Test method, system, storage medium and program product

Abstract

The present invention provides a testing method, system, storage medium, and program product that can be applied to the field of server technology. The testing method includes: obtaining sensitive parameters and device data corresponding to a device under test from a data set, wherein the device under test is a substitute for a target device, and the sensitive parameters represent the degree of impact of the device data on the performance of the target device; controlling multiple generating devices to output multiple excitation signals based on the device data, so as to perform an excitation test on the device under test using the multiple excitation signals; and obtaining a test result for the device under test based on the sensitive parameters, the test data obtained during the excitation test, and environmental data.

Description

Technical Field

[0001] The present invention relates to the technical field of servers, and in particular to a testing method, system, storage medium and program product. Background Art

[0002] Application scenarios such as enterprise applications, cloud computing, and big data analysis place high demands on the read and write performance of server hard drives. Reliability testing can simulate various scenarios in real-world applications and quantitatively evaluate hard drive performance indicators such as read and write speed, latency, and throughput. Related technologies have combined hard drives and fans from different manufacturers for the same server, enabling a certain degree of prediction of hard drive performance based on noise. However, physical hardware combination testing in related technologies requires testing for each combination, increasing the complexity and workload of the test. Compatibility issues between different types of hardware can also lead to unstable tests. Summary of the Invention

[0003] In view of the above problems, the present invention provides a testing method, apparatus, system, electronic device, storage medium and program product.

[0004] According to a first aspect of the present invention, a testing method is provided, comprising: obtaining sensitive parameters and device data corresponding to a device to be tested from a data set, wherein the device to be tested is a substitute device for a target device, and the sensitive parameters characterize the degree of influence of the device data on the performance of the target device; controlling a plurality of generating devices to output a plurality of excitation signals based on the device data, so as to perform an excitation test on the device to be tested using the plurality of excitation signals; and obtaining a test result of the device to be tested based on the sensitive parameters, the test data obtained in the excitation test, and the environmental data.

[0005] The second aspect of the present invention provides a testing device, comprising: a data acquisition module for acquiring sensitive parameters and equipment data corresponding to the device to be tested from a data set, wherein the device to be tested is a substitute device for the target device, and the sensitive parameters characterize the degree of influence of the equipment data on the performance of the target device; a signal output module for controlling multiple generating devices to output multiple excitation signals based on the equipment data, so as to perform excitation testing on the device to be tested using the multiple excitation signals; and a result determination module for obtaining the test results of the device to be tested based on the sensitive parameters, the test data acquired in the excitation test, and the environmental data.

[0006] A third aspect of the present invention provides a testing system, comprising: a memory; and a processor configured to execute the above-mentioned testing method according to instructions and data stored in the memory.

[0007] A fourth aspect of the present invention provides an electronic device, comprising: one or more processors; a memory for storing one or more computer programs, wherein the one or more processors execute the one or more computer programs to implement the steps of the above method.

[0008] The fifth aspect of the present invention further provides a computer-readable storage medium having a computer program or instructions stored thereon, which implements the steps of the above method when the computer program or instructions are executed by a processor.

[0009] The sixth aspect of the present invention further provides a computer program product, comprising a computer program or instructions, which implement the steps of the above method when executed by a processor. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] The above contents and other objects, features and advantages of the present invention will become more apparent through the following description of the embodiments of the present invention with reference to the accompanying drawings, in which:

[0011] Figure 1 A diagram illustrating an application scenario of a testing method, apparatus, system, electronic device, storage medium, and program product according to an embodiment of the present invention is shown;

[0012] Figure 2 A flow chart of a testing method according to an embodiment of the present invention is shown;

[0013] Figure 3 A flow chart of another testing method according to an embodiment of the present invention is shown;

[0014] Figure 4 Shows a structural block diagram of a testing device according to an embodiment of the present invention;

[0015] Figure 5 shows a block diagram of a test system according to an embodiment of the present invention;

[0016] Figure 6 A block diagram of an electronic device suitable for implementing a testing method according to an embodiment of the present invention is shown. DETAILED DESCRIPTION

[0017] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are exemplary only and are not intended to limit the scope of the present invention. In the following detailed description, for ease of explanation, many specific details are set forth to provide a comprehensive understanding of embodiments of the present invention. However, it is apparent that one or more embodiments may also be implemented without these specific details. In addition, in the following description, descriptions of known structures and technologies are omitted to avoid unnecessary confusion of the concept of the present invention.

[0018] The terms used herein are only for describing specific embodiments and are not intended to limit the present invention. The terms "comprise", "include", etc. used herein indicate the presence of the features, steps, operations and / or components, but do not exclude the presence or addition of one or more other features, steps, operations or components.

[0019] All terms used herein (including technical and scientific terms) have the meanings commonly understood by those skilled in the art unless otherwise defined. It should be noted that the terms used herein should be interpreted as having a meaning consistent with the context of this specification and should not be interpreted in an idealized or overly rigid manner.

[0020] When expressions such as "at least one of A, B, and C, etc." are used, they should generally be interpreted in accordance with the meaning commonly understood by those skilled in the art (for example, "a system having at least one of A, B, and C" should include but is not limited to a system having A alone, B alone, C alone, A and B, A and C, B and C, and / or A, B, C, etc.).

[0021] In some examples, testing is performed on combinations of hard drives and fans from different manufacturers. For example, some hard drives may use the newer third-generation serial interface, while some fans may utilize a specialized pulse-width modulation interface. This requires extensive compatibility testing to ensure that the different components work together properly. Incompatible combinations can cause the server to fail to boot properly or operate unstably, requiring significant time for troubleshooting and adjustments, resulting in low testing efficiency.

[0022] Furthermore, different manufacturers' hard drives and fans use different firmware versions. Older firmware versions may have known compatibility issues, while newer versions may introduce new issues. This requires testing various firmware versions, increasing the complexity and workload.

[0023] In some cases, some drives may experience significant degradation in read and write performance under high load, while others may have better caching strategies, providing more stable performance. To fully evaluate performance, each drive requires testing under varying loads and data patterns, which increases the number of test items and testing time.

[0024] In some examples, a method for predicting hard drive read and write performance based on noise is established by establishing baseline curves for different hard drive read and write performance characteristics; converting the measured hard drive noise signal to generate a hard drive noise curve; comparing the hard drive noise curve with the baseline curve, and then testing the hard drive performance based on a preset calculation formula. This approach, to a certain extent, enables the prediction of hard drive read and write performance based on noise. However, this approach only considers the impact of noise on hard drive read and write performance, lacking a comprehensive consideration of the impact of multiple factors, resulting in low prediction accuracy.

[0025] In some cases, certain hard drives draw high current when operating under heavy load, while fans running at high speeds can also increase power consumption. If the combination of hard drives and fans exceeds the server's power supply capacity, or if power distribution is inappropriate, this can lead to insufficient power, causing server instability, such as reboots and freezes.

[0026] For example, some hard drives may experience cache overflows under specific workloads, resulting in a sudden drop in read and write speeds. Instant or unstable fan speed adjustments can cause internal server temperature fluctuations, further impacting the performance of the hard drives and other hardware. This performance volatility and unpredictability pose risks to server stability testing, requiring extensive testing and adjustments to ensure stable server operation under a variety of conditions.

