Electrical measurement method and device of liquid crystal display panel and electronic equipment

Abstract

The application provides an electrical measurement method and device of a liquid crystal display panel and electronic equipment, and relates to the field of data processing. In the method, a multi-channel signal generator is used to apply a sinusoidal voltage signal to the liquid crystal display panel; a high-speed camera is used to collect a light intensity time sequence of the liquid crystal display panel to which the sinusoidal voltage signal is applied; the light intensity time sequence is analyzed through a mapping relationship curve to obtain an analysis result of the liquid crystal display panel; the analysis result is converted into a two-dimensional distribution map, and an abnormal area is located through an image processing algorithm. The technical solution provided by the application facilitates improving the electrical measurement efficiency of the liquid crystal display panel.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of data processing, and particularly relates to an electrical measurement method and device of a liquid crystal display panel and electronic equipment. BACKGROUND

[0002] The liquid crystal display panel is a core display component of modern electronic equipment, and its electrical performance index directly affects the display effect, power consumption and service life.

[0003] The existing electrical performance test of the liquid crystal panel mainly depends on the microprobe point-by-point contact measurement technology. Usually, the probe is positioned at the edge of the panel glass substrate or the pixel driving electrode, and the LCR meter, oscilloscope or current source is used to apply an alternating bias to a single pixel or a small area one by one, and the corresponding voltage, current, capacitance and loss parameters are measured. However, when the number of panel pixels is huge, the point-by-point contact measurement needs to move the probe frequently or use a complex probe array, and the test period is often several hours or even several days, which leads to low electrical measurement efficiency of the liquid crystal display panel.

[0004] Therefore, there is an urgent need for an electrical measurement method, device and electronic equipment of a liquid crystal display panel. SUMMARY

[0005] The present application provides an electrical measurement method, device and electronic equipment of a liquid crystal display panel, which facilitates improving the electrical measurement efficiency of the liquid crystal display panel.

[0006] In a first aspect of the present application, an electrical measurement method of a liquid crystal display panel is provided, and the method comprises the following steps: applying a sinusoidal voltage signal to the liquid crystal display panel by using a multi-channel signal generator; acquiring a light intensity time sequence collected by a high-speed camera for the liquid crystal display panel after the sinusoidal voltage signal is applied; analyzing the light intensity time sequence by using a mapping relationship curve to obtain an analysis result for the liquid crystal display panel; converting the analysis result into a two-dimensional distribution map, and locating an abnormal area by using an image processing algorithm.

[0007] By adopting the technical scheme, the multi-channel signal generator is adopted to apply a sinusoidal voltage signal to the liquid crystal display panel, high frequency, high resolution, multi-point parallel excitation can be realized under non-contact condition, and problems such as glass scratching, electrode damage and contact resistance interference caused by traditional probe point-by-point contact are avoided. Secondly, the light intensity time sequence of the liquid crystal panel after applying the electric signal is collected by using a high-speed camera, the response behavior of each pixel point under dynamic driving can be captured under the premise of non-contact and non-damage, and large-area, global and synchronous electro-optical characteristic sampling is realized. Thirdly, the light intensity data is inversely analyzed by the pre-constructed photoelectric mapping relationship curve, the optical response can be restored to the electrical performance parameters such as equivalent capacitance, conductance or phase shift, and the gap between the optical signal and the electrical parameter in the traditional test is effectively bridged. Further, the analysis result is generated into a two-dimensional electrical parameter distribution map after being uniformly coded, and combined with image processing algorithms such as threshold segmentation, edge extraction and connected domain analysis, the small but key abnormal areas in the panel can be automatically identified, including problems such as parasitic capacitance mutation, signal path blockage or uneven driving response, which greatly improves the detection accuracy and defect positioning ability. Therefore, the electrical measurement efficiency of the liquid crystal display panel is improved.

[0008] Optionally, the method further comprises: applying known direct current voltage data to at least one group of test pixels on the liquid crystal display panel; acquiring light intensity data of the liquid crystal display panel; and constructing a mapping relationship curve of light intensity and voltage according to the direct current voltage data and the light intensity data.

[0009] By adopting the technical scheme, the known direct current voltage data is applied to at least one group of test pixels on the liquid crystal display panel, and the corresponding light intensity response data is synchronously acquired, so as to construct the mapping relationship curve between the light intensity and the voltage, which has extremely important technical significance and practical value. Firstly, the process ensures that the electro-optical response of each pixel point under static condition is stably collected by precisely controlling the voltage range and step interval applied, and eliminates the complex interference caused by response lag, frequency coupling and other factors under dynamic driving, so that the subsequent mapping relationship is more reliable and controllable. Secondly, by establishing this one-to-one electro-optical mapping curve, the reverse decoding from the light intensity data to the electrical parameter can be effectively realized, so that the optical measurement has the ability to analyze the electrical performance of the panel, and breaks through the limitation of traditional method which can only obtain brightness or color information. Thirdly, the mapping relationship has good repeatability and generalization ability, and can be adaptively adjusted through calibration between different test batches or different types of panels, so as to improve the universality of the method. In addition, the curve can also be used as an important training basis for machine learning, electrical parameter reconstruction or defect prediction model, to realize intelligent diagnosis and predictive maintenance under data driving.

[0010] Optionally, the analysis of the light intensity time sequence by the mapping relationship curve obtains an analysis result of the liquid crystal display panel, specifically including: obtaining a plurality of excitation frequencies of the multi-channel signal generator; synchronously multiplying the light intensity time sequence by a sine signal and a cosine signal of each excitation frequency to obtain a multiplication result; performing low-pass filtering on the multiplication result and obtaining an amplitude and a phase of each frequency component; mapping the amplitude and the phase of each frequency component to corresponding voltage values and current values by using the mapping relationship curve; and inversely calculating the analysis result of the liquid crystal display panel by least square fitting of multiple frequency points according to the corresponding voltage values and current values in combination with a series resistance-capacitance equivalent circuit model, wherein the analysis result includes equivalent resistances, equivalent capacitances, and loss angles of each pixel on the liquid crystal display panel.

