Peak value searching method and device, chip, electronic equipment and storage medium

Abstract

The invention discloses a peak value searching method and device of capacitance induction quantity, a chip, electronic equipment and a storage medium. The peak value searching method comprises the following steps: acquiring a capacitance induction quantity of each induction point on a touch screen to obtain an induction data array; comparing the capacitance induction quantity of each induction point with the first adjacent induction point and the capacitance induction quantity of the second adjacent induction point to obtain a first comparison value and a second comparison value, and storing the first comparison value and the second comparison value to the induction point; acquiring a third comparison value opposite to the first comparison value, and storing the third comparison value to the first adjacent induction point; obtaining a fourth comparison value opposite to the second comparison value, and storing the fourth comparison value to a second adjacent induction point; and traversing the sensing data array, comparing the sum of the comparison values stored on each sensing point with a set threshold value, and determining the sensing point of which the sum is equal to the set threshold value as a peak point. Therefore, repeated comparison in the peak value searching process can be avoided, and the searching speed can be improved.

Description

Technical Field

[0001] The present invention relates to the technical field of touch display, and particularly to a peak finding method, a finding device, a chip, an electronic device and a storage medium. Background Art

[0002] With the development of science and technology, touch screens have been widely used in more and more electronic devices, and users can perform various operations on the devices through the touch screens.

[0003] Most of the existing touch screens are capacitive touch screens. The capacitive touch device determines whether an induction point is touched by detecting the capacitive induction amount of the induction point, obtaining the difference (Diff) between the capacitive induction amount and a reference amount, and obtaining the peak point in Diff through traversal comparison, so as to locate the touch area.

[0004] Figure 1 The schematic diagram of traversal comparison in the prior art is shown. Refer to Figure 1 , each induction point needs to be compared with multiple adjacent induction points around it. Taking adjacent induction points A and B as an example, when comparing point A with its adjacent induction points, it needs to be compared with point B; when comparing point B with its adjacent induction points, it also needs to be compared with point A. That is to say, the comparison between point A and point B needs to be repeated twice. In the process of traversal comparison, this kind of repetition will consume a large amount of time, resulting in slow processing speed, and at the same time wasting a lot of unnecessary computing resources and bringing a burden to the processor. Summary of the Invention

[0005] In view of the above problems, the purpose of the present application is to provide a peak finding method, a finding device, a chip, an electronic device and a storage medium, which can avoid repeated comparison of induction points.

[0006] According to one aspect of the present application, a method for finding the peak of capacitive induction amount is provided, which includes: obtaining the capacitive induction amount of each induction point on the touch screen to obtain an induction data array; comparing the capacitive induction amount of each of the induction points with its first adjacent induction point and second adjacent induction point to obtain a first comparison value and a second comparison value, and storing the first comparison value and the second comparison value at this induction point; inverting the first comparison value to obtain a third comparison value and storing it at the first adjacent induction point; inverting the second comparison value to obtain a fourth comparison value and storing it at the second adjacent induction point; traversing the induction data array, comparing the sum of the comparison values stored at each induction point with a set threshold, and determining the induction point where the sum is equal to the set threshold as the peak point.

[0007] Optionally, the peak finding method further includes: for each of the peak points, obtaining the sum of the comparison values on its adjacent sensing points, and comparing the sum with a set range. When the sum of the comparison values on any of the adjacent sensing points falls within the set range, it is determined that the peak point is a noise point.

[0008] Optionally, the first comparison value and the second comparison value are obtained through a Boolean expression, and one of the true value and the false value output by the Boolean expression represents that the capacitance induction amount of the sensing point is greater than its first adjacent sensing point or second adjacent sensing point, and the other represents that the capacitance induction amount of the sensing point is less than or equal to its first adjacent sensing point or second adjacent sensing point.