[0027] Based on the above problems, the present invention provides a testing method, including: obtaining sensitive parameters and equipment data corresponding to the device to be tested from a data set, wherein the device to be tested is a substitute device for the target device, and the sensitive parameters characterize the degree of influence of the equipment data on the performance of the target device; controlling multiple generating devices to output multiple excitation signals based on the equipment data, so as to perform excitation testing on the device to be tested using multiple excitation signals; and obtaining test results of the device to be tested based on the sensitive parameters, the test data obtained in the excitation test, and the environmental data.

[0028] According to an embodiment of the present invention, by utilizing the device data in the data set based on different test requirements to control multiple generating devices to output different excitation signals to perform excitation testing on the device to be tested, since the test data and environmental data obtained in the excitation test are used as variables combined with the sensitive parameters corresponding to the device to be tested to perform testing, test results that replace the physical test of the target device under different test conditions are obtained, thereby avoiding stability and compatibility issues in the physical hardware testing process, and achieving multiple combination test results of different generating devices and different devices to be tested, thereby improving test efficiency and reducing test time.

[0029] Figure 1 An application scenario diagram of a testing method, apparatus, system, electronic device, storage medium, and program product according to an embodiment of the present invention is shown.

[0030] like Figure 1 As shown, the application scenario according to this embodiment may include a processor 101, a device under test 102, and a generator 103. The processor 101 may be a server that provides various services, such as a baseboard controller. For example, the processor 101 may acquire relevant data corresponding to the device under test 102 in real time and control the generator 103 based on the relevant data.

[0031] DUT 102 can be a device integrated into processor 101, such as a hard drive dummy, that replaces a real target device (e.g., a mechanical hard drive) in processor 101. DUT 102 can include a signal interface that can be connected to processor 101 to provide power to DUT 102 and enable data transmission between it and other devices (e.g., a generator).

[0032] The generator 103 can be placed at a position corresponding to the device to be tested 102 according to actual test requirements, and is used to emit an excitation signal to perform an excitation test on the device to be tested 102. It is understood that the specific location of the generator 103 is based on the standard of accurately emitting the excitation signal, and is not specifically limited here.

[0033] It should be noted that the test method provided in the embodiment of the present invention can generally be executed by the processor 101. Accordingly, the test device provided in the embodiment of the present invention can generally be set in the processor 101. The test method provided in the embodiment of the present invention can also be executed by a server or server cluster that is different from the processor 101 and can communicate with the processor 101. Accordingly, the test device provided in the embodiment of the present invention can also be set in a server or server cluster that is different from the processor 101 and can communicate with the processor 101.

[0034] It should be understood that Figure 1 The numbers of processors, devices under test, and generators are merely illustrative. Any number of processors, devices under test, and generators may be used depending on the implementation requirements.

[0035] Figure 2 A flow chart of a testing method according to an embodiment of the present invention is shown.

[0036] like Figure 2 As shown, the testing method of this embodiment includes operations S210 to S230.

[0037] In operation S210 , sensitive parameters and device data corresponding to the device under test are obtained from the data set, wherein the device under test is a substitute device for the target device, and the sensitive parameters represent the degree of influence of the device data on the performance of the target device.

[0038] In an embodiment of the present invention, a data set may be used to store sensitive parameters, device data, and other relevant data related to the device to be tested. The data set may be stored in a target file on a server or in cloud storage, and the specific form is not limited here. The target device may be a device in a server used for reading and writing data, storing data, and backing up data. The data such as the size, installation features, weight, and moment of inertia of the device to be tested may be consistent with the target device, so as to meet the standard of receiving the excitation signal of the target device instead of the target device and the signal transmission path does not produce deviations. The device data may include the device data of the target device, the device data of the device generating the excitation signal in the server, and the data of other related devices.

[0039] For example, device data is obtained by collecting multiple device data of target devices and excitation signal devices of different types or different manufacturers; sensitive parameters are obtained through experiments or finite element analysis; and the obtained device data and sensitive parameters are stored in the target file of the server, and the device data and sensitive parameters are obtained in real time from the data set according to actual needs.

[0040] In operation S220 , the plurality of generating devices are controlled to output a plurality of excitation signals based on the device data, so as to perform an excitation test on the device to be tested using the plurality of excitation signals.

[0041] In an embodiment of the present invention, the generating device may be a substitute for the excitation signal device in the server, and may simulate the excitation signal device according to actual test requirements and emit different types of excitation signals.

[0042] For example, a suitable generator is selected based on at least one of the excitation signal type, frequency range and output power required by the device to be tested, and the programmable control interface of the generator is used to send control instructions through the processor to change the parameters of the output signal to perform an excitation test on the device to be tested.

[0043] In operation S230 , a test result of the device to be tested is obtained based on the sensitive parameters, the test data obtained in the stimulus test, and the environmental data.

[0044] In an embodiment of the present invention, the test data may include multiple types of test data based on different generating devices. The environmental data may include at least one of temperature data and humidity data, and the environmental data may be obtained using different types of sensors. The sensitive parameters may include multiple types of sensitive parameters based on different test data.

[0045] For example, the preset thresholds corresponding to different test data are determined using the test method or finite element analysis method, so as to determine the test results of the device to be tested based on the preset thresholds, sensitive parameters corresponding to different test data, different types of test data and environmental data.

[0046] According to an embodiment of the present invention, by utilizing the device data in the data set based on different test requirements to control multiple generating devices to output different excitation signals to perform excitation testing on the device to be tested, since the test data and environmental data obtained in the excitation test are used as variables combined with the sensitive parameters corresponding to the device to be tested to perform testing, test results that replace the physical test of the target device under different test conditions are obtained, thereby avoiding stability and compatibility issues in the physical hardware testing process, and achieving multiple combination test results of different generating devices and different devices to be tested, thereby improving test efficiency and reducing test time.

[0047] It can be understood that the above has described how to obtain the test results of the device to be tested. The following will describe how to determine different thresholds for different test data.

[0048] According to an embodiment of the present invention, the test data includes vibration test data and noise test data; the method also includes: determining a vibration threshold for the vibration test data, wherein, when the vibration acceleration amplitude of the target device is greater than or equal to the vibration threshold, the performance of the target device is degraded; determining a noise threshold for the noise test data, wherein, when the sound pressure amplitude of the target device is greater than or equal to the noise threshold, the performance of the target device is degraded.

[0049] In an embodiment of the present invention, vibration test data may be the vibration frequency and vibration acceleration amplitude generated by a vibration generating device obtained through an excitation test. Noise test data may be the acoustic wave signal generated by a noise generating device during an excitation test that corresponds to the spectrum of an excitation signal device (e.g., a fan).

[0050] In embodiments of the present invention, a vibration threshold may represent the critical value at which a target device (e.g., a mechanical hard drive) will experience performance degradation under the influence of vibration acceleration amplitude. Specifically, when the vibration acceleration amplitude emitted by an external device is greater than or equal to the vibration threshold, the target device's performance begins to degrade. A noise threshold may represent the critical value at which a target device will experience performance degradation under the influence of sound pressure amplitude. Specifically, when the sound pressure amplitude emitted by an external device is greater than or equal to the noise threshold, the target device's performance begins to degrade.