[0011] By using the above technical solution, the coherent demodulation can be effectively realized by obtaining a plurality of excitation frequencies of the multi-channel signal generator and synchronously multiplying the light intensity time sequence by a sine wave and a cosine wave of each frequency, so that a plurality of frequency responses originally mixed in the time signal are extracted respectively. This processing manner not only improves the resolution, but also suppresses the interference of non-target frequencies, and improves the signal-to-noise ratio and stability of the measurement. Secondly, by performing low-pass filtering on the multiplication result, the accurate amplitude and phase information of each frequency component can be obtained, which provides a core basis for reflecting the real response characteristics of the liquid crystal pixel under different frequency driving. Further, by using the photoelectric mapping curve constructed in the early stage, the optical information can be accurately converted into equivalent voltage and current data, thereby realizing the cross-physical quantity conversion from the optical domain to the electrical domain, and avoiding the inherent contact error and damage risk in direct electrical measurement. Furthermore, in combination with the series resistance-capacitance equivalent circuit model, the least square fitting of the voltage and current data of multiple frequency points can be performed to inversely calculate the electrical property parameters of each pixel point of the liquid crystal panel.

[0012] Optionally, the obtaining of the light intensity time sequence collected by the high-speed camera for the liquid crystal display panel after the sine voltage signal is applied specifically includes: in a constant backlight environment, controlling the high-speed camera to continuously shoot the liquid crystal display panel at a frame rate of a preset multiple of the excitation frequency to obtain a shooting image; and according to the shooting image, matching a power-on time stamp of the multi-channel signal generator to output the light intensity time sequence.

[0013] By adopting the technical scheme, the high-speed camera is controlled to continuously shoot at a frame rate of a preset multiple of the excitation frequency under a constant backlight environment, and the power-on time stamp of the multi-channel signal generator is used for synchronous alignment, so that the light intensity time sequence of the liquid crystal display panel is accurately acquired, which has significant technical advantages and practical value. First, shooting under constant backlight conditions can effectively avoid the interference of environmental light changes or backlight fluctuations on the light intensity signal, ensuring the consistency and stability of the collected data and enhancing the accuracy of subsequent optoelectronic mapping. Second, sampling at a frame rate of more than a multiple of the excitation frequency ensures that multiple key phase points in each period are captured completely, ensuring that the time-domain details of the light intensity signal can be restored with high resolution, which helps to accurately calculate frequency-domain response characteristics such as amplitude and phase information.

[0014] Optionally, the analysis result is converted into a two-dimensional distribution map, and an abnormal area is located by an image processing algorithm, specifically including: obtaining a target pixel of the liquid crystal display panel; mapping the voltage value and current value of the target pixel in the analysis result to a two-dimensional grid and rendering with pseudo-color to obtain a heat distribution map; performing feature extraction on the heat distribution map using a gray threshold segmentation algorithm and a connected domain extraction algorithm, and denoising by morphological filtering to obtain a target feature point; extracting a color value of the target feature point; determining the abnormal area according to the size relationship between the color value and a color threshold value, the abnormal area including a capacitance mutation and / or a loss hot spot.

[0015] By adopting the technical scheme, the analysis result is mapped into a two-dimensional distribution map in a visual manner, and the efficient identification and accurate positioning of the abnormal area are realized by means of an image processing algorithm, which embodies the highly integrated multi-dimensional information fusion capability and the intelligent level of abnormal detection. First, by extracting the voltage value and current value of all target pixels in the liquid crystal display panel and mapping these data to a two-dimensional grid to construct a pseudo-color heat distribution map, not only is the intuitive expression of the electrical performance parameters in the spatial dimension realized, but also the originally abstract electrical parameters have an observable, comparable and quantifiable image form, greatly improving the intuitiveness and operation efficiency of human-computer interaction. Second, the gray threshold segmentation algorithm and the connected domain extraction algorithm are used to extract the features of different color regions in the heat map, which can quickly filter out local areas with significant electrical deviation, and further image denoising processing by morphological filtering can effectively eliminate false positives caused by shooting noise or edge effects, enhancing the integrity and boundary clarity of the target feature area. Third, by extracting the color value of the target feature point and comparing it with the preset color threshold value, the nature of the abnormal area can be quantitatively identified.

[0016] Optionally, the determining the abnormal region according to the size relationship between the color value and the color threshold value specifically comprises: if it is determined that the color value is greater than the color threshold value, performing coordinate and boundary calibration on the target feature point according to a preset first range to obtain a first abnormal region, the preset first range being determined by a difference between the color value and the color threshold value; if it is determined that the color value is less than the color threshold value, performing coordinate and boundary calibration on the target feature point according to a preset second range to obtain a second abnormal region, the preset second range being determined by a difference between the color value and the color threshold value.

[0017] By adopting the above technical solution, the target feature point in the liquid crystal display panel is dynamically judged and region boundary calibrated based on the size relationship between the color value and the preset color threshold value, which further improves the accuracy of abnormal detection, the fine-grained recognition ability and the flexibility of region boundary determination. Specifically, the method first distinguishes the abnormal response regions of different types or severities by judging the relative size of the color value and the threshold value; when the color value is higher than the threshold value, it often represents that the electrical parameter of the target pixel is abnormally large, for example, there is significant current leakage, loss hot spot or high frequency conduction abnormality, at this time, the boundary is calibrated according to the preset first range, which can accurately delineate this kind of strong abnormal region, and ensure that the boundary range is dynamically adjusted according to the "excess amount", improving the accuracy and effectiveness of positioning; on the contrary, when the color value is lower than the threshold value, it may represent that the pixel has hidden defects such as capacitance drop, signal attenuation or driving failure, and by setting the second range to perform fine calibration of coordinates and boundaries, the real boundary of this kind of weak response or electrical degradation region can also be reasonably depicted.

[0018] Optionally, the method further comprises: generating a detection report according to the abnormal region; and sending the detection report to a worker corresponding to the liquid crystal display panel.