[0009] Optionally, the true value is represented by the number 1, and the true value represents that the capacitance induction amount of the sensing point is less than or equal to the adjacent sensing point. The false value is represented by the number 0, and the false value represents that the capacitance induction amount of the sensing point is greater than the adjacent sensing point. The set threshold is 0, and the set range includes the sum of the comparison values being 3 and 4.

[0010] Optionally, before traversing the sensing data array, the peak finding method further includes: adding an auxiliary row and an auxiliary column to the sensing data array. One of the auxiliary row and the auxiliary column is adjacent to the sensing data array in the first direction, and the other is adjacent to the sensing data array in the second direction. The auxiliary row and the auxiliary column include a plurality of auxiliary operation values, and the relative magnitude of each auxiliary operation value is consistent with the capacitance induction amount of the adjacent sensing point of the auxiliary operation value.

[0011] Optionally, for the N×M sensing data array, the auxiliary row includes M auxiliary operation values, and the auxiliary column includes N auxiliary operation values; or for the N×M sensing data array, the auxiliary row includes M + 1 auxiliary operation values, and the auxiliary column includes N + 1 auxiliary operation values, where N and M are positive integers.

[0012] According to a second aspect of the present application, there is provided a peak finding device for capacitance induction amount, which includes: a capacitance induction amount acquisition unit that acquires the capacitance induction amount of each induction point on the touch screen to obtain an induction data array; a comparison value acquisition unit that compares the capacitance induction amount of each said induction point with that of its first adjacent induction point and second adjacent induction point to obtain a first comparison value and a second comparison value, and obtains a third comparison value opposite to the first comparison value and a fourth comparison value opposite to the second comparison value; a storage unit for storing the comparison values, for each said induction point, storing the first comparison value and the second comparison value at this induction point, storing the third comparison value at its first adjacent induction point, and storing the fourth comparison value at its second adjacent induction point; a processing unit that compares the sum of the comparison values stored at each said induction point with a set threshold to determine the induction point where the sum is equal to the set threshold as the peak point.

[0013] Optionally, the processing unit is further configured to determine and filter out noise points. For each said peak point, the processing unit also compares the sum of the comparison values on its adjacent induction points with a set range, and when the sum of the comparison values on any of the adjacent induction points falls within the set range, determines this peak point as a noise point.

[0014] According to a third aspect of the present application, there is provided a chip, which includes: the peak finding device according to any one of the above. According to a fourth aspect of the present application, there is provided an electronic device, which includes: a touch screen; and the peak finding device according to any one of the above.

[0015] According to a fifth aspect of the present application, there is provided a computer-readable storage medium, where the storage medium stores a computer program, and the computer program can be executed by a processor to complete the peak finding method according to any one of the above.

[0016] According to the peak finding method, finding device, chip, electronic device and storage medium provided by the present application, the comparison value each time is stored in the two induction points participating in the comparison, so that repeated comparison between these two induction points can be avoided, which is beneficial to simplifying the comparison process and saving comparison time and computing resources.

[0017] Furthermore, according to the comparison values stored in multiple induction points around each peak point, the change trend of the capacitance induction amount around this peak point can be judged, so that it can be judged whether this peak point is a noise point. By judging and filtering out the noise points, the reliability of the peak points can be improved. Description of the Drawings

[0018] Through the following description of the embodiments of the present invention with reference to the drawings, the above and other objects, features and advantages of the present invention will become clearer. In the drawings:

[0019] Figure 1 Show a schematic diagram of traversal comparison in the prior art;

[0020] Figure 2 Show a schematic structural diagram of an electronic device according to an embodiment of the present application;

[0021] Figure 3 Show a schematic flowchart of a peak finding method according to an embodiment of the present application;

[0022] Figure 4 Show a schematic diagram of the storage of comparison values;

[0023] Figure 5 Show a schematic diagram of the relative positions of the auxiliary row / auxiliary column and the sensing data array;

[0024] Figure 6A Show a schematic diagram of the first sensing data array;