[0051] In a feasible embodiment, the noise threshold can be determined by vibration analysis or finite element analysis. The vibration threshold is determined by modal analysis and finite element analysis.

[0052] For example, vibration analysis can be used to determine the noise threshold. Based on the hard drive's structural and material parameters, methods such as finite element analysis can be used to simulate the hard drive's vibration response under varying sound pressures, including acceleration, displacement, and velocity. This can then analyze the relationship between the hard drive's vibration and its performance indicators. For example, vibration can cause the spacing between the hard drive's head and platter to change, affecting read and write performance. Experimental or theoretical analysis can be used to determine the quantitative relationship between vibration amplitude and hard drive performance loss. Combining the vibration model and the relationship between vibration and performance, the sound pressure amplitude at which hard drive performance loss reaches a certain threshold, known as the critical sound pressure, can then be calculated.

[0053] According to an embodiment of the present invention, by focusing on the vibration characteristics of the hard disk, the response of the internal structure of the hard disk to the vibration caused by sound pressure can be deeply analyzed. It is highly targeted at the problem of hard disk performance degradation caused by vibration, and the critical sound pressure values such as head and disk collision, data reading and writing errors caused by vibration can be found more accurately, thereby improving the accuracy of the noise threshold.

[0054] For example, methods of using modal analysis and finite element analysis to determine the vibration threshold may include: obtaining the geometric dimension data of the hard disk from the hard disk manufacturer, such as the disk diameter, thickness, head arm length, etc., as well as the material properties of the main components of the hard disk, such as density, elastic modulus, Poisson's ratio, etc.; then using finite element analysis software to create a three-dimensional geometric model of the hard disk; defining the boundary conditions of the three-dimensional geometric model based on the actual installation and use of the hard disk, such as the position of the mounting screw holes for fixing the hard disk; and then solving the hard disk mode through finite element analysis software to obtain the hard disk's natural frequency and modal vibration shape, and thus obtaining the response characteristics of the hard disk at different vibration frequencies.

[0055] For example, vibration acceleration loads of varying amplitudes can be applied to the model, and combined with modal analysis results, the hard drive's response at different frequencies can be considered. Finite element analysis is used to calculate the hard drive's response quantities, such as stress, strain, and displacement, under vibration acceleration. Based on the calculated response quantities, the extent to which the hard drive's performance may be affected is assessed. For example, excessive displacement of the head arm can cause the spacing between the head and the platter to change, impacting read and write performance. By setting thresholds for performance indicators, such as the maximum allowable displacement of the head arm, the corresponding critical acceleration is determined.

[0056] According to an embodiment of the present invention, the combined method of modal analysis and finite element analysis mainly relies on computer software and hardware, does not require a large amount of experimental equipment, and has relatively low software costs. Compared with traditional experimental testing methods, it can greatly save costs and time.

[0057] According to an embodiment of the present invention, the sensitive parameters include vibration sensitive parameters corresponding to the vibration test data and noise sensitive parameters corresponding to the noise test data; based on the sensitive parameters, the test data and the environmental data acquired in the excitation test, a test result of the device to be tested is obtained, including: determining a first change corresponding to the vibration test data based on the vibration sensitive parameters, the vibration test data, the vibration threshold and the environmental data; determining a second change corresponding to the noise test data based on the noise sensitive parameters, the noise test data, the noise threshold and the environmental data; and obtaining a test result for the performance change of the device to be tested by weighting the first change using a first weight and weighting the second change using a second weight.

[0058] In embodiments of the present invention, a vibration sensitivity parameter may represent the sensitivity coefficient of target device performance under different combinations of vibration test data and environmental data. A noise sensitivity parameter may represent the sensitivity coefficient of target device performance under different combinations of noise test data and environmental data. It will be appreciated that the sensitivity parameter is proportional to the rate of performance degradation of the target device.

[0059] In an embodiment of the present invention, the first variation may represent the degradation of target device performance under different environmental data and different vibration test data. The second variation may represent the degradation of target device performance under different environmental data and different noise test data.

[0060] Considering that testing all combinations of N fan types and M hard drives in the related art requires N×M tests, each of which requires time to set up the environment, run the test program, and record and analyze the data, the present invention addresses this technical issue by utilizing a performance impact function between temperature, vibration, and noise test data and the read and write performance of a mechanical hard drive to perform performance testing. This performance test can characterize the ratio of the hard drive's read and write rates under different stimulus conditions to a baseline, where the baseline can be the hard drive's read and write rates in an idle or low-load state.

[0061] For example, by testing the read and write performance of multiple mechanical hard disks under different temperature data, different device vibration characteristics, and different device noise characteristics, we can analyze the impact of temperature data, vibration test data, and noise test data on the read and write performance of mechanical hard disks. A mathematical function relationship between the three can be established. The read and write loss caused by different device vibration characteristics under different temperature data can be expressed as the following formula (1):

[0062] (1);

[0063] Among them, ΔIOPS V It can represent the hard disk read / write drop value under different temperature data and different equipment vibration characteristics, that is, the first change. VThis parameter represents the sensitivity coefficient of the hard drive's read / write performance under the combination of device vibration characteristics and temperature data. It is a function of vibration frequency f1 and temperature T. A represents the vibration acceleration amplitude, including the peak acceleration. A0 represents the vibration threshold, indicating the value above which hard drive vibration begins to decrease.

[0064] Similarly, the read / write loss caused by different device noise characteristics at different temperatures can be expressed as follows:

[0065] (2);

[0066] Among them, ΔIOPS N It can represent the hard disk read / write drop value under different temperature data and different device noise characteristics, that is, the second variation. N It can be the sensitivity coefficient of the hard disk read and write performance under the combination of device noise characteristics and temperature data. It is a function of the noise frequency f2 and temperature T. P can represent the noise sound pressure value, and P0 can represent the noise threshold, indicating that the hard disk read and write performance begins to decline after exceeding this sound pressure value.

[0067] Furthermore, after determining the first change amount and the second change amount, the first change amount can be weighted using the first weight and the second change amount can be weighted using the second weight to obtain a test result for the performance change amount of the device to be tested, as shown in the following formula (3):

[0068] (3);

[0069] Here, w1 may be a first weight corresponding to the first change amount, and w2 may be a second weight corresponding to the second change amount.

[0070] For example, you can set the temperature to 40°C, adjust the vibration table frequency to 50Hz, and the vibration acceleration amplitude to 0.1g. Then, mount a specific hard drive on the vibration table, start the vibration, and test the drive's read and write performance. Gradually adjust the vibration level to obtain the vibration threshold at 40°C and 50Hz, as well as the function of vibration frequency f1 and temperature T. Similarly, through extensive experimentation, you can determine the noise threshold, vibration threshold, function of vibration frequency and temperature, and function of noise frequency and temperature for hard drives of different models and manufacturers.