[0019] By adopting the technical scheme, after the abnormal area of the liquid crystal display panel is identified and positioned, a structured report containing the detection result is automatically generated and sent to relevant staff, the information closed loop degree and response efficiency of the detection process are significantly improved, and the technical scheme has many practical application values and management advantages. First, by automatically generating the detection report, the position information of the abnormal area, the electrical performance parameter distribution, the abnormal type judgment, the abnormal degree and the like can be systematically output in the form of combination of text and image, the whole process data sedimentation from image processing to information induction is realized, and visual and archivable basis is provided for subsequent problem tracking, maintenance decision, quality control analysis and the like. Second, the generation of the detection report is based on the data processing process driven by the algorithm, the missing report and miswriting and the like that may occur during manual recording are avoided, and the accuracy and consistency of the information are ensured. Third, after the report is generated, it can be sent to the liquid crystal panel production or quality inspection staff in real time, so that the detection result can be grasped by the staff in the first time and the problem area can be quickly responded, the production rhythm and closed loop feedback speed are accelerated, and the real-time performance and collaborative efficiency of the whole panel detection system are improved.

[0020] In a second aspect of the present application, an electrical measurement device for a liquid crystal display panel is provided, which comprises an acquisition module and a processing module. The processing module is configured to apply a sinusoidal voltage signal to the liquid crystal display panel by using a multi-channel signal generator. The acquisition module is configured to acquire a light intensity time sequence collected by a high-speed camera for the liquid crystal display panel after the sinusoidal voltage signal is applied. The processing module is further configured to analyze the light intensity time sequence by using a mapping relationship curve to obtain an analysis result for the liquid crystal display panel. The processing module is further configured to convert the analysis result into a two-dimensional distribution map and locate an abnormal area by using an image processing algorithm.

[0021] In a third aspect of the present application, an electronic device is provided, which comprises a processor, a memory, a user interface and a network interface. The memory is configured to store instructions. The user interface and the network interface are both configured to communicate with other devices. The processor is configured to execute the instructions stored in the memory, so that the electronic device performs the method as described above.

[0022] In a fourth aspect of the present application, a computer readable storage medium is provided, which stores instructions. When the instructions are executed, the method as described above is performed.

[0023] In summary, the one or more technical schemes provided in the present application have at least the following technical effects or advantages:

[0024] By applying a sinusoidal voltage signal to the liquid crystal display panel through a multi-channel signal generator, high-frequency, high-resolution, multi-point parallel excitation can be achieved under non-contact conditions, avoiding problems such as glass scratching, electrode damage, and contact resistance interference caused by traditional probe point-by-point contact. Second, by using a high-speed camera to collect the light intensity time sequence of the liquid crystal panel after applying the electrical signal, the response behavior of each pixel point under dynamic driving can be captured under the premise of non-contact and non-destructive, realizing large-area, global, and synchronous electro-optical property sampling. Third, through the prior construction of the photoelectric mapping relationship curve, the light intensity data can be analyzed inversely, and the optical response can be restored to electrical performance parameters such as equivalent capacitance, conductance, or phase shift, effectively bridging the gap between traditional testing "light signals" and "electrical parameters". Further, the analysis results are uniformly coded to generate a two-dimensional electrical parameter distribution map, combined with image processing algorithms such as threshold segmentation, edge extraction, and connected component analysis, which can automatically identify small but critical abnormal areas in the panel, including parasitic capacitance mutation, signal path blockage, or uneven driving response, greatly improving detection accuracy and defect positioning ability. Therefore, it is convenient to improve the electrical measurement efficiency of the liquid crystal display panel. BRIEF DESCRIPTION OF DRAWINGS

[0025] Figure 1 A flowchart of an electrical measurement method of a liquid crystal display panel provided by an embodiment of the present application is shown.

[0026] Figure 2 Another flowchart of an electrical measurement method of a liquid crystal display panel provided by an embodiment of the present application is shown.

[0027] Figure 3 A module diagram of an electrical measurement device of a liquid crystal display panel provided by an embodiment of the present application is shown.

[0028] Figure 4 A structural diagram of an electronic device provided by an embodiment of the present application is shown.

[0029] Explanation of reference numerals: 31, acquisition module; 32, processing module; 41, processor; 42, communication bus; 43, user interface; 44, network interface; 45, memory. DETAILED DESCRIPTION

[0030] In order for those skilled in the art to better understand the technical solutions in the specification, the technical solutions in the specification will be described clearly and completely below in conjunction with the drawings in the embodiments of the specification. Obviously, the described embodiments are only a part of the embodiments of the present application, not all embodiments.

[0031] In the description of the embodiments of the present application, the words such as "for example" or "for instance" are used to represent an example, an illustration, or a description. Any embodiment or design scheme described as "for example" or "for instance" in the embodiments of the present application should not be interpreted as more preferred or more advantageous than other embodiments or design schemes. Rather, the use of words such as "for example" or "for instance" is intended to present the relevant concept in a specific manner.

[0032] In the description of the embodiments of the present application, the term "a plurality of" means two or more. For example, a plurality of systems means two or more systems, and a plurality of screen terminals means two or more screen terminals. In addition, the terms "first" and "second" are used only for descriptive purposes and should not be construed as indicating or implying relative importance or implicitly indicating the technical features indicated. Therefore, the features defined with "first" and "second" can explicitly or implicitly include one or more features. The terms "include", "contain", "have" and their variants mean "include but are not limited to", unless otherwise specifically emphasized.

[0033] As an indispensable core display component in modern electronic devices, the electrical performance of the liquid crystal display panel determines the display quality, energy consumption performance and product life of the whole machine to a great extent. The current mainstream method for testing the electrical performance of the liquid crystal panel is mainly point-by-point contact measurement by a micro probe. This method usually precisely positions the micro probe at the edge of the glass substrate or the pixel driving electrode position of the panel, cooperates with an LCR meter, an oscilloscope or a precision current source and other instruments, and applies an alternating bias signal to a single pixel or a small range area one by one, and measures the corresponding voltage, current, capacitance, loss factor and other key parameters.

[0034] However, with the continuous improvement of panel resolution and the increasing pixel density, point-by-point contact testing not only needs to frequently move the probe or rely on a highly complex probe array for batch coverage, but also has a very long overall testing process, which often takes several hours or even several days to complete the comprehensive measurement of the whole panel, seriously restricting the overall efficiency and production adaptability of the electrical detection. In addition, the probe contact process may also introduce mechanical stress or contact resistance interference, which has the risk of damaging the panel or causing measurement errors.