[0025] Figure 6B Show the total of the comparison values stored at each sensing point in the first sensing data array;

[0026] Figure 6C Show a comparison schematic diagram of multiple sensing points in the first area;

[0027] Figure 7A Show a schematic diagram of the second sensing data array;

[0028] Figure 7B Show the total of the comparison values stored at each sensing point in the second sensing data array;

[0029] Figure 8 Show a schematic structural diagram of a peak finding device according to an embodiment of the present application. Detailed implementation manners

[0030] The various embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. In the respective drawings, the same elements are denoted by the same or similar reference numerals. For clarity, the various parts in the drawings are not drawn to scale.

[0031] Meanwhile, in the present specification and claims, certain terms are used to refer to specific components. Those of ordinary skill in the art should understand that manufacturers may use different terms to refer to the same component. The present specification and claims do not use the difference in names as a way to distinguish components, but use the difference in functions of components as the criterion for distinction.

[0032] It should be understood that in the following description, a "circuit" may include a single or multiple combined hardware circuits, programmable circuits, state machine circuits, and / or elements capable of storing instructions executed by the programmable circuits. When an element or circuit is said to be "connected to" another element or when an element or circuit is said to be "connected between" two nodes, it can be directly coupled or connected to another element or there may be intermediate elements. The connection between elements can be physical, logical, or a combination thereof. In contrast, when an element is said to be "directly coupled to" or "directly connected to" another element, it means there are no intermediate elements between the two.

[0033] In addition, it should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, such that a process, method, article or device comprising a series of elements not only includes those elements, but also includes other elements not expressly listed, or elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "comprising a..." does not exclude the presence of additional identical elements in the process, method, article or device comprising the element.

[0034] It should also be noted that in the various methods and processes of this application, the magnitude of the sequence numbers of the steps does not mean the order of execution, nor does it constitute any limitation on the implementation process of the embodiments of this application.

[0035] Figure 2 Schematic structural diagram showing an embodiment of an electronic device of this application.

[0036] Referring to Figure 2 , the electronic device includes a touch screen 10 and a peak finding device 20. Among them, the electronic device can be a touch display device or any electronic device with a touch screen 10. For the touch display device, the touch screen 10 is also multiplexed as a display screen, so as to display corresponding images according to the touch area and / or touch trajectory.

[0037] The touch screen 10 is, for example, a capacitive screen and operates in a self-capacitance mode, with the electrodes parasitically coupled to ground. The touch screen 10 in this embodiment includes, for example, an electrode array in which the horizontal (X) and vertical (Y) electrodes are made of ITO material and intersect with each other. The intersection points are the sensing points 11. These electrode arrays respectively form capacitances with ground, that is, self-capacitances, which are the capacitances of the electrodes to ground or the capacitances of the screen body. When a finger touches the capacitive screen, the capacitance of the finger will be superimposed on the screen body capacitance, causing an increase in the capacitance sensing amount of the corresponding sensing point. The peak finding device 20 is used to find the sensing point on the touch screen 10 where the capacitance sensing amount is at a peak, so as to determine the touch area and / or touch trajectory on the touch screen 10 to implement the touch control function.

[0038] The following will introduce the peak finding method provided by this application in combination with Figures 3 to 7B In some embodiments, this method can also be used as the working process of the above-mentioned peak finding device 20.

[0039] Figure 3 FIG. shows a schematic flowchart of the peak finding method according to an embodiment of this application. Referring to Figure 3 this, the peak finding method includes the following steps:

[0040] In step S11, the capacitance sensing amount of each sensing point on the touch screen is obtained to obtain a sensing data array.

[0041] The sensing points on the touch screen are arranged in an array. The adjacent sensing points of each sensing point include first to fourth adjacent sensing points. The first to fourth adjacent sensing points are adjacent to the sensing point in the first direction, second direction, the reverse of the first direction, and the reverse of the second direction respectively.

