT malfunction or trace corrosion breakage), while the other side's Gn_R is outputting normally, this row will appear as a weak line with decreasing brightness from right to left. This is because the horizontal scan lines of the display screen have RC (resistance and capacitance), and using only one Gn_R to drive one row of scan lines results in an excessive load. The closer to the signal end, the better the charging effect; the furthest end has the worst charging. If both Gn signals on both sides are broken, then the scan signal for this row will be completely absent. Because the GOA unit signals are cascaded, the disappearance of the Gn signal means that from the nth row onwards, the GOA units below cannot be activated. In this case, the nth row and subsequent rows cannot be activated for normal charging. Therefore, the GOA units on both sides must retain the path connecting to the detection module 10 and the compensation module 20.

[0060] In some feasible embodiments, multiple scan lines are driven by multiple differential clock signals generated by a level shifter based on the column clock signal output by a timing controller.

[0061] In this embodiment, the output signal waveform of the scan line in the display panel and the related signal output waveform can be referred to Figure 3 To understand this, the timing controller (Tcon) outputs a regular square wave CKV (Clock pulse vertical, column clock signal). For the Tcon output waveform CKV, the level shifter (LS) samples the signal once on the rising edge and once on the falling edge, thus obtaining the LS output waveform. As an example, using four different clock signals CLK as columns, we can obtain waveforms CK1 to CK4. The waveform output by CK1 passes through the PCB (Printed Circuit Board) to the GOA unit on the glass, ultimately obtaining the waveform G1. Therefore, the output signals Gn of all scan lines on the display panel are generated by driving CK1 to CK4, only outputting scan signals corresponding to different rows at different times. Figure 3 It is known that the regular square wave waveform is a theoretical waveform, or a waveform without a panel connection. However, in practical applications, after connecting the panel's GOA unit, a back-end load is introduced. The waveforms CK1 to CK4, as well as Gn corresponding to the opening of the scan line, will be subject to this load, causing the square wave waveform to distort, such as... Figure 3 The actual G(n+3) waveform is shown in the diagram. For the output of LS in practical applications, as shown... Figure 4As shown, a normal row has a load of one row, so when it is turned on, it has the effect of a downstream load. The voltage rise rate cannot reach the predetermined voltage instantly, and there needs to be a rise time. For rows where Gn is disconnected, this will be reflected in the CLK waveform of LS output, which is a standard square wave. Therefore, this difference can be used to detect the number of rows where Gn is disconnected.

[0062] In some feasible embodiments, the preset reference signal includes a preset comparison signal and a column clock signal output by a timing controller; reference Figure 5 The aforementioned detection module 10 may specifically include:

[0063] Comparison unit 11 is electrically connected to multiple scan lines and input to a preset comparison signal. Comparison unit 11 is used to compare the output signals of multiple scan lines with the preset comparison signal to obtain a comparison result.

[0064] The logic processing unit 12 is electrically connected to the comparison unit 11, the timing controller and the compensation module 20 respectively. The logic processing unit 12 is used to determine the position of the abnormal scan line among multiple scan lines according to the comparison result and the column clock signal, and output the position of the abnormal scan line to the compensation module 20.

[0065] As can be seen from the foregoing embodiments, since the GOA unit is driven line by line by the four CKs of the LS and corresponds one-to-one with each line of the scan line, it is only necessary to detect the abnormality of these four CKs to know which line has a problem.

[0066] In this embodiment, as an example, the comparison unit 11 can be a comparator. By comparing CK1 with the comparison waveform (preset comparison signal), the output waveform can be obtained. Therefore, the number of comparison units 11 can be the same as the number of difference clock signals. Taking the difference clock signals including CK1 to CK4 in the aforementioned embodiment as an example, the comparison results output by the comparison unit 11 can include output 1 to output 4, such as... Figure 6 As shown, the comparison waveform is a high level, the duration of which is the time it takes for CK to rise to half voltage. Under normal circumstances, within time t1, the voltage of CK can only rise to half of the normal voltage. At this time, the comparison waveform is compared with CK by the comparator, and the output level is 0. The comparator is also limited to working within time t1 (the power supply voltage of the comparator can be controlled to perform time-segmented comparison). When the back-end G scan is disconnected, the CK waveform is abnormal, and a pulse high level is output.