[0035] To solve the above technical problems, the present application provides an electrical measurement method of a liquid crystal display panel, referring to Figure 1 , Figure 1 A flowchart of an electrical measurement method of a liquid crystal display panel provided by an embodiment of the present application. The electrical measurement method is applied to a server and includes steps S110 to S140, and the steps are as follows:

[0036] S110, applying a sinusoidal voltage signal to the liquid crystal display panel by using a multi-channel signal generator.

[0037] Specifically, a multi-channel signal generator capable of outputting multiple mutually independent adjustable sinusoidal wave signals simultaneously is used in the test system, and these voltage signals are directly applied to the row and column drive lines of the liquid crystal panel. Through multi-channel parallel output, different frequencies or amplitudes of excitation can be applied to the panel in the same test, simulating various driving conditions that the panel may encounter in actual operation, thereby obtaining the response information of the panel in multiple frequency bands at one time without the need to repeatedly load and switch single-path excitation, greatly improving the test efficiency and flexibility.

[0038] Among them, the server refers to the central control and data management unit in the whole test system, which communicates with the multi-channel signal generator through network or bus interface, configures and issues instructions to the output frequency, amplitude and phase of the signal generator. The server not only loads and stores the setting file of the excitation signal, but also undertakes the role of triggering and synchronization control. When the test starts, the server sends a start command to the signal generator, notifies the high-speed camera to start acquisition at the same time, and records the time stamps of the two in the log to ensure the accurate alignment and traceability management of the electrical signal and optical data in subsequent analysis.

[0039] For example, assuming that three sinusoidal wave outputs are configured, channel one simulates the normal refresh frequency of the panel with 240Hz and 5Vpp amplitude, channel two detects the medium frequency dielectric loss with 1kHz and 2Vpp amplitude, and channel three analyzes the high frequency parasitic resistance effect with 10kHz and 1Vpp amplitude. The signal generator superimposes the three waveforms and sends them to the row and column drive interfaces through the amplifier, while starting the high-speed camera for optical acquisition. In this way, the dynamic response of the panel under three driving conditions of low frequency, medium frequency and high frequency can be obtained in the same test period, laying a solid foundation for subsequent multi-frequency harmonic demodulation and electrical parameter inversion.

[0040] S120, acquiring the light intensity time sequence collected by the high-speed camera for the liquid crystal display panel after the sinusoidal voltage signal is applied.

[0041] Specifically, after the liquid crystal display panel is applied with the sinusoidal voltage signal by the multi-channel signal generator, the server controls the high-speed camera to continuously shoot the panel at a very high frame rate, thereby recording the brightness (i.e. light intensity) change of each pixel point under voltage excitation. The high-speed camera uploads the collected image sequence to the server, and the server extracts and time sorts the pixel brightness change in these images frame by frame to form a "light intensity time sequence" reflecting the pixel response process, which is used for subsequent electrical analysis. This process ensures the non-contact, global and dynamic acquisition of the electrical response behavior of the liquid crystal pixel, avoiding the efficiency and accuracy problems brought by point-by-point electrical contact.

[0042] In a possible implementation, the light intensity time sequence collected by the high-speed camera for the liquid crystal display panel after a sinusoidal voltage signal is applied is obtained, specifically comprising: in a constant backlight environment, the high-speed camera is controlled to continuously shoot the liquid crystal display panel at a frame rate of a preset multiple of the excitation frequency to obtain a shooting image; and the light intensity time sequence is output according to the shooting image and the power-on time stamp of the multi-channel signal generator.

[0043] Specifically, in order to accurately capture the dynamic response process of the liquid crystal pixel under voltage excitation, the test system first sets a stable backlight illumination environment to ensure that external light does not interfere with the shooting effect. Subsequently, the server controls the high-speed camera to continuously shoot the liquid crystal display panel at a frame rate much higher than the frequency of the applied sinusoidal signal (for example, 5 times, 10 times or higher). The continuous images with high frame rate can record the periodic fluctuations of pixel brightness with voltage in detail. Since the camera acquisition and signal application are performed in parallel, the server uses the time stamp information sent by the signal generator to accurately align the time axis of the shooting image, so as to accurately organize the light intensity information of each pixel at each time into a complete time sequence.

[0044] For example, assuming that the signal generator applies a sinusoidal excitation signal with a frequency of 200 Hz to the liquid crystal panel, the server sets the high-speed camera to continuously shoot at a speed of 2000 frames per second, which is equivalent to shooting 10 frames of images in each sinusoidal period. In the images shot under constant backlight, the brightness of each pixel point in the 10 frames will show a trend of fluctuation with the sinusoidal signal. The server then matches the time sequence of the image frames with the starting time of the excitation voltage to accurately extract the complete curve of the change of pixel brightness with time, i.e., the light intensity time sequence. This curve will serve as the core data basis for analyzing the electrical performance of the pixel.

[0045] S130, analyzing the light intensity time sequence through the mapping relationship curve to obtain an analysis result for the liquid crystal display panel.

[0046] Specifically, after obtaining the light intensity time sequence of each pixel point of the liquid crystal display panel, the server does not directly use these optical data as the basis for judgment, but uses the pre-constructed "mapping relationship curve" to convert the physical meaning. This mapping relationship curve is established based on experiments and reflects the regular relationship between the light intensity response of the liquid crystal pixel and the electrical parameters such as voltage, current and the like. The server uses this curve to convert the fluctuation mode of light intensity with time into the corresponding electrical behavior parameters, such as voltage change, current response, impedance characteristics, and the like, thereby realizing the analysis of the electrical performance of the pixel in a non-contact manner.

[0047] In a possible implementation, a known direct current voltage data is applied to at least one group of test pixels on the liquid crystal display panel; light intensity data of the liquid crystal display panel is acquired; and a mapping relationship curve of light intensity and voltage is constructed according to the direct current voltage data and the light intensity data.

[0048] Specifically, the system applies direct current voltages with different amplitudes to the known pixels and records the light intensity of the corresponding pixels under each voltage condition. Since the liquid crystal response under the direct current signal is relatively stable, it can be ensured that each group of "voltage-light intensity" data is stable and repeatable, thereby forming a group of basic mapping data points. The server fits these points into a "mapping relationship curve", and subsequent analysis can convert the light intensity value of the unknown pixel into an equivalent electrical parameter through the curve.