[0071] According to embodiments of the present invention, the aforementioned performance impact function only requires N tests to obtain N×M combinations of results, significantly reducing testing time and shortening the test cycle to 1 / M of the original, thereby improving testing efficiency. Furthermore, by utilizing the performance impact function to evaluate combination results, when testing new fan or hard drive types, there is no need to make large-scale adjustments to the test process. Simply incorporating the new device into the function algorithm model and performing a small amount of testing can yield new combination results. This provides strong adaptability and flexibility, enabling rapid response to market demands and technological changes.

[0072] According to an embodiment of the present invention, the method also includes: determining a vibration sensitivity parameter based on the device vibration signal detected at the current moment, the vibration threshold and the current performance data of the target device; and determining a noise sensitivity parameter based on the device noise signal detected at the current moment, the noise threshold and the current performance data.

[0073] In an embodiment of the present invention, the device vibration signal may include the vibration acceleration amplitude of the target device measured at a vibration-sensitive frequency; the device noise signal may include the sound pressure amplitude measured at a noise-sensitive frequency. A vibration sensitivity parameter may be determined based on the difference between the vibration acceleration amplitude of the device measured at the noise-sensitive frequency and a vibration threshold, as well as a performance degradation value of the target device. A noise sensitivity parameter may be determined based on the difference between the sound pressure amplitude measured at the vibration-sensitive frequency and the noise threshold, as well as a performance degradation value of the target device.

[0074] For example, the difference between the measured vibration acceleration amplitude of the device at the vibration sensitive frequency and the vibration threshold, and the difference between the measured sound pressure amplitude at the noise sensitive frequency and the noise threshold are determined respectively; thereby, the ratio between each difference and the performance degradation value of the target device is determined as the respective sensitive parameters.

[0075] According to an embodiment of the present invention, a vibration sensitivity parameter is determined based on a device vibration signal detected at a current moment, a vibration threshold, and current performance data of a target device, including: determining a first difference between the device vibration signal and the vibration threshold; and determining a ratio between the first difference and the current performance data as the vibration sensitivity parameter.

[0076] In an embodiment of the present invention, a first difference value can be obtained by subtracting the currently measured vibration acceleration amplitude from the vibration threshold value. Current performance data of the target device at the current moment can then be determined, and the vibration sensitivity parameter can be calculated by calculating the ratio between the first difference value and the current performance data. Furthermore, the vibration sensitivity parameter can be stored in a target file or a cloud-based data set.

[0077] According to an embodiment of the present invention, a noise-sensitive parameter is determined based on the device noise signal, noise threshold, and current performance data detected at the current moment, including: determining a second difference between the device noise signal and the noise threshold; and determining the ratio between the second difference and the current performance data as the noise-sensitive parameter.

[0078] In an embodiment of the present invention, a first difference value can be obtained by subtracting the currently measured sound pressure amplitude from the noise threshold value. Current performance data of the target device at the current moment can then be determined, and the noise sensitivity parameter can be calculated by calculating the ratio of the second difference value to the current performance data. Furthermore, the noise sensitivity data can be stored in a target file or a cloud storage dataset.

[0079] For example, after the server is powered on, the baseboard controller can be used to read the unique identification code of the inserted hard disk through the hard disk backplane array card. The unique identification code can be used to determine the manufacturer, model and other information of the hard disk, and the hard disk unique identification code can be associated with the hard disk noise sensitivity database.

[0080] According to an embodiment of the present invention, the method also includes: determining the test sensitive parameters of the device to be tested using multiple initial frequency data and multiple initial amplitude data in the equipment data; and determining the target position information of each of the multiple detection devices from the initial position information of each of the multiple detection devices based on the test sensitive parameters, sensitive parameters and parameter thresholds.

[0081] In an embodiment of the present invention, testing sensitive parameters can be performed by pre-testing the device under test before performance testing to obtain the sensitive parameters of the device under test at different initial positions. Parameter thresholds can be used to detect the error between the tested sensitive parameters and the actual sensitive parameters of the target device. The detection device can include a variety of sensors based on actual testing requirements, such as temperature sensors, vibration sensors, and temperature sensors. The detection device can be installed within the device under test.

[0082] For example, sensors can be used to collect sensitive parameters of the device to be tested at different locations, such as temperature, vibration acceleration, noise, etc., so that the sampling rate and accuracy of the sensor meet the test requirements; thereby, key characteristic parameters are extracted from the collected data, such as temperature change rate, vibration frequency and amplitude, noise intensity, etc.; and the extracted characteristic parameters are compared with the sensitive parameters in the database using the threshold method. If the difference between the collected parameters and the parameters in the database is within the preset threshold range, they are considered to match.

[0083] For example, at multiple candidate locations of a marker detection device, each location has a unique identifier. Parameter matching verification can be performed on the data collected at each candidate location. If the matching conditions are met (for example, the sensitive parameters are substantially consistent or the parameter threshold meets the preset conditions), the location is determined as a response point. The location information of the determined response point is recorded, including coordinates, identifiers, etc. Furthermore, an automated robot or robotic arm is used to precisely place the detection device (such as a temperature sensor, vibration sensor, or noise sensor) at the determined response point, and environmental data and test data are obtained in real time based on actual test requirements. It can be understood that the hard drive response point can represent the corresponding position of the vibration sensor and noise sensor on the hard drive during the test. The characteristics of the vibration and noise test results at this point, combined with temperature conditions, can be used to determine the hard drive's read and write performance.

[0084] According to the embodiment of the present invention, by matching the current test sensitive parameters with the parameters in the database, the response points can be automatically determined and the detection devices can be arranged, thereby improving the test efficiency and the accuracy of data collection.

[0085] According to an embodiment of the present invention, based on the test sensitive parameters, sensitive parameters and parameter thresholds, the target position information of each of the multiple detection devices is determined from the initial position information of each of the multiple detection devices, including: determining the difference between the test sensitive parameters and the sensitive parameters; obtaining the target position information when the difference is less than or equal to the parameter threshold, so as to obtain test data and environmental data using the multiple detection devices at the target position information.

[0086] In an embodiment of the present invention, the detection devices can be arranged at different positions of the hard disk, and performance tests can be carried out under excitations of different frequencies and different sound pressure amplitudes to obtain test sensitive parameters of the device to be tested; when the obtained test sensitive parameters are basically consistent with the sensitive parameters in the database, or the parameter threshold meets the preset conditions, the target position information is determined as the response point of the device to be tested, and the detection device is arranged at this position.

[0087] According to an embodiment of the present invention, since the signal at the target position information (response point) is highly representative and stable, the data collected by the detection device here is relatively less affected by external interference factors, which can effectively reduce measurement errors and improve the credibility and reliability of the data.

[0088] According to an embodiment of the present invention, the device data includes the device identification of the target device, the device vibration data and device vibration characteristics of the target device, the device noise data and device noise characteristics, and the generating device includes a vibration generating device and a noise generating device; based on the device data, multiple generating devices are controlled to output multiple excitation signals, including: controlling the vibration generating device to output the vibration excitation signal based on the device identification and the device vibration characteristics, and controlling the noise generating device to output the noise excitation signal based on the device identification and the device noise characteristics.

[0089] In embodiments of the present invention, the vibration generator may be a device that emits different vibration excitation signals based on actual test requirements. The noise generator may be a device that emits different noise excitation signals based on actual test requirements. It is understood that the types of vibration and noise generators are based on the requirements of the excitation signal devices in the simulation server, and the specific types are not limited herein.