[0042] It should be understood that for the sensing points adjacent to the edge of the touch screen, there are no adjacent sensing points in the direction adjacent to the touch screen. For example, for the sensing points adjacent to the edge of the touch screen in the first direction, there are no first adjacent sensing points, and for the sensing points adjacent to the touch screen in both the first direction and the second direction, there are no first adjacent sensing points and second adjacent sensing points.

[0043] In some embodiments, one of the first direction and the second direction is the row direction and the other is the column direction.

[0044] Hereinafter, an example will be given where the first direction is the row direction and to the right, and the second direction is the column direction and downwards. That is to say, for the sensing point D with coordinates (x, y), the coordinates of its first adjacent sensing point are (x + 1, y), and the coordinates of its second adjacent sensing point are (x, y + 1). Correspondingly, the reverse of the first direction is to the left, and the reverse of the second direction is upwards.

[0045] In step S12, the capacitance induction amount of each induction point is respectively compared with the capacitance induction amounts of the first adjacent induction point and the second adjacent induction point to obtain a first comparison value and a second comparison value, and the first comparison value and the second comparison value are stored in the induction point.

[0046] In step S13, the first comparison value is inverted to obtain a third comparison value, which is stored in the first adjacent induction point.

[0047] In step S14, the second comparison value is inverted to obtain a fourth comparison value, which is stored in the second adjacent induction point.

[0048] To make it easier to understand the above steps S12 to S14, Figure 4 a schematic diagram showing the storage of the comparison values is shown. In Figure 4 it shows the induction point D(x, y), the first adjacent induction point D1(x + 1, y) of the induction point D, and the second adjacent induction point D2(x, y + 1) of D.

[0049] The capacitance induction amount of the induction point D is compared with the capacitance induction amount of its first adjacent induction point D1, thereby obtaining a first comparison value A1, and A1 is stored in the induction point D. The third comparison value A3 opposite to the first comparison value A1 is stored in its first adjacent induction point D1.

[0050] The capacitance induction amount of the induction point D is compared with the capacitance induction amount of its second adjacent induction point D2, thereby obtaining a second comparison value A2, and A2 is stored in the induction point D. The fourth comparison value A4 opposite to the second comparison value A2 is stored in its second adjacent induction point D2.

[0051] In some embodiments, for the convenience of calculation, Boolean expressions can be used to obtain the above first comparison value and second comparison value. Specifically, one of the true value and the false value output by the Boolean expression represents that the capacitance induction amount of the induction point D is less than or equal to its adjacent induction point, and the other represents that the capacitance induction amount of the induction point D is greater than its adjacent induction point.

[0052] Exemplarily, for example, the first comparison value can be obtained using the following formula (1), and the second comparison value can be obtained using the following formula (2).

[0053] dir1=(diff(x,y)-diff(x+1,y)≤0) (1)

[0054] dir2=(diff(x,y)-diff(x,y+1)≤0) (2)

[0055] Wherein, dir1 and dir2 are the first comparison value and the second comparison value respectively, diff represents the capacitance induction amount, and "≤0" represents the judgment condition, that is, when the capacitance induction amount at this induction point is less than or equal to the capacitance induction amount of the adjacent induction point, a true value is output, otherwise a false value is output.

[0056] True values and false values are usually represented by the numbers 1 and 0. In the following text, take the number 1 as the true value and the number 0 as the false value as an example. That is to say, when the comparison value is 1, it means that the capacitance induction amount of the induction point is less than or equal to that of its adjacent induction point, and when the comparison value is 0, it means that the capacitance induction amount of the induction point is greater than that of its adjacent induction point.

[0057] In step S15, traverse the induction data array, compare the sum of the comparison values stored at each induction point with the set threshold, and determine the induction point where the sum is equal to the set threshold as the peak point.