[0049] For example, if 5 typical pixels in the panel are selected as test points, they are sequentially applied with 0V, 1V, 2V, 3V and other voltage levels, and the brightness values of the pixels under these voltages are recorded by a high-speed camera, such as the gray scale change from dark to light. After the server collects the data pairs of brightness and voltage, a curve is obtained by fitting: the higher the brightness, the greater the corresponding voltage. This curve becomes the "reference model" of the entire test system, and in subsequent large-scale dynamic testing, only the light intensity needs to be seen to accurately infer the voltage state of the current pixel, thereby realizing efficient electrical parameter restoration without electrical contact.

[0050] In a possible implementation, the light intensity time sequence is analyzed through the mapping relationship curve to obtain an analysis result of the liquid crystal display panel, specifically including: acquiring a plurality of excitation frequencies of the multi-channel signal generator; synchronously multiplying the light intensity time sequence with a sine signal and a cosine signal of each excitation frequency to obtain a multiplication result; performing low-pass filtering on the multiplication result and acquiring amplitudes and phases of each frequency component; mapping the amplitudes and phases of each frequency component into corresponding voltage values and current values by using the mapping relationship curve; and inversely calculating the analysis result of the liquid crystal display panel by combining the corresponding voltage values and current values with a series resistance-capacitance equivalent circuit model through multi-frequency point least square fitting, wherein the analysis result includes equivalent resistances, equivalent capacitances and loss angles of each pixel on the liquid crystal display panel.

[0051] Specifically, the server extracts multiple sinusoidal excitation signal information of different frequencies from the multi-channel signal generator, then takes these frequencies as references, and synchronously multiplies the light intensity time series collected by the high-speed camera with the corresponding frequency sinusoidal and cosine waveforms respectively, so as to extract the frequency components hidden in the light intensity. This process is similar to "sifting out" the response components consistent with the specific frequency in the signal. After multiplication, the system performs low-pass filtering on the results to remove noise interference and only keep the key frequency components, and then calculates the response amplitude and phase information corresponding to each frequency. Then, with the help of the mapping relationship curve constructed in advance, the server converts these optical response quantities into corresponding voltage and current data as the basis for electrical performance analysis.

[0052] For example, if three excitation frequencies of 100 Hz, 300 Hz and 500 Hz are applied to a liquid crystal panel, the light intensity time series of a certain pixel also contains periodic changes of these frequencies. The system finds that the response amplitude of a certain pixel at 300 Hz is larger and the phase delay is more obvious through frequency demodulation, and the current response obtained after mapping is much smaller than the voltage response. According to the series resistance-capacitance equivalent model, this means that the equivalent resistance of the pixel is high, the equivalent capacitance is low, and there is a large loss angle, indicating that it may have problems such as leakage, aging or material defects. The whole process not only realizes the extraction of dynamic non-contact frequency domain response, but also efficiently and accurately back-projects the detailed electrical performance parameters at the pixel level.

[0053] S140, convert the analysis results into a two-dimensional distribution map, and locate the abnormal area through image processing algorithm.

[0054] Specifically, after obtaining the electrical performance analysis results corresponding to each pixel, the server does not stop at the original data level, but maps these data to a plane map, so that the analysis results have a visual performance in space. The electrical parameters (such as equivalent resistance, capacitance or loss angle) of each pixel point are projected into a two-dimensional coordinate grid, and pseudo-color rendering means is used to represent the numerical difference, generating an intuitive heat distribution map. Then, the system further applies image processing algorithms such as gray scale segmentation, connected domain extraction and morphological operation to identify the highlighted areas (color anomalies) in the map, so as to accurately lock the areas that may have defects or performance abnormalities.

[0055] In a possible implementation, the analysis result is converted into a two-dimensional distribution map, and an abnormal area is located by an image processing algorithm, specifically including: obtaining a target pixel of the liquid crystal display panel; mapping the voltage value and the current value of the target pixel in the analysis result onto a two-dimensional grid, and rendering by pseudo-color to obtain a heat distribution map; performing feature extraction on the heat distribution map by using a gray threshold segmentation algorithm and a connected domain extraction algorithm, and performing denoising by combining morphological filtering to obtain a target feature point; extracting a color value of the target feature point; determining an abnormal area according to a size relationship between the color value and a color threshold value, and the abnormal area includes a capacitance mutation and / or a loss hot spot.

[0056] Specifically, the system extracts target pixel points from all pixels of the liquid crystal display panel, and maps the voltage, current and other electrical performance parameters obtained in the analysis of these pixels onto a two-dimensional image grid, like giving each pixel of the panel an electrical performance label. Subsequently, these labels are presented in the form of color to constitute a "heat distribution map", and the color depth represents the high and low of the parameter value. For example, the pixel with high voltage value may be represented by red, and the pixel with low voltage value may be represented by blue. Then, the system performs image processing on the map, including separating the obviously abnormal area by using the gray threshold algorithm, identifying the shape and boundary of the continuous area by using the connected domain algorithm, and processing the image noise by using the morphological filtering, so as to obtain clean and clear target feature points.

[0057] For example, if a certain block of liquid crystal panel has a red mass in the heat distribution map, it means that the capacitance value of these pixels is obviously higher than that of other areas. The system identifies the color value of these red pixels and compares it with the preset "abnormal color threshold value". If the color value is higher than the threshold value, the system determines that the area is the first type of abnormal area of "capacitance mutation", and automatically marks the boundary. If another area has a color value obviously lower than the threshold value, it is also identified as the second type of abnormal area, such as "loss hot spot". The whole process can realize automatic and high-precision abnormal positioning, avoiding subjective errors and efficiency bottlenecks of manual identification.

[0058] In a possible implementation, the abnormal area is determined according to a size relationship between the color value and the color threshold value, specifically including: if it is determined that the color value is greater than the color threshold value, the target feature point is marked in coordinates and boundary according to a preset first range to obtain a first abnormal area, and the preset first range is determined by a difference between the color value and the color threshold value; if it is determined that the color value is less than the color threshold value, the target feature point is marked in coordinates and boundary according to a preset second range to obtain a second abnormal area, and the preset second range is determined by a difference between the color value and the color threshold value.