[0090] In an embodiment of the present invention, the device identification can be determined by combining the model, manufacturer data, and version signal of the target device. The device vibration data can be a vibration signal directly acquired using a vibration generator, and the device vibration characteristics can be features extracted from the device vibration data. The device noise data can be a noise signal directly acquired using a noise generator, and the device noise characteristics can be features extracted from the device noise data.

[0091] For example, using a vibration generator, methods for generating a vibration signal with controllable frequency and amplitude may include: placing an electric vibration table on a solid foundation to ensure that it is level and stable, and connecting the output of the function generator to the input of a power amplifier, and the output of the power amplifier to the vibration generator; installing an acceleration sensor on the vibration table to ensure that the sensor is in close contact with the table, and setting the required vibration signal frequency and amplitude on the function generator; turning on the power, starting the vibration generator, and observing whether the signal collected by the sensor is consistent with the set value. A data acquisition system can be used to monitor the vibration signal in real time, and the output of the power amplifier can be adjusted through a feedback control system to ensure the stability and accuracy of the vibration signal.

[0092] For example, methods of using a noise generator to generate white noise that matches the fan noise spectrum may include: extracting key features of the fan noise spectrum, such as the main frequency components, peak frequency, frequency band energy distribution, etc., and then establishing a mathematical model of the fan noise spectrum based on the key features; using a noise generator to generate broadband white noise whose output frequency range meets the fan noise frequency range; using a spectrum analyzer to monitor the white noise spectrum in real time, and adjusting the output signal of the noise generator to make the white noise spectrum match the fan noise spectrum.

[0093] According to the embodiment of the present invention, by comprehensively considering the impact of vibration data, noise data and environmental data in the actual environment on hard disk performance, it avoids unilaterally considering the impact of noise or vibration, and improves the accuracy of the test results.

[0094] According to an embodiment of the present invention, the method also includes: updating the test data using an update coefficient to obtain updated test data; segmenting the updated test data using a window function to obtain multiple segmented test data; converting the multiple segmented test data into the frequency domain to obtain frequency domain features corresponding to the test data; and obtaining equipment vibration features and equipment noise features based on the frequency domain features and the power spectrum data determined by the frequency domain features.

[0095] In embodiments of the present invention, the update coefficients can be used to calibrate the acquired test data. A window function, such as a rectangular window function, can be used to smooth the signal in the updated test data. Frequency domain features can be obtained by converting the time domain features of the segmented test data. Power spectrum data can be obtained by processing the frequency domain features. Device vibration features can include vibration frequency and vibration intensity. Device noise features can be frequency distribution characteristics of the noise.

[0096] For example, the test data is updated and calibrated using update coefficients corresponding to the vibration and noise test data, respectively, to obtain updated vibration and noise data. A rectangular window is used to segment the updated vibration and noise data, respectively, to obtain the spectrum changes over different time periods, namely the segmented test data. A fast Fourier transform is performed on the small signal segments within the segmented test data to obtain the signal's frequency domain representation. The power spectrum and power spectral density (PSD) corresponding to the vibration and noise test data are then calculated based on the frequency domain representation. By analyzing the vibration PSD spectrum, the vibration characteristics of the hard drive, such as the resonant frequency and vibration intensity, can be identified. By analyzing the noise PSD spectrum, the frequency distribution of the noise can be determined, allowing the identification of the primary noise source and interference frequency.

[0097] According to an embodiment of the present invention, the update coefficient includes a first update coefficient corresponding to the vibration test data; the method also includes: determining the actual amplitude corresponding to the vibration test data based on the peak value of the vibration test data; and determining the first update coefficient using the standard amplitude and the actual amplitude generated by the vibration calibration equipment.

[0098] In an embodiment of the present invention, the actual amplitude may be obtained by calculating the peak value or the root mean square value of the time domain signal. The standard amplitude of the vibration test data may be generated by a calibrator.

[0099] For example, a vibration calibrator is used to generate a vibration signal of known frequency and amplitude as a standard reference, and ensure that the frequency range and amplitude range of the calibrator cover the measurement range of the hard disk vibration signal; a vibration sensor is used to collect and process the vibration signal in real time to obtain the actual amplitude, and then the ratio between the standard amplitude and the actual amplitude is determined as the first update coefficient.

[0100] According to an embodiment of the present invention, the update coefficient includes a second update coefficient corresponding to the noise test data; the method also includes: determining the actual sound pressure data of the noise test data based on the sampling data of the noise test data; and determining the ratio between the standard sound pressure data generated by the noise calibration equipment and the actual sound pressure data as the second update coefficient.

[0101] In an embodiment of the present invention, the actual sound pressure data may be obtained by calculating the noise signal obtained by the noise sensor using a root mean square method, and the standard sound pressure data may be obtained by generating a sound level calibrator.

[0102] For example, a sound level calibrator is used to generate a standard noise signal with a known sound pressure level. The frequency range and sound pressure level range of the sound level calibrator can match the hard disk noise test requirements. A noise sensor (such as a microphone) is placed at the measurement position specified by the calibrator (at the target position information) to ensure that the sound field environment of the sensor and the calibrator meets the calibration requirements. The sound level calibrator is started to generate a noise signal with a standard sound pressure level. The signal output by the sensor at this time is collected by a data acquisition system, and the actual sound pressure data of the collected noise test data is calculated through the root mean square value. The ratio between the standard sound pressure data and the actual sound pressure data is used as the second update coefficient.

[0103] According to embodiments of the present invention, even sensors of the same model may have varying sensitivities. Signal calibration can determine calibration coefficients based on standard signals, adjusting the sensor output to accurately reflect actual vibration or noise levels. Environmental factors (such as temperature and humidity) can affect sensor performance. Calibration can be performed under specific environmental conditions to compensate for detection deviations caused by these factors, thereby improving the accuracy of test results.

[0104] Figure 3 A flow chart of another testing method according to an embodiment of the present invention is shown.

[0105] like Figure 3 As shown, the test method of this embodiment can be implemented by multiple devices in a test system, which may include a detection device, a processor, a generator, and a device to be tested. The test method may include operations S301 to S305.

[0106] In operation S301 , a plurality of detection devices are used to detect signals received by a target device at a current moment, which may include a device noise signal and a device vibration signal.

[0107] In operation S302, the processor determines sensitive parameters based on the acquired signal, preset thresholds, and current performance data of the target device and stores them in a data set. The preset thresholds may include a vibration threshold and a noise threshold, and the sensitive parameters may include a vibration sensitivity parameter and a noise sensitivity parameter.

[0108] In operation S303 , device data of the target device is acquired from the data set, and a plurality of generating apparatuses are controlled based on the device data.

[0109] In operation S304 , the generating device outputs a stimulus signal required for testing to perform a stimulus test on the device to be tested, thereby obtaining test data and environmental data.

[0110] In operation S305 , a test result of the device to be tested is obtained according to the acquired sensitive parameters, test data, and environmental data.

[0111] In another feasible embodiment, the testing method may include operations S310 to S340.