[0058] Combined with Figure 4 , when traversing to the induction point D1, the already stored third comparison value A3 can be used to represent the magnitude of the capacitance induction amount between the induction point D1 and the induction point D; when traversing to the induction point D2, the already stored fourth comparison value A4 can be used to represent the magnitude of the capacitance induction amount between the induction point D2 and the induction point D. Therefore, there is no need to repeat the comparison process between the induction point D1 and D, and between the induction point D2 and D. That is to say, based on the above storage mechanism, only two comparisons are required for each induction point, and the comparison values between each induction point and each of its adjacent induction points can be obtained after traversing the induction data array. Therefore, repeated comparisons between induction points can be avoided, which is beneficial to simplifying the process, saving the computing resources required for comparison, and improving efficiency.

[0059] Since each comparison value represents the comparison result between this induction point and one of its first to fourth adjacent induction points, the sum of the comparison values on the induction point can represent the number of adjacent induction points whose capacitance induction amount is greater than that of this induction point. When the sum is equal to the set threshold, it means that the capacitance induction amount of this induction point is greater than any one of its first to fourth adjacent induction points, which also means that this induction point is the peak point.

[0060] It should be noted that for each induction point adjacent to the edge of the touch screen, there is no corresponding adjacent point in the direction adjacent to the touch screen. Therefore, in the peak finding method of the embodiment of the present application, before traversing the induction data array, auxiliary rows and auxiliary columns will be added to the induction data array to facilitate the acquisition of comparison values. One of the auxiliary rows and auxiliary columns is adjacent to the induction data array in the first direction, and the other is adjacent to the induction data array in the second direction.

[0061] Figure 5 Shows a schematic diagram of the relative positions of the auxiliary row / auxiliary column and the induction data array. In Figure 5In the example where the touch screen includes nine sensing points B1 - B9, sensing points B3, B6, and B9 are the sensing points adjacent to the right edge of the touch screen, and sensing points B7, B8, and B9 are the sensing points adjacent to the lower edge of the touch screen. Then, referring to the first direction to the right and the second direction downwards as above, the auxiliary column AY is adjacent to the sensing data array in the first direction, and the auxiliary row AX is adjacent to the sensing data array in the second direction. The auxiliary row AX and the auxiliary column AY include a plurality of auxiliary operation values, and the relative magnitudes between each auxiliary operation value and the capacitance sensing amount of its adjacent sensing point are the same. For example, if the capacitance sensing amount of sensing point B3 is greater than the auxiliary operation value A1, then the capacitance sensing amounts of sensing points B6 and B9 are also respectively greater than their corresponding auxiliary operation values A2 and A3, and the capacitance sensing amounts of sensing points B7, B8, and B9 are also respectively greater than their corresponding auxiliary operation values A4, A5, and A6. Further, for the convenience of operation, the magnitudes of the auxiliary operation values in the auxiliary row / auxiliary column are equal, and the relative magnitude is the same as that of the capacitance sensing amount of any sensing point. For example, the magnitudes of the auxiliary operation values A1 - A7 are equal, and the relative magnitude is the same as that of the capacitance sensing amount of any one of the sensing points B1 - B9. It can be understood that during the process of finding the peak value, generally, the auxiliary operation value is less than the capacitance sensing amount of its adjacent sensing point. That is to say, the auxiliary operation value can be selected as a value that cannot be sensed under normal circumstances, such as A1 - A7 are all -500.

[0062] It should be noted that in some embodiments, the auxiliary operation values in the auxiliary row AX and the auxiliary column AY correspond one-to-one with the sensing points. That is to say, for an N×M sensing data array (i.e., an N×M sensing point array), the number of auxiliary operation values in the auxiliary column AY is the same as the number of rows of the sensing data array, that is, N; the number of auxiliary operation values in the auxiliary column AX is the same as the number of columns of the sensing data array, that is, M, where N and M are positive integers.