[0067] In this embodiment, the comparison results output by multiple comparison units 11 are provided to the logic processing unit 12. The logic processing unit 12 then performs a comprehensive analysis based on each comparison result and the column clock signal from the timing controller to determine the position of the abnormal scan line among the multiple scan lines.

[0068] Reference Figure 7 In some feasible embodiments, the logic processing unit 12 may specifically include:

[0069] OR gate 121 is electrically connected to multiple comparison units 11. OR gate 121 is used to output a control signal based on multiple comparison results.

[0070] Processor 122 is electrically connected to OR gate 121, timing controller and compensation module 20 respectively. Processor 122 is used to compare control signal with column clock signal to determine drive timing, determine the position of abnormal scan line among multiple scan lines according to drive timing, and output the position of abnormal scan line to compensation module 20.

[0071] In this embodiment, as an example, the four comparison results obtained by the four comparison units 11 in the aforementioned embodiment based on comparing CK1 to CK4 with the comparison waveforms are output into an OR gate 121 to generate a control signal CPV. Then, the column clock signal CKV of the timing controller Tcon is given to the processor 122 to obtain the following result: Figure 8 The counting waveform shown shows that when CPV is low, a square wave of CKV counts once. When CPV is high, the counting mark is set, and the processor 122 records the count value at this time, so the location of the scan line break can be obtained. When CPV is exhausted, that is, after scanning to the last line, the location and number of scan line breaks in the panel can be known.

[0072] Reference Figure 9 In some feasible embodiments, the compensation module 20 may specifically include:

[0073] Compensation line 21 is electrically connected to detection module 10 and is used to transmit compensation signals;

[0074] The switching unit 22 is electrically connected to the compensation line 21, the detection module 10 and multiple scan lines respectively. The switching unit 22 is used to control the on / off state of the compensation line 21 according to the opening sequence of the multiple scan lines and the position of the abnormal scan line, so that the compensation signal is output to the row where the abnormal scan line is located.

[0075] In this embodiment, after the specific location of the abnormal scan line is detected, the corresponding location needs to be repaired to achieve automated detection and automated compensation. After the location of the abnormal scan line is known, a compensation waveform can be generated separately for the scan signal corresponding to the missing scan line and given to the GOA unit to achieve the same effect as repairing the scan line.

[0076] As an example, such as Figure 9As shown, the compensation signal needs to pass through switch unit 22 before reaching the GOA unit. Figure 9 The switching unit 22 shown (taking a MOS switch as an example, but other similar switching devices can also be used) can control 8 channels with a 2-bit signal. If there are multiple channels, the number of control bits can be increased. In this way, by adjusting the digital signal used to control the switching unit 22 according to the position of the abnormal scan line, it is possible to select which scan line to compensate. As can be seen from the above embodiment, after a frame scan is completed, the processor 122 obtains the position of the broken line. At this time, the broken line position is converted into a number of bits, which can control the switching unit 22. When a scan line is broken, the compensation for that line is turned on, and the compensation signal is given to the corresponding broken line. At the same time, only one compensation line is needed to achieve the effect of compensating for multiple abnormalities. This is because the scan lines are turned on line by line, so the switching unit 22 can be controlled by adjusting the number of bits to select the corresponding broken line. In this way, multiple broken scan lines can be repaired at different times using the same compensation line.

[0077] This application provides a driving circuit that receives output signals from each scan line through a detection module and compares them with a preset reference signal to determine the location of abnormal scan lines among multiple scan lines. This eliminates the need for manual searching using a microscope, saving time and reducing the possibility of operational errors. A compensation module outputs a compensation signal to the row containing the abnormal scan line, ensuring that the row can be driven normally without the need for laser repair. This avoids the problem of poor repair results that may occur with manual repair and eliminates the need for a limited number of repair lines to complete the broken line repair, overcoming the limitation on the number of broken line repairs. This application can utilize the external network circuit of the display panel to reduce manual operation time and operational errors, enabling real-time detection of broken lines and timely location of broken or dark lines.