[0112] In operation S310, a vibration and noise generating device is designed. For example, vibration and noise excitation tests are conducted on individual fans in different types of servers to obtain a database of vibration and noise excitations for fans of different models and manufacturers. A programmable vibration and noise generating device is designed to simulate the vibration and noise generated by the server fans during operation. The generating device may include: a vibration generator, a noise generator, and a controller. The vibration generator can generate a vibration signal with controllable frequency and amplitude, the noise generator can generate white noise that matches the fan noise spectrum, and the controller can adjust the vibration and noise intensity according to preset parameters.

[0113] In operation S320, a data acquisition device is designed. For example, a hard drive dummy is designed. The dummy's dimensions, mounting features, weight, moment of inertia, and other parameters are consistent with those of a real mechanical hard drive, ensuring that vibration and noise transmission paths are consistent. The dummy includes a temperature sensor, a vibration acceleration sensor, and a noise sensor for real-time temperature, vibration, and noise signal acquisition.

[0114] In operation S330, a mechanical hard disk read / write performance function is constructed. For example, the read / write performance of a large number of mechanical hard disks can be tested under different temperatures and different vibration and noise characteristics. The impact of temperature data, vibration data, and noise data on the mechanical hard disk read / write performance can be analyzed, and a mathematical function relationship between the three can be established.

[0115] In operation S340, test data collection and processing. Deploy a server, a hard disk dummy, a vibration noise generating device, and a signal acquisition device in the test environment. The vibration noise generating device is powered by the server motherboard, and the control program is integrated into the baseboard controller. The sensor of the hard disk dummy is connected to the signal acquisition device. Start the server, and use the control program to make the vibration noise generating device emit the vibration noise of fans of different brands and models respectively. After the hard disk dummy is collected, it is input into the signal acquisition device. The signal acquisition device first performs feature decomposition on the collected signal, queries the sensitivity coefficients of different hard disks through the database, and predicts the performance results of the hard disk under the fan through the prediction function. The performance results can characterize the ratio of the hard disk read and write rate under different excitation conditions to the baseline condition.

[0116] Based on the above test method, the present invention also provides a test device. Figure 4 The device is described in detail.

[0117] Figure 4 A structural block diagram of a testing device according to an embodiment of the present invention is shown.

[0118] like Figure 4 As shown, the testing device of this embodiment includes a data acquisition module 410 , a signal output module 420 and a result determination module 430 .

[0119] Data acquisition module 410 is configured to obtain sensitive parameters and device data corresponding to the device under test from the dataset. The device under test is a surrogate device for the target device, and the sensitive parameters represent the degree to which the device data affects the performance of the target device. In one embodiment, data acquisition module 410 may be configured to perform operation S210 described above and will not be further described here.

[0120] The signal output module 420 is used to control multiple generating devices to output multiple excitation signals based on the device data, so as to use the multiple excitation signals to perform an excitation test on the device to be tested. In one embodiment, the signal output module 420 can be used to perform the operation S220 described above, which will not be repeated here.

[0121] The result determination module 430 is used to obtain the test result of the device under test based on the sensitive parameters, the test data obtained in the stimulus test, and the environmental data. In one embodiment, the result determination module 430 can be used to perform the operation S230 described above, which will not be repeated here.

[0122] According to an embodiment of the present invention, through the data acquisition module 410, the signal output module 420 and the result determination module 430 in the test device, the device data in the data set is used to control multiple generating devices to output different excitation signals to perform excitation testing on the device to be tested based on different test requirements. Since the test data and environmental data obtained in the excitation test are used as variables and combined with the sensitive parameters corresponding to the device to be tested to perform testing, test results that replace the physical test of the target device under different test conditions are obtained, thereby avoiding stability and compatibility issues in the physical hardware testing process, and achieving multiple combination test results of different generating devices and different devices to be tested, thereby improving test efficiency and reducing test time.

[0123] According to an embodiment of the present invention, the test data includes vibration test data and noise test data; the apparatus further includes: a vibration threshold determination module and a noise threshold determination module. The vibration threshold determination module is configured to determine a vibration threshold for the vibration test data, wherein if the vibration acceleration amplitude of the target device is greater than or equal to the vibration threshold, the performance of the target device is degraded; and the noise threshold determination module is configured to determine a noise threshold for the noise test data, wherein if the sound pressure amplitude of the target device is greater than or equal to the noise threshold, the performance of the target device is degraded.

[0124] According to an embodiment of the present invention, the sensitive parameters include a vibration sensitivity parameter corresponding to the vibration test data and a noise sensitivity parameter corresponding to the noise test data; the result determination module 430 includes: a first variation determination submodule, a second variation determination submodule, and a weighting submodule. The first variation determination submodule is configured to determine a first variation corresponding to the vibration test data based on the vibration sensitivity parameter, the vibration test data, a vibration threshold, and environmental data; the second variation determination submodule is configured to determine a second variation corresponding to the noise test data based on the noise sensitivity parameter, the noise test data, the noise threshold, and environmental data; and the weighting submodule is configured to obtain a test result for the variation in the performance of the device to be tested by weighting the first variation using a first weight and the second variation using a second weight.

[0125] According to an embodiment of the present invention, the apparatus further includes: a first parameter determination module, configured to determine a vibration sensitivity parameter based on a currently detected device vibration signal, a vibration threshold, and current performance data of the target device; and a second parameter determination module, configured to determine a noise sensitivity parameter based on a currently detected device noise signal, a noise threshold, and current performance data.

[0126] According to an embodiment of the present invention, the first parameter determination module includes: a first difference determination submodule for determining a first difference between the device vibration signal and a vibration threshold; and a parameter determination submodule for determining a ratio between the first difference and current performance data as a vibration sensitivity parameter.

[0127] According to an embodiment of the present invention, the second parameter determination module includes: a second difference determination submodule for determining a second difference between the device noise signal and the noise threshold; and a noise sensitivity parameter determination submodule for determining the ratio between the second difference and the current performance data as the noise sensitivity parameter.

[0128] According to an embodiment of the present invention, the device further includes: a test sensitive parameter determination module and a position information determination module. The test sensitive parameter determination module is configured to determine the test sensitive parameters of the device to be tested using multiple initial frequency data and multiple initial amplitude data in the device data; and the position information determination module is configured to determine the target position information of each of the multiple detection devices from their respective initial position information based on the test sensitive parameters, the sensitive parameters, and the parameter threshold.

[0129] According to an embodiment of the present invention, the location information determination module includes a difference determination submodule and a data acquisition submodule. The difference determination submodule is used to determine the difference between the test sensitive parameter and the sensitive parameter; the data acquisition submodule is used to obtain the target location information when the difference is less than or equal to the parameter threshold, thereby acquiring test data and environmental data using multiple detection devices located at the target location information.

[0130] According to an embodiment of the present invention, the device data includes the device identification of the target device, the device vibration data and device vibration characteristics of the target device, the device noise data and device noise characteristics, and the generating device includes a vibration generating device and a noise generating device; the signal output module 420 includes: a signal output submodule, which is used to control the vibration generating device to output a vibration excitation signal based on the device identification and the device vibration characteristics, and to control the noise generating device to output a noise excitation signal based on the device identification and the device noise characteristics.