[0059] Specifically, after completing the generation of the heat map and the extraction of feature points, the system will judge the "color value" of each target feature point and compare it with the set "color threshold". If the color value of a feature point is higher than the threshold (for example, the color is very bright), it means that the electrical performance of the pixel is abnormally high, such as a sudden increase in the capacitance value. At this time, the system will set a "first range" based on the difference between this color value and the threshold, and use this range to calibrate the range and position of the abnormal area where the point is located, ultimately forming the first type of abnormal area. Similarly, if the color value is lower than the threshold (the color is dark or low in saturation), it means that the electrical performance parameters of the point are abnormally low, and the system will form the second type of abnormal area in a similar way.

[0060] For example, if the detection results show that the color value of an area is very close to dark red, and the color threshold set by the system is in the orange area, then the dark red will obviously exceed the threshold, and the system will determine that there is a "capacitance mutation" phenomenon in the area and set a marked range around these red pixels as the first abnormal area. Conversely, a certain area may appear close to gray-blue, which is far below the set green threshold. In this case, the system will automatically infer that it may be a "loss hotspot" or signal loss problem based on the difference, and mark it as the second abnormal area. By dynamically adjusting the detection boundary based on color difference, intelligent abnormality recognition with high sensitivity and strong adaptability can be achieved.

[0061] In one possible implementation, refer to Figure 2 , Figure 2 Another flow chart of a method for electrical testing of a liquid crystal display panel provided in an embodiment of the present application includes steps S210 to S220, which are as follows: S210, generating a test report based on the abnormal area; S220, sending the test report to the personnel responsible for the liquid crystal display panel.

[0062] Specifically, after the system identifies an abnormal area on the LCD panel, it automatically generates a detailed inspection report. This report includes information about the abnormal area, such as its location, the type of abnormality (e.g., capacitance mutation, current fluctuation), and the severity of the abnormality. It may also incorporate thermal maps and specific numerical data to help personnel fully understand the symptoms and causes of the problem. The report not only provides a textual description but also includes accompanying images, allowing personnel to more intuitively identify the problem.

[0063] For example, if a certain area of the liquid crystal display panel is found to have a current value higher than the normal range during detection, it may cause overheating or uneven brightness in that part. The system will generate a detection report indicating the specific coordinates of the abnormal area, the type of abnormality (such as "current fluctuation abnormality"), and the thermal map of the abnormal area. This report will then be sent to relevant engineers or operators through email or internal system, facilitating them to quickly locate the problem area, timely handle and repair, and avoid potential quality problems affecting product delivery.

[0064] The application also provides an electrical measurement device for a liquid crystal display panel, which refers to Figure 3 , Figure 3 A module schematic diagram of an electrical measurement device for a liquid crystal display panel provided by an embodiment of the application. The electrical measurement device is a server, which includes an acquisition module 31 and a processing module 32. The processing module 32 applies a sinusoidal voltage signal to the liquid crystal display panel using a multi-channel signal generator. The acquisition module 31 acquires the light intensity time sequence collected by the high-speed camera for the liquid crystal display panel after being applied with the sinusoidal voltage signal. The processing module 32 analyzes the light intensity time sequence through a mapping relationship curve to obtain an analysis result for the liquid crystal display panel. The processing module 32 converts the analysis result into a two-dimensional distribution map and locates the abnormal area through an image processing algorithm.

[0065] In a possible implementation, the processing module 32 applies known direct current voltage data to at least one group of test pixels on the liquid crystal display panel. The acquisition module 31 acquires the light intensity data of the liquid crystal display panel. The processing module 32 constructs a mapping relationship curve of light intensity and voltage according to the direct current voltage data and the light intensity data.

[0066] In a possible implementation, the processing module 32 analyzes the light intensity time sequence through the mapping relationship curve to obtain an analysis result for the liquid crystal display panel, specifically including: the acquisition module 31 acquires a plurality of excitation frequencies of the multi-channel signal generator; the processing module 32 synchronously multiplies the light intensity time sequence with the sinusoidal signal and the cosine signal of each excitation frequency to obtain a multiplication result; the processing module 32 performs low-pass filtering on the multiplication result and acquires the amplitude and phase of each frequency component; the processing module 32 maps the amplitude and phase of each frequency component to the corresponding voltage value and current value using the mapping relationship curve; and the processing module 32 inversely calculates the analysis result of the liquid crystal display panel according to the corresponding voltage value and current value, in combination with a series resistance-capacitance equivalent circuit model, through multi-frequency point least squares fitting, wherein the analysis result includes the equivalent resistance, equivalent capacitance and loss angle of each pixel on the liquid crystal display panel.

[0067] In a possible implementation, the acquisition module 31 acquires the light intensity time sequence collected by the high-speed camera for the liquid crystal display panel after a sinusoidal voltage signal is applied, and specifically, the processing module 32 controls the high-speed camera to continuously shoot the liquid crystal display panel at a frame rate that is a preset multiple of the excitation frequency in a constant backlight environment to obtain a shooting image; and the processing module 32 outputs the light intensity time sequence according to the shooting image and a power-on timestamp of the multi-channel signal generator.

[0068] In a possible implementation, the processing module 32 converts the analysis result into a two-dimensional distribution map and locates an abnormal area through an image processing algorithm, and specifically, the acquisition module 31 acquires a target pixel of the liquid crystal display panel; the processing module 32 maps the voltage value and the current value of the target pixel in the analysis result to a two-dimensional grid and renders the two-dimensional grid with pseudo-color to obtain a heat distribution map; the processing module 32 performs feature extraction on the heat distribution map by using a gray threshold segmentation algorithm and a connected domain extraction algorithm, and performs denoising in combination with morphological filtering to obtain a target feature point; the processing module 32 extracts a color value of the target feature point; and the processing module 32 determines an abnormal area according to a size relationship between the color value and a color threshold value, where the abnormal area includes a capacitance mutation and / or a loss hot spot.

[0069] In a possible implementation, the processing module 32 determines the abnormal area according to the size relationship between the color value and the color threshold value, and specifically, if the processing module 32 determines that the color value is greater than the color threshold value, the processing module 32 performs coordinate and boundary calibration on the target feature point according to a preset first range to obtain a first abnormal area, where the preset first range is determined by a difference between the color value and the color threshold value; and if the processing module 32 determines that the color value is less than the color threshold value, the processing module 32 performs coordinate and boundary calibration on the target feature point according to a preset second range to obtain a second abnormal area, where the preset second range is determined by a difference between the color value and the color threshold value.