[0078] Furthermore, embodiments of this application also provide a driving method, referring to... Figure 10 , Figure 10 This is a flowchart illustrating a driving method provided in an embodiment of this application. In this embodiment, the driving method is applied to the driving circuit provided in the above embodiment, and includes steps S10 to S20:

[0079] Step S10: Determine the position of the abnormal scan line among the multiple scan lines based on the output signals of the multiple scan lines and the preset reference signal;

[0080] Step S20: Output a compensation signal to the row where the abnormal scan line is located according to the opening order of multiple scan lines and the position of the abnormal scan line.

[0081] In some feasible embodiments, the aforementioned preset reference signal includes a preset comparison signal and a column clock signal output by the timing controller; step S10 may specifically include:

[0082] Step S11: Compare the output signals of multiple scan lines with a preset comparison signal to obtain a comparison result;

[0083] Step S12: Determine the position of the abnormal scan line among the multiple scan lines based on the comparison result and the column clock signal.

[0084] In some feasible embodiments, step S12 above may specifically include:

[0085] Step S121: Output a control signal based on multiple comparison results;

[0086] Step S122: Compare the control signal with the column clock signal to determine the drive timing;

[0087] Step S123: Determine the location of the abnormal scan line among the multiple scan lines based on the driving timing.

[0088] In some feasible embodiments, the driving circuit described above includes a compensation line; step S20 may specifically include:

[0089] Step S21: Control the on / off state of the compensation line according to the opening sequence of multiple scan lines and the position of the abnormal scan line, so that the compensation signal is output to the row where the abnormal scan line is located.

[0090] The driving method provided in this embodiment belongs to the same technical concept as the driving circuit provided in the above embodiments. The specific structure of the driving circuit can be referred to the above embodiments. Since the driving method provided in this embodiment adopts all the technical solutions of all the above embodiments, it has at least all the beneficial effects brought by the technical solutions of the above embodiments, which will not be described in detail here.

[0091] Furthermore, this application embodiment also provides a display panel, which includes: a plurality of scan lines extending along a first direction and a plurality of data lines extending along a second direction, wherein the plurality of scan lines and the plurality of data lines are insulated from each other and intersect to define a plurality of sub-pixel regions, and the display panel also includes the driving circuit provided in the above embodiment, which is electrically connected to the plurality of scan lines.

[0092] As an example, the display panel in this embodiment can be a TN (Twisted Nematic) display panel, an IPS (In-Plane Switching) display panel, a VA (Vertical Alignment) display panel, or an MVA (Multi-Domain Vertical Alignment) display panel. Of course, it can also be other types of display panels, such as an OLED display panel.

[0093] The display panel provided in this embodiment can be applied to a display device. This display device can be a display device including a driving circuit and a display panel, or it can be a debugging device used to detect and compensate for abnormal scan lines in the display panel. This embodiment does not limit its application. Specifically, the display device can be any product or component with display functionality, such as a mobile phone, tablet computer, television, monitor, laptop computer, digital photo frame, or navigator.

[0094] The display panel proposed in this embodiment and the driving circuit proposed in the above embodiments belong to the same technical concept. Technical details not described in detail in this embodiment can be found in any of the above embodiments. Furthermore, this embodiment has at least all the beneficial effects brought about by the technical solutions of the above embodiments, and will not be repeated here.

[0095] It should be noted that although a logical order is shown in the flowchart, in some cases, the steps shown or described may be performed in a different order than that shown in the flowchart. The terms "first," "second," etc., in the specification, claims, and the aforementioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0096] It should also be understood that references to "one embodiment" or "some embodiments" in the specification of embodiments of this application mean that one or more embodiments of this application include the specific features, structures, or characteristics described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized. The terms "comprising," "including," "having," and variations thereof all mean "including but not limited to," unless otherwise specifically emphasized.

[0097] It should be noted that the technical solutions of the various embodiments of this application can be combined with each other, but only if they are implemented by those skilled in the art. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such combination of technical solutions does not exist and is not within the scope of protection claimed by this application.

[0098] The above are merely optional embodiments of this application and do not limit the patent scope of this application. Any equivalent structural or procedural transformations made based on the content of the specification and drawings of this application under the concept of this application, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.