[0131] According to an embodiment of the present invention, the apparatus further includes: a data updating module, a segmentation module, a conversion module, and a feature determination module. The data updating module is configured to update the test data using an update coefficient to obtain updated test data; the segmentation module is configured to segment the updated test data using a window function to obtain multiple segmented test data; the conversion module is configured to convert the multiple segmented test data into the frequency domain to obtain frequency domain features corresponding to the test data; and the feature determination module is configured to obtain device vibration features and device noise features based on the frequency domain features and power spectrum data determined by the frequency domain features.

[0132] According to an embodiment of the present invention, the update coefficient includes a first update coefficient corresponding to the vibration test data; the apparatus further includes an amplitude determination module and an update coefficient determination module. The amplitude determination module is configured to determine an actual amplitude corresponding to the vibration test data based on a peak value of the vibration test data; and the update coefficient determination module is configured to determine the first update coefficient using a standard amplitude generated by a vibration calibration device and the actual amplitude.

[0133] According to an embodiment of the present invention, the update coefficient includes a second update coefficient corresponding to the noise test data. The apparatus further includes a sound pressure data determination module and a coefficient determination module. The sound pressure data determination module is configured to determine actual sound pressure data of the noise test data based on sampled data of the noise test data; and the coefficient determination module is configured to determine the ratio between the standard sound pressure data generated by the noise calibration device and the actual sound pressure data as the second update coefficient.

[0134] According to embodiments of the present invention, any multiple modules among the data acquisition module 410, signal output module 420, and result determination module 430 may be combined into a single module, or any one of these modules may be split into multiple modules. Alternatively, at least part of the functionality of one or more of these modules may be combined with at least part of the functionality of other modules and implemented in a single module. According to embodiments of the present invention, at least one of the data acquisition module 410, signal output module 420, and result determination module 430 may be at least partially implemented as a hardware circuit, such as a field programmable gate array (FPGA), a programmable logic array (PLA), a system on a chip, a system on a substrate, a system on a package, an application-specific integrated circuit (ASIC), or may be implemented in hardware or firmware through any other reasonable means of circuit integration or packaging, or may be implemented in any one of the three implementation methods of software, hardware, and firmware, or any suitable combination of these. Alternatively, at least one of the data acquisition module 410, signal output module 420, and result determination module 430 may be at least partially implemented as a computer program module that, when executed, performs the corresponding functionality.

[0135] Figure 5 FIG. 4 shows a block diagram of a test system according to an embodiment of the present invention.

[0136] like Figure 5 As shown, the test system includes: a memory 501 and a processor 101; the processor 101 is configured to execute the above test method according to the instructions and data stored in the memory 501.

[0137] The memory 501 may store different types of instructions and data. The instructions may include test instructions, data acquisition instructions, and control instructions. The data may include sensitive parameters, device data, environmental data, test data, and test results obtained from the test.

[0138] The processor 101 can be used to perform test operations, such as obtaining sensitive parameters and device data from a data set, and controlling the generating device to output an excitation signal based on the device data, and using the excitation signal to perform an excitation test on the device to be tested, thereby obtaining test results based on sensitive parameters, test data and environmental data.

[0139] Figure 6 A block diagram of an electronic device suitable for implementing a testing method according to an embodiment of the present invention is shown.

[0140] like Figure 6 As shown, an electronic device according to an embodiment of the present invention includes a processor 601, which can perform various appropriate actions and processes based on programs stored in a read-only memory (ROM) 602 or programs loaded from a storage unit 608 into a random access memory (RAM) 603. Processor 601 may include, for example, a general-purpose microprocessor (e.g., a CPU), an instruction set processor, and / or a special-purpose microprocessor (e.g., an application-specific integrated circuit (ASIC)). Processor 601 may also include onboard memory for caching purposes. Processor 601 may include a single processing unit or multiple processing units for performing different actions of the method flow according to an embodiment of the present invention.

[0141] Various programs and data required for the operation of the electronic device are stored in RAM 603. Processor 601, ROM 602, and RAM 603 are connected to each other via bus 604. Processor 601 executes the programs in ROM 602 and / or RAM 603 to perform various operations according to the method flow of the embodiment of the present invention. It should be noted that the programs may also be stored in one or more memories other than ROM 602 and RAM 603. Processor 601 may also execute the programs stored in the one or more memories to perform various operations according to the method flow of the embodiment of the present invention.

[0142] According to an embodiment of the present invention, the electronic device may further include an input / output (I / O) interface 605, which is also connected to the bus 604. The electronic device may further include one or more of the following components connected to the I / O interface 605: an input portion 606 including a keyboard, a mouse, etc.; an output portion 607 including devices such as a cathode ray tube (CRT), a liquid crystal display (LCD), and speakers; a storage portion 608 including a hard disk; and a communication portion 609 including a network interface card such as a LAN card or a modem. The communication portion 609 performs communication processing via a network such as the Internet. A drive 610 is also connected to the I / O interface 605 as needed. Removable media 611, such as a magnetic disk, an optical disk, a magneto-optical disk, or a semiconductor memory, is installed in the drive 610 as needed, so that computer programs read from the removable media can be installed in the storage portion 608 as needed.

[0143] The present invention also provides a computer-readable storage medium, which may be included in the device / apparatus / system described in the above embodiments, or may exist independently and not incorporated into the device / apparatus / system. The computer-readable storage medium carries one or more programs, which, when executed, implement the method according to the embodiments of the present invention.

[0144] According to an embodiment of the present invention, a computer-readable storage medium may be a non-volatile computer-readable storage medium, and may include, for example, but not limited to: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In the present invention, a computer-readable storage medium may be any tangible medium that contains or stores a program that can be used by or in conjunction with an instruction execution system, apparatus, or device. For example, according to an embodiment of the present invention, a computer-readable storage medium may include the ROM 602 and / or RAM 603 described above, and / or one or more memories other than ROM 602 and RAM 603.

[0145] The embodiment of the present invention further includes a computer program product, which includes a computer program containing program code for executing the method shown in the flowchart. When the computer program product is run in a computer system, the program code is used to enable the computer system to implement the testing method provided by the embodiment of the present invention.

[0146] The computer program executes the above functions defined in the system / device of the embodiment of the present invention when the computer program is executed by the processor 601. According to the embodiment of the present invention, the system, device, module, unit, etc. described above can be implemented by a computer program module.

[0147] In one embodiment, the computer program may be stored on a tangible storage medium such as an optical storage device or a magnetic storage device. In another embodiment, the computer program may be transmitted and distributed in the form of a signal on a network medium, downloaded and installed via the communication portion 609, and / or installed from a removable medium 611. The program code contained in the computer program may be transmitted using any appropriate network medium, including but not limited to wireless, wired, or any suitable combination thereof.

[0148] In such an embodiment, the computer program can be downloaded and installed from a network via the communication section 609 and / or installed from a removable medium 611. When the computer program is executed by the processor 601, the above-described functions defined in the system of the embodiment of the present invention are performed. According to the embodiment of the present invention, the systems, devices, means, modules, units, etc. described above can be implemented by computer program modules.