[0070] In a possible implementation, the processing module 32 generates a detection report according to the abnormal area, and the processing module 32 sends the detection report to a worker corresponding to the liquid crystal display panel.

[0071] It should be noted that the apparatus provided in the above examples is only used to illustrate the division of the above functional modules, and in actual applications, the above functions can be completed by different functional modules according to needs, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above. In addition, the apparatus and method embodiments provided in the above examples belong to the same concept, and the specific implementation process is detailed in the method embodiments, which will not be repeated here.

[0072] The present application also provides an electronic device, which refers to Figure 4 , Figure 4A structural schematic diagram of an electronic device is provided for an embodiment of the present application. The electronic device can include at least one processor 41, at least one network interface 44, a user interface 43, a memory 45, and at least one communication bus 42.

[0073] The communication bus 42 is configured to realize the connection and communication between the components.

[0074] The user interface 43 can include a display, a camera, and optionally a standard wired interface and a wireless interface.

[0075] The network interface 44 can optionally include a standard wired interface and a wireless interface (such as a Wi-Fi interface).

[0076] The processor 41 can include one or more processing cores. The processor 41 connects various parts of the server through various interfaces and lines, executes various functions of the server and processes data by running or executing instructions, programs, code sets or instruction sets stored in the memory 45, and calling data stored in the memory 45. Optionally, the processor 41 can be implemented in at least one of a hardware form of a digital signal processing (DSP), a field-programmable gate array (FPGA), and a programmable logic array (PLA). The processor 41 can be integrated with a combination of one or more of a central processing unit (CPU), a graphics processing unit (GPU), and a modem. The CPU is mainly used to process operating systems, user interfaces, and application programs. The GPU is responsible for rendering and drawing the content to be displayed on the display. The modem is used to process wireless communication. It can be understood that the above-mentioned modem can also not be integrated into the processor 41, but can be realized by a separate chip.

[0077] The memory 45 can include a random access memory (RAM) and a read-only memory (ROM). Optionally, the memory 45 includes a non-transitory computer-readable storage medium. The memory 45 can be configured to store instructions, programs, codes, code sets, or instruction sets. The memory 45 can include a program storage area and a data storage area. The program storage area can be configured to store instructions for implementing an operating system, instructions for at least one function (such as a touch function, a sound playing function, an image playing function, etc.), instructions for implementing the methods described above, etc. The data storage area can be configured to store data related to the methods described above, etc. The memory 45 can optionally be at least one storage device located away from the processor 41. As shown in Figure 4 the memory 45, as a computer storage medium, can include an operating system, a network communication module, a user interface module, and an application program of the electrical measurement method of the liquid crystal display panel.

[0078] In the electronic device shown in Figure 4 the user interface 43 can be configured to provide an interface for user input and obtain data input by the user. The processor 41 can be configured to invoke an application program of the electrical measurement method of the liquid crystal display panel stored in the memory 45, and when executed by one or more processors, cause the electronic device to perform the method(s) of one or more of the above-described embodiments.

[0079] It should be noted that, for the above-described method embodiments, in order to simply describe, they are all described as a series of action combinations, but those skilled in the art should know that the application is not limited to the action sequence described, because according to the application, certain steps can be performed in other sequences or at the same time. Secondly, those skilled in the art should know that the embodiments described in the specification all belong to preferred embodiments, and the actions and modules involved are not necessarily required by the application.

[0080] The application further provides a computer-readable storage medium storing instructions. When executed by one or more processors, the instructions cause an electronic device to perform the method(s) of one or more of the above-described embodiments.

[0081] In the above-described embodiments, the description of each embodiment has its own focus, and the parts not described in detail in a certain embodiment can be referred to the related description of other embodiments.

[0082] In several embodiments provided in the present application, it should be understood that the disclosed apparatus can be implemented in other manners. For example, the division of the apparatus embodiments is merely illustrative, and the division of units can be changed according to actual conditions, such as a combination or integration of some units, or a deletion of some features, or an addition of some features. In addition, the coupling or direct coupling or communication connection between the shown or discussed units can be indirect coupling or communication connection through some interfaces, devices or units, and can be in electrical, mechanical or other forms.

[0083] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, i.e., they may be located in one place or distributed on multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the embodiment.

[0084] In addition, the functional units in each embodiment of the present application can be integrated in one processing unit, or each unit can be physically present separately, or two or more units can be integrated in one unit. The integrated unit can be realized in the form of hardware or in the form of a software functional unit.

[0085] If the integrated unit is realized in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer readable storage medium. Based on this understanding, the technical solutions of the present application essentially or the part that contributes to the prior art or the whole or part of the technical solutions can be embodied in the form of a software product, which is stored in a storage medium, including a number of instructions to make a computer device (which can be a personal computer, a server or a network device, etc.) execute all or part of the steps of the embodiments of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, magnetic disk or optical disk, etc. Various program codes that can store program codes.

[0086] The above is only exemplary embodiments of the present disclosure, which cannot limit the scope of the present disclosure. That is, any equivalent changes and modifications made in accordance with the teachings of the present disclosure are still within the scope of the present disclosure. Other embodiments of the present disclosure will be easily obtained by those skilled in the art after considering the specification and the practical disclosure. The present application is intended to cover any variations, uses or adaptations of the present disclosure that follow the general principles of the present disclosure and include common knowledge or conventional techniques in the art that are not described in the present disclosure. The specification and examples are only considered as exemplary, and the scope and spirit of the present disclosure are defined by the claims.