[0063] In other embodiments, for an N×M sensing data array (i.e., an N×M sensing point array), the number of auxiliary operation values in the auxiliary column AY is N + 1; the number of auxiliary operation values in the auxiliary column AX is M + 1. Therefore, during the process of traversing and comparing, the sensing data array can be expanded from N×M to an (N + 1)×(M + 1) calculation array, which is more conducive to the automation of peak value finding, where N and M are positive integers. For example, referring to Figure 5 , for a 3×3 sensing data array, the auxiliary column AY includes four auxiliary operation values A1, A2, A3, A7, and the auxiliary row AX includes four auxiliary operation values A4, A5, A6, A7, where A7 is the auxiliary operation value shared by the auxiliary row and the auxiliary column. This auxiliary operation value A7 is only used to implement the automated array comparison and does not affect the comparison result.

[0064] Further, since the sum of the comparison values at each sensing point is compared with a set threshold to find the peak, in order to save storage resources, in some embodiments, after obtaining the first comparison value and the second comparison value, they can be directly summed and stored. That is, the sensing data array can be traversed according to the following formula (3) to obtain the comparison values stored at each sensing point:

[0065] (3)

[0066] where, for the sensing point (x, y), dir1 represents the first comparison value of this sensing point, and dir2 represents the second comparison value of this sensing point, represents the third comparison value stored on the first adjacent sensing point (x + 1, y) of this sensing point, represents the fourth comparison value stored on the second adjacent sensing point (x, y + 1) of this sensing point, represents the traversal process of the sensing data array, that is, storing the comparison values as above for each sensing point in the sensing data array.

[0067] As an example, Figure 6A shows a schematic diagram of the first sensing data array; Figure 6B shows the sum of the comparison values stored at each sensing point in the first sensing data array. To facilitate the understanding of the above step S15, the following further illustrates the above step S15 by taking the first region I in the first sensing data array as an example.

[0068] Figure 6C shows a comparison schematic diagram of multiple sensing points in the first region. Referring to Figure 6C , each sensing point only needs to be compared twice to obtain multiple comparison values of this sensing point after traversing the sensing data array. Corresponding to the above example where the capacitance sensing amount of the sensing point D is represented by the number 1 when it is less than or equal to its adjacent sensing point, and the number 0 when the capacitance sensing amount of the sensing point D is greater than its adjacent sensing point, the set threshold can be 0. That is, when the sum of the comparison values is 0, it indicates that the sensed capacitance of this sensing point is greater than any of its adjacent sensing points, which also indicates that this sensing point is a peak point.

[0069] However, in some cases, due to the interference of the environment or other factors, incorrect touch positions will be generated, that is, there may be noise points among the peak points. Therefore, the peak finding method in some embodiments further includes the following steps S16 and S17.

[0070] In step S16, for each peak point, obtain the sum of the comparison values on its adjacent sensing points and compare it with a set range. When the sum of the comparison values on any adjacent sensing point falls within the set range, determine that this peak point is a noise point.

[0071] Under this setting range, the change trend of the capacitance induction around the peak point does not match the true induction point, which indicates that this peak point is a noise point.

[0072] Corresponding to the example where the capacitance induction of the induction point D is represented by the number 1 less than or equal to its adjacent induction points, and the number 0 represents that the capacitance induction of the induction point D is greater than its adjacent induction points, the setting range includes, for example, the sum of each comparison value being 3 and 4. Taking Region II in the first induction data array as an example, after determining that there is a peak point in this region, since the sum of the comparison values of adjacent induction points falls within the setting range, it indicates that this peak point is a noise point.

[0073] Filter the noise points determined in step S16 in step S17.

[0074] Figure 7A A schematic diagram showing the second induction data array; Figure 7B Show the sum of the comparison values stored in each induction point in the second induction data array. Referring to the second induction data array, due to environmental factors, there are multiple peak points with a capacitance induction of 255. According to the peak finding method provided by the present application, the noise points in these peak points can be effectively filtered.