[0149] According to an embodiment of the present invention, the program code for executing the computer program provided by the embodiment of the present invention can be written in any combination of one or more programming languages. Specifically, these computer programs can be implemented using high-level procedural and / or object-oriented programming languages, and / or assembly / machine languages. Programming languages include, but are not limited to, languages such as Java, C++, Python, "C" or similar programming languages. The program code can be executed entirely on the user computing device, partially on the user device, partially on a remote computing device, or entirely on a remote computing device or server. In the case of a remote computing device, the remote computing device can be connected to the user computing device through any type of network, including a local area network (LAN) or a wide area network (WAN), or can be connected to an external computing device (for example, using an Internet service provider to connect via the Internet).

[0150] The flowcharts and block diagrams in the accompanying drawings illustrate the possible implementation architecture, functions and operations of the systems, methods and computer program products according to various embodiments of the present invention. In this regard, each box in the flowchart or block diagram can represent a module, program segment, or a part of code, and the above-mentioned module, program segment, or a part of code contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in an order different from that marked in the accompanying drawings. For example, two boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram or flowchart, and the combination of boxes in the block diagram or flowchart, can be implemented with a dedicated hardware-based system that performs the specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0151] It will be understood by those skilled in the art that the features described in the various embodiments of the present invention may be combined and / or coupled in various ways, even if such combinations or couplings are not explicitly described in the present invention. In particular, the features described in the various embodiments of the present invention may be combined and / or coupled in various ways without departing from the spirit and teachings of the present invention. All such combinations and / or couplings fall within the scope of the present invention.

[0152] The above describes embodiments of the present invention. However, these embodiments are for illustrative purposes only and are not intended to limit the scope of the present invention. Although each embodiment has been described separately above, this does not mean that the measures in each embodiment cannot be advantageously used in combination. Without departing from the scope of the present invention, those skilled in the art may make various substitutions and modifications, which should all fall within the scope of the present invention.

Claims

1. A testing method, characterized in that: The method comprises: Acquire sensitive parameters and device data corresponding to the device under test from the data set, wherein the device under test is a substitute device for the target device, the sensitive parameters represent the degree of influence of the device data on the performance of the target device, and the device data includes the device data of the target device and the device data of the device generating the stimulus signal; controlling a plurality of generating devices to output a plurality of excitation signals based on the device data, so as to perform an excitation test on the device to be tested using the plurality of excitation signals; Obtaining a test result of the device to be tested based on the sensitive parameters, the test data obtained in the stimulus test, and the environmental data, including: determining a first variation corresponding to the vibration test data based on vibration test data in the test data, a vibration sensitivity parameter corresponding to the vibration test data, a vibration threshold, and the environmental data, wherein the vibration sensitivity parameter represents a sensitivity coefficient of the performance of the target device under a combination of the vibration test data and the environmental data, and the environmental data includes temperature data and humidity data; determining, based on noise test data in the test data, a noise sensitivity parameter corresponding to the noise test data, a noise threshold, and the environmental data, a second variation corresponding to the noise test data, wherein the noise sensitivity parameter represents a sensitivity coefficient of the target device performance under a combination of the noise test data and the environmental data; By weighting the first variation with a first weight and weighting the second variation with a second weight, a test result for the variation of the performance of the device to be tested is obtained.

2. The method according to claim 1, characterized in that The method further comprises: determining a vibration threshold for the vibration test data, wherein when the vibration acceleration amplitude of the target device is greater than or equal to the vibration threshold, the performance of the target device exhibits degradation; A noise threshold for the noise test data is determined, wherein when a sound pressure amplitude of the target device is greater than or equal to the noise threshold, performance of the target device exhibits degradation.

3. The method according to claim 1, characterized in that The method further comprises: determining the vibration sensitivity parameter based on the device vibration signal detected at the current moment, the vibration threshold, and current performance data of the target device; The noise sensitivity parameter is determined based on the device noise signal detected at a current moment, the noise threshold, and the current performance data.

4. The method according to claim 3, characterized in that Determining the vibration sensitivity parameter based on the device vibration signal detected at the current moment, the vibration threshold, and current performance data of the target device includes: determining a first difference between the device vibration signal and the vibration threshold; A ratio between the first difference and the current performance data is determined as the vibration sensitivity parameter.

5. The method according to claim 3, characterized in that Determining the noise sensitivity parameter based on the device noise signal detected at a current moment, the noise threshold, and the current performance data includes: determining a second difference between the device noise signal and the noise threshold; A ratio between the second difference and the current performance data is determined as the noise sensitivity parameter.

6. The method according to claim 1, characterized in that The method further comprises: Determining test sensitive parameters of the device to be tested using a plurality of initial frequency data and a plurality of initial amplitude data in the device data; Based on the test sensitive parameter, the sensitive parameter and the parameter threshold, target position information of each of the multiple detection devices is determined from the initial position information of each of the multiple detection devices.

7. The method according to claim 6, characterized in that Determining target position information of each of the plurality of detection devices from initial position information of each of the plurality of detection devices based on the test sensitive parameter, the sensitive parameter, and the parameter threshold, comprising: determining a difference between the test sensitive parameter and the sensitive parameter; When the difference is less than or equal to the parameter threshold, the target position information is obtained, so as to acquire the test data and the environmental data by using the multiple detection devices located at the target position information.

8. The method according to claim 2, characterized in that The device data includes a device identification of the target device, device vibration data and device vibration characteristics of the target device, device noise data and device noise characteristics, and the generating device includes a vibration generating device and a noise generating device; Controlling a plurality of generating devices to output a plurality of excitation signals based on the device data includes: The vibration generating device is controlled to output a vibration excitation signal based on the device identification and the device vibration characteristics, and the noise generating device is controlled to output a noise excitation signal based on the device identification and the device noise characteristics.

9. The method according to claim 8, characterized in that The method further comprises: Updating the test data using an update coefficient to obtain updated test data; Using a window function to segment the updated test data to obtain a plurality of segmented test data; Converting the plurality of segmented test data into a frequency domain to obtain frequency domain features corresponding to the test data; The device vibration feature and the device noise feature are obtained based on the frequency domain feature and the power spectrum data determined by the frequency domain feature.

10. The method according to claim 9, characterized in that The update coefficient includes a first update coefficient corresponding to the vibration test data; The method further comprises: determining an actual amplitude corresponding to the vibration test data based on a peak value of the vibration test data; The first update coefficient is determined using a standard amplitude generated by a vibration calibration device and the actual amplitude.

11. The method according to claim 9, characterized in that The update coefficient includes a second update coefficient corresponding to the noise test data; The method further comprises: determining actual sound pressure data of the noise test data based on the sampled data of the noise test data; The ratio between the standard sound pressure data generated by the noise calibration device and the actual sound pressure data is determined as the second update coefficient.

12. A testing system, characterized in that: include: Memory; A processor configured to execute the method according to any one of claims 1 to 11 according to the instructions and data stored in the memory.

13. A computer-readable storage medium having a computer program or instruction stored thereon, characterized in that: When the computer program or instruction is executed by a processor, the steps of the method according to any one of claims 1 to 11 are implemented.

14. A computer program product comprising a computer program or instructions, characterized in that When the computer program or instruction is executed by a processor, the steps of the method according to any one of claims 1 to 11 are implemented.

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