Claims

1. A method for electrical testing of a liquid crystal display panel, characterized in that: The method comprises: A multi-channel signal generator is used to apply a sinusoidal voltage signal to the liquid crystal display panel; Acquire a time series of light intensity collected by a high-speed camera on a liquid crystal display panel after the sinusoidal voltage signal is applied; Analyzing the light intensity time series by mapping the relationship curve to obtain an analysis result for the liquid crystal display panel; Converting the analysis results into a two-dimensional distribution map and locating the abnormal area through an image processing algorithm; The method of analyzing the light intensity time series through the mapping relationship curve to obtain an analysis result for the liquid crystal display panel specifically includes: obtaining multiple excitation frequencies of the multi-channel signal generator; synchronously multiplying the light intensity time series with the sine signal and cosine signal of each excitation frequency to obtain a multiplication result; low-pass filtering the multiplication result to obtain the amplitude and phase of each frequency component; using the mapping relationship curve to map the amplitude and phase of each frequency component to a corresponding voltage value and current value; and according to the corresponding voltage value and current value, in combination with a series resistor-capacitor equivalent circuit model, inverting the analysis result of the liquid crystal display panel through multi-frequency point least squares fitting, wherein the analysis result includes the equivalent resistance, equivalent capacitance and loss angle of each pixel on the liquid crystal display panel. The method of acquiring a light intensity time series collected by a high-speed camera from a liquid crystal display panel after the sinusoidal voltage signal is applied specifically comprises: controlling the high-speed camera to continuously photograph the liquid crystal display panel at a frame rate that is a multiple of the excitation frequency in a constant backlight environment to obtain a photographed image; and matching the power-on timestamp of the multi-channel signal generator according to the photographed image to output the light intensity time series; The converting the analysis results into a two-dimensional distribution map and locating the abnormal area through an image processing algorithm specifically includes: obtaining a target pixel of the liquid crystal display panel; mapping the voltage value and current value of the target pixel in the analysis result onto a two-dimensional grid, and rendering it with pseudo color to obtain a thermal distribution map; extracting features from the thermal distribution map using a grayscale threshold segmentation algorithm and a connected domain extraction algorithm, and performing denoising in combination with morphological filtering to obtain target feature points; extracting the color value of the target feature point; and determining the abnormal area based on the size relationship between the color value and the color threshold, wherein the abnormal area includes a capacitance mutation and / or a loss hotspot. The determining of the abnormal area according to the size relationship between the color value and the color threshold specifically includes: if it is determined that the color value is greater than the color threshold, calibrating the coordinates and boundaries of the target feature point according to a preset first range to obtain a first abnormal area, and the preset first range is determined by the difference between the color value and the color threshold; if it is determined that the color value is less than the color threshold, calibrating the coordinates and boundaries of the target feature point according to a preset second range to obtain a second abnormal area, and the preset second range is determined by the difference between the color value and the color threshold.

2. The electrical testing method of a liquid crystal display panel according to claim 1, wherein: The method further comprises: Applying known DC voltage data to at least one group of test pixels on the liquid crystal display panel; Acquiring light intensity data of the liquid crystal display panel; A mapping relationship curve between light intensity and voltage is constructed according to the DC voltage data and the light intensity data.

3. The electrical testing method of a liquid crystal display panel according to claim 1, wherein: The method further comprises: Generate a detection report based on the abnormal area; The detection report is sent to the staff corresponding to the liquid crystal display panel.

4. An electrical measuring device for a liquid crystal display panel, characterized in that: The electrical measuring device comprises an acquisition module (31) and a processing module (32), wherein: The processing module (32) is used to apply a sinusoidal voltage signal to the liquid crystal display panel using a multi-channel signal generator; The acquisition module (31) is used to acquire a light intensity time series collected by a high-speed camera on a liquid crystal display panel after the sinusoidal voltage signal is applied; The processing module (32) is further configured to analyze the light intensity time series through a mapping relationship curve to obtain an analysis result for the liquid crystal display panel; The processing module (32) is further configured to convert the analysis result into a two-dimensional distribution map and locate the abnormal area through an image processing algorithm; The processing module (32) is used to obtain the analysis result for the liquid crystal display panel in the following manner: obtaining multiple excitation frequencies of the multi-channel signal generator; synchronously multiplying the light intensity time series with the sine signal and cosine signal of each excitation frequency to obtain the multiplication result; performing low-pass filtering on the multiplication result and obtaining the amplitude and phase of each frequency component; using the mapping relationship curve, mapping the amplitude and phase of each frequency component to a corresponding voltage value and current value; according to the corresponding voltage value and current value, combined with a series resistance-capacitance equivalent circuit model, inverting the analysis result of the liquid crystal display panel through multi-frequency point least squares fitting, the analysis result including the equivalent resistance, equivalent capacitance and loss angle of each pixel on the liquid crystal display panel; The acquisition module (31) is used to acquire the light intensity time series in the following manner: in a constant backlight environment, controlling the high-speed camera to continuously shoot the liquid crystal display panel at a frame rate that is a preset multiple of the excitation frequency to obtain a shot image; matching the power-on timestamp of the multi-channel signal generator according to the shot image, and outputting the light intensity time series; The processing module (32) is used to locate the abnormal area in the following manner: obtaining the target pixel of the liquid crystal display panel; mapping the voltage value and current value of the target pixel in the analysis result onto a two-dimensional grid, and rendering it with pseudo color to obtain a thermal distribution map; using a grayscale threshold segmentation algorithm and a connected domain extraction algorithm to extract features from the thermal distribution map, and combining it with morphological filtering to perform denoising to obtain target feature points; extracting the color value of the target feature point; determining the abnormal area according to the size relationship between the color value and the color threshold, the abnormal area including capacitance mutation and / or loss hotspot; wherein, determining the abnormal area according to the size relationship between the color value and the color threshold specifically includes: if it is determined that the color value is greater than the color threshold, performing coordinate and boundary calibration on the target feature point according to a preset first range to obtain a first abnormal area, the preset first range being determined by the difference between the color value and the color threshold; if it is determined that the color value is less than the color threshold, performing coordinate and boundary calibration on the target feature point according to a preset second range to obtain a second abnormal area, the preset second range being determined by the difference between the color value and the color threshold.

5. An electronic device, characterized in that: The electronic device comprises a processor (41), a memory (45), a user interface (43) and a network interface (44), wherein the memory (45) is used to store instructions, the user interface (43) and the network interface (44) are both used to communicate with other devices, and the processor (41) is used to execute the instructions stored in the memory (45) so that the electronic device executes the method according to any one of claims 1 to 3.

6. A computer-readable storage medium, characterized in that The computer-readable storage medium stores instructions, and when the instructions are executed, the method according to any one of claims 1 to 3 is performed.

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