[0075] According to the peak finding method, finding device, electronic device and storage medium provided by the present application, each comparison value is stored in the two induction points participating in the comparison, so that repeated comparison between these two induction points can be avoided, which is beneficial to simplifying the comparison process and saving comparison time and computing resources.

[0076] Furthermore, according to the comparison values stored in multiple induction points around each peak point, the change trend of the capacitance induction around the peak point can be judged, so that it can be judged whether this peak point is a noise point. By judging and filtering the noise points, the reliability of the peak point can be improved.

[0077] The present application also provides a peak finding device. Figure 8 Show a schematic structural diagram of the peak finding device according to an embodiment of the present application. This peak finding device can be set in an electronic device as shown in Figure 2 and is used to implement the peak finding method described above.

[0078] Refer to Figure 8 , this peak finding device includes:

[0079] A capacitance induction acquisition unit 21, configured to acquire the capacitance induction of each induction point on the touch screen, so as to obtain an induction data array;

[0080] A comparison value obtaining unit 22 compares the capacitance induction amounts of each sensing point with those of its first adjacent sensing point and second adjacent sensing point, thereby obtaining a first comparison value and a second comparison value, and obtaining a third comparison value opposite to the first comparison value and a fourth comparison value opposite to the second comparison value.

[0081] A storage unit 23 is used to store the comparison values. For each sensing point, the first comparison value and the second comparison value are stored at this sensing point, the third comparison value is stored at its first adjacent sensing point, and the fourth comparison value is stored at its second adjacent sensing point.

[0082] A processing unit 24 is used to compare the sum of the comparison values stored at each sensing point with a set threshold, and determine the sensing points where the sum is equal to the set threshold as peak points.

[0083] Further, in some embodiments, for each peak point, the processing unit also compares the sum of the comparison values on its adjacent sensing points with a set range, and when the sum of the comparison values on any adjacent sensing points falls within the set range, determines that this peak point is a noise point and filters it out.

[0084] The acquisition of each comparison value and the comparison with the set threshold or set range have been introduced in more detail above, and will not be elaborated here.

[0085] Further, the present application also provides a chip, which can be used to drive a touch screen. The chip is integrated with the above-mentioned peak finding device by means of, for example, circuit integration to complete the above-mentioned peak finding method, and thus also has any of the above beneficial effects.

[0086] Further, the present application also provides a computer-readable storage medium. The storage medium stores a computer program, which can be executed by a processor to complete the above-mentioned peak finding method, and thus also has any of the above beneficial effects.

[0087] According to the peak finding method, finding device, chip, electronic device and storage medium provided by the present application, each comparison value is stored in two sensing points participating in the comparison, so that repeated comparison between these two sensing points can be avoided, which is beneficial to simplifying the comparison process and saving comparison time and computing resources.

[0088] Further, according to the comparison values stored in multiple sensing points around each peak point, the change trend of the capacitance induction amount around this peak point can be judged, and thus it can be judged whether this peak point is a noise point. By judging and filtering out the noise points, the reliability of the peak points can be improved.

[0089] As described above with respect to the embodiments of the present application, these embodiments do not describe all the details in detail, nor do they limit the present application to only the specific embodiments. Obviously, many modifications and variations can be made based on the above description. These embodiments are selected and specifically described in this specification in order to better explain the principles and practical applications of the present application, so that those skilled in the art can make good use of the present application and its modifications. The scope of protection of the present application shall be subject to the scope defined by the claims of the present application.

Claims

1. A method for finding the peak value of capacitance induction, wherein: include: Obtaining the capacitance sensing value of each sensing point on the touch screen to obtain a sensing data array; Comparing the capacitive sensing values ​​of each sensing point with its first adjacent sensing point and its second adjacent sensing point to obtain a first comparison value and a second comparison value, and storing the first comparison value and the second comparison value in the sensing point; inverting the first comparison value to obtain a third comparison value, and storing the third comparison value in the first adjacent sensing point; inverting the second comparison value to obtain a fourth comparison value, and storing the fourth comparison value in the second adjacent sensing point; The sensing data array is traversed, the sum of the comparison values ​​stored at each sensing point is compared with a set threshold, and the sensing point where the sum is equal to the set threshold is determined as a peak point.