Claims

1. A driving circuit, characterized in that, The driving circuit includes: A detection module is electrically connected to multiple scan lines. The detection module is used to determine the position of abnormal scan lines among the multiple scan lines based on the output signals of the multiple scan lines and a preset reference signal. The compensation module is electrically connected to the detection module and the multiple scan lines respectively. The compensation module is used to output a compensation signal to the row where the abnormal scan line is located through a compensation line in a time-division manner according to the opening order of the multiple scan lines and the position of the abnormal scan line. The compensation module includes: A compensation line, which is electrically connected to the detection module, is used to transmit the compensation signal; A switching unit is provided, which is electrically connected to the compensation line, the detection module, and the spare line respectively. The switching unit is used to control the on / off state of the compensation line according to the opening sequence of the multiple scan lines and the position of the abnormal scan line, so that the compensation signal is output to the row where the abnormal scan line is located through the spare line, wherein the spare line is connected to each pixel connected to the abnormal scan line.

2. The driving circuit as described in claim 1, characterized in that, The preset reference signal includes a preset comparison signal and a column clock signal output by the timing controller; The detection module includes: A comparison unit is electrically connected to the plurality of scan lines and connected to the preset comparison signal. The comparison unit is used to compare the output signals of the plurality of scan lines with the preset comparison signal to obtain a comparison result. A logic processing unit is electrically connected to the comparison unit, the timing controller, and the compensation module. The logic processing unit is used to determine the position of the abnormal scan line among the multiple scan lines based on the comparison result and the column clock signal, and output the position of the abnormal scan line to the compensation module.

3. The driving circuit as described in claim 2, characterized in that, The multiple scan lines are driven by multiple differential clock signals generated by a level converter based on the column clock signal. The detection module includes multiple comparison units, the number of which is the same as the number of differential clock signals.

4. The driving circuit as described in claim 3, characterized in that, The logic processing unit includes: An OR gate, which is electrically connected to a plurality of the comparison units, is used to output a control signal based on the plurality of comparison results; The processor is electrically connected to the OR gate, the timing controller, and the compensation module. The processor is used to compare the control signal with the column clock signal to determine the driving timing, determine the position of the abnormal scan line among the multiple scan lines according to the driving timing, and output the position of the abnormal scan line to the compensation module.

5. A driving method, characterized in that, The driving method is applied to the driving circuit as described in any one of claims 1 to 4, comprising: The position of the abnormal scan line among the multiple scan lines is determined based on the output signal of the multiple scan lines and the preset reference signal; Based on the activation order of the multiple scan lines and the position of the abnormal scan line, a compensation signal is output to the row where the abnormal scan line is located.

6. The driving method as described in claim 5, characterized in that, The preset reference signal includes a preset comparison signal and a column clock signal output by the timing controller; The step of determining the position of the abnormal scan line among the multiple scan lines based on the output signals of the multiple scan lines and the preset reference signal includes: The comparison result is obtained by comparing the output signals of the multiple scan lines with the preset comparison signal; The location of the abnormal scan line among the multiple scan lines is determined based on the comparison results and the column clock signal.

7. The driving method as described in claim 6, characterized in that, The step of determining the position of the abnormal scan line among the multiple scan lines based on the comparison result and the column clock signal includes: Output control signals based on multiple comparison results; The control signal is compared with the column clock signal to determine the drive timing; The location of the abnormal scan line among the multiple scan lines is determined based on the driving timing.

8. The driving method as described in claim 5, characterized in that, The driving circuit includes a compensation line; The step of outputting a compensation signal to the row containing the abnormal scan line according to the opening order of the multiple scan lines and the position of the abnormal scan line includes: The on / off state of the compensation line is controlled according to the opening sequence of the multiple scan lines and the position of the abnormal scan line, so that the compensation signal is output to the row where the abnormal scan line is located.

9. A display panel, the display panel comprising: The display panel comprises a plurality of scan lines extending along a first direction and a plurality of data lines extending along a second direction, wherein the plurality of scan lines and the plurality of data lines are insulated from each other and intersect to define a plurality of sub-pixel regions. The display panel further comprises a driving circuit as described in any one of claims 1 to 4, wherein the driving circuit is electrically connected to the plurality of scan lines.

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