2. The peak value search method according to claim 1, wherein: The peak value search method further includes: For each peak point, the sum of the comparison values ​​at its adjacent sensing points is obtained and compared with a set range. When the sum of the comparison values ​​at any adjacent sensing points falls within the set range, the peak point is determined to be a noise point.

3. The peak value search method according to claim 2, wherein: Obtain the first comparison value and the second comparison value through a Boolean expression, One of the true value and the false value output by the Boolean expression represents that the capacitance sensing amount of the sensing point is greater than that of its first adjacent sensing point or the second adjacent sensing point, and the other represents that the capacitance sensing amount of the sensing point is less than or equal to that of its first adjacent sensing point or the second adjacent sensing point.

4. The peak value search method according to claim 3, wherein: The true value is represented by the number 1, which indicates that the capacitance sensing value of the sensing point is less than or equal to that of the adjacent sensing point. The false value is represented by the number 0, and the false value indicates that the capacitance sensing amount of the sensing point is greater than that of the adjacent sensing points. The set threshold is 0, and the set range includes the sum of the comparison values ​​being 3 and 4.

5. The peak value search method according to claim 2, wherein: Before traversing the sensing data array, the peak search method further includes: adding an auxiliary row and an auxiliary column to the sensing data array, wherein one of the auxiliary row and the auxiliary column is adjacent to the sensing data array in the first direction, and the other is adjacent to the sensing data array in the second direction, The auxiliary row and the auxiliary column include a plurality of auxiliary operation values, and each of the auxiliary operation values ​​is consistent in relative magnitude with a capacitance sensing value of a sensing point adjacent to the auxiliary operation value.

6. The peak value search method according to claim 5, wherein: For the N×M sensing data array, the auxiliary row includes M auxiliary operation values, and the auxiliary column includes N auxiliary operation values; or For the N×M sensing data array, the auxiliary row includes M+1 auxiliary operation values, and the auxiliary column includes N+1 auxiliary operation values. N and M are positive integers.

7. A device for finding the peak value of capacitance induction, wherein: include: A capacitive sensing quantity acquisition unit is used to acquire the capacitive sensing quantity of each sensing point on the touch screen to obtain a sensing data array; a comparison value acquisition unit, for comparing the capacitive sensing values ​​of each of the sensing points with the first adjacent sensing point and the second adjacent sensing point to obtain a first comparison value and a second comparison value, and to obtain a third comparison value opposite to the first comparison value and a fourth comparison value opposite to the second comparison value; a storage unit, configured to store comparison values, and for each of the sensing points, storing the first comparison value and the second comparison value to the sensing point, storing the third comparison value to its first adjacent sensing point, and storing the fourth comparison value to its second adjacent sensing point; The processing unit compares the sum of the comparison values ​​stored at each of the sensing points with a set threshold value, so as to determine the sensing point where the sum is equal to the set threshold value as a peak point.

8. The peak value search device according to claim 7, wherein: The processing unit is also used to determine and filter out noise points. For each of the peak points, the processing unit further compares the sum of the comparison values ​​at the adjacent sensing points with a set range, so that when the sum of the comparison values ​​at any of the adjacent sensing points falls within the set range, the peak point is determined as a noise point.

9. A chip, wherein: include: A peak search device as claimed in claim 7 or 8.

10. An electronic device, wherein: include: touchscreen; as well as A peak search device as claimed in claim 7 or 8.

11. A computer-readable storage medium, wherein: The storage medium stores a computer program, and the computer program can be executed by a processor to complete the peak search method according to any one of claims 1 to 6